Test fixture and test device

Abstract

The embodiment of the invention relates to the technical field of detection equipment, and particularly discloses a test fixture and a detection device.The test fixture comprises a main body, the main body is provided with a first contact area and a second contact area which are isolated from each other, the first contact area is used for being electrically connected with a to-be-detected piece, and the second contact area is used for being electrically connected with a reference detection piece or another reference detection piece; a plurality of contact parts are arranged in the first contact area and the second contact area and are respectively used for connecting a contact of a to-be-detected piece and a contact of a reference detection piece or another to-be-detected piece; and the plurality of first conductive pins are embedded in the main body in an insulating manner, one end of each first conductive pin is connected to the contact part, and the other end of each first conductive pin extends out of the outer surface of the main body to form a detection area. Through the mode, the to-be-detected contact of the to-be-detected piece is guided to the outer surface of the main body through the contact part and the first conductive probe, so that a user can conveniently detect the contact, and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the field of test fixture technology, and in particular to a test fixture and test device. Background Technology

[0002] A point-of-load power supply, also known as a load-point power supply, is a DC / DC converter placed near an LSI (microprocessor, ASIC, FPGA, DSP, etc.) to convert high-voltage electrical energy into low-voltage electrical energy suitable for electronic devices. It is commonly used in distributed, multi-functional PCB board designs. It can be a very small power IC or a low-power power module, and can be isolated or non-isolated.

[0003] In the process of realizing this invention, the inventors discovered that: Currently, as point power supplies are increasingly widely used in electronic devices, the testing requirements for point power supplies are also gradually increasing. In the existing conventional testing process, point power supplies adopt a parallel testing method, that is, multiple channels of a single module are connected in parallel for testing. This testing method requires flying wire connection through two test boards, which is complex to configure, inefficient, and the long connection wires introduce unnecessary parasitic inductance, resistance, and capacitance, affecting the test results. As a result, the testing efficiency of point power supplies is low and the accuracy of the test results is affected. Summary of the Invention

[0004] This invention provides a test fixture, i.e., a test device, which mainly solves the technical problem that existing point power supply testing mainly relies on flying wires to bring out the contacts of the point power supply so that it can be tested by the equipment to ensure that the point power supply functions normally. This is cumbersome and has low testing efficiency.

[0005] To solve the above-mentioned technical problems, the present invention provides a test fixture, including a main body. The main body is provided with a first contact area and a second contact area that are isolated from each other. The first contact area is used to electrically connect to a device under test, and the second contact area is used to electrically connect to a reference device or another device under test. Both the first and second contact areas are provided with a plurality of contact portions. The contact portions located in the first contact area are used to connect to the contacts of the device under test, and the contact portions located in the second contact area are used to connect to the contacts of the reference device or another device under test. A plurality of first conductive pins are insulatedly embedded in the main body. One end of each first conductive pin is connected to a contact portion, and the other end of each first conductive pin extends out of the outer surface of the main body to form a detection area, which is used to connect to an external detection component.

[0006] Optionally, the other end of the plurality of first conductive pins surrounds the first contact area or the second contact area to form the detection area.

[0007] Optionally, the detection area includes a first functional detection area and a second functional detection area surrounding the first contact area or the second contact area. The first functional detection area is further away from the first contact area or the second contact area than the second functional detection area. The first functional detection area is used to connect the main functional area of ​​the device under test, and the second functional detection area is used to connect the secondary functional area of ​​the device under test.

[0008] Optionally, the main body is provided with a plurality of conductive slots, the conductive slots being located on the surface opposite to the outer surface of the main body where the other end of the first conductive pin is exposed. The portion of the first conductive pin embedded in the main body communicates with the external environment through the conductive slots. When multiple test fixtures are stacked, the other end of the first conductive pin of one test fixture is inserted into the conductive slot of another test fixture and electrically connected to the first conductive pin of the other test fixture.

[0009] Optionally, the main body includes a first wall and a second wall opposite to each other, the first contact area is located on the first wall, the second contact area is located on the second wall, the other end of the first conductive pin extends from the periphery of the second contact area, and the portion of the first conductive pin extending from the periphery of the second contact area is electrically connected to the detection component, and the main body and the detection component together clamp the reference detection element or another element to be detected.

[0010] Optionally, the main body is provided with a first mounting groove, the first contact area is located at the bottom of the first mounting groove, and the test piece is received in the first mounting groove; the test fixture includes a fixing component, the fixing component is movably disposed on the main body, and the fixing component is used to clamp the test piece together with the main body.

[0011] Optionally, the fixing component includes a pressure plate and a snap-fit ​​component. One end of the pressure plate is rotatably disposed on one side of the first contact area, and the snap-fit ​​component is rotatably disposed on the other end of the pressure plate. The snap-fit ​​component can reciprocate between a preset first position and a preset second position. When the snap-fit ​​component is in the preset first position, it is locked to the main body to press the object to be tested. When the snap-fit ​​component is in the preset second position, it is unlocked from the main body to release the object to be tested.

[0012] Optionally, the main body includes a first wall, a second wall, and a third wall, the first wall and the second wall are opposite to each other, the third wall is perpendicular to the first wall and the second wall, the first contact area is located on the first wall, the second contact area is located on the second wall, and the first conductive pin extends from the third wall.

[0013] To solve the above-mentioned technical problems, another technical solution adopted by the present invention is: to provide a detection device, including a detection component and the above-mentioned test fixture, wherein the detection component is provided with a plurality of first insertion holes, and the other end of a plurality of first conductive pins is inserted into the plurality of first insertion holes and electrically connected to the detection component, wherein the detection component is used to connect to an external display device.

[0014] Optionally, the detection device includes a transfer component and a plurality of second conductive pins. The plurality of second conductive pins are insulatedly embedded in the transfer component. The transfer component includes multiple insertion surfaces and transition surfaces. The transition surface is provided with a plurality of second insertion holes. One end of the plurality of second conductive pins is located in the second insertion hole, and the other end of the plurality of second conductive pins extends out from the transition surface. The other end of the plurality of second conductive pins is used to insert and electrically connect to the detection component. The first conductive pins of the plurality of test fixtures are inserted into the second insertion holes and electrically connected to the second conductive pins.

[0015] The beneficial effects of this invention are as follows: Unlike the prior art, this invention provides a test fixture and a detection device. The test fixture includes a main body and first conductive pins. The main body is provided with a first contact area and a second contact area that are isolated from each other. The first contact area is used to electrically connect to the device under test, and the second contact area is used to electrically connect to a reference detection device or another device under test. Both the first and second contact areas are provided with a plurality of contact portions. The contact portions located in the first contact area are used to connect to the contacts of the device under test, and the contact portions located in the second contact area are used to connect to the contacts of the reference detection device or another device under test. A plurality of first conductive pins are insulatedly embedded in the main body. One end of each first conductive pin is connected to a contact portion, and the other end of each first conductive pin extends out of the outer surface of the main body to form a detection area. The detection area is used to connect to an external detection component. With the above structure, the embodiments of the present invention can guide the contact of the test piece to the detection area where the first conductive pin extends out of the outer surface of the main body by setting the first conductive pin, thereby improving the convenience of detection. Furthermore, when the second contact area is electrically connected to the reference test piece, the two mutually isolated first and second contact areas can enable the test fixture to form a comparison with the test piece through the added reference test piece, thereby improving the detection efficiency. When the second contact area is electrically connected to another test piece, the space area of ​​the outer surface of the main body can be fully utilized, thereby improving the detection efficiency of the test fixture. Attached Figure Description

[0016] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on the drawings without creative effort.

