Screen control circuit and electronic equipment

Abstract

The invention provides a screen control circuit and electronic equipment. An embedded controller and a Hall sensor are respectively connected with an input port of an AND gate, and an output port of the AND gate is connected with a backlight controller and / or a touch controller. When the cover is closed, the Hall sensor outputs a low-level signal, no matter whether the embedded controller outputs a high-level signal or a low-level signal, the AND gate outputs the low-level signal, and the backlight controller and the touch controller receive the low-level signal, so that the screen function is closed, and the screen function is ensured to be normal when the cover is closed when the EC fails.

Description

Technical Field

[0001] This application relates to the field of electronic equipment technology, and more particularly to a screen control circuit and electronic equipment. Background Technology

[0002] With the development of technology, various flip devices have emerged, including laptops and flip phones. When powered on, a flip device allows the screen to be turned on when the lid is open and off when the lid is closed. The screen functions as a power-on function and / or a touch function.

[0003] In the existing technology, the control of the screen of a flip device is usually achieved by an embedded controller (EC) monitoring whether the cover is open or closed; when the cover is open, an open signal is sent to the screen function controller to turn on the screen function; when the cover is closed, a close signal is sent to the screen function controller to turn off the screen function.

[0004] In summary, the existing screen control method for flip devices relies solely on the EC (Electronic Control Unit) to control screen functions. When the EC malfunctions, it can lead to abnormal screen functions when the flip is closed. Summary of the Invention

[0005] The screen control circuit and electronic device provided in this application are used to solve the problem of abnormal screen function when the cover is closed in the prior art due to EC failure.

[0006] In a first aspect, embodiments of this application provide a screen control circuit, including:

[0007] Embedded controllers, Hall sensors, and AND gates;

[0008] The first input port of the AND gate is connected to the Hall sensor, the second input port of the AND gate is connected to the first control port of the embedded controller, and the power input terminal of the AND gate is connected to the first power supply port.

[0009] The output port of the AND gate is connected to the backlight controller and / or the touch controller;

[0010] The Hall sensor is used to output a low-level signal when a magnet is detected and a high-level signal when no magnet is detected.

[0011] In one possible implementation, the screen control circuit further includes a first N-channel MOSFET and a first resistor;

[0012] The output port of the AND gate is connected to the source of the first N-channel MOS transistor;

[0013] The gate of the first N-channel MOS is connected with a second power supply port, the first end of the first resistor is connected with the touch controller and the drain of the first N-channel MOS respectively, and the second end of the first resistor is connected with a third power supply port; the third power supply port outputs a high level signal.

[0014] In a possible implementation, the first power supply port and the second power supply port have the same power supply voltage, and the power supply voltage is a high level.

[0015] In a possible implementation, the power supply input of the AND gate is connected with the first end of the capacitor, and the second end of the capacitor is grounded.

[0016] In a possible implementation, the screen control circuit further comprises a test control unit.

[0017] The first control port of the test control unit is connected with the second control port of the embedded controller.

[0018] The second control port of the test control unit is connected with the Hall sensor.

[0019] The output port of the test control unit is connected with the first input port of the AND gate.

[0020] In a possible implementation, the embedded controller is configured to:

[0021] output a low level signal through the second control port when detecting that the flip device is in a test mode;

[0022] output a high level signal through the second control port and output a high level signal through the first control port when detecting that the flip device is in a non-test mode.

[0023] In a possible implementation, the test control unit is configured to:

[0024] output a high level signal through the output port when receiving a high level signal through the first control port and receiving a high level signal through the second control port;

[0025] output a low level signal through the output port when receiving a high level signal through the first control port and receiving a low level signal through the second control port;

[0026] output a high level signal through the output port when receiving a low level signal through the first control port and receiving a high level signal through the second control port;

[0027] outputs a high level signal through its output port when it receives a low level signal through its first control port and receives a low level signal through its second control port.

[0028] In a possible implementation, the test control unit comprises a second N-channel MOS tube, a third N-channel MOS tube and a second resistor.

[0029] In a possible implementation, the gate of the second N-channel MOS tube is connected with a second control port of the embedded controller, the source of the second N-channel MOS tube is connected with the Hall sensor, and the drain of the second N-channel MOS tube is connected with the drain of the third N-channel MOS tube.

[0030] The gate of the third N-channel MOS tube is connected with a fourth power supply port and a second end of the second resistor respectively, the source of the third N-channel MOS tube is connected with a first end of the second resistor and a first input port of the AND gate respectively, and the fourth power supply port outputs a high level signal.

[0031] In a possible implementation, the test control unit further comprises a third resistor.

