A method and apparatus for monitoring cracking in a building wall

Abstract

The application provides a building wall cracking monitoring method and device, and relates to the technical field of building engineering safety, which comprises the following steps: acquiring crack width values fed back by a plurality of wall crack monitoring devices in real time; receiving building equipment parameters input by a user, and establishing twin building wall model data with crack states according to the plurality of crack width values and the building equipment parameters; generating wall longitudinal crack total height and wall transverse crack total length according to the twin building wall model data, and generating current wall crack data by summarizing; and generating wall crack estimated change data according to the current wall crack data and pre-recorded historical wall crack data. In the application, a single wall crack and a plurality of wall cracks are monitored respectively, so that the health state of the wall can be detected more comprehensively; in addition, in the application, the change of the cracks can be estimated, so that the health state of the wall can be warned.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of construction engineering safety, in particular to a building wall internal cracking monitoring method and device. BACKGROUND

[0002] During the construction of a building wall, due to different setting times of the cast concrete, different parameters of the cast material, and different settlement speeds of the foundation of the multiple house beam supports supporting the wall, there may be a certain amount of cracking or even cracks in the wall after casting or piling up the wall, especially for walls that have been built for a long time.

[0003] For walls that have cracks, by monitoring the changes in the cracks over a long period of time, the health status of the wall can be reflected, for example, after a small crack is generated. If the width of the crack does not change over time, it can be considered that the health status of the wall is good.

[0004] However, monitoring the changes in a single crack in the wall to reflect the health status of the entire wall is limited, and it is also difficult to provide timely warnings and other treatments in response to changes in the wall and cracks. SUMMARY

[0005] In order to provide early warning treatment for the health status of the wall, the present application provides a building wall internal cracking monitoring method and device.

[0006] In a first aspect, the present application provides a building wall internal cracking monitoring method, which adopts the following technical solution:

[0007] A building wall internal cracking monitoring method, the method comprising:

[0008] Real-time acquisition of crack width values fed back by multiple wall crack monitoring devices;

[0009] Receiving user input of building device parameters, and establishing a twin building wall model data with a crack state according to multiple crack width values and the building device parameters;

[0010] Generating a total height of longitudinal cracks in the wall and a total length of transverse cracks in the wall according to the twin building wall model data, and generating current wall crack data by summarizing multiple crack width values, the total height of longitudinal cracks in the wall, and the total length of transverse cracks in the wall;

[0011] Generating wall crack prediction change data according to the current wall crack data and pre-recorded historical wall crack data.

[0012] Optionally, the generating wall crack prediction change data according to the current wall crack data and pre-recorded historical wall crack data comprises:

[0013] Real-time target wall crack monitoring equipment acquires wall temperature values corresponding to multiple signal collection time points;

[0014] According to the multiple crack width values fed back by the target wall crack monitoring equipment and the corresponding multiple wall temperature values recorded in the current wall crack data and the historical wall crack data, multiple basic crack width values excluding the temperature influence are generated;

[0015] According to the multiple basic crack width values, the estimated crack change information corresponding to the target wall crack monitoring equipment is generated;

[0016] According to the estimated crack change information corresponding to the multiple wall crack monitoring equipment, wall crack estimated change data is generated.

[0017] Optionally, the generating, according to the multiple crack width values fed back by the target wall crack monitoring equipment and the corresponding multiple wall temperature values recorded in the current wall crack data and the historical wall crack data, multiple basic crack width values excluding the temperature influence comprises:

[0018] The target wall crack monitoring equipment acquires target wall crack width values at the same wall temperature value within adjacent two days;

[0019] According to the two target wall crack width values corresponding to the same wall temperature value, a crack width increase value is calculated and generated;

[0020] According to the first crack width increase value corresponding to the first wall temperature value and the second crack width increase value corresponding to the second wall temperature value, crack width influence data corresponding to multiple wall temperature values is calculated and generated;

[0021] According to the crack width influence data and the multiple crack width values fed back by the target wall crack monitoring equipment, multiple basic crack width values excluding the temperature influence are generated.

[0022] Optionally, the generating, according to the multiple basic crack width values, the estimated crack change information corresponding to the target wall crack monitoring equipment comprises:

[0023] According to a preset sampling period, multiple sampling basic crack width values corresponding to target time points within the sampling period are screened out from the multiple basic crack width values;

[0024] According to the multiple sampling basic crack width values, multiple crack growth values corresponding between adjacent sampling periods are calculated and generated;

[0025] According to the plurality of crack growth values, a plurality of growth value growth numbers corresponding to adjacent crack growth values are calculated, and a growth coefficient corresponding to two adjacent growth value growth numbers is calculated;

[0026] According to the plurality of growth value growth numbers, the plurality of crack growth values, and the plurality of growth coefficients, estimated crack change information corresponding to the target wall crack monitoring device within a preset estimation time period is calculated.

[0027] Optionally, the method further comprises:

[0028] According to the preset coefficient derivation quantity, a plurality of target growth coefficients located before the current time are selected from the plurality of growth coefficients;

[0029] According to the mean value of the plurality of target growth coefficients, a plurality of estimated growth coefficients within the estimation time period are gradually calculated;

[0030] According to the plurality of estimated growth coefficients, the plurality of growth value growth numbers, and the plurality of crack growth values, a plurality of estimated growth value growth numbers and a plurality of estimated crack growth values are calculated;

[0031] According to the plurality of estimated crack growth values and the plurality of sampling basic crack width values, estimated crack change information corresponding to the target wall crack monitoring device within a preset estimation time period is generated.

[0032] Optionally, the method further comprises:

[0033] The first crack growth value, the first growth value growth number, and the first growth coefficient generated by the target wall crack monitoring device are compared with the corresponding crack growth threshold value, the growth threshold value, and the change coefficient threshold value, respectively;

[0034] If the first crack growth value is greater than the crack growth threshold value, and / or the first growth value growth number is greater than the crack growth threshold value, and / or the first growth coefficient is greater than the change coefficient threshold value, an abnormal warning instruction is generated;

[0035] After experiencing a preset short-term monitoring time period, the method further comprises:

[0036] If the second crack growth value generated by the target wall crack monitoring device is less than or equal to the crack growth threshold value, and the second growth value growth number is less than or equal to the growth threshold value, and the second growth coefficient is less than or equal to the change coefficient threshold value, a short-term recovery instruction is generated;

[0037] If the second crack growth value is greater than the crack growth threshold value, and / or the second growth value growth number is greater than the growth threshold value, and / or the second growth coefficient is greater than the change coefficient threshold value, a long-term failure instruction is generated.

