ICD driving chip CP test automation device

Abstract

The invention relates to the technical field of CP testing, in particular to an ICD drive chip CP testing automation device which comprises a CP testing cabinet, a mechanical arm and a wafer barrel are arranged in the CP testing cabinet, a testing assembly is installed in the CP testing cabinet and comprises a testing table, circulating pipes are fixedly installed in interlayers on the two sides of the testing table, and the circulating pipes are connected with the mechanical arm and the wafer barrel. According to the invention, the cold-heat conversion machine transmits hot air through the air inlet pipe and the circulating pipes to heat the test bench, the test bench is shut down after reaching a specified temperature and is tested again to verify the performance in a high-temperature environment, the test bench is cooled after the high-temperature test is qualified, and the test bench is connected with the cold-heat conversion machine through the air inlet pipe and the circulating pipes. Compared with a traditional normal temperature test, the reliability and stability of the ICD driving chip at the extreme temperature can be comprehensively evaluated, and it is ensured that the product adapts to different use scenes.

Description

Technical Field

[0001] This invention relates to the field of CP testing technology, specifically to an automated device for CP testing of ICD driver chips. Background Technology

[0002] The ICD driver chip CP testing automation device is an integrated system for automated electrical parameter and functional testing of chips at the wafer stage. Its core is to use an industrial-grade six-axis collaborative robotic arm to accurately remove uncut wafers from the wafer drum via a vacuum chuck, place them on the vacuum chuck of the test bench for fixation, and then the robotic arm grabs the ICD driver chip, precisely aligning its pins with the wafer probe card to trigger the wafer-level probes to perform parallel testing on the chip pins. Testers immediately determine the chip's passability based on preset thresholds, and finally complete the fully automated testing and sorting of wafer batches.

[0003] Currently, the testing method for ICD chips is traditional room temperature testing. In the traditional room temperature testing process, ICD driver chips can only be evaluated under normal temperature conditions. Since ICD driver chips tested at room temperature do not have reliability and stability at extreme temperatures, the chip's performance becomes unstable at extreme temperatures, leading to product failures. Consequently, it cannot be ensured that the product is suitable for different usage scenarios. Summary of the Invention

[0004] The purpose of this invention is to provide an automated testing device for ICD driver chips. The hot-cold converter transfers hot air through the air inlet and circulation pipes to heat the test bench. After reaching the specified temperature, the device stops and tests again to verify performance under high-temperature conditions. After passing the high-temperature test, the test bench is allowed to cool down. Then, cold air is transferred to cool it down to the specified low temperature before stopping and testing again to verify performance under low-temperature conditions. Compared with traditional room temperature testing, this device can comprehensively evaluate the reliability and stability of ICD driver chips under extreme temperatures, ensuring that the product is suitable for different application scenarios.

[0005] To achieve the above objectives, the present invention provides the following technical solution: an automated testing device for ICD driver chips (CP), comprising a CP testing cabinet, wherein a robotic arm and a wafer bucket are provided inside the CP testing cabinet, and a testing component is installed inside the CP testing cabinet. The testing component includes a testing platform, and circulation tubes are fixedly installed inside the interlayer on both sides of the testing platform. One end of each set of circulation tubes is connected to a collection box. An auxiliary component is installed on the CP testing cabinet, and the auxiliary component includes a bidirectional motor. One output end of the bidirectional motor is fixedly connected to a first connecting rod, and brush rods are fixedly connected to both sides of the first connecting rod. One end of the first connecting rod is connected to a connecting pipe via a synchronous belt. The connecting pipe is provided with multiple sets of nozzles, and one end of the connecting pipe is connected to a first pipe. One end of the first pipe is connected to an air pump, and the air pump is fixedly installed inside the collection box. The other output end of the bidirectional motor is fixedly connected to a reciprocating lead screw, and a piston block is slidably connected to the reciprocating lead screw. A piston tube is connected to the outer surface of the piston block, and a second pipe is connected to one side of the piston tube. One end of the second pipe is connected to the interior of the testing platform.

[0006] Preferably, the CP test cabinet is equipped with a conveyor belt, a glass door on one side of the CP test cabinet, a display on the other side of the CP test cabinet, and a temperature sensor inside the test bench.

[0007] Preferably, one end of each of the two sets of circulation pipes is connected to an air inlet pipe, one end of which penetrates one side of the CP test cabinet, and one end of which is externally connected to a heat exchanger.

