Chip performance testing device and testing method thereof

Abstract

The invention discloses a chip performance testing device and method, and the device comprises a feeding mechanism, a testing platform, a limiting adjustment assembly, a chip adsorption assembly, a supporting sliding assembly, an adsorption processing assembly, a tail end adjustment assembly, a side sealing assembly, a testing mechanism, and a testing probe. The bottom of the pushing cylinder is fixedly connected with a fine adjustment motor; according to the invention, the test mechanism is used as a three-axis adjusting mechanism of the device and is combined with the tail end adjusting assembly to adjust the inclination angle of the test probe relative to the chip, so that the complex actual test requirements are met, and the practicability of the device is improved; the positioning process of the chip is automatically completed through the limiting adjusting assembly before testing, manual participation is not needed, and the labor cost of chip testing is reduced; after positioning is completed, the supporting sliding assembly is matched with the adsorption processing assembly to remove dust and impurities remaining on the chip, it is avoided that the dust and the impurities are attached to a testing point to affect the testing result, and the testing precision of the device is guaranteed.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip performance testing, in particular to a chip performance testing device and a testing method thereof. BACKGROUND

[0002] Chip performance testing is a key link to evaluate the performance level of chips in different aspects. The main purpose of performance testing is to evaluate the performance of chips in actual application, including key indicators such as processing speed, computing power, and response time. Through performance testing, it can be ensured that the chip can meet the design requirements and the needs of application scenarios, thereby improving the overall performance of the product and the user experience. The existing device for chip performance testing can basically meet the daily use requirements, but still has certain deficiencies. Firstly, the test probe of the existing testing device is generally matched with a three-axis structure to adjust the test position, but due to the structure design of the three-axis transmission, the inclination angle of the probe relative to the chip cannot be adjusted during the test process, and the test point position cannot be accurately controlled, which makes it difficult to meet the complex actual test requirements, affecting the practicality of the device. Secondly, the existing testing device has single functionality, and manual positioning and clamping of the chip are required before testing, which increases the labor cost of the chip testing process. Thirdly, the existing testing device cannot remove dust and impurities on the chip before testing the test point, and the dust and impurities attached to the test point will affect the testing process of the device. Therefore, it is necessary to design a chip performance testing device and a testing method thereof. SUMMARY

[0003] The present application aims to provide a chip performance testing device and a testing method thereof to solve the problems raised in the background.

[0004] In order to achieve the above object, the present application provides the following technical scheme: a chip performance testing device, comprising a feeding mechanism, a test platform, a limiting adjustment assembly, a chip adsorption assembly, a supporting sliding assembly, an adsorption processing assembly, a tail end adjusting assembly, a side sealing assembly, a test mechanism and a test probe, the feeding mechanism is composed of a feeding belt, a supporting plate, a feeding motor, a supporting wheel, a transmission wheel, a clamping groove and a fixed clamping block, the top of the feeding belt is uniformly provided with the test platform, the inside top of the test platform is symmetrically provided with a push bracket in the limiting adjustment assembly, the push bracket is provided with a push air cylinder, the bottom of the push air cylinder is fixedly connected with a fine adjustment motor, and the output end of the fine adjustment motor is fixedly connected with a limiting wheel; the bearing seat symmetrically arranged on the top of the test platform is rotatably connected with a sliding lead screw in the supporting sliding assembly, the sliding lead screw is provided with a sliding table, and the sliding table is connected with the sliding lead screw in a matched mode through a ball nut embedded and installed in the sliding table, the sliding table is symmetrically provided with a down pressure air cylinder in the chip adsorption assembly, and one side of the sliding table is provided with an expansion table in the adsorption processing assembly; one side of the test platform is provided with a lateral bracket in the side sealing assembly; the supporting plate is uniformly provided with a lifting frame in the test mechanism, and the test mechanism is composed of the lifting frame, a lifting air cylinder, a translation bracket, a translation air cylinder, a horizontal push air cylinder, a horizontal translation frame, a guide rod and a limiting frame.

[0005] As a further technical scheme of the present application, the limiting adjustment assembly is composed of a push bracket, a push air cylinder, a fine adjustment motor, a limiting wheel, a supporting table and a supporting shaft, the supporting table is fixed in the test platform, and the supporting shaft is rotatably connected in the groove uniformly arranged on the top of the supporting table.

[0006] As a further technical scheme of the present application, the test platforms are hingedly connected with each other, and the bottom center of the test platform is provided with a fixed clamping block, the fixed clamping block is connected in the clamping groove in a matched mode, and the clamping groove is uniformly arranged on the feeding belt.

