Measurement system based on Ethernet-APL

Abstract

The invention relates to the technical field of industrial equipment measurement, in particular to a measurement system based on an Ethernet-APL. The device comprises a calculation and measurement unit, a curve correction unit and a package generation unit. According to the invention, the curve establishing module obtains the fitting coefficient, and the environment temperature data collected in the simulation measurement module and the set environment temperature threshold value are utilized to judge whether the environment temperature change violently exists, and when it is judged that the environment temperature change violently exists, the simulation measurement module carries out simulation on the environment temperature change violently. The fitting coefficient and the collected environment temperature data are used for fitting the measurement value of the detection sensor, the temperature-measurement characteristic curve is established through the collected environment temperature data and the fitting measurement value of the detection sensor, and the accurate temperature-measurement characteristic curve is established, so that the measurement value can be corrected according to the current environment temperature; interference caused by temperature fluctuation is reduced, misjudgment and misoperation caused by temperature interference are avoided, and the measurement stability of the detection sensor is improved.

Description

Technical Field

[0001] This invention relates to the field of industrial equipment measurement technology, and more specifically, to a measurement system based on Ethernet-APL. Background Technology

[0002] In the field of industrial production and equipment monitoring, online detection plays a crucial role. For example, in the processes of oil refining and chemical manufacturing, various online detection methods monitor the operating status and process parameters of equipment in real time, providing strong support for the safe and reliable operation of equipment and the accuracy and stability of process operation and adjustment. Currently, most existing detection functions adopt traditional wired transmission methods, such as 4-20mA analog signals or RS-485 buses. However, with the development of the Industrial Internet of Things (IIoT), its requirements for real-time performance, reliability, and intrinsic safety are constantly increasing. Traditional detection functions can no longer meet the new demands. Traditional wired transmission methods have many limitations in terms of data transmission speed, transmission distance, power supply, and protocol compatibility, and cannot adapt to the large-scale, high-speed, and reliable data transmission and processing needs of the Industrial Internet of Things era. The emergence of Ethernet-APL (Advanced Physical Layer) technology has brought new opportunities to solve these problems. This technology boasts advantages such as high speed, long-distance power supply, intrinsic safety, and Ethernet protocol compatibility, providing an ideal solution for upgrading industrial inspection systems. However, in sensor measurements, temperature fluctuations can significantly impact the results. Without proper handling, strain or corrosion rate data measured by the sensor will have large deviations, easily leading to misjudgments and malfunctions. Furthermore, temperature fluctuations exacerbate interference, greatly reducing the stability and accuracy of sensor measurements. Therefore, we provide a measurement system based on Ethernet-APL. Summary of the Invention

[0003] The purpose of this invention is to provide a measurement system based on Ethernet-APL to solve the problems mentioned in the background art.

[0004] To achieve the above objectives, the present invention provides a measurement system based on Ethernet-APL, including a calculation and measurement unit, a curve correction unit, and a package generation unit; The calculation and measurement unit obtains power to provide power to the embedded microprocessor and then performs initialization. After initialization, the constant current source circuit outputs current to the detection sensor and generates a voltage signal. It records the measured value, constant current value, and voltage value of the detection sensor. The voltage signal is sent to the signal conditioning circuit for amplification and filtering. The processed signal is then input to the analog-to-digital conversion circuit for simulation. The analog signal is recorded and converted into a digital signal. The digital data is then measured using the detection sensor. At the same time, the ambient temperature data is collected in real time by the temperature sensor. The curve correction unit obtains the fitting coefficient and uses the ambient temperature data collected in the calculation and measurement unit to determine whether there is a drastic change in ambient temperature. When it is determined that there is a drastic change in ambient temperature, the fitting coefficient is used to fit the measured value of the detection sensor with the collected ambient temperature data, and a temperature-measurement characteristic curve is established to calculate the measurement change value of the detection sensor under the new ambient temperature data. Then, the corrected measurement value is calculated to correct the measurement value of the detection sensor. The encapsulation generation unit receives the correction command from the curve correction unit, inputs the corrected measurement value into the embedded microprocessor and calculates the measured physical quantity, then encapsulates the data and generates corresponding analytical data, which is then sent to the Ethernet communication module. The APL signal is generated and transmitted to the APL gateway.