[0032] A first end of the third resistor is connected with the gate of the second N-channel MOS tube, a second end of the third resistor is connected with a fifth power supply port, and the fifth power supply port outputs a high level signal.

[0033] In a second aspect, the embodiments of the present application provide an electronic device, comprising a screen control circuit and a magnet.

[0034] The screen control circuit is the screen control circuit in any one of the first aspect.

[0035] The magnet and one of the Hall sensors in the screen control circuit are arranged in an upper cover part of the electronic device, and the other is arranged in a host part of the electronic device.

[0036] The screen control circuit and the electronic device provided by the embodiments of the present application are characterized in that the embedded controller and the Hall sensor are connected with the input ports of the AND gate respectively, the output port of the AND gate is connected with the backlight controller and / or the touch controller. When the cover is closed, the Hall sensor outputs a low level signal, and no matter whether the embedded controller outputs a high level signal or a low level signal, the AND gate outputs a low level signal, and the backlight controller and the touch controller will receive a low level signal, thereby realizing the screen function shutdown and ensuring the normal screen function when the cover is closed in the EC failure. BRIEF DESCRIPTION OF DRAWINGS

[0037] The accompanying drawings, which are incorporated herein and constitute part of this specification, illustrate embodiments consistent with the application and, together with the description, further serve to explain the principles of the application.

[0038] Figure 1 Structure diagram of screen control circuit embodiment one provided by the present application;

[0039] Figure 2 Structure diagram of screen control circuit embodiment two provided by the present application;

[0040] Figure 3 Structure diagram of screen control circuit embodiment three provided by the present application;

[0041] Figure 4 Structure diagram of screen control circuit embodiment four provided by the present application;

[0042] Figure 5 Structure diagram of screen control circuit embodiment five provided by the present application;

[0043] Figure 6 Structure diagram of screen control circuit embodiment six provided by the present application.

[0044] The specific embodiments of the present application have been shown by the above-described drawings, and will be described in more detail hereinafter. These drawings and written description are not intended to restrict the scope of the concept of the present application by any means, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0045] The exemplary embodiments will be described in detail herein with reference to the attached drawings. The description of the exemplary embodiments is intended to apply to various alternative embodiments of the application. It is to be understood that features illustrated or described as part of one embodiment can be provided with one or more of the other embodiments as well. Variations to these embodiments can become apparent to those of ordinary skill in the art once the concepts of the application are understood. The following detailed description is, therefore, not to be taken in a limiting sense, as the scope of the application is defined by the appended claims and equivalents thereof.

[0046] The terms "first", "second", "third", "fourth" and the like in the description and in the claims of the present application, and above-mentioned drawings, if any, are used to distinguish between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the use of the terms so-termed "first", "second", "third", "fourth" and the like, if any, in the description and in the claims of the present application is not used to describe a particular sequential or chronological order, unless otherwise expressly stated. It is to be understood that the data so used in the description and in the claims of the present application can be interchanged, where appropriate, to refer to a similar one, in order that the embodiments of the present application described herein can be implemented in other than the order described or shown herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover the non-exclusive inclusion of the steps or elements described, for example, of processes, methods, systems, products or devices, and that the processes, methods, systems, products or devices can include additional steps or elements not expressly listed or inherent to such processes, methods, systems, products or devices.

[0047] With the development of technology, various flip devices have emerged, such as notebook computers, flip phones, etc. The notebook flip device can realize the opening of the screen function when the lid is opened, and the closing of the screen function when the lid is closed under the condition of starting. The screen function is the screen-on function, and / or the touch function.

[0048] In the prior art, the control of the screen of the flip device is usually monitored by the embedded controller (EC) whether the lid is opened or closed. When the lid is opened, an opening signal is sent to the controller of the screen function, and the screen function is opened. When the lid is closed, a closing signal is sent to the controller of the screen function, and the screen function is closed. However, when the EC fails, the screen function will be abnormal when the lid is closed.

[0049] In view of the problems existing in the prior art, the inventors found that a Hall sensor, a magnet and an AND gate can be added to the flip device during the research on the screen control circuit of the flip device. The embedded controller and the Hall sensor are respectively connected with the input ports of the AND gate, and the output port of the AND gate is connected with the backlight controller and / or the touch controller. When the flip device is closed, the Hall sensor outputs a low-level signal. Regardless of whether the embedded controller outputs a high-level signal or a low-level signal, the AND gate outputs a low-level signal, and the backlight controller and the touch controller will both receive the low-level signal, thereby realizing the screen-off and the non-working of the touch control when the lid is closed, and ensuring the normal screen function when the lid is closed. Based on the above inventive concept, the screen control circuit in the present application is designed.

