Dynamic parameter testing device for full-power-level parallel device

Abstract

The invention relates to the technical field of testing, and discloses a dynamic parameter testing device for a full-power-level parallel device. The device comprises a cabinet body, a man-machine interaction unit arranged on the outer side of the cabinet body, and a connecting bin, a test chamber, a capacitor chamber, a low-voltage power distribution control chamber, a high-voltage power supply chamber and a low-voltage host machine chamber which are arranged in the cabinet body, and the test chamber, the capacitor chamber and the high-voltage power supply chamber are communicated in the connecting bin to form a high-voltage bin chamber; the test chamber comprises a support plate arranged at the bottom of the test chamber, a to-be-tested power device group arranged on the support plate and a claim test stack row, a direct current end at one side of the claim test stack row is connected with a primary terminal of the to-be-tested power device group, and a direct current end at the other side of the claim test stack row is connected with a positive and negative terminal group at the top of a connection stack row in a connection bin; and the terminal group connected with the bottom of the stacked row is connected with the direct-current terminal group for supporting the capacitor group in the capacitor chamber. Therefore, rapid matching of dynamic parameters of different parallel devices can be accurately achieved, the consistency of parallel use of the IGBTs is improved to the maximum extent, and the service life of the devices is prolonged.

Description

Technical Field

[0001] This invention relates to the field of testing technology, and in particular to a dynamic parameter testing device for parallel devices of all power levels. Background Technology

[0002] With the improvement of the power level of existing single devices and the increase of the power density of the whole machine, the parallel use of multiple power devices has become more and more common. However, there are certain differences between devices produced in different batches or even the same batch. Direct parallel use can lead to problems such as inconsistent parameters and affect product life.

[0003] There are two common pairing schemes for power devices used in parallel: Scheme 1: direct parallel use according to the manufacturer's production batch; Scheme 2: the manufacturer matches the parameters according to the user's pairing requirements, and the user uses them in parallel according to the manufacturer's matching scheme.

[0004] However, the existing solution 1 ignores the individual differences of the devices and does not achieve the best matching of device performance, and cannot achieve the optimal configuration and use of device parameters; solution 2 is only provided by a few domestic manufacturers, and its scope of application is narrow. Even if it is provided, there are problems such as the inability to continue using other intact devices in the same group in special circumstances such as device damage or replacement, resulting in serious waste. Summary of the Invention

[0005] This invention provides a dynamic parameter testing device for parallel devices of all power levels, which can solve the technical problems in the prior art.

[0006] This invention provides a dynamic parameter testing device for parallel devices of all power levels. The device includes a cabinet, a human-machine interface unit disposed outside the cabinet, and a connection compartment, a test chamber, a capacitor chamber, a low-voltage power distribution control chamber, a high-voltage power supply chamber, and a low-voltage main unit chamber disposed inside the cabinet. The test chamber, the capacitor chamber, and the high-voltage power supply chamber are connected to the connection compartment to form a high-voltage chamber. The test chamber includes a support plate disposed at the bottom of the test chamber, a group of power devices under test disposed on the support plate, and a test stack. One DC terminal of the test stack is connected to the primary terminal of the group of power devices under test, and the other DC terminal is connected to the positive and negative terminal group at the top of the connection stack in the connection compartment. The terminal group at the bottom of the connection stack is connected to the DC terminal group of the supporting capacitor group in the capacitor chamber.

[0007] Preferably, the low-voltage power distribution control room includes a power supply and distribution unit, a signal acquisition unit, and a drive controller.

[0008] Preferably, the high-voltage power supply room includes a controllable DC power supply and a reactor. One terminal of the controllable DC power supply is connected to the positive terminal of the connecting stack, and the other terminal is connected to one terminal of the power supply contactor at the bottom of the connecting compartment. The other terminal of the power supply contactor is connected to the negative terminal of the connecting stack. One terminal of the reactor is connected to the AC terminal of the connecting stack, and the other terminal is connected to the negative terminal of the connecting stack.

