Electronic accessory test processor

Abstract

The invention provides an electronic accessory test processor. Specifically, according to one embodiment of the present invention, there may be provided a device comprising: a first tray for placing a plurality of electronic components; comprising a plurality of pickers arranged in the x-axis direction, and a transfer hand capable of transferring the plurality of electronic components placed on the first tray to a second tray; a photographing unit that acquires image information by photographing the plurality of pickups; and an electronic component test processor that acquires a first pickup x coordinate, which is an x-axis coordinate of each of the plurality of pickers, based on the image information when the transfer hand is placed at a first tray position on the first tray.

Description

[0001] This application is a divisional application of application number CN 202210188188.1, filed on February 28, 2022, entitled "Electronic Component Test Processor". Technical Field

[0002] This invention relates to a test processor for electronic components. Background Technology

[0003] A test handler is a device that supports testing electronic components such as semiconductor devices manufactured through a defined manufacturing process, and classifies the electronic components according to the test results. Such a test handler can test electronic components such as semiconductor devices by electrically connecting them to a tester.

[0004] On the other hand, electronic components, after being tested, are provided to the test processor while loaded onto the customer's pallet. Furthermore, these electronic components are conveyed to the test processor by multiple pickups to a transfer station. The spacing between the multiple pickups and the spaces where the electronic components are arranged on the customer's pallet differs from the spacing between the electronic components on the transfer station. Therefore, when multiple pickups convey electronic components loaded on the customer's pallet, it is necessary to adjust the spacing between the electronic components according to the transfer station's arrangement.

[0005] However, the positions of multiple pickups may deviate during assembly, and tolerances may arise due to incorrect assembly. Furthermore, errors may occur due to the inability to precisely control the spacing between multiple pickups. Thus, the spacing control between multiple pickups can be flawed for various reasons. In such cases, the pickups may not accurately grasp the electronic components and may not place them correctly on the transfer platform. Consequently, electronic components may detach from the transfer platform, reducing test accuracy and potentially damaging the components.

[0006] Therefore, there is a need for an electronic component testing and processing machine that can accurately hold electronic components even if there are errors in the spacing between multiple pickups, and can place the held electronic components in the correct position on the transfer platform. Summary of the Invention

[0007] An embodiment of the present invention is based on the above background, and provides an electronic component testing processor that can accurately hold components even if there is an error in the spacing between multiple pickups, and can place the held electronic components in the correct position on the first tray.

[0008] In addition, one embodiment of the present invention provides an electronic component test processor that improves the accuracy of testing by placing electronic components in the correct position and prevents damage to electronic components due to separation.

[0009] According to one aspect of the present invention, a first tray for placing a plurality of electronic components can be provided; a transfer hand including a plurality of pickups arranged along the x-axis direction for transferring the plurality of electronic components placed on the first tray to a second tray; a capturing unit for acquiring image information by capturing images of the plurality of pickups; and a control unit that, based on the image information, acquires a first pickup x-coordinate as the x-axis coordinate of each of the plurality of pickups when the transfer hand is placed on the first tray position, wherein the control unit, when the transfer hand is placed on the first tray position, calculates a first reference x-coordinate as the preset x-axis coordinate of each of the plurality of pickups and a first x-coordinate deviation value of each of the plurality of pickups corresponding to the difference of the first reference x-coordinate as the first pickup x-coordinate; and when a first maximum x-coordinate deviation value having the maximum value among the plurality of first x-coordinate deviation values ​​is less than a preset x-critical value, After the conveyor moves the first minimum x-axis deviation value, which has the minimum value among the plurality of first x-axis deviation values, and the first average x-axis deviation value, which is the average of the first maximum x-axis deviation values, to one side of the x-axis, the conveyor controls the electronic component test processor to pick up the plurality of electronic components from the first tray.

[0010] Furthermore, an electronic component test processor can be provided in which at least a portion of the plurality of pickups are arranged along the y-axis direction; the control unit, based on the image information, when the conveyor is placed at the first tray position, acquires a first pickup y-coordinate as the y-axis coordinate of each of the plurality of pickups; when the conveyor is placed at the first tray position, calculates a first reference y-coordinate as a preset y-axis coordinate of each of the plurality of pickups and a first y-coordinate deviation value of each of the plurality of pickups corresponding to the first reference y-coordinate as the difference of the first pickup y-coordinate; when a first maximum y-deviation value having the maximum value among the plurality of first y-coordinate deviation values ​​is less than or equal to a preset y-critical value, the conveyor moves to one side in the y-axis direction by the first minimum y-deviation value having the minimum value among the plurality of first y-coordinate deviation values ​​and the first average y-deviation value as the average of the first maximum y-deviation value, and then controls the conveyor to grasp the plurality of electronic components from the second tray.

[0011] Furthermore, a control unit can be provided that, when the conveyor is placed on the second tray position on the second tray, acquires a second pickup x-coordinate as the x-axis coordinate of each of the plurality of pickups; when the conveyor is placed on the second tray position, calculates a second reference x-coordinate as a preset x-axis coordinate of each of the plurality of pickups and a second x-coordinate deviation value of each of the plurality of pickups corresponding to the second reference x-coordinate as the difference between the second pickup x-coordinate; calculates an x-correction value as the difference between the first x-coordinate deviation value and the second x-coordinate deviation value of each of the plurality of pickups, and calculates an x-correction value as the average of the maximum and minimum values ​​of the plurality of x-correction values; after the conveyor moves the first average x-deviation value to one side in the x-axis direction and moves the average x-correction value to the other side in the x-axis direction, controls the conveyor to place the plurality of electronic components on the electronic component test processor on the second tray.

[0012] Furthermore, a control unit can be provided that, when one or more of the plurality of first x-coordinate deviation values ​​exceed the x-critical value, controls the conveyor to place the plurality of pickups at a position separated from the first pickups by other average x-deviation values, and controls the conveyor to place one or more pickups exceeding the x-critical value onto one or more of the plurality of electronic components; the other average x-deviation value is the average of the maximum and minimum x-deviation values ​​of the remaining pickups other than the one or more pickups exceeding the x-critical value in the electronic component test processor.

