Sample changer for x-ray device

Abstract

The invention relates to an X-ray analysis device having a sample changer comprising a tray rotatable about an axis of rotation Y, the tray having a plurality of sample positions arranged in a circular pattern, the tray being driven by a motor, characterized in that the sample changer comprises a telescopic arm, the telescopic arm has a drive system designed to perform a linear reciprocating translational motion in a Z direction perpendicular to the axis of rotation Y, and on which there is arranged a gripper designed to pick up the sample from the tray and carry the sample to a measurement chamber in the X-ray apparatus and back; and the telescopic arm is arranged in an XZ plane perpendicular to the rotation axis Y and radially points to the periphery from the center of the tray. Such a non-complex mechanism allows pre-selection of samples and positioning of the samples beside the loading opening, such that time-consuming measurements are less. The invention also relates to a sample changer for an X-ray analysis device and to a method for carrying out X-ray measurements.

Description

Technical Field

[0001] The present invention relates to an X-ray analysis apparatus having a sample changer comprising a tray rotatable about a rotation axis Y, the tray having a plurality of sample positions arranged in a circular pattern, the rotatable tray being driven by a motor to rotate the tray about the rotation axis Y of the sample positions. Background Technology

[0002] This X-ray analysis device is shown in BRUKER's manual "SKYSCAN 1272 CMOS Edition" (=Reference [1]) or manual "SKYSCAN 1275" (=Reference [2]).

[0003] Generally, this invention relates to the field of X-ray analysis for providing rapid routine examination of samples of various materials. Thus, X-ray fluorescence, X-ray diffraction, or other X-ray analytical methods are used to study the characteristics of material samples. The material samples can be solid materials in bulk or powder form, but can also be fluids in suitable containers.

[0004] One particularly powerful technique in X-ray analysis is 3D X-ray microscopy (3D XRM), also known as “microCT,” as described, for example, in references [1] and [2]. MicroCT is one of the most advanced methods for obtaining 3D insights into samples of any material, shape, or size with little or no sample preparation. Conventional microscopy uses light or electron beams to image samples directly by refocusing radiation through them, or alternative microscopy techniques, such as atomic force microscopy (“AFM”), use other sensors to probe the sample surface. These techniques can provide detailed local 2D images of surface or near-surface structure or properties. However, X-ray microscopy can also image 3D internal structures, measuring the entire sample at once and immediately, thus avoiding tedious sample preparation that could alter or even destroy the sample. In particular, the “SkyScan1275” device described in reference [2] is specifically designed for rapid scanning and obtaining high-quality results that are critical for scientific research and industrial applications such as quality control or production process monitoring.

[0005] For these purposes, general-purpose X-ray analysis equipment must offer a high level of automation. In such routine inspections, a large number of samples must be measured within a short timeframe. Therefore, a sample changer facility for selecting the sample to be measured from multiple other samples to be inspected at different times is crucial for the rapid transport and accurate positioning of the sample currently being measured.

[0006] A sample changer for an X-ray analysis apparatus that was an early and relatively slow-moving device is described in DE 198 51 501 C1 (= Reference [3]). Here, different ferromagnetic sample holders are held by an electromagnet and demagnetized after being placed in their measurement positions.

[0007] US 6,111,930 A (=Reference [4]) discloses a linear automatic sample changer for an X-ray diffractometer. There is no rotating sample tray and the sample cannot be rotated.

[0008] CN 113960081 A (= Reference [5]) shows another linear sample holder that provides vertical lifting of the sample to its measurement position. Similarly, there is no rotating sample tray and the sample cannot be rotated.

[0009] CN 218995266 U (= Reference [6]) discloses a rotating sample tray. The sample is placed on a rotating plate but is not picked up and transferred to the measuring chamber. Sample picking is done from the top. No end effector is provided within the rotating sample changer to load the sample into the measuring device.

[0010] CN 106383134 A (= Reference [7]) describes a sample changer having a platform that rotates the sample and brings it into the measurement position. Sample pickup and placement are not addressed here.

[0011] In US D715,958 S (=Reference [8]), sample pickup is again performed from the top of the device. Nothing is disclosed about an end effector or similar device housed within the sample changer.

[0012] CN 103344659 A (= Reference [9]) describes the vertical descent of a sample into a transfer tube. Similarly, nothing is disclosed about an end effector or similar device housed within the sample changer. Furthermore, no rotating element is provided in the device.

[0013] US 2014 / 0123738 A1 (=Reference

[10] ) discloses a sample changer that can receive a sample holder. The changer includes a circular tray having through holes for receiving the holder. It is associated with a lifting column operated by a motor that moves the circular tray vertically. A second motor rotates the circular tray. The circular tray is movable in terms of rotation and vertical translation, but the document does not mention any means for sample transport. However, the sample is placed on a rotating plate but is not picked up and transferred to the measuring chamber.