[0005] As a further improvement to this technical solution, the judgment calculation module utilizes the power supply and reference circuit to obtain power through the PoDL part of the IEEE 802.3bu standard, thereby providing power to the embedded microprocessor and subsequently performing initialization. After initialization, the constant current source circuit outputs current to the detection sensor and generates a voltage signal. It records the sensor's measured value, constant current value, and voltage value. It uses the voltage signal and the sensor's measured value to determine whether they are proportional. It calculates the current value using the voltage value and the sensor's measured value. When the current value equals the constant current value, it is determined that the voltage signal is proportional to the sensor's measured value. By analyzing the relationship between voltage and measurement, the operating status and performance of the circuit components can be understood, and the circuit parameters can be optimized and adjusted to improve overall performance.

[0006] As a further improvement to this technical solution, the analog measurement module receives the command from the judgment calculation module that the voltage signal is proportional to the measured value of the detection sensor, and sends the voltage signal to the signal conditioning circuit. The voltage signal is amplified and filtered by the time-division differential control signal conditioning circuit. The voltage signal after amplification and filtering is more accurate and stable, reducing measurement errors caused by signal distortion and noise interference. This is crucial for the measurement of detection sensors that require high precision, and provides a reliable basis for subsequent data analysis and decision-making.

[0007] As a further improvement to this technical solution, the curve establishment module obtains the fitting coefficient, and uses the ambient temperature data collected in the simulation measurement module and the set ambient temperature threshold to determine whether there is a drastic change in ambient temperature. When a drastic change in ambient temperature is determined, the fitting coefficient is used to fit the measured value of the detection sensor with the collected ambient temperature data. A temperature-measurement characteristic curve is established by using the collected ambient temperature data and the fitted measured value of the detection sensor. By determining whether the ambient temperature change is drastic, and fitting the measured value with the fitting coefficient and the collected ambient temperature data when the change is drastic, the change of measurement with temperature can be captured more accurately, thereby improving the accuracy of measurement and avoiding measurement errors.

[0008] As a further improvement to this technical solution, the measurement correction module collects new ambient temperature data through a temperature sensor and substitutes it into the temperature-measurement characteristic curve to calculate the measurement change value of the detection sensor under the new ambient temperature data. Then, it converts the digital data measured in the analog measurement module into the measurement value when it is an analog signal. The corrected measurement value is calculated using the measurement value and the measurement change value when it is an analog signal. The measurement value of the detection sensor is corrected by correcting the correction parameter value. By correcting the measurement value by calculating the measurement change value according to the temperature-measurement characteristic curve, the interference of temperature on the measurement results can be effectively eliminated, making the measurement value closer to the true value. This avoids large deviations in the strain or corrosion rate data measured by the detection sensor, and significantly improves the measurement accuracy.

[0009] Compared with the prior art, the beneficial effects of the present invention are as follows: 1. In this Ethernet-APL-based measurement system, a curve module is established to obtain fitting coefficients. The ambient temperature data collected in the simulation measurement module is compared with a set ambient temperature threshold to determine if there are drastic changes in ambient temperature. When a drastic change in ambient temperature is determined, the fitting coefficients are used to fit the measured values ​​of the detection sensor to the collected ambient temperature data. A temperature-measurement characteristic curve is established by combining the collected ambient temperature data and the fitted measured values ​​of the detection sensor. By establishing an accurate temperature-measurement characteristic curve, the measured values ​​can be corrected according to the current ambient temperature, reducing interference caused by temperature fluctuations, avoiding erroneous judgments and misoperations due to temperature interference, and improving the stability of the detection sensor measurement.

[0010] 2. In this Ethernet-APL-based measurement system, the measurement correction module acquires new ambient temperature data through a temperature sensor and substitutes it into the temperature-measurement characteristic curve. It calculates the measurement change value of the sensor under the new ambient temperature data, then converts the digital data measured in the analog measurement module into an analog signal measurement value. Using the analog signal measurement value and the measurement change value, a corrected measurement value is calculated. The measurement value of the sensor is corrected by using correction parameter values. By calculating the measurement change value based on the temperature-measurement characteristic curve to correct the measurement value, the interference of temperature on the measurement results can be effectively eliminated, making the measurement value closer to the true value. This avoids large deviations in the strain or corrosion rate data measured by the sensor and improves the measurement accuracy of the sensor. Attached Figure Description

[0011] Figure 1 This is a block diagram of the overall system structure of the present invention; Figure 2 This is a block diagram of the present invention.

