Method for rapidly testing sensitivity of locomotive signal

Abstract

The invention discloses a locomotive signal sensitivity rapid test method, and belongs to the field of train operation control equipment detection and maintenance. The problem that an existing method cannot improve the low test efficiency of an existing dichotomy on the premise that the test coverage rate and precision are guaranteed is solved. The method comprises the steps that a test system is initialized, a test sequence is loaded, and the test sequence comprises a plurality of test item points; executing the following operations on each test item point: judging whether the current test item point is the first item point in the sequence or not, or judging whether the carrier frequency of the current test item point is different from the carrier frequency of the previous test item point or not; if yes, executing a benchmark test process on the current test item point to determine a sensitivity value of the current test item point, and recording the sensitivity value and carrier frequency of the test item point; if not, executing a stepping voltage fine tuning test process on the current test item point to determine the sensitivity value of the test item point, and updating the recorded sensitivity value; and repeating the process until all the test item points are tested. The method is used in train operation control field.

Description

Technical Field

[0001] This invention belongs to the field of train operation control equipment testing and maintenance, and in particular relates to a rapid testing method for locomotive signal sensitivity. Background Technology

[0002] Locomotive signaling onboard system equipment (hereinafter referred to as locomotive signaling) is the core equipment for train operation control, and its reliability is directly related to train operation safety. Among the many indicators of locomotive signaling, sensitivity is a crucial technical indicator. It refers to the minimum induced voltage or track short-circuit current value required for the locomotive signal to reliably receive, decode, and correctly respond to track signals. Therefore, accurate and efficient testing of locomotive signal sensitivity is a necessary maintenance step to ensure the safe and stable operation of the equipment after it goes online.

[0003] Currently, domestic rail circuits mainly adopt FSK signal standards such as TB / T3060 frequency shift, 1.9 frequency shift, and ZPW-2000 series. Different standards correspond to different carrier frequency and low-frequency combinations. Taking common locomotive signaling equipment supporting 1.9 frequency shift and ZPW-2000 series standards as an example, its sensitivity test needs to cover 60 items for 4 carrier frequencies and 15 low-frequency combinations for 1.9 frequency shift, and 180 items for 12 carrier frequencies and 15 low-frequency combinations for ZPW-2000 series, totaling 240 test items.

[0004] According to the standard TB / T 3287-2013 "Locomotive Signal Onboard System Equipment", the locomotive signal sensitivity has an allowable deviation range (μ±σ mV). However, the testing equipment needs to accurately measure the specific sensitivity value, with an accuracy requirement of 0.1 mV. Currently, the widely used testing method in the industry is the "binary method," which has significant drawbacks such as cumbersome testing procedures and excessive time consumption. Specifically, taking the testing of a certain carrier frequency and low frequency combination in the ZPW-2000 series as an example, the standard testing procedure requires starting from the upper limit of the sensitivity range, outputting signals of different amplitudes multiple times and observing the equipment response. During this process, each output signal must wait for a strain time of no less than 2 seconds to ensure a stable response. After turning off the output, a lamp-off time of no less than 4 seconds must be waited to ensure the equipment status is reset before the next test can be performed. By gradually narrowing the range through this binary approximation method until the precise sensitivity value is found, the testing time for a single item is approximately 75 seconds. If all 240 test items are tested, the total time will be about 5 hours. Furthermore, considering that the locomotive signaling equipment includes two backup motherboards, A and B, which need to be tested separately, the total time to complete the whole machine test will reach 10 hours. This extremely low testing efficiency is difficult to meet the urgent timeliness requirements of on-site maintenance work.

[0005] To shorten testing time, some field units have had to adopt a compromise in practice: sampling only a few low-frequency points for each carrier frequency, while abandoning the complete testing of all items required by the standard. While this approach can reduce the total sensitivity testing time to within about 2 hours, it comes at the cost of sacrificing test coverage. This results in a large number of items not being tested, making it impossible to comprehensively and effectively assess the performance of the equipment under all operating modes. This creates potential safety hazards in equipment operation and increases the risk of equipment failure due to undetected sensitivity degradation during actual operation.

