Diffraction efficiency test system and method and diffraction efficiency calculation method and device

Abstract

The embodiment of the invention provides a diffraction efficiency test system and method and a diffraction efficiency calculation method and device, and relates to the field of X-ray diffraction, the system comprises an X-ray emitter, an X-ray detector, a first rotary table and a second rotary table; the first turntable is used for placing a first crystal; the second turntable is used for placing a second crystal; the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table can be switched between a first arrangement mode and a second arrangement mode; wherein in the first arrangement mode, X-rays emitted by the X-ray emitter enter the X-ray detector through the first crystal; and in the second arrangement mode, the X-ray emitted by the X-ray emitter sequentially passes through the first crystal and the second crystal to enter the X-ray detector. Through the technical scheme provided by the embodiment of the invention, the accuracy of diffraction efficiency measurement can be improved while the cost of a diffraction efficiency test system is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of X-ray diffraction, in particular to a diffraction efficiency testing system and method and a diffraction efficiency calculation method and device. BACKGROUND

[0002] Diffraction efficiency is an important indicator for measuring the response characteristics of crystal X-rays. Accurate determination of diffraction efficiency is beneficial to in-depth understanding of the Bragg diffraction principle of crystal and the mechanism of X-ray action, and provides important theoretical basis and technical support for crystal design and development of single-energy X-ray devices, and promotes the continuous development of material science and X-ray diffraction technology. Therefore, accurate determination of crystal diffraction efficiency is crucial.

[0003] In related technologies, some diffraction efficiency testing systems rely on large-scale equipment such as synchrotron radiation sources to determine the diffraction efficiency of crystals. This scheme can accurately determine the diffraction efficiency of crystals, but the diffraction efficiency testing system is costly and difficult to use for crystal diffraction efficiency testing in a conventional laboratory. Alternatively, some diffraction efficiency testing systems rely on a single X-ray source and a detector to determine the diffraction efficiency of crystals. The cost of the above diffraction efficiency testing system is relatively low and can be used for crystal diffraction efficiency testing in a conventional laboratory. However, due to the poor monochromaticity of the single X-ray source and other factors, the accuracy of the determination of the diffraction efficiency of the crystal is low. SUMMARY

[0004] The purpose of the embodiments of the present application is to provide a diffraction efficiency testing system and method and a diffraction efficiency calculation method and device to reduce the cost of the diffraction efficiency testing system while improving the accuracy of the diffraction efficiency determination. The specific technical solutions are as follows:

[0005] In a first aspect, the embodiments of the present application provide a diffraction efficiency testing system, which comprises:

[0006] an X-ray emitter, an X-ray detector, a first turntable and a second turntable;

[0007] The first turntable is used to place a first crystal, and the second turntable is used to place a second crystal;

[0008] The X-ray emitter, the X-ray detector, the first turntable and the second turntable can be switched between a first arrangement mode and a second arrangement mode;

[0009] When in the first arrangement mode, the X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal;

[0010] When in the second arrangement mode, the X-rays emitted by the X-ray emitter are sequentially incident on the X-ray detector via the first crystal and the second crystal.

[0011] In one embodiment of the present application, the placement position of the X-ray emitter and the first rotary table when in the first arrangement mode is the same as the placement position of the X-ray emitter and the first rotary table when in the second arrangement mode.

[0012] When in the first arrangement mode, the X-ray detector is placed at a first position, and the second rotary table is placed at a second position, the first position being a position on a primary diffraction light path of X-rays generated via the first crystal, and the second position being a position not on the primary diffraction light path of X-rays generated via the first crystal.

[0013] When in the second arrangement mode, the X-ray detector is placed at a third position, and the second rotary table is placed at a fourth position, the third position being a position on a secondary diffraction light path of X-rays sequentially generated via the first crystal and the second crystal, and the fourth position being a position on the primary diffraction light path of X-rays generated via the first crystal.

[0014] In one embodiment of the present application, the system further comprises a base, the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table being placed on the base when in the first arrangement mode or the second arrangement mode.

[0015] The X-ray detector comprises a detection assembly, a lifting assembly and a displacement assembly, the lifting assembly moving the detection assembly in a height direction, and the displacement assembly moving the detection assembly within a placement range of the base.

[0016] In one embodiment of the present application, the first rotary table and the second rotary table comprise a driving assembly and a support assembly, the support assembly being used to support the first crystal or the second crystal, and the driving assembly rotating the support assembly along a central axis of the support assembly.

[0017] In one embodiment of the present application, the support assembly comprises a first clamping portion and a second clamping portion, the first clamping portion and the second clamping portion being arranged in parallel, and the first clamping portion and the second clamping portion cooperatively clamping the first crystal or the second crystal.

[0018] In one embodiment of the present application, the X-ray emitter comprises an X-ray light source and a collimator, the X-ray light source and the collimator being connected and the collimator being located in a light emitting direction of the X-ray light source.

[0019] In a second aspect, an embodiment of the present application provides a diffraction efficiency testing method, which is applied to any of the above-mentioned diffraction efficiency testing systems, and the method comprises:

[0020] The first crystal is placed on the first rotary table, and the second crystal is placed on the second rotary table.

[0021] The X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the first arrangement mode, the X-ray emitter is controlled to generate X-ray irradiation to the diffraction surface of the first crystal to generate first diffraction, the light beam of the first diffraction is incident on the X-ray detector, the X-ray detector is controlled to record the light beam of the first diffraction to obtain a first diffraction spectrum, and the first target energy corresponding to a first diffraction peak is determined according to the first diffraction spectrum.

[0022] The X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the second arrangement mode, the X-ray emitter is controlled to generate X-ray irradiation to the diffraction surface of the first crystal to generate first diffraction, the light beam of the first diffraction is incident on the X-ray detector, the X-ray detector is controlled to record the light beam of the first diffraction to obtain a first diffraction spectrum, and the first target energy corresponding to a first diffraction peak is determined according to the first diffraction spectrum.

[0023] In an embodiment of the present application, the method further comprises:

[0024] The X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the first arrangement mode, the first crystal placed on the first rotary table is removed, the X-ray emitter is controlled to generate X-ray irradiation to the first rotary table, the X-ray detector is controlled to record the X-ray light beam to obtain a third energy spectrum, and the third photon count at the first target energy is determined according to the third energy spectrum.

[0025] The X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the second arrangement mode, the second crystal placed on the second rotary table is removed, the X-ray generated by the X-ray emitter is incident on the second rotary table via the first crystal, the X-ray detector is controlled to record the X-ray light beam to obtain a fourth energy spectrum, and the fourth photon count at the second target energy is determined according to the fourth energy spectrum.

[0026] In a third aspect, an embodiment of the present application provides a diffraction efficiency calculation method, which comprises:

[0027] acquire a first photon count and a second photon count, the first photon count and the second photon count being obtained according to the diffraction efficiency test method described above;

[0028] determine the diffraction efficiency of the crystal under test at a target energy according to a ratio of the second photon count to the first photon count; the target energy being an energy corresponding to the first photon count or the second photon count; or

[0029] acquire a first photon count, a second photon count, a third photon count and a fourth photon count, the first photon count, the second photon count, the third photon count and the fourth photon count being obtained according to the diffraction efficiency test method described above;

[0030] determine the diffraction efficiency of the crystal under test at a target energy according to a ratio of a fifth photon count to a sixth photon count; the fifth photon count being a difference between the second photon count and the fourth photon count, the sixth photon count being a difference between the first photon count and the third photon count; the target energy being an energy corresponding to the first photon count or the second photon count.