[0017] Figure 1 This is an exploded structural diagram of a test fixture and detection component provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of a test fixture viewed from below according to an embodiment of the present invention; Figure 3 This is a schematic diagram of another test fixture assembled with a detection assembly according to an embodiment of the present invention; Figure 4 This is an exploded structural diagram of another test fixture and detection component provided in an embodiment of the present invention; Figure 5 This is a cross-sectional schematic diagram of another test fixture provided in an embodiment of the present invention; Figure 6 This is an exploded structural diagram of another test fixture provided in an embodiment of the present invention; Figure 7 This is a cross-sectional schematic diagram from one perspective of another test fixture provided in an embodiment of the present invention; Figure 8 This is a cross-sectional schematic diagram from another perspective of another test fixture provided in the embodiments of the present invention; Figure 9 This is a cross-sectional schematic diagram from another perspective of another type of test fixture provided in the embodiments of the present invention; Figure 10 yes Figure 9 Enlarged view of part B in the middle; Figure 11 yes Figure 9 Enlarged view of a section in the middle C; Figure 12 This is a schematic diagram of another test fixture provided in an embodiment of the present invention; Figure 13 This is a schematic diagram of the structure of a testing device that utilizes various test fixtures provided in this application, according to an embodiment of the present invention.

[0018] Icon labels: 100. Test fixture; 1. Main body; 11. First contact area; 12. Second contact area; 13. Contact part; 1a. First wall surface; 1b. Second wall surface; 1c. Third wall surface; 14. First mounting groove; 15. Sliding cavity; 151. First bottom wall; 152. First top wall; 153. Sliding wall; 1531. Sliding groove; 154. Fourth wall surface; 155. Fifth wall surface; 16. Conductive slot; 2. First conductive pin; 21. Detection area; 211. First functional detection area; 212. Second functional detection area; 3. Fixing components; 31. Pressure plate; 311. Plate body; 3111. Rotating hole; 312. Rotating part; 32. Snap-fit ​​component; 4. Sliding assembly; 41. Receiving groove; 4a. First sliding member; 4a1. First receiving groove; 4a2. Through hole; 4a3. Wire groove; 5. First elastic element; 6. Skateboard; 7. Second elastic element; 8. First traction component; 9. First knob; 91. Operating section; A1, Second sliding member; A11, Second receiving groove; A12, Third receiving groove; A13, First through groove; A131, First slot; A132, Second slot; A133, First partition; A134, Second partition; A135, Third partition; A136, Sixth wall surface; A1361, First groove; A137, Seventh wall surface; A1371, Second groove; A2, First board; A3, the second support board; A4. Third elastic element; A5. Rotating assembly; A51. Second knob; A511. Tooth; A52. Second traction component; A53. Rotating gear; A54. Clamping component; A55. Fourth elastic component; A56. Third traction component; 200. Items to be inspected; 300. Reference test piece; 1000, Detection device; 1001, Detection component; 10011, First insertion hole; 1002, Transition component; 10021, Insertion surface; 100211, Second insertion hole; 10022, Transition surface; 1003, Second conductive pin; 10023, Transition surface; 100231, Third insertion hole. Detailed Implementation

[0019] To facilitate understanding of the present invention, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected to" another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this specification are for illustrative purposes only.

[0020] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the invention. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0021] This application provides a test fixture 100; please refer to [link / reference]. Figure 1 and Figure 2The test fixture 100 includes a main body 1 and a plurality of first conductive pins 2. The main body 1 is used to carry the first conductive pins 2, the device under test 200, and the reference test device 300. The main body 1 is provided with mutually isolated first contact areas 11 and second contact areas 12. The first contact areas 11 are used to electrically connect to the device under test 200, and the second contact areas 12 are used to electrically connect to the reference test device 300 or another device under test 200. Further, a plurality of contact portions 13 are provided in both the first contact areas 11 and the second contact areas 12. The contact portions 13 located in the first contact areas 11 are used to connect to the device under test. The contacts of 200, the contact portion 13 located in the second contact area 12, are used to connect the contacts of the reference detection element 300 or another detection element 200; a plurality of first conductive pins 2 are insulatedly embedded in the main body 1 to ensure that the first conductive pins 2 do not form a short circuit contact that affects the detection accuracy. One end of the first conductive pin 2 is connected to the contact portion 13 (including the contact portion 13 of the first contact area 11 and the contact portion 13 of the second contact area 12), and the other end of the first conductive pin 2 extends out of the outer surface of the main body 1 to form a detection area 21. The detection area 21 is used to connect the external detection component 1001. The above structure uses several first conductive pins 2 to extend the contacts of both the test piece 200 and the reference test piece 300 to the outside of the main body 1. This eliminates the need for users to perform jumper wire operations when testing the test piece 200. Users only need to test the test area 21 formed by the protruding first conductive pins 2 from the outer surface of the main body 1, improving the convenience of testing. Furthermore, when the contact portion 13 of the second contact area 12 is electrically connected to the reference test piece 300, the presence of the first contact area 11 and the second contact area 12 allows users to use the test clip... When the test fixture 100 is used, the reference test piece 300 located in the second contact area 12 can be directly compared with the test piece 200 located in the first contact area 11, thereby quickly confirming whether the test piece 200 is functioning properly. When the contact part 13 of the second contact area 12 is electrically connected to another test piece 200, the existence of the first contact area 11 and the second contact area 12 allows the user to increase the number of test pieces 200 that the test fixture 100 can detect when using the test fixture 100, thereby improving the detection efficiency of the test fixture 100.

[0022] Understandably, the positions of the first contact area 11 and the second contact area 12 can be adjacent or opposite, depending on the available testing space of the actual test fixture 100 and the testing tools used. When the first contact area 11 and the second contact area 12 are adjacent, they are located on the same surface of the body 1; when they are opposite, they are located on two opposite surfaces of the body 1.

[0023] For example, in this application, the first contact area 11 and the second contact area 12 are located on two opposite surfaces of the body 1 to improve the integration of the test fixture 100. For details, please refer to [link to relevant documentation]. Figure 1 and Figure 2 The main body 1 includes a first wall 1a and a second wall 1b opposite to each other. The first contact area 11 is located on the first wall 1a, and the second contact area 12 is located on the second wall 1b. The other end of the first conductive pin 2 extends from the periphery of the second contact area 12. The portion of the first conductive pin 2 extending from the periphery of the second contact area 12 is electrically connected to the detection component 1001. The main body 1 and the detection component 1001 together clamp the reference detection component 300 or another component 200 to be detected.

[0024] It is understandable that the way the reference detection component 300 and the other test component 200 are fixed in the second contact area 12 is not limited to the above-mentioned method of being clamped and fixed by the main body 1 and the detection component 1001. Other methods include, but are not limited to, snap-fit ​​fixing, clamping plate pressing fixing, etc.

[0025] In some embodiments, please refer to Figure 1 The main body 1 is provided with a first mounting groove 14, and a first contact area 11 is located at the bottom of the first mounting groove 14. The part to be tested 200 is housed in the first mounting groove 14, and the groove wall of the first mounting groove 14 limits the part to be tested 200, preventing unexpected displacement of the part to be tested 200 from affecting the test. The further test fixture 100 includes a fixing component 3, which is movably disposed on the main body 1 and is used to clamp the part to be tested 200 together with the main body 1. The fixing component 3 and the groove wall of the mounting groove cooperate to limit the part to be tested 200, preventing unexpected displacement of the part to be tested 200 during the test, thereby preventing the test accuracy and test efficiency from being affected.

