Assessment interaction control method, system and server

Abstract

The invention provides an assessment interaction control method and system and a server, and relates to the technical field of simulation interaction, and the method achieves the real-time combination of operation and theory, enhances the flexibility and intelligence of a trigger mechanism, and builds an operation-knowledge two-dimensional assessment process. According to the method, the multi-dimensional assessment result of the trainee is output through deep interactive fusion of dynamic test question triggering and the answer embedding simulation process in combination with accurate ability evaluation of the operation behavior and the answer result, the training time of the trainee can be shortened, and the training cost is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of simulation interaction technology, in particular to a kind of examination interaction control method, system and server. BACKGROUND

[0002] The manufacturing, packaging and testing process of integrated circuits requires specific training for operators due to the high technical threshold. In order not to occupy the production line for training, virtual simulation training systems are often used to train operators. The existing virtual simulation training system combines operation training with knowledge examination, but still has the following problems: Independent simulation operation + independent examination system: the virtual simulation training module and the online examination module are two independent modules, and there is no data correlation between them; Fixed node answering type simulation platform: in the virtual simulation process, test questions are inserted at a predetermined fixed position.

[0003] The above problems result in that the theoretical knowledge and practical operation training are not closely combined, and the students are difficult to consolidate key concepts in operation; there is a lack of dynamic and intelligent test question triggering mechanism, and the related knowledge cannot be examined in real time according to the operation state (such as error, progress); the examination method is single, and it is difficult to accurately score in combination with the operation process, and it is difficult to comprehensively evaluate the ability of students, thereby resulting in that the training time of students is long, and the training cost is high. SUMMARY

[0004] Therefore, the purpose of the present application is to provide an examination interaction control method, system and server, which realizes the real-time combination of operation and theory, enhances the flexibility and intelligence of the triggering mechanism, and establishes a "operation-knowledge" two-dimensional evaluation process. The method outputs the multi-dimensional examination results of students by dynamic test question triggering, deep interactive fusion of test question embedding simulation process, and accurate ability evaluation combining operation behavior and test results, which can reduce the training time of students and reduce the training cost.

[0005] In a first aspect, the present application provides an examination interaction control method, which comprises: An analog simulation scene is constructed based on an integrated circuit manufacturing scene, and a process logic parameter corresponding to the integrated circuit manufacturing scene is determined according to a device model contained in the analog simulation scene, and a test question database corresponding to the device model is constructed by using the process logic parameter; The test question triggering condition parameter, the test question extraction strategy parameter and the test question pop-up interaction parameter corresponding to the device model are determined according to the process logic parameter, and the dynamic triggering condition corresponding to the device model and the test question database is determined by using the test question triggering condition parameter, the test question extraction strategy parameter and the test question pop-up interaction parameter; Obtain the operation instruction of the user to the simulation scene; when the operation instruction meets the dynamic triggering condition, determine the device model corresponding to the operation instruction, and determine the question content, question answer and question pop-up position corresponding to the device model based on the question database; After the simulation scene generates the answer area in the question pop-up position and displays the question content in the answer area, the user's answer result is obtained in real time, and the user's examination result is calculated by comparing the answer result with the question answer.

[0006] Optionally, based on the integrated circuit manufacturing scene, the device model corresponding to the integrated circuit manufacturing scene is determined according to the process logic parameters, and the question database corresponding to the device model is constructed by using the process logic parameters. The steps include: Obtain the IC manufacturing equipment, packaging equipment and testing equipment corresponding to the integrated circuit manufacturing scene, and obtain the simulation scene by loading and packaging the IC manufacturing equipment, packaging equipment and testing equipment based on the Unity3D engine; Determine the manufacturing logic parameters, packaging logic parameters and testing logic parameters corresponding to the simulation scene according to the IC manufacturing equipment, packaging equipment and testing equipment, and determine the process logic parameters corresponding to the device model in the integrated circuit manufacturing scene based on the manufacturing logic parameters, packaging logic parameters and testing logic parameters; Use the setting parameters, operation parameters and use parameters corresponding to the device model in the process logic parameters to construct the question data corresponding to the device model, and construct the question database corresponding to the device model according to the association result of the process logic parameters and the question data.

[0007] Optionally, according to the process logic parameters, the question triggering condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters corresponding to the device model are determined, and the dynamic triggering condition corresponding to the device model and the question database is determined by using the question triggering condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters. The steps include: According to the manufacturing logic parameters, packaging logic parameters and testing logic parameters contained in the process logic parameters, the process operation instruction and the error operation instruction corresponding to the simulation scene are determined; Use the process operation instruction and the error operation instruction to determine the question triggering condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters corresponding to the device model; Determine the question data corresponding to the question database through the question triggering condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters, and determine the dynamic triggering condition corresponding to the device model based on the question data.

[0008] Optionally, the operation instruction of the user on the simulation scene is acquired; when the operation instruction meets the dynamic triggering condition, the device model corresponding to the operation instruction is determined, and the question content, the question answer and the question pop-up window position corresponding to the device model are determined based on the question database, including: The mouse click action of the user is acquired in real time to obtain the click event of the user on the simulation scene, and the operation instruction of the user on the simulation scene is determined based on the click event; When it is detected that the operation instruction meets the dynamic triggering condition, the operation instruction corresponding to the process logic parameter is acquired, and the operation instruction corresponding to the device model is determined by using the manufacturing logic parameter, the packaging logic parameter and the test logic parameter corresponding to the process logic parameter; The question data corresponding to the device model is acquired based on the question database, and the question content, the question answer and the question pop-up window position corresponding to the question data are determined based on the process logic parameter.

[0009] Optionally, after the simulation scene generates the answering area in the question pop-up window position and displays the question content in the answering area, the answering result of the user is acquired in real time, and the examination result of the user is calculated by using the comparison result of the answering result and the question answer, including: The display page corresponding to the device model in the simulation scene is acquired based on the Unity3D engine; The answering area with the highest display level is generated in the display page by using the question pop-up window position, and the question content is displayed in the answering area, and the answering result of the user in the answering area is monitored in real time; After the answering result is monitored, the comparison result is obtained by comparing the answering result with the question answer, and the answering score of the user is calculated according to the comparison result; The examination result of the user is determined by using the answering score.

[0010] Optionally, after the comparison result of the answering result and the question answer is obtained, the method further includes: If the answering result and the question answer in the comparison result do not match, the question analysis text corresponding to the question answer is acquired, and the question analysis text is displayed in the preset analysis position in the answering area.

[0011] Optionally, before the operation instruction of the user on the simulation scene is acquired, the method further includes: The mode selection instruction of the user on the simulation scene is acquired; wherein the mode selection instruction includes the learning mode instruction and the examination mode instruction.