[0050] The technical solutions of the present application will be described in detail below through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes can not be described in detail in some embodiments.

[0051] Exemplarily, Figure 1 The structure diagram of the screen control circuit embodiment one provided by the present application is as follows,Figure 1 As shown in the figure, the screen control circuit comprises an embedded controller 101, a Hall sensor 102, and an AND gate 103.

[0052] The first input port of the AND gate 103 is connected with the Hall sensor 102, the second input port of the AND gate 103 is connected with the first control port of the embedded controller 101, and the power input of the AND gate 103 is connected with the first power supply port 107.

[0053] The output port of the AND gate 103 is connected with the backlight controller 106 and / or the touch controller 109. In the figure, the output port of the AND gate 103 is connected with the backlight controller 106 and the touch controller 109, and the output port of the AND gate 103 can also be connected with only the backlight controller 106 or only the touch controller 109.

[0054] It should be noted that the AND gate 103 also comprises a grounding end (not shown in the figure), which is grounded.

[0055] The Hall sensor 102 is used to output a low-level signal when a magnet is detected, and output a high-level signal when no magnet is detected; one of the magnets and the Hall sensor 102 is arranged on the upper cover part of the flip device, and the other is arranged on the main part of the flip device. The flip device can be divided into two parts by the rotating shaft, one part with a screen is the upper cover part, and the other part without a screen is the main part; if both parts have a screen, one part is the upper cover part and the other part is the main part.

[0056] It should be noted that after the cover is closed, the projections of the magnets and the Hall sensor 102 on the horizontal plane are in the same position, which can improve the detection accuracy of the Hall sensor 102.

[0057] The embedded controller 101 is used to output a high-level signal through the first control port when the flip device is opened in the on state of the flip device, and output a low-level signal through the first control port when the flip device is closed.

[0058] The AND gate 103 is used to output a low-level signal through the output port when a low-level signal is received through at least one of the first input port and the second input port, and output a high-level signal through the output port when high-level signals are received through the first input port and the second input port.

[0059] In the normal case of the embedded controller 101:

[0060] When the flip device is closed, the embedded controller 101 outputs a low level signal to the second input port of the AND gate 103 through the first control port, and the Hall sensor 102 outputs a low level signal to the first input port of the AND gate 103, so the AND gate 103 outputs a low level signal through the output port.

[0061] When the output port of the AND gate 103 is connected to the backlight controller 106 only, the backlight controller 106 can receive the low level signal to control the screen of the flip device to be off. When the output port of the AND gate 103 is connected to the touch controller 109 only, the touch controller 109 can receive the low level signal to control the screen of the flip device to be touch-inoperable. When the output port of the AND gate 103 is connected to the backlight controller 106 and the touch controller 109, the backlight controller 106 can receive the low level signal to control the screen of the flip device to be off, and the touch controller 109 can receive the low level signal to control the screen of the flip device to be touch-inoperable.

[0062] When the flip device is opened, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, and the Hall sensor 102 outputs a high level signal to the first input port of the AND gate 103, so the AND gate 103 outputs a high level signal through the output port.

[0063] When the output port of the AND gate 103 is connected to the backlight controller 106 only, the backlight controller 106 can receive the high level signal to control the screen of the flip device to be on. When the output port of the AND gate 103 is connected to the touch controller 109 only, the touch controller 109 can receive the high level signal to control the screen of the flip device to be touch-operable. When the output port of the AND gate 103 is connected to the backlight controller 106 and the touch controller 109, the backlight controller 106 can receive the high level signal to control the screen of the flip device to be on, and the touch controller 109 can receive the high level signal to control the screen of the flip device to be touch-operable.

[0064] In the case of failure of the embedded controller 101:

[0065] When the flip device is closed, the embedded controller 101 can output a high level signal or a low level signal through the first control port, and the Hall sensor 102 outputs a low level signal to the first input port of the AND gate 103, so the AND gate 103 outputs a low level signal through the output port.

[0066] When the output port of the AND gate 103 is connected to the backlight controller 106 only, the backlight controller 106 can receive a low-level signal to control the screen of the flip device to be off. When the output port of the AND gate 103 is connected to the touch controller 109 only, the touch controller 109 can receive a low-level signal to control the touch function of the screen of the flip device to be disabled. When the output port of the AND gate 103 is connected to the backlight controller 106 and the touch controller 109, the backlight controller 106 can receive a low-level signal to control the screen of the flip device to be off, and the touch controller 109 can receive a low-level signal to control the touch function of the screen of the flip device to be disabled.

