Test connection device for printed circuit assembly board

Abstract

The invention discloses a test connection device for a printed circuit assembly board. The test connection device comprises a probe seat module, a protective cover module, a bolt module and a spring, the probe seat module comprises a probe seat, a probe, a test interface board, a fastening bushing and the like, the arrangement of probe mounting holes is consistent with the arrangement mode of a PCB test disc to be tested, and the test interface board is in contact with one end of the probe; the protective cover module is provided with a grounding support ring, a positioning guide sleeve and the like; the bolt module comprises a bolt and a knob; and the spring sleeves the peripheral surface of the positioning guide sleeve. The device is positioned through the existing mounting hole and the auxiliary positioning hole of the PCB to be tested, and is locked through the matching of the bolt and the shell nut, so that the probe is contacted with the test disc to establish electrical connection. Therefore, an on-board test connector is omitted, and the material cost is saved. The connection density is improved, and the PCB area is saved; the fastening lining and the grounding supporting ring have the signal reference ground function, meet the requirement for high-speed signal transmission and are suitable for the field of printed circuit assembly board testing.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of printed circuit technology, in particular to a printed circuit assembly board testing technology, and more particularly to a testing connecting device for printed circuit assembly board. BACKGROUND

[0002] In order to meet the testing requirements, the prior art generally places one or more special connectors on the PCB; during testing, the connector is connected to the testing instrument using a matching plug-in cable, thereby achieving the testing purpose.

[0003] However, the prior art has many deficiencies: 1. It increases the material cost, such a connector is only needed for testing, and the end user does not need it. 2. The commonly used low-cost connector has a low connection density and cannot transmit high-speed signals. 3. It occupies valuable PCB space and increases the system size; even if the connector is not installed during mass production, the corresponding mounting pads on the PCB still exist, and these spaces should be saved to provide more functions for the user or to compress the system size and cost. SUMMARY

[0004] The present application provides a testing connecting device for printed circuit assembly board to solve the problems of additional material cost, low connection density, low signal transmission rate, and PCB space occupation in the prior art, and cancels the on-board testing connector, improves the connection density and signal transmission rate, saves the PCB area, and reduces the system size.

[0005] The technical solution adopted by the present application to solve the technical problem: the testing connecting device for printed circuit assembly board includes a probe seat module, a protective cover module, a bolt module, and a spring.

[0006] The probe seat module comprises a probe seat, a set of probes, a probe fastening bushing, a test interface plate and a probe fastening nut. The probe seat is provided with probe mounting holes, guide pin holes and fastening bushing mounting holes. The probes are mounted in the probe mounting holes and the arrangement of the probe mounting holes is consistent with the arrangement of the test pads on the PCB to be tested. The probe fastening bushing is mounted in the fastening bushing mounting holes and is fixedly connected with the probe seat. The test interface plate is fixed with the probe seat through the probe fastening bushing and the probe fastening nut, and the tail ends of the probes are in contact with the test interface plate. After such arrangement, the probe seat module realizes accurate docking with the PCB to be tested and signal transmission through the cooperation of other components. The probe mounting holes, the guide pin holes and the fastening bushing mounting holes on the probe seat have clear division of labor. The arrangement of the probe mounting holes strictly corresponds to the arrangement of the test pads on the PCB to be tested, so as to ensure that the probes mounted in the holes can form a one-to-one contact relationship with the test pads of the PCB to be tested, thereby providing basic positioning protection for test signal transmission. The probe fastening bushing is mounted in the fastening bushing mounting holes and is fixed with the probe seat. In combination with the threaded connection of the probe fastening nut and the tightening, the test interface plate and the probe seat are clamped and fixed. This fixing mode can effectively avoid the displacement of the test interface plate caused by vibration or external force during the test, thereby ensuring the stability of the contact between the test interface plate and the tail ends of the probes. In addition, this fixing mode improves the integrity and assembly of the module and supports on-site replacement of the probes, thereby improving the maintainability. The contact between the test interface plate and the probes directly forms an electrical connection path, so that the test signals of the PCB to be tested can be transmitted to the test interface plate through the probes, the switching and transmission between the signals and the test equipment are completed, and the effective test of the printed circuit assembly board is realized.

