Wireless module test equipment
Patent Information
- Application Number
- CN202511339709.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-19
- Publication Date
- 2026-01-13
Smart Images
Figure CN121333431A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The application relates to the technical field of serial port modules, in particular to a wireless module testing device. BACKGROUND
[0002] A wireless module, also known as a wireless communication module, is a hardware device that integrates wireless communication functions. It has a built-in wireless communication protocol stack and radio frequency circuit, and can realize wireless communication between devices. The main function of the wireless module is to simplify the development process of wireless communication. Developers do not need to design wireless communication circuits and protocol stacks from scratch. They only need to transmit data and configure through the interface provided by the module.
[0003] With the rapid development of the Internet of Things industry, wireless modules with UART interfaces are increasingly used in IoT markets such as air conditioners, refrigerators, and other white goods. During production and testing of wireless modules in module factories, the UART interface of the module is used in conjunction with a test board, tooling, and a USB-to-UART serial port board connected to a computer to achieve testing. However, when testing the module using the existing testing method, the test pins on the tooling are already in an electrified state (derived from the serial port board) before they come into contact with the module, such as a voltage of 3.3V. This can cause voltage glitches when the module test point mechanically contacts the pins, exceeding the voltage supported by the module chip (typically 3.6V), resulting in damage to the module or reduced performance, causing defective modules on the production line, and even defective modules shipped to the end user.
[0004] Therefore, there is an urgent need to design a more advanced module testing method to solve the problem of wireless module damage or performance degradation caused by voltage integration in the prior art. SUMMARY
[0005] The application aims to provide a wireless module testing device. A new serial port board for wireless module testing is designed, and a delay circuit is added to the serial port board. When the wireless module is pressed on the tooling, the module power supply path and the UART interface path are delayed to connect, realizing voltage-free pressing operation of the wireless module, and avoiding the problem of wireless module damage or performance degradation.
[0006] To achieve the above-mentioned purpose, the application provides the following technical solutions: The application provides a wireless module testing device, which can at least include: a test tooling and a target serial port board; The target serial port board is connected to the test tooling, and the target serial port board is connected to an upper computer. The test tooling is connected to the wireless module to be tested. The target serial port board is used to provide delayed power to the wireless module under test, ensuring that the wireless module under test is pressed against the test pin of the test fixture under no voltage conditions.
[0007] Preferably, the target serial port board may include a main functional circuit and a delay power supply circuit that are electrically connected to each other; The delayed power supply circuit is used to provide a delayed enable signal to the main functional circuit, so that the data signal path and power supply path in the main functional circuit are turned on with a delay.
[0008] Preferably, the ports of the target serial port board may include a UART receive port, a UART transmit port, a power port, a signal trigger port, and a ground port; the signal trigger port is used to send a trigger signal to the delay power supply circuit. The UART receiving port of the target serial port board is connected to the UART transmitting port of the wireless module under test through the test fixture. The UART transmitting port of the target serial port board is connected to the UART receiving port of the wireless module under test through the test fixture. The power port of the target serial port board is connected to the power port of the wireless module under test through the test fixture. The signal trigger port of the target serial port board is connected to the ground port of the wireless module under test through the test fixture. The ground port of the target serial port board is connected to the ground port of the wireless module under test through the test fixture.
[0009] Preferably, when the wireless module under test is pressed against the test pin of the test fixture, the signal trigger port is grounded and a low voltage signal is sent to the delay power supply circuit; The delayed power supply circuit, based on the low voltage signal, uses a reset chip to send an enable signal to the on / off switches on the data signal path and the power supply path after a delay, so that the data signal path and the power supply path are turned on after a delay.
[0010] Preferably, the delay power supply circuit may include a NOT gate chip, a first reset chip, and a second reset chip; The first terminal of the NOT gate chip is connected to the signal trigger port, and the second terminal of the NOT gate chip is connected to the first terminal of the first reset chip. The second terminal of the first reset chip is connected to the first terminal of the second reset chip, and the third terminal of the first reset chip is connected to the main functional circuit. The second terminal of the second reset chip is connected to the main functional circuit.
