Train test method and device

Abstract

The invention discloses a train test method and device, and relates to the field of tests.The train test method comprises the steps that when a simulation machine is connected with a single board card, test data are sent to the single board card according to test logic, and feedback data returned by the board card are received; when the simulation machine is connected with the plurality of board cards, sending test data to the board cards according to the test logic, and receiving returned feedback data; determining a test result of the board card based on the test data and the feedback data; and when the simulation machine is connected with the train control system, simulating an actual operation environment of the train or outputting a fault signal according to the test logic, and determining a test result of the train control system based on a state returned by the train control system according to the actual operation environment or the fault signal. The simulation machine is constructed, various states of the train can be simulated, an actual train does not need to be used, and damage to the train is reduced. And single, multiple and systematic tests are carried out on the board cards, so that faults can be more comprehensively confirmed through multi-layer tests, and the test accuracy is improved.

Description

Technical Field

[0001] This invention relates to the field of testing, and in particular to a method and apparatus for testing trains. Background Technology

[0002] The traction motor control system of a high-speed maglev train is one of the key components ensuring the safe and efficient operation of the train. Currently, the testing of the train's traction motor control system adopts actual train testing methods. One is static testing, which checks the electrical connections and signal transmissions for normal operation without moving the vehicle; the other is dynamic testing, which involves low-speed travel on a test track, gradually increasing the speed to test the control system's performance under different operating conditions. Both of these testing methods are conducted on real trains, and simulating various fault scenarios is extremely costly, such as motor failures and communication interruptions, and may bring unforeseen risks, even leading to train damage and expensive repair costs. Summary of the Invention

[0003] The purpose of this invention is to provide a train testing method and apparatus. A simulator is constructed to simulate various train states without the need for an actual train, thus reducing damage to the train. Single, multiple, and systemic tests are performed on circuit boards, enabling multi-level testing for more comprehensive fault identification and improved testing accuracy.

[0004] To solve the above-mentioned technical problems, the present invention provides a method for testing trains, comprising:

[0005] Run the simulator, which is used to simulate a train;

[0006] When the simulator is connected to a single board, test data is sent to the single board according to the test logic, and feedback data is received from the board.

[0007] The test results for a single board are determined based on the test data and the feedback data.

[0008] When the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data is received from the connected boards.

[0009] The test results for multiple boards are determined based on the test data and the feedback data;

[0010] When the simulator is connected to the train control system, it simulates the actual operating environment of the train or outputs fault signals to the train control system according to the test logic.

[0011] The test results of the train control system are determined based on the actual operating environment or the status returned by the fault signal.

[0012] On the other hand, before running the simulator, the following also applies:

[0013] Predetermine the test requirements for the train, and generate test logic based on the test requirements;

[0014] The train was simulated using a simulator based on its structure and operational performance.

[0015] A communication module and a hardwired module are configured, and the communication module and the hardwired module are respectively connected to the simulator so that the simulator can receive communication data sent by the board and the train control system through the communication module, and collect hardwired data of the board and the train control system through the hardwired module.

[0016] On the other hand, when multiple boards include an MN board and a control board, and the simulator, communication module, MN board, and control board are connected sequentially, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0017] Test data is generated based on the test logic corresponding to the MN board and the control board.

[0018] The test data is sent to the MN board through the communication module, so that the MN board sends the test data to the control board, and the control board generates feedback data based on the received test data;

[0019] By receiving feedback data generated by the control board forwarded by the MN board;

[0020] Based on the test data and the feedback data, the test results of multiple boards are determined, including:

[0021] When the test data is a periodic return of a life signal from the control board, if the feedback data is a periodic signal, then it is determined that the path of the MN board and the control board is normal.

[0022] When the test data is a sending command, if the feedback data is the command value corresponding to the sending command, then it is determined that the path of the MN board and the control board is normal.

[0023] On the other hand, when multiple boards include an AD board, an MN board, and a control board, and the simulator, hardwired module, AD board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0024] Test data is generated based on the test logic corresponding to the AD board, the MN board, and the control board.

[0025] The test data is sent to the AD board through the hardwire module, so that the AD board generates feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence.

[0026] Receive the feedback data returned by the communication module;

[0027] Based on the test data and the feedback data, the test results of multiple boards are determined, including:

[0028] When the test data is a first analog voltage signal, if the feedback data is an analog voltage signal with the same voltage as the test data, then it is determined that the path of the AD board, the MN board and the control board is normal.

[0029] When the test data is a second analog voltage signal, if the feedback data is an analog voltage signal with an error less than a preset error compared to the test data, then the sampling accuracy test of the AD board is determined to be passed, and the value of the second analog voltage signal is less than that of the first analog voltage signal.

