A test run management system for automotive temperature sensors

Abstract

The application discloses a kind of test operation management systems suitable for automobile temperature sensor, belong to automobile temperature sensor test evaluation technical field, the application is by static test module, dynamic test module respectively to temperature sensor by static to dynamic many aspects are tested, rely on static test obtains temperature sensor in stable condition under temperature difference float value, voltage difference float value, and comprehensive analysis will test object be divided into qualified object and object to be detected, that is, before carrying out dynamic test, screening is carried out, then rely on dynamic test obtains temperature sensor in unstable condition under normal thermal response coefficient, normal linear coefficient, and dynamic performance coefficient is generated from the two, whether the performance detection of qualified object meets the requirement according to dynamic performance coefficient is judged and analyzed, in addition, in the process of testing, abnormal test results are checked and analyzed by static investigation module, dynamic analysis module, effectively improve test accuracy.

Description

Technical Field

[0001] This invention relates to the field of automotive temperature sensor testing and evaluation technology, and more specifically, to a test operation management system suitable for automotive temperature sensors. Background Technology

[0002] Automotive temperature sensors are a crucial component of automotive control systems. They monitor key parameters such as engine coolant, engine oil, and intake air temperature, providing data to the electronic control unit (ECU) to help control engine operation and fuel efficiency. Their response rate to temperature directly impacts the operation of the vehicle's cooling system. Before use, automotive temperature sensors undergo performance testing, primarily to assess their sensitivity and reliability.

[0003] Existing temperature sensor performance testing methods simulate the sensitivity of temperature sensors at the same or different temperatures. However, these methods are limited and lack necessary verification measures, which can easily lead to inaccurate temperature sensor test results.

[0004] To address these issues, we propose a test and operation management system suitable for automotive temperature sensors. Summary of the Invention

[0005] The purpose of this invention is to solve existing practical problems and provide a test and operation management system suitable for automotive temperature sensors compared with existing technologies.

[0006] The objective of this invention can be achieved through the following technical solution: a test operation management system for automotive temperature sensors, comprising a management platform, a static test module, a static troubleshooting module, a dynamic test module, a dynamic analysis module, and an early warning module;

[0007] The monitoring platform marks the temperature sensor to be tested as the test object, sets a test cycle, and divides the test cycle into multiple test points;

[0008] The static testing module is used to perform static test analysis on the test object: it obtains the actual ambient temperature value, the temperature detection value of the test object and the voltage value of the test object in a constant temperature environment, and performs a comprehensive analysis on the actual ambient temperature value, the temperature detection value of the test object and the voltage value of the test object to classify the test object into qualified objects and objects to be inspected.

[0009] The static screening module is used to perform secondary static test analysis on the objects to be inspected: it verifies the judgment of the objects to be inspected based on the test results, divides the objects to be inspected into qualified objects and unqualified objects, and sends the verification results to the early warning module;

[0010] The dynamic testing module is used to perform dynamic testing and analysis on qualified objects: multiple temperatures are selected as test temperatures and formed into a temperature measurement sequence. The qualified objects are tested according to the temperature measurement sequence to obtain dynamic performance coefficients. Based on the dynamic performance coefficients, it is determined whether the performance test of the qualified objects meets the requirements, and dynamic performance qualified signals and dynamic performance unqualified signals are generated and sent to the dynamic analysis module.

[0011] After receiving a dynamic performance failure signal, the dynamic analysis module determines the influencing factors that generated the dynamic performance failure signal and sends the determination result to the early warning unit.

[0012] As a preferred embodiment of the present invention, the static testing process of the test object includes: obtaining the actual ambient temperature value and the temperature detection value of the test object in a constant temperature environment; marking the absolute value of the difference between the actual ambient temperature value and the temperature detection value of the test object at the same test point as the absolute temperature difference; and summing the absolute temperature differences of multiple test points and taking the average value to obtain the temperature difference fluctuation value.

[0013] Obtain the voltage value of the test object in a constant temperature environment. Mark the absolute value of the difference between the voltage values ​​of the test object at two test points as the absolute voltage difference. Sum the absolute voltage differences of multiple test points and take the average value to obtain the voltage difference fluctuation value.