[0013] Furthermore, a control unit can be provided that, when the conveyor is placed on the second tray position on the second tray, acquires the second pickup x-coordinate as the x-axis coordinate of each of the plurality of pickups; when the conveyor is placed on the second tray position, calculates the second reference x-coordinate of each of the plurality of pickups as a preset x-axis coordinate and the second x-coordinate deviation value of each of the plurality of pickups as the difference of the second pickup x-coordinate corresponding to the second reference x-coordinate; calculates the offset x-correction value as the difference between the first x-coordinate deviation value and the second x-coordinate deviation value of the one or more pickups; after the conveyor moves the other average x-deviation value to one side of the x-axis direction and moves the offset x-correction value to the other side of the x-axis direction, controls the conveyor to cause one or more pickups exceeding the x-critical value to place the one or more electronic components on the second tray as an electronic component test processor.

[0014] Furthermore, an electronic component testing processor control method can be provided, comprising: an image acquisition step of acquiring image information by capturing images from multiple pickups; a first pickup x-coordinate acquisition step of acquiring first pickup x-coordinates as x-axis coordinates of each of the multiple pickups when the conveyor is located at a first tray position on a first tray based on the image information; a first x-coordinate deviation value calculation step of calculating first reference x-coordinates as preset x-axis coordinates of each of the multiple pickups and first x-coordinate deviation values ​​of each of the multiple pickups corresponding to the first reference x-coordinates as differences in the first pickup x-coordinates when the conveyor is placed at the first tray position; a determination step of determining whether a first maximum x-deviation value having the maximum value among the multiple first x-coordinate deviation values ​​exceeds a preset x-critical value; and a first movement step of moving the conveyor to one side in the x-axis direction when it is determined that the first maximum x-deviation value is less than or equal to the x-critical value, moving the conveyor to the first minimum x-deviation value having the minimum value among the multiple first x-coordinate deviation values ​​and a first average x-deviation value being the average of the first minimum x-deviation value.

[0015] Furthermore, an electronic component testing processor control method can be provided, comprising: a first pickup y-coordinate acquisition step, based on the image information, when the conveyor is placed at the first tray position, acquiring a first pickup y-coordinate as the y-axis coordinate of each of the plurality of pickups; a first y-coordinate deviation value calculation step, when the conveyor is placed at the first tray position, calculating a first reference y-coordinate as the preset y-axis coordinate of each of the plurality of pickups and a first y-coordinate deviation value of each of the plurality of pickups corresponding to the first reference y-coordinate as the difference of the first pickup y-coordinate; a determination step, determining whether a first maximum y-coordinate deviation value having the maximum value among the plurality of first y-coordinate deviation values ​​exceeds a preset y-critical value; and a second movement step, when the first maximum y-coordinate deviation value is less than or equal to the y-critical value, moving the conveyor to one side in the y-axis direction by a first minimum y-coordinate deviation value having the minimum value among the plurality of first y-coordinate deviation values ​​and a first average y-coordinate deviation value being the average of the first minimum y-coordinate deviation value.

[0016] Furthermore, an electronic component testing processor control method may be provided, which includes a second pickup x-coordinate acquisition step, which acquires the second pickup x-coordinate as the x-axis coordinate of each of the plurality of pickups when the conveyor is placed on the second tray position; a second x-coordinate deviation value calculation step, which calculates the second reference x-coordinate as the preset x-axis coordinate of each of the plurality of pickups and the second x-coordinate deviation value of each of the plurality of pickups corresponding to the second reference x-coordinate as the difference of the second pickup x-coordinate; an average x-correction value calculation step, which calculates the x-correction value as the difference between the first x-coordinate deviation value and the second x-coordinate deviation value of each of the plurality of pickups, and calculates the average x-correction value as the average of the maximum and minimum values ​​of the plurality of x-correction values; and a second movement step, which moves the conveyor placed on the second tray to one side in the x-axis direction by the first average x-deviation value and to the other side in the x-axis direction by the average x-correction value.

[0017] Furthermore, an electronic component testing processor control method may be provided, which includes a step of calculating an average x-deviation value, which is the average of the maximum and minimum x-deviation values ​​of the remaining pickups other than one or more pickups that exceed the x-critical value, based on the first x-coordinate deviation value among the plurality of pickups; and a first sequential movement step, in which, when one or more of the plurality of first x-coordinate deviation values ​​exceed the x-critical value, the plurality of pickups are moved to a position positioned at a distance from the first pickup x-coordinate of the other average x-deviation value, and the conveyor is moved to place the one or more pickups on one or more of the plurality of electronic components.

[0018] Furthermore, an electronic component testing processor control method may be provided, which includes a second pickup x-coordinate acquisition step, which acquires the second pickup x-coordinate as the x-axis coordinate of each of the plurality of pickups when the conveyor is placed on the second tray position; a second x-coordinate deviation value calculation step, which calculates the second reference x-coordinate as the preset x-axis coordinate of each of the plurality of pickups and the second x-coordinate deviation value of each of the plurality of pickups corresponding to the second reference x-coordinate as the difference between the second reference x-coordinate and the second pickup x-coordinate; an offset x-correction value calculation step, which calculates the offset x-correction value as the difference between the first x-coordinate deviation value and the second x-coordinate deviation value of the one or more pickups; and a second sequential movement step, which includes a step of moving the conveyor in the x-axis direction to move the other average x-coordinate value and an offset correction value movement step of moving the offset x-correction value to the other side in the x-axis direction.

[0019] Beneficial effects One embodiment of the present invention has the effect of accurately holding electronic components or placing the held electronic components in the correct position on the first tray, even if there is an error in the spacing between multiple pickups.

