Normal-temperature and high-temperature integrated testing equipment for wave crest axial thermistor resistance value

Abstract

The invention discloses a normal-temperature and high-temperature integrated testing device for the resistance value of a thermistor in the wave crest axial direction, and the device comprises a normal-temperature testing module which comprises a feeding mechanism, a first straightening mechanism, a normal-temperature testing mechanism and a conversion belt material wheel which are sequentially disposed on a first rack in the conveying direction of the thermistor; the high-temperature testing module comprises a second rack, a second straightening mechanism, a high-temperature testing mechanism and a classified material receiving mechanism, and the second straightening mechanism, the high-temperature testing mechanism and the classified material receiving mechanism are sequentially arranged in the conveying direction of the thermistors on the second rack; wherein the normal-temperature testing mechanism comprises a normal-temperature oil groove and a normal-temperature testing wheel, and a first cover plate corresponding to the normal-temperature oil groove in position is arranged on the working table of the first rack. Compared with the prior art, the problem that resistance testing of a large number of wave crest axial thermistors at the normal temperature and the high temperature cannot be rapidly achieved through existing equipment is solved.

Description

Technical Field

[0001] This invention relates to the field of electronic component testing technology, and in particular to a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor. Background Technology

[0002] A wave-crest axial thermistor is a thermistor element packaged with axial leads, with the leads extending from both ends of the element. Wave-crest axial thermistors are often of the NTC (negative temperature coefficient) type, and their resistance decreases as the temperature increases. They are widely used in temperature detection, circuit protection, and other applications.

[0003] The B-value is the material constant of a thermistor, reflecting its resistance sensitivity to temperature changes. Testing the B-value ensures that the component meets the temperature sensitivity requirements of a specific application. If the B-value of a wave-axis thermistor deviates from the standard, it may lead to the failure of temperature compensation or protection functions.

[0004] The B-value test of wave-crest axial thermistors is a critical step in production. By measuring the resistance values ​​at 25℃ and 85℃ and calculating the B-value, products that meet specifications can be screened out. Existing equipment is unable to quickly perform resistance value testing of a large number of wave-crest axial thermistors at both room temperature and high temperature, resulting in low efficiency in the B-value testing of wave-crest axial thermistors. Summary of the Invention

[0005] The purpose of this invention is to provide an integrated room-temperature and high-temperature testing device for the resistance value of wave crest axial thermistors, so as to solve the problem that existing equipment is unable to quickly perform resistance value testing of a large number of wave crest axial thermistors at room temperature and high temperature.

[0006] To achieve the above objectives, the present invention employs the following technical solution: a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor, comprising: The room temperature testing module includes a feeding mechanism, a first straightening mechanism, a room temperature testing mechanism, and a conversion belt roller arranged sequentially along the thermistor conveying direction on the first frame; The high-temperature testing module includes a second frame, a second straightening mechanism, a high-temperature testing mechanism, and a sorting and collecting mechanism. The second straightening mechanism, the high-temperature testing mechanism, and the sorting and collecting mechanism are arranged sequentially along the thermistor conveying direction on the second frame. The ambient temperature testing mechanism includes an ambient temperature oil tank and an ambient temperature testing wheel. A first cover plate corresponding to the ambient temperature oil tank is provided on the worktable of the first frame. The first frame is provided with the first material conveyor chain guide frame, which includes a vertical frame section, a horizontal frame section and an inclined frame section. The lower part of the vertical frame section passes through the first cover plate and is connected to the horizontal frame section. One end of the inclined frame section is connected to the horizontal frame section and the other end extends out of the first cover plate. The horizontal frame section is set in the ambient temperature oil tank, and the ambient temperature test wheel is rotatably installed on the horizontal frame section. One end of the first front conveyor chain extends to the feeding mechanism and the other end extends to the ambient temperature test wheel. One end of the first rear conveyor chain extends to the ambient temperature test wheel and the other end extends to the conversion conveyor wheel.

[0007] As a further description of the above technical solution: The first material conveyor chain guide frame is equipped with two parallel chain side positioning plates. The chain side positioning plates are equipped with vertical positioning sections that correspond to the vertical frame sections. The bent edge at the top of the vertical positioning section contacts the lead wire of the thermistor.

