Automatic analysis method and device for double-pulse waveform data and electronic equipment

Abstract

The invention belongs to the technical field of double-pulse testing, and provides an automatic analysis method and device for double-pulse waveform data and electronic equipment. The oscilloscope channel information comprises channels corresponding to gate-emitter voltage, gate current and collector-emitter voltage respectively; the device type and the topological form corresponding to the double-pulse waveform data are identified, the device type comprises at least one of a metal-oxide-semiconductor field effect transistor, an insulated gate bipolar transistor and a diode, and the topological form comprises a single tube or multiple tubes connected in parallel; according to the device type, the topological form and the duty ratio, performing working condition splitting on the double-pulse waveform data to obtain waveform data of multiple working conditions; and performing data analysis on the waveform data of the plurality of working conditions, and outputting waveform analysis results corresponding to the waveform data of the plurality of working conditions.

Description

Technical Field

[0001] This application belongs to the field of dual-pulse testing technology, and more specifically, relates to a method, apparatus, and electronic device for automated analysis of dual-pulse waveform data. Background Technology

[0002] Currently, dual-pulse testing is the core method for evaluating the performance of power semiconductor devices. By collecting waveform data such as gate-emitter voltage and gate current, indicators such as loss and stress are extracted to support device selection and optimization.

[0003] However, the relevant dual-pulse waveform data analysis methods involve a lot of manual intervention and are inefficient. They require manual data import, marking of operating condition boundaries, and setting of parameters. The analysis of a single set of data is time-consuming, and manual operation is prone to result deviation. Furthermore, the device and topology compatibility is poor, and they are mostly designed for specific devices or single-tube topologies. When switching device types or multi-tube parallel topologies, the script needs to be reconstructed, which is not versatile enough. Summary of the Invention

[0004] The purpose of this application is to provide an automated method, apparatus, and electronic device for analyzing bipulse waveform data, aiming to solve the technical problems of low efficiency, poor accuracy, and insufficient versatility in related bipulse waveform data analysis methods.

[0005] To achieve the above objectives, according to the first aspect of this application, an automated analysis method for dual-pulse waveform data is provided, the method comprising: The system receives input duty cycle, oscilloscope channel information, and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current, and collector-emitter voltage, respectively. Identify the device type and topology corresponding to the dual-pulse waveform data. The device type includes at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes. The topology includes a single transistor or multiple transistors connected in parallel. Based on the device type, the topology, and the duty cycle, the dual-pulse waveform data is split into operating conditions to obtain waveform data for multiple operating conditions. Data analysis is performed on the waveform data of the multiple operating conditions respectively, and the waveform analysis results corresponding to the waveform data of each of the multiple operating conditions are output.

[0006] The beneficial effects of the embodiments of this application compared with the prior art are: The system receives input duty cycle, oscilloscope channel information, and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to gate-emitter voltage, gate current, and collector-emitter voltage, respectively. It identifies the device type and topology corresponding to the dual-pulse waveform data. The device type includes at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes. The topology includes single-transistor or multi-transistor parallel connection. Based on the device type, topology, and duty cycle, the system splits the dual-pulse waveform data into multiple operating conditions, obtaining waveform data for each condition. It then performs data analysis on the waveform data for each of these multiple operating conditions, outputting the waveform analysis results for each condition.

[0007] Furthermore, it enables automated and precise analysis of dual-pulse waveform data, allowing for condition decomposition and multi-parameter calculation without manual intervention, significantly improving the efficiency of dual-pulse waveform data analysis. It also adapts to various device types and topologies, meeting customized testing needs in different scenarios.

[0008] According to a second aspect of this application, an automated dual-pulse waveform data analysis device is provided, comprising: The acquisition unit is used to receive input duty cycle, oscilloscope channel information and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current and collector-emitter voltage, respectively. The identification unit is used to identify the device type and topology corresponding to the dual-pulse waveform data. The device type includes at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes. The topology includes a single transistor or multiple transistors connected in parallel. The splitting unit is used to split the dual-pulse waveform data into multiple operating conditions according to the device type, the topology and the duty cycle. The analysis unit is used to perform data analysis on the waveform data of the multiple operating conditions respectively, and output the waveform analysis results corresponding to the waveform data of the multiple operating conditions.

[0009] According to a third aspect of this application, an electronic device is provided, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device causes the electronic device to perform the method as described in any one of the claims.

[0010] According to a fourth aspect of this application, a computer-readable storage medium is provided that stores a computer program, which, when executed by a processor, implements the method as described in any one of the claims.

[0011] According to a fifth aspect of this application, a computer program product is provided that, when run on an electronic device, causes the electronic device to perform the method described in any one of the first aspects above.

[0012] It is understandable that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0014] Figure 1 This is a flowchart illustrating an automated analysis method for dual-pulse waveform data provided in an embodiment of this application; Figure 2 This is a schematic diagram of an optional CSV format file provided in an embodiment of this application; Figure 3 This is a schematic diagram of the visual operation interface of an optional automated analysis platform provided in an embodiment of this application; Figure 4 This is a schematic diagram of the channel data corresponding to the collector-emitter voltage in an optional dual-pulse waveform data provided in an embodiment of this application; Figure 5 This is a schematic diagram of an optional slope variation curve provided in an embodiment of this application; Figure 6 This is a schematic diagram of an optional waveform analysis provided in an embodiment of this application; Figure 7 This is a flowchart illustrating an optional automated analysis method for dual-pulse waveform data provided in an embodiment of this application. Figure 8 This is a flowchart illustrating an optional automated analysis method for dual-pulse waveform data provided in an embodiment of this application. Figure 9 This is a schematic diagram of the structure of an automated dual-pulse waveform data analysis device provided in an embodiment of this application; Figure 10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0015] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0016] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.

[0017] It should also be understood that, in the description of this application, unless otherwise stated, the " / " used in the specification and appended claims indicates that the related objects are in an "or" relationship. For example, A / B can mean A or B. The "and / or" in this application is merely a description of the relationship between the related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. Furthermore, in the description of this application, unless otherwise stated, "multiple" means two or more. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can represent: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.

[0018] Furthermore, to facilitate a clear description of the technical solutions in the embodiments of this application, the terms "first" and "second" are used in the embodiments of this application to distinguish identical or similar items with essentially the same function and effect. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, but are only used for distinguishing descriptions, and the terms "first" and "second" do not necessarily imply that they are different, nor should they be construed as indicating or implying relative importance.

[0019] As used in this application specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if detected [the described condition or event]" may be interpreted, depending on the context, as meaning "once determined," "in response to determination," "once detected [the described condition or event]," or "in response to detection [the described condition or event]."

[0020] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.

[0021] This application provides an example of an automated analysis method for dual-pulse waveform data. The automated analysis method for dual-pulse waveform data provided in this application aims to solve the problems of long time consumption in manual analysis of existing dual-pulse waveform data and the inability of general analysis software to meet customized needs. Through automated working condition decomposition and data analysis process, it can achieve efficient and accurate analysis of dual-pulse waveform data under multiple device types and multiple topologies.

[0022] Please refer to Figure 1 As shown, Figure 1 A schematic flowchart of an automated analysis method for dual-pulse waveform data provided in this application is shown. This is an example and not a limitation; the method can be applied to or run in electronic devices. The method includes: S101 receives input duty cycle, oscilloscope channel information, and dual-pulse waveform data.

[0023] The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current, and collector-emitter voltage.

[0024] S102 identifies the device type and topology corresponding to the dual-pulse waveform data.

[0025] The device types include at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes, and the topology includes single transistors or multiple transistors connected in parallel.

[0026] S103, based on device type, topology and duty cycle, splits the dual-pulse waveform data into operating conditions to obtain waveform data for multiple operating conditions.