[0008] Preferably, the other end of both sets of circulation pipes penetrates through the interlayer on both sides of the test bench and the interior of the CP test cabinet, and one end of the circulation pipe is connected to the interior of the collection box.

[0009] Preferably, one end of the first connecting rod penetrates the edge of the conveyor belt, and the first connecting rod and the brush rod are installed on one side of the conveyor belt, while the connecting tube is fixedly installed on the edge of the conveyor belt.

[0010] Preferably, one end of the connecting pipe passes through the frame of the conveyor belt, and one end of the connecting pipe is connected to a movable sleeve. The movable sleeve is fixedly installed on the frame of the conveyor belt. The movable sleeve has a groove inside, and one end of the connecting pipe has a convex ring that rotates inside the groove. One end of the movable sleeve is connected to one end of the first pipe.

[0011] Preferably, the other end of the first pipe penetrates the interior of the collection box, and the other end of the first pipe is fixedly connected to the air pump, and the collection box is fixedly installed on one side of the CP test cabinet.

[0012] Preferably, a threaded sleeve is slidably connected to the reciprocating lead screw, the reciprocating lead screw and the threaded sleeve are connected by a ball nut pair, and a piston block is fixedly installed on the outer surface of the threaded sleeve.

[0013] Preferably, one end of the reciprocating screw is fixedly connected to the inside of the piston tube, the piston tube is fixedly installed on the CP test cabinet, the piston block slides inside the piston tube, the piston tube is provided with two sets of sliding grooves, and the piston block is provided with protrusions on both sides of the two sets of sliding grooves.

[0014] Compared with the prior art, the beneficial effects of the present invention are:

[0015] 1. This invention uses a thermal converter to transfer hot air through an inlet pipe and a circulation pipe to heat the test bench. After reaching the specified temperature, the machine is stopped and tested again to verify the performance under high temperature conditions. After the high temperature test is passed, the test bench is cooled down, and then cold air is transferred to cool it down to the specified low temperature before stopping and testing again to verify the performance under low temperature conditions. Compared with traditional room temperature testing, this invention can comprehensively evaluate the reliability and stability of ICD driver chips under extreme temperatures, ensuring that the product is suitable for different application scenarios.

[0016] 2. In this invention, an air pump transmits gas from a collection box to a first pipe. The first pipe then transmits the gas through a movable sleeve to a connecting pipe. The gas inside the connecting pipe is sprayed onto the ICD driver chip through a nozzle. This serves two purposes: firstly, it assists in cleaning the ICD driver chip, preventing dust from remaining on it and affecting the ICD driver chip testing; secondly, the connecting pipe drives the nozzle to rotate, making the gas spray more even and preventing residual heat in the gas and directional gas spraying from causing localized temperature abnormalities in the ICD driver chip, thus affecting the ICD driver chip testing performance.

[0017] 3. In this invention, the reciprocating screw drives the piston block to reciprocate inside the piston tube via the threaded sleeve. The piston block transmits the gas inside the piston tube to the second pipe, and the second pipe transmits the gas to the test bench. After the auxiliary ICD driver chip passes the normal test at high temperature, the test bench is cooled to improve the test rate of the ICD driver chip. Attached Figure Description

[0018] Figure 1 This is one of the overall structural schematic diagrams of the present invention;

[0019] Figure 2 This is a second schematic diagram of the overall structure of the present invention;

[0020] Figure 3 This is a cross-sectional view of the overall structure of the present invention;

[0021] Figure 4 This is a cross-sectional view of the test component structure of the present invention;

[0022] Figure 5 This is a schematic diagram showing the connection between the test component and the auxiliary component of the present invention;

[0023] Figure 6 This is a cross-sectional view of the auxiliary component structure of the present invention;

[0024] Figure 7 For the present invention Figure 6 Enlarged view of the structure at point A in the middle;

[0025] Figure 8 This is a cross-sectional view of the piston tube structure of the present invention.

