CTP battery Block test tool

Abstract

The invention relates to a CTP battery Block test tool, and the tool is characterized in that the tool comprises a test bottom plate which is provided with a first positive electrode and a first negative electrode; the probe plate comprises a positive electrode module and a negative electrode module, and a plurality of probe units are arranged on the positive electrode module and the negative electrode module; all probe units contained in the positive electrode module are connected in series to form a first series structure; all the probe units contained in the negative electrode module are connected in series to form a second series structure; the test bottom plate is connected in series with the first series structure and the second series structure through the first positive electrode and the first negative electrode to form a third series structure; and the pressing piece is connected with the test bottom plate and the probe plate and is used for driving the probe plate to move, so that the technical problems that a traditional test tool cannot realize the overall performance evaluation after multiple battery cells are connected in series or in parallel and is difficult to meet efficient and comprehensive test requirements in the prior art are solved.

Description

Technical Field

[0001] This application relates to the field of CTP battery pack testing, and in particular to a CTP battery block testing fixture. Background Technology

[0002] With the rapid development of new energy vehicle technology, CTP (Cell to Pack) batteries have become the mainstream solution due to their high energy density and simplified structure. Their core lies in directly integrating the cell into the battery pack, eliminating the module layer that serves as the intermediate load-bearing component in traditional battery packs. Traditional battery packs employ a three-tiered structure of "cell-module-pack," while CTP, through structural optimization, eliminates the module layer and directly arranges and packages the cells into the battery pack. This makes the smallest integrated unit (block) between a single cell and the battery pack a direct part of the pack. In the CTP battery production process, the performance testing of the block is a crucial step in ensuring battery quality and safety.

[0003] In actual testing, traditional testing equipment can only test the voltage and insulation performance of individual cells in a CTP battery block one by one. It cannot achieve overall performance evaluation after multiple cells are connected in series or parallel. This results in the loss of key parameters such as total voltage, differential voltage and insulation withstand voltage, making it difficult to fully verify the reliability and consistency of the block module, and thus failing to meet the requirements for efficient and comprehensive testing. Summary of the Invention

[0004] This application provides a CTP battery block test fixture to solve the technical problem that traditional test fixtures in related technologies cannot achieve overall performance evaluation after multiple cells are connected in series or parallel, and are difficult to meet the requirements of efficient and comprehensive testing.

[0005] This application provides a CTP battery block testing fixture, which includes: The test base plate is equipped with a first positive electrode and a first negative electrode; A probe plate includes a positive electrode module and a negative electrode module, and multiple probe units are provided on both the positive electrode module and the negative electrode module; All the probe units contained in the positive electrode module are connected in series to form a first series structure; All the probe units contained in the negative electrode module are connected in series to form a second series structure; The test base plate is connected in series with the first positive electrode, the first negative electrode, the first series structure, and the second series structure to form a third series structure; And a pressing element, which is connected to the test base plate and the probe plate, and is used to drive the probe plate to move.

[0006] In one embodiment, the two outermost probe units in the first series structure respectively constitute the positive and negative ends of the first series structure; In the second series structure, the two outermost probe units constitute the positive and negative ends of the second series structure, respectively; In the first series structure and the second series structure, the positive terminal of one is connected to the negative terminal of the other; In the first series structure and the second series structure, the remaining negative terminal is connected to the first positive terminal of the test base plate, and the remaining positive terminal is connected to the first negative terminal of the test base plate.

[0007] In one embodiment, the probe unit includes: Two probe mounting bases are disposed at a distance from each other on the probe plate along one of a first direction and a second direction. Each probe mounting base is fitted with a first probe and a second probe. The first probe is used to connect a single battery cell at one end of the bottom of the probe mounting base, and the first probe is used to connect a test device at one end of the top of the probe mounting base. The second probe is used to connect to a single battery cell at one end of the bottom of the probe mounting base, and the second probe is used to connect to the second probe on the adjacent probe unit at one end of the probe mounting base; Wherein, the first direction is one of the probe plate length direction and the probe plate width direction, and the second direction is the other of the probe plate length direction and the probe plate width direction.