[0014] The existing Bruker micro-CT sample changers cited above for the SkyScan 1272 (see reference [1]) and SkyScan 1275 (see reference [2]) describe a versatile device that relies on mechanical principles to ensure sample handling and imaging. At its core, the system features a robotic arm mechanism designed for precision and reliability. The robotic arm is equipped with a dedicated end effector that is adept at safely gripping a variety of sample holders. The arm’s movements are determined by a programmed sequence that guides the arm between the sample loading tray and the imaging chamber. Inside the imaging chamber, the SkyScan 1272 or SkyScan 1275 performs a scan of the sample. The robotic arm places each sample in the optimal position for imaging, ensuring consistent results across multiple scans. This automation significantly reduces the need for manual intervention, freeing up valuable time for researchers to focus on data analysis and interpretation. The sample changer is designed as a top-loading device, meaning that the rotating disk / tray is located in a compartment placed on top of the instrument.

[0015] Execute the following sequence:

[0016] - Rotate the sample tray / pallet to the requested position.

[0017] - Sample pick-up holder (with sample on top)

[0018] -Retract the robotic arm from the tray / pallet

[0019] - Move the robotic arm downwards

[0020] - Move the rotary table to the handover position.

[0021] - Open the instrument's automatic door

[0022] - Insert the sample onto the rotary table using a robotic arm.

[0023] - to lower the sample

[0024] -Retract the robotic arm

[0025] - The automatic door of the instrument closes.

[0026] - Perform a scan.

[0027] The disadvantage of this known mechanism is:

[0028] - The instrument blocks the entrance to the sample chamber and the field of view of the micro-CT system because the lifting mechanism covers the instrument door.

[0029] -Bulky instrument (lifting platform)

[0030] - If mounted on top of the instrument, it is difficult to equip the sample changer with a sample.

[0031] - Difficult to install

[0032] - Complex motion, the sample trajectory from the sample tray to the inspection chamber

[0033] - The long stroke of the lifting platform takes a long time to transport samples. Summary of the Invention

[0034] In view of this, the object of the present invention is to provide a universal and compact sample changer with minimal technical effort, particularly designed for XRM (X-ray microscopy) benchtop setups, and which can be front-loaded compared to known sample changers. This novel sample changer should be easy to use and readily applicable to various locations due to its small and compact construction. Furthermore, the sample changer should include a relatively uncomplicated mechanism. The device should also provide the possibility of pre-selecting the sample and positioning it beside the loading opening to minimize time-consuming measurements.

[0035] This objective is achieved according to the invention and in a surprisingly simple and effective manner by modifying a general X-ray analysis apparatus with a sample changer as defined in the first paragraph above, wherein the sample changer includes a telescopic arm having a drive system designed to perform linear reciprocating translational motion in the Z direction perpendicular to the rotation axis Y, and an end effector arranged on the telescopic arm designed to pick up a sample from a tray and carry the sample into the measurement chamber of the X-ray analysis apparatus and return; and the telescopic arm is arranged in an XZ plane perpendicular to the rotation axis Y and points radially outward from the center of the rotatable tray.

[0036] This invention provides a sample changer, which is specifically designed for microCT desktop systems. In principle, it is a novel “variation” of the “rotary” sample changer known according to references [1] or [2], with the advantage that when the sample changer is installed, the instrument’s door is not covered, thus preventing access to the sample chamber.

[0037] In addition, the sample changer includes a non-complex mechanism with a simple telescopic arm that performs only linear motion and a rotatable tray for selecting the sample.

[0038] The sample changer according to the present invention offers many significant advantages:

[0039] Improved efficiency

[0040] The sample changer automates the process of loading and positioning samples for imaging, significantly reducing the time and effort required by researchers. This increased efficiency allows for higher throughput, enabling the imaging of more samples in a shorter amount of time.

[0041] Consistency and accuracy

[0042] By utilizing a telescopic arm and a programmed sequence, this novel sample changer ensures continuous and precise sample positioning within the imaging chamber. This consistency is crucial for obtaining reliable and reproducible results across multiple scans. Compared to existing technologies, it eliminates the need for precision-manufactured robotic arms that must perform a series of different movements to load the sample.

[0043] Minimize the risk of sample damage

[0044] The automated processing provided by this new sample changer reduces the risk of sample damage or mishandling that can occur during manual loading and positioning. This is especially important when handling fragile or valuable samples.

[0045] Customization and flexibility

[0046] Sample changers typically offer options for customizable sample positioning and imaging configurations, allowing researchers to tailor the system to their specific experimental needs. This flexibility enables wide-ranging applications across various fields, from materials science to biology.

[0047] Unmanned operation

[0048] Once the new sample changer is in place, the user can initiate imaging and leave the system unattended, freeing up time for other tasks. This is particularly advantageous for long-duration experiments or nighttime scans.

[0049] Streamlined workflow

[0050] The integration of this novel sample changer into the micro-CT system simplifies the overall imaging workflow, thereby reducing the need for manual intervention and streamlining the process from sample preparation to data acquisition.

[0051] Overall, the sample changer according to the invention enhances the capabilities of micro-CT systems by improving efficiency, accuracy and flexibility, ultimately enabling researchers to conduct more complex experiments and obtain higher quality data.

[0052] A further significant advantage of the present invention is:

[0053] • Compact design (pick-up and placement mechanism within a turntable / circular sample tray)

[0054] - The telescopic arm is used to extend the reach.

[0055] - The turntable / circular tray rotates around the telescopic arm

[0056] • Fewer complex movements

[0057] - A telescopic arm with an end effector to pick up and move samples placed within the circumference of a turntable / circular sample tray.

