Braid system for multi-dimensional detection of COB multi-string and multi-parallel lamp beads
By using a multi-dimensional inspection system to perform electrical and optical inspections on COB multi-string and multi-parallel LEDs, the problems of identifying potential LED defects and orientation in the tape and reel system were solved, improving product yield and reliability and optimizing production efficiency.
Patent Information
- Application Number
- CN202511258445.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-04
- Publication Date
- 2025-10-21
AI Technical Summary
Existing taping systems have difficulty identifying potential electrical and optical hazards in COB multi-string and multi-parallel lamps, and are unable to accurately verify the taping direction, resulting in the lamps being reversed or angularly deviated at the application end, affecting the performance and reliability of optoelectronic devices.
A multi-dimensional detection system is adopted, including an electrical testing station, a rotary station, a micro-lighting testing station, and an optical testing station. The current value is detected by applying positive and negative voltages, the direction of the LED beads is adjusted, and the direction is ensured to be consistent through image comparison. A collection station is set up to collect defective products, and a counting station controls the feeding rhythm.
Accurately identifying electrical and optical defects ensures correct LED orientation, significantly improving product yield, reducing defective products from reaching the application end, and increasing production efficiency and automation.
Smart Images
Figure CN120815752A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of LED optoelectronic devices, and in particular to a tape braiding system for multi-dimensional detection of COB multi-string and multi-parallel lamp beads. Background Art
[0002] In the field of LED optoelectronic devices, COB multi-string and multi-parallel lamp beads are an important component and are widely used in various lighting and display devices. Their performance stability directly affects the quality of terminal products.
[0003] The taping system utilizes high-speed vibrating feeding and precise positioning to orderly place optoelectronic devices (including COB multi-string and multi-parallel LEDs) into carrier tape, then heat-press seals the LEDs with a cover tape to create standardized taped packaging. Some high-end taping equipment, such as the LED Spectrometer Taping Machine, integrates spectrometry, color separation, and electrical performance testing capabilities, automatically detecting and classifying optoelectronic parameters such as brightness, wavelength, and voltage before taping.
[0004] However, existing taping systems have limitations in electrical testing, making it difficult to identify potential electrical and optical issues with LEDs. This can result in defective LEDs entering the application, leading to quality issues. Furthermore, due to the high degree of similarity in the front appearance of frames or brackets, relying solely on image recognition technology from above cannot accurately verify the taping direction. This can easily cause the LEDs to be reversed or angularly misaligned during placement at the application, leading to optoelectronic device failure and compromising overall performance and reliability. Summary of the Invention
[0005] The purpose of the present invention is to provide a tape system for multi-dimensional detection of COB multi-string and multi-parallel lamp beads, aiming to improve the product yield of the tape system.
[0006] In order to achieve the above object, the present invention adopts the following technical solutions: The present invention provides a multi-dimensional tape system for detecting COB multi-string and multi-parallel lamp beads, comprising a loading assembly, a turret, a unloading assembly, and a plurality of inspection stations. The turret comprises a plurality of storage bins, which rotate along a first direction. The plurality of inspection stations are distributed along the first direction between the loading position and the unloading position of the storage bin. The loading position refers to the position where the storage bin obtains the optoelectronic device containing the COB multi-string and multi-parallel lamp beads through the loading assembly, and the unloading position refers to the position where the storage bin unloads the optoelectronic device through the unloading assembly. The inspection stations that the storage bin passes through when rotating along the first direction include an electrical measuring station, a first collecting station, a rotating station, a micro-lighting test station, a second collecting station, a first optical inspection station, and a third collecting station. The electrical measuring station is used to test the electrical parameters of the optoelectronic device. The rotating station is used to adjust the direction of the optoelectronic device to ensure that the arrangement direction of the lamp beads remains consistent. The micro-lighting test station is used to test whether the lighting level of the optoelectronic device is qualified. The first optical inspection station is used to photograph the frame and back solder pad of the optoelectronic device and compare them with the standard image to determine the direction of the optoelectronic device. The first collection station, the second collection station and the third collection station respectively recycle the photoelectric devices with poor electrical properties, unqualified lighting levels, and direction deflection exceeding a set angle as measured in the detection station. The first direction is clockwise or counterclockwise.
