Integral summation type high-precision source measurement system and method

Abstract

The invention provides an integral summation type high-precision source measurement system and method, the source measurement system adopts discrete devices to build a power amplification module, the output can reach 100V and 1A, and the test requirements of high-power devices are met. A traditional source measurement system is poor in stability, a source measurement unit adopts a summation and integration structure, when a load suddenly changes, the system can be rapidly adjusted to a safe voltage / current value through a clamping circuit, an output value and a set value are kept consistent, the system stability is improved, the source measurement unit adopts a PXI 3U structure and can be inserted into a PXI case, and the system stability is improved. And a test system can be conveniently formed with other board cards. According to the technical scheme, the technical problems that in the prior art, a source measuring unit is not wide enough in output range, poor in system stability, large in size, poor in portability and not suitable for system integration are solved.

Description

Technical Field

[0001] This invention relates to the field of electronic measurement technology, and in particular to an integral summation type high-precision source measurement system and method. Background Technology

[0002] The source measurement unit (SMU) operates in a four-quadrant mode, capable of outputting voltage in both positive and negative directions as a constant voltage source, and current in both positive and negative directions as a constant current source. While providing precise voltage and current sources, it can also function as a voltage, current, and resistance meter, integrating the functions of both. SMUs are widely used in power semiconductor testing, optoelectronic device research, and transistor calibration. However, traditional SMUs suffer from limitations such as insufficient output range, poor system stability, large size, poor portability, and unsuitability for system integration. Summary of the Invention

[0003] This invention provides an integral summation-based high-precision source measurement system and method, which can solve the technical problems of traditional source measurement units, such as insufficient output range, poor system stability, large size, poor portability, and unsuitability for system integration.

[0004] According to one aspect of the present invention, an integral summation type high-precision source measurement system is provided. The system includes a host computer display module, a microcontroller control module, an error integration module, a power amplification module, and a measurement feedback module. The host computer display module sets current or voltage values ​​according to a set operating mode and controls the microcontroller control module via an SPI serial bus. The microcontroller control module outputs a setting signal. The measurement feedback module outputs a measurement feedback signal. The error integration module outputs an amplified error signal based on the setting signal and the measurement feedback signal. The power amplification module amplifies the error signal and outputs a measurement signal to the output terminal and the measurement feedback module. The measurement feedback module conditions the output measurement signal before sending it to the error integration module, thus achieving dynamic adjustment between the output measurement signal and the setting signal. The power amplification module adopts a complementary push-pull structure, using the same input signal to drive two complementary symmetrical transistors of different polarities to obtain two excitation signals of equal magnitude and opposite phase. The power amplification module includes PNP power transistors, NPN power transistors, NPN field-effect transistors, PNP field-effect transistors, and bipolar transistors. The input signal is initially amplified by the PNP and NPN power transistors. The PNP power transistor initially amplifies the positive half-cycle current signal, and the NPN power transistor initially amplifies the negative half-cycle current signal. The amplified signal is then switched according to the range, through the positive half-cycle voltage signal range switching of the NPN field-effect transistor and the negative half-cycle voltage signal range switching of the PNP field-effect transistor. Finally, the signal current is further amplified by the bipolar transistor to obtain the output signal. The integral summation type high-precision source measurement system is powered by the PXI backplane and adopts a PXI 3U structure that can be inserted into the PXI chassis.

[0005] Furthermore, the host computer display module is used to realize the selection of working mode, voltage range setting, current range setting, output voltage setting, output current setting, clamping voltage setting, clamping current setting, and return voltage and return current display. When the pressure measurement mode is selected, the voltage range selection, output voltage setting, clamping current setting and return voltage display are completed; when the current measurement mode is selected, the current range selection, output current setting, clamping voltage setting and return current display are completed.

[0006] Furthermore, the error integration module includes a selection switch, a follower, an error amplifier, an integrator, an upper clamping circuit, a lower clamping circuit, and a comparator. The selection switch is used to select whether the feedback voltage signal or the feedback current signal is connected to the circuit. The follower is used to increase the signal output impedance. The error amplifier is used to amplify the error between the setting signal and the output measurement feedback signal. The integrator is used to integrate the output signal of the error amplifier. The upper clamping circuit is used to clamp the upper limit value, the lower clamping circuit is used to clamp the lower limit value, and the comparator is used to generate a high-level clamping signal.