[0058] - The telescopic arm is stationary—it does not rotate or lift, but extends only along a horizontal stationary axis to retrieve and retract the sample for collection.

[0059] - The turntable / circular tray is fixed vertically (and cannot be lifted).

[0060] - An integrated mechanism to lift the sample at the pickup position so that it can be picked up by the telescopic arm.

[0061] • Easy to equip with a sample changer; tray mounted on the front of the instrument.

[0062] • Easy to install

[0063] • Short trips take very little time.

[0064] Since measurement times during CT scans can be relatively long, this novel sample changer allows for pre-classification or positioning of the sample carrier, enabling subsequent loading steps to be performed more quickly. This is likely because the sample changer according to the invention can move independently of the enclosed measurement chamber. The rotating sample tray and telescopic arm are located outside the measurement chamber and can place the sample at different positions on the tray.

[0065] The main concept of this invention is to design a compact pick-and-place mechanism—a front loader for transporting samples to the main system—installed within a circular sample tray, which still allows access to the sample chamber when mounted on the main system. This concept eliminates the need for a lifting mechanism that obstructs access to the sample changer and impairs manual single-scan operations.

[0066] The sample changer can be easily installed on an X-ray device without additional alignment procedures. The changer can also be retrofitted to an X-ray device.

[0067] Preferred embodiments and further developments of the present invention

[0068] In a particularly preferred embodiment of the invention, one end of the telescopic arm is positioned substantially at the center of the rotatable tray and originates from the rotation axis Y of the sample position pattern, and the drive system is arranged along the telescopic arm in a Z direction perpendicular to the rotation axis Y.

[0069] The telescopic arm passes through the center of the tray, but the movement does not necessarily originate from the center. Positioning the telescopic arm in the center of the rotary table saves space, allowing for a compact design. Depending on the shape of the arm, the end effector can move above the tray, or the tray may have a loading slot (described in detail below) that allows the telescopic arm to pass through.

[0070] An advantageous embodiment of the invention is characterized in that the sample changer is arranged in front of the X-ray analysis apparatus such that the measurement chamber can be linearly approached in the Z direction by a telescopic arm, preferably through a gate.

[0071] Therefore, the sample changer is suitable for use in conjunction with an X-ray device equipped with a device door or gate to prevent X-ray radiation leakage from the device. Preferably, the X-ray source is turned off during sample loading into and unloading from the CT device. Alternatively, a gate can be provided for cases where a fragile X-ray source needs to be kept open during loading / unloading.

[0072] In a preferred further development of this type of embodiment, the sample changer includes: at least two fixing devices, particularly anchors, arranged on a base plate, the fixing devices being designed to engage with corresponding parts, particularly pins, on the base plate of the X-ray analysis apparatus during linear movement of the sample changer toward the X-ray analysis apparatus; and a latching element for securing the sample changer to the X-ray analysis apparatus.

[0073] Installation is simple because the position of this novel sample changer is defined by three fixed "anchors" beneath the main system in the substrate. The fork-shaped anchors engage in corresponding reverse shapes (e.g., pins) via a sliding motion. After engagement, the sample changer is secured in place by a latching mechanism. No further alignment procedures are required. Existing, prior art sample changers require alignment every time they are installed.

[0074] In another, relatively compact and simple embodiment, the sample changer for the X-ray analysis apparatus, preferably an X-ray diffractometer or CT device according to the invention is characterized in that the sample changer further includes a plurality of sample holders for carrying the object to be analyzed, the sample holders being designed to mate with sample positions, wherein the sample positions are through holes in protrusions, recesses or rotatable trays in which the user can position the sample.

[0075] In a preferred embodiment, the sample changer includes a pair of clamping jaws having mechanisms for clamping and opening the jaws to releasably lock the sample holder in a position on a rotatable tray when the telescopic arm approaches or retracts.

[0076] Furthermore, it keeps the sample holder in place during scanning, for example, when the sample holder is prone to wobbling during turntable rotation. The clamping arm is preferably an additional electromechanical assembly with automatically driven clamping jaws. This device is preferably mounted on a rotatable tray.

[0077] The following further developments of these embodiments are preferred, wherein the sample holder includes a circumferential edge or edge into which a telescopic arm can engage to elevate the holder, and the end effector has a fork-shaped design for engaging the sample holder.

[0078] Alternatively or commonly, in a further advantageous variation of these embodiments, the sample changer further includes a lifting mechanism for elevating the sample or sample holder for pickup by the end effector. This additional lifting mechanism elevates the sample holder approximately 1 cm to a pickup position where the forks of the telescopic arm can engage.

[0079] Also advantageous is the following alternative embodiment of the invention, characterized in that the sample holder includes a circumferentially tapered portion, and the end effector is designed as an end effector or clamp that lifts the sample holder when pressed together.

[0080] Here, the fork can be replaced by an end effector, and the sample holder is provided with a tapered feature, such that the arm of the end effector squeezes the tapered area of ​​the sample holder, which is then automatically lifted by a gripping motion. This means that a separate lifting mechanism is not required. Instead, an end effector is needed to squeeze the arm.

