ATE test system and method of operational amplifier

Abstract

The invention discloses an ATE test system and method for an operational amplifier, and the system comprises a test seat which is used for detachably installing a tested dual-channel operational amplifier; the static parameter measurement module comprises a static parameter measurement circuit, a first switch module and a first auxiliary operational amplifier; after the static parameter measuring circuit is connected with the first auxiliary operational amplifier, a static parameter test is carried out on a first channel of the dual-channel operational amplifier; the dynamic parameter measurement module comprises a dynamic parameter measurement circuit, a second switch module and a second auxiliary operational amplifier; and after the dynamic parameter measuring circuit is connected with the second auxiliary operational amplifier, a dynamic parameter test is carried out on the second channel of the dual-channel operational amplifier. According to the technical scheme, all-parameter measurement of any two-channel operational amplifier is achieved, the testing convenience and universality are improved, and the testing efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip testing, and in particular to an ATE testing system and method for an operational amplifier. BACKGROUND

[0002] Under the background of rapid development of the integrated circuit industry, as a core component of electronic systems, the performance parameters of analog chips such as operational amplifiers directly determine the reliability and stability of terminal products. With the increasing complexity of chip design and the diversification of application scenarios, the market puts forward higher requirements for the efficiency, accuracy and universality of chip testing. The technical differences between traditional testing techniques and intelligent testing solutions are gradually highlighted. How to balance the testing cost, cover all-dimensional parameters and adapt to multiple types of chips has become the research direction in the field of chip testing.

[0003] There are mainly two core testing methods in the current chip testing technology field. One is a manual measurement method, which usually draws a test circuit board according to the typical circuit in the chip data manual. The circuit structure is simple. During the testing process, engineers need to manually disassemble or install resistors, capacitors and other components to change the module composition and layout of the test circuit, and then use oscilloscopes, multimeters, signal generators and other general instruments to complete the manual testing of chip performance parameters one by one. The other is an intelligent testing method, which needs to know the performance parameter characteristics of the tested chip in advance during the drawing of the test circuit board, and build a full-performance parameter test circuit module. Through the construction of a logic on-off circuit system by a relay, combined with the tested chip module, the test circuit module and the data storage module, the testing of different performance parameters of the chip is realized. The core is to use an automatic test equipment (ATE) combined with a C language test program to realize chip testing.

[0004] However, the manual testing method has the problems of low reliability of test results and low testing efficiency. Most intelligent testing methods can only test one or two parameters of the chip, and the testing dimension of a single test circuit board is limited, which has the problems of incomplete parameter coverage and poor universality. SUMMARY

[0005] The present application provides an ATE testing system and method for an operational amplifier to realize static parameter testing and dynamic parameter testing of any dual-channel operational amplifier.

[0006] According to an aspect of the present application, an ATE testing system for an operational amplifier is provided, which comprises:

[0007] The test seat is used for detachably mounting a double-channel operational amplifier to be tested, and after the double-channel operational amplifier is mounted, the pins of the double-channel operational amplifier are connected to the ports of the test seat in correspondence;

[0008] The static parameter measurement module comprises a static parameter measurement circuit, a first switch module and a first auxiliary operational amplifier; the static parameter measurement circuit is connected to the corresponding ports of the test seat, the first switch module is connected between the first auxiliary operational amplifier and the static parameter measurement circuit, the first switch module is used for turning on or turning off the connection between the first auxiliary operational amplifier and the static parameter measurement circuit, and after the static parameter measurement circuit is connected to the first auxiliary operational amplifier, the first channel of the double-channel operational amplifier is subjected to static parameter testing;

[0009] The dynamic parameter measurement module comprises a dynamic parameter measurement circuit, a second switch module and a second auxiliary operational amplifier; the dynamic parameter measurement circuit is connected to the corresponding ports of the test seat, the second switch module is connected between the second auxiliary operational amplifier and the dynamic parameter measurement circuit, the second switch module is used for turning on or turning off the connection between the second auxiliary operational amplifier and the dynamic parameter measurement circuit, and after the dynamic parameter measurement circuit is connected to the second auxiliary operational amplifier, the second channel of the double-channel operational amplifier is subjected to dynamic parameter testing.

[0010] Optionally, the static parameter measurement circuit comprises a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor and a first selection switch; the first switch module comprises a first control switch and a second control switch; and the double-channel operational amplifier comprises a first operational amplifier and a second operational amplifier.

[0011] A first end of the first resistor is connected to an inverting input end of the first operational amplifier, and a second end of the first resistor is grounded.

[0012] A first end of the second resistor is connected to a non-inverting input end of the first operational amplifier, and a second end of the second resistor is grounded.

[0013] A first end of the third resistor is connected to the non-inverting input end of the first operational amplifier, and a second end of the third resistor is grounded.

[0014] A first end of the fourth resistor is connected to the inverting input end of the first operational amplifier.

[0015] The first control switch is connected between a second end of the fourth resistor and an output end of the first auxiliary operational amplifier.

[0016] A first end of the fifth resistor is connected to the output end of the first operational amplifier, and a second end of the fifth resistor is connected to a first end of the sixth resistor.

[0017] The common terminal of the first selection switch is connected to the second terminal of the sixth resistor, the first terminal of the first selection switch is connected to a reference voltage, the second terminal of the first selection switch is grounded, and the first selection switch is used to select the common terminal with the first terminal or the second terminal.

[0018] The second control switch is connected between the second terminal of the fifth resistor and the inverting input terminal of the first auxiliary operational amplifier, and the non-inverting input terminal of the first auxiliary operational amplifier is grounded.

[0019] Optionally, the static parameter measurement circuit further comprises a seventh resistor, an eighth resistor, a third control switch and a fourth control switch.

[0020] The first terminal of the first resistor is connected to the inverting input terminal of the first operational amplifier through the seventh resistor, and the first terminal of the second resistor is connected to the non-inverting input terminal of the first operational amplifier through the eighth resistor.

[0021] The third control switch is connected in parallel with the seventh resistor, and the fourth control switch is connected in parallel with the eighth resistor.

[0022] Optionally, the static parameter measurement circuit further comprises a ninth resistor.

[0023] The first terminal of the ninth resistor is connected to the output terminal of the first operational amplifier, and the second terminal of the ninth resistor is grounded.

[0024] Optionally, the static parameter measurement circuit further comprises a third selection switch and a fourth selection switch.

[0025] The common terminal of the third selection switch is connected to the positive power supply terminal of the first operational amplifier, the first terminal, the second terminal and the third terminal of the third selection switch are connected to the positive pole of the first power supply, the positive pole of the second power supply and the positive pole of the third power supply respectively.

[0026] The common terminal of the fourth selection switch is connected to the negative power supply terminal of the first operational amplifier, the first terminal, the second terminal and the third terminal of the fourth selection switch are connected to the negative pole of the first power supply, the negative pole of the second power supply and the negative pole of the third power supply respectively.

[0027] The third selection switch is used to select the common terminal with the first terminal, the second terminal or the third terminal, and the fourth selection switch is used to select the common terminal with the first terminal, the second terminal or the third terminal.

[0028] Optionally, the static parameter measurement circuit further comprises a fifth selection switch.