[0008] In one embodiment, when two probe mounting bases are spaced apart on the probe plate along a first direction; The positive electrode module and the negative electrode module are spaced apart along the first direction of the probe plate, and multiple probe units connected in series are arranged on both the positive electrode module and the negative electrode module along the second direction.

[0009] In one embodiment, when two probe mounting bases are spaced apart on the probe plate along a second direction; The positive electrode module and the negative electrode module are spaced apart along the first direction of the probe plate, and multiple probe units connected in series are arranged on both the positive electrode module and the negative electrode module along the second direction.

[0010] In one embodiment, each of the probe mounting bases is provided with two first probes and two second probes, with the two first probes connected in parallel and the two second probes connected in parallel.

[0011] In one embodiment, a support member is provided on the test base plate along its length direction, and the pressing member includes: The L-shaped support rod has one end mounted on the support member and the other end hinged to a pressing handle. In addition, a connecting arm, one end of which is hinged to the pressing handle, and the other end of which is hinged to a pressing shaft, the pressing shaft being connected to the probe plate.

[0012] In one embodiment, a CTP battery block testing fixture further includes: The return spring has its two ends along its length connected to the probe plate and the test base plate, respectively.

[0013] In one embodiment, a CTP battery block testing fixture further includes: Several spare probes are inserted into the test base plate.

[0014] In one embodiment, the test base plate is provided with support feet at the bottom, and the test base plate has multiple hollow holes.

[0015] The beneficial effects of the technical solution provided in this application include: during the block test of CTP batteries, a pressing component is used to drive the probe plate to move and connect the probe plate to the CTP battery. Each probe unit is connected to a single cell in the CTP battery block and is used to connect to the testing device, thereby performing voltage and insulation tests on the single cell in the CTP battery block. While connecting to a single cell, multiple probe units on the positive electrode module are connected in series to form a first series structure, and multiple probe units on the negative electrode module are connected in series to form a second series structure. Then, a third series structure is formed by connecting the first positive electrode, the first negative electrode, and the first and second series structures in series on the test base plate. This allows all probe units on the probe plate, i.e., all cells in a single block, to be connected in series, thereby performing voltage and insulation tests on the entire block. The structure is simple and can measure the voltage and insulation of a single cell or the entire CTP battery individually, providing a more comprehensive test. This solves the technical problem in related technologies where traditional testing fixtures cannot achieve overall performance evaluation after multiple cells are connected in series or parallel, making it difficult to meet the needs of efficient and comprehensive testing.

[0016] This application provides a CTP battery block testing fixture. Since the probe units on the probe board can be connected in series with a positive electrode module and a negative electrode module while being connected to a single cell, the voltage and insulation of a single cell or the entire CTP battery can be measured separately, making the test more comprehensive and efficient. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 A schematic diagram of a CTP battery block testing fixture structure provided in this application embodiment; Figure 2 This is a schematic diagram of the probe plate in an embodiment of this application; In the diagram: 1. Test base plate; 11. First positive electrode; 12. First negative electrode; 13. Support component; 14. Reset spring; 15. Support foot; 16. Spare probe; 17. Hole; 2. Probe plate; 21. Positive electrode module; 22. Negative electrode module; 23. Probe unit; 231. Probe mounting base; 232. First probe; 233. Second probe; 3. Pressing component; 31. L-shaped support rod; 311. Pressing handle; 32. Connecting arm; 321. Pressing shaft. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0020] This application provides a CTP battery block test fixture, which can solve the technical problem that traditional test fixtures in related technologies cannot achieve overall performance evaluation after multiple cells are connected in series or in parallel, and are difficult to meet the requirements of efficient and comprehensive testing.

