Contact state detection device and method for connector

Abstract

The invention discloses a contact state detection device and method for a connector. The device comprises a to-be-detected connector, a male end connector, a metal touch detection circuit and an upper computer. And after the to-be-detected connector is inserted into the male end connector, the detected pin is electrically connected with the metal touch detection circuit. The metal touch detection circuit can perform multi-channel sampling on the contact state of each jack of the male end connector and generate an electric signal corresponding to the contact state of each channel. And the upper computer is connected with the metal touch detection circuit through a wired interface, and is used for receiving the electric signal and analyzing the contact state of each channel according to a preset judgment rule so as to accurately judge whether each pin is in normal contact or virtual connection. The device can realize multichannel parallel detection, is rapid and reliable in detection process, can effectively avoid misjudgment caused by the fact that a traditional method only depends on logic level judgment, is suitable for online monitoring and quality detection of the contact performance of the connector, and has the advantages of being high in detection precision and high in applicability.

Description

Technical Field

[0001] This invention belongs to the field of connector testing technology, specifically relating to a device and method for detecting the contact state of connectors. Background Technology

[0002] Various pluggable electrical connectors, such as Harding rectangular connectors, are widely used in railway signaling products, industrial automation equipment, and rail transit communication control systems. These connectors typically form a point-to-point conductive path through the contact between the metal spring inside the female socket and the male pin.

[0003] However, during long-term use, the metal spring contacts inside the female connector are prone to performance degradation due to various reasons, including: increased contact resistance caused by surface metal oxidation, decreased elasticity due to mechanical fatigue, and insufficient contact force caused by localized plastic deformation or fracture. When the metal spring contacts are not firmly connected to the male connector pins, a loose connection will occur, meaning that the contact appears normal, but the actual conductivity is unstable. Loose connections may lead to intermittent circuits, signal distortion, and even localized overheating under high current operating conditions, which may cause burnout or safety accidents in severe cases.

[0004] Existing methods for detecting connector contact status mainly rely on two approaches: one is to measure the resistance between the two ends of the connector with a multimeter to determine whether it is conductive; the other is to conduct long-term high-temperature stress testing to expose loose connections through accelerated aging. In a loose connection state, the connector may still maintain some conductivity, so simple resistance measurement is often insufficient to identify potential poor contact. While high-temperature stress testing can increase the probability of loose connections being exposed, it has a long testing cycle, high cost, and still carries the risk of loose connections not being detected in time. Most existing detection methods are post-event verifications, meaning that loose connection problems are often only discovered after actual operation or a failure occurs, leading to increased maintenance costs and repair time, and making it difficult to guarantee equipment reliability.

[0005] In the prior art, Chinese patent CN115656889A discloses a novel connector system and its intelligent diagnostic method, belonging to the field of connector system structural design technology. It includes: a male connector terminal, a female connector terminal, an intelligent diagnostic module, and an information module. The intelligent diagnostic module includes: an isolation acquisition module, which isolates the main circuit from the monitoring circuit to prevent interference caused by electrical connections; a fault perception module, which, for existing connector contact failures, performs power-on self-tests and runtime timeout trigger self-tests based on the current or signal level in the circuit to detect whether the connector is connected correctly. It captures the transient multi-pulse characteristics generated by the high and low level changes of the signal in the female connector terminal, monitors the connector system in real time during use for faults, and locates the fault location using a serial number. The information module transmits relevant signals to the information module when the intelligent diagnostic module detects an abnormality, prompting engineers with connector fault-related information. However, this solution has the following limitations:

[0006] 1. This method is mainly based on the conduction judgment of high level / low level. In the case of a false connection, the logic level may still be normal, so it is easy to misjudge the normal state.