[0007] Furthermore, the error integration module, used to output an amplified error signal based on the setting signal and the measurement feedback signal, specifically includes: the measurement feedback signal is selected by a selector switch to choose whether to input a feedback voltage signal or a feedback current signal into the circuit; one feedback signal passes through a follower to increase the signal output impedance; it is then compared with the setting voltage signal, then amplified by an error amplifier to amplify the error between the setting signal and the feedback signal, then integrated by an integrator to integrate the output signal of the error amplifier, and then a follower to increase the signal output impedance; the other selected measurement feedback signal is input into the clamping circuit, where the clamping voltage is compared with the feedback signal to calculate the difference. The upper and lower clamping circuits control the upper and lower limits of the feedback signal, respectively. If either clamping setting value is exceeded, a comparison signal is generated, which is then processed by a comparator to generate a high-level clamping signal.

[0008] Furthermore, the measurement feedback module includes a follower, a range divider selection circuit, a differential amplifier circuit, and a range selection and current-to-voltage conversion circuit. The follower is used to improve the signal output impedance, the range divider selection circuit is used to divide the voltage and select the range, the differential amplifier circuit is used to condition the feedback signal to generate a feedback voltage / current signal, and the range selection and current-to-voltage conversion circuit is used to select the range of the current signal and convert the current signal into a voltage signal.

[0009] Furthermore, in the measurement feedback module, one end of the feedback voltage signal is directly connected to one end of the differential amplifier circuit via a follower, and the other end of the feedback voltage signal passes through a range divider selection circuit to divide the voltage and select the range. Then, it passes through a follower to increase the signal output impedance. The two feedback signals are conditioned by the feedback signal of the differential amplifier circuit to generate the feedback voltage signal. The feedback current signal is selected by a range selection and current-to-voltage conversion circuit to select the range of the current signal and convert the current signal into a voltage signal. Then, it is conditioned by the feedback signal of the differential amplifier circuit to generate the feedback current signal.

[0010] Furthermore, the microcontroller control module includes a microcontroller, a digital-to-analog converter (DAC) circuit, an analog-to-digital converter (ADC) circuit, a setting signal range selection and current-to-voltage conversion circuit, an upper clamping signal conditioning circuit, a lower clamping signal conditioning circuit, and a feedback signal conditioning circuit. The microcontroller is used to send control signals to the DAC and ADC circuits. The DAC circuit is used to output the setting voltage / current signal, the upper clamping signal, and the lower clamping signal. The ADC circuit is used to acquire the conditioned feedback voltage / current signal. The setting signal range selection and current-to-voltage conversion circuit is used to select and amplify the setting voltage / current signal. The upper clamping signal conditioning circuit is used to condition the upper clamping signal. The lower clamping signal conditioning circuit is used to condition the lower clamping signal. The feedback signal conditioning circuit is used to condition the feedback voltage / current signal.

[0011] Furthermore, in the microcontroller control module, the microcontroller sends control signals to the digital-to-analog converter circuit. The digital-to-analog converter circuit outputs a setting voltage / current signal, an upper clamping signal, and a lower clamping signal. The setting signal range selection and current-to-voltage conversion circuit performs range selection and amplification on the setting voltage / current signal. The upper clamping signal conditioning circuit conditions the upper clamping signal, and the lower clamping signal conditioning circuit conditions the lower clamping signal. The microcontroller sends control signals to the analog-to-digital converter circuit, which acquires the conditioned feedback voltage / current signal. The feedback signal conditioning circuit conditions the feedback voltage / current signal.

[0012] According to another aspect of the present invention, an integral summation-based high-precision source measurement method is provided, which uses the integral summation-based high-precision source measurement system described above to perform high-precision source measurement.

[0013] Furthermore, the integral summation type high-precision source measurement method includes: the host computer display module sets the current / voltage value according to the user-set working mode (current measurement / voltage measurement or pressure measurement / current measurement), controls the microcontroller via SPI serial bus, and the digital-to-analog conversion circuit outputs the setting signal; the setting signal and the measurement feedback signal are amplified by the error integration module, and then the signal power is amplified and sent to the output terminal; the amplified signal is conditioned by the voltage / current range selection circuit in the measurement feedback module, and then sent to the error integration module to realize the dynamic adjustment of the setting signal and the measurement feedback signal.