[0027] S104 performs data analysis on waveform data for multiple operating conditions and outputs the waveform analysis results corresponding to each operating condition.

[0028] In some embodiments, an automated analysis platform or system can provide a front-end visual interface for users to input the duty cycle and oscilloscope channel information required for analysis, and upload dual-pulse waveform data. The duty cycle input by the user is the duty cycle value of the driving voltage in the dual-pulse test. This duty cycle value is preset according to the actual test conditions and directly affects the calculation of the time range for subsequent condition breakdowns.

[0029] The oscilloscope channel information requires the user to explicitly specify the oscilloscope channel number corresponding to the gate-emitter voltage, gate current, and collector-emitter voltage. This ensures that the automated analysis platform can accurately extract the target electrical parameter signals from the waveform data and avoids analysis deviations caused by incorrect channel correspondence. The dual-pulse waveform data is a CSV or ZIP file exported by the user from the oscilloscope. The CSV file contains information about each channel (e.g., ...). Figure 2 Columns A, B, C, D, E, and F shown represent continuous sampling data from one channel during the test. Users can view this data through... Figure 3 The local file selection or drag-and-drop upload function of the visual operation interface (front-end interface) of the automated analysis platform shown can be used to submit the CSV format file (test file). The automated analysis platform or automated analysis system performs format verification and integrity checks on the received CSV format file to ensure that the double pulse waveform data in the CSV format file can be parsed normally.

[0030] Next, the automated analysis platform or system implements the identification function in two ways: one is for the user to actively select a mode, and the other is... Figure 3 As shown, the automated analysis system provides device type options (Metal-Oxide-Semiconductor Field-Effect Transistor, Insulated-Gate Bipolar Transistor, Diode) and topology options (single transistor, multiple transistors in parallel) on the front-end interface. Users can directly select, fill in, and confirm according to the actual test object. Another mode is automatic identification. The automated analysis system analyzes the characteristic patterns of electrical parameters in the uploaded dual-pulse waveform data (such as differences in gate-emitter voltage drive waveforms of different devices, and the changing characteristics of collector-emitter voltage and gate current during conduction / turn-off), and combines this with the channel information input by the user to automatically match the corresponding device type. Simultaneously, it determines the topology based on the number of independent electrical parameter groups in the dual-pulse waveform data (a single set of electrical parameters corresponds to a single-transistor topology, and multiple sets of independent electrical parameters correspond to a multiple-transistor parallel topology). After identification, the automated analysis system feeds back the identification results to the front-end interface for user confirmation. Users can manually correct the results according to the actual situation to ensure that subsequent analysis processes match the test object.

[0031] Then, based on the recognition results and input parameters, operating condition segmentation is performed to obtain waveform data for multiple independent operating conditions. It should be understood that the core logic of operating condition segmentation is to determine the time range of each operating condition based on the slope characteristics of the collector-emitter voltage and the duty cycle, thereby achieving accurate separation of waveforms from multiple operating conditions. In some embodiments, the automated analysis platform or automated analysis system first extracts the channel data corresponding to the collector-emitter voltage from the double-pulse waveform data, such as... Figure 4 As shown. The sliding window slope is calculated for the channel data corresponding to the collector-emitter voltage according to a predetermined window width (the window width can be adjusted according to the sampling frequency and test accuracy, for example, set to 10-100 sampling points), generating the following... Figure 5 The slope change curve is shown. By analyzing the characteristics of the slope change curve, the turn-on and turn-off times for each operating condition are determined. When the slope drops rapidly from near 0 to the minimum point, this moment is the turn-on time for the corresponding operating condition, indicating that the device starts to conduct. When the slope increases rapidly from near 0 to the maximum point, this moment is the turn-off time for the corresponding operating condition, indicating that the device starts to turn off. Subsequently, the automated analysis system calculates the time difference between the turn-off time and the turn-on time for each operating condition, divides this time difference by the duty cycle input by the user, and then multiplies it by 100% to obtain the low-level width.

[0032] Simultaneously, the time difference between the slope recovering from its extreme value (minimum or maximum) to the baseline interval is obtained. This time difference is used to supplement the stable segment data before and after the operating condition. Based on the above calculation results, the independent time range of a single operating condition is determined. Its starting time is the turn-on time minus the slope recovery time difference, and then minus half of the low-level width. The ending time is the turn-off time plus the slope recovery time difference, plus half of the low-level width. This method ensures that the time range of each operating condition is independent and does not overlap, avoiding the use of supplementary data from the previous operating condition to occupy the data of the subsequent operating condition. Finally, the waveform data within each independent time range is filled with stable segment data, supplementing the slope stability data before the turn-on time and after the turn-off time, to obtain the following... Figure 6 The waveform data diagrams for each operating condition shown are ultimately used to obtain waveform data for multiple independent operating conditions. This ensures that complete and stable slope data are available before and after each operating condition is turned on and off, providing reliable data support for subsequent data analysis.

[0033] Finally, the waveform data for multiple operating conditions are analyzed separately, and the corresponding waveform analysis results are output. Before data analysis, the automated analysis system first performs parameter zeroing processing on the current and voltage signals in the waveform data of each operating condition to eliminate measurement zero drift or systematic errors that may exist during the test, ensuring the accuracy of the analysis results. Based on the zeroed current and voltage signals, the sliding window calculation method is used to calculate various parameters in sequence: calculate the driving positive and negative voltages, plateau stress, and peak stress, where the plateau stress is the mean value of the sample data in the plateau segment within the operating condition range, and the peak stress is the maximum voltage stress value within the operating condition range; calculate the conduction loss, conduction current, turn-off loss, and turn-off current. This process adapts different value rules according to the device type. In addition, it can also calculate the conduction time gradient, reverse recovery current peak, negative charge and negative power, as well as the time information (such as conduction delay time and turn-off delay time) and gradient information (such as current change gradient and voltage change gradient) that are of business interest.

[0034] In some embodiments, after all parameters have been calculated, the waveform analysis results for each working condition are compiled into a standardized report. The standardized report contains the specific values ​​of each calculated parameter, the waveform diagram of the working condition, and the analysis log information. Users can download the standardized report through the front-end interface to achieve precise control over the test data for each working condition.

[0035] This implementation method achieves automated and accurate analysis of dual-pulse waveform data through a standardized automated analysis method. It can complete the working condition decomposition and multi-parameter calculation without manual intervention, which greatly improves the analysis efficiency of dual-pulse waveform data. At the same time, it is compatible with various device types and topologies, meeting the customized testing needs of different pulse waveform test scenarios.

[0036] One possible implementation is, such as Figure 7 As shown, based on device type, topology, and duty cycle, the dual-pulse waveform data is split into operating conditions to obtain waveform data for multiple operating conditions, including: S701 calculates the slope corresponding to the collector-emitter voltage waveform data according to the predetermined window width and generates a slope change curve.

[0037] S702 determines the turn-on and turn-off times for each operating condition based on the characteristics of the slope change curve.

[0038] The turn-on time is the moment when the slope drops from the baseline interval to the minimum point, and the turn-off time is the moment when the slope increases from the baseline interval to the maximum point.

[0039] S703 calculates the low-level width for each operating condition based on the time difference between the turn-off and turn-on times and the duty cycle.

[0040] S704 determines the independent time range corresponding to each operating condition based on the turn-on time, turn-off time, low-level width, and slope recovery time difference for each operating condition.

[0041] The slope recovery time difference is the time difference during which the slope recovers from its maximum or minimum point to the baseline interval.

[0042] S705, based on the independent time range corresponding to each working condition, splits the dual-pulse waveform data into independent working condition data that do not overlap, thus obtaining waveform data for multiple working conditions.