[0008] As a further description of the above technical solution: A first chain guide wheel is provided at the angle between the vertical frame section and the horizontal frame section, and the first front belt chain passes around the first chain guide wheel.

[0009] As a further description of the above technical solution: The high-temperature testing mechanism includes a constant-temperature oil tank and a high-temperature testing wheel. The constant-temperature oil tank is located below the worktable of the second frame, and the high-temperature testing wheel is located inside the constant-temperature oil tank. One end of the second front conveyor chain extends to one side of the conversion conveyor wheel, and the other end extends to the high-temperature testing wheel. One end of the first rear conveyor chain extends to the high-temperature testing wheel, and the other end extends to the sorting and receiving mechanism.

[0010] As a further description of the above technical solution: A preheating mechanism is provided between the second straightening mechanism and the high-temperature testing mechanism. The preheating mechanism includes a heating element that extends below the second front conveyor chain.

[0011] As a further description of the above technical solution: The receiving mechanism includes a distributing wheel, a sorting wheel mounting frame, a distributing box, and a receiving seat. The distributing wheel is rotatably mounted on the sorting wheel mounting frame. The distributing box is located on one side of the distributing wheel. Several claw plates are arranged between the distributing box and the distributing wheel, and these claw plates are arranged circumferentially along the distributing wheel. A claw plate drive motor is installed on the sorting wheel mounting frame, and the claw plates are fixedly mounted on the motor shaft of the claw plate drive motor. Several feeding channels are provided on the distributing box, with one feeding channel corresponding to one claw plate. The receiving seat is located below the distributing box, and several receiving slots are provided on the receiving seat, with one receiving slot corresponding to one feeding channel.

[0012] As a further description of the above technical solution: The feeding mechanism includes a feeding chute and a first conveyor wheel, with one end of the feeding chute extending to one side of the first conveyor wheel.

[0013] As a further description of the above technical solution: The first frame contains a first elevator, which is fixedly installed on the ground. The lifting rod of the first elevator is fixedly installed on the first frame.

[0014] As a further description of the above technical solution: A first protective cover is provided on the first frame, and a feeding mechanism is located outside the first protective cover. A second protective cover is provided on the second frame, and a sorting and receiving mechanism is located outside the second protective cover.

[0015] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are: 1. In this invention, the integrated room temperature and high temperature testing equipment for the resistance of the wave crest axial thermistor mainly consists of two parts: a room temperature testing module and a high temperature testing module. The room temperature testing module is used to measure the resistance of the wave crest axial thermistor at room temperature, and the high temperature testing module is used to measure the resistance of the wave crest axial thermistor at high temperature, so that the B value of the device can be calculated by the operation of the two resistance values. Both the room temperature testing module and the high temperature testing module control the ambient temperature to stabilize by immersing the thermistor in an oil bath, and realize the room temperature test and high temperature test of the same thermistor online, thereby improving the testing efficiency and testing quality of the wave crest axial thermistor.

[0016] 2. In this invention, the room temperature test module and the high temperature test module are set up independently. The axial thermistor of the wave crest is transferred by changing the material roller, which facilitates the separate maintenance of the room temperature test module and the high temperature test module. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 A schematic diagram of the structure of a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor. Figure 1 .

[0019] Figure 2 A schematic diagram of the structure of a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor. Figure 2 .

[0020] Figure 3 This is a schematic diagram of the structure of the room temperature testing module in a room temperature and high temperature integrated testing device for the resistance value of a wave crest axial thermistor. Figure 1 .

[0021] Figure 4This is a schematic diagram of the structure of the room temperature testing module in a room temperature and high temperature integrated testing device for the resistance value of a wave crest axial thermistor. Figure 2 .

[0022] Figure 5 This is a schematic diagram of the structure of the room temperature testing module in a room temperature and high temperature integrated testing device for the resistance value of a wave crest axial thermistor. Figure 3 .

[0023] Figure 6 for Figure 5 A magnified view of a portion of point A in the middle.

[0024] Figure 7 This is a schematic diagram of the high-temperature testing module in a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor.

[0025] Figure 8 This is a schematic diagram of the sorting and collecting mechanism in a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor.

[0026] Figure 9 for Figure 8 A magnified view of a section at point B.