[0011] Preferably, the main functional circuit may include a serial port chip, an analog switch, a load switch, and a DC-DC module; The first end of the serial port chip is connected to the host computer via a USB interface, the second end of the serial port chip is connected to the first end of the analog switch, the second end of the analog switch is connected to the third end of the first reset chip, and the third end of the analog switch is connected to the UART port of the wireless module under test via the test fixture. The first end of the load switch is connected to the host computer via a USB interface, the second end of the load switch is connected to the second end of the second reset chip, the third end of the load switch is connected to the first end of the DC-DC module, and the fourth end of the load switch is connected to the power port of the wireless module under test via the test fixture; the second end of the DC-DC module is connected to the power port of the wireless module under test via the test fixture.
[0012] Preferably, when the wireless module under test is pressed against the test pin of the test fixture, the NOT gate chip receives a low-level signal; The NOT gate chip outputs a high level to the first reset chip, and the first reset chip sends a high level signal to the analog switch and the second reset chip respectively according to a first delay; After receiving the high-level signal sent by the first reset chip, the second reset chip sends a high-level signal to the load switch according to the second delay.
[0013] Preferably, when the first reset chip and the second reset chip have the same model, the first delay is equal to the second delay.
[0014] Preferably, both the first delay and the second delay are 240ms.
[0015] Preferably, the DC-DC module is an adjustable output voltage module; the output voltage range of the DC-DC module is 1.8V to 4V.
[0016] Compared with existing technologies, the present invention provides a wireless module testing device, which involves setting up at least a test fixture and a target serial port board; connecting the target serial port board to the test fixture and the target serial port board to a host computer; and pressing the test fixture with the wireless module under test. The target serial port board is used to provide delayed power to the wireless module under test, ensuring that the wireless module under test is pressed with the test pins of the test fixture under no-voltage conditions. When the corresponding test point of the module makes mechanical contact with the pin connected to the target serial port board, the pins are not immediately energized; instead, there is a delay of at least 240ms before voltage is applied. This achieves voltage-free pressing operation, avoiding the problem of overvoltage during the module pressing process that could damage the module or cause performance degradation. Attached Figure Description
[0017] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this invention, illustrate exemplary embodiments of the invention and are used to explain the invention, but do not constitute an undue limitation of the invention. In the drawings: Figure 1 This is a schematic diagram of the test hardware connection structure in the existing wireless module production line testing technology. Figure 2 This is a schematic diagram showing the connection between the wireless module and the serial port board during testing on a wireless module production line in the existing technology. Figure 3 This is a schematic diagram of the internal circuit structure of the serial port board in the testing of a wireless module production line in the prior art; Figure 4 This is a schematic diagram of the main structure of a wireless module testing device provided by the present invention; Figure 5 This is a schematic diagram of the main structure of the target serial port board of a wireless module testing device provided by the present invention; Figure 6 This is a schematic diagram showing the connection between the wireless module and the target serial port board in a wireless module testing device provided by the present invention.
[0018] Figure labels: 400-Test fixture, 500-Target serial port board, 510-Delay power supply circuit, 520-Main function circuit. Detailed Implementation
[0019] To facilitate a clear description of the technical solutions in the embodiments of the present invention, the terms "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect. For example, the first threshold and the second threshold are merely used to distinguish different thresholds and do not limit their order. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and the terms "first" and "second" are not necessarily different.
[0020] It should be noted that in this invention, the terms "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in this invention should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.
[0021] In this invention, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding related objects have an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can represent: a, b, c, a combination of a and b, a combination of a and c, a combination of b and c, or a, b, and c, where a, b, and c can be single or multiple.
