Test probe position adjusting device

By using a mechanical structure combining an eccentric wheel and an elastic element, the positioning accuracy and rigidity impact problems of the test probe position adjustment device during high-speed start-stop and reversal are solved, achieving absolute accuracy of the probe position and stability of the test, and reducing the risk of tip wear and damage to the tested object.

CN121633792APending Publication Date: 2026-03-10SHENZHEN IN CUBE AUTOMATION
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-15
Publication Date
2026-03-10

AI Technical Summary

Technical Problem

In the prior art, the positioning accuracy of the test probe is difficult to guarantee when the system response delay is delayed during high-speed start-stop or frequent reversal. The contact pressure fluctuates, and the rigid impact of the driving element affects the test accuracy and the safety of the object under test.

Method used

The mechanical structure adopts a combination of eccentric wheel and elastic element. The rotation of the eccentric wheel drives the upper and lower push parts. The energy storage and release mechanism of the elastic element is used to achieve precise linear displacement of the probe. The mechanical limit eliminates overshoot and hysteresis problems and smoothly absorbs the rigid impact during drive start-up, shutdown and reversal.

Benefits of technology

It achieves absolute accuracy and stability in probe positioning, reduces the risk of tip wear and damage to the tested object, and improves the accuracy and reliability of the test.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a test probe position adjusting device, and belongs to the technical field of chip detection, the test probe position adjusting device comprises a base, a sliding assembly, an auxiliary assembly, a mounting seat and a driving mechanism, the sliding assembly is arranged on the base; a fixing piece of the auxiliary assembly is provided with a limiting groove, two connecting pieces correspondingly penetrate through the two limiting grooves and are connected to the two ends of a U-shaped moving base, and elastic pieces are arranged on the outer surfaces of the connecting pieces in a sleeving mode and located between limiting heads of the connecting pieces and the bottoms of the limiting grooves. The mounting seat is connected to the U-shaped moving seat and is slidably connected to the base through the two sliding assemblies; an eccentric wheel of the driving mechanism is located above a U-shaped opening of the U-shaped moving seat, the driving part is installed on the base and used for driving the eccentric wheel to rotate, the upper pushing part is located above the eccentric wheel and connected to the installation seat, and the lower pushing part is located below the eccentric wheel and connected to the U-shaped moving seat. The outer contour of the eccentric wheel abuts against the upper pushing piece and the lower pushing piece all the time. According to the invention, the position of the test probe can be accurately and stably adjusted.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip detection, in particular to a test probe position adjusting device. BACKGROUND

[0002] In the field of precise electronic testing such as chip detection and circuit board detection, as a key signal conducting element, the position accuracy and contact stability between the test probe and the test point directly determine the accuracy of the electrical signal acquisition and the reliability of the test results. During the test process, the probe needs to be accurately switched between the contact and separation positions, and ensure consistent and stable pressure each time it is contacted, which puts high requirements on the control accuracy, motion stability and impact resistance of the position adjusting device.

[0003] In the prior art, a common scheme to achieve the above position adjustment is to directly drive the probe mounting seat to move up and down by using a linear motor, a pneumatic cylinder or an electric cylinder as a linear driving element. However, due to the lack of reliable end mechanical limit, the motion control completely depends on the position feedback and braking system of the driver, and over-shooting or lagging phenomena are easy to occur due to system response delay when starting and stopping at high speed or frequently reversing, which makes it difficult to ensure the positioning accuracy of the probe, and the contact pressure fluctuates, which seriously affects the test accuracy. Secondly, the rigid impact generated by the driving element itself at the start and stop moment is large, and this impact will be directly transmitted to the probe tip, not only accelerating the tip wear, but also possibly causing mechanical damage to the precise measured object.

[0004] Therefore, it is urgent to provide a test probe position adjusting device to solve the above problems. SUMMARY

[0005] The purpose of the present application is to provide a test probe position adjusting device that can accurately and stably adjust the position of the test probe.

