An automatic temperature control method for an oven

Abstract

This invention discloses an automatic temperature control method for an oven, relating to the field of automatic temperature control technology. It addresses the problem of insufficient dynamic sensing of baking degree, leading to reduced quality of the baked product. By setting a baking time, the method detects the infrared radiation intensity of the target baking area and the carbon dioxide concentration inside the oven during this period to comprehensively assess the current baking degree. The target baking degree is obtained through interactive logs, and the risk of charring is assessed by combining deviations and smoke particle size. When a risk exists, the oven temperature is collected, and microwave power and inner wall reflectivity are detected to generate first and second adjustment temperatures. The target temperature is selected by combining historical baking times. Through real-time monitoring of multiple parameters, deviation analysis, and optimization using historical data, a closed-loop intelligent control of the baking process is achieved, helping to prevent charring or under-baking, and significantly improving baking uniformity, product quality, and operational efficiency.

Description

Technical Field

[0001] This invention relates to the field of automatic temperature control technology, and more specifically, to an automatic temperature control method for an oven. Background Technology

[0002] Most existing ovens rely on a single temperature sensor or a set time curve to control the heating process. In practical applications, the heating state of the baking target (such as meat, pastries, vegetables, etc.) is not only related to the oven temperature, but also affected by many factors such as the gas concentration inside the oven, the distribution of radiant heat, the characteristics of smoke, and the reflectivity of the materials.

[0003] The existing technology has the following shortcomings:

[0004] Currently, traditional temperature control methods typically employ fixed-power heating or on / off control based on preset times. These methods cannot identify the degree of baking and the risk of charring in real time. Furthermore, problems are only detected through smoke alarms or temperature surges when the food is about to char, resulting in delayed adjustments that affect baking quality. The lack of dynamic perception of the degree of baking leads to reduced quality of the finished product and increased baking risks. Therefore, an automatic temperature control method for ovens is proposed.

[0005] The information disclosed in the background section is only intended to enhance the understanding of the background of this disclosure, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0006] In order to overcome the above-mentioned defects of the prior art, the embodiments of the present invention provide an automatic temperature control method for an oven, which solves the problems mentioned in the background art by using intelligent control methods that combine multi-parameter real-time monitoring, deviation analysis and historical data optimization.

[0007] To achieve the above objectives, the present invention provides the following technical solution: an automatic temperature control method for an oven, comprising the following steps:

[0008] Step S1: Set the baking time, and during the baking time, detect the infrared radiation intensity of the target to be baked and the carbon dioxide concentration in the oven environment. Combine the infrared radiation intensity and carbon dioxide concentration to evaluate the current baking degree of the target to be baked.

[0009] Step S2: Retrieve the target baking degree of the baking target through the interaction log, calculate the baking degree deviation of the baking target in combination with the current baking degree, detect the smoke particle size in the oven environment, and determine whether there is a risk of charring of the baking target in combination with the baking degree deviation;

[0010] Step S3: When there is a risk of charring in the baking target, the current temperature of the oven is collected, the microwave output power and inner wall reflectivity of the oven are detected, and the first and second adjustment temperatures are generated by combining the current temperature.

[0011] Step S4: Obtain the historical baking time of the baking target, and select the first and second adjustment temperatures as the target temperature of the oven based on the historical baking time.

[0012] In a preferred embodiment, in step S1, a baking time is set, and during the baking time, the infrared radiation intensity of the target being baked and the carbon dioxide concentration inside the oven are collected in real time.

[0013] The infrared radiation intensity of the target to be baked is obtained by receiving infrared radiation through an infrared sensor installed on the side wall of the oven cavity.

[0014] In a preferred embodiment, in step S1, the carbon dioxide concentration inside the oven is collected by a gas concentration sensor arranged on the side wall of the oven cavity.

[0015] After standardizing the infrared radiation intensity and carbon dioxide concentration, the current baking degree of the target is obtained by weighted averaging.

[0016] In a preferred embodiment, in step S2, the target baking degree of the baking target is retrieved through the interaction log in the oven interface;

[0017] The difference between the current baking degree and the target baking degree is calculated to obtain the baking degree deviation of the target baking degree;

[0018] Particle size distribution data is obtained by using laser scattering particle sensors placed inside the oven cavity, and the average particle size is calculated as the smoke particle size of the oven's internal environment.

