Electrostatic test device and method for OLED display module

Abstract

The embodiment of the invention provides an electrostatic test device and method for an OLED display module, relates to the technical field of display, and is used for improving the electrostatic test efficiency and shortening the electrostatic test period. The OLED display module comprises an OLED display panel, and the static test device comprises a static generator used for discharging to the OLED display module to be tested; the second conductive part is used for being arranged on the first surface of the OLED display module to be tested; the first surface is located on the light emitting side of the OLED display module to be detected; the heating piece is used for being arranged on the side, away from the light emitting side, of the OLED display module to be tested; the second conductive part is used for being arranged on the side, away from the light emitting side, of the OLED display panel; and the power supply is used for forming an electric field between the first conductive piece and the second conductive piece.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of display, in particular to an electrostatic test device and method for an OLED display module. BACKGROUND

[0002] An organic light emitting diode (OLED) display screen includes a semiconductor device such as a thin film transistor (TFT), and the semiconductor device is very sensitive to static electricity. Static electricity is everywhere in life, especially in dry winter. Therefore, the OLED display screen has the possibility of being damaged due to static electricity. Therefore, it is necessary to test the anti-static performance of the OLED display screen at present. SUMMARY

[0003] Therefore, the embodiments of the present application provide an electrostatic test device and method for an OLED display module, which are used for testing the anti-static performance of the OLED display module, improving the electrostatic test efficiency, and shortening the electrostatic test period.

[0004] In a first aspect, the embodiments of the present application provide an electrostatic test device for an OLED display module, the OLED display module including an OLED display panel, and the electrostatic test device including: a static generator configured to discharge to a to-be-tested OLED display module; a first conductive member configured to be arranged on a first surface of the to-be-tested OLED display module, the first surface being located on a light-out side of the to-be-tested OLED display module; a heating member configured to be arranged on a side of the to-be-tested OLED display module away from the light-out side; a second conductive member configured to be arranged on a side of the OLED display panel away from the light-out side; a power supply configured to form an electric field between the first conductive member and the second conductive member.

[0005] In a second aspect, the embodiments of the present application provide an electrostatic test method for an OLED display module, the OLED display module including an OLED display panel, and the electrostatic test method including: arranging a first conductive member on a first surface of a to-be-tested OLED display module, the first surface being located on a light-out side of the to-be-tested OLED display module; arranging a second conductive member on a side of the OLED display panel away from the light-out side; arranging a heating member on a side of the to-be-tested OLED display module away from the light-out side; discharging to the to-be-tested OLED display module by using a static generator; forming an electric field between the first conductive member and the second conductive member by using a power supply.

[0006] The electrostatic testing device and the electrostatic testing method for the OLED display module provided by the embodiment of the present application can form an electrostatic charge conduction path by using the electric field between the first conductive member and the second conductive member, and can introduce the electrostatic charge into the interior of the OLED display panel. Moreover, in the process of introducing the electrostatic charge into the interior of the OLED display panel, the first conductive member provided by the embodiment of the present application can be used instead of the electrostatic brush, the electrostatic testing efficiency can be improved, and the electrostatic testing period can be shortened.

[0007] Moreover, in the electrostatic testing process, based on the setting mode provided by the embodiment of the present application, the position of the first conductive member does not need to be moved, the electric field between the first conductive member and the second conductive member can be ensured to be more stable, and the electric field is not affected by human factors, so that the accuracy of the test result can be improved.

[0008] On the other hand, the electrostatic testing device provided by the embodiment of the present application further includes a heating member, in the process of electrostatic testing of the OLED display module, the heating member can be used to heat the OLED display module, to simulate the environment generated by the internal circuit heating when the OLED display module works, and to improve the failure speed of the OLED display panel, so as to shorten the electrostatic testing period. Moreover, by using this setting mode, the OLED display panel does not need to be turned on as a whole, the dependence on the testing equipment can be reduced, the operation is facilitated, and in addition, the temperature accuracy of the OLED display panel in the heating process can be improved. BRIEF DESCRIPTION OF DRAWINGS

