Method and system for measuring parameters of electric double-layer supercapacitor, and storage medium

Abstract

The invention provides a method and a system for measuring parameters of an electric double-layer supercapacitor, and a storage medium, and relates to the technical field of supercapacitors. The method comprises the following steps that in the environment of controlling heat exchange, charging and discharging test circulation is executed on the double-electric-layer supercapacitor, the charging and discharging test circulation comprises a constant-current discharging stage and a constant-current charging stage, and the current amplitude of the constant-current discharging stage is equal to that of the constant-current charging stage; acquiring a first temperature change value of the shell of the supercapacitor in the constant-current discharging stage and a second temperature change value of the shell of the supercapacitor in the constant-current charging stage; and calculating the internal resistance value of the supercapacitor based on the first temperature change value, the second temperature change value, the heat capacity parameter of the supercapacitor, the current value and the charging and discharging time.

Description

Technical Field

[0001] This invention relates to the field of supercapacitor technology, and in particular to a method, system, and storage medium for measuring parameters of a double-layer supercapacitor. Background Technology

[0002] Electric double-layer supercapacitors (EDLCs) are a type of highly efficient energy storage device, widely used in new energy, electric vehicles, smart grids, and industrial energy storage due to their high power density, long cycle life, and fast charge and discharge characteristics. Internal resistance, as one of the core parameters of their performance, directly affects energy conversion efficiency, thermal management, and system reliability. Internal resistance not only leads to energy loss and irreversible heating, but also affects the actual working efficiency and lifespan of supercapacitors.

[0003] Currently, the industry commonly uses internal resistance testing methods based on electrical response, mainly including voltage drop methods (such as DC internal resistance testing) and voltage bounce methods (such as pulse testing). These methods estimate the internal resistance value by measuring the instantaneous change or relaxation behavior of the voltage during charging and discharging. However, the test results of these methods are heavily dependent on the selected voltage range and sampling time, resulting in poor data repeatability and low comparability. In addition, traditional methods have difficulty distinguishing between irreversible heating caused by internal resistance and reversible heating caused by entropy change in the ion system. In practical applications, the heating of supercapacitors consists of two parts: first, Joule heating caused by internal resistance, which is exothermic during both charging and discharging; and second, a reversible thermal effect caused by the change in entropy of ions in the electrolyte under the influence of an electric field—heat is released during charging due to the increased orderliness of ion arrangement and the decrease in entropy, while heat is absorbed during discharging. This reversible thermal effect has a significant impact on temperature changes, but it cannot be isolated and quantified solely by voltage signals. Therefore, existing technologies can only provide apparent internal resistance values, which are insufficient to accurately reflect the true internal resistance characteristics and make it even more difficult to assess the actual contribution of reversible thermal behavior to the system temperature rise. This poses challenges to the thermal management design, condition assessment, and performance optimization of supercapacitors. Summary of the Invention

[0004] The purpose of this invention is to provide a method, system, and storage medium for measuring the parameters of a double-layer supercapacitor, in order to solve the technical problems mentioned in the background art: the prior art can only provide the apparent internal resistance value, which is difficult to accurately reflect the true internal resistance characteristics, and even more difficult to assess the actual contribution of reversible thermal behavior to the temperature rise of the system. This brings difficulties to the thermal management design, condition assessment, and performance optimization of supercapacitors.

[0005] To achieve the above objectives, according to one aspect of the present invention, a method for measuring the parameters of a double-layer supercapacitor is provided, comprising the following steps:

[0006] In a controlled heat exchange environment, a charge-discharge test cycle is performed on a double-layer supercapacitor. The charge-discharge test cycle includes a constant current discharge stage and a constant current charging stage, wherein the current amplitude of the constant current discharge stage is equal to that of the constant current charging stage.

[0007] Obtain the first temperature change value of the supercapacitor casing during the constant current discharge stage, and the second temperature change value of the supercapacitor casing during the constant current charging stage;

[0008] The internal resistance of the supercapacitor is calculated based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charging and discharging time.

[0009] In one possible implementation, the method further includes:

[0010] Based on the sum of the first temperature change value and the second temperature change value, the heat capacity parameter, and the charge / discharge time, the reversible heating power of the supercapacitor ion system is calculated.