[0007] 2. Its pulse capture method mainly monitors the number of level changes, which makes it difficult to accurately reflect physical characteristics such as capacitive coupling effect and dynamic charging and discharging response during the loose connection process, resulting in limited diagnostic granularity;

[0008] 3. This solution requires power-on or operation for a period of time before poor contact can be inferred from the voltage level characteristics, and it cannot directly detect loose connection problems during the assembly or early detection stages;

[0009] Therefore, existing technologies are unable to quickly and accurately identify loose connections, which may still lead to potential problems with railway signal connectors during use. Summary of the Invention

[0010] The purpose of this invention is to overcome the shortcomings of the prior art by providing a contact state detection circuit and method for connectors.

[0011] The objective of this invention can be achieved through the following technical solutions:

[0012] This invention provides a contact state detection device for a connector, comprising: a connector to be tested, a male connector, a metal touch detection circuit, and a host computer; the connector to be tested is inserted into the male connector, and the pin to be tested is electrically connected to the metal touch detection circuit; the metal touch detection circuit is used to perform multi-channel sampling of the contact state of each corresponding socket of the male connector and generate an electrical signal corresponding to the contact state of each channel; the host computer is connected to the metal touch detection circuit through a wired interface, and is used to receive the electrical signals and determine the contact state of each pin according to a preset rule.

[0013] Furthermore, the metal touch detection circuit includes a transistor, a first operational amplifier, a second operational amplifier, and a capacitor.

[0014] Furthermore, the base of the transistor is connected to the socket of the male connector, the collector of the transistor is connected to pin 2 of the first operational amplifier, and the emitter of the transistor is grounded.

[0015] Furthermore, the metal touch detection circuit also includes a second resistor; pin 2 of the first operational amplifier is connected to a 24V power supply; pin 3 of the first operational amplifier is connected to the 24V power supply and pin 5 of the second operational amplifier; pin 3 of the first operational amplifier is also grounded through the second resistor; pin 1 of the first operational amplifier is connected to pin 6 of the second operational amplifier, the positive terminal of the capacitor, and the input terminal of the host computer; pin 8 of the first operational amplifier is connected to the 24V power supply; and pin 4 of the first operational amplifier is grounded.

[0016] Furthermore, the metal touch detection circuit also includes a second diode, and pin 7 of the second operational amplifier is connected to the negative terminal of the second diode.

[0017] Furthermore, the positive terminal of the capacitor is connected to pin 1 of the first operational amplifier and the input terminal of the host computer, respectively, and the negative terminal of the capacitor is grounded.

[0018] Furthermore, the host computer is used to execute the following processes:

[0019] For each channel under test of the male connector, the host computer controls the metal touch detection circuit or external excitation source to implement at least two different modes of excitation according to a predetermined scanning time slot and receives the corresponding electrical signals. The excitation modes include, but are not limited to: natural touch trigger recording, controlled short pulse or step excitation, and optional multi-frequency AC excitation.

[0020] The host computer extracts several feature items for judgment from the received electrical signal. The feature items include peak amplitude, rise time, charge / discharge time constant, decay wake energy, and residual potential.

[0021] The host computer fuses the extracted features based on the training model to calculate the contact health score, and preliminarily judges each channel as normal contact or loose contact based on the score and the preset threshold range.

[0022] The host computer will perform differential analysis on the characteristic items of the channel identified as having a loose connection and its adjacent or clustered channels, compare the consistency of the electrical signal characteristics, identify whether the loose connection is a single channel fault or a systematic offset, and mark it when it is identified as a systematic offset and prompt for clamp or grounding check.

[0023] For channels that are still found to be loosely connected after differential analysis verification, the host computer automatically triggers a hierarchical confirmation process according to a preset strategy. The confirmation process includes: increasing the number of electrical signal samplings, switching to a high-resolution measurement mode, changing the excitation amplitude or frequency, extending the sampling window, and using a majority voting or hysteresis mechanism to determine the final judgment.

[0024] Another aspect of the present invention provides a detection method based on any of the above-described contact state detection devices for connectors, comprising the following steps:

[0025] After the connector to be tested is inserted into the male connector, the host computer controls the metal touch detection circuit or external excitation source to implement at least two different modes of excitation according to a predetermined scanning time slot and receives the corresponding electrical signals. The excitation modes include, but are not limited to: natural touch trigger recording, controlled short pulse or step excitation and optional multi-frequency AC excitation.

