Switching power supply test cabinet

Abstract

The invention discloses a switch power supply test cabinet, and relates to the technical field of switch power supply aging test, the switch power supply test cabinet comprises an aging test cabinet, the aging test cabinet is fixedly connected with a plurality of laminates in a linear array, each laminate is provided with a plurality of switch power supplies, the aging test cabinet is provided with a test assembly, and the test assembly comprises a plurality of shelving grooves. The plurality of shelving grooves are respectively formed in the plurality of laminates, each laminate corresponds to one shelving groove, and two vertical grooves are symmetrically formed in the aging test cabinet and the plurality of laminates; through operation of the test assembly, an existing mode of taking and placing switch power supplies one by one is converted into a batch operation mode of putting in and taking out the switch power supplies at one time through a supporting plate, time consumed in the switch power supply test preparation and ending stages is greatly shortened, repeated labor is combined into one-time operation, the throughput rate of the test process is remarkably increased, and the test efficiency is improved. And meanwhile, the risk that an operator is scalded is effectively reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of switch power supply aging test, in particular to a switch power supply test cabinet. BACKGROUND

[0002] Switch power supply is a kind of high-frequency power conversion device. In order to verify its long-term working reliability, it needs to be tested before leaving the factory. The test usually places the switch power supply in a special aging test cabinet, makes it run continuously under full load, and filters out early failure products by actively exposing potential problems. During the test, the switch power supply needs to be connected with the power supply interface in the cabinet to realize circuit conduction, and then the temperature in the cabinet is raised by the environment control unit, and the current and power are adjusted by the load simulation unit to simulate the actual working state and complete the aging process.

[0003] However, the existing aging test cabinet has several problems in actual application. First, in the taking and placing process of the switch power supply, each power supply needs to be operated as an independent unit. The test personnel must take and place them one by one to the designated position of the cabinet layer plate, and then take them out one by one after the test is completed. This way of operating one by one significantly prolongs the test preparation and ending time, reducing the overall efficiency. In addition, the temperature in the cabinet is high after the aging test is completed. Frequent opening and closing of the door to take and place the power supply not only affects the stability of the temperature field, but also increases the risk of scalding for the operator.

[0004] Secondly, as an industrial component, the switch power supply lacks a unified standard for its size and interface layout. The interface positions of power supplies of different power levels, brands, models and application scenarios differ significantly. The power supply plug of the traditional aging test cabinet is usually fixed in design and can only be well adapted to power supplies within a certain size range. When testing power supply models with mismatched interface positions, the plug often cannot be connected or the cable is excessively bent. Therefore, the operator often needs to use an adapter or adjust the power supply placement posture to complete the connection. Such temporary measures not only increase the preparation time, but also may cause unreliable connection, increased contact resistance, affect the test accuracy, and even introduce safety hazards.

[0005] Therefore, a switch power supply test cabinet is proposed. SUMMARY

[0006] The purpose of the present application is to provide a switch power supply test cabinet to solve the problems raised in the background.

[0007] In order to achieve the above object, the present application provides the following technical scheme: a switching power supply test cabinet, comprising an aging test cabinet, a plurality of layers are fixedly connected in a straight line array on the aging test cabinet, a plurality of switching power supplies are respectively arranged on each layer, a test assembly is arranged on the aging test cabinet, the test assembly comprises a plurality of resting grooves, the plurality of resting grooves are respectively arranged on the plurality of layers, one resting groove is arranged on each layer, two vertical grooves are symmetrically arranged on the aging test cabinet and the plurality of layers, the two vertical grooves pass through the top of the aging test cabinet, one supporting plate is clamped in each resting groove, a cavity is arranged in the supporting plate, a plurality of grooves one are arranged in a straight line array on the top of each supporting plate, a gear is rotatably connected in the cavity of each supporting plate, two guide blocks are symmetrically fixedly connected in the cavity of each supporting plate, two tooth rods are arranged in the cavity of each supporting plate in a staggered and symmetrical manner, a plurality of baffles are fixedly connected in a straight line array on each tooth rod, two horizontal plates are symmetrically fixedly connected on the side, away from each other, of the two baffles close to the gear on each supporting plate, a threaded rod one is threadedly connected to each horizontal plate, an electric push rod is fixedly connected to the top of the outer wall of the aging test cabinet, the telescopic shaft of the electric push rod faces upward, a supporting rod is fixedly connected to the end of the telescopic shaft of the electric push rod, the two ends of the supporting rod pass through the two vertical grooves and extend downward to the inner wall bottom of the aging test cabinet, and a plurality of side plates are symmetrically fixedly connected in a straight line array to the two ends of the supporting rod extending into the aging test cabinet.