[0011] In one possible implementation, the charge-discharge test cycle includes the following steps in sequence:

[0012] The supercapacitor is charged to an upper limit voltage and maintained at a constant voltage for a first preset time;

[0013] Perform the constant current discharge phase until the voltage drops to the lower limit voltage, and record the discharge time;

[0014] After the constant current discharge stage, allow the mixture to stand for a second preset time.

[0015] Perform the constant current charging phase until the voltage rises back to the upper limit voltage, and record the charging time;

[0016] After the constant current charging phase, the device is left to stand for a third preset time.

[0017] In one possible implementation, the discharge time is equal to the charging time.

[0018] In one possible implementation, during the test cycle, the voltage, current, and casing temperature data of the supercapacitor are recorded synchronously, with a data recording time interval of no more than 0.1 seconds.

[0019] According to another aspect of the embodiments of this disclosure, a measurement system for parameters of a double-layer supercapacitor is provided. The system is used to implement a method for measuring parameters of a double-layer supercapacitor as described in any possible implementation. The system includes:

[0020] Insulation device for housing the supercapacitor under test;

[0021] The charging and discharging device is electrically connected to the supercapacitor in the insulation device;

[0022] A temperature measuring device is installed inside the insulation device to measure the temperature of the supercapacitor casing;

[0023] The control and processing device is communicatively connected to the charging and discharging device and the temperature measuring device.

[0024] The control processing device is configured to control the charging and discharging device to execute the charging and discharging test cycle and to acquire the temperature data measured by the temperature measuring device.

[0025] In one possible implementation, the control processing device is further configured to calculate the internal resistance of the supercapacitor based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charge / discharge time.

[0026] In one possible implementation, the control processing device is further configured to calculate the reversible heating power of the supercapacitor ion system based on the sum of the first temperature change value and the second temperature change value.

[0027] In one possible implementation, the insulation device is an insulated temperature chamber.

[0028] According to another aspect of the present disclosure, a computer-readable storage medium is provided, wherein at least one piece of program code is stored therein, the at least one piece of program code being loaded and executed by a processor to implement the method for measuring the parameters of a double-layer supercapacitor as described in any of the possible implementations above.

[0029] The above-described one or more technical solutions in the embodiments of this application have at least one or more of the following technical effects:

[0030] This invention provides a method for measuring the parameters of a double-layer supercapacitor. By conducting symmetrical constant-current charge-discharge tests on the supercapacitor in a controlled heat exchange environment, the interference of external environmental fluctuations on temperature measurement is effectively isolated, providing a crucial guarantee for obtaining pure and reliable data on shell temperature changes. Based on this, by real-time monitoring of the second temperature change value during the charging phase and the first temperature change value during the discharging phase in the charge-discharge cycle, and combining known heat capacity parameters, current values, and time parameters, the irreversible heating caused by internal resistance and the reversible heating caused by the entropy change of the ion system can be accurately separated, thereby accurately calculating the internal resistance value of the supercapacitor. This method fundamentally overcomes the shortcomings of traditional voltage drop or voltage rebound methods, which suffer from inconsistent measurement results and poor repeatability due to the influence of the test voltage range and relaxation time. It not only significantly improves the accuracy and reliability of internal resistance measurement and achieves precise analysis of the thermal behavior of supercapacitors, but also provides a pioneering technical means for quantitatively evaluating its reversible thermal effects, possessing significant engineering application value for product thermal management design, condition assessment, and life prediction.

[0031] The above description is merely an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention and to implement it in accordance with the contents of the specification, and in order to make the above and other objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention are described below. Attached Figure Description

[0032] Figure 1 This is a schematic flowchart of a method for measuring parameters of a double-layer supercapacitor according to an exemplary embodiment.

[0033] Figure 2 This is a detailed flowchart illustrating the charge-discharge test cycle of a method for measuring parameters of a double-layer supercapacitor according to an exemplary embodiment.

[0034] Figure 3 This is a schematic diagram of the composition structure of a measurement system module for parameters of a double-layer supercapacitor according to an exemplary embodiment.

[0035] Figure 4 This is a typical charge / discharge time-temperature curve for a double-layer supercapacitor.