[0006] Therefore, there is an urgent need for a method that can fundamentally solve the problem of low efficiency in the existing "dichotomy" testing while ensuring test coverage and accuracy. Summary of the Invention

[0007] In view of this, the present invention aims to propose a rapid testing method for locomotive signal sensitivity, in order to solve the problem that existing methods cannot improve the low efficiency of the existing bisection method while ensuring test coverage and accuracy.

[0008] To achieve the above objectives, the present invention adopts the following technical solution: A method for rapid testing of locomotive signal sensitivity, the method comprising: Initialize the test system and load the test sequence, which includes multiple test items, each corresponding to a specific combination of carrier frequency and low frequency; For each test item in the test sequence, perform the following operations: Determine whether the current test item is the first item in the sequence, or whether the carrier frequency of the current test item is different from the carrier frequency of the previous test item; If so, then perform a benchmark test procedure on the current test item to determine the sensitivity value of the current test item, and record the sensitivity value and carrier frequency of the current test item; If not, perform a step voltage fine-tuning test procedure on the current test item to determine the sensitivity value of the current test item and update the recorded sensitivity value; Repeat the above process until all test items have been tested.

[0009] Furthermore, a preferred method is proposed, wherein the benchmark test process adopts a bisection method test, which includes outputting signals of different amplitudes multiple times and observing the device response, and gradually narrowing the range in a bisection approximation manner until the final sensitivity value is determined.

[0010] Furthermore, a preferred method is proposed, wherein the step voltage fine-tuning test procedure includes: Output an amplitude to the device under test equal to the recorded sensitivity value minus the preset step difference. The signal; Wait for the designated response time; If the device under test does not output the expected response, the amplitude of the input signal is gradually increased with a preset step accuracy, and a specified strain time is waited after each increase until the device under test outputs the expected response correctly. The amplitude of the final output signal is used as the sensitivity value of the current test point.

[0011] Furthermore, a preferred method is proposed, wherein the preset step difference... The value ranges from 0.1mV to 2mV.

[0012] Furthermore, a preferred method is proposed, wherein the preset stepping accuracy is 0.1mV.

[0013] Furthermore, a preferred method is proposed, wherein in the benchmark test process, the strain time after each output signal is not less than 2 seconds, and the lamp-off time after the output is turned off is not less than 4 seconds.

[0014] Furthermore, a preferred method is proposed, wherein in the step voltage fine-tuning test process, the waiting strain time is set according to the standard requirements corresponding to the test item, and is not less than the minimum strain time.

[0015] Furthermore, a preferred approach is proposed, wherein the test items cover multiple signal standards, including at least one of TB / T3060 frequency shift, 1.9 frequency shift, and ZPW-2000 series.

[0016] Based on the same inventive concept, the present invention also proposes a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor runs the computer program stored in the memory, the processor executes a rapid testing method for locomotive signal sensitivity according to any one of the above.

[0017] Based on the same inventive concept, the present invention also proposes a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the steps of a rapid locomotive signal sensitivity testing method as described in any of the preceding claims.

[0018] Compared with the prior art, the beneficial effects of the present invention are: Existing binary search methods treat each "carrier frequency-low frequency" combination as a completely independent test task, requiring a complete binary search from scratch for each item. This "exhaustive" approach ignores the inherent correlation between test items. This invention utilizes the characteristic that the sensitivity of low-frequency points under the same carrier frequency is essentially the same, fundamentally changing the traditional mode of independently searching for each test item using binary search. For subsequent low-frequency tests under the same carrier frequency, this method directly skips the complex binary iterative process, employing a step voltage fine-tuning method for rapid positioning, significantly reducing the testing steps for a single item from over a dozen to just a few. Practice shows that using this method, the total time to complete all 240 test items can be shortened from over 10 hours to less than 2 hours, improving efficiency by over 80%, greatly meeting the urgent efficiency requirements of on-site maintenance.