[0007] The electrical testing station is configured to sequentially apply forward and reverse voltages to the photovoltaic device and detect the current value of the photovoltaic device to determine whether the photovoltaic device is dead or leaking. If no current value is detected when the forward voltage is applied, or if the detected current value is greater than the reverse current limit of the photovoltaic device when the reverse voltage is applied, it is identified as an electrical failure.
[0008] The rotation station is configured to obtain the current value detected by the electrical measuring station and compare it with multiple internally stored preset current values to determine the deflection angle of the photoelectric device. If the photoelectric device is deflected, the rotation station adjusts the current value to the preset angle. The current values measured by the electrical measuring station for a photoelectric device with normal electrical properties at different deflection angles correspond one-to-one with the multiple preset current values.
[0009] The standard image is a full-color image of the optoelectronic device frame and back pads at a preset angle. The first optical inspection station is configured to capture a full-color image of the optoelectronic device frame and back pads and compare it with the standard image. If the similarity with the standard image is less than a first set value, it is determined that the optoelectronic device has deflected beyond the set angle.
[0010] The micro-lighting test station applies a small current to the photoelectric device, captures an image of the device's lamps, and compares it with an image of a fully illuminated, qualified photoelectric device. Any image that is inconsistent with the fully illuminated image of a qualified photoelectric device is deemed unsatisfactory. A positioning station is also located between the loading station and the electrical measurement station. This station is used to secure the photoelectric device in the center of the storage bin.
[0011] The unloading assembly includes a carrier tape, onto which the optoelectronic devices are unloaded via an unloading station and moved along the carrier tape's transport direction. The taping system also includes a second optical inspection station, located above the carrier tape. The second optical inspection station is configured to capture a full-color image of the optoelectronic devices and compare it with a full-color image of a qualified optoelectronic device. If the degree of similarity with the full-color image of a qualified optoelectronic device is less than a second set value, the optoelectronic device is deemed unqualified.
[0012] The range of the first setting value is 50%-90%, and the range of the second setting value is 50%-90%.
[0013] A counting station is also included between the unloading position and the third collecting station. The counting station is configured to count the photoelectric devices arriving at the counting station. When the number of photoelectric devices arriving at the counting station reaches a preset number, the loading assembly stops loading.
[0014] Multiple detection stations are evenly distributed between the loading and unloading positions.
[0015] Compared with the prior art, the present invention has the following beneficial effects: 1. The multi-dimensional detection of COB multi-string and multi-parallel lamp taping system provided in the embodiment of the present application applies positive and reverse voltages to the optoelectronic devices through an electrical measuring station and detects the current value, which can accurately identify electrical defects such as dead lamps and leakage; by taking the lamp bead image at a small current through a micro-lighting test station and comparing it with the qualified image, it can effectively eliminate dead lamps, dimly lit lamps, and partially dimly lit lamps with optical abnormalities, solving the problem that traditional taping systems cannot identify potential electrical and optical hazards, and greatly reducing the risk of defective lamps flowing into the application end.
[0016] 2. The rotation station adjusts the direction of the optoelectronic device according to the current value of the electrical measuring station. Combined with the image comparison of the frame and the back pad at the first optical inspection station (if the similarity is less than 50%-90%, the direction is judged to be abnormal), it double guarantees the correct direction of the lamp beads. The second optical inspection station further reviews the front appearance and direction, and can identify placement deviations such as reverse and lateral directions, avoiding optoelectronic device failure caused by incorrect direction during end-to-end patching, significantly improving product reliability, thereby increasing the product yield of optoelectronic devices produced by the taping system.