[0026] The host computer extracts several feature items for judgment from the received electrical signal;

[0027] The host computer fuses the extracted features based on the training model to calculate the contact health score, and preliminarily judges each channel as normal contact or loose contact based on the score and the preset threshold range.

[0028] The host computer will perform differential analysis on the characteristic items of the channel identified as having a loose connection and its adjacent or clustered channels, compare the consistency of the electrical signal characteristics, identify whether the loose connection is a single channel fault or a systematic offset, and mark it when it is identified as a systematic offset and prompt for clamp or grounding check.

[0029] For channels that are still found to be loosely connected after differential analysis verification, the host computer automatically triggers a hierarchical confirmation process according to a preset strategy. The confirmation process includes: increasing the number of electrical signal samplings, switching to a high-resolution measurement mode, changing the excitation amplitude or frequency, extending the sampling window, and using a majority voting or hysteresis mechanism to determine the final judgment.

[0030] Furthermore, the characteristic terms include peak amplitude, rise time, charge / discharge time constant, decay wake energy, and residual potential;

[0031] Furthermore, the host computer performs differential analysis on the characteristic features of the channel identified as having a loose connection and its adjacent or clustered channels, compares the consistency of the electrical signal characteristics, and identifies whether the loose connection is a single channel fault or a systemic offset. Specifically, this includes:

[0032] The host computer analyzes the various features of the virtual connection channel. Mean of corresponding feature terms of its adjacent or clustered channels Perform difference calculations to obtain the difference index Δ i The calculation formula is:

[0033]

[0034] in, This represents the value of the i-th feature term of the channel that is determined to be a loose connection. Δ represents the mean of adjacent or clustered channels of a virtual connection at the i-th feature term; i This represents the normalized difference value of the virtual connection channel on the i-th feature term;

[0035] The host computer defines the comprehensive difference metric D based on the sum of squares of the difference indices of each characteristic item. The calculation formula is as follows:

[0036]

[0037] Where D is the comprehensive difference metric, used to measure the overall deviation of the virtual connection channel from its neighboring channels; n is the total number of feature terms involved in the analysis;

[0038] When the comprehensive differential metric D exceeds the preset single-channel threshold, the channel is determined to be a single-channel fault; when the differential index Δ i When multiple channels exhibit systematic offset, it is determined to be a systematic offset and a prompt is made to perform a fixture or grounding check.

[0039] Compared with the prior art, the present invention has the following advantages:

[0040] (1) In existing technologies, the method of measuring resistance using a multimeter can only distinguish between fully conductive and fully disconnected states. However, in the case of a loose connection, a certain conductive resistance may still be maintained, resulting in a normal test result and the potential for a loose connection not being identified. To address this issue, this invention incorporates a metal touch detection circuit. Utilizing the capacitive coupling effect formed at the connector contact interface, it extracts the response signal characteristics (such as voltage amplitude, rise time, and residual potential) during the charging and discharging process, enabling it to sensitively detect electrical signal deviations caused by loose connections. Through this detection method based on the capacitive touch sensing principle, this invention effectively solves the problem of traditional resistance measurement failing to identify loose connections, achieving rapid and reliable detection of loose connection states.

[0041] (2) In existing technologies, high-temperature, long-duration stress testing relies on accelerated aging to expose loose connections, resulting in long testing cycles, high costs, and the risk that loose connections may not be detected in time. To address this issue, this invention can acquire multi-dimensional feature quantities through active detection of capacitor charging and discharging signals during the assembly or maintenance phase, and determine loose connections through analysis by a host computer. This eliminates the need for high temperatures and long-term operation to detect potential problems in advance. This method significantly shortens the detection cycle, reduces testing costs, and significantly improves the early detection rate and preventative maintenance capabilities for loose connection issues.