[0007] The protective cover module comprises a grounding support ring, a positioning guide sleeve, an end cover and at least one guide pin. The positioning guide sleeve is fixed in the center hole of the grounding support ring, the grounding support ring is fixed in the center hole of the end cover, and the guide pin is fixed in the guide pin hole of the end cover. The probes contact the test pads on the PCB to be tested through the probe holes of the end cover. The connection mode among the positioning guide sleeve, the grounding support ring and the end cover makes the center axes of the three collinear, and the force is more symmetrical during fastening, which is beneficial to the accurate positioning of the device. The guide pin is fixed in the guide pin hole of the end cover, and the position corresponds to the auxiliary positioning hole on the PCB to be tested. During the test, the pre-positioning of the protective cover module relative to the PCB to be tested can be realized through the cooperation of the guide pin and the positioning hole. In cooperation with the cooperation of the positioning guide sleeve and the mounting hole of the test board, the complete positioning of the protective cover module relative to the PCB to be tested can be realized. At the same time, the fixed connection among the components makes the protective cover module form a stable overall structure, which protects the probes during the use and storage of the device.

[0008] The bolt module comprises a bolt and a knob, the bolt is arranged in the center hole of the positioning guide sleeve, the knob is sleeved on the light rod part of the bolt through the center hole and is fixed with the bolt by a locking screw, the lower end surface of the knob abuts against the upper end surface of the probe fastening sleeve; the bolt is arranged in the center hole of the positioning guide sleeve, forming axial guiding cooperation of both, ensuring stable axial movement of the bolt under the constraint of the positioning guide sleeve. The knob is sleeved on the light rod part of the bolt, and the relative fixation with the bolt is realized through the locking effect of the locking screw, the position of the knob on the light rod can be adjusted and locked to adapt to different thicknesses of the to-be-tested board. The lower end surface of the knob abuts against the upper end surface of the probe fastening sleeve, and this contact relationship transmits axial force during locking of the device: when the knob is rotated, the bolt thread is screwed into the shell nut of the to-be-tested board, which pushes the probe seat module where the probe fastening sleeve is located through the abutting surface, overcomes the spring force and moves to the to-be-tested board, finally makes the probe seat module, the protection cover module and the to-be-tested PCB tightly compressed, and ensures the reliable contact between the probe and the corresponding test disc, and between the probe fastening sleeve, the grounding support ring and the grounding disc.

[0009] The spring is sleeved on the outer peripheral surface of the positioning guide sleeve, and the two ends thereof abut against the probe fastening sleeve and the grounding support ring respectively and are pre-pressed and installed. This makes the protection cover module pushed away from the probe seat module by the spring in the state that the device is not used, and the probe is immersed in the probe hole, so that the probe is protected by the protection cover module. When the device is in the locking and loosening process, the protection cover module always abuts against the knob under the action of the spring elastic force, so that the position thereof slowly changes along the positioning guide sleeve with the knob in this process, thereby avoiding the probe from being impacted violently, and also making the movement more smooth.

[0010] In summary, the device realizes positioning through the existing mounting hole and auxiliary positioning hole on the to-be-tested PCB, and realizes locking through cooperation of the bolt and the nut on the shell of the to-be-tested PCB, forms the test device in which the probe contacts the test disc on the to-be-tested PCB and establishes electrical connection.

[0011] As a further improvement of the invention, the probe is a two-way telescopic spring probe, the tail end of which is connected with the test interface board; the other end, when fastened, abuts against the test disc of the to-be-tested board and is retracted by a small distance, and the internal spring keeps a certain contact force with the test disc, thereby establishing the signal connection between the test interface board and the to-be-tested board. When the device is in the testing state, the elastic force of the probe spring acts on both ends of the needle at the same time, so that the tail end of the interface board needle closely abuts against the test disc of the test interface board, and the needle of the to-be-tested board closely abuts against the test disc of the to-be-tested PCB, ensuring that both can establish a stable electrical connection path. The two-way telescopic probe structure can adapt to the possible warping of the to-be-tested board during the testing process or the mating error of the end face of the test interface board and the probe seat during the assembly process. The telescopic amount of the probe spring can be adjusted accordingly to maintain a stable contact pressure, thereby ensuring the continuity and accuracy of the testing signal transmission and effectively avoiding the distortion or misjudgment of the testing data caused by poor contact.