[0027] Legend: 1. Room temperature testing module; 11. First frame; 111. First cover plate; 12. Feeding mechanism; 121. Feeding chute; 122. First conveyor wheel; 13. First straightening mechanism; 14. First conveyor chain guide frame; 141. Vertical frame section; 142. Horizontal frame section; 143. Inclined frame section; 144. First chain guide wheel; 15. Room temperature testing mechanism; 151. Room temperature oil tank; 152. Room temperature testing wheel; 16. Conversion conveyor wheel; 17. Chain side positioning plate; 171. Vertical positioning section; 18. First elevator; 19. First protective cover; 2. High-temperature testing module; 21. Second frame; 22. Second straightening mechanism; 23. High-temperature testing mechanism; 231. Constant temperature oil bath; 232. High-temperature testing wheel; 24. Sorting and receiving mechanism; 241. Sorting wheel; 242. Sorting wheel mounting frame; 243. Sorting box; 2431. Discharge channel; 244. Receiving seat; 25. Preheating mechanism; 26. Second protective cover. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0029] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention. Example

[0030] Please see Figure 1-9 This invention provides a technical solution: a room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor, comprising: The room temperature testing module 1 includes a feeding mechanism 12, a first straightening mechanism 13, a room temperature testing mechanism 15, and a conversion belt roller 16 arranged sequentially along the thermistor conveying direction on the first frame 11. The high temperature testing module 2 includes a second frame 21, a second straightening mechanism 22, a high temperature testing mechanism 23, and a sorting and collecting mechanism 24. The second straightening mechanism 22, the high temperature testing mechanism 23, and the sorting and collecting mechanism 24 are arranged sequentially along the thermistor conveying direction on the second frame 21. Among them, the ambient temperature testing mechanism 15 includes an ambient temperature oil tank 151 and an ambient temperature testing wheel 152. The ambient temperature oil tank 151 is located below the workbench of the first frame 11. The workbench of the first frame 11 is provided with a first cover plate 111 corresponding to the ambient temperature oil tank 151. The first material chain guide frame 14 is provided with through holes arranged in an array. The first frame 11 is provided with a first material-carrying chain guide frame 14. The first material-carrying chain guide frame 14 includes a vertical frame section 141, a horizontal frame section 142 and an inclined frame section 143. The lower part of the vertical frame section 141 passes through the first cover plate 111 and is connected to the horizontal frame section 142. One end of the inclined frame section 143 is connected to the horizontal frame section 142, and the other end extends out of the first cover plate 111. The horizontal frame section 142 is set in the ambient temperature oil tank 151. The ambient temperature test wheel 152 is rotatably mounted on the horizontal frame section 142. Two parallel test pieces are set on one side of the ambient temperature test wheel 152. The two test pieces contact the leads on both sides of the axial thermistor on the peak of the ambient temperature test wheel 152 to realize the resistance measurement. The ambient temperature test wheel 152 is driven by a divider. The divider is fixedly mounted on the first frame 11. One end of the first front conveyor chain extends to the feeding mechanism 12 and the other end extends to the ambient temperature test wheel 152. One end of the first rear conveyor chain extends to the ambient temperature test wheel 152 and the other end extends to the conversion conveyor wheel 16.

[0031] The integrated room temperature and high temperature testing equipment for wave-crest axial thermistor resistance measurement mainly consists of two parts: room temperature testing module 1 and high temperature testing module 2. Room temperature testing module 1 is used to measure the resistance of the wave-crest axial thermistor at room temperature (25℃), and high temperature testing module 2 is used to measure the resistance of the wave-crest axial thermistor at high temperature (85℃). This allows for subsequent calculation of the device's B value using the two resistance values. Both room temperature testing module 1 and high temperature testing module 2 stabilize the ambient temperature by immersing the thermistor in an oil bath and perform both room temperature and high temperature tests on the same thermistor online, improving the testing efficiency and quality of the wave-crest axial thermistor.

[0032] The ambient temperature test module 1 and the high temperature test module 2 are set up independently. The axial transfer of the thermistor of the wave crest is realized by the conversion of the feed roller 16, which facilitates the separate maintenance of the ambient temperature test module 1 and the high temperature test module 2.

