Current protection test method, device and system, electronic equipment and storage medium

Abstract

The invention discloses a current protection test method, device and system, electronic equipment and a storage medium. The first feedback information corresponding to the tripping signal grabbed by the data acquisition device and the second feedback information corresponding to the notification signal of the current generation device are acquired to obtain the tripping time of the to-be-tested device, and then the current protection test is automatically completed based on the comparison result of the tripping time and the set time range. Therefore, the labor cost is reduced, and errors caused by manual testing are reduced. Meanwhile, the tripping time is judged according to the feedback information related to the to-be-tested equipment, automatic testing of current protection can be completed without multiple times of physical switching-on operation, and the accuracy and efficiency of current protection testing are improved.

Description

Technical Field

[0001] This application relates to the field of equipment testing technology, specifically to a current protection testing method, apparatus, system, electronic device, and storage medium. Background Technology

[0002] Current protection devices (such as current protection relays or circuit breakers) are used to monitor the current in a circuit and take corresponding protective measures when the current exceeds a set threshold, such as cutting off the circuit or triggering an alarm. Current protection testing is a method used to verify the function and performance of current protection devices to ensure that they can trigger protective actions in a timely manner and prevent the current in the circuit from exceeding safe limits. Traditional current protection testing relies on manual operation at different test points, followed by tripping the circuit breaker after protection occurs and then manually closing it. This method is not only inefficient but also inaccurate. Summary of the Invention

[0003] The purpose of this application is to provide a current protection testing method, apparatus, system, electronic device, and storage medium to solve the problems of low efficiency and low accuracy in current protection testing in the prior art.

[0004] To achieve the above objectives, the first aspect of this application provides a test method for current protection, applied to a test device for current protection. The test device is electrically connected to a data acquisition device and a current generating device, respectively. The data acquisition device is electrically connected to the current generating device and the device under test (DUT), respectively. The current generating device is electrically connected to the DUT. The test method includes:

[0005] The trigger current generator outputs a set current to the device under test and sends a notification signal to the data acquisition device. The set current is used to trigger the current protection function of the device under test.

[0006] Acquire the first feedback information fed back by the data acquisition device when it detects the tripping signal of the device under test, and the second feedback information fed back when it receives the notification signal;

[0007] Based on the first and second feedback information, determine the tripping time of the device under test;

[0008] The current protection test results of the device under test are determined based on the comparison between the tripping time and the set time range.

[0009] In this embodiment of the application, determining the tripping time of the device under test based on the first feedback information and the second feedback information includes:

[0010] The first timestamp when the data acquisition device collected the trip signal is obtained from the first feedback information, and the second timestamp when the data acquisition device collected the notification signal is obtained from the second feedback information;

[0011] The time difference is determined based on the first timestamp and the second timestamp;

[0012] The time difference is determined as the tripping time of the device under test.

[0013] In this embodiment of the application, determining the tripping time of the device under test based on the first feedback information and the second feedback information includes:

[0014] Get the set sampling rate;

[0015] Obtain the first edge timestamp of the trip signal and the second edge timestamp of the notification signal;

[0016] Determine the edge time difference based on the first edge timestamp and the second edge timestamp;

[0017] The ratio of the edge time difference to the set sampling rate is determined as the tripping time of the device under test.

[0018] In this embodiment of the application, the device under test includes multiple test points. Based on the comparison between the tripping time and a set time range, the current protection test result of the device under test is determined, including:

[0019] Determine if the tripping time is within the set time range;

[0020] If the tripping time is within the set time range, the current test point of the device under test is determined to have passed the current protection test;

[0021] Test the next test point of the device under test until the test conditions are met;

[0022] If the tripping time is not within the set time range, the current test point of the device under test is determined to have failed the current protection test.

[0023] In this embodiment of the application, the testing method further includes:

[0024] When the test termination conditions are met, the test report of the device under test is output.

[0025] The conditions for ending the test include all test points of the device under test passing the current protection test, and test points failing the current protection test.

