Exposure control method for X-ray imaging, X-ray generator and exposure control system thereof

Abstract

The exposure control method for X-ray imaging comprises S10 to S50. And S10, acquiring sampling data of the target electrical parameters of the bulb tube. And S20, obtaining an analysis value of the target electrical parameter according to the sampling data in the first-degree ignition monitoring period. S30, for the first-degree ignition monitoring period, whether the absolute deviation of the analysis value of the target electrical parameter relative to the preset value is larger than or equal to a first preset threshold value or not is judged. And if yes, controlling exposure according to a first control strategy. And S40, obtaining an analysis value of the target electrical parameter according to the sampling data in the second-degree ignition monitoring period. S50, for the second-degree ignition monitoring period, whether the absolute deviation of the analysis value of the target electrical parameter relative to the preset value is larger than or equal to a second preset threshold value or not is judged. And if yes, controlling exposure according to a second control strategy. The method can monitor ignition and control exposure, and is beneficial to protecting the bulb tube. In addition, the invention also provides an X-ray generator and an exposure control system.

Description

Technical Field

[0001] This invention relates to the field of medical devices, and more particularly to an exposure control method for X-ray imaging, an exposure control system for an X-ray generator to implement the exposure control method, and an X-ray generator including the exposure control system. Background Technology

[0002] The X-ray generator is the core component of a medical X-ray imaging system. It generates X-rays by accelerating electrons at high voltage to bombard a target. During exposure, the high voltage can occasionally momentarily break down the insulation, a phenomenon commonly known as arcing. Arsoning can damage the X-ray tube and may also affect image quality. Therefore, it is necessary to monitor arcing during exposure and take necessary measures. Summary of the Invention

[0003] The purpose of this invention is to provide an exposure control method for X-ray imaging, which can be used to monitor arcing during the exposure process and control the exposure according to the occurrence of arcing, thereby protecting the X-ray tube.

[0004] Another objective of this invention is to provide an exposure control system for an X-ray generator, which can be used to monitor arcing during exposure and control the exposure based on the occurrence of arcing, thereby protecting the X-ray tube.

[0005] Another object of the present invention is to provide an X-ray generator that can be used to monitor arcing during exposure and control the exposure according to the occurrence of arcing, thereby protecting the X-ray tube.

[0006] This invention provides an exposure control method for X-ray imaging, comprising steps S10 to S50. S10: During exposure, sampling data of the target electrical parameters of the X-ray tube are acquired. The sampling data is obtained by continuously sampling the target electrical parameters of the X-ray tube according to a sampling period. The target electrical parameters include tube voltage and / or tube current. S20: Based on the sampling data within each first-level ignition monitoring period, the analytical values ​​of each target electrical parameter for each first-level ignition monitoring period are obtained. The first-level ignition monitoring period is greater than or equal to the sampling period. S30: For each first-level ignition monitoring period, it is determined whether the absolute deviation of the analytical value of each target electrical parameter relative to its preset value is greater than or equal to a first preset threshold. If the determination result is yes, exposure control is performed according to a first control strategy. S40: Based on the sampling data within each second-level ignition monitoring period, the analytical values ​​of each target electrical parameter for each second-level ignition monitoring period are obtained. The second-level ignition monitoring period is greater than or equal to the sampling period. S50: For each second-level ignition monitoring cycle, determine whether the absolute deviation of the analyzed value of each target electrical parameter relative to its preset value is greater than or equal to a second preset threshold. The second preset threshold for each target electrical parameter is greater than the first preset threshold. If any of the determinations are yes, then exposure control is performed according to the second control strategy. The second control strategy differs from the first control strategy.

[0007] This X-ray imaging exposure control method can be used to monitor different degrees of arcing during the exposure process, and to control the exposure through different control strategies according to the occurrence of different degrees of arcing, which helps to protect the X-ray tube.

[0008] In another illustrative embodiment of the exposure control method for X-ray imaging, the first preset threshold is 10% to 20% of the preset value, and the second preset threshold is 30% to 50% of the preset value.

[0009] In another illustrative embodiment of the X-ray imaging exposure control method, the first control strategy includes terminating exposure when the judgment results of N consecutive first-level ignition monitoring cycles are all "yes". Here, N is a positive integer greater than or equal to 2. This helps to extend the lifespan of the X-ray tube.