[0038] Optionally, after the long-term failure instruction, further comprising:

[0039] According to the preset abnormal monitoring period length, periodically acquire abnormal record crack growth value, abnormal record growth value growth number and abnormal record growth coefficient;

[0040] According to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimation duration is generated.

[0041] Optionally, the abnormal estimated crack width change information within the preset abnormal estimation duration is generated according to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients, comprising:

[0042] According to the preset abnormal data reference quantity, a plurality of abnormal record growth coefficients are screened out;

[0043] According to the abnormal estimation duration and the abnormal monitoring period length, the estimated abnormal number and the abnormal coefficient estimation number are calculated;

[0044] According to the plurality of abnormal record growth coefficients, the following steps are executed in a loop until the number of calculated abnormal estimation growth coefficients is the abnormal coefficient estimation number:

[0045] According to the abnormal data reference quantity, a plurality of reference growth coefficients are screened out from the plurality of abnormal record growth coefficients and zero, one or more abnormal estimation growth coefficients;

[0046] According to the plurality of reference growth coefficients, the reference coefficient deviation total amount is calculated;

[0047] According to the reference coefficient deviation total amount and the plurality of reference growth coefficients, the corresponding abnormal estimation growth coefficient is calculated;

[0048] According to the plurality of abnormal estimation growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimation duration is generated.

[0049] Optionally, the formula for calculating the reference coefficient deviation total amount is as follows:

[0050] ;

[0051] The calculation formula for calculating the abnormal estimated growth coefficient is as follows:

[0052] ;

[0053] wherein, is the total amount of reference coefficient deviation, is one of the abnormal estimated growth coefficients, , , ... is a plurality of reference growth coefficients, is the estimated number of abnormalities.

[0054] In a second aspect, the application provides a building wall cracking monitoring device, which adopts the following technical solution:

[0055] A building wall cracking monitoring device, comprising a data twin processing device, which comprises:

[0056] An information acquisition module is configured to acquire crack width values fed back by a plurality of wall crack monitoring devices in real time;

[0057] A twin model establishing module is configured to receive building device parameters input by a user and establish a twin building wall model data with a crack state according to a plurality of crack width values and the building device parameters;

[0058] A data statistical arrangement module is configured to generate a total height of a longitudinal wall crack and a total length of a transverse wall crack according to the twin building wall model data, and to generate current wall crack data by summarizing a plurality of crack width values, the total height of the longitudinal wall crack, and the total length of the transverse wall crack;

[0059] A crack change derivation module is configured to generate wall crack estimated change data according to the current wall crack data and pre-recorded historical wall crack data.

[0060] In summary, the application has at least one of the following beneficial technical effects:

[0061] In the application, a single wall crack and a plurality of wall cracks are monitored respectively, so that the health status of the wall can be detected more comprehensively. In addition, in the application, the change of the crack can be estimated, so that the health status of the wall can be warned. BRIEF DESCRIPTION OF DRAWINGS

[0062] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0063] Figure 1 This is a structural block diagram of a building wall crack monitoring device provided in an embodiment of this application.

[0064] Figure 2 This is a flowchart illustrating a method for monitoring cracks inside building walls provided in an embodiment of this application.

[0065] Figure 3 This is a schematic diagram of a process for generating estimated changes in wall cracks, provided in an embodiment of this application.

[0066] Figure 4 This is a schematic diagram of a process for generating predicted crack change information provided in an embodiment of this application.

[0067] Figure 5 This is a schematic diagram of a process for generating abnormal estimated crack width change information provided in an embodiment of this application. Detailed Implementation

[0068] To make the objectives, technical solutions, and advantages of this invention clearer, the following will be described in conjunction with the appendix. Figures 1-5 The embodiments of the present invention will be described in further detail below.

[0069] This application provides a method for monitoring cracks inside building walls. This method can be applied to a crack monitoring device for building walls, and the frame structure of the crack monitoring device can be as follows: Figure 1 As shown, the wall crack monitoring device can consist of a data twin processing device, multiple gateways, and multiple wall crack monitoring devices. The wall crack monitoring devices employ fiber optic crack detection sensors. The main implementer of this method can be the data twin processing device within the wall crack monitoring device, assisted by multiple gateways and multiple wall crack monitoring devices. Multiple wall crack detection sensors feed back the detected crack width values ​​to the corresponding gateways, which then transmit the data to the data twin processing device via the internet.

[0070] This application uses the monitoring of multiple cracks in a building wall as an example for illustration. The monitoring and treatment of cracks in other situations, such as the support wall of a foundation pit, the slope protection of a water conservancy project, and bridges, are similar and will not be described in detail here.

[0071] The following will describe the specific implementation methods. Figure 2The processing flow shown is described in detail, and the content can be as follows:

[0072] Step S101, real-time acquisition of multiple wall crack monitoring equipment feedback crack width value.

[0073] In implementation, the data twin processing device acquires the crack width values fed back by the multiple wall crack monitoring devices through the gateway.

[0074] Step S102, receiving user input building equipment parameters, and establishing a twin building wall model data with crack state according to multiple crack width values and building equipment parameters.

[0075] In implementation, the data twin processing device receives the user input building equipment parameters, so that the data twin processing device constructs the three-dimensional model of the wall. Further, the data twin processing device receives multiple crack width values and the positions of the crack width values on the wall, so as to construct the twin building wall model data carrying the cracks.

[0076] Step S103, generating the total height of the longitudinal cracks of the wall and the total length of the transverse cracks of the wall according to the twin building wall model data, and summarizing multiple crack width values, the total height of the longitudinal cracks of the wall and the total length of the transverse cracks of the wall to generate current wall crack data.

[0077] In implementation, the data twin processing device superimposes the crack widths of all cracks in the wall in the longitudinal direction in the twin building wall model data to calculate and generate the total height of the longitudinal cracks. At the same time, the data twin processing device superimposes the crack widths of all cracks in the wall in the transverse direction in the twin building wall model data to calculate and generate the total length of the transverse cracks.

[0078] The data twin processing device summarizes multiple crack width values, the total height of the longitudinal cracks of the wall and the total length of the transverse cracks of the wall to generate current wall crack data.

[0079] Step S104, generating wall crack prediction change data according to current wall crack data and pre-recorded historical wall crack data.

[0080] In implementation, the data twin processing device estimates the change of the crack width value of each wall crack monitoring device based on the crack width value fed back by the wall crack monitoring device.