[0014] This invention provides an integral summation-type high-precision source measurement system. This system establishes an integral summation-type high-precision source measurement unit electrical testing device, featuring a wide output voltage / current range, good stability, and portability. Traditional source measurement units have insufficient output range. This system uses discrete components (resistors, capacitors, diodes, transistors, MOSFETs, etc., instead of integrated chips) to build a power amplifier module, achieving an output of up to 100V and 1A, meeting the testing requirements of high-power devices. Traditional source measurement unit systems have poor system stability. This system employs a summation-integration structure; when the load changes abruptly, the system can be quickly adjusted to a safe voltage / current value by a clamping circuit, ensuring consistency between the output value and the set value, thus improving system stability. Traditional source measurement units are bulky, lack portability, and are unsuitable for system integration. This source measurement unit adopts a PXI 3U structure (common source measurement units on the market, due to their high power, generally use a desktop chassis structure; this source measurement unit is a board-type unit using a PXI 3U structure), allowing it to be inserted into a PXI chassis for easy integration into a test system with other boards. Therefore, the integral summation type high-precision source measurement system provided by this invention, compared with existing technologies, offers a wider output voltage / current range, better stability, and portability. It effectively solves the technical problems of existing source measurement units, such as insufficient output range, poor system stability, large size, poor portability, and unsuitability for system integration. Attached Figure Description

[0015] The accompanying drawings, which form part of this specification, are provided to further illustrate embodiments of the invention and, together with the textual description, explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0016] Figure 1 and Figure 2 A schematic diagram of an integral summation-based high-precision source measurement system provided according to a specific embodiment of the present invention.

[0017] Figure 3 A schematic diagram of the host computer display module in a high-precision element measurement system provided according to a specific embodiment of the present invention.

[0018] Figure 4 The diagram below illustrates the principle of the error integration module in this high-precision element measurement system according to a specific embodiment of the present invention.

[0019] Figure 5A block diagram illustrating the principle of the measurement feedback module in this high-precision element measurement system according to a specific embodiment of the present invention.

[0020] Figure 6 A schematic diagram of the power amplifier module in this high-precision element measurement system provided according to a specific embodiment of the present invention.

[0021] Figure 7 The block diagram of the microcontroller control module in this high-precision element measurement system provided according to a specific embodiment of the present invention is shown. Detailed Implementation

[0022] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0024] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0025] like Figure 1 and Figure 2As shown in the figure, a high-precision source measurement system based on integral summation is provided according to a specific embodiment of the present invention. This system includes a host computer display module, a microcontroller control module, an error integration module, a power amplification module, and a measurement feedback module. The host computer display module is used to set the current or voltage value according to the set operating mode and controls the microcontroller control module via an SPI serial bus. The microcontroller control module outputs a setting signal, and the measurement feedback module outputs a measurement feedback signal. The error integration module outputs an amplified error signal based on the setting signal and the measurement feedback signal. The power amplification module amplifies the error signal and outputs a measurement signal to the output terminal and the measurement feedback module. The measurement feedback module conditions the output measurement signal before sending it to the error integration module, thereby achieving dynamic adjustment between the output measurement signal and the setting signal. The power amplifier module adopts a complementary push-pull structure, using the same input signal to drive two complementary symmetrical transistors of different polarities to obtain two excitation signals of equal magnitude and opposite phase. The power amplifier module includes PNP power transistors, NPN power transistors, NPN field-effect transistors, PNP field-effect transistors, and bipolar transistors. The input signal is initially amplified by the PNP and NPN power transistors. The PNP power transistor initially amplifies the positive half-cycle current signal, and the NPN power transistor initially amplifies the negative half-cycle current signal. The amplified signal is then switched according to the range, through the positive half-cycle voltage signal range switching of the NPN field-effect transistor and the negative half-cycle voltage signal range switching of the PNP field-effect transistor. Finally, the signal current is further amplified by the bipolar transistor to obtain the output signal. The integral summation type high-precision source measurement system is powered by the PXI backplane and adopts a PXI 3U structure that can be inserted into the PXI chassis.

[0026] This configuration provides an integral summation-based high-precision source measurement system. This system establishes an integral summation-based high-precision source measurement unit electrical test device, featuring a wide output voltage / current range, good stability, and portability. Traditional source measurement units have insufficient output range. This system uses discrete components (resistors, capacitors, diodes, transistors, MOSFETs, etc., instead of integrated chips) to build a power amplifier module, achieving an output of up to 100V, 1A, meeting the testing requirements of high-power devices. Traditional source measurement unit systems have poor system stability. This system employs a summation-integration structure; when the load changes abruptly, the system can be quickly adjusted to a safe voltage / current value by a clamping circuit, ensuring consistency between the output value and the set value, thus improving system stability. Traditional source measurement units are bulky, lack portability, and are unsuitable for system integration. This source measurement unit adopts a PXI 3U structure (common source measurement units on the market, due to their high power, generally use a desktop chassis structure; this source measurement unit is a board-type unit using a PXI 3U structure), allowing it to be inserted into a PXI chassis for easy integration into a test system with other boards. Therefore, the integral summation type high-precision source measurement system provided by this invention, compared with existing technologies, offers a wider output voltage / current range, better stability, and portability. It effectively solves the technical problems of existing source measurement units, such as insufficient output range, poor system stability, large size, poor portability, and unsuitability for system integration.