[0030] On the other hand, when multiple boards include an I / O board, an MN board, and a control board, and the simulator, hardwired module, I / O board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0031] Test data is generated based on the test logic corresponding to the IO board, the MN board, and the control board.

[0032] The test data is sent to the IO board through the hardwire module, so that the IO board generates feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence.

[0033] Receive the feedback data returned by the communication module;

[0034] The test data is sent to the MN board through the communication module, so that the test data passes through the MN board, the control board, the IO board and the hardwire module;

[0035] Receive feedback data generated by the I / O board based on the test data, returned by the hardwire module;

[0036] Based on the test data and the feedback data, the test results of multiple boards are determined, including:

[0037] When both the test data and the feedback data are digital signals, if the test data sent by the hardwire module is the same as the feedback data returned by the communication module, then the digital input test of the IO board is determined to be passed.

[0038] When both the test data and the feedback data are digital signals, if the test data sent by the communication module is the same as the feedback data returned by the hardwire module, then the digital output test of the IO board is determined to be passed.

[0039] On the other hand, when multiple boards include a PRW board, an MN board, and a control board, and the simulator, PRW adapter box, PRW board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0040] Test data is generated based on the test logic corresponding to the PRW board, the MN board, and the control board.

[0041] The test data is sent to the PRW adapter box so that the PRW adapter box can generate feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence.

[0042] Receive the feedback data returned by the communication module;

[0043] Based on the test data and the feedback data, the test results of multiple boards are determined, including:

[0044] When the test data is a fixed value PRW signal, if the feedback data is the same as the test data, then the PRW board is determined to have passed the static test.

[0045] When the test data is a dynamic PRW signal, if the feedback data is the same as the test data, then the PRW board is determined to have passed the dynamic test.

[0046] On the other hand, when the simulator is connected to the train control system, the actual operating environment of the train is simulated according to the test logic, including:

[0047] When the simulator is connected to the train control system, the power-on process, power-off process, and step-jump process of the train are simulated according to the test logic.

[0048] The power-on process consists of the following states in sequence: initial state, pre-charge state, rectification state, inverting state, and inverting state. The power-off process consists of the following states in sequence: inverting state, inverting state, rectification state, and initial state. The step-by-step process is a process with a different order from the power-on process.

[0049] The test results of the train control system are determined based on the status returned by the train control system according to the actual operating environment, including:

[0050] When the actual operating environment is a power-on or power-off process, the train control system performs corresponding actions according to the actual operating environment. When the actual operating environment is a step-by-step process, the train control system does not perform any actions. Therefore, the logic function test of the train control system is considered to have passed.

[0051] On the other hand, when the simulator is connected to the train control system, a fault signal is output to the train control system according to the test logic, including:

[0052] When the simulator is connected to the train control system, it outputs a fault voltage signal, a fault current signal, or a fault control signal to the train control system according to the test logic.

[0053] The test results of the train control system are determined based on the status returned by the fault signal, including:

[0054] If the train control system performs the corresponding action based on the fault voltage signal, the fault current signal, or the fault control signal, then the simulated fault test of the train control system is determined to be passed.

[0055] On the other hand, when the simulator is connected to the train control system, a fault signal is output to the train control system according to the test logic, including:

[0056] When the simulator is connected to the train control system, a fault load is output to the train control system according to the test logic;

[0057] The test results of the train control system are determined based on the status returned by the fault signal, including:

[0058] If the train control system performs the corresponding action based on the faulty load, then the control performance test of the train control system is determined to be passed.

[0059] To solve the above-mentioned technical problems, the present invention also provides a train testing device, characterized in that it comprises:

[0060] Memory, used to store computer programs;

[0061] A processor is used to implement the steps of the above-described train testing method when executing the computer program.

[0062] This application provides a train testing method and apparatus, relating to the testing field. The method includes: when a simulator is connected to a single board, sending test data to the single board according to test logic and receiving feedback data returned by the board; when the simulator is connected to multiple boards, sending test data to the boards according to test logic and receiving returned feedback data; determining the test results of the boards based on the test data and feedback data; and when the simulator is connected to a train control system, simulating the actual operating environment of the train or outputting fault signals according to test logic, and determining the test results of the train control system based on the status returned by the train control system according to the actual operating environment or fault signals. A simulator is constructed that can simulate various states of the train without using an actual train, reducing damage to the train. Multi-level testing of individual, multiple, and system boards allows for more comprehensive fault identification and improves test accuracy. Attached Figure Description

[0063] To more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the prior art and embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0064] Figure 1 A flowchart of a train testing method provided by the present invention;

[0065] Figure 2 A schematic diagram of the structure of a simulator provided by the present invention;

[0066] Figure 3 This is a schematic diagram of the structure for testing an MN board and control board provided by the present invention;

[0067] Figure 4 This is a schematic diagram of the structure for testing an AD board, MN board, and control board provided by the present invention;

[0068] Figure 5a A schematic diagram of the input quantity testing structure of an IO board, an MN board, and a control board provided by the present invention;

[0069] Figure 5b A schematic diagram of the output measurement structure of an IO board, an MN board and a control board provided by the present invention;

[0070] Figure 6This invention provides a schematic diagram of the structure for testing a PRW board, MN board, and control board.