[0009] Preferably, the connection compartment further includes a discharge resistor group and a discharge contactor, with one terminal of the discharge resistor group connected to the positive terminal of the connection stack, and the other terminal connected to one terminal of the discharge contactor, and the other terminal of the discharge contactor connected to the negative terminal of the connection stack.

[0010] Preferably, the low-voltage host room includes an engineering host for exchanging information with the human-machine interface unit and the drive controller.

[0011] Preferably, the device further includes a roller assembly disposed at the bottom of the housing.

[0012] Preferably, the roller assembly includes a locking unit.

[0013] Preferably, the device further includes a handling handle disposed on the outside of the housing.

[0014] Preferably, the top of the housing is provided with a test door and a control door, the front of the housing is provided with a left half door and a right half door, the back of the housing is provided with a main door and an auxiliary door, the main door and the auxiliary door are the connection compartment, the test door is the test chamber, the left half door is the capacitor chamber, the control door is the enclosed low-voltage power distribution control chamber, and the right half door is divided into upper and lower parts, the upper part is the high-voltage power supply chamber, and the lower part is the enclosed low-voltage main unit chamber.

[0015] Preferably, adjacent compartments are physically separated by partitions.

[0016] The above technical solution enables dynamic parameter testing of different packaged devices by replacing the support plate and test stack, thereby accurately achieving rapid matching of dynamic parameters of different parallel devices (parallel devices of full power level), maximizing the consistency of IGBT parallel use, and extending the service life of the devices. Attached Figure Description

[0017] The accompanying drawings, which form part of this specification, are provided to further illustrate embodiments of the invention and, together with the textual description, explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0018] Figure 1 A front top view of a dynamic parameter testing device for parallel devices of full power rating according to an embodiment of the present invention is shown;

[0019] Figure 2 A rear top view of a dynamic parameter testing device for parallel devices of full power rating according to an embodiment of the present invention is shown.

[0020] Figure 3 An internal schematic diagram of a dynamic parameter testing device for parallel devices of full power rating according to an embodiment of the present invention is shown.

[0021] Explanation of reference numerals in the attached figures

[0022] 1. Cabinet body; 2. Test door; 3. Control door; 4. Left half door; 5. Right half door;

[0023] 6. Main door; 7. Auxiliary door; 8. Handle; 9. Roller assembly; 10. Human-machine interface unit;

[0024] 11. Partition plate; 101. Support plate; 102. Power device group; 103. Trial stack;

[0025] 104 Connecting stack; 105 Supporting capacitor bank; 106 Power supply and distribution unit;

[0026] 107 Signal acquisition and processing unit; 108 Drive controller; 109 Controllable DC power supply;

[0027] 110 Reactor; 111 Power Supply Contactor; 112 Discharge Resistor Group;

[0028] 113 Discharge contactor; 114 Engineering host. Detailed Implementation

[0029] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0030] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0031] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0032] like Figure 1-3As shown, this embodiment of the invention provides a dynamic parameter testing device for parallel devices of all power levels. The device includes a cabinet 1, a human-machine interface unit 10 disposed outside the cabinet 1, and a connection compartment, a test chamber, a capacitor chamber, a low-voltage power distribution control chamber, a high-voltage power supply chamber, and a low-voltage main unit chamber disposed inside the cabinet 1. The test chamber, the capacitor chamber, and the high-voltage power supply chamber are connected to the connection compartment to form a high-voltage compartment. The test chamber includes a support plate 101 disposed at the bottom of the test chamber, a power device group 102 under test disposed on the support plate 101, and a test stack 103. One DC terminal of the test stack 103 is connected to the primary terminal of the power device group 102 under test, and the other DC terminal is connected to the positive and negative terminal group at the top of the connection stack 104 in the connection compartment. The terminal group at the bottom of the connection stack 104 is connected to the DC terminal group of the supporting capacitor group 105 in the capacitor chamber.