[0022] Currently, commonly used wireless module testing equipment utilizes the module's UART interface during module manufacturing, along with a test board, fixtures, and a USB-to-UART serial port board connected to a computer for testing. Please refer to [link / reference]. Figures 1 to 3 , Figure 1 This is a schematic diagram of the test hardware connection structure in the existing wireless module production line testing technology. Figure 2 This is a schematic diagram showing the connection between the wireless module and the serial port board during testing on a wireless module production line in the existing technology. Figure 3 This is a schematic diagram of the internal circuit structure of the serial port board used in the testing of wireless module production lines in the prior art.
[0023] exist Figure 1 In this system, the wireless module uses a UART communication interface. There are test points on the bottom of the module. During production testing, a host computer communicates with the module via a USB-to-UART serial port board. The serial port board controls the module to perform various tests and acquire test data. Figure 2 The connection method between the wireless module and the serial port board for quality inspection during production line testing is shown; that is, the VCC interface of the wireless module test point is connected to the 3.3V interface of the serial port board, the GND interface of the wireless module test point is connected to the GND interface of the serial port board, the UART_TX interface of the wireless module test point is connected to the UART_RX interface of the serial port board, and the UART_RX interface of the wireless module test point is connected to the UART_TX interface of the serial port board.
[0024] Furthermore, during mass production on the production line, the wireless module test points are connected to the serial port board via pins, a test board, and a wiring harness. The internal circuit structure block diagram of the serial port board is shown below. Figure 3As shown, the built-in DC-DC converter transforms the 5V power supply from the USB to 3.3V to power the module. The USB DM / DP signal is converted into a UART signal, which communicates with the module's UART. After the module is placed in the fixture and pressed into position, the module's test points make full contact with the ejector pins, the circuit is connected, and the test is initiated. Because the power, UART_TX, and UART_TX pins on the fixture are already energized (from the serial port board) at 3.3V before contacting the wireless module, voltage spikes may occur when the module's test points make mechanical contact with the ejector pins. These spikes may exceed the voltage supported by the wireless module chip (generally 3.6V), damaging the wireless module, causing module defects on the production line, or even defective units shipped to end users.
[0025] Based on this, the present invention provides a wireless module testing device. By adding a delayed power supply circuit to the serial port board, it realizes the wireless module without voltage, thus solving the problem of overvoltage during the module pressing process that damages the module or causes a decrease in module performance.
[0026] The technical solution of the present invention will now be described in detail with reference to the accompanying drawings: Please see Figure 4 , Figure 4 This is a schematic diagram of the main structure of a wireless module testing device provided by the present invention.
[0027] exist Figure 4 In this context, wireless module testing equipment may include at least: The test fixture 400 and the target serial port board 500 are used. The target serial port board 500 is connected to the test fixture 400 and to the host computer. The test fixture 400 is pressed together with the wireless module under test. The target serial port board 500 is used to provide delayed power to the wireless module under test to ensure that the wireless module under test is pressed together with the test pins of the test fixture 400 under no voltage conditions.
[0028] Specifically, the test fixture includes a test board with corresponding mounting positions for the wireless module. The connection between the wireless module and the test board is typically a pin. A pressing device (such as a pressure cap) is placed on top of the test board. After aligning the test points of the wireless module with the pins, the pressing device applies downward pressure to the wireless module, ensuring complete contact between the wireless module and the test board. This establishes a test channel from the host computer to the target serial port board, then to the test board, and finally to the wireless module. Because the target serial port board of this invention provides delayed power to the wireless module, the pins on the test board are de-energized during wireless module installation, achieving voltage-free pressing between the wireless module and the pins in the test fixture.