[0081] At the same time, the change trend of the total height of the longitudinal cracks of the wall is estimated based on the historical values of the total height of the longitudinal cracks of the wall, and the change trend of the total length of the transverse cracks of the wall is estimated based on the historical values of the total length of the transverse cracks of the wall.

[0082] In addition, a single crack width threshold value, a wall longitudinal crack total height threshold value and a wall transverse crack total length threshold value are preset in the data twin processing device. When the estimated value is greater than the corresponding threshold value, a wall safety warning information is generated.

[0083] In the present application, the health status of the wall is detected more comprehensively by monitoring a single wall crack and multiple wall cracks respectively. In addition, in the present application, the health status of the wall can be warned by estimating the crack change.

[0084] Optionally, in step S104, there is also a process as shown in Figure 3 The specific operation process is as follows:

[0085] In step S201, the wall temperature values corresponding to the multiple signal collection time points of the target wall crack monitoring device are acquired in real time.

[0086] In the implementation, the multiple crack width values fed back by one of the wall crack monitoring devices are taken as an example, which is referred to as a target wall crack monitoring device.

[0087] The data twin processing device acquires the wall temperature values corresponding to the multiple crack width values collected by the wall crack monitoring device in real time.

[0088] In step S202, the multiple crack width values fed back by the target wall crack monitoring device and the corresponding multiple wall temperature values recorded in the current wall crack data and the historical wall crack data are used to generate the corresponding multiple basic crack width values excluding the temperature influence.

[0089] In the implementation, a standard reference temperature value, for example, 20°C, is preset in the data twin processing device.

[0090] Since the wall crack changes little within a day, it can be considered that the change of the wall crack width within a day is mainly caused by the temperature difference. Therefore, by comparing the crack width values at other wall temperature values with the crack width value at 20°C within the same day, the values are recorded as temperature influence change values.

[0091] Specifically, the corresponding crack width value at 20°C is subtracted from the corresponding crack width value at other wall temperature values, and the calculated difference is taken as the temperature influence change value corresponding to the wall temperature value.

[0092] Then, the multiple crack width values corresponding to different wall temperature values are subtracted by the corresponding temperature influence change values to calculate the basic crack width values.

[0093] In step S203, the estimated crack change information corresponding to the target wall crack monitoring device is generated according to the multiple basic crack width values.

[0094] In implementation, the data twin processing device derives the crack change of the crack corresponding to the target wall crack monitoring device according to the basic crack width value corresponding to the target wall crack monitoring device, which is referred to as estimated crack change information here.

[0095] Step S204, generating wall crack estimated change data according to the estimated crack change information corresponding to the plurality of wall crack monitoring devices.

[0096] In implementation, the data twin processing device aggregates and superimposes the estimated crack change information corresponding to the plurality of wall crack monitoring devices to generate estimated wall longitudinal crack change information and estimated wall transverse crack change information, and aggregates the wall crack estimated change data from the estimated wall longitudinal crack change information, the estimated wall transverse crack change information and the plurality of estimated crack change information.

[0097] Here, the data twin processing device further includes a single crack width threshold, a wall longitudinal crack total height threshold and a wall transverse crack total length threshold, and compares the plurality of estimated crack change information, the estimated wall longitudinal crack change information and the estimated wall transverse crack change information with the single crack width threshold, the wall longitudinal crack total height threshold and the wall transverse crack total length threshold respectively, so as to give a warning for the health status of the wall.

[0098] Optionally, in step S202, the following processing steps exist, and the specific operation process is as follows:

[0099] Obtaining the target wall crack monitoring device, the target wall crack width value at the same wall temperature value within two adjacent days.

[0100] In implementation, the data twin processing device is preconfigured with a standard reference temperature value, for example, 20℃.

[0101] The data twin processing device obtains the wall crack width value of the target wall crack monitoring device at the same wall temperature value within two adjacent days, which is referred to as the target wall crack width value here, for example, the target wall crack width value corresponding to 20℃ within two adjacent days and the target wall crack width value corresponding to 10℃ within two adjacent days.

[0102] According to the two target wall crack width values corresponding to the same wall temperature value, the crack width increase value is calculated and generated.

[0103] In implementation, any two wall temperature values are taken as examples. The data twin processing device subtracts the two target wall crack width values corresponding to 20℃ to calculate the crack width increase value corresponding to 20℃ within one day.

[0104] In addition, the data twin processing device subtracts the two target wall crack width values corresponding to 10°C to calculate the crack width increase value corresponding to 20°C within a day.

[0105] It should be noted that the corresponding same wall temperature value within two adjacent days can be two or more. In order to reduce the crack width increase that can be generated between different time differences, two target wall crack width values are selected, and the two target wall crack width values are selected because the time points within a day are closest to each other. For example, the wall temperature values at 10 o'clock and 2 o'clock in a day are both 10°C, and the wall temperature values at 11 o'clock and 1 o'clock in another day are both 10°C. The target crack width increase values collected at 10 o'clock in a day and 11 o'clock in another day are established in a corresponding relationship, and the target crack width increase values collected at 1 o'clock in a day and 2 o'clock in another day are established in a corresponding relationship. Then, the average of the two groups is taken as the crack width increase value corresponding to 10°C.

[0106] According to the first crack width increase value corresponding to the first wall temperature value and the second crack width increase value corresponding to the second wall temperature value, the crack width influence data corresponding to the wall temperature values is calculated.

[0107] In implementation, the data twin processing device takes two wall temperature values as an example for illustration, for example, 20°C and 10°C as described above, which are referred to as the first wall temperature value and the second wall temperature value, respectively. The crack width increase value corresponding to the first wall temperature value is referred to as the first crack width increase value, and the crack width increase value corresponding to the second wall temperature value is referred to as the second crack width increase value.

[0108] Then, the first crack width increase value is subtracted from the second crack width increase value to calculate the temperature influence crack width change value corresponding to the first wall temperature value relative to the first wall temperature value. Therefore, the temperature influence crack width change value of each wall temperature value relative to the standard wall temperature value is calculated in a recursive manner, and the crack width influence data is generated.

[0109] According to the crack width influence data and the multiple crack width values fed back by the target wall crack monitoring device, multiple basic crack width values corresponding to the temperature influence are generated.

[0110] In implementation, the data twin processing device subtracts the temperature influence crack width change value corresponding to the wall temperature in the crack width influence data from the multiple crack width values fed back by the target wall crack monitoring device to calculate the multiple basic crack width values corresponding to the target wall crack monitoring device.

[0111] In the above manner, the changes caused by non-temperature changes of the wall crack within a day are removed as much as possible, and the influence on the calculation of the basic crack width value is removed.