[0036] Explanation of reference numerals in the attached drawings: 100, insulation device; 200, charging and discharging device; 300, temperature measuring device; 400, control and processing device. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be described in further detail below with reference to the accompanying drawings.

[0038] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of systems and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0039] Figure 1 This is a flowchart illustrating a method for measuring parameters of a double-layer supercapacitor according to an exemplary embodiment, as shown below. Figure 1 As shown, the method includes the following steps:

[0040] In step S100, a charge-discharge test cycle is performed on the double-layer supercapacitor in a controlled heat exchange environment. The charge-discharge test cycle includes a constant-current discharge stage and a constant-current charging stage, with the current amplitude in the constant-current discharge stage being equal to that in the constant-current charging stage. Specifically, to ensure the stability of the ambient temperature during the test and to avoid the influence of external temperature fluctuations on the temperature change of the supercapacitor, the double-layer supercapacitor under test needs to be placed in a heat-controlled environment. Preferably, this environment is an adiabatic or constant-temperature environment, such as a high-performance adiabatic enclosure filled with highly efficient adiabatic materials such as ultrafine glass fiber or vacuum insulation panels, with a thermal conductivity preferably lower than [value missing]. To minimize convective, conductive, and radiative heat exchange between the supercapacitor under test and the external environment, the supercapacitor is fixed inside the insulated cavity, ensuring it is not in direct contact with the inner wall of the cavity.

[0041] As another optional embodiment, the controlled heat exchange environment can also be achieved using a high-precision constant temperature chamber, which can stabilize the internal ambient temperature at a set value, and its temperature control accuracy is preferably superior to that of a high-precision constant temperature chamber. More preferably superior to This provides a known and stable thermodynamic boundary condition.

[0042] During the constant current discharge phase, the supercapacitor is discharged with a constant current value until the preset discharge cutoff voltage is reached. During the constant current charging phase, the supercapacitor is charged with the same constant current value until the preset charging cutoff voltage is reached. It should be noted that, in order to ensure the accuracy of the thermal effect separation calculation, the current amplitude used in the constant current discharge phase and the constant current charging phase must be equal, and the selection of this current amplitude must take into account the rated capacity of the supercapacitor.

[0043] In step S200, the first temperature change value of the supercapacitor casing during the constant current discharge stage and the second temperature change value of the supercapacitor casing during the constant current charging stage are obtained. Specifically, before performing the above test cycle, a temperature sensing element, such as a high-precision thin-film platinum resistance temperature sensor, can be tightly attached to the surface of the supercapacitor casing, ensuring good thermal contact. This temperature sensor is connected to the data acquisition system, and the sampling frequency is not less than [missing information]. It is used to monitor and record changes in the shell temperature in real time.

[0044] During the constant current discharge phase, irreversible Joule heating and reversible entropy change heat occur inside the supercapacitor, causing a change in the shell temperature. The start and end times of this discharge phase are recorded, and the temperature change data of the supercapacitor shell during this phase are recorded simultaneously to obtain the first temperature change value. During the constant current charging phase, irreversible Joule heating and reversible entropy change heat also occur inside the supercapacitor, causing a change in the shell temperature. The start and end times of this charging phase are recorded, and the temperature change data of the supercapacitor shell during this phase are recorded simultaneously to obtain the second temperature change value.

[0045] Please see Figure 4 This is a typical charge / discharge time-temperature curve of a double-layer supercapacitor. The graph clearly records the temperature change of the supercapacitor casing during a complete charge / discharge test cycle. Specifically, in the graph: the Y-axis represents the temperature change value in Kelvin, with 0 representing the temperature reference point at the start of the test; the X-axis represents time in minutes; and the curve represents the temperature change of the supercapacitor casing relative to the initial temperature.

[0046] from Figure 4 As can be seen from the graph, during the discharge phase, current flows out, ion movement becomes disordered (entropy increases), and heat is absorbed. This endothermic effect exceeds the Joule heating generated by the internal resistance, causing the shell temperature to drop. The curve in the graph shows a significant negative peak, the amplitude of which is the first temperature change value mentioned above. During the charging phase, current flows in, ion movement becomes ordered (entropy decreases), and heat is released. At the same time, the internal resistance also generates Joule heating. The superposition of these two exothermic effects causes the shell temperature to rise. The curve in the graph shows a significant positive peak, the amplitude of which is the second temperature change value mentioned above.