[0029] The common terminal of the fifth selection switch is connected to the second terminals of the first resistor and the second resistor.

[0030] The first terminal of the fifth selection switch is connected to the fourth power supply, and the second terminal of the fifth selection switch is connected to the fifth power supply, the fifth selection switch is used to select the common terminal with the first terminal or the second terminal, the fourth power supply outputs a positive voltage, and the fifth power supply outputs a negative voltage.

[0031] Optionally, the dynamic parameter measurement circuit comprises a tenth resistor, an eleventh resistor, a twelfth resistor, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, an alternating current power supply and a sixth selection switch; the dual-channel operational amplifier comprises a first operational amplifier and a second operational amplifier; the second switch module comprises a fifth control switch and a sixth control switch;

[0032] The first end of the tenth resistor is connected to the inverting input end of the second operational amplifier, and the second end of the tenth resistor is grounded.

[0033] The first end of the eleventh resistor is connected to the non-inverting input end of the second operational amplifier, and the second end of the eleventh resistor is grounded.

[0034] The first end of the twelfth resistor is connected to the non-inverting input end of the second operational amplifier, and the second end of the twelfth resistor is connected to the alternating current power supply.

[0035] The first end of the thirteenth resistor is connected to the inverting input end of the second operational amplifier.

[0036] The fifth control switch is connected between the second end of the thirteenth resistor and the output end of the second auxiliary operational amplifier.

[0037] The first end of the fourteenth resistor is connected to the output end of the second operational amplifier, and the second end of the fourteenth resistor is connected to the first end of the fifteenth resistor.

[0038] The common end of the sixth selection switch is connected to the second end of the fifteenth resistor, the first end of the sixth selection switch is connected to a reference voltage, the second end of the sixth selection switch is grounded, and the sixth selection switch is used to select the common end and the first end or the second end.

[0039] The sixth control switch is connected between the second end of the fourteenth resistor and the inverting input end of the second auxiliary operational amplifier, and the non-inverting input end of the second auxiliary operational amplifier is grounded.

[0040] Optionally, the dynamic parameter measurement circuit further comprises a seventh control switch, an eighth control switch, a ninth control switch and a capacitor.

[0041] The first end of the thirteenth resistor is connected to the non-inverting input end of the second operational amplifier through the seventh control switch.

[0042] The eighth control switch is connected between the output end of the second operational amplifier and the output end of the second auxiliary operational amplifier.

[0043] The ninth control switch is connected between the output end of the second operational amplifier and the first end of the capacitor, and the second end of the capacitor is grounded.

[0044] According to another aspect of the present application, there is provided an ATE testing method of an operational amplifier, which is applied to the testing system of any embodiment of the present application, and the testing method comprises:

[0045] controlling the first switch module to be turned on and the second switch module to be turned off, and performing static parameter testing on the dual-channel operational amplifier;

[0046] controlling the second switch module to be turned on and the first switch module to be turned off, and performing dynamic parameter testing on the dual-channel operational amplifier.

[0047] Optionally, the testing method further comprises:

[0048] detecting whether the dual-channel operational amplifier is loaded into the testing seat;

[0049] after the dual-channel operational amplifier is loaded into the testing seat, supplying power to the dual-channel operational amplifier, turning off the power supply of the first auxiliary operational amplifier and the second auxiliary operational amplifier, and performing open-circuit and short-circuit testing on the dual-channel operational amplifier.

[0050] The technical solution of the embodiment of the present application can realize the replacement of testing of any dual-channel operational amplifier by using the testing seat of the SOP-8 packaged chip testing socket, and improves the convenience and universality of testing of the operational amplifier. By designing the static parameter measurement module and the dynamic parameter measurement module, the static measurement circuit in the static parameter measurement module is connected to the corresponding port of the testing seat, the static measurement circuit is connected to the first auxiliary operational amplifier through the first switch module, the static parameter measurement of the dual-channel operational amplifier is realized, the dynamic measurement circuit in the dynamic parameter measurement module is connected to the corresponding port of the testing seat, the dynamic measurement circuit is connected to the second auxiliary operational amplifier through the second switch module, and the dynamic parameter measurement of the dual-channel operational amplifier is realized. The technical solution of the embodiment of the present application realizes the full parameter measurement of the dual-channel operational amplifier, and improves the testing efficiency.

[0051] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0052] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0053] Figure 1A structural diagram of an ATE test system for an operational amplifier provided in an embodiment of the present invention;

[0054] Figure 2 A schematic diagram of an input offset voltage testing circuit provided in an embodiment of the present invention;

[0055] Figure 3 This is a schematic diagram of a bias current testing circuit provided in an embodiment of the present invention;

[0056] Figure 4 A schematic diagram of an open-loop voltage gain test circuit provided in an embodiment of the present invention;

[0057] Figure 5 A power supply voltage rejection ratio test circuit structure diagram provided in an embodiment of the present invention;

[0058] Figure 6 A common-mode voltage rejection ratio test circuit structure diagram provided in an embodiment of the present invention;

[0059] Figure 7 A gain-bandwidth product test circuit structure diagram provided in an embodiment of the present invention;

[0060] Figure 8 A circuit diagram for slew rate testing provided in an embodiment of the present invention;

[0061] Figure 9 A flowchart of an ATE test method for an operational amplifier provided in an embodiment of the present invention;

[0062] Figure 10 A flowchart of another ATE test method for an operational amplifier provided in an embodiment of the present invention;

[0063] Figure 11 A flowchart of another operational amplifier ATE test method provided in an embodiment of the present invention. Detailed Implementation

[0064] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0065] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in a sequence other than that shown or described in this invention. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0066] Figure 1 This is a structural diagram of an ATE test system for an operational amplifier provided in an embodiment of the present invention. The ATE test system for operational amplifiers is suitable for intelligent chip testing scenarios. For example, the ATE test system for operational amplifiers can intelligently test the performance parameters of a dual-channel operational amplifier.

[0067] like Figure 1 As shown, the ATE test system for the operational amplifier includes:

[0068] Test socket 110 is used for detachable installation of the dual-channel operational amplifier 140 under test. After the dual-channel operational amplifier 140 is installed, the pins of the dual-channel operational amplifier 140 are connected to the corresponding ports of the test socket 110.

[0069] The static parameter measurement module 120 includes a static parameter measurement circuit 121, a first switch module 122, and a first auxiliary operational amplifier A. The static parameter measurement circuit 121 is connected to the corresponding port of the test socket 110. The first switch module 122 is connected between the first auxiliary operational amplifier A and the static parameter measurement circuit 121. The first switch module 122 is used to turn on or off the connection between the first auxiliary operational amplifier A and the static parameter measurement circuit 121. After the static parameter measurement circuit 121 is connected to the first auxiliary operational amplifier A, static parameter testing is performed on the first channel 141 of the dual-channel operational amplifier 140.

[0070] The dynamic parameter measurement module 130 includes a dynamic parameter measurement circuit 131, a second switch module 132, and a second auxiliary operational amplifier B. The dynamic parameter measurement circuit 131 is connected to the corresponding port of the test socket 110. The second switch module 132 is connected between the second auxiliary operational amplifier B and the dynamic parameter measurement circuit 131. The second switch module 132 is used to turn on or off the connection between the second auxiliary operational amplifier B and the dynamic parameter measurement circuit 131. After the dynamic parameter measurement circuit 131 is connected to the second auxiliary operational amplifier B, dynamic parameter testing is performed on the second channel 142 of the dual-channel operational amplifier 140.