[0071] Figure 7 A schematic diagram of a test structure for a train control system provided by the present invention;

[0072] Figure 8 This is a schematic diagram of the structure of a train testing device provided by the present invention. Detailed Implementation

[0073] The core of this invention is to provide a train testing method and apparatus, which constructs a simulator that can simulate various train states without using an actual train, thus reducing damage to the train. Single, multiple, and systemic tests on circuit boards are performed, enabling multi-level testing for more comprehensive fault identification and improving testing accuracy.

[0074] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0075] Figure 1 A flowchart of a train testing method provided by the present invention, the train testing method comprising:

[0076] S11: Run the simulator, which is used to simulate trains;

[0077] S12: When the simulator is connected to a single board, it sends test data to the single board according to the test logic and receives feedback data returned by the board.

[0078] S13: Determine the test results for a single board based on test data and feedback data;

[0079] S14: When the simulator is connected to multiple boards, it sends test data to the connected boards according to the test logic and receives feedback data returned by the connected boards.

[0080] S15: Determine the test results of multiple boards based on test data and feedback data;

[0081] S16: When the simulator is connected to the train control system, it simulates the actual operating environment of the train or outputs fault signals to the train control system according to the test logic.

[0082] S17: The test results of the train control system are determined based on the actual operating environment or the status returned by the fault signal.

[0083] The traction motor control system of a high-speed maglev train is one of the key components ensuring the safe and efficient operation of the train. Currently, the testing of the train's traction motor control system adopts actual train testing methods. One is static testing, which checks the electrical connections and signal transmissions for normal operation without moving the vehicle; the other is dynamic testing, which involves low-speed travel on a test track, gradually increasing the speed to test the control system's performance under different operating conditions. Both of these testing methods are conducted on real trains, and simulating various fault scenarios is extremely costly, such as motor failures and communication interruptions, and may bring unforeseen risks, even leading to train damage and expensive repair costs.

[0084] The testing process is divided into three steps: unit testing, integration testing, and system testing. The testing strategies for each stage are described below, based on their respective testing focuses:

[0085] (1) Unit testing:

[0086] Unit testing is the testing process that verifies the correctness of different functional boards and forms the basis for subsequent testing. Its purpose is to discover various hardware errors that may exist within each module, focusing on the following aspects: 1) Module interface: Testing the data throughput of the interface of the board under test; 2) Boundaries: Carefully designing test cases where data is equal to, greater than, or less than boundary comparison values; 3) Performance: Testing the hardware performance required by the model.

[0087] (2) Integration testing:

[0088] Integration testing, also known as assembly testing or joint testing, typically involves assembling all modules into a system according to design requirements, building upon unit testing. Key considerations include: 1) Whether data loss occurs when connecting modules across interfaces. 2) Whether the functionality of one module negatively impacts the functionality of another. 3) Whether the combined sub-functions achieve the expected parent function. 4) Whether accumulated errors in unit modules will amplify to an unacceptable level. During assembly, one-time assembly or incremental assembly methods can be considered.

[0089] (3) System testing:

[0090] The purpose of system testing is to verify whether the functions and performance of the system software design are consistent with the expected goals. It mainly includes the following types of testing: 1) Functional testing: including logic testing, state transition logic sequence testing; reliability testing, simulating fault input, and accurately performing protection actions; 2) Performance testing: whether the expected target value can be achieved under arbitrary changes of different parameters within the boundary.

[0091] The control system adopts a cabinet-style structure consisting of a main control board and peripheral interface boards as its hardware structure. It supports 16-channel AD sampling, 9-channel PWM input and output, 24-channel digital input, and 8-channel digital output, and has functions such as motor control, logic control, and system communication diagnostics.

[0092] Control board: Performs data processing and logic control, and supports 9-channel PWM input and output.

[0093] AD board: Acquires voltage and current signals, supports 16-channel AD sampling, voltage signal range -2.5V~+2.5V, and interacts with the control board via local bus.

[0094] Management board: Communicates with the host computer via CAN box, and interacts with the control board via local bus.

[0095] IO board: Performs digital input and output, interacts with control board or management board via bus, supports 24 digital inputs and 16 digital outputs.