[0014] In a preferred embodiment of the present invention, the process of classifying test objects into qualified objects and objects to be inspected includes: comparing the temperature difference fluctuation value and the voltage difference fluctuation value with the temperature difference fluctuation threshold and the voltage difference fluctuation threshold stored in the management platform, respectively; when the temperature difference fluctuation value is less than or equal to the temperature difference fluctuation threshold and the voltage difference fluctuation value is less than or equal to the voltage difference fluctuation threshold, a normal signal is generated, and the test object corresponding to the normal signal is marked as a qualified object; otherwise, an abnormal signal is generated, and the test object is marked as an object to be inspected.

[0015] As a preferred embodiment of the present invention, the process of performing secondary static test analysis on the object under test includes: increasing the actual ambient temperature value to make the test environment reach a constant temperature, obtaining the actual ambient temperature value and the temperature detection value of the test object to generate a new temperature difference fluctuation value, obtaining the voltage value of the test object to generate a voltage difference fluctuation value, verifying the judgment of the object under test through the new temperature difference fluctuation value and voltage difference fluctuation value, and generating a verification pass signal and a verification fail signal.

[0016] When the temperature difference fluctuation value is less than or equal to the temperature difference fluctuation threshold and the voltage difference fluctuation value is less than or equal to the voltage difference fluctuation threshold, a verification pass signal is generated, and the object to be inspected is marked as a pass object; otherwise, a verification fail signal is generated, and the object to be inspected is marked as a fail object.

[0017] As a preferred embodiment of the present invention, the process of dynamically testing a qualified object includes: adjusting the ambient temperature to the first test temperature in the temperature measurement sequence; after the temperature detection value of the qualified object reaches the first test temperature value, instantly adjusting the first test temperature to the second test temperature; marking the time when the temperature detection data of the qualified object reaches the second test temperature as the thermal response time; obtaining multiple thermal response times in the temperature measurement sequence in this way; comparing the thermal response time with a preset thermal response time threshold; calculating the ratio between the number of thermal response times less than the preset thermal response time threshold and the total number; and marking it as the normal thermal response coefficient.

[0018] Multiple test points in the temperature measurement sequence are paired up to obtain a new test sequence. The voltage fluctuation value is calculated by the difference between the voltage values ​​of the two test objects in the first test sequence. At the same time, the temperature fluctuation value is calculated by the difference between the temperature values ​​of the two test objects in the first test sequence. The ratio between the voltage fluctuation value and the temperature fluctuation value is marked as the temperature coefficient. This process is repeated to obtain all the temperature coefficients in the test sequence. The multiple temperature coefficients are then combined into a set A. The temperature coefficient deviation value is calculated by the difference between the two consecutive temperature coefficients in set A.

[0019] The temperature coefficient deviation value is compared with the preset temperature coefficient deviation threshold. The ratio between the number of temperature coefficient deviation values ​​less than the preset temperature coefficient deviation threshold and the total number is calculated and marked as the normal linear coefficient. The normal thermal response coefficient and the normal linear coefficient are numerically calculated to obtain the dynamic performance coefficient. The dynamic performance coefficient is compared with the preset dynamic performance coefficient threshold to generate a dynamic performance qualified signal and a dynamic performance unqualified signal.

[0020] As a preferred embodiment of the present invention, the process of determining the influencing factors corresponding to the generation of dynamic performance failure signal includes: comparing the normal thermal response coefficient with a preset normal thermal response coefficient threshold to generate thermal response performance qualified signal and thermal response performance failure signal.

[0021] When the normal thermal response coefficient is within the preset normal thermal response coefficient threshold range, the ratio between the sum of the time differences of multiple thermal response times greater than the preset thermal response time threshold generated in the temperature measurement sequence and the number of thermal response times greater than the preset thermal response time threshold is calculated and marked as the thermal response time deviation coefficient. The thermal response time deviation coefficient is compared with the preset thermal response time deviation coefficient threshold, and a thermal response performance failure signal and a thermal response performance qualification signal are generated.

[0022] The normal linear coefficient is compared with the preset normal linear coefficient threshold to generate a dynamic voltage performance qualified signal and a dynamic voltage performance unqualified signal.

