Mainboard test system

Abstract

The invention provides a mainboard test system, which comprises an external device, a PC mainboard, a backlight power supply circuit and an AC-to-DC circuit, and the external device comprises a storage board or a control device. The PC mainboard is electrically connected with external equipment, the control end of the backlight power supply circuit and the control end of the AC-to-DC circuit, the input end of the AC-to-DC circuit is electrically connected with an AC power supply, the first output end of the AC-to-DC circuit is electrically connected with the input end of the backlight power supply circuit, and the output end of the backlight power supply circuit is electrically connected with a display screen. In the test system, the PC mainboard, the backlight power supply circuit and the AC-to-DC circuit can be tested without the participation of a display screen, so that the test cost is reduced.

Description

Technical Field

[0001] This invention relates to the field of motherboard testing, and particularly to a motherboard testing system. Background Technology

[0002] In the manufacturing process of modern electronic products, testing the quality and reliability of the products is of paramount importance.

[0003] For all-in-one computers equipped with an Embedded DisplayPort (EDP) display, it is often necessary to test the PC motherboard, backlight power supply circuit, and AC-to-DC converter circuit. Currently, these tests are typically performed by electrically connecting the display to the motherboard.

[0004] However, when there are a large number of motherboards to be tested, the above testing scheme requires a large number of displays, resulting in high testing costs. Moreover, since the motherboards have not been tested, their stability is insufficient, which increases the possibility of display damage, further increasing testing costs. Summary of the Invention

[0005] This invention provides a motherboard testing system that eliminates the need for a monitor in conjunction with the motherboard, thereby reducing testing costs.

[0006] This invention provides a motherboard testing system, comprising an external device, a PC motherboard, a backlight power supply circuit, and an AC-to-DC converter. The external device includes a storage board or a control device. The PC motherboard is electrically connected to the external device, the control terminal of the backlight power supply circuit, and the control terminal of the AC-to-DC converter. The input terminal of the AC-to-DC converter is electrically connected to an AC power source, the first output terminal of the AC-to-DC converter is electrically connected to the input terminal of the backlight power supply circuit, and the output terminal of the backlight power supply circuit is electrically connected to a display screen. The PC motherboard outputs a power-on signal to the AC-to-DC converter to control its operation. If the external device includes a storage board, the PC motherboard further acquires extended display identifier data stored on the storage board and outputs a first backlight control signal to the backlight power supply circuit based on the extended display identifier data to control its operation. If the external device includes a control device, the external device outputs a first control signal to the PC motherboard, and the PC motherboard further outputs a second backlight control signal to the backlight power supply circuit based on the first control signal to control its operation.

[0007] In this embodiment, a storage board or control device is used in conjunction with a PC motherboard to control the operation of the backlight power supply circuit and the AC-to-DC circuit, allowing testing to be performed without the need for a display screen, thus reducing testing costs.

[0008] In some embodiments, the PC motherboard includes a CPU and a control chip. The CPU is electrically connected to the control terminal of the backlight power supply circuit and the control chip, and the control chip is also electrically connected to the control terminal of the AC-to-DC circuit. If the external device includes a storage board, the storage board is electrically connected to the CPU; if the external device includes a control device, the control device is electrically connected to the control chip, and the control chip is also electrically connected to the control terminal of the backlight power supply circuit.

[0009] In this embodiment, an external device is used in conjunction with the CPU or control chip to enable the CPU or control chip to control the backlight power supply circuit. This allows the backlight power supply circuit to be controlled without the involvement of the display screen, reducing subsequent testing costs.

[0010] In some embodiments, if the external device includes a storage board, the storage board includes a storage chip. The storage chip is electrically connected to the CPU and is used to store extended display identification data.

[0011] In this embodiment, the reliability of the storage board is improved by using a storage chip to store the extended display identification data.

[0012] In some embodiments, the storage board further includes a conversion chip. The conversion chip is electrically connected to the CPU and is used to convert a first display signal output by the CPU into a second display signal, wherein the first display signal and the second display signal use different signal protocols.

[0013] In this embodiment, by setting a conversion chip inside the storage board, the CPU can then be electrically connected to the display screen through the storage board, thereby expanding the application scenarios of the storage board.

[0014] In some embodiments, the PC motherboard also includes a display port. The CPU is also electrically connected to the display port, which is used to electrically connect to a display screen.