[0027] Furthermore, in this invention, the host computer display module is used to realize the selection of working mode (FVMI or FIMV), voltage range setting, current range setting, output voltage setting, output current setting, clamping voltage setting, clamping current setting, sampling voltage display, and sampling current display. When the pressure measurement mode is selected, the voltage range selection, output voltage setting, clamping current setting, and sampling voltage display are completed; when the current measurement mode is selected, the current range selection, output current setting, clamping voltage setting, and sampling current display are completed.

[0028] The error integration module includes a selection switch, a follower, an error amplifier, an integrator, an upper clamping circuit, a lower clamping circuit, and a comparator. The selection switch is used to select whether the feedback voltage signal or the feedback current signal is connected to the circuit. The follower is used to increase the signal output impedance. The error amplifier is used to amplify the error between the setting signal and the output measurement feedback signal. The integrator is used to integrate the output signal of the error amplifier. The upper clamping circuit is used to clamp the upper limit value, the lower clamping circuit is used to clamp the lower limit value, and the comparator is used to generate a high-level clamping signal.

[0029] In this invention, the error integration module is used to output an amplified error signal based on the setting signal and the measurement feedback signal. Specifically, the measurement feedback signal is selected by a selector switch to choose whether to input a feedback voltage signal or a feedback current signal into the circuit. One feedback signal passes through a follower to increase the signal output impedance. It is then compared with the setting voltage signal, then amplified by an error amplifier to amplify the error between the setting signal and the feedback signal, then integrated by an integrator to integrate the output signal of the error amplifier, and then a follower to increase the signal output impedance. The other selected measurement feedback signal is input into a clamping circuit. The clamping voltage is compared with the feedback signal to calculate the difference. The upper clamping circuit and the lower clamping circuit control the upper and lower limits of the feedback signal, respectively. If either clamping setting value is exceeded, a comparison signal will be generated. This comparison signal is then processed by a comparator to generate a high-level clamping signal.

[0030] Furthermore, in this invention, the measurement feedback module includes a follower, a range divider selection circuit, a differential amplifier circuit, and a range selection and current-to-voltage conversion circuit. The follower is used to improve the signal output impedance, the range divider selection circuit is used to divide the voltage and select the range, the differential amplifier circuit is used to condition the feedback signal to generate a feedback voltage / current signal, and the range selection and current-to-voltage conversion circuit is used to select the range of the current signal and convert the current signal into a voltage signal.

[0031] Specifically, in the measurement feedback module, one end of the feedback voltage signal is directly connected to one end of the differential amplifier circuit via a follower, and the other end of the feedback voltage signal passes through a range divider selection circuit to divide the voltage and select the range. Then, it passes through a follower to increase the signal output impedance. The two feedback signals are conditioned by the feedback signal of the differential amplifier circuit to generate the feedback voltage signal. The feedback current signal is selected by a range selection and current-to-voltage conversion circuit to select the range of the current signal and convert the current signal into a voltage signal. Then, it is conditioned by the feedback signal of the differential amplifier circuit to generate the feedback current signal (expressed in voltage form).

[0032] Furthermore, in this invention, the microcontroller control module includes a microcontroller, a digital-to-analog converter (DAC), an analog-to-digital converter (ADC), a setting signal range selection and current-to-voltage conversion circuit, an upper clamping signal conditioning circuit, a lower clamping signal conditioning circuit, and a feedback signal conditioning circuit. The microcontroller is used to send control signals to the DAC and ADC. The DAC is used to output a setting voltage / current signal, an upper clamping signal, and a lower clamping signal. The ADC is used to acquire the conditioned feedback voltage / current signal. The setting signal range selection and current-to-voltage conversion circuit is used to select and amplify the setting voltage / current signal. The upper clamping signal conditioning circuit is used to condition the upper clamping signal. The lower clamping signal conditioning circuit is used to condition the lower clamping signal. The feedback signal conditioning circuit is used to condition the feedback voltage / current signal.