[0043] In this embodiment, the operating condition splitting is based on the dynamic change characteristics of the collector-emitter voltage. Combined with test parameters, the time boundaries of each operating condition are accurately divided to avoid mutual interference between data from different operating conditions, and to provide an independent and complete data source for subsequent targeted data analysis.

[0044] First, the system performs collector-emitter voltage slope calculation and slope change curve generation. Based on the sampling frequency and testing accuracy requirements of the dual-pulse waveform data, the system presets a fixed window width (the window width can be adjusted according to the actual application scenario, usually set to 10-100 consecutive sampling points to ensure accurate capture of voltage change trends while avoiding noise interference), and calculates the sliding window slope of the extracted collector-emitter voltage waveform data.

[0045] In the specific calculation process, for the voltage sampling data in each window, the slope value corresponding to that window is obtained by linear fitting and differentiation. After traversing all voltage sampling data in sequence, the slope values ​​of each window are arranged in time order to generate a slope change curve that reflects the rate of change of collector-emitter voltage, providing a direct basis for the identification of subsequent turn-on and turn-off times.

[0046] Subsequently, the turn-on and turn-off times for each operating condition are identified based on the characteristics of the slope change curve. In the double-pulse test, the collector-emitter voltage drops rapidly when the device is turned on, corresponding to a rapid drop in the slope; conversely, the collector-emitter voltage rises rapidly when the device is turned off, corresponding to a rapid increase in the slope. The baseline range refers to the range where the slope fluctuates steadily (this can be automatically determined based on the noise level of the test data). When the slope rapidly deviates from the baseline range and drops to the minimum point in the slope change curve, it indicates that the device has entered the conduction process, and the sampling time corresponding to this minimum point is the turn-on time for the current operating condition. Conversely, when the slope rapidly deviates from the baseline range and increases to the maximum point in the curve, it indicates that the device has entered the turn-off process, and the sampling time corresponding to this maximum point is the turn-off time for the current operating condition.

[0047] Next, combining the time difference between the turn-off and turn-on moments and the duty cycle, the low-level width for each operating condition is calculated. First, the effective operating duration for a single operating condition is calculated, which is the time difference between the turn-off and turn-on moments. This time difference reflects the actual operating time of the device from turn-on to turn-off in a single operating condition. Since the duty cycle characterizes the proportion of the high-level drive voltage within a complete cycle in a double-pulse test, the low-level width has a fixed proportional relationship with the effective operating duration. By dividing the aforementioned time difference by the user-input duty cycle and then multiplying by 100%, the low-level width corresponding to each operating condition is obtained. It should be understood that this low-level width is essentially the interval time between two adjacent operating conditions.

[0048] Subsequently, based on the turn-on time, turn-off time, low-level width, and slope recovery time difference, an independent time range for each operating condition is determined. The slope recovery time difference (t2-t1) refers to the time difference required for the slope to recover from an extreme point (minimum or maximum) to the baseline interval (i.e., near "0"). This parameter is calculated by analyzing the number of sampling points from the extreme point to the baseline interval in the slope change curve and the sampling frequency, reflecting the time it takes for the voltage change to stabilize after the device is turned on or off.

[0049] To ensure that the data for each operating condition includes both the complete on-off and off-off segments and the preceding and following stable segments (to eliminate the impact of edge effects on the analysis results), the independent time range is calculated according to the following logic: Subtract the slope recovery time difference from the on-time, then subtract half the low-level width to obtain the start time of the independent time range; add the slope recovery time difference to the off-time, then add half the low-level width to obtain the end time of the independent time range. Distributing half the low-level width to the beginning and end of the operating condition ensures that the independent time ranges of adjacent operating conditions do not overlap, completely preventing the stable segment data of the previous operating condition from occupying the effective data of the subsequent operating condition, or vice versa.

[0050] Finally, the dual-pulse waveform data is split according to the determined independent time ranges to obtain waveform data for multiple operating conditions. For example, the automated analysis platform can extract all sampled data within the corresponding time interval from the original dual-pulse waveform data according to the start and end times of each operating condition, including complete signals of gate-emitter voltage, gate current, and collector-emitter voltage. Since the independent time ranges of each operating condition have been ensured to be non-overlapping and complete through the above steps, the extracted data are independent single-condition waveform data. Each data group contains the complete process of device operation under that operating condition (stabilization segment before conduction, conduction-turn-off operating segment, and stabilization segment after turn-off), which can be directly used for subsequent targeted data analysis.

[0051] One possible implementation is still as follows Figure 7As shown, S703 calculates the low-level width for each operating condition based on the time difference between the turn-off and turn-on times and the duty cycle, including: S7031, divide the absolute value of the time difference between the turn-off time and the turn-on time for each operating condition by the duty cycle to obtain the calculation result.

[0052] S7032 multiplies the calculated result by the first percentage to obtain the low-level width.

[0053] In some embodiments, during the low-level width calculation stage of the working condition segmentation, the intermittent time between adjacent working conditions can be accurately derived based on the correlation between the effective working duration of the working condition and the duty cycle, combined with preset proportional parameters, providing key data support for the subsequent definition of independent time ranges.

[0054] First, the absolute value of the time difference between the turn-off and turn-on times for each operating condition is calculated. Based on the turn-on and turn-off times identified in the previous section, the timestamps corresponding to these two times are extracted (the timestamps are based on the oscilloscope sampling time base, accurate to the sampling period level), and the time difference between the two is obtained through numerical calculation. Since the turn-on time is necessarily earlier than the turn-off time, theoretically the time difference should be positive. However, to avoid negative values ​​in extreme test scenarios (such as abnormal data sampling or time identification deviations) that could affect the validity of subsequent calculations, this implementation deliberately uses the absolute value of the time difference to ensure that the basic parameters involved in the calculation are always valid positive numbers, thus guaranteeing the stability of the calculation logic. The physical meaning of this absolute value of the time difference is the effective operating duration of the device from the start of conduction to complete turn-off in a single operating condition.

[0055] Next, the absolute value of the time difference is divided by the duty cycle input by the user to obtain the preliminary calculation result. Here, the duty cycle is the preset drive voltage duty cycle (i.e., the percentage of time the drive voltage is high within a complete test cycle) before the double-pulse test, and its value ranges from 0 to 1 (or 0% to 100%, the system automatically supports both input formats and performs unit conversion). Since the effective working duration is positively correlated with the duty cycle, the larger the duty cycle, the higher the percentage of the effective working duration in the test cycle. The ratio of the two essentially corresponds to the total duration reference value of a single test cycle, thus ensuring that the calculation of the low-level width matches the actual test conditions.

[0056] Finally, the preliminary calculation result is multiplied by the first percentage to obtain the low-level width for each operating condition. The first percentage is a pre-set fixed ratio parameter, determined based on industry standards for double-pulse testing, device operating characteristics, and the independence requirements of operating condition splitting (for example, it can be set to 100%, in which case the low-level width directly corresponds to the interval time in the test cycle excluding the effective working time; it can also be adjusted to other reasonable ratios according to actual needs, and the automated analysis system allows users to customize the percentage value in the front-end interface or select the system's preset standard parameter). Through this multiplication operation, the reference value of the total test cycle duration is converted into a specific low-level width, which is the non-overlapping interval time between two adjacent operating conditions. Accurate calculation ensures that the subsequently determined independent time ranges of each operating condition do not interfere with each other, meeting the operating condition splitting requirements for different device types and different test scenarios.

[0057] In one possible implementation, S704 determines the independent time range for each operating condition based on the turn-on time, turn-off time, low-level width, and slope recovery time difference for each operating condition, including: S7041 subtracts the slope recovery time difference from the conduction time of each operating condition, and then subtracts half of the low-level width to obtain the start time of the independent time range of each operating condition.