[0081] A further advantageous embodiment of the invention features a rotating tray comprising a slot that allows a telescopic arm to pass through the slot into the X-ray analysis apparatus in the Z direction. This provides the possibility of pre-selecting samples and positioning them beside the loading slot, which is beneficial for less time-consuming measurements. Optionally, a holding slot can be kept empty, i.e., without a sample holder, to allow the sample changer to perform advanced loading of subsequent samples during the measurement time of the previous sample.

[0082] Also within the scope of this invention is a method for performing X-ray measurements, comprising the following steps:

[0083] i. Providing an X-ray analysis apparatus according to the invention as described above, wherein at least one of the positions of the rotatable tray of the sample changer and the scanning position within the measuring instrument is vacant;

[0084] ii. Load the X-ray analysis apparatus with the sample, begin the measurement, and place the next sample to be scanned on the first side of the input slot, ensuring that there is an empty space on the second side of the input slot for placing the measured sample.

[0085] By pre-sorting samples near the input slot, the time required for tray rotation for unloading and loading is minimized.

[0086] The following further development of the method is preferred, wherein step ii. is performed by the following sub-steps:

[0087] ii.1) Before measuring the first sample:

[0088] a) Rotate the rotatable tray so that the first sample to be measured is in front of the end effector of the telescopic arm.

[0089] b) Pick up the first sample and place it into the X-ray analysis apparatus;

[0090] ii.2) Begin measuring the first sample;

[0091] ii.3) During the measurement of the first sample:

[0092] a) Rotate the rotatable tray to the position of the subsequent sample (second object) to be measured, pick up the sample and place it in the empty first position next to the input slot;

[0093] ii.4) After measuring the first sample:

[0094] a) Pick up the first sample from the X-ray analysis apparatus and position it in the empty position on the second side of the input slot.

[0095] b) Rotate the rotatable tray to the first side of the input slot that is filled with subsequent samples, pick up the sample, and place it into the X-ray analysis apparatus.

[0096] c) Rotate the rotatable tray to the second side of the input slot, pick up the sample and place it in the empty position on the rotatable tray;

[0097] ii.5) Repeat steps ii.1) to ii.4) until each sample has been measured.

[0098] The preferred variant of this further development includes the initial step ii.1.1.a) when the scanning position within the measuring instrument is occupied by another sample that is not the first sample to be scanned, clearing the scanning position within the measuring instrument by picking up the sample and placing it in an empty position on a rotatable tray.

[0099] Alternatively or commonly, a further advantageous variation includes step ii.3.1.a): if the position next to the first side of the input slot is not vacant, the rotatable tray is turned to that position, the sample is picked up and placed in the vacant position on the rotatable tray.

[0100] Another variation of the above-described further embodiment of the invention is characterized by including step ii.3.2): if the position next to the second side of the input slot is not vacant, the rotatable tray is turned to that position, the sample is picked up and placed in the vacant position on the rotatable tray.

[0101] Further advantages can be extracted from the description and accompanying drawings. The features mentioned above and below can be used individually or collectively in any combination according to the invention. The mentioned embodiments should not be construed as exhaustive, but rather as exemplary features used to describe the invention. Attached Figure Description

[0102] The invention is illustrated in the accompanying drawings and explained in more detail based on illustrative embodiments.

[0103] In the attached diagram:

[0104] Figure 1a An isometric view from above is shown of an embodiment of a sample changer for an X-ray analysis apparatus according to the present invention;

[0105] Figure 1b As shown Figure 1a The sample changer shown is without a top cap;

[0106] Figure 1c As shown Figure 1b The sample changer shown is without a rotatable tray and its inner and outer housings;

[0107] Figure 1d As shown Figure 1c The sample changer shown is rotated 90° around the rotation axis Y and has no additional housing or mounting parts;

[0108] Figure 1e As shown Figure 1b The sample changer shown has a rotatable tray with two sample holders, one of which is held by a fork-shaped end effector.

[0109] Figure 1f A partial view of a sample changer with clamping arms for a sample holder is shown.

[0110] Figures 2a-2g The turntable of the rotatable tray in different working positions is schematically shown, thus illustrating the loading / unloading of samples by simple direct loading / unloading;

[0111] Figures 3a-3ac The turntable of a rotatable tray in different working positions is schematically shown, thereby illustrating a more advanced and efficient loading / unloading of samples by means of a novel method according to the invention; and

[0112] Figure 4a , 4b The diagram schematically illustrates a turntable of a rotatable tray that performs the restoration of the original sequence. Detailed Implementation

[0113] This invention relates primarily to providing improved tools and methods for performing scientific and industrial X-ray investigations. In particular, the invention proposes an X-ray analysis apparatus having a sample changer 10 comprising a tray 11 rotatable about a rotation axis Y, the tray having a plurality of sample positions 12 arranged in a circular pattern, the rotatable tray 11 being driven by a motor to rotate the tray 11 about the rotation axis Y of the sample position pattern.

[0114] Figures 1a to 1f An embodiment of a novel sample changer 10 according to the present invention is schematically depicted. The sample changer includes a telescopic arm 13 having a drive system designed to perform linear reciprocating translational motion in the Z direction perpendicular to the rotation axis Y. An end effector 14 is arranged on the telescopic arm 13, the end effector being designed to pick up a sample from a tray 11, carry the sample to a measurement chamber in an X-ray analysis apparatus, and return. The telescopic arm 13 is arranged in an XZ plane perpendicular to the rotation axis Y and points radially outward from the center of the rotatable tray 11.