[0007] As a further technical scheme of the present application, the supporting wheel and the transmission wheel are respectively and cooperatively wound on the supporting wheel and the transmission wheel in the feeding belt, and the supporting wheel and the transmission wheel are rotatably connected on the supporting plate through bearings, one side of the supporting plate is fixedly installed with the feeding motor, and the output end of the feeding motor is fixedly connected on the transmission wheel.

[0008] As a further technical scheme of the present application, the supporting sliding assembly is composed of a sliding lead screw, a sliding table, a shaft coupling and a sliding motor, the sliding motor is embedded and installed in the groove symmetrically arranged on one side of the top of the test platform, the output end of the sliding motor is provided with the shaft coupling, and the shaft coupling is connected on one end of the sliding table in a matched mode.

[0009] As a further technical scheme of the present application, the chip adsorption assembly is composed of a downward pressing cylinder, a vacuum pump, a negative pressure shell, a connecting plate and a negative pressure connector, the output end of the downward pressing cylinder is fixedly connected with the connecting plate, the bottom of the connecting plate is provided with the negative pressure shell, the negative pressure shell is slidingly connected in the sliding table, the bottom of the negative pressure shell is uniformly provided with the negative pressure connector, the negative pressure shell is connected with the vacuum pump, and the vacuum pump is fixed on the top side of the sliding table.

[0010] As a further technical scheme of the present application, the adsorption treatment assembly is composed of an extension table, a top cylinder, an adsorption shell, a mounting plate, a rotary motor, a rolling brush wheel, an air suction pump and a collection shell, the top of the extension table is symmetrically provided with the top cylinder, the output end of the top cylinder penetrates through the extension table and is fixedly connected with the adsorption shell, the bottom of the adsorption shell is symmetrically provided with the mounting plate on both sides, the mounting plate is symmetrically provided with the rotary motor on one side, the output end of the rotary motor penetrates through the mounting plate and is fixedly connected with the rolling brush wheel; the top of the adsorption shell is symmetrically provided with the air suction pump, one side of the air suction pump is provided with the collection shell, and the input end and the output end of the air suction pump are in communication with the adsorption shell and the collection shell, respectively.

[0011] As a further technical scheme of the present application, the side sealing assembly is composed of a side support, a limiting frame, a sealing plate, a rack, a transmission gear and a gear motor, the bottom of the side support is provided with the limiting frame, the limiting frame and the side support are slidingly connected with the sealing plate, the rack is embedded and mounted in the symmetrically formed grooves on one side of the sealing plate, the rack is meshingly connected with the transmission gear, the transmission gear is fixed on the output end of the gear motor, and the gear motor is symmetrically fixed on the bottom of the test platform.

[0012] As a further technical scheme of the present application, the lifting frame is provided with a lifting cylinder, the lifting cylinder is fixed on the translation support, the translation support is provided with a translation cylinder, the bottom of the translation cylinder is fixedly connected with a horizontal pushing cylinder, the output end of the horizontal pushing cylinder is fixedly connected with a horizontal moving frame, one side of the horizontal moving frame is provided with a guide rod, the guide rod is slidingly connected in the limiting frame, and the limiting frame is slidingly connected on the top of the translation support; the first motor in the tail end adjusting assembly is fixedly sleeved in the horizontal moving frame, the tail end adjusting assembly is composed of the first motor, a first support, a second motor and a second support, the output end of the first motor is fixedly connected with the first support, the first support is fixedly sleeved with the second motor, the output end of the second motor is fixedly connected with the second support, and the second support is fixedly sleeved with the test probe.

[0013] A chip performance test method, comprising the following steps: step one, positioning; step two, cleaning before detection; step three, measuring point detection; step four, pushing detection;

[0014] In step one above, the test platform is first evenly placed on the feeding belt by the cooperation of the card slot and the fixed card block. Then, the feeding motor drives the transmission wheel to rotate, and the feeding belt moves the test platform to the feeding end. After the chip to be tested is placed on the support platform of the test platform, the feeding motor drives the transmission wheel to rotate in the opposite direction, moving the test platform to the bottom of the test probe in sequence. During the movement, the push cylinder drives the fine adjustment motors on both sides to move closer to each other along the push bracket. The limit wheel on the output end of the fine adjustment motor is used to center the chip. Then, the fine adjustment motor drives the limit wheel to rotate, and the chip is pressed against the inner wall of the test platform by friction to complete the positioning process.

[0015] In step two above, after positioning is completed, the sliding motor drives the sliding screw to rotate. Through the cooperation between the sliding screw and the ball nut embedded in the sliding table, the sliding table moves along the axis of the sliding screw to the top of the chip. Then, the top cylinder drives the adsorption shell to move down, so that the roller brush is pressed tightly on the chip. Subsequently, the symmetrically arranged rotary motor drives the roller brush to rotate relative to each other. At the same time, the exhaust pump adsorbs the impurities and dust from the roller brush into the collection shell.

