Abnormal cell screening method and system based on image analysis
By obtaining staining parameters of cell sections through image analysis, fitting and standardizing the staining curves, the problem of inaccurate staining characteristics caused by individual cell differences is solved, thereby improving the accuracy of cell screening and diagnostic consistency.
Patent Information
- Application Number
- CN202511547948.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-28
- Publication Date
- 2026-05-01
- Estimated Expiration
- 2045-10-28
AI Technical Summary
Traditional cell screening methods suffer from variations in staining characteristics due to individual cell differences, which affects the accuracy of screening. In particular, differences in staining conditions and equipment between different laboratories affect diagnostic consistency.
By acquiring continuous image frames of cell slices, extracting staining parameters and performing standardized correction, and using image analysis methods to fit staining curves to eliminate the influence of individual differences, an abnormal cell screening method using image analysis is adopted, including acquiring staining parameters, fitting curves, standardization correction, and threshold comparison.
It improves the accuracy of abnormal cell screening, reduces the differences in staining sensitivity caused by biological factors such as individual gene expression, cell membrane protein composition and pH changes, and enhances diagnostic consistency.