[0115] The telescopic arm 13 transports the sample into the instrument. The telescopic arm performs a linear reciprocating motion in a single direction, which is the loading direction, defined here as the Z-axis perpendicular to the rotation axis Y.

[0116] A preferred fork-shaped end effector 14 is arranged on top of the telescopic arm 13 and grasps the sample contained in the sample holder.

[0117] One end of the telescopic arm 13 is substantially positioned at the center of the rotatable tray 11 and originates from the rotation axis Y of the sample position pattern, and the drive system is arranged along the telescopic arm 13 in the Z direction.

[0118] The sample changer 10 is positioned in front of the X-ray analysis apparatus, allowing the measurement chamber to be linearly approached in the Z-direction by the telescopic arm 13, preferably via a gate (not shown in the figures). Furthermore, the sample changer 10 includes: at least two fixing devices 15, particularly anchors, arranged on a base plate 16, designed to engage corresponding elements (particularly pins) on the base plate 16 of the X-ray analysis apparatus during the linear movement of the sample changer 10 toward the X-ray analysis apparatus; and a latching element 17 for securing the sample changer 10 to the X-ray analysis apparatus. The latching element 17 is part of a clamping device mounted on the rotary table 11 of the CT instrument. It is necessary to ensure that the sample holder is properly secured within the scanner.

[0119] exist Figure 1eThe figure shows two sample holders 18 for carrying an object to be analyzed, designed to mate with a sample position 12, wherein the sample position 12 is a protrusion or through-hole in a rotatable tray 11. The sample holders 18 include circumferential edges or margins 18a, and an end effector 14 has a fork-shaped design for engaging the sample holders 18. Furthermore, the sample holders 18 may include a circumferential tapered portion (not shown in the figures), and the end effector 14 may be designed as a clamp to lift the sample holders 18 when pressed together.

[0120] like Figure 1c and 1d As shown, the sample changer 10 may include a lifting mechanism 19 for lifting the sample or sample holder 18 to be picked up by the end effector 14. The lifting mechanism 19 preferably lifts the sample by about 10 mm so that it can be picked up by the fork.

[0121] Figure 1a , 1b Figure 1e shows the input slot 20 included in the Z direction of the rotatable tray 11, thereby allowing the telescopic arm 13 with end effector 14 to pass through the input slot 20 into the X-ray analysis apparatus.

[0122] As described above, the sample changer 10 includes a rotatable tray 11 (also referred to as a "turntable") on which a sample holder 18 with a sample can be positioned. The rotatable tray 11 or turntable rotates about a fork-shaped end effector 14 that moves only laterally.

[0123] Depending on the samples used, tray 11 can be adapted to carry up to, for example, 60 samples at a time, preferably between 10 and 20 samples, and in the most preferred embodiment, 15 samples. It is recommended to implement multiple layers in the sample changer 10 to increase the total number of samples by stacking samples in the sample holder. Depending on how many can be stacked, the number becomes double, triple, etc. A double layer increases the number of samples to 30, and a third layer increases it to 45.

[0124] The sample tray 11 is essentially a tray with holes 12 into which the user can insert sample holders 18, each containing a sample, one by one. There are no borders / walls around it—the lid or sample tray cover can be completely removed—so samples can be placed on the turntable from above or the side.

[0125] In this embodiment, the rotatable tray 11 is adapted for CT measurement and has 15 holes for receiving sample holders with a diameter of 5 cm. The distance between the sample holders extends to 7.5 cm.

[0126] According to the invention, the device further includes a telescopic arm 13 for picking up the sample holder 18 and loading it into the X-ray apparatus. The telescopic arm 13 has a fork-shaped end effector 14 that engages with the edge of the sample holder 18. By performing a simple translational movement, the arm 13 can carry the sample holder 18 from the tray 11 to the measurement chamber of the X-ray apparatus and back.

[0127] Therefore, this invention proposes a novel pick-and-place device within the circumference of a circular sample tray, the pick-and-place device having a telescopic arm for conveying samples to and retracting them from the main instrument. This pick-and-place device is located between samples and at the level of the sample tray.

[0128] The drive mechanism can be, for example, a gear drive or a toothed belt drive (with a stepper motor or a DC motor), but it can also be a hydraulic or pneumatic cylinder.

[0129] The lifting mechanism can be driven by a stepper motor. This mechanism uses a simple worm gear / worm wheel drive and a rod with a cam follower to lift the platform, as shown in the figure.

[0130] In an alternative embodiment, the lift can be driven by the movement of an arm / fork. In this case, the lifting mechanism includes a platform with a chamfered portion, and the platform lifts the lift as the slider with the fork moves toward the sample.

[0131] Figures 2a to 2g This schematic illustrates loading / unloading different samples (only 15 samples in this example) via a simple direct load / unload process. In this simple direct load / unload scheme, samples are picked up and loaded / unloaded "one after another" from their positions, as defined in the scanner's batch processing. The process does not necessarily need to be performed in the order of position / sample.

[0132] Figure 2a The initial setup is shown, with the turntable positioned at the gap location [0] = insertion slot. All samples {1-15} are located in their respective sample positions [1-15].