[0016] In step three above, after the impurities and dust are cleaned, the adsorption shell is returned to its original position by the sliding motor and the top cylinder. Then, the translational support is moved up and down along the lifting frame by the lifting cylinder, the translational cylinder moves the horizontal push cylinder along the translational support, and the horizontal push cylinder moves the horizontal frame along the guide rod axis, forming a three-axis adjustment mechanism to adjust the spatial position of the test probe and test the test points on the chip. During the test, the first support is rotated by the first motor according to the actual position of the test point, and at the same time, the second motor drives the test probe on the second support to rotate around the axis of the output end of the second motor. Combined with the three-axis adjustment mechanism, the tilt angle of the test probe relative to the chip is adjusted to meet the complex actual test requirements.

[0017] In step four above, after the test point is completed, the test probe is first driven back to its original position. During the repositioning process, the gear motor drives the transmission gear to rotate. The meshing of the transmission gear and the rack causes the sealing plate to move down along the limit frame and the side bracket, releasing the enclosure of the test platform. Then, the sliding motor drives the sliding screw to rotate. Through the cooperation between the sliding screw and the ball nut embedded inside the sliding stage, the sliding stage moves along the axis of the sliding screw to the top of the chip. Then, the pressing cylinder drives the connecting plate to move down and press the negative pressure connector tightly against the top side of the chip board. Then, the vacuum pump provides negative pressure to the negative pressure shell to fix the chip. Finally, the limit wheel on the output end of the fine-tuning motor moves the interface of one end of the chip out of the test platform for subsequent testing.

[0018] Compared with the prior art, the chip performance testing device and the testing method have the advantages that: in the testing process, the three-axis adjusting mechanism is used to adjust the spatial position of the testing probe, and the test points on the chip are tested; in the testing process, the first motor is used to drive the first support to rotate, and the second motor is used to drive the testing probe on the second support to flip around the axis direction of the second motor output end, so that the inclination angle of the testing probe relative to the chip is adjusted in combination with the three-axis adjusting mechanism, the complex actual testing requirement is met, and the practicability of the equipment is improved; the transmission wheel is reversely rotated by the feeding motor, the testing platform is sequentially moved to the bottom of the testing probe, the two sides of the testing platform are moved to each other by the push cylinder during the movement, the chip is positioned by the limit wheel on the output end of the fine adjustment motor, then the fine adjustment motor is used to drive the limit wheel to rotate, the chip is positioned on the inner wall of the testing platform by friction, manual participation in the positioning process is not needed, and the labor cost of chip testing is reduced; after the positioning is completed, the sliding screw is rotated by the sliding motor, the sliding table is moved to the top of the chip along the axis direction of the sliding screw by cooperation of the sliding screw and the ball nut embedded in the sliding table, then the top cylinder drives the adsorption shell to move downwards, the brush wheel is tightly pressed on the chip, then the brush wheel is relatively rotated by the rotation motor arranged in a symmetrical mode, and the impurities and dust of the brush wheel are sucked into the collecting shell by the air suction pump. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 It is a three-dimensional view of the overall structure of the application;

[0020] Figure 2 It is a three-dimensional view of the overall structure of the application; Figure 1 It is a partial enlarged view of region A in the three-dimensional view;

[0021] Figure 3 It is a right view of the overall structure of the application;

[0022] Figure 4 It is an exploded view of the partial structure of the application;

[0023] Figure 5 It is a three-dimensional view of the overall structure of the application; Figure 4 It is a partial enlarged view of region A in the three-dimensional view;

[0024] Figure 6 It is a three-dimensional view of the overall structure of the application; Figure 4 It is a partial enlarged view of region B in the three-dimensional view;

[0025] Figure 7 It is a three-dimensional view of the overall structure of the application; Figure 4 It is a partial enlarged view of region C in the three-dimensional view;

[0026] Figure 8 The schematic diagram of the installation position of the fixed clamping block in the application;

[0027] Figure 9 The flow chart of the test method of the application;

[0028] In the figure: 1, feeding mechanism; 2, test platform; 3, limiting adjustment assembly; 4, chip adsorption assembly; 5, support sliding assembly; 6, adsorption processing assembly; 7, tail end adjustment assembly; 8, side closing assembly; 9, test mechanism; 10, test probe; 11, feeding belt; 13, support plate; 14, feeding motor; 15, support wheel; 16, transmission wheel; 17, clamping groove; 18, fixed clamping block; 31, push bracket; 32, push cylinder; 33, fine adjustment motor; 34, limiting wheel; 35, support table; 36, support shaft; 41, downward pressing cylinder; 42, vacuum pump; 43, negative pressure shell; 44, connecting plate; 45, negative pressure connector; 51, sliding screw; 52, sliding table; 53, coupling; 54, sliding motor; 61, extension table; 62, top cylinder; 63, adsorption shell; 64, mounting plate; 65, rotary motor; 66, rolling brush wheel; 67, air suction pump; 68, collection shell; 71, first motor; 72, first bracket; 73, second motor; 74, second bracket; 81, lateral bracket; 82, limiting frame; 83, closing plate; 84, rack; 85, transmission gear; 86, gear motor; 91, lifting frame; 92, lifting cylinder; 93, translation bracket; 94, translation cylinder; 95, horizontal pushing cylinder; 96, horizontal translation frame; 97, guide rod; 98, limiting frame. DETAILED DESCRIPTION

