Semiconductor silicon wafer detector intelligent training and dynamic knowledge management method

Abstract

The invention relates to an intelligent training and dynamic knowledge management method for semiconductor silicon wafer detection personnel, which belongs to the technical field of semiconductor silicon wafer operation training and comprises the following operation steps of: 1, generating a personalized training course through a dynamic case library; and 2, providing a resident help entry to solve the problem in real time. And 3, supporting employees to submit experience and automatically pushing the experience in a standardized manner. A closed-loop and self-evolution intelligent system is constructed, a dynamic case library is used as a core knowledge carrier, and whole-process management from personalized training to real-time work assistance and then to experience precipitation and knowledge updating is achieved. The core idea of the method is to systematically convert experience of employees with deep qualification and new problems encountered by new employees into reusable and pushable standardized knowledge, so that talent training is accelerated, and the overall detection level and quality are improved.