[0008] Further, the two side plates on the same horizontal plane form a group, each group of side plates is located at the top of the two ends of the layer, a guide rod is fixedly connected between the two side plates of one group on each layer, a servo motor is fixedly connected to one side plate in the other group, the output shaft of the servo motor faces the switching power supply, a reciprocating screw rod is fixedly connected to the output shaft of the servo motor, one end of the reciprocating screw rod, away from the servo motor, is rotatably connected to the adjacent side plate, two supporting plates are symmetrically threadedly connected to each reciprocating screw rod, the two supporting plates on the same reciprocating screw rod are slidably connected to the adjacent guide rods, two slide rods are symmetrically slidably connected to each supporting plate, a push plate is fixedly connected to the side, close to the switching power supply, of the two slide rods on the same supporting plate, a spring is sleeved on each slide rod, the two ends of the spring are fixedly connected to the side, close to the supporting plate and the push plate, a plurality of grooves two are arranged in a straight line array on each supporting plate, a connecting terminal is slidably connected in each groove two, a lead-through head is inserted into the side, close to the switching power supply, of each connecting terminal, a connecting rod is fixedly connected to the top of the plurality of connecting terminals on the same supporting plate, a double-headed telescopic rod is fixedly connected between every two adjacent connecting rods, and a threaded rod two is threadedly connected to each connecting rod close to the opening side of the aging test cabinet.

[0009] Further, the two tooth rods in each supporting plate are slidably connected to the adjacent guide blocks, and the two tooth rods in each supporting plate are meshed with the corresponding gears.

[0010] Further, each baffle plate passes through and is in sliding connection with the adjacent slot one, two baffle plates on two adjacent racks form a group, multiple groups are arranged, and each group of baffle plates is located in the adjacent slot one.

[0011] Further, the top of the two ends of the supporting plate is fixedly connected with a handle.

[0012] Further, the bottom end of the threaded rod one is provided with a non-slip pad, and the non-slip pad at the bottom end of the threaded rod one is in extrusion fit with the upper surface of the supporting plate.

[0013] Further, the two ends of the supporting rod pass through two vertical grooves and extend downward to the inner wall bottom of the aging test cabinet.

[0014] Further, two thread lines with opposite directions are symmetrically arranged on the reciprocating screw rod.

[0015] Further, the push plate is provided in a hollow frame shape, the two ends of the switching power supply are provided with power connection holes, and the side of the lead-through head away from the wire terminal is in plug-in fit with the power connection hole of the switching power supply.

[0016] Further, the side of the threaded rod two close to the supporting plate is provided with a rubber pad, and the rubber pad of the threaded rod two is in extrusion fit with the supporting plate.

[0017] Compared with the prior art, the beneficial effects of the present application are: Through the operation of the test assembly, the existing way of taking and placing the switching power supply one by one is changed into a batch operation mode of placing and taking once through the supporting plate, which greatly shortens the time consumed in the switching power supply test preparation and ending stage, combines multiple repeated labor into one operation, significantly improves the throughput rate of the test process, and effectively reduces the risk of the operator being scalded.

[0018] Through the operation of the test assembly, the preparation work and the test are realized simultaneously, when a batch of switching power supplies are being aged in the aging test cabinet, the operator can prepare another batch of supporting plates outside the aging test cabinet for the next batch of tests. When the test is completed, the supporting plate full of tested switching power supplies is taken out, and the supporting plate preloaded with new switching power supplies can be immediately placed, so that the aging test cabinet can start a new round of test almost without waiting, which greatly improves the equipment utilization rate.

[0019] Through the operation of the test assembly, a flexible position-adjustable and model-specification-flexible replacement lead-through head is designed, so that the aging test cabinet can quickly and conveniently adapt to various switching power supplies of different sizes and different interface layouts, solving the limitation of the traditional fixed plug design that can only serve a limited number of switching power supplies. This greatly improves the utilization rate of the test equipment. At the same time, by adjusting the position of the lead-through head to accurately align it with the switching power supply, the direct and firm connection is ensured, avoiding the problems of increased contact resistance and poor contact caused by the use of adapter wires or forcibly bent cables in traditional technology. It ensures that the aging test of the switching power supply can be carried out safely and reliably.

[0020] Through the operation of the test assembly, it can effectively restrict and limit the movement of the switching power supply during the aging test, prevent it from moving due to environmental vibration or accidental touch, and ensure that the connection between the switching power supply and the lead-through head is always in a stable state. This avoids test interruption or data anomalies caused by loose connections, ensuring the continuity and effectiveness of the aging test. At the same time, the limiting baffle, push plate and adjustable position lead-through head work together, making it flexible to adapt to switching power supplies of different sizes, providing stable fixation and connection for switching power supplies of various models, ensuring the stability and universality of switching power supply testing. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 is a schematic diagram of the overall device of the present application; Figure 2 is a sectional view of the structure of the aging test cabinet, layer plate, and resting groove of the present application; Figure 3 is a position diagram of the structure of the aging test cabinet, layer plate, and electric push rod of the present application; Figure 4 is a sectional view of the structure of the aging test cabinet, gear, and threaded rod of the present application; Figure 5 is a sectional view of the structure of the aging test cabinet, gear, and threaded rod of the present application; Figure 4 is an enlarged view of position A in the present application; Figure 6 is a sectional view of the structure of the aging test cabinet, gear, and threaded rod of the present application; Figure 7 is an enlarged view of position B in the present application; Figure 6 Figure 8 is an exploded view of the structure of the aging test cabinet, support rod, and supporting plate of the present application; Figure 9 is a sectional view of the structure of the aging test cabinet, gear, and threaded rod of the present application; Figure 10 is an exploded view of the structure of the aging test cabinet, gear, and threaded rod of the present application; Figure 11 ​The explosion schematic view of the guide rod, the reciprocating wire rod, the supporting plate and the like structure of the present application.