[0031] In a fifth aspect, an embodiment of the present application provides a diffraction efficiency calculation device, the device comprising:

[0032] a first acquisition module, configured to acquire a first photon count and a second photon count, the first photon count and the second photon count being obtained according to the diffraction efficiency test method described above;

[0033] a first diffraction efficiency determination module, configured to determine the diffraction efficiency of the crystal under test at a target energy according to a ratio of the second photon count to the first photon count; the target energy being an energy corresponding to the first photon count or the second photon count; or

[0034] a second acquisition module, configured to acquire a first photon count, a second photon count, a third photon count and a fourth photon count, the first photon count, the second photon count, the third photon count and the fourth photon count being obtained according to the diffraction efficiency test method described above;

[0035] a second diffraction efficiency determination module, configured to determine the diffraction efficiency of the crystal under test at a target energy according to a ratio of a fifth photon count to a sixth photon count; the fifth photon count being a difference between the second photon count and the fourth photon count, the sixth photon count being a difference between the first photon count and the third photon count; the target energy being an energy corresponding to the first photon count or the second photon count.

[0036] An embodiment of the present application further provides an electronic device, comprising:

[0037] a memory, configured to store a computer program;

[0038] The processor is configured to implement the diffraction efficiency calculation method according to any one of the preceding embodiments when executing the program stored in the memory.

[0039] The application further provides a computer readable storage medium, which stores a computer program, and the computer program is configured to implement the diffraction efficiency calculation method according to any one of the preceding embodiments when executed by a processor.

[0040] The application further provides a computer program product comprising instructions which, when executed on a computer, cause the computer to carry out the diffraction efficiency calculation method according to any one of the preceding embodiments.

[0041] The application has the following beneficial effects:

[0042] In the technical scheme provided by the application, the diffraction efficiency test system relies on an X-ray emitter to emit X-rays, and does not rely on a large-scale device such as a synchrotron radiation source to emit X-rays. The X-ray emitter has a lower cost than the synchrotron radiation source, so that the diffraction efficiency test system has a lower cost and can be used for crystal diffraction efficiency testing in a conventional laboratory.

[0043] In addition, in the diffraction efficiency test system, the X-ray source, the X-ray detector, the first rotary table and the second rotary table can be switched between the first arrangement mode and the second arrangement mode. When the diffraction efficiency test system is in the first arrangement mode, the X-rays emitted by the X-ray source are incident on the X-ray detector via the first crystal, that is, a light path of once diffraction is formed. When the diffraction efficiency test system is in the second arrangement mode, the X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal and the second crystal in sequence, that is, a light path of twice diffraction is formed. After the X-rays pass through the first crystal, certain stray light can be filtered out, and the monochromaticity of the X-rays is improved. In this way, the error caused by the accumulation of the photon counts of the energy near the target energy on the channel address of the target energy due to the poor monochromaticity of the X-rays when the X-ray detector records the photon counts at the target energy can be reduced. Therefore, the photon counts of a specific energy in the light path of once diffraction recorded by the X-ray detector and the photon counts of a specific energy in the light path of twice diffraction are more accurate. Furthermore, the diffraction efficiency calculated based on the two parameters is also more accurate, and the accuracy of the diffraction efficiency test is improved.

[0044] Of course, implementing any product or method of the application does not necessarily require all the advantages described above to be achieved at the same time. BRIEF DESCRIPTION OF DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description only represent some of the embodiments of the present application, and all other embodiments obtained by those of ordinary skill in the art based on these drawings also belong to the protection scope of the present application.

[0046] Figure 1 A structural schematic diagram of a diffraction efficiency test system provided by an embodiment of the present application is shown in the figure.

[0047] Figure 2 A schematic diagram of a second arrangement provided by an embodiment of the present application is shown in the figure.

[0048] Figure 3 A flowchart of a diffraction efficiency test method provided by an embodiment of the present application is shown in the figure.

[0049] Figure 4 A schematic diagram of primary diffraction and secondary diffraction X-ray energy spectrum after background subtraction provided by an embodiment of the present application is shown in the figure.

[0050] Figure 5 A flowchart of a first diffraction efficiency test calculation method provided by an embodiment of the present application is shown in the figure.

[0051] Figure 6 A flowchart of a second diffraction efficiency test calculation method provided by an embodiment of the present application is shown in the figure.

[0052] Figure 7 A structural schematic diagram of a first diffraction efficiency test device provided by an embodiment of the present application is shown in the figure.

[0053] Figure 8 A structural schematic diagram of a second diffraction efficiency test device provided by an embodiment of the present application is shown in the figure.

[0054] Figure 9 A structural schematic diagram of an electronic device provided by an embodiment of the present application is shown in the figure. DETAILED DESCRIPTION

[0055] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments only represent some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art based on the present application also belong to the protection scope of the present application.

[0056] X-ray diffraction is one of the core technologies for revealing the microscopic structure of matter, and its applications are deeply integrated into multiple dimensions of modern scientific research, industrial technology, and social development. Crystal Bragg diffraction, as one form of X-ray diffraction, allows for energy selection of X-rays. Its unique monochromatic energy spectrum characteristics are widely used in materials characterization and analysis, light source development, and detector calibration. The core of crystal Bragg diffraction is Bragg's law: when the wavelength of the incident X-rays is approximately equal to the interatomic distance of the crystal, Bragg diffraction occurs. The X-rays are scattered by the crystal atoms in a mirror-like manner and undergo constructive interference, thus achieving high-intensity X-ray emission at specific energies.

[0057] Diffraction efficiency is an important indicator for measuring the X-ray response characteristics of crystals. Accurate measurement of diffraction efficiency is beneficial for a deeper understanding of the Bragg diffraction principle of crystals and the mechanism of X-ray action, providing important theoretical basis and technical support for crystal design and the development of single-energy X-ray devices, and promoting the continuous development of materials science and X-ray diffraction technology. Therefore, accurate measurement of crystal diffraction efficiency is of utmost importance.

[0058] In related technologies, some diffraction efficiency testing systems rely on large-scale equipment such as synchrotron radiation sources to determine crystal diffraction efficiency. This approach can accurately measure crystal diffraction efficiency; however, these systems are expensive and difficult to use in conventional laboratories. Alternatively, some diffraction efficiency testing systems rely on a single X-ray source and detector to determine crystal diffraction efficiency. These systems are less expensive and can be used in conventional laboratories; however, due to factors such as the poor monochromaticity of a single X-ray source, the accuracy of crystal diffraction efficiency measurement is low.

[0059] In order to reduce the cost of the diffraction efficiency testing system while improving the accuracy of diffraction efficiency measurement, this invention provides a diffraction efficiency testing system and method, and a diffraction efficiency calculation method and apparatus.

[0060] First, the diffraction efficiency testing system provided in the embodiments of the present invention will be described.