[0047] Through the above-mentioned charge-discharge test cycle with symmetrical current amplitude performed under strict heat exchange environment, high signal-to-noise ratio temperature change data that truly reflects the internal heat generation behavior of the supercapacitor can be obtained, laying a reliable data foundation for subsequent accurate calculation of internal resistance.

[0048] In step S300, the internal resistance of the supercapacitor is calculated based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charging and discharging time.

[0049] In symmetrical constant current charge-discharge tests, the irreversible Joule heating effect caused by internal resistance is the same during the charge-discharge phase, while the reversible thermal effect caused by the entropy change of the ion system is equal in magnitude but opposite in sign during the charge-discharge phase. This characteristic allows the two to be accurately separated and the internal resistance to be solved by solving a simple thermal balance equation.

[0050] Specifically, the calculation process is implemented according to the following steps:

[0051] First, obtain the basic data obtained from the aforementioned testing steps:

[0052] The first temperature change value measured during the constant current discharge stage (unit: This value is usually negative, indicating a decrease in the casing temperature;

[0053] The second temperature change value measured during the constant current charging phase (unit: This value is usually positive, indicating that the casing temperature is rising;

[0054] The absolute value of the current applied during the constant current discharge and charging phases (unit: );

[0055] The constant current discharge time With constant current charging time To achieve accurate calculations, the discharge time should be equal to the charging time, i.e. (unit: ).

[0056] Secondly, the heat capacity parameter of the supercapacitor is determined. This parameter is the overall heat capacity of the supercapacitor, characterizing the amount of heat it needs to absorb to increase its temperature by 1 Kelvin. In practice, this heat capacity parameter can be determined by the mass of the supercapacitor. and its specific heat capacity The product of is obtained, that is (unit: )

[0057] The specific heat capacity The mass can be obtained by performing differential scanning calorimetry (DSC) tests on samples of the same type and material, or by estimating using known specific heat capacities of common materials. This represents the measured mass of the supercapacitor.

[0058] Then, the heat balance equation for the charging and discharging process is established:

[0059] During the constant current discharge phase, the ion system absorbs heat due to entropy increase, while Joule heating is generated due to internal resistance. The heat balance relationship is as follows:

[0060]

[0061] in, This is the heat absorbed due to the entropy change of the ion system (i.e., the absolute value of the reversible heat effect). This is the Joule heat generated by internal resistance.

[0062] During the constant current charging phase, the ion system releases heat as its entropy decreases, while Joule heating is also generated due to internal resistance. The heat balance relationship is as follows:

[0063]

[0064] Simultaneous equations sum equation Adding the two equations together will eliminate the difference. Item, obtained:

[0065]

[0066] Equivalence By performing the transformation, the internal resistance of the supercapacitor can be obtained. The calculation formula is as follows:

[0067]

[0068] Finally, the first temperature change value Second temperature change value Specific heat capacity ,quality Current value and time Substituting into the above calculation formula, the internal resistance value of the supercapacitor can be directly calculated. .

[0069] By conducting symmetrical constant-current charge-discharge tests on supercapacitors in a controlled heat exchange environment, interference from external environmental fluctuations on temperature measurements is effectively isolated, providing a crucial guarantee for obtaining pure and reliable data on casing temperature changes. Based on this, by real-time monitoring of the second temperature change during the charging phase and the first temperature change during the discharging phase of the charge-discharge cycle, and combining this with known heat capacity parameters, current values, and time parameters, the irreversible heating caused by internal resistance and the reversible heating caused by entropy changes in the ion system can be accurately separated, thereby accurately calculating the internal resistance value of the supercapacitor. This method fundamentally overcomes the shortcomings of traditional voltage drop or voltage bounce methods, which suffer from inconsistent measurement results and poor repeatability due to the influence of the test voltage range and relaxation time. It not only significantly improves the accuracy and reliability of internal resistance measurement and achieves precise analysis of the thermal behavior of supercapacitors, but also provides a pioneering technical means for quantitatively evaluating their reversible thermal effects, possessing significant engineering application value for product thermal management design, condition assessment, and life prediction.

[0070] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0071] In an exemplary embodiment, the method further includes:

[0072] Based on the sum of the first and second temperature changes, the heat capacity parameter, and the charge / discharge time, the reversible heating power of the supercapacitor ion system is calculated. Specifically, firstly, the data obtained from the test cycle in step S100 is acquired:

[0073] The first temperature change value measured during the constant current discharge phase (unit: This value is usually negative, indicating a decrease in the casing temperature;

[0074] The second temperature change value measured during the constant current charging phase (unit: This value is usually positive, indicating that the casing temperature is rising;

[0075] Duration of the constant current discharge and charge phase (unit: ),and (unit: ).

[0076] Next, the heat capacity parameter of the supercapacitor is obtained. This parameter represents the overall heat capacity of the supercapacitor. (unit: Preferably, the heat capacity... Through the mass of the supercapacitor and the specific heat capacity of its material The product is determined, that is The specific heat capacity The mass can be determined in advance by differential scanning calorimetry (DSC) or by using empirical values; This represents the measured mass of the supercapacitor.

[0077] The calculation of the reversible heating power is based on the following principle: in the symmetrical charge-discharge test, the reversible thermal effect caused by the entropy change of the ion system. The absolute value of is equal during the charging phase (heat release) and the discharging phase (heat absorption), according to the aforementioned heat balance equations. and :

[0078]

[0079]

[0080] Equation With equation Adding them together can eliminate the internal resistance Joule heating term. ,get:

[0081]

[0082] Therefore, the reversible thermal effect The calculation formula is:

[0083]

[0084] Subsequently, the reversible heating power of the ion system (unit: The reversible thermal effect is defined as the average power of the reversible thermal effect over a complete charge-discharge cycle; since the reversible thermal effect occurs during the charging period... and discharge period All of these events occur within the time frame, and their total duration of action can be considered as... Therefore, the reversible heating power By utilizing reversible thermal effects Divide by total time The calculation yielded:

[0085]

[0086] Finally, the first temperature change value Second temperature change value Heat capacity parameters (i.e.) ), and charge / discharge time Substituting into the above calculation formula, the reversible heating power of the supercapacitor ion system can be calculated. The reversible heating power It is a key parameter for evaluating the thermal behavior of supercapacitors, providing a precise data basis for the design of thermal management systems for practical applications.

[0087] In an exemplary embodiment, reference is made to... Figure 2 The charge-discharge test cycle includes the following steps in sequence:

[0088] In step S110, the supercapacitor is charged to an upper limit voltage and held at a constant voltage for a first preset time. The upper limit voltage is preferably the rated voltage of the supercapacitor. The first preset time is set to ensure that the supercapacitor is fully charged and the internal ion distribution reaches a stable state. Its range is usually 1 minute to 10 minutes, preferably 5 minutes. This step provides a stable and repeatable initial state for the subsequent constant current discharge.

[0089] In step S120, the constant current discharge stage is performed until the voltage drops to a lower limit voltage, and the discharge time is recorded. The lower limit voltage and the upper limit voltage together define the voltage window for testing. This window is usually selected within the linear operating region of the supercapacitor. For example, the lower limit voltage can be 0.6 times the upper limit voltage. The amplitude of the discharge current is selected according to the rated capacity of the supercapacitor, usually from 0.5C to 5C.

[0090] In step S130, after the constant current discharge stage, the supercapacitor is allowed to stand for a second preset time. This standing stage allows the ion concentration gradient inside the supercapacitor to relax naturally to a certain extent and makes the temperature distribution of its shell more uniform, providing a clearer starting point for subsequent temperature data analysis. The second preset time must ensure that thermal equilibrium is reached, and its range is usually 30 seconds to 10 minutes, preferably 200 seconds.

[0091] In step S140, the constant current charging phase is performed until the voltage rises back to the upper limit voltage, and the charging time is recorded. To ensure the accuracy of subsequent calculations, the charging time should be equal to the discharging time, that is, the accuracy of the charging and discharging current and the consistency of the voltage threshold should be controlled.

[0092] In step S150, the device is left to rest for a third preset time after the constant current charging phase. This resting phase serves a similar purpose to step S130, allowing the device to reach a new thermal equilibrium state after charging is complete, so that subsequent test cycles can be performed if needed. The third preset time may be the same as or different from the second preset time, and its range is typically from 30 seconds to 10 minutes, preferably 200 seconds.

[0093] It should be noted that during the test cycle, the voltage, current, and casing temperature data of the supercapacitor are recorded simultaneously, with a data recording time interval of no more than 0.1 seconds. Throughout the entire test cycle, the temperature change of the supercapacitor casing, terminal voltage, and current data must be continuously monitored and recorded. The data recording sampling interval should be sufficiently high, for example, no more than 0.1 seconds, to accurately capture the dynamic response process of voltage and temperature.

[0094] This disclosure also provides a measurement system for the parameters of a double-layer supercapacitor, used to implement the method described in any of the above embodiments. Please refer to [link to relevant documentation]. Figure 3 The system includes:

[0095] A heat insulation device 100 is used to house the supercapacitor under test. The heat insulation device 100 is used to house the supercapacitor under test and provide it with a test environment with controllable heat exchange. The heat insulation device 100 is preferably a heat insulation chamber, the chamber body of which is made of a low thermal conductivity material and filled with a high-efficiency heat insulation material, such as ultrafine glass fiber cotton or vacuum insulation board, to ensure that the heat exchange between the supercapacitor under test and the external environment is minimized.

[0096] The charging and discharging device 200 is electrically connected to the supercapacitor in the insulation device 100; the charging and discharging device 200 is preferably a programmable constant current charging and discharging tester, which is configured to output a precisely controlled constant current according to the command and monitor the terminal voltage of the supercapacitor, so as to realize the constant current charging and discharging cycle, constant voltage maintenance and voltage threshold judgment in the method.

[0097] A temperature measuring device 300 is disposed within the insulation device 100 and is used to measure the temperature of the supercapacitor casing. The temperature measuring device 300 preferably includes one or more high-precision temperature sensors and their signal conditioning circuits. The arrangement of the sensors must ensure that the average temperature of the casing can be accurately reflected. The temperature measuring device 300 has a high sampling rate to capture minute temperature changes during charging and discharging.

[0098] A control processing device 400 is communicatively connected to the charging / discharging device 200 and the temperature measuring device 300. The control processing device 400 is preferably a computer system with an integrated data acquisition card or a dedicated embedded controller. The control processing device 400 is configured to control the charging / discharging device 200 to execute the charging / discharging test cycle and acquire the temperature data measured by the temperature measuring device 300. Specifically, this includes the following steps:

[0099] Send control commands to the charging and discharging device 200 to drive it to execute the charging and discharging test cycle, including steps such as controlling charging to the upper limit voltage, constant voltage holding, constant current discharging to the lower limit voltage, resting, and constant current charging to the upper limit voltage;

[0100] The temperature data of the supercapacitor casing is acquired and recorded in real time from the temperature measuring device 300.

[0101] The charging and discharging device 200 acquires and records the charging and discharging current value, voltage value, and time parameters for each stage.

[0102] The control processing device 400 is further configured to calculate the internal resistance of the supercapacitor based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charging / discharging time. Specifically, the control processing device 400 internally stores calculation logic, which is programmed to automatically calculate the internal resistance of the supercapacitor based on the acquired first temperature change value, second temperature change value, current value, time, and the pre-stored or input thermal capacity parameter of the supercapacitor, according to the aforementioned formula for calculating the internal resistance of the supercapacitor.

[0103] The control processing device 400 is further configured to calculate the reversible heating power of the supercapacitor ion system based on the sum of the first temperature change value and the second temperature change value. Specifically, the control processing device 400 internally stores calculation logic, which is programmed to: read the first temperature change value of the constant current discharge stage and the second temperature change value of the constant current charging stage; calculate the sum of the absolute value of the first temperature change value and the second temperature change value, i.e.; read the pre-set or calibrated heat capacity parameter of the supercapacitor from the storage unit, which is preferably the product of specific heat capacity and mass; read the duration of the constant current discharge stage or constant current charging stage; substitute the above parameters into the above calculation formula for reversible heating power for calculation; and output the calculated value and unit of reversible heating power.

[0104] As another optional embodiment, the control processing device 400 may also provide a human-machine interface for setting test parameters, starting test programs, and displaying measurement results.

[0105] Through the coordinated work of the various parts of the system, the entire measurement process can be completed automatically, accurately acquiring the required parameters and effectively improving the accuracy, repeatability, and efficiency of the measurement.

[0106] In an exemplary embodiment, a storage medium including instructions is also provided, such as a memory including instructions, which can be executed by a processor of a terminal to complete the method for measuring the parameters of the double-layer supercapacitor. Optionally, the storage medium is a non-transitory computer-readable storage medium, such as a ROM (Read-Only Memory), RAM (Random Access Memory), CD-ROM (Compact Disc Read-Only Memory), magnetic tape, floppy disk, and optical data storage device.

[0107] In an exemplary embodiment, a computer program product is also provided, which includes computer program code stored in a computer-readable storage medium. A processor of a computer device reads the computer program code from the computer-readable storage medium and executes the computer program code, causing the computer device to perform the operations performed in the above-described method for measuring the parameters of a double-layer supercapacitor.

[0108] Any aspects of this invention not described in detail are well-known to those skilled in the art.

[0109] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A method for measuring the parameters of a double-layer supercapacitor, characterized in that, Includes the following steps: In a controlled heat exchange environment, a charge-discharge test cycle is performed on a double-layer supercapacitor. The charge-discharge test cycle includes a constant current discharge stage and a constant current charging stage, wherein the current amplitude of the constant current discharge stage is equal to that of the constant current charging stage. Obtain the first temperature change value of the supercapacitor casing during the constant current discharge stage, and the second temperature change value of the supercapacitor casing during the constant current charging stage; The internal resistance of the supercapacitor is calculated based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charging and discharging time.

2. The method for measuring the parameters of a double-layer supercapacitor according to claim 1, characterized in that, The method further includes: Based on the sum of the first temperature change value and the second temperature change value, the heat capacity parameter, and the charge / discharge time, the reversible heating power of the supercapacitor ion system is calculated.

3. A method for measuring the parameters of a double-layer supercapacitor according to claim 1 or 2, characterized in that, The charge-discharge test cycle includes the following steps in sequence: The supercapacitor is charged to an upper limit voltage and maintained at a constant voltage for a first preset time; Perform the constant current discharge phase until the voltage drops to the lower limit voltage, and record the discharge time; After the constant current discharge stage, allow the mixture to stand for a second preset time. Perform the constant current charging phase until the voltage rises back to the upper limit voltage, and record the charging time; After the constant current charging phase, the device is left to stand for a third preset time.

4. The method for measuring the parameters of a double-layer supercapacitor according to claim 3, characterized in that, The discharge time is equal to the charging time.

5. The method for measuring the parameters of a double-layer supercapacitor according to claim 1, characterized in that, During the test cycle, the voltage, current and casing temperature data of the supercapacitor are recorded synchronously, with a data recording time interval of no more than 0.1 seconds.

6. A measurement system for parameters of a double-layer supercapacitor, used to implement the method according to any one of claims 1 to 5, characterized in that, The system includes: Insulation device for housing the supercapacitor under test; The charging and discharging device is electrically connected to the supercapacitor in the insulation device; A temperature measuring device is installed inside the insulation device to measure the temperature of the supercapacitor casing; The control and processing device is communicatively connected to the charging and discharging device and the temperature measuring device. The control processing device is configured to control the charging and discharging device to execute the charging and discharging test cycle and to acquire the temperature data measured by the temperature measuring device.

7. The measurement system for parameters of a double-layer supercapacitor according to claim 6, characterized in that, The control processing device is further configured to calculate the internal resistance of the supercapacitor based on the first temperature change value, the second temperature change value, the thermal capacity parameter of the supercapacitor, the current value, and the charging and discharging time.

8. The measurement system for parameters of a double-layer supercapacitor according to claim 7, characterized in that, The control processing device is also configured to calculate the reversible heating power of the supercapacitor ion system based on the sum of the first temperature change value and the second temperature change value.

9. The measurement system for parameters of a double-layer supercapacitor according to claim 6, characterized in that, The insulation device is an insulated temperature chamber.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method as described in any one of claims 1 to 5.

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