[0042] (3) Existing technologies struggle to distinguish between a loose connection and a normal connection because the electrical signal generated in a loose connection state has a very small amplitude and short duration, making it easy for traditional logic level detection to misjudge as a normal connection. This invention amplifies and prolongs the weak, short-lived electrical signal generated during the channel's charging and discharging process by incorporating an operational amplifier and capacitor in the metal touch detection circuit, enabling the signal to be stably acquired and analyzed by the host computer. This allows the invention to effectively distinguish between loose connections and normal contacts; even if the electrical signal is weak or short-lived, it can be accurately captured and determined, thereby significantly improving the sensitivity and reliability of loose connection detection.

[0043] (4) Existing technologies identify poor contact through pulse capture, but this mainly monitors the number of level changes and cannot accurately reflect the capacitive coupling effect and charging / discharging dynamic characteristics during the connection failure process, resulting in limited diagnostic granularity. To solve this problem, this invention not only extracts a single feature of the charging / discharging response signal, but also extracts multiple feature quantities (such as amplitude, rise time, time constant, residual potential, etc.), and performs feature fusion and differential analysis on the host computer to obtain more comprehensive contact status information. By comprehensively utilizing multi-dimensional features, this invention significantly improves the diagnostic granularity and judgment accuracy, achieving more detailed and reliable connection failure identification. Attached Figure Description

[0044] Figure 1 This is a circuit diagram of a metal touch detection system according to an embodiment of the present invention;

[0045] Figure 2 This is a flowchart of the contact state detection method according to an embodiment of the present invention;

[0046] The attached diagram is labeled as follows: Q1, transistor; R1, first resistor; R2, second resistor; R3, third resistor; R4, fourth resistor; R5, fifth resistor; R6, sixth resistor; U1-1, first operational amplifier; U-2, second operational amplifier; C1, capacitor; D1, first diode; D2, second diode. Detailed Implementation

[0047] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0048] Example 1:

[0049] This embodiment provides a contact state detection device for connectors, including: a connector to be tested, a male connector, a metal touch detection circuit, and a host computer; the connector to be tested is inserted into the male connector, and the pin to be tested is electrically connected to the metal touch detection circuit; the metal touch detection circuit is used to perform multi-channel sampling of the contact state of each corresponding socket of the male connector and generate an electrical signal corresponding to the contact state of each channel; the host computer is connected to the metal touch detection circuit through a wired interface, and is used to receive the electrical signals and determine the contact state of each pin according to preset rules based on the electrical signals of each channel.

[0050] like Figure 1 As shown, the metal touch detection circuit includes a transistor Q1, a first operational amplifier U1-1, a second operational amplifier U1-2, and a capacitor C1. The base of the transistor is connected to the male connector socket, the collector of the transistor is connected to pin 2 of the first operational amplifier, and the emitter of the transistor is grounded. The metal touch detection circuit also includes a second resistor. Pin 2 of the first operational amplifier is connected to a 24V power supply. Pin 3 of the first operational amplifier is connected to both the 24V power supply and pin 5 of the second operational amplifier, and pin 3 of the first operational amplifier is also grounded through the second resistor. Pin 1 of the first operational amplifier is connected to pin 6 of the second operational amplifier, the positive terminal of the capacitor, and the input terminal of the host computer. Pin 8 of the first operational amplifier is connected to the 24V power supply, and pin 4 of the first operational amplifier is grounded. The metal touch detection circuit also includes a second diode. Pin 7 of the second operational amplifier is connected to the negative terminal of the second diode. The positive terminal of the capacitor is connected to pin 1 of the first operational amplifier and the input terminal of the host computer, and the negative terminal of the capacitor is grounded.