[0071] In this embodiment of the invention, the test socket 110 is a hardware carrier that supports a chip test socket and provides a test environment for the chip under test. For example, the chip under test can be a dual-channel operational amplifier 140. The dual-channel operational amplifier 140 has a first channel 141 and a second channel 142. The first channel 141 is a static parameter measurement channel and can be connected to a static parameter measurement module 120. The second channel 142 is a dynamic parameter measurement channel and can be connected to a dynamic parameter measurement module 130. The chip test socket can be a small outline package (SOP) structure with 8 pins, and the chip test socket is mounted on the test socket 110. The dual-channel operational amplifier 140 can be installed by connecting its pins to the ports of the test socket 110, and the dual-channel operational amplifier 140 can also be removed from the test socket 110.

[0072] The static parameter measurement module 120 is a component that enables the measurement of static parameters of the dual-channel operational amplifier 140. Static parameters refer to the electrical characteristic parameters of the dual-channel operational amplifier 140 in its static operating state, reflecting the performance, specifications, and other indicators of the dual-channel operational amplifier 140 itself. For example, static parameters may include input offset voltage, input offset current, bias current, quiescent power dissipation, open-loop voltage gain, power supply voltage rejection ratio, and operating mode voltage rejection ratio. The static parameter measurement module 120 includes a static parameter measurement circuit 121, a first switch module 122, and a first auxiliary operational amplifier A. The static parameter measurement circuit 121 is the core circuit that enables the static parameter measurement function. The first switch module 122 is a switching component used to control the connection state between the static parameter measurement circuit 121 and the first auxiliary operational amplifier A. For example, the first switch module 122 can be a relay, specifically a relay switch. The first auxiliary operational amplifier A is an operational amplifier used for signal conditioning, which is implemented by the auxiliary static parameter measurement circuit 121 to measure static parameters. The first auxiliary operational amplifier A is connected to the static parameter measurement circuit 121 through the first switch module 122 to measure the static parameters of the dual-channel operational amplifier 140.

[0073] The dynamic parameter measurement module 130 is a component that enables the measurement of dynamic parameters of the dual-channel operational amplifier 140. Dynamic parameters refer to the electrical characteristic parameters of the dual-channel operational amplifier 140 under dynamic operating conditions, reflecting its response capability and performance to changing signals. For example, dynamic parameters may include the gain-bandwidth product and slew rate. The dynamic parameter measurement module 130 includes a dynamic parameter measurement circuit 131, a second switch module 132, and a second auxiliary operational amplifier B. The dynamic parameter measurement circuit 131 is the core circuit that generates dynamic test signals for the dual-channel operational amplifier 140, acquires and analyzes the response signals of the dual-channel operational amplifier 140, and realizes the dynamic parameter measurement function. The second switch module 132 is a switching component used to control the connection state between the dynamic parameter measurement circuit 131 and the second auxiliary operational amplifier B. For example, the second switch module 132 can be a relay, specifically a relay switch. The second auxiliary operational amplifier B is an operational amplifier used by the auxiliary dynamic parameter measurement circuit 131 to measure dynamic parameters and amplify or filter dynamic signals. The second auxiliary operational amplifier B is connected to the dynamic parameter measurement circuit 131 through the second switch module 132 to measure the dynamic parameters of the dual-channel operational amplifier 140.

[0074] Specifically, the ATE test system for the operational amplifier includes a test socket 110, a static parameter measurement module 120, a dynamic parameter measurement module 130, and a dual-channel operational amplifier 140. The test socket 110 can be an SOP-8 packaged chip test socket. The dual-channel operational amplifier 140 can be installed or removed from the test socket 110 via corresponding pins. Optionally, the dual-channel operational amplifier 140 can be any dual-channel operational amplifier. The static parameter measurement module 120 includes a static parameter measurement circuit 121, a first switch module 122, and a first auxiliary operational amplifier A. The static parameter measurement circuit 121 is connected to the corresponding port of the test socket 110. The first switch module 122 is located between the first auxiliary operational amplifier A and the static parameter measurement circuit 121. When the first switch module 122 is in the ON state, the static parameter measurement circuit 121 is connected to the first auxiliary operational amplifier A, thereby enabling static parameter testing of the first channel 141 of the dual-channel operational amplifier 140 plugged into the test socket 110. The dynamic parameter measurement module 130 includes a dynamic parameter measurement circuit 131, a second switch module 132, and a second auxiliary operational amplifier B. The dynamic parameter measurement circuit 131 is connected to the corresponding port of the test socket 110. The second switch module 132 is located between the second auxiliary operational amplifier B and the dynamic parameter measurement circuit 131. When the second switch module 132 is in the ON state, the dynamic parameter measurement circuit 131 is connected to the second auxiliary operational amplifier B, thereby enabling dynamic parameter testing of the second channel 142 of the dual-channel operational amplifier 140 plugged into the test socket 110.

[0075] Optionally, both the first switch module 122 and the second switch module 132 can be double-pole double-throw relays. The first switch module 122 and the second switch module 132 are not simultaneously turned on. For example, the first switch module 122 is turned on and the second switch module 132 is turned off, or the first switch module 122 is turned off and the second switch module 132 is turned on. The on or off state of the first switch module 122 and the second switch module 132 can be controlled by the software program, thereby realizing arbitrary switching between static parameter testing and dynamic parameter testing of the dual-channel operational amplifier 140.

[0076] Optionally, the dual-channel operational amplifier 140, the first auxiliary operational amplifier A, and the second auxiliary operational amplifier B are all powered by a 5V power supply. The 5V power supply comes from the General Precision Measurement Unit (GPMU) module of the ATE tester. The GPMU can provide a wide power supply voltage of -3V to +8V, a current range of ±300mA, and strong driving capability. The first switch module 122 and the second switch module 132 are also powered by a 5V power supply, which comes from the UTILITY module of the ATE tester.

[0077] According to the technical solution of this invention, a test socket using an SOP-8 packaged chip test socket allows for the testing and replacement of any dual-channel operational amplifier, improving the convenience and versatility of operational amplifier testing. By designing a static parameter measurement module and a dynamic parameter measurement module, the static measurement circuit in the static parameter measurement module is connected to the corresponding port of the test socket. The static measurement circuit is connected to the first auxiliary operational amplifier via a first switch module, enabling static parameter measurement of the dual-channel operational amplifier. The dynamic measurement circuit in the dynamic parameter measurement module is connected to the corresponding port of the test socket. The dynamic measurement circuit is connected to the second auxiliary operational amplifier via a second switch module, enabling dynamic parameter measurement of the dual-channel operational amplifier. This technical solution of the present invention achieves full parameter measurement of the dual-channel operational amplifier, improving testing efficiency.

[0078] Figure 2 This is a structural diagram of an input offset voltage test circuit provided in an embodiment of the present invention. The static parameter measurement circuit can measure the input offset voltage parameter and static power consumption parameter of the chip under test. The chip under test is a dual-channel operational amplifier chip.