[0012] The meanings of the labels in the diagram are as follows: 1. Calculation and measurement unit; 11. Judgment and calculation module; 12. Simulation measurement module; 2. Curve Correction Unit; 21. Curve Creation Module; 22. Measurement Correction Module; 3. Packaging and generation unit; 31. Computational packaging module; 32. Generation and storage module. Detailed Implementation

[0013] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0014] Example 1 This invention provides a measurement system based on Ethernet-APL. Please refer to [link / reference]. Figure 1 It includes a calculation and measurement unit 1, a curve correction unit 2, and a packaging and generation unit 3; The computational measurement unit 1 obtains power to provide power to the embedded microprocessor and then performs initialization. After initialization, the constant current source circuit outputs current to the detection sensor and generates a voltage signal. It records the measured value, constant current value, and voltage value of the detection sensor. The voltage signal is sent to the signal conditioning circuit for amplification and filtering. The processed signal is then input to the analog-to-digital converter circuit for simulation. The analog signal is recorded and converted into a digital signal. The digital data is then measured by the detection sensor. Simultaneously, the ambient temperature data is collected in real time by the temperature sensor. The curve correction unit 2 obtains the fitting coefficient and uses the ambient temperature data collected in the computational measurement unit 1 to determine whether there is a drastic change in ambient temperature. When a drastic change in ambient temperature is determined, the fitting coefficient is used to fit the measured value of the detection sensor with the collected ambient temperature data, and a temperature-measurement characteristic curve is established to calculate the change in the measured value of the detection sensor under the new ambient temperature data. The corrected measured value is then calculated and corrected for the measured value of the detection sensor. The encapsulation generation unit 3 receives the correction command from the curve correction unit 2, inputs the corrected measured value into the embedded microprocessor, calculates the measured physical quantity, encapsulates it, generates the corresponding analytical data, and sends the corresponding analytical data to the Ethernet communication module. The APL signal is generated and transmitted to the APL gateway.

[0015] For a more detailed explanation of the above units, please refer to [link / reference]. Figure 2 ; The calculation and measurement unit 1 includes a judgment and calculation module 11 and an analog measurement module 12; The judgment calculation module 11 uses the power supply and reference circuit to obtain power through the PoDL part of the IEEE 802.3bu standard via a coupling / decoupling network to provide power and voltage to the embedded microprocessor. After the embedded microprocessor is powered on, it immediately executes the initialization process to complete the SPI interface configuration, internal register settings and interrupt vector table establishment. After initialization, the constant current source circuit starts working, outputting current to the detection sensor (measuring probe) and recording the measured value of the detection sensor. and constant current value The current causes the sensor to generate a voltage signal, and the voltage value is recorded. The system uses the voltage signal and the measured value from the detection sensor to determine whether they are proportional, and calculates multiple sets of current values ​​based on the voltage value and the sensor's measurement value. When multiple current values ​​are equal and equal to the constant current value, it is determined that the voltage signal is proportional to the measured value of the detection sensor. By monitoring and analyzing the voltage-to-measurement ratio, the working status and performance of each circuit component can be understood. Based on this information, the circuit parameters can be optimized and adjusted, such as adjusting the output current of the constant current source and optimizing the gain of the signal conditioning circuit, thereby improving the overall performance. Since the voltage signal output by the detection sensor is usually weak and may contain noise interference, the analog measurement module 12 receives the command from the judgment and calculation module 11 that the voltage signal is proportional to the measured value of the detection sensor. The module then sends the voltage signal to the signal conditioning circuit. The signal conditioning circuit amplifies and filters the voltage signal using a time-division differential control circuit, resulting in a processed voltage signal. This amplified and filtered voltage signal is more accurate and stable, reducing measurement errors caused by signal distortion and noise interference. This is crucial for detection sensors requiring high precision. For example, when measuring minute changes to monitor strain or corrosion rates, high-precision signal processing can improve the accuracy of measurement results, providing a reliable basis for subsequent data analysis and decision-making. The processed signal is input to an analog-to-digital converter (ADC) for simulation, and the analog signal is recorded. The ADC communicates with the embedded microprocessor via an SPI serial interface to convert the analog signal into a digital signal, which is then transmitted to the embedded microprocessor. The embedded microprocessor uses a sensor to measure the digital data and obtains the measured digital data. Simultaneously, a temperature sensor collects ambient temperature data in real time, obtaining the collected ambient temperature data. This is used in subsequent signal processing to eliminate temperature drift errors and improve measurement accuracy; Curve correction unit 2 includes curve creation module 21 and measurement correction module 22; In industrial settings where temperatures fluctuate drastically, including high and low temperatures, the measured values ​​of the detection sensor are significantly affected by temperature, leading to measurement errors. The curve module 21 acquires the fitting coefficients from historical data. The system uses the ambient temperature data collected by the simulation measurement module 12 and the set ambient temperature threshold to determine whether there is a drastic change in ambient temperature. When the collected ambient temperature data is greater than the set ambient temperature threshold, it is determined that there is a drastic change in ambient temperature. The fitting coefficient is then used to determine the situation. Ambient temperature data collected in simulation measurement module 12 Fitting the measured values ​​of the detection sensor Specific algorithm formula: By collecting ambient temperature data and fitting the measured values ​​of the detection sensor, a temperature-measurement characteristic curve is established. Drastic changes in ambient temperature can significantly affect the measurement results of the detection sensor. Traditional measurement methods may not be able to reflect the changes in measurement values ​​caused by such changes in a timely and accurate manner. By judging whether the ambient temperature change is drastic, and fitting the measured values ​​with the collected ambient temperature data when the change is drastic, the change of measurement with temperature can be captured more accurately, thereby improving the accuracy of the measurement. For example, in some industrial production scenarios, the start-up or shutdown of equipment can cause the ambient temperature to rise or fall rapidly. In such cases, this method can correct the measured values ​​in a timely manner and avoid measurement errors.