[0023] Compared with the prior art, the advantages of this invention are:

[0024] (1) This solution uses a static test module and a dynamic test module to perform static and dynamic performance tests on the temperature sensor respectively. The static test obtains the temperature difference fluctuation value and voltage difference fluctuation value of the temperature sensor under stable conditions. The test objects are divided into qualified objects and objects to be inspected based on the temperature difference fluctuation value and voltage difference fluctuation value, so as to screen them before dynamic testing. Then, the dynamic test obtains the normal thermal response coefficient and normal linear coefficient of the temperature sensor under unstable conditions. The normal thermal response coefficient and normal linear coefficient are used to generate the dynamic performance coefficient. The performance of qualified objects is judged based on the dynamic performance coefficient. The test is carried out from static to dynamic aspects. In addition, during the test, the static investigation module and the dynamic analysis module are used to verify and analyze the abnormal test results, which effectively improves the test accuracy.

[0025] (2) This scheme also uses a static screening module to perform a second static performance test on the object to be tested. The new temperature difference fluctuation value and voltage difference fluctuation value obtained are used to verify the judgment of the object to be tested and remove unqualified objects. The dynamic analysis module is used to determine the influencing factors corresponding to the dynamic performance failure signal generated by the dynamic test module. This process analyzes the normal thermal response coefficient and normal linear coefficient respectively, so as to accurately obtain the influencing factors of dynamic performance failure, so as to provide direction for subsequent optimization of temperature sensor based on the influencing factors. Attached Figure Description

[0026] Figure 1 This is an overall system block diagram of the present invention;

[0027] Figure 2 This is a system block diagram from Embodiment 1 of the present invention;

[0028] Figure 3 This is a system block diagram in Embodiment 2 of the present invention. Detailed Implementation

[0029] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0030] Example 1: This invention discloses a test and operation management system suitable for automotive temperature sensors. Please refer to [link / reference]. Figure 1It includes a management platform, a static testing module, a static investigation module, a dynamic testing module, a dynamic analysis module, and an early warning module. The monitoring platform marks the temperature sensor to be tested as the test object, sets a test cycle, and divides the test cycle into multiple test points.

[0031] Please see Figure 2 The static testing module is used to perform static test analysis on the test object within a test cycle: it obtains the actual ambient temperature value, the temperature detection value of the test object, and the voltage value of the test object at multiple test points in a constant temperature environment, performs comprehensive analysis on the actual ambient temperature value, the temperature detection value of the test object, and the voltage value of the test object, and classifies the test object into qualified objects and objects to be inspected based on the analysis results;

[0032] The specific static testing process includes: collecting the actual ambient temperature values ​​and the temperature detection values ​​of the test object at multiple test points in a constant temperature environment; marking the absolute value of the difference between the actual ambient temperature value and the temperature detection value of the test object at the same test point as the absolute temperature difference; summing the absolute temperature differences of multiple test points and taking the average value to obtain the temperature difference fluctuation value; the smaller the temperature difference fluctuation value, the more accurate the temperature sensor's temperature detection.

[0033] The voltage values ​​of the test object are collected at multiple test points in a constant temperature environment. The absolute value of the difference between the voltage values ​​of the test object at two consecutive test points is marked as the absolute voltage difference. The absolute voltage differences of multiple test points are summed and the average value is taken to obtain the voltage difference fluctuation value. The smaller the voltage difference fluctuation value, the smaller the deviation of the output voltage of the test object under the same temperature in multiple tests, reflecting that the temperature sensor output is more stable.

[0034] The static testing module compares the temperature difference fluctuation value and the voltage difference fluctuation value with the temperature difference fluctuation threshold and the voltage difference fluctuation threshold stored in the management platform, respectively. When the temperature difference fluctuation value is less than or equal to the temperature difference fluctuation threshold and the voltage difference fluctuation value is less than or equal to the voltage difference fluctuation threshold, a normal signal is generated, and the test object corresponding to the normal signal is marked as a qualified object. Otherwise, an abnormal signal is generated, and the test object corresponding to the abnormal signal is marked as an object to be inspected.