[0022] In the figure: 11, aging test cabinet; 12, layer plate; 13, switching power supply; 21, resting groove; 22, vertical groove; 23, supporting plate; 24, groove one; 25, gear; 26, guide block; 27, toothed rod; 28, baffle; 29, horizontal plate; 210, threaded rod one; 211, electric push rod; 212, supporting rod; 213, side plate; 214, guide rod; 215, servo motor; 216, reciprocating wire rod; 217, supporting plate; 218, sliding rod; 219, push plate; 220, spring; 221, groove two; 222, connecting terminal; 223, conducting head; 224, connecting rod; 225, double-headed telescopic rod; 226, threaded rod two. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0024] The embodiments provided by the present application include: Please refer to Figures 1 to 11 As shown in the figure, a switching power supply test cabinet includes an aging test cabinet 11, the front part of the aging test cabinet 11 is provided with a cabinet door, and a plurality of layer plates 12 are fixedly connected in a straight line array on the aging test cabinet 11. Each layer plate 12 is provided with a plurality of switching power supplies 13.

[0025] Among them: the aging test cabinet 11, the layer plate 12 and the switching power supply 13 are all known technologies, the aging test cabinet 11 is integrated with an environmental control unit, a load simulation unit and a data acquisition unit. The environmental control unit is used to control the temperature in the aging test cabinet 11, the load simulation unit is used to adjust the current and power of the switching power supply 13, and the data acquisition unit is used to detect the test situation of the switching power supply 13. Through the cooperation of the environmental control unit and the load simulation unit, the actual working state of the switching power supply 13 can be simulated, and the aging process can be completed.

[0026] Among them: the aging test cabinet 11 is integrated with a control panel, and the control panel is used to control the environmental control unit, the load simulation unit and the data acquisition unit.

[0027] The aging test cabinet 11 is provided with a test assembly, the test assembly comprises a plurality of resting grooves 21, the plurality of resting grooves 21 are respectively formed in a plurality of layers 12, and each layer 12 corresponds to a resting groove 21; the aging test cabinet 11 and the plurality of layers 12 are symmetrically provided with two vertical grooves 22, and the two vertical grooves 22 all pass through the top of the aging test cabinet 11; each resting groove 21 is clamped with a supporting plate 23, the supporting plate 23 is internally provided with a cavity, the top of each supporting plate 23 is linearly arrayed with a plurality of grooves 24, each cavity of each supporting plate 23 is rotationally connected with a gear 25, each cavity of each supporting plate 23 is symmetrically fixedly connected with two guide blocks 26, each cavity of each supporting plate 23 is symmetrically provided with two tooth rods 27, the two tooth rods 27 in each supporting plate 23 are respectively slidably connected with adjacent guide blocks 26, the two tooth rods 27 in each supporting plate 23 are all meshed with the corresponding gear 25, each tooth rod 27 is linearly arrayed with a plurality of baffles 28, each baffle 28 passes through adjacent grooves 24, and each baffle 28 is slidably connected with adjacent grooves 24, the two baffles 28 on each tooth rod 27 are a group, a plurality of groups are provided, and each group of baffles 28 is located in adjacent grooves 24, the two baffles 28 on each supporting plate 23, which are away from each other, are symmetrically fixedly connected with two horizontal plates 29 near the gear 25, each horizontal plate 29 is threadedly connected with a threaded rod 210, the outer wall top of the aging test cabinet 11 is fixedly connected with an electric push rod 211, the telescopic shaft of the electric push rod 211 faces upward, the telescopic shaft end of the electric push rod 211 is fixedly connected with a support rod 212, the two ends of the support rod 212 pass through the two vertical grooves 22 and extend downward to the inner wall bottom of the aging test cabinet 11, the two ends of the support rod 212 extending into the aging test cabinet 11 are linearly arrayed and symmetrically fixedly connected with a plurality of side plates 213, the two side plates 213 on the same horizontal plane are a group, and each layer 12 has two groups of side plates 213, each group of side plates 213 is located at the top of the two ends of the layer 12, the two side plates 213 in one group on each layer 12 are fixedly connected with a guide rod 214, one side plate 213 in the other group is fixedly connected with a servo motor 215, the output shaft of the servo motor 215 faces the switching power supply 13, the output shaft of the servo motor 215 is fixedly connected with a reciprocating screw rod 216, one end of the reciprocating screw rod 216 away from the servo motor 215 is rotationally connected with the adjacent side plate 213, each reciprocating screw rod 216 is symmetrically threadedly connected with two support plates 217, the two support plates 217 on the same reciprocating screw rod 216 are slidably connected with adjacent guide rods 214, each support plate 217 is symmetrically slidably connected with two slide rods 218, the two slide rods 218 on the same support plate 217 are fixedly connected with a push plate 219 on the side close to the switching power supply 13, each slide rod 218 is sleeved with a spring 220, and the two ends of the spring 220 are fixedly connected with the support plate 217 and the push plate 219.A plurality of slots two 221 are arranged in a straight line array on each support plate 217, and one connecting terminal 222 is slidably connected in each slot two 221. Each connecting terminal 222 is inserted with a lead-through head 223 on one side close to the switching power supply 13. The top of the plurality of connecting terminals 222 on the same support plate 217 is fixedly connected with a connecting rod 224. The two connecting rods 224 on each layer plate 12 are fixedly connected with a double-head telescopic rod 225. The connecting rod 224 on the side of the aging test cabinet 11 door of each layer plate 12 is threadedly connected with a threaded rod two 226.