[0026] In this embodiment of the application, the testing method further includes:

[0027] Turn on the control data acquisition device;

[0028] Set the acquisition parameters of the data acquisition device;

[0029] After the set delay time, the trigger current generator outputs the set current;

[0030] Once the test completion signal is received, the control data acquisition device is turned off.

[0031] In this embodiment of the application, the testing method further includes:

[0032] Adjust the output current of the current generator;

[0033] When the output current triggers the power supply of the device under test to disconnect, the output current is set to the set current.

[0034] In this embodiment of the application, the device under test includes a trip signal generation circuit and a trip execution circuit, and the test method further includes:

[0035] Disconnect the trip signal generation circuit and the trip execution circuit, and connect the trip signal generation circuit to the data acquisition device.

[0036] A second aspect of this application provides a current protection testing device, which is electrically connected to a data acquisition device and a current generating device, respectively. The data acquisition device is electrically connected to the current generating device and the device under test (DUT), and the current generating device is electrically connected to the DUT. The testing device includes:

[0037] The trigger module is used to trigger the current generator to output a set current to the device under test and send a notification signal to the data acquisition device. The set current is used to trigger the current protection function of the device under test.

[0038] The acquisition module is used to acquire the first feedback information fed back by the data acquisition device when it detects the tripping signal of the device under test, and the second feedback information fed back when it receives the notification signal.

[0039] The determination module is used to determine the tripping time of the device under test based on the first feedback information and the second feedback information.

[0040] The comparison module is used to determine the current protection test result of the device under test based on the comparison between the tripping time and the set time range.

[0041] A third aspect of this application provides an electronic device including the aforementioned current protection testing apparatus, the electronic device comprising:

[0042] The memory is configured to store instructions; and

[0043] The processor is configured to retrieve instructions from memory and to implement the aforementioned current protection test method when executing instructions.

[0044] A fourth aspect of this application provides a current protection testing system, comprising:

[0045] The aforementioned electronic devices;

[0046] A current generating device, electrically connected to electronic equipment and the device under test;

[0047] The data acquisition device is electrically connected to the electronic equipment and the current generating device.

[0048] The fifth aspect of this application provides a machine-readable storage medium storing instructions that, when executed by a processor, configure the processor to perform the aforementioned current protection test method.

[0049] This application provides a current protection testing device, which is electrically connected to a data acquisition device and a current generator. The data acquisition device is electrically connected to both the current generator and the device under test (DUT), and the current generator is electrically connected to the DUT. The testing device first triggers the current generator to output a set current to the DUT and sends a notification signal to the data acquisition device. The set current is used to trigger the current protection function of the DUT. Then, it acquires first feedback information from the data acquisition device when it detects a tripping signal from the DUT, and second feedback information from the notification signal received. Next, based on the first and second feedback information, the tripping time of the DUT is determined. Finally, based on the comparison between the tripping time and a set time range, the current protection test result of the DUT is determined. This application obtains the tripping time of the DUT by acquiring the first feedback information corresponding to the tripping signal captured by the data acquisition device and the second feedback information corresponding to the notification signal from the current generator, and then automatically completes the current protection test based on the comparison between the tripping time and the set time range. This reduces labor costs and minimizes errors caused by manual testing. Meanwhile, by determining the tripping time through feedback information related to the device under test, the current protection test can be automated without performing multiple physical closing operations, thus improving the accuracy and efficiency of the current protection test.

[0050] Other features and advantages of this application will be described in detail in the following detailed description section. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 This is a schematic diagram of the structure of a current protection test system provided in an embodiment of this application;

[0053] Figure 2 This is a schematic diagram of the structure of a current protection test system provided in a specific embodiment of this application;

[0054] Figure 3 This is a flowchart illustrating a current protection testing method provided in an embodiment of this application;

[0055] Figure 4 This is a flowchart illustrating a data acquisition method using a data acquisition board provided in an embodiment of this application.