[0112] Specifically, in step S203, there is a step as shown in Figure 4 The operation flow is as follows:

[0113] Step S301, according to the preset sampling period, in the plurality of basic crack width values, the sampling period is filtered out under the target time corresponding to the plurality of sampling basic crack width values.

[0114] In implementation, the data twin processing device performs periodic monitoring cycle with preset sampling period, and in a sampling period, only one basic crack width value is filtered out, which can be called sampling basic crack width value here. The sampling basic crack width value here corresponds to the same target time in a sampling period, for example, the sampling period is 1 week from Monday to Sunday, and the plurality of sampling basic crack width values all correspond to the basic crack width value collected at 12 o'clock on Thursday.

[0115] Step S302, according to the plurality of sampling basic crack width values, a plurality of corresponding crack growth values between adjacent sampling periods are calculated and generated.

[0116] In implementation, the data twin processing device calculates the difference value between the two adjacent sampling basic crack width values in two adjacent sampling periods, which can be called crack growth value.

[0117] Here, the plurality of sampling basic crack width values can be denoted as a1, a2, a3,..., an, and the corresponding crack growth values can be denoted as b1, b2, b3,..., bn. n , where b1=a2-a1, b2=a3-a2,..., bn=an-an-1. n-1 n-1 n n-1

[0118] Step S303, according to the plurality of crack growth values, a plurality of corresponding growth value growth numbers between adjacent crack growth values are calculated and generated, and the growth coefficient corresponding to the two adjacent growth value growth numbers is calculated and generated.

[0119] In implementation, the data twin processing device calculates the growth value growth number corresponding to the two crack growth values.

[0120] Here, the plurality of growth value growth numbers can be denoted as c1, c2, c3,..., cn, where c1=b2-b1, c2=b3-b2,..., cn=bn-bn-1. n-2 n-1 n-1 n-2

[0121] ​​​​​​​​Meanwhile, the growth coefficients corresponding to the two adjacent growth value growth numbers are calculated.

[0122] Here, the multiple growth value growth numbers can be denoted as k1, k2, k3, …, k n-3 , where k1 = c2 / c1, k2 = c3 / c2, …, k n-3 = c n-2 / c n-3 . It should be noted that when the growth value growth number is 0, it is impossible to be the divisor, and the corresponding k is recorded as 0.

[0123] In step S304, the estimated crack change information corresponding to the target wall crack monitoring device within the preset estimation time is calculated according to the multiple growth coefficients, the multiple growth value growth numbers, and the multiple crack growth values.

[0124] In implementation, the data twin processing device derives the estimated growth coefficient within the estimation time through the mean of the multiple growth coefficients, and reversely calculates the multiple estimated growth value growth values and the multiple estimated crack growth values by using the estimated growth coefficient, so as to gradually calculate the estimated crack change information corresponding to the target wall crack monitoring data within the preset estimation time by using the multiple estimated crack growth values.

[0125] In the present application, the crack width change value is used to reflect the actual change of the crack width in each adoption period; the growth value growth number is used to reflect the change rate of the crack width; and the growth coefficient is used to reflect the trend of the change rate of the crack width, such as the trend of gradually stabilizing or the trend of gradually deteriorating. In the process of gradually changing the width of the wall crack, for example, when the width of the wall crack is changed by the foundation settlement, since the preliminary deep soil of the foundation is relatively soft, the settlement rate of the foundation is fast, and the deep soil of the foundation is compacted in the later period, the settlement rate gradually becomes flat, and thus the growth coefficient can effectively reflect the change of the wall crack.

[0126] Specifically, in step S304, the following processing steps exist:

[0127] According to the preset coefficient derivation number, multiple target growth coefficients located before the time are screened from the multiple growth coefficients.

[0128] In implementation, the data twin processing device is preset with a coefficient derivation number, so as to screen the growth coefficients located before the current time within the coefficient derivation number, and then calculate the multiple estimated growth coefficients within the subsequent estimation time by using the screened multiple growth coefficients. Here, the screened multiple growth coefficients are referred to as target growth coefficients.

[0129] According to the mean value of the plurality of target growth coefficients, a plurality of estimated growth coefficients in the estimated duration are gradually calculated.

[0130] In implementation, the data twin processing device solves the first estimated growth coefficient after the current time through the mean value of the plurality of target growth coefficients.

[0131] Then, the farthest target growth coefficient from the current time is removed from the target growth coefficients according to the estimated growth coefficient, and the second estimated growth coefficient is calculated by taking the mean value of the plurality of target growth coefficients and the first estimated growth coefficient.

[0132] In this way, a plurality of estimated growth coefficients in the estimated duration are gradually calculated.

[0133] According to the plurality of estimated growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values, a plurality of estimated growth value growth numbers and a plurality of estimated crack growth values are calculated.

[0134] In implementation, the data twin processing device reversely calculates the plurality of crack growth values according to the plurality of estimated growth coefficients. It should be noted that if the plurality of estimated growth coefficients are all 0, only the crack growth value closest to the current time before the current time is used to generate a plurality of estimated crack growth values with the same value.

[0135] According to the plurality of estimated crack growth values and the plurality of sampling basic crack width values, the estimated crack change information corresponding to the target wall crack monitoring device in the preset estimated duration is generated.

[0136] In implementation, the data twin processing device gradually calculates the estimated crack width value corresponding to the target wall crack monitoring device in the estimated duration by using the sampling basic crack width value closest to the current time among the plurality of estimated crack growth values, and generates the estimated crack change information.

[0137] Optionally, in the present application, the following steps are also included, and the specific processing procedure is as follows:

[0138] The first crack growth value, the first growth value growth number and the first growth coefficient generated by the target wall crack monitoring device are compared with the corresponding crack growth threshold value, growth threshold value and change coefficient threshold value respectively.

[0139] If the first crack growth value is greater than the crack growth threshold value, and / or the first growth value growth number is greater than the crack growth threshold value, and / or the first growth coefficient is greater than the change coefficient threshold value, an abnormal warning instruction is generated.

[0140] In implementation, the data twin processing device compares the crack growth value, the growth value growth number and the growth coefficient closest to the current time, which are respectively referred to as the first crack growth value, the first growth value growth number and the first growth coefficient.

[0141] The data twin processing device compares the first crack growth value, the first growth value growth number and the first growth coefficient with the corresponding crack growth threshold, growth threshold and change coefficient threshold respectively. If one of the following conditions occurs, an abnormal warning instruction is generated.