[0012] Optionally, if the mode selection instruction is the examination mode instruction, after the simulation scene is controlled to generate the answer area in the question pop-up position and display the question content in the answer area, the step of calculating the examination result of the user by using the comparison result of the answer result and the question answer includes: acquiring the display page corresponding to the device model in the simulation scene based on the Unity3D engine; controlling the generation of the answer area with the highest display level in the display page by using the question pop-up position, and controlling the display of the question content to the answer area, and then real-time monitoring the answer result of the user in the answer area, and acquiring the answer time corresponding to the answer result by using the preset timer in real time; when the answer time exceeds the preset answer time threshold, determining the comparison result of the answer result and the question answer as an error result, and calculating the answer score of the user according to the error result; determining the examination result of the user by using the answer score.

[0013] In a second aspect, the present application provides an examination interaction control system, which comprises: a simulation scene construction module, configured to construct a simulation scene based on an integrated circuit manufacturing scene, determine the process logic parameters corresponding to the integrated circuit manufacturing scene according to the device models contained in the simulation scene, and construct a test question database corresponding to the device models by using the process logic parameters; a trigger condition determination module, configured to determine the question trigger condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters corresponding to the device models according to the process logic parameters, and determine the dynamic trigger conditions corresponding to the device models and the test question database by using the question trigger condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters; a question data interaction module, configured to acquire the operation instruction of the user to the simulation scene, determine the device model corresponding to the operation instruction when the operation instruction meets the dynamic trigger conditions, and determine the question content, the question answer and the question pop-up position corresponding to the device model based on the test question database; an examination result generation module, configured to control the simulation scene to generate the answer area in the question pop-up position and display the question content in the answer area, and then acquire the answer result of the user in real time, and calculate the examination result of the user by using the comparison result of the answer result and the question answer.

[0014] In a third aspect, the present application further provides a server comprising a processor and a memory, wherein the memory stores computer executable instructions capable of being executed by the processor, and the processor executes the computer executable instructions to implement the steps of the examination interaction control method provided in the first aspect.

[0015] In a fourth aspect, the present application also provides a storage medium storing computer executable instructions, which, when invoked and executed by a processor, cause the processor to implement the steps of the examination interaction control method of the first aspect.

[0016] The examination interaction control method, system and server provided by the present application first construct a simulation scene based on an integrated circuit manufacturing scene, determine process logic parameters corresponding to the integrated circuit manufacturing scene according to equipment models contained in the simulation scene, and construct a test question database corresponding to the equipment models by using the process logic parameters; then determine question trigger condition parameters, question extraction strategy parameters and question pop-up interaction parameters corresponding to the equipment models according to the process logic parameters, and determine dynamic trigger conditions corresponding to the equipment models and the test question database by using the question trigger condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters; subsequently, obtain operation instructions of a user to the simulation scene; when the operation instructions meet the dynamic trigger conditions, determine the equipment models corresponding to the operation instructions, and determine question content, question answers and question pop-up positions corresponding to the equipment models based on the test question database; finally, after controlling the simulation scene to generate an answer area in the question pop-up positions and display the question content in the answer area, obtain the answer results of the user in real time, and calculate the examination results of the user by using the comparison results of the answer results and the question answers. The method realizes the real-time combination of operation and theory, enhances the flexibility and intelligence of the trigger mechanism, and establishes a "operation-knowledge" two-dimensional evaluation process. The method outputs multi-dimensional examination results of students by dynamic test question triggering, deep interactive fusion of answer embedding simulation process, and accurate ability evaluation combining operation behavior and answer results, which can reduce the training time of students and reduce the training cost.

[0017] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent to those skilled in the art upon examination of the following or can be learned by practice of the present application. The objects and other advantages of the present application will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.

[0018] So that the foregoing objectives, features and advantages of the present application can be readily understood, a more particular description of the application follows, reference being made to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the specific embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or prior art description. Obviously, the drawings described below are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.

[0020] Figure 1 A flow chart of an examination interaction control method provided by an embodiment of the present application; Figure 2 A flow chart of step S101 in an examination interaction control method provided by an embodiment of the present application; Figure 3 A flow chart of step S102 in an examination interaction control method provided by an embodiment of the present application; Figure 4 A flow chart of step S103 in an examination interaction control method provided by an embodiment of the present application; Figure 5 A flow chart of step S104 in an examination interaction control method provided by an embodiment of the present application; Figure 6 A flow chart of step S104 in another examination interaction control method provided by an embodiment of the present application; Figure 7 A flow chart of another examination interaction control method provided by an embodiment of the present application; Figure 8 A structural schematic diagram of an examination interaction control system provided by an embodiment of the present application; Figure 9 A structural schematic diagram of a server provided by an embodiment of the present application.

[0021] Icon: 810-simulation scene construction module; 820-trigger condition determination module; 830-question data interaction module; 840-examination result generation module; 101-processor; 102-memory; 103-bus; 104-communication interface. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the present application will be described clearly and completely in combination with embodiments. Obviously, the described embodiments are some embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative labor are within the protection scope of the present application.

[0023] The manufacturing, packaging and testing process of integrated circuits requires specific training for the operator to perform actual operation due to high technical threshold. In order not to occupy the production line for training, the operator is often trained through a virtual simulation training system. The existing virtual simulation training system combines operation training and knowledge examination, but still has the following problems: Independent simulation operation + independent examination system: that is, the virtual simulation training module and the online examination module are two independent modules, and there is no data correlation between the two; Fixed node answering type simulation platform: in the virtual simulation process, the test questions are inserted at the preset fixed position (such as forced answering after completing each process module).

[0024] Specifically, the limitations of independent simulation operation + independent examination system are: The examination is disconnected from the operation, and the examination questions cannot match the specific operation errors or weak points in the simulation of the college; Lack of timely feedback, the errors in the operation of the student cannot be corrected in real time, which may form an error memory; Poor immersion, the examination jumps to an independent interface, destroying the continuity of the simulation.

[0025] The limitations of the fixed node answering type simulation platform are: Rigid triggering mechanism, the position of the question is fixed, which cannot adapt to the operation habits of different students; Lack of intelligence, even if the student operates completely correctly, the fixed questions still need to be answered, which may repeat the examination of the mastered content; Weak error correlation, the questions have no direct correlation with the specific errors in the operation, and it is difficult to strengthen the knowledge points;

[0026] The above problems result in that the theoretical knowledge and the operation training are not closely combined, the student cannot consolidate the key concepts in the operation, the dynamic and intelligent question triggering mechanism is lacking, the related knowledge cannot be examined in real time according to the operation state (such as error, progress), the examination method is single, the student's ability cannot be accurately scored combined with the operation process, and the student's ability cannot be fully evaluated, thereby resulting in that the student training time is long and the training cost is high.

[0027] Based on this, the present application provides an examination interaction control method, system and server, which realizes the real-time combination of operation and theory, enhances the flexibility and intelligence of the triggering mechanism, and establishes a "operation-knowledge" two-dimensional evaluation process. The method outputs the multi-dimensional examination results of the students by dynamic question triggering, deep interactive fusion of the simulation process embedded with the answering, and accurate ability evaluation combined with the operation behavior and the answering result, which can reduce the training time of the students and reduce the training cost.