[0029] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by a person of ordinary skill in the art without creative work fall within the protection scope of the application.

[0030] Please refer to the drawings in the embodiments of the application Figure 1 - the drawings in the embodiments of the application Figure 8The application provides a chip performance testing device, which comprises a feeding mechanism 1, a testing platform 2, a limiting adjustment assembly 3, a chip adsorption assembly 4, a supporting sliding assembly 5, an adsorption processing assembly 6, a tail end adjustment assembly 7, a side sealing assembly 8, a testing mechanism 9 and a testing probe 10. The feeding mechanism 1 is composed of a feeding belt 11, a supporting plate 13, a feeding motor 14, a supporting wheel 15, a transmission wheel 16, a clamping groove 17 and a fixed clamping block 18. The top of the feeding belt 11 is uniformly provided with the testing platform 2. The inside top of the testing platform 2 is symmetrically provided with a push bracket 31 in the limiting adjustment assembly 3. The push bracket 31 is provided with a push air cylinder 32. The bottom of the push air cylinder 32 is fixedly connected with a fine adjustment motor 33. The output end of the fine adjustment motor 33 is fixedly connected with a limiting wheel 34. The top of the testing platform 2 is symmetrically provided with a bearing seat, and the supporting sliding assembly 5 is rotatably connected with a sliding lead screw 51 in the bearing seat. The sliding lead screw 51 is provided with a sliding table 52. The sliding table 52 is connected with the sliding lead screw 51 in a matched mode through a ball nut embedded and installed in the sliding table 52. The sliding table 52 is symmetrically provided with a lower pressing air cylinder 41 in the chip adsorption assembly 4. One side of the sliding table 52 is provided with an expansion table 61 in the adsorption processing assembly 6. One side of the testing platform 2 is provided with a lateral bracket 81 in the side sealing assembly 8. The supporting plate 13 is uniformly provided with a lifting frame 91 in the testing mechanism 9. The testing mechanism 9 is composed of the lifting frame 91, a lifting air cylinder 92, a translation bracket 93, a translation air cylinder 94, a horizontal pushing air cylinder 95, a horizontal translation frame 96, a guide rod 97 and a limiting frame 98. The limiting adjustment assembly 3 is composed of the push bracket 31, the push air cylinder 32, the fine adjustment motor 33, the limiting wheel 34, a supporting table 35 and a supporting shaft 36. The supporting table 35 is fixed in the testing platform 2. The supporting shaft 36 is rotatably connected with a groove uniformly opened in the top of the supporting table 35. The testing platforms 2 are hingedly connected with each other. The bottom center of the testing platform 2 is provided with the fixed clamping block 18 which is connected in the clamping groove 17 in a matched mode. The clamping groove 17 is uniformly opened in the feeding belt 11. The supporting wheel 15 and the transmission wheel 16 are respectively and cooperatively wound around the feeding belt 11. The supporting wheel 15 and the transmission wheel 16 are rotatably connected with the supporting plate 13 through bearings. One side of the supporting plate 13 is fixedly provided with the feeding motor 14. The output end of the feeding motor 14 is fixedly connected with the transmission wheel 16. The supporting sliding assembly 5 is composed of the sliding lead screw 51, the sliding table 52, a shaft coupling 53 and a sliding motor 54. The sliding motor 54 is embedded and installed in a groove symmetrically opened in the top of the testing platform 2. The output end of the sliding motor 54 is provided with the shaft coupling 53 which is connected with one end of the sliding table 52 in a matched mode.The chip adsorption assembly 4 is composed of a downward pressing cylinder 41, a vacuum pump 42, a negative pressure shell 43, a connecting plate 44 and a negative pressure connector 45, the output end of the downward pressing cylinder 41 is fixedly connected with the connecting plate 44, the bottom of the connecting plate 44 is provided with the negative pressure shell 43, the negative pressure shell 43 is slidingly connected in the sliding table 52, and the bottom of the negative pressure shell 43 is uniformly provided with the negative pressure connector 45, the negative pressure shell 43 is matched and connected on the vacuum pump 42, and the vacuum pump 42 is fixed on the top side of the sliding table 52; the adsorption processing assembly 6 is composed of an extension table 61, a top cylinder 62, an adsorption shell 63, a mounting plate 64, a rotary motor 65, a rolling brush wheel 66, an air suction pump 67 and a collection shell 68, the top of the extension table 61 is symmetrically provided with the top cylinder 62, the output end of the top cylinder 62 penetrates through the extension table 61 and is fixedly connected on the adsorption shell 63, the bottom of the adsorption shell 63 is symmetrically provided with the mounting plate 64 on both sides, one side of the mounting plate 64 is symmetrically provided with the rotary motor 65, and the output end of the rotary motor 65 penetrates through the mounting plate 64 and is fixedly connected on the rolling brush wheel 66; the top of the adsorption shell 63 is symmetrically provided with the air suction pump 67, one side of the air suction pump 67 is provided with the collection shell 68, and the input end and the output end of the air suction pump 67 are in communication with the adsorption shell 63 and the collection shell 68 respectively; the side sealing assembly 8 is composed of a side support 81, a limiting frame 82, a sealing plate 83, a rack 84, a transmission gear 85 and a gear motor 86, the bottom of the side support 81 is provided with the limiting frame 82, the limiting frame 82 and the side support 81 are slidingly connected with the sealing plate 83, the rack 84 is embedded and mounted in the recesses symmetrically opened on one side of the sealing plate 83, the rack 84 is in meshing connection with the transmission gear 85, the transmission gear 85 is fixed on the output end of the gear motor 86, and the gear motor 86 is symmetrically fixed on the bottom of the test platform 2; the lifting frame 91 is provided with a lifting cylinder 92, the lifting cylinder 92 is fixed on the translation support 93, the translation support 93 is provided with a translation cylinder 94, the bottom of the translation cylinder 94 is fixedly connected with a horizontal pushing cylinder 95, the output end of the horizontal pushing cylinder 95 is fixedly connected with a horizontal moving frame 96, one side of the horizontal moving frame 96 is provided with a guide rod 97, the guide rod 97 is slidingly connected in the limiting frame 98, and the limiting frame 98 is slidingly connected on the top of the translation support 93; the first motor 71 in the tail end adjusting assembly 7 is fixedly sleeved in the horizontal moving frame 96, the tail end adjusting assembly 7 is composed of the first motor 71, a first support 72, a second motor 73 and a second support 74, the output end of the first motor 71 is fixedly connected with the first support 72, the first support 72 is fixedly sleeved with the second motor 73, the output end of the second motor 73 is fixedly connected with the second support 74, the second support 74 is fixedly sleeved with the test probe 10, and the second motor 73 is used for adjusting the overturning angle of the test probe 10, and at the same time, the first motor 71 drives the first support 72 to rotate, so that the orientation of the test probe 10 after overturning can be adjusted.