[0142] Condition one: the first crack growth value is greater than the crack growth threshold;

[0143] Condition two: the first growth value growth number is greater than the crack growth threshold;

[0144] Condition three: the first growth coefficient is greater than the change coefficient threshold.

[0145] Through the abnormal warning instruction, it is indicated that the change state of the crack width is in an abnormal change condition, which needs to be paid attention to by safety personnel.

[0146] After experiencing a preset short-term monitoring duration, it also includes:

[0147] If the second crack growth value currently generated by the target wall crack monitoring device is less than or equal to the crack growth threshold, and the second growth value growth number is less than or equal to the growth threshold, and the second growth coefficient is less than or equal to the change coefficient threshold, a short-term recovery instruction is generated;

[0148] If the second crack growth value currently generated is greater than the crack growth threshold, and / or the second growth value growth number is greater than the growth threshold, and / or the second growth coefficient is greater than the change coefficient threshold, a long-term failure instruction is generated.

[0149] In implementation, the data twin processing device generates an abnormal warning instruction, and after experiencing a short-term monitoring duration, the data twin processing device compares the crack growth value, the growth value growth number and the growth coefficient closest to the current time again, which are respectively referred to as the second crack growth value, the second growth value growth number and the second growth coefficient.

[0150] The data twin processing device compares the second crack growth value, the second growth value growth number and the second growth coefficient with the corresponding crack growth threshold, growth threshold and change coefficient threshold respectively, and there are the following two conditions:

[0151] Case one: the second crack growth value is less than or equal to the crack growth threshold value, and the second growth value growth number is less than or equal to the growth threshold value, and the second growth coefficient is less than or equal to the change coefficient threshold value, a short-term recovery instruction is generated, indicating that although the wall crack width has an abnormal change, for example, the crack edge building material falls off, the wall crack monitoring device is currently blocked, but it will be restored to normal in a short time, so no further attention is needed.

[0152] Case two: the second crack growth value is greater than the crack growth threshold value, and / or the second growth value growth number is greater than the growth threshold value, and / or the second growth coefficient is greater than the change coefficient threshold value, a long-term failure instruction is generated, indicating that the wall crack width has an abnormal change and has not been restored, so further attention is needed.

[0153] Optionally, after the data twin processing device generates the long-term failure instruction, the following processing steps are further included, and the specific operation process is as follows:

[0154] According to the preset abnormal monitoring period length, the abnormal record crack growth value, the abnormal record growth value growth number and the abnormal record growth coefficient are periodically obtained;

[0155] According to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimated period is generated.

[0156] In implementation, in order to further strengthen the monitoring of the wall crack, the data twin processing device re-estimates the crack width change condition with the preset abnormal monitoring period length.

[0157] The abnormal monitoring period length here is less than the length of the sampling period, for example, the length of the sampling period is 1 week, and the abnormal monitoring period length can be 1 day or several hours, so as to strengthen the monitoring of the wall crack with the long-term failure instruction.

[0158] The data twin processing device periodically obtains the crack growth value, the growth value growth number and the growth coefficient with the abnormal monitoring period length, and they are called the abnormal record crack growth value, the abnormal record growth value growth number and the abnormal record growth coefficient here, and the acquisition method here is as shown in steps S301 to S303, which will not be described in detail.

[0159] Then, the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients are used to calculate the abnormal estimated crack width change information within the abnormal estimated period.

[0160] Specifically, the processing steps for calculating the abnormal estimated crack width change information are as follows: Figure 5As shown, the operation flow is as follows

[0161] In step S401, according to the preset abnormal data reference quantity, a plurality of abnormal record growth coefficients are screened out.

[0162] In implementation, the data twin processing device is preset with abnormal data reference data.

[0163] Before generating the abnormal estimated crack width change information, the data twin processing device screens out a plurality of abnormal record growth coefficients closest to the current time before the current time according to the abnormal data reference quantity, and the number of screened out is the abnormal data reference quantity.

[0164] In step S402, the abnormal estimated quantity is calculated according to the abnormal estimated duration and the abnormal monitoring period duration.

[0165] In implementation, the data twin processing device divides the abnormal estimated duration by the abnormal monitoring period duration to calculate the crack growth value quantity that needs to be estimated, which is referred to as the estimated abnormal quantity here. Then, the estimated abnormal quantity is reduced by 3 to generate the abnormal coefficient estimation quantity.

[0166] Here, since the abnormal monitoring period duration is much smaller than the abnormal estimated duration, the estimated abnormal quantity is usually greater than 3, so the case where the estimated abnormal quantity is less than or equal to 3 is not considered too much.

[0167] According to the plurality of abnormal record growth coefficients, the following steps are executed in a loop until the number of calculated abnormal estimated growth coefficients is equal to the abnormal coefficient estimation quantity:

[0168] In implementation, the data twin processing device performs loop processing on the estimation of the growth coefficient with the plurality of abnormal record growth coefficients, and the estimated value of the growth coefficient is referred to as the abnormal estimated growth coefficient. Until the number of abnormal estimated growth coefficients is equal to the abnormal coefficient estimation quantity, the loop is exited.

[0169] In step S403, according to the abnormal data reference quantity, a plurality of reference growth coefficients are screened out from the plurality of abnormal record growth coefficients and zero, one or more abnormal estimated growth coefficients.

[0170] In implementation, when entering the loop for the first time, the abnormal estimated growth coefficient is zero, and the data twin processing device takes the abnormal record growth coefficient closest to the current time and located before the current time as the reference when calculating the first abnormal estimated growth coefficient, which is referred to as reference growth data. Here, the number of reference growth data is the abnormal data reference quantity.

[0171] In the second entering cycle, the abnormal estimated growth coefficient is one, and the data twin processing device takes the abnormal record growth coefficient closest to the current time and located before the current time as a reference when calculating the second abnormal estimated growth coefficient, and combines the first abnormal estimated growth coefficient calculated to be referred to as reference growth data, and the number of reference growth data is the abnormal data reference number.

[0172] In this way, the reference growth coefficients are updated in a way of elimination from the end.

[0173] Step S404, according to the plurality of reference growth coefficients, the reference coefficient deviation total amount is calculated and generated.

[0174] In implementation, the formula for calculating the reference coefficient deviation total amount is as follows:

[0175] ;

[0176] The reference coefficient deviation total amount is 、 、 ...... The plurality of reference growth coefficients are The estimated abnormal number is included.

[0177] Step S405, according to the reference coefficient deviation total amount and the plurality of reference growth coefficients, the corresponding abnormal estimated growth coefficient is calculated and generated.