[0058] S7042 adds the slope recovery time difference to the turn-off time of each operating condition, and then adds half of the low-level width to obtain the termination time of the independent time range of each operating condition.

[0059] S7043, determine the independent time range of each working condition based on the start and end times of the independent time range of each working condition.

[0060] In some embodiments, determining the independent time range is a key step in achieving non-overlapping splitting of multi-condition data. By integrating parameters such as the core time of the condition, the duration of the stable period, and the interval time, a complete and independent time boundary is defined for each condition, ensuring that the data relied upon for subsequent analysis not only includes the complete working process but also avoids mutual interference between different conditions.

[0061] First, the source and physical meaning of each parameter involved in the calculation are clarified, laying the foundation for the time range derivation. Among them, the turn-on and turn-off times are the core time nodes of the operating conditions identified earlier through the slope change curve characteristics, corresponding to the precise sampling times of the device's turn-on and turn-off processes, respectively; the low-level width is the interval time between adjacent operating conditions calculated earlier by combining the effective operating duration and duty cycle, a key separating parameter to avoid overlapping operating conditions; the slope recovery time difference is the length of time it takes for the slope to recover from the extreme point (the minimum point corresponding to turn-on or the maximum point corresponding to turn-off) to the baseline interval (i.e., the stable interval near "0"). This parameter is calculated by the system by analyzing the number of sampling points from the extreme point to the baseline interval in the slope change curve and converting it to the oscilloscope sampling frequency, reflecting the time it takes for the voltage signal to stabilize before and after the device is turned on, and its value directly affects the integrity of the stable segment data before and after the operating condition. The time base of all the above parameters is consistent with the sampling timestamp of the double-pulse waveform data, ensuring the consistency of the time dimension in the calculation process.

[0062] Next, the start time of the independent time range for each operating condition is calculated. To ensure that sufficient slope stabilization data is included before the start time (to eliminate the impact of pre-conduction signal fluctuations on the analysis results), and to avoid occupying the effective data range of the previous operating condition, for example, the on-time of the operating condition can be used as a reference point. First, the slope recovery time difference is subtracted. This operation can extend the time boundary forward to the pre-conduction signal stabilization stage. Then, half of the low-level width is subtracted. Since the low-level width is the complete interval time between adjacent operating conditions, half of it is allocated to the start side of the current operating condition. This can both utilize the interval time to supplement the stable segment data and ensure a safe interval with the time range of the previous operating condition, avoiding overlap.

[0063] Through the above two-step subtraction operation, the final time point obtained is the starting time of the independent time range of the current working condition. The signal before the sampling point corresponding to this time has been in a stable state, which can provide reliable reference data for the conduction process analysis.

[0064] Subsequently, the termination time of each independent time range for each operating condition is calculated. Echoing the calculation logic of the start time, the determination of the termination time must ensure that complete slope-stabilized data is included after shutdown, while not occupying the effective data range of the subsequent operating condition: using the shutdown time of the operating condition as a reference point, the slope recovery time difference is first added, extending the time boundary to the stage where the signal stabilizes after shutdown; then, half of the low-level width is added, and the other half of the interval time between adjacent operating conditions is used to further separate the current operating condition from the next operating condition, ensuring that their time ranges do not overlap.

[0065] The time point obtained by the above two-step addition operation is the end time of the independent time range of the current operating condition. The signal after the sampling point corresponding to this time has become stable, which can avoid the interference of signal fluctuations after shutdown on subsequent operating condition analysis.

[0066] Finally, based on the calculated start and end times, the independent time range for each operating condition is determined. The independent time range for each operating condition is a continuous time interval from the start to the end, with clear boundary characteristics: from the start to the turn-on time is the pre-conduction stable segment, containing the complete signal of the slope recovering to a stable state; from the turn-on time to the turn-off time is the core operating segment of the condition, covering the entire process of device turn-on, stable operation, and turn-off; from the turn-off time to the end time is the post-turn-off stable segment, also containing the complete signal of the slope recovering to a stable state. Since the time range of each operating condition is isolated from adjacent operating conditions through a low-level width binary allocation, and the integrity of the stable segment data is ensured through the slope recovery time difference, the independent time ranges of all operating conditions do not overlap and are complete, making them direct independent data sources for subsequent targeted data analysis.

[0067] One possible implementation involves performing data analysis on waveform data for multiple operating conditions and outputting waveform analysis results for each operating condition, including zeroing the parameters of the current and voltage signals in the waveform data for each operating condition.

[0068] In some embodiments, based on the zeroed current and voltage signals, the following calculations are performed sequentially using a sliding window method: Calculate the driving positive and negative pressure, plateau stress, and peak stress, where the plateau stress is the mean of the sample data of the plateau segment within the working condition range.

[0069] Calculate the conduction loss, conduction current, turn-off loss, and turn-off current. The values ​​of conduction current and turn-off current are determined according to the device type.

[0070] Calculate the conduction time gradient, peak reverse recovery current, negative charge, and negative power.

[0071] The calculation process focuses on time and gradient information, including turn-on delay time and turn-off delay time, and current and voltage change gradients.

[0072] In some embodiments, the current and voltage signals in the waveform data for each operating condition are first zeroed. During the double-pulse test, the oscilloscope sampling system may experience baseline drift and environmental noise interference, resulting in a fixed offset in the original signal. Directly using this offset for calculation would affect the accuracy of the results. Zeroing eliminates this error. Specifically, current and voltage signal samples are extracted from the stable segment before conduction within an independent time range for each operating condition (this stable segment has been ensured to be free of signal fluctuations through the operating condition splitting described earlier). The mean value of the signal within this sample interval is calculated as the offset. Subsequently, the corresponding offset is subtracted from the current and voltage signals within the entire operating condition interval to obtain the zero-drift corrected pure signal. This ensures that all subsequent parameter calculations are based on a signal without systematic errors, improving the reliability of the analysis results.

[0073] Based on the zeroed current and voltage signals, a sliding window calculation method is used to sequentially calculate various parameters. The sliding window method involves using a pre-set fixed-length sliding window (the window length is set according to the signal sampling frequency and parameter accuracy requirements, for example, 5-50 consecutive sampling points, which can be customized through system parameters). The window traverses the entire operating signal range along the time axis, performing statistical calculations (such as mean, peak value, integral, etc.) on the signal samples within each window, ultimately obtaining continuous parameter calculation results. This method can both smooth signal noise and accurately capture the dynamic changes in parameters.

[0074] First, the driving positive and negative voltages, plateau stress, and peak stress are calculated. The driving positive and negative voltages are determined by extracting stable segment data from the gate-emitter voltage signal after zeroing. The driving positive voltage is the stable value of the gate-emitter voltage during conduction, and the driving negative voltage is the stable value of the gate-emitter voltage during turn-off; both are obtained by calculating the mean of the signal within a sliding window. The plateau stress is calculated for the collector-emitter voltage signal. First, a plateau segment where the voltage signal remains stable within the operating range is identified (the fluctuation amplitude of the signal within the sliding window is considered a plateau segment). Then, the mean of all sample data within this plateau segment is calculated as the plateau stress. The peak stress is the maximum value of the collector-emitter voltage signal within the operating range. It is obtained by traversing all signal windows using a sliding window calculation, capturing the maximum value within each window, and comparing and filtering to reflect the instantaneous maximum voltage load borne by the device during operation.