[0033] The cabinet has enclosed panels on both the left and right sides, and a human-machine interface unit is located on the outside of the cabinet (e.g., on the right side of the cabinet exterior) with adjustable direction, angle, and height. A support plate 101 is fixed to the bottom of the test chamber, and a connecting stack 104 is fixed inside the connecting compartment.

[0034] The above technical solution enables dynamic parameter testing of different packaged devices by replacing the support plate and test stack, thereby accurately achieving rapid matching of dynamic parameters of parallel devices of different power levels, maximizing the consistency of IGBT parallel use, and extending the service life of the devices.

[0035] According to one embodiment of the present invention, the low-voltage power distribution control room includes a power supply and distribution unit 106, a signal acquisition unit 107, and a drive controller 108.

[0036] According to one embodiment of the present invention, the high-voltage power supply room includes a controllable DC power supply 109 and a reactor 110. One terminal of the controllable DC power supply 109 is connected to the positive terminal of the connection stack 104, and the other terminal is connected to one terminal of the power supply contactor 111 at the bottom of the connection compartment. The other terminal of the power supply contactor 111 is connected to the negative terminal of the connection stack 104. One terminal of the reactor 110 is connected to the AC terminal of the test stack 103, and the other terminal is connected to the negative terminal of the connection stack 104.

[0037] The power supply contactor can be fixed at the bottom of the connection compartment.

[0038] According to one embodiment of the present invention, the connection compartment further includes a discharge resistor group 112 and a discharge contactor 113. One terminal of the discharge resistor group 112 is connected to the positive terminal of the connection stack 104, and the other terminal is connected to one terminal of the discharge contactor 113. The other terminal of the discharge contactor 113 is connected to the negative terminal of the connection stack 104.

[0039] Among them, the discharge resistor group 112 can be fixed inside the connection compartment.

[0040] According to one embodiment of the present invention, the low-voltage host room includes an engineering host 114 for information interaction with the human-machine interaction unit 10 and the drive controller 108.

[0041] This enables the control and status monitoring of the parameter testing device.

[0042] According to one embodiment of the present invention, the device further includes a roller assembly 9 disposed at the bottom of the housing 1.

[0043] This facilitates the movement of dynamic parameter testing devices for parallel devices of all power levels, making them suitable for more scenarios.

[0044] According to one embodiment of the present invention, the roller assembly 9 includes a locking unit.

[0045] Therefore, the parameter testing device can be fixed without moving it, ensuring reliable testing of the parameter testing device.

[0046] According to one embodiment of the present invention, the device further includes a handling handle 8 disposed on the outside of the housing 1.

[0047] By setting up a handling handle, the parameter testing device can be easily moved and transported.

[0048] For example, the carrying handle can be located on the left side of the cabinet exterior.

[0049] According to one embodiment of the present invention, a test door 2 and a control door 3 are provided on the top of the housing 1, a left half door 4 and a right half door 5 are provided on the front of the housing 1, a main door 6 and an auxiliary door 7 are provided on the back of the housing 1, the connection compartment is located inside the main door 6 and the auxiliary door 7, the test chamber is located inside the test door 2, the capacitor chamber is located inside the left half door 4, the low-voltage power distribution control room is located inside the control door 3, and the right half door 5 is divided into upper and lower parts, the upper part is the high-voltage power supply room, and the lower part is the closed low-voltage main unit room.

[0050] In other words, the internal space of the cabinet can be roughly divided into two parts: front and back.

[0051] According to one embodiment of the present invention, adjacent compartments are physically separated by partitions 11.

[0052] In other words, the various compartments are physically separated by partitions 11.