[0096] PRW board: Adapted for communication between high-speed maglev systems and DRCU (LTE / 38G) to acquire speed signals.

[0097] Speed ​​board: Supports cross-induction loop communication and orthogonal decoding acquisition of speed signals.

[0098] Photoelectric conversion board: Adapted to hardware-in-the-loop simulation system, it performs mutual conversion of photoelectric signals to realize the interface interconnection between the control system and the simulator.

[0099] System functions include electromagnetic / power control, logic control, and system communication diagnostics. Currently, the development of three-phase rectifier control, frequency converter control, and logic control functions has been completed.

[0100] In the early stages of board-level testing, testing software such as CCS and RT-Lab, along with oscilloscopes, were used to conduct functional and performance tests on each board of the self-developed control system. The test results showed that the functions and performance of each board were good, laying the foundation for the next stage of integration testing and system function testing using the automated testing software QuiKTA.

[0101] This application provides a train testing method, relating to the testing field. The method includes: when a simulator is connected to a single board, sending test data to the single board according to test logic and receiving feedback data returned by the board; when the simulator is connected to multiple boards, sending test data to the boards according to test logic and receiving returned feedback data; determining the test results of the boards based on the test data and feedback data; and when the simulator is connected to a train control system, simulating the actual operating environment of the train or outputting fault signals according to test logic, and determining the test results of the train control system based on the status returned by the train control system according to the actual operating environment or fault signals. A simulator is constructed that can simulate various states of the train without using an actual train, reducing damage to the train. Multi-level testing of individual, multiple, and system boards allows for more comprehensive fault identification and improves test accuracy.

[0102] Based on the above embodiments:

[0103] Figure 2 A schematic diagram of the structure of a simulator provided by the present invention;

[0104] In some embodiments, prior to running the emulator, the following is also included:

[0105] Predetermine the test requirements for the train and generate test logic based on those requirements;

[0106] Train simulation is used based on the train's structure and operational performance;

[0107] A communication module and a hardwired module are configured, and the communication module and the hardwired module are respectively connected to the simulator so that the simulator can receive communication data sent by the board and the train control system through the communication module, and collect hardwired data from the board and the train control system through the hardwired module.

[0108] like Figure 2 As shown, a hardware-in-the-loop test platform based on the QuiKTA platform and RT-LAB simulation system was built according to the test object. The test system architecture is as follows: including test software, simulator, test interface, BOB disconnect box and test object.

[0109] The QuiKTA testing platform automatically generates and executes test cases based on testing requirements, and automatically generates documentation, thus automating embedded system testing. The software system is an open platform, providing APIs for C / C++, LabVIEW, and other languages ​​to meet diverse API needs. Based on a client / server architecture, the software is hardware scalable (allowing one main control computer to manage multiple terminals / lower-level machines, facilitating multi-user management and parallel testing); it supports model management for simulation platforms such as RT-Lab; and it supports graphical monitoring panel management, enabling real-time monitoring or online debugging of data graphs, with richer data display and command triggering methods.

[0110] RT-LAB Simulation Platform: As a real-time simulation tool, its core functions include real-time simulation and hardware-in-the-loop (HIL) testing. It supports importing models from Simulink and other technologies, seamlessly connecting the R&D and testing phases. The platform features high precision, modular design, and distributed computing capabilities, enabling it to efficiently handle complex system simulations.

[0111] 5700 simulator: As the main control simulator, it has functions such as power modeling, interface configuration, and parameter recording;

[0112] The Hilbox emulator, as a communication module, serves as part of the communication link. It receives feedback data from the control system via the CAN interface and feeds it back to the main controller 5700 emulator via UDP / PCIe communication.

[0113] The BOB disconnect box, as a hardwired module, connects the controller under test to the hardware-in-the-loop test environment, leads the signal out from the corresponding channel on the front panel for easy observation, recording and measurement, and can perform continuity and disconnection tests, as well as short circuit tests to ground and power supply.

[0114] In addition, the simulator will be equipped with a variety of interfaces, including:

[0115] AD sampling interface: The control system collects analog quantity information such as voltage and current from the simulation model;

[0116] I / O interfaces include digital input (control system commands) and digital output (simulation system status feedback) interfaces;

[0117] RS485 interface: The control system acquires PRW signals through the PRW adapter box;

[0118] CAN bus interface: The system's status information is fed back via CAN communication, and then relayed from the Hilbox emulator to the 5700 emulator.

[0119] UDP interface: Communication between Hilbox and 5700 emulator.