[0075] Secondly, conduction loss, conduction current, turn-off loss, and turn-off current are calculated. The values ​​of conduction current and turn-off current are determined based on the device type. The calculation of these parameters requires consideration of the time intervals for conduction and turn-off processes defined earlier: For conduction current and turn-off current, based on the device type identified in the operating condition breakdown (metal-oxide-semiconductor field-effect transistor, insulated-gate bipolar transistor, or diode), the corresponding value rules are automatically matched (specific rules are detailed in subsequent implementations), and characteristic current values ​​within the corresponding time intervals are extracted through sliding window calculation. Conduction loss is obtained by performing sliding window integration on the voltage and current signals within the conduction time interval (the integration formula is the product of voltage and current over time), reflecting the energy loss during the device's conduction phase. Similarly, turn-off loss is obtained by performing sliding window integration on the voltage and current signals within the turn-off time interval, characterizing the energy loss during the device's turn-off phase.

[0076] Next, the conduction time gradient, peak reverse recovery current, negative charge, and negative power are calculated. The conduction time gradient reflects the rate of current rise during conduction, and is obtained by calculating the mean rate of change of the current signal within the conduction time interval using a sliding window. The peak reverse recovery current, for devices such as diodes, is determined by calculating the maximum value of the reverse current during turn-off using a sliding window. The negative charge is the integral of the negative current over time during turn-off, obtained by performing a sliding window integration on the negative current signal within the turn-off interval. The negative power is the product of the negative voltage and the negative current, obtained by calculating the mean or peak value of their product using a sliding window. These parameters are mainly used to evaluate the reverse characteristics and energy loss during device turn-off.

[0077] Finally, the time and gradient information relevant to the business are calculated. The time information includes turn-on delay time and turn-off delay time, while the gradient information includes current change gradient and voltage change gradient. The turn-on delay time is the time difference between the drive voltage rising to a preset threshold (e.g., 10% of the drive positive voltage) and the current rising to a preset threshold (e.g., 10% of the turn-on current). The turn-off delay time is the time difference between the drive voltage falling to a preset threshold (e.g., 90% of the drive positive voltage) and the current falling to a preset threshold (typically 10% of the turn-off current). Both are obtained by capturing signal threshold points using a sliding window and calculating the time difference. The current change gradient is the maximum rate of change of the current signal within a specified interval, and the voltage change gradient is the maximum rate of change of the voltage signal within a specified interval. These are obtained by calculating the signal difference between adjacent sampling points using a sliding window, converting it to a rate of change, and then selecting the maximum value. This set of parameters can meet the customized evaluation needs for device response speed and dynamic characteristics during the R&D process.

[0078] After all parameters are calculated, the calculation results for each operating condition are organized in a standardized format to form an independent analysis report containing parameter values, calculation basis, and signal waveform screenshots. Each operating condition corresponds to one report, and finally, the waveform analysis results corresponding to multiple operating conditions are output, which makes it convenient for R&D personnel to view the device performance data for a single operating condition.

[0079] In one possible implementation, for a metal-oxide-semiconductor field-effect transistor or an insulated-gate bipolar transistor, the calculation of conduction loss and conduction current, and turn-off loss and turn-off current includes: When the initial operating condition has a conduction current of 0, the conduction current in subsequent operating conditions is the current corresponding to the starting point with the same current slope. The turn-off current is the peak current before turn-off; The time intervals for the conduction process and the turn-off process are determined. The start time of the conduction process is when the driving voltage rises to the second percentage of the driving positive voltage, and the end time of the conduction process is when the voltage stress drops to the third percentage of the plateau voltage. The start time of the turn-off process is when the driving voltage drops to the fourth percentage of the driving positive voltage, and the end time of the turn-off process is when the current drops to the third percentage of the turn-off current. The first percentage is greater than the fourth percentage, the fourth percentage is greater than the second percentage, and the second percentage is greater than the third percentage. The conduction loss is calculated based on the time interval of the conduction process and the conduction current, and the turn-off loss is calculated based on the time interval of the turn-off process and the turn-off current.

[0080] For metal-oxide-semiconductor field-effect transistors or insulated-gate bipolar transistors, this implementation method uses the adapter-specific current value rules and process range definition standards, combined with sliding window calculation and integral operation, to accurately derive conduction loss, conduction current, turn-off loss and turn-off current, providing targeted quantitative basis for the performance evaluation of such devices.

[0081] First, the rules for determining the conduction current value are clearly defined, and the differences between the initial and subsequent operating conditions are differentiated for adaptation. For the initial operating condition (i.e., the condition corresponding to the first complete working cycle in the double-pulse test), since the device is in an unconducted initial state during the initial stage of the test, there is no preceding conduction current reference. Therefore, the conduction current is directly set to 0, which conforms to the current characteristics of the device during the startup phase. For subsequent operating conditions (all operating conditions after the initial condition), the value of the conduction current needs to be determined based on the current continuity characteristics between operating conditions: the system uses a sliding window calculation method to traverse the current signal of the conduction process of the previous operating condition, extracts the slope characteristics of the current change during this process (i.e., the slope value of the current rise or stabilization phase), and then searches for the signal starting position in the current signal of the current condition that matches the slope characteristics. The current value corresponding to this starting position is the conduction current of the current operating condition. Thus, it is ensured that the conduction current value of the subsequent operating conditions is consistent with the current change law of the previous operating condition, which conforms to the current transfer characteristics of the device during continuous operation.

[0082] Secondly, the standard for determining the value of the turn-off current is established. The turn-off current is defined as the peak current before turn-off, and its physical essence is the instantaneous peak value of the current signal when the device is about to enter the turn-off process. The specific extraction process is as follows: based on the turn-off time defined above, within a preset time window before the turn-off time (the window length is set according to the device's turn-off response speed, 10-50 sampling points), the current signal is traversed by sliding window calculation to capture the maximum current value within the window. This maximum value is the turn-off current, reflecting the peak current load before the device is turned off, and is a key parameter for calculating turn-off losses.

[0083] Next, the time intervals of the conduction and turn-off processes are precisely defined to establish a clear range for loss calculation. This range is defined based on characteristic thresholds of the driving voltage, voltage stress (collector-emitter voltage), and current signal, and the second, third, and fourth percentages corresponding to each threshold follow the relationship of "fourth percentage > second percentage > third percentage" (for example, typical values ​​are: second percentage is 10%, third percentage is 2%, and fourth percentage is 90%, and each percentage can be customized according to the device model and test accuracy requirements). The specific definition logic is as follows: The start time of the conduction process is determined by the driving voltage. When the driving voltage rises from the baseline state to the second percentage of the positive driving voltage, it indicates that the driving signal has been activated, and the device begins to enter the conduction process; this moment is the start time of the conduction process. The end time of the conduction process is determined by the voltage stress. When the voltage stress rapidly drops from the high level before conduction to the third percentage of the plateau voltage, it indicates that the device has fully conducted and entered a stable operating state; this moment is the end time of the conduction process. The start time of the turn-off process is also determined by the driving voltage. When the driving voltage drops from the positive driving voltage to the fourth percentage, it indicates that the driving signal has been withdrawn, and the device begins to enter the turn-off process; this moment is the start time of the turn-off process. The end time of the turn-off process is determined by the current signal. When the current drops to the third percentage of the turn-off current, it indicates that the device has basically completed turn-off, and the current tends to stabilize; this moment is the end time of the turn-off process. The above interval definitions strictly follow the device's operating state switching rules to ensure that the loss calculation only covers the core energy loss stages of conduction and turn-off.

[0084] Finally, based on the defined time interval and determined current parameters, conduction loss and turn-off loss are calculated. Both losses are calculated using the zero-adjusted voltage signal (voltage stress) and current signal, employing sliding window integration: for conduction loss, within the conduction time interval, the product of the voltage and current signals is solved window by window using sliding window calculation, and then the product results of all windows are integrated over time; the integrated result is the conduction loss, reflecting the total energy consumed by the device during conduction. For turn-off loss, the calculation logic is consistent with conduction loss; within the turn-off time interval, the product of the voltage and current signals is integrated using sliding window calculation to obtain the turn-off loss, characterizing the energy loss of the device during turn-off. Sliding window integration can smooth out the influence of signal noise on the integration result and accurately capture the dynamic changes of voltage and current, ensuring the accuracy of the loss calculation results.