[0178] In implementation, the calculation formula for calculating the abnormal estimated growth coefficient is as follows:

[0179] ;

[0180] The abnormal estimated growth coefficient is one of the abnormal estimated growth coefficients.

[0181] Step S406, according to the plurality of abnormal estimated growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimated time length is generated.

[0182] In implementation, after the loop processing of steps S503 to S504 is completed, the plurality of abnormal estimated growth value growth numbers and the plurality of abnormal estimated crack growth values are inversely calculated through the plurality of abnormal estimated growth coefficients, so as to facilitate the calculation of the abnormal estimated crack width change information within the preset abnormal estimated time length.

[0183] In this application, the predicted estimation of the abnormal estimated growth coefficient is readjusted in the way of changing the sampling weight, and the accuracy of the estimation of the abnormal estimated growth coefficient is increased.

[0184] The embodiment of the application further discloses a building wall cracking monitoring device, comprising a data twin processing device, the data twin processing device comprises:

[0185] An information acquisition module is configured to acquire crack width values fed back by the plurality of wall crack monitoring devices in real time.

[0186] A twin model establishing module is configured to receive building device parameters input by a user, and establish a twin building wall model data with a crack state according to the plurality of crack width values and the building device parameters.

[0187] A data statistical arrangement module is configured to generate a total height of a longitudinal wall crack and a total length of a transverse wall crack according to the twin building wall model data, and generate current wall crack data by summarizing the plurality of crack width values, the total height of the longitudinal wall crack and the total length of the transverse wall crack.

[0188] A crack change derivation module is configured to generate wall crack estimated change data according to the current wall crack data and historical wall crack data recorded in advance.

[0189] Optionally, the data twin processing device is specifically configured to:

[0190] An information acquisition module is configured to acquire wall temperature values corresponding to the target wall crack monitoring device at a plurality of signal acquisition moments in real time.

[0191] A temperature influence excluding module is configured to generate a plurality of basic crack width values corresponding to the target wall crack monitoring device under the exclusion of temperature influence according to the plurality of crack width values fed back by the target wall crack monitoring device and the plurality of wall temperature values corresponding to the historical wall crack data.

[0192] A crack change derivation module is configured to generate estimated crack change information corresponding to the target wall crack monitoring device according to the plurality of basic crack width values.

[0193] The crack change derivation module is configured to generate wall crack estimated change data according to the estimated crack change information corresponding to the plurality of wall crack monitoring devices.

[0194] Optionally, the data twin processing device is specifically configured to:

[0195] An information acquisition module is configured to acquire target wall crack width values of the target wall crack monitoring device at a same wall temperature value within adjacent two days.

[0196] A temperature influence excluding module is configured to calculate and generate a crack width change value according to the two target wall crack width values corresponding to the same wall temperature value.

[0197] A temperature influence elimination module is configured to calculate, according to a first crack width increment corresponding to a first wall temperature value and a second crack width increment corresponding to a second wall temperature value, crack width influence data corresponding to a plurality of wall temperature values;

[0198] A temperature influence elimination module is configured to generate, according to the crack width influence data and a plurality of crack width values fed back by the target wall crack monitoring device, a plurality of base crack width values corresponding to the target wall crack monitoring device under the influence of temperature.

[0199] Optionally, the data twin processing device is specifically configured to:

[0200] A data screening module is configured to screen, according to a preset sampling period, a plurality of sampling base crack width values corresponding to a target time within the sampling period from the plurality of base crack width values;

[0201] A crack change value arrangement and calculation module is configured to calculate, according to the plurality of sampling base crack width values, a plurality of crack growth values corresponding to adjacent sampling periods;

[0202] The crack change value arrangement and calculation module is configured to calculate, according to the plurality of crack growth values, a plurality of growth value growth numbers corresponding to adjacent crack growth values and a growth coefficient corresponding to two adjacent growth value growth numbers.

[0203] A crack change derivation module is configured to calculate, according to the plurality of growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values, estimated crack change information corresponding to the target wall crack monitoring device within a preset estimation time length.

[0204] Optionally, the data twin processing device is specifically configured to:

[0205] A data screening module is configured to screen, according to a preset coefficient derivation number, a plurality of target growth coefficients located before a current time from the plurality of growth coefficients;

[0206] A crack change derivation module is configured to calculate, according to a mean value of the plurality of target growth coefficients, a plurality of estimated growth coefficients within the estimation time length.

[0207] The crack change derivation module is configured to calculate, according to the plurality of estimated growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values, a plurality of estimated growth value growth numbers and a plurality of estimated crack growth values.

[0208] The crack change derivation module is configured to generate, according to the plurality of estimated crack growth values and the plurality of sampling base crack width values, estimated crack change information corresponding to the target wall crack monitoring device within the preset estimation time length.

[0209] Optionally, the data twin processing device can also be configured to:

[0210] a crack data comparison module, configured to compare the first crack growth value, the first growth value growth number and the first growth coefficient generated by the target wall crack monitoring device currently with the corresponding crack growth threshold value, growth threshold value and change coefficient threshold value respectively;

[0211] if the first crack growth value is greater than the crack growth threshold value, and / or the first growth value growth number is greater than the crack growth threshold value, and / or the first growth coefficient is greater than the change coefficient threshold value, an abnormal warning instruction is generated;

[0212] after experiencing a preset short-term monitoring duration, further comprising:

[0213] if the second crack growth value generated by the target wall crack monitoring device currently is less than or equal to the crack growth threshold value, and the second growth value growth number is less than or equal to the growth threshold value, and the second growth coefficient is less than or equal to the change coefficient threshold value, a short-term recovery instruction is generated;

[0214] if the second crack growth value is greater than the crack growth threshold value, and / or the second growth value growth number is greater than the growth threshold value, and / or the second growth coefficient is greater than the change coefficient threshold value, a long-term failure instruction is generated.

[0215] Optionally, the data twin processing device can be further configured to:

[0216] an information acquisition module, configured to periodically acquire abnormal record crack growth values, abnormal record growth value growth numbers and abnormal record growth coefficients according to a preset abnormal monitoring period duration;

[0217] a crack change derivation module, configured to generate abnormal estimated crack width change information within a preset abnormal estimation duration according to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients.