[0020] In addition, one embodiment of the present invention has the effect of improving the accuracy of testing by placing the electronic components in the correct position, and preventing damage to the electronic components due to their separation. Attached Figure Description

[0021] Figure 1 A conceptual diagram illustrating an electronic component test processor according to an embodiment of the present invention; Figure 2 To illustrate Figure 1 A diagram showing the relationship between the conveyor and electronic components; Figure 3 To show Figure 2 A diagram showing the state when the intervals of multiple pickups are adjusted; Figure 4 To show Figure 1 A diagram showing the status of multiple pickups set on multiple electronic components; Figure 5 To show Figure 4 A diagram showing the state of the conveyor moving along the x-axis in the direction of the first average x-deviation value; Figure 6 To show Figure 5 A diagram showing the state of adjusting the spacing between multiple pickups while they are holding electronic components. Figure 7 To show Figure 6 A diagram showing the state of the transmitter moving the first average x-deviation value; Figure 8 To show Figure 7 A graph showing the state of the moving average x-correction value of the transmitter; Figure 9 To illustrate in sequence the control method of an electronic component test processor according to an embodiment of the present invention The flowchart. Detailed Implementation

[0022] The specific embodiments for realizing the technical concept of the present invention will now be described in detail with reference to the accompanying drawings.

[0023] Furthermore, when describing the present invention, if it is determined that a detailed description of the relevant known structures or functions may obscure the essence of the present invention, such detailed description will be omitted.

[0024] Furthermore, when it is mentioned that a certain constituent element is "connected" or "held" by other constituent elements, although it can be directly connected to and held by other constituent elements, it should be understood that there may be other constituent elements in between.

[0025] The terminology used in this specification is for illustrative purposes only and is not intended to limit the invention. Unless the singular expression is clearly distinguishable in the context, it includes multiple expressions.

[0026] Furthermore, although terms such as first, third, etc., which include ordinal numbers, can be used to describe various constituent elements, However, the corresponding constituent elements are not limited to these terms. These terms are only used to distinguish one constituent element from another.

[0027] The word "including" as used in the specification means to specify a particular characteristic, domain, positive number, step, action, element and / or component, without excluding the existence or addition of other specific characteristics, domains, positive numbers, steps, actions, elements, components and / or groups.

[0028] Furthermore, the descriptions of "top," "bottom," etc., in this specification are based on the illustrations shown on the drawing. If the orientation of the object changes, the difference in description will be indicated in advance. On the other hand, the x-axis and y-axis directions in this specification refer to... Figures 4 to 8 The directions in which the x-axis and y-axis extend.

[0029] See below. Figure 1 According to an embodiment of the present invention, an electronic component test processor 1 can electrically connect electronic components 2 manufactured through a prescribed manufacturing process to a tester and then classify the electronic components 2 based on the test results. For example, the electronic component 2 can be a semiconductor device. Furthermore, the electronic component test processor 1 can be manufactured in various forms to optimize for the type of electronic component 2 to be tested. Such an electronic component test processor 1 can be combined with a tester 3 capable of testing electronic components 2, to which the electronic components 2 can be electrically connected. Such an electronic component test processor 1 may include a frame 10, a stacker 20, a base 30, a conveyor 40, a camera unit 50, a first tray 60, a tester 70, a transfer unit 80, a control unit 90, and a mover 100.

[0030] The frame 10 can support the stacker 20, the assembly base 30, the transfer hand 40, the imaging unit 50, the first tray 60, the test hand 70, the transfer unit 80, the control unit 90, and the mover 100, and loads the second tray CT, providing transfer space. Such a frame 10 may include a repeater (not shown) capable of transferring the second tray CT from the stacker 20 to the assembly base 30. In this specification, the second tray CT may be referred to as the customer tray CT.

[0031] The stacker 20 can hold a second tray CT loaded with electronic components. Such a stacker 20 can be supported on the frame 10. Furthermore, the second tray CT loaded in the stacker 20 can be transferred to the group base 30 via a repeater, and the second tray CT can be transferred back to the stacker 20 from the group base 30. Such a stacker 20 can be positioned below the group base 30.

[0032] The assembly base 30 can support the second tray CT conveyed by the stacker 20. Such an assembly base 30 may have an opening (not shown) exposed to the conveyor arm 40 for exposing the second tray CT, which carries the electronic components 2, to the conveyor arm 40. When the second tray CT carrying the electronic components 2 is located inside such an opening, the electronic components 2 can be conveyed from the second tray CT to the first tray 60 via the conveyor arm 40.

[0033] See Figure 2 and Figure 3 The conveyor 40 can transfer electronic components 2 loaded on the second tray CT to the first tray 60. For example, the conveyor 40 can be supported and moved by a conveyor track (not shown) while simultaneously conveying multiple electronic components 2. Furthermore, the hand body 41 can move from either the first tray position or the second tray position to the other. In this specification, the first tray position is the position where the conveyor 40 is placed on the first tray 60, and the second tray position is the position where the conveyor 40 is placed on the second tray CT. Such a conveyor 40 may include a hand body 41, a pickup 42, and a drive motor 43.

[0034] The hand body 41 can support multiple pickups 42. Such a hand body 41 can move in one or more directions, including the x-axis and y-axis, via a drive motor 43. Furthermore, the spacing between the multiple pickups 42 can be adjusted. For example, the hand body 41 can be equipped with a cam and cam follower driven by the drive motor 43. The spacing between the multiple pickups 42 can be adjusted by such a cam and cam follower.

[0035] The pickup 42 can transfer multiple electronic accessories 2 from either the second tray CT or the first tray 60 to the other. For example, the pickup 42 can hold an electronic accessory 2 placed on the second tray CT and can place the held electronic accessory 2 on the first tray 60. Multiple such pickups 42 can be provided, and the multiple pickups 42 can hold multiple electronic accessories 2 simultaneously or individually. Such multiple pickups 42 may include a first pickup 42a, a second pickup 42b, a third pickup 42c, and a fourth pickup 42d. However, this specification describes multiple pickups 42 as being provided in four, but this is only an example, and any number can be provided.

[0036] On the other hand, the multiple pickups 42 can be configured to adjust the spacing between them. For example, the multiple pickups 42 can adjust the spacing between the multiple electronic accessories 2 when transferring the multiple electronic accessories 2 from either the second tray CT or the first tray 60 to the other. The spacing between such multiple pickups 42 can be wider in the second tray position than in the first tray position. This is because the spacing between the pockets containing the electronic accessories 2 in the first tray 60 is wider than the spacing between the pockets containing the electronic accessories 2 (not shown) in the second tray CT. Therefore, the spacing between the multiple pickups 42 can narrow when the transfer hand 40 moves from the first tray position to the second tray position. On the other hand, the spacing between the multiple pickups 42 may have different spacings due to assembly and manufacturing tolerances.