[0015] In this embodiment, by setting a display port on the PC motherboard, the CPU can be electrically connected to the display screen through the display port.

[0016] In some embodiments, the PC motherboard also includes a serial port. The control chip is electrically connected to the serial port, which is used for electrical connection to external devices.

[0017] In this embodiment, by setting a serial port on the PC motherboard, the control chip can be electrically connected to an external device via the serial port to achieve communication with the external device.

[0018] In some embodiments, if the external device includes a storage board, the storage board is electrically connected to the CPU via a display port. If the external device includes a control device, the control device is electrically connected to a control chip via a serial port.

[0019] In this embodiment, the port that is electrically connected to the PC motherboard can be flexibly selected according to the type of external device, thereby improving the flexibility of the testing process.

[0020] In some embodiments, the second output terminal of the AC-to-DC circuit is electrically connected to the CPU.

[0021] In this embodiment, the AC-to-DC circuit can power the CPU through the second output terminal, thereby providing the required voltage and current to the PC motherboard.

[0022] In some embodiments, the control chip is also used to output a power-on signal to the CPU to control the CPU to power on.

[0023] In this embodiment, through the above settings, not only can the working state of the CPU be controlled by the control chip, but also in a test system where the external device is a storage board, the control chip can output a power-on signal after the test is completed to control the CPU to power on, thus preventing damage to the CPU caused by powering on without testing the power supply section.

[0024] In some embodiments, the control chip includes an EC or an MCU.

[0025] In this embodiment, the user can choose EC or MCU as the control chip according to actual needs, thereby improving the design flexibility of the test system. Attached Figure Description

[0026] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements / modules and steps with the same reference numerals in the drawings are represented as similar elements / modules and steps. Unless otherwise stated, the figures in the drawings do not constitute a limitation on scale.

[0027] Figure 1 This is a structural block diagram of a motherboard testing system provided in an embodiment of the present invention;

[0028] Figure 2 This is a structural block diagram of another motherboard testing system provided in an embodiment of the present invention;

[0029] Figure 3 This is a structural block diagram of another motherboard testing system provided in an embodiment of the present invention;

[0030] Figure 4 This is a structural block diagram of another motherboard testing system provided in an embodiment of the present invention;

[0031] Figure 5 This is a structural block diagram of the fifth type of motherboard testing system provided in this embodiment of the invention. Detailed Implementation

[0032] The present invention will now be described in detail with reference to specific embodiments. These embodiments will help those skilled in the art to further understand the present invention, but do not limit the invention in any way. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention. These all fall within the scope of protection of the present invention.

[0033] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0034] It should be noted that, unless there is a conflict, the various features in the embodiments of this invention can be combined with each other, all of which are within the protection scope of this application. Furthermore, although functional modules are divided in the device schematic diagram, in some cases, they can be divided differently from those in the device. In addition, the terms "first," "second," etc., used herein do not limit the data or execution order, but only distinguish identical or similar items with substantially the same function and effect.

[0035] When integrating the PC motherboard, backlight power supply circuit, and AC-to-DC circuit onto the same motherboard, the power supply section (backlight power supply circuit and AC-to-DC circuit) needs to be tested before powering the PC motherboard. Otherwise, if the untested power supply section is used to power the PC motherboard, it may damage the motherboard. Therefore, it is necessary to test the backlight power supply circuit and AC-to-DC circuit to ensure that they function properly.

[0036] However, in all-in-one computer products equipped with EDP displays, the backlight of the LCD screen is controlled by the CPU's backlight signal on the PC motherboard, controlling its operation. In Intel's CPU logic, the CPU only enables the backlight and outputs a dimming signal after connecting a display and detecting the Extended Display Identification Data (EDID) of the external display. In other words, the CPU can only output a backlight control signal when a display is connected to control the backlight power supply circuit. Otherwise, the CPU will not generate a backlight control signal, rendering the backlight power supply circuit inoperable and preventing testing. Therefore, testing requires the display to be used in conjunction with the PC motherboard, backlight power supply circuit, and AC-to-DC converter. However, in mass production of motherboards, this testing method requires a large number of displays, and since the motherboards are not tested, the possibility of display damage increases, leading to higher testing costs.