[0028] For the convenience of understanding the present embodiment, first of all, a kind of examination interactive control method disclosed in the present embodiment is introduced in detail, as shown in Figure 1 The method comprises: Step S101, based on integrated circuit manufacturing scene construction simulation scene, according to the equipment model contained in simulation scene determines the process logic parameter corresponding to integrated circuit manufacturing scene, and utilizes process logic parameter to construct the test question database corresponding to equipment model.

[0029] This step aims to create a virtual examination environment that fits the actual integrated circuit manufacturing and reserves examination content.The simulation scene construction process can combine the high-precision characteristics of integrated circuit manufacturing, restore the device form (such as wafer table of lithography machine, reaction chamber of etching machine) of core processes such as lithography, etching, ion implantation, operation process (such as vacuum degree check before device start) and environmental feedback (such as audible and visual alarm when parameter is abnormal), to ensure the authenticity of the scene.

[0030] The process logic parameter determination process can extract key parameters from the equipment model, including the operation sequence of each process (such as vacuum pumping before thin film deposition and then introducing reaction gas), parameter threshold (such as the reasonable range of lithography exposure energy), fault correlation rules (such as the impact of high temperature on wafer quality) and so on.

[0031] The test question database construction process can design questions based on process logic parameters, covering device operation specifications (such as "What is the first step operation of the glue coating machine when it starts?"), parameter setting rationality (such as "What will happen if ion implantation dose exceeds the standard value?"), fault handling (such as "Troubleshooting steps of glue coating machine") and so on, to achieve strong association between questions and actual operation.

[0032] Step S102, according to the process logic parameter, determine the question trigger condition parameter, question extraction strategy parameter and question pop-up interaction parameter corresponding to the equipment model, and utilize the question trigger condition parameter, question extraction strategy parameter and question pop-up interaction parameter to determine the dynamic trigger condition corresponding to the equipment model and the test question database.

[0033] This step realizes the flexibility of examination through parameter definition, and makes the question trigger more in line with user operation reality. Specifically, in the determination process of question trigger condition parameter, the scene of triggering answering is determined, for example, before starting the device (examination of safety specifications), after setting parameters (verification of parameter rationality), when operation appears abnormal (such as pressure surge, examination of emergency handling).

[0034] In the determination process of question extraction strategy parameter, relevant selection rules need to be specified, such as adjusting difficulty according to user operation proficiency (newbies focus on basic operation questions, experienced hands focus on comprehensive analysis questions), preferentially extracting the question with the highest correlation degree to current operation (such as focusing on etching process questions when operating etching machine).

[0035] In the determination process of the pop-up window interaction parameter, the display rule of the answering interface needs to be set, including the pop-up window position (avoiding the core operation area of the device, such as the key button of the control panel), the display style (such as red pop-up window for emergency questions and blue pop-up window for regular questions), and the interaction limit (such as key process questions that need to be answered before continuing operation).

[0036] The above parameters are combined in the dynamic trigger condition integration to form the operation-question linkage logic, for example, when the user sets the etching temperature to exceed the upper limit, one medium difficulty question is extracted from the fault handling question bank, and the pop-up window is displayed beside the temperature display screen.

[0037] In step S103, the operation instruction of the user to the simulation scene is obtained; when the operation instruction meets the dynamic trigger condition, the device model corresponding to the operation instruction is determined, and the question content, question answer and question pop-up window position corresponding to the device model are determined based on the test question database.

[0038] This step realizes the precise docking of user operation and examination content. Specifically, the operation instruction acquisition process needs to capture the user's operation in the simulation scene (such as clicking the button, inputting the parameter, adjusting the device state) in real time, and convert it into structured data (such as "device: etching machine; operation: temperature setting to 550°C"). When the trigger condition is determined, the user operation can be compared with the dynamic trigger condition, if the operation meets the trigger condition (such as the temperature setting exceeding the threshold), the corresponding device model (etching machine) is locked. The test question database based on the device model is used to determine the question content (such as "when the etching temperature exceeds the limit, what is the correct handling step?"), the standard answer and the pop-up window position (such as the temperature adjustment knob) are determined based on the extraction strategy parameter.

[0039] In step S104, after the simulation scene generates the answering area in the pop-up window position and displays the question content in the answering area, the user's answering result is obtained in real time, and the examination result of the user is calculated by comparing the answering result with the question answer.

[0040] This step completes the examination closed loop and realizes real-time evaluation. Specifically, when the answer area is generated and displayed, the determined pop-up position and style can be used to generate an answer interface (such as buttons containing options, input boxes) in the simulation scene and display the question content. The answer result acquisition and comparison process can collect the user's answer feedback (such as selecting options, inputting answers) in real time, and compare it with the standard answer (objective questions directly compare options, subjective questions judge whether it meets the parameter range or process specification). The examination result calculation process needs to combine the answer accuracy, answer time (such as bonus for quick answer, deduction for overtime), operation specification (such as whether the steps meet the standard process) and other dimensions to generate a comprehensive examination result, and mark the weak links (such as "etching process fault handling question correct rate is low").

[0041] Optionally, based on the integrated circuit manufacturing scene, the simulation simulation scene is constructed, the process logic parameters corresponding to the integrated circuit manufacturing scene are determined according to the equipment model contained in the simulation simulation scene, and the step S101 of constructing the test question database corresponding to the equipment model by using the process logic parameters is as shown in Figure 2 Step S201, obtaining the corresponding IC manufacturing equipment, packaging equipment and testing equipment in the integrated circuit manufacturing scene, and loading and packaging the IC manufacturing equipment, packaging equipment and testing equipment based on the Unity3D engine to obtain the simulation simulation scene.

[0042] This step focuses on restoring the equipment environment of the integrated circuit manufacturing whole process through digital tools, and the core is to realize the accurate loading and scene packaging of the equipment model.

[0043] When obtaining the equipment data, the detailed parameters of the three types of core equipment in the integrated circuit manufacturing scene can be collected first—IC manufacturing equipment (such as lithography machine, etching machine, ion implanter, etc., including mechanical structure, control interface, process parameter range), packaging equipment (such as bonder, plastic packaging machine, etc., including packaging material processing, pin welding function module), testing equipment (such as probe station, ATE automatic test equipment, etc., including test program, signal detection module).

[0044] In the application process of Unity3D engine, the 3D modeling and physical engine functions of Unity3D are used to convert the CAD drawings or physical scanning data of the above-mentioned equipment into interactive virtual models, restore the appearance details (such as button layout, display screen style) and operation logic (such as the motion trajectory of the mechanical arm, the opening and closing animation of the valve) of the equipment. Through the packaging function of the engine, the equipment model and the scene environment (such as clean room layout, conveyor belt system) are integrated into a complete simulation simulation scene, ensuring that the user can perform immersive operations (such as clicking device buttons, inputting process parameters) in the scene.

[0045] ​Step S202, determine the manufacturing logic parameters, packaging logic parameters and testing logic parameters corresponding to the simulation simulation scene according to the IC manufacturing equipment, packaging equipment and testing equipment, and determine the process logic parameters corresponding to the equipment model in the integrated circuit manufacturing scene based on the manufacturing logic parameters, packaging logic parameters and testing logic parameters.