[0056] Figure 5 This is a flowchart illustrating a current protection testing method provided in a specific embodiment of this application;

[0057] Figure 6 This is a schematic diagram of the structure of a current protection testing device provided in an embodiment of this application;

[0058] Figure 7 This is a structural block diagram of an electronic device provided in an embodiment of this application. Detailed Implementation

[0059] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0060] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified. In this application, the term "exemplary" is used to mean "used as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is provided to enable any person skilled in the art to implement and use this application. In the following description, details are set forth for illustrative purposes. It should be understood that those skilled in the art will recognize that this application can be implemented without using these specific details. In other instances, well-known structures and processes will not be described in detail to avoid unnecessary detail that would obscure the description of this application. Therefore, this application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

[0061] The current protection testing method in this application embodiment is applied to a current protection testing device, which is installed in an electronic device. In this application embodiment, the testing device is used to test the current protection function of the device under test. The device under test can be a molded case circuit breaker. Molded case circuit breakers are typically used in low-voltage circuits to prevent excessive current caused by circuit overload, short circuit, and other faults by disconnecting the circuit. For example... Figure 1 As shown, Figure 1 This is a schematic diagram of a current protection test system provided in an embodiment of this application. The current protection test system in this embodiment may include an electronic device 100, which integrates a current protection test device to run a machine-readable storage medium corresponding to a current protection test method, thereby executing the steps of the current protection test method. The test system may also include a current generator 200, a data acquisition device 300, and a device under test (DUT) 400. The current generator 200 is electrically connected to the electronic device 100 and the DUT 400, and the data acquisition device 300 is electrically connected to both the electronic device 100 and the current generator 200. The current generator 200 can be used to adjust and control the magnitude of the current, setting and outputting a specific current value as needed, thereby enabling the DUT to obtain a current of a set magnitude. In this embodiment, the current generator 200 can be configured with a set current, i.e., a setpoint current, that enables the DUT 400 to activate its current protection function. In this way, when the current generator 200 outputs a set current to the device under test (DUT) 400, the DUT 400, upon receiving the set current, activates its current protection function and generates a trip signal. The data acquisition device 300 can then collect feedback information from both the DUT 400 and the current generator 200, thereby testing the current protection function of the DUT 400 based on the two feedback signals. Thus, through the architecture of the aforementioned testing system, the current protection function of the DUT 400 can be automatically tested, freeing up manpower and improving testing efficiency and accuracy.

[0062] The following explanation uses the current generator 200 as the current platform 210 and the data acquisition device 300 as the data acquisition board 310 as examples. Figure 2 This is a schematic diagram of the structure of a current protection test system provided in a specific embodiment of this application. Figure 2As shown, the test system also includes a transmitter 500, which is a device for converting the acquired signal into a standard signal. The transmitter 500 is connected to the current stage 210, the device under test (DUT) 400, and the data acquisition board 310. The electronic device 100 triggers the current stage 210 to output current. The transmitter 500 converts the current signal output by the current stage 210 into a standard signal and sends the standard signal to the data acquisition board 310 and the DUT 400. Thus, both the DUT 400 and the data acquisition board 310 can receive and read the standard signal to perform subsequent operations. After receiving feedback information from the DUT 400 and the current stage 210, the data acquisition board 310 sends the feedback information to the electronic device 100, completing the automated test of the current protection function of the DUT 400. Furthermore, in this embodiment, the current protection function can be tested at different points on the DUT 400, and the same test method can be performed for each point.

[0063] Understandable, Figure 1 and Figure 2 The electronic equipment in the current protection test system shown, or the devices contained in the electronic equipment, do not constitute a limitation on the embodiments of this application. That is, the number or type of equipment contained in the test system, or the number or type of devices contained in each device, do not affect the overall implementation of the technical solution in the embodiments of this application, and can all be considered as equivalent substitutions or derivatives of the technical solutions claimed in the embodiments of this application.

[0064] In this application embodiment, the electronic device 100 can be an independent device, or a device network or device cluster composed of devices. For example, the electronic device 100 described in this application embodiment includes, but is not limited to, a computer, a network host, a single network device, a set of multiple network devices, or a cloud device composed of multiple devices. Among them, the cloud device is composed of a large number of computers or network devices based on cloud computing.