[0067] When the flip device is opened, the Hall sensor 102 outputs a high-level signal to the first input port of the AND gate 103. If the embedded controller 101 outputs a high-level signal through the first control port, the AND gate 103 outputs a high-level signal through the output port, and the screen function is normal, and the user can use the computer normally. If the embedded controller 101 outputs a low-level signal through the first control port, the AND gate 103 outputs a low-level signal through the output port, and the screen is off and the touch function of the screen is disabled, so that the user can be reminded of the computer failure in time for maintenance.

[0068] In an implementation manner, the screen control circuit further comprises a capacitor (not shown in the figure). The power input end of the AND gate 103 is connected to the first end of the capacitor, and the second end of the capacitor is grounded. The capacitor can act as a local power supply to provide transient current for the AND gate 103, and at the same time can reduce the parasitic inductance and high-frequency noise of the wire, and improve the operation stability of the AND gate 103.

[0069] The screen control circuit provided by the embodiment is connected to the input port of the AND gate through the embedded controller and the Hall sensor respectively, and the output port of the AND gate is connected to the backlight controller and / or the touch controller. When the flip device is closed, the Hall sensor outputs a low-level signal, and no matter whether the embedded controller outputs a high-level signal or a low-level signal, the AND gate outputs a low-level signal, and the backlight controller and the touch controller will receive a low-level signal, thereby realizing the functions of closing the screen and disabling the touch function when the flip device is closed, and ensuring the normal screen function when the embedded controller fails. In addition, when the embedded controller is normal, the screen control circuit can ensure the normal screen function when the flip device is opened and closed.

[0070] Based on the above-mentioned Figure 1 the above-mentioned Figure 2 the above-mentioned Figure 2As shown, the screen control circuit further comprises a first N-channel MOS transistor 104 and a first resistor 105.

[0071] In the first embodiment, in the case that the output port of the AND gate 103 needs to be connected to the touch controller 109, if the voltage output by the AND gate 103 does not match the input voltage of the touch controller 109, level conversion is needed, and the first N-channel MOS transistor 104 and the first resistor 105 are needed to realize the level conversion. In the figure, the output port of the AND gate 103 is connected to the backlight controller 106, and the output port of the AND gate 103 can also not be connected to the backlight controller 106.

[0072] The output port of the AND gate 103 is connected to the source of the first N-channel MOS transistor 104 and the backlight controller 106 respectively;

[0073] The gate of the first N-channel MOS transistor 104 is connected to the second power supply port 108, the first end of the first resistor 105 is connected to the touch controller 109 and the drain of the first N-channel MOS transistor 104 respectively, and the second end of the first resistor 105 is connected to the third power supply port 110; the third power supply port 110 outputs a high-level signal.

[0074] The power supply voltage of the first power supply port 107 and the second power supply port 108 is the same and is high; the power supply voltage of the third power supply port 110 is greater than the power supply voltage of the first power supply port 107 and the second power supply port 108.

[0075] The embedded controller 101 is used to output a high-level signal through the first control port when the flip device is detected to be opened in the on state of the flip device, and output a low-level signal through the first control port when the flip device is detected to be closed.

[0076] When the AND gate 103 outputs a low-level signal through the output port, the voltage difference between the gate and the source of the first N-channel MOS transistor 104 is greater than the threshold voltage because the power supply voltage of the second power supply port 108 is high, and the first N-channel MOS transistor 104 is turned on. Since the first resistor 105 is a pull-up resistor, the level received by the touch controller 109 is a low-level signal when the first N-channel MOS transistor 104 is turned on, so the touch controller 109 controls the screen touch of the flip device to not work.

[0077] When the AND gate 103 outputs a high level signal through the output port, the voltage difference between the gate and the source of the first N-channel MOS tube 104 is less than the threshold voltage because the supply voltage of the second supply port 108 is high level, so the first N-channel MOS tube 104 is off. Because the first resistor 105 is a pull-up resistor, when the first N-channel MOS tube 104 is off, the level received by the touch controller 109 is a high level signal, so the touch controller 109 controls the screen touch of the flip device to work.

[0078] Through the first N-channel MOS tube 104 and the first resistor 105, the signal output by the AND gate 103 can be converted to the signal specification corresponding to the touch controller 109.

[0079] It can be known from the first embodiment that the screen control circuit of the second embodiment can realize that, in the case that the embedded controller 101 is normal, when the flip device is closed, the screen is turned off and the screen touch does not work; when the flip device is opened, the screen is turned on and the screen touch works. In the case that the embedded controller 101 is faulty, when the flip device is closed, the screen is turned off and the screen touch does not work.