[0033] The first material-carrying chain guide frame 14 is provided with two parallel chain side positioning plates 17. The chain side positioning plates 17 are arranged along the length direction of the first material-carrying chain guide frame 14. The chain side positioning plates 17 are provided with vertical positioning sections 171 whose positions correspond to the vertical frame section 141. The cross-section of the vertical positioning section 171 is "L" shaped, and the bent edge at the top of the vertical positioning section 171 contacts the lead wire of the thermistor.

[0034] When the first front conveyor chain and its thermistor descend along the vertical frame section 141 into the ambient temperature oil tank 151, the vertical positioning section 171 of the chain side positioning plate 17 positions the lead wire of the thermistor through the top bending edge to prevent the thermistor from detaching from the first front conveyor chain.

[0035] The high-temperature testing mechanism 23 includes a constant-temperature oil tank 231 and a high-temperature testing wheel 232. The constant-temperature oil tank 231 is located below the workbench of the second frame 21, and the high-temperature testing wheel 232 is located inside the constant-temperature oil tank 231. One end of the second front conveyor chain extends to one side of the conversion conveyor wheel 16, and the other end extends to the high-temperature testing wheel 232. One end of the first rear conveyor chain extends to the high-temperature testing wheel 232, and the other end extends to the sorting and receiving mechanism 24.

[0036] The thermistors tested at room temperature are transferred to the second front conveyor chain via the conversion conveyor wheel 16. After being straightened by the second straightening mechanism 22, the thermistors on the second front conveyor chain enter the high temperature testing mechanism 23 for resistance testing under high temperature conditions. The working principle is the same as that of the room temperature testing mechanism 15, except that the oil temperature is different.

[0037] The feeding mechanism 12 includes a feeding trough 121 and a first conveyor roller 122, with one end of the feeding trough 121 extending to one side of the first conveyor roller 122. A plurality of wave-crest axial thermistors stored in the feeding trough 121 slide into the conveyor gap on the first conveyor roller 122, enabling individual feeding using the first conveyor roller 122. As the first conveyor roller 122 rotates to the other side, the components are conveyed to the first front conveyor chain. The working principle of the first conveyor roller 122 for individual feeding of electronic components is common knowledge and will not be elaborated further.

[0038] A rotatable brush wheel can be installed on the upper side of the first conveyor wheel 122. The axial thermistor of the wave crest on the first conveyor wheel 122 that extends beyond the side end face is brushed off by the brush wheel, so that the brush wheel can prevent the material from stacking.

[0039] Working principle: Taking the resistance test in the room temperature test module 1 as an example, the thermistor supplied by the feeding mechanism 12 is conveyed by the first front conveyor chain. After the lead wire is straightened by the second straightening mechanism 22, the first front conveyor chain enters the room temperature oil tank 151 along the first conveyor chain guide frame 14. As the first front conveyor chain moves in the room temperature oil tank 151, the thermistor is immersed in the oil tank and kept at a constant temperature for a period of time before being conveyed to the room temperature test wheel 152. The thermistor is guided into the room temperature test wheel 152 and tested at room temperature. Then, it rotates to the other side with the room temperature test wheel 152 and falls onto the first rear conveyor chain. It is then moved out of the room temperature oil tank 151 by the first rear conveyor chain. The thermistor at the end of the first rear conveyor chain is guided into the switching conveyor wheel 16 to realize the switching of the thermistor between the room temperature test module 1 and the high temperature test module 2.

[0040] Similarly, in the high-temperature test module 2, the second front conveyor chain is guided into the oil tank by the second conveyor chain guide frame, and the thermistor is also immersed in the oil tank and kept at a constant temperature for a period of time before the high-temperature test is carried out to ensure the accuracy of the test.

[0041] In addition, the temperature of the oil inside the ambient temperature oil bath 151 is kept stable by a heating element and an oil temperature controller. The same principle applies to the temperature-controlled oil bath 231. Example

[0042] Based on the above embodiments, this embodiment further improves upon the following technical solution: a first chain guide wheel 144 is provided at the angle between the vertical frame section 141 and the horizontal frame section 142, and the first front conveyor chain passes around the first chain guide wheel 144.

[0043] The first chain guide wheel 144 is rotatably mounted on the horizontal frame section 142, and the first chain guide wheel 144 is provided with a groove corresponding to the chain teeth on the first front conveyor chain, so that the first front conveyor chain changes from vertical downward movement to horizontal conveying along the horizontal frame section 142, and the bottom of the vertical positioning section 171 extends to the first chain guide wheel 144 to prevent the thermistor from detaching from the first front conveyor chain during the turning process.