[0026] Understandably, the main body 1 can also be provided with a second mounting groove, which is located on the second wall surface 1b mentioned above. The second contact area 12 is located at the bottom of the second mounting groove. The reference detection element 300 or another detection element 200 is accommodated in the second mounting groove. The groove wall of the second mounting groove and the pressing of the detection component 1001 on the reference detection element 300 or the other detection element 200 together achieve common limiting of the reference detection element 300 or the other detection element 200, so as to avoid the reference detection element 300 or the other detection element 200 from undergoing unexpected displacement.

[0027] It should be noted that the main body 1 may not have a second mounting slot, but instead a third mounting slot (not shown) may be provided on the detection component 1001. The opening of the third mounting slot corresponds to the second contact area 12, so that when the test fixture 100 is assembled with the detection component 1001, a portion of the reference detection piece 300 or another piece to be tested 200 can be accommodated in the third mounting slot. Thus, the reference detection piece 300 or another piece to be tested 200 is limited by the joint action of the groove wall of the third mounting slot and the main body 1, so as to avoid the reference detection piece 300 or the other piece to be tested 200 from being displaced unexpectedly.

[0028] In some embodiments, please refer to Figure 1 The fixing component 3 includes a pressure plate 31 and a snap-fit ​​component 32. One end of the pressure plate 31 is rotatably disposed on one side of the first contact area 11, and the snap-fit ​​component 32 is rotatably disposed on the other end of the pressure plate 31. The snap-fit ​​component 32 can reciprocate between a preset first position and a preset second position. When the snap-fit ​​component 32 is in the preset first position, the snap-fit ​​component 32 is locked to the main body 1, and the pressure plate 31 covers the first mounting groove 14 and abuts against the test piece 200 so that the pressure plate 31 presses the test piece 200 tightly, so that when the user tests the test piece 200, the contact point of the test piece 200 can maintain a stable electrical connection with the contact part 13 in the first contact area 11. When the snap-fit ​​component 32 is in the preset second position, the snap-fit ​​component 32 is unlocked from the main body 1 so that the user can release the test piece 200, so that the user can replace or remove the test piece 200.

[0029] In some embodiments, please refer to Figure 1 The pressure plate 31 includes a plate body 311 and a rotating part 312. One end of the plate body 311 rotates to one side of the first contact area 11, and the snap-fit ​​part 32 is rotatably disposed at the other end of the plate body 311. The plate body 311 is provided with a rotating hole 3111. When the plate body 311 covers the opening of the first mounting groove 14, the rotating hole 3111 communicates with the first mounting groove 14. The rotating part 312 is screwed into the rotating hole 3111, and one end of the rotating part 312 can extend into the first mounting groove 14 as the screwing depth increases, so that the rotating part 312 can press the test piece 200 located in the first mounting groove 14, thereby improving the stability of the electrical connection between the contact point of the test piece 200 and the contact part 13 in the first detection area 21. Furthermore, the depth of the screwing part extending into the first mounting groove 14 is adjustable, thereby enabling the test fixture 100 to adapt to test pieces 200 of different thicknesses and improving the applicability of the test fixture 100.

[0030] Understandably, the method of fixing the test piece 200 is not limited to fixing it by relying on the rotating pressure plate 31 and the snap-fit ​​part 32. Other methods include, but are not limited to, using a drawer-like pull-out structure, snap-fit ​​fixing to the first mounting groove 14, pull-out or magnetic cover plates, etc.

[0031] The test piece 200, the reference test piece 300, or another test piece 200 are not limited to being placed on the outer surface of the main body 1. Alternatively, part or all of the test piece 200 and the reference test piece 300, or another test piece 200, can be placed inside the main body 1 to improve the space utilization of the test fixture 100 and thus enhance its integration. Furthermore, to achieve the installation and fixation of the test piece 200 and / or the reference test piece 300 or another test piece 200, the available methods include, but are not limited to, a combination of one or more of the following: a pull-out disassembly method, component clamping, or fixing with the fixing component 3. For example, a pull-out disassembly method, a pull-out method combined with component clamping, or a pull-out method combined with fixing with the fixing component 3.

[0032] For example, in some embodiments, the test piece 200 and / or the reference test piece 300 or another test piece 200 is disassembled and assembled using a pull-out method. For this method, please refer to [link / reference]. Figure 3 , Figure 4 and Figure 5 The main body 1 is provided with a sliding cavity 15. The first contact area 11 and / or the second contact area 12 mentioned above are both located on the inner wall of the sliding cavity 15. The test fixture 100 also includes a sliding component 4. The sliding component 4 is slidably disposed in the sliding cavity 15. The sliding component 4 is provided with a receiving groove 41. The test piece 200 and / or the reference test piece 300 or another test piece 200 is received in the receiving groove 41. The sliding component 4 is used to change the contact or separation between the test piece 200 and the first contact area 11, and / or change the contact or separation between the reference test piece 300 or another test piece 200 and the second contact area 12. A plurality of first conductive pins 2 are insulatedly embedded in the main body 1. One end of the first conductive pin 2 is connected to the contact portion 13 (including the contact portion 13 of the first contact area 11 and the contact portion 13 of the second contact area 12). The other end of the first conductive pin 2 extends out of the outer surface of the main body 1 to form a detection area 21. The detection area 21 is used to connect to the external detection component 1001. When the sliding assembly 4 is housed within the sliding cavity 15, the first contact area 11 and / or the second contact area 12 both correspond to the receiving groove 41, so that the contacts of the test piece 200 housed in the receiving groove 41 can be electrically connected to the contact portion 13 in the first contact area 11, and / or the contacts of the reference test piece 300 or another test piece 200 housed in the mounting groove can be electrically connected to the contact portion 13 in the second contact area 12; when the sliding assembly 4 slides out of the sliding cavity 15, the mounting groove is exposed to the external environment, facilitating the placement and removal of the test piece 200 and / or the reference test piece 300 or another test piece 200. This structural design improves the integration of the test fixture 100 and facilitates the multi-layer stacking arrangement of the test fixture 100.

[0033] Understandably, the height of the cavity opening of the sliding cavity 15 needs to be greater than or equal to the overall thickness of the sliding assembly 4 after the test piece 200 and / or the reference test piece 300 or another test piece 200 are housed in the mounting groove.

[0034] It should be noted that the number of receiving slots 41 includes, but is not limited to, positive integers greater than or equal to one. When there is one receiving slot 41, the receiving slot 41 is used to accommodate the test piece 200 or the reference test piece 300. When there are two receiving slots 41, the two receiving slots 41 correspond to the first contact area 11 and the second contact area 12, respectively. That is, one receiving slot 41 corresponds to the first contact area 11, and the other receiving slot 41 corresponds to the second contact area 12.

[0035] Understandably, the sliding component 4 can slide into the sliding cavity 15 in ways including but not limited to: manual pushing, power pushing provided by the elastic element, and pushing by the electromechanical structure.

[0036] For ease of understanding, the second contact area 12 described below is only for placing the reference test piece 300. Of course, the second contact area 12 is also applicable for placing another test piece 200.

[0037] For example, in this application, the sliding assembly 4 is forced into the sliding cavity 15 by the elastic tensile force provided by the elastic element. Please refer to [link to relevant documentation]. Figure 4 and Figure 5 The test fixture 100 also includes a first elastic element 5. Along the sliding direction of the sliding component 4, one end of the first elastic element 5 is disposed on the inner wall of the sliding cavity 15, and the other end of the first elastic element 5 is disposed on the sliding component 4. When the sliding component 4 is in the preset third position, the first elastic element 5 is in a natural state. At this time, the sliding component 4 can be pulled out of the sliding cavity 15 by a human hand or an external instrument. During the process of the sliding component 4 being pulled out of the sliding cavity 15, the first elastic element 5 is gradually stretched, thereby generating a force that drives the sliding component 4 to automatically return to its original position. When the sliding component 4 is in the preset fourth position, the first elastic element 5 is in an elastically stretched state. At this time, the sliding component 4 is completely exposed to the external environment. Users can disassemble and install the test piece 200 and the reference test piece 300. At this time, the force generated by the first elastic element 5 on the sliding component 4 to drive it to automatically return to its original position reaches its maximum. After the human hand or external instrument is removed, the sliding component 4 can automatically return to its original position. Users do not need to push the sliding component 4 into the sliding cavity 15 separately, thus improving the user experience.