[0033] Specifically, in the microcontroller control module, the microcontroller sends a control signal to the digital-to-analog converter circuit. The digital-to-analog converter circuit outputs a setting voltage / current signal, an upper clamping signal, and a lower clamping signal. The setting signal range selection and current-to-voltage conversion circuit performs range selection and amplification on the setting voltage / current signal. The upper clamping signal conditioning circuit conditions the upper clamping signal, and the lower clamping signal conditioning circuit conditions the lower clamping signal. The microcontroller sends a control signal to the analog-to-digital converter circuit, which acquires the conditioned feedback voltage / current signal. The feedback signal conditioning circuit conditions the feedback voltage / current signal.

[0034] According to another aspect of the present invention, an integral summation-based high-precision source measurement method is provided. This method uses the integral summation-based high-precision source measurement system described above to perform high-precision source measurement. The integral summation-based high-precision source measurement method includes: a host computer display module sets the current / voltage value according to the user-set operating mode (FIMV or FVMI), controls a microcontroller via an SPI serial bus, and outputs a setting signal through a digital-to-analog converter circuit; the setting signal and the measurement feedback signal are amplified by an error integration module, and then the signal power is amplified and sent to the output terminal; the amplified signal is conditioned by a voltage / current range selection circuit in the measurement feedback module before being sent back to the error integration module, thereby realizing dynamic adjustment of the setting signal and the measurement feedback signal.

[0035] To gain a further understanding of the present invention, the following description is provided in conjunction with... Figures 1 to 7 The high-precision source measurement system based on integral summation provided by this invention will be described in detail.

[0036] like Figures 1 to 7As shown in the figure, a high-precision source measurement system based on integral summation according to a specific embodiment of the present invention is provided, which specifically includes a host computer display module, a microcontroller control module, an error integration module, a power amplification module, and a measurement feedback module. The specific signal flow process is as follows: The host computer display module sends a signal, and its working process is as follows: During the system operation, the host computer display module sets the current / voltage value according to the user-defined working mode, which is either current-to-voltage measurement (FIMV) (set value is current value, feedback value is voltage value) or current-to-voltage measurement (FVMI) (set value is voltage value, feedback value is current value (output in voltage form)). It then controls the microcontroller via the SPI serial bus to set the high-precision digital-to-analog converter output signal. The set value and the measurement feedback signal output by the measurement feedback module are amplified by the error integration module (this is the difference between the amplified set value and the measurement feedback signal; however, this difference is gradually reduced through the negative feedback of the circuit, similar to the principle of PID control, ultimately ensuring that the set value and the measurement feedback signal are equal). The signal power is then amplified to the output terminal (the signal output by the error integration module is amplified by the power amplification module; due to different ground potentials set by the system, the signal value is not 0). The amplified signal then passes through the voltage / current range selection circuit (the voltage / current range selection circuit belongs to...). Figure 5 The internal circuitry of the measurement feedback module conditions the feedback signal (by amplifying and attenuating the signal output from the power amplifier module using operational amplifiers) before sending it to the error integration module. This enables dynamic adjustment of the measurement feedback signal and the set voltage / current. The power amplifier module serves as the positive terminal of the output signal, and the negative terminal serves as the reference ground signal. This feedback connection to the integrator's output ensures a relative zero value for the integrator's output, further guaranteeing consistency between the set value and the output value.

[0037] Figure 3 This is a block diagram of the host computer display module in this high-precision source measurement unit. Its features include the ability to select the operating mode (FVMI or FIMV), set the voltage range, set the current range, set the output voltage, set the output current, set the clamping voltage, set the clamping current, and display the sampled voltage and current.

[0038] Figure 4 This is a block diagram of the error integration module in this high-precision source measurement unit. Its key feature is that, depending on whether the system operates in current-voltage measurement or pressure-current measurement mode, it can select either a feedback voltage signal or a feedback current signal. The error between the system's set value and the measured feedback signal is amplified by an error amplifier and an integrator. This circuit also has a clamping protection function when the voltage or current reaches its limit value.

[0039] The function of each module:

[0040] Selector switch: Selects whether to input a feedback voltage signal or a feedback current signal into the circuit.

[0041] Follower: Used to increase the output impedance of a signal.

[0042] Error amplifier: Used to amplify the error between the setting signal and the feedback signal.

[0043] Integrator: Used to integrate the output signal of the error amplifier.

[0044] Upper clamping circuit: used to clamp the upper limit value.

[0045] Lower clamping circuit: used to clamp the lower limit value.

[0046] Comparator: Used to generate a high-level clamping signal.

[0047] Workflow:

[0048] The feedback voltage or current signal is selected via a selector switch, allowing the circuit to input either a feedback voltage or current signal. One feedback signal passes through a follower to increase the output impedance. It is then compared with the set voltage signal, followed by an error amplifier to amplify the error between the set signal and the feedback signal. Next, it passes through an integrator to integrate the output signal of the error amplifier. Finally, it passes through another follower to further increase the output impedance.

