A connector terminal insertion testing device
By using a needle-synchronous monitoring mechanism to monitor the connector terminal insertion process in real time, the problem of redundant mechanical movements in existing testing devices is solved, achieving efficient and stable insertion testing and extending the service life of the device.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-14
- Publication Date
- 2026-03-31
AI Technical Summary
Existing connector terminal mating test equipment involves unnecessary mechanical movements during the test process, resulting in easily damaged test probes, low efficiency, and poor stability, making it difficult to balance test reliability and long-term operational stability.
A needle synchronization monitoring mechanism is adopted, which monitors the synchronization of the test probe needle in real time through follow-up components and monitoring units, and terminates the insertion test action in a timely manner to avoid unnecessary mechanical actions and improve the stability and reliability of the test probe.
It improves testing efficiency, extends the service life of the testing equipment, ensures the reliability of plug-in testing and the stability of long-term operation, and reduces mechanical wear and elastic fatigue.
Smart Images

Figure CN121500191B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of terminal testing, and specifically to a connector terminal insertion test device. Background Art
[0002] After the connector terminal is inserted and assembled, it is usually necessary to test the insertion depth, position consistency and insertion reliability of the terminal through an insertion test device, so as to avoid affecting the electrical connection performance and use safety of the connector due to problems such as insufficient terminal insertion, looseness or virtual connection.
[0003] Existing connector terminal insertion test devices mostly use test probes to perform insertion tests on terminals. The test probe usually includes an axially movable needle tip, an elastic element (spring), a barrel body and a tail end contact. During the insertion test, the test probe moves towards the corresponding terminal hole position on the connector housing under the push of the driving mechanism.
[0004] When the needle tip contacts the terminal, the test probe continues to advance. If the terminal has been inserted in place and reliably locked, the terminal will block the continued advancement of the needle tip, forcing the needle tip to retract relative to the barrel body against the elastic force of the elastic element. This retraction stroke is usually a preset fixed mechanical stroke. When the needle tip retracts to the end point of the preset stroke, the conductive part at the tail of the needle tip will contact the contact at the tail of the barrel body, forming a closed test circuit, which is judged as qualified.
[0005] Conversely, if an abnormal situation occurs and the test circuit cannot be closed, it is judged as unqualified. Specifically, it includes: 1. Terminal missing: The needle tip is inserted into the empty hole without obstruction and there is no retraction action.
[0006] 2. Terminal not inserted in place: Although the terminal is located in the hole position, it is only partially inserted or does not reach the locked position, and its front end position is further back than the standard position (i.e., "insufficient insertion depth"). When the test probe driving mechanism stops advancing, the retraction amount of the needle tip is not enough to reach the preset position where it contacts the tail contact, resulting in the test circuit not being closed.
[0007] 3. Terminal not locked firmly or virtual connection: The terminal is pushed backward under the pressure of the needle tip (i.e., "ejected"), and the retraction amount of the needle tip is small or even does not retract. When the test probe driving mechanism stops advancing, the needle tip has not retracted to the preset position where it contacts the tail contact, resulting in the test circuit not being closed.
[0008] Through the methods described above, existing connection testing devices can, to some extent, distinguish between various abnormal states such as missing terminals, incomplete connection, and loose locking. However, in practical applications, existing technology still has significant shortcomings. Regardless of whether the terminal is abnormal, the test probe completes the entire advance and retraction test action according to a preset stroke, lacking the ability to respond instantly to the actual connection status of the terminal. When the terminal connection is abnormal, unnecessary mechanical actions occur. Under long-term, high-frequency testing conditions, this can easily accelerate the fatigue aging of elastic elements and the mechanical wear of the needle and syringe, thereby affecting the accuracy of the test probe retraction and the reliability of electrical contact, reducing the overall stable operation and service life of the testing device. Furthermore, unnecessary mechanical actions generate ineffective action time, limiting further improvements in testing efficiency.