[0037] The imaging unit 50 can acquire image information by photographing the conveyor 40. The image information may include images of the hand body 41 and multiple pickups 42 captured by the imaging unit 50. Furthermore, the image information acquired by the imaging unit 50 can be transmitted to the control unit 90. For example, the imaging unit 50 can be a camera and can photograph the bottom surface of the conveyor 40. Multiple such imaging units 50 can be provided. Furthermore, any one of the multiple imaging units 50 is positioned adjacent to the first tray 60 and acquires first image information by photographing the conveyor 40 placed at the first tray position. Additionally, another of the multiple imaging units 50 is positioned adjacent to the second tray CT and acquires second image information by photographing the conveyor 40 placed at the second tray position.

[0038] The first tray 60 can transfer electronic components 2 received from the conveyor 40 via a transfer 80. This first tray 60 can form multiple pockets (not shown) for holding multiple electronic components. Furthermore, the first tray 60 can move back and forth between the conveyor 40 and the test location TP. The test location TP refers to the area where the electronic component 2 is electrically connected to the tester 3. This first tray 60 can be used to load electronic components and may be referred to as a transfer platform or test tray.

[0039] Tester 70 can transport the electronic component 2, which is placed on transfer 80, to test location TP, and load the electronic component 2 to be tested into test socket 3a of tester 3. Test socket 3a refers to the part of tester 3 that cannot hold the electronic component 2; when tester 70 places the electronic component 2 into test socket 3a, test socket 3a can be placed on test location TP. Conversely, tester 70 can remove the tested electronic component 2 from test socket 3a and transport it to transfer 80.

[0040] The transfer unit 80 can transport electronic components received from the first tray 60 to the testing location TP. Furthermore, the transfer unit 80 can transport electronic components that have completed testing to the mobile unit 100. The Ferry 80 can form multiple spaces that can accommodate multiple electronic components (not shown in the figure).

[0041] The control unit 90 can control the operation of the conveyor 40, the imaging unit 50, the first tray 60, the test hand 70, the ferry 80, and the mover 100. Such a control unit 90 can be implemented using a computing device including a microprocessor, measuring devices such as sensors, and memory; its implementation is obvious to those skilled in the art, and therefore further detailed description will be omitted.

[0042] The mover 100 can receive tested electronic components from the transfer station 80. This mover 100 can simultaneously classify the tested electronic components according to the test results and transfer them to the second tray CT. The mover 100 can travel along... Figure 1 Move in the direction indicated by the arrow.

[0043] On the other hand, when the spacing between the multiple pickups 42 is adjusted, the control unit 90 can adjust the position of the conveyor 40 so that the multiple pickups 42 stably hold or release the electronic accessory 2. The control for adjusting the position of the conveyor 40 when the control unit 90 causes the multiple pickups 42 to hold or release the electronic accessory 2 will be described below.

[0044] See you again Figure 2 In this specification, the coordinates of each of the multiple electronic components 2 placed at the first correct position RP1 of the first tray 60 are defined as preset first reference x-coordinates and first reference y-coordinates. Furthermore, when multiple pickups 42 are placed above the first correct position RP1, the coordinates of each of the multiple pickups 42 can also be defined as first reference x-coordinates and first reference y-coordinates. The first reference x-coordinate is the x-axis coordinate, and the first reference y-coordinate is the y-axis coordinate.

[0045] See Figure 3 In this specification, the coordinates of the multiple electronic components 2 placed at the second correct position RP2 of the second tray CT are defined as preset second reference x-coordinates and second reference y-coordinates. Furthermore, when the multiple pickups 42 are respectively placed above the second correct position RP2, the coordinates of the multiple pickups 42 can also be defined as second reference x-coordinates and second reference y-coordinates. The second reference x-coordinate is the x-axis coordinate, and the second reference y-coordinate is the y-axis coordinate.

[0046] On the other hand, when the conveyor 40 is placed in the first tray position, the control unit 90 can obtain the coordinates of each of the plurality of pickups 42 based on the first image information captured by the imaging unit 50. In this specification, the x-axis coordinate of the plurality of pickups 42 obtained when the conveyor 40 is placed in the first tray position is defined as the first pickup x-coordinate, and the y-axis coordinate is defined as the first pickup x-coordinate.

[0047] Furthermore, when the conveyor 40 is placed in the second tray position, the control unit 90 can obtain the coordinates of each of the multiple pickups 42 based on the second image information captured by the imaging unit 50. In this specification, the x-axis coordinates of the multiple pickups 42 obtained when the conveyor 40 is placed in the second tray position are defined as the second pickup x-coordinates, and the y-axis coordinates are defined as the second pickup x-coordinates.

[0048] See Figure 4 The control unit 90 can calculate the first x-coordinate deviation value by the difference between the first reference x-coordinate of each of the multiple pickups 42 and the first pickup x-coordinate. For example, the first x-coordinate deviation value of the first pickup 42a is -1, and the first x-coordinate deviation value of the second pickup 42b is 0. Furthermore, the first x-coordinate deviation value of the third pickup 42c is 4, and the first x-coordinate deviation value of the fourth pickup 42d is 3. On the other hand, in Figure 4 In this context, the grid value is 2. Furthermore, the control unit 90 can calculate the first y-coordinate deviation value based on the difference between the first reference y-coordinate of each of the multiple pickups 42 and the first pickup y-coordinate.

[0049] When the first maximum x-deviation value, which has the largest value among multiple first x-coordinate deviation values, is less than or equal to a preset x-critical value, the control unit 90 can calculate a first average x-deviation value. The first average x-deviation value can be the average of the first minimum x-deviation value and the first maximum x-deviation value, which have the smallest value among multiple first x-coordinate deviation values. For example, the x-critical value can be 6. In this case, since the first maximum x-deviation value (4 in the third pickup 42c) is less than or equal to the x-critical value, the control unit 90 calculates the first average x-deviation value 1.5 by averaging the first minimum x-deviation value -1 and the first maximum x-deviation value 4.