[0012] As a further improvement of the invention, the probe seat is provided with an interface board positioning protrusion, and the test interface board is provided with a positioning notch matched with the positioning protrusion. During the installation of the test interface board, the positioning protrusion is embedded in the positioning notch, and the corresponding outer periphery of the probe fastening bush is matched with the installation hole of the test interface board to ensure the accurate alignment of the probe and the corresponding contact points on the test interface board. At the same time, the probe fastening bush is connected with the probe fastening nut through threads, and the test interface board is pressed and fixed on the probe seat by tightening the nut. This positioning and installation method can ensure stable and reliable contact between the probe and the test interface board, and is easy to assemble and maintain.

[0013] As a further improvement of the invention, the fixation of the probe fastening bush and the probe seat is realized by pressing or glue, both of which can ensure the stable connection of the bush and the probe seat: the pressing method uses interference fit to tightly combine the bush and the installation hole of the probe seat, avoiding loosening due to vibration during testing and ensuring the structural integrity; the glue fixation forms a reliable connection through the adhesive force of the glue, which is suitable for assembly requirements of different materials or structures.

[0014] As a further improvement of the invention, the grounding support ring is made of conductive material, the lower end surface of which is in contact with the mounting hole grounding plate on the PCB to be tested, and the upper end surface is in contact with the lower end surface of the probe fastening bushing which is also made of conductive material. The lower end surface is in contact with the mounting hole grounding plate on the PCB to be tested, establishing electrical connection with the signal reference ground of the board to be tested; the upper end surface is in contact with the lower end surface of the probe fastening bushing, which extends the grounding path to the probe seat module through the probe fastening bushing, and finally connects with the interface board grounding ring through the fastening bushing, thereby forming a through grounding path of the PCB to be tested and the test interface board. This structure spatially allows each probe to have a signal ground adjacent to it as a reference, effectively reducing the length of the signal return path and reducing electromagnetic interference between high-speed test signals during transmission on the probe. At the same time, this structure also makes it possible to control the characteristic impedance of each probe, effectively suppressing the reflection of high-speed test signals due to impedance matching problems when passing through the structure, improving the integrity of the test signal and the accuracy of the test results.

[0015] As a further improvement of the invention, the positioning guide sleeve is in clearance fit with the center hole of the probe fastening bushing, and the outer surface of the positioning guide sleeve is provided with an axially extending notch, which divides the lower end portion of the positioning guide sleeve into a plurality of petal-shaped structures. The positioning guide sleeve and the center hole of the probe fastening bushing are in clearance fit, providing the basic condition for the relative axial movement of the two, ensuring that the protection cover module where the positioning guide sleeve is located can flexibly stretch along the center hole axis under the action of the bolt module and the spring, meeting the compression and reset requirements during testing. The axial notch provided on the outer surface of the positioning guide sleeve divides the lower end portion into a plurality of petal-shaped structures, and this design enables the lower end portion to have a certain radial elastic deformation capability, allowing it to have a certain fault tolerance for the eccentricity of the mounting hole and its corresponding shell nut thread hole caused by manufacturing and assembly during the fastening process.

[0016] As a further improvement of the invention, the guide pin is in clearance fit with the guide pin hole of the probe holder, the guide pin comprises a first guide pin and a second guide pin, the end of the first guide pin extends out of the end cap and is used to fit with the auxiliary positioning hole on the PCB to be tested, the length of the second guide pin is not greater than that of the first guide pin, and the second guide pin cooperates with the first guide pin to form a double-guide-pin positioning structure according to whether the auxiliary positioning hole is provided on the PCB to be tested. The guide pin is in clearance fit with the guide pin hole of the probe holder, so that the guide pin can slide in the guide pin hole to meet the pressing and resetting movement requirements during testing. The end of the first guide pin extends out of the end cap and can be directly inserted into the auxiliary positioning hole on the PCB to be tested, and the circumferential positioning is achieved through the pin hole fit. The length of the second guide pin is not greater than that of the first guide pin, and the function of the second guide pin is flexibly adjusted according to whether the auxiliary positioning hole corresponding to the second guide pin is provided on the PCB to be tested: when the auxiliary positioning hole corresponding to the second guide pin is provided on the PCB to be tested, the second guide pin and the first guide pin are respectively fitted with the respective positioning holes to form a double-guide-pin cooperative positioning. In this case, the positioning guide sleeve end and the corresponding hole positioning on the PCB to be tested can be relieved, thereby adapting to a thinner PCB to be tested and allowing a larger offset between the housing nut thread hole and the mounting hole center.