[0038] Understandably, when using a pull-out clamping method or a pull-out fixing method with fixing component 3, the first contact area 11 is located on the inner wall of the sliding cavity 15 and the second contact area 12 is located on the outer surface of the main body 1, or the second contact area 12 is located on the inner wall of the sliding cavity 15 and the first contact area 11 is located on the outer surface of the main body 1. For example, when the first contact area 11 is located on the inner wall of the sliding cavity 15 and the second contact area 12 is located on the outer surface of the main body 1, the first contact area 11 corresponds to the receiving groove 41, the test piece 200 is received in the receiving groove 41, and the reference test piece 300 is fixed by clamping component or by fixing component 3. When the sliding component 4 is received in the sliding cavity 15, the contact point of the test piece 200 is electrically connected to the contact portion 13 in the first contact area 11. Moving the sliding component 4 changes the contact between the test piece 200 and the first contact area 11. Separation; or, when the second contact area 12 is located on the inner wall of the sliding cavity 15 and the first contact area 11 is located on the outer surface of the main body 1, the reference detection element 300 is housed in the receiving groove 41, and the test element 200 is fixed by the component clamp or by the fixing assembly 3. When the sliding assembly 4 is housed in the sliding cavity 15, the contact of the reference detection element 300 is electrically connected to the contact portion 13 in the second contact area 12. Moving the sliding assembly 4 changes the contact or separation between the contact of the reference detection element 300 and the contact portion 13 in the second contact area 12.

[0039] For example, please refer to Figure 4 and Figure 5 The test fixture 100 adopts a pull-out method combined with component clamping, and the test piece 200 is housed in the receiving groove 41. The reference test piece 300 is clamped by the main body 1 and the components. Specifically, the second contact area 12 of the main body 1 is located on the second wall surface 1b mentioned above. When the test fixture 100 is installed on the test assembly 1001, the second contact area 12 of the second wall surface 1b and the test assembly 1001 jointly clamp and fix the reference assembly.

[0040] Understandably, when using a pull-out method combined with component clamping, the contact point of the component to be tested 200 can be oriented towards either the first wall surface 1a or the second wall surface 1b. For details, please refer to... Figure 4 and Figure 5 The sliding cavity 15 includes a first bottom wall 151 and a first top wall 152, which are opposite to each other. When the first contact area 11 is located on the first bottom wall 151, the contact point of the test piece 200 faces the first wall surface 1a; or when the first contact area 11 is located on the first top wall 152, the contact point of the test piece 200 faces the second wall surface 1b.

[0041] For example, in some embodiments, the contact of the object to be detected 200 is oriented toward the first bottom wall 151; see [link to relevant documentation]. Figure 4 and Figure 5 The sliding component 4 includes a first sliding member 4a, which is provided with a first receiving groove 4a1 (i.e., referring to the case where the number of the above-mentioned mounting grooves is one). The test piece 200 is received in the first receiving groove 4a1. The bottom of the first receiving groove 4a1 is provided with a plurality of through holes 4a2. Each through hole 4a2 corresponds to a contact portion 13 of a first contact area 11. The contact of the test piece 200 passes through the through hole 4a2 and is electrically connected to the contact portion 13 of the first contact area 11. That is, when the first sliding member 4a is received in the sliding cavity 15, the contact of the test piece 200 passes through the through hole 4a2 and is electrically connected to the contact portion 13 of the first contact area 11. When the first sliding member 4a slides out of the sliding cavity 15, the electrical connection between the contact of the test piece 200 and the contact portion 13 of the first contact area 11 is broken.

[0042] Furthermore, to ensure the stability of the electrical connection between the contact of the component under test 200 and the contact portion 13 of the first contact area 11 when the first sliding member 4a is housed within the sliding cavity 15, and to reduce wear on the contact of the component under test 200, a slidable sliding plate 6 is provided on the inner wall of the sliding cavity 15 to hold the component under test 200. Specifically, please refer to... Figure 4 and Figure 5Along the direction from the first top wall 152 toward the first bottom wall 151, the first top wall 152 extends with multiple sliding walls 153, which together form a groove 1531. The test fixture 100 includes a sliding plate 6, a second elastic member 7, and a first traction member 8. The sliding plate 6 is slidably disposed in the groove 1531. The second elastic member 7 is elastically compressed between the sliding plate 6 and the bottom of the groove 1531, so that the second elastic member 7 can provide an elastic force to force the sliding plate 6 to tend to move away from the first top wall 152. One end of the first traction member 8 is fixed to the first sliding member 4a, and the other end of the first traction member 8 is fixed to the side of the sliding plate 6 facing the first traction member 8. When the first sliding member 4a is in a preset third position (i.e., the aforementioned sliding component 4 slides out of the sliding cavity 15), the first sliding member 4a drives the first traction member 8 to tighten, thereby causing the sliding plate 6 to compress the second elastic member 7, thus causing the sliding plate to... The force applied to the test piece 200 disappears, allowing the first sliding member 4a to easily slide out of the slide cavity 15 and move to the preset fourth position (i.e., when the aforementioned sliding component 4 is housed in the slide cavity 15). When the first sliding member 4a is in the preset fourth position, the first sliding member 4a causes the first traction member 8 to relax, and the second elastic member 7 pushes the slide plate 6 to hold the test piece 200. The force provided by the second elastic member 7, which forces the slide plate 6 to move away from the first top wall 152, enables the contact point of the test piece 200 to pass through the through hole 4a2 and be stably electrically connected to the contact portion 13 of the first contact area 11, ensuring the accuracy of the test fixture 100 when performing testing with the testing component 1001. This structural design also creates a "surface-to-surface" static friction between the slide plate 6 and the test piece 200, achieving a self-locking effect for the first sliding member 4a.

[0043] In some embodiments, please refer to Figure 4 and Figure 5 The sliding component 4 includes a first knob 9, which is rotatably mounted on a first sliding member 4a. The first sliding member 4a is provided with a wire groove 4a3, which is located on the side wall of the first sliding member 4a. The other end of the first traction member 8 passes through the wire groove 4a3 and is wound around the first knob 9. The first knob 9 adjusts the tension and relaxation of the first traction member 8 by changing the direction of rotation. For example, when the first knob 9 rotates clockwise, the first traction member 8 is tensioned, thereby driving the slide plate 6 to move towards the direction close to the first top wall 152. The contact between the slide plate 6 and the test piece 200 disappears. At this time, the first sliding member 4a can be slid from the preset fourth position to the preset third position. After the first sliding member 4a slides from the preset third position to the preset fourth position, the user operates the first knob 9 to rotate it counterclockwise, thereby relaxing the first traction member 8. Under the combined action of the elastic force of the second elastic member 7 and the weight of the slide plate 6, it is forced to press against the test piece 200.