[0019] In a preferred embodiment, in step S2, based on the baking degree deviation and smoke particle size, it is determined whether the baking target has a risk of charring:

[0020] When the deviation in baking degree is greater than the deviation threshold and the smoke particle size is greater than the particle size threshold, it is determined that the baking target has a risk of coking.

[0021] Conversely, if the baking target does not pose a risk of charring, it is determined that there is no risk of charring.

[0022] In a preferred embodiment, in step S3, when there is a risk of charring in the baking target, a monitoring window is preset, and the temperature of the oven is collected at the beginning and end of the monitoring window by a thermocouple sensor inside the oven.

[0023] Use the oven temperature at the end of the monitoring window as the current temperature.

[0024] The ratio of the difference between the initial oven temperature and the current temperature in the monitoring window to the temperature change rate is taken as the temperature change rate.

[0025] The driving current and driving voltage of the microwave generator are obtained through the driving circuit of the microwave generator, and the product of the driving current and driving voltage is used as the microwave output power.

[0026] In a preferred embodiment, in step S3, after standardizing the microwave output power and temperature change rate, a first adjustment temperature is generated by combining the temperature change rate with the current temperature. ,in, The microwave output power after standardization. The temperature change rate after standardization. The preset adjustment coefficient, The current temperature. The first temperature setting is used.

[0027] In a preferred embodiment, in step S3, the reflectivity of the inner wall is retrieved from the oven control database, and the second adjustment temperature is calculated in conjunction with the current temperature. ,in, The preset reflectivity adjustment coefficient, The reflectivity of the inner wall, The current temperature. This is for the second temperature regulation.

[0028] In a preferred embodiment, in step S4, the historical baking time of the corresponding baking target is retrieved from the oven control database, and the median of the historical baking time is taken as the baking time threshold.

[0029] If the baking time exceeds the baking time threshold, the first and second adjustable temperatures are compared, and the minimum value is selected as the target temperature.

[0030] Conversely, the first and second adjustable temperatures are compared numerically, and the maximum value is selected as the target temperature.

[0031] The technical effects and advantages of this invention are as follows:

[0032] This invention sets a baking time and detects the infrared radiation intensity of the target being baked and the carbon dioxide concentration inside the oven during the baking time. It comprehensively assesses the current baking degree of the target by combining the infrared radiation intensity and carbon dioxide concentration. The target baking degree of the target is retrieved through interactive logs, and the baking degree deviation is calculated based on the current baking degree. The smoke particle size inside the oven is detected, and the baking degree deviation is used to determine if there is a risk of charring. If there is a risk of charring, the current oven temperature is collected, and the microwave output power and inner wall reflectivity of the oven are detected. A first and second adjustment temperature are generated based on the current temperature. The historical baking time of the target is obtained, and the first and second adjustment temperatures are selected as the target temperature of the oven based on the historical baking time. Through real-time monitoring of multiple parameters, deviation analysis, and optimization using historical data, a closed-loop intelligent control of the baking process is achieved, which helps prevent charring or underbaking, and significantly improves baking uniformity, finished product quality, and operational efficiency. Attached Figure Description

[0033] Figure 1 This is a flowchart illustrating the implementation of an automatic temperature control method for an oven according to the present invention.

[0034] Figure 2 This is a schematic diagram illustrating the steps of an automatic temperature control method for an oven according to the present invention. Detailed Implementation

[0035] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0036] This invention sets a baking time and detects the infrared radiation intensity of the target being baked and the carbon dioxide concentration inside the oven during the baking time. It comprehensively assesses the current baking degree of the target by combining the infrared radiation intensity and carbon dioxide concentration. The target baking degree of the target is retrieved through interactive logs, and the baking degree deviation is calculated based on the current baking degree. The smoke particle size inside the oven is detected, and the baking degree deviation is used to determine if there is a risk of charring. If there is a risk of charring, the current temperature of the oven is collected, and the microwave output power and inner wall reflectivity of the oven are detected. A first and second adjustment temperature are generated based on the current temperature. The historical baking time of the target is obtained, and the first and second adjustment temperatures are selected as the target temperature of the oven based on the historical baking time. Through a combination of multi-parameter real-time monitoring, deviation analysis, and historical data optimization, closed-loop intelligent control of the baking process is achieved.