[0080] The screen control circuit provided in the embodiment realizes level conversion through the first N-channel MOS tube and the first resistor, and ensures the normal operation of the touch controller. In addition, when the flip device is closed, the Hall sensor outputs a low level signal, and no matter whether the embedded controller outputs a high level signal or a low level signal, the AND gate outputs a low level signal, and the backlight controller and the touch controller will both receive the low level signal, thereby realizing that the screen is turned off and the screen touch does not work when the flip device is closed, and ensuring that the screen functions normally when the embedded controller is faulty. In addition, when the embedded controller is normal, the screen control circuit can ensure that the screen functions normally when the flip device is opened and closed.

[0081] For example, on the basis of the above-mentioned Figure 2 embodiment, Figure 3 The structure schematic diagram of the screen control circuit provided in the third embodiment of the application is shown in FIG. 11. Figure 3 The screen control circuit further includes a test control unit 111.

[0082] Because the flip device also needs to be tested, during the test, the screen needs to be turned on and the screen touch needs to work. During the test, the flip device needs to be opened at a small angle and placed in an inverted V shape to save space, or the flip device needs to be closed and placed vertically to save space. Because the flip device is opened at a small angle, the Hall sensor 102 may detect a magnet, so that the screen is turned off and the screen touch does not work, and the test cannot be performed; also because the flip device is closed, the screen is turned off and the screen touch does not work, and the test cannot be performed. In order to solve this problem, in the Figure 2On the basis of the embodiment shown, a test control unit 111 is added.

[0083] The first control port of the test control unit 111 is connected to the second control port of the embedded controller 101.

[0084] The second control port of the test control unit 111 is connected to the Hall sensor 102.

[0085] The output port of the test control unit 111 is connected to the first input port of the AND gate 103.

[0086] The embedded controller 101 is further configured to:

[0087] When detecting that the flip device is in the test mode, output a low-level signal through the second control port thereof, and output a high-level signal through the first control port thereof. When detecting that the flip device is in the non-test mode, output a high-level signal through the second control port thereof, and in the power-on state of the flip device, output a high-level signal through the first control port when detecting that the flip device is opened, and output a low-level signal through the first control port when detecting that the flip device is closed.

[0088] It should be noted that the user can perform a mode selection operation on the flip device, so that the flip device can determine whether to enter the test mode or the non-test mode according to the operation of the user, and the embedded controller 101 can determine whether the flip device is in the test mode or the non-test mode.

[0089] The test control unit 111 is configured to:

[0090] When receiving a high-level signal through the first control port thereof and receiving a high-level signal through the second control port thereof, output a high-level signal through the output port thereof.

[0091] When receiving a high-level signal through the first control port thereof and receiving a low-level signal through the second control port thereof, output a low-level signal through the output port thereof.

[0092] When receiving a low-level signal through the first control port thereof and receiving a high-level signal through the second control port thereof, output a high-level signal through the output port thereof.

[0093] When receiving a low-level signal through the first control port thereof and receiving a low-level signal through the second control port thereof, output a high-level signal through the output port thereof.

[0094] In the case where the embedded controller 101 detects that the flip device is in the test mode:

[0095] When the flip device is closed, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, the embedded controller 101 outputs a low level signal to the first control port of the control unit 111 through the second control port, and the Hall sensor 102 outputs a low level signal to the second control port of the test control unit 111. The control unit 111 outputs a high level signal to the first input port of the AND gate 103 through the output port, so the AND gate 103 outputs a high level signal from the output port. As can be known in combination with Embodiment One and Embodiment Two, the screen is bright, the screen touch works, and the test can be performed.

[0096] When the flip device is closed, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, the embedded controller 101 outputs a low level signal to the first control port of the control unit 111 through the second control port, and the Hall sensor 102 outputs a low level signal to the second control port of the test control unit 111. The control unit 111 outputs a high level signal to the first input port of the AND gate 103 through the output port, so the AND gate 103 outputs a high level signal from the output port. As can be known in combination with Embodiment One and Embodiment Two, the screen is bright, the screen touch works, and the test can be performed.

[0097] When the flip device is closed, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, the embedded controller 101 outputs a low level signal to the first control port of the control unit 111 through the second control port, and the Hall sensor 102 outputs a low level signal to the second control port of the test control unit 111. The control unit 111 outputs a high level signal to the first input port of the AND gate 103 through the output port, so the AND gate 103 outputs a high level signal from the output port. As can be known in combination with Embodiment One and Embodiment Two, the screen is bright, the screen touch works, and the test can be performed.