[0009] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly introduced as follows. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0010] Figure 1 A cross-sectional schematic view of an OLED display module provided by the embodiment of the present application; Figure 2 A schematic view of an electrostatic testing device for an OLED display module provided by the embodiment of the present application; Figure 3 A schematic view of an electrostatic testing device for an OLED display module provided by the embodiment of the present application; Figure 4 A schematic view of an electrostatic testing device for an OLED display module provided by the embodiment of the present application; Figure 5 A schematic view of an electrostatic testing device for an OLED display module provided by the embodiment of the present application; Figure 6 A temperature curve comparison chart of a heating element and an OLED display module provided by the embodiment of the present application; Figure 7 A detection time comparison chart of three electrostatic detection devices; Figure 8 A flowchart of an electrostatic test method provided by the embodiment of the present application. DETAILED DESCRIPTION

[0011] In order to better understand the technical solutions of the present application, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0012] It should be clear that the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0013] The terms used in the embodiments of the present application are only for the purpose of describing the specific embodiments, and are not intended to limit the present application. The singular forms "a", "an" and "the" used in the embodiments of the present application and the appended claims are also intended to include the plural forms, unless the context clearly indicates otherwise.

[0014] It should be understood that the term "and / or" used herein is only to describe the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent the three cases of A alone, A and B together, and B alone. In addition, the character " / " in this paper generally represents that the front and rear associated objects are a "or" relationship.

[0015] The embodiments of the present application provide an electrostatic test device for an OLED display module, as shown in Figure 1 Figure 1 A cross-sectional schematic diagram of an OLED display module provided by the embodiment of the present application, the OLED display module 1 can include an OLED display panel 11.

[0016] For example, the OLED display panel 11 can include a light emitting unit layer and a driving circuit layer, the light emitting unit layer includes a light emitting unit, and the driving circuit layer includes a pixel driving circuit for driving the light emitting unit to light up. For example, the pixel driving circuit includes a thin film transistor.

[0017] For example, as shown in Figure 2 Figure 2 ​​A schematic diagram of an electrostatic testing device for an OLED display module is provided, which can evaluate the anti-static capability of the OLED display module and provide a reference for the anti-static design of the OLED display module.

[0018] As shown in Figure 2 , the electrostatic testing device comprises an electrostatic generator 2, a first conductive member 31, a second conductive member 32, a heating member 4, and a power supply 5.

[0019] During the electrostatic testing of the OLED display module 1, the electrostatic generator 2 is used to discharge the OLED display module 1 to be tested. For example, the electrostatic generator 2 comprises a high-voltage source, such as an electrostatic gun. Optionally, during the electrostatic testing of the OLED display module, the discharge voltage provided by the electrostatic generator 2 can gradually increase from a low voltage to a high voltage, so as to discharge the OLED display module multiple times until the failure point in the OLED display module 1 is found, which is the weak point of the OLED display module under electrostatic. For example, the discharge voltage can gradually increase from ±1kV to ±20kV. For example, the electrostatic generator 2 can discharge once or multiple times at each discharge voltage.

[0020] During the electrostatic testing of the OLED display module, as shown in Figure 2 , the first conductive member 31 is arranged on the first surface S1 of the OLED display module 1 to be tested; the first surface S1 is located on the light-emitting side of the OLED display module 1 to be tested. The second conductive member 32 is arranged on the side of the OLED display panel 11 in the OLED display module 1 away from the light-emitting side. The heating member 4 is arranged on the side of the OLED display module 1 away from the light-emitting side. For example, as shown in Figure 2 , the heating member 4 is arranged on the side of the second conductive member 32 away from the OLED display module 1.

[0021] The power supply 5 is used to provide a voltage to the first conductive member 31 and the second conductive member 32, so as to form an electric field between the first conductive member 31 and the second conductive member 32. In other words, the first conductive member 31 and the second conductive member 32 can constitute a capacitor.

[0022] For example, as shown in Figure 2 , the electrostatic testing device further comprises a first wire 61 and a second wire 62, the first wire 61 is electrically connected to the first conductive member 31 and the power supply 5, and the second wire 62 is electrically connected to the second conductive member 32 and the power supply 5.