[0029] Based on this, the wireless module testing equipment provided by the present invention includes at least a test fixture 400 and a target serial port board 500; the target serial port board 500 is connected to the test fixture 400 and connected to a host computer; the test fixture 400 is pressed together with the wireless module under test; the target serial port board 500 is used to provide delayed power supply to the wireless module under test, ensuring that the wireless module under test is pressed together with the test pin of the test fixture 400 under no-voltage conditions; when the test point corresponding to the module makes mechanical contact with the pin connected to the target serial port board, the pin will not be immediately energized, but will be energized after at least 240ms, thus achieving voltage-free pressing operation and avoiding the problem of overvoltage during the module pressing process that could damage the module or cause a decrease in module performance.
[0030] It should be noted that the wireless module is used as an example in this invention. As long as the test point of the module is connected to the test board by pressing the pin, the device provided by this invention can be used to perform voltage-free connection on any module, thereby avoiding the problems of module damage or performance degradation caused by voltage connection. The delay time can be set according to the requirements by selecting different delay chips, which is simple, fast and low cost.
[0031] In one alternative embodiment, please refer to Figure 5 , Figure 5 This is a schematic diagram of the main structure of the target serial port board of a wireless module testing device provided by the present invention.
[0032] exist Figure 5 In the target serial port board 500, a main function circuit 520 and a delay power supply circuit 510 may be electrically connected to each other. The delay power supply circuit 510 is used to provide a delay enable signal to the main function circuit 520, so that the data signal path and power supply path in the main function circuit 520 are turned on with a delay.
[0033] Specifically, the ports of the target serial port board 500 include a UART receive port, a UART transmit port, a power port, a signal trigger port, and a ground port. The signal trigger port (EN_L port) is used to send a trigger signal to the delay power supply circuit 510. The UART receive port of the target serial port board is connected to the UART transmit port of the wireless module under test through a test fixture. The power port of the target serial port board is connected to the power port of the wireless module under test through a test fixture. The signal trigger port of the target serial port board is connected to the ground port of the wireless module under test through a test fixture. The ground port of the target serial port board is connected to the ground port of the wireless module under test through a test fixture. The ground port of the wireless module under test can be two electrically connected ports or a single port. When it is a single port, two ports connected to this port are split off from the test fixture and then connected to the ground port and signal trigger port of the target serial port board, respectively.
[0034] More specifically, before the test fixture is pressed together, the EN_L (signal trigger port) of the target serial port board is floating, the DC-DC converter has no output, and the analog switch is off. At this time, there is no voltage on the pins of the serial port board connected to the fixture, namely 3.3V, UART_RX, and UART_TX. When the wireless module is placed in the fixture for pressing, the EN_L of the serial port board is pulled low because it is in contact with the module's GND test point. This triggers a delay to power the module and turn on the UART. The signal trigger port will input a low level, thereby triggering its corresponding delay power supply circuit, which makes the data signal path and power supply path in the main functional circuit conduct with a delay.
[0035] Based on this, the wireless module testing equipment provided by the present invention can realize that when the wireless module under test is pressed with the test pin of the test fixture, the signal trigger port is grounded and a low voltage signal is sent to the delayed power supply circuit. Based on the low voltage signal, the delayed power supply circuit uses a reset chip to send an enable signal to the on / off switches on the data signal path and the power supply path, so that the data signal path and the power supply path are turned on with a delay. That is, when the module test point makes mechanical contact with the pin connected to the serial port board, due to the presence of the reset chip, EN_L is pulled low and will not immediately trigger the pin to have voltage, thereby realizing voltageless pressing between the wireless module under test and the test fixture, avoiding the problem of overvoltage during the test process causing damage to the module.
[0036] As an optional embodiment, please refer to Figure 6 , Figure 6 This is a schematic diagram showing the connection between the wireless module and the target serial port board in a wireless module testing device provided by the present invention.
[0037] existFigure 6 In the circuit, the delay power supply circuit 510 may include a NOT gate chip, a first reset chip, and a second reset chip; the main function circuit 520 may include a serial port chip, an analog switch, a load switch, and a DC-DC module.