[0017] 3. The first, second, and third collection stations specifically recycle optoelectronic devices with poor electrical performance, unqualified lighting conditions, or misaligned orientation, enabling precise diversion and centralized processing of defective products while minimizing manual intervention. The counting station automatically controls material loading based on preset quantities, optimizing production flow and increasing automation and overall production efficiency in the taping process. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1This is a structural diagram of a multi-dimensional detection system for the braiding of COB multi-string and multi-parallel lamp beads provided by an embodiment of the present application; Figure 2 This is a schematic diagram of the back side of a photoelectric device provided in an embodiment of the present application; Figure 3 This is a schematic diagram of a photoelectric device provided by an embodiment of the present application with all lamp beads lit; Figure 4 The present invention is a front view of a photoelectric device provided in an embodiment of the present application.
[0019] Among them, 1 is the loading assembly, 2 is the turret, 21 is the holding bin, 22 is the loading position, 23 is the unloading position, 3 is the unloading assembly, 31 is the carrier, 4 is the electrical measuring station, 5 is the first collecting station, 6 is the rotating station, 7 is the micro-lighting test station, 8 is the second collecting station, 9 is the first optical test station, 10 is the third collecting station, 11 is the positioning station, 12 is the second optical detection station, 13 is the counting station, and 100 is the optoelectronic device. DETAILED DESCRIPTION
[0020] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0021] The embodiment of the present application provides a multi-dimensional detection system for the braiding of COB multi-string and multi-parallel lamp beads, for example, Figure 1 As shown in the figure, the braiding system includes a loading assembly 1, a turret 2, a discharge assembly 3, and multiple inspection stations. The turret 2 includes multiple storage bins 21, which rotate in a first direction. Multiple inspection stations are distributed along the first direction between a loading position 22 and a discharge position 23 in the storage bin 21. The loading position 22 is where the storage bin 21 passes through the loading assembly 1 to retrieve optoelectronic devices 100 containing COB multi-string and multi-parallel lamp beads, and the discharge position 23 is where the storage bin 21 passes through the discharge assembly 3 to unload optoelectronic devices 100.
[0022] The inspection stations that the accommodating chamber 21 passes through when rotating along the first direction include an electrical measuring station 4, a first collecting station 5, a rotating station 6, a micro-lighting test station 7, a second collecting station 8, a first optical inspection station 9, and a third collecting station 10. The electrical measuring station 4 is used to test the electrical parameters of the optoelectronic device 100. The rotating station 6 is used to adjust the direction of the optoelectronic device 100 to ensure that the arrangement direction of the lamp beads remains consistent. The micro-lighting test station 7 is used to test whether the lighting level of the optoelectronic device 100 is qualified. The first optical inspection station 9 is used to photograph the frame and back solder pad of the optoelectronic device 100 and compare them with the standard image to determine the direction of the optoelectronic device 100. The first collecting station 5, the second collecting station 8, and the third collecting station 10 respectively recycle the optoelectronic devices 100 with poor electrical properties, unqualified lighting levels, or direction deflection exceeding the set angle measured in the inspection station. The first direction is clockwise or counterclockwise.
[0023] As a possible implementation method, the loading assembly 1 includes a vibrating feed tray, a linear feed track, a positioning and grasping mechanism, and a sensor. A spiral ascending track is provided inside the vibrating feed tray, and the track width matches the size of the optoelectronic device. The disorderly stacked optoelectronic devices can be gradually transported to the exit along the track through high-frequency vibration. The linear feed track is connected to the exit of the vibrating feed tray, and the optoelectronic devices are kept in a single row and moved in an orderly manner toward the positioning and grasping mechanism through continuous vibration; the positioning and grasping mechanism uses a pneumatic suction cup or a mechanical gripper, which can accurately grasp the optoelectronic device at the end of the linear feed track; the sensor is installed at the end of the linear feed track and the loading position 22 of the storage bin 21, and is used to detect the position of the optoelectronic device 100 and the idle state of the storage bin 21.
