Filament testing device and method for X-ray tube

Abstract

The invention relates to a filament testing device and method for an X-ray tube. The filament testing device comprises a cavity and a testing rack. The cavity is communicated with the test rack; a plurality of filament test positions are arranged in the cavity, the filament test positions are used for installing to-be-tested filaments, and the plurality of to-be-tested filaments are connected in series; the test rack comprises a vacuum system, the vacuum system is used for processing the cavity into a vacuum environment, the filament test device further comprises a filament power supply, and the filament power supply is used for testing a plurality of to-be-tested filaments under the condition that the vacuum degree of the cavity reaches a preset threshold value. According to the lamp filament testing device, the cavity is arranged in the lamp filament testing device, so that the plurality of lamp filaments to be tested can be assembled on the lamp filament testing positions of the cavity for testing, and the plurality of lamp filaments to be tested are connected in series, so that the plurality of lamp filaments to be tested can be tested at the same time; and the test rack is arranged in the filament test device, so that the vacuum system of the test rack can process the cavity into a vacuum environment for filament test, and the filament test efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of X-ray tube filament testing, in particular to a filament testing device and method of an X-ray tube. BACKGROUND

[0002] An X-ray tube is a vacuum diode working at high voltage, including two electrodes, one is a filament for emitting electrons as a cathode, and the other is a target for accepting electron bombardment as an anode.

[0003] In the related art, during the production process of an X-ray tube core, each filament assembled on the cathode head needs to be tested before the core is sealed, and the test needs to be performed under high vacuum conditions to test whether each filament emits light and whether it is deformed, so as to ensure the quality of the filament in the X-ray tube.

[0004] However, the way of testing each filament in the related art has the technical problem of low test efficiency. SUMMARY

[0005] Therefore, it is necessary to provide a filament testing device and method of an X-ray tube to improve the filament test efficiency in view of the above technical problems.

[0006] In a first aspect, the present application provides a filament testing device of an X-ray tube, which includes a cavity and a test rack; the cavity is in communication with the test rack; the cavity includes a plurality of filament test sites for installing filaments to be tested, and the plurality of filaments to be tested are connected in series.

[0007] The test rack includes a vacuum system for processing the cavity into a vacuum environment, and the filament testing device further includes a filament power supply for testing the plurality of filaments to be tested when the vacuum degree of the cavity reaches a preset threshold.

[0008] In one embodiment, the cavity further includes a first vacuum feedthrough guide rod and a second vacuum feedthrough guide rod; the first vacuum feedthrough guide rod is connected to one end of the plurality of filaments to be tested, and the second vacuum feedthrough guide rod is connected to the other end of the plurality of filaments to be tested.

[0009] In one embodiment, each filament to be tested in the plurality of filaments to be tested includes two pins, the first pin of the filament to be tested at the first end position is connected to the first vacuum feedthrough guide rod, the second pin of the filament to be tested at the last end position is connected to the second vacuum feedthrough guide rod, and the first pin of the filament to be tested at the middle position is connected to the second pin of the filament to be tested at the previous position.

[0010] In one of the embodiments, the cavity further comprises a main shell and a vacuum connecting device; the first vacuum feedthrough rod and the second vacuum feedthrough rod are arranged on the vacuum connecting device, and the vacuum connecting device is sealingly connected to the main shell.

[0011] In one of the embodiments, the cavity further comprises a cavity connecting device; the vacuum connecting device is connected to the cavity connecting device, and the vacuum connecting device is fixed to the main shell through the cavity connecting device.

[0012] In one of the embodiments, the cavity further comprises a filament fixing block and a fixing block connecting member; the filament fixing block is connected to the cavity connecting device through the fixing block connecting member.

[0013] A plurality of filaments to be tested are arranged on the filament fixing block.

[0014] In one of the embodiments, the test rack comprises a dry pump and a molecular pump; the dry pump is connected to the molecular pump.

[0015] The dry pump is configured to perform vacuum pumping on the cavity, and the molecular pump is configured to perform vacuum pumping on the cavity when the vacuum degree reaches a first preset vacuum threshold, so that the vacuum degree in the cavity reaches a second preset vacuum threshold, and the second preset vacuum threshold is greater than the first preset vacuum threshold.