[0085] Through the above calculation process, based on the operating characteristics of metal-oxide-semiconductor field-effect transistors and insulated-gate bipolar transistors, and through a logic chain of operating condition differentiation, feature parameter extraction, precise interval definition, and integral operation, targeted calculation of on and off related parameters is achieved, providing a standardized and precise implementation scheme for the analysis of dual-pulse waveform data of such devices.

[0086] In one possible implementation, for a diode, the calculation includes: conduction loss and conduction current, turn-off loss and turn-off current, including: When the initial shutdown current is 0, the shutdown current in subsequent operating conditions is the same as the conduction current in the previous operating condition. The conduction current is the plateau current after conduction; The time intervals for the diode's turn-off process and conduction process are determined. The start time of the turn-off process is when the driving voltage rises to the second percentage of the driving positive voltage. The end time of the turn-off process under the initial operating condition is when the voltage stress rises to the fourth percentage of the plateau voltage. The end time of the turn-off process under the subsequent operating condition is when the current reverses and recovers to the second percentage of the minimum current. The start time of the conduction process is when the driving voltage drops to the fourth percentage of the driving positive voltage. The end time of the conduction process is when the current rises to the fourth percentage of the final plateau current. The first percentage is greater than the fourth percentage, and the fourth percentage is greater than the second percentage. The turn-off loss is calculated based on the time interval of the turn-off process and the turn-off current, and the conduction loss is calculated based on the time interval of the conduction process and the conduction current.

[0087] In some embodiments, taking advantage of the unique operating characteristics of diodes—unidirectional conductivity and reverse recovery—this implementation method uses customized current value rules and process interval definition standards, combined with sliding window integration operations, to accurately calculate conduction loss, conduction current, turn-off loss, and turn-off current, providing a targeted technical solution for the quantitative evaluation of diode double-pulse waveform data.

[0088] First, the rules for determining the values ​​of the on-state and off-state currents are clarified to suit the diode's operating characteristics and the requirements for continuity of operating conditions. For the off-state current, in the initial operating condition (the condition corresponding to the first complete working cycle of the double-pulse test), the diode is in an initial non-operating state, with no preceding on-state current as a reverse recovery reference. Therefore, the off-state current in the initial operating condition is set to 0, which conforms to the electrical characteristics of the device during the startup phase. In subsequent operating conditions (all operating conditions after the initial condition), the value of the off-state current is determined based on the current transfer pattern between operating conditions.

[0089] Since the reverse recovery current of a diode is directly related to the conduction current of the previous operating condition, the conduction current value of the previous operating condition is automatically extracted and used as the turn-off current for the current operating condition, ensuring that the parameter calculations during the turn-off process are consistent with the actual state of continuous device operation. The conduction current is defined as the plateau current after conduction. For example, a sliding window calculation method can be used to traverse the current signal during conduction, identify the plateau segment where the current rises and remains stable (the interval where the current fluctuation amplitude within the window is below a preset threshold is the plateau segment), and calculate the average current signal within this plateau segment as the conduction current. This value reflects the stable current load after the diode is turned on.

[0090] Secondly, accurately defining the time intervals between the turn-off and turn-on processes provides a clear core stage for loss calculation. The definition of each time interval is based on the characteristic thresholds of the driving voltage, voltage stress (collector-emitter voltage), and current signal, and follows the relationship of "first percentage > fourth percentage > second percentage". For example, the second percentage is 10%, the fourth percentage is 90%, and the first percentage is 100%. Each percentage can be customized according to the diode model and test accuracy requirements.

[0091] Optionally, the start time of the turn-off process is determined by the driving voltage. When the driving voltage rises from the baseline state to the second percentage of the driving positive voltage, it indicates that the driving signal has initiated the turn-off command, and the diode begins to enter the turn-off process. This moment is the start time of the turn-off process. The end time of the turn-off process needs to be distinguished between the initial and subsequent operating conditions: In the initial operating condition, since there is no reverse recovery current reference, the voltage stress is used as the judgment standard. When the voltage stress rises rapidly from the low level after conduction to the fourth percentage of the platform voltage, it indicates that the diode has been completely turned off and the voltage tends to stabilize. This moment is the end time of the turn-off process in the initial operating condition. In the subsequent operating condition, based on the reverse recovery characteristics of the diode, the reverse recovery current is used as the judgment standard. The system first identifies the minimum current value of the reverse recovery during the turn-off process (capturing the minimum current point through sliding window calculation). When the current recovers from this minimum current value to its second percentage, it indicates that the reverse recovery process has ended and the diode has been completely turned off. This moment is the end time of the turn-off process in the subsequent operating condition.

[0092] The start time of the conduction process is determined by the driving voltage. When the driving voltage drops from the off state to four percent of the driving positive voltage, it indicates that the driving signal has initiated the conduction command, and the diode begins to enter the conduction process. This moment is the start time of the conduction process. The end time of the conduction process is determined by the current signal. When the current rises from the baseline state to four percent of the final plateau current, it indicates that the diode has fully turned on and entered a stable operating state. This moment is the end time of the conduction process. The above interval definition strictly follows the diode's "conduction-turn-off-reverse recovery" operating sequence to ensure that the loss calculation only covers the energy loss stage and avoids signal interference during non-operating periods.

[0093] Finally, based on the defined time interval and determined current parameters, turn-off loss and turn-on loss are calculated. Both losses are calculated using a clean signal after zeroing, employing sliding window integration: For turn-off loss, within the turn-off time interval, the product of voltage stress (collector-emitter voltage) and current signal is solved window by window using sliding window calculation. The product results from all windows are then integrated over time; the integrated result is the turn-off loss. This turn-off loss includes not only the energy loss during diode turn-off but also the energy loss during reverse recovery, closely reflecting the diode's loss characteristics. For turn-on loss, the calculation logic is consistent with turn-off loss. Within the turn-on time interval, the product of voltage stress and current signal is integrated using sliding window calculation to obtain the turn-on loss, characterizing the energy loss during diode conduction. The sliding window integration method effectively smooths signal noise, accurately captures the dynamic relationship between voltage and current, and ensures the accuracy and reliability of the loss calculation results.

[0094] Furthermore, the above calculation process closely aligns with the core characteristics of diodes, such as unidirectional conductivity and reverse recovery. Through customized parameter values, precise process range definition, and scientific integral calculations, it achieves targeted quantification of diode conduction and turn-off related parameters, providing a standardized and precise data analysis solution for diode performance evaluation.

[0095] In one possible implementation, when the topology is multiple transistors in parallel, the waveform data of the gate-emitter voltage, gate current, and collector-emitter voltage corresponding to a single transistor are analyzed independently as a group; based on the single-transistor waveform analysis results corresponding to the independent analysis of multiple groups, the waveform analysis results of the multiple transistors in parallel are obtained.

[0096] When the topology is a multi-pipe parallel connection, this implementation adopts the mode of "independent analysis of a single pipe + summary of results of multiple pipes", which can not only accurately capture the individual performance characteristics of each pipe, but also comprehensively evaluate the consistency and overall working status of the multi-pipe parallel connection, adapting to the differentiated and holistic analysis needs in the multi-pipe parallel connection scenario.