[0009] Therefore, although existing testing equipment can detect different interpolation abnormalities, varying degrees of looseness, and missing terminals within a certain range, it still suffers from redundant testing actions, vulnerability of key components, and limited testing efficiency. It is difficult to ensure testing reliability while simultaneously meeting the requirements for long-term operational stability and efficient testing. Summary of the Invention
[0010] This invention provides a connector terminal mating test device, including a test socket, several test probes, a drive mechanism, a control system, and a probe synchronization monitoring mechanism. The test probes are arranged in a row on the test socket, and each test probe includes a probe tip that is elastically telescopically arranged along the mating direction. The probe tip has a stepped structure with a stepped surface. The probe synchronization monitoring mechanism includes several follower members and several monitoring units. The follower members correspond one-to-one with the test probes and are elastically slidable along the mating direction, abutting against the stepped surface of the probe tip. The monitoring units are respectively arranged between adjacent test probes. Each monitoring unit includes two monitoring heads and a monitoring seat. The monitoring heads are respectively mounted on the follower members corresponding to the adjacent test probes and move with the follower members. The monitoring seat is elastically slidable along the mating direction. Under normal conditions, the monitoring seat maintains abutment contact with both monitoring heads simultaneously. When the probe tip displacements on adjacent test probes are asynchronous, the corresponding two monitoring heads generate relative displacement, causing the monitoring seat to disengage from the abutment contact state under the limiting action of one monitoring head and sending an abnormal signal to the control system. The control system then controls the drive mechanism to stop the continued advancement of the test probes.
[0011] In one possible implementation, the follower includes an arc-shaped contact end and a rod-shaped sliding part. The arc-shaped contact end abuts against the stepped surface, and the opening of the arc-shaped contact end is used to accommodate a small diameter portion of the needle, so that the follower moves radially along the needle to complete the mating installation with the needle.
[0012] In one possible implementation, the monitoring base includes a sliding rod two and a contact plate. The contact plate is fixedly mounted on the sliding rod two and has symmetrically arranged constraint holes. The monitoring head includes a guide post and a limiting platform. The guide post of the monitoring head is inserted into the constraint holes on the monitoring base, and the limiting platform abuts against the contact plate.
[0013] In one possible implementation, the follower is slidably positioned at the upper limit of the test seat and maintains a contacting relationship with the needle throughout the needle reset process.
[0014] In one possible implementation, the test fixture includes a first mounting part and a second mounting part, with a test probe integrated on the first mounting part and a needle synchronization monitoring mechanism integrated on the second mounting part, which is assembled with the first mounting part.
[0015] In one possible implementation, a micro-motion contact structure is provided between the monitoring head and the monitoring base, the travel of which is less than the retraction travel of the needle.
[0016] In one possible implementation, the micro-motion contact structure includes a limiting seat and an elastic conductive contact, the elastic conductive contact being slidably mounted on the limiting seat.
[0017] In one possible implementation, the direction of the elastic force on the monitoring seat is opposite to the direction of the elastic force on the follower. When the needle retracts, part of the elastic force on the monitoring seat is transmitted to the follower through the monitoring head.
[0018] The above-mentioned one or more technical solutions in the embodiments of the present invention have the following technical effects: According to the connector terminal insertion test device provided by the embodiments of the present invention, the retraction synchronization of multiple test probes during the connector insertion process is monitored in real time by a probe synchronization monitoring mechanism. When the terminal insertion is abnormal, the insertion test action is terminated in time to avoid unnecessary mechanical action, improve the stability and reliability of the test probe operation under long-term and high-frequency test conditions, and improve test efficiency. In addition, during the monitoring process, the mechanical cooperation of the monitoring seat, the monitoring head and the follower can monitor the synchronization of probe retraction with long-term stability and reliability, and can assist the precise reset of the probe to a certain extent, further ensuring the reliability of the insertion test and the stability of long-term operation. Attached Figure Description
[0019] Figure 1 This is a schematic diagram of the test base and mounting base of a connector terminal insertion test device provided in an embodiment of the present invention.
[0020] Figure 2This is a partial top-view structural diagram of a connector terminal insertion test device provided in an embodiment of the present invention.
[0021] Figure 3 This is a schematic diagram of the sliding rod, the limiting groove, and the mounting platform of a connector terminal insertion test device provided in an embodiment of the present invention.