[0046] This step extracts logic parameters from different links by disassembling equipment functions, and finally forms a complete process logic system.

[0047] In the hierarchical logic parameter extraction process, for IC manufacturing equipment, manufacturing logic parameters are extracted, including the exposure time and energy corresponding relationship of lithography, the gas flow and etching rate correlation rule of etching, the timing control of wafer transfer (such as the interval time of mechanical arm taking and placing wafer), etc. For packaging equipment, packaging logic parameters are extracted, such as the matching range of temperature and bonding strength of bonder, the mold closing pressure threshold of plastic packaging mold, the position accuracy requirement of wire bonding (such as error ≤ 5 μm), etc. For testing equipment, test logic parameters are extracted, including the probe contact pressure range of probe station, the test signal frequency and voltage threshold of ATE equipment, the defective product judgment standard (such as leakage current > 1 μA is unqualified), etc.

[0048] The process logic parameter integration process associates the logic parameters of the three links of manufacturing, packaging and testing, forms the process logic parameters covering the whole process of "chip manufacturing-packaging-testing", for example, "the wafer thickness parameter of IC manufacturing directly affects the bonding pressure setting of subsequent packaging", to ensure that the correlation between parameters meets the real production logic.

[0049] Step S203, construct the question data corresponding to the equipment model using the setting parameters, operation parameters and use parameters in the process logic parameters, and construct the test question database corresponding to the equipment model according to the association results of the process logic parameters and the question data.

[0050] This step establishes an examination question bank that accurately matches equipment operation based on the association of equipment parameters and question data. Specifically, the dimension division process of question data is based on the core parameter types of equipment models in process logic parameters, and three types of question data are designed: Setting parameter type question: around the initial parameter configuration of equipment (such as the focus setting range of lithography machine, the voltage range selection of test equipment), for example, "please set the probe contact pressure of probe station, the reasonable range should be ____ "; Operation parameter type question: focus on dynamic parameter adjustment in equipment operation (such as plasma power adjustment of etching machine, welding time control of bonder), for example, "when the bonding strength detection value is low, how should the bonding temperature parameter be adjusted?"; Parameter-based questions: Questions related to safety specifications and maintenance requirements of equipment (e.g., laser power safety threshold of a lithography machine, probe cleaning period of a test equipment), such as "How many wafers does an ATE device need to test continuously before it needs to be calibrated?"

[0051] Construction logic of the question database: According to the association results of process logic parameters and question data (such as "bonding temperature range in packaging logic parameters" corresponding to "operation parameter-based questions"), a dedicated question bank is established for each device model, and the mapping relationship between the question and the parameter (such as the question ID corresponding to the parameter ID) is marked to ensure that relevant questions can be accurately retrieved according to device operation in the future.

[0052] Optionally, the device model corresponding question triggering condition parameters, question extraction strategy parameters and question pop-up interaction parameters are determined according to the process logic parameters, and the device model and the question database corresponding dynamic triggering condition are determined by using the question triggering condition parameters, the question extraction strategy parameters and the question pop-up interaction parameters in step S102, as shown in Figure 3 , which includes: Step S301, according to the manufacturing logic parameters, packaging logic parameters and testing logic parameters contained in the process logic parameters, the process operation instructions and error operation instructions corresponding to the simulation simulation scene are determined.

[0053] This step provides a basis for subsequent triggering condition design by analyzing process logic parameters, identifying user operation types and classifying. Specifically, in the process operation instruction extraction, standard operation instructions conforming to process specifications can be extracted from manufacturing, packaging and testing three types of logic parameters. For example: Manufacturing link: "wafer alignment-exposure parameter setting-start exposure" sequence instruction of lithography process; "introduction of reaction gas-plasma ignition-parameter monitoring" time sequence instruction of etching process.

[0054] Packaging link: "chip positioning-wire bonding-tension test" operation instruction of bonding process; "mold preheating-resin injection-curing molding" parameter control instruction of plastic packaging process.

[0055] Test link: "probe card calibration-test program loading-contact pressure setting" operation instruction of probe station; "signal frequency setting-voltage threshold adjustment-data acquisition" test flow instruction of ATE device.

[0056] The error operation instruction definition process can define the error operation that may cause device failure or product defects based on the process specification. For example: Manufacturing link: etching machine starts plasma before reaching the preset vacuum degree; Packaging link: bonding temperature exceeds the material bearing threshold; Test link: probe station contact pressure is too large to cause wafer scratch.

[0057] Step S302: Use process operation instructions and error operation instructions to determine the question triggering condition parameters, question extraction strategy parameters and question pop-up interaction parameters corresponding to the equipment model.

[0058] This step transforms process instructions into core parameters for the assessment interaction, achieving a precise link between operation and assessment. Specifically, when obtaining the question trigger condition parameters, specific scenarios for triggering the answer can be designed based on the process operation instructions and erroneous operation instructions. For example: Routine operation trigger: After the user performs the "Photolithography exposure parameter setting" operation, the question related to "relationship between exposure energy and photoresist thickness" will be triggered; Error Trigger: When a user attempts to "start the etching machine when the vacuum level is insufficient", the "Etching Machine Safe Start-up Conditions" assessment question is triggered. Abnormal state trigger: Simulate the sudden "abnormal temperature alarm" of the equipment, triggering the "troubleshooting process" question.

[0059] When obtaining the parameters for the question extraction strategy, rules for selecting questions from the question database can be defined to ensure that the questions match the difficulty level of the operation. For example: Increasing difficulty strategy: When novice users operate for the first time, they are given basic questions (such as "What is the main function of an etching machine?"). After repeated operation, they are gradually given more comprehensive questions (such as "Coordinated adjustment of parameters in multi-step etching process"). Relevance-first strategy: When users operate the "lithography machine", priority is given to extracting questions that are directly related to the lithography process (such as "factors affecting lithography resolution"), rather than general knowledge questions about the equipment. Random supplementation strategy: To avoid users memorizing fixed answers, when the same type of operation is repeatedly triggered, similar but different questions with different parameters are randomly selected from the question bank (e.g., "When the photoresist thickness is 2μm, the exposure energy should be set to ______").

[0060] The process of obtaining interactive parameters for the question pop-up window should fully consider the display rules of the answer interface, balancing assessment and operational smoothness. For example: Location parameters: The pop-up window should be placed in a non-interference area of ​​the device control panel (such as the blank space on the right) to avoid obstructing key operation buttons; Style parameters: Emergency fault questions use a red border with a blinking animation, while routine operation questions use a blue border; Interaction restriction parameters: Critical process questions (such as parameter confirmation before photolithography exposure) require mandatory answers and an accuracy rate of ≥80% before continuing the operation; non-critical process questions (such as daily equipment cleaning) are allowed to be answered later.

[0061] Step S303, determine the corresponding question data in the test question database through the question trigger condition parameter, the question extraction strategy parameter and the question pop-up interaction parameter, and determine the dynamic trigger condition corresponding to the device model based on the question data.