[0024] The vibrating feeder starts and transports the optoelectronic devices 100 inside along the spiral track through vibration. During the process, the guide structure of the track (such as side baffles and bosses) is used to perform preliminary posture adjustment on the optoelectronic devices 100 so that they enter the linear feeder track in a roughly uniform direction; then, the optoelectronic devices 100 continue to move on the linear feeder track, and after the sensor detects that the optoelectronic device 100 has reached the end, it sends a signal to the positioning and grasping mechanism; the positioning and grasping mechanism grasps the optoelectronic device 100 according to the signal, and at the same time, when the sensor 104 of the loading position 22 detects that the accommodating bin 21 is idle, the positioning and grasping mechanism transfers the optoelectronic device 100 to the accommodating bin 21; finally, the accommodating bin 21 temporarily fixes the optoelectronic device 100 through the suction nozzle structure to complete the loading.
[0025] As a possible implementation, the collection station consists of a vacuum suction pipe, a recovery pipe, and a negative pressure generator. When the system determines that the photoelectric device 100 is unqualified and reaches the collection station 10, the negative pressure generator is activated, causing the vacuum suction pipe to generate negative pressure. The vacuum suction pipe moves above the storage chamber 21, aligns with the photoelectric device 100, and contacts it, sucking it in through the negative pressure. The vacuum suction pipe then moves to the entrance of the recovery pipe, the negative pressure is turned off, and the photoelectric device 100 flows along the pipe into the recovery container under the action of gravity. The inner wall of the recovery pipe is made of smooth polytetrafluoroethylene material to reduce wear on the photoelectric device 100 during transportation.
[0026] The electrical testing station 4 is configured to sequentially apply forward and reverse voltages to the photovoltaic device 100 and detect the current value of the photovoltaic device 100 to determine whether the photovoltaic device is dead or leaking. If no current value is detected when the forward voltage is applied, or if the detected current value is greater than the reverse current limit of the photovoltaic device when the reverse voltage is applied, it is determined to be electrical failure.
[0027] The electrical measuring station 4 applies a forward voltage to the photoelectric device 100, meaning the voltage direction is consistent with the current direction during normal operation of the lamp bead. During this process, if no current value is detected, it indicates a short circuit in the chip or circuit inside the lamp bead, resulting in a "dead lamp" condition. In this case, the lamp bead will not light up properly at the application end. After the forward detection, the electrical measuring station 4 switches to a reverse voltage, meaning the voltage direction is opposite to the normal operating direction. At this point, a normal photoelectric device 100 should have good reverse insulation and a low current value. If the detected current value exceeds the reverse current limit (i.e., the preset insulation threshold) for this type of photoelectric device 100, it is determined to be "leakage current." In this case, the lamp bead is prone to heating, failure, and even circuit failure due to leakage current over long-term use.
[0028] Compared with the electrical detection in the traditional taping system that only detects the on and off state under a single voltage, the electrical testing station 4 can cover more potential electrical hazards through forward and reverse dual-dimensional detection, such as hidden short circuits and insulation layer damage. It solves the problem of the inability to identify critical electrical defects in existing technologies, provides an accurate basis for the subsequent elimination of defective lamp beads, and reduces the risk of defective devices flowing into the application end.
[0029] Rotation station 6 is configured to obtain the current value detected by electrical measurement station 4 and compare it with multiple internally stored preset current values to determine the deflection angle of photoelectric device 100. If photoelectric device 100 is deflected, it is adjusted to the preset angle. The current value measured by electrical measurement station 4 for a properly electrically functioning photoelectric device 100 at different deflection angles corresponds one-to-one with the multiple preset current values.
[0030] The orientation of the lamp beads in the optoelectronic device 100, such as forward, reverse, 90°, or 270°, can affect the conduction path of its internal circuit, leading to differences in the current values detected by the electrical measuring station 4. Based on this characteristic, the rotating station 6 pre-stores preset current values for different deflection angles. These preset current values at different deflection angles can be calibrated using extensive experimental data to match the current values of electrically normal optoelectronic devices at corresponding angles.