[0022] Figure 4 This is a side view of the sliding rod one and sliding rod two of a connector terminal insertion test device provided in an embodiment of the present invention.
[0023] Figure 5 This is a schematic diagram of the structure of the first mounting part and the second mounting part of a connector terminal insertion test device provided in an embodiment of the present invention.
[0024] Figure 6 This is an exploded structural diagram of the test socket of a connector terminal insertion test device provided in an embodiment of the present invention.
[0025] Figure 7 This is a schematic diagram showing the state of the pin and test head of a connector terminal insertion test device provided in an embodiment of the present invention when no insertion test is performed.
[0026] Figure 8 This is a schematic diagram showing the state of contact between the needle and the test head when the test circuit of a connector terminal insertion test device provided in an embodiment of the present invention is closed.
[0027] Figure 9 This is a schematic diagram of the micro-motion structure of a connector terminal insertion test device provided in an embodiment of the present invention.
[0028] In the diagram: 1. Test base; 101. First mounting part; 102. Second mounting part; 2. Test probe; 21. Needle; 22. Test head; 3. Needle synchronous monitoring mechanism; 31. Follower; 311. Arc-shaped contact end; 312. Rod-shaped sliding part; 313. Connecting frame; 314. Sliding rod one; 32. Monitoring head; 321. Guide column; 322. Limiting platform; 33. Monitoring base; 331. Sliding rod two; 332. Contact plate; 333. Constraint hole; 34. Micro-motion contact structure; 341. Limiting seat; 342. Elastic conductive contact; 35. Spring component one; 36. Spring component two; 37. Guide rod; 38. Limiting groove; 39. Mounting platform; 4. Mounting base. Detailed Implementation
[0029] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described below, and those skilled in the art can make similar modifications without departing from the spirit of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.
[0030] Please see Figures 1-8 A connector terminal mating test device includes a test socket 1, test probes 2, a probe synchronization monitoring mechanism 3, a mounting base 4, a drive mechanism (not shown in the figure), and a control system (not shown in the figure). The test socket 1 is mounted on the mounting base 4, and a number of test probes 2 are mounted on the test socket 1 in a row from left to right. Figure 1 As shown, there are four test probes 2, each corresponding to a terminal on the connector.
[0031] The test probe 2 includes a needle head 21 that is elastically telescopic in the front-to-back direction and a test head 22 at the tail. The needle head 21 has a stepped structure with a stepped surface, and the test head 22 is connected to the test circuit via a wire. The needle head synchronous monitoring mechanism 3 is used to monitor whether the needles 21 on the array of test probes 2 retract synchronously during the connector insertion test, so as to determine in real time whether there is an insertion abnormality of the terminal, and send an abnormal signal to the control system when an abnormality is detected, thereby controlling the drive mechanism to terminate the subsequent insertion test action.
[0032] Specific testing process: The drive mechanism consists of a servo motor and a linear module. The servo motor drives the linear module to advance the mounting base 4 forward, causing the needle 21 of the test probe 2 to insert into the corresponding hole of the connector, and the needle 21 abuts against the terminal in the corresponding hole. Then, as the mounting base 4 continues to advance, the needle 21 retracts backward due to the obstruction of the terminal. When the needle 21 retracts to a preset position and abuts against the test head 22 at the tail of the test probe 2 (e.g., ...), ... Figure 6 As shown in the figure, a closed test loop is formed, and the control system receives the closed signal and determines that the connector is qualified.
[0033] Under normal circumstances, after the needle 21 contacts the terminal, it will retract backward synchronously under the obstruction of the terminal, and the needles 21 arranged in a row will maintain a consistent movement state.
[0034] When any terminal connection is abnormal, such as improper or insecure insertion, causing it to be pushed out by the corresponding pin 21 after contact, resulting in the pin 21 not retracting synchronously with the other pins 21, the pin synchronization monitoring mechanism 3 will detect the asynchrony in real time and send an abnormal signal to the control system. The control system will then issue an interrupt command to the drive mechanism, stopping the mounting base 4 from moving and resetting it. The connector can then be marked as defective using an existing marking device, and the testing of the next connector can proceed.