[0028] As shown in the figure, the top of the support plate 23 is fixedly connected with a handle for the operator to grasp. Figure 8

[0029] The bottom end of the threaded rod one 210 is provided with a non-slip pad, and the non-slip pad at the bottom end of the threaded rod one 210 is in extrusion fit with the upper surface of the support plate 23.

[0030] The electric push rod 211 and the servo motor 215 are electrically connected to the control panel of the aging test cabinet 11.

[0031] The reciprocating screw rod 216 is a known technology, and two threads with opposite thread directions are symmetrically arranged on the reciprocating screw rod 216. The two support plates 217 on each reciprocating screw rod 216 are threadedly connected with the two opposite threads.

[0032] The push plate 219 is provided in a hollow frame type, and the connecting terminal 222 and the lead-through head 223 are located in the hollow part of the push plate 219 frame type, which prevents the push plate 219 from interfering with the connecting terminal 222 and the lead-through head 223.

[0033] The switching power supply 13 is a known technology, and the two ends of the switching power supply 13 are provided with power connection holes. The side of the lead-through head 223 away from the connecting terminal 222 is inserted into the power connection hole of the switching power supply 13. Specifically, the operator selects the appropriate lead-through head 223 according to the type of the switching power supply 13 power connection hole to be tested, and then inserts the lead-through head 223 into the connecting terminal 222. When the lead-through head 223 is inserted into the connecting terminal 222, and the lead-through head 223 is inserted into the power connection hole of the switching power supply 13, the connecting terminal 222 will feed back the circuit conduction state of the lead-through head 223 and the switching power supply 13 to the data acquisition unit of the aging test cabinet 11 in real time, which is used to detect the aging test of the switching power supply 13.

[0034] ​The double-end telescopic rod 225 is arranged in three sections, and is located at the most side, which does not block the switching power supply 13 and the supporting plate 23. Both ends of the double-end telescopic rod 225 are arranged as telescopic ends, and the two telescopic ends of the double-end telescopic rod 225 are fixedly connected with the two adjacent supporting plates 217. Specifically, the double-end telescopic rod 225 functions to enable the two connecting rods 224 to move synchronously. The telescopic function of the double-end telescopic rod 225 enables the synchronous movement of the two connecting rods 224 to adapt to the change of the interval between the two supporting plates 217, so that the two connecting rods 224 can still move synchronously when the interval between the two supporting plates 217 changes.

[0035] The rubber pad is arranged on the side of the threaded rod two 226 close to the supporting plate 217, and the rubber pad of the threaded rod two 226 is in extrusion fit with the supporting plate 217.

[0036] In the initial stage of the test assembly, that is, when the aging test cabinet 11 does not need to perform the aging test on the switching power supply 13, the state of each structure in the test assembly is as follows: The supporting plate 23 is not inserted into the resting groove 21. The two baffles 28 in each groove one 24 are located at the two ends of the groove one 24, that is, the interval between the two baffles 28 in the same groove one 24 is initially the largest. The threaded rod one 210 is not screwed on the horizontal plate 29. The electric push rod 211 and the servo motor 215 are not started to run. The two supporting plates 217 on the reciprocating screw rod 216 are located at the two ends of the reciprocating screw rod 216, that is, the interval between the two supporting plates 217 on the same reciprocating screw rod 216 is initially the largest. The spring 220 does not produce elastic deformation. The threaded rod two 226 is not screwed on the supporting plate 217.

[0037] When the test assembly is running, that is, when the aging test cabinet 11 needs to perform the aging test on the switching power supply 13, it is divided into four stages. First, the preprocessing stage of the switching power supply 13, that is, the preprocessing of the switching power supply 13 waiting for the aging test process outside the aging test cabinet 11.

[0038] Second, the switching power supply 13 after preprocessing is placed into the aging test cabinet 11, and the circuit conduction of the switching power supply 13 is completed.

[0039] Third, the environmental control unit of the aging test cabinet 11 and the load simulation unit and the data acquisition unit cooperate to run, and the connecting terminal 222 feeds back the circuit conduction of the connecting head 223 and the switching power supply 13 to the data acquisition unit of the aging test cabinet 11 in real time, and performs the aging test on the switching power supply 13 in the aging test cabinet 11.

[0040] Fourthly, the switch power supply 13 which has completed the aging test is taken out of the aging test cabinet 11, and the next round of switch power supply 13 aging test process is carried out.

[0041] The four stages of the test assembly operation will be described in turn as follows: The first stage is the pretreatment stage of the switch power supply 13, that is, the pretreatment of the switch power supply 13 waiting for the aging test process outside the aging test cabinet 11. At this time, the operator places a switch power supply 13 between the two baffles 28 of each group, so that the bottom of the switch power supply 13 is attached to the top surface of the support plate 23. It should be noted that at this time, the operator does not need to strictly align the position of the switch power supply 13, but only needs to place the switch power supply 13 at any position between the two baffles 28 in the same slot 24.