[0061] The following is combined with Figures 1 to 2 The diffraction efficiency testing system provided in the embodiments of the present invention will be described.

[0062] See Figure 1 This is a schematic diagram of a diffraction efficiency testing system provided in an embodiment of the present invention.

[0063] The diffraction efficiency testing system includes an X-ray emitter 1, an X-ray detector 2, a first turntable 3, and a second turntable 4;

[0064] The first rotary table 3 is used for placing a first crystal, and the second rotary table 4 is used for placing a second crystal.

[0065] The X-ray emitter 1, the X-ray detector 2, the first rotary table 3 and the second rotary table 4 can be switched between the first arrangement mode and the second arrangement mode.

[0066] The first crystal and the second crystal are both to-be-tested crystals, and the first crystal and the second crystal can be crystals of the same material, including but not limited to Si(220), Si(311), Si(400), Si(331) and Si(224).

[0067] In the embodiment of the application, when the X-ray emitter 1, the X-ray detector 2, the first rotary table 3 and the second rotary table 4 are in the first arrangement mode, the X-rays emitted by the X-ray emitter 1 are incident on the X-ray detector 2 via the first crystal, that is, a first diffraction light path is formed; when the X-ray emitter 1, the X-ray detector 2, the first rotary table 3 and the second rotary table 4 are in the second arrangement mode, the X-rays emitted by the X-ray emitter 1 are incident on the X-ray detector 2 via the first crystal and the second crystal in sequence, that is, a second diffraction light path is formed.

[0068] In the embodiment of the application, the first arrangement mode and the second arrangement mode can be set in advance, that is, the placement positions of the X-ray emitter 1, the X-ray detector 2, the first rotary table 3 and the second rotary table 4 are set as the first arrangement mode and the second arrangement mode. As long as the first arrangement mode can meet the condition of forming a first diffraction light path, the second arrangement mode can meet the condition of forming a second diffraction light path.

[0069] In one embodiment of the application, when in the first arrangement mode, the placement positions of the X-ray emitter 1 and the first rotary table 3 are the same as the placement positions of the X-ray emitter 1 and the first rotary table 3 when in the second arrangement mode; when in the first arrangement mode, the X-ray detector 2 is placed at a first position, and the second rotary table 4 is placed at a second position, the first position is a position on a first diffraction light path generated by the X-rays via the first crystal, and the second position is a position not on the first diffraction light path generated by the X-rays via the first crystal; when in the second arrangement mode, the X-ray detector 2 is placed at a third position, and the second rotary table 4 is placed at a fourth position, the third position is a position on a second diffraction light path generated by the X-rays via the first crystal and the second crystal in sequence, and the fourth position is a position on the first diffraction light path generated by the X-rays via the first crystal.

[0070] Referring to Figure 2A schematic view of a second arrangement mode provided by the embodiment of the present application can be seen from the figure, the X-ray emitter 1 and the first turntable 3 are placed on the same horizontal line, the second turntable 4 is placed on the position of the first diffraction light path of the X-ray via the first crystal, the X-ray detector 2 is placed on the position of the second diffraction light path of the X-ray via the first crystal and the second crystal in turn, the first turntable 3 and the second turntable 4 are placed on the same vertical line, the X-ray detector 4 and the second turntable 4 are placed on the same horizontal line, the arrow direction of the X-ray via the first crystal on the first turntable 3 in the figure is the direction of the first diffraction light path, and the arrow direction of the X-ray via the second crystal on the second turntable 4 is the direction of the second diffraction light path.

[0071] The X-ray emitter 1 and the first turntable 3 are placed on the same horizontal line, so that the X-ray can be aligned to the first crystal placed on the first turntable 3, the second turntable 4 is placed on the position of the first diffraction light path of the X-ray via the first crystal, and the X-ray detector 2 is placed on the position of the second diffraction light path of the X-ray via the first crystal and the second crystal in turn, so as to realize that the X-ray emitter 1, the X-ray detector 2, the first turntable 3 and the second turntable 4 are in the second arrangement mode. It should be noted that when in the second arrangement mode, the first turntable is placed with the first crystal, and the second turntable is placed with the second crystal, so that the X-ray emitted by the X-ray emitter 1 is incident to the X-ray detector 2 via the first crystal placed on the first turntable 3 and the second crystal placed on the second turntable 4 in turn.

[0072] Continuing to refer to Figure 2 , the positions of the X-ray emitter 1 and the first turntable 3 remain unchanged, the X-ray detector 2 is placed on the position of the first diffraction light path of the X-ray via the first crystal (the second turntable 4 in the Figure 2 may be replaced by the X-ray detector 2, and the X-ray detector 2 is aligned to the first crystal), and the second turntable 4 is placed on the position other than the first diffraction light path of the X-ray via the first crystal, or the second turntable 4 can be directly not placed.

[0073] The X-ray emitter 1 and the first turntable 3 are placed on the same horizontal line, so that the X-ray can be aligned to the first crystal placed on the first turntable 3, the X-ray detector 2 is placed on the position of the first diffraction light path of the X-ray via the first crystal, and the second turntable 4 is placed on the position other than the first diffraction light path of the X-ray via the first crystal, so as to realize that the X-ray emitter 1, the X-ray detector 2 and the first turntable 3 are in the first arrangement mode. It should be noted that when in the first arrangement mode, the first turntable is placed with the first crystal, so that the X-ray emitted by the X-ray emitter 1 is incident to the X-ray detector 2 after Bragg diffraction of the first crystal placed on the first turntable.

[0074] Correspondingly, the first arrangement mode and the second arrangement mode can be switched by adjusting the placement position relationship between the X-ray detector 2 and the second turntable 4.

[0075] For example, if the first arrangement mode is currently adopted, the position of the second turntable 4 is adjusted to a position on the first diffraction light path of the X-ray generated by the first crystal, and the position of the X-ray detector 2 is adjusted to a position on the second diffraction light path of the X-ray generated by the first crystal and the second crystal in turn, i.e., the light emitting direction of the first crystal on the first turntable 3 is adjusted to be opposite to the X-ray detector 2, the light emitting direction of the first crystal on the first turntable 3 is adjusted to be opposite to the second turntable 4, and the light emitting direction of the second crystal on the second turntable 4 is adjusted to be opposite to the X-ray detector 2, so as to switch the first arrangement mode to the second arrangement mode.

[0076] If the second arrangement mode is currently adopted, the position of the second turntable 4 is adjusted to a position outside the first diffraction light path of the X-ray generated by the first crystal (the second turntable 4 can also be directly removed), and the position of the X-ray detector 2 is adjusted to a position on the first diffraction light path of the X-ray generated by the first crystal, so as to switch the second arrangement mode to the first arrangement mode.

[0077] When the X-ray emitter 1, the X-ray detector 2, the first turntable 3 and the second turntable 4 are in the first arrangement mode, the light emitting direction of the diffraction light of the first crystal is opposite to the X-ray detector 2, so that the X-ray emitted by the X-ray emitter 1 can reach the X-ray detector 2 after being Bragg diffracted by the first crystal placed on the first turntable 3.