[0031] For example, when performing experimental data calibration, when the photoelectric device 100 is exactly at the preset angle, the forward current value measured by the electrical measuring station 4 is 10mA (the preset current value is A, i.e., 10mA). When the photoelectric device 100 is deflected 90°, the forward current value measured by the electrical measuring station is 8mA (the preset current value is B, i.e., 8mA). In the detection environment, when the forward current value measured when the photoelectric device 100 enters the electrical measuring station 4 is 8mA, it matches the preset current B, which means that the photoelectric device 100 has deflected 90°. The rotating station 6 adjusts the deflected photoelectric device 100 to the preset angle, thereby ensuring that the arrangement direction of the lamp beads of the photoelectric device 100 unloaded from the unloading position 23 remains consistent. This adjustment ensures the directional consistency of the photoelectric device 100 when it is mounted on the application end, solves the problems of reverse mounting and angle deviation caused by inaccurate direction recognition in traditional tape systems, and fundamentally reduces the risk of device failure.
[0032] The standard image is a full-color image of the frame and back pads of the optoelectronic device 100 at a preset angle. The first optical inspection station 9 is configured to: take a full-color image of the frame and back pads of the optoelectronic device 100 and compare it with the standard image. If the similarity with the standard image is less than a first set value, it is determined that the direction of the optoelectronic device 100 is deflected by more than the set angle. For example, the standard image is as follows: Figure 2 shown.
[0033] As one possible implementation, the first optical inspection station 9 includes an imaging camera. When the optoelectronic device 100 carried by the storage compartment 21 passes through the first optical inspection station 9, the imaging camera is located at the bottom of the optoelectronic device 100 and photographs the frame and back solder pads of the optoelectronic device 100. Because the standard image captures the frame and back solder pads of the optoelectronic device 100 at a preset angle, if an abnormality occurs in the rotation station 6, resulting in an optoelectronic device 100 that has deflected beyond the preset angle and cannot be adjusted to the preset angle, the first optical inspection station 9 can identify it by comparing its similarity with the standard image. Optoelectronic devices 100 that have been identified as deflected beyond the preset angle are then collected by the third collection station.
[0034] The micro lighting test station 7 is configured to apply a small current to the optoelectronic device 100, take an image of the lamp beads of the optoelectronic device 100 and compare it with the image of a qualified optoelectronic device with all the lamp beads lit. If it is inconsistent with the image of a qualified optoelectronic device with all the lamp beads lit, it is identified as an unqualified lighting degree.
[0035] As a possible implementation method, the micro-lighting test station 7 includes an image camera. When the optoelectronic device 100 carried by the storage compartment 21 passes through the micro-lighting test station 7, the image camera is located above the optoelectronic device 100 and can take a picture of the lighting condition of the lamp beads of the optoelectronic device 100. The photograph is compared with an image of a qualified optoelectronic device with all the lamp beads lit. For example, the image of a qualified optoelectronic device with all the lamp beads lit is as follows: Figure 3 As shown, if they are inconsistent, it is identified as a lighting level failure and is collected by the second collection station 8.
[0036] A positioning station 11 is also provided between the loading position 22 and the electrical measuring station 4. The positioning station 11 is used to fix the optoelectronic device 100 at the center of the storage bin 21. When the loading component 1 places the optoelectronic device 100 in the storage bin 21, the position and angle of the optoelectronic device 100 on the storage bin 21 cannot be guaranteed. Therefore, subsequent angle judgment and adjustment are required to ensure that the arrangement direction of the lamp beads of the optoelectronic device 100 is consistent. The positioning station 11 is located before the electrical measuring station 4, which means that the optoelectronic device 100 placed in the storage bin 21 will first be reset by the positioning station to prevent the optoelectronic device 100 from slipping off the storage bin 21 during the subsequent rotation test. As a possible implementation method, the storage bin 21 is located at the outermost edge of the turret 2, and the storage bin 21 includes a suction nozzle structure, which fixes the optoelectronic device 100. The positioning station 11 aligns the optoelectronic device 100 sucked up by the suction nozzle at the outermost edge of the turret 2 with the center of the suction nozzle.