[0035] It should be noted that the present invention can also monitor over-insertion. That is, when any one or more terminals are over-inserted, the corresponding test probe 2 will retract prematurely during the insertion process. The needle synchronization monitoring mechanism 3 can also detect the asynchronous state of the needle 21 and issue an abnormal signal.
[0036] See Figure 1 and Figure 2 The needle synchronization monitoring mechanism 3 includes several follower components 31 and several monitoring units. Each follower component 31 corresponds one-to-one with the test probe 2 and is elastically slidable on the test seat 1 in the front-to-back direction, such as... Figure 2 As shown, a spring 35 is provided between the follower 31 and the test seat 1, and the front end of the follower 31 abuts against the stepped surface of the needle 21.
[0037] Monitoring units are respectively arranged between adjacent test probes 2. Each monitoring unit includes two monitoring heads 32 and a monitoring seat 33. The monitoring heads 32 are respectively mounted on the follower 31 corresponding to the adjacent test probe 2 and move with the follower 31. The monitoring seat 33 is elastically slidably arranged on the test seat 1 in the front-back direction. Figure 2 As shown, a spring element 36 is provided between the monitoring seat 33 and the test seat 1. Under normal conditions, the test seat 1 in the same detection unit maintains contact with both monitoring heads 32 simultaneously.
[0038] When the needle 21 retracts synchronously, the follower 31 moves backward, and the spring 36 releases its elastic force, causing the monitoring seat 33 to move backward and maintain a contacting state with the corresponding two monitoring heads 32.
[0039] When any needle 21 fails to retract synchronously, the corresponding follower 31 stops moving, and the monitoring seat 33 will not continue to move backward under the limit of the corresponding monitoring head 32 on the follower 31, and thus disengage from the other monitoring head 32. At this time, the monitoring circuit is in a disconnected state and sends an abnormal signal to the control system.
[0040] It should be noted that the monitoring heads 32 and monitoring bases 33 in all monitoring units are connected in series with wires to form a total monitoring loop. The wiring of this loop is simple, requiring only two signal lines. The control system only needs to monitor one DI point to complete the judgment: when the total monitoring loop is on, it indicates that all needles 21 are synchronized and the connector is qualified; when the total monitoring loop is off, at least one needle 21 is out of sync and the connector is unqualified.
[0041] See Figure 1 , Figure 5 and Figure 6 To facilitate assembly and subsequent replacement and maintenance, the test base 1 is provided with a first mounting part 101 and a second mounting part 102. The test probe 2 is mounted on the first mounting part 101, and the needle synchronization monitoring mechanism 3 is mounted on the second mounting part 102. Simply assemble the second mounting part 102 with the needle synchronization monitoring mechanism 3 installed and the first mounting part 101 with the test probe 2 installed together to complete the matching installation of the follower 31 and the test probe 2.
[0042] See Figure 2 , Figure 5 and Figure 6 The follower 31 includes an arc-shaped contact end 311 and a rod-shaped sliding part 312. The rod-shaped sliding part 312 is slidably inserted into the second mounting part 102 and is symmetrically distributed left and right. The arc-shaped contact end 311 is fixedly installed on the front end of the symmetrical rod-shaped sliding part 312 and abuts against the stepped surface of the needle 21. The opening of the arc-shaped contact end 311 can accommodate the small diameter portion of the needle 21. When the first mounting part 101 is installed on the second mounting part 102, the arc-shaped contact end 311 is just locked onto the needle 21 and abuts against the stepped surface (e.g., Figure 5 As shown in the figure, the arc-shaped contact end 311 is coaxially arranged with the needle 21.
[0043] See Figure 2 , Figure 3 , Figure 4 and Figure 6 The follower 31 also includes a connecting frame 313 and a sliding rod 314. The rear ends of the symmetrical rod-shaped sliding parts 312 are all fixedly installed on the connecting frame 313. The connecting frame 313 is located inside the second mounting part 102. The sliding rod 314 is fixedly connected to the connecting frame 313 and is located above the corresponding test probe 2. At the same time, the sliding rod 314 is slidably installed back and forth in the second mounting part 102.