[0026] In the diagram: 1. CP test cabinet; 101. Robotic arm; 102. Wafer barrel; 103. Conveyor belt; 2. Test assembly; 201. Test bench; 202. Circulation pipe; 203. Air inlet pipe; 204. Collection box; 3. Auxiliary assembly; 301. Bidirectional motor; 302. First connecting rod; 303. Brush rod; 304. Synchronous belt; 305. Connecting pipe; 306. Nozzle; 307. Movable sleeve; 308. First pipe; 309. Air pump; 311. Reciprocating screw; 312. Piston tube; 313. Piston block; 314. Second pipe. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0028] See Figures 1 to 4 As shown, the present invention provides an automated testing device for ICD driver chip CP, including a CP testing cabinet 1. The CP testing cabinet 1 is equipped with a robotic arm 101 and a wafer bucket 102. The CP testing cabinet 1 is equipped with a testing component 2. The testing component 2 includes a testing table 201. Circulation tubes 202 are fixedly installed inside the interlayer on both sides of the testing table 201. One end of each of the two sets of circulation tubes 202 is connected to a collection box 204.

[0029] At the start of the test, the industrial-grade six-axis collaborative robotic arm 101 removes the uncut wafer from the wafer drum 102 using a vacuum suction cup and places it on the chuck of the test stage 201. The chuck fixes the wafer by vacuum suction. Then, the robotic arm 101 picks up the ICD driver chip from the conveyor belt 103 and places the ICD driver chip on the wafer probe. The wafer tests the pins of the ICD driver chip, and the tester observes the real-time data on the monitor to determine whether the ICD driver chip test results are qualified.

[0030] After the ICD driver chip passes the normal test at room temperature, the tester starts the external heat exchanger connected to the air inlet duct 203. The heat exchanger starts to transfer hot air, which flows through the two sets of circulation pipes 202 to heat the inside of the test bench 201, causing the temperature inside the test bench 201 to rise. After the temperature sensor inside the test bench 201 detects the specified temperature, the heat exchanger stops transferring hot air. At this time, the tester tests the ICD driver chip again through the wafer and judges whether the test result of the ICD driver chip in the high temperature environment is qualified by observing the display.

[0031] Once the ICD driver chip passes the normal high-temperature test, after the internal temperature of the test bench 201 drops to the normal temperature, the tester starts the external cooling and heating converter connected to the air inlet duct 203. The cooling and heating converter begins to transfer cold air, which flows through the two sets of circulation pipes 202 to cool down the inside of the test bench 201 and raise the internal temperature of the test bench 201. After the temperature sensor inside the test bench 201 detects the specified temperature, the cooling and heating converter stops transferring cold air. At this time, the tester tests the ICD driver chip again through the wafer and observes the display to determine whether the test result of the ICD driver chip under low-temperature conditions is qualified.

[0032] After the ICD driver chip passes the room temperature test, the hot and cold conversion machine transfers hot air through the air inlet pipe 203 and the circulation pipe 202 to heat up the test platform 201. After reaching the specified temperature, the machine stops and tests again to verify the performance under high temperature conditions. After passing the high temperature test, the test platform 201 is cooled down, and then cold air is transferred to cool it down to the specified low temperature before the machine stops and tests again to verify the performance under low temperature conditions. Compared with traditional room temperature testing, this method can comprehensively evaluate the reliability and stability of the ICD driver chip under extreme temperatures, ensuring that the product is suitable for different application scenarios.

[0033] After the hot and cold air is transferred through the two sets of circulation pipes 202, the hot and cold air is transferred to the collection box 204 for collection through one end of the two sets of circulation pipes 202.

[0034] See Figures 5 to 8As shown, the CP test cabinet 1 is equipped with an auxiliary component 3, which includes a bidirectional motor 301. One output end of the bidirectional motor 301 is fixedly connected to a first connecting rod 302. Brush rods 303 are fixedly connected to both sides of the first connecting rod 302. One end of the first connecting rod 302 is connected to a connecting pipe 305 via a synchronous belt 304. Multiple nozzles 306 are provided on the connecting pipe 305. One end of the connecting pipe 305 is connected to a first pipe 308. One end of the first pipe 308 is connected to an air pump 309. The air pump 309 is fixedly installed inside the collection box 204. The other output end of the bidirectional motor 301 is fixedly connected to a reciprocating screw 311. A piston block 313 is slidably connected to the reciprocating screw 311. A piston tube 312 is connected to the outer surface of the piston block 313. One side of the piston tube 312 is connected to a second pipe 314. One end of the second pipe 314 is connected to the inside of the test bench 201.

[0035] While the ICD driver chip is being transported on the conveyor belt 103, the tester starts the bidirectional motor 301. One end of the bidirectional motor 301 drives the brush rod 303 to rotate via the first connecting rod 302. The brush rod 303 cleans the conveyor belt 103 to prevent dust from the air from falling onto the conveyor belt 103 when it is not in use. When the ICD driver chip is being transported on the conveyor belt 103, dust can adhere to the ICD driver chip, which will affect the test of the ICD driver chip and lead to inaccurate test results.