[0133] Figure 2b The turntable is shown rotating to the position actually requested [3].

[0134] Figure 2c The image shows the end effector moving onto sample {3} and the fork of the end effector being lifted.

[0135] Figure 2d The end effector retracts, and sample {3} is held in the fork.

[0136] Figure 2eThe turntable is shown rotating into the insertion slot [0], and the sample {3} is still held in the fork.

[0137] Figure 2f The insertion fork is shown, and the sample {3} is inserted into the measurement area of ​​the X-ray analysis apparatus and placed inside the apparatus together with its sample holder.

[0138] Figure 2g The end effector with the empty fork is shown retracted while the sample {3} is in the measurement position within the X-ray analysis apparatus; the end effector and its empty fork wait in their position for the purpose of returning the sample {3} from the measurement position within the X-ray analysis apparatus after measurement and transporting it back to its initial position on the turntable [3].

[0139] Figures 3a to 3aa The illustration schematically shows an advanced and more efficient loading / unloading process for different samples (again, only 15 samples in this example) that can be achieved through a novel modification of the sample changer (10) according to the invention. In this advanced loading / unloading scheme, samples are picked up and loaded / unloaded one by one from their positions, as defined in the batch processing of a scanner. Although the process is not very simple, it allows for significantly faster execution of successive scans by making reasonable use of (otherwise lost) scan time to place the next sample in the optimal position.

[0140] The process includes the following steps:

[0141] • When located near loading slots, picking up and loading / unloading from their current positions one by one is fast.

[0142] However, the farther the position is from the insertion slot [0], the longer it takes for the turntable to rotate.

[0143] • This extra time is dead time that users may not want to spend.

[0144] • Advanced (Effective) Loading

[0145] • Introduce load and unload locations.

[0146] • When performing a scan on a sample, the sample changer rearranges the samples on the turntable, so that

[0147] • The location

[15] (unload) is always free.

[0148] • Position [0] (Loading) is always loaded with the next sample to be scanned.

[0149] Figure 3aThe initial setup is shown, with the turntable positioned at location [0] where the gap is located. Location [0] is the loading, unloading, and insertion slot. All samples {1-15} are placed in their respective initial positions [1-15].

[0150] Figure 3b The diagram illustrates the measurement of sample {3} at the measurement location within the X-ray analysis apparatus. During a simple loading process, the sample changer will simply remain idle and wait, thus... Figure 2g The device demonstrates a simple method for unloading sample {3}. Instead of doing so, the device performs the following steps:

[0151] Figure 3c The process of parking sample {1} from loading slot [1] to the idle position of sample {3} currently being scanned is shown, and the turntable rotates to the loading position [1].

[0152] Figure 3d The grasping of sample {1} is shown. For simplicity, all necessary sub-steps for describing each action are omitted here, i.e.,

[0153] • Move the fork onto the sample.

[0154] • Lifting fork

[0155] • Retract the fork.

[0156] Figure 3e The image shows the turntable rotating to an idle position of the sample {3} currently being scanned [3].

[0157] Figure 3f The sample {1} is shown to be positioned at location [3]. For simplicity, all necessary sub-steps for describing each action are omitted here, i.e.,

[0158] • Move the fork onto the slot.

[0159] • Lower the forklift.

[0160] • Retract the fork.

[0161] Figure 3g The diagram illustrates the beginning of placing the next sample {6} to be scanned on the loading position [1] by rotating the turntable to the position of the next sample {6} to be scanned while the sample {3} is still in the measurement position within the X-ray analysis apparatus [6]. In practice, the order in which the samples are scanned is irrelevant and can be configured individually.

[0162] Figure 3h The image shows a sample being grasped using an end effector {6}.

[0163] Figure 3iIt is shown that the turntable was rotated to the loading position while the sample {6} was still in the fork of the end effector [1].

[0164] Figure 3j The sample {6} is shown resting on the loading slot [0].

[0165] Figure 3k The diagram shows the start of releasing the unloading position and parking the sample {15} on the position [6] of the next sample {6} to be scanned, while the sample {3} is still in the measurement position within the X-ray analysis apparatus, i.e., the tray rotates to unload the sample {15} from its current position

[15] .

[0166] Figure 3l The image shows the fork gripping the sample {15} and lowering the end effector.

[0167] Figure 3m This shows the rotation of the turntable to position [6] (the original position of the next sample [6] to be scanned, which is now in position [1]) while sample {15} is still on the fork of the end effector.

[0168] Figure 3n The sample {15} is shown parked at position [6].

[0169] Figure 3o The image shows the turntable rotating to the insertion position [0].

[0170] Figure 3p The image shows the use of an end effector to grasp a measured sample {3} at a measurement position within an X-ray analysis apparatus. For simplicity, all necessary sub-steps describing each action are omitted here, i.e.,

[0171] • Move the fork to the measuring position via position [0].

[0172] • Lower the forklift.

[0173] • Move the fork onto sample {3}.

[0174] • Lifting fork

[0175] • Retract the fork.

[0176] Figure 3q The end effector with the measured sample {3} is shown being lowered from the measurement position within the X-ray analysis apparatus into the turntable.