[0078] When the X-ray emitter 1, the X-ray detector 2, the first turntable 3 and the second turntable 4 are in the second arrangement mode, the light emitting direction of the diffraction light of the first crystal is opposite to the second crystal, so that the X-ray emitted by the X-ray emitter 1 can be incident to the X-ray detector 2 in turn through the first crystal placed on the first turntable 3 and the second crystal placed on the second turntable 4.

[0079] In an embodiment of the present application, the X-ray emitter 1 comprises an X-ray light source 11 and a collimator 12, the X-ray light source 11 and the collimator 12 are connected, and the collimator 12 is located on the light emitting direction of the X-ray light source 11.

[0080] The X-ray light source 11 is used to emit continuous spectrum X-rays. Specifically, the target material of the X-ray light source can determine the energy distribution of the X-rays, the focal spot size determines the divergence of the light beam, and the maximum tube current restricts the intensity of the X-ray output, which together constitute the core performance framework of the X-ray light source. In the embodiment of the application, the target material of the X-ray light source 11 includes but is not limited to a W target (tungsten target), a Mo target (molybdenum target), a Cu target (copper target), and a Ti target (titanium target). The focal spot size of the X-ray light source 11 can be set to 1 mm x 1 mm, and the maximum tube current of the X-ray light source can be set to 1 mA (milliampere).

[0081] The collimator 12 is used to limit the beam size of the X-rays and to realize light path collimation. Specifically, the collimator 12 can be made of stainless steel, and the length thereof can be set to 10 cm, and the aperture thereof is 1 mm.

[0082] The continuous spectrum X-rays emitted by the X-ray light source 11 pass through the collimator 12. The collimator 12 converts the X-ray beam into a parallel or directional narrow beam light form by means of a slit or grid composed of metal septa (such as lead or tungsten), and shoots into the crystal to be measured, accurately controls the irradiation range of the X-rays, and ensures that only the crystal region to be measured is irradiated, thereby improving the accuracy of the diffraction efficiency measurement.

[0083] In an embodiment of the application, the X-ray emitter 1 can further include a connecting assembly for connecting the X-ray light source 11 and the collimator 12. Specifically, the connecting assembly can be a light source adapter flange, which can realize the adaptation of the X-ray light source 11 and the collimator 12 when the interfaces thereof are inconsistent.

[0084] In an embodiment of the application, the above-mentioned diffraction efficiency test system further includes a base 5, which is used to place the X-ray emitter 1, the X-ray detector 2, the first rotary table 3, and the second rotary table 4 when they are in the above-mentioned first arrangement or the above-mentioned second arrangement, thereby realizing the fixation of the X-ray emitter 1, the X-ray detector 2, the first rotary table 3, and the second rotary table 4.

[0085] In an embodiment of the application, the X-ray detector 2 includes a detection assembly 21, a lifting assembly 22, and a displacement assembly 23.

[0086] The detection assembly 21 is used to record the number of X-ray photons, which can be any one of a silicon drift detector, a CdZnTe detector, and a high-purity germanium detector, or other types of detectors. The specific type of the detection assembly is not limited in the embodiment of the application.

[0087] The response energy range of the X-ray detector can represent the X-ray photon energy range that the detector can effectively respond to, and this parameter can determine the applicable scenario of the detector; the energy resolution of the X-ray detector can describe the ability of the detector to distinguish adjacent energy X-ray photons, and the smaller the value, the higher the resolution, and the stronger the ability to distinguish adjacent energy X-ray photons; the detection efficiency of the X-ray detector can represent the probability of the detector converting incident X-ray photons into measurable signals. According to specific application scenarios and requirements, the appropriate response energy range, energy resolution and detection efficiency of the X-ray detector can be determined. For example, the application scenario of the present application is the scenario of testing crystals, so the response energy range of the detection assembly is set to cover 1keV-100keV, the energy resolution is <5%, and the detection efficiency is >80%.

[0088] The lifting assembly 22 can be a motorized lifting platform with a lifting accuracy of better than 0.1mm, and the displacement assembly 23 can be a motorized displacement platform with a displacement accuracy of better than 0.1mm.

[0089] The lifting assembly 22 drives the detection assembly 21 to move in the height direction, and the displacement assembly drives the detection assembly to move within the placement range of the base 5. By adjusting the position and height of the detection assembly 21 through the lifting assembly 22 and the displacement assembly 23, the position of the detection assembly 21 is optimized to ensure the highest X-ray photon receiving efficiency and maximize the diffraction peak signal strength determined by the detection assembly 21.

[0090] The lifting assembly 22 drives the detection assembly 21 to move in the height direction, and the displacement assembly 23 drives the detection assembly 21 to move within the placement range of the base 5. The implementation can be a one-dimensional scanning method, i.e., fixing the displacement assembly 23 first, adjusting the lifting assembly 22 to find the intensity peak value; then fixing the lifting assembly 22, adjusting the displacement assembly 23 to optimize the position of the detection assembly 21, or fixing the lifting assembly 22 first, adjusting the displacement assembly 23 to find the maximum peak value of the diffraction peak; then fixing the displacement assembly 23, adjusting the lifting assembly 22 to optimize the position of the detection assembly 21.

[0091] The lifting assembly 22 drives the detection assembly 21 to move in the height direction, and the displacement assembly 23 drives the detection assembly 21 to move within the placement range of the base 5. The implementation can be a two-dimensional scanning method, i.e., adjusting the lifting assembly 22 and the displacement assembly 23 at the same time to find the maximum peak value of the diffraction peak, and to optimize the position of the detection assembly 21.

[0092] In one embodiment of the present application, the first turntable 3 includes a driving assembly 31 and a supporting assembly 32, and the second turntable 4 includes a driving assembly 41 and a supporting assembly 42.

[0093] The driving assembly is used to drive the supporting assembly to rotate along the central axis of the supporting assembly. For example, the driving assembly is an electric rotating table, and the angular positioning accuracy of the electric rotating table is better than 0.001°. The supporting assembly is used to support the to-be-tested crystal (the first crystal and the second crystal), so that the to-be-tested crystal can be irradiated by X-rays, and the to-be-tested crystal is prevented from being blocked.

[0094] In one embodiment of the present application, the supporting assembly 32 includes a first clamping part 321 and a second clamping part 322, and the supporting assembly 42 includes a first clamping part 421 and a second clamping part 422. The first clamping part and the second clamping part are arranged in parallel. The first clamping part 321 and the second clamping part 322 cooperatively clamp the first crystal, and the first clamping part 421 and the second clamping part 422 cooperatively clamp the second crystal. Specifically, the first clamping part and the second clamping part are arranged vertically in parallel or transversely in parallel. In this way, the first clamping part and the second clamping part cooperatively clamping the to-be-tested crystal can prevent the to-be-tested crystal from being blocked, and improve the irradiation area of the X-rays irradiated to the to-be-tested crystal.

[0095] As can be seen from the above embodiments, the diffraction efficiency test system provided by the embodiments of the present application relies on the X-ray emitter to emit X-rays, does not rely on large equipment such as a synchrotron radiation source to emit X-rays, and the X-ray emitter has a lower cost than the synchrotron radiation source. Therefore, the cost of building the diffraction efficiency test system is low, and the diffraction efficiency test system can be used for crystal diffraction efficiency testing in a conventional laboratory.