[0017] As a further improvement of the invention, a tapered thread exit transition surface is provided on the bolt, and a ring-shaped lip with a rounded edge is provided on the center hole of the positioning guide sleeve; in the unused state, the abutment of the tapered thread exit transition surface and the ring-shaped lip with a rounded edge can prevent the protective cover module from being separated from the probe holder module under the continuous pushing force of the spring, thereby maintaining the integrity of the device. In addition, under the action of the spring pushing force, the abutment of the tapered thread exit transition surface and the ring-shaped lip with a rounded edge has a self-centering effect on the bolt, which creates favorable conditions for the subsequent smooth engagement of the bolt and the nut threads, as well as the cooperation between the guide sleeve end and the mounting hole of the PCB to be tested.

[0018] As a further improvement of the invention, the outer periphery of the knob is provided with knurls, and a slot is formed in the knob in the axial direction. The opening degree of the slot can be adjusted by the adjusting screw to tighten or loosen the bolt. The knurls on the outer periphery of the knob can effectively prevent slipping and improve ease of operation. The slot formed in the axial direction of the knob has a certain elastic deformation capacity: when the adjusting screw is tightened, the opening degree of the slot decreases, the inner hole of the knob shrinks and tightens the bolt, so that the bolt and the knob form a rigid connection, thereby the bolt can be rotated by rotating the knob, and the device is locked; when the adjusting screw is loosened, the slot naturally opens, the bolt is loosened, and after the knob is removed, the probe holder module and the protective cover module can be separated from each other, thereby meeting the assembly requirements.

[0019] As a further improvement to the invention, the end cap of the protective cover module is provided with a probe hole. In the non-use state, the probe tip of the test board is submerged in the probe hole. In the non-use state, the probe hole on the end cap of the protective cover module and the probe tip of the test board correspond to each other, ensuring the probe tip is completely submerged. The core effect of this structure is the protection of the probe tip: by submerging the tip in the hole, the tip is prevented from being directly exposed to the external environment when not in use, preventing deformation or damage due to collisions, friction, or other external forces, while also reducing the adhesion of dust, impurities, and other contaminants to the tip surface. This protection maintains the structural integrity and surface cleanliness of the probe tip, ensuring stable and reliable electrical contact between the tip and the test plate of the test board during use, guaranteeing the accuracy of test signal transmission. Furthermore, the cooperation between the probe hole and the tip also provides auxiliary positioning for the probe in the non-use state, limiting its radial wobble and further maintaining the overall stability of the probe structure.

[0020] The beneficial effects of this invention are: the structure of this invention is reasonable and compact; by adopting the above technical solution, the test connector on the board is eliminated, and this device is used instead during testing and removed after testing, thus saving component costs; the connection density is improved, and the use of surface pads saves PCB area, thereby reducing the system size; the components in the device that realize positioning and locking also serve as signal reference grounds, reducing the signal return path and meeting the requirements of higher speed signal transmission. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of the present invention when connected to a PCB board for testing;

[0022] Figure 2 This is a schematic diagram of the structure of the present invention;

[0023] Figure 3 This is a left view of the invention in an untested state;

[0024] Figure 4 This is a rear view of the test state of the present invention;

[0025] Figure 5 for Figure 4 A cross-sectional view along the AA direction;

[0026] Figure 6 This is a bottom view of the present invention;

[0027] Figure 7 for Figure 6 Cross-sectional view along the BB direction;

[0028] Figure 8 This is a cross-sectional view of the probe.