[0044] Similarly, a second chain guide wheel is set at the angle between the horizontal frame section 142 and the inclined frame section 143 to prevent the thermistor from detaching from the first front conveyor during the conveying process in which the inclined frame section 143 guides the first rear conveyor chain from horizontal to inclined upward. Example

[0045] This embodiment further improves upon the above embodiment by providing the following technical solution: a preheating mechanism 25 is provided between the second straightening mechanism 22 and the high-temperature testing mechanism 23. The preheating mechanism 25 includes a heating element extending below the second front conveyor chain. The heating element can specifically use components such as heating wires or heating plates.

[0046] The preheating mechanism 25 heats the second front conveyor chain to prevent its low temperature from affecting the temperature control of the high-temperature oil in the constant temperature oil tank 231. It also prevents the low temperature of the second front conveyor chain from affecting the temperature near the thermistor and thus avoids interference with the high-temperature test of the thermistor. Example

[0047] This embodiment further improves upon the above embodiment by providing the following technical solution: The sorting and receiving mechanism 24 includes a sorting wheel 241, a sorting wheel mounting frame 242, a sorting box 243, and a receiving seat 244. The sorting wheel 241 is rotatably mounted on the sorting wheel mounting frame 242. A sorting wheel drive device is provided on the back of the sorting wheel mounting frame 242 to drive the sorting wheel 241 to rotate. The sorting box 243 is located on one side of the sorting wheel 241. A plurality of claw plates 245 are provided between the sorting box 243 and the sorting wheel 241. Along the circumference of the sorting wheel 241, a pawl drive motor is installed on the sorting wheel mounting frame 242. The pawl 245 is fixedly installed on the motor shaft of the pawl drive motor. The sorting box 243 is provided with several feeding channels 2431, and one feeding channel 2431 corresponds to one pawl 245. The receiving seat 244 is located below the sorting box 243. The receiving seat 244 is provided with several receiving grooves, and one receiving groove corresponds to one feeding channel 2431.

[0048] The wave-crest axial thermistors that have completed room temperature and high temperature tests are conveyed to one side of the distribution wheel 241 via the second rear conveyor chain. The wave-crest axial thermistors on the second rear conveyor chain are guided by the guide plate into the conveyor gap on the distribution wheel 241, and as the distribution wheel 241 rotates, they are carried by the distribution wheel 241 to the other side of the distribution box 243. There may be four types of wave-crest axial thermistors on the distribution wheel 241: qualified products, products that failed the room temperature test, products that failed the high temperature test, and products that failed both tests.

[0049] Four claws 245 arranged circumferentially on the outer side of the material distribution wheel 241 are used to move the four types of wave crest axial thermistors on the material distribution wheel 241 to the four feeding channels 2431 of the material distribution box 243, and then collect them into different receiving slots on the receiving seat 244.

[0050] On the other hand, under normal conditions, the claw 245 positions the lead wire of the wave crest axial thermistor through its lower edge, preventing the wave crest axial thermistor from detaching from the material feeding gap on the feeding wheel 241, so that the wave crest axial thermistor can rotate with the feeding wheel 241 to the corresponding feeding channel 2431 and then be fed by the claw 245. Example

[0051] Based on the above embodiments, this embodiment further improves upon the following technical solution: a first elevator 18 is provided inside the first frame 11, the first elevator 18 is fixedly installed on the ground, and the lifting rod of the first elevator 1 is fixedly installed on the first frame 11.

[0052] The first lifting platform 18 can be a worm gear screw jack. The four corners of the first frame 11 are synchronously lifted by the worm gear screw jack, so that the main unit of the ambient temperature test module 1 (except for the ambient temperature oil tank 151) can be lifted and lowered, so that the ambient temperature oil tank 151 can be moved into and out of the ambient temperature test module 1.

[0053] Similarly, the four corners of the high temperature test module 2 are equipped with second elevators to lift the main unit, so as to facilitate the movement of the constant temperature oil tank 231 in and out. Example

[0054] Based on the above embodiments, this embodiment further improves upon the following technical solutions: a first protective cover 19 is provided on the first frame 11, a feeding mechanism 12 is provided outside the first protective cover 19, a second protective cover 26 is provided on the second frame 21, and a sorting and receiving mechanism 24 is provided outside the second protective cover 26.