[0037] Example 1

[0038] Please see Figures 1 to 2 An automatic temperature control method for an oven includes the following steps:

[0039] Step S1: Set the baking time, and during the baking time, detect the infrared radiation intensity of the target to be baked and the carbon dioxide concentration in the oven environment. Combine the infrared radiation intensity and carbon dioxide concentration to evaluate the current baking degree of the target to be baked.

[0040] Step S2: Retrieve the target baking degree of the baking target through the interaction log, calculate the baking degree deviation of the baking target in combination with the current baking degree, detect the smoke particle size in the oven environment, and determine whether there is a risk of charring of the baking target in combination with the baking degree deviation;

[0041] Step S3: When there is a risk of charring in the baking target, the current temperature of the oven is collected, the microwave output power and inner wall reflectivity of the oven are detected, and the first and second adjustment temperatures are generated by combining the current temperature.

[0042] Step S4: Obtain the historical baking time of the baking target, and select the first and second adjustment temperatures as the target temperature of the oven based on the historical baking time.

[0043] The specific implementation is as follows:

[0044] In step S1, the baking time is set. The baking time refers to the target heating time parameter that the operator inputs and confirms through the oven interface according to the type, weight and thickness of the baking target.

[0045] It should be noted that the oven interface refers to the human-computer interaction module used to realize information input and feedback between the operator and the oven, and can receive baking parameters input by the user.

[0046] During the baking time, the infrared radiation intensity of the target being baked and the carbon dioxide concentration inside the oven are collected in real time.

[0047] When the target is being baked, its surface will continuously emit infrared radiation. The infrared radiation is received by an infrared sensor set on the side wall of the oven cavity and converted into a current signal. The current signal is then converted into an infrared radiation intensity value to obtain the infrared radiation intensity of the target being baked.

[0048] The carbon dioxide concentration inside the oven is collected by a gas concentration sensor placed on the side wall of the oven cavity. The gas concentration sensor has a built-in light source that emits infrared light of a specific wavelength. Carbon dioxide molecules absorb the infrared light of the characteristic wavelength, which causes the intensity of transmitted light to decrease. The sensor receives the transmitted light signal and outputs a voltage value. Based on the Beer-Lambert law, the voltage value is converted into carbon dioxide concentration to obtain the carbon dioxide concentration inside the oven cavity.

[0049] It should be noted that an infrared sensor is a detection device used to receive the thermal radiation from the surface of a baking target and convert it into an electrical signal. Based on the principle of passive infrared detection, its sensitive wavelength covers the range of 2–20 μm, and it responds to the thermal radiation released by the baking target during the baking process. The gas concentration sensor is a non-dispersive infrared carbon dioxide detection module. It has a built-in light source that emits infrared light of a specific wavelength. After passing through the gas measurement cavity, it is partially absorbed by carbon dioxide molecules. The remaining light signal is selectively transmitted to a photodetector through a filter. The photodetector converts the intensity of the transmitted light into an electrical signal. The Beer-Lambert law states that when light propagates in a homogeneous medium, its intensity decreases logarithmically with the concentration of the absorbing substance in the medium and the optical path length.

[0050] After standardizing the infrared radiation intensity and carbon dioxide concentration, the current baking degree of the target is obtained using a weighted average method. The specific calculation formula is as follows:

[0051] ;

[0052] in, The current degree of baking is the target level. Infrared radiation intensity, This refers to the concentration of carbon dioxide. and The weighting coefficients are determined by experimentally measuring the response curves of infrared radiation intensity changes and carbon dioxide concentration changes to the degree of baking for different baking targets under standard baking conditions. The contribution ratio of each to the evaluation of the degree of baking is analyzed to determine their values. For example, for baking targets with high moisture content, infrared radiation intensity is more sensitive to the degree of surface baking, so the infrared radiation weight can be set to 0.7 and the carbon dioxide concentration weight to 0.3. For baking targets where the change in carbon dioxide caused by internal moisture evaporation is more obvious, the infrared radiation weight can be set to 0.4 and the carbon dioxide concentration weight to 0.6.

[0053] In step S2, the target baking degree of the baking target is retrieved through the interaction log in the oven interface. The target baking degree is a standardized baking parameter preset by the operator based on the type, weight and thickness of the baking target.