[0098] When the flip device is closed, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, the embedded controller 101 outputs a low level signal to the first control port of the control unit 111 through the second control port, and the Hall sensor 102 outputs a low level signal to the second control port of the test control unit 111. The control unit 111 outputs a high level signal to the first input port of the AND gate 103 through the output port, so the AND gate 103 outputs a high level signal from the output port. As can be known in combination with Embodiment One and Embodiment Two, the screen is bright, the screen touch works, and the test can be performed.

[0099] When the flip device is closed, the embedded controller 101 outputs a high level signal to the second input port of the AND gate 103 through the first control port, the embedded controller 101 outputs a low level signal to the first control port of the control unit 111 through the second control port, and the Hall sensor 102 outputs a low level signal to the second control port of the test control unit 111. The control unit 111 outputs a high level signal to the first input port of the AND gate 103 through the output port, so the AND gate 103 outputs a high level signal from the output port. As can be known in combination with Embodiment One and Embodiment Two, the screen is bright, the screen touch works, and the test can be performed.

[0100] The screen control circuit provided by the embodiment can ensure the screen to be bright and the screen touch to work when the flip device is opened and closed at a small angle in the test mode, and meet the test requirements. The flip device can ensure the functions of opening and closing to be normal in the non-test mode.

[0101] For example, based on the above-mentioned Figure 3 For example, based on the above-mentioned Figure 4 The structure diagram of the screen control circuit provided by the fourth embodiment of the application is shown in FIG. 4. Figure 4 The test control unit 111 includes a second N-channel MOS tube 112, a third N-channel MOS tube 113 and a second resistor 114.

[0102] The gate of the second N-channel MOS tube 112 is connected with the second control port of the embedded controller 101, the source of the second N-channel MOS tube 112 is connected with the Hall sensor 102, and the drain of the second N-channel MOS tube 112 is connected with the drain of the third N-channel MOS tube 113.

[0103] The gate of the third N-channel MOS tube 113 is connected with the fourth power supply port 115 and the second end of the second resistor 114 respectively, the source of the third N-channel MOS tube 113 is connected with the first end of the second resistor 114 and the first input port of the AND gate 103 respectively, and the fourth power supply port 115 outputs a high level signal.

[0104] The first control port of the test control unit 111 is the gate of the second N-channel MOS tube 112, the second control port of the test control unit 111 is the source of the second N-channel MOS tube 112, and the output port of the test control unit 111 is the source of the third N-channel MOS tube 113.

[0105] When the gate of the second N-channel MOS tube 112 receives a high level signal and the source of the second N-channel MOS tube 112 receives a high level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is disconnected, the second resistor 114 is a pull-up resistor, the fourth power supply port 115 outputs a high level signal, and therefore the voltage at the source of the third N-channel MOS tube 113 is a high level.

[0106] When the gate of the second N-channel MOS tube 112 receives a high-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is greater than the threshold voltage, the second N-channel MOS tube 112 is turned on, the third N-channel MOS tube 113 is turned on in the direction from the source to the drain due to the internal body diode, the voltage at the source of the third N-channel MOS tube 113 is a low level, and the second resistor 114 is a pull-up resistor.

[0107] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a high-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the source of the third N-channel MOS tube 113 is a high level.

[0108] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the source of the third N-channel MOS tube 113 is a high level.

[0109] In combination with Embodiment Two, it can be known that, by the test control unit 111 in the embodiment, the screen is bright and the screen touch works when the embedded controller 101 detects that the flip device is in the test mode.

[0110] When the embedded controller 101 detects that the flip device is in the non-test mode, the screen is off and the screen touch does not work when the flip device is closed, and the screen is bright and the screen touch works when the flip device is opened.

[0111] In an implementation manner, the test control unit 111 further includes a third resistor (not shown in the figure), a first end of the third resistor is connected with the gate of the second N-channel MOS tube 112, a second end of the third resistor is connected with a fifth power supply port, and the fifth power supply port outputs a high-level signal. By the third resistor, level conversion can be realized to adapt to N-channel MOS tubes of different specifications.

[0112] The screen control circuit provided by the embodiment can realize the function of the test control unit through the second N-channel MOS tube, the third N-channel MOS tube and the second resistor, so that the screen of the flip device is bright and the screen touch works in the test mode, and the test requirement is met. In the non-test mode, the flip device ensures the normal functions of opening and closing. In addition, the drain of the second N-channel MOS tube and the drain of the third N-channel MOS tube are connected, and the current cannot flow from the drain to the source of the third N-channel MOS tube, so that the screen control abnormality caused by leakage is avoided.

[0113] For example, on the basis of the embodiment shown in the above Figure 3 For example, on the basis of the embodiment shown in the above Figure 5 The structure schematic diagram of the screen control circuit embodiment five provided by the application is shown in the figure Figure 5 The test control unit 111 includes the second N-channel MOS tube 112, the diode 116 and the second resistor 114.