[0038] Specifically, the first terminal of the NOT gate chip can be connected to the signal trigger port, the second terminal of the NOT gate chip can be connected to the first terminal of the first reset chip; the second terminal of the first reset chip can be connected to the first terminal of the second reset chip, the third terminal of the first reset chip can be connected to the main function circuit; and the second terminal of the second reset chip can be connected to the main function circuit.
[0039] Furthermore, the first end of the serial port chip can be connected to the host computer via a USB interface, the second end of the serial port chip can be connected to the first end of the analog switch, the second end of the analog switch can be connected to the third end of the first reset chip, and the third end of the analog switch can be connected to the UART port of the wireless module under test via a test fixture; thus forming a data signal transmission channel; that is, the data signal path is: USB → serial port chip → analog switch → UART interface (port).
[0040] Furthermore, the first terminal of the load switch can be connected to the host computer via a USB interface, the second terminal of the load switch can be connected to the second terminal of the second reset chip, the third terminal of the load switch can be connected to the first terminal of the DCDC module, and the fourth terminal of the load switch can be connected to the power port of the wireless module under test via a test fixture; the second terminal of the DCDC module can be connected to the power port of the wireless module under test via a test fixture; thus forming a power supply circuit transmission channel, that is, the power supply path is: USB → load switch → DCDC → power port (3.3V or 3V); where the DCDC module is an adjustable output voltage module; the output voltage range of the DCDC module is 1.8V to 4V.
[0041] Based on this, when the external input to EN_L is low (triggered when the fixture is pressed down), it is flipped to high level by a NOT gate chip, and then output to high level after a delay by two reset chips. The reset chip outputs a high level after a delay of about 240ms after receiving a high level input, and filters out voltage glitches generated when the voltage is applied. In other words, the working principle of the wireless module testing equipment provided by this invention is as follows: when the wireless module under test is pressed with the test pin of the test fixture, the NOT gate chip receives a low-level signal; the NOT gate chip outputs a high level to the first reset chip, the first reset chip sends high-level signals to the analog switch and the second reset chip respectively according to the first delay, and connects the data signal path after a delay; after receiving the high level sent by the first reset chip, the second reset chip sends a high-level signal to the load switch according to the second delay; and then connects the power supply path after a delay. Among them, when the first reset chip and the second reset chip are of the same model, the first delay and the second delay are equal. For example, when using TI's LM809M3-3.08 / NOPB as the first and second reset chips, tests have verified that the delay timing of the first and second delays is approximately 240ms, with a total delay of approximately 480ms; this avoids overvoltage issues that could damage the module during the testing process.
[0042] As an alternative embodiment, please refer to further details. Figure 6 The wireless module testing equipment provided by this invention can also directly output 5V voltage through a load switch, thereby enabling testing of wireless modules with different voltage levels and achieving compatibility. Compared with the prior art, it further improves the applicability of the testing equipment and promotes the production efficiency of wireless modules.
[0043] Although the invention has been described herein in conjunction with various embodiments, those skilled in the art will understand and implement other variations of the disclosed embodiments by reviewing the accompanying drawings, the disclosure, and the appended claims in carrying out the claimed invention. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "an" does not exclude a plurality. A single processor or other unit can implement several functions listed in the claims. While different dependent claims may recite certain measures, this does not mean that these measures cannot be combined to produce good results.
[0044] Although the invention has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made therein without departing from the spirit and scope of the invention. Accordingly, this specification and drawings are merely exemplary descriptions of the invention as defined by the appended claims, and are considered to cover any and all modifications, variations, combinations, or equivalents within the scope of the invention. Clearly, those skilled in the art can make various alterations and modifications to the invention without departing from its spirit and scope. Thus, if such modifications and modifications of the invention fall within the scope of the claims and their equivalents, the invention is also intended to include such modifications and modifications.