[0079] like Figure 2As shown, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, and a first selection switch K0; the first switch module 122 includes a first control switch 1221 and a second control switch 1222; the dual-channel operational amplifier includes a first operational amplifier DUT1 and a second operational amplifier.

[0080] The first terminal of the first resistor R1 is connected to the inverting input of the first operational amplifier DUT1, and the second terminal of the first resistor R1 is grounded; the first terminal of the second resistor R2 is connected to the non-inverting input of the first operational amplifier DUT1, and the second terminal of the second resistor R2 is grounded; the first terminal of the third resistor R3 is connected to the non-inverting input of the first operational amplifier DUT1, and the second terminal of the third resistor R3 is grounded; the first terminal of the fourth resistor R4 is connected to the inverting input of the first operational amplifier DUT1; the first control switch 1221 is connected between the second terminal of the fourth resistor R4 and the output terminal of the first auxiliary operational amplifier A; the fifth resistor... The first terminal of resistor R5 is connected to the output terminal of the first operational amplifier DUT1, and the second terminal of the fifth resistor R5 is connected to the first terminal of the sixth resistor R6. The common terminal of the first selection switch K0 is connected to the second terminal of the sixth resistor R6. The first terminal of the first selection switch K0 is connected to the reference voltage VREF, and the second terminal of the first selection switch K0 is grounded. The first selection switch K0 is used to select the common terminal with the first terminal or the second terminal. The second control switch 1222 is connected between the second terminal of the fifth resistor R5 and the inverting input terminal of the first auxiliary operational amplifier A. The non-inverting input terminal of the first auxiliary operational amplifier A is grounded, and GND indicates grounding.

[0081] In this embodiment of the invention, the dual-channel operational amplifier includes a first operational amplifier DUT1 and a second operational amplifier. The first operational amplifier DUT1 is used for static parameter measurement. The first switching module 122 includes a first control switch 1221 and a second control switch 1222. The first control switch 1221 and the second control switch 1222 have the same on or off state, used to control the connection state between the first operational amplifier DUT1 and the first auxiliary operational amplifier A. For example, the first switching module 122 can be a double-pole double-throw relay. When the power supply voltage of the double-pole double-throw relay is high, the control signal is low, and the double-pole double-throw relay is turned on.

[0082] Specifically, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, and a first selection switch K0; the first switch module 122 includes a first control switch 1221 and a second control switch 1222. With the first switch module 122 turned on, the first operational amplifier DUT1 of the dual-channel operational amplifier can be connected to the first auxiliary operational amplifier A. The input of the first operational amplifier DUT1 is in a zero-input state, and the output of the first operational amplifier DUT1 is its input offset voltage. When the first operational amplifier DUT1 can be connected to the first auxiliary operational amplifier A, the first auxiliary operational amplifier A amplifies the input offset voltage of the first operational amplifier DUT1. By calculating the amplification factor of the measurement circuit and the output voltage of the first auxiliary operational amplifier A, the input offset voltage of the first operational amplifier DUT1 can be measured. Measurement.

[0083] For example, the first resistor R1, the second resistor R2, and the third resistor R3 are 50Ω resistors, the fourth resistor R4 is a 10KΩ resistor, and the fifth resistor R5 and the sixth resistor R6 are 100KΩ resistors. The common terminal of the first selector switch K0 is connected to the second terminal, the sixth resistor R6 is grounded, and the first control switch 1221 and the second control switch 1222 are closed. This allows for the measurement of the input offset voltage parameter of the dual-channel operational amplifier. The amplification factor can be calculated by analyzing the circuit characteristics of the static parameter measurement circuit. for By measuring the output voltage VM of the first auxiliary operational amplifier A, the input offset voltage of the first operational amplifier DUT1 can be obtained. for .

[0084] See also Figure 2 The ATE test system also includes an ATE tester, which is connected to both ends of the power supply of the first operational amplifier DUT1 and can measure the static power consumption parameter PD of the first operational amplifier DUT1.

[0085] For example, the first control switch 1221 and the second control switch 1222 are closed, the common terminal of the first selector switch K0 is connected to the second terminal, the sixth resistor R6 is grounded, and the ATE tester is connected to the power supply terminals of the first operational amplifier DUT1 to detect and record the voltage and current values ​​at the power input terminals of the first operational amplifier DUT1, which are respectively recorded as the voltage at the positive input terminal of the power supply of the first operational amplifier DUT1. and current The voltage at the negative input terminal of the first operational amplifier DUT1 and current The static power consumption PD can be obtained as follows: .

[0086] Figure 3 A bias current testing circuit structure diagram provided in an embodiment of the present invention. Optionally, the static parameter measurement circuit further includes a seventh resistor R7, an eighth resistor R8, a third control switch K1, and a fourth control switch K2.

[0087] The first end of the first resistor R1 is connected to the inverting input of the first operational amplifier DUT1 through the seventh resistor R7; the first end of the second resistor R2 is connected to the non-inverting input of the first operational amplifier DUT1 through the eighth resistor R8; the third control switch K1 is connected in parallel with the seventh resistor R7, and the fourth control switch K2 is connected in parallel with the eighth resistor R8.

[0088] Specifically, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a first selection switch K0, a seventh resistor R7, an eighth resistor R8, a third control switch K1, and a fourth control switch K2. The first switch module 122 includes a first control switch 1221 and a second control switch 1222. When the first control switch 1221 and the second control switch 1222 are closed and conducting, the first operational amplifier DUT1 can be connected to the first auxiliary operational amplifier A. By connecting the seventh resistor R7 and the third control switch K1 to the inverting input terminal of the first operational amplifier DUT1, and the eighth resistor R8 and the fourth control switch K2 to the non-inverting input terminal of the first operational amplifier DUT1, the on and off states of the third control switch K1 and the fourth control switch K2 are different. When the third control switch K1 is on and the fourth control switch K2 is off, the voltage value of the first auxiliary operational amplifier A can be obtained. When the third control switch K1 is off and the fourth control switch K2 is on, another voltage of the first auxiliary operational amplifier A can be obtained. When the seventh resistor R7 or the eighth resistor R8 is connected to the input terminal of the first operational amplifier DUT1, due to the existence of bias current, the voltage output of the first operational amplifier DUT1 includes the voltage drop generated by the bias current. The first auxiliary operational amplifier A amplifies the small voltage drop to a measurable range. Therefore, the bias current parameter IB of the first operational amplifier DUT1 can be obtained according to the output voltage of the first auxiliary operational amplifier A and the seventh resistor R7.

[0089] For example, the first resistor R1, the second resistor R2, and the third resistor R3 are 50Ω resistors; the fourth resistor R4 is a 10KΩ resistor; the fifth resistor R5 and the sixth resistor R6 are 100KΩ resistors; the first control switch 1221 and the second control switch 1222 are closed; the common terminal of the first selector switch K0 is connected to the second terminal; the sixth resistor R6 is grounded (GND indicates ground); the seventh resistor R7 and the eighth resistor R8 are 100KΩ resistors; when the third control switch K1 is open and the fourth control switch K2 is closed, the seventh resistor R7 is connected to the circuit; and the voltage VM of the first auxiliary operational amplifier A is... , ,in, For the input offset voltage, This is the bias current at the inverting input terminal. This is the input offset current. When the third control switch K1 is closed and the fourth control switch K2 is open, the eighth resistor R8 is connected to the static parameter measurement circuit, and the voltage VM of the first auxiliary operational amplifier A is... , Subtracting the two equations, we get: Then the bias current parameter IB of the first operational amplifier DUT1 is .