[0054] It should be noted that the interaction log refers to the data set used by the oven control system to record the interaction behavior between the operator and the oven and the system response information, including but not limited to the baking parameters entered by the operator through the oven's interactive interface.

[0055] The difference between the current baking degree and the target baking degree is calculated to obtain the baking degree deviation of the baking target.

[0056] After obtaining the baking degree deviation, the smoke particle size in the oven's internal environment is further detected. A monochromatic laser beam is emitted into the oven cavity by a laser scattering particle sensor arranged in the oven cavity. When smoke particles pass through the laser beam, they are scattered. The scattered light is received by the photodetector built into the laser scattering particle sensor and converted into an current signal. Based on the Mie scattering theory, the current signal is converted into particle size distribution data, and the average particle size is calculated as the smoke particle size in the oven's internal environment.

[0057] It should be noted that a laser scattering particle sensor is an optical measurement device used to detect the particle size of smoke particles inside an oven cavity. It includes a laser emitting module, a photodetector, and a signal processing unit. The laser emitting module emits a monochromatic, coherent laser beam into the oven cavity. When there are tiny particles in the air, the particles will scatter the laser beam. The scattered light is received by the photodetector and converted into an electrical signal. After processing the electrical signal, the particle size distribution is obtained. Mie scattering theory is a mathematical theory that describes the scattering characteristics when light interacts with spherical particles with diameters similar to the wavelength of light. Based on Maxwell's equations, it solves for the scattering and absorption of incident electromagnetic waves by spherical particles, and can accurately describe the scattering intensity and angular distribution of light by particles of different sizes and refractive indices.

[0058] Based on the deviation in baking degree and smoke particle size, determine whether the baking target has a risk of charring:

[0059] When the deviation in baking degree is greater than the deviation threshold and the smoke particle size is greater than the particle size threshold, it is determined that the baking target has a risk of coking.

[0060] Conversely, if the baking target does not pose a risk of charring, it is determined that there is no risk of charring.

[0061] It should be noted that the deviation threshold is determined through experimental data and the characteristics of the baking target. For different types of baking targets, the distribution of the difference between the target baking degree and the actual baking degree is recorded under standard baking conditions. The critical point of baking deviation on the charring or under-baking of the baking target is analyzed, and thus the deviation threshold is set. For example, for a certain baking target, it can be found through multiple batches of experiments that when the baking degree deviation exceeds 0.15, its surface begins to show excessive browning. Therefore, the deviation threshold is set to 0.15. The particle size threshold is based on the correlation analysis between the distribution of smoke particles inside the oven and the charring risk of the baking target. Smoke particle size data are collected at different baking stages, and an empirical model is established by combining the observation results of the charring phenomenon of the baking target, so as to determine the particle size threshold. For example, for a certain baking target, when the average particle size of the smoke measured by the laser scattering particle sensor exceeds 12μm, the experiment shows that its surface is prone to local charring. Therefore, the particle size threshold is set to 12μm.

[0062] In step S3, when there is a risk of charring in the baking target, a monitoring window is preset, and the temperature of the oven is collected at the beginning and end of the monitoring window by a thermocouple sensor inside the oven.

[0063] It should be explained that a thermocouple sensor is a temperature acquisition device built on the principle of thermoelectric effect, used to collect the temperature of an oven.

[0064] The oven temperature at the end of the monitoring window is taken as the current temperature.

[0065] The ratio of the difference between the initial oven temperature and the current temperature in the monitoring window to the temperature change rate is taken as the temperature change rate.

[0066] When the rate of temperature change is greater than 0, the first regulating temperature is generated;

[0067] Conversely, the current temperature will be maintained.

[0068] The driving current and driving voltage of the microwave generator are obtained through the driving circuit of the microwave generator, and the product of the driving current and driving voltage is used as the microwave output power.

[0069] After standardizing the microwave output power and temperature change rate, the first adjustment temperature is generated based on the current temperature. ,in, The microwave output power after standardization. The temperature change rate after standardization. The preset adjustment coefficient, The current temperature. The first temperature setting is used.