[0037] The unloading assembly 3 includes a carrier tape 31. The optoelectronic devices 100 are unloaded onto the carrier tape 31 via the unloading position 23 and move along the transport direction of the carrier tape 31. The taping system also includes a second optical inspection station 12, located above the carrier tape 31. The second optical inspection station 12 is configured to capture a full-color image of the top of the optoelectronic devices 100 and compare it with a full-color image of the top of a qualified optoelectronic device 100. If the similarity with the full-color image of the top of a qualified optoelectronic device is less than a second set value, the optoelectronic device is identified as unqualified.
[0038] The second optical inspection station 12 is a key link in the tape system for final appearance and orientation review of the optoelectronic device 100. It is located above the carrier tape 31 and works in conjunction with the blanking component 3 to further screen out unqualified devices through image comparison. As a possible implementation method, the second optical inspection station 12 includes an image camera. When the optoelectronic device 100 is transported along the carrier tape 31 transmission path, it will pass under the image camera, affecting the camera to shoot the front of the optoelectronic device 100 and compare it with the full-color image above the qualified optoelectronic device 100. For example, the image above the qualified optoelectronic device 100 is as follows: Figure 4 If the similarity is less than the second set value, the unqualified optoelectronic devices 100 must be manually removed from the carrier tape 31. As the final inspection step in the tape-taping process, the second optical inspection station 12 complements the previous inspection stations, further reducing the risk of defective products reaching the end user and improving overall product reliability.
[0039] In some embodiments, the first setting value ranges from 50% to 90%, and the second setting value ranges from 50% to 90%.
[0040] A counting station 13 is further provided between the unloading position 23 and the third collecting station 10. The counting station 13 is configured to count the photoelectric devices 100 arriving at the counting station 13. When the number of photoelectric devices 100 arriving at the counting station reaches a preset number, the loading assembly 1 stops loading.
[0041] Multiple inspection stations are evenly distributed between the loading station 22 and the unloading station 23. This even distribution of inspection stations ensures that the processing time of each inspection station matches the rotational cycle of the turret 2 during the rotation of the optoelectronic device 100, avoiding local congestion or idleness caused by the concentration of inspection stations. For example, the time required for each station of the turret 2 to rotate is fixed. The even distribution of inspection stations ensures that inspection tasks at each station, such as electrical testing, imaging, and direction adjustment, are completed within the same timeframe, reducing waiting and backlogs, thereby improving the overall throughput of the tape system.
[0042] In the description of this specification, specific features, structures, materials or characteristics may be combined in an appropriate manner in any one or more embodiments or examples.
[0043] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any modifications or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.
Claims
1. A multi-dimensional detection system for the braiding of COB multi-string and multi-parallel LEDs, characterized by: The invention comprises a loading assembly (1), a rotating tower (2), a unloading assembly (3) and a plurality of inspection stations; the rotating tower (2) comprises a plurality of storage bins (21), and the storage bins (21) rotate along a first direction; the plurality of inspection stations are distributed along the first direction between a loading position (22) and a unloading position (23) of the storage bin (21); wherein the loading position (22) refers to the position where the storage bin (21) passes through the loading assembly (1) to obtain a photoelectric device (100) containing COB multi-string and multi-parallel lamp beads, and the unloading position (23) refers to the position where the storage bin (21) passes through the unloading assembly (3) to unload the photoelectric device (100); the inspection stations passed by the storage bin (21) when rotating along the first direction include an electric measuring station (4), a first collecting station (5), a rotating station (6), a micro-lighting test station (7), and a second collecting station (8). , a first optical inspection station (9) and a third collection station (10); the electrical measurement station (4) is used to test the electrical parameters of the optoelectronic device (100); the rotation station (6) is used to adjust the direction of the optoelectronic device (100) to ensure that the arrangement direction of the lamp beads remains consistent; the micro-lighting test station (7) is used to test whether the lighting degree of the optoelectronic device (100) is qualified; the first optical inspection station (9) is used to photograph the frame and back pad of the optoelectronic device (100) and compare them with the standard image to determine the direction of the optoelectronic device (100); the first collection station (5), the second collection station (8) and the third collection station (10) respectively recycle the optoelectronic devices (100) with poor electrical properties, unqualified lighting levels, and direction deflection exceeding a set angle measured in the inspection station; the first direction is clockwise or counterclockwise.