[0090] See also Figure 3 By simultaneously closing or opening the third control switch K1 and the fourth control switch K2, the input offset current parameter IOS of the first operational amplifier DUT1 can be measured. For example, when the third control switch K1 and the fourth control switch K2 are closed simultaneously, the seventh resistor R7 and the eighth resistor R8 are short-circuited and not connected to the static parameter measurement circuit. In this case, the voltage value VM of the first auxiliary operational amplifier A can be obtained. , When the third control switch K1 and the fourth control switch K2 are simultaneously open, the seventh resistor R7 and the eighth resistor R8 are connected to the static parameter measurement circuit. At this time, the voltage value VM of the first auxiliary operational amplifier A can be obtained. , , and The difference is calculated, and the input offset current parameter IOS of the first operational amplifier DUT1 is: .

[0091] Figure 4 A schematic diagram of an open-loop voltage gain test circuit provided in an embodiment of the present invention is shown below. Figure 4 As shown, optionally, the static parameter measurement circuit also includes a ninth resistor R9;

[0092] The first terminal of the ninth resistor R9 is connected to the output terminal of the first operational amplifier DUT1, and the second terminal of the ninth resistor R9 is grounded.

[0093] Specifically, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a ninth resistor R9, and a first selection switch K0; the second terminal of the ninth resistor R9 is grounded, with GND indicating grounding. The first switch module 122 includes a first control switch 1221 and a second control switch 1222. When the first control switch 1221 and the second control switch 1222 are closed, the first operational amplifier DUT1 can be connected to the first auxiliary operational amplifier A. The common terminal of the first selection switch K0 is connected to the first terminal. The sixth resistor R6 is connected to the reference voltage VREF. By connecting the ninth resistor R9, the actual load condition can be simulated, thereby measuring the open-loop voltage gain parameter of the first operational amplifier DUT1. .

[0094] For example, the first resistor R1, the second resistor R2, and the third resistor R3 are all 50Ω resistors; the fourth resistor R4 is a 10KΩ resistor; and the fifth resistor R5 and the sixth resistor R6 are 100KΩ resistors. The first control switch 1221 and the second control switch 1222 are closed. The common terminal of the first selector switch K0 is connected to the first terminal. The sixth resistor R6 is connected to the reference voltage VREF. The ninth resistor R9 is a 2KΩ resistor. By adjusting the reference voltage VREF twice (e.g., +VREF and -VREF), when the input reference voltage is +VREF, the output voltage of the first operational amplifier DUT1 is -VREF. The output voltage VM of the first auxiliary operational amplifier A can then be measured as VL1. ,in, This represents the open-loop voltage gain of the first operational amplifier, DUT1. For the input offset voltage, The input offset current is used. When the input reference voltage is -VREF, the output voltage of the first operational amplifier DUT1 is +VREF, and the output voltage VM of the first auxiliary operational amplifier A can be measured to be VL2. The difference between VL2 and VL1 is: Then the open-loop voltage gain AVO of the first operational amplifier DUT1 is , .

[0095] Figure 5 A power supply voltage rejection ratio test circuit structure diagram provided in an embodiment of the present invention is shown below. Figure 5As shown, optionally, the static parameter measurement circuit also includes a third selection switch K3 and a fourth selection switch K4;

[0096] The common terminal of the third selection switch K3 is connected to the positive power supply terminal of the first operational amplifier DUT1. The first, second, and third terminals of the third selection switch K3 are connected to the positive terminal +VS of the first power supply and the positive terminal +VS+ of the second power supply, respectively. The positive terminal of the third power supply is +VS- The common terminal of the fourth selector switch K4 is connected to the negative power supply terminal of the first operational amplifier DUT1. The first, second, and third terminals of the fourth selector switch are connected to the negative terminal -VS of the first power supply and the negative terminal -VS+ of the second power supply, respectively. The negative terminal of the third power supply -VS- The third selector switch K3 is used to select the common terminal to the first, second, or third terminal, and the fourth selector switch K4 is used to select the common terminal to the first, second, or third terminal.

[0097] For ease of explanation, VS also represents the standard power supply voltage of the first operational amplifier DUT1. It also refers to voltage variation, reflecting the fluctuation range applied to the power supply terminal, and can be set according to actual conditions. The specific values ​​are not specifically limited in this embodiment of the invention. That is, the voltage at the positive terminal +VS of the first power supply is +VS, and the voltage at the negative terminal -VS of the first power supply is -VS. The voltage at the positive terminal +VS of the second power supply... The voltage is +VS+ The negative terminal of the second power supply is -VS+. The voltage is -VS+ The positive terminal of the third power supply is +VS-. The voltage is +VS- The negative terminal of the third power supply -VS- The voltage is -VS- .

[0098] Specifically, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a third selection switch K3, and a fourth selection switch K4; the first switch module 122 includes a first control switch 1221 and a second control switch 1222. When the first control switch 1221 and the second control switch 1222 are closed, the first operational amplifier DUT1 can be connected to the first auxiliary operational amplifier A. When the third selection switch K3 is closed, it selects the common terminal with the first, second, or third terminal; when the fourth selection switch K4 is closed, it selects the common terminal with the first, second, or third terminal. When the third selection switch K3 is closed and selects the common terminal with the first terminal, and the fourth selection switch K4 is closed and selects the common terminal with the first terminal, the output voltage VM of the first auxiliary operational amplifier A can be obtained. When the third selection switch K3 is closed, connecting the common terminal to the second terminal, and the fourth selection switch K4 is closed, connecting the common terminal to the second terminal, the output voltage VM of the first auxiliary operational amplifier A can be obtained as follows: When the third selection switch K3 is closed, connecting the common terminal to the third terminal, and the fourth selection switch K4 is closed, connecting the common terminal to the third terminal, the output voltage VM of the first auxiliary operational amplifier A can be obtained as follows: By connecting to different ports via the third selection switch K3 and the fourth selection switch K4, the change in the output voltage of the first operational amplifier DUT1 can be measured. The first auxiliary operational amplifier A amplifies this change to a measurable range. Therefore, the power supply rejection ratio can be calculated using the changes in the power supply voltage and the output voltage of the first operational amplifier DUT1. .

[0099] For example, the first resistor R1, the second resistor R2, and the third resistor R3 are 50Ω resistors, the fourth resistor R4 is a 10KΩ resistor, and the fifth resistor R5 and the sixth resistor R6 are 100KΩ resistors. The first control switch 1221 and the second control switch 1222 are closed. The common terminal of the first selector switch K0 is connected to the second terminal. The sixth resistor R6 is grounded, and GND indicates grounding. Controlling the third selector switch K3 and the fourth selector switch K4 closes the common terminal to select the first, second, and third terminals respectively. The measured output voltage VM of the first auxiliary operational amplifier A is VL3, VL4, and VL5 respectively. The positive power supply voltage rejection ratio KSRR1 of the first operational amplifier DUT1 is... , This represents the change in the power supply voltage of the first operational amplifier DUT1. This represents the change in output voltage of the first operational amplifier DUT1. ,but Similarly, the negative supply voltage rejection ratio (RSR) of the first operational amplifier DUT1 is KSRR2. , .