[0065] Those skilled in the art will understand that Figure 1 and Figure 2 The current protection test system shown is merely one application scenario corresponding to the technical solution of this application, and does not constitute a limitation on the application scenario of the technical solution of this application. Other application scenarios may include... Figure 1 The number of more or fewer electronic devices shown, or the network connections of electronic devices, for example Figure 1 Only one electronic device is shown in the diagram. It is understood that the current protection test system may also include one or more other electronic devices, which are not specified here.

[0066] It should be noted that, Figure 1 and Figure 2The current protection test system shown is merely an example. The current protection test system described in this application embodiment is for the purpose of more clearly illustrating the technical solution of this application embodiment and does not constitute a limitation on the technical solution provided in this application embodiment.

[0067] Based on the above-described current protection test system, an embodiment of the current protection test method is proposed. A detailed description is provided below with reference to the accompanying drawings.

[0068] Figure 3 This is a flowchart illustrating a current protection testing method provided in an embodiment of this application. Figure 3 As shown, the test method can be performed by the above-mentioned electronic device 100, which includes a current protection test device. The test device is electrically connected to a data acquisition device and a current generating device. The data acquisition device is electrically connected to the current generating device and the device under test. The current generating device is electrically connected to the device under test. The current protection test method will be described in detail below.

[0069] Step 301: The trigger current generator outputs a set current to the device under test and sends a notification signal to the data acquisition device. The set current is used to trigger the current protection function of the device under test.

[0070] In this embodiment, when the testing device begins testing, it can trigger the current generator to output a set current to the device under test (DUT). This set current is a current that can trigger the current protection function of the DUT. In this embodiment, the set current of the current generator can be configured in advance. Specifically, the output current of the current generator can be adjusted, and the state of the DUT can be observed. When the output current triggers the power supply to the DUT to disconnect, the output current is determined as the set current. In this way, the obtained set current can trigger the current protection function of the DUT.

[0071] While the current generator outputs a set current to the device under test (DUT), it can send a notification signal to the data acquisition device. This notification signal is a signal that informs the data acquisition device that the current generator has output current to the DUT. In one example, the notification signal may contain information characterizing the time when the current generator outputs the set current, such as timestamp information or timestamp information corresponding to a signal edge.

[0072] In one embodiment of this application, the data acquisition device can be configured as a data acquisition board. The data acquisition board can be turned on or off as needed. When the data acquisition board is turned on, signal acquisition can be performed; conversely, when the data acquisition board is turned off, signal acquisition cannot be performed. This reduces the energy consumption of data acquisition and extends the lifespan of the data acquisition device.

[0073] Step 302: Obtain the first feedback information fed back by the data acquisition device when detecting the tripping signal of the device under test and the second feedback information received when receiving the notification signal.

[0074] In the embodiment of the present application, after the device under test receives the set current, it will enter the current protection state and generate a tripping signal at the same time. The tripping signal is a signal used to trigger or indicate the disconnection of a circuit or device, so as to ensure that the power supply of the device under test can be quickly cut off and the operation of the device under test can be stopped in case of dangerous situations such as faults. The time when the current generating device sends current to the device under test and the time when the device under test generates the tripping signal should be within a certain time difference to ensure that the current protection function of the device under test is qualified. Therefore, in the embodiment of the present application, the data acquisition device collects the tripping signal and the notification signal, captures two signals through the data acquisition device, and sends the feedback information corresponding to the two signals to the test device. The test device then determines whether the device under test passes the current protection test by comparing the two pieces of feedback information. In the embodiment of the present application, the feedback information includes the first feedback information and the second feedback information. The first feedback information is the feedback information corresponding to the tripping signal of the device under test, and the second feedback information is the feedback information corresponding to the notification signal.

[0075] Step 303: Determine the tripping time of the device under test according to the first feedback information and the second feedback information.