[0029] Explanation of reference signs: probe holder 1, probe 2, interface plate needle 2-1, needle tube 2-2, probe spring 2-3, test plate needle 2-4, probe fastening bushing 3, test interface plate 4, probe fastening nut 5, grounding support ring 6, positioning guide sleeve 7, end cover 8, guide pin 9, first guide pin 9-1, second guide pin 9-2, bolt 10, knob 11, spring 12, set screw 13. DETAILED DESCRIPTION

[0030] The application will be further described below with reference to the accompanying drawings:

[0031] Referring to the drawings: the test connection device for printed circuit assembly board in the embodiment comprises a probe holder module, a protective cover module, a bolt module and a spring;

[0032] The probe holder module comprises a probe holder 1, a set of probes 2, a probe fastening bushing 3, a test interface plate 4 and a probe fastening nut 5, the probe holder 1 is provided with probe mounting holes, guide pin holes and fastening bushing mounting holes, the probes 2 are mounted in the probe mounting holes and the arrangement mode of the probe mounting holes is consistent with the arrangement mode of the test disc on the PCB to be tested, the probe fastening bushing 3 is mounted in the fastening bushing mounting hole and fixedly connected with the probe holder 1, the test interface plate 4 is fixed with the probe holder 1 through the probe fastening bushing 3 and the probe fastening nut 5, and one end of the test interface plate 4 is in contact with the probes 2; the probe holder is a nearly ring member, the fastening bushing is mounted in the fastening bushing mounting hole, and the two are fixed by pressing or glue; after the probe mounting holes are mounted with the probes and the fastening nut is tightened, the probe interface plate will press against the tail end of the probe to prevent it from coming out; the guide pin holes are penetrated by the protective cover guide pins and allow the guide pins to slide in the holes; the interface plate positioning protrusions are matched with the adapter plate notches to play a circumferential positioning role.

[0033] The protective cover module comprises a grounding support ring 6, a positioning guide sleeve 7, an end cover 8 and at least one guide pin 9, the positioning guide sleeve 7 is penetrated in the center hole of the grounding support ring 6 and the end cover 8 and fixedly connected, the guide pin 9 is penetrated in the guide pin hole of the end cover 8 and fixedly connected, and the lower end of the probe 2 penetrates the end cover 8 to contact the test disc on the PCB to be tested; preferably, the end cover 8 is an insulator and is injection molded with thermoplastic material; the positioning guide sleeve 7 is machined on a jig lathe, and an axial notch is machined out of the sleeve by using a fast wire, and the material is a hard metal; the grounding support ring 6 is machined on a jig lathe, and the material is preferably a copper alloy with good conductivity.

[0034] The bolt module comprises a bolt 10 and a knob 11, the bolt 10 is penetrated in the center hole of the positioning guide sleeve 7, the knob 11 is sleeved on the light rod part of the bolt 10 and can be fixed with the bolt 10 by the set screw 13, and the lower end surface of the knob 11 abuts against the upper end surface of the probe fastening bushing 3;

[0035] Spring 12 is sleeved on the outer circumferential surface of positioning guide sleeve 7, and its two ends abut against probe fastening bushing 3 and grounding support ring 6 respectively.

[0036] As attached Figure 8 As shown, probe 2 is a bidirectional retractable probe, including an interface board probe 2-1, a probe tube 2-2, a probe spring 2-3, and a test board probe 2-4. The interface board probe 2-1 contacts the test interface board 4, and the test board probe 2-4 contacts the test pad on the PCB under test. The probe spring 2-3 is located inside the probe tube 2-2 and abuts against both the interface board probe 2-1 and the test board probe 2-4. This device uses a bidirectional retractable probe as the physical path for the electrical signal connection between the test board and the interface board. The interface board probe is made of copper alloy, and its head contacts the test pad on the interface board. The probe tube is also made of copper alloy, making the other three parts a single unit and ensuring that the probes on both sides can only extend and retract along the axis within the probe tube. There is a locking point near the interface board probe on the probe tube, which is the axial stop point of the probe in the probe holder mounting hole. The spring is made of piano wire, providing the necessary contact force when the probes on both sides are compressed. The test board probe is made of copper alloy, and its head contacts the test pad on the test board. The probe has three states: free state, interface board probe compression state, and interface board and test board probe compression state.