[0016] In one of the embodiments, the filament testing device further comprises a vacuum degree measuring device; the filament power supply is fixed to the test rack.

[0017] One end of the cavity is connected to the filament power supply, and the other end of the cavity is connected to the vacuum degree measuring device, and the vacuum degree measuring device is further connected to the test rack.

[0018] In one of the embodiments, the vacuum degree measuring device comprises an ionization gauge or a cold gauge.

[0019] In one of the embodiments, the filament power supply is connected to the first vacuum feedthrough rod and the second vacuum feedthrough rod of the cavity through a wire.

[0020] In a second aspect, the present application further provides a filament testing method of an X-ray tube, the method comprising:

[0021] In response to a test request of a target filament, a test rack in a filament testing device is controlled to perform vacuum pumping on a cavity in which the target filament is located; the filament testing device is any one of the filament testing devices in the first aspect.

[0022] When it is detected that the vacuum degree in the cavity reaches a preset threshold, a filament power supply in the filament testing device is turned on to test the target filament.

[0023] The filament testing device and method of the X-ray tube, the filament testing device comprises a cavity and a testing rack; the cavity is communicated with the testing rack; the cavity comprises a plurality of filament testing positions for mounting the filaments to be tested, and the plurality of filaments to be tested are connected in series; the testing rack comprises a vacuum system for processing the cavity into a vacuum environment; and the filament testing device further comprises a filament power supply for testing the plurality of filaments to be tested when the vacuum degree of the cavity reaches a preset threshold. In the filament testing device, the plurality of filaments to be tested can be assembled on the filament testing positions of the cavity for testing, and the plurality of filaments to be tested are connected in series to simultaneously test the plurality of filaments to be tested; and the testing rack is arranged in the filament testing device, so that the vacuum system of the testing rack can process the cavity into a vacuum environment, i.e., the vacuum environment is provided for the plurality of filaments to be tested connected in series, so that the plurality of filaments to be tested in the vacuum environment can be simultaneously tested, and the filament testing efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the drawings needed to be used in the embodiments or the related art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0025] Figure 1 A schematic diagram of a filament testing device in an embodiment;

[0026] Figure 2 A schematic diagram of a cavity in an embodiment;

[0027] Figure 3 A schematic diagram of a cavity in another embodiment;

[0028] Figure 4 A schematic diagram of a cavity in another embodiment;

[0029] Figure 5 A schematic diagram of a cavity in another embodiment;

[0030] Figure 6 A schematic diagram of a cavity in another embodiment;

[0031] Figure 7 A schematic diagram of the connection of components in a cavity in an embodiment;

[0032] Figure 8 A schematic diagram of a filament testing device in another embodiment. DETAILED DESCRIPTION

[0033] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in details below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not intended to limit the present application.

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application; the terms "comprising" and "having," and any variations thereof, as used herein are intended to cover a non-exclusive inclusion.

[0035] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "a plurality of" is two or more, unless otherwise explicitly and specifically limited.

[0036] Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The appearance of the phrase in various places in the specification does not necessarily all refer to the same embodiment, nor is it necessarily independent or alternative embodiments to other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0037] An X-ray tube is a vacuum diode that operates at high voltage, including two electrodes, one is a filament for emitting electrons as a cathode, and the other is a target for receiving electron bombardment as an anode.

[0038] In the related art, during the production process of the X-ray tube core, the filament assembled on the cathode head needs to be tested before the core is sealed. The test needs to be carried out under high vacuum condition. How to create high vacuum condition to test the filament in the X-ray tube core, and whether it can test multiple filaments at the same time to improve the test efficiency and production efficiency are the problems to be solved at present.

[0039] Based on this, the application provides a filament testing device and method of an X-ray tube. A cavity is arranged in the filament testing device, so that a plurality of filaments to be tested can be assembled on the filament testing positions of the cavity for testing, and the plurality of filaments to be tested are connected in series, so that the plurality of filaments to be tested can be tested at the same time. A testing rack is arranged in the filament testing device, so that the vacuum system of the testing rack can process the cavity into a vacuum environment, that is, a vacuum environment is provided for the plurality of filaments to be tested connected in series. In this way, the plurality of filaments to be tested in the vacuum environment can be tested at the same time, and the filament testing efficiency is improved.