[0062] This step integrates three types of parameters to form the linkage logic of device operation and test questions. Specifically, in the question data mapping process, the question trigger condition parameter is associated with the question ID in the test question database, for example: the operation of "lithography exposure parameter setting" corresponds to the questions with IDs Q101-Q105 in the test question database (exposure energy calculation, photoresist selection, etc.); the fault of "etching machine vacuum degree abnormality" corresponds to the questions with IDs Q206-Q210 (vacuum system fault troubleshooting).

[0063] The dynamic trigger condition generation process can generate specific trigger rules in combination with the extraction strategy and the interaction parameter. For example: Rule 1: When the user operates the "lithography machine" and sets the exposure energy > 500 mJ / cm 2 , randomly extract 1 question from Q101-Q105, display it in a blue pop-up window on the right side of the control panel, and answer it within 30 seconds; Rule 2: When the user attempts to "start the etching machine when the vacuum degree is < 1e-3 Pa", forcibly trigger Q206 ("What are the hazards of insufficient vacuum degree of the etching machine?"), display it in a red pop-up window, and must answer correctly to continue operating.

[0064] The trigger condition can dynamically adjust the trigger strategy according to the user's historical test data. For example: If the user has answered correctly for 3 consecutive times on the "lithography parameter setting" related questions, the trigger frequency of such questions is reduced, and the trigger probability of "lithography defect analysis" and other high-level questions is increased; if the user's error rate on the "etching machine fault handling" questions is > 50%, the trigger priority of such questions is increased in subsequent operations, and automatically associated learning materials (such as etching machine maintenance manual fragments) are recommended.

[0065] Optionally, obtain the operation instruction of the user on the simulation simulation scene; when the operation instruction meets the dynamic trigger condition, determine the device model corresponding to the operation instruction, and determine the question content, question answer and question pop-up position corresponding to the device model based on the test question database, as shown in Figure 4 , comprising: Step S401, obtain the click event of the user on the simulation simulation scene by using the real-time monitoring mouse click action of the user, and determine the operation instruction of the user on the simulation simulation scene based on the click event.

[0066] This step realizes the accurate recognition of user operation through interactive technology, providing data basis for subsequent trigger judgment. In the process of mouse click event listening, the user's mouse click action can be captured in real time by using Unity3D simulation scene and Raycasting technology. For example: when the user clicks the "parameter setting" button on the control panel of the lithography machine, the system records the click position (such as screen coordinates [x, y]), click timestamp and associated UI element ID; if the click occurs in the device operable area (such as the gas flow adjustment knob of the etching machine), the system synchronously obtains the current angle value of the knob and the adjustment direction (clockwise / counter-clockwise).

[0067] The semantic analysis of the operation instruction can convert the click event into an operation instruction with process meaning. For example: clicking the "lithography machine-start" button translates into "lithography process start instruction"; dragging the etching machine "gas flow" slider to 500sccm translates into "etching process parameter setting instruction (gas flow = 500sccm)"; long-pressing the test equipment "probe card replacement" icon translates into "test equipment maintenance instruction".

[0068] The instruction validity verification needs to verify the rationality of the operation instruction based on the process logic parameters. For example: clicking the "lithography machine-exposure" button in the "wafer unloaded" state is judged as an invalid instruction, and a safety prompt is triggered; if the current temperature of the etching machine is <100℃, and the user tries to set the plasma power >500W, it is judged as a risky operation, and the "hazard of high-power operation in low-temperature state" related question is automatically triggered.

[0069] In step S402, when it is detected that the operation instruction meets the dynamic trigger condition, the process logic parameters corresponding to the operation instruction are obtained, and the device model corresponding to the operation instruction is determined by using the manufacturing logic parameters, packaging logic parameters and test logic parameters corresponding to the process logic parameters.

[0070] This step realizes the accurate mapping from user operation to device model through parameter association. The trigger condition matching algorithm involved in the above process compares the parsed operation instruction with the dynamic trigger condition determined in step S102. For example: if the operation instruction is "set etching temperature = 600℃", and there is "trigger assessment when etching temperature > 500℃" in the trigger condition parameters, it is judged that the operation meets the trigger condition; if the user clicks the "skip calibration" button in the "lithography alignment" process, and the trigger condition contains "trigger assessment when key process does not complete standard step", it is judged that the trigger is met.

[0071] When the parameter of the equipment model is traced, the corresponding equipment model is located through the process logic parameter after the trigger condition is met. For example, if the operation instruction involves "exposure energy setting", the "lithography machine" equipment model is located through the "lithography process parameter association table" in the manufacturing logic parameter; if the operation instruction is "bonding pressure adjustment", the "wire bonding machine" equipment model is associated through the "bonding process parameter chain" in the packaging logic parameter.

[0072] When the multi-equipment collaborative operation process is processed, the main operation equipment (such as an etching machine) and auxiliary equipment (such as a conveyor belt) can be determined through the equipment linkage rule in the process logic parameter for a composite operation involving multiple equipment (such as "wafer is transferred from the etching machine to the cleaning table"), and the main equipment related question is triggered preferentially.

[0073] In step S403, the question data corresponding to the equipment model is obtained based on the question database, and the question content, question answer and question pop-up window position corresponding to the question data are determined based on the process logic parameter.

[0074] This step combines equipment characteristics and operation scenarios to customize the examination content and optimize the display position. In the selection of question data, the matching question data is called from the question database based on the equipment model. For example, if the equipment is a "lithography machine" and the current operation is "exposure parameter setting", the "lithography process parameter calculation" type question (such as "When the photoresist thickness is 1.5 μm, the best exposure energy is?") is preferentially selected; if the user operation triggers an "abnormal state" (such as temperature alarm), the "fault diagnosis" type question (such as "The possible cause of the high temperature of the lithography machine is?") is called.

[0075] The dynamic generation process of the question content needs to parameterize the called question data to ensure that the question is related to the current operation scenario. For example, the fixed parameters in the question are replaced by the current operation value of the user (such as replacing the blank in "exposure energy = __ mJ / cm 2 " with the current setting value of the user to dynamically generate "When you set the exposure energy to 400 mJ / cm 2 , the corresponding lithography resolution is?"); the multiple-choice question options are randomly sorted (such as the order of options A / B / C is randomly adjusted each time the question is answered), avoiding the user's memory of the answer position.

[0076] The optimization calculation process of the pop-up window position can dynamically calculate the optimal pop-up window position according to the layout characteristics of the device operation interface. For example: for devices with a dense control panel (such as a lithography machine), the pop-up window position is set at the edge of the operation area (such as the right side of the parameter input box) to avoid blocking key buttons; for 3D rotatable device models (such as etching machine reaction chambers), the pop-up window position follows the changes in the viewing angle and is always kept in the visible area of the front of the device; if the operation involves multiple steps (such as wafer loading processes), the pop-up window position is dynamically adjusted according to the current step (such as displaying near the "wafer box" in the first step and displaying next to the "robot control panel" in the second step). Optionally, after the simulation scene control generates the answer area in the pop-up window position and displays the question content in the answer area, the step S104 of real-time obtaining the user's answer result and calculating the user's examination result by comparing the answer result with the question answer is shown in Figure 5 , and includes: Step S501: Obtain the display page corresponding to the device model in the simulation scene based on the Unity3D engine.