[0076] In the embodiment of the present application, the feedback information may include, but is not limited to, the time stamp corresponding to when the data acquisition device receives the signal, the edge time stamp of the signal, etc., which can be used to determine the time difference information between multiple signals. After the test device obtains the first feedback information and the second feedback information sent by the data acquisition device, it can determine the time difference between the tripping signal and the notification signal based on the time stamp-related information contained in the first feedback information and the second feedback information, so as to obtain the tripping time of the device under test.

[0077] Step 304: Determine the current protection test result of the device under test according to the comparison result between the tripping time and the set time range.

[0078] In the embodiment of the present application, a set time range can be determined in advance. This set time range is a condition for determining the current protection test result of the device under test. Within this set time range, it indicates that the device under test trips normally, that is, the current protection function is qualified. If it exceeds this set time range, it indicates that the current protection function of the device under test is unqualified and fails the current protection test. In this way, based on the comparison between the tripping time and the set time range, the current protection test of the device under test can be carried out efficiently and accurately.

[0079] In this embodiment, the device under test (DUT) may include a trip signal generation circuit and a trip execution circuit. To better perform automated testing, the trip signal generation circuit and the trip execution circuit can be disconnected, and the trip signal generation circuit can be connected to a data acquisition device. By bringing out the trip signal generation circuit and the trip execution circuit of the DUT, automated testing of each point can be completed without multiple physical closing operations.

[0080] This application embodiment obtains the tripping time of the device under test (DUT) by acquiring first feedback information corresponding to the tripping signal captured by the data acquisition device and second feedback information corresponding to the notification signal from the current generating device. Based on the comparison between the tripping time and a set time range, the current protection test is automatically completed. This reduces labor costs and minimizes errors caused by manual testing. Furthermore, by determining the tripping time using feedback information related to the DUT, the current protection test can be automated without multiple physical closing operations, improving the accuracy and efficiency of the current protection test.

[0081] In this embodiment, the time difference between the tripping signal and the notification signal can be determined based on the timestamp information directly acquired by the data acquisition device or based on the sampling rate and the signal edge timestamp information. Examples of these two determination methods are given below.

[0082] In one example, the feedback signal may include a timestamp corresponding to when the data acquisition device acquired the signal. The first timestamp is the timestamp when the data acquisition device acquired the tripping signal, and the second timestamp is the timestamp when the data acquisition device acquired the notification signal. Therefore, in step 303, the first timestamp when the data acquisition device acquired the tripping signal can be obtained from the first feedback information, and the second timestamp when the data acquisition device acquired the notification signal can be obtained from the second feedback information. Then, the time difference is determined based on the first and second timestamps. This time difference is then determined as the tripping time of the device under test.

[0083] In another example, the feedback signal may include the edge timestamp corresponding to the moment the data acquisition device acquires the signal. The edge timestamp refers to the time when the first rising edge appears in the signal waveform. The ratio of the edge timestamp to the sampling rate of the data acquisition device is the signal timestamp. Specifically, the first edge timestamp refers to the edge timestamp when the data acquisition device acquires the trip signal, and the second edge timestamp refers to the edge timestamp when the data acquisition device acquires the notification signal. Therefore, in step 303, the set sampling rate can be obtained first. Then, the first edge timestamp of the trip signal and the second edge timestamp of the notification signal are obtained. The edge time difference is determined based on the first and second edge timestamps. Finally, the ratio of the edge time difference to the set sampling rate is determined as the trip time of the device under test.

[0084] It should be noted that the embodiments of this application are not limited to the above-described method of collecting the time difference of multiple signals. Other methods that can determine the time difference of multiple signals can also be used to calculate the time difference, such as a set processing algorithm, etc., which are not limited here.