[0040] In one exemplary embodiment, as shown in Figure 1 A filament testing device 1 of an X-ray tube is provided, which includes a cavity 10 and a testing rack 20. The cavity 10 is in communication with the testing rack 20. The cavity 10 includes a plurality of filament testing positions 11 for mounting filaments to be tested, and the plurality of filaments to be tested are connected in series.

[0041] The testing rack 20 includes a vacuum system for processing the cavity 10 into a vacuum environment. The filament testing device further includes a filament power supply for testing the plurality of filaments to be tested when the vacuum degree of the cavity 10 reaches a preset threshold. In the embodiment of the application, the filament power supply can be a direct current power supply.

[0042] The cavity 10 refers to a closed space or area, which is usually enclosed by a series of materials. In one embodiment, the cavity 10 can be a metal cavity enclosed by a metal material. The metal cavity is a shell structure made of metal material, which usually adopts special aluminum, copper, stainless steel alloy as the cavity material, and the inside can be used to install electronic components and the like.

[0043] The filament testing position 11 refers to a position where a filament to be tested can be mounted. In the embodiment of the application, the cavity includes a plurality of filament testing positions 11, and the plurality of filaments to be tested can be assembled on the respective filament testing positions 11 for testing.

[0044] When testing the filaments to be tested, the testing environment needs to be processed into a high-vacuum environment. In the embodiment of the application, the vacuum system in the testing rack 20 can be used to perform vacuum pumping on the cavity environment.

[0045] The testing rack 20 refers to a testing device for testing filaments in a vacuum environment, which includes a vacuum system that can process the testing environment of the filaments to be tested into a vacuum environment. The vacuum system includes a plurality of vacuum devices, such as dry pumps and molecular pumps, which can perform vacuum pumping on the cavity to process the cavity environment into a vacuum environment.

[0046] In the embodiment of the present application, the cavity 10 needs to be communicated with the test rack 20, so that the vacuum system of the test rack 20 can perform vacuumization on the cavity 10, that is, process the cavity 10 into a vacuum environment, so that the filaments to be tested are all in the vacuum environment, facilitating the test. For example, the cavity 10 can be placed above the test rack 20, and the lower part of the cavity 10 is open, which is used to connect with the test rack 20, so that the cavity 10 is communicated with the test rack 20.

[0047] The filament to be tested refers to a filament arranged at a cathode of an X-ray tube, which uses tungsten as a filament material. Tungsten is a metal with high melting point and high heat resistance, which is suitable for use in an X-ray tube. The filament is a part of the X-ray tube for generating electrons. When the filament is heated by electric current, electrons are emitted, thereby generating X-rays.

[0048] In the embodiment of the present application, in order to improve the test efficiency, a plurality of filaments to be tested can be arranged in the cavity, and the plurality of filaments to be tested are connected in series, so as to simultaneously test the plurality of filaments to be tested.

[0049] In the embodiment, the plurality of filaments to be tested are connected in series in the cavity 10, and the cavity 10 is communicated with the test rack 20. In this case, the cavity 10 is vacuumized by the vacuum system of the test rack 20, so as to process the environment in the cavity 10 into a vacuum environment. At the same time, the vacuum degree of the environment in the cavity 10 can be measured by a vacuum degree measuring device. When the vacuum degree in the cavity 10 reaches a preset threshold, the plurality of filaments to be tested can be tested. The vacuum degree measuring device can be a vacuum degree detector, a rotary coupling vacuum gauge, an ionization gauge, etc.

[0050] In some embodiments, the cavity 10 has an observation window. When the cavity 10 is processed into a vacuum environment and the test on the plurality of filaments to be tested in the cavity 10 is started, the test situation of the plurality of filaments to be tested can be observed through the observation window. In some embodiments, the observation window is provided with transparent glass. The transparent glass is arranged on the cavity 10, so as to facilitate the observation of the deformation and light emission of the plurality of filaments to be tested.