[0035] The dynamic testing module is used to perform dynamic testing and analysis on qualified objects within a test cycle. Multiple temperatures are selected as test temperatures within the test cycle and arranged into a temperature measurement sequence. Performance testing is then performed on the qualified objects according to this temperature measurement sequence. The specific process includes:

[0036] The ambient temperature is adjusted to the first test temperature in the temperature measurement sequence. After the temperature detection value of the qualified object reaches the first test temperature value, the first test temperature is instantly adjusted to the second test temperature. The time when the temperature detection data of the qualified object reaches the second test temperature is marked as the thermal response time. Multiple thermal response times in the temperature measurement sequence are obtained in this way. The thermal response time is compared with the preset thermal response time threshold. The ratio between the number of thermal response times less than the preset thermal response time threshold and the total number is calculated and marked as the normal thermal response coefficient. The larger the normal thermal response coefficient, the shorter the time required for the output temperature to reach a stable value when the qualified object changes from one temperature state to another. That is, when the temperature of the measured medium undergoes a step change, the temperature sensor reacts faster and has stronger performance.

[0037] Multiple test points in the temperature measurement sequence are paired up to obtain a new test sequence. The voltage fluctuation value is calculated by the difference between the voltage values ​​of the two test objects in the first test sequence. At the same time, the temperature fluctuation value is calculated by the difference between the temperature values ​​of the two test objects in the first test sequence. The ratio between the voltage fluctuation value and the temperature fluctuation value is marked as the temperature coefficient. This process is repeated to obtain all the temperature coefficients in the test sequence. The multiple temperature coefficients are then combined into a set A. The temperature coefficient deviation value is calculated by the difference between the two consecutive temperature coefficients in set A.

[0038] The temperature coefficient deviation value is compared with the preset temperature coefficient deviation threshold. The ratio between the number of temperature coefficient deviation values ​​less than the preset temperature coefficient deviation threshold and the total number is calculated and marked as the normal linearity coefficient. The larger the normal linearity coefficient, the smaller the change in temperature coefficient before and after, the better the linear relationship, indicating that the output voltage of the temperature sensor changes uniformly under different temperatures.

[0039] The dynamic performance coefficient is obtained by numerically calculating the normal thermal response coefficient and the normal linearity coefficient, as follows: The normal thermal response coefficient and the normal linearity coefficient are labeled RX and XS, respectively, and the dynamic performance coefficient DX is generated according to the formula. , where a1 and a2 represent the proportional coefficients of the normal thermal response coefficient and the normal linear coefficient, respectively, and α1 > α2 > 1;

[0040] The dynamic testing module obtains dynamic performance coefficients and determines whether the performance test of a qualified object meets the requirements based on these coefficients. The dynamic performance coefficients are compared with a preset dynamic performance coefficient threshold. When the dynamic performance coefficient is greater than or equal to the preset threshold, the performance test of the qualified object is deemed to meet the requirements. The larger the dynamic performance coefficient, the more the performance test of the qualified object meets the requirements, and a dynamic performance qualified signal is generated. When the dynamic performance coefficient is less than the preset threshold, the performance test of the qualified object is deemed to fail to meet the dynamic performance test requirements, a dynamic performance unqualified signal is generated, and the dynamic performance unqualified signal is sent to the dynamic analysis module.

[0041] Example 2: Please refer to Figure 3 The static testing module sends abnormal signals to the static investigation module, which is used to perform secondary static testing analysis on the object under test and verify the judgment of the object under test based on the test results.

[0042] The specific process includes: increasing the actual ambient temperature value during the test cycle to make the test environment reach a constant temperature, obtaining the actual ambient temperature values ​​of multiple test points and the temperature detection value of the test object to generate a new temperature difference fluctuation value, obtaining the voltage value of the test object at multiple test points to generate a voltage difference fluctuation value, and verifying the judgment of the test object through the new temperature difference fluctuation value and voltage difference fluctuation value.

[0043] When the temperature difference fluctuation value is less than or equal to the temperature difference fluctuation threshold and the voltage difference fluctuation value is less than or equal to the voltage difference fluctuation threshold, a verification pass signal is generated, and the object to be inspected is marked as a pass object. Conversely, a verification fail signal is generated, and the object to be inspected is marked as a fail object. At the same time, the verification result is sent to the early warning module. The early warning module displays the early warning content based on the verification fail signal and simultaneously sends the early warning content to the mobile terminal of the management personnel.

[0044] When the dynamic analysis module receives a dynamic performance failure signal, it determines the influencing factors that generated the dynamic performance failure signal.