[0044] It should be noted that the other end of the first traction member 8 needs to be wound with a certain length to ensure that the first sliding member 4a has sufficient slack to allow for partial following movement of the first traction member 8 during the process of sliding from the preset fourth position to the preset third position. Of course, the first traction member 8 can also be a rope made of elastic material. When the first sliding member 4a slides from the preset fourth position to the preset third position, it causes the first traction member 8 to tighten, thereby causing the slide plate 6 to move towards the direction close to the first top wall 152. After the first sliding member 4a slides from the preset third position to the preset fourth position, the first traction member 8 is relaxed, and the slide plate 6 is forced to press against the test piece 200 under the combined action of the elastic force of the second elastic member 7 and the weight of the slide plate 6.

[0045] Furthermore, there are two first traction members 8, and correspondingly two wire grooves 4a3. The two wire grooves 4a3 are located on both sides of the first sliding member 4a. One end of one first traction member 8 is fixed to the slide plate 6, and the other end of the first traction member 8 passes through one wire groove 4a3 and is wound around the first knob 9. One end of the other first traction member 8 is fixed to the slide plate 6, and the other end of the first traction member 8 passes through the other wire groove 4a3 and is wound around the first knob 9. The presence of two first traction members 8 can balance the forces acting on the first sliding member 4a, improving the smoothness of the first sliding member 4a during sliding.

[0046] When the test piece 200 and the reference test piece 300 are disassembled and assembled using only a pull-out method, the first contact area 11 and the second contact area 12 are both located on the inner wall of the sliding cavity 15, and there are two receiving grooves 41. The opening of one receiving groove 41 corresponds to the first contact area 11, and the opening of the other receiving groove 41 corresponds to the second contact area 12. The test piece 200 and the reference test piece 300 are both housed in the receiving grooves 41. When the sliding assembly 4 is housed in the sliding cavity 15, the contact of the test piece 200 is electrically connected to the contact portion 13 in the first contact area 11, and the contact of the reference test piece 300 is electrically connected to the contact portion 13 in the second contact area 12. Moving the sliding assembly 4 changes the contact or separation between the test piece 200 and the first contact area 11, and simultaneously changes the contact or separation between the contact of the reference test piece 300 and the contact portion 13 in the second contact area 12.

[0047] For example, please refer to Figure 6 and Figure 7The test fixture 100 uses a pull-out method to assemble and disassemble the test piece 200 and the reference test piece 300. The sliding cavity 15 includes a fourth wall 154 (i.e., the first top wall 152 mentioned above) and a fifth wall 155 (i.e., the second top wall mentioned above). The first contact area 11 is located on the fourth wall 154, and the second contact area 12 is located on the fifth wall 155. The sliding assembly 4 also includes a second sliding member A1, which is slidably disposed in the sliding cavity 15. The second sliding member A1 can reciprocate between a preset fifth position and a preset sixth position. The second sliding member A1 is provided with a second receiving groove A11 and a third receiving groove A12 (i.e., the second receiving groove A11 and the third receiving groove A12 refer to the number of receiving grooves 41 mentioned above, which is two). The test piece 200 is received in the second receiving groove A11, and the reference test piece 300 is received in the third receiving groove A12. When the second sliding member A1 is in the preset fifth position, The second sliding member A1 is housed in the sliding cavity 15, and the second receiving groove A11 corresponds to the first contact area 11. The contact of the test piece 200 located in the second receiving groove A11 is electrically connected to the contact portion 13 of the first contact area 11. The third receiving groove A12 corresponds to the second contact area 12, and the contact of the reference test piece 300 located in the third receiving groove A12 is electrically connected to the contact portion 13 of the second contact area 12. When the second sliding member A1 is in the preset sixth position, the second sliding member A1 slides out of the sliding cavity 15, and the second receiving groove A11 and the third receiving groove A12 are exposed to the external environment. The test piece 200 and the reference test piece 300 can be disassembled and assembled from the second receiving groove A11 and the third receiving groove A12, respectively, which further improves the integration of the test fixture 100. Users only need to pull and tuck to complete the disassembly and assembly of the test piece 200 and the reference test piece 300, which also improves the convenience of user operation.

[0048] It should be noted that the preset third position and the aforementioned preset fifth position both refer to the sliding component 4 sliding out of the sliding cavity 15, and the preset fourth position and preset sixth position both refer to the sliding component 4 being housed in the sliding cavity 15. This is only for the purpose of easy distinction and understanding.

[0049] For further details, please refer to Figure 8The second sliding member A1 is provided with a first through groove A13, which has a first opening A131 and a second opening A132. The sliding assembly 4 also includes a first support plate A2, a second support plate A3, and a third elastic member A4. The first support plate A2 and the second support plate A3 are spaced apart and movably disposed in the first through groove A13 to divide the first through groove A13 into a first partition A133, a second partition A134, and a third partition A135 with variable volumes. The first support plate A2 is close to the first opening A131, and the second support plate A3 is close to the second opening A13. 2. The area between the first support plate A2 and the first slot A131 is defined as the first partition A133 (i.e., referring to the aforementioned second receiving slot A11). The interval area between the first support plate A2 and the second support plate A3 is defined as the second partition A134. The area between the second support plate A3 and the second slot A132 is defined as the third partition A135 (i.e., referring to the aforementioned third receiving slot A12). The third elastic member A4 is disposed in the second partition A134. The third elastic member A4 is elastically compressed by the first support plate A2 and the second support plate A3. The third elastic member A4 is... The elastic potential energy accumulated after compression tends to drive the first support plate A2 and the second support plate A3 to move in opposite directions. The test fixture 100 also includes a rotating component A5, which is movably mounted on the sliding component 4. The rotating component A5 is used to control the compression and extension of the third elastic element A4 to drive the first support plate A2 / or the second support plate A3 to move towards or away from each other. When the first support plate A2 and / or the second support plate A3 move towards each other, the space of the second partition A134 is compressed, and the first partition A133 and / or the third partition A135 have sufficient space to place the object to be tested. Test piece 200 and reference test piece 300; when the first support plate A2 and / or the second support plate A3 move in opposite directions, the space of the second partition A134 is expanded, and the space of the first partition A133 and / or the third partition A135 is compressed, thereby discharging a portion of the test piece 200 from the first partition A133, and / or discharging a portion of the reference test piece 300 from the third partition A135, which facilitates the user's disassembly and assembly of the test piece 200 and the reference test piece 300, enriching the functionality of the test fixture 100 while ensuring the integration of the test fixture 100.

[0050] It should be noted that the rotating component A5 is used to control the compression and extension of the third elastic element A4 to drive the first support plate A2 and / or the second support plate A3 to move towards or away from each other, representing the following three modes: When both the first support plate A2 and the second support plate A3 can move, the rotating component A5 controls the compression and extension of the third elastic element A4 to drive the first support plate A2 and the second support plate A3 to move towards or away from each other; when only the first support plate A2 moves, the rotating component A5 controls the compression and extension of the third elastic element A4 to drive the first support plate A2 to move towards or away from the second support plate A3; when only the second support plate A3 can move, the rotating component A5 controls the compression and extension of the third elastic element A4 to drive the second support plate A3 to move towards or away from the first support plate A2.