[0051] The filament test device provided by the embodiment of the present application comprises a cavity and a test rack; the cavity is in communication with the test rack; the cavity comprises a plurality of filament test sites for mounting the filaments to be tested, and the plurality of filaments to be tested are connected in series; the test rack comprises a vacuum system for processing the cavity into a vacuum environment; and the filament test device further comprises a filament power supply for testing the plurality of filaments to be tested when the vacuum degree of the cavity reaches a preset threshold. In the filament test device, a cavity is arranged in the filament test device, so that the plurality of filaments to be tested can be assembled on the filament test sites of the cavity for testing, and the plurality of filaments to be tested are connected in series, so that the plurality of filaments to be tested can be tested at the same time; and a test rack is arranged in the filament test device, so that the vacuum system of the test rack can process the cavity into a vacuum environment, that is, a vacuum environment is provided for the plurality of filaments to be tested connected in series, so that the plurality of filaments to be tested in the vacuum environment can be tested at the same time, and the filament test efficiency is improved.

[0052] Based on the above embodiment, an embodiment of the components in the cavity is further described.

[0053] In one exemplary embodiment, as shown in Figure 2 The cavity 10 further comprises a first vacuum feedthrough guide rod 12 and a second vacuum feedthrough guide rod 13; the first vacuum feedthrough guide rod 12 is connected to one end of the plurality of filaments to be tested, and the second vacuum feedthrough guide rod 13 is connected to the other end of the plurality of filaments to be tested.

[0054] The vacuum feedthrough guide rod is a specific form or component of the vacuum feedthrough, which mainly functions to transfer matter, energy or signals in the vacuum system. The design of the vacuum feedthrough guide rod allows connection and transmission between the inside and the outside while maintaining a high vacuum or ultra-high vacuum state inside the vacuum system.

[0055] The vacuum feedthrough guide rod can be made of high-temperature-resistant and corrosion-resistant materials such as stainless steel, titanium alloy or ceramic to ensure stability and reliability in a vacuum environment. It usually includes a feedthrough body, an insulator and a joint, wherein the feedthrough body is used to lead the conductor or pipeline in the connector out of the vacuum chamber, the insulator is used to isolate the electromagnetic interference and gas leakage between the feedthrough body and the conductor or pipeline, and the joint is used to connect the feedthrough body and the conductor or pipeline and ensure the sealing.

[0056] In the embodiment of the present application, the cavity comprises two vacuum feedthrough guide rods, namely the first vacuum feedthrough guide rod 12 and the second vacuum feedthrough guide rod 13, which are used to connect the plurality of filaments to be tested to be connected to the filament power supply for testing. The first vacuum feedthrough guide rod 12 is connected to one end of the plurality of filaments to be tested, and the second vacuum feedthrough guide rod 13 is connected to the other end of the plurality of filaments to be tested.

[0057] With the first vacuum feedthrough rod 12 connected to one end of multiple filaments to be tested and the second vacuum feedthrough rod 13 connected to the other end of multiple filaments to be tested, multiple filaments to be tested can be connected to a power source through the first vacuum feedthrough rod 12 and the second vacuum feedthrough rod 13 to energize multiple filaments to be tested and to test the luminescence and deformation of multiple filaments to be tested under energized conditions.

[0058] The following detailed description of the specific connection method between multiple filaments to be tested and two vacuum feedthrough rods is provided through specific embodiments.

[0059] In one exemplary embodiment, such as Figure 3 As shown, each of the multiple test filaments includes two pins. The first pin 110 of the test filament at the beginning position is connected to the first vacuum feed rod 12, the second pin 111 of the test filament at the end position is connected to the second vacuum feed rod 13, and the first pin 110 of the test filament at the middle position is connected to the second pin 111 of the test filament at the previous position.

[0060] In this embodiment, each filament to be tested includes two pins, namely a first pin 110 and a second pin 111. Since the multiple filaments to be tested in this embodiment are connected in series, the second pin 111 of each filament to be tested is connected to the first pin 110 of the next filament to be tested, and the first pin 110 of the first filament to be tested is connected to the first vacuum feedthrough rod 12, and the second pin 111 of the last filament to be tested is connected to the second vacuum feedthrough rod 13.