[0051] The working principle of this embodiment is as follows:

[0052] When the connector under test is inserted into the male connector, the connection between a single pin and the corresponding socket is not simply an ideal direct metal connection. A contact capacitance C is formed due to minute gaps or contact via spring contacts. contact When the tester presses the female end of the rectangular electrical connector to ensure good contact with the testing fixture, the induced capacitance C of the human body relative to the ground... body With the above C contact Connected in parallel, forming the total equivalent capacitance:

[0053] C tot =C contact +C body

[0054] This parallel connection ensures that, upon pressing or experiencing a transient disturbance, the potential change at this node is related to the total capacitance, thereby generating a small transient voltage V at the input of the detection circuit (i.e., the base of the transistor). in (t);

[0055] This transient voltage acts on the transistor (base in the diagram). When V in When the base-emitter voltage reaches the turn-on threshold, the transistor changes from cutoff to conduction, the collector current increases, and the collector voltage changes accordingly. This change is directly sent to the input of the first operational amplifier (i.e., pin 2 of the first operational amplifier is connected to the collector of the transistor), which is equivalent to converting the capacitive coupling / weak signal at the contact surface into a voltage / current signal that can be processed by the amplifier.

[0056] The first operational amplifier amplifies the weak signal from the collector of the transistor with high gain, raising the transient voltage, which was originally very small and easily drowned out by noise, to a measurable level; and buffers and drives the signal with low impedance to drive the subsequent circuit (including the capacitor charging circuit and the host computer input).

[0057] A capacitor C1 is connected in parallel at the output of the first operational amplifier. This capacitor is used for energy storage / delay and waveform shaping: when the output of the first operational amplifier rises, capacitor C1 is charged and the capacitor voltage rises accordingly; when the input disturbance disappears (e.g., pressing no longer changes the potential or the excitation stops the moment the tester removes it), causing the amplifier drive to disappear, capacitor C1 will discharge through the equivalent impedance in the circuit, thereby generating a trail signal with exponential decay characteristics at the output.

[0058] Due to differences in physical contact quality, there are differences in equivalent circuit parameters between a loose connection and a normal connection, mainly reflected in the equivalent capacitance C. contact On the equivalent contact resistance of the equivalent capacitance:

[0059] When in normal contact: the metal spring and the pin have a good, large contact area and low contact resistance, and the equivalent capacitance is low. The resistance is relatively large, and the equivalent contact resistance is relatively small. According to the above mechanism, when pressure is applied and C is formed... tot At that time, the coupling energy of the input voltage is greater, resulting in V in (t) has a higher peak voltage after being amplified by the first operational amplifier; and because C tot The discharge time constant τ is relatively large, resulting in a long wake duration. In the time domain, this manifests as a higher peak amplitude, a smoother rise / fall, and a longer wake.

[0060] When a connector has a poor connection: There may be a micro-gap or coupling only through a tiny area of ​​contact, resulting in an equivalent capacitance. The contact resistance is relatively small, or it is large or nonlinear. The result is the initial voltage V coupled to the detection point. in (t) is significantly lower, the peak value is small after amplification, and due to C tot A smaller discharge path impedance ratio results in a shorter time constant τ, rapid wake decay, and a smaller energy integral. In the time domain, this manifests as: lower amplitude, steeper rise / fallback, shorter wake, and a relatively higher proportion of noise.

[0061] In this circuit, the second operational amplifier and the second diode constitute a signal shaping and thresholding circuit: the second operational amplifier can function as a comparator / filter, further thresholding or amplifying the continuous analog wake output of the first operational amplifier, and clamping the output polarity or amplitude through the diode to protect the host computer input and achieve the required digital boundaries (e.g., generating pulses or levels that can be recognized by the switch input board). In short:

[0062] The first op-amp is responsible for amplification, driving, and charging;

[0063] The capacitor is responsible for holding, delaying, and forming the discharge trail.

[0064] The second operational amplifier and diode are responsible for shaping and comparison / protection, so that the output can be accurately recorded by the analog sampling of the host computer, and can also generate a digital signal that can be recognized by the switch quantity acquisition device when needed.

[0065] After receiving the electrical signal, the host computer analyzes its characteristics, such as amplitude, rise time, charge / discharge time constant, and residual potential. Based on preset judgment rules, it determines the contact status of each channel pin. When the signal characteristics are within the normal range, the contact is considered normal; when the signal amplitude is low or the charge / discharge characteristics are abnormal, the contact is considered loose or poor, thus achieving rapid and accurate detection of the connector contact status.