[0031] Please refer to the attached drawings Figure 9The application provides a chip performance testing method, which comprises the following steps: step one, feeding and positioning; step two, pre-detection cleaning; step three, measuring point detection; and step four, pushing detection.

[0032] In the step one, the test platform 2 is uniformly placed on the feeding belt 11 through the cooperation of the clamping groove 17 and the fixed clamping block 18, then the feeding motor 14 drives the transmission wheel 16 to rotate, and the test platform 2 is moved to the feeding end by the feeding belt 11, after the chip to be tested is placed on the support table 35 of the test platform 2, the transmission wheel 16 is reversely rotated by the feeding motor 14, the test platform 2 is sequentially moved to the bottom of the test probe 10, the two sides of the fine adjustment motor 33 are driven to move close to each other along the push bracket 31 by the push air cylinder 32 during the moving process, the center line of the chip is positioned by the limiting wheel 34 on the output end of the fine adjustment motor 33, then the limiting wheel 34 is rotated by the fine adjustment motor 33, and one side of the chip is pressed on the inner wall of the test platform 2 by friction to complete the positioning process;

[0033] In the step two, after the positioning is completed, the sliding screw 51 is rotated by the sliding motor 54, the sliding table 52 is moved to the top of the chip along the axis direction of the sliding screw 51 by the cooperation of the sliding screw 51 and the ball nut embedded in the sliding table 52, then the suction shell 63 is driven to move down by the top air cylinder 62, the brush wheel 66 is tightly pressed on the chip, then the brush wheel 66 is relatively rotated by the rotation motor 65 arranged symmetrically, and the impurities and dust of the brush are sucked into the collecting shell 68 by the air pump 67;

[0034] In the step three, after the impurities and dust are cleaned, the suction shell 63 is returned to the original position by the sliding motor 54 and the top air cylinder 62, then the translation bracket 93 is moved up and down along the lifting frame 91 by the lifting air cylinder 92, the horizontal push air cylinder 95 is moved along the translation bracket 93 by the translation air cylinder 94, the horizontal moving frame 96 is moved along the axis of the guide rod 97 by the horizontal push air cylinder 95, a three-axis adjustment mechanism is formed to adjust the spatial position of the test probe 10, and the measuring point on the chip is tested; during the testing process, the first bracket 72 is rotated by the first motor 71 according to the actual position of the measuring point, the test probe 10 on the second bracket 74 is flipped around the axis direction of the output end of the second motor 73 by the second motor 73, the inclination angle of the test probe 10 relative to the chip is adjusted by the three-axis adjustment mechanism, and the complex actual testing requirement is met.