[0019] This invention completely solves the industry dilemma of being forced to reduce the number of test items due to excessively long testing times. This invention designs an intelligent dynamic strategy selection logic. For a new carrier frequency group, the first item uses a traditional benchmark testing procedure, such as the binary search method. The purpose is not only to determine the sensitivity of that point, but more importantly, to establish a high-precision sensitivity reference value for subsequent items in the same group. When the carrier frequency of subsequent test items remains unchanged, it automatically switches to a step voltage fine-tuning procedure. This procedure no longer performs large-scale binary iterations, but starts from a preset voltage point near the reference value, performing small-step, unidirectional fine-tuning to quickly locate the precise sensitivity value of the current item. The core of this mechanism is that the time-consuming precise search process is used only to establish a benchmark, while the testing of a large number of subsequent items at the same carrier frequency is simplified into an efficient and rapid confirmation process. Because testing efficiency is fundamentally improved, maintenance departments no longer need to sacrifice test coverage for efficiency, and can perform complete testing of all carrier frequencies and low-frequency combinations required by technical standards. This fundamentally eliminates the risk of equipment failure that may be hidden due to some items not being tested, and significantly improves the safety and reliability of locomotive signaling equipment in operation.

[0020] The method proposed in this invention has clear logic and a simple judgment process. The core judgment is only whether the carrier frequency of the current item point is the same as that of the previous item point, making it easy to integrate into existing automated testing platforms. By automatically recording the final sensitivity value of the previous item point and intelligently selecting subsequent testing strategies, the entire testing process is automated and intelligent, effectively reducing manual intervention. This not only further improves testing efficiency but also reduces the risk of inaccurate test results due to human error.

[0021] The significant reduction in testing time achieved by the method proposed in this invention directly translates to a reduction in the time spent on maintenance stations, equipment, and human resources, effectively improving the operational capacity and turnaround efficiency of the maintenance base. This allows for a substantial increase in maintenance capacity and cost savings through algorithm optimization alone, without additional hardware investment. Attached Figure Description

[0022] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings: Figure 1 This is a schematic diagram of a rapid testing method for locomotive signal sensitivity according to the present invention. Detailed Implementation

[0023] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of the present invention can be combined with each other, and the described embodiments are only some embodiments of the present invention, not all embodiments.

[0024] Implementation Method 1, see [link] Figure 1 This embodiment describes a rapid testing method for locomotive signal sensitivity, the method comprising: Initialize the test system and load the test sequence, which includes multiple test items, each corresponding to a specific combination of carrier frequency and low frequency; For each test item in the test sequence, perform the following operations: Determine whether the current test item is the first item in the sequence, or whether the carrier frequency of the current test item is different from the carrier frequency of the previous test item; If so, then perform a benchmark test procedure on the current test item to determine the sensitivity value of the current test item, and record the sensitivity value and carrier frequency of the current test item; If not, perform a step voltage fine-tuning test procedure on the current test item to determine the sensitivity value of the current test item and update the recorded sensitivity value; Repeat the above process until all test items have been tested.

[0025] In practical applications, when the current test item is not the first item in the sequence, or when the carrier frequency of the previous test item differs from that of the previous test item, and the benchmark test procedure cannot be executed smoothly, a benchmark test procedure is used to prevent test failure. For example: at the same carrier frequency, the sensitivity of the previous item is 100, and the actual sensitivity of the current item is 98, but... A value of 0.2 results in the expected output being 98. To ensure continued testing, the current solution is to delay the LED off for 4 seconds and then directly use the benchmark test procedure. Of course, this also means... =0.3 is sufficient; this value is a balanced value that has been gradually found through practice.

[0026] The method proposed in this embodiment does not lie in a simple improvement of the existing two basic testing algorithms, namely the bisection method or the step voltage fine-tuning method, but rather in the innovative discovery and utilization of a key technical fact overlooked by existing technologies, and based on this, a completely new and intelligent testing strategy selection mechanism is designed. Specifically: Existing technologies, such as the traditional dichotomy method, treat each "carrier frequency-low frequency" combination test item as a completely independent and unrelated test task. Therefore, the technical concept involves performing a complete dichotomy search from scratch for each item, which is a blind and resource-intensive testing mode. This implementation method reveals and verifies for the first time a key principle: for the same locomotive signaling equipment, at a specific carrier frequency, its receiving sensitivity for different low-frequency information exhibits a high degree of consistency. This means that in continuous testing, if the carrier frequency of the current test item is the same as the previous item, then their actual sensitivity values ​​will be very close. This discovery forms the technical foundation of this method.