2. The multi-dimensional detection system for COB multi-string and multi-parallel LED stripping according to claim 1, characterized in that: The electrical measuring station (4) is configured to sequentially apply a forward voltage and a reverse voltage to the photoelectric device (100), and detect the current value of the photoelectric device (100) to determine whether the photoelectric device (100) is dead or leaking. If no current value is detected when the forward voltage is applied, or if the detected current value is greater than the reverse current limit value of the photoelectric device (100) when the reverse voltage is applied, it is identified as electrical failure.
3. The multi-dimensional detection system for COB multi-string and multi-parallel LED stripping according to claim 2, characterized in that: The rotating station (6) is configured to obtain the current value detected by the electrical measuring station (4), and compare it with a plurality of preset current values stored internally to determine the deflection angle of the photoelectric device (100), and adjust it to the preset angle when the photoelectric device (100) is deflected; wherein, under different deflection angles, the current value measured in the electrical measuring station (4) of the photoelectric device (100) with normal electrical properties corresponds one to one with the plurality of preset current values.
4. The multi-dimensional detection system for COB multi-string and multi-parallel LED taping according to claim 3, characterized in that: The standard image is a full-color image of the frame and back pad of the optoelectronic device (100) at a preset angle; the first optical inspection station (9) is configured to: capture the full-color image of the frame and back pad of the optoelectronic device (100), and compare it with the standard image; if the similarity with the standard image is less than a first set value, it is determined that the direction of the optoelectronic device (100) is deflected by more than the set angle.
5. The multi-dimensional detection system for COB multi-string and multi-parallel LED taping according to claim 1, characterized in that: The micro-lighting test station (7) is configured to apply a small current to the photoelectric device (100), take an image of the lamp beads of the photoelectric device (100) and compare it with an image of a qualified photoelectric device with all the lamp beads lit. If the image is inconsistent with the image of a qualified photoelectric device with all the lamp beads lit, it is identified as an unqualified lighting degree.
6. The multi-dimensional detection system for COB multi-string and multi-parallel LED stripping according to claim 2, characterized in that: A positioning station (11) is also provided between the loading position (22) and the electrical measuring station (4); the positioning station (11) is used to fix the photoelectric device (100) at the center position of the accommodating bin (21).
7. The multi-dimensional detection system for multi-string and multi-parallel COB LED stripping according to claim 4, characterized in that: The unloading assembly (3) includes a carrier tape (31), and the optoelectronic device (100) is unloaded onto the carrier tape (31) through the unloading position (23) and moves along the transport direction of the carrier tape (31); the taping system also includes a second optical inspection station (12), which is located above the carrier tape (31) and is configured to: capture a full-color image above the optoelectronic device (100) and compare it with a full-color image above a qualified optoelectronic device; if the similarity with the full-color image above the qualified optoelectronic device is less than a second set value, the optoelectronic device (100) is identified as unqualified.
8. The multi-dimensional detection system for COB multi-string and multi-parallel lamp taping according to claim 7 is characterized in that: The range of the first setting value is 50%-90%, and the range of the second setting value is 50%-90%.
9. The multi-dimensional detection system for COB multi-string and multi-parallel lamp taping according to claim 8 is characterized in that: A counting station (13) is also provided between the unloading position (23) and the third collecting station (10); the counting station (13) is configured to count the photoelectric devices (100) arriving at the counting station, and when the photoelectric devices (100) arriving at the counting station (13) reach a preset number, the loading assembly (1) stops loading.
10. The multi-dimensional detection system for COB multi-string and multi-parallel lamp taping according to claim 1 is characterized in that: A plurality of detection stations are evenly distributed between the loading position (22) and the unloading position (23).