[0096] In addition, in the diffraction efficiency test system, the X-ray source, the X-ray detector, the first rotating table and the second rotating table can be switched between the first arrangement mode and the second arrangement mode. When the diffraction efficiency test system is in the first arrangement mode, the X-rays emitted by the X-ray source are incident on the X-ray detector via the first crystal, i.e., a light path of once diffraction is formed. When the diffraction efficiency test system is in the second arrangement mode, the X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal and the second crystal in sequence, i.e., a light path of twice diffraction is formed. After the X-rays pass through the first crystal, certain stray light can be filtered out, and the monochromaticity of the X-rays is improved. In this way, the error caused by the accumulation of the photon counts of the energy near the target energy on the channel address of the target energy due to the poor monochromaticity of the X-rays when the X-ray detector records the photon counts at the target energy can be reduced. Therefore, the photon counts of a specific energy recorded by the X-ray detector in the light path of once diffraction and the photon counts of a specific energy in the light path of twice diffraction are more accurate. Furthermore, the diffraction efficiency calculated based on the two parameters is also more accurate, and the accuracy of the diffraction efficiency test is improved.

[0097] Next, a diffraction efficiency test method provided by an embodiment of the present application will be described.

[0098] Referring to Figure 3A flowchart of a diffraction efficiency test method provided by an embodiment of the present application is shown in the figure, the method can be applied to the diffraction efficiency test system described above, and the method comprises steps S301-S303.

[0099] S301, the first crystal is placed on the first turntable, and the second crystal is placed on the second turntable.

[0100] In the embodiment of the present application, the first crystal can be placed on the first turntable when the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the first arrangement mode, and the first crystal can be placed on the first turntable and the second crystal can be placed on the second turntable when the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the second arrangement mode.

[0101] In one embodiment of the present application, the X-ray emitter and the X-ray detector can be turned on when the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the first arrangement mode, and the X-ray emitter and the X-ray detector can be turned off after the first photon count is recorded by the X-ray detector. When the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the second arrangement mode and the second photon count is recorded by the X-ray detector, the X-ray emitter and the X-ray detector are turned on again.

[0102] In one embodiment of the present application, the X-ray emitter and the X-ray detector can be continuously turned on when the X-ray detector records the first photon count and the second photon count.

[0103] S302, the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the first arrangement mode, the X-ray emitter is controlled to generate X-rays to irradiate the diffraction surface of the first crystal to produce first diffraction, the light beam of the first diffraction is incident on the X-ray detector, the X-ray detector is controlled to record the light beam of the first diffraction to obtain a first diffraction spectrum, and the first target energy corresponding to the first diffraction peak is determined according to the first diffraction spectrum.

[0104] In the embodiment of the present application, the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed according to the first arrangement mode, the diffraction surface of the first crystal is adjusted with the X-ray beam direction by rotating the first turntable, Bragg diffraction of X-rays is caused, a light path of the first diffraction is formed, that is, the X-rays generated by the X-ray emitter irradiate the diffraction surface of the first crystal to produce the first diffraction, the light beam of the first diffraction is incident on the X-ray detector, so that the X-ray photon count is recorded by the X-ray detector to obtain a diffraction spectrum.

[0105] The X-ray detector can distinguish X-rays of different energies, specifically in the form of an X-ray energy spectrum (diffraction spectrum), and can record the photon count at the target energy corresponding to the center channel address of the Bragg diffraction peak. When the angle between the diffraction surface of the first crystal and the X-ray beam direction is different, the target energy corresponding to the center channel address of the Bragg diffraction peak is also different. Therefore, in the embodiment of the present application, by rotating the first rotary table, the angle between the diffraction surface of the first crystal and the X-ray beam direction is changed, and then X-rays of different energies can be generated. The target energy corresponding to the diffraction peak in the diffraction spectrum generated by the X-ray detector is also not the same, and the photon count at different energies can be recorded, and then the diffraction efficiency of the test crystal at different energies can be realized.

[0106] In the embodiment of the present application, before starting the diffraction efficiency test, the position of the X-ray detector can also be roughly adjusted, so that the X-ray detector is roughly aligned with the center position of the first crystal first. The X-ray detector can record the first diffraction spectrum within a preset time, that is, the photon count corresponding to different energies within the preset time, and record the photon count at the first target energy corresponding to the first diffraction peak in the first diffraction spectrum. At the same time, the detection assembly can be moved by the lifting assembly and the displacement assembly in the X-ray detector to find the maximum count at the first target energy, which is determined as the first photon count.

[0107] For example, when the diffraction efficiency of the test crystal is tested, the target material of the X-ray source in the X-ray detector can be a titanium target, and the test crystal (the first crystal and the second crystal) can be a Si(220) crystal. The X-rays emitted by the X-ray source are incident on the X-ray detector via the first crystal. By rotating the first rotary table, the angle between the diffraction surface of the first crystal and the X-ray beam direction is 45.8°. The X-ray energy spectrum under the test integration time of 60s is tested, and the count at the target energy E=4.51keV corresponding to the center channel address of the Bragg diffraction peak is recorded. The position of the X-ray detector is adjusted by the lifting assembly and the displacement assembly to find the maximum count position, which is recorded as the first photon count.

[0108] S303, the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the second arrangement mode, the X-ray emitter is controlled to generate X-rays to irradiate the diffraction surface of the first crystal to produce primary diffraction, the primary diffraction beam is diffracted to the diffraction surface of the second crystal to produce secondary diffraction, and the secondary diffraction beam is incident on the X-ray detector; the X-ray detector is controlled to record the secondary diffraction beam to obtain a second diffraction spectrum, and the second photon count at the second target energy corresponding to the second diffraction peak is determined according to the second diffraction spectrum.

[0109] Wherein, the first target energy and the second target energy are the same.

[0110] In the embodiment of the present application, the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table are placed according to the second arrangement mode to form a light path of secondary diffraction, that is, the X-ray emitter generates X-ray irradiation to the diffraction surface of the first crystal to generate primary diffraction, the light beam of primary diffraction is diffracted to the diffraction surface of the second crystal to generate secondary diffraction, and the light beam of secondary diffraction is incident to the X-ray detector, so that the X-ray detector records the number of X-ray photons.

[0111] In the embodiment of the present application, before the diffraction efficiency test is started, the position of the X-ray detector can be roughly adjusted, so that the X-ray detector is roughly aligned with the center position of the second crystal first.

[0112] When the X-ray detector scans the light beam of secondary diffraction to generate a diffraction spectrum, since the angle between the diffraction surface of the second crystal and the X-ray beam direction does not necessarily fully satisfy the Bragg law under the second target energy, at this time, the energy corresponding to the diffraction peak of the generated diffraction spectrum may be different from the first target energy corresponding to the diffraction peak of the above-mentioned first diffraction spectrum, or the diffraction peak does not appear. Therefore, by fine-tuning the angle of the second rotary table according to a preset step size until the X-ray detector scans to determine the second diffraction spectrum, the second target energy corresponding to the second diffraction peak of the second diffraction spectrum is the same as the first target energy corresponding to the diffraction peak of the above-mentioned first diffraction spectrum, and the photon count under the second target energy corresponding to the second diffraction peak in the second diffraction spectrum is recorded. At the same time, the detection assembly can be moved by the lifting assembly and the displacement assembly in the X-ray detector to find the maximum count under the second target energy and determine the second photon count.