[0023] In the static electricity test of the OLED display module 1, the embodiment of the present application can discharge the OLED display module 1 to be tested by the static electricity generator 2. Then, the power source 5 is used to form an electric field between the first conductive part 31 and the second conductive part 32. Under the drive of the electric field, the static electricity charges move from the second conductive part 32 to the side of the first conductive part 31, that is, the static electricity charge conduction path is formed between the second conductive part 32 and the first conductive part 31, so as to avoid the static electricity charges to accumulate in the local position outside the OLED display panel 11. For example, when the second conductive part 32 is grounded, the static electricity charges can be avoided to accumulate in the position close to the second conductive part 32.

[0024] By the method provided by the embodiment of the present application, the static electricity charges can enter the inside of the OLED display panel 11, so as to make the static electricity environment of the OLED display panel 11 in the test process more close to the static electricity environment of the OLED display panel 11 in the subsequent factory use process, thereby improving the accuracy of the static electricity test.

[0025] In addition, in the process of discharging the OLED display module 1 to be tested by the static electricity generator 2, and / or in the process of electrifying the first conductive part 31 and the second conductive part 32 by the power source 5, the static electricity test device provided by the embodiment of the present application can heat the OLED display module 1 by the heating part 4, so as to simulate the temperature environment of the OLED display panel in the actual use process. Since the device characteristics of the thin film transistor in the OLED display panel are related to the temperature, the temperature rise can make the device of the thin film transistor to be biased. Therefore, by heating the OLED display module provided by the detection device of the embodiment of the present application, the failure speed of the weak position in the OLED display panel 11 can be accelerated, thereby being beneficial to shorten the test period.

[0026] In the static electricity test process, the failure position and the failure time in the OLED display module 1 can be recorded, and the failure position is the static weak point in the OLED display module 1.

[0027] By the method provided by the embodiment of the present application, the first conductive part 31 can be used to avoid the static electricity brush in the process of introducing the static electricity charges into the inside of the OLED display panel 11. Figure 3 As shown in the figure, Figure 3Fig. 1 is a schematic view of a prior art electrostatic test method for an OLED display module. The electrostatic brush 01 is located on the surface of the OLED display module 1 near the light-emitting side, and the electrostatic brush 01 can be grounded to form a static charge conduction path between the electrostatic brush 01 and the copper plate 14 located on the side of the OLED display panel 11 away from the light-emitting side. Since the electrostatic brush 01 has a small area, this method cannot cover the entire surface of the OLED display module 1, and a long test period is required. In addition, the electrostatic brush 01 needs to be manually operated by the test personnel, so this method is greatly affected by human factors. If the test personnel operates improperly, test errors will occur, and the test results are not stable.

[0028] In the embodiment of the present application, the first conductive member 31 can be a planar structure. For example, the first conductive member 31 can cover the surface of the OLED display module 1 to increase the coverage area of the first conductive member 31 on the OLED display module 1, so that the electric field between the first conductive member 31 and the second conductive member 32 passes through the entire screen of the OLED display panel 11, thereby allowing the static conduction path to pass through any position of the screen of the OLED display panel 11, without the need for point-by-point testing of the surface of the OLED display module 1, thereby improving the efficiency of the electrostatic test and shortening the electrostatic test period. Moreover, during the electrostatic test, based on the setting method provided in the embodiment of the present application, the position of the first conductive member 31 does not need to be moved, which can ensure that the electric field between the first conductive member 31 and the second conductive member 32 is more stable and is not affected by human factors, thereby improving the accuracy of the test results.

[0029] On the other hand, the electrostatic test device provided in the embodiment of the present application further comprises a heating member 4, which can be used to heat the OLED display module 1 during the electrostatic test, to simulate the temperature environment generated by the internal circuit heating of the OLED display module 1 during operation, and to increase the failure speed of the OLED display panel, thereby shortening the electrostatic test period. Moreover, with this setting method, the OLED display panel does not need to be lit as a whole, which can reduce the dependence on test equipment, facilitate operation, and improve the temperature accuracy of the OLED display panel 11 during heating.