[0037] To reduce testing costs, this invention provides a motherboard testing system. This system uses a storage board or control device in conjunction with a PC motherboard, backlight power supply circuit, and AC-to-DC circuit for testing, eliminating the need for a display screen and thus reducing testing costs.

[0038] This invention provides a motherboard testing system; please refer to [link / reference]. Figure 1 The testing system includes external devices 100, a PC motherboard 200, a backlight power supply circuit 300, and an AC-to-DC circuit 400. Please refer to the documentation for details. Figures 1 to 3 External device 100 includes storage board 110 or control device 120.

[0039] PC motherboard 200 is electrically connected to external device 100, control terminal of backlight power supply circuit 300 and control terminal of AC to DC circuit 400 respectively. The input terminal of AC to DC circuit 400 is used to electrically connect to AC power supply. The first output terminal of AC to DC circuit 400 is electrically connected to input terminal of backlight power supply circuit 300. The output terminal of backlight power supply circuit 300 is used to electrically connect to display screen.

[0040] The PC motherboard 200 outputs a power-on signal to the AC-to-DC converter 400 to control its operation. If the external device 100 includes a storage board 110, the PC motherboard 200 also acquires the EDID stored in the storage board 110 and outputs a first backlight control signal to the backlight power supply circuit 300 based on the EDID to control its operation. If the external device 100 includes a control device 120, the external device 100 outputs a first control signal to the PC motherboard 200, and the PC motherboard 200 also outputs a second backlight control signal to the backlight power supply circuit 300 based on the first control signal to control its operation.

[0041] The PC motherboard 200 can be a motherboard for a desktop computer, all-in-one computer, laptop computer, PDA, or tablet computer. In some embodiments, for layout convenience, the PC motherboard 200, AC-to-DC circuit 400, and backlight power supply circuit 300 can be centrally located on the same motherboard.

[0042] The AC-to-DC circuit 400 can operate based on a power-on signal, converting AC power to DC power and outputting DC voltage and current through a first output terminal and a second output terminal; it can also be shut down based on a power-off signal from the PC motherboard 200, i.e., it will not output DC voltage and current. The AC power supply can be AC ​​mains power. The voltage and current of the DC power output from the first output terminal and the voltage and current output from the second output terminal can be equal or unequal, depending on actual needs. The specific structure of the AC-to-DC circuit 400 can be found in existing technologies and is not limited here.

[0043] The backlight power supply circuit 300 provides the necessary voltage and current to the backlight in the LCD screen. This circuit typically varies depending on the type of backlight used in the LCD screen (such as LED or CCFL) and the size and performance requirements of the screen. Generally, the backlight power supply circuit 300 includes a DC-to-DC converter and a brightness control circuit. The DC-to-DC converter boosts or bucks the DC power supply output from the AC-to-DC converter 400 to convert it into a voltage and current suitable for backlight operation. The brightness control circuit adjusts the backlight brightness by controlling the duration of backlight operation. Specific structures of the backlight power supply circuit 300 can be found in existing technologies and are not limited here.

[0044] The backlight power supply circuit 300 can turn on, turn off, or adjust the output voltage and current based on a first backlight control signal or a second backlight control signal. The first and second backlight control signals can be pulse width modulation (PWM) signals.

[0045] Storage board 110 can be used to store EDID, which describes and identifies the capabilities and characteristics of the display device. EDID may include at least one of the following: display identification information, display mode support information, audio support information, and display characteristic information. The display identification information may include information such as manufacturer name, model number, and serial number to uniquely identify the display. The display mode support information may include display mode information such as resolution, refresh rate, and color depth supported by the display. The audio support information indicates whether the display supports audio functions and the supported audio formats and number of channels. The display characteristic information may include information such as the display's physical size, pixel aspect ratio, and color space support. PC motherboard 200 can understand and adapt the display's capabilities by reading the EDID information to correctly configure and drive the display. It can automatically identify parameters such as the display's resolution and refresh rate and adjust them accordingly to ensure optimal display performance and compatibility.