[0045] The specific determination process includes:

[0046] The normal thermal response coefficient is compared with the preset normal thermal response coefficient threshold. When the normal thermal response coefficient is greater than the maximum value of the preset normal thermal response coefficient threshold range, a thermal response performance qualified signal is generated. When the normal thermal response coefficient is less than the minimum value of the preset normal thermal response coefficient threshold range, a thermal response performance unqualified signal is generated.

[0047] When the normal thermal response coefficient is within the preset normal thermal response coefficient threshold range, the ratio between the sum of the time differences of multiple thermal response times greater than the preset thermal response time threshold generated in the temperature measurement sequence and the number of thermal response times greater than the preset thermal response time threshold is calculated and marked as the thermal response time deviation coefficient. The thermal response time deviation coefficient is compared with the preset thermal response time deviation coefficient threshold. When the thermal response time deviation coefficient is greater than or equal to the preset thermal response time deviation coefficient threshold, a thermal response performance failure signal is generated; otherwise, a thermal response performance qualification signal is generated.

[0048] The normal thermal response coefficient is within the preset normal thermal response coefficient threshold range. Considering the time difference between the thermal response time and the preset thermal response time threshold, the larger the time difference, the longer the thermal response time reflected at two temperature test points, and the slower the temperature sensor response speed.

[0049] The normal linear coefficient is compared with a preset normal linear coefficient threshold. When the normal linear coefficient is greater than or equal to the preset normal linear coefficient threshold, a dynamic voltage performance qualified signal is generated.

[0050] When the normal linear coefficient is less than the preset normal linear coefficient threshold, a dynamic voltage performance failure signal is generated.

[0051] Finally, the judgment result is sent to the early warning unit. The early warning unit displays the generated signals of unqualified thermal response performance and unqualified dynamic voltage performance through early warning text and sends them to the mobile terminal of the management personnel at the same time, which can easily provide the management personnel with direction for optimizing the temperature sensor.

[0052] In summary, this invention utilizes static and dynamic testing modules to perform static and dynamic performance tests on temperature sensors. Static testing yields temperature difference and voltage difference fluctuations under stable conditions, which are then used to categorize test subjects into qualified and untested objects, thus enabling screening before dynamic testing. Dynamic testing then obtains the normal thermal response coefficient and normal linearity coefficient of the temperature sensor under unstable conditions, generating a dynamic performance coefficient. This dynamic performance coefficient is used to determine whether the qualified objects meet performance requirements. The invention employs a multi-faceted testing approach, from static to dynamic testing. Furthermore, during the testing process, a static screening module and a dynamic analysis module verify and analyze abnormal test results, effectively improving testing accuracy.

[0053] The above are merely preferred embodiments of the present invention; however, the scope of protection of the present invention is not limited thereto; any equivalent substitutions or modifications made by those skilled in the art within the technical scope disclosed in the present invention, based on the technical solution and its improved concept, should be covered within the scope of protection of the present invention.