[0097] First, the waveform data of a single transistor is grouped. In multi-transistor parallel testing, the oscilloscope configures independent gate-emitter voltage channels, gate current channels, and collector-emitter voltage channels for each transistor to synchronously acquire the operating signals of each transistor. Data grouping is achieved in two ways: one is based on a user-preset "transistor number-channel number" mapping relationship. When the user inputs the oscilloscope channel information, they simultaneously specify the three-channel number corresponding to each transistor (e.g., transistor 1 corresponds to channels 1-3, transistor 2 corresponds to channels 4-6, etc.). Based on this mapping relationship, the complete three-channel data of each single transistor is extracted from the original dual-pulse waveform data. The other is an automatic grouping mode. Based on the sampling synchronization and signal independence of the oscilloscope channels, multiple independent three-channel signal combinations are identified. Each combination corresponds to the waveform data of one transistor. After grouping, the data is fed back to the user interface for confirmation and correction to ensure the accuracy of the grouping.

[0098] Subsequently, an independent standardized analysis process was performed on each group of single-tube waveform data. The analysis process for each group of data fully reused the complete technical solution under the single-tube topology, specifically including: receiving the duty cycle (the duty cycle of each tube is consistent in the multi-tube parallel test, and the unified duty cycle input by the user is used) and channel information corresponding to the group of data; identifying the device type corresponding to the group of data (the device type of each tube is the same in the multi-tube parallel scenario, and it is applied to all groups after identification once); according to the device type, multi-tube parallel topology and duty cycle, the waveform data of the group of data is split into multiple independent operating conditions to obtain waveform data of multiple independent operating conditions; the waveform data of each operating condition is zeroed, and based on the zeroed signal, a sliding window calculation method is used to calculate various parameters such as driving positive and negative voltage, plateau stress, peak stress, conduction loss, and turn-off loss in sequence, and finally outputting the single-tube waveform analysis result corresponding to the tube. The result includes detailed parameter values, waveform screenshots and performance evaluation conclusions for each operating condition of the tube.

[0099] It is important to emphasize that all independent analyses of individual tubes followed a completely consistent standardized process, including the same window width, percentage threshold, calculation algorithm, and parameter definitions. This ensured the comparability of analysis results across different tubes, laying the foundation for subsequent multi-tube consistency evaluation. For example, the same slope was used to calculate the window width for all tube operating condition breakdowns, and the same integration algorithm was used for conduction loss calculations, avoiding result deviations caused by differences in analysis procedures.

[0100] Finally, the waveform analysis results of multiple tubes in parallel are obtained by summarizing the analysis results of multiple single tubes. The summarization process includes two core aspects: First, it retains the independent analysis reports of all single tubes, presenting the individual performance data of each tube in its entirety, so that users can view the working status of a single tube in a targeted manner (such as abnormal loss of a certain tube, excessively high stress peak, etc.); Second, it generates a special summary report for multiple tubes in parallel, which focuses on calculating and presenting the consistency evaluation indicators of multiple tubes, including the maximum, minimum, average and deviation rates of conduction losses of each tube, the consistency fluctuation range of turn-off current, the distribution difference of plateau stress, the dispersion of reverse recovery current peak, etc. These indicators directly reflect the current sharing effect and performance consistency when multiple tubes are connected in parallel. At the same time, the system will also integrate and present the key parameters of each tube (such as conduction loss, turn-off current, peak stress) in the form of comparison tables or trend charts, intuitively showing the performance differences between multiple tubes.

[0101] Through the above embodiments, we can not only accurately quantify the individual performance of each tube, but also comprehensively evaluate the overall working characteristics of multiple tubes in parallel, effectively solving the technical problems of difficult fault location of single tubes and difficulty in evaluating overall consistency in multi-tube parallel scenarios, and providing complete data analysis support for the design optimization, fault diagnosis and performance verification of multi-tube parallel systems.

[0102] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0103] Corresponding to the automated analysis method for double-pulse waveform data in the above embodiment, Figure 9 This is a schematic diagram of the structure of an automated dual-pulse waveform data analysis device provided in an embodiment of this application. This device can be implemented as part or all of a computer device by software, hardware, or a combination of both. The computer device can be... Figure 10 The electronic device shown.

[0104] Reference Figure 9 The automated analysis device for dual-pulse waveform data includes: The acquisition unit 901 is used to receive input duty cycle, oscilloscope channel information, and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current, and collector-emitter voltage, respectively.

[0105] The identification unit 902 is used to identify the device type and topology corresponding to the double pulse waveform data.

[0106] The device types include at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes, and the topology includes single transistors or multiple transistors connected in parallel.

[0107] The splitting unit 903 is used to split the dual-pulse waveform data into multiple operating conditions based on the device type, topology and duty cycle.

[0108] Analysis unit 904 is used to perform data analysis on waveform data of multiple working conditions and output waveform analysis results corresponding to each of the waveform data of multiple working conditions.

[0109] It is understood that the embodiments of the automated dual-pulse waveform data analysis device and any implementation thereof correspond to the embodiments of the automated dual-pulse waveform data analysis method and any implementation thereof. The technical effects corresponding to the embodiments of the automated dual-pulse waveform data analysis device and any implementation thereof can be found in the technical effects corresponding to the aforementioned embodiments of the automated dual-pulse waveform data analysis method and any implementation thereof, and will not be repeated here.

[0110] It should be noted that the dual-pulse waveform data automated analysis device provided in the above embodiments is only an example of the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0111] The functional units and modules in the above embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of the embodiments of this application.

[0112] It should be noted that the information interaction and execution process between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.

[0113] This application also provides an electronic device, which includes one or more processors and a memory; The memory is coupled to one or more processors. The memory is used to store computer program code, which includes computer instructions. One or more processors call the computer instructions to cause the electronic device to execute the aforementioned automated analysis method for dual-pulse waveform data.

[0114] Figure 10This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device 1000 can be a mobile phone, smart screen, tablet computer, wearable electronic device, in-vehicle electronic device, augmented reality (AR) device, virtual reality (VR) device, laptop computer, ultra-mobile personal computer (UMPC), netbook, personal digital assistant (PDA), projector, or a communication device such as a server, storage device, or base station, or a smart car, etc. This application embodiment does not impose any limitations on the specific type of electronic device.

[0115] The memory 1001 can be used to store computer software programs 1002 and modules. The processor 1003 executes various functional applications and data processing of the electronic device by running the software programs and modules stored in the memory 1001. The memory 1001 may mainly include a program storage area and a data storage area. The program storage area may store the operating system, application programs required for at least one function (such as sound playback function, image playback function, etc.), etc.; the data storage area may store data created according to the use of the electronic device (such as audio data, telephone book, etc.). In addition, the memory 1001 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0116] The processor 1003 may include one or more processors such as a central processing unit (CPU), an application processor (AP), and a baseband processor. The processor can serve as the nerve center and command center of the wireless router. The processor 1003 can generate operation control signals based on instruction opcodes and timing signals to control instruction fetching and execution. The memory 1001 can be used to store executable program code, including instructions. The processor 1003 executes various functional applications and data processing of the network device by running the instructions stored in the memory. The memory 1001 may include a program storage area and a data storage area, such as storing data for audio signals to be played. For example, the memory may be Double Data Rate Synchronous Dynamic Random Access Memory (DDR) or Flash memory.

[0117] This application also provides a computer-readable storage medium storing computer instructions; when the computer-readable storage medium is used on an electronic device, it causes the electronic device to execute the aforementioned automated analysis method for dual-pulse waveform data.

[0118] The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or can include one or more data storage devices such as servers or data centers that can be integrated with media. The available medium can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media, or semiconductor media (e.g., solid-state disks (SSDs)).

[0119] This application also provides a computer program product containing computer instructions, which, when run on an electronic device, enables the electronic device to execute the aforementioned automated analysis method for dual-pulse waveform data.