[0010] In another illustrative embodiment of the X-ray imaging exposure control method, the first control strategy includes: when the judgment result of the first degree of arcing monitoring cycle is "yes", switching the control mode from tube current control mode to filament heating current control mode, maintaining this for a first set duration, and then switching back to tube current control mode. The tube current control mode stabilizes the real-time radiation power at a preset value by controlling the magnitude of the tube current. The filament heating current control mode stabilizes the tube current at a preset value by controlling the magnitude of the filament current. By switching the control mode from tube current control mode to filament heating current control mode, the continuous increase of the filament current can be prevented, which helps protect the filament, extends the life of the X-ray tube, and helps maintain the continuity of exposure.

[0011] In another illustrative embodiment of the X-ray imaging exposure control method, the first control strategy further includes: if the number of times the control mode switches from tube current control mode to filament heating current control mode exceeds M times within a second set time period, then the exposure is terminated. Here, M is a positive integer greater than or equal to 2. This helps to extend the lifespan of the X-ray tube.

[0012] In another illustrative embodiment of the exposure control method for X-ray imaging, the second control strategy is to terminate the exposure. This helps to extend the life of the X-ray tube.

[0013] In another illustrative embodiment of the X-ray imaging exposure control method, in steps S20 and / or S40, the method for obtaining the analytical value of the tube current is to take the maximum value, and the method for obtaining the analytical value of the tube voltage is to take the minimum value. This helps to improve accuracy.

[0014] In another illustrative embodiment of the exposure control method for X-ray imaging, in steps S20 and / or S40, the method for obtaining the analytical value is to take the earliest sampled value. This helps to improve sensitivity.

[0015] In another illustrative embodiment of the X-ray imaging exposure control method, in S20, the method for obtaining the analysis value is to take the earliest sampled value, and the length of the first-level arcing monitoring cycle is A1; and / or in S40, the method for obtaining the analysis value is to take the earliest sampled value, and the length of the second-level arcing monitoring cycle is A2, where A2 is greater than A1. This helps to save computing power and improve efficiency.

[0016] This invention also provides an exposure control system for an X-ray generator, comprising a memory and a processor. The memory stores a computer program. When the processor executes the computer program, it can implement the aforementioned X-ray imaging exposure control method. This X-ray generator exposure control system can be used to monitor different degrees of arcing during exposure and control the exposure using different control strategies based on the occurrence of different degrees of arcing, thus protecting the X-ray tube.

[0017] In another illustrative embodiment of the X-ray generator's exposure control system, the system further includes a DC sensor. The DC sensor is connected in series or mounted on the tube current detection feedback line between the X-ray tube and the high-voltage generator for sampling the tube current. The DC sensor signal is connected to a memory. This facilitates rapid acquisition of tube current sampling data and improves sensitivity.

[0018] The present invention also provides an X-ray generator, which includes the exposure control system of the aforementioned X-ray generator. This X-ray generator can be used to monitor different degrees of arcing during exposure and to control the exposure using different control strategies based on the occurrence of different degrees of arcing, thereby protecting the X-ray tube. Attached Figure Description

[0019] The following figures are for illustrative purposes only and do not limit the scope of the invention.

[0020] Figure 1 This is a schematic flowchart illustrating one embodiment of an exposure control method for X-ray imaging.

[0021] Figure 2 This is a schematic block diagram of one embodiment of the exposure control system for an X-ray generator.

[0022] Label Explanation

[0023] 10. Memory

[0024] 20 processors

[0025] 30 DC Sensor Detailed Implementation

[0026] To provide a clearer understanding of the technical features, objectives, and effects of the invention, specific embodiments of the invention are now described with reference to the accompanying drawings. In the drawings, the same reference numerals indicate components with the same or similar structures but the same function.

[0027] In this document, “illustrative” means “serving as an example, illustration or description”, and any illustration or implementation described herein as “illustrative” should not be construed as a more preferred or advantageous technical solution.

[0028] In this document, terms such as "first," "second," etc., do not indicate degree of importance or order, but are used only to distinguish them from each other for the purpose of document description. Nouns and pronouns relating to persons in this patent application are not limited to specific genders.

[0029] To keep the drawings simple, each drawing only schematically shows the parts related to the present invention, and they do not represent the actual structure of the product.

[0030] Figure 1 This is a schematic flowchart illustrating one embodiment of an exposure control method for X-ray imaging. Figure 1 As shown, the exposure control method for X-ray imaging in this illustrative embodiment includes S10 to S50.

[0031] S10: During the exposure process, sampling data of the target electrical parameters of the X-ray tube are acquired in real time. The sampling data is obtained by continuously sampling the target electrical parameters of the X-ray tube according to a sampling period, the length of which is, for example, between 0.1 milliseconds and 1 millisecond, but not limited to this. In this illustrative embodiment, the target electrical parameters include tube voltage and tube current.