[0114] The gate of the second N-channel MOS tube 112 is connected with the second control port of the embedded controller 101, the source of the second N-channel MOS tube 112 is connected with the Hall sensor 102, and the drain of the second N-channel MOS tube 112 is connected with the negative electrode of the diode 116.

[0115] The positive electrode of the diode 116 is connected with the first end of the second resistor 114 and the first input port of the AND gate 103 respectively, the fourth power supply port 115 is connected with the second end of the second resistor 114, and the fourth power supply port 115 outputs a high level signal.

[0116] The first control port of the test control unit 111 is the gate of the second N-channel MOS tube 112, the second control port of the test control unit 111 is the source of the second N-channel MOS tube 112, and the output port of the test control unit 111 is the positive electrode of the diode 116.

[0117] When the gate of the second N-channel MOS tube 112 receives a high level signal and the source of the second N-channel MOS tube 112 receives a high level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is disconnected, the second resistor 114 is a pull-up resistor, the fourth power supply port 115 outputs a high level signal, and therefore the voltage at the positive electrode of the diode 116 is a high level.

[0118] When the gate of the second N-channel MOS tube 112 receives a high-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is greater than the threshold voltage, the second N-channel MOS tube 112 is turned on, the diode 116 is turned on from the positive electrode to the negative electrode, and the voltage at the positive electrode of the diode 116 is a low level.

[0119] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a high-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the positive electrode of the diode 116 is a high level.

[0120] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the positive electrode of the diode 116 is a high level.

[0121] In combination with Embodiment Two, it can be known that, by the test control unit 111 in the embodiment, the screen is bright and the screen touch works when the embedded controller 101 detects that the flip device is in the test mode.

[0122] When the embedded controller 101 detects that the flip device is in the non-test mode, the screen is off and the screen touch does not work when the flip device is closed, and the screen is bright and the screen touch works when the flip device is opened.

[0123] The screen control circuit provided in the embodiment realizes the function of the test control unit by the second N-channel MOS tube, the diode and the second resistor, so that the screen is bright and the screen touch works when the flip device is in the test mode, and the test requirement is met. When the flip device is in the non-test mode, the functions of opening and closing are ensured to be normal. In addition, because of the existence of the diode, the current cannot flow from the negative electrode to the positive electrode of the diode, so that the screen control abnormality caused by the leakage is avoided.

[0124] For example, on the basis of the above Figure 3 mentioned embodiments, Figure 6 the structure schematic diagram of the screen control circuit embodiment six provided in the application is shown in Figure 6 the test control unit 111 includes the second N-channel MOS tube 112 and the second resistor 114.

[0125] The gate of the second N-channel MOS tube 112 is connected with the second control port of the embedded controller 101, the source of the second N-channel MOS tube 112 is connected with the Hall sensor 102, and the drain of the second N-channel MOS tube 112 is connected with the first end of the second resistor 114 and the first input port of the AND gate 103 respectively.

[0126] The fourth power supply port 115 is connected with the second end of the second resistor 114, and the fourth power supply port 115 outputs a high-level signal.

[0127] The first control port of the test control unit 111 is the gate of the second N-channel MOS tube 112, the second control port of the test control unit 111 is the source of the second N-channel MOS tube 112, and the output port of the test control unit 111 is the drain of the second N-channel MOS tube 112.

[0128] When the gate of the second N-channel MOS tube 112 receives a high-level signal and the source of the second N-channel MOS tube 112 receives a high-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the fourth power supply port 115 outputs a high-level signal, so the voltage at the drain of the second N-channel MOS tube 112 is a high level.

[0129] When the gate of the second N-channel MOS tube 112 receives a high-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is greater than the threshold voltage, the second N-channel MOS tube 112 is turned on, the second resistor 114 is a pull-up resistor, and the voltage at the drain of the second N-channel MOS tube 112 is a low level.

[0130] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a high-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the drain of the second N-channel MOS tube 112 is a high level.

[0131] When the gate of the second N-channel MOS tube 112 receives a low-level signal and the source of the second N-channel MOS tube 112 receives a low-level signal, the voltage difference between the gate and the source of the second N-channel MOS tube 112 is less than the threshold voltage, the second N-channel MOS tube 112 is turned off, the second resistor 114 is a pull-up resistor, and the voltage at the drain of the second N-channel MOS tube 112 is a high level.

[0132] As can be seen from Embodiment 2, the test control unit 111 in this embodiment can enable the screen to light up and the screen touch to work when the embedded controller 101 detects that the flip device is in test mode.