[0037] The probe holder 1 is provided with an interface board positioning protrusion, and the test interface board 4 is provided with a positioning notch that cooperates with the interface board positioning protrusion.

[0038] The probe fastening bushing 3 is fixed to the probe seat 1 by pressing or gluing. The outer circumferential surface of the probe fastening bushing 3 mates with the mounting hole of the test interface plate 4, and the probe fastening bushing 3 is tightened and fixed to the test interface plate 4 by threading with the probe fastening nut 5.

[0039] The grounding support ring 6 is made of conductive metal. Its lower end face is used to contact the grounding plate of the mounting hole on the PCB under test, and its upper end face abuts against the lower end face of the probe fastening bushing 3.

[0040] The positioning guide sleeve 7 is clearance-fitted with the center hole of the probe fastening bushing 3. The outer peripheral surface of the positioning guide sleeve 7 is provided with an axially extending groove, which divides the lower part of the positioning guide sleeve 7 into multiple petal-shaped structures.

[0041] The guide pin 9 is in clearance fit with the guide pin hole of the probe holder 1, the guide pin 9 comprises a first guide pin 9-1 and a second guide pin 9-2, the end of the first guide pin 9-1 protrudes out of the end cover and is used to fit with the auxiliary positioning hole on the PCB to be tested, the length of the second guide pin 9-2 is not greater than that of the first guide pin 9-1, and the second guide pin 9-2 cooperates with the first guide pin 9-1 to form a double-guide-pin positioning structure according to whether the auxiliary positioning hole is arranged or not. In order to overcome the limitation of the length of the bolt thread and to achieve complete positioning during the stage when the device is placed on the thin PCB to be tested, the second guide pin 9-2 can be made to protrude out of the lower end surface of the end cover like the first guide pin 9-1, a positioning hole can be arranged on the PCB to be tested for the second guide pin 9-2, the positioning function of the positioning guide sleeve can be cancelled, and the lip of the positioning guide sleeve can be made to be inwardly recessed relative to the supporting grounding ring. When the guide pin positioning is completely used and the positioning requirement of the positioning guide sleeve is cancelled, the guide pin is made to be inwardly recessed relative to the supporting grounding ring, the device is placed on the PCB to be tested, and then the complete positioning of the device is achieved. Moreover, the lower end surface of the supporting grounding ring is in contact with the mounting hole grounding disc, and the locking of the device can be completed by continuing to rotate the knob. In this case, two auxiliary positioning holes need to be arranged on the PCB to be tested. Due to manufacturing and assembly errors, the eccentricity between the center of the thread hole of the shell nut and the center of the corresponding mounting hole of the PCB to be tested is inevitable. In normal application, the inner diameter of the mounting hole is much larger than the large diameter of the screw thread, and such eccentricity generally does not cause the device to be unable to be assembled. However, in the present scheme, the mounting hole is used for positioning and locking through the thread connection with the shell nut. Therefore, the tolerance of the eccentricity is much smaller, and the double-guide-pin positioning is used as an alternative. In addition, the transition surface of the nut is in abutment with the lip of the positioning guide sleeve, and the outer peripheral surface adjacent to the lip of the positioning guide sleeve is used for positioning with the mounting hole. Considering the strength of the thread connection, 2-3 threads need to be engaged at all times. In this way, the end of the bolt protrudes a considerable distance. In this case, if the PCB to be tested is too thin, the end of the positioning pin cannot be deeply inserted into the auxiliary positioning hole to achieve preliminary positioning. If the height of the protruding end cover of the guide pin is increased, the end of the guide pin protrudes too much from the lower surface of the PCB to be tested in the locked state. The double-guide-pin positioning eliminates the positioning requirement of the positioning guide sleeve, cancels the outer peripheral surface used for positioning, and thus the distance by which the end of the bolt protrudes is compressed, which is suitable for the PCB to be tested which is thinner.