[0016] Historical data includes fitting coefficients ; Measurement correction module 22 acquires new ambient temperature data through temperature sensor. The new ambient temperature data is substituted into the temperature-measurement characteristic curve of the curve creation module 21. The measurement change value of the sensor caused by temperature change under the new ambient temperature data is obtained through the temperature-measurement characteristic curve. The measured values ​​are then converted from the digital data measured in the analog measurement module 12 into analog signals. The corrected measurement value is calculated using the measured value and the measurement change value of the analog signal. Specific algorithm formula: The measured values ​​of the detection sensor are corrected by adjusting parameter values, as these values ​​are easily affected by ambient temperature. Under different temperature conditions, the measured value of the same physical quantity may change, leading to measurement errors. By acquiring ambient temperature data in real time and calculating the measurement change value based on the temperature-measurement characteristic curve to correct the measured value, the interference of temperature on the measurement results can be effectively eliminated, making the measured value closer to the true value. For example, in a high-temperature industrial furnace environment, without temperature correction, the strain or corrosion rate data measured by the detection sensor will have a large deviation, while after correction, the measurement accuracy can be significantly improved; the correction command is then passed to the packaging generation unit 3. The packaging generation unit 3 includes a computing packaging module 31 and a generation storage module 32; The calculation and encapsulation module 31 receives the correction command from the measurement correction module 22 and inputs the corrected measurement value into the embedded microprocessor. The embedded microprocessor calculates the measured physical quantity (such as strain or corrosion rate) based on the corrected measurement value. For example, it performs conversion between the corrected measurement value and the measured physical quantity. Simultaneously, the embedded microprocessor encapsulates the measured physical quantity to generate corresponding analytical data. Since the measured values ​​from the detection sensor are affected by various factors, after error correction such as temperature correction, the true measured value can be more accurately reflected. The embedded microprocessor calculates the measured physical quantity (such as strain or corrosion rate) based on this correction value, which can significantly reduce measurement errors and accurately reflect the actual state of the measured object. For example, in bridge structural health monitoring, it can accurately measure the strain of the bridge structure and promptly detect potential safety hazards.

[0017] The embedded microprocessor sends the corresponding parsed data to the Ethernet communication module via the SPI interface. Ethernet communication module The PHY physical interface chip with integrated APL physical layer is selected. The PHY chip communicates with the embedded microprocessor through the internal SPI interface and receives the corresponding parsed data sent by the embedded microprocessor. The storage module 32 generates a storage module via an Ethernet communication module. Upon receiving the corresponding parsed data, the PHY chip sends a clock signal according to the external crystal oscillator clock to generate an APL signal. The APL signal is then transmitted to the APL gateway via the PHY chip and the APL two-wire interface. After the APL signal is transmitted to the APL gateway, the Ethernet communication module... The corresponding parsed data is sent to the embedded microprocessor's internal FLASH data storage function for storage. Measurement data from sensors in industrial environments is crucial for assessing equipment operating status, detecting potential faults, and analyzing production processes. Storing the parsed data in FLASH allows for long-term data retention, which helps in building a historical database.