[0050] Furthermore, when the first maximum y-deviation value, which has the largest value among the plurality of first y-coordinate deviation values, is less than or equal to a preset y-critical value, the control unit 90 can calculate a first average y-deviation value. The first average y-deviation value can be the average of the first minimum y-deviation value and the first maximum y-deviation value, which have the smallest value among the plurality of first y-coordinate deviation values.

[0051] See Figure 5The control unit 90 can control the conveyor 40 to move the conveyor 40 to one side in the x-axis direction by a first average x-deviation value. Furthermore, the control unit 90 can control the conveyor 40 to move the conveyor 40 to one side in the y-axis direction by a first average y-deviation value. When the conveyor 40 moves by the first average x-deviation value in the x-axis direction and by the first average y-deviation value in the y-axis direction, the control unit 90 can control the multiple pickups 42 to hold the electronic component 2.

[0052] See Figure 6 When the conveyor 40 holds multiple electronic components 2, the control unit 90 can move the conveyor 40 so that it is placed in the second tray position. Furthermore, during the movement of the conveyor 40, the control unit 90 can control the conveyor 40 to shorten the distance between the multiple pickers 42 while they hold the multiple electronic components 2.

[0053] The control unit 90 can calculate the second x-coordinate deviation value by the difference between each second reference x-coordinate of the plurality of pickups 42 and the acquired second pickup x-coordinate. For example, the second x-coordinate deviation value of the first pickup 42a is -5, and the second x-coordinate deviation value of the second pickup 42b is 0. Furthermore, the second x-coordinate deviation value of the third pickup 42c is 1, and the second x-coordinate deviation value of the fourth pickup 42d is 2. Additionally, the control unit 90 can calculate the second y-coordinate deviation value by the difference between each second reference y-coordinate of the plurality of pickups 42 and the second pickup y-coordinate.

[0054] Furthermore, the control unit 90 can calculate the x-correction value by the difference between the first coordinate x-deviation value and the second coordinate x-deviation value of each of the multiple pickups 42. For example, the x-correction value of the first pickup 42a is -4, and the x-correction value of the second pickup 42b is 0. In addition, the x-correction value of the third pickup 42c is -3, and the x-correction value of the fourth pickup 42d is -1. In this case, the control unit 90 can calculate the average x-correction value, which is the average of the maximum and minimum values ​​among multiple x-correction values. The average x-correction value can be -2. Furthermore, the control unit 90 can calculate the y-correction value, which is the difference between the first y-coordinate deviation value and the second y-coordinate deviation value corresponding to the multiple pickups 42. Thus, the control unit 90 can calculate the average y-correction value based on the multiple y-correction values.

[0055] Then, the control unit 90 moves the conveyor 40 to one side in the x-axis direction by the first average x-deviation value (see...). Figure 7The control unit 90 moves the conveyor 40 to the other side of the x-axis direction by an average x-correction value (see Figure 8). Furthermore, the control unit 90 can move the conveyor 40 to one side of the y-axis direction by a first average y-deviation value, and also move the conveyor 40 to the other side of the y-axis direction by an average y-correction value. When the conveyor 40 moves the average x-correction value and the average y-correction value along the x-axis and y-axis respectively, the control unit 90 can place multiple electronic components 2 onto the second tray CT.

[0056] In this way, even if errors occur in the spacing between the multiple pickups 42 by adjusting the spacing between them, the control unit 90 can move the transport hand 40 by making corrections. Therefore, the phenomenon of multiple pickups 42 missing multiple electronic accessories 2 is minimized, and the phenomenon of multiple pickups 42 being separated from the correct position of the first tray 60 or the second tray CT can be prevented.

[0057] On the other hand, when one or more of the multiple first x-coordinate deviation values ​​exceed the x-critical value, the control unit 90 can calculate other average x-deviations of the pickups 42 other than the one or more pickups 42 that exceed the x-critical value. For example, when the first x-coordinate deviation value of the fourth pickup 42d exceeds the x-critical value, the control unit 90 calculates other average x-deviation values ​​by averaging the maximum and minimum x-coordinate deviation values ​​among the first pickup 42a, the second pickup 42b, and the third pickup 42c. In this case, after the control unit 90 moves one or more pickups 42 that exceed the x-critical value onto one or more electronic accessories 2, it controls the conveyor 40 to hold one or more electronic accessories 2. Furthermore, the control unit 90 can move the remaining pickups 42 that do not exceed the x-critical value to a position from the first pickup x-coordinate interval to other average x-deviation values, and then control the conveyor 40 to hold the electronic accessories 2.

[0058] Furthermore, when the conveyor 40 moves to the second tray position while holding the electronic component 2, the control unit 90 can acquire the second pickup x-coordinate of each of the multiple pickups 42 and calculate the second x-coordinate deviation value. The control unit 90 can then calculate the offset x-correction value by subtracting the first and second x-coordinate deviation values ​​of one or more pickups 42 that exceed a threshold value. In this case, after the control unit 90 moves the conveyor 40, placed at the second tray position, to one side of the x-axis direction by another average x-deviation value and to the other side of the x-axis direction by an offset x-correction value, it can control the conveyor 40 so that one or more pickups 42 exceeding the x-threshold value place one or more electronic components 2 onto the second tray CT.

[0059] When one or more of the plurality of first y-coordinate deviation values ​​exceed a y-critical value, the control unit 90 can calculate other average y-deviation values ​​for the remaining pickups 42 other than the one or more pickups 42 that exceed the y-critical value. For example, the control unit 90 can calculate other average y-deviation values ​​by averaging the maximum and minimum y-deviation values ​​of the one or more pickups 42 that exceed the y-critical value. In this case, after the one or more pickups 42 that exceed the y-critical value move onto one or more electronic components 2, the control unit 90 can control the conveyor 40 to hold one or more electronic components 2. Furthermore, the control unit 90 can control the conveyor 40 to hold one or more electronic components 2 after moving the remaining pickups 42 that do not exceed the y-critical value to a position that is spaced apart from the first pickup's y-coordinate by other average y-deviation values.

[0060] In addition, the control unit 90 can calculate the offset y correction value by subtracting the first y coordinate deviation value and the second y coordinate deviation value of one or more pickups 42 that exceed the y threshold value.