[0077] This step relies on the rendering mechanism of the Unity3D engine to provide a basic canvas for the generation of the answer area. Specifically, the device model display page obtaining process can locate the currently active device model display page through the UI system of Unity3D (such as the Canvas component). For example: when the user operates a lithography machine, the system automatically obtains the 3D operation interface of the lithography machine (including the control panel, parameter display screen, and device status indicator) and the associated 2D interactive layer (such as the floating operation guide); for encapsulated devices (such as a bonding machine), the dynamically rendered working area picture (such as the real-time trajectory simulation of wire bonding) is synchronously obtained.

[0078] The page level and rendering priority setting can preset the rendering level of the display page according to the importance of the device operation. For example: the display page priority of core manufacturing devices such as lithography and etching is higher than that of auxiliary devices (such as wafer conveyors), ensuring that the answer area is generated while focusing on the current operation device; if the user simultaneously operates multiple devices (such as "etching machine + detection table" linkage), the system automatically locks the device page of the last interaction as the answer carrier.

[0079] Step S502: Control the generation of the answer area with the highest display level in the display page using the pop-up window position of the question, and control the display of the question content to the answer area, and real-time monitor the answer result of the user in the answer area.

[0080] This step realizes the seamless integration of the answer interface and the simulation scene through the engine function, ensuring smooth interaction. In the hierarchical control of the answer area, the Unity3D UI layer management (Sorting Layer) can be used to generate the highest display layer in the question popup position, for example: the Sorting Layer of the answer area is set to "Top", ensuring that it covers the device operation interface but does not block the device parameters related to the question (such as when assessing "etching temperature setting", the temperature display screen can still be seen); the answer area uses a semi-transparent background (transparency 70%), which highlights the answer content while preserving the user's perception of the current state of the device (such as real-time parameters like pressure, temperature, etc.).

[0081] The adaptive display of the answer content can dynamically adjust the answer area style according to the question type, for example: for single / multiple choice questions, generate a popup window with option buttons, and adjust the button size according to the device interface ratio (such as the keyboard machine operation interface is small, the button size is reduced in proportion); parameter calculation questions can embed a number input box or a slider component, and the input range is bound to the reasonable interval in the process logic parameters (such as inputting etching temperature, the slider is limited to 300-500℃); process sorting questions can display draggable step cards, supporting users to adjust the operation order (such as "lithography process step sorting").

[0082] The real-time listening process of the answer result can capture the user's answer operation in real time through the Unity3D event system, for example: listen to the click event of the option button, record the user's selected answer (such as "option B"); listen to the submission action of the input box, and synchronize the input content format (such as parameter questions require input of numbers + units, otherwise prompt "format error").

[0083] Step S503, when the answer result is listened to, compare the answer result with the question answer to get a comparison result, and calculate the user's answer score according to the comparison result.

[0084] This step realizes objective scoring through logical verification, ensuring result accuracy. Specific needs include customizing comparison logic according to question type, for example: objective questions (single / multiple choice) directly compare the string consistency of user options and standard answers (such as matching option ID "B" with answer ID "B" to determine correctness); parameter subjective questions allow a ±5% error range (such as a standard answer of "400℃" and user input of "385-415℃" are both correct), and errors beyond the range are penalized by a deviation percentage (such as inputting 430℃ deducts 30% of the score); process operation questions are scored based on step integrity and sequence correctness (such as 3 steps for a 5-step process score 60 points, and each step sequence error deducts 10%).

[0085] The dynamic calibration of the score can adjust the score weight in combination with the operation scene, for example: the basic score of a key process question (such as lithography exposure parameter setting) is 10 points, and an additional "operation specification score" of 2 points (step in line with safety process to add points).

[0086] In step S504, the examination result corresponding to the user is determined by using the answer score.

[0087] This step integrates the score data to generate a multi-dimensional evaluation result. The quantitative presentation process of the examination result is based on the answer score to calculate a comprehensive index, for example: single device examination result: weighted calculation according to "basic score (70%) + speed score (20%) + specification score (10%)", full score is 100 points, and 60 points or more is judged as "qualified"; the whole process examination result is summarized to manufacture, package and test each link score, and the weight is distributed according to the importance of the process (such as manufacturing link accounts for 50%, packaging 25%, and testing 25%).

[0088] The examination result can be obtained by automatically generating a score analysis report, for example: labeling weak links: "etching machine fault handling question score 40 points (lower than average 65 points), it is suggested to strengthen the vacuum system maintenance knowledge learning"; operation trend feedback: "the correct rate of parameter setting question in this examination is 80%, which is 15% higher than the last time, and the operation precision has made obvious progress".

[0089] Optionally, after the answer result is compared with the question answer to obtain a comparison result, the method further includes: if the answer result in the comparison result does not match the question answer, obtaining a question analysis text corresponding to the question answer, and controlling the question analysis text to be displayed to a preset analysis position in the answer area. In this scenario, if the user answers incorrectly, the analysis result of the question is obtained according to the question analysis text, and the analysis result is displayed in the preset analysis position in the answer area.

[0090] Optionally, before obtaining the operation instruction of the user to the simulation simulation scene, the method further includes: Obtaining a mode selection instruction of the user to the simulation simulation scene; wherein the mode selection instruction includes a learning mode instruction and an examination mode instruction.

[0091] The learning mode instruction corresponds to a learning mode, and in the learning mode, the conditions of operations can be detected and judged, such as automatically triggering an error mechanism when the bonding temperature exceeds the range of 150-180 DEG C, and pushing the question gold wire bonding temperature to affect the bonding strength. The examination mode instruction corresponds to an examination mode, and in the examination mode, the answers can be checked and scored according to the answers, and the answer time is limited to 30 seconds, and if the time is exceeded, the answer is automatically judged as wrong. Specifically, if the mode selection instruction is the examination mode instruction, the simulation scene is controlled to generate an answer area in the question pop-up position, and the question content is displayed in the answer area, the user's answer result is obtained in real time, and the comparison result of the answer result and the question answer is used to calculate the examination result of the user, as shown in step S104 of Figure 6 Step S601, obtaining a display page corresponding to a device model in a simulation scene based on a Unity3D engine; Step S602, generating an answer area with the highest display level in the display page by using a question pop-up position, and controlling the question content to be displayed in the answer area, and real-time monitoring of the user's answer result in the answer area, and using a pre-set timer to obtain the answer time corresponding to the answer result in real time; Step S603, when the answer time exceeds the pre-set answer time threshold, determining the comparison result of the answer result and the question answer as an error result, and calculating the answer score of the user according to the error result; Step S604, determining the examination result of the user by using the answer score.