[0018] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A measurement system based on Ethernet-APL, characterized in that: It includes a calculation and measurement unit (1), a curve correction unit (2), and a packaging generation unit (3); The calculation and measurement unit (1) obtains power to provide power to the embedded microprocessor and then performs initialization. After initialization, the constant current source circuit outputs current to the detection sensor and generates a voltage signal. It records the measured value, constant current value, and voltage value of the detection sensor. The voltage signal is sent to the signal conditioning circuit for amplification and filtering. The processed signal is then input to the analog-to-digital conversion circuit for simulation. The analog signal is recorded and converted into a digital signal. The digital data is then measured using the detection sensor. At the same time, the ambient temperature data is collected in real time through the temperature sensor. The curve correction unit (2) obtains the fitting coefficient and uses the ambient temperature data collected in the calculation and measurement unit (1) to determine whether there is a drastic change in ambient temperature. When it is determined that there is a drastic change in ambient temperature, the fitting coefficient is used to fit the measured value of the detection sensor with the collected ambient temperature data, and a temperature-measurement characteristic curve is established to calculate the measured change value of the detection sensor under the new ambient temperature data. Then, the corrected measured value is calculated to correct the measured value of the detection sensor. The encapsulation generation unit (3) receives the correction command from the curve correction unit (2), inputs the corrected measurement value into the embedded microprocessor and calculates the measured physical quantity, then encapsulates and generates corresponding analytical data, and sends the corresponding analytical data to the Ethernet communication module. The APL signal is generated and transmitted to the APL gateway.

2. The measurement system based on Ethernet-APL according to claim 1, characterized in that: The calculation and measurement unit (1) includes a judgment and calculation module (11) and an analog measurement module (12). The judgment calculation module (11) uses the power supply and reference circuit to obtain power through the PoDL part of the IEEE 802.3bu standard to provide power to the embedded microprocessor and then perform initialization; After initialization, the constant current source circuit outputs current to the detection sensor and generates a voltage signal. It records the measured value of the detection sensor, the constant current value, and the voltage value. It uses the voltage signal and the measured value of the detection sensor to determine whether they are proportional. It calculates the current value using the voltage value and the measured value of the detection sensor. When the current value is equal to the constant current value, it is determined that the voltage signal is proportional to the measured value of the detection sensor.

3. The measurement system based on Ethernet-APL according to claim 2, characterized in that: The analog measurement module (12) receives the judgment calculation module (11) command that the voltage signal is proportional to the measured value of the detection sensor, sends the voltage signal to the signal conditioning circuit, and performs amplification and filtering on the voltage signal through the time-division differential control signal conditioning circuit. The processed signal is then input into the analog-to-digital conversion circuit for simulation and the analog signal is recorded.

4. The measurement system based on Ethernet-APL according to claim 3, characterized in that: The analog measurement module (12) converts the analog signal into a digital signal, then transmits the converted digital signal to the embedded microprocessor and uses the detection sensor to measure the digital data, while simultaneously collecting ambient temperature data in real time through the temperature sensor.

5. The measurement system based on Ethernet-APL according to claim 4, characterized in that: The curve correction unit (2) includes a curve establishment module (21) and a measurement correction module (22). The curve establishment module (21) obtains the fitting coefficient, and uses the ambient temperature data collected in the simulation measurement module (12) and the set ambient temperature threshold to determine whether there is a situation of drastic change in ambient temperature. When it is determined that there is a situation of drastic change in ambient temperature, the fitting coefficient and the collected ambient temperature data are used to fit the measured value of the detection sensor, and a temperature-measurement characteristic curve is established by the collected ambient temperature data and the fitted measured value of the detection sensor.

6. The measurement system based on Ethernet-APL according to claim 5, characterized in that: The measurement correction module (22) collects new ambient temperature data through the temperature sensor and substitutes it into the temperature-measurement characteristic curve to calculate the measurement change value of the detection sensor under the new ambient temperature data. Then, it converts the digital data measured in the analog measurement module (12) into the measurement value when it is converted into an analog signal. It uses the measurement value and measurement change value when it is in analog signal mode to calculate the corrected measurement value and corrects the measurement value of the detection sensor through the correction parameter value.

7. The measurement system based on Ethernet-APL according to claim 4, characterized in that: The encapsulation generation unit (3) includes a computational encapsulation module (31) and a generation storage module (32). The calculation encapsulation module (31) receives the correction command from the measurement correction module (22), inputs the corrected measurement value into the embedded microprocessor and calculates the measured physical quantity. The embedded microprocessor encapsulates the measured physical quantity and generates corresponding analytical data. The embedded microprocessor sends the corresponding analytical data to the Ethernet communication module through the SPI interface. middle.

8. The measurement system based on Ethernet-APL according to claim 7, characterized in that: The generation storage module (32) communicates via an Ethernet communication module. The system receives the corresponding parsed data, generates an APL signal, and transmits it to the APL gateway.

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