[0218] Optionally, the data twin processing device can be specifically configured to:

[0219] a data screening module, configured to screen a plurality of abnormal record growth coefficients according to a preset abnormal data reference number;

[0220] a crack change numerical arrangement calculation module, configured to calculate an estimated abnormal number and an abnormal coefficient estimated number according to the abnormal estimation duration and the abnormal monitoring period duration;

[0221] according to the plurality of abnormal record growth coefficients, the following steps are executed in a loop until the number of abnormal estimated growth coefficients calculated is the abnormal coefficient estimated number:

[0222] The data screening module is configured to screen a plurality of reference growth factors from a plurality of abnormal record growth factors and zero, one or more abnormal estimated growth factors according to a reference number of abnormal data.

[0223] The crack change numerical arrangement calculation module is configured to calculate a reference factor deviation total amount according to the plurality of reference growth factors.

[0224] The crack change derivation module is configured to calculate corresponding abnormal estimated growth factors according to the reference factor deviation total amount and the plurality of reference growth factors.

[0225] The crack change derivation module is configured to generate abnormal estimated crack width change information within a preset abnormal estimated time length according to the plurality of abnormal estimated growth factors.

[0226] Optionally, the data twin processing device is specifically configured to:

[0227] The formula for calculating the reference factor deviation total amount is as follows:

[0228]

[0229] The formula for calculating the abnormal estimated growth factor is as follows:

[0230]

[0231] wherein, the reference factor deviation total amount is, one of the abnormal estimated growth factors is, , , ... the plurality of reference growth factors are, and the estimated abnormal number is.

[0232] The data twin processing device provided in the embodiments of the present application can have great differences due to different configurations or performances, and can include one or more central processing units (for example, one or more processors) and memories, one or more storage media (for example, one or more mass storage devices) for storing application programs or data. The memories and the storage media can be temporary storage or persistent storage. The programs stored in the storage medium can include one or more modules (not shown in the figure), and each module can include a series of instruction operations on the data twin processing device.

[0233] ​​The data twin processing device can further include one or more power supplies, one or more wired or wireless network interfaces, one or more input / output interfaces, one or more keyboards, and / or one or more operating systems.

[0234] The data twin processing device can include a memory, and one or more programs stored in the memory and configured to be executed by the one or more processors to perform the processing of the data twin processing device in the above-mentioned method for monitoring cracking in a building wall.

[0235] It can be understood by those skilled in the art that all or part of the steps of the above-mentioned embodiments can be completed by hardware, or by programs instructing related hardware, and the programs can be stored in a computer readable storage medium, such as a read-only memory.

[0236] The above are all preferred embodiments of the present application, and are not intended to limit the protection scope of the present application, therefore: any equivalent changes made according to the structure, shape, principle of the present application should be covered within the protection scope of the present application.

[0237] Although the present application is disclosed as above, the protection scope of the present application is not limited to this. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present application, and these changes and modifications shall fall within the protection scope of the present application.

Claims

1. A method of monitoring cracking in a building wall, characterized by, The method comprises: Real-time acquisition of crack width values fed back by a plurality of wall crack monitoring devices; Receiving user input building equipment parameters, and establishing twin building wall model data with crack states according to a plurality of crack width values and the building equipment parameters; According to the twin building wall model data, the total height of the longitudinal wall cracks and the total length of the transverse wall cracks are generated, and the plurality of crack width values, the total height of the longitudinal wall cracks and the total length of the transverse wall cracks are summarized to generate current wall crack data; According to the current wall crack data and the pre-recorded historical wall crack data, wall crack prediction change data is generated; According to the current wall crack data and the pre-recorded historical wall crack data, wall crack prediction change data is generated, which comprises: Real-time acquisition of wall temperature values corresponding to the target wall crack monitoring device at a plurality of signal collection time points; According to the current wall crack data and the historical wall crack data, a plurality of crack width values fed back by the target wall crack monitoring device and a plurality of corresponding wall temperature values are recorded, and a plurality of basic crack width values corresponding to the temperature influence are generated; According to a plurality of basic crack width values, the target wall crack monitoring device corresponding to the estimated crack change information is generated; According to a plurality of wall crack monitoring device corresponding to the estimated crack change information, wall crack prediction change data is generated; According to the current wall crack data and the pre-recorded historical wall crack data, wall crack prediction change data is generated, which comprises: Acquisition of target wall crack width values of the target wall crack monitoring device at the same wall temperature value within two adjacent days; According to two target wall crack width values corresponding to the same wall temperature value, a crack width increase value is calculated and generated; According to the first crack width increase value corresponding to the first wall temperature value and the second crack width increase value corresponding to the second wall temperature value, crack width influence data corresponding to a plurality of wall temperature values is calculated and generated; According to the crack width influence data and the plurality of crack width values fed back by the target wall crack monitoring device, a plurality of basic crack width values corresponding to the temperature influence are generated; According to a plurality of basic crack width values, the target wall crack monitoring device corresponding to the estimated crack change information is generated, which comprises: According to a preset sampling period, a plurality of sampling basic crack width values corresponding to the target time within the sampling period are selected from a plurality of basic crack width values; According to a plurality of sampling basic crack width values, a plurality of crack growth values corresponding to adjacent sampling periods are calculated and generated; According to a plurality of crack growth values, a plurality of growth value growth numbers corresponding to adjacent crack growth values are calculated and generated, and a growth coefficient corresponding to two adjacent growth value growth numbers is calculated and generated; According to the plurality of growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values, the estimated crack change information corresponding to the target wall crack monitoring device within the preset estimated time length is calculated and generated; The method further comprises: The first crack growth value, the first growth value growth number and the first growth coefficient generated by the target wall crack monitoring device are compared with the corresponding crack growth threshold value, the growth threshold value and the change coefficient threshold value respectively; If the first crack growth value is greater than the crack growth threshold value, and / or the first growth value growth number is greater than the crack growth threshold value, and / or the first growth coefficient is greater than the change coefficient threshold value, an abnormal warning instruction is generated; After experiencing a preset short-term monitoring time length, the method further comprises: If the second crack growth value generated by the target wall crack monitoring device is less than or equal to the crack growth threshold value, and the second growth value growth number is less than or equal to the growth threshold value, and the second growth coefficient is less than or equal to the change coefficient threshold value, a short-term recovery instruction is generated; 2. The method of claim 1, wherein, If the second crack growth value is greater than the crack growth threshold value, and / or the second growth value growth number is greater than the growth threshold value, and / or the second growth coefficient is greater than the change coefficient threshold value, a long-term fault instruction is generated. After the long-term fault instruction, the method further comprises: According to the preset abnormal monitoring cycle time length, the abnormal record crack growth value, the abnormal record growth value growth number and the abnormal record growth coefficient are periodically acquired; According to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimation time length is generated. The method further comprises: According to the preset abnormal data reference quantity, the plurality of abnormal record growth coefficients are screened out; 3. The method of claim 2, wherein, According to the abnormal estimation time length and the abnormal monitoring cycle time length, the estimated abnormal number and the abnormal coefficient estimation number are calculated and generated; The method further comprises: The first crack growth value, the first growth value growth number and the first growth coefficient generated by the target wall crack monitoring device are compared with the corresponding crack growth threshold value, the growth threshold value and the change coefficient threshold value respectively; 4. The method of claim 3, wherein, If the first crack growth value is greater than the crack growth threshold value, and / or the first growth value growth number is greater than the crack growth threshold value, and / or the first growth coefficient is greater than the change coefficient threshold value, an abnormal warning instruction is generated; After experiencing a preset short-term monitoring time length, the method further comprises: If the second crack growth value generated by the target wall crack monitoring device is less than or equal to the crack growth threshold value, and the second growth value growth number is less than or equal to the growth threshold value, and the second growth coefficient is less than or equal to the change coefficient threshold value, a short-term recovery instruction is generated; If the second crack growth value is greater than the crack growth threshold value, and / or the second growth value growth number is greater than the growth threshold value, and / or the second growth coefficient is greater than the change coefficient threshold value, a long-term fault instruction is generated. After the long-term fault instruction, the method further comprises: According to the preset abnormal monitoring cycle time length, the abnormal record crack growth value, the abnormal record growth value growth number and the abnormal record growth coefficient are periodically acquired; According to the plurality of abnormal record crack growth values, the plurality of abnormal record growth value growth numbers and the plurality of abnormal record growth coefficients, the abnormal estimated crack width change information within the preset abnormal estimation time length is generated. The method further comprises: According to the preset abnormal data reference quantity, the plurality of abnormal record growth coefficients are screened out; According to the abnormal estimation time length and the abnormal monitoring cycle time length, the estimated abnormal number and the abnormal coefficient estimation number are calculated and generated; According to a plurality of said abnormal record growth coefficients, the following steps are cyclically executed until the number of calculated abnormal estimated growth coefficients is said abnormal coefficient estimation number: According to the abnormal data reference number, in a plurality of said abnormal record growth coefficients, and in zero, one or more abnormal estimated growth coefficients, a plurality of reference growth coefficients are screened out; According to a plurality of said reference growth coefficients, a reference coefficient deviation total amount is calculated and generated; According to the reference coefficient deviation total amount and a plurality of said reference growth coefficients, a corresponding abnormal estimated growth coefficient is calculated and generated; According to a plurality of said abnormal estimated growth coefficients, abnormal estimated crack width change information within a preset abnormal estimation time is generated.