[0049] The selected feedback signal is connected to the clamping circuit. The clamping voltage is compared with the feedback signal, and the difference is calculated. The upper and lower clamping circuits control the upper and lower limits of the feedback signal, respectively. If either clamping setting value is exceeded, a comparison signal will be generated. This comparison signal is then processed by a comparator to generate a high-level clamping signal.

[0050] Figure 5 This is a block diagram of the measurement feedback module in this high-precision source measurement unit. Its key feature is that the feedback voltage signal and feedback current signal can be conditioned by different range selection circuits to a voltage range acceptable to the analog-to-digital converter.

[0051] The function of each module:

[0052] Follower: Used to increase the output impedance of a signal.

[0053] Voltage range divider selection circuit: used for voltage division and range selection.

[0054] Differential amplifier circuit: used to condition the feedback signal and generate a feedback voltage / current signal.

[0055] Range selection / current-to-voltage conversion circuit: used to select the range of the current signal and convert the current signal into a voltage signal.

[0056] Workflow:

[0057] One end of the feedback voltage signal is directly connected to one end of the differential amplifier circuit via a follower. The other end of the feedback voltage signal passes through a range divider circuit for voltage division and range selection. The signal output impedance is then increased by a follower. The two feedback signals are then processed by the differential amplifier circuit for feedback signal conditioning to generate the feedback voltage signal.

[0058] The feedback current signal is selected by a range selection / current-to-voltage conversion circuit to convert the current signal into a voltage signal. Then, it is conditioned by a differential amplifier circuit to generate the feedback current signal.

[0059] Figure 6 This is a block diagram of the power amplifier module in this high-precision source measurement unit. Its key feature is the use of a classic complementary push-pull structure, employing the same input signal to drive two complementary symmetrical transistors of different polarities, resulting in two excitation signals of equal magnitude but opposite phase. Range switching is achieved via a field-effect transistor, enabling signal outputs for different current ranges.

[0060] The function of each module:

[0061] PNP power transistor: used for initial amplification of the positive half-cycle of the signal.

[0062] NPN power transistor: used for initial amplification of the negative half-cycle of the signal.

[0063] NPN field-effect transistor: used for range switching of positive half-cycle current signals.

[0064] PNP field-effect transistor: used for range switching of negative half-cycle current signals.

[0065] Bipolar transistor: Used to further amplify the signal current amplification factor.

[0066] Workflow:

[0067] The power amplifier module employs a classic complementary push-pull structure, using the same input signal to drive two complementary symmetrical transistors of different polarities, resulting in two excitation signals of equal magnitude but opposite phase. The input signal is initially amplified by a PNP power transistor and an NPN power transistor. The PNP power transistor amplifies the positive half-cycle of the current signal, while the NPN power transistor amplifies the negative half-cycle. The amplified signals are then switched according to their range, with the NPN MOSFET switching the positive half-cycle voltage signal and the PNP MOSFET switching the negative half-cycle voltage signal. Finally, a bipolar transistor further amplifies the signal current, yielding the output signal.

[0068] Figure 7This is a block diagram of the microcontroller control module in this high-precision source measurement unit. Its key feature is the inclusion of a digital-to-analog converter (DAC) circuit and an analog-to-digital converter (ADC). The DAC circuit generates the setting voltage / current signal and the clamping signal. The ADC circuit acquires the feedback voltage and feedback current signals.

[0069] The function of each module:

[0070] Microcontroller: Used to send control signals to digital-to-analog converter circuits and analog-to-digital converter circuits.

[0071] Digital-to-analog converter circuit: used to output setting voltage / current signals, output upper clamping signals, and output lower clamping signals.

[0072] Analog-to-digital converter circuit: used to acquire the conditioned feedback voltage / current signal.

[0073] Voltage / current signal range selection / current-voltage conversion circuit: used to select the range and amplify the voltage / current signal.

[0074] Upper clamp signal conditioning circuit: used to condition the upper clamp signal.

[0075] Lower clamp signal conditioning circuit: used to condition the lower clamp signal.

[0076] Signal conditioning circuit: Used to condition the feedback voltage / current signal.

[0077] Workflow:

[0078] The microcontroller sends control signals to the digital-to-analog converter (DAC). The DAC outputs a setting voltage / current signal, an upper clamping signal, and a lower clamping signal. The voltage / current signal range selection circuit selects and amplifies the setting voltage / current signal. The upper clamping signal conditioning circuit conditions the upper clamping signal. The lower clamping signal conditioning circuit conditions the lower clamping signal.