[0120] Figure 3 This is a schematic diagram of the structure for testing an MN board and control board provided by the present invention;

[0121] In some embodiments, when multiple boards include an MN board and a control board, and the simulator, communication module, MN board, and control board are connected sequentially, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0122] Test data is generated based on the test logic corresponding to the MN board and control board.

[0123] Test data is sent to the MN board via the communication module, so that the MN board can send the test data to the control board, and the control board generates feedback data based on the received test data.

[0124] By receiving feedback data generated by the control board forwarded by the MN board;

[0125] The test results for multiple boards were determined based on test data and feedback data, including:

[0126] If the test data shows that the control board periodically returns a life signal, and the feedback data is a periodic signal, then it is determined that the MN board and the control board have normal pathways.

[0127] If the feedback data is the command value corresponding to the sent command when the test data is the sent command, then it is determined that the path of the MN board and the control board is normal.

[0128] During integration testing, the assembly process of the system boards is tested to see if the functions and performance of the boards will interfere with each other during the assembly process. Therefore, it is necessary to retest the board functions during the assembly process.

[0129] like Figure 3 As shown, the 5700 emulator sends commands to the MN board via the Hilbox emulator. The MN board then forwards these commands to the control board. The control board checks whether the command has been received and returns different values ​​accordingly. If the command is received, it returns the command; otherwise, it returns 0. The command is then sent back to the Hilbox emulator via the CAN bus and then back to the 5700 emulator. The success of the transmission and the accuracy of the transmitted value are determined by analyzing this return value.

[0130] Table 1

[0131]

[0132] As shown in Table 1, Table 1 is a test item table for CAN communication and dual-port RAM communication functions. Based on the test results in Table 1, determine whether the communication path passes the test.

[0133] Whether the pathway is functioning correctly can be determined by either sending a separate transmission command and matching it with the received command value, or by receiving periodic life signals from the control board.

[0134] Figure 4 This is a schematic diagram of the structure for testing an AD board, MN board, and control board provided by the present invention;

[0135] In some embodiments, when multiple boards include an AD board, an MN board, and a control board, and the simulator, hardwired module, AD board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0136] Test data is generated based on the test logic corresponding to the AD board, MN board, and control board.

[0137] Test data is sent to the AD board via a hardwired module, so that the AD board can generate feedback data based on the test data. The feedback data passes through the control board, MN board and communication module in sequence.

[0138] Receive feedback data returned by the communication module;

[0139] The test results for multiple boards were determined based on test data and feedback data, including:

[0140] like Figure 4 As shown, when the test data is the first analog voltage signal, if the feedback data is an analog voltage signal with the same voltage as the test data, then it is determined that the path of the AD board, MN board and control board is normal.

[0141] When the test data is the second analog voltage signal, if the feedback data is an analog voltage signal with an error less than the preset error compared to the test data, then the sampling accuracy test of the AD board is determined to be passed, and the value of the second analog voltage signal is less than that of the first analog voltage signal.

[0142] The 8-channel AD sampling function, sampling accuracy, sampling range, and protection functions were tested. An 8-channel analog signal was emitted from a 5700 emulator. The AD board under test acquired the signals and sent them to the control board. The MN board read the AD acquisition data and sent it to the Hilbox emulator via the CAN bus, and also sent it to the 5700 emulator via UDP protocol. The sampling accuracy was tested by comparing the emitted analog signals with the acquired signals. The QuiKTA software allows for parameter configuration of the 8-channel analog signals emitted by the 5700 and provides real-time display of the acquired data and sampling accuracy. The board performance was evaluated by comparing the configured parameters and the acquired parameters.

[0143] Table 2

[0144]

[0145] The test results are shown in Table 2. Table 2 is the test result table of AD sampling function. Based on the test results in Table 2, it is determined whether the communication path has passed the test.

[0146] When conducting path testing, it is sufficient to use 8 analog signals at 2V. However, when it is necessary to test the sampling accuracy, in addition to using 8 analog signals at 2V, the voltage value is gradually reduced to 1V, 500mV, 200mV and 100mV. The sampling accuracy is determined based on the error of the returned signal.

[0147] Figure 5a This is a schematic diagram of the input quantity testing structure of an IO board, an MN board, and a control board provided by the present invention. Figure 5b A schematic diagram of the output measurement structure of an IO board, an MN board and a control board provided by the present invention;

[0148] In some embodiments, when multiple boards include an I / O board, an MN board, and a control board, and the simulator, hardwired module, I / O board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0149] Test data is generated based on the test logic corresponding to the IO board, MN board, and control board.

[0150] Test data is sent to the IO board via a hardwired module, so that the IO board can generate feedback data based on the test data. The feedback data passes through the control board, MN board and communication module in sequence.