[0061] Taking a cavity 10 containing three filaments to be tested as an example, the first pin 110 of the first filament to be tested is connected to the first vacuum feedthrough rod 12, the second pin 111 of the first filament to be tested is connected to the first pin 110 of the second filament to be tested, the second pin 111 of the second filament to be tested is connected to the first pin 110 of the third filament to be tested, and the second pin 111 of the third filament to be tested is connected to the second vacuum feedthrough rod 13. The first filament to be tested is the one at the beginning, the third filament to be tested is the one at the end, and the second filament to be tested is the one in the middle.

[0062] The filament testing device provided in this application embodiment, by setting a first vacuum feedthrough rod and a second vacuum feedthrough rod in the cavity, allows multiple filaments to be tested to be connected to the first vacuum feedthrough rod and the second vacuum feedthrough rod, thereby enabling multiple filaments to be tested to be connected to a power source for testing, so as to observe the luminescence and deformation of multiple filaments to be tested.

[0063] Based on the above embodiment, an embodiment of the position where the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod are located is described.

[0064] In an exemplary embodiment, as shown in Figure 4 The cavity 10 includes a main shell and a vacuum connection device 14; the first vacuum feedthrough guide rod 12 and the second vacuum feedthrough guide rod 13 are arranged on the vacuum connection device 14, and the vacuum connection device 14 is sealingly connected with the main shell.

[0065] The vacuum connection device 14 refers to a device with a connection function in a vacuum system. In the embodiment of the application, the vacuum connection device 14 can be a vacuum feedthrough flange.

[0066] The vacuum feedthrough flange is a flange of a high-vacuum system, usually made of stainless steel, has good sealing performance, can withstand high pressure and high temperature under high-vacuum conditions, and has good anti-leakage performance.

[0067] In the embodiment, the first vacuum feedthrough guide rod 12 and the second vacuum feedthrough guide rod 13 are arranged on the vacuum connection device 14, and the vacuum connection device 14 is sealingly connected with the main shell. The main shell refers to the shell of the cavity 10.

[0068] In an embodiment, as shown in Figure 5 The cavity 10 further includes a cavity connection device 15; the vacuum connection device 14 is connected with the cavity connection device 15, and the vacuum connection device 14 can be sealingly fixed to the main shell through the cavity connection device 15.

[0069] The cavity connection device 15 refers to a device for connecting different elements in the cavity 10. In the embodiment of the application, the cavity connection device 15 can be a cavity mounting flange.

[0070] The vacuum connection device 14 in the cavity 10 can be fixed through the cavity connection device 15, so that the first vacuum feedthrough guide rod 12 and the second vacuum feedthrough guide rod 13 are also fixed in the cavity 10, so that when a plurality of filaments to be tested are tested, they can be connected with the two vacuum feedthrough guide rods in the fixed position and connected to the filament power supply for testing. The vacuum connection device 14 and the cavity connection device 15 can be connected through a flange gasket and a screw.

[0071] In an embodiment, as shown in Figure 6 The cavity 10 further includes a filament fixing block 16 and a fixing block connecting piece 17; the filament fixing block 16 is connected with the cavity connection device 15 through the fixing block connecting piece 17; and a plurality of filament test sites are arranged on the filament fixing block 16.

[0072] In the embodiment of the present application, the filament fixing block 16 can be a support plate, and the support plate is provided with a plurality of filament test sites, and each filament test site can be assembled with a filament to be tested.

[0073] The fixing block connecting piece 17 is used to connect the filament fixing block 16, and the filament fixing block 16 is connected to the other end of the cavity connecting device, that is, the vacuum connecting device 14 is located on one side of the cavity connecting device 15, and the filament fixing block 16 is located on the other side of the cavity connecting device 15.