[0177] Figure 3r It is shown that the turntable rotates to position

[15] (the original slot of sample

[15] , which is actually stopped in position [6]) while sample {3} is still in the fork of the end effector.

[0178] Figure 3s The recently scanned sample {3} is shown parked at the unloading position

[15] .

[0179] Figure 3t The turntable is shown rotating to the loading position [1], and the fork of the end effector is currently empty.

[0180] Figure 3u The image shows the capture of the next sample {6} to be scanned from the parking position of the next sample {6} in position [1] (sample {1} is parked in position [3]).

[0181] Figure 3v This shows the turntable rotating to the insertion position [0] while the next sample {6} to be scanned is still held by the fork.

[0182] Figure 3w The diagram illustrates the insertion of the sample {6} into the measurement position within the X-ray analysis apparatus by an end effector for scanning. For simplicity, all necessary sub-steps describing each action are omitted here, i.e.,

[0183] • Move the fork to the measuring position of the device via position [0].

[0184] • Lower the forklift.

[0185] • Move the fork onto the turntable.

[0186] • Lifting fork

[0187] • Retract the fork.

[0188] Figure 3x This shows that for subsequent scans, the following steps are always the same:

[0189] 1. Place the next sample {11} to be scanned on the loading position [1].

[0190] 2. Place the sample {15} that is parked at position [6] into the empty position

[11] of the next sample {11} to be scanned.

[0191] 3. Place the sample {1} from the parking position [3] onto the position [6] of the sample {6} currently being scanned.

[0192] 4. Make room for unloading

[15] and place the most recently scanned sample{3} in its original position[3].

[0193] Figure 3y It shows the execution Figure 3x The situation following the steps shown. The device is ready to place sample {6} in the unloading position

[15] and insert the next sample from the loading position [1].

[0194] Figure 3z This illustrates the alternative in the case where the last sample to be scanned is a sample from the unloading location

[15] . Figure 3x The process:

[0195] 1. Place the next sample to be scanned {15} (which is currently resting on the slot [6] of the sample {6} being scanned) on the loading position [1].

[0196] 2. Place the sample {1} from the parking position [3] onto the position [6] of the sample {6} currently being scanned.

[0197] 3. Make room for unloading

[15] and place the most recently scanned sample{3} in its original position[3].

[0198] Figure 3aa It shows the execution Figure 3z The situation after the steps shown.

[0199] Figure 3ab This illustrates the alternative in the case where the sample to be scanned is a sample from the loading location [1]. Figure 3x The process:

[0200] 4. Place the next sample {1} to be scanned (which is currently parked in the slot [3] of the most recently scanned sample {3}) in the loading position [1].

[0201] 5. Make room for unloading

[15] and place the most recently scanned sample{3} in its original position[3].

[0202] Figure 3ac It shows the execution Figure 3ab The situation after the steps shown.

[0203] Figures 4a-4b After the final measurement, the sample is restored to its original position, i.e.

[0204] 6. Place the sample {1}, which was initially located on the loading slot [1] at the beginning of the sequence, back to its original position.

[0205] 7. Clear the unloading position and place the most recently scanned sample in its original position[3], which was occupied by the sample from the loading tank.

[0206] 8. Place the next sample from the unloading slot

[15] back into its original position.

[0207] 9. Return the last scanned sample, still in the scanner, to its original position, which was occupied by the sample from the unloading slot.

[0208] List of reference numerals in the attached diagram:

[0209] 10 Sample Changers

[0210] 11 Rotatable trays

[0211] 12 Sample Positions

[0212] 13 telescopic boom

[0213] 14 end effector

[0214] 15 Fixtures

[0215] 16 base plate

[0216] 17 latching elements

[0217] 18 sample holders

[0218] 18a Sample holder edge or margin

[0219] 19 Lifting Mechanisms

[0220] 20 input slots

[0221] 21 clamping claws

[0222] X is perpendicular to the directions Y and Z.

[0223] Y-tray rotation axis

[0224] The axis of the reciprocating translational motion of the Z-arm telescopic arm

[0225] Prior art citations:

[0226] Consider publications used to assess the patentability of this invention:

[0227] [1] BRUKER Manual “SKYSCAN 1272 CMOS Version; 3D X-ray Microscopy Solution”, by Bruker BioSpin, T186803, June 2021

[0228] [2] BRUKER Manual “SKYSCAN 1275; Fast, Automated, Desktop X-ray Miniature Computed Tomography Scanner”, by Bruker microCT, Belgium, 2016

[0229] [3]DE 198 51 501 C1

[0230] [4]US 6,111,930 A

[0231] [5]CN 113960081 A

[0232] [6]CN 218995266 U

[0233] [7]CN 106383134 A

[0234] [8]US D715,958 S

[0235] [9]CN 103344659 A

[0236]

[10] US 2014 / 0123738 A1

Claims

1. An X-ray analysis device with a sample changer (10) comprising a rotatable tray (11) rotatable about a rotation axis Y, the tray having a plurality of sample positions (12) arranged in a circular pattern, the rotatable tray (11) being driven by a motor to rotate the tray (11) about the rotation axis Y of the sample position pattern, characterized in that the sample changer (10) comprises a telescopic arm (13) having a drive system designed to perform a linear reciprocating translation motion in a Z direction perpendicular to the rotation axis Y, and on the telescopic arm (13) is arranged an end effector (14) designed to pick up a sample from the tray (11) and carry it to a measurement chamber in the X-ray analysis device and back; and the telescopic arm (13) is arranged in an XZ plane perpendicular to the rotation axis Y and points radially from the center of the rotatable tray (11) to the periphery.