[0079] The microcontroller sends control signals to the analog-to-digital converter (ADC), which then acquires the conditioned feedback voltage / current signal. The signal conditioning circuit conditions the feedback voltage / current signal and performs bipolar conversion to suit the ADC.

[0080] In summary, this invention provides an integral summation-based high-precision source measurement system, including a host computer display module, an error integration module, a measurement feedback module, a power amplification module, and a microcontroller control module. The working principle of this invention is as follows: During system operation, the host computer display module sets the current / voltage values ​​according to the user-defined operating mode (FIMV or FVMI). It then controls the microcontroller via an SPI serial bus to set the output setting signal from a high-precision digital-to-analog converter chip. The error between the set value and the measurement feedback signal is amplified by the error integration module, and then the signal power is amplified and sent to the output terminal. The amplified signal is then conditioned by a voltage / current range selection circuit before being sent to the error integration module, achieving dynamic adjustment of the set voltage / current.

[0081] The beneficial effects of this invention are as follows: Traditional source measurement units have insufficient output range. This source measurement unit uses discrete components to build a power amplifier module, achieving an output of up to 100V and 1A, meeting the testing requirements of high-power devices. Traditional source measurement units suffer from poor system stability. This source measurement unit employs a summation-integration structure (referring to an error integration module). When the load changes abruptly, the system can be quickly adjusted to a safe voltage / current value by a clamping circuit, ensuring consistency between the output value and the set value, thus improving system stability. Traditional source measurement units are bulky and lack portability, making them unsuitable for system integration. This source measurement unit draws power from a PXI backplane and uses a PXI 3U structure, allowing it to be inserted into a PXI chassis, facilitating the integration of other boards into a test system.

[0082] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0083] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0084] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An integrator-summation high-precision source measurement system characterized by, The integral summation formula high-precision source measurement system comprises a host computer display module, a single-chip microcomputer control module, an error integral module, a power amplification module and a measurement feedback module, the host computer display module is used for setting current or voltage value according to the set working mode, controlling the single-chip microcomputer control module through an SPI serial bus, outputting a setting signal, outputting a measurement feedback signal, the error integral module is used for outputting an amplified error signal according to the setting signal and the measurement feedback signal, and the power amplification module is used for power amplifying the error signal and outputting a measurement signal to the output terminal and the measurement feedback module, the measurement feedback module sends the output measurement signal into the error integral module after conditioning, and realizes dynamic adjustment of the output measurement signal and the setting signal. The power amplification module adopts a complementary push-pull structure, uses the same input signal to drive two complementary symmetrical triodes of different polarities to obtain two excitation signals of equal size and opposite phase, and comprises a PNP power tube, an NPN power tube, an NPN field effect tube, a PNP field effect tube and a bipolar transistor, the input signal is preliminarily amplified through the PNP power tube and the NPN power tube, the PNP power tube preliminarily amplifies the positive half cycle signal of the current signal, and the NPN power tube preliminarily amplifies the negative half cycle signal of the current signal; the amplified signal is switched according to different ranges, the NPN field effect tube switches the positive half cycle voltage signal range, the PNP field effect tube switches the negative half cycle voltage signal range, and finally the signal current amplification multiple is further amplified through the bipolar transistor to obtain an output signal. The integral summation formula high-precision source measurement system is powered by a PXI backplane and adopts a PXI 3U structure which can be inserted into a PXI chassis.

2. The integrator-summer high-precision source measurement system of claim 1, wherein, The host computer display module is used for realizing working mode selection (FVMI or FIMV), voltage range setting, current range setting, output voltage setting, output current setting, clamping voltage setting, clamping current setting, back sampling voltage display and back sampling current display, when the pressurizing flow measurement mode is selected, completing voltage range selection, output voltage setting, clamping current setting and back sampling voltage display, and when the flow pressurizing measurement mode is selected, completing current range selection, output current setting, clamping voltage setting and back sampling current display.

3. The integrator-summer high-precision source measurement system of claim 2, wherein, The error integral module comprises a selection switch, a follower, an error amplifier, an integrator, an upper clamping circuit, a lower clamping circuit and a comparator, the selection switch is used for selecting whether a feedback voltage signal or a feedback current signal is connected to the circuit, the follower is used for improving signal output impedance, the error amplifier is used for amplifying the error of the setting signal and the output measurement feedback signal, the integrator is used for integrating the output signal of the error amplifier, the upper clamping circuit is used for clamping the upper limit value, the lower clamping circuit is used for clamping the lower limit value, and the comparator is used for generating a high-level clamping signal.