[0027] Based on the aforementioned core findings, this implementation breaks away from the existing one-size-fits-all testing model and proposes a dynamic testing strategy selection mechanism. The core logic of its technical principle is as follows: when the carrier frequency changes, the system determines that it has entered a new testing scenario. Due to the lack of historical data for reference, a benchmark testing procedure is used to accurately determine the sensitivity of the first item under that carrier frequency group, and this result is used as the sensitivity benchmark value for that carrier frequency group. When the carrier frequency does not change, the system utilizes the characteristic of consistent sensitivity under the same carrier frequency to determine that the sensitivity of the current item must be highly close to the result Sp of the previous item. Therefore, this method intelligently skips the time-consuming complete binary search and instead adopts an efficient step voltage fine-tuning method. This method starts with the known Sp and quickly confirms the result through small voltage steps, thereby greatly shortening the positioning time.

[0028] The technical principle of this implementation method realizes a fundamental shift from indiscriminate repeated measurement to intelligent correlation measurement, opening up a completely new path for improving testing efficiency.

[0029] Implementation Method 2: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method 1. The benchmark testing process adopts the bisection method, which includes outputting signals of different amplitudes multiple times and observing the equipment response. The range is gradually narrowed down using the bisection method until the final sensitivity value is determined.

[0030] Implementation Method 3: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method 1. The step voltage fine-tuning test process includes: Output an amplitude to the device under test equal to the recorded sensitivity value minus the preset step difference. The signal; Wait for the designated response time; If the device under test does not output the expected response, the amplitude of the input signal is gradually increased with a preset step accuracy, and a specified strain time is waited after each increase until the device under test outputs the expected response correctly. The amplitude of the final output signal is used as the sensitivity value of the current test point.

[0031] Implementation Method Four: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method One, wherein the preset step difference value... The value range is from 0.1mV to 2mV. Since the device under test may be manufactured by multiple companies, differences in hardware performance and software design may lead to fluctuations in actual sensitivity when testing different low-frequency items on the same carrier frequency. To ensure the correctness of this method, multiple rounds of testing on different manufacturers and different devices are needed to find a balance between accurate testing and testing efficiency. The value should be set, and users should be allowed to configure this value. If the value is too small, the method is prone to failure during testing; if it is too large, the test will take too long.

[0032] Implementation Method 5: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method 1, wherein the preset step accuracy is 0.1mV. The testing equipment has a testing accuracy of 0.1mV, therefore the step value is set to 0.1mV.

[0033] Implementation Method Six: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method One. In the benchmark test process, the waiting time after each signal output is not less than 2 seconds, and the waiting time after the output is turned off is not less than 4 seconds.

[0034] Implementation Method Seven: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method One. In the step voltage fine-tuning test process, the waiting strain time is set according to the standard requirements corresponding to the test item, and is not less than the minimum strain time.

[0035] Implementation Method 8: This implementation method further defines the rapid testing method for locomotive signal sensitivity described in Implementation Method 1. The test items cover multiple signal standards, including at least one of TB / T3060 frequency shift, 1.9 frequency shift, and ZPW-2000 series.

[0036] Implementation Method Nine: A computer device according to this implementation method includes a memory and a processor. The memory stores a computer program. When the processor runs the computer program stored in the memory, the processor executes a rapid locomotive signal sensitivity testing method according to any one of Implementation Methods One to Eight.

[0037] Implementation Method 10: A computer-readable storage medium according to this embodiment stores a computer program, which, when executed by a processor, performs the steps of a rapid locomotive signal sensitivity testing method as described in any one of Implementation Methods 1 to 8.

[0038] Implementation Method Eleven: This implementation method provides a specific embodiment of the rapid testing method for locomotive signal sensitivity described in Implementation Method One, and also serves to explain Implementation Methods Two to Eight. Specifically: This method introduces a dynamic test strategy selection mechanism when performing test items involving carrier frequency and low-frequency combinations. Its core logic is to determine whether the carrier frequency of the current test item is the same as that of the previous test item. Based on the determination result, the system will automatically switch to different test processes. If the carrier frequency changes, it is considered the start of a "new carrier frequency group". A complete benchmarking procedure (such as the bisection method) is used for the first item in the group to determine its precise sensitivity benchmark value.