5. The method of claim 4, wherein, The formula for calculating the reference coefficient deviation total amount according to a plurality of said reference growth coefficients is as follows: ； The formula for calculating the abnormal estimated growth coefficient is as follows: ； wherein is the total amount of reference coefficient deviation, is one of the abnormal estimated growth coefficients, , , ... is the plurality of reference growth coefficients, is the estimated abnormal number.

6. A building wall cracking monitoring device, characterized by, The data twin processing device comprises: An information acquisition module for acquiring crack width values fed back by a plurality of wall crack monitoring devices in real time; A twin model establishing module for receiving building device parameters input by a user and establishing a twin building wall model data with a crack state according to a plurality of said crack width values and said building device parameters; A data statistical arrangement module for generating a total height of a wall longitudinal crack and a total length of a wall transverse crack according to said twin building wall model data, and generating current wall crack data by summarizing a plurality of said crack width values, said total height of a wall longitudinal crack and said total length of a wall transverse crack; A crack change derivation module for generating wall crack estimated change data according to said current wall crack data and pre-recorded historical wall crack data; An information acquisition module for acquiring wall temperature values corresponding to a target wall crack monitoring device at a plurality of signal acquisition time points in real time; A temperature influence exclusion module for generating a plurality of basic crack width values corresponding to the target wall crack monitoring device under the exclusion of temperature influence according to a plurality of crack width values fed back by the target wall crack monitoring device recorded in the current wall crack data and the historical wall crack data, and a plurality of wall temperature values corresponding thereto; A crack change derivation module for generating estimated crack change information corresponding to the target wall crack monitoring device according to a plurality of said basic crack width values; A crack change derivation module for generating wall crack estimated change data according to a plurality of said estimated crack change information corresponding to a plurality of wall crack monitoring devices; An information acquisition module for acquiring target wall crack width values of the target wall crack monitoring device at the same wall temperature value within adjacent two days; A temperature influence exclusion module for calculating and generating a crack width increase value according to two target wall crack width values corresponding to the same wall temperature value; A temperature influence exclusion module for calculating and generating crack width influence data corresponding to a plurality of wall temperature values according to a first crack width increase value corresponding to a first wall temperature value and a second crack width increase value corresponding to a second wall temperature value. The temperature influence elimination module is configured to generate a plurality of basic crack width values corresponding to the target wall crack monitoring device under the influence of temperature according to the crack width influence data and a plurality of crack width values fed back by the target wall crack monitoring device; The data screening module is configured to screen a plurality of sampling basic crack width values corresponding to a target time within a sampling period from the plurality of basic crack width values according to a preset sampling period; The crack change value arrangement and calculation module is configured to calculate and generate a plurality of crack growth values corresponding to a plurality of adjacent sampling periods according to the plurality of sampling basic crack width values; The crack change value arrangement and calculation module is configured to calculate and generate a plurality of growth value growth numbers corresponding to the plurality of adjacent crack growth values and a growth coefficient corresponding to two adjacent growth value growth numbers according to the plurality of crack growth values; The crack change derivation module is configured to calculate and generate estimated crack change information of the target wall crack monitoring device within a preset estimation time according to the plurality of growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values; The data screening module is configured to screen a plurality of target growth coefficients located before a current time from the plurality of growth coefficients according to a preset coefficient derivation number; The crack change derivation module is configured to gradually calculate and generate a plurality of estimated growth coefficients within the estimation time according to a mean value of the plurality of target growth coefficients; The crack change derivation module is configured to calculate and generate a plurality of estimated growth value growth numbers and a plurality of estimated crack growth values according to the plurality of estimated growth coefficients, the plurality of growth value growth numbers and the plurality of crack growth values; The crack change derivation module is configured to generate estimated crack change information of the target wall crack monitoring device within the preset estimation time according to the plurality of estimated crack growth values and the plurality of sampling basic crack width values.

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