[0042] When the switch power supply 13 is placed between the multiple baffles 28 on a single support plate 23, the operator holds the two baffles 28 located in the middle of the support plate 23, specifically the two baffles 28 with the horizontal plate 29 fixed. And push the two baffles 28 to move inward, at this time, the two baffles 28 move synchronously, driving the two tooth rods 27 to move synchronously. The two tooth rods 27 slide on the corresponding guide blocks 26, and the gear 25 rotates with the movement of the two tooth rods 27 to mesh. The gear 25 ensures that the two tooth rods 27 move synchronously and the displacement distance of the two tooth rods 27 is consistent.

[0043] With the synchronous movement of the two tooth rods 27 and the same movement distance of the two tooth rods 27, the two tooth rods 27 can drive the corresponding multiple baffles 28 to move synchronously. The two baffles 28 in each slot 24 move inward. During the inward movement of the two baffles 28, the baffles 28 abut against the switch power supply 13 and push the switch power supply 13 to move to the middle position of the slot 24 until the two baffles 28 abut against the two sides of the switch power supply 13 at the same time. At this time, the multiple switch power supplies 13 on the support plate 23 are abutted and attached by the baffles 28 on both sides, and the multiple switch power supplies 13 are located at the middle position of the corresponding slot 24. At this time, the operator screws down the multiple threaded rods 210, so that the anti-slip pads at the bottom of the threaded rods 210 abut against the top surface of the support plate 23, thereby locking and fixing the position of the multiple baffles 28. At this time, the multiple switch power supplies 13 on the support plate 23 are fixed in the state of being abutted and attached. Specifically, as shown in the figure, at this time, the multiple switch power supplies 13 are horizontally limited by the support plate 23 on both sides from left to right. Figure 3

[0044] ​At this time, the operator completes the placement of the switching power supply 13 on a single tray 23. The operator can repeat the above operation multiple times to complete the placement of the switching power supply 13 on multiple trays 23, so that the switching power supply 13 is placed on each of the multiple trays 23.

[0045] The second stage: the switching power supply 13 after the pretreatment needs to be placed in the aging test cabinet 11, and the circuit of the switching power supply 13 is turned on in the aging test cabinet 11. At this time, the operator pulls the handle at both ends of the top of the tray 23 with both hands, moves the tray 23 from the outside of the aging test cabinet 11 into the aging test cabinet 11, and aligns the tray 23 with a resting groove 21 for clamping. In this process, the tray 23 synchronously moves the multiple switching power supplies 13 that have been abutted and adhered above, so that the multiple switching power supplies 13 on the same tray 23 can be placed in the aging test cabinet 11 at the same time and placed on the layer plate 12.

[0046] After completing the placement of a single tray 23, the operator aligns the remaining trays 23 with the resting grooves 21 on the remaining layer plates 12 in turn for clamping, so that the switching power supply 13 is placed on each layer plate 12. At this time, the operator can adjust the plug-in position of the lead-through head 223 and the switching power supply 13, as follows: The operator controls the extension or contraction of the telescopic shaft of the electric push rod 211, so that the telescopic shaft of the electric push rod 211 extends or contracts, and at the same time, the support rod 212 moves up and down in the aging test cabinet 11. When the support rod 212 moves up and down, the support rod 212 drives the multiple connection terminals 222 on each layer to move up and down synchronously, until the lead-through head 223 moves to the plug-in position required by the corresponding switching power supply 13. At this time, the electric push rod 211 stops working, and the telescopic shaft of the electric push rod 211 stops working and remains in the current position, fixing the height of the lead-through head 223.

[0047] After completing the height adjustment of the lead-through head 223, the operator holds any one of the connection terminals 222 and pushes the connection terminal 222 in the direction of plug-in cooperation with the switching power supply 13 and the lead-through head 223. The connection terminal 222 moves through the connecting rod 224 to drive the remaining connection terminals 222 on the same support plate 217 to move synchronously. When the connecting rod 224 to which the connection terminal 222 belongs moves, it drives another connecting rod 224 on each layer plate 12 to move synchronously through the double-headed telescopic rod 225. That is, the operator can move any one of the connection terminals 222, and the remaining connection terminals 222 on each layer plate 12 can move synchronously. This can save the operator's operation time, and the operator does not need to adjust the position of the connection terminal 222 one by one.

[0048] When the connecting terminal 222 is moved to the position corresponding to the insertion hole of the switching power supply 13, the operator no longer moves the connecting terminal 222. And the operator screws the threaded rod two 226 on the connecting rod 224, and as the threaded rod two 226 is screwed, the rubber pad of the threaded rod two 226 is pressed against the supporting plate 217, so that the position of the connecting rod 224 on the supporting plate 217 is locked and fixed, and at this time the two connecting rods 224 cannot move on the corresponding supporting plate 217, that is, the positions of the connecting terminal 222 and the lead-through head 223 are fixed, and at this time the height and position of the lead-through head 223 on the horizontal plane are adjusted to correspond to the position of the insertion hole of the switching power supply 13, and the position of the lead-through head 223 is fixed. After completion, the operator repeats the above operation to adjust the positions of the connecting terminal 222 and the lead-through head 223 on the remaining layers of the plate 12.