[0039] If the carrier frequency remains unchanged, the sensitivity at each low-frequency point is basically the same under the same carrier frequency. The complete binary search process is skipped, and the sensitivity result of the previous point is directly used to quickly confirm and measure the result using the efficient "step voltage fine-tuning method".

[0040] The specific implementation process of this method is as follows: Figure 1 As shown: S1: System initialization, proceed to S2; S2: Load the carrier frequency Fc and low frequency of the current test item, start the sensitivity test, and proceed to S3; S3: Determine if this is the first sensitivity test: If yes, proceed to S4; otherwise, proceed to S5. S4: Execute the "Benchmarking Process": A reliable baseline procedure is used to determine the precise value of its sensitivity. This baseline procedure can be a bisection method or other algorithms that can accurately test the sensitivity of this test item. The measured sensitivity is denoted as Sp, and the current carrier frequency is denoted as Fp. After this step is completed, proceed to S7; S5: Determine if the current carrier frequency Fc is the same as the previous carrier frequency Fp: If not, proceed to S4; if yes, proceed to S6. S6: Perform a rapid test using the "step voltage fine-tuning method": Output a signal to the device under test with an amplitude smaller than Sp by a preset step difference ΔV, where ΔV is greater than or equal to 0.1mV and less than or equal to 2mV; If the device does not output the desired light color after waiting for the specified strain time, the amplitude of the output signal is gradually increased in increments of 0.1mV, and the specified strain time is waited for at each step until the device correctly outputs the desired light color; the signal voltage value at this time is the sensitivity of the current point; proceed to S7; This process is a fast linear search. If the starting point is chosen to be very close to the true sensitivity value, it usually only takes a few steps to locate the point. If ΔV is chosen too small, Sp+ΔV may already be greater than the sensitivity of the current test point, which will cause the test to fail. If ΔV is chosen too large, more steps will be required, which will increase the test time. S7: The next step to determine whether to continue the sensitivity test: If yes, proceed to S2. If no, the sensitivity test ends.

[0041] This embodiment simulates the sensitivity test of a single main board of a locomotive signaling equipment at six specified low-frequency points, intuitively demonstrating the efficiency advantage of the method of the present invention compared with the traditional binary search method.

[0042] 1. Test conditions and parameters In this embodiment, the device under test is the locomotive signal main board (single board); there are a total of 6 test items, in the following sequence: 1.9 frequency shift, carrier frequency 550Hz, low frequency 11Hz (sensitivity range: 15.9±1.2mV, strain time ≤2s). 1.9 frequency shift, carrier frequency 550Hz, low frequency 15Hz (sensitivity range: 15.9±1.2mV, strain time ≤1.5s). 1.9 frequency shift, carrier frequency 550Hz, low frequency 22.5Hz (sensitivity range: 15.9±1.2mV, strain time ≤1.5s). ZPW-2000, carrier frequency 2000Hz, low frequency 11.4Hz (sensitivity range: 100±7.5mV, strain time ≤2s). ZPW-2000, carrier frequency 2000Hz, low frequency 15.8Hz (sensitivity range: 100±7.5mV, strain time ≤1.5s). ZPW-2000, carrier frequency 2000Hz, low frequency 18Hz (sensitivity range: 100±7.5mV, strain time ≤1.3s). The common parameters set include: the time for all items to turn off the light is ≤4s.

[0043] To simplify the calculation, it is assumed that the actual sensitivity of the device under test at all points is the center value of its range, that is, 15.9mV at the 1.9 frequency shift point and 100mV at the ZPW-2000 point.

[0044] The parameters set in this invention include: a step difference ΔV of 0.3mV and a step accuracy of 0.1mV. To wait for the device under test to stably output the desired light color, the waiting time for all low-frequency strain is uniformly set to 3 seconds, and the waiting time for all low-frequency lamp drop is uniformly set to 5 seconds.