[0046] If the external device 100 includes a storage board 110, after the PC motherboard 200 is electrically connected to the storage board 110, the PC motherboard 200 will read the EDID stored on the storage board 110. In this way, the PC motherboard 200 will mistakenly believe that it is now electrically connected to the display screen, causing the PC motherboard 200 to output a first backlight control signal to the backlight power supply circuit 300, so that the backlight power supply circuit 300 operates based on the first backlight control signal. In addition, the PC motherboard 200 can output a power-on signal to the AC-to-DC circuit 400, so that the AC-to-DC circuit 400 operates. In this way, the output power of the AC-to-DC circuit 400 and the output power of the backlight power supply circuit 300 can be tested to determine whether the outputs of the AC-to-DC circuit 400 and the backlight power supply circuit 300 are normal. If they are normal, the AC-to-DC circuit 400 can be controlled to supply power to the PC motherboard, and the PC motherboard can be tested to see if its functions are normal, thus completing the test.

[0047] If the external device 100 includes a control device 120, which can be a desktop computer, all-in-one computer, laptop computer, PDA, tablet computer, or other device with a controller, it can output a first control signal to the control chip 220, causing the control chip 220 to enter test mode. In this way, the control chip 220 can output a second backlight control signal to the backlight power supply circuit 300, causing the backlight power supply circuit 300 to operate based on the second backlight control signal. In addition, the PC motherboard 200 can output a power-on signal to the AC-to-DC circuit 400, causing the AC-to-DC circuit 400 to operate. In this way, the output power of the AC-to-DC circuit 400 and the output power of the backlight power supply circuit 300 can be tested to determine whether the outputs of the AC-to-DC circuit 400 and the backlight power supply circuit 300 are normal. If they are normal, the AC-to-DC circuit 400 can be controlled to supply power to the PC motherboard, and the PC motherboard can be tested to see if its functions are normal, thus completing the test.

[0048] In summary, the motherboard testing system provided in this embodiment of the invention enables the PC motherboard 200 to control the backlight power supply circuit 300 and the AC-to-DC circuit 400 without the need for a display screen. Subsequent testing of the PC motherboard 200, backlight power supply circuit 300, and AC-to-DC circuit 400 can be performed without a display screen, reducing testing costs. Furthermore, the testing system has a simple structure and is user-friendly for factory operations.

[0049] In some of these embodiments, please refer to Figure 2 or Figure 3 The PC motherboard 200 includes a CPU 210 and a control chip 220. The CPU 210 is electrically connected to the control terminal of the backlight power supply circuit 300 and the control chip 220. The control chip 220 is also electrically connected to the control terminal of the AC-to-DC circuit 400. Please refer to [link / reference]. Figure 2 If external device 100 includes storage board 110, then storage board 110 is electrically connected to CPU 210. See also... Figure 3 If the external device 100 includes a control device 120, then the control device 120 is electrically connected to the control chip 220, and the control chip 220 is also electrically connected to the control terminal of the backlight power supply circuit 300.

[0050] The CPU210 is electrically connected to the control chip 220, enabling communication between the CPU210 and the control chip 220. The communication protocol used between the two can be set according to actual needs and is not limited here.

[0051] CPU210 can be an Intel series CPU. When the CPU210 is electrically connected to the display screen, it can output a first backlight control signal to the backlight power supply circuit 300 based on the display screen's EDID to control the operation of the backlight power supply circuit 300.

[0052] If external device 100 includes storage board 110, please refer to Figure 2 After the CPU210 is electrically connected to the storage board 110, the CPU210 will read the EDID stored in the storage board 110. In this way, the CPU210 will mistakenly believe that it is electrically connected to the display screen, and the CPU210 will output the first backlight control signal to the backlight power supply circuit 300, so that the backlight power supply circuit 300 will work based on the first backlight control signal.

[0053] If external device 100 includes control device 120, please refer to Figure 3After the control device 120 is electrically connected to the control chip 220, it will output a first control signal to the control chip 220, causing the control chip 220 to enter the test mode. The control chip 220 can respond to the first control signal by outputting a second backlight control signal to the backlight power supply circuit 300. After the test is completed, the control device 120 can output a second control signal to the control chip 220, causing the control chip 220 to exit the test mode. In this way, the control chip 220 can enter the normal working mode.