[0021] Reference Figure 1 and Figure 2This application provides a CTP battery block testing fixture, which includes a test base plate 1, a probe plate 2, and a pressing component 3. The test base plate 1 is provided with a first positive electrode 11 and a first negative electrode 12. During CTP battery block testing, the first positive electrode 11 and the first negative electrode 12 are connected to the testing device. The probe plate 2 is divided into a positive electrode module 21 and a negative electrode module 22. Both the positive electrode module 21 and the negative electrode module 22 are provided with multiple probe units 23. The probe units 23 are used to connect to the positive and negative electrodes of a single cell in the CTP battery and are connected to the testing device so that the tester can detect the voltage and insulation performance of a single cell. The multiple probes located on the positive electrode module 21... The probe units 23 are connected in series to form a first series structure by connecting multiple cells connected to the probe units 23 on the positive electrode module 21. The probe units 23 on the negative electrode module 22 are connected in series to form a second series structure by connecting multiple cells connected to the probe units 23 on the negative electrode module 22. The test base plate 1 forms a third series structure by connecting the first positive electrode 11, the first negative electrode 12, the first series structure, and the second series structure. This allows all the cells connected to the probe plate 2 to form a complete circuit. The test device is then connected to the first positive electrode 11 and the first negative electrode 12 to test the voltage and insulation of the overall CTP battery block.

[0022] The test base plate 1 and the probe plate 2 are connected by a pressing component 3, which is used to drive the probe plate 2 to move. When performing voltage testing on the CTP battery block, the CTP battery block is placed on a flat surface, and the test base plate 1 and the probe plate 2 are positioned above the CTP battery block. The pressing component 3 pushes the probe plate 2 toward the CTP battery block, thereby completing the connection between multiple probe units 23 on the probe plate 2 and multiple cells on the CTP battery block. This allows for simultaneous voltage and insulation testing of the entire CTP battery block and individual cells within it, making the testing more comprehensive. This solves the technical problem in related technologies where traditional testing fixtures cannot achieve overall performance evaluation after multiple cells are connected in series or parallel, making it difficult to meet the needs of efficient and comprehensive testing.

[0023] More specifically, in the first series structure, the two outermost probe units 23 constitute the positive and negative terminals of the first series structure, respectively. In the second series structure, the two outermost probe units 23 constitute the positive and negative terminals of the second series structure, respectively. When performing overall performance testing of the CTP battery block, one positive terminal of the first series structure and the other negative terminal of the second series structure are connected together. Then, the remaining negative terminal is connected to the first positive terminal 11 on the test base plate 1, and the remaining positive terminal is connected to the first negative terminal 12 on the test base plate 1. This allows multiple cells to be connected in series to form a complete circuit. Then, the test device is connected to the first positive terminal 11 and the first negative terminal 12 to perform voltage and insulation testing of the overall CTP battery block.

[0024] For example, in one embodiment of this application, the first positive electrode 11 of the test base plate 1 is connected to the negative terminal of the first series structure, the positive terminal of the first series structure is connected to the negative terminal of the second series structure, and finally the positive terminal of the second series structure is connected to the first negative electrode 12 of the test base plate 1. This allows for the voltage and insulation testing of the entire CTP battery block. In other embodiments, the current connection direction after the first positive electrode 11, the first negative electrode 12, the first series structure, and the second series structure form a third series structure can be changed according to the actual connection convenience.

[0025] Furthermore, a single probe unit 23 includes two probe mounting bases 231, which are spaced apart on the probe plate 2 along one of a first direction and a second direction. A first probe 232 and a second probe 233 are inserted into each probe mounting base 231, both passing through the probe mounting base 231. The first probe 232 is used to connect to a single battery cell at its bottom end and to connect to a testing device at its top end, thus enabling the two probe mounting bases 231 to... The two first probes 232 are connected to the positive and negative terminals of a single cell at one end of the bottom of the probe mounting base 231, and the two first probes 232 are connected to the test device at one end of the top of the probe mounting base 231, so as to perform voltage and insulation tests on a single cell; the second probe 233 is used to connect a single cell at one end of the bottom of the probe mounting base 231, and the second probe 233 is used to connect to the second probe 233 on the adjacent probe unit 23, so that the adjacent probe units 23 can be connected in series, thereby completing the overall series connection of all single cells on the probe board 2.