[0036] When one end of the bidirectional motor 301 drives the brush rod 303 to rotate via the first connecting rod 302, the first connecting rod 302 drives the connecting pipe 305 to rotate via the synchronous belt 304. At this time, the tester starts the air pump 309. The air pump 309 transmits the gas from the collection box 204 to the inside of the first pipe 308. The first pipe 308 transmits the gas through the movable sleeve 307 to the connecting pipe 305. The gas transmitted inside the connecting pipe 305 is sprayed onto the ICD driver chip through the nozzle 306. On the one hand, this helps to clean the ICD driver chip and prevents dust from remaining on the ICD driver chip, which would affect the ICD driver chip test. On the other hand, because the convex ring at one end of the connecting pipe 305 moves in the groove inside the movable sleeve 307, the connecting pipe 305 drives the nozzle 306 to rotate, making the gas spray more even and preventing residual heat in the gas and directional gas spraying from causing local temperature abnormalities in the ICD driver chip, which would affect the ICD driver chip test performance.

[0037] When the bidirectional motor 301 drives the brush rod 303 to rotate via the first connecting rod 302, the bidirectional motor 301 also drives the reciprocating screw 311 to rotate. Since the reciprocating screw 311 is connected to the threaded sleeve through a ball nut pair and the protrusions on both sides of the piston block 313 slide on two sets of sliding grooves inside the piston tube 312, the reciprocating screw 311 drives the piston block 313 to reciprocate inside the piston tube 312 via the threaded sleeve. The piston block 313 transmits the gas inside the piston tube 312 to the second pipe 314, and the second pipe 314 transmits the gas to the test bench 201. After the auxiliary ICD driver chip passes the normal high-temperature test, the test bench 201 is cooled to improve the test rate of the ICD driver chip.

[0038] In an optional embodiment, the CP test cabinet 1 is equipped with a conveyor belt 103, a glass door is provided on one side of the CP test cabinet 1, a display is provided on the other side of the CP test cabinet 1, and a temperature sensor is provided inside the test bench 201.

[0039] It should be noted that the conveyor belt 103 is used to transport the ICD driver chip. The tester records the values ​​on the display and judges whether the results are qualified. The temperature sensor is used to detect the internal temperature of the test bench 201 in real time.

[0040] In an optional embodiment, one end of each of the two sets of circulation pipes 202 is connected to an air inlet pipe 203, one end of the air inlet pipe 203 penetrates one side of the CP test cabinet 1, and one end of the air inlet pipe 203 is externally connected to a heat exchanger.

[0041] It should be noted that after the ICD driver chip passes the room temperature test, the hot air converter transmits hot air through the air inlet pipe 203 and the circulation pipe 202 to the heating test bench 201 to a specified high temperature, then stops the machine and tests again to verify the high temperature performance. After the high temperature test passes, the temperature is lowered, and then cold air is transmitted to a specified low temperature before stopping the machine and testing again to verify the low temperature performance. This method can comprehensively evaluate the reliability and stability of the chip under extreme temperatures, ensuring that it can adapt to different scenarios.

[0042] In an optional embodiment, the other ends of both sets of circulation pipes 202 penetrate through the interlayer on both sides of the test bench 201 and the interior of the CP test cabinet 1, and one end of the circulation pipe 202 is connected to the interior of the collection box 204.

[0043] It should be noted that after the hot and cold air is transferred through the two sets of circulation pipes 202, the hot and cold air is transferred to the collection box 204 for collection through one end of the two sets of circulation pipes 202.

[0044] In an optional embodiment, one end of the first connecting rod 302 passes through the frame of the conveyor belt 103, and the first connecting rod 302 and the brush rod 303 are installed on one side of the conveyor belt 103, and the connecting tube 305 is fixedly installed on the frame of the conveyor belt 103.

[0045] It should be noted that the bidirectional motor 301 drives the brush rod 303 to rotate through the first connecting rod 302, and the brush rod 303 cleans the conveyor belt 103.