[0100] Figure 6 A common-mode voltage rejection ratio (CMRR) test circuit structure diagram provided in an embodiment of the present invention is shown below. Figure 6 As shown, the static parameter measurement circuit also includes a fifth selection switch K5;

[0101] The common terminal of the fifth selector switch K5 is connected to the second terminal of the first resistor R1 and the second resistor R2; the first terminal of the fifth selector switch K5 is connected to the fourth power supply VIC+, and the second terminal of the fifth selector switch K5 is connected to the fifth power supply VIC-. The fifth selector switch K5 is used to select the common terminal to either the first or the second terminal. The fourth power supply VIC+ outputs a positive voltage, and the fifth power supply VIC- outputs a negative voltage.

[0102] Specifically, the static parameter measurement circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, and a fifth selection switch K5; the first switch module 122 includes a first control switch 1221 and a second control switch 1222. When the first control switch 1221 and the second control switch 1222 are closed, the first operational amplifier DUT1 can be connected to the first auxiliary operational amplifier A. The fifth selection switch K5 can be connected to either the fourth power supply VIC+ or the fifth power supply VIC- to provide an input voltage signal to the first operational amplifier DUT1. By connecting the fifth selection switch K5 to the first or second terminal, the first operational amplifier DUT1 can output different voltages. The first auxiliary operational amplifier A amplifies the output voltage of the first operational amplifier DUT1. Therefore, by measuring the output voltage of the first auxiliary operational amplifier A, the common-mode voltage rejection ratio (CMRR) of the first operational amplifier DUT1 can be calculated.

[0103] For example, the first resistor R1, the second resistor R2, and the third resistor R3 are 50Ω resistors, the fourth resistor R4 is a 10KΩ resistor, and the fifth resistor R5 and the sixth resistor R6 are 100KΩ resistors. The first control switch 1221 and the second control switch 1222 are closed. The common terminal of the first selector switch K0 is connected to the second terminal. The sixth resistor R6 is grounded, and GND represents grounding. By adjusting the connection of the common terminal of the fifth selector switch K5 to the first terminal, the output voltage VM of the first auxiliary operational amplifier A can be obtained as VL6. By adjusting the connection of the common terminal of the fifth selector switch K5 to the second terminal, the output voltage VM of the first auxiliary operational amplifier A can be obtained as VL7. Then the common-mode voltage rejection ratio (CMRR) is... .

[0104] Figure 7A gain-bandwidth product test circuit structure diagram provided by an embodiment of the present invention is shown below. Figure 7 As shown, the dynamic parameter measurement circuit includes a tenth resistor R10, an eleventh resistor R11, a twelfth resistor R12, a thirteenth resistor R13, a fourteenth resistor R14, a fifteenth resistor R15, an AC power supply, and a sixth selection switch K6; the dual-channel operational amplifier includes a first operational amplifier and a second operational amplifier DUT2; the second switch module 132 includes a fifth control switch 1321 and a sixth control switch 1322;

[0105] The first terminal of the tenth resistor R10 is connected to the inverting input terminal of the second operational amplifier DUT2, and the second terminal of the tenth resistor R10 is grounded.

[0106] The first terminal of the eleventh resistor R11 is connected to the non-inverting input terminal of the second operational amplifier DUT2, and the second terminal of the eleventh resistor R11 is grounded.

[0107] The first end of the twelfth resistor R12 is connected to the non-inverting input of the second operational amplifier DUT2, and the second end of the twelfth resistor R12 is connected to the AC power supply.

[0108] The first terminal of the thirteenth resistor R13 is connected to the inverting input terminal of the second operational amplifier DUT2;

[0109] The fifth control switch 1321 is connected between the second terminal of the thirteenth resistor R13 and the output terminal of the second auxiliary operational amplifier B;

[0110] The first end of the fourteenth resistor R14 is connected to the output of the second operational amplifier DUT2, and the second end of the fourteenth resistor R14 is connected to the first end of the fifteenth resistor R15.

[0111] The common terminal of the sixth selector switch K6 is connected to the second terminal of the fifteenth resistor R15. The first terminal of the sixth selector switch K6 is connected to the reference voltage VREF. The second terminal of the sixth selector switch K6 is grounded. The sixth selector switch K6 is used to select the common terminal to either the first or the second terminal.

[0112] The sixth control switch 1322 is connected between the second terminal of the fourteenth resistor R14 and the inverting input terminal of the second auxiliary operational amplifier B, and the non-inverting input terminal of the second auxiliary operational amplifier B is grounded.

[0113] The AC power supply is connected to the non-inverting input of the second operational amplifier DUT2, and is used to provide the second operational amplifier DUT2 with an AC test signal of fixed amplitude and adjustable frequency.

[0114] Specifically, the dynamic parameter measurement circuit includes a tenth resistor R10, an eleventh resistor R11, a twelfth resistor R12, a thirteenth resistor R13, a fourteenth resistor R14, a fifteenth resistor R15, an AC power supply, and a sixth selection switch K6. The second switch module 132 includes a fifth control switch 1321 and a sixth control switch 1322. When the fifth control switch 1321 and the sixth control switch 1322 are closed, the second operational amplifier DUT2 is connected to the second auxiliary operational amplifier B, enabling the measurement of the gain-bandwidth product (GBW) of the dual-channel operational amplifier's dynamic parameters. Optionally, the AC power supply is connected to the 200kHz AC signal port of the ATE tester, and the second switch module 132 can be a double-pole double-throw relay.

[0115] For example, resistors R10 and R11 are 1KΩ resistors, resistor R12 is a 200KΩ resistor, resistors R14 and R15 are 100KΩ resistors, and resistor R13 is a 200KΩ resistor. The fifth control switch 1321 and the sixth control switch 1322 are closed, connecting the second operational amplifier DUT2 to the second auxiliary operational amplifier B. The common terminal of the sixth selection switch K6 is connected to the second terminal. The fifteenth resistor R15 is grounded, with GND indicating grounding. AC power provides an AC signal to the second operational amplifier DUT2. The output AC voltage signal Voa of the second auxiliary operational amplifier B can be measured. Therefore, the gain-bandwidth product GBW of the second operational amplifier DUT2 is... Where fin = 200kHz is the frequency at which the closed-loop gain drops to its maximum value, and Via is the effective value of the amplitude of the output AC voltage signal of the second auxiliary operational amplifier B. The amplification factor of the dynamic parameter measurement circuit.

[0116] Figure 8 A circuit diagram for slew rate testing provided in an embodiment of the present invention is shown below. Figure 8 As shown, the dynamic parameter measurement circuit also includes a seventh control switch K7, an eighth control switch K8, a ninth control switch K9, and a capacitor C;

[0117] The first terminal of the thirteenth resistor R13 is connected to the non-inverting input terminal of the second operational amplifier DUT2 through the seventh control switch K7;

[0118] The eighth control switch K8 is connected between the output terminal of the second operational amplifier DUT2 and the output terminal of the second auxiliary operational amplifier B;

[0119] The ninth control switch K9 is connected between the output terminal of the second operational amplifier DUT2 and the first terminal of capacitor C, and the second terminal of capacitor is grounded.