[0006] As conceived above, the technical solution adopted by the present application is:

[0007] The test probe position adjusting device comprises:

[0008] a base;

[0009] two sliding assemblies are arranged on the same side of the base in a horizontal direction;

[0010] an auxiliary assembly comprising a U-shaped moving seat, two fixing members, two connecting members and two elastic members, each of the fixing members is provided with a limiting slot extending in a vertical direction, the two connecting members are correspondingly arranged in the bottom of the two limiting slots and fixedly connected to the two ends of the U-shaped moving seat, and the elastic members are sleeved on the outer surfaces of the connecting members and located between the limiting heads of the connecting members and the bottoms of the limiting slots;

[0011] A mounting base is used for mounting a test probe, and is fixedly connected to the U-shaped moving base and slidably connected to the base along a vertical direction through two sliding assemblies;

[0012] A driving mechanism is located between the two sliding assemblies and comprises a driving member, an eccentric wheel, an upper pushing member and a lower pushing member, the eccentric wheel is located above the U-shaped opening of the U-shaped moving base, the driving member is mounted on the base for driving the eccentric wheel to rotate, the upper pushing member is located above the eccentric wheel and connected to the mounting base, and the lower pushing member is located below the eccentric wheel and connected to the U-shaped moving base, and the outer contour of the eccentric wheel always abuts against the upper pushing member and the lower pushing member when the driving member drives the eccentric wheel to rotate.

[0013] Preferably, the upper pushing member comprises a connecting base, a first bearing and an upper pushing rod, the mounting base is provided with a mounting groove in the top surface, the connecting base is located in the mounting groove and connected to the mounting base, and the upper pushing rod is rotatably connected to the connecting base through the first bearing, and the outer circumferential surface of the upper pushing rod abuts against the outer circumferential surface of the eccentric wheel.

[0014] Preferably, the lower pushing member comprises a connecting rod and a pressing head, the connecting rod is fixedly connected to the U-shaped moving base, and the pressing head is rotatably connected to the connecting rod, and the outer circumferential surface of the pressing head abuts against the outer circumferential surface of the eccentric wheel.

[0015] Preferably, the test probe position adjusting device further comprises a connecting assembly, the connecting assembly comprises a connecting block and a convex ridge, the connecting block is fixedly connected to the U-shaped moving base and provided with a connecting groove, and the convex ridge is connected to the mounting base and embedded in the connecting groove.

[0016] Preferably, the driving member is arranged on the side of the base away from the mounting base, and the driving mechanism further comprises a transmission shaft, the transmission shaft is connected to the output shaft of the driving member, rotatably penetrates through the base and is fixedly connected to the eccentric wheel.

[0017] Preferably, the sliding assembly comprises a guide rail and a sliding block which are slidably matched along the vertical direction, and one of the guide rail and the sliding block is fixed to the base, and the other is fixed to the mounting base.

[0018] Preferably, the mounting base comprises a sliding member and a mounting platform which are vertically connected, the sliding member is slidably connected to the base, and the mounting platform is provided with a mounting hole for mounting the test probe.

[0019] Preferably, a plurality of lightening holes are arranged on the mounting platform.

[0020] The present application has the following advantages:

[0021] The application provides a test probe position adjusting device. When the eccentric end of an eccentric wheel is turned away from a pushing element, the mounting seat naturally falls under the action of gravity, and the pushing element is actively lowered by the eccentric wheel to compress the elastic element and store potential energy. The design ensures that the pushing element is always attached to the profile of the eccentric wheel, and the compression force of the elastic element forms controllable damping in the lowering stage, effectively inhibiting the acceleration trend of free fall and avoiding overshoot or vibration of the probe due to inertia. When the eccentric wheel is turned to push the pushing element upwards, the energy stored in the elastic element is rapidly released to pull the pushing element to follow synchronously, ensuring that the pushing element is continuously attached to the eccentric wheel, so that the upward movement is instant and accurate. This process forms a gapless composite transmission of "active driving and elastic following", which directly converts the rotation angle of the eccentric wheel into accurate linear displacement of the probe, and the geometric profile of the eccentric wheel constitutes rigid physical limiting for the movement of the pushing element and the pushing element, eliminating the overshoot or lag caused by electrical control delay or inaccurate braking, and realizing the absolute accuracy of the probe position ensured by the mechanical structure. At the same time, through the elastic energy storage and release mechanism, the rigid impact of driving start-stop and reversing is smoothly absorbed, reducing the risk of probe tip wear and damage to the measured object. BRIEF DESCRIPTION OF DRAWINGS