[0053] As can be seen from the above embodiments, the dynamic parameter testing device for parallel devices of all power levels described in this invention has at least the following advantages: 1. It enables rapid matching of dynamic parameters of two or even more parallel IGBTs, ensuring consistency in parallel use and extending the service life of the devices; 2. The testing process achieves high and low voltage separation, ensuring the safety of testing personnel; 3. The device has wide compatibility, applicable to almost all packaging forms on the market and covering all power level devices. The figure only illustrates one packaging form (two parallel structures). Other packaging and parallel schemes are not listed one by one, but are not intended to limit the invention; 4. Single-compartment operation can realize the replacement of different batches and different packaging forms, improving testing efficiency; 5. By setting support wheels with locking function at the bottom of the cabinet and handles on the side, the equipment can be quickly moved and transferred; 6. The human-machine interaction unit can realize the adjustment of height, direction, angle, etc., to meet the needs of different working positions, and the interaction is user-friendly.

[0054] In the description of this invention, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is generally based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this invention and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this invention; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0055] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0056] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0057] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A dynamic parameter testing device for parallel devices of all power levels, characterized in that, The device includes a cabinet (1), a human-machine interface unit (10) located outside the cabinet (1), and a connection compartment, a test chamber, a capacitor chamber, a low-voltage power distribution control room, a high-voltage power supply room, and a low-voltage host room located inside the cabinet (1). The test chamber, the capacitor chamber, and the high-voltage power supply room are connected to the connection compartment to form a high-voltage compartment. The test chamber includes a support plate (101) located at the bottom of the test chamber, a power device group (102) under test and a test stack (103) located on the support plate (101). One side of the test stack (103) is connected to the primary terminal of the power device group (102) under test, and the other side is connected to the positive and negative terminal group at the top of the connection stack (104) in the connection compartment. The terminal group at the bottom of the connection stack (104) is connected to the DC terminal group of the supporting capacitor group (105) in the capacitor chamber.

2. The apparatus according to claim 1, characterized in that, The low-voltage power distribution control room includes a power supply and distribution unit (106), a signal acquisition unit (107), and a drive controller (108).

3. The apparatus according to claim 2, characterized in that, The high-voltage power supply room includes a controllable DC power supply (109) and a reactor (110). One terminal of the controllable DC power supply (109) is connected to the positive terminal of the connecting stack (104), and the other terminal is connected to one terminal of the power supply contactor (111) at the bottom of the connecting compartment. The other terminal of the power supply contactor (111) is connected to the negative terminal of the connecting stack (104). One terminal of the reactor (110) is connected to the AC terminal of the test stack (103), and the other terminal is connected to the negative terminal of the connecting stack (104).

4. The apparatus according to claim 3, characterized in that, The connection compartment also includes a discharge resistor group (112) and a discharge contactor (113). One terminal of the discharge resistor group (112) is connected to the positive terminal of the connection stack (104), and the other terminal is connected to one terminal of the discharge contactor (113). The other terminal of the discharge contactor (113) is connected to the negative terminal of the connection stack (104).

5. The apparatus according to claim 4, characterized in that, The low-voltage host room includes an engineering host (114) for information interaction with the human-machine interaction unit (10) and the drive controller (108).

6. The apparatus according to claim 5, characterized in that, The device also includes a roller assembly (9) disposed at the bottom of the housing (1).

7. The apparatus according to claim 6, characterized in that, The roller assembly (9) includes a locking unit.

8. The apparatus according to any one of claims 1-7, characterized in that, The device also includes a handling handle (8) disposed on the outside of the housing (1).

9. The apparatus according to any one of claims 1-7, characterized in that, The top of the housing (1) is provided with a test door (2) and a control door (3). The front of the housing (1) is provided with a left half door (4) and a right half door (5). The back of the housing (1) is provided with a main door (6) and an auxiliary door (7). The connection compartment is inside the main door (6) and the auxiliary door (7). The test chamber is inside the test door (2). The capacitor chamber is inside the left half door (4). The low-voltage power distribution control room is inside the control door (3). The right half door (5) is divided into two parts: the upper part is the high-voltage power supply room and the lower part is the closed low-voltage main unit room.

10. The apparatus according to any one of claims 1-7, characterized in that, Adjacent compartments are physically separated by partitions (11).

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