[0049] After completion, the lead-through head 223 needs to be inserted into the switching power supply 13 to make the switching power supply 13 circuit conductive, at this time the operator drives the servo motor 215 to operate, so that the output shaft of the servo motor 215 rotates, and at the same time the output shaft of the servo motor 215 rotates, the output shaft end of the servo motor 215 drives the reciprocating screw rod 216 to rotate synchronously, and as the reciprocating screw rod 216 rotates, the reciprocating screw rod 216 has a tendency to deflect the two supporting plates 217 on it along the thread direction, but the supporting plates 217 can only slide linearly along the guide rod 214 under the guidance and limiting action of the guide rod 214, so that the two supporting plates 217 can move closer to or away from each other on the guide rod 214 as the reciprocating screw rod 216 rotates. Since the two supporting plates 217 are already located at the two end positions of the reciprocating screw rod 216 in the initial state, as the reciprocating screw rod 216 rotates, the two supporting plates 217 slide together on the guide rod 214, and as the two supporting plates 217 move together, the two push plates 219 on the side of the two supporting plates 217 move synchronously, and in the process of the two push plates 219 moving together, the push plates 219 abut against the end of the switching power supply 13 and push the switching power supply 13 to move towards the middle of the supporting plate 23. It should be noted that in this process, although the switching power supply 13 has been abutted by the two side baffles 28, the switching power supply 13 will still be abutted by the push plate 219 and move forward and backward on the baffle 28. Referring to Figure 3As shown, when the two push plates 219 are in contact with the two ends of the switching power supply 13, the switching power supply 13 is pushed to the middle position of the horizontal plane of the support plate 23 from the front to the back direction. At this time, with the continuous rotation of the reciprocating wire rod 216, the two support plates 217 continue to move together, but the push plates 219 have contacted the ends of the switching power supply 13 and cannot follow the movement, and then with the movement of the support plates 217, the support plates 217 elastically press the springs 220 and slide on the slide rods 218 to the push plates 219. At this time, with the continuous movement of the support plates 217, the lead-through heads 223 gradually penetrate the frame-shaped hollow part of the push plates 219 and are inserted with the switching power supply 13. At this time, the two ends of the switching power supply 13 are inserted with the corresponding lead-through heads 223, and the switching power supply 13 is limited by the two baffles 28 and the two push plates 219 around, and then at this time, the switching power supply 13 is in a state of being limited around on the support plate 23 in addition to being inserted with the circuit, so that the switching power supply 13 is fixed in position during the aging test. After completion, the operator no longer drives the servo motor 215 to operate, and then the reciprocating wire rod 216 no longer rotates, so that the position of the lead-through head 223 is fixed.

[0050] It should be noted that: at this time, the limiting of the switching power supply 13 and the circuit conduction work are optimized from the one-by-one processing in the prior art to multi-layer synchronous processing, which improves the work efficiency.

[0051] It should be noted that: if the model of the switching power supply 13 to be tested next time changes from the switching power supply 13 tested previously, the operator needs to insert the lead-through head 223 suitable for the switching power supply 13 to be tested next time into each connection terminal 222 at the beginning of the third stage.

[0052] The third stage: at this time, the switching power supply 13 on the multi-layer layer plate 12 in the aging test cabinet 11 is completed in position and the circuit is conducted, the operator closes the cabinet door of the aging test cabinet 11, so that the inside of the aging test cabinet 11 is sealed, and then the operator controls the environmental control unit, the load simulation unit and the data acquisition unit to operate cooperatively through the control panel, and the connection terminal 222 feeds back the circuit conduction state of the lead-through head 223 and the switching power supply 13 to the data acquisition unit of the aging test cabinet 11 in real time, and the switching power supply 13 in the aging test cabinet 11 is tested. It should be noted that the support rod 212 is closely matched with the vertical slot 22 on the aging test cabinet 11, which serves to ensure the sealing of the inside of the aging test cabinet 11.

[0053] The fourth stage: when the aging test is completed, the switch power supply 13 which has completed the aging test needs to be taken out of the aging test cabinet 11, and the next round of switch power supply 13 aging test process is carried out. At this time, the operator opens the cabinet door of the aging test cabinet 11, and drives the servo motor 215 to operate, so that the output shaft of the servo motor 215 reversely rotates, so that the two supporting plates 217 move away from each other. In the process of moving away from each other, the two supporting plates 217 slide away from the push plate 219 on the corresponding slide rod 218, and at the same time, the spring 220 is elastically stretched and reset, and the contact head 223 is no longer plugged with the switch power supply 13. With the continuous movement of the supporting plate 217 away from the switch power supply 13, the supporting plate 217 drives the push plate 219 to move to the end position of the reciprocating wire rod 216. At this time, the distance between the two supporting plates 217 on each layer plate 12 is maximum, that is, the initial state is restored. After completion, the operator holds the handles at the top of the supporting plate 23 to take out the supporting plate 23 and the plurality of switch power supplies 13 on it from the aging test cabinet 11 simultaneously. When the supporting plate 23 on the plurality of layers of layer plates 12 in the aging test cabinet 11 is taken out, the interior of the aging test cabinet 11 is emptied. At this time, the taking out of the switch power supply 13 is optimized from the existing technology of taking out one by one to taking out the whole layer, which improves the work efficiency.