[0042] The bolt 10 is provided with a tapered thread exit transition surface, and the center hole of the positioning guide sleeve 7 is provided with an annular lip with a rounded edge. The thread exit transition surface is in abutment with the lip to prevent the protective cover module and the probe holder module from being separated.

[0043] The outer peripheral surface of the knob 11 is provided with knurling, and a slot is formed in the knob along the axial direction. The opening and closing degree of the slot can be adjusted by the set screw 13 to tightly hold or loosen the bolt 10.

[0044] The end cover 8 of the protective cover module is provided with a probe hole. In the unused state, the PCB needle 2-4 of the probe 2 is inserted into the probe hole.

[0045] The following steps explain the positioning and locking of the device and the board to be tested, and then the specific implementation process of establishing the test connection:

[0046] 1. Use the hand-held device knob to align the first guide pin 9-1 of the protective cover module with the auxiliary positioning hole of the board to be tested, and roughly align the bolt head with the mounting hole, and place it on the board to be tested. At this time, the first guide pin 9-1 has been located in the auxiliary positioning hole of the PCB, and the circumferential positioning has taken effect. For thinner boards to be tested, the lower end surface of the grounding support ring 6 has not yet contacted the grounding disc of the mounting hole. However, the bolt thread and the nut thread have already contacted. At this time, the probe 2 is still in the end cap 8 probe hole and does not contact the corresponding test disc of the board to be tested.

[0047] 2. For thicker boards to be tested, slightly rotate the knob 11, and the threads will engage. The bolt module gradually descends with rotation until the lower end surface of the grounding support ring 6 contacts the grounding disc of the mounting hole. At this time, the lower end outer surface of the positioning guide sleeve 7 has entered the mounting hole, and the position positioning has taken effect. Combined with the circumferential positioning that has already taken effect in step 1, complete positioning of the module is achieved. In this step, the probe seat module and the protective module have not moved relative to each other, and the probe 2 is in the protective cover probe hole and does not contact the corresponding test disc of the board to be tested.

[0048] 3. Continue to rotate the knob 11 to complete the locking of the device. The knob 11 drives the bolt thread to rotate into the nut, and the bolt pulls down the knob. The knob 11 presses against the upper end surface of the probe fastening bushing 3, forcing the probe seat module to descend against the spring force until the lower end surface of the probe fastening bushing 3 in the probe seat module contacts the upper end surface of the grounding support ring 6. The lower end surface of the probe fastening bushing 3 of the probe seat module contacts the upper end surface of the grounding support ring 6, combined with the end surface of the knob 11 contacting the upper end surface of the probe fastening bushing 3 and the lower end surface of the grounding support ring 6 contacting the grounding disc of the mounting hole. On the one hand, it establishes the connection between the test interface board and the board to be tested. On the other hand, it prevents the probe seat module from continuing to move downward, avoiding overpressure of the probe 2. The probe 2 in the probe seat hole moves downward with the probe seat 1 and contacts the test disc. When the probe seat module reaches its lower stop point, the probe needle 2-4 is compressed to its designed stroke. The spring force of the probe spring 2-3 in the probe needle tube 2-2 provides appropriate contact force on both sides of the needle and the test interface board and the corresponding test disc of the board to be tested, establishing the signal connection between the test interface board and the board to be tested.

[0049] 4. For the removal of the device from the board to be tested, follow the reverse order of the above. That is, first loosen the nut. During this process, as the lower end surface of the knob 11 rises, the probe seat module is gradually lifted by the spring 12, and the probe 2 retreats into the protective cover module probe hole. When the bolt and the housing nut threads disengage, the knob can be removed by hand.

[0050] While the application has been illustrated and described with reference to preferred embodiments, it will be readily apparent to those of ordinary skill in the art that various changes in form and detail can be made without departing from the spirit and scope of the application.