[0035] In the above step four, after the test point test is completed, the test probe 10 is first returned to the home position, the transmission gear 85 is driven to rotate by the gear motor 86 during the returning process, the closed plate 83 is moved downward along the limiting frame 82 and the lateral support 81 by the mutual meshing of the transmission gear 85 and the rack 84, the test platform 2 is released from the closure, then the sliding screw 51 is driven to rotate by the sliding motor 54, the sliding table 52 is moved to the top of the chip along the axis direction of the sliding screw 51 by the mutual cooperation of the sliding screw 51 and the ball nut embedded and installed in the sliding table 52, then the lower cylinder 41 drives the connecting plate 44 to move downward to tightly press the negative pressure connector 45 on the top side of the chip plate, then the vacuum pump 42 provides negative pressure for the negative pressure shell 43 to fix the chip, then the limiting wheel 34 on the output end of the fine adjustment motor 33 moves the interface on one end of the chip out of the test platform 2 for subsequent testing.

[0036] Based on the above, the advantages of the present application are that, during the test process, the translation support 93 is moved up and down along the lifting frame 91 by the lifting cylinder 92, the horizontal push cylinder 95 is moved along the translation support 93 by the translation cylinder 94, the horizontal translation frame 96 is moved along the axis of the guide rod 97 by the horizontal push cylinder 95, a three-axis adjustment mechanism is formed to adjust the spatial position of the test probe 10, and the test points on the chip are tested; during the test process, the first support 72 is rotated by the first motor 71 according to the actual position of the test point, and the test probe 10 on the second support 74 is flipped around the axis direction of the output end of the second motor 73 by the second motor 73, and the three-axis adjustment mechanism adjusts the inclination angle of the test probe 10 relative to the chip, which meets the complex actual test requirements and improves the practicality of the equipment; the test platform 2 is moved to the bottom of the test probe 10 in turn by driving the transmission wheel 16 to rotate in the opposite direction by the feeding motor 14, during the movement process, the fine adjustment motors 33 on both sides are brought closer to each other along the push support 31 by the push cylinder 32, and the chip is centered by the limiting wheel 34 on the output end of the fine adjustment motor 33, then the fine adjustment motor 33 drives the limiting wheel 34 to rotate, and the chip is positioned by friction by pressing one side of the chip against the inner wall of the test platform 2, which eliminates the need for manual positioning and reduces the labor cost of chip testing; after positioning is completed, the sliding screw 51 is driven to rotate by the sliding motor 54, the sliding table 52 is moved to the top of the chip along the axis direction of the sliding screw 51 by the mutual cooperation of the sliding screw 51 and the ball nut embedded and installed in the sliding table 52, then the top cylinder 62 drives the adsorption shell 63 to move downward, the brush wheel 66 is tightly pressed on the chip, then the symmetrical rotary motor 65 drives the brush wheel 66 to rotate relative to each other, and the dust and impurities of the brush are sucked into the collection shell 68 by the exhaust pump 67.

[0037] It will be apparent to those skilled in the art that the application is not limited to the details of the above-exemplified embodiments and that the present application can be implemented in other particular forms without departing from the spirit or essential characteristics of the present application. The embodiments should therefore be considered in all respects as illustrative and not restrictive, the scope of the application being indicated by the appended claims rather than by the above description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. No reference signs in the claims should be considered as limiting the scope of the claims with respect to the figures of the patent document.