[0022] Figure 1 FIG. 1 is a structural schematic diagram of the test probe position adjusting device according to an embodiment of the application;

[0023] Figure 2 FIG. 2 is a partial structural schematic diagram of the test probe position adjusting device according to an embodiment of the application;

[0024] Figure 3 FIG. 3 is a sectional view of the test probe position adjusting device according to an embodiment of the application;

[0025] Figure 4 FIG. 4 is a sectional view of a partial structure of the test probe position adjusting device according to an embodiment of the application.

[0026] In the drawings:

[0027] 1, base;

[0028] 2, sliding assembly; 21, guide rail; 22, sliding block;

[0029] 3, auxiliary assembly; 31, U-shaped moving seat; 32, fixed element; 320, limiting groove; 33, connecting element; 331, limiting head; 34, elastic element;

[0030] 4, mounting seat; 41, sliding element; 42, mounting platform; 420, mounting hole; 421, weight-reducing hole;

[0031] 5, driving mechanism; 51, driving member; 511, output shaft; 52, eccentric wheel; 53, pushing-up member; 531, connecting seat; 532, first bearing; 533, pushing-up rod; 54, pushing-down member; 541, connecting rod; 542, pressing head; 55, transmission shaft;

[0032] 6, connecting assembly; 61, connecting block; 62, convex ridge. DETAILED DESCRIPTION

[0033] The application will be further described below in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described herein are intended to be merely illustrative of the application and not in limitation thereof. It should also be noted that, for the purpose of description, only the parts related to the application are shown in the drawings rather than all the parts.

[0034] In the description of the application, unless otherwise explicitly specified and limited, the terms "connected", "connected", "fixed" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the application can be understood according to the specific circumstances.

[0035] In the present application, unless otherwise explicitly specified and limited, the "upper" or "lower" of the first feature to the second feature can include that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, the "upper", "upper" and "upper" of the first feature to the second feature include that the first feature is directly above and obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The "below", "below" and "below" of the first feature to the second feature include that the first feature is directly below and obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0036] In the description of the present embodiment, the terms "upper", "lower", "right", etc. orientation or position relationship is based on the orientation or position relationship shown in the drawings, which is only for the convenience of description and simplification of operation, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0037] As Figures 1-4As shown, the present application provides a test probe position adjusting device, which comprises a base 1, two sliding assemblies 2, an auxiliary assembly 3, a mounting seat 4 and a driving mechanism 5, the two sliding assemblies 2 are arranged on the same side of the base 1 in a horizontal direction; the auxiliary assembly 3 comprises a U-shaped moving seat 31, two fixing members 32, two connecting members 33 and two elastic members 34, each fixing member 32 is provided with a limiting groove 320 extending in a vertical direction, the two connecting members 33 are correspondingly arranged at the groove bottoms of the two limiting grooves 320 and fixedly connected to the two ends of the U-shaped moving seat 31, the elastic member 34 is sleeved on the outer surface of the connecting member 33 and located between the limiting head 331 of the connecting member 33 and the groove bottom of the limiting groove 320; the mounting seat 4 is used for mounting the test probe, the mounting seat 4 is fixedly connected to the U-shaped moving seat 31 and slidably connected to the base 1 in a vertical direction through the two sliding assemblies 2; the driving mechanism 5 is located between the two sliding assemblies 2 and comprises a driving member 51, an eccentric wheel 52, an upper pushing member 53 and a lower pushing member 54, the eccentric wheel 52 is located above the U-shaped opening of the U-shaped moving seat 31, the driving member 51 is mounted on the base 1 and used for driving the eccentric wheel 52 to rotate, the upper pushing member 53 is located above the eccentric wheel 52 and connected to the mounting seat 4, and the lower pushing member 54 is located below the eccentric wheel 52 and connected to the U-shaped moving seat 31, when the driving member 51 drives the eccentric wheel 52 to rotate, the outer contour of the eccentric wheel 52 always abuts against the upper pushing member 53 and the lower pushing member 54.