[0066] Example 2:

[0067] This embodiment provides a method for detecting the contact state of a connector, such as... Figure 2 As shown, it includes the following steps:

[0068] Step S1: After the connector to be tested is inserted into the male connector, the host computer controls the metal touch detection circuit or external excitation source to implement at least two different modes of excitation according to the predetermined scanning time slot and receives the corresponding electrical signals. The excitation modes include, but are not limited to: natural touch trigger recording, controlled short pulse or step excitation and optional multi-frequency AC excitation.

[0069] Natural touch triggering recording refers to the passive monitoring of the transient response of the channel from transistor triggering to the output of the first operational amplifier when the human body / fixture comes into contact or shifts with the channel under test due to manual pressing or clamping actions, and automatic triggering of sampling and storage. Controlled short pulse or step excitation refers to the host computer actively applying isolated and energy-limited voltage / current pulses or step excitations to a designated channel to obtain a repeatable time-domain response under controlled excitation, which is used to accurately estimate the channel's charge / discharge time constant and energy characteristics. Multi-frequency AC excitation refers to the host computer or external excitation source applying small-amplitude continuous or discrete frequency AC excitations (e.g., f1, f2, f3...) to the channel, and measuring the amplitude and phase response of the channel under test at each frequency point to obtain frequency-dependent complex impedance information, thereby distinguishing between resistance-dominated or capacitance-dominated coupling characteristics.

[0070] Step S2: The host computer extracts several feature items for judgment from the received electrical signal. The feature items include peak amplitude, rise time, charge / discharge time constant, decay wake energy, and residual potential.

[0071] The formula for calculating the peak amplitude is as follows:

[0072]

[0073] Where V(t) is the instantaneous voltage signal acquired by the host computer, and t s t e These represent the start and end times of the sampling window, respectively; A peak Peak amplitude;

[0074] The formula for calculating rise time is:

[0075] T rise =t 90％ -t 10％

[0076] Among them, t 90％ t 10％ These represent the moments when the instantaneous voltage signal acquired by the host computer reaches 90% and 10% of its peak amplitude, respectively; T rise Indicates the rise time;

[0077] The formula for calculating the charge / discharge time constant is:

[0078]

[0079] Where t1 and t2 represent two non-overlapping sampling times in the discharge segment, with t2>t1; τ is a time constant, representing the exponential decay characteristic of the discharge (or charging) process.

[0080] The formula for calculating the energy of the decaying wake is:

[0081]

[0082] Among them, t end T indicates the moment when the stimulus ends or the peak ends. win E represents the length of the trail integration window; tail To attenuate the wake energy, the signal energy accumulated in the discharge wake is characterized.

[0083] The formula for calculating residual potential is:

[0084] V res =V(t) end +T win )

[0085] Among them, V res The residual potential represents the remaining voltage level at the end of the wake window, reflecting the degree of charge residue or incomplete discharge.

[0086] Step S3: The host computer fuses the extracted features based on the trained model to calculate a contact health score, and preliminarily judges each channel as normal contact or loose contact based on the score and a preset threshold range. Specifically, this includes:

[0087] For the i-th feature term F i First, normalize the data using the mean and standard deviation calculated from the baseline sample.

[0088] The original discriminant z is obtained by linearly combining the normalized features, and the calculation formula is as follows:

[0089]

[0090] Where n represents the total number of feature terms, The values ​​represent the normalized feature values, b is the bias term, and w is the value of the feature term. i This represents the weight coefficient of the i-th feature term;

[0091] Mapping the linear discriminant to a contact health score (probabilistic output): Using a Sigmoid mapping, z is mapped to a contact health score in the interval (0,1).

[0092]

[0093] Among them, S health For contact health scoring;

[0094] Based on the contact health score and the preset threshold range, each channel is initially judged as either normal contact or loose contact.

[0095] Step S4: The host computer performs differential analysis on the characteristic items of the channel identified as having a loose connection and its adjacent or clustered channels, compares the consistency of the electrical signal characteristics, identifies whether the loose connection is a single channel fault or a systematic offset, and marks and prompts for clamp or grounding checks when it is identified as a systematic offset.