[0113] It should be noted that the first target energy corresponding to the first diffraction peak in the first diffraction spectrum is the same as the second target energy corresponding to the second diffraction peak in the second diffraction spectrum, in order to realize the Bragg diffraction efficiency of the test crystal under a specific target energy.

[0114] Continuing the above example, the X-ray emitter and the X-ray detector are turned on, the X-ray emitted by the X-ray source in the X-ray emitter is incident to the X-ray detector through the first crystal and the second crystal in turn, the X-ray energy spectrum under the integral time of 60s is tested by the X-ray detector, the second rotary table is rotated by the program control with a step size of 0.001° until the secondary diffraction peak appears and reaches the maximum value, the count under the specific energy E=4.51keV is recorded, the position of the X-ray detection assembly is scanned and adjusted by the lifting assembly and the displacement assembly, the maximum count position is found, and the second photon count is recorded.

[0115] It can be seen from the above embodiments that, in the diffraction efficiency test system, the X-ray source, the X-ray detector, the first rotary table and the second rotary table can be switched between the first arrangement mode and the second arrangement mode, when in the first arrangement mode, the X-rays emitted by the X-ray source are incident on the X-ray detector via the first crystal, that is, a first diffraction light path is formed, when in the second arrangement mode, the X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal and the second crystal in turn, that is, a second diffraction light path is formed, after the X-rays pass through the first crystal, certain stray light can be filtered out, and the monochromaticity of the X-rays is improved, so that the error caused by the accumulation of the photon counts of the energy near the target energy on the channel address of the target energy due to the poor monochromaticity of the X-rays when the X-ray detector records the photon counts at the target energy can be reduced, so that the photon counts at the specific energy in the first diffraction light path recorded by the X-ray detector and the photon counts at the specific energy in the second diffraction light path are more accurate, and the diffraction efficiency calculated based on the two parameters is also more accurate, and the accuracy of the diffraction efficiency test is improved.

[0116] In order to further improve the accuracy of the diffraction efficiency test, the above diffraction efficiency test method can further include steps S304-S305.

[0117] S304, the X-ray source, the X-ray detector, the first rotary table and the second rotary table are placed according to the first arrangement mode, the first crystal placed on the first rotary table is removed, the X-ray emitter is controlled to generate X-rays to irradiate the first rotary table, the X-ray detector is controlled to record the X-ray beam to determine a third energy spectrum, and the third photon count at the first target energy is determined according to the third energy spectrum.

[0118] In the embodiment of the application, the background photon count when there is no first crystal on the first rotary table in the first diffraction light path can also be recorded, so as to reduce the influence of the background noise on the accuracy of the diffraction efficiency test.

[0119] In order to simplify the process of the diffraction efficiency test, the step S304 can be performed after the step S302.

[0120] After the X-ray detector records the first photon count in the first diffraction light path, the first crystal placed on the first rotary table can be removed, the X-ray emitter generates X-rays to irradiate the first rotary table, the X-ray detector scans the X-ray beam within a preset time length to determine a third energy spectrum, and the third photon count at the first target energy is determined according to the third energy spectrum. The third photon count can represent the background noise in the first diffraction light path.

[0121] Continuing the above example, under the first arrangement, the first crystal is removed, the X-ray energy spectrum under the integral time of 60s is tested, the counts under the specific energy E=4.51keV are recorded, and the third photon counts are recorded.

[0122] S305, the X-ray light source, the X-ray detector, the first turntable and the second turntable are placed according to the second arrangement, the second crystal placed on the second turntable is removed, so that the X-ray generated by the X-ray emitter is incident on the second turntable through the first crystal, and the X-ray detector scans the X-ray beam within a preset time length to determine a fourth energy spectrum, and the fourth photon counts under the second target energy are determined according to the fourth energy spectrum.

[0123] In the embodiment of the application, on the twice diffraction light path, the background photon counts without the second crystal on the second turntable can also be recorded, so as to reduce the influence of the background noise on the diffraction efficiency test accuracy.

[0124] In order to simplify the process of diffraction efficiency test, the step S305 can be performed after the step S303.

[0125] On the twice diffraction light path, after the second photon counts are recorded by the X-ray detector, the second crystal placed on the second turntable can be removed, the X-ray generated by the X-ray emitter is incident on the second turntable through the first crystal on the first turntable, and the X-ray detector scans the X-ray beam within a preset time length to determine a fourth energy spectrum, and the fourth photon counts under the second target energy are determined according to the fourth energy spectrum. The fourth photon counts can represent the background noise on the twice diffraction light path.

[0126] Continuing the above example, the second crystal is removed, the X-ray energy spectrum under the integral time of 60s is tested, the counts under the specific energy E=4.51keV are recorded, and the fourth photon counts are recorded.

[0127] Referring to Figure 4 A schematic diagram of the once diffraction and twice diffraction X-ray energy spectrum after the background is deducted is provided for the embodiment of the application, wherein the horizontal axis represents the energy, the unit is keV, and the vertical axis represents the photon counts. The once diffraction X-ray energy spectrum has a higher peak value, and the twice diffraction X-ray energy spectrum has a lower peak value. As can be seen from the figure, the target energy corresponding to the peak values of the once diffraction and twice diffraction X-ray energy spectrum is the same, which is 4.51keV.

[0128] As can be seen from the above embodiment, in the embodiment of the application, the background photon counts without the crystal on the once diffraction light path and the twice diffraction light path are tested, and the background photon counts can be deducted when calculating the Bragg diffraction efficiency of the crystal, so as to further improve the accuracy of the diffraction efficiency test.

[0129] A diffraction efficiency calculation method provided by the embodiment of the application will be described below.

[0130] Referring to Figure 5 A flowchart of a first diffraction efficiency test calculation method provided by an embodiment of the present application is shown in FIG. 5. The method can be applied to an electronic device and includes steps S501-S502.

[0131] S501, obtaining a first photon count and a second photon count.

[0132] The first photon count and the second photon count are obtained by the diffraction efficiency test method described above. After the X-ray detector obtains the first photon count and the second photon count, the electronic device can obtain the first photon count and the second photon count.

[0133] S502, determining the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of the second photon count to the first photon count.

[0134] The target energy is the energy corresponding to the first photon count or the second photon count. For example, if the first photon count is the photon count at E=4.51 keV, the target energy is 4.51 keV.

[0135] The electronic device can determine the diffraction efficiency of the to-be-tested crystal at a specific energy by comparing the second photon count with the first photon count. The specific energy is the target energy corresponding to the first photon count and the second photon count.

[0136] Specifically, the diffraction efficiency can be calculated using the following formula (1):

[0137] η = I 20 / I 10 (1)

[0138] wherein η represents the diffraction efficiency, I 20 represents the second photon count, and I 10 represents the first photon count.