[0045] 2. Testing process of the method of the present invention (1) Item 1 (1.9 frequency shift, 550Hz, 11Hz): Carrier frequency change: First sensitivity test, perform benchmark test, i.e., dichotomy.

[0046] Steps: Output upper limit 17.1mV, output 14.6mV when the device responds correctly, with a lower limit of -0.1mV; output 16.5mV when the device does not respond. The device responds correctly, outputting 15.3mV; the device does not respond, outputting 16.2mV. The device responds correctly, outputting 15.6mV; the device does not respond, outputting 15.7mV. The device does not respond, outputting 15.8mV; the device does not respond, outputting 15.9mV; the device responds correctly.

[0047] Measurement sensitivity: 15.9mV.

[0048] Time taken: Approximately (3+5)+3+(3+5)+3+(3+5)+3+3+3+3=42 seconds.

[0049] Record: Sp = 15.9mV, Fp = 550Hz.

[0050] (2) Item 2 (1.9 frequency shift, 550Hz, 15Hz): The carrier frequency is the same, and the step voltage fine adjustment method is executed.

[0051] Steps: Output Sp-ΔV = 15.9 - 0.3 = 15.6mV, no response from the device, output 15.7mV; no response from the device, output 15.8mV; no response from the device, output 15.9mV, the device responds correctly.

[0052] Measurement sensitivity: 15.9mV.

[0053] Time taken: 3+3+3+3=12 seconds.

[0054] Log: Updated Sp = 15.9mV (3) Item 3 (1.9 frequency shift, 550Hz, 22.5Hz): The carrier frequency is the same, and the step voltage fine-tuning method is performed. Steps: Output Sp-ΔV = 15.9 - 0.3 = 15.6mV, no response from the device, output 15.7mV; no response from the device, output 15.8mV; no response from the device, output 15.9mV, the device responds correctly.

[0055] Measurement sensitivity: 15.9mV.

[0056] Time taken: 3 + 3 + 3 + 3 = 12 seconds.

[0057] Log: Updated Sp = 15.9mV (4) Item 4 (ZPW-2000, 2000Hz, 11.4Hz): Carrier frequency change, perform benchmark test, i.e., binary method.

[0058] Steps: Output upper limit 107.5mV, device responds correctly, output 92.4mV, lower limit -0.1; The device did not respond, outputting 103.8mV; the device responded correctly, outputting 96.3mV. The device did not respond, outputting 101.9mV; the device responded correctly, outputting 98.1mV. The device does not respond and outputs 101mV; the device responds correctly and outputs 99mV. The device does not respond and outputs 100.5mV; the device responds correctly and outputs 99.5mV. The device does not respond and outputs 100.3mV; the device responds correctly and outputs 99.7mV. The device is unresponsive, outputting 99.8mV; the device is unresponsive, outputting 99.9mV. The device did not respond, but output 100mV. The device responded correctly.

[0059] Measurement sensitivity: 100mV.

[0060] Time taken: Approximately (3+5)+3+(3+5)+3+(3+5)+3+(3+5)+3+(3+5)+3+(3+5)+3+3+3+3=75 seconds Record: Sp = 100mV, Fp = 2000Hz.

[0061] (5) Item 4 (ZPW-2000, 2000Hz, 15.8Hz): The carrier frequency is the same, and the step voltage fine-tuning method is implemented. Steps: Output Sp-ΔV = 100 - 0.3 = 99.7mV, no response from the device, output 99.8mV; no response from the device, output 99.9mV; no response from the device, output 100mV; the device responds correctly.

[0062] Measurement sensitivity: 100mV.

[0063] Time taken: Approximately 3 + 3 + 3 + 3 = 12 seconds Record: Sp = 100mV.

[0064] (6) Item 5 (ZPW-2000, 2000Hz, 18Hz): The carrier frequency is the same, and the step voltage fine-tuning method is implemented. Steps: Output Sp-ΔV = 100 - 0.3 = 99.7mV, no response from the device, output 99.8mV; no response from the device, output 99.9mV; no response from the device, output 100mV; the device responds correctly.

[0065] Measurement sensitivity: 100mV.

[0066] Time taken: Approximately 3 + 3 + 3 + 3 = 12 seconds Record: Sp = 100mV.