[0120] The closing of the seventh control switch K7, the eighth control switch K8, and the ninth control switch K9 controls the circuit's conduction. The first terminal of the tenth resistor R10 is connected to the voltage port of the ATE tester, providing input voltage to the second operational amplifier DUT2. The first end of the tenth resistor R10 is connected to the inverting input of the second operational amplifier DUT2, the first end of the eleventh resistor R11 is connected to the non-inverting input of the second operational amplifier DUT2, and the first end of the eleventh resistor R11 is grounded, with GND indicating grounding.

[0121] Specifically, closing the seventh control switch K7, the eighth control switch K8, and the ninth control switch K9 can turn on the circuit. By measuring the maximum rate of change of the output voltage of the second operational amplifier DUT2, the slew rate SR of the second operational amplifier DUT2 can be obtained.

[0122] For example, the tenth resistor R10 is selected as 2KΩ, the eleventh resistor R11 is selected as 1KΩ, the thirteenth resistor R13 is selected as 2KΩ, and the capacitor C is selected as 100pF. Measurement The output of the op-amp under test within the time period , It is the time it takes for the output to rise from 10% to 90% of the step amplitude. The slew rate SR of the second operational amplifier DUT2 can be calculated from the output voltage step amplitude. .

[0123] Figure 9 This is a flowchart of an ATE test method for an operational amplifier provided in an embodiment of the present invention. The test method can be applied to the test system of any embodiment of the present invention, and the test method includes:

[0124] S10: Control the first switch module to turn on and control the second switch module to turn off to perform static parameter testing on the dual-channel operational amplifier.

[0125] Specifically, the first and second switch modules can be controlled by software programs. For example, an ATE tester can control the on / off state of each switch module. When the first and second control switches in the first switch module are closed, the first switch module is on. When the fifth and sixth control switches in the second switch module are off, the second switch module is off. The first operational amplifier in the dual-channel operational amplifier is connected to the static parameter measurement module, and the static parameter measurement circuit in the static parameter measurement module is connected to the first auxiliary operational amplifier. This allows for the testing of static parameters such as input offset voltage, input offset current, bias current, static power consumption, open-loop voltage gain, power supply voltage rejection ratio, and operating mode voltage rejection ratio.

[0126] S20 controls the second switch module to turn on and the first switch module to turn off, performing dynamic parameter testing on the dual-channel operational amplifier.

[0127] Specifically, the first and second switch modules can be controlled by software programs. For example, an ATE tester can control the on / off state of each switch module. The first control switch and the second control switch in the first switch module are disconnected, and the first switch module is off. The fifth control switch and the sixth control switch in the second switch module are closed, and the second switch module is on. The second operational amplifier in the dual-channel operational amplifier is connected to the dynamic parameter measurement module. The dynamic parameter measurement circuit in the dynamic parameter measurement module is connected to the second auxiliary operational amplifier. This allows for the testing of dynamic parameters such as the gain-bandwidth product and slew rate.

[0128] It should be noted that the steps of the above testing method have no fixed order. The first and second switch modules are controlled by software programs. The static parameters can be tested first and then the dynamic parameters, or vice versa.

[0129] Figure 10 A flowchart of another ATE test method for an operational amplifier provided in an embodiment of the present invention is shown below. Figure 10 As shown, the test methods include:

[0130] S210. Check if the dual-channel operational amplifier is installed in the test socket.

[0131] In this embodiment of the invention, the testing system includes a test socket. After the dual-channel operational amplifier is installed in the test socket, static and dynamic parameter tests can be performed on the dual-channel operational amplifier. The test socket has a detection function, which can automatically detect the pin signals of the dual-channel operational amplifier through mechanical contacts or photoelectric sensors. For example, a low level indicates that it is installed, and a high level indicates that it is not installed, or a low level indicates that it is not installed and a high level indicates that it is installed. When all pins are installed in the test socket, the testing of the dual-channel operational amplifier can continue.

[0132] S220. After the dual-channel operational amplifier is installed in the test socket, power is supplied to the dual-channel operational amplifier, and the power supply to the first auxiliary operational amplifier and the second auxiliary operational amplifier is turned off. Open-circuit and short-circuit tests are then performed on the dual-channel operational amplifier.

[0133] In this embodiment of the invention, the dual-channel operational amplifier is powered on and its electrical functions are tested. For example, open-circuit and short-circuit tests are performed. The open-circuit test involves measuring the insulation resistance between the amplifier's pins to confirm that the internal circuitry is intact. The short-circuit test involves measuring the amplifier's output voltage to determine if there is any abnormal conduction within the amplifier, such as a short circuit between the power supply and output terminals, ensuring the amplifier possesses basic signal amplification capabilities. After passing the open-circuit and short-circuit tests, further testing of the dual-channel operational amplifier can proceed.

[0134] S230 controls the first switch module to turn on and the second switch module to turn off, performing static parameter testing on the dual-channel operational amplifier.

[0135] S240 controls the second switch module to turn on and the first switch module to turn off, performing dynamic parameter testing on the dual-channel operational amplifier.

[0136] Specifically, before testing the static and dynamic parameters of the dual-channel operational amplifier, the dual-channel operational amplifier needs to be installed on the test socket, and the installation status needs to be checked. If the installation status is confirmed, power is supplied to the dual-channel operational amplifier, while the power supply to the first and second auxiliary operational amplifiers is turned off. Open-circuit and short-circuit tests are then performed on the dual-channel operational amplifier. After the open-circuit and short-circuit tests are passed, the software program controls the first switch module to turn on and the second switch module to turn off to perform static parameter tests. Similarly, controlling the second switch module to turn on and the first switch module to turn off performs dynamic parameter tests.

[0137] Figure 11 A flowchart of another operational amplifier ATE test method provided in an embodiment of the present invention is shown below. Figure 11 As shown, the test methods include:

[0138] S301, Begin.

[0139] S302, the program is stored in the memory circuit.

[0140] Optionally, the storage circuit is powered by a 5V power supply, which is sourced from the UTILITY module of the ATE tester.

[0141] S303. Check if the dual-channel operational amplifier is installed in the test socket. If not, return to S301. If yes, continue execution.

[0142] S304: Enable power supply to dual-channel operational amplifier and disable power supply to auxiliary operational amplifier.

[0143] Both the dual-channel operational amplifier and the auxiliary operational amplifier are powered by a 5V power supply.

[0144] S305, Open Circuit Test, Short Circuit Test. If it fails, return to S303; if it passes, continue execution.

[0145] Among them, open-circuit and short-circuit tests were performed on the dual-channel operational amplifier to ensure that the dual-channel operational amplifier itself was functioning normally and had been installed on the test socket.

[0146] S306, Control the first switch module to turn on and control the second switch module to turn off.

[0147] S307, Input Offset Voltage Test, Static Power Consumption Test.

[0148] S308, Input Offset Current Test, Bias Current Test.

[0149] S309, Open-loop voltage gain test.

[0150] S310, Power Supply Voltage Rejection Ratio Test.

[0151] S311, Common-mode voltage rejection ratio test.