[0061] In this specification, the control unit 90 has been described for correcting the gap between electronic components during the transfer of electronic components from the first tray 60 to the second tray CT, but the same control can also be applied to the transfer of electronic components from the second tray CT to the first tray 60. Furthermore, although the correction of the gap between electronic components between the first tray 60 and the second tray CT has been described, the correction control can also be applied to the process of correcting the gap between electronic components between the first tray 60 and the transfer 80.

[0062] Thus, even if errors occur in the spacing between the multiple pickups 42, the electronic component testing and processing machine 1 according to an embodiment of the present invention can accurately hold multiple electronic components 2 by correcting them. Furthermore, it also has the effect of placing the held multiple electronic components 2 in the correct position on the first tray 60.

[0063] Furthermore, even if the spacing of the electronic component placement spaces formed in the first tray 60 and the second tray CT are different, the electronic component test processor 1 has the effect of placing the electronic component 2 in the correct position by controlling the spacing between the pickups 42.

[0064] In the following text, refer to Figure 9 An electronic component test processor control method S10 for controlling an electronic component test processor 1 according to an embodiment of the present invention will be described.

[0065] An electronic component testing processor control method S10 supports the testing of electronic components 2 by controlling an electronic component testing processor 1. This electronic component testing processor control method S10 may include an image acquisition step S100, a first coordinate acquisition step S200, a first deviation value calculation step S300, a judgment step S400, a first movement step S500, a second coordinate acquisition step S600, a second deviation value calculation step S700, an average correction value calculation step S800, a second movement step S900, other average deviation value calculation steps S1000, a first sequential movement step S1100, an offset deviation value calculation step S1200, and a second sequential movement step S1300.

[0066] Image acquisition step S100 can acquire image information by capturing images of multiple pickups 42 through the shooting unit 50. Such image acquisition step S100 can acquire first image information by capturing images of the conveyor 40 placed on the first tray, and acquire second image information by capturing images of the conveyor 40 placed on the second tray.

[0067] The first coordinate acquisition step S200 may include the first picker x coordinate acquisition step S210 and the first picker y coordinate acquisition step S220.

[0068] In the first pickup x-coordinate acquisition step S210, based on the image information, the first pickup x-coordinate of each of the multiple pickups placed on the first tray can be acquired.

[0069] In the first pickup y-coordinate acquisition step S220, based on the image information, the first pickup y-coordinate of each of the multiple pickups placed on the first tray can be acquired.

[0070] The first deviation value calculation step S300 may include the first x-coordinate deviation value calculation step S310 and the first y-coordinate deviation value calculation step S320.

[0071] In step S310, the first x-coordinate deviation value is calculated based on the first reference x-coordinate and the first pickup x-coordinate. Furthermore, in step S310, the first average x-coordinate deviation value can be calculated by averaging the first minimum x-coordinate deviation value and the first x-coordinate deviation value.

[0072] In step S320, the first y-coordinate deviation value is calculated based on the first reference y-coordinate and the first pickup y-coordinate. Furthermore, in step S320, the first average y-coordinate deviation value can be calculated by averaging the first minimum y-coordinate deviation value and the first y-coordinate deviation values.

[0073] In step S400, it can be determined whether the first maximum x-deviation value, which has the largest value among the multiple first x-coordinate deviation values ​​calculated in step S300, exceeds the x-critical value. Similarly, it can be determined whether the first maximum y-deviation value, which has the largest value among the multiple first y-coordinate deviation values, exceeds the y-critical value.

[0074] In the first movement step S500, the conveyor 40 placed on the first tray can be moved. This first movement step S500 can be performed before the conveyor 40 picks up the electronic component 2. The first movement step S500 may include a first movement step S510 and a second movement step S520.

[0075] In the first moving step S510, when the first maximum x-deviation value is less than or equal to the x-critical value, the conveyor 40 can move the first average x-deviation value in the x-axis direction.

[0076] In the second moving step S520, when the first maximum y deviation value is equal to or less than the y critical value, the conveyor 40 can move the first average y deviation value in the y-axis direction.

[0077] The second coordinate acquisition step S200 may include the second picker x-coordinate acquisition step S610 and the second picker y-coordinate acquisition step S620. In the second pickup x-coordinate acquisition step S610, the second pickup x-coordinates of each of the multiple pickups 42 placed on the second tray position can be obtained based on the second image information.

[0078] In the second pickup y-coordinate acquisition step S620, the second pickup y-coordinates of each of the multiple pickups 42 placed on the second tray position can be acquired based on the second image information.

[0079] The second deviation value calculation step S700 may include the second x-coordinate deviation value calculation step S710 and the second y-coordinate deviation value calculation step S720.

[0080] In step S710 of calculating the second x-coordinate deviation value, the second x-coordinate deviation value of each of the multiple pickups 42 can be calculated based on the second reference x-coordinate and the second pickup x-coordinate.

[0081] In step S720, the second y-coordinate deviation value is calculated based on the second reference y-coordinate and the second pickup y-coordinate. The second y-coordinate deviation value of each of the multiple pickups 42 can be calculated.

[0082] The step S800 for calculating the average correction value may include step S810 for calculating the average x correction value and step S820 for calculating the average y correction value.

[0083] In the average x-correction value calculation step S810, the x-correction value, which is the difference between the first x-coordinate deviation value and the second x-coordinate deviation value of each of the plurality of pickups 42, can be calculated. Furthermore, the average x-correction value, which is the average of the maximum and minimum x-correction values ​​calculated in the average x-correction value calculation step S810, can be calculated.

[0084] In the average y-correction value calculation step S820, the y-correction value, which is the difference between the first y-coordinate deviation value and the second y-coordinate deviation value of each of the plurality of pickups 42, can be calculated. Furthermore, the average y-correction value, which is the average of the maximum and minimum y-correction values ​​calculated in the average y-correction value calculation step S820, can be calculated.

[0085] In the second movement step S900, the conveyor 40 placed at the second tray position is moved to one side of the x-axis direction by a first average x-deviation value, and can also be moved to the other side of the x-axis direction by an average x-correction value. Furthermore, in the second movement step S900, the conveyor 40 can move to one side of the y-axis direction by a first average y-deviation value, and can also be moved to the other side of the y-axis direction by only an average y-correction value.