Claims

1. A chip performance testing device, comprising a feeding mechanism (1), a testing platform (2), a limit adjustment component (3), a chip adsorption component (4), a support sliding component (5), an adsorption processing component (6), a tail end adjustment component (7), a side sealing component (8), a testing mechanism (9), and a testing probe (10), characterized in that: The feeding mechanism (1) is composed of a feeding belt (11), a supporting plate (13), a feeding motor (14), a supporting wheel (15), a transmission wheel (16), a clamping groove (17) and a fixed clamping block (18), the top of the feeding belt (11) is uniformly provided with a test platform (2), the inside top of the test platform (2) is symmetrically provided with a push bracket (31) in the limiting adjustment assembly (3), the push bracket (31) is provided with a push air cylinder (32), the bottom of the push air cylinder (32) is fixedly connected with a fine adjustment motor (33), and the output end of the fine adjustment motor (33) is fixedly connected with a limiting wheel (34); the bearing seat symmetrically arranged on the top of the test platform (2) is rotatably connected with a sliding lead screw (51) in the supporting sliding assembly (5), the sliding lead screw (51) is provided with a sliding table (52), and the sliding table (52) is connected with the sliding lead screw (51) through the ball nut embedded and installed inside, the sliding table (52) is symmetrically provided with a lower pressing air cylinder (41) in the chip adsorption assembly (4), and one side of the sliding table (52) is provided with an expansion table (61) in the adsorption treatment assembly (6); one side of the test platform (2) is provided with a lateral support (81) in the side sealing assembly (8); the supporting plate (13) is uniformly provided with a lifting frame (91) in the test mechanism (9), and the test mechanism (9) is composed of the lifting frame (91), a lifting air cylinder (92), a translation bracket (93), a translation air cylinder (94), a horizontal pushing air cylinder (95), a horizontal moving frame (96), a guide rod (97) and a limiting frame (98).

2. The chip performance test apparatus according to claim 1, wherein: The limiting adjustment assembly (3) is composed of a push bracket (31), a push air cylinder (32), a fine adjustment motor (33), a limiting wheel (34), a supporting table (35) and a supporting shaft (36), the supporting table (35) is fixed in the test platform (2), and the supporting table (35) is rotatably connected with the supporting shaft (36) in the uniformly formed grooves on the top of the supporting table (35).

3. The chip performance test apparatus according to claim 2, wherein: The test platforms (2) are hingedly connected with each other, and the bottom center of the test platform (2) is provided with a fixed clamping block (18), the fixed clamping block (18) is connected in the clamping groove (17), and the clamping groove (17) is uniformly formed in the feeding belt (11).

4. The chip performance test apparatus according to claim 3, wherein: The supporting wheel (15) and the transmission wheel (16) are respectively and correspondingly wound on the feeding belt (11), and the supporting wheel (15) and the transmission wheel (16) are rotatably connected on the supporting plate (13) through bearings, one side of the supporting plate (13) is fixedly installed with the feeding motor (14), and the output end of the feeding motor (14) is fixedly connected on the transmission wheel (16).

5. The chip performance test apparatus according to claim 1, wherein: The supporting sliding assembly (5) is composed of a sliding lead screw (51), a sliding table (52), a shaft coupling (53) and a sliding motor (54), the sliding motor (54) is embeddedly installed in the recess symmetrically formed on one side of the top of the test platform (2), the output end of the sliding motor (54) is provided with the shaft coupling (53), and the shaft coupling (53) is connected on one end of the sliding table (52).

6. The chip performance test apparatus according to claim 1, wherein: The chip adsorption assembly (4) is composed of a downward air cylinder (41), a vacuum pump (42), a negative pressure shell (43), a connecting plate (44) and a negative pressure connector (45), the output end of the downward air cylinder (41) is fixedly connected with the connecting plate (44), the bottom of the connecting plate (44) is provided with the negative pressure shell (43), the negative pressure shell (43) is slidingly connected in the sliding table (52), the bottom of the negative pressure shell (43) is uniformly provided with the negative pressure connector (45), the negative pressure shell (43) is connected with the vacuum pump (42), and the vacuum pump (42) is fixed on the top side of the sliding table (52).

7. The chip performance test apparatus according to claim 1, wherein: The adsorption treatment assembly (6) is composed of an extension table (61), a top air cylinder (62), an adsorption shell (63), a mounting plate (64), a rotary motor (65), a rolling brush wheel (66), an air suction pump (67) and a collection shell (68), the top of the extension table (61) is symmetrically provided with the top air cylinder (62), the output end of the top air cylinder (62) penetrates through the extension table (61) and is fixedly connected to the adsorption shell (63), the bottom of the adsorption shell (63) is symmetrically provided with the mounting plate (64) on both sides, one side of the mounting plate (64) is symmetrically provided with the rotary motor (65), the output end of the rotary motor (65) penetrates through the mounting plate (64) and is fixedly connected to the rolling brush wheel (66); the top of the adsorption shell (63) is symmetrically provided with the air suction pump (67), one side of the air suction pump (67) is provided with the collection shell (68), and the input end and the output end of the air suction pump (67) are in communication with the adsorption shell (63) and the collection shell (68) respectively.