[0026] The first direction is one of the length direction and the width direction of the probe plate 2, and the second direction is the other of the length direction and the width direction of the probe plate 2. For example, in this embodiment, the two probe mounting bases 231 are spaced apart along the width direction of the probe plate 2.

[0027] Furthermore, when the two probe mounting bases 231 are spaced apart on the probe plate 2 along the first direction, the positive electrode module 21 and the negative electrode module 22 are spaced apart along the first direction of the probe plate 2, and both the positive electrode module 21 and the negative electrode module 22 have multiple probe units 23 connected in series along the second direction. Taking the embodiment of this application as an example, in this embodiment, the first direction is the width direction of the probe plate 2, and the second direction is the length direction of the probe plate 2. When the two probe mounting bases 231 are spaced apart on the probe plate 2 along the width direction of the probe plate 2, the positive electrode module 21 and the negative electrode module 22 of the probe plate 2 are spaced apart along the width direction of the probe plate 2, and both the positive electrode module 21 and the negative electrode module 22 have multiple probe units 23 connected in series along the length direction of the probe plate 2.

[0028] In other embodiments of this application, the two probe mounting bases 231 may also be spaced apart on the probe plate 2 along its length, and the positive electrode module 21 and the negative electrode module 22 may be spaced apart along its width. Both the positive electrode module 21 and the negative electrode module 22 may have multiple probe units 23 connected in series along the length of the probe plate 2. The specific connection method can be determined according to the arrangement of adjacent individual cells in the CTP battery block, so that multiple probe units 23 on the probe plate 2 can be connected in series with individual cells to form an overall circuit.

[0029] To reduce the possibility of a single faulty probe causing an overall circuit break during testing, in one embodiment of this application, each probe mounting base 231 is provided with two first probes 232 and two second probes 233. The two first probes 232 are connected in parallel, and the two second probes 233 are also connected in parallel. When one probe fails and breaks the circuit, the other probe can continue to conduct electricity during testing. Furthermore, during the testing process, the probe with significantly different data from other probes can be quickly identified based on the data on the testing device, allowing for timely repair. Multiple spare probes 16 are provided on the test base plate 1. When a probe shows a significant deviation in data, the tester can promptly replace the probe to continue testing.

[0030] More specifically, the test base plate 1 is provided with support feet 15 at its bottom, thereby raising the placement height of the test base plate 1. When conducting CTP battery block testing, the CTP battery block is placed between the support feet 15 along the length of the test base plate 1. To further reduce the overall weight of the testing fixture, the test base plate 1 is also provided with multiple perforated holes 17, providing a lightweight design for the manufacture of the test base plate 1.

[0031] The pressing component 3 specifically includes an L-shaped support rod 31 and a connecting arm 32. A support member 13 is provided on the surface of the test base plate 1 along its length. One end of the L-shaped support rod 31 is fixed to the support member 13 by bolts to raise the installation height of the L-shaped support rod 31. The other end of the L-shaped support rod 31 is hinged to a pressing handle 311. One end of the connecting arm 32 is hinged to the pressing handle 311, and the other end is hinged to a pressing shaft 321. The pressing shaft 321 is fixedly connected to the probe plate 2. When connecting the probe plate 2 and the CTP battery block below the probe unit 23, the CTP battery block is placed under the test base plate 1 and the probe plate 2. After aligning the multiple probes with the individual cells on the CTP battery block, the pressing handle 311 is pressed down. The connecting arm 32 drives the pressing shaft 321 to push the probe plate 2 downward, thereby completing the connection between the probe plate 2 and the CTP battery block.

[0032] To facilitate the reset of the probe plate 2, a reset spring 14 is also provided on the test base plate 1. Its two ends in the length direction are connected to the probe plate 2 and the test base plate 1 respectively. After the CTP battery block test is completed, the press handle 311 is released, and the reset spring 14 can drive the probe plate 2 to reset to the initial state, which facilitates the next CTP battery block voltage test and makes it more convenient to use.