[0092] The examination interaction control method in the scene mainly includes the following steps: constructing a virtual simulation scene and a process logic, building a mapping database of questions and processes; a dynamic question triggering mechanism is realized by triggering condition detection, question extraction algorithm and pop-up interaction control; the question is checked and scored; after the answer is finished, the scene state is saved and restored, and if it is an examination mode, the answer time is also recorded. The above process is specifically shown in the flow chart of another examination interaction control method Figure 7

[0093] The present application can realize the following technical effects through the dynamic question triggering mechanism, intelligent checking system and seamless interaction design: the dynamic association of questions is realized by the error triggering mechanism, the knowledge point memory retention rate is improved by real-time answering during operation, the skill and knowledge are covered by operation and theoretical answering dual-dimension scoring, the scene state is frozen during answering, the embedded modal pop-up window is appeared, the error is restored to ≤0.1mm, and the virtual simulation + dynamic examination can also reduce the operation training time of the device and reduce the training cost.

[0094] ​​From the above-mentioned examination interaction control method in the embodiment, it can be seen that the method realizes the real-time combination of operation and theory, enhances the flexibility and intelligence of the triggering mechanism, and establishes a "operation-knowledge" two-dimensional evaluation process. The method outputs the multi-dimensional examination results of the students by dynamically triggering the test questions, deeply interacting and fusing the simulation process embedded in the answering process, and accurately evaluating the ability of the operation behavior and the answering result, which can reduce the training time of the students and reduce the training cost.

[0095] Corresponding to the above-mentioned examination interaction control method embodiment, the embodiment of the present application also provides an examination interaction control system, as shown in Figure 8 The system comprises: The simulation scene construction module 810 is configured to construct a simulation simulation scene based on an integrated circuit manufacturing scene, determine process logic parameters corresponding to the integrated circuit manufacturing scene according to a device model contained in the simulation simulation scene, and construct a test question database corresponding to the device model by using the process logic parameters. The triggering condition determination module 820 is configured to determine a question triggering condition parameter, a question extraction strategy parameter and a question pop-up interaction parameter corresponding to the device model according to the process logic parameters, and determine a dynamic triggering condition corresponding to the device model and the test question database by using the question triggering condition parameter, the question extraction strategy parameter and the question pop-up interaction parameter. The question data interaction module 830 is configured to obtain an operation instruction of a user to the simulation simulation scene; when the operation instruction meets the dynamic triggering condition, determine a device model corresponding to the operation instruction, and determine a question content, a question answer and a question pop-up position corresponding to the device model based on the test question database. The examination result generation module 840 is configured to control the simulation simulation scene to generate an answering area in the question pop-up position and display the question content in the answering area, obtain an answering result of the user in real time, and calculate an examination result of the user by using a comparison result of the answering result and the question answer.

[0096] It can be seen from the above-mentioned examination interaction control system that the system realizes the real-time combination of operation and theory, enhances the flexibility and intelligence of the triggering mechanism, and establishes a "operation-knowledge" two-dimensional evaluation process. The system outputs the multi-dimensional examination results of the students by dynamically triggering the test questions, deeply interacting and fusing the simulation process embedded in the answering process, and accurately evaluating the ability of the operation behavior and the answering result, which can reduce the training time of the students and reduce the training cost.

[0097] The implementation principle and the technical effects of the examination interaction control system provided by the embodiment of the present application are the same as those of the above-mentioned examination interaction control method embodiment. For brief description, the part not mentioned in the system embodiment can be referred to the corresponding content in the above-mentioned examination interaction control method embodiment.

[0098] The embodiment also provides a server, and a structure diagram of the server is as followsFigure 9 As shown, the device includes a processor 101 and a memory 102; wherein the memory 102 is configured to store one or more computer instructions, and the one or more computer instructions are executed by the processor to implement the steps of the examination interaction control method described above.

[0099] Figure 9 The server as shown further includes a bus 103 and a communication interface 104, and the processor 101, the communication interface 104 and the memory 102 are connected through the bus 103.

[0100] The memory 102 can include a high-speed random access memory (RAM), and can also include a non-volatile memory, such as at least one disk memory. The bus 103 can be an ISA bus, a PCI bus, an EISA bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 9 Only one bidirectional arrow is used in the figure, but it does not mean that there is only one bus or only one type of bus.

[0101] The communication interface 104 is configured to connect with at least one user terminal and other network elements through a network interface, and send the encapsulated IPv4 packet or IPv4 packet to the user terminal through the network interface.

[0102] The processor 101 can be an integrated circuit chip with processing capability. In implementation process, each step of the above method can be completed by integrated logic circuit of hardware in the processor 101 or instruction in the form of software. The processor 101 described above can be a general processor, including a central processing unit (CPU), a network processor (NP), etc.; can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component. Each method, step and logic block diagram disclosed in the embodiments of the present disclosure can be implemented or executed. The general processor can be a microprocessor or the processor can also be any conventional processor. The steps of the method disclosed in combination with the embodiments of the present disclosure can be directly embodied as a hardware code processor to execute, or be executed by a combination of hardware and software modules in the code processor. The software module can be located in a random access memory, a flash memory, a read only memory, a programmable read only memory or an electrically erasable programmable memory, a register, or other mature storage medium in the art. The storage medium is located in the storage 102, and the processor 101 reads the information in the storage 102, and combines the hardware to complete the steps of the method of the above embodiments.

[0103] The embodiment of the present application further provides a storage medium, and the storage medium stores a computer program. When the computer program is run by a processor, the steps of the examination interaction control method in the above embodiment are executed.

[0104] In several embodiments provided in the present application, it should be understood that the disclosed system, device, equipment and method can be implemented by other ways. The system embodiments described above are only schematic, for example, the division of the units is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some communication interface, device or unit, and can be electrical, mechanical or other forms.

[0105] The units described as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, i.e. may be located in one place, or may be distributed on multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the embodiment scheme.

[0106] In addition, each functional unit in each embodiment of the application can be integrated in one processing unit, or each unit can exist physically, or two or more units can be integrated in one unit.

[0107] If the functions are realized in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer readable storage medium executable by a processor. Based on this understanding, the technical solutions of the application or the part of the prior art that essentially contributes or the part of the technical solutions can be embodied in the form of a software product, which is stored in a storage medium and includes instructions for making a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the steps of the method described in each embodiment of the application. The foregoing storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disk or optical disk and various program code storage media.

[0108] Finally, it should be noted that: the above-described embodiments are only specific embodiments of the application, which are used to illustrate the technical solutions of the application, but not to limit it, the protection scope of the application is not limited thereto, although the application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any skilled person in the art can modify or easily think of changes to the technical solutions recorded in the foregoing embodiments within the technical range disclosed by the application, or make equivalent replacement to part of the technical features; and these modifications, changes or replacements do not make the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the application, and should be covered in the protection scope of the application. Therefore, the protection scope of the application should be subject to the protection scope of the claims.