[0030] If the OLED display panel 11 is heated by the way of turning on the whole machine, on the one hand, the whole machine needs to be provided to adapt to different specifications of the OLED display panel 11, and the test resource of the whole machine is limited and it is difficult to meet the demand. On the other hand, the OLED display panel 11 needs to be assembled on the whole machine by the pasting process during the test. Since the lapping process of the OLED display panel 11 and the whole machine also affects the heat received by the OLED display panel 11, if the lapping process is not stable enough, it will also affect the accuracy of the temperature received by the OLED display panel 11.

[0031] Figure 2 It is also shown that the test table 6, and the heating member 4 can be arranged on the surface of the test table 6. The test table 6 can be a desktop or other equipment capable of providing a flat surface.

[0032] For example, as shown in Figure 2 The first conductive member 31 at least partially covers the first surface S1 to increase the coverage area of the first conductive member 31 on the OLED display module 1, so that it is not necessary to test the weak electrostatic position in the OLED display panel 11 point by point, and the electrostatic test period can be shortened and the electrostatic test efficiency can be improved.

[0033] Optionally, the first conductive member 31 includes a conductive cloth.

[0034] For example, as shown in Figure 1 The OLED display module 1 to be tested also includes a cover plate 12 located on the light emitting side of the OLED display panel 11. The surface of the cover plate 12 away from the OLED display panel 11 includes the first surface S1. During the electrostatic test of the OLED display module 1, the first conductive member 31 including the conductive cloth and the first surface S1 are attached, that is, the conductive cloth is located on the surface of the cover plate 12 away from the OLED display panel 11.

[0035] For example, as shown in Figure 2 The surface of the side of the heating member 4 close to the OLED display module 1 to be tested includes a plane. By using this arrangement, the OLED display module 1 can be placed more stably on the heating member 4 while being heated by the heating member 4, and the stability of the OLED display module 1 during the electrostatic test can be improved.

[0036] For example, the heating member 4 includes a constant temperature heating platform. By using this arrangement, the temperature uniformity of the heating member 4 can be improved, and the heating consistency of different positions in the OLED display module can be improved. Optionally, the temperature T of the constant temperature heating platform can satisfy 55℃≤T≤65℃. For example, T=60℃ to simulate the screen temperature of the whole machine under high load.

[0037] As shown in Figure 4 , Figure 4 Another schematic diagram of the electrostatic testing device for the OLED display module is shown in the figure. The electrostatic testing device further comprises a heat-conducting filling part 7. The heat-conducting filling part 7 is used to fill the gap between the OLED display module 1 to be tested and the heating member 4. When the OLED display module 1 and the heating member 4 cannot be seamlessly attached, the heat-conducting filling part 7 can improve the heat conduction efficiency between the heating member 4 and the OLED display module 1. As shown in the figure, the temperature difference between the OLED display module 1 and the heating member 4 can be less than 1℃ during the heating process of the OLED display module 1 by the heating member.

[0038] As shown in Figure 4 , The OLED display module 1 comprises a curved screen. The curved screen refers to the edge part of the OLED display module 1 being a curved structure with a certain curvature. The heat-conducting filling part 7 can fill the gap between the curved screen and the heating member 4.

[0039] Figure 1 and Figure 5 , Figure 5 Another schematic diagram of the electrostatic testing device for the OLED display module is shown in the figure. The OLED display module 1 can also be provided as a straight screen. The straight screen refers to the OLED display module 1 not comprising a curved structure, and each region being a plane.

[0040] During the electrostatic testing of the OLED display module 1, whether the OLED display module 1 adopts the curved screen shown in Figure 4 or the straight screen structure shown in Figure 5 , the electrostatic testing device comprising the heat-conducting filling part 7 can be adopted to eliminate the heating difference of OLED display modules 1 with different forms, and facilitate the comparison of the anti-static performance of products with different forms.

[0041] As shown in the figure, the heat-conducting filling part 7 comprises a silica gel pad.

[0042] Optionally, the thickness of the silica gel pad is T, and 2.5mm≤T≤3.5mm. For example, T=3mm.

[0043] As shown in the figure, Figure 6 , Figure 6This invention provides a temperature curve comparison diagram of a heating element and an OLED display module, where the horizontal axis represents time and the vertical axis represents temperature. Curve 1 represents the temperature change curve of the heating element, curve 2 represents the temperature change curve of the OLED display module when heated by the heating element without a silicone pad, and curve 3 represents the temperature change curve of the OLED display module when heated by the heating element with a silicone pad. It can be seen that the temperature difference between the OLED display module and the heating element can be reduced after the silicone pad is installed. This indicates that the thermal conductivity between the heating element and the OLED display module is improved after the silicone pad is installed, reducing heat loss during the thermal conduction process.