Claims

1. A test and operation management system for automotive temperature sensors, characterized in that: It includes a management platform, a static testing module, a static investigation module, a dynamic testing module, a dynamic analysis module, and an early warning module; The monitoring platform marks the temperature sensor to be tested as the test object, sets a test cycle, and divides the test cycle into multiple test points; The static testing module is used to perform static test analysis on the test object: it obtains the actual ambient temperature value, the temperature detection value of the test object and the voltage value of the test object in a constant temperature environment, and performs a comprehensive analysis on the actual ambient temperature value, the temperature detection value of the test object and the voltage value of the test object to classify the test object into qualified objects and objects to be inspected. The static screening module is used to perform secondary static test analysis on the objects to be inspected: it verifies the judgment of the objects to be inspected based on the test results, divides the objects to be inspected into qualified objects and unqualified objects, and sends the verification results to the early warning module; The dynamic testing module is used to perform dynamic testing and analysis on qualified objects: multiple temperatures are selected as test temperatures and formed into a temperature measurement sequence. The qualified objects are tested according to the temperature measurement sequence to obtain dynamic performance coefficients. Based on the dynamic performance coefficients, it is determined whether the performance test of the qualified objects meets the requirements, and dynamic performance qualified signals and dynamic performance unqualified signals are generated and sent to the dynamic analysis module. After receiving a dynamic performance failure signal, the dynamic analysis module determines the influencing factors that generated the dynamic performance failure signal and sends the determination result to the early warning unit. The static testing process for the test object includes: obtaining the actual ambient temperature value and the test object temperature detection value in a constant temperature environment; marking the absolute value of the difference between the actual ambient temperature value and the test object temperature detection value at the same test point as the absolute temperature difference; and summing the absolute temperature differences of multiple test points and taking the average value to obtain the temperature difference fluctuation value. Obtain the voltage value of the test object in a constant temperature environment, mark the absolute value of the difference between the voltage values ​​of the test object at two consecutive test points as the absolute voltage difference, and sum the absolute voltage differences of multiple test points and take the average value to obtain the voltage difference fluctuation value. The process of classifying test objects into qualified objects and objects to be inspected includes: comparing the temperature difference fluctuation value and the voltage difference fluctuation value with the temperature difference fluctuation threshold and the voltage difference fluctuation threshold stored in the management platform, respectively. When the temperature difference fluctuation value is less than or equal to the temperature difference fluctuation threshold and the voltage difference fluctuation value is less than or equal to the voltage difference fluctuation threshold, a normal signal is generated, and the test object corresponding to the normal signal is marked as a qualified object. Otherwise, an abnormal signal is generated, and the test object is marked as an object to be inspected. The process of dynamic testing of qualified objects includes: adjusting the ambient temperature to the first test temperature in the temperature measurement sequence; after the temperature detection value of the qualified object reaches the first test temperature value, the first test temperature is instantly adjusted to the second test temperature; the time when the temperature detection data of the qualified object reaches the second test temperature is marked as the thermal response time; and so on to obtain multiple thermal response times in the temperature measurement sequence. The thermal response times are compared with a preset thermal response time threshold, and the ratio between the number of thermal response times less than the preset thermal response time threshold and the total number is calculated and marked as the normal thermal response coefficient. Multiple test points in the temperature measurement sequence are paired up to obtain a new test sequence. The voltage fluctuation value is calculated by the difference between the voltage values ​​of the two test objects in the first test sequence. At the same time, the temperature fluctuation value is calculated by the difference between the temperature values ​​of the two test objects in the first test sequence. The ratio between the voltage fluctuation value and the temperature fluctuation value is marked as the temperature coefficient. This process is repeated to obtain all the temperature coefficients in the test sequence. The multiple temperature coefficients are then combined into a set A. The temperature coefficient deviation value is calculated by the difference between the two consecutive temperature coefficients in set A. The temperature coefficient deviation value is compared with the preset temperature coefficient deviation threshold. The ratio between the number of temperature coefficient deviation values ​​less than the preset temperature coefficient deviation threshold and the total number is calculated and marked as the normal linear coefficient. The normal thermal response coefficient and the normal linear coefficient are numerically calculated to obtain the dynamic performance coefficient. The dynamic performance coefficient is compared with the preset dynamic performance coefficient threshold to generate a dynamic performance qualified signal and a dynamic performance unqualified signal.

2. The test and operation management system for automotive temperature sensors according to claim 1, characterized in that: The process of performing secondary static testing and analysis on the object under test includes: increasing the actual ambient temperature value to bring the test environment to a constant temperature, obtaining the actual ambient temperature value and the temperature detection value of the test object to generate a new temperature difference fluctuation value, obtaining the voltage value of the test object to generate a voltage difference fluctuation value, and verifying the judgment of the object under test through the new temperature difference fluctuation value and voltage difference fluctuation value to generate a verification pass signal and a verification fail signal.

3. The test and operation management system for automotive temperature sensors according to claim 2, characterized in that: The process of determining the influencing factors corresponding to the generation of dynamic performance failure signals includes: comparing the normal thermal response coefficient with the preset normal thermal response coefficient threshold to generate thermal response performance qualified signals and thermal response performance failure signals; When the normal thermal response coefficient is within the preset normal thermal response coefficient threshold range, the ratio between the sum of the time differences of multiple thermal response times greater than the preset thermal response time threshold generated in the temperature measurement sequence and the number of thermal response times greater than the preset thermal response time threshold is calculated and marked as the thermal response time deviation coefficient. The thermal response time deviation coefficient is compared with the preset thermal response time deviation coefficient threshold, and a thermal response performance failure signal and a thermal response performance qualification signal are generated. The normal linear coefficient is compared with the preset normal linear coefficient threshold to generate a dynamic voltage performance qualified signal and a dynamic voltage performance unqualified signal.

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