[0086] On the other hand, the step S1000 for calculating other average deviation values ​​may include the step S1010 for calculating other average x-deviation values ​​and the step S1020 for calculating other average y-deviation values.

[0087] In step S1010, when the first maximum x-axis deviation value exceeds the x-critical value, other average x-axis deviation values ​​of the remaining pickups 42, excluding one or more pickups whose first x-axis deviation value exceeds the x-critical value, can be calculated. These other average x-axis deviation values ​​are the average of the maximum and minimum x-axis deviation values ​​among the first x-axis deviation values ​​of the remaining pickups 42.

[0088] In step S1020, when the first maximum y-deviation value exceeds the y-critical value, other average y-deviation values ​​of the remaining pickups 42, excluding one or more pickups whose first y-coordinate deviation values ​​exceed the y-critical value, can be calculated. These other average y-deviation values ​​are the average of the maximum and minimum y-deviation values ​​among the first y-coordinate deviation values ​​of the remaining pickups 42.

[0089] In the first sequential movement step S1100, when one or more of the multiple first x-coordinate deviation values ​​exceed one or more x-critical values, the conveyor 40 can be moved to one side in the x-axis direction by other average x-deviation values. Similarly, when one or more of the multiple first y-coordinate deviation values ​​exceed a y-critical value, the conveyor 40 can be moved to one side in the y-axis direction by other average y-deviation values. On the other hand, in the first sequential movement step S1100, by moving the conveyor 40, one or more pickups 42 exceeding one or more of the x-critical and y-critical values ​​are placed on a portion of the multiple electronic components 2. That is, even if the pickups 42 exceeding the critical values ​​are moved by an average x-deviation value or an average y-deviation value, they cannot hold the electronic component 2; therefore, the control unit 90 further controls the conveyor 40 to hold the electronic component 2 by the pickups exceeding the critical values.

[0090] The step S1200 for calculating the offset deviation value may include the step S1210 for calculating the offset x deviation value and the step S1220 for calculating the offset y deviation value.

[0091] In step S1210 of calculating the offset x-bias value, the offset x-correction value can be calculated by subtracting the first x-coordinate deviation value and the second x-coordinate deviation value of one or more pickups 42 whose first x-coordinate deviation value exceeds the x-critical value.

[0092] In the step S1220 of calculating the offset y-deviation value, the offset y-correction value can be calculated by subtracting the first y-coordinate deviation value and the second y-coordinate deviation value of one or more pickups 42 whose first y-coordinate deviation value exceeds the y-critical value.

[0093] The second sequential shift step S1300 may include an average value shift step S1310 and an offset correction value shift step S1320.

[0094] In other average value moving steps S1310, the conveyor 40 can be moved to one side of the x-axis direction with other average x-deviation values, and the conveyor 40 can be moved to one side of the y-axis direction with other average y-deviation values.

[0095] In the offset correction value movement step S1320, the conveyor 40 can be moved to the other side of the x-axis direction by offset x correction value, and the conveyor 40 can be moved to the other side of the y-axis direction by offset y correction value.

[0096] Although embodiments of the invention have been described as specific examples, these are merely illustrative and the invention is not limited thereto, and should be construed as having the broadest scope of the technical ideas disclosed herein. Those skilled in the art can implement patterns of unspecified shapes by combining / substituting the disclosed embodiments, without departing from the scope of the invention. Furthermore, those skilled in the art can readily make changes or modifications to the disclosed embodiments based on this specification, and such changes or modifications are obviously also within the scope of the invention.

Claims

1. An electronic accessory test handler, comprising: comprises: a first tray for placing a plurality of electronic components; a transfer hand including a plurality of pickers arranged in an x-axis direction, which transfers the plurality of electronic components placed on the first tray to a second tray; a photographing unit which acquires image information by photographing the plurality of pickers; and a control unit which, based on the image information, acquires first picker x-axis coordinates as x-axis coordinates of the plurality of pickers when the transfer hand is placed at a first tray position on the first tray, the control unit, calculates first reference x-axis coordinates as preset x-axis coordinates of the plurality of pickers and first x-axis deviation values of the plurality of pickers corresponding to differences in the first picker x-axis coordinates from the first reference x-axis coordinates when the transfer hand is placed at the first tray position, controls the transfer hand to grip the plurality of electronic components from the first tray after moving the transfer hand to one side of the x-axis by a first minimum x-axis deviation value, which is a minimum value among the first x-axis deviation values, and a first average x-axis deviation value, which is an average value of the first maximum x-axis deviation value, when a first maximum x-axis deviation value, which is a maximum value among the first x-axis deviation values, is less than a preset x-axis threshold value.

2. The electronic component test handler according to claim 1, wherein at least a part of the plurality of pickers is arranged in a y-axis direction, the control unit, acquires first picker y-axis coordinates as y-axis coordinates of the plurality of pickers when the transfer hand is placed at the first tray position based on the image information, calculates first reference y-axis coordinates as preset y-axis coordinates of the plurality of pickers and first y-axis deviation values of the plurality of pickers corresponding to differences in the first picker y-axis coordinates from the first reference y-axis coordinates when the transfer hand is placed at the first tray position, controls the transfer hand to grip the plurality of electronic components from the second tray after moving the transfer hand to one side of the y-axis by a first minimum y-axis deviation value, which is a minimum value among the first y-axis deviation values, and a first average y-axis deviation value, which is an average value of the first maximum y-axis deviation value, when a first maximum y-axis deviation value, which is a maximum value among the first y-axis deviation values, is less than or equal to a preset y-axis threshold value.

3. The electronic component test handler according to claim 1, wherein the control unit, acquires second picker x-axis coordinates as x-axis coordinates of the plurality of pickers when the transfer hand is placed at a second tray position on the second tray, calculates second reference x-axis coordinates as preset x-axis coordinates of the plurality of pickers and second x-axis deviation values of the plurality of pickers corresponding to differences in the second picker x-axis coordinates from the second reference x-axis coordinates when the transfer hand is placed at the second tray position, and ​ an x correction value that is a difference between the first x coordinate deviation value and the second x coordinate deviation value of each of the plurality of pickers, and an average x correction value that is an average of a maximum value and a minimum value of the plurality of x correction values; the transfer hand is controlled so that the plurality of electronic components are placed on the second tray after the transfer hand is moved by the first average x deviation value to one side in the x axis direction and by the average x correction value to the other side in the x axis direction.