[0038] When the eccentric end of the eccentric wheel 52 rotates away from the upper pushing member 53, the mounting seat 4 naturally falls under the action of gravity, and the lower pushing member 54 is actively lowered by the eccentric wheel 52, compresses the elastic member 34 and stores potential energy. This design not only ensures that the upper pushing member 53 always fits the contour of the eccentric wheel 52, but also forms a controllable damping force in the downward phase by compressing the elastic member 34, effectively inhibiting the acceleration trend of free fall and avoiding overshoot or vibration of the probe due to inertia. When the eccentric wheel 52 rotates to push the upper pushing member 53 upwards, the energy stored in the elastic member 34 is rapidly released, pulling the lower pushing member 54 to follow synchronously, ensuring that the lower pushing member 54 continuously adheres to the eccentric wheel 52, making the upward movement instant and accurate. This process forms a "active driving and elastic following" gapless composite transmission, which directly converts the rotation angle of the eccentric wheel 52 into the precise linear displacement of the probe, and the geometric contour of the eccentric wheel 52 constitutes a rigid physical limit for the movement of the upper pushing member 53 and the lower pushing member 54, eliminating the overshoot or lag caused by electrical control delay or inaccurate braking, and realizing the absolute accuracy of the probe position guaranteed by the mechanical structure. At the same time, through the elastic energy storage and release mechanism, the rigid impact of driving start and stop and reversing is smoothly absorbed, reducing the risk of probe tip wear and damage to the measured object.

[0039] In this embodiment, the fixing member 32 is connected to the mounting seat 4 by a bolt.

[0040] In this embodiment, the elastic member 34 is a spring.

[0041] In this embodiment, the U-shaped connecting seat 31 has connecting portions at both ends, and these connecting portions protrude from the sides of the U-shaped moving seat 31. Two connecting pieces 33 are respectively inserted into the bottom of the two limiting grooves 320 and fixedly connected to the two connecting portions. The protruding connecting portions allow for local reinforcement only at key connection points with stress concentration without increasing the overall size of the U-shaped moving seat 31, thereby achieving a lightweight design of the structure while ensuring the strength of the core load-bearing area.

[0042] Specifically, such as Figure 1 As shown, the mounting base 4 includes a vertically connected slider 41 and a mounting platform 42. The slider 41 is slidably connected to the slide base 21, and the mounting platform 42 is provided with a mounting hole 420 for mounting the test probe. The structure in which the slider 41 and the mounting platform 42 are vertically connected achieves a clear division of labor between the sliding guidance function and the test probe mounting function. The mounting hole 420 can be precisely sized according to the diameter and shape of the test probe to ensure that there is no radial loosening after the probe is installed, while avoiding mutual interference between the probe mounting structure and the sliding structure of the slider 41.

[0043] More specifically, the mounting platform 42 is provided with a number of weight-reducing holes 421. The weight-reducing holes 421 can effectively reduce the overall weight of the mounting platform 42, thereby reducing the total weight of the mounting base 4. When the drive mechanism 5 drives the mounting base 4 to move, the lighter mounting base 4 can reduce the power loss of the drive component 51.

[0044] Specifically, such as Figure 1 As shown, the sliding assembly 2 includes a guide rail 21 and a slider 22 that slide in a vertical direction. One of the guide rail 21 and the slider 22 is fixed to the base 1, and the other is fixed to the mounting base 4. The sliding engagement of the guide rail 21 and the slider 22 effectively limits the radial displacement of the mounting base 4 during vertical movement, ensuring that the mounting base 4 always moves smoothly along a preset vertical trajectory. This avoids misalignment between the test probe and the test point due to trajectory deviation, further improving the accuracy of the test position.

[0045] In this embodiment, a slide rail 21 extending vertically is provided on the base 1, and a slider 22 is provided on the mounting base 4.

[0046] In other embodiments, a slider 22 extending vertically is provided on the base 1, and a corresponding slide rail 21 is provided on the mounting base 4.