[0032] S20: Analyze the target electrical parameters for each first-level ignition monitoring cycle in real time based on the sampled data within each first-level ignition monitoring cycle. The first-level ignition monitoring cycle is greater than or equal to the sampling cycle. The endpoints of the first-level ignition monitoring cycle are, for example, sampling points, but are not limited to this. In this illustrative embodiment, the length of the first-level ignition monitoring cycle is, for example, between 5 and 10 milliseconds. The method for obtaining the analysis value of the tube current in the first-level ignition monitoring cycle is to take the maximum value of the sampled tube current data within the cycle, and the method for obtaining the analysis value of the tube voltage in the first-level ignition monitoring cycle is to take the minimum value of the sampled tube voltage data within the cycle. This requires temporary storage of the sampled data, for example, temporarily storing the sampled data from 10 seconds prior to the current moment. The duration can be adjusted as needed. This method helps improve accuracy, but is not limited to this.

[0033] S30: For each first-level ignition monitoring cycle, determine in real time whether the absolute deviation of the analyzed value of each target electrical parameter relative to its preset value is greater than or equal to a first preset threshold. The first preset threshold can be selected within the range of 10% to 20% of the preset value according to the sensitivity requirements, but is not limited to this. If the determination result is yes, then exposure control is performed according to the first control strategy. Specifically, in this illustrative embodiment, "yes" in the determination result for the first-level ignition monitoring cycle means that the absolute deviation of the analyzed value of the tube current relative to the preset value of the tube current in the first-level ignition monitoring cycle is greater than or equal to the first preset threshold, and / or the absolute deviation of the analyzed value of the tube voltage relative to the preset value of the tube voltage in the first-level ignition monitoring cycle is greater than or equal to the first preset threshold.

[0034] In this illustrative embodiment, the first control strategy includes terminating exposure when the judgment result of N consecutive first-level ignition monitoring cycles is "yes". Here, N is a positive integer greater than or equal to 2. The specific value of N can be selected based on the needs of exposure continuity and X-ray tube protection. This can extend the X-ray tube life, but is not limited to this. In this illustrative embodiment, the value of N ranges from 5 to 10, but is not limited to this. In this illustrative embodiment, an alarm signal is issued, for example, to notify relevant personnel when exposure is terminated.

[0035] S40: Analyze the target electrical parameters for each second-level ignition monitoring cycle in real time based on the sampling data within each second-level ignition monitoring cycle. The second-level ignition monitoring cycle is greater than or equal to the sampling cycle. The endpoints of the second-level ignition monitoring cycle are, for example, the endpoints of the first-level ignition monitoring cycle, but are not limited thereto. In this illustrative embodiment, the method for obtaining the analysis values ​​of each target electrical parameter for the second-level ignition monitoring cycle is to take the earliest sampling value, that is, to directly obtain the sampling data of the earliest sampling point within the second-level ignition monitoring cycle. This eliminates the need for temporary storage of the sampling data, improving sensitivity, but is not limited thereto. The second-level ignition monitoring cycle is, for example, no more than 500 microseconds, but is not limited thereto.

[0036] S50: For each second-level ignition monitoring cycle, determine in real time whether the absolute deviation of the analyzed value of each target electrical parameter relative to its preset value is greater than or equal to a second preset threshold. The second preset threshold for each target electrical parameter is greater than the first preset threshold. The second preset threshold can be selected, for example, within the range of 30% to 50% of the preset value based on sensitivity requirements, but is not limited to this. If the determination result is yes, exposure control is performed according to the second control strategy. The second control strategy differs from the first control strategy. Specifically, in this illustrative embodiment, "yes" in the determination result for the second-level ignition monitoring cycle refers to the absolute deviation of the analyzed value of the tube current relative to the preset value of the tube current being greater than or equal to the second preset threshold, and / or the absolute deviation of the analyzed value of the tube voltage relative to the preset value of the tube voltage being greater than or equal to the second preset threshold. The second control strategy is, for example, directly terminating the exposure, but is not limited to this. In the illustrative embodiment, an alarm signal is also issued simultaneously with the termination of exposure to notify relevant personnel.

[0037] Arson causes changes in tube voltage and current, and different degrees of arcing result in different degrees of changes in these parameters. Utilizing this, the X-ray imaging exposure control method of this illustrative embodiment can monitor arcing of varying degrees during exposure and control the exposure using different control strategies based on the occurrence of different degrees of arcing, thus protecting the X-ray tube.