[0044] The monitoring base 33 includes a sliding rod 331 and a contact plate 332. The contact plate 332 is fixedly installed on the sliding rod 331, and constraint holes 333 are symmetrically opened on the left and right sides of the contact plate 332 (e.g., Figure 3As shown, the monitoring head 32 includes a guide post 321 and a limiting platform 322. The guide post 321 is fixedly installed on the front side of the corresponding limiting platform 322, and the limiting platform 322 is fixedly installed on the sliding rod 314 of the corresponding follower 31. The contact plate 332 is located on the front side of the limiting platform 322, and the guide post 321 is inserted into the corresponding constraint hole 333. Both the contact plate 332 and the limiting platform 322 are made of conductive material. When the contact plate 332 is in contact with both corresponding limiting platforms 322 at the same time, the monitoring circuit is in a closed state; if either one is not in contact, the monitoring circuit is in an open state.
[0045] See Figure 2 , Figure 4 and Figure 9 To improve monitoring reliability, a micro-motion contact structure 34 is installed on the limiting stage 322. The micro-motion contact structure 34 is located below the guide post 321, such as... Figure 9 As shown, the micro-motion contact structure 34 includes a limiting seat 341 and an elastic conductive contact 342. The elastic conductive contact 342 is slidably mounted on the limiting seat 341 with a stroke limited to 0-0.3mm. That is, the monitoring circuit will only be disconnected when the distance between the limiting stage 322 and the contact plate 332 exceeds 0.3mm. The fixed retraction stroke of the contact needle 21 is 2.6mm, and the monitoring action is triggered before the needle 21 completes effective retraction. This can promptly terminate invalid insertion test actions, effectively reducing mechanical wear and elastic fatigue.
[0046] See Figure 2 , Figure 3 and Figure 4 To improve the stability of the sliding rod 331 and sliding rod 314 during forward and backward sliding, a number of guide rods 37 are fixedly installed in the second mounting part 102. The guide rods 37 are respectively inserted through the sliding rod 331 and sliding rod 314, so that the sliding rod 331 and sliding rod 314 slide forward and backward along the corresponding guide rods 37. The spring element 35 is sleeved on the corresponding guide rod 37 and is located between the sliding rod 314 and the rear side wall of the mounting cavity in the second mounting part 102.
[0047] A limiting groove 38 is provided at the front end of the sliding rod 2 331 (e.g. Figure 3 As shown), a mounting platform 39 is provided on the corresponding guide rod 37. The spring element 36 is sleeved on the corresponding guide rod 37 and its front end is fixedly connected to the mounting platform 39, while its rear end is fixedly installed on the bottom surface of the limiting groove 38.
[0048] During the connector insertion test, sliding rod 314 moves backward, causing spring 35 to compress. Simultaneously, spring 36 releases its elasticity, causing sliding rod 331 to move backward. This causes contact plate 332 to press firmly against the two corresponding limiting platforms 322. The elastic forces acting on sliding rod 331 are opposite to those acting on sliding rod 314. Part of the elastic force on sliding rod 331 is transferred to sliding rod 314 through contact plate 332 and limiting platforms 322. This reduces the force exerted by spring 35 on needle 21 via the arc-shaped contact end 311, thus minimizing the impact of the monitoring process on the insertion test and ensuring its stability. It should be noted that the elastic force of spring 35 acting on follower 31 is greater than the sum of the elastic forces of the two adjacent springs 36 acting on the detection base 33. This ensures that follower 31 can overcome the force of spring 36 and stably reset when needle 21 resets.
[0049] Furthermore, the follower 31 is limited and slidably mounted on the second mounting part 102, such as... Figure 2 As shown, the front side wall of the mounting cavity limits the connection frame 313, thereby limiting the follower 31, so that the spring 35 is always in a compressed state. This ensures that when the needle 21 is reset, the follower 31 always maintains a stable contact with the needle 21. It can also assist the needle 21 in accurately resetting when the elastic element in the test probe 2 is loose and cannot accurately reset the needle 21, further ensuring the reliability of the insertion test and the stability of the test process.