[0096] The host computer performs differential analysis on the characteristic features of the channel identified as having a loose connection and its adjacent or clustered channels, compares the consistency of the electrical signal characteristics, and identifies whether the loose connection is a single channel fault or a systemic offset. Specifically, this includes:

[0097] The host computer provides information on the various characteristics of the virtual connection channel. Mean of corresponding feature terms of its adjacent or clustered channels Perform difference calculations to obtain the difference index Δ i The calculation formula is:

[0098]

[0099] in, This represents the value of the i-th feature term of the channel that is determined to be a loose connection. Δ represents the mean of adjacent or clustered channels of a virtual connection at the i-th feature term; i This represents the normalized difference value of the virtual connection channel on the i-th feature term;

[0100] The host computer defines the comprehensive difference metric D based on the sum of squares of the difference indices of each characteristic item. The calculation formula is as follows:

[0101]

[0102] Where D is the comprehensive difference metric, used to measure the overall deviation of the virtual connection channel from its neighboring channels; n is the total number of feature terms involved in the analysis;

[0103] When the comprehensive differential metric D exceeds the preset single-channel threshold, the channel is determined to be a single-channel fault; when the differential index Δ i When multiple channels exhibit systematic offset, it is determined to be a systematic offset and a prompt is made to perform a fixture or grounding check.

[0104] Step S5: For channels that are still considered loosely connected after differential analysis verification, the host computer automatically triggers a hierarchical confirmation process according to a preset strategy. The confirmation process includes: increasing the number of electrical signal samplings, switching to high-resolution measurement mode, changing the excitation amplitude or frequency, extending the sampling window, and using majority voting or hysteresis mechanism to determine the final judgment.

[0105] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0106] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and these modifications or substitutions should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A contact state detection device for a connector, characterized in that, include: Connector to be tested, male connector, metal touch detection circuit, host computer; The connector to be tested is inserted into the male connector, and the pin to be tested is electrically connected to the metal touch detection circuit; the metal touch detection circuit is used to perform multi-channel sampling of the contact state of each corresponding socket of the male connector and generate an electrical signal corresponding to the contact state of each channel; The host computer is connected to the metal touch detection circuit via a wired interface to receive the electrical signals and determine the contact state of each pin according to preset rules.

2. The contact state detection device for a connector according to claim 1, characterized in that, The metal touch detection circuit includes a transistor, a first operational amplifier, a second operational amplifier, and a capacitor.

3. The contact state detection device for a connector according to claim 2, characterized in that, The base of the transistor is connected to the socket of the male connector, the collector of the transistor is connected to pin 2 of the first operational amplifier, and the emitter of the transistor is grounded.

4. The contact state detection device for a connector according to claim 2, characterized in that, The metal touch detection circuit also includes a second resistor. Pin 2 of the first operational amplifier is connected to a 24V power supply. Pin 3 of the first operational amplifier is connected to the 24V power supply and pin 5 of the second operational amplifier. Pin 3 of the first operational amplifier is also grounded through the second resistor. Pin 1 of the first operational amplifier is connected to pin 6 of the second operational amplifier, the positive terminal of the capacitor, and the input terminal of the host computer. Pin 8 of the first operational amplifier is connected to a 24V power supply. Pin 4 of the first operational amplifier is grounded.

5. A contact state detection device for a connector according to claim 2, characterized in that, The metal touch detection circuit also includes a second diode, and pin 7 of the second operational amplifier is connected to the negative terminal of the second diode.

6. The contact state detection device for a connector according to claim 2, characterized in that, The positive terminal of the capacitor is connected to pin 1 of the first operational amplifier and the input terminal of the host computer, respectively, and the negative terminal of the capacitor is grounded.