[0151] Receive feedback data returned by the communication module;

[0152] Test data is sent to the MN board via the communication module, so that the test data passes through the MN board, control board, IO board and hardwire module;

[0153] Receive feedback data generated by the I / O board based on test data from the hardwired module;

[0154] The test results for multiple boards were determined based on test data and feedback data, including:

[0155] When both the test data and the feedback data are digital signals, if the test data sent by the hardwire module is the same as the feedback data returned by the communication module, then the digital input test of the IO board is confirmed to be passed.

[0156] When both the test data and feedback data are digital signals, if the test data sent by the communication module is the same as the feedback data returned by the hardwire module, then the digital output test of the IO board is considered to have passed.

[0157] Test the digital input and digital output functions.

[0158] Digital input test: The 5700 emulator sends 8 digital signals. The I / O board under test acquires the digital signals and sends each digital signal to the MN board through the control board. The MN board sends the acquired digital signals to the Hilbox emulator via the CAN bus and then to the 5700 emulator via the UDP protocol.

[0159] Table 3

[0160]

[0161] As shown in Table 3, which is the digital input test table, the test results in Table 3 are used to determine whether the digital input test passes or fails. Eight different digital signals are sent, and the returned values ​​are checked against the sent values.

[0162] Digital output test: The 5700 emulator sends 8 digital signal commands to Hilbox via UDP protocol. The commands are then sent to the MN board via CAN bus, the MN board sends them to the control board, the control board sends them to the I / O board under test via the backplane bus, and the commands are returned to the 5700 emulator via the I / O output port. The sent digital signals and the returned digital signals are compared.

[0163] Table 4

[0164]

[0165] As shown in Table 4, which is the digital output test table, the test results in Table 4 are used to determine whether the digital output test passes or fails. Eight different digital signals are sent, and the returned values ​​are checked against the sent values.

[0166] Figure 6 This invention provides a schematic diagram of the structure for testing a PRW board, MN board, and control board.

[0167] In some embodiments, when multiple boards include a PRW board, an MN board, and a control board, and the simulator, PRW adapter box, PRW board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including:

[0168] Test data is generated based on the test logic corresponding to the PRW board, MN board, and control board.

[0169] Test data is sent to the PRW adapter box so that the PRW adapter box can generate feedback data based on the test data. The feedback data passes through the control board, MN board and communication module in sequence.

[0170] Receive feedback data returned by the communication module;

[0171] The test results for multiple boards were determined based on test data and feedback data, including:

[0172] If the feedback data is the same as the test data when the test data is a fixed value PRW signal, then the PRW board is determined to have passed the static test.

[0173] If the feedback data is the same as the test data when the test data is a dynamic PRW signal, then the PRW board is determined to have passed the dynamic test.

[0174] Static testing: The 5700 emulator simulates a fixed-value PRW signal and sends it to the PRW board under test via RS485 signal through the PRW adapter box. The PRW signal parsed by the PRW board is sent to the MN board through the control board. The MN board sends the PRW signal to the Hilbox emulator via the CAN bus and forwards it to the 5700 emulator.

[0175] Dynamic testing: The 5700 simulator simulates the PRW signal during the dynamic operation of a vehicle.

[0176] Table 5

[0177]

[0178] As shown in Table 5, which is the static and dynamic test table, the results in Table 5 determine whether the static and dynamic tests pass or fail. For static tests, the PRW signal has a fixed value; for dynamic tests, the PRW signal has a dynamically changing value. If the returned signal is the same as the sent signal, the test passes.

[0179] Figure 7 A schematic diagram of a test structure for a train control system provided by the present invention;

[0180] In some embodiments, when the simulator is connected to the train control system, the actual operating environment of the train is simulated according to test logic, including:

[0181] When the simulator is connected to the train control system, the power-on process, power-off process and step-jump process of the train are simulated according to the test logic.

[0182] The power-on process consists of the initial state, pre-charge state, rectification state, invertible state, and inverting state in sequence. The power-off process consists of the inverting state, invertible state, rectification state, and initial state in sequence. The step-by-step process is a process with a different order from the power-on process.

[0183] The test results of the train control system are determined based on the status returned by the train control system according to the actual operating environment, including:

[0184] When the actual operating environment is a power-on or power-off process, the train control system performs the corresponding actions according to the actual operating environment. When the actual operating environment is a step-by-step process, the train control system does not perform any actions. This indicates that the logic function test of the train control system has passed.

[0185] Use QuiKTA software to build a state transition command interface or test process (provided that test cases for the automated process have been set up). By giving the corresponding state transition commands, test whether the power circuit completes the corresponding state switch and whether the control system completes the corresponding state machine transition.