[0047] Specifically, such as Figure 1 , Figure 2 and Figure 3As shown, the upper pusher 53 includes a connecting seat 531, a first bearing 532 and an upper push rod 533. The top surface of the mounting seat 4 is provided with a mounting groove. The connecting seat 531 is located in the mounting groove and connected to the mounting seat 4. The upper push rod 533 is rotatably connected to the connecting seat 531 through the first bearing 532. The outer peripheral surface of the upper push rod 533 abuts against the outer peripheral surface of the eccentric wheel 42. The connecting seat 531 is stably connected to the mounting seat 4 through the mounting groove, providing a solid mounting foundation for the entire pusher 53, preventing positional displacement during the transmission process with the eccentric wheel 52, and ensuring the accuracy of force transmission. The push rod 533 is rotatably connected to the connecting seat 531 through the first bearing 532, which transforms the contact between the push rod 533 and the outer circumference of the eccentric wheel 52 into rolling friction, reducing the frictional resistance when they come into contact, extending the service life of the push rod 533 and the eccentric wheel 52, and reducing the vibration and noise generated by friction, ensuring smoother operation when the eccentric wheel 52 rotates to drive the mounting seat 4 to switch positions.

[0048] In this embodiment, the mounting groove is formed on the top surface of the slider 41.

[0049] Specifically, the pusher 54 includes a connecting rod 541 and a clamping head 542. The connecting rod 541 is fixedly connected to the U-shaped slide 31, and the clamping head 542 is rotatably connected to the connecting rod 541. The outer circumferential surface of the clamping head 542 abuts against the outer circumferential surface of the eccentric wheel 52. The rotatable connection between the clamping head 542 and the connecting rod 541 transforms the sliding friction between the clamping head 542 and the outer circumferential surface of the eccentric wheel 52 into rolling friction or low-resistance rotational friction during the rotation of the eccentric wheel 52 and the pusher 54. This reduces the frictional resistance and wear at the contact points, making the movement of the pusher 54 smoother and more responsive, and also reducing wear caused by long-term use, thus extending the service life of the eccentric wheel 52 and the pusher 54.

[0050] In this embodiment, the clamping head 542 is rotatably connected to the connecting rod 541 via a second bearing.

[0051] Specifically, such as Figure 3 As shown, the drive component 51 is located on the side of the base 1 opposite to the mounting base 4. The drive mechanism 5 also includes a transmission shaft 55, which is connected to the output shaft 511 of the drive component 51. The transmission shaft 55 rotatably passes through the base 1 and is fixedly connected to the eccentric wheel 52. By placing the drive component 51 and the mounting base 4 on opposite sides of the base 1, structural interference between the drive component 51 and the mounting base 4 during movement is effectively avoided, while also making the device more compact in the vertical space. The output shaft 511 of the drive component 51 is connected to the transmission shaft 55, which rotatably passes through the base 1 and is fixedly connected to the eccentric wheel 52. This shortens the power transmission path, reduces energy loss and error accumulation in intermediate transmission links, and ensures that the torque of the drive component 51 can be accurately and efficiently transmitted to the eccentric wheel 52.

[0052] In this embodiment, the driving component 51 is a motor, and the output shaft 511 is the motor shaft.

[0053] Specifically, such as Figure 1 and Figure 2 As shown, the test probe position adjustment device also includes a connecting component 6, which includes a connecting block 61 and a protrusion 62. The connecting block 61 is fixedly connected to the U-shaped movable seat 31 and is provided with a connecting groove. The protrusion 62 is connected to the mounting base 4 and is embedded in the connecting groove. The fitting design of the protrusion 62 and the connecting groove provides a clear positioning reference for the installation of the mounting base 4 relative to the U-shaped movable seat 31, simplifies the assembly process, ensures the relative positional accuracy between the two, and avoids motion interference or accuracy loss caused by installation deviation.

[0054] In this embodiment, the test probe position adjustment device includes two sets of connecting components 6, which are connected one-to-one to the left and right sides of the U-shaped movable base 31 and arranged symmetrically. The symmetrical distribution of the two sets of connecting components 6 makes the force on the mounting base 4 more balanced. When the test probe is subjected to lateral force or torque due to improper contact position with the test point, the symmetrical structure can effectively decompose and resist the off-center load, prevent the mounting base 4 from tilting, and ensure the accuracy of the vertical movement trajectory of the probe.