[0085] To improve the safety and reliability of the system containing the device under test (DUT), the current protection of the DUT is typically implemented at multiple test points. Therefore, in this embodiment, the DUT may include multiple test points. For the current protection test of the DUT, multiple test points can be tested sequentially. In step 304, it can be determined whether the current test point has passed the current protection test by judging whether the tripping time is within a set time range. If the tripping time is within the set time range, it indicates that the current protection function of the test point is qualified, and the current test point of the DUT can be determined to have passed the current protection test. Then, the next test point of the DUT is tested until the test termination condition is met. Conversely, if the tripping time is not within the set time range, it indicates that the current test point has not passed the current protection test, and the current test point of the DUT can be determined to have failed the current protection test.

[0086] In this embodiment, the test termination condition may include all test points (TPTs) of the device under test (DUT) passing the current protection test, and one TPT failing the current protection test. When the test termination condition is met, a test report for the DUT can be output. In one example, if the test termination condition is that all TPTs of the DUT pass the current protection test, a test report indicating that the DUT has passed the test can be output. In another example, if the test termination condition is that one TPT in the DUT fails the current protection test, a test report indicating that the DUT has failed the current protection test will be output, and the faulty TPT and related test information will be presented in the test report. This allows users to more intuitively view and analyze the test results and promptly troubleshoot the faulty DUT.

[0087] In this embodiment, to improve the lifespan of the data acquisition device, automated testing can be performed by controlling the data acquisition device to turn on and off. Specifically, first, the data acquisition device is turned on, and the acquisition parameters are set. After setting the set delay time for the acquisition parameters, a current generator is triggered to output a set current to perform automated testing of the device under test. Upon receiving a test completion signal, the data acquisition device can be turned off.

[0088] The following explanation uses a data acquisition device as an example to illustrate the data acquisition process of the data acquisition board. Figure 4This is a flowchart illustrating a data acquisition method using a data acquisition board provided in an embodiment of this application. Figure 4 As shown, this data acquisition method includes steps 401-406.

[0089] Step 401: Power on the data acquisition board.

[0090] Step 402: Configure AI settings. These settings may include: sampling rate, acquisition mode, wiring method, trigger source, and adding new AI channels. For example, the sampling rate can be set to 3200, the acquisition mode can be set to continuous acquisition, the wiring method can be set to differential (DIFF), the trigger source can be set to analog input software trigger, and adding new AI channels may include Trip and In channels.

[0091] Step 403: AI activation trigger.

[0092] In this embodiment of the application, a set delay time can be set. After the set delay time of the data acquisition board is set, such as 1 second, step 404 can be entered to send a trigger signal to the current protection test device so that the test device triggers the current stage to output the set current.

[0093] Step 405: Obtain the time difference of multiple signals. One signal is the first feedback information fed back when the tripping signal of the device under test is detected, and the other signal is the second feedback information fed back when the notification signal is received. The time difference is determined based on the first and second feedback information. In one example, the time difference can be determined based on the channel number, signal type, edge type, edge threshold, and processing algorithm.

[0094] Step 406: After receiving the test completion signal from the test device, shut down the data acquisition board.

[0095] This application embodiment allows for customized settings for current protection testing by configuring a data acquisition board. Simultaneously, by disconnecting the physical tripping action, the tripping signal of the device under test and the notification signal of the current generating device are extracted, enabling the data acquisition board to more accurately acquire the two signals and feed back the timing information of the two signals to the testing device. This improves the calculation accuracy of the tripping signal and realizes automated testing of current protection.

[0096] Based on such Figure 4 The data acquisition board shown below will be used as an example to illustrate the test method for current protection. Figure 5This is a flowchart illustrating a current protection testing method provided in a specific embodiment of this application. In one specific embodiment, the device under test includes multiple points, and the current protection testing method may include steps 501-509, which will be described in detail below.

[0097] Step 501: Configure the current protection setting value of the device under test.

[0098] Step 502: When the power supply to the device under test is disconnected, the setting value is determined as the set current.

[0099] Step 503: Enable the data acquisition function of the data acquisition board;

[0100] Step 504: The current stage outputs the configured set current to the device under test and sends a notification signal to the data acquisition board;

[0101] Step 505: Determine the tripping time based on the first and second feedback information;

[0102] Step 506: Determine if the tripping time is within the set time range. If yes, proceed to step 507; otherwise, proceed to step 509.