[0051] For further details, please refer to Figures 6 to 8 The aforementioned rotating assembly A5 includes a second knob A51 and a second traction member A52. The second knob A51 is rotatably mounted on the second sliding member A1, and a portion of the second knob A51 extends into the second partition A134. One end of the second traction member A52 is mounted on the first support plate A2 and the second support plate A3, and the other end of the second traction member A52 is fixed to the second knob A51. The second knob A51 adjusts the length of the second traction member A52 around the second knob A51 by rotation, and cooperates with the third elastic member A4 to control the first support plate A2 and / or the second support plate A3 to move towards or away from each other. For example, when the second slider A1 is in the preset fifth position, the second knob A51 is driven to rotate clockwise. The second traction member A52 is tightened, causing the first support plate A2 and / or the second support plate A3 to slide towards each other in the first through groove A13. The space of the second partition A134 is compressed, thereby squeezing the third elastic member A4. This causes the third elastic member A4 to accumulate elastic potential energy, and the space of the first partition A133 and / or the third partition A135 is expanded. The electrical connection between the contact of the test piece 200 and the contact portion 13 of the first contact area 11 is disconnected, and the electrical connection between the contact of the reference test piece 300 and the contact portion 13 of the second contact area 12 is disconnected, facilitating the second The slider A1 moves from the preset fifth position to the preset sixth position; when the second slider A1 is in the preset sixth position, the second knob A51 is driven to rotate counterclockwise, the second traction member A52 is released, and the elastic potential energy accumulated by the third elastic member A4 drives the first support plate A2 and / or the second support plate A3 to slide opposite each other in the first through groove A13, the space of the second partition A134 is expanded, and the space of the first partition A133 and the third partition A135 is compressed. A part of the test piece 200 extends out of the first slot A131, and a part of the reference test piece 300 extends out of the second slot A132, which facilitates the disassembly and assembly of the test piece 200 and the reference test piece 300.

[0052] It should be noted that the reference detection component 300 is received from the second slot A132 into the third partition A135 in the following ways, including but not limited to: magnetic attraction, snap-fit ​​fixation, clamp fixation, etc.

[0053] For example, in some embodiments, the reference detection component 300 is clamped and fixed, and both the first support plate A2 and the second support plate A3 are movable. For details, please refer to [link / reference]. Figure 6The rotating assembly A5 also includes a rotating gear A53, a clamping member A54, a fourth elastic member A55, and a third traction member A56. The second knob A51 extends into a portion of the second partition A134 and is partially provided with teeth A511. The clamping member A54 is disposed in the first through groove A13, specifically located on the inner wall of the third partition A135. The clamping member A54 is used to clamp the reference detection member 300. The fourth elastic member A55 is elastically compressed between the inner wall of the first through groove A13 and the clamping member A54. The elastic potential energy accumulated by the fourth elastic member A55 drives the clamping member A54 to move away from the first through groove A13. The movement trend of the inner wall of 3 is as follows: one end of the third traction member A56 is fixed to the clamping member A54, and the other end of the third traction member A56 is wound around the rotating gear A53. The rotating gear A53 meshes with the teeth A511. The second knob A51 controls the length of the third traction member A56 wound around the rotating gear A53 and the length of the second traction member A52 wound around the second knob A51 by rotating. It also works with the third elastic member A4 to control the movement of the first support plate A2 and the second support plate towards or away from each other, while working with the fourth elastic member A55 to control the movement of the clamping member A54 toward or away from the inner wall of the first through groove A13.Specifically, when the second knob A51 is rotated clockwise, it drives the rotating gear A53 to rotate counterclockwise. Simultaneously, the second knob A51, through the second traction member A52, causes the first support plate A2 and the second support plate A3 to move in opposite directions. At the same time, the second knob A51 causes the third traction member A56 to tighten, thereby causing the clamping member A54 to move towards the inner wall of the first through groove A13 and compress the fourth elastic member A55. At this time, the clamping member A54 disengages from the reference detection member 300, and the reference detection... The measuring piece 300 can disengage from the second slot A132 under its own weight; when the second knob A51 is rotated clockwise, it drives the rotating gear A53 to rotate counterclockwise. Simultaneously, the second knob A51, through the second traction member A52, drives the first support plate A2 and the second support plate A3 to slide towards each other, while the rotating gear A53 drives the third traction member A56 to relax. The fourth elastic member A55 drives the clamping member A54 to move away from the inner wall of the first through slot A13 and abut against the reference detection. When the reference test piece 300 is clamped by the clamping piece A54, it is fixed within the expanded third partition A135, thus completing the installation of the reference test piece 300. When the second knob A51 is rotated counterclockwise, it drives the rotating gear A53 to rotate clockwise. While the second knob A51 relaxes the second traction piece A52, the third elastic piece A4 drives the first support plate A2 and the second support plate A3 to move in opposite directions. At the same time, the rotating gear A53 drives the third traction piece A56 to tighten and causes the clamping piece A54 to move towards the inner wall of the first barrel and disengage from the reference test piece 300. Under the combined action of the gravity of the reference test piece 300 and the thrust of the third elastic piece A4 driving the second support plate A3 away from the first support plate A2, the reference test piece 300 is automatically detached. This ensures the integration of the test fixture 100 while improving the efficiency of user assembly and disassembly of the reference test piece 300 and enhancing the user experience.

[0054] It should be noted that the second knob A51 tightens or loosens the second traction component A52 and the third traction component A56 tightens or loosens simultaneously with the rotation of the gear A53, so that the user can install and fix the test piece 200 and the reference test piece 300 with a single rotation of the second knob A51.

[0055] It is understandable that the number of rotating gear A53, clamping member A54, fourth elastic member A55 and third traction member A56 are all equal and are all positive integers greater than or equal to one.

[0056] For example, in this embodiment, please refer to Figure 6The number of rotating gears A53, clamping member A54, fourth elastic member A55, and third traction member A56 are all two. The two rotating gears A53 are rotatably connected to both sides of the second knob A51. Due to the meshing characteristic of rotating gears A53 and second knob A51, the two rotating gears A53 rotate in the same direction when rotatably connected to both sides of the second knob A51. The first through groove A13 includes a sixth wall surface A136 and a seventh wall surface A137. A fourth elastic member A55 is fixed between the sixth wall surface A136 and a clamping member A54. One end of a third traction member A56 is fixed to a clamping member A54 and the other end of a third traction member A56 is wound around a rotating gear A53. Another fourth elastic member A55 is fixed between the seventh wall surface A137 and another clamping member A54 and the other end of another third traction member A56 is wound around another rotating gear A53. The two clamping members A54 arranged in this symmetrical manner can improve the stability of clamping and fixing the reference detection member 300, and also ensure that the force applied by the two clamping members A54 on both sides of the reference detection member 300 is the same. This can reduce the probability of the reference detection member 300 deflecting when it is detached from the third partition A135, reduce the probability of the reference detection member 300 deflecting unexpectedly during the removal process, and improve the protection of the reference detection member 300 when disassembling it.

[0057] In some embodiments, please refer to Figure 9 , Figure 10 and Figure 11 The sixth wall surface A136 is provided with a first groove A1361, in which a clamping member A54 is received and a fourth elastic member A55 is compressed between the bottom of the first groove A1361 and the clamping member A54. The seventh wall surface A137 is provided with a second groove A1371, in which another clamping member A54 is received and another fourth elastic member A55 is compressed between the bottom of the second groove A1371 and the clamping member A54. This structure allows the two clamping members A54 to partially extend from the first groove A1361 and the second groove A1371 respectively when clamping the reference detection member 300, and to clamp both sides of the reference detection member 300 respectively. When disassembling the reference detection member 300, the two clamping members A54 can be respectively received within the first groove A1361 and the second groove A1371. The volume of the fourth elastic element A55 and the clamping element A54 is reduced, the probability of the fourth elastic element A55 and the clamping element A54 colliding with foreign objects (referring to various parts of the non-reference test element 300) is reduced, the protective performance of the test fixture 100 is improved, and the integration of the test fixture 100 is further improved.

[0058] In some embodiments, please refer to Figure 4The first knob 9 or the second knob A51 has an operating part 91 on the surface opposite to the main body 1. The operating part 91 has a flat plate-like structure, which is convenient for the user's fingers to pinch and improves the user's operation convenience.