[0046] In an optional embodiment, one end of the connecting pipe 305 passes through the frame of the conveyor belt 103, and one end of the connecting pipe 305 is connected to a movable sleeve 307. The movable sleeve 307 is fixedly installed on the frame of the conveyor belt 103. The movable sleeve 307 has a groove inside, and one end of the connecting pipe 305 has a convex ring that rotates inside the groove. One end of the movable sleeve 307 is connected to one end of the first pipe 308.

[0047] It should be noted that, since the convex ring at one end of the connecting pipe 305 moves on the groove inside the movable sleeve 307, the connecting pipe 305 drives the nozzle 306 to rotate, making the gas spray more even.

[0048] In an optional embodiment, the other end of the first pipe 308 penetrates the interior of the collection box 204, and the other end of the first pipe 308 is fixedly connected to the air pump 309. The collection box 204 is fixedly installed on one side of the CP test cabinet 1.

[0049] It should be noted that the air pump 309 is fixed inside the collection box 204. Driven by the bidirectional motor 301, the air in the collection box 204 is transported to the inside of the connecting pipe 305 through the first pipe 308, and then evenly sprayed onto the surface of the ICD driver chip during transmission through the nozzle 306. This not only helps to clean the chip dust and prevent test errors, but also avoids local residual temperature abnormalities from affecting performance through even spraying.

[0050] In an optional embodiment, a threaded sleeve is slidably connected to the reciprocating lead screw 311, and the reciprocating lead screw 311 and the threaded sleeve are connected by a ball nut pair, and a piston block 313 is fixedly installed on the outer surface of the threaded sleeve.

[0051] It should be noted that since the reciprocating screw 311 is connected to the threaded sleeve through a ball nut pair, the reciprocating screw 311 drives the piston block 313 to reciprocate inside the piston tube 312 through the threaded sleeve.

[0052] In an optional embodiment, one end of the reciprocating screw 311 is fixedly connected to the inside of the piston tube 312. The piston tube 312 is fixedly installed on the CP test cabinet 1. The piston block 313 slides inside the piston tube 312. The piston tube 312 is provided with two sets of sliding grooves. Both sides of the piston block 313 are provided with protrusions that slide on the two sets of sliding grooves.

[0053] It should be noted that since the protrusions on both sides of the piston block 313 slide on the two sets of sliding grooves inside the piston tube 312, the reciprocating screw 311 drives the piston block 313 to reciprocate inside the piston tube 312 through the threaded sleeve.

[0054] Working principle: At the start of the test, the industrial-grade six-axis collaborative robotic arm 101 takes the uncut wafer from the wafer drum 102 through a vacuum suction cup and places it on the chuck of the test stage 201. The chuck fixes the wafer by vacuum suction. Then, the robotic arm 101 picks up the ICD driver chip from the conveyor belt 103 and places the ICD driver chip on the wafer probe. The wafer tests the pins of the ICD driver chip. The tester observes the real-time data on the monitor and judges whether the ICD driver chip test result is qualified.

[0055] After the ICD driver chip passes the room temperature test, the hot and cold conversion machine transfers hot air through the air inlet pipe 203 and the circulation pipe 202 to heat up the test platform 201. After reaching the specified temperature, the machine stops and tests again to verify the performance under high temperature conditions. After passing the high temperature test, the test platform 201 is cooled down, and then cold air is transferred to cool it down to the specified low temperature before the machine stops and tests again to verify the performance under low temperature conditions. Compared with traditional room temperature testing, this method can comprehensively evaluate the reliability and stability of the ICD driver chip under extreme temperatures, ensuring that the product is suitable for different application scenarios.

[0056] After the hot and cold air is transferred through the two sets of circulation pipes 202, the hot and cold air is transferred to the collection box 204 for collection through one end of the two sets of circulation pipes 202.

[0057] While the ICD driver chip is being transmitted on the conveyor belt 103, the tester starts the bidirectional motor 301. One end of the bidirectional motor 301 drives the brush rod 303 to rotate through the first connecting rod 302, and the brush rod 303 cleans the conveyor belt 103.

[0058] When one end of the bidirectional motor 301 drives the brush rod 303 to rotate via the first connecting rod 302, the first connecting rod 302 drives the connecting pipe 305 to rotate via the synchronous belt 304. At this time, the tester starts the air pump 309. The air pump 309 transmits the gas passing through the collection box 204 to the inside of the first pipe 308. The first pipe 308 transmits the gas through the movable sleeve 307 to the connecting pipe 305. The gas transmitted inside the connecting pipe 305 is sprayed onto the ICD driver chip through the nozzle 306.