8. The chip performance test apparatus according to claim 1, wherein: The side sealing assembly (8) is composed of a lateral support (81), a limiting frame (82), a sealing plate (83), a rack (84), a transmission gear (85) and a gear motor (86), the bottom of the lateral support (81) is provided with the limiting frame (82), the limiting frame (82) and the lateral support (81) are slidingly connected with the sealing plate (83), the rack (84) is embedded and installed in the recesses symmetrically formed on one side of the sealing plate (83), the rack (84) is in meshing connection with the transmission gear (85), the transmission gear (85) is fixed on the output end of the gear motor (86), and the gear motor (86) is symmetrically fixed on the bottom of the test platform (2).

9. The chip performance test apparatus according to claim 1, wherein: The lifting frame (91) is provided with a lifting cylinder (92) fixed on a translation bracket (93), the translation bracket (93) is provided with a translation cylinder (94), the bottom of the translation cylinder (94) is fixedly connected with a horizontal pushing cylinder (95), the output end of the horizontal pushing cylinder (95) is fixedly connected with a horizontal moving frame (96), one side of the horizontal moving frame (96) is provided with a guide rod (97) slidingly connected in a limiting frame (98) slidingly connected on the top of the translation bracket (93); the horizontal moving frame (96) is fixedly sleeved with the first motor (71) in the tail end adjusting assembly (7), the tail end adjusting assembly (7) is composed of the first motor (71), a first bracket (72), a second motor (73) and a second bracket (74), the output end of the first motor (71) is fixedly connected with the first bracket (72), the first bracket (72) is fixedly sleeved with the second motor (73), the output end of the second motor (73) is fixedly connected with the second bracket (74), and the second bracket (74) is fixedly sleeved with the test probe (10).

10. A method of testing the performance of a chip, comprising the steps of: The step one is loading positioning, the step two is pre-detection cleaning, the step three is measuring point detection, and the step four is pushing detection. In the step one, the test platform (2) is uniformly placed on the feeding belt (11) through the cooperation of the clamping groove (17) and the fixed clamping block (18), then the feeding motor (14) drives the transmission wheel (16) to rotate, and the test platform (2) is moved to the discharging end by the feeding belt (11), after the chip to be tested is placed on the support table (35) of the test platform (2), the transmission wheel (16) is reversely rotated by the feeding motor (14), the test platform (2) is sequentially moved to the bottom of the test probe (10), and the center line of the chip is positioned by the limiting wheel (34) on the output end of the fine adjustment motor (33) through the cooperation of the top pushing cylinder (32) and the fine adjustment motor (33) on both sides to move closer to each other along the top pushing bracket (31) during the movement process, and then the fine adjustment motor (33) drives the limiting wheel (34) to rotate, and the chip is positioned by friction on the inner wall of the test platform (2); In the step two, after positioning, the sliding motor (54) drives the sliding lead screw (51) to rotate, the sliding lead screw (51) and the sliding table (52) are embedded with a ball nut, the sliding table (52) is moved to the top of the chip along the axis direction of the sliding lead screw (51), then the top cylinder (62) drives the adsorption shell (63) to move downward, the roller brush wheel (66) is tightly pressed on the chip, then the symmetrical rotary motor (65) drives the roller brush wheel (66) to relatively rotate, and the impurities and dust of the roller brush are sucked into the collecting shell (68) by matching the air suction pump (67). Wherein the above step three, after the impurities and dust cleaning is completed through the slip motor (54) and the top cylinder (62) drive adsorption shell (63) home, after through the lifting cylinder (92) drive translation bracket (93) along the lifting frame (91) up and down, translation cylinder (94) drive horizontal push cylinder (95) along the translation bracket (93) moves, horizontal push cylinder (95) drive horizontal translation frame (96) along the guide rod (97) axis moves, constitute three axis adjustment mechanism adjustment test probe (10) space position, and test the test point on the chip; During testing, according to the actual position of the test point through the first motor (71) drive first bracket (72) rotation, while the second motor (73) drive second bracket (74) on the test probe (10) around the second motor (73) output end axis direction flip, match three axis adjustment mechanism adjustment test probe (10) relative to the inclination angle of chip, meet the complex actual test demand; Wherein the above step four, after the test point test is completed through first drive test probe (10) home, in the process of homing through gear motor (86) drive transmission gear (85) rotation, using transmission gear (85) and rack (84) of mutual meshing makes closed plate (83) along the limit frame (82) and lateral support (81) down, remove the closure to test platform (2), then through the slip motor (54) drive slip screw (51) rotation, through the slip screw (51) and slip table (52) inside embedded installation ball nut of mutual cooperation makes slip table (52) along the axis direction of slip screw (51) moves to the top of chip, then down pressure cylinder (41) drive connecting plate (44) down will negative pressure connector (45) tight pressure in the top side of chip board, then through the vacuum pump (42) for negative pressure shell (43) provides negative pressure to chip fixed, then match the output end of fine adjustment motor (33) on the limit wheel (34) will chip one end of the interface out of test platform (2) for subsequent testing.

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