[0054] If the switch power supplies 13 for subsequent aging test are all of the same batch, same model and size, the operator can prepare several supporting plates 23 with switch power supplies 13 during the waiting time when the first batch of supporting plates 23 with switch power supplies 13 are placed in the test waiting stage. The switch power supplies 13 can be pre-placed when the aging test cabinet 11 is aging tested. After a batch of switch power supplies 13 are aged and the aging test cabinet 11 is emptied, the operator can directly insert the prepared supporting plate 23 into the resting groove 21, and then drive the servo motor 215 to make the contact head 223 plug with the switch power supply 13, so that the circuit of the switch power supply 13 is turned on, and in the process, the switch power supply 13 is limited and fixed. The operator does not need to adjust the specifications, models and positions of the contact head 223 again, and can directly use the positions of the last batch. This can facilitate the aging test convenience of switch power supplies 13 of the same model and size.

[0055] If the switch power supplies 13 for subsequent aging test are different from the last batch of switch power supplies 13 in model and size, the operator only needs to repeat the position adjustment of the baffle 28 in step one and the adjustment of the position of the connecting terminal 222 in step two, without adjusting the remaining operations. This improves the universality of the test assembly.

[0056] In summary, through the operation of the test assembly, the following beneficial effects can be achieved: Firstly, in the traditional test process, the switching power supply 13 needs to be taken out and placed one by one, which leads to a long preparation and ending time. In addition, there is a risk of scalding and damage to the temperature field stability when taking out and placing one by one in a high-temperature environment.

[0057] By running the test assembly, the existing way of taking out and placing the switching power supply 13 one by one is changed to a batch operation mode of one-time placement and removal by the tray 23, which greatly shortens the time consumed in the preparation and ending stages of the switching power supply 13 test, combines multiple repetitive labor into one operation, and significantly improves the throughput rate of the test process. At the same time, it effectively reduces the risk of scalding for the operator.

[0058] Secondly, in the traditional test process, preparation work such as placing the switching power supply 13, circuit conduction and test execution, closing the cabinet door, warming up, and testing needs to be performed sequentially. The operator must stand in front of the cabinet door and complete the placement and circuit conduction of the switching power supply 13 one by one before starting the test. During this time, the aging test cabinet 11 is in an idle waiting state.

[0059] By running the test assembly, the preparation work and the test are performed synchronously. When a batch of switching power supplies 13 are being aged in the aging test cabinet 11, the operator can prepare another batch of trays 23 outside the aging test cabinet 11 for the next batch of tests. As soon as the test is completed, the tray 23 full of tested switching power supplies 13 is taken out, and the tray 23 preloaded with new switching power supplies 13 can be immediately placed in, so that the aging test cabinet 11 can start a new round of testing almost without waiting, greatly improving the utilization rate of the equipment.

[0060] Thirdly, the power supply plug of the traditional aging test cabinet 11 is usually fixed in design and can only better adapt to switching power supplies 13 of a certain size range. When testing switching power supply 13 models with mismatched interface positions, the plug often cannot be connected or the cable is excessively bent.

[0061] By running the test assembly, a conduction head 223 with adjustable position and flexible replacement of model specifications is designed, which enables the aging test cabinet 11 to quickly and conveniently adapt to various switching power supplies 13 of different sizes and different interface layouts, solving the limitation of the traditional fixed plug design that can only serve a limited number of switching power supply 13 models. This greatly improves the utilization rate of the test equipment. At the same time, by adjusting the position of the conduction head 223 to accurately align it with the switching power supply 13, it ensures direct and firm connection, avoiding the problems of increased contact resistance and poor contact caused by the use of adapter cables or forced bending of cables in traditional technology. It ensures that the aging test of the switching power supply 13 can be safely and reliably performed.

[0062] Fourthly, through the operation of the test assembly, it can effectively restrict and limit the movement of the switching power supply 13 during the aging test, preventing it from being displaced due to environmental vibration or accidental touch, thereby ensuring that the connection between the switching power supply 13 and the conducting head 223 is always in a stable state. This avoids test interruption or data anomalies caused by loose connection, ensuring the continuity and effectiveness of the aging test. At the same time, the limiting baffle 28, the push plate 219 and the adjustable position conducting head 223 work together, making it flexible to adapt to switching power supplies 13 of different sizes, providing stable fixation and connection for switching power supplies 13 of various models, ensuring the stability and universality of the switching power supply 13 test.

[0063] It should be noted that in this text, the term "includes" "contains" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or includes elements inherent to such process, method, article or device.