[0103] Step 507: Determine whether all test points of the device under test have been tested. If yes, proceed to step 508; otherwise, continue testing the next test point and return to step 501.

[0104] Step 508: Output the test report of the device under test.

[0105] Step 509: Pause the test and proceed to step 508.

[0106] This embodiment first configures the set current output of the current generator, then collects the notification signal from the current generator and the tripping signal from the device under test (DUT) via a data acquisition board. It then sends the first feedback information detected when the DUT trips, and the second feedback information received when the notification signal is received, to the testing device. The testing device determines the tripping time of the DUT based on the first and second feedback information. It then compares the tripping time with a set time range to determine the current protection test result of the DUT. If the tripping time is within the set time range, the test continues to the next test point until all test points of the DUT have completed the current protection test. When a test point's tripping time is outside the set time range, the current protection test is terminated promptly, and a test report containing fault information is output. In this way, the current protection test of each test point of the DUT is automatically completed using the above method, reducing labor costs and minimizing errors caused by manual testing. Furthermore, by determining the tripping time using feedback information related to the DUT, multiple physical closing operations are unnecessary, thus automating the current protection test and improving its accuracy and efficiency.

[0107] Figure 6 This is a schematic diagram of a current protection testing device 600 provided in an embodiment of this application. As shown, the testing device may include a trigger module 601, an acquisition module 602, a determination module 603, and a comparison module 604. The trigger module 601 is used to trigger a current generator to output a set current to the device under test (DUT) and send a notification signal to a data acquisition device. The set current is used to trigger the current protection function of the DUT. The acquisition module 602 is used to acquire first feedback information fed back by the data acquisition device when it detects a tripping signal from the DUT, and second feedback information fed back upon receiving the notification signal. The determination module 603 is used to determine the tripping time of the DUT based on the first and second feedback information. The comparison module 604 is used to determine the current protection test result of the DUT based on the comparison result between the tripping time and a set time range.

[0108] The trigger module 601, acquisition module 602, determination module 603, and comparison module 604 of this application embodiment can be used to execute steps 301-304 in the embodiment corresponding to the above-mentioned current protection test method. For the specific implementation of these modules and more details, please refer to the corresponding method section, which will not be repeated here.

[0109] Figure 7 This is a structural block diagram of an electronic device provided in an embodiment of this application. Figure 7As shown in the embodiment of this application, the electronic device 100 includes the aforementioned current protection testing apparatus 600. The electronic device 100 may include a memory 710 and a processor 720. The memory 710 is configured to store instructions. The processor 720 is configured to retrieve instructions from the memory and, when executing the instructions, to implement the aforementioned current protection testing method.

[0110] This application also provides a machine-readable storage medium storing instructions that, when executed by a processor, configure the processor to perform the aforementioned current protection test method.

[0111] Since the instructions stored in the electronic device and the machine-readable storage medium can execute the steps in any of the current protection test methods provided in the embodiments of this application, the beneficial effects that any of the current protection test methods provided in the embodiments of this application can achieve can be realized, as detailed in the previous embodiments, and will not be repeated here.

[0112] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0113] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create a machine for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0114] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0115] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0116] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0117] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0118] Computer-readable media include both permanent and non-permanent, removable and non-removable media, which can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient media, such as modulated communication signals and carrier waves.

[0119] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0120] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A method of testing for current protection, characterized by, The application is applied to a test device for current protection, the test device is electrically connected with a data acquisition device and a current generating device respectively, the data acquisition device is electrically connected with the current generating device and a device to be tested respectively, the current generating device is electrically connected with the device to be tested, and the test method comprises the following steps: triggering the current generating device to output a set current to the device to be tested, and sending a notification signal to the data acquisition device, wherein the set current is used for triggering the current protection function of the device to be tested; acquiring first feedback information fed back by the data acquisition device when detecting the tripping signal of the device to be tested and second feedback information fed back by the data acquisition device when receiving the notification signal; determining the tripping time of the device to be tested according to the first feedback information and the second feedback information; determining the current protection test result of the device to be tested according to the comparison result of the tripping time and a set time range.