[0070] It should be explained that the preset monitoring window is used to limit the start and end times of temperature acquisition, and can be set according to the type of baking target and historical baking experience. For example, the preset monitoring window can be set to 5 seconds or 10 seconds. The drive circuit of the microwave generator refers to the control module used to supply power to the microwave source and adjust the output power. In this embodiment, it is used to acquire the drive current and drive voltage of the microwave generator. The preset adjustment coefficient is used to adjust the amplitude of temperature change and is set according to the actual baking environment and the adaptability requirements of the baking target. For example, when the baking target needs to maintain temperature stability, the preset adjustment coefficient can be set to 0.3. The standardization processing method includes, but is not limited to, standard linear transformation based on interval scaling, statistical Z-Score standardization method, or normalization method based on nonlinear mapping function. The application method of standardization processing will not be elaborated here.

[0071] Microwave output power is used to reflect the rate at which the microwave source releases heat energy into the oven cavity per unit time. By comparing the microwave output power with the rate of temperature change, it is determined whether there is excessively rapid heat transfer within the oven. When a risk of charring is detected in the baking target, if the microwave output power is high and the rate of temperature change increases, it indicates that the heat energy in the oven cavity is transferred to the internal environment of the oven faster. The microwave output power is used in conjunction with the current temperature to generate a first regulating temperature to prevent heat energy from continuing to accumulate and to suppress the charring trend.

[0072] The internal wall reflectivity refers to the ability of the inner wall of the oven cavity to reflect incident microwaves. It is pre-calibrated through experiments based on the material and coating of the inner wall of the oven and stored as a model parameter in the oven control database. The value of the internal wall reflectivity ranges from 0 to 1. The higher the internal wall reflectivity, the stronger the ability to reflect incident microwaves and the higher the degree of temperature concentration. The lower the internal wall reflectivity, the stronger the absorption ability of incident microwaves and the more uniform the temperature distribution.

[0073] The oven control database is used to retrieve the reflectivity of the inner wall, and the second adjustable temperature is calculated based on the current temperature. ,in, The preset reflectivity adjustment coefficient, The reflectivity of the inner wall, The current temperature. For second temperature regulation;

[0074] It should be explained that the oven control database refers to the database in the oven used to store and retrieve parameters related to the baking target, the oven's physical parameters and operating parameters. It stores the historical baking time for different baking targets and the oven's inner wall reflectivity, etc. The preset reflectivity adjustment coefficient is used to quantify the influence of the inner wall reflectivity on temperature regulation. It is set by professionals according to different oven cavity structures. For example, the preset reflectivity adjustment coefficient is set to 0.5.

[0075] In step S4, the historical baking time of the corresponding baking target is retrieved through the oven control database, and the median of the historical baking time is taken as the baking time threshold.

[0076] If the baking time exceeds the baking time threshold, the first and second adjustable temperatures are compared, and the minimum value is selected as the target temperature.

[0077] Conversely, the first and second adjustable temperatures are compared numerically, and the maximum value is selected as the target temperature.

[0078] Adjust the temperature inside the oven cavity to the target temperature.

[0079] When the baking time exceeds the baking time threshold, the target needs a longer heating cycle. If the target temperature is too high during a long baking process, the risk of charring is higher. By selecting a lower adjustment temperature as the target temperature, the baking time can be guaranteed while suppressing the risk of charring. When the baking time is less than or equal to the baking time threshold, the target needs a shorter heating cycle. If the target temperature is too low, the target may not be fully cooked. By selecting a higher adjustment temperature as the target temperature, the risk of charring can be suppressed while ensuring that the target is fully cooked in a shorter time.

[0080] The above formulas are all dimensionless calculations. The formulas are derived from software simulations based on a large amount of collected data to obtain the most recent real-world results. The preset parameters in the formulas are set by those skilled in the art according to the actual situation.

[0081] The above embodiments can be implemented, in whole or in part, by software, hardware, firmware, or any other combination thereof. When implemented using software, the above embodiments can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more sets of available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium. The semiconductor medium can be a solid-state drive.

[0082] It should be understood that the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. A and B can be singular or plural. Additionally, the character " / " in this article generally indicates an "or" relationship between the preceding and following related objects, but it can also represent an "and / or" relationship. Please refer to the context for a more accurate understanding.

[0083] In this application, "at least one" means one or more, and "more than one" means two or more. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or multiple items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.