[0186] A normal power-on process should consist of the following states: initial state, pre-charge state, rectification state, ready-to-invert state, and inverter state. The power-off process should consist of the following states: inverter state, ready-to-invert state, rectification state, and initial state. This means that transitions can only occur sequentially between two adjacent steps. A skipped state, however, is a change that does not occur between two adjacent states. For example, during power-on, the initial state can only transition to the pre-charge state; other states cannot be transitioned, meaning no action is allowed.

[0187] As shown in Table 6, Table 6 is the logic function test table. The test results in Table 6 are used to determine whether the logic function test passes or fails.

[0188] Table 6

[0189]

[0190] In some embodiments, when the simulator is connected to the train control system, outputting a fault signal to the train control system according to the test logic includes:

[0191] When the simulator is connected to the train control system, it outputs fault voltage signal, fault current signal or fault control signal to the train control system according to the test logic.

[0192] The test results of the train control system are determined based on the status returned by the fault signal, including:

[0193] If the train control system executes the corresponding action based on the fault voltage signal, fault current signal, or fault control signal, then the simulated fault test of the train control system is deemed to have passed.

[0194] Use QuiKTA software to build a fault injection interface or test process (provided that test cases for the automated process have been set up). Simulate different fault conditions by changing the parameter settings of the power model, and test whether the control system completes the corresponding fault protection actions.

[0195] The testing process involves various faults. This application simulates bus overvoltage faults, overcurrent faults, three-phase current imbalance, phase loss faults, and circuit breaker faults (clamping / closing). The test pass / fail status is determined based on the returned values.

[0196] Table 7

[0197]

[0198] As shown in Table 7, Table 7 is the simulated fault test table. The test results in Table 7 are used to determine whether the simulated fault test passes or fails.

[0199] In some embodiments, when the simulator is connected to the train control system, outputting a fault signal to the train control system according to the test logic includes:

[0200] When the simulator is connected to the train control system, a fault load is output to the train control system according to the test logic.

[0201] The test results of the train control system are determined based on the status returned by the fault signal, including:

[0202] If the train control system performs the corresponding action based on the fault load, then the control performance test of the train control system is deemed to have passed.

[0203] Using QuiKTA software, the inverter system parameters are varied to simulate changes in load, grid voltage, and other parameters under different boundary conditions, testing whether the control system has good response speed and ideal regulation performance. Specifically, load mutation can be used to achieve this.

[0204] Table 8

[0205]

[0206] As shown in Table 8, Table 8 is the control performance test table. The control performance test results are used to determine whether the control performance test is passed.

[0207] Figure 8 This is a schematic diagram of a train testing device provided by the present invention. The train testing device includes:

[0208] Memory 81 is used to store computer programs;

[0209] The processor 82 is used to implement the steps of the above-described train testing method when executing a computer program.

[0210] The description of the train testing device provided in this application is similar to that in the above embodiments and will not be repeated here.

[0211] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0212] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0213] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for testing trains, characterized in that, include: Run the simulator, which is used to simulate a train; When the simulator is connected to a single board, test data is sent to the single board according to the test logic, and feedback data is received from the board. The test results for a single board are determined based on the test data and the feedback data. When the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data is received from the connected boards. The test results for multiple boards are determined based on the test data and the feedback data; When the simulator is connected to the train control system, it simulates the actual operating environment of the train or outputs fault signals to the train control system according to the test logic. The test results of the train control system are determined based on the actual operating environment or the status returned by the fault signal.

2. The train testing method as described in claim 1, characterized in that, Before running the simulator, the following also applies: Predetermine the test requirements for the train, and generate test logic based on the test requirements; The train was simulated using a simulator based on its structure and operational performance. A communication module and a hardwired module are configured, and the communication module and the hardwired module are respectively connected to the simulator so that the simulator can receive communication data sent by the board and the train control system through the communication module, and collect hardwired data of the board and the train control system through the hardwired module.

3. The train testing method as described in claim 1, characterized in that, When multiple boards, including an MN board and a control board, are connected sequentially to the simulator, communication module, MN board, and control board, and the simulator is connected to the multiple boards, test data is sent to the connected boards according to the test logic, and feedback data is received from the connected boards, including: Test data is generated based on the test logic corresponding to the MN board and the control board. The test data is sent to the MN board through the communication module, so that the MN board sends the test data to the control board, and the control board generates feedback data based on the received test data; By receiving feedback data generated by the control board forwarded by the MN board; Based on the test data and the feedback data, the test results of multiple boards are determined, including: When the test data is a periodic return of a life signal from the control board, if the feedback data is a periodic signal, then it is determined that the path of the MN board and the control board is normal. When the test data is a sending command, if the feedback data is the command value corresponding to the sending command, then it is determined that the path of the MN board and the control board is normal.