[0120] The computer storage medium and computer program product provided in the embodiments of this application are used to execute the methods provided above. Therefore, the beneficial effects they can achieve can be referred to the beneficial effects corresponding to the methods provided above, and will not be repeated here.

[0121] In the above embodiments, implementation can also be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions. When the computer instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another via wired (e.g., coaxial cable, fiber optic, Digital Subscriber Line, DSL) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible to a computer, or a data storage device such as a server or data center that integrates one or more available media. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk drive (HDD), or solid-state drive (SSD), etc., and the storage medium can also include combinations of the above types of memory.

[0122] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0123] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments claimed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0124] In the embodiments provided in this application, it should be understood that the disclosed apparatus / network devices and methods can be implemented in other ways. For example, the apparatus / network device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0125] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0126] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. An automated analysis method for dual-pulse waveform data, characterized in that, include: The system receives input duty cycle, oscilloscope channel information, and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current, and collector-emitter voltage, respectively. Identify the device type and topology corresponding to the dual-pulse waveform data. The device type includes at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes. The topology includes a single transistor or multiple transistors connected in parallel. Based on the device type, the topology, and the duty cycle, the dual-pulse waveform data is split into operating conditions to obtain waveform data for multiple operating conditions. Data analysis is performed on the waveform data of the multiple operating conditions respectively, and the waveform analysis results corresponding to the waveform data of each of the multiple operating conditions are output.

2. The method according to claim 1, characterized in that, The process involves splitting the dual-pulse waveform data into operating conditions based on the device type, topology, and duty cycle to obtain waveform data for multiple operating conditions, including: The slope corresponding to the waveform data of the collector-emitter voltage is calculated according to a predetermined window width, and a slope change curve is generated; Based on the characteristics of the slope change curve, the turn-on time and turn-off time for each operating condition are determined, wherein the turn-on time is the moment when the slope drops from the baseline interval to the minimum point, and the turn-off time is the moment when the slope increases from the baseline interval to the maximum point. The low-level width of each operating condition is calculated based on the time difference between the turn-off time and the turn-on time and the duty cycle for each operating condition. Based on the turn-on time, turn-off time, low-level width, and slope recovery time difference for each operating condition, an independent time range corresponding to each operating condition is determined, wherein the slope recovery time difference is the time difference for the slope to recover from the maximum or minimum point to the baseline interval. Based on the independent time range corresponding to each operating condition, the double-pulse waveform data is split into independent operating condition data that do not overlap, resulting in waveform data for multiple operating conditions.

3. The method according to claim 2, characterized in that, The step of calculating the low-level width for each operating condition based on the time difference between the turn-off time and the turn-on time, and the duty cycle, includes: The absolute value of the time difference between the turn-off time and the turn-on time for each of the aforementioned operating conditions is divided by the duty cycle to obtain the calculation result; The calculated result is multiplied by the first percentage to obtain the low-level width.

4. The method according to claim 2, characterized in that, The determination of the independent time range for each operating condition based on the turn-on time, turn-off time, low-level width, and slope recovery time difference for each operating condition includes: Subtract the slope recovery time difference from the conduction time of each operating condition, and then subtract half of the low-level width to obtain the start time of the independent time range of each operating condition. Add the slope recovery time difference to the shutdown time of each operating condition, and then add half of the low-level width to obtain the termination time of the independent time range of each operating condition. The independent time range for each operating condition is determined based on the start and end times of the independent time range for each operating condition.

5. The method according to any one of claims 1 to 4, characterized in that, The step of performing data analysis on the waveform data of the multiple operating conditions and outputting the waveform analysis results corresponding to each of the multiple operating conditions includes: The current and voltage signals in the waveform data of each operating condition are subjected to parameter zeroing processing; Based on the zeroed current and voltage signals, the following calculations are performed sequentially using a sliding window calculation method: Calculate the driving positive and negative pressure, plateau stress and peak stress, where the plateau stress is the mean of the sample data of the plateau segment within the working condition range; Calculate the conduction loss, conduction current, turn-off loss, and turn-off current. The values ​​of the conduction current and the turn-off current are determined according to the device type. Calculate the conduction time gradient, peak reverse recovery current, negative charge, and negative power; The calculation includes time information and gradient information of interest to the business. The time information includes turn-on delay time and turn-off delay time, and the gradient information includes current change gradient and voltage change gradient.

6. The method according to claim 5, characterized in that, For metal-oxide-semiconductor field-effect transistors or insulated-gate bipolar transistors, the calculation of conduction loss and conduction current, and turn-off loss and turn-off current includes: When the initial operating condition has a conduction current of 0, the conduction current in subsequent operating conditions is the current corresponding to the starting point with the same current slope. The shutdown current is the peak current before shutdown; The time intervals for the conduction process and the turn-off process are determined, wherein the start time of the conduction process is when the driving voltage rises to the second percentage of the driving positive voltage, and the end time of the conduction process is when the voltage stress drops to the third percentage of the plateau voltage; the start time of the turn-off process is when the driving voltage drops to the fourth percentage of the driving positive voltage, and the end time of the turn-off process is when the current drops to the third percentage of the turn-off current; the first percentage is greater than the fourth percentage, the fourth percentage is greater than the second percentage, and the second percentage is greater than the third percentage. The conduction loss is calculated based on the time interval of the conduction process and the conduction current, and the turn-off loss is calculated based on the time interval of the turn-off process and the turn-off current.

7. The method according to claim 5, characterized in that, For diodes, the calculation of conduction loss and conduction current, turn-off loss and turn-off current includes: When the initial shutdown current is 0, the shutdown current in subsequent operating conditions is the same as the conduction current in the previous operating condition. The conduction current is the platform current after conduction; The time intervals for the diode's turn-off process and conduction process are determined, wherein the start time of the turn-off process is when the driving voltage rises to the second percentage of the driving positive voltage, the end time of the turn-off process under the initial operating condition is when the voltage stress rises to the fourth percentage of the plateau voltage, the end time of the turn-off process under the subsequent operating condition is when the current reverses and recovers to the second percentage of the minimum current, the start time of the conduction process is when the driving voltage drops to the fourth percentage of the driving positive voltage, and the end time of the conduction process is when the current rises to the fourth percentage of the final plateau current, wherein the first percentage is greater than the fourth percentage, and the fourth percentage is greater than the second percentage; The turn-off loss is calculated based on the time interval of the turn-off process and the turn-off current, and the conduction loss is calculated based on the time interval of the conduction process and the conduction current.

8. The method according to any one of claims 1 to 4, characterized in that, When the topology is a multi-transistor parallel connection, the waveform data of the gate-emitter voltage, gate current and collector-emitter voltage corresponding to a single transistor are analyzed independently as a group; Based on the single-tube waveform analysis results of multiple groups of independently analyzed outputs, the multi-tube parallel waveform analysis results are obtained.

9. An automated analysis device for dual-pulse waveform data, characterized in that, include: The acquisition unit is used to receive input duty cycle, oscilloscope channel information and dual-pulse waveform data. The oscilloscope channel information includes the channels corresponding to the gate-emitter voltage, gate current and collector-emitter voltage, respectively. The identification unit is used to identify the device type and topology corresponding to the dual-pulse waveform data. The device type includes at least one of metal-oxide-semiconductor field-effect transistors, insulated-gate bipolar transistors, and diodes. The topology includes a single transistor or multiple transistors connected in parallel. The splitting unit is used to split the dual-pulse waveform data into multiple operating conditions according to the device type, the topology and the duty cycle. The analysis unit is used to perform data analysis on the waveform data of the multiple operating conditions respectively, and output the waveform analysis results corresponding to the waveform data of the multiple operating conditions.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it causes the electronic device to implement the method as described in any one of claims 1 to 8.

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