[0055] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. Those skilled in the art will be able to make various obvious changes, readjustments, and substitutions without departing from the scope of protection of the present invention. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the claims of the present invention.

Claims

1. A test probe position adjustment device, characterized by, Include: Base (1); Two sliding assemblies (2) are arranged on the same side of the base (1) in the horizontal direction; Auxiliary assembly (3), including U-shaped moving seat (31), two fixed parts (32), two connecting parts (33) and two elastic parts (34), each fixed part (32) is provided with a limiting slot (320) extending in the vertical direction, two connecting parts (33) are correspondingly provided in the bottom of two limiting slots (320) and fixedly connected to both ends of the U-shaped moving seat (31), the outer surface of each connecting part (33) is sleeved with the elastic part (34), and the elastic part (34) is located between the limiting head (331) of the connecting part (33) and the bottom of the limiting slot (320); Mounting seat (4) for mounting test probe, the mounting seat (4) is fixedly connected to the U-shaped moving seat (31) and is connected to the base (1) in the vertical direction through two sliding assemblies (2); Driving mechanism (5) is located between two sliding assemblies (2), including driving part (51), eccentric wheel (52), upper pushing part (53) and lower pushing part (54), the eccentric wheel (52) is located above the U-shaped opening of the U-shaped moving seat (31), the driving part (51) is installed on the base (1) for driving the eccentric wheel (52) to rotate, the upper pushing part (53) is located above the eccentric wheel (52) and is connected to the mounting seat (4), the lower pushing part (54) is located below the eccentric wheel (52) and is connected to the U-shaped moving seat (31), when the driving part (51) drives the eccentric wheel (52) to rotate, the outer contour of the eccentric wheel (52) always abuts the upper pushing part (53) and the lower pushing part (54).

2. The test probe position adjustment apparatus according to claim 1, wherein The upper pushing part (53) includes connecting seat (531), first bearing (532) and upper pushing rod (533), the top surface of the mounting seat (4) is provided with a mounting slot, the connecting seat (531) is located in the mounting slot and is connected to the mounting seat (4), the upper pushing rod (533) is rotatably connected to the connecting seat (531) through the first bearing (532), and the outer circumferential surface of the upper pushing rod (533) abuts the outer circumferential surface of the eccentric wheel (52).

3. The test probe position adjustment apparatus according to claim 1, wherein The lower pushing part (54) includes connecting rod (541) and pressing head (542), the connecting rod (541) is fixedly connected to the U-shaped moving seat (31), the pressing head (542) is rotatably connected to the connecting rod (541), and the outer circumferential surface of the pressing head (542) abuts the outer circumferential surface of the eccentric wheel (52).

4. The test probe position adjustment apparatus according to claim 1, wherein The test probe position adjusting device further comprises a connecting assembly (6), the connecting assembly (6) comprises a connecting block (61) and a convex ridge (62), the connecting block (61) is fixedly connected to the U-shaped moving seat (31) and is provided with a connecting slot, and the convex ridge (62) is connected to the mounting seat (4) and embedded in the connecting slot.

5. The test probe position adjustment apparatus according to claim 1, wherein The driving member (51) is arranged on the side of the base (1) away from the mounting seat (4), and the driving mechanism (5) further comprises a transmission shaft (55) connected to an output shaft (511) of the driving member (51) and rotatably penetrating through the base (1) and being fixedly connected to the eccentric wheel (52).

6. The test probe position adjustment apparatus according to claim 1, wherein The sliding assembly (2) comprises a guide rail (21) and a sliding block (22) slidingly fitted along the vertical direction, one of the guide rail (21) and the sliding block (22) being fixed to the base (1) and the other being fixed to the mounting seat (4).

7. The test probe position adjustment apparatus according to any one of claims 1 to 6, characterized by The mounting seat (4) comprises a sliding member (41) and a mounting platform (42) connected vertically, the sliding member (41) being slidingly connected to the base (1), and the mounting platform (42) being provided with mounting holes (420) for mounting the test probes.

8. The test probe position adjustment apparatus according to claim 7, wherein A plurality of lightening holes (421) are formed in the mounting platform (42).