[0067] 3. Efficiency Comparison Analysis (1) The total time taken by the method of the present invention is: 42+12+12+75+12+12=165 seconds (2) The time taken by the traditional binary search method: 42×3+75×3=351 seconds In the six-item test of this embodiment, the method of the present invention requires only about 165 seconds, while the traditional dichotomy method requires about 351 seconds. The present invention reduces the test time by more than 50%, significantly improving efficiency.

[0068] If the user selects all 15 low frequencies under a 550Hz carrier frequency with a 1.9 frequency shift, or all 15 low frequencies under a 2000Hz carrier frequency of the ZPW-2000 series, the method of this invention is expected to take 42 + 12 × 14 + 75 + 12 × 14 = 453 seconds, while the traditional binary search method takes 42 × 15 + 75 × 15 = 1755 seconds, a reduction of more than 70%. Furthermore, with an increase in the number of test items (e.g., 240 points in total, testing two motherboards), the time saved will be even more considerable, fully demonstrating the practical value and superior performance of this invention.

[0069] Those skilled in the art will understand that embodiments of this disclosure can be provided as methods, systems, or computer program products. Therefore, this disclosure can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this disclosure can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code. This disclosure is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create a machine for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 The computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes. These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this disclosure and not to limit its protection scope. Although this disclosure has been described in detail with reference to the above embodiments, those skilled in the art should understand that after reading this disclosure, they can still make various changes, modifications or equivalent substitutions to the specific implementation of the invention, but these changes, modifications or equivalent substitutions are all within the protection scope of the published pending claims.

Claims

1. A method for rapid testing of locomotive signal sensitivity, characterized in that, The method comprises: initializing a test system and loading a test sequence, the test sequence comprising a plurality of test points, each test point corresponding to a specific carrier frequency and low frequency combination; for each test point in the test sequence, performing the following operations: determining whether the current test point is the first test point in the sequence or whether the carrier frequency of the current test point is different from that of the previous test point; if yes, performing a baseline test procedure on the current test point to determine the sensitivity value of the current test point, and recording the sensitivity value and carrier frequency of the current test point; if no, performing a step voltage fine-tuning test procedure on the current test point to determine the sensitivity value of the current test point, and updating the recorded sensitivity value; repeating the above process until all test points are tested.

2. The method of claim 1, wherein the method further comprises: The baseline test procedure uses a binary search test, which comprises outputting signals of different amplitudes multiple times and observing the device response, and gradually narrowing the range in a binary approximation manner until the final sensitivity value is determined.

3. The method of claim 1, wherein the method further comprises: The step voltage fine-tuning test procedure comprises: outputting to the device under test a signal having an amplitude equal to the recorded sensitivity value minus a preset step difference ; waiting for a specified strain time; if the device under test does not output the expected response, gradually increasing the amplitude of the input signal by a preset step precision, and waiting for a specified strain time after each increase, until the device under test correctly outputs the expected response; the amplitude of the final output signal is taken as the sensitivity value of the current test point.

4. The method of claim 1, wherein the method further comprises: The preset step difference value The value range of the preset step difference value is 0.1 mV to 2 mV.

5. The method of claim 1, wherein the method further comprises: The preset step precision is 0.1 mV.

6. The method of claim 1, wherein the method further comprises: In the baseline test procedure, the strain time after each output signal is not less than 2 seconds, and the drop time after the output is turned off is not less than 4 seconds.

7. The method of claim 1, wherein the method further comprises: In the step voltage fine-tuning test procedure, the strain time is set according to the standard requirements of the test point, and is not less than the minimum strain time.

8. The method of claim 1, wherein the method further comprises: The test points cover multiple signal formats, including at least one of TB / T3060 frequency shift, 1.9 frequency shift, and ZPW-2000 series.

9. A computer device, comprising: A memory and a processor are included, and the memory stores a computer program, when the processor runs the computer program stored in the memory, the processor executes a locomotive signal sensitivity rapid test method according to any one of claims 1-8.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, which is run by the processor to execute the steps of the locomotive signal sensitivity rapid test method according to any one of claims 1-8.

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