[0038] In this illustrative embodiment, the target electrical parameters include tube voltage and tube current, but are not limited thereto. In other illustrative embodiments, the target electrical parameters may include only tube voltage or only tube current. Since the change in tube current precedes the change in tube voltage during sparking, including tube current in the target electrical parameters is beneficial for improving sensitivity.

[0039] In other illustrative embodiments, the target electrical parameters used in S20 and S30 may be different from or not exactly the same as the target electrical parameters used in S40 and S50.

[0040] In other illustrative embodiments, the first control strategy may differ from that described in the above embodiments. Specifically, in other illustrative embodiments, the first control strategy may include, for example, switching the control mode from tube current control mode to filament heating current control mode immediately when the judgment result of the first degree ignition monitoring cycle is yes, maintaining this for a first set duration, and then switching back to tube current control mode. The first set duration may be, for example, 1 millisecond to 2 milliseconds, but is not limited to this.

[0041] The tube current control mode stabilizes the real-time radiant power at a preset value by controlling the tube current. In this mode, when arcing occurs, it is interpreted as a decrease in real-time radiant power, and the tube current is increased to maintain the radiant power. The filament heating current control mode stabilizes the tube current at a preset value by controlling the filament current. Switching from tube current control to filament heating current control prevents the filament current from continuously increasing, protecting the filament, extending the X-ray tube's lifespan, and maintaining continuous exposure.

[0042] Based on this, the first control strategy further includes, for example, terminating the exposure if the number of times the control mode switches from tube current control mode to filament heating current control mode exceeds M times within a second set time period. The second set time period is, for example, 10 seconds, but is not limited to this. Here, M is a positive integer greater than or equal to 2. The value of M can be selected based on the requirements for exposure continuity and X-ray tube protection. Specifically, the value range of M is, for example, 3 to 5, but is not limited to this. In an illustrative embodiment, an alarm signal is also issued to notify relevant personnel at the same time as the exposure is terminated. This helps to extend the life of the X-ray tube.

[0043] In addition, another illustrative embodiment of the X-ray imaging exposure control method is provided. The similarities with the aforementioned X-ray imaging exposure control method will not be repeated here, but the differences are as follows. In this illustrative embodiment, the target electrical parameters include only tube voltage or only tube current. In S20, the method for obtaining the analysis value is to take the earliest sampled value, that is, to directly acquire the sampling data from the earliest sampling point within the first-level ignition monitoring cycle. This eliminates the need for temporary storage of the sampling data, thus improving sensitivity. The length of the first-level ignition monitoring cycle is A1. In S40, the method for obtaining the analysis value is still to take the earliest sampled value, that is, to directly acquire the sampling data from the earliest sampling point within the second-level ignition monitoring cycle. This eliminates the need for temporary storage of the sampling data, thus improving sensitivity. The length of the second-level ignition monitoring cycle is A2, where A2 is greater than A1. Specifically, the value range of A1 is, for example, 100 microseconds to 200 microseconds, and the value range of A2 is, for example, no more than 500 microseconds, but is not limited thereto. Since different degrees of arcing will result in different cycles of change in tube voltage and tube current, this setting helps to save computing power and improve efficiency.

[0044] Figure 2 This is a schematic block diagram of one embodiment of the exposure control system for an X-ray generator. Figure 2 As shown, the exposure control system of the X-ray generator includes a memory 10 and a processor 20. The memory 10 stores a computer program. When the processor 20 executes the computer program, it can implement the above-described X-ray imaging exposure control method. This X-ray generator exposure control system can be used to monitor different degrees of arcing during the exposure process and control the exposure according to different control strategies based on the occurrence of different degrees of arcing, which helps to protect the X-ray tube.

[0045] like Figure 2 As shown in the illustrative embodiment, the exposure control system of the X-ray generator also includes a DC sensor 30. The DC sensor 30 is connected in series or sleeved on the tube current detection feedback line between the X-ray tube and the high-voltage generator for sampling the tube current. The DC sensor 30 signal is connected to the memory 10. This facilitates rapid acquisition of tube current sampling data and improves sensitivity. The DC sensor 30 is, for example, a DC milliammeter or a Hall effect DC sensor, but is not limited to these.

[0046] The present invention also provides an X-ray generator, in one illustrative embodiment of which includes an X-ray tube, a high-voltage generator, and the aforementioned exposure control system for the X-ray generator. The exposure control system of the X-ray generator is integrated or packaged with, for example, the high-voltage generator. This X-ray generator can be used to monitor different degrees of arcing during exposure and to control the exposure using different control strategies based on the occurrence of different degrees of arcing, thereby protecting the X-ray tube.