[0133] When the embedded controller 101 detects that the flip device is in non-test mode, the screen is off and the touch screen is not working when the flip device is closed; the screen is on and the touch screen is working when the flip device is opened.

[0134] The screen control circuit provided in this embodiment uses a second N-channel MOSFET and a second resistor to realize the function of the test control unit. This allows the flip device to power on the screen and enable touch operation in test mode, meeting testing requirements. In non-test mode, the flip device ensures normal opening and closing functions.

[0135] This application also provides an electronic device, including a screen control circuit and a magnet, which is a flip device.

[0136] The screen control circuit is the screen control circuit in the above-described screen control circuit embodiment.

[0137] One of the magnets and the Hall sensor in the screen control circuit is located in the top cover of the flip device, and the other is located in the main body of the flip device. When the cover is closed, the projections of the magnet and the Hall sensor on the horizontal plane are at the same position, which can improve the detection accuracy of the Hall sensor.

[0138] The screen control circuit in this embodiment ensures normal screen function when the flip phone is closed, even in the event of an embedded controller failure. It also enables the screen to light up and the touchscreen to function in test mode, meeting testing requirements. In non-test mode, it ensures normal opening and closing functionality. Its implementation principle is similar to any of the screen control circuit embodiments described above and will not be repeated here.

[0139] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A screen control circuit, characterized in that, include: Embedded controllers, Hall sensors, and AND gates; The first input port of the AND gate is connected to the Hall sensor, the second input port of the AND gate is connected to the first control port of the embedded controller, and the power input terminal of the AND gate is connected to the first power supply port. The output port of the AND gate is connected to the backlight controller and / or the touch controller; The Hall sensor is used to output a low-level signal when a magnet is detected and a high-level signal when no magnet is detected.

2. The screen control circuit according to claim 1, characterized in that, The screen control circuit also includes a first N-channel MOSFET and a first resistor; The output port of the AND gate is connected to the source of the first N-channel MOS transistor; The gate of the first N-channel MOSFET is connected to the second power supply port, the first end of the first resistor is connected to the touch controller and the drain of the first N-channel MOSFET, and the second end of the first resistor is connected to the third power supply port; the third power supply port outputs a high-level signal.

3. The screen control circuit according to claim 2, characterized in that, The power input terminal of the AND gate is connected to the first terminal of the capacitor, and the second terminal of the capacitor is grounded.

4. The screen control circuit according to any one of claims 1 to 3, characterized in that, The screen control circuit also includes a test control unit; The first control port of the test control unit is connected to the second control port of the embedded controller; The second control port of the test control unit is connected to the Hall sensor; The output port of the test control unit is connected to the first input port of the AND gate.

5. The screen control circuit according to claim 4, characterized in that, The embedded controller is used for: When the flip device is detected to be in test mode, a low-level signal is output through its second control port and a high-level signal is output through its first control port. When the flip device is detected to be in non-test mode, a high-level signal is output through its second control port.

6. The screen control circuit according to claim 5, characterized in that, The test control unit is used for: When a high-level signal is received through its first control port and a high-level signal is received through its second control port, a high-level signal is output through its output port. When a high-level signal is received through its first control port and a low-level signal is received through its second control port, a low-level signal is output through its output port. When it receives a low-level signal through its first control port and a high-level signal through its second control port, it outputs a high-level signal through its output port. When a low-level signal is received through its first control port and a low-level signal is received through its second control port, a high-level signal is output through its output port.

7. The screen control circuit according to claim 6, characterized in that, The test control unit includes a second N-channel MOSFET, a third N-channel MOSFET, and a second resistor.

8. The screen control circuit according to claim 7, characterized in that, The gate of the second N-channel MOSFET is connected to the second control port of the embedded controller, the source of the second N-channel MOSFET is connected to the Hall sensor, and the drain of the second N-channel MOSFET is connected to the drain of the third N-channel MOSFET. The gate of the third N-channel MOS transistor is connected to the fourth power supply port and the second end of the second resistor, respectively. The source of the third N-channel MOS transistor is connected to the first end of the second resistor and the first input port of the AND gate, respectively. The fourth power supply port outputs a high-level signal.

9. The screen control circuit according to claim 8, characterized in that, The test control unit also includes a third resistor; The first end of the third resistor is connected to the gate of the second N-channel MOS transistor, and the second end of the third resistor is connected to the fifth power supply port, which outputs a high-level signal.

10. An electronic device, characterized in that, Includes screen control circuitry and magnets; The screen control circuit is the screen control circuit described in any one of claims 1 to 9; The magnet and one of the Hall sensors in the screen control circuit are located on the top cover of the electronic device, and the other is located on the main body of the electronic device.

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