2. The X-ray analysis apparatus according to claim 1, characterized in that One end of the telescopic arm (13) is arranged substantially in the center of the rotatable tray (11) and from the rotation axis Y of the sample position pattern; and the drive system is arranged along the telescopic arm (13) in a Z direction perpendicular to the rotation axis Y.

3. The X-ray analysis device according to any one of the preceding claims, characterized in that The sample changer (10) is arranged in front of the X-ray analysis device so that the measurement chamber can be linearly approached by the telescopic arm (13) in the Z direction, preferably through a gate.

4. The X-ray analysis apparatus according to claim 3, characterized in that The sample changer (10) comprises at least two fixation means (15), in particular anchors, arranged on a base plate (16), designed to engage with corresponding means, in particular pins, on a base plate (16) of the X-ray analysis device in linear motion of the sample changer (10) to the X-ray analysis device; and a latching element (17) for fixing the sample changer (10) to the X-ray analysis device.

5. A sample changer (10) for an X-ray analysis device according to any one of the preceding claims, preferably an X-ray diffractometer or a CT device, characterized in that The sample changer (10) further comprises a plurality of sample holders (18) for carrying objects to be analyzed and designed to cooperate with the sample positions (12), wherein the sample positions (12) are protrusions or through-holes in the rotatable tray (11).

6. The sample changer (10) according to claim 5, characterized in that The sample changer (10) comprises a pair of clamping jaws (21) with a mechanism for clamping and opening the jaws (21) to releasably lock the sample holders (18) in position on the rotatable tray (11) when the telescopic arm (13) is approached or retracted.

7. The sample changer (10) according to claim 5 or 6, characterized in that The sample holders (18) comprise a circumferential rim or edge (18a) and the end effector (14) has a fork design to engage the sample holders (18).

8. The sample changer (10) according to any one of claims 5 to 7, characterized in that The sample changer (10) further comprises a lifting mechanism (19) for lifting a sample or sample holder (18) to be picked up by the end effector (14).

9. The sample changer (10) of an X-ray analysis device according to any one of the preceding claims, characterized in that The sample holders (18) comprise a circumferential conical portion and the end effector (14) is an actively driven end effector, preferably designed as a clamp to lift the sample holders (18) when pressed together.

10. The sample changer (10) according to any one of the preceding claims, characterized in that The rotatable tray (11) further comprises an input slot (20) allowing the telescopic arm (13) to enter the X-ray analysis device through the input slot (20) in the Z direction.

11. A method for performing X-ray measurements, comprising the steps of: i. providing an X-ray analysis device according to any one of claims 1 to 4, wherein all sample positions (12) of the rotatable tray (11) of the sample changer (10) and at least one of the scanning positions within the measurement instrument are free; ii. loading the X-ray analysis device with a sample, starting the measurement, and placing the next sample to be scanned on the first side of the input slot (20) and ensuring that a free position for placing a measured sample is present on the second side of the input slot (20).

12. The method for performing an X-ray measurement according to claim 11, wherein, Step ii. is performed by the following sub-steps: ii.1) before measuring the first sample: a) turning the rotatable tray (11) so that the first sample to be measured is in front of the end effector (14) of the telescopic arm (13), b) picking up the first sample and placing it into the X-ray analysis device; ii.2) starting the measurement of the first sample; ii.3) during the measurement of the first sample: a) turning the rotatable tray (11) to the position of the subsequent sample (second object) to be measured, picking up this sample and placing it into the free first position next to the input slot (20); ii.4) after the measurement of the first sample: a) picking up the first sample from the X-ray analysis device and positioning it into the free position on the second side of the input slot (20), b) turning the rotatable tray (11) to the first side of the input slot (20) that has been filled with the subsequent sample, picking up this sample and placing it into the X-ray analysis device; c) turning the rotatable tray (11) to the sample position next to the second side of the input slot (20), picking up this sample and placing it into the free position on the rotatable tray (11); ii.5) repeating steps ii.1) to ii.4) until each sample has been measured.

13. The method for performing an X-ray measurement according to claim 12, wherein, The method further comprises an initial step ii.1.1.a) of emptying the scanning position within the measurement instrument by picking up another sample than the first sample to be scanned and placing it into a free position on the rotatable tray (11) when the scanning position within the measurement instrument is occupied by this sample.

14. The method for performing an X-ray measurement according to claim 12 or 13, wherein, The method further comprises a step ii.3.1.a) of turning the rotatable tray (11) to the sample position next to the first side of the input slot (20) if this position is not free, picking up this sample and placing it into a free sample position on the rotatable tray (11).

15. The method for performing an X-ray measurement according to any one of claims 12 to 14, wherein, The method further comprises a step ii.3.2) of turning the rotatable tray (11) to the sample position next to the second side of the input slot (20) if this position is not free, picking up this sample and placing it into a free sample position on the rotatable tray (11).

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