7. The contact state detection device for a connector according to claim 1, characterized in that, The host computer is used to execute the following processes: For each channel under test of the male connector, the host computer controls the metal touch detection circuit or external excitation source to implement at least two different modes of excitation according to a predetermined scanning time slot and receives the corresponding electrical signals. The excitation modes include, but are not limited to: natural touch trigger recording, controlled short pulse or step excitation, and optional multi-frequency AC excitation. The host computer extracts several feature items for judgment from the received electrical signal. The feature items include peak amplitude, rise time, charge / discharge time constant, decay wake energy, and residual potential. The host computer fuses the extracted features based on the training model to calculate the contact health score, and preliminarily judges each channel as normal contact or loose contact based on the score and the preset threshold range. The host computer will perform differential analysis on the characteristic items of the channel identified as having a loose connection and its adjacent or clustered channels, compare the consistency of the electrical signal characteristics, identify whether the loose connection is a single channel fault or a systematic offset, and mark it when it is identified as a systematic offset and prompt for clamp or grounding check. For channels that are still found to be loosely connected after differential analysis verification, the host computer automatically triggers a hierarchical confirmation process according to a preset strategy. The confirmation process includes: increasing the number of electrical signal samplings, switching to a high-resolution measurement mode, changing the excitation amplitude or frequency, extending the sampling window, and using a majority voting or hysteresis mechanism to determine the final judgment.

8. A detection method for a contact state detection device for a connector based on any one of claims 1 to 7, characterized in that, Includes the following steps: After the connector to be tested is inserted into the male connector, the host computer controls the metal touch detection circuit or external excitation source to implement at least two different modes of excitation according to a predetermined scanning time slot and receives the corresponding electrical signals. The excitation modes include, but are not limited to: natural touch trigger recording, controlled short pulse or step excitation and optional multi-frequency AC excitation. The host computer extracts several feature items for judgment from the received electrical signal; The host computer fuses the extracted features based on the training model to calculate the contact health score, and preliminarily judges each channel as normal contact or loose contact based on the score and the preset threshold range. The host computer will perform differential analysis on the characteristic items of the channel identified as having a loose connection and its adjacent or clustered channels, compare the consistency of the electrical signal characteristics, identify whether the loose connection is a single channel fault or a systematic offset, and mark it when it is identified as a systematic offset and prompt for clamp or grounding check. For channels that are still found to be loosely connected after differential analysis verification, the host computer automatically triggers a hierarchical confirmation process according to a preset strategy. The confirmation process includes: increasing the number of electrical signal samplings, switching to a high-resolution measurement mode, changing the excitation amplitude or frequency, extending the sampling window, and using a majority voting or hysteresis mechanism to determine the final judgment.

9. A method for detecting the contact state of a connector according to claim 8, characterized in that, The characteristics include peak amplitude, rise time, charge / discharge time constant, decay wake energy, and residual potential.

10. A method for detecting the contact state of a connector according to claim 8, characterized in that, The host computer performs differential analysis on the characteristic features of the channel identified as having a loose connection and its adjacent or clustered channels, compares the consistency of the electrical signal characteristics, and identifies whether the loose connection is a single channel fault or a systemic offset. Specifically, this includes: The host computer processes each characteristic item F of the virtual connection channel. i (c) Mean of corresponding feature terms of its adjacent or clustered channels Perform difference calculations to obtain the difference index Δ i The calculation formula is: Among them, F i (c) This represents the value of the i-th feature term of the channel that is determined to be a loose connection. Δ represents the mean of adjacent or clustered channels of a virtual connection at the i-th feature term; i This represents the normalized difference value of the virtual connection channel on the i-th feature term; The host computer defines the comprehensive difference metric D based on the sum of squares of the difference indices of each characteristic item. The calculation formula is as follows: Where D is the comprehensive difference metric, used to measure the overall deviation of the virtual connection channel from its neighboring channels; n is the total number of feature terms involved in the analysis; When the comprehensive differential metric D exceeds the preset single-channel threshold, the channel is determined to be a single-channel fault; when the differential index Δ i When multiple channels exhibit systematic offset, it is determined to be a systematic offset and a prompt is made to perform a fixture or grounding check.

Images