An optical measuring device

By using modular design and precision mechanical linkage optical measurement equipment, the problem of existing equipment being unable to handle multi-band measurements has been solved. This enables high-purity, flexible environmental simulation and high-precision optical parameter measurement, improving the equipment's versatility and measurement efficiency.

CN121678575BActive Publication Date: 2026-04-14FUZHOU XIDE INTELLIGENT TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
FUZHOU XIDE INTELLIGENT TECH CO LTD
Filing Date
2026-02-11
Publication Date
2026-04-14

AI Technical Summary

Technical Problem

Existing optical measurement equipment has limited functionality, making it difficult to perform multi-band measurements on the same platform. It also lacks flexible environmental simulation and optical parameter testing capabilities, resulting in cumbersome operation, low efficiency, and insufficient data comparability.

Method used

An optical measurement device was designed, comprising a shielding layer structure, an infrared shielding structure, an ultraviolet shielding structure, a visible light adjustment structure, a gas medium structure, a refractive testing structure, and a focusing layer structure. Through precise mechanical linkage and modular design, it achieves high-purity extraction and high-precision intensity detection of specific wavelengths in a full-spectrum light source.

Benefits of technology

It achieves compatibility between infrared and ultraviolet bands on the same hardware platform, improving the equipment's versatility and cost-effectiveness, eliminating system errors, enhancing data comparability and measurement efficiency, reducing maintenance difficulty, and ensuring the accuracy and stability of optical components.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application discloses an optical measuring device, and relates to the technical field of optical measurement, which comprises a shielding layer structure, an infrared light shielding structure is arranged below the shielding layer structure, an ultraviolet light shielding structure is arranged below the infrared light shielding structure, a visible light adjusting structure is arranged below the ultraviolet light shielding structure, a gas medium structure is arranged below the visible light adjusting structure, a refraction test structure is arranged below the gas medium structure, a light collecting layer structure is arranged below the refraction test structure, and a sensor layer is arranged below the light collecting layer structure; the shielding layer structure comprises a metal cover for shielding electromagnetic waves and a quartz window for allowing a full-spectrum light source to pass through; the application realizes high-purity extraction of specific wave bands in the full-spectrum light source, flexible environment simulation and high-precision intensity detection, and has high practical value in the fields of scientific research and industrial detection.
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Description

Technical Field

[0001] This invention relates to the field of optical measurement technology, specifically to an optical measurement device. Background Technology

[0002] In spectral analysis, environmental monitoring, and materials science research, it is often necessary to extract specific bands (such as infrared and ultraviolet) from the full spectrum of light sources with high purity and measure their intensity accurately. However, existing equipment is often single-function and cannot accommodate multi-band measurements on the same platform. It also lacks flexible environmental simulation and optical parameter testing capabilities, resulting in cumbersome operation, low efficiency, and insufficient data comparability. Therefore, there is an urgent need for an integrated, modular, and easy-to-operate multi-band optical measurement and analysis device.

[0003] Patent CN116105854B discloses a method for correcting measurement data of an optical measurement device. The method includes: acquiring the measured light intensity data of multiple samples in a target wavelength band before and after the replacement of optical components in the optical measurement device; calculating the light intensity ratio curve, weighted ratio curve, and correction ratio curve for each sample in the target wavelength band at each frame number based on the measured light intensity data of multiple samples in the target wavelength band; and correcting the measured light intensity data after the replacement of optical components based on the correction ratio curve to obtain the corrected measured light intensity data. This patent obtains the correction ratio curve at each frame number from the measured light intensity data of multiple samples before and after component replacement, and corrects the light intensity data after component replacement using the correction ratio curve, ensuring that the extracted film thickness and complex refractive index are consistent with the results before component replacement, reducing unknown and difficult-to-characterize errors introduced by component replacement. However, this patent also suffers from problems such as low reliability, limited functionality, and difficult maintenance of the optical measurement structure. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides an optical measurement device that solves the problems mentioned in the background section.

[0005] To achieve the above objectives, the present invention provides the following technical solution: an optical measurement device, comprising a shielding layer structure, an infrared light-shielding structure disposed below the shielding layer structure, an ultraviolet light-shielding structure disposed below the infrared light-shielding structure, a visible light adjustment structure disposed below the ultraviolet light-shielding structure, a gas medium structure disposed below the visible light adjustment structure, a refraction testing structure disposed below the gas medium structure, a light-concentrating layer structure disposed below the refraction testing structure, and a sensor layer disposed below the light-concentrating layer structure;

[0006] The shielding layer structure includes a metal cover that shields electromagnetic waves and a quartz window that allows full-spectrum light sources to pass through.

[0007] The ultraviolet shading