[0044] For example, such as Figure 1 As shown, the OLED display module 1 under test also includes foam 13 and copper plate 14. Foam 13 can provide a buffering effect for the OLED display module 1. Figure 1 As shown, the copper plate 14 is located on the side of the foam 13 away from the OLED display panel 11. When the OLED display module 1 is working, the copper plate 14 can be grounded.

[0045] Optional, such as Figure 2 As shown, the second conductive element 32 includes a copper plate 14. This arrangement simplifies the structure of the OLED display module 1.

[0046] For example, in this embodiment of the invention, the power supply 5 is used to provide a first voltage to the first conductive element 31 and a second voltage to the second conductive element 32. The voltage difference between the first voltage and the second voltage is ΔV, where 3kV ≤ ΔV ≤ 5kV. For example, ΔV = 4kV. When performing electrostatic discharge testing on the OLED display module 1, under the action of the electric field corresponding to this voltage difference, the static charge accumulated near the second conductive element 32 will migrate into the interior of the OLED display panel, thereby enabling the detection of weak points inside the OLED display panel. Moreover, this setup eliminates the need for human intervention, which helps improve detection accuracy.

[0047] The present invention compared the detection times of three electrostatic detection devices, and the results are as follows: Figure 7 As shown, the vertical axis represents time, and the horizontal axis uses a conventional method to represent time. Figure 3 The electrostatic detection device shown includes an electrostatic brush; the new method – without a silicone pad – indicates the use of… Figure 2 The electrostatic discharge (ESD) detection device shown does not include the silicone pad. A new method – the presence of a silicone pad indicates the use of… Figure 4 and Figure 5 The electrostatic discharge (ESD) detection device, including a silicone pad, is shown. It can be seen that the new method shortens the detection time compared to the conventional method. Furthermore, the ESD detection device with a silicone pad offers even shorter detection time and higher efficiency.

[0048] Based on the same inventive concept, the embodiment of the present application also provides an electrostatic test method for an OLED display module, the OLED display module comprising an OLED display panel, and the electrostatic test method comprises the following steps: Figure 2 and Figure 8 as shown in the figures, Figure 8 The electrostatic test method provided by the embodiment of the present application comprises the following steps: Step S1: a first conductive member 31 is arranged on a first surface S1 of the OLED display module 1 to be tested, the first surface S1 being located on the light-out side of the OLED display module 1 to be tested; Step S2: a second conductive member 32 is arranged on the side of the OLED display panel 11 away from the light-out side; Step S3: a heating member 4 is arranged on the side of the OLED display module 1 to be tested away from the light-out side; Step S4: the electrostatic generator 2 is used to discharge the OLED display module 1 to be tested; for example, the electrostatic generator 2 comprises a high-voltage source, such as an electrostatic gun. Optionally, during the electrostatic test of the OLED display module, the discharge voltage provided by the electrostatic generator 2 can gradually increase from a low voltage to a high voltage, so as to discharge the OLED display module multiple times until the failure point in the OLED display module 1 is found, and the failure point is the electrostatic weak point of the OLED display module. For example, the discharge voltage can gradually increase from ±1kV to ±20kV. For example, the electrostatic generator 2 can discharge once or multiple times at each discharge voltage.

[0049] Step S5: the power supply 5 is used to form an electric field between the first conductive member 31 and the second conductive member 32. Under the driving of the electric field, the electrostatic charge will move from the second conductive member 32 to the side of the first conductive member 31, that is, an electrostatic charge conduction path is formed between the second conductive member 32 and the first conductive member 31, so as to avoid the accumulation of electrostatic charge at the local position outside the OLED display panel 11. For example, the accumulation of electrostatic charge near the second conductive member 32 can be avoided. By using the method provided by the embodiment of the present application, the electrostatic charge can enter the inside of the OLED display panel 11, so that the electrostatic environment of the OLED display panel 11 during the test process is closer to the electrostatic environment of the OLED display panel 11 during the subsequent factory use process, thereby improving the accuracy of the electrostatic test.