[0033] In the description of this application, it should be noted that the terms "upper," "lower," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Unless otherwise expressly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0034] It should be noted that in this application, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0035] The above description is merely a specific embodiment of this application, enabling those skilled in the art to understand or implement this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A CTP battery block testing fixture, characterized in that, It includes: The test base plate (1) is provided with a first positive electrode (11) and a first negative electrode (12). The probe plate (2) includes a positive electrode module (21) and a negative electrode module (22), and multiple probe units (23) are provided on both the positive electrode module (21) and the negative electrode module (22). All probe units (23) contained in the positive electrode module (21) are connected in series to form a first series structure; All probe units (23) contained in the negative electrode module (22) are connected in series to form a second series structure; The test base plate (1) is connected in series with the first positive electrode (11), the first negative electrode (12), the first series structure, and the second series structure to form a third series structure; In addition, a pressing element (3) is connected to the test base plate (1) and the probe plate (2) and is used to drive the probe plate (2) to move.

2. The CTP battery block testing fixture as described in claim 1, characterized in that: The two outermost probe units (23) in the first series structure constitute the positive and negative ends of the first series structure, respectively; The two outermost probe units (23) in the second series structure constitute the positive and negative ends of the second series structure, respectively; In the first series structure and the second series structure, the positive terminal of one is connected to the negative terminal of the other; In the first series structure and the second series structure, the remaining negative terminal is connected to the first positive terminal (11) of the test base plate (1), and the remaining positive terminal is connected to the first negative terminal (12) of the test base plate (1).

3. The CTP battery block testing fixture as described in claim 2, characterized in that, The probe unit (23) includes: Two probe mounting bases (231) are provided on the probe plate (2) at intervals along one of the first and second directions. A first probe (232) and a second probe (233) are inserted into each probe mounting base (231). The first probe (232) is used to connect a single cell at one end of the bottom of the probe mounting base (231), and the first probe (232) is used to connect a test device at one end of the top of the probe mounting base (231). The second probe (233) is used to connect a single cell at one end of the bottom of the probe mounting base (231), and the second probe (233) is used to connect the second probe (233) on the adjacent probe unit (23) at one end of the top of the probe mounting base (231). The first direction is one of the length direction and the width direction of the probe plate (2), and the second direction is the other of the length direction and the width direction of the probe plate (2).

4. The CTP battery block testing fixture as described in claim 3, characterized in that: When the two probe mounting bases (231) are spaced apart on the probe plate (2) along the first direction; The positive electrode module (21) and the negative electrode module (22) are spaced apart along a first direction, and both the positive electrode module (21) and the negative electrode module (22) are provided with a plurality of probe units (23) connected in series along a second direction.

5. The CTP battery block testing fixture as described in claim 3, characterized in that: When the two probe mounting bases (231) are spaced apart on the probe plate (2) along the second direction; The positive electrode module (21) and the negative electrode module (22) are spaced apart along a first direction, and both the positive electrode module (21) and the negative electrode module (22) are provided with a plurality of probe units (23) connected in series along a second direction.

6. The CTP battery block testing fixture as described in claim 3, characterized in that: Each of the probe mounting bases (231) is provided with two first probes (232) and two second probes (233), with the two first probes (232) connected in parallel and the two second probes (233) connected in parallel.

7. The CTP battery block testing fixture as described in claim 1, characterized in that: A support member (13) is provided on the test base plate (1) along its length direction, and the pressing member (3) includes: L-shaped support rod (31), one end of which is set on the support member (13), and the other end is hinged to a pressing handle (311). In addition, a connecting arm (32) is hinged at one end to the pressing handle (311) and at the other end to a pressing shaft (321), which is connected to the probe plate (2).

8. The CTP battery block testing fixture as described in claim 1, characterized in that, Also includes: The reset spring (14) has its two ends in the length direction connected to the probe plate (2) and the test base plate (1), respectively.

9. The CTP battery block testing fixture as described in claim 1, characterized in that, Also includes: Several spare probes (16) are inserted on the test base plate (1).

10. A CTP battery block testing fixture as described in claim 1, characterized in that: The test base plate (1) is provided with a support foot (15) at the bottom, and the test base plate (1) is provided with multiple hollow holes (17).

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