[0050] In embodiments of the present invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0051] In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "connected," "installed," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, an integral connection, or a sliding connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0052] The embodiments described herein are preferred embodiments of the present invention and are not intended to limit the scope of protection of the present invention. Therefore, all equivalent changes made based on the structure, shape, and principle of the present invention should be covered within the scope of protection of the present invention.
Claims
1. A connector terminal insertion test device, comprising a test seat, a plurality of test probes, a driving mechanism and a control system, the test probes are installed in a column on the test seat, and the test probes comprise needle heads elastically arranged in an insertion direction, the needle heads are in a stepped structure with stepped surfaces, characterized in that: a needle head synchronization monitoring mechanism for monitoring whether the displacement of the needle heads is synchronized is further included, the needle head synchronization monitoring mechanism comprises: a plurality of followers corresponding to the test probes one by one and elastically slidingly arranged along the insertion direction and abutting against the stepped surfaces of the needle heads; a plurality of monitoring units arranged between adjacent test probes respectively; each monitoring unit comprises two monitoring heads and a monitoring seat, the monitoring heads are respectively installed on the followers corresponding to the adjacent test probes and move along the insertion direction with the followers; and spring members two are arranged between the monitoring seat and the test seat; in a normal state, the monitoring seat keeps abutting contact with the two monitoring heads at the same time, and the monitoring heads and the monitoring seat in all monitoring units are connected in series through wires to form a monitoring loop; when the needle heads are retracted synchronously, the followers move backward, the spring members two release elastic force, the monitoring seat moves backward accordingly, and keeps abutting contact with the corresponding two monitoring heads; when any needle head fails to retract synchronously, the corresponding follower stops moving, the monitoring seat does not continue to move backward under the limitation of the corresponding monitoring head on the follower, and is separated from the other monitoring head, the monitoring loop is disconnected, an abnormal signal is sent to the control system, and the control system controls the driving mechanism to stop the test probes from continuing to advance according to the abnormal signal. The follower comprises an arc-shaped contact end and a rod-shaped sliding part, the arc-shaped contact end abuts against the stepped surface, and the opening of the arc-shaped contact end is used for accommodating the small-diameter part of the needle head to pass through, so that the follower moves along the radial direction of the needle head to complete the cooperative installation with the needle head. The monitoring seat comprises a sliding rod two and a contact plate, the contact plate is fixedly installed on the sliding rod two and symmetrical constraint holes are arranged on the contact plate, the monitoring head comprises a guide column and a limiting table, the guide column of the monitoring head is respectively inserted into the constraint hole on the monitoring seat, and the limiting table abuts against the contact plate. The follower is limitingly and slidingly arranged on the test seat, and always keeps the abutting relationship with the needle head during the reset process of the needle head. The test seat comprises a first mounting part and a second mounting part, the test probes are integrally installed on the first mounting part, the needle head synchronization monitoring mechanism is integrally installed on the second mounting part, and the second mounting part is assembled with the first mounting part. A micro-motion contact structure is arranged between the monitoring head and the monitoring seat, and the action stroke of the micro-motion contact structure is smaller than the retraction stroke of the needle head. The micro-motion contact structure comprises a limiting seat and an elastic conductive contact point, and the elastic conductive contact point is limitingly and slidingly installed on the limiting seat.
2. The connector terminal insertion test device according to claim 1, characterized by: The direction of the elastic force acting on the monitoring seat is opposite to the direction of the elastic force acting on the follower, and part of the elastic force acting on the monitoring seat is transmitted to the follower through the monitoring head when the needle head is retracted.
3. The connector terminal insertion testing device according to claim 1, wherein: 4. The connector terminal insertion testing apparatus according to any one of claims 1 to 3, characterized by: 5. The connector terminal insertion test device according to claim 1 or 2, characterized by: 6. The connector terminal insertion test device according to claim 1 or 3, characterized by: 7. The connector terminal insertion testing apparatus according to claim 6, wherein: 8. The connector terminal insertion testing apparatus according to claim 1 or 3, wherein:
Citation Information
Patent Citations
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