[0074] Based on the above connection mode, a plurality of filaments to be tested can be fixed in the cavity 10, and the plurality of filaments to be tested are connected in series on the first vacuum feedthrough lead 12 and the second vacuum feedthrough lead 13. In this way, the plurality of filaments to be tested can be connected with the filament power supply through the first vacuum feedthrough lead 12 and the second vacuum feedthrough lead 13 to enable the plurality of filaments to be tested to be powered on for testing.

[0075] As shown in the schematic diagram of the connection of various components in the cavity. Figure 7 As shown in the schematic diagram of the connection of various components in the cavity. Among them, the cavity includes five filaments to be tested, each filament to be tested includes two pins, the rightmost is the first filament to be tested, and the second filament to be tested, the third filament to be tested, the fourth filament to be tested and the fifth filament to be tested are sequentially arranged from left to right. The five filaments to be tested are fixed on the filament test sites of the filament fixing block, the filament fixing block is connected with the cavity connecting device through the fixing block connecting piece, the cavity connecting device is also connected with the vacuum connecting device, the vacuum connecting device is provided with the first vacuum feedthrough lead and the second vacuum feedthrough lead, the first vacuum feedthrough lead is connected with the first pin of the first filament to be tested, the second vacuum feedthrough lead is connected with the second pin of the fifth filament to be tested, and the first vacuum feedthrough lead and the second vacuum feedthrough lead are both provided with vacuum feedthrough insulating pieces, wherein the vacuum feedthrough insulating pieces mainly play an isolation role to avoid signal short circuit and interference.

[0076] The filament testing device provided by the embodiment of the present application can fix the first vacuum feedthrough lead and the second vacuum feedthrough lead on the vacuum connecting device by arranging the vacuum connecting device in the cavity, and connect the vacuum connecting device with the cavity connecting device. The vacuum connecting device is fixed, and at the same time, the plurality of filaments to be tested are also fixed on the filament test sites of the filament fixing block, and the filament fixing block is connected with the cavity connecting device through the fixing block connecting piece. In this way, the plurality of filaments to be tested and the vacuum feedthrough leads connected with the main shell and the filament are all fixed in the cavity, and the connection of various components in the cavity is completed through the preset connection mode, which provides an optional way for quickly realizing the testing connection of a plurality of filaments.

[0077] Based on the above embodiment, an embodiment of the above testing rack is described.

[0078] In one exemplary embodiment, as shown in Figure 8 The test rack 20 includes a dry pump 21 and a molecular pump 22; the dry pump 21 is connected with the molecular pump 22.

[0079] The dry pump 21 is used to vacuumize the cavity 10, and the molecular pump 22 is used to vacuumize the cavity 10 when the vacuum degree reaches a first preset vacuum threshold, so that the vacuum degree in the cavity 10 reaches a second preset vacuum threshold, which is greater than the first preset vacuum threshold.

[0080] The dry pump 21 is a dry vacuum pump, mainly including a dry screw vacuum pump and a vortex dry pump. When multiple filaments to be tested need to be tested, the dry pump 21 needs to be controlled to start vacuumizing.

[0081] The molecular pump 22 is a vacuum pump that uses a high-speed rotating rotor to transfer momentum to gas molecules, so that they gain directional velocity and are compressed and driven to the exhaust port to be pumped by the previous stage. When the dry pump 21 works for a period of time, the vacuum degree in the vacuum test rack reaches a medium vacuum level, and the molecular pump 22 is controlled to start vacuumizing, so that the vacuum degree in the cavity reaches the required vacuum degree for filament testing. The vacuum degree = atmospheric pressure - absolute pressure, and the absolute pressure = atmospheric pressure + gauge pressure.

[0082] In addition, in one embodiment, the filament testing device further includes a vacuum degree measuring device; the filament power supply is fixed to the test rack; one end of the cavity is connected to the filament power supply; the other end of the cavity is connected to the vacuum degree measuring device, and the vacuum degree measuring device is also connected to the test rack.

[0083] The vacuum degree measuring device includes an ionization gauge or a cold gauge, etc.

[0084] Continuing to refer to Figure 8 The left side of the test rack is fixed with a filament power supply, which is connected with the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod of the cavity through wires.

[0085] On the other side of the cavity, a vacuum degree measuring device such as an ionization gauge is also connected, which is used to measure the vacuum degree in the cavity.