4. The train testing method as described in claim 1, characterized in that, When multiple boards include an AD board, an MN board, and a control board, and the simulator, hardwired module, AD board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including: Test data is generated based on the test logic corresponding to the AD board, the MN board, and the control board. The test data is sent to the AD board through the hardwire module, so that the AD board generates feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence. Receive the feedback data returned by the communication module; Based on the test data and the feedback data, the test results of multiple boards are determined, including: When the test data is a first analog voltage signal, if the feedback data is an analog voltage signal with the same voltage as the test data, then it is determined that the path of the AD board, the MN board and the control board is normal. When the test data is a second analog voltage signal, if the feedback data is an analog voltage signal with an error less than a preset error compared to the test data, then the sampling accuracy test of the AD board is determined to be passed, and the value of the second analog voltage signal is less than that of the first analog voltage signal.

5. The train testing method as described in claim 1, characterized in that, When multiple boards include an I / O board, an MN board, and a control board, and the simulator, hardwired module, I / O board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including: Test data is generated based on the test logic corresponding to the IO board, the MN board, and the control board. The test data is sent to the IO board through the hardwire module, so that the IO board generates feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence. Receive the feedback data returned by the communication module; The test data is sent to the MN board through the communication module, so that the test data passes through the MN board, the control board, the IO board and the hardwire module; Receive feedback data generated by the I / O board based on the test data, returned by the hardwire module; Based on the test data and the feedback data, the test results of multiple boards are determined, including: When both the test data and the feedback data are digital signals, if the test data sent by the hardwire module is the same as the feedback data returned by the communication module, then the digital input test of the IO board is determined to be passed. When both the test data and the feedback data are digital signals, if the test data sent by the communication module is the same as the feedback data returned by the hardwire module, then the digital output test of the IO board is determined to be passed.

6. The train testing method as described in claim 1, characterized in that, When multiple boards include a PRW board, an MN board, and a control board, and the simulator, PRW adapter box, PRW board, control board, MN board, communication module, and simulator form a loop, when the simulator is connected to multiple boards, test data is sent to the connected boards according to the test logic, and feedback data returned by the connected boards is received, including: Test data is generated based on the test logic corresponding to the PRW board, the MN board, and the control board. The test data is sent to the PRW adapter box so that the PRW adapter box can generate feedback data based on the test data. The feedback data passes through the control board, the MN board and the communication module in sequence. Receive the feedback data returned by the communication module; Based on the test data and the feedback data, the test results of multiple boards are determined, including: When the test data is a fixed value PRW signal, if the feedback data is the same as the test data, then the PRW board is determined to have passed the static test. When the test data is a dynamic PRW signal, if the feedback data is the same as the test data, then the PRW board is determined to have passed the dynamic test.

7. The test method for a train as described in any one of claims 1 to 6, characterized in that, When the simulator is connected to the train control system, the actual operating environment of the train is simulated according to the test logic, including: When the simulator is connected to the train control system, the power-on process, power-off process, and step-jump process of the train are simulated according to the test logic. The power-on process consists of the following states in sequence: initial state, pre-charge state, rectification state, inverting state, and inverting state. The power-off process consists of the following states in sequence: inverting state, inverting state, rectification state, and initial state. The step-by-step process is a process with a different order from the power-on process. The test results of the train control system are determined based on the status returned by the train control system according to the actual operating environment, including: When the actual operating environment is a power-on or power-off process, the train control system performs corresponding actions according to the actual operating environment. When the actual operating environment is a step-by-step process, the train control system does not perform any actions. Therefore, the logic function test of the train control system is considered to have passed.

8. The test method for a train as described in any one of claims 1 to 6, characterized in that, When the simulator is connected to the train control system, a fault signal is output to the train control system according to the test logic, including: When the simulator is connected to the train control system, it outputs a fault voltage signal, a fault current signal, or a fault control signal to the train control system according to the test logic. The test results of the train control system are determined based on the status returned by the fault signal, including: If the train control system performs the corresponding action based on the fault voltage signal, the fault current signal, or the fault control signal, then the simulated fault test of the train control system is determined to be passed.

9. The test method for a train as described in any one of claims 1 to 6, characterized in that, When the simulator is connected to the train control system, a fault signal is output to the train control system according to the test logic, including: When the simulator is connected to the train control system, a fault load is output to the train control system according to the test logic; The test results of the train control system are determined based on the status returned by the fault signal, including: If the train control system performs the corresponding action based on the faulty load, then the control performance test of the train control system is determined to be passed.

10. A testing device for trains, characterized in that, include: Memory, used to store computer programs; A processor for executing the computer program to implement the steps of the train testing method as described in any one of claims 1 to 9.

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