[0059] It should be noted that the reference test piece 300 is a standard for users to visually compare with the test piece 200. Therefore, the reference test piece 300 needs to ensure its functional integrity and quality compliance. The test piece 200 and the reference test piece 300 include, but are not limited to, structures with pins or contacts, such as chips or products containing chip functionality. For example, in this application, the test piece 200 and the reference test piece 300 are preferably point power supplies.

[0060] The detection area 21 formed by the first conductive pin 2 extending out of the outer surface of the main body 1 can be a contact point protruding from the outer surface of the main body 1 or a probe structure protruding from the outer surface of the main body 1. For example, in this application, the detection area 21 is formed by a probe structure of the first conductive pin 2 extending out of the outer surface of the main body 1.

[0061] Understandably, the detection area 21 is designed to facilitate user detection operations, therefore the detection area 21 needs to have sufficient space for user operations.

[0062] In some embodiments, please refer to Figure 2 The other ends of several first conductive pins 2 surround the first contact area 11 or the second contact area 12 to form a detection area 21. In this way, the area of ​​the detection area 21 that can be operated by the user is significantly larger than the area enclosed by several contacts of the test piece 200. This method also improves the space utilization of the test fixture 100, eliminating the need to create a separate space on the test fixture 100 independent of the first contact area 11 and / or the second contact area 12 for the layout of the detection area 21, thus improving the integration of the test fixture 100.

[0063] In some embodiments, please refer to Figure 2The detection area 21 includes a first functional detection area 211 and a second functional detection area 212 surrounding the first contact area 11 or the second contact area 12. The first functional detection area 211 is further away from the first contact area 11 or the second contact area 12 than the second functional detection area 212. The first functional detection area 211 is used to connect the main functional area of ​​the device under test 200 (i.e., functions that require focused or high-frequency detection), and the second functional detection area 212 is used to connect the secondary functional area of ​​the device under test 200 (i.e., functions with lower detection frequency and requirements). Specifically, each contact on the device under test 200 corresponds to a different function. For example, when the component to be tested 200 is a point power supply, several contacts of the point power supply correspond to the input, output, control, and status functions of the point power supply. During the actual testing time, these functions can be divided into key testing functions and non-key testing functions according to actual needs. In order to facilitate the user's testing operation, in this application, the probes corresponding to the key testing functions are preferentially arranged in the first function testing area 211, while the remaining probes are arranged in the second function testing area 212. This partitioning layout strategy can make the user's operation more focused and convenient when testing functions with high failure rates or those that need to be evaluated in the later stage, thereby effectively improving testing efficiency and ease of use.

[0064] It should be noted that the specific functions of the test piece 200 and the corresponding information of the first function detection area 211 and the second function detection area 212 can be selected according to actual needs, and will not be listed here.

[0065] In other embodiments, please refer to Figure 12 The detection area 21 is located on a surface independent of the first surface where the first contact area 11 is located and the second surface where the second contact area 12 is located. Specifically, the main body 1 includes a first wall 1a, a second wall 1b, and a third wall 1c. The first wall 1a and the second wall 1b are opposite to each other, and the third wall 1c is perpendicular to the first wall 1a and the second wall 1b. The first contact area 11 is located on the first wall 1a, the second contact area 12 is located on the second wall 1b, and the first conductive pin 2 extends from the third wall 1c. The corresponding detection component 1001 or the transfer component 1002 for electrically connecting the test fixture 100 and the detection component 1001 is provided with conductive sockets for the test fixture to be electrically connected to the detection component 1001. Through this structural design, the test fixture 100 can be electrically connected side by side to the detection component 1001 or the transfer component 1002, so that the test fixture 100 can be adapted to the installation environment where it cannot be stacked, thus improving the applicability of the test fixture 100.

[0066] In some implementations, please refer to the following: Figure 3 and Figure 6The main body 1 is provided with a plurality of conductive slots 16. The conductive slots 16 are located on the surface opposite to the outer surface of the main body 1 where the other end of the first conductive pin 2 is exposed. The part of the first conductive pin 2 embedded in the main body 1 communicates with the external environment through the conductive slots 16. When multiple test fixtures 100 are stacked, the other end of the first conductive pin 2 of one test fixture 100 is inserted into the conductive slot 16 of another test fixture 100 and is electrically connected to the first conductive pin 2 of the other test fixture 100. This structural design allows multiple test fixtures 100 to be connected in parallel, enabling users to test multiple components 200 simultaneously, thus improving testing efficiency through parallel processing. When users test a component 200 using testing equipment (a testing device 1000 corresponding to the test fixture 100, a multimeter, an analyzer, etc.), a single operation is sufficient to power all the stacked test fixtures 100, send test commands, and read the response data of all components 200. This reduces manual operation time, saves channel resources on the testing equipment, and ensures consistency of test conditions, eliminates system errors, and improves data comparability. The stacked structure design gives the test fixtures 100 high system scalability and flexibility, allowing users to select the required number to stack, easily adapting to different testing needs at different production or R&D stages.

[0067] This application also provides an embodiment of a detection device 1000, please refer to [link / reference]. Figure 13 The detection device 1000 includes a detection component 1001 and multiple test fixtures 100 as described above. The detection component 1001 is provided with a plurality of first insertion holes 10011. The other ends of a plurality of first conductive pins 2 are inserted into the plurality of first insertion holes 10011 and then electrically connected to the detection component 1001. The detection component 1001 is used to detect the workpiece 200 to be tested on the test fixtures 100, thereby improving detection efficiency. Furthermore, the detection component 1001 can also be electrically connected to an external display device so that users can intuitively view the detection structure of the workpiece 200 to be tested.

[0068] It should be noted that the position and layout of the first insertion hole 10011 can be selected according to the actual needs of the test fixture 100, provided that it can correspond to the probes of the detection area 21. For example, when the test fixture 100 adopts a stackable structure (i.e., the detection area 21 surrounds the first contact area 11 or the second contact area 12), the number and layout of the first insertion holes 10011 are consistent with the number and layout of the probes protruding from the surface of the main body 1 of the test fixture 100 with a stackable structure; when the test fixture 100 adopts a side-by-side structure (i.e., the test fixture 100 with the other end of the first conductive pin 2 protruding from the third wall 1c), the first insertion holes 10011 constitute multiple areas corresponding to the probe layout of the third surface wall of the main body 1 of the test fixture 100.

[0069] In some embodiments, please refer to 13, the detection device 1000 includes a transfer member 1002 and a plurality of second conductive pins 1003. The plurality of second conductive pins 1003 are insulatedly embedded in the transfer member 1002. The transfer member 1002 includes a plurality of insertion surfaces 10021 and a transition surface 10022. The insertion surfaces 10021 are provided with a plurality of second insertion holes 100211. One end of the plurality of second conductive pins 1003 is located in the second insertion hole 100211, and the other end of the plurality of second conductive pins 1003 extends out from the transition surface 10022. The other end of the plurality of second conductive pins 1003 is used to insert and electrically connect to the detection assembly 1001. The first conductive pins 2 of the plurality of test fixtures 100 are inserted into the second insertion holes 100211 and electrically connected to the second conductive pins 1003.