[0152] S312, controls the second switch module to turn on and controls the first switch module to turn off.

[0153] S313, Gain-bandwidth product test.

[0154] S314, Swing rate test.

[0155] S315, End.

[0156] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0157] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. An ATE test system for operational amplifiers, characterized by, The utility model relates to a double -channel operational amplifier static parameter and dynamic parameter test device, including: Test seat for detachable installation measured double -channel operational amplifier, after the installation of double -channel operational amplifier, the pin of double -channel operational amplifier is connected with the port of test seat corresponding, Static parameter measurement module, including static parameter measurement circuit, first switch module and first auxiliary operational amplifier, static parameter measurement circuit connects corresponding port of test seat, first switch module is used for the connection between first auxiliary operational amplifier and static parameter measurement circuit is turned on or disconnected, after static parameter measurement circuit is connected with first auxiliary operational amplifier, the first channel of double -channel operational amplifier is carried out static parameter test, Dynamic parameter measurement module, including dynamic parameter measurement circuit, second switch module and second auxiliary operational amplifier, dynamic parameter measurement circuit connects corresponding port of test seat, second switch module is used for the connection between second auxiliary operational amplifier and dynamic parameter measurement circuit is turned on or disconnected, after dynamic parameter measurement circuit is connected with second auxiliary operational amplifier, the second channel of double -channel operational amplifier is carried out dynamic parameter test.

2. The test system of claim 1, wherein, Static parameter measurement circuit includes first resistance, second resistance, third resistance, fourth resistance, fifth resistance, sixth resistance and first selection switch, first switch module includes first control switch and second control switch, double -channel operational amplifier includes first operational amplifier and second operational amplifier, The first end of first resistance is connected with the noninverting input terminal of first operational amplifier, and the second end of first resistance is grounded. The first end of second resistance is connected with the inverting input terminal of first operational amplifier, and the second end of second resistance is grounded. The first end of third resistance is connected with the inverting input terminal of first operational amplifier, and the second end of third resistance is grounded. The first end of fourth resistance is connected with the noninverting input terminal of first operational amplifier. The first control switch is connected between the second end of fourth resistance and the output terminal of first auxiliary operational amplifier. The first end of fifth resistance is connected with the output terminal of first operational amplifier, and the second end of fifth resistance is connected with the first end of sixth resistance. The common terminal of first selection switch is connected with the second end of sixth resistance, the first end of first selection switch is connected with reference voltage, the second end of first selection switch is grounded, and first selection switch is used for the common terminal and first end or second end. The second control switch is connected between the second end of fifth resistance and the noninverting input terminal of first auxiliary operational amplifier, and the inverting input terminal of first auxiliary operational amplifier is grounded.

3. The test system of claim 2, wherein, Static parameter measurement circuit further includes seventh resistance, eighth resistance, third control switch and fourth control switch, The first end of first resistance is connected with the noninverting input terminal of first operational amplifier through seventh resistance, and the first end of second resistance is connected with the inverting input terminal of first operational amplifier through eighth resistance. The third control switch is connected in parallel with the seventh resistor, and the fourth control switch is connected in parallel with the eighth resistor.

4. The test system of claim 2, wherein, The static parameter measurement circuit further comprises a ninth resistor; The first end of the ninth resistor is connected to the output end of the first operational amplifier, and the second end of the ninth resistor is grounded.

5. The test system of claim 2, wherein, The static parameter measurement circuit further comprises a third selection switch and a fourth selection switch; The common end of the third selection switch is connected to the positive power supply end of the first operational amplifier, and the first end, the second end and the third end of the third selection switch are respectively connected to the positive pole of the first power supply, the positive pole of the second power supply and the positive pole of the third power supply. The common end of the fourth selection switch is connected to the negative power supply end of the first operational amplifier, and the first end, the second end and the third end of the fourth selection switch are respectively connected to the negative pole of the first power supply, the negative pole of the second power supply and the negative pole of the third power supply. The third selection switch is used for selecting the common end with the first end, the second end or the third end, and the fourth selection switch is used for selecting the common end with the first end, the second end or the third end.

6. The test system of claim 2, wherein, The static parameter measurement circuit further comprises a fifth selection switch; The common end of the fifth selection switch is connected to the second end of the first resistor and the second resistor, the first end of the fifth selection switch is connected to a fourth power supply, and the second end of the fifth selection switch is connected to a fifth power supply, the fifth selection switch is used for selecting the common end with the first end or the second end, the fourth power supply outputs a positive voltage, and the fifth power supply outputs a negative voltage.

7. The test system of claim 1, wherein, The dynamic parameter measurement circuit comprises a tenth resistor, an eleventh resistor, a twelfth resistor, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, an alternating current power supply and a sixth selection switch; the double-channel operational amplifier comprises a first operational amplifier and a second operational amplifier; and the second switch module comprises a fifth control switch and a sixth control switch. The first end of the tenth resistor is connected to the inverting input end of the second operational amplifier, and the second end of the tenth resistor is grounded. The first end of the eleventh resistor is connected to the non-inverting input end of the second operational amplifier, and the second end of the eleventh resistor is grounded. The first end of the twelfth resistor is connected to the non-inverting input end of the second operational amplifier, and the second end of the twelfth resistor is connected to the alternating current power supply. The first end of the thirteenth resistor is connected to the inverting input end of the second operational amplifier. The fifth control switch is connected between the second end of the thirteenth resistor and the output end of the second auxiliary operational amplifier. The first end of the fourteenth resistor is connected to the output end of the second operational amplifier, and the second end of the fourteenth resistor is connected to the first end of the fifteenth resistor. The common end of the sixth selection switch is connected to the second end of the fifteenth resistor, the first end of the sixth selection switch is connected to a reference voltage, the second end of the sixth selection switch is grounded, and the sixth selection switch is used for selecting the common end with the first end or the second end. The sixth control switch is connected between the second end of the fourteenth resistor and the inverting input end of the second auxiliary operational amplifier, and the non-inverting input end of the second auxiliary operational amplifier is grounded.

8. The test system of claim 7, wherein, The dynamic parameter measurement circuit further comprises a seventh control switch, an eighth control switch, a ninth control switch and a capacitor; The first end of the thirteenth resistor is connected to the non-inverting input end of the second operational amplifier through the seventh control switch; The eighth control switch is connected between the output end of the second operational amplifier and the output end of the second auxiliary operational amplifier; The ninth control switch is connected between the output end of the second operational amplifier and the first end of the capacitor, and the second end of the capacitor is grounded.

9. An ATE test method for an operational amplifier, characterized by, The test method is applied to the test system of any one of claims 1-8, and the test method comprises: Controlling the first switch module to be turned on and the second switch module to be turned off to perform static parameter test on the dual-channel operational amplifier; Controlling the second switch module to be turned on and the first switch module to be turned off to perform dynamic parameter test on the dual-channel operational amplifier.

10. The test method of claim 9, wherein, Further comprising: Detecting whether the dual-channel operational amplifier is loaded into the test seat; After the dual-channel operational amplifier is loaded into the test seat, power supply of the dual-channel operational amplifier is performed, power supply of the first auxiliary operational amplifier and the second auxiliary operational amplifier is turned off, and open circuit and short circuit test of the dual-channel operational amplifier is performed.

Images