[0050] Moreover, in the process of introducing the static electricity into the interior of the OLED display panel, the first conductive piece 31 can be used to avoid using the static brush, so that the static test efficiency can be improved and the static test period can be shortened. Moreover, in the static test process, based on the setting mode provided by the embodiment of the present application, the position of the first conductive piece does not need to be moved, so that the electric field between the first conductive piece and the second conductive piece can be more stable and is not affected by human factors, thereby improving the accuracy of the test results.

[0051] On the other hand, the static test device provided by the embodiment of the present application further comprises a heating piece. In the process of static test on the OLED display module, the heating piece can be used to heat the OLED display module, so as to simulate the environment generated by the internal circuit heating when the OLED display module works, and improve the failure speed of the OLED display panel, thereby shortening the static test period. Moreover, by using the setting mode, the OLED display panel does not need to be turned on as a whole, so that the dependence on the test equipment can be reduced, the operation is facilitated, and in addition, the temperature accuracy of the OLED display panel in the heating process can be improved.

[0052] It should be noted that, Figure 8 The order of the steps S1, S2, S3, S4 and S5 shown is only illustrative, and the embodiment of the present application does not limit the order of the above steps. For example, the order of the steps S2, S3, S1, S4 and S5 can also be performed.

[0053] The above is only the preferred embodiment of the present application, and is not used to limit the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

[0054] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. An electrostatic testing device for OLED display modules, characterized in that, The OLED display module includes an OLED display panel, and the electrostatic testing device includes: An electrostatic generator is used to discharge onto an OLED display module under test. A first conductive element is disposed on a first surface of the OLED display module under test; the first surface is located on the light-emitting side of the OLED display module under test. A heating element is provided on the side of the OLED display module under test that is away from the light-emitting side; The second conductive element is disposed on the side of the OLED display panel away from the light-emitting side; A power source is used to create an electric field between the first conductive element and the second conductive element.

2. The electrostatic testing device according to claim 1, characterized in that, The first conductive element at least partially covers the first surface.

3. The electrostatic testing device according to claim 1, characterized in that, The first conductive element includes a conductive cloth.

4. The electrostatic testing device according to claim 3, characterized in that, The OLED display module under test includes a cover plate and an OLED display panel, and the surface of the cover plate away from the OLED display panel includes the first surface; The conductive cloth is used to adhere to the first surface.

5. The electrostatic testing device according to claim 1, characterized in that, The surface of the heating element near the OLED display module under test includes a plane.

6. The electrostatic testing device according to claim 1, characterized in that, The heating element includes a constant temperature heating platform.

7. The electrostatic testing device according to claim 1, characterized in that, It also includes a thermally conductive filling portion, which is used to fill the gap between the OLED display module under test and the heating element.

8. The electrostatic testing device according to claim 7, characterized in that, The thermally conductive filling portion includes a silicone pad.

9. The electrostatic testing device according to claim 8, characterized in that, The thickness of the silicone pad is T, where 2.5mm ≤ T ≤ 3.5mm.

10. The electrostatic testing device according to claim 1, characterized in that, The OLED display module under test includes an OLED display panel, foam, and copper foil, with the copper foil located on the side of the foam away from the OLED display panel. The second conductive element includes the copper foil.

11. The electrostatic testing device according to claim 1, characterized in that, The power supply is used to provide a first voltage to the first conductive element and a second voltage to the second conductive element, wherein the voltage difference between the first voltage and the second voltage is ΔV, and 3kV≤ΔV≤5kV.

12. A method for electrostatic testing of OLED display modules, characterized in that, The OLED display module includes an OLED display panel, and the electrostatic testing method includes: A first conductive element is disposed on the first surface of the OLED display module under test, and the first surface is located on the light-emitting side of the OLED display module under test. A second conductive element is disposed on the side of the OLED display panel away from the light-emitting side; A heating element is provided on the side of the OLED display module under test away from the light-emitting side; Discharge is applied to the OLED display module under test using an electrostatic generator; An electric field is created between the first conductive element and the second conductive element using a power source.

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