[0139] As can be seen from the above embodiment, in the embodiment of the present application, the diffraction efficiency of the to-be-tested crystal at a specific energy is calculated by obtaining the first photon count and the second photon count. Since the first photon count and the second photon count are obtained by filtering some stray light of the X-ray through once diffraction and twice diffraction, high monochromaticity and high collimation are achieved, so that the first photon count and the second photon count obtained are more accurate, and the diffraction efficiency of the to-be-tested crystal at the specific energy calculated based on these parameters is also more accurate.

[0140] To further improve the accuracy of the diffraction efficiency calculation, an embodiment of the present application further provides a diffraction efficiency calculation method.

[0141] Referring to Figure 6A flowchart of a second diffraction efficiency test calculation method provided by an embodiment of the present application is shown in FIG. 6. The method can be applied to an electronic device and includes steps S601-S602.

[0142] S601, obtaining a first photon count, a second photon count, a third photon count, and a fourth photon count.

[0143] The first photon count, the second photon count, the third photon count, and the fourth photon count are obtained by the diffraction efficiency test method described above. After the X-ray detector obtains the first photon count, the second photon count, the third photon count, and the fourth photon count, the electronic device can be sent the first photon count, the second photon count, the third photon count, and the fourth photon count, and then the electronic device can obtain the first photon count, the second photon count, the third photon count, and the fourth photon count.

[0144] S602, determining the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of a fifth photon count to a sixth photon count.

[0145] The fifth photon count is the difference between the second photon count and the fourth photon count, and the sixth photon count is the difference between the first photon count and the third photon count.

[0146] The electronic device can determine the diffraction efficiency of the to-be-tested crystal at a specific energy by comparing the difference between the second photon count and the fourth photon count with the difference between the first photon count and the third photon count. The specific energy is the target energy corresponding to the first photon count and the second photon count.

[0147] Specifically, the diffraction efficiency can be calculated using the following formula (2):

[0148] η = (I 20 - I 2b ) / (I 10 - I 1b ) (2)

[0149] wherein η represents the diffraction efficiency, I 20 represents the second photon count, I 2b represents the fourth photon count, I 10 represents the first photon count, and I 1b represents the third photon count.

[0150] As can be seen from the above embodiments, in the embodiments of the present application, the first photon count, the second photon count, the third photon count and the fourth photon count are acquired, so as to calculate the diffraction efficiency of the to-be-tested crystal at a specific energy. Since some stray light of the X-ray is filtered out through the first diffraction and the second diffraction, high monochromaticity and high collimation are realized, so that the first photon count and the second photon count acquired are more accurate. Meanwhile, when the diffraction efficiency of the to-be-tested crystal at the specific energy is calculated, the background noise is deducted, and the diffraction efficiency of the to-be-tested crystal at the specific energy calculated based on these parameters is more accurate.

[0151] Based on the same inventive concept, the embodiments of the present application also provide a diffraction efficiency calculation device.

[0152] Referring to Figure 7 A structure diagram of a first diffraction efficiency calculation device provided by the embodiments of the present application is shown in FIG. 7. The device comprises:

[0153] A first acquisition module 701 is configured to acquire a first photon count and a second photon count, wherein the first photon count and the second photon count are obtained according to the diffraction efficiency test method described above.

[0154] A first diffraction efficiency determination module 702 is configured to determine the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of the second photon count to the first photon count, wherein the target energy is an energy corresponding to the first photon count and the second photon count.

[0155] Referring to Figure 8 A structure diagram of a second diffraction efficiency calculation device provided by the embodiments of the present application is shown in FIG. 8. The device comprises:

[0156] A second acquisition module 801 is configured to acquire a first photon count, a second photon count, a third photon count and a fourth photon count, wherein the first photon count, the second photon count, the third photon count and the fourth photon count are obtained according to the diffraction efficiency test method described above.

[0157] A second diffraction efficiency determination module 802 is configured to determine the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of a fifth photon count to a sixth photon count, wherein the fifth photon count is a difference between the second photon count and the fourth photon count, the sixth photon count is a difference between the first photon count and the third photon count, and the target energy is an energy corresponding to the first photon count or the second photon count.

[0158] The technical scheme provided by the embodiment of the present application is that the diffraction efficiency test system depends on an X-ray emitter to emit X-rays, does not depend on a large device such as a synchrotron radiation source to emit X-rays, and the X-ray emitter has a lower cost than the synchrotron radiation source, so that the diffraction efficiency test system has a lower cost and can be used for crystal diffraction efficiency test in a conventional laboratory.

[0159] In addition, in the diffraction efficiency test system, the X-ray source, the X-ray detector, the first rotary table and the second rotary table can be switched between the first arrangement mode and the second arrangement mode. When the diffraction efficiency test system is in the first arrangement mode, the X-rays emitted by the X-ray source are incident on the X-ray detector via the first crystal, that is, a light path of once diffraction is formed. When the diffraction efficiency test system is in the second arrangement mode, the X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal and the second crystal in turn, that is, a light path of twice diffraction is formed. After the X-rays pass through the first crystal, certain stray light can be filtered out, and the monochromaticity of the X-rays is improved. In this way, when the X-ray detector records the photon count at the target energy, the error caused by the accumulation of the photon count at the energy near the target energy on the channel address of the target energy due to the poor monochromaticity of the X-rays can be reduced. Therefore, the photon count of a specific energy in the light path of once diffraction recorded by the X-ray detector and the photon count of a specific energy in the light path of twice diffraction are more accurate. Furthermore, the diffraction efficiency calculated based on the two parameters is also more accurate, and the accuracy of the diffraction efficiency test is improved.

[0160] The embodiment of the present application also provides an electronic device, such as Figure 9 As shown in the figure, the electronic device includes a processor 901, a communication interface 902, a memory 903 and a communication bus 904, wherein the processor 901, the communication interface 902 and the memory 903 complete mutual communication through the communication bus 904.

[0161] The memory 903 is used to store a computer program.

[0162] The processor 901 is used to execute the program stored in the memory 903, and implement the diffraction efficiency calculation method described above.

[0163] The communication bus mentioned in the above electronic device can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The communication bus can be divided into an address bus, a data bus, a control bus, etc. For the convenience of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or only one type of bus.

[0164] The communication interface is configured to communicate between the electronic device and other devices.

[0165] The memory can include a random access memory (RAM) and can also include a non-volatile memory (NVM), such as at least one disk memory. Optionally, the memory can also be at least one storage device located away from the aforementioned processor.

[0166] The aforementioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc. It can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component.

[0167] In yet another embodiment provided by the present application, a computer readable storage medium is provided, and the computer readable storage medium stores a computer program. The computer program is executed by a processor to implement the steps of any of the aforementioned diffraction efficiency calculation methods.

[0168] In yet another embodiment provided by the present application, a computer program product containing instructions, which, when run on a computer, causes the computer to execute any of the aforementioned diffraction efficiency calculation methods.

[0169] In the embodiments described above, all or some of the steps can be implemented by software, hardware or firmware, or any combination thereof. When implemented in software, all or some of the steps can be implemented in the form of one or more computer programs which are stored in a computer readable medium. The computer readable medium can include one or more of a computer readable storage medium and a computer readable signal medium. The computer readable storage medium can include one or more of a magnetic storage medium (e.g., one or more magnetic tapes), an electronic storage medium (e.g., one or more semiconductor memories or tapes), a mechanical storage medium (e.g., one or more recording chips), or the like. The computer readable signal medium can include a computer readable storage medium which is configured to transmit program code embedded in a modulated data signal. The modulated data signal is one example of a propagated computer readable signal.