[0054] In the motherboard testing system provided in this embodiment, the CPU 210 or control chip 220 can output a first backlight control signal or a second backlight control signal to control the backlight power supply circuit 300 to operate, and the control chip 220 can output a power-on signal to control the AC-to-DC circuit 400 to operate, without the participation of a display screen. This allows for testing of the backlight power supply circuit 300 and the AC-to-DC circuit 400. After testing, the PC motherboard 200 is then tested, reducing testing costs. Furthermore, in mass production of circuit boards, the large number of displays used during testing can be eliminated, enabling low-cost testing and aging processes. In a testing system where the external device 100 is the control device 120, the CPU 210 and other parts of the PC motherboard 200 can be excluded from the testing process, preventing damage to the CPU 210 and other parts of the PC motherboard 200 during testing, further reducing testing costs.

[0055] In some embodiments, if the external device 100 includes a control device 120, the test system includes a switch module electrically connected to the CPU 210, the control chip 220, and the backlight power supply circuit 300. Specifically, the switch module can be a multiplexer, for example, with its first input terminal electrically connected to the CPU 210, its second input terminal electrically connected to the control chip 220, and its output terminal electrically connected to the control terminal of the backlight power supply circuit 300. This allows the switch module to establish a connection between the first input terminal and the output terminal and disconnect the connection between the second input terminal and the output terminal when the CPU 210 outputs a first backlight control signal; and to disconnect the connection between the first input terminal and the output terminal and establish a connection between the second input terminal and the output terminal when the control chip 220 outputs a second backlight control signal. By setting up the switch module, the operation of the control chip 220 can be maintained even when the CPU 210 outputs a first backlight control signal, or the operation of the CPU 210 can be maintained even when the control chip 220 outputs a second backlight control signal, thus improving the stability of the test system. The specific structure of the switch module can be found in existing technology and is not limited here.

[0056] In some embodiments, if the external device 100 includes a storage board 110, please refer to [reference needed]. Figure 4The storage board 110 includes a storage chip 111. The storage chip 111 is electrically connected to the CPU 210 and is used to store extended display identification data. The storage chip 111 can be a non-volatile memory chip such as a Flash chip.

[0057] In this embodiment, the EDID is stored using the storage chip 111, which has high reliability, low power consumption, and can be erased and programmed multiple times, allowing for frequent updates of the EDID and improving application scenarios.

[0058] In some of these embodiments, please refer to Figure 4 The storage board 110 also includes a conversion chip 112. The conversion chip 112 is electrically connected to the CPU 210 and is used to convert the first display signal output by the CPU 210 into a second display signal, wherein the first display signal and the second display signal use different signal protocols.

[0059] Specifically, the first display signal can be an EDP signal, and the second display signal can be an LVDS signal or a VBO signal. In this way, the display signal output by the CPU 210 can be converted by the conversion chip 112. After the subsequent test is completed, the CPU 210 can be adapted to different displays through the storage board 110 to complete the display, thereby improving the application scenarios of the storage board 110.

[0060] In some of these embodiments, please refer to Figure 4 The PC motherboard 200 also includes a display port 230. The CPU 210 is also electrically connected to the display port 230, which is used for electrically connecting to a display screen. The display port 230 can be an EDP port, and the display screen can be an LCD screen. In this embodiment, by providing a display port 230 on the PC motherboard 200, the CPU 210 can be electrically connected to the display screen through the display port 230.

[0061] In some of these embodiments, please refer to Figure 4 The PC motherboard 200 also includes a serial port 240. The control chip 220 is electrically connected to the serial port 240, which is used for electrical connection to external devices. These external devices can be desktop computers, all-in-one computers, laptops, PDAs, tablets, etc., and the serial port 240 can be an RS232 serial port. In this embodiment, by providing a serial port 240 on the PC motherboard 200, the control chip 220 can electrically connect to the external device through the serial port 240, enabling communication with the external device.

[0062] In some of these embodiments, please refer to Figure 4If the external device 100 includes a storage board 110, the storage board 110 is electrically connected to the CPU 210 via the display port 230. Furthermore, the storage chip 111 and the conversion chip 112 within the storage board 110 are electrically connected to the CPU via the display port 230. Please refer to [link to relevant documentation]. Figure 5 If the external device 100 includes a control device 120, then the control device 120 is electrically connected to the control chip 220 via the serial port 240.

[0063] In this embodiment, by setting the display port 230 and the serial port 240, the PC motherboard 200 can be electrically connected to the external device 100 for subsequent testing. Furthermore, the port for electrical connection to the PC motherboard 200 can be flexibly selected according to the type of the external device 100, thereby improving the flexibility of the testing process.