[0070] It should be noted that the layout of the second insertion holes 100211 on the multiple insertion surfaces 10021 can be the same, for example, all of them can be adapted to the stackable structure of the test fixture 100 (i.e., the detection area 21 surrounds the first contact area 11 or the second contact area 12), so that the stackable structure of the test fixture 100 can be inserted into the multiple insertion surfaces 10021; the layout of the second insertion holes 100211 on the multiple insertion surfaces 10021 can be different, for example, the layout of the second insertion holes 100211 on one insertion surface 10021 is that of the stackable structure of the test fixture 100, and the layout of the second insertion holes 100211 on another insertion surface 10021 is that of the test fixture 100. The test fixture 100 has a side-by-side structure (i.e., the test fixture 100 with the other end of the first conductive pin 2 extending from the third wall surface 1c). Furthermore, the multiple insertion surfaces 10021 corresponding to the stackable test fixture 100 can be defined according to the assembly / disassembly method of the test piece 200 and the reference test piece 300. For example, a test fixture 100 that only uses a pull-out method to assemble / disassemble the test piece 200 and the reference test piece 300 can be placed on the same insertion surface 10021, while a test fixture 100 that uses a pull-out method to clamp either the test piece 200 or the reference test piece 300 can be placed on another insertion surface 10021. This method enhances the functionality and modularity of the testing device 1000, and this structural design gives the testing device 1000 excellent expandability and adaptability.

[0071] In some embodiments, please refer to Figure 13 The transfer component 1002 also includes a transfer surface 10023, which is opposite to the adapter surface 10022. The transfer surface 10023 is provided with a third insertion hole 100231. The third insertion hole 100231 is used for the insertion of the portion of the second conductive pin 1003 of another transfer component 1002 that extends out of the adapter surface 10022. A portion of the second conductive pin 1003 communicates with the outside through the third insertion hole 100231, so that when the portion of the second conductive pin 1003 of one transfer component 1002 that extends out of the adapter surface 10022 is inserted into the third insertion hole 100231 of another transfer component 1002, an electrical connection can be made, thereby improving the expandability of the detection device 1000.

[0072] This application provides a test fixture 100 and a testing device 1000. The test fixture 100 includes a main body 1 and a plurality of first conductive pins 2. The main body 1 is used to carry the first conductive pins 2, the component to be tested 200, and the reference testing component 300. The main body 1 is provided with mutually isolated first contact areas 11 and second contact areas 12. The first contact areas 11 are used to electrically connect to the component to be tested 200, and the second contact areas 12 are used to electrically connect to the reference testing component 300 or another component to be tested 200. Further, a plurality of contact portions 13 are provided in both the first contact area 11 and the second contact area 12. The contact portions 13 located in the first contact area 11 are... Part 13 is used to connect to the contacts of the test piece 200. The contact part 13 located in the second contact area 12 is used to connect to the contacts of the reference test piece 300 or another test piece 200. A plurality of first conductive pins 2 are insulatedly embedded in the main body 1 to ensure that there is no short circuit contact between the first conductive pins 2, which would affect the detection accuracy. One end of the first conductive pin 2 is connected to the contact part 13 (including the contact part 13 of the first contact area 11 and the contact part 13 of the second contact area 12), and the other end of the first conductive pin 2 extends out of the outer surface of the main body 1 to form the detection area 21. The detection area 21 is used to connect to the external detection component 1001. By setting the first conductive pin 2, the contacts of both the test piece 200 and the reference test piece 300 can be guided to the outside of the main body 1 by the first conductive pin 2, which facilitates subsequent testing by the user. Compared with the existing testing method using flying wires, the method of relying on the test fixture 100 in this application is faster and more convenient, improves the user experience, reduces the probability of incorrect contact connection, and improves the accuracy of testing.

[0073] It should be noted that while the preferred embodiments of the present invention are given in the specification and accompanying drawings, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are not intended to impose additional limitations on the content of the present invention; their purpose is to provide a more thorough and comprehensive understanding of the disclosure of the present invention. Furthermore, the above-described technical features can be combined with each other to form various embodiments not listed above, all of which are considered to be within the scope of the present invention specification. Moreover, those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. A test fixture, characterized in that, include: The main body is provided with a first contact area and a second contact area that are isolated from each other. The first contact area is used to electrically connect to the device under test, and the second contact area is used to electrically connect to a reference test device or another device under test. Both the first contact area and the second contact area are provided with a plurality of contact portions. The contact portions located in the first contact area are used to connect to the contacts of the test piece, and the contact portions located in the second contact area are used to connect to the contacts of the reference test piece or another test piece. A plurality of first conductive pins are insulatedly embedded in the body, one end of the first conductive pin is connected to the contact portion, and the other end of the first conductive pin extends out of the outer surface of the body to form a detection area, the detection area being used to connect to an external detection component.

2. The test fixture according to claim 1, characterized in that, The other end of the plurality of first conductive pins surrounds the first contact area or the second contact area to form the detection area.

3. The test fixture according to claim 1, characterized in that, The detection area includes a first functional detection area and a second functional detection area surrounding the first contact area or the second contact area. The first functional detection area is further away from the first contact area or the second contact area than the second functional detection area. The first functional detection area is used to connect the main functional area of ​​the device under test, and the second functional detection area is used to connect the secondary functional area of ​​the device under test.

4. The test fixture according to claim 1, characterized in that, The main body is provided with a plurality of conductive slots, the conductive slots being located on the surface opposite to the outer surface of the main body where the other end of the first conductive pin is exposed, and the portion of the first conductive pin embedded in the main body communicates with the external environment through the conductive slots. When multiple test fixtures are stacked, the other end of the first conductive pin of one test fixture is inserted into the conductive slot of another test fixture and electrically connected to the first conductive pin of the other test fixture.

5. The test fixture according to claim 2, characterized in that, The main body includes a first wall and a second wall opposite to each other. The first contact area is located on the first wall, and the second contact area is located on the second wall. The other end of the first conductive pin extends from the periphery of the second contact area. The portion of the first conductive pin extending from the periphery of the second contact area is electrically connected to the detection component. The main body and the detection component together clamp the reference detection piece or another piece to be detected.

6. The test fixture according to claim 5, characterized in that, The main body is provided with a first mounting groove, the first contact area is located at the bottom of the first mounting groove, and the component to be tested is housed in the first mounting groove. The test fixture includes a fixing component, which is movably disposed on the main body and is used to clamp the test piece together with the main body.

7. The test fixture according to claim 6, characterized in that, The fixing component includes a pressure plate and a snap-fit ​​component. One end of the pressure plate is rotatably disposed on one side of the first contact area, and the snap-fit ​​component is rotatably disposed on the other end of the pressure plate. The snap-fit ​​component can reciprocate between a preset first position and a preset second position. When the latching component is in the preset first position, the latching component locks with the main body to press the component to be tested; When the latch is in the preset second position, the latch is unlocked from the main body to release the item to be tested.

8. The test fixture according to claim 1, characterized in that, The main body includes a first wall, a second wall, and a third wall. The first wall and the second wall are opposite to each other, and the third wall is perpendicular to the first wall and the second wall. The first contact area is located on the first wall, the second contact area is located on the second wall, and the other end of the first conductive pin extends from the third wall.

9. A detection device, characterized in that, The device includes a detection component and a plurality of test fixtures as described in any one of claims 1-8. The detection component is provided with a plurality of first insertion holes, and the other ends of a plurality of first conductive pins are inserted into the plurality of first insertion holes and electrically connected to the detection component. The detection component is used to detect the test piece on the test fixture.

10. The detection device according to claim 9, characterized in that, The detection device includes a transfer component and a plurality of second conductive pins. The plurality of second conductive pins are insulated and embedded in the transfer component. The transfer component includes multiple insertion surfaces and transition surfaces. The transition surface is provided with a plurality of second insertion holes. One end of the plurality of second conductive pins is located in the second insertion hole, and the other end of the plurality of second conductive pins extends out from the transition surface. The other end of the plurality of second conductive pins is used to insert and electrically connect to the detection component. The first conductive pins of the plurality of test fixtures are inserted into the second insertion holes and electrically connected to the second conductive pins.

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