Claims

1. A method for interactive assessment control, characterized in that, The method includes: A simulation scenario is constructed based on the integrated circuit manufacturing scenario. The process logic parameters corresponding to the integrated circuit manufacturing scenario are determined according to the equipment models contained in the simulation scenario. The test question database corresponding to the equipment models is constructed using the process logic parameters. Based on the process logic parameters, determine the question triggering condition parameters, question extraction strategy parameters, and question pop-up interaction parameters corresponding to the equipment model, and use the question triggering condition parameters, question extraction strategy parameters, and question pop-up interaction parameters to determine the dynamic triggering conditions corresponding to the equipment model and the question database; Obtain user operation commands for the simulated scenario; when the operation command meets the dynamic triggering condition, determine the device model corresponding to the operation command, and determine the question content, question answer, and question pop-up location corresponding to the device model based on the question database; After the simulated scenario generates an answer area in the question pop-up window and displays the question content in the answer area, the user's answer results are obtained in real time, and the user's assessment results are calculated by comparing the answer results with the question answers.

2. The assessment interaction control method according to claim 1, characterized in that, The steps include: constructing a simulation scenario based on an integrated circuit manufacturing scenario; determining the process logic parameters corresponding to the integrated circuit manufacturing scenario based on the equipment models included in the simulation scenario; and constructing a question database corresponding to the equipment models using the process logic parameters. The simulation scenario is obtained by acquiring the corresponding IC manufacturing equipment, packaging equipment, and testing equipment in the integrated circuit manufacturing scenario, and by loading and packaging the IC manufacturing equipment, the packaging equipment, and the testing equipment based on the Unity3D engine. Based on the IC manufacturing equipment, the packaging equipment, and the testing equipment, determine the manufacturing logic parameters, packaging logic parameters, and testing logic parameters corresponding to the simulation scenario, and based on the manufacturing logic parameters, the packaging logic parameters, and the testing logic parameters, determine the process logic parameters corresponding to the equipment model in the integrated circuit manufacturing scenario; The question data corresponding to the equipment model is constructed using the setting parameters, operation parameters, and usage parameters corresponding to the equipment model in the process logic parameters, and the question database corresponding to the equipment model is constructed based on the association result between the process logic parameters and the question data.

3. The assessment interaction control method according to claim 2, characterized in that, The steps of determining the question triggering condition parameters, question extraction strategy parameters, and question pop-up interaction parameters corresponding to the equipment model based on the process logic parameters, and determining the dynamic triggering conditions corresponding to the equipment model and the question database using the question triggering condition parameters, the question extraction strategy parameters, and the question pop-up interaction parameters, include: Based on the manufacturing logic parameters, packaging logic parameters, and testing logic parameters included in the process logic parameters, determine the process operation instructions and error operation instructions corresponding to the simulation scenario; The process operation instructions and the error operation instructions are used to determine the question triggering condition parameters, question extraction strategy parameters, and question pop-up interaction parameters corresponding to the equipment model; The question data corresponding to the question database is determined by the question triggering condition parameters, the question extraction strategy parameters, and the question pop-up interaction parameters, and the dynamic triggering conditions corresponding to the device model are determined based on the question data.

4. The assessment interaction control method according to claim 3, characterized in that, The steps of obtaining user operation commands for the simulated scenario; determining the device model corresponding to the operation command when the operation command meets the dynamic triggering condition, and determining the question content, question answer, and question pop-up location corresponding to the device model based on the question database, include: The user's click events on the simulated scenario are obtained by real-time monitoring of the user's mouse click actions, and the user's operation instructions on the simulated scenario are determined based on the click events. When the operation instruction is detected to meet the dynamic triggering condition, the process logic parameters corresponding to the operation instruction are obtained, and the manufacturing logic parameters, packaging logic parameters and testing logic parameters corresponding to the process logic parameters are used to determine the equipment model corresponding to the operation instruction. Based on the question database, obtain the question data corresponding to the equipment model, and determine the question content, the question answer, and the question pop-up location corresponding to the question data based on the process logic parameters.

5. The assessment interaction control method according to claim 1, characterized in that, The steps of controlling the simulated scenario to generate an answer area in the question pop-up window and display the question content in the answer area, then acquiring the user's answer result in real time, and calculating the user's assessment result by comparing the answer result with the question answer, include: The display page corresponding to the device model in the simulation scene is obtained based on the Unity3D engine; The system uses the position of the question pop-up to control the generation of the highest-level answer area on the display page, and controls the display of the question content in the answer area, while monitoring the user's answer in the answer area in real time. After the answer result is detected, the answer result is compared with the answer to the question to obtain the comparison result, and the user's answer score is calculated based on the comparison result; The user's assessment result is determined using the answer score.

6. The assessment interaction control method according to claim 5, characterized in that, After comparing the answer result with the answer to the question to obtain the comparison result, the method further includes: If the answer result in the comparison results does not match the answer to the question, then the question parsing text corresponding to the answer to the question is obtained, and the question parsing text is displayed in the preset parsing position in the answer area.

7. The assessment interaction control method according to claim 1, characterized in that, Before obtaining user commands for the simulated scenario, the method further includes: Obtain the user's mode selection instruction for the simulated scenario; wherein, the mode selection instruction includes a learning mode instruction and an assessment mode instruction.

8. The assessment interaction control method according to claim 7, characterized in that, If the mode selection instruction is the assessment mode instruction, then the steps of controlling the simulation scenario to generate an answer area in the question pop-up position and displaying the question content in the answer area, obtaining the user's answer result in real time, and calculating the user's assessment result using the comparison result of the answer result and the question answer, include: The display page corresponding to the device model in the simulation scene is obtained based on the Unity3D engine; The system controls the generation of the highest-level answer area on the display page by using the position of the question pop-up window, and controls the display of the question content in the answer area. The system then monitors the user's answer in the answer area in real time and uses a preset timer to obtain the answer time corresponding to the answer result in real time. When the answering time exceeds the preset answering time limit threshold, the comparison result between the answer and the question answer is determined to be an error result, and the user's answering score is calculated based on the error result; The user's assessment result is determined using the answer score.

9. An interactive assessment control system, characterized in that, The system includes: The simulation scenario construction module is used to construct a simulation scenario based on the integrated circuit manufacturing scenario, determine the process logic parameters corresponding to the integrated circuit manufacturing scenario according to the equipment model contained in the simulation scenario, and construct a test question database corresponding to the equipment model using the process logic parameters. The triggering condition determination module is used to determine the question triggering condition parameters, question extraction strategy parameters, and question pop-up interaction parameters corresponding to the equipment model based on the process logic parameters, and to determine the dynamic triggering conditions corresponding to the equipment model and the question database using the question triggering condition parameters, the question extraction strategy parameters, and the question pop-up interaction parameters. The question data interaction module is used to obtain the user's operation instructions for the simulated scenario; when the operation instructions meet the dynamic triggering conditions, the device model corresponding to the operation instructions is determined, and the question content, question answer and question pop-up position corresponding to the device model are determined based on the question database; The assessment result generation module is used to control the simulation scenario to generate an answer area in the question pop-up window and display the question content in the answer area, then obtain the user's answer result in real time, and calculate the user's assessment result by comparing the answer result with the question answer.

10. A server, characterized in that, It includes a processor and a memory, the memory storing computer-executable instructions that can be executed by the processor, the processor executing the computer-executable instructions to implement the steps of the assessment interaction control method according to any one of claims 1 to 8.

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