[0064] In some of these embodiments, please refer to Figure 2 or Figure 3 The second output terminal of the AC-to-DC circuit 400 is electrically connected to the CPU 210. In this embodiment, the AC-to-DC circuit 400 can supply power to the CPU 210 through its second output terminal, thereby providing the required voltage and current to the PC motherboard 200.

[0065] In some embodiments, the control chip 220 is also used to output a power-on signal to the CPU 210 to control the CPU 210 to power on. In this embodiment, through the above settings, not only can the operating state of the CPU 210 be controlled by the control chip 220, but also in a test system where the external device 100 is the storage board 110, the control chip 220 can output a power-on signal after the test is completed to control the CPU 210 to power on, thus preventing damage to the CPU 210 caused by powering on without testing the power supply section.

[0066] In some embodiments, the control chip 220 includes an embedded controller (EC) or a microcontroller unit (MCU). The specific model of the EC and MCU can be selected according to actual needs and is not limited here. In this embodiment, the user can select an EC or an MCU as the control chip 220 according to actual needs, thereby improving the design flexibility of the test system.

[0067] It should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0068] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; under the concept of the present invention, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the present invention as described above, which are not provided in detail for the sake of brevity; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A motherboard testing system, characterized in that, The testing system includes external devices, a PC motherboard, a backlight power supply circuit, and an AC-to-DC circuit. The external devices include a storage board or a control device. The PC motherboard is electrically connected to the external device, the control terminal of the backlight power supply circuit, and the control terminal of the AC to DC circuit. The input terminal of the AC to DC circuit is electrically connected to the AC power supply. The first output terminal of the AC to DC circuit is electrically connected to the input terminal of the backlight power supply circuit. The output terminal of the backlight power supply circuit is electrically connected to the display screen. The PC motherboard is used to output a power-on signal to the AC-to-DC circuit to control the operation of the AC-to-DC circuit. If the external device includes the storage board, the PC motherboard is also used to acquire the extended display identification data stored in the storage board, and output a first backlight control signal to the backlight power supply circuit based on the extended display identification data, so as to control the backlight power supply circuit to work. If the external device includes the control device, the external device is used to output a first control signal to the PC motherboard, and the PC motherboard is also used to output a second backlight control signal to the backlight power supply circuit based on the first control signal, so as to control the backlight power supply circuit to work.

2. The testing system according to claim 1, characterized in that, The PC motherboard includes a CPU and a control chip; The CPU is electrically connected to the control terminal of the backlight power supply circuit and the control chip, and the control chip is also electrically connected to the control terminal of the AC to DC circuit. If the external device includes the storage board, then the storage board is electrically connected to the CPU; If the external device includes the control device, then the control device is electrically connected to the control chip, and the control chip is also electrically connected to the control terminal of the backlight power supply circuit.

3. The testing system according to claim 2, characterized in that, If the external device includes the storage board, then the storage board includes storage chips; The storage chip is electrically connected to the CPU and is used to store the extended display identifier data.

4. The testing system according to claim 3, characterized in that, The storage board also includes a conversion chip; The conversion chip is electrically connected to the CPU. The conversion chip is used to convert the first display signal output by the CPU into a second display signal, wherein the first display signal and the second display signal use different signal protocols.

5. The testing system according to any one of claims 2-4, characterized in that, The PC motherboard also includes a display port; The CPU is also electrically connected to the display port, which is used to electrically connect to the display screen.

6. The testing system according to claim 5, characterized in that, The PC motherboard also includes a serial port; The control chip is electrically connected to the serial port, which is used to electrically connect to external devices.

7. The testing system according to claim 6, characterized in that, If the external device includes the storage board, then the storage board is electrically connected to the CPU through the display port; If the external device includes the control device, then the control device is electrically connected to the control chip via the serial port.

8. The testing system according to any one of claims 2-4, characterized in that, The second output terminal of the AC-to-DC circuit is electrically connected to the CPU.

9. The testing system according to any one of claims 2-4, characterized in that, The control chip is also used to output a power-on signal to the CPU to control the CPU to power on.

10. The testing system according to any one of claims 2-4, characterized in that, The control chip includes an EC or an MCU.

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