Claims

1. A test connection arrangement for printed circuit assembly boards, characterized by: The probe base module, the protective cover module, the bolt module and the spring are included. The probe base module includes a probe base (1), a set of probes (2), a probe fastening bushing (3), a test interface plate (4) and a probe fastening nut (5), the probe base (1) is provided with probe mounting holes, guide pin holes and fastening bushing mounting holes, the probes (2) are mounted in the probe mounting holes and the arrangement of the probe mounting holes is consistent with the arrangement of the test pads on the PCB to be tested, the probe fastening bushing (3) is mounted in the fastening bushing mounting hole and is fixedly connected with the probe base (1), the test interface plate (4) is fixed with the probe base (1) through the probe fastening bushing (3) and the probe fastening nut (5), and the tail end of the test interface plate (4) is in contact with the probes (2). The protective cover module includes a grounding support ring (6), a positioning guide sleeve (7), an end cover (8) and at least one guide pin (9), the positioning guide sleeve (7) is arranged in the coaxial center holes of the grounding support ring (6) and the end cover (8) and is fixedly connected, the guide pin (9) is arranged in the guide pin hole of the end cover (8) and is fixedly connected, and the lower end of the probe (2) passes through the end cover (8) and is in contact with the test pad on the PCB to be tested. The bolt module includes a bolt (10) and a knob (11), the bolt (10) is arranged in the center hole of the positioning guide sleeve (7), the knob (11) is sleeved on the light rod part of the bolt (10) and can be fixed with the bolt (10) through a locking screw (13), and the lower end surface of the knob (11) is in abutment with the upper end surface of the probe fastening bushing (3). The spring (12) is sleeved on the outer peripheral surface of the positioning guide sleeve (7) and the two ends thereof are in abutment with the probe fastening bushing (3) and the grounding support ring (6) respectively.

2. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The probe (2) is a spring probe, the tail end thereof is connected with the test interface plate (4), the other end thereof is in abutment with the corresponding test pad of the test board and is retracted by a small distance when being fastened, the internal spring makes the probe (2) maintain a certain contact force with the test pad, so that the signal connection between the test interface plate and the test board is established.

3. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The probe base (1) is provided with an interface plate positioning protrusion, and the test interface plate (4) is provided with a positioning notch matched with the interface plate positioning protrusion.

4. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The outer peripheral surface of the probe fastening bushing (3) is matched with the mounting hole of the test interface plate (4) and is fixed with the probe base (1); the probe fastening bushing (3) is further matched with the probe fastening nut (5) through threads to press and fix the test interface plate (4).

5. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The grounding support ring (6) is of a conductive material structure, the lower end surface thereof is used for being in contact with the grounding pad of the mounting hole on the PCB to be tested, and the upper end surface thereof is in abutment with the lower end surface of the probe fastening bushing (3).

6. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The positioning guide sleeve (7) is matched with the center hole of the probe fastening bushing (3) in a clearance, the outer peripheral surface of the positioning guide sleeve (7) is provided with a slot extending in the axial direction, and the slot divides the lower end part of the positioning guide sleeve (7) into a plurality of petal-shaped structures.

7. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The guide pin (9) is matched with the guide pin hole gap of the probe base (1), the guide pin (9) comprises a first guide pin (9-1) and a second guide pin (9-2), the end of the first guide pin (9-1) extends out of the end cover and is used for matching with the auxiliary positioning hole on the PCB to be tested, the length of the second guide pin (9-2) is not greater than that of the first guide pin (9-1), and the second guide pin (9-2) cooperates with the first guide pin (9-1) to form a double-guide-pin positioning structure according to whether the auxiliary positioning hole is arranged on the PCB to be tested.

8. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: A threaded exit transition surface is arranged on the bolt (10), a lip is arranged on the center hole of the positioning guide sleeve (7), and the threaded exit transition surface is abutted with the lip to prevent the protective cover module from being separated from the probe base module.

9. A test connection arrangement for printed circuit board assemblies according to claim 1, characterized in that: The outer circumferential surface of the knob (11) is provided with knurling, and a slot is arranged on the knob in the axial direction, and the opening and closing degree of the slot can be adjusted by the set screw (13) to tightly hold or loosen the bolt (10).

10. The test connection device for printed circuit board assembly of claim 1, wherein: The end cover (8) of the protective cover module is provided with a probe hole, and in the unused state, the needle head (2-4) of the probe (2) is immersed in the probe hole.

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