[0047] It should be understood that although this specification is described according to various embodiments, not every embodiment contains only one independent technical solution. This way of describing the specification is only for clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

[0048] The detailed descriptions listed above are merely specific descriptions of feasible embodiments of the present invention and are not intended to limit the scope of protection of the present invention. All equivalent implementation schemes or modifications made without departing from the spirit of the present invention, such as combinations, divisions or repetitions of features, should be included within the scope of protection of the present invention.

Claims

1. An exposure control method for X-ray imaging, characterized in that, include: S10: During the exposure process, sampling data of the target electrical parameters of the X-ray tube are acquired. The sampling data is obtained by continuously sampling the target electrical parameters of the X-ray tube according to the sampling period. The target electrical parameters include tube voltage and / or tube current. S20: Based on the sampling data within each first-degree ignition monitoring cycle, obtain the analysis value of each target electrical parameter for each first-degree ignition monitoring cycle, wherein the first-degree ignition monitoring cycle is greater than or equal to the sampling cycle; S30: For each of the first degree of ignition monitoring cycles, determine whether the absolute deviation of the analysis value of each target electrical parameter relative to its preset value is greater than or equal to a first preset threshold. If the determination result is yes, then perform exposure control according to the first control strategy. S40: Obtain the analytical value of each target electrical parameter for each of the second-level ignition monitoring cycles based on the sampling data within each second-level ignition monitoring cycle, wherein the second-level ignition monitoring cycle is greater than or equal to the sampling cycle; and S50: For each of the second-level ignition monitoring cycles, determine whether the absolute deviation of the analysis value of each target electrical parameter relative to its preset value is greater than or equal to a second preset threshold. If the second preset threshold of each target electrical parameter is greater than the first preset threshold, and if the determination result is yes, then perform exposure control according to the second control strategy. The second control strategy is different from the first control strategy.

2. The exposure control method for X-ray imaging as described in claim 1, characterized in that, The first preset threshold is 10% to 20% of the preset value, and the second preset threshold is 30% to 50% of the preset value.

3. The exposure control method for X-ray imaging as described in claim 1, characterized in that, The first control strategy includes: if the judgment result of the first degree ignition monitoring cycle is yes for N consecutive cycles, then the exposure is terminated, where N is a positive integer greater than or equal to 2.

4. The exposure control method for X-ray imaging as described in claim 1, characterized in that, The first control strategy includes: when the judgment result of the first degree ignition monitoring cycle is yes, switching the control mode from tube current control mode to filament heating current control mode, maintaining it for a first set time, and then switching back to tube current control mode. The tube current control mode is used to stabilize the real-time radiant power at a preset value by controlling the magnitude of the tube current, and the filament heating current control mode is used to stabilize the tube current at a preset value by controlling the magnitude of the filament current.

5. The exposure control method for X-ray imaging as described in claim 4, characterized in that, The first control strategy further includes: if the number of times the control mode switches from tube current control mode to filament heating current control mode exceeds M times within a second set time period, then the exposure is terminated, where M is a positive integer greater than or equal to 2.

6. The exposure control method for X-ray imaging as described in claim 1, characterized in that, The second control strategy is to terminate exposure.

7. The exposure control method for X-ray imaging as described in claim 1, characterized in that, In S20 and / or S40, the method for obtaining the analysis value of the tube current is to take the maximum value, and the method for obtaining the analysis value of the tube voltage is to take the minimum value.

8. The exposure control method for X-ray imaging as described in claim 1, characterized in that, In S20 and / or S40, the method for obtaining the analysis value is to take the earliest sampled value.

9. The exposure control method for X-ray imaging as described in claim 1, characterized in that, In step S20, the method for obtaining the analysis value is to take the earliest sampled value, and the length of the first degree of ignition monitoring cycle is A1; and / or In S40, the method for obtaining the analysis value is to take the earliest sampled value, and the length of the second degree of ignition monitoring cycle is A2, where A2 is greater than A1.

10. An exposure control system for an X-ray generator, characterized in that, It includes a memory (10) and a processor (20), the memory (10) storing a computer program, and the processor (20) executing the computer program to implement the exposure control method for X-ray imaging according to any one of claims 1 to 9.

11. The exposure control system for the X-ray generator as described in claim 10, characterized in that, The exposure control system of the X-ray generator also includes a DC sensor (30), which is connected in series or sleeved on the tube current detection feedback line between the X-ray tube and the high voltage generator for sampling the tube current. The DC sensor (30) is connected to the memory (10).

12. An X-ray generator, characterized in that, An exposure control system for an X-ray generator as described in claim 10 or 11.

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