4. The integrator-summer high-precision source measurement system of claim 3, wherein, The error integral module is used for outputting an amplified error signal according to the setting signal and the measurement feedback signal, and specifically comprises: The measurement feedback signal is selected by a selector switch to choose whether to input a feedback voltage signal or a feedback current signal into the circuit; one feedback signal passes through a follower to increase the signal output impedance; then it is compared with the set voltage signal, then passes through an error amplifier to amplify the error between the set signal and the feedback signal, then passes through an integrator to integrate the output signal of the error amplifier, and then passes through a follower to increase the signal output impedance. Another selected measurement feedback signal is connected to the clamping circuit. The clamping voltage and the feedback signal are compared and the difference is calculated. The upper clamping circuit and the lower clamping circuit control the upper and lower limits of the feedback signal, respectively. If either clamping setting value is exceeded, a comparison signal will be generated. This comparison signal is then processed by a comparator to generate a high-level clamping signal.

5. The integrator-summer high-precision source measurement system of any one of claims 1 to 4, wherein, The measurement feedback module includes a follower, a range divider selection circuit, a differential amplifier circuit, and a range selection and current-to-voltage conversion circuit. The follower is used to improve the signal output impedance. The range divider selection circuit is used to divide the voltage and select the range. The differential amplifier circuit is used to condition the feedback signal to generate a feedback voltage / current signal. The range selection and current-to-voltage conversion circuit is used to select the range of the current signal and convert the current signal into a voltage signal.

6. The integral summing high precision source measurement system of claim 5, wherein, In the measurement feedback module, one end of the feedback voltage signal is directly connected to one end of the differential amplifier circuit via a follower, and the other end of the feedback voltage signal passes through a range divider selection circuit to divide the voltage and select the range. Then, it passes through a follower to increase the signal output impedance. The two feedback signals are conditioned by the feedback signal of the differential amplifier circuit to generate the feedback voltage signal. The feedback current signal is selected by a range selection and current-to-voltage conversion circuit to select the range of the current signal and convert the current signal into a voltage signal. Then, it is conditioned by the feedback signal of the differential amplifier circuit to generate the feedback current signal.

7. The integral summing high precision source measurement system of claim 6, wherein, The microcontroller control module includes a microcontroller, a digital-to-analog converter (DAC), an analog-to-digital converter (ADC), a setting signal range selection and current-to-voltage conversion circuit, an upper clamping signal conditioning circuit, a lower clamping signal conditioning circuit, and a feedback signal conditioning circuit. The microcontroller sends control signals to the DAC and ADC. The DAC outputs a setting voltage / current signal, an upper clamping signal, and a lower clamping signal. The ADC acquires the conditioned feedback voltage / current signal. The setting signal range selection and current-to-voltage conversion circuit selects and amplifies the setting voltage / current signal. The upper clamping signal conditioning circuit conditions the upper clamping signal. The lower clamping signal conditioning circuit conditions the lower clamping signal. The feedback signal conditioning circuit conditions the feedback voltage / current signal.

8. The integral summing high precision source measurement system of claim 7, wherein, In the single-chip microcomputer control module, the single-chip microcomputer sends a control signal to the digital-to-analog conversion circuit, the digital-to-analog conversion circuit outputs a setting voltage / current signal, an upper clamping signal and a lower clamping signal, a setting signal range selection and current-voltage conversion circuit selects and amplifies the setting voltage / current signal, an upper clamping signal conditioning circuit conditions the upper clamping signal, and a lower clamping signal conditioning circuit conditions the lower clamping signal.

9. An integrated summing high precision source measurement method characterized by, The integral summation type high-precision source measurement method uses the integral summation type high-precision source measurement system as claimed in claims 1 to 8 to perform high-precision source measurement.

10. The method of claim 9, wherein, The integral summation type high-precision source measurement method comprises: The host computer display module sets the current / voltage value according to the working mode set by the user, i.e. flow-in pressure measurement (FIMV) or pressure-in flow measurement (FVMI), controls the single-chip microcomputer through the SPI serial bus, and the digital-to-analog conversion circuit outputs a setting signal; The setting signal and the measurement feedback signal are amplified in error integration module, and then the signal power is amplified to the output terminal; The power amplified signal is sent to the error integration module after being conditioned by the voltage / current range selection circuit in the measurement feedback module, so as to realize the dynamic adjustment of the setting signal and the measurement feedback signal.

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