4. The electronic component test handler of claim 1, wherein the control section, when one or more of the plurality of first x coordinate deviation values exceeds the x critical value, the transfer hand is controlled so that the plurality of pickers are placed at positions that are spaced apart from the first picker x coordinate by the other average x deviation value; the transfer hand is controlled so that the one or more pickers that exceed the x critical value are placed on one or more of the plurality of electronic components; the other average x deviation value is an average of a maximum x deviation value and a minimum x deviation value of the remaining pickers other than the one or more pickers that exceed the x critical value.

5. The electronic component test handler of claim 4, wherein the control section, when the transfer hand is placed at a second tray position on the second tray, second picker x coordinates that are x axis coordinates of each of the plurality of pickers are acquired; when the transfer hand is placed at the second tray position, second reference x coordinates that are preset x axis coordinates of each of the plurality of pickers and second x coordinate deviation values of each of the plurality of pickers that correspond to a difference between the second reference x coordinates and the second picker x coordinates are calculated; an offset x correction value that is a difference between the first x coordinate deviation value and the second x coordinate deviation value of the one or more pickers is calculated; the transfer hand is controlled so that the one or more pickers that exceed the x critical value place the one or more electronic components on the second tray after the transfer hand is moved by the other average x deviation value to one side in the x axis direction and by the offset x correction value to the other side in the x axis direction.

6. An electronic accessory test handler control method, comprising: including: an image acquisition step of acquiring image information by photographing the plurality of pickers; a first picker x coordinate acquisition step of acquiring first picker x coordinates that are x axis coordinates of each of the plurality of pickers when the transfer hand is at a first tray position on a first tray based on the image information; a first x coordinate deviation value calculation step of calculating first x coordinate deviation values of each of the plurality of pickers that correspond to a difference between first reference x coordinates that are preset x axis coordinates of each of the plurality of pickers and the first picker x coordinates when the transfer hand is placed at the first tray position; a determination step of determining whether a first maximum x deviation value that is a maximum value of the plurality of first x coordinate deviation values exceeds a preset x critical value; and The first moving step moves the transfer hand to one side in the x-axis direction by a first minimum x deviation value, which is the minimum value among the plurality of first x coordinate deviation values, and a first average x deviation value, which is the average of the first minimum x deviation value, when it is determined that the first maximum x deviation value is less than or equal to an x critical value.

7. The electronic accessory test handler control method of claim 6, wherein, Further comprising: A first picker y coordinate acquisition step acquires a first picker y coordinate, which is the y-axis coordinate of each of the plurality of pickers, based on the image information when the transfer hand is placed at the first tray position; A first y coordinate deviation value calculation step calculates a first reference y coordinate, which is the preset y-axis coordinate of each of the plurality of pickers, and a first y coordinate deviation value, which is the difference from the first picker y coordinate corresponding to the first reference y coordinate, when the transfer hand is placed at the first tray position; A determination step determines whether a first maximum y deviation value, which is the maximum value among the plurality of first y coordinate deviation values, exceeds a preset y critical value; and A second moving step moves the transfer hand to one side in the y-axis direction by a first minimum y deviation value, which is the minimum value among the plurality of first y coordinate deviation values, and a first average y deviation value, which is the average of the first minimum y deviation value, when the first maximum y deviation value is less than or equal to the y critical value. Further comprising:

8. The electronic accessory test handler control method of claim 6, wherein, A second picker x coordinate acquisition step acquires a second picker x coordinate, which is the x-axis coordinate of each of the plurality of pickers, when the transfer hand is placed at a second tray position on a second tray; A second x coordinate deviation value calculation step calculates a second reference x coordinate, which is the preset x-axis coordinate of each of the plurality of pickers, and a second x coordinate deviation value, which is the difference from the second picker x coordinate corresponding to the second reference x coordinate, when the transfer hand is placed at the second tray position; An average x correction value calculation step calculates an x correction value, which is the difference between the first x coordinate deviation value and the second x coordinate deviation value of each of the plurality of pickers, and calculates an average x correction value, which is the average of the maximum value and the minimum value among the plurality of x correction values; and A second moving step moves the transfer hand placed on the second tray to one side in the x-axis direction by the first average x deviation value and to the other side in the x-axis direction by the average x correction value. Further comprising: An other average x deviation value calculation step calculates an other average x deviation value, which is the average of the maximum x deviation value and the minimum x deviation value of the remaining pickers other than one or more pickers that exceed the x critical value, among the plurality of pickers; and 9. The electronic accessory test handler control method of claim 6, wherein, A first sequential moving step moves the plurality of pickers to a position spaced apart from the first picker x coordinate by the other average x deviation value and moves the transfer hand so that the one or more pickers are placed on one or more electronic components among the plurality of electronic components when one or more of the plurality of first x coordinate deviation values exceed the x critical value. Further comprising: ​ ​ 10. The electronic accessory test handler control method of claim 9, wherein, ​ a second pickup x coordinate acquisition step of acquiring a second pickup x coordinate as an x axis coordinate of each of the plurality of pickups when the transfer hand is placed at a second tray position on the second tray; a second x coordinate deviation value calculation step of calculating a second reference x coordinate as a preset x axis coordinate of each of the plurality of pickups and a second x coordinate deviation value of each of the plurality of pickups as a difference between the second reference x coordinate and an x coordinate of the second pickup corresponding to the second reference x coordinate when the transfer hand is placed at the second tray position; an offset x correction value calculation step of calculating an offset x correction value as a difference between the first x coordinate deviation value and the second x coordinate deviation value of the one or more pickups; and a second sequential movement step including an other average value movement step of moving the transfer hand in the x axis direction by an other average value of the other average x coordinate deviation values and an offset correction value movement step of moving the transfer hand in the x axis direction by the offset x correction value to the other side.

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