Claims
1. A wireless module testing device, characterized in that, At least including: Test fixtures and target serial port board; The target serial port board is connected to the test fixture, the target serial port board is connected to the host computer, and the test fixture is pressed and connected to the wireless module under test. The target serial port board is used to provide delayed power to the wireless module under test, ensuring that the wireless module under test is pressed against the test pin of the test fixture under no voltage conditions.
2. The wireless module testing equipment as described in claim 1, characterized in that, The target serial port board includes a main functional circuit and a delayed power supply circuit that are electrically connected to each other. The delayed power supply circuit is used to provide a delayed enable signal to the main functional circuit, so that the data signal path and power supply path in the main functional circuit are turned on with a delay.
3. The wireless module testing equipment as described in claim 2, characterized in that, The target serial port board includes a UART receive port, a UART transmit port, a power port, a signal trigger port, and a ground port; the signal trigger port is used to send a trigger signal to the delay power supply circuit. The UART receiving port of the target serial port board is connected to the UART transmitting port of the wireless module under test through the test fixture. The UART transmitting port of the target serial port board is connected to the UART receiving port of the wireless module under test through the test fixture. The power port of the target serial port board is connected to the power port of the wireless module under test through the test fixture. The signal trigger port of the target serial port board is connected to the ground port of the wireless module under test through the test fixture. The ground port of the target serial port board is connected to the ground port of the wireless module under test through the test fixture.
4. The wireless module testing equipment as described in claim 3, characterized in that, When the wireless module under test is pressed against the test pin of the test fixture, the signal trigger port is grounded and a low voltage signal is sent to the delay power supply circuit. The delayed power supply circuit, based on the low voltage signal, uses a reset chip to send an enable signal to the on / off switches on the data signal path and the power supply path after a delay, so that the data signal path and the power supply path are turned on after a delay.
5. The wireless module testing equipment as described in claim 2, characterized in that, The delayed power supply circuit includes a NOT gate chip, a first reset chip, and a second reset chip. The first terminal of the NOT gate chip is connected to the signal trigger port, and the second terminal of the NOT gate chip is connected to the first terminal of the first reset chip. The second terminal of the first reset chip is connected to the first terminal of the second reset chip, and the third terminal of the first reset chip is connected to the main functional circuit. The second terminal of the second reset chip is connected to the main functional circuit.
6. The wireless module testing equipment as described in claim 5, characterized in that, The main functional circuit includes a serial port chip, an analog switch, a load switch, and a DC-DC module. The first end of the serial port chip is connected to the host computer via a USB interface, the second end of the serial port chip is connected to the first end of the analog switch, the second end of the analog switch is connected to the third end of the first reset chip, and the third end of the analog switch is connected to the UART port of the wireless module under test via the test fixture. The first end of the load switch is connected to the host computer via a USB interface, the second end of the load switch is connected to the second end of the second reset chip, the third end of the load switch is connected to the first end of the DC-DC module, and the fourth end of the load switch is connected to the power port of the wireless module under test via the test fixture; the second end of the DC-DC module is connected to the power port of the wireless module under test via the test fixture.
7. The wireless module testing equipment as described in claim 6, characterized in that, When the wireless module under test is pressed against the test pin of the test fixture, the NOT gate chip receives a low-level signal; The NOT gate chip outputs a high level to the first reset chip, and the first reset chip sends a high level signal to the analog switch and the second reset chip respectively according to a first delay; After receiving the high-level signal sent by the first reset chip, the second reset chip sends a high-level signal to the load switch according to the second delay.
8. The wireless module testing equipment as described in claim 7, characterized in that, When the first reset chip and the second reset chip have the same model, the first delay is equal to the second delay.
9. The wireless module testing equipment as described in claim 8, characterized in that, Both the first delay and the second delay are 240ms.
10. The wireless module testing equipment as described in claim 6, characterized in that, The DC-DC module is an adjustable output voltage module; the output voltage range of the DC-DC module is 1.8V to 4V.