[0055] In addition to dust protection, the first protective cover 19 and the second protective cover 26 on the machine can also effectively keep warm and reduce temperature fluctuations. In addition, the feeding mechanism 12 and the sorting and receiving mechanism 24 are located outside the protective covers to avoid interference with the loading and unloading of the wave crest axial thermistors.

[0056] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A room-temperature and high-temperature integrated testing device for the resistance value of a wave crest axial thermistor, characterized in that, include: The room temperature testing module includes a feeding mechanism, a first straightening mechanism, a room temperature testing mechanism, and a conversion belt roller arranged sequentially along the thermistor conveying direction on the first frame; The high-temperature testing module includes a second frame, a second straightening mechanism, a high-temperature testing mechanism, and a sorting and collecting mechanism. The second straightening mechanism, the high-temperature testing mechanism, and the sorting and collecting mechanism are arranged sequentially along the thermistor conveying direction on the second frame. The ambient temperature testing mechanism includes an ambient temperature oil tank and an ambient temperature testing wheel, and a first cover plate corresponding to the ambient temperature oil tank is provided on the worktable of the first frame. The first frame is provided with the first material chain guide frame, which includes a vertical frame section, a horizontal frame section and an inclined frame section. The lower part of the vertical frame section passes through the first cover plate and is connected to the horizontal frame section. One end of the inclined frame section is connected to the horizontal frame section and the other end extends out of the first cover plate. The horizontal frame section is set in the ambient temperature oil tank, and the ambient temperature test wheel is rotatably installed on the horizontal frame section. One end of the first front conveyor chain extends to the feeding mechanism and the other end extends to the ambient temperature test wheel. One end of the first rear conveyor chain extends to the ambient temperature test wheel and the other end extends to the conversion conveyor wheel.

2. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The first material conveyor chain guide frame is provided with two parallel chain side positioning plates. The chain side positioning plates are provided with vertical positioning sections whose positions correspond to the vertical frame section. The bent edge at the top of the vertical positioning section contacts the lead wire of the thermistor.

3. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, A first chain guide wheel is provided at the angle between the vertical frame section and the horizontal frame section, and the first front conveyor chain passes around the first chain guide wheel.

4. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The high-temperature testing mechanism includes a constant-temperature oil tank and a high-temperature testing wheel. The constant-temperature oil tank is located below the worktable of the second frame, and the high-temperature testing wheel is located inside the constant-temperature oil tank. One end of the second front conveyor chain extends to one side of the conversion conveyor wheel, and the other end extends to the high-temperature testing wheel. One end of the first rear conveyor chain extends to the high-temperature testing wheel, and the other end extends to the sorting and receiving mechanism.

5. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, A preheating mechanism is provided between the second straightening mechanism and the high temperature testing mechanism, and the preheating mechanism includes a heating element extending below the second front conveyor chain.

6. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The sorting and receiving mechanism includes a sorting wheel, a sorting wheel mounting frame, a sorting box, and a receiving seat. The sorting wheel is rotatably mounted on the sorting wheel mounting frame. The sorting box is located on one side of the sorting wheel. A plurality of claw plates are arranged between the sorting box and the sorting wheel, and the claw plates are arranged circumferentially along the sorting wheel. A claw plate drive motor is mounted on the sorting wheel mounting frame, and the claw plates are fixedly mounted on the motor shaft of the claw plate drive motor. The sorting box has a plurality of feeding channels, and one feeding channel corresponds to one claw plate. The receiving seat is located below the sorting box, and the receiving seat has a plurality of receiving slots, and one receiving slot corresponds to one feeding channel.

7. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The feeding mechanism includes a feeding chute and a first conveyor wheel, with one end of the feeding chute extending to one side of the first conveyor wheel.

8. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The first frame is equipped with a first elevator, which is fixedly installed on the ground, and the lifting rod of the first elevator is fixedly installed on the first frame.

9. The integrated room-temperature and high-temperature testing device for the resistance value of a wave crest axial thermistor according to claim 1, characterized in that, The first frame is provided with a first protective cover, and the feeding mechanism is located outside the first protective cover. The second frame is provided with a second protective cover, and the sorting and receiving mechanism is located outside the second protective cover.

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