2. The test method of claim 1, wherein, The method for determining the tripping time of the device to be tested according to the first feedback information and the second feedback information comprises the following steps: acquiring a first time stamp when the data acquisition device collects the tripping signal from the first feedback information, and acquiring a second time stamp when the data acquisition device collects the notification signal from the second feedback information; determining a time difference according to the first time stamp and the second time stamp; determining the tripping time of the device to be tested as the time difference.

3. The test method of claim 1, wherein, The method for determining the tripping time of the device to be tested according to the first feedback information and the second feedback information comprises the following steps: acquiring a set sampling rate; acquiring a first edge time stamp of the tripping signal and a second edge time stamp of the notification signal; determining an edge time difference according to the first edge time stamp and the second edge time stamp; determining the ratio of the edge time difference to the set sampling rate as the tripping time of the device to be tested.

4. The test method of claim 1, wherein, The device to be tested comprises a plurality of test points, and the method for determining the current protection test result of the device to be tested according to the comparison result of the tripping time and a set time range comprises the following steps: determining whether the tripping time is within the set time range; if the tripping time is within the set time range, determining that the current test point of the device to be tested passes the current protection test; testing the next test point of the device to be tested until the end test condition is reached if the tripping time is not within the set time range, determining that the current test point of the device to be tested fails the current protection test.

5. The test method of claim 4, wherein, The test method further comprises the following steps: outputting a test report of the device to be tested when the end test condition is reached; wherein the end test condition comprises that all test points of the device to be tested pass the current protection test, and that there is a test point that fails the current protection test.

6. The test method according to any one of claims 1 to 5, characterized in that, The test method further comprises the following steps: controlling the data acquisition device to be turned on; setting the acquisition parameters of the data acquisition device; after a set delay time, triggering the current generating device to output the set current; after receiving a test completion signal, controlling the data acquisition device to be turned off.

7. The test method according to any one of claims 1 to 5, characterized in that, Further comprising the following steps: adjusting the output current of the current generating device; The output current is determined as the set current when the output current triggers the power supply of the device under test to be turned off.

8. The test method according to any one of claims 1 to 5, characterized in that, The device under test comprises a trip signal generating circuit and a trip execution circuit, and the test method further comprises: The trip signal generating circuit and the trip execution circuit are turned off, and the trip signal generating circuit is connected to the data acquisition device.

9. A test device for current protection, characterized in that The test device is electrically connected to the data acquisition device and the current generating device respectively, the data acquisition device is electrically connected to the current generating device and the device under test respectively, the current generating device is electrically connected to the device under test, and the test device comprises: The triggering module is configured to trigger the current generating device to output a set current to the device under test, and send a notification signal to the data acquisition device, wherein the set current is used to trigger the current protection function of the device under test; The acquisition module is configured to acquire first feedback information fed back by the data acquisition device when the trip signal of the device under test is detected, and second feedback information fed back when the notification signal is received; The determination module is configured to determine the trip time of the device under test according to the first feedback information and the second feedback information; The comparison module is configured to determine the current protection test result of the device under test according to the comparison result of the trip time and the set time range.

10. An electronic device, comprising: The electronic device comprises the test device for current protection according to claim 9. a memory configured to store instructions; and a processor configured to call the instructions from the memory and enable the current protection test method according to any one of claims 1 to 8 to be implemented when the instructions are executed.

11. A test system for current protection, characterized by comprises: the electronic device according to claim 10; a current generating device electrically connected to the electronic device and the device under test; a data acquisition device electrically connected to the electronic device and the current generating device.

12. A machine-readable storage medium, characterized in that, The machine-readable storage medium stores instructions thereon, which, when executed by a processor, cause the processor to be configured to perform the current protection test method according to any one of claims 1 to 8.

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