[0086] In the embodiment of the present application, the cavity is connected with the filament power supply, and when multiple filaments to be tested are tested, the multiple filaments to be tested can be powered on through the filament power supply, and the vacuum degree in the cavity can be measured through the vacuum degree measuring device to detect the timing of triggering the power-on instruction and starting the test of the multiple filaments to be tested.

[0087] From Figure 8It can be seen that the test rack further comprises a cold gauge and an ionization gauge capable of measuring the vacuum degree in the test rack, a cutoff valve for regulating the molecular pump and the dry pump, a molecular pump controller for controlling the operation of the molecular pump, a leak detection valve for conducting a leak detection test on the test rack, a vacuum display for displaying the vacuum degree in the test rack, and a temperature display for displaying the temperature in the test rack. In addition, a hand valve is arranged on the right side of the cavity, which needs to be opened when the cavity is started to be vacuumized.

[0088] The filament test device provided by the embodiments of the present application can vacuumize the cavity by arranging the dry pump and the molecular pump in the test rack, and can control the filament power supply to be turned on when the vacuum degree in the cavity reaches a certain value by arranging the filament power supply and the vacuum degree measuring device, so as to electrify the plurality of filaments to be tested in the cavity, thereby testing the plurality of filaments to be tested at the same time and improving the filament test efficiency.

[0089] Based on the same inventive concept, the embodiments of the present application also provide a filament test method of an X-ray tube. In one exemplary embodiment, the method comprises:

[0090] In response to a test request of a target filament, a test rack in a filament test device is controlled to vacuumize a cavity in which the target filament is located; the filament test device is the filament test device in any of the preceding embodiments; and in a case where it is detected that the vacuum degree in the cavity reaches a preset threshold, a filament power supply in the filament test device is turned on to test the target filament.

[0091] In the embodiments of the present application, the target filament is a plurality of filaments to be tested, which are arranged in a cavity in the filament test device. In one embodiment, the process of filament installation and shell assembly is described by taking three filaments to be tested as an example.

[0092] The three filaments to be tested are installed on the filament test sites of the filament fixing block, the second pin of the first filament to be tested is connected to the first pin of the second filament to be tested, the second pin of the second filament to be tested is connected to the first pin of the third filament to be tested, the filament fixing block is connected to the cavity connection device through the fixing block connecting piece, then the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod are arranged on the vacuum connection device, and the vacuum connection device is connected to the cavity connection device, the first pin of the first filament to be tested is connected to the first vacuum feedthrough guide rod, the second pin of the third filament to be tested is connected to the second vacuum feedthrough guide rod, and finally the vacuum connection device is sealingly connected to the main shell of the cavity, thereby completing the installation of the filaments and the assembly of the shell.

[0093] Each of the filaments to be tested includes two pins, the second pin of each of the filaments to be tested is connected to the first pin of the next filament to be tested, the filament to be tested at the first end position is connected to the first vacuum feedthrough guide rod in the cavity, and the filament to be tested at the last end position is connected to the second vacuum feedthrough guide rod in the cavity.

[0094] The first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod are arranged on a vacuum connection device, and the vacuum connection device is connected to one end of a cavity connection device of the cavity. The plurality of filaments to be tested are arranged on the plurality of filament test positions of the filament fixing block, and the filament fixing block is connected to the other end of the cavity connection device through a fixing block connecting device. The filament testing device further includes a filament power supply connected to the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod of the cavity through a wire.

[0095] The testing rack of the filament testing device is in communication with the cavity and is used for processing the cavity into a vacuum environment. A dry pump and a molecular pump are arranged in the testing rack and are used for vacuumizing the cavity.

[0096] When the test request of the target filament is received, the dry pump in the testing rack is controlled to vacuumize the cavity, when the vacuum degree in the cavity reaches a medium vacuum level, the molecular pump is controlled to continue vacuumizing, and when the vacuum degree in the cavity reaches a preset threshold, the direct current power supply is controlled to be turned on, so that the plurality of filaments to be tested are electrified, the light emission and deformation of the plurality of filaments to be tested are observed, and the test results of the plurality of filaments to be tested are obtained.