[0064] Although embodiments of the present application have been shown and described, it will be understood by those having ordinary skill in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the application, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A switching power supply test cabinet, comprising an aging test cabinet (11), a plurality of layers (12) are fixedly connected on the aging test cabinet (11) in a straight line array, and a plurality of switching power supplies (13) are respectively placed on each layer (12), characterized in that: The aging test cabinet (11) is provided with a test assembly, the test assembly includes a plurality of resting grooves (21), the plurality of resting grooves (21) are respectively arranged on a plurality of layers (12), each layer (12) corresponds to a resting groove (21), the aging test cabinet (11) and the plurality of layers (12) are symmetrically provided with two vertical grooves (22) together, the two vertical grooves (22) pass through the top of the aging test cabinet (11), each resting groove (21) is clamped with a supporting plate (23), the supporting plate (23) is internally provided with a cavity, the top of each supporting plate (23) is linearly arrayed with a plurality of grooves (24), each supporting plate (23) is rotatably connected with a gear (25) in the cavity, each supporting plate (23) is symmetrically fixedly connected with two guide blocks (26) in the cavity, each supporting plate (23) is misalignedly and symmetrically provided with two tooth rods (27) in the cavity, each tooth rod (27) is linearly arrayed with a plurality of baffles (28), each supporting plate (23) is symmetrically fixedly connected with two horizontal plates (29) on the side away from each other of the two baffles (28) close to the gear (25), each horizontal plate (29) is threadedly connected with a threaded rod (210), the outer wall top of the aging test cabinet (11) is fixedly connected with an electric push rod (211), the telescopic shaft of the electric push rod (211) faces upward, the telescopic shaft end of the electric push rod (211) is fixedly connected with a support rod (212), the both ends of the support rod (212) pass through the two vertical grooves (22) and extend downward to the inner wall bottom of the aging test cabinet (11), the both ends of the support rod (212) extending into the aging test cabinet (11) are linearly arrayed and symmetrically fixedly connected with a plurality of side plates (213).

2. The switching power supply test cabinet of claim 1, wherein: Two side plates (213) on the same horizontal plane are a group, each group of side plates (213) is located at the top of both ends of the layer plate (12), the two side plates (213) in one group on each layer plate (12) are fixedly connected with a guide rod (214), one of the side plates (213) in the other group is fixedly connected with a servo motor (215), the output shaft of the servo motor (215) faces the switching power supply (13), the output shaft of the servo motor (215) is fixedly connected with a reciprocating screw rod (216), one end of the reciprocating screw rod (216) away from the servo motor (215) is rotatably connected with the adjacent side plate (213), two supporting plates (217) are symmetrically threadedly connected on each reciprocating screw rod (216), the two supporting plates (217) on the same reciprocating screw rod (216) are slidably connected with the adjacent guide rod (214), two slide rods (218) are symmetrically slidably connected on each supporting plate (217), the two slide rods (218) on the same supporting plate (217) are fixedly connected with a push plate (219) on the side close to the switching power supply (13), a spring (220) is sleeved on each slide rod (218), and the two ends of the spring (220) are fixedly connected with the supporting plate (217) and the push plate (219) on the side close thereto, a plurality of groove twos (221) are linearly arranged on each supporting plate (217), a connecting terminal (222) is slidably connected in each groove two (221), a lead-through head (223) is inserted into each connecting terminal (222) on the side close to the switching power supply (13), a connecting rod (224) is fixedly connected to the top of the plurality of connecting terminals (222) on the same supporting plate (217), a double-headed telescopic rod (225) is fixedly connected between every two adjacent connecting rods (224), and a threaded rod two (226) is threadedly connected to each connecting rod (224) on the side close to the opening of the aging test cabinet (11).

3. The switching power supply test cabinet of claim 1, wherein: The two tooth rods (27) in each supporting plate (23) are slidably connected with the adjacent guide blocks (26), and the two tooth rods (27) in each supporting plate (23) are meshed with the corresponding gears (25).

4. The switching power supply test cabinet of claim 1, wherein: Each baffle (28) penetrates through the adjacent groove one (24), and each baffle (28) is slidably connected with the adjacent groove one (24). Two baffles (28) on the two tooth rods (27) are a group, a plurality of groups are arranged, and each group of baffles (28) is located in the adjacent groove one (24).

5. The switching power supply test cabinet of claim 1, wherein: The top of the supporting plate (23) is fixedly connected with a handle.

6. The switching power supply test cabinet of claim 1, wherein: The bottom end of the threaded rod one (210) is provided with a non-slip pad, and the non-slip pad at the bottom end of the threaded rod one (210) is in extrusion fit with the upper surface of the supporting plate (23).

7. The switching power supply test cabinet of claim 2, wherein: The two ends of the supporting rod (212) penetrate through the two vertical grooves (22) and extend downward to the inner wall bottom of the aging test cabinet (11).

8. The switching power supply test cabinet of claim 2, wherein: The reciprocating screw rod (216) is symmetrically provided with two thread lines with opposite directions.

9. The switching power supply test cabinet of claim 2, wherein: The push plate (219) is provided in a hollow frame type, both ends of the switching power supply (13) are provided with power connection holes, and the lead-through head (223) is inserted and matched with the power connection holes of the switching power supply (13) on the side away from the wire terminal (222).

10. The switching power supply test cabinet of claim 2, wherein: The rubber pad of the second threaded rod (226) is provided on the side close to the support plate (217), and the rubber pad of the second threaded rod (226) is extruded and matched with the support plate (217).

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