[0084] It should be understood that in the various embodiments of this application, the order of the above-mentioned processes does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0085] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0086] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0087] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0088] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0089] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0090] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0091] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of protection of the above specification.

Claims

1. An automatic temperature control method for an oven, characterized in that: Includes the following steps: Step S1: Set the baking time, and during the baking time, detect the infrared radiation intensity of the target to be baked and the carbon dioxide concentration in the oven environment. Combine the infrared radiation intensity and carbon dioxide concentration to evaluate the current baking degree of the target to be baked. Step S2: Retrieve the target baking degree of the baking target through the interaction log, calculate the baking degree deviation of the baking target in combination with the current baking degree, detect the smoke particle size in the oven environment, and determine whether there is a risk of charring of the baking target in combination with the baking degree deviation; Step S3: When there is a risk of charring in the baking target, the current temperature of the oven is collected, the microwave output power and inner wall reflectivity of the oven are detected, and the first and second adjustment temperatures are generated by combining the current temperature. Step S4: Obtain the historical baking time of the target baking time, and select the first and second adjustment temperatures as the target oven temperature based on the historical baking time; In step S4, the historical baking time of the corresponding baking target is retrieved through the oven control database, and the median of the historical baking time is taken as the baking time threshold. If the baking time exceeds the baking time threshold, the first and second adjustable temperatures are compared, and the minimum value is selected as the target temperature. Conversely, the first and second adjustable temperatures are compared numerically, and the maximum value is selected as the target temperature.

2. The automatic temperature control method for an oven according to claim 1, characterized in that: In step S1, the baking time is set, and during the baking time, the infrared radiation intensity of the target being baked and the carbon dioxide concentration inside the oven are collected in real time. The infrared radiation intensity of the target to be baked is obtained by receiving infrared radiation through an infrared sensor installed on the side wall of the oven cavity.

3. The automatic temperature control method for an oven according to claim 2, characterized in that: In step S1, the carbon dioxide concentration inside the oven is collected by a gas concentration sensor arranged on the side wall of the oven cavity; After standardizing the infrared radiation intensity and carbon dioxide concentration, the current baking degree of the target is obtained by weighted averaging.

4. The automatic temperature control method for an oven according to claim 3, characterized in that: In step S2, the target baking degree of the baking target is retrieved through the interaction log in the oven interface; The difference between the current baking degree and the target baking degree is calculated to obtain the baking degree deviation of the target baking degree; Particle size distribution data is obtained by using laser scattering particle sensors placed inside the oven cavity, and the average particle size is calculated as the smoke particle size of the oven's internal environment.

5. The automatic temperature control method for an oven according to claim 4, characterized in that: In step S2, based on the baking degree deviation and smoke particle size, it is determined whether the baking target has a risk of charring: When the deviation in baking degree is greater than the deviation threshold and the smoke particle size is greater than the particle size threshold, it is determined that the baking target has a risk of coking. Conversely, if the baking target does not pose a risk of charring, it is determined that there is no risk of charring.

6. The automatic temperature control method for an oven according to claim 1, characterized in that: In step S3, when there is a risk of charring in the baking target, a monitoring window is preset, and the temperature of the oven is collected at the beginning and end of the monitoring window by a thermocouple sensor inside the oven. Use the oven temperature at the end of the monitoring window as the current temperature. The ratio of the difference between the initial oven temperature and the current temperature in the monitoring window to the temperature change rate is taken as the temperature change rate. The driving current and driving voltage of the microwave generator are obtained through the driving circuit of the microwave generator, and the product of the driving current and driving voltage is used as the microwave output power.

7. The automatic temperature control method for an oven according to claim 6, characterized in that: In step S3, after standardizing the microwave output power and temperature change rate, the first adjustment temperature is generated by combining the temperature change rate with the current temperature. ,in, The microwave output power after standardization. The temperature change rate after standardization. The preset adjustment coefficient, The current temperature. The first temperature setting is used.

8. The automatic temperature control method for an oven according to claim 1, characterized in that: In step S3, the reflectivity of the inner wall is retrieved from the oven control database, and the second adjustment temperature is calculated in conjunction with the current temperature. ,in, The preset reflectivity adjustment coefficient, The reflectivity of the inner wall, The current temperature. This is for the second temperature regulation.

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