[0097] The filament testing method provided by the embodiment of the present application includes the following steps: in response to a test request of a target filament, a testing rack in a filament testing device is controlled to vacuumize a cavity in which the target filament is located, and when it is detected that the vacuum degree in the cavity reaches a preset threshold, a filament power supply in the filament testing device is turned on to test the target filament. In the method, a plurality of filaments are arranged in the cavity of the filament testing device, when the plurality of filaments need to be tested, the cavity is vacuumized by the testing rack, and when the vacuum degree in the cavity reaches the preset threshold, the plurality of filaments are tested by turning on the power supply, so that the plurality of filaments are tested at the same time, and the filament testing efficiency is improved.

[0098] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0099] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0100] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A filament testing device for an X-ray tube, characterized in that The filament testing device comprises a cavity and a testing rack; the cavity is in communication with the testing rack; the cavity comprises a plurality of filament testing sites for mounting filaments to be tested, and the plurality of filaments to be tested are connected in series; The testing rack comprises a vacuum system for processing the cavity into a vacuum environment, and the filament testing device further comprises a filament power supply for testing the plurality of filaments to be tested when the vacuum degree of the cavity reaches a preset threshold.

2. The filament testing device of claim 1, wherein, The cavity further comprises a first vacuum feedthrough guide rod and a second vacuum feedthrough guide rod; the first vacuum feedthrough guide rod is connected to one end of the plurality of filaments to be tested, and the second vacuum feedthrough guide rod is connected to the other end of the plurality of filaments to be tested.

3. The filament testing device of claim 2, wherein, Each filament to be tested in the plurality of filaments to be tested comprises two pins; the first pin of the filament to be tested at the first end position is connected to the first vacuum feedthrough guide rod, the second pin of the filament to be tested at the last end position is connected to the second vacuum feedthrough guide rod, and the first pin of the filament to be tested at the middle position is connected to the second pin of the filament to be tested at the previous position.

4. The filament testing device of claim 2, wherein, The cavity further comprises a main shell and a vacuum connection device; the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod are arranged on the vacuum connection device, and the vacuum connection device is sealingly connected to the main shell.

5. The filament testing device of claim 4, wherein, The cavity further comprises a cavity connection device; the vacuum connection device is connected to the cavity connection device, and the vacuum connection device is fixed to the main shell through the cavity connection device.

6. The filament testing device of claim 5, wherein, The cavity further comprises a filament fixing block and a fixing block connecting piece; the filament fixing block is connected to the cavity connection device through the fixing block connecting piece; and the plurality of filament testing sites are arranged on the filament fixing block.

7. The filament testing device of any of claims 1-6, wherein, The testing rack comprises a dry pump and a molecular pump; the dry pump is connected to the molecular pump; The dry pump is used for vacuumizing the cavity, and the molecular pump is used for vacuumizing the cavity when the vacuum degree reaches a first preset vacuum threshold, so that the vacuum degree in the cavity reaches a second preset vacuum threshold, and the second preset vacuum threshold is greater than the first preset vacuum threshold.

8. The filament testing device of any of claims 1-6, wherein, The filament testing device further comprises a vacuum degree measuring device; the filament power supply is fixed to the testing rack; One end of the cavity is connected to the filament power supply, and the other end of the cavity is connected to the vacuum degree measuring device, and the vacuum degree measuring device is further connected to the testing rack.

9. The filament testing device of claim 8, wherein, The vacuum degree measuring device comprises an ionization gauge or a cold gauge.

10. The filament testing device of claim 8, wherein, The filament power supply is connected to the first vacuum feedthrough guide rod and the second vacuum feedthrough guide rod of the cavity through wires.

11. A method of filament testing of an X-ray tube, characterized in that The method comprises: In response to a test request of a target filament, a testing rack in a filament testing device is controlled to vacuumize a cavity in which the target filament is located; the filament testing device is any one of the filament testing devices described in claims 1-10; When it is detected that the vacuum degree in the cavity reaches a preset threshold, a filament power supply in the filament testing device is turned on to test the target filament.

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