[0059] When the bidirectional motor 301 drives the brush rod 303 to rotate via the first connecting rod 302, the other end of the bidirectional motor 301 drives the reciprocating screw 311 to rotate. Since the reciprocating screw 311 is connected to the threaded sleeve through the ball nut pair and the protrusions on both sides of the piston block 313 slide on the two sets of sliding grooves inside the piston tube 312, the reciprocating screw 311 drives the piston block 313 to reciprocate inside the piston tube 312 through the threaded sleeve. The piston block 313 transmits the gas inside the piston tube 312 to the second pipe 314, and the second pipe 314 transmits the gas to the test bench 201 to cool the inside of the test bench 201.

[0060] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An automated testing device for ICD driver chips, comprising a CP testing cabinet (1), wherein the CP testing cabinet (1) is equipped with a robotic arm (101) and a wafer bucket (102), characterized in that, The CP test cabinet (1) is equipped with a test component (2), which includes a test bench (201). Both sides of the test bench (201) are fixedly installed with circulation pipes (202), and one end of each of the two sets of circulation pipes (202) is connected to a collection box (204). The CP test cabinet (1) is equipped with an auxiliary component (3), which includes a bidirectional motor (301). One output end of the bidirectional motor (301) is fixedly connected to a first connecting rod (302). Brush rods (303) are fixedly connected to both sides of the first connecting rod (302). One end of the first connecting rod (302) is connected to a connecting pipe (305) via a synchronous belt (304). The connecting pipe (305) is equipped with multiple sets of nozzles (306). One end of the connecting pipe (305) is connected to a first pipe (306). 8) One end of the first pipe (308) is connected to an air pump (309), the air pump (309) is fixedly installed inside the collection box (204), the other output end of the bidirectional motor (301) is fixedly connected to a reciprocating screw (311), a piston block (313) is slidably connected on the reciprocating screw (311), a piston tube (312) is connected to the outer surface of the piston block (313), a second pipe (314) is connected to one side of the piston tube (312), and one end of the second pipe (314) is connected to the inside of the test bench (201).

2. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, The CP test cabinet (1) is equipped with a conveyor belt (103), a glass door is provided on one side of the CP test cabinet (1), a display is provided on the other side of the CP test cabinet (1), and a temperature sensor is provided inside the test bench (201).

3. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, Both sets of circulation pipes (202) are connected to an air inlet pipe (203) at one end. One end of the air inlet pipe (203) passes through one side of the CP test cabinet (1), and one end of the air inlet pipe (203) is connected to a heat exchanger.

4. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, The other ends of the two sets of circulation pipes (202) are connected to the interlayer on both sides of the test bench (201) and the interior of the CP test cabinet (1), and one end of the circulation pipe (202) is connected to the interior of the collection box (204).

5. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, One end of the first connecting rod (302) passes through the frame of the conveyor belt (103), and the first connecting rod (302) and the brush rod (303) are installed on one side of the conveyor belt (103), and the connecting tube (305) is fixedly installed on the frame of the conveyor belt (103).

6. The automated testing device for ICD driver chip CP according to claim 5, characterized in that, One end of the connecting pipe (305) passes through the frame of the conveyor belt (103), and one end of the connecting pipe (305) is connected to a movable sleeve (307). The movable sleeve (307) is fixedly installed on the frame of the conveyor belt (103). The movable sleeve (307) has a groove inside. One end of the connecting pipe (305) has a convex ring that rotates inside the groove. One end of the movable sleeve (307) is connected to one end of the first pipe (308).

7. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, The other end of the first pipe (308) penetrates the inside of the collection box (204), and the other end of the first pipe (308) is fixedly connected to the air pump (309). The collection box (204) is fixedly installed on one side of the CP test cabinet (1).

8. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, A threaded sleeve is slidably connected to the reciprocating lead screw (311), and the reciprocating lead screw (311) and the threaded sleeve are connected by a ball nut pair. A piston block (313) is fixedly installed on the outer surface of the threaded sleeve.

9. The automated testing device for ICD driver chip CP according to claim 1, characterized in that, One end of the reciprocating screw (311) is fixedly connected to the inside of the piston tube (312). The piston tube (312) is fixedly installed on the CP test cabinet (1). The piston block (313) slides inside the piston tube (312). The piston tube (312) is provided with two sets of sliding grooves. Both sides of the piston block (313) are provided with protrusions that slide on the two sets of sliding grooves.

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