[0170] It should be noted that, in the description, relative terms such as first and second are used only to differentiate one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Also, the terms "comprising", "including" or any other variant thereof are intended to cover a non-exclusive inclusion, so that a process, method, article or apparatus that includes a list of elements does not only include those elements, but also includes other elements not expressly listed or other elements inherent to such process, method, article or apparatus. Without more limitations, an element defined by the phrase "comprising a" does not exclude the existence of additional identical elements in the process, method, article or apparatus including the element.

[0171] Each of the embodiments in the specification is described in a relevant manner, and the same or similar parts between the embodiments can be referred to each other. Each embodiment focuses on the difference from other embodiments. In particular, for the method embodiments, since they are basically similar to the system embodiments, the description is relatively simple, and the relevant parts can be referred to the part of the method embodiments.

[0172] The above merely describes the preferred embodiments of the present application, but is not used to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A diffraction efficiency test system, characterized by, The system comprises: an X-ray emitter, an X-ray detector, a first turntable and a second turntable; the first turntable is used for placing a first crystal, and the second turntable is used for placing a second crystal; the X-ray emitter, the X-ray detector, the first turntable and the second turntable can be switched between a first arrangement mode and a second arrangement mode; when in the first arrangement mode, X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal; when in the second arrangement mode, X-rays emitted by the X-ray emitter are incident on the X-ray detector via the first crystal and the second crystal in sequence.

2. The system of claim 1, wherein, The placement position of the X-ray emitter and the first turntable when in the first arrangement mode is the same as the placement position of the X-ray emitter and the first turntable when in the second arrangement mode; when in the first arrangement mode, the X-ray detector is placed at a first position, and the second turntable is placed at a second position, the first position is a position on a primary diffraction light path of X-rays via the first crystal, and the second position is a position not on the primary diffraction light path of X-rays via the first crystal; when in the second arrangement mode, the X-ray detector is placed at a third position, and the second turntable is placed at a fourth position, the third position is a position on a secondary diffraction light path of X-rays via the first crystal and the second crystal in sequence, and the fourth position is a position on the primary diffraction light path of X-rays via the first crystal.

3. The system of claim 1, wherein, The system further comprises a base, and the X-ray emitter, the X-ray detector, the first turntable and the second turntable are placed on the base when in the first arrangement mode or the second arrangement mode; The X-ray detector comprises a detection assembly, a lifting assembly and a displacement assembly, the lifting assembly drives the detection assembly to move in a height direction, and the displacement assembly drives the detection assembly to move within a placement range of the base.

4. The system of claim 1, wherein, The first turntable and the second turntable comprise a driving assembly and a support assembly, the support assembly is used for supporting the first crystal or the second crystal, and the driving assembly drives the support assembly to rotate along a central axis of the support assembly.

5. The system of claim 4, wherein, The support assembly comprises a first clamping portion and a second clamping portion, the first clamping portion and the second clamping portion are arranged in parallel, and the first clamping portion and the second clamping portion cooperatively clamp the first crystal or the second crystal.

6. The system of claim 1, wherein, The X-ray emitter comprises an X-ray light source and a collimator, the X-ray light source and the collimator are connected, and the collimator is located in a light emission direction of the X-ray light source.

7. A method of testing diffraction efficiency, characterized by, The method is applied to the diffraction efficiency test system according to any one of claims 1-6, and the method comprises: placing a first crystal on a first turntable and placing a second crystal on a second turntable; Placing the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table according to a first arrangement mode, controlling the X-ray emitter to generate X-ray irradiation to the diffraction surface of the first crystal to generate first diffraction, the first diffraction light beam being incident on the X-ray detector; controlling the X-ray detector to record the first diffraction light beam to obtain a first diffraction spectrum, and determining a first target energy corresponding to a first diffraction peak according to the first diffraction spectrum; the first target energy corresponding to a first photon count; Placing the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table according to a second arrangement mode, controlling the X-ray emitter to generate X-ray irradiation to the diffraction surface of the first crystal to generate first diffraction, the first diffraction light beam being incident on the diffraction surface of the second crystal to generate second diffraction, the second diffraction light beam being incident on the X-ray detector; controlling the X-ray detector to record the second diffraction light beam to obtain a second diffraction spectrum, and determining a second target energy corresponding to a second diffraction peak according to the second diffraction spectrum; the first target energy and the second target energy being the same.

8. The method of claim 7, wherein, The method further comprises: Placing the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table according to a first arrangement mode, removing the first crystal placed on the first rotary table, controlling the X-ray emitter to generate X-ray irradiation to the first rotary table, and controlling the X-ray detector to record the X-ray light beam to obtain a third energy spectrum, and determining a third photon count at a first target energy according to the third energy spectrum; Placing the X-ray emitter, the X-ray detector, the first rotary table and the second rotary table according to a second arrangement mode, removing the second crystal placed on the second rotary table, controlling the X-ray emitter to generate X-ray irradiation to the second rotary table via the first crystal, and controlling the X-ray detector to record the X-ray light beam to obtain a fourth energy spectrum, and determining a fourth photon count at a second target energy according to the fourth energy spectrum.

9. A method of calculating diffraction efficiency, characterized by, The method comprises: Obtaining the first photon count and the second photon count, the first photon count and the second photon count being obtained according to the method of claim 7; Determining the diffraction efficiency of the to-be-tested crystal at a target energy according to the ratio of the second photon count to the first photon count; the target energy being the energy corresponding to the first photon count or the second photon count; or Obtaining the first photon count, the second photon count, the third photon count and the fourth photon count, the first photon count, the second photon count, the third photon count and the fourth photon count being obtained according to the method of claim 8; Determining the diffraction efficiency of the to-be-tested crystal at a target energy according to the ratio of the fifth photon count to the sixth photon count; the fifth photon count being the difference between the second photon count and the fourth photon count, and the sixth photon count being the difference between the first photon count and the third photon count; the target energy being the energy corresponding to the first photon count or the second photon count.

10. A diffraction efficiency calculating apparatus characterized by comprising: The device comprises: The first acquisition module is configured to acquire a first photon count and a second photon count, wherein the first photon count and the second photon count are obtained according to the method in claim 7. The first diffraction efficiency determination module is configured to determine the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of the second photon count to the first photon count, wherein the target energy is an energy corresponding to the first photon count or the second photon count. The second acquisition module is configured to acquire a first photon count, a second photon count, a third photon count and a fourth photon count, wherein the first photon count, the second photon count, the third photon count and the fourth photon count are obtained according to the method in claim 8. The second diffraction efficiency determination module is configured to determine the diffraction efficiency of the to-be-tested crystal at a target energy according to a ratio of a fifth photon count to a sixth photon count, wherein the fifth photon count is a difference between the second photon count and the fourth photon count, the sixth photon count is a difference between the first photon count and the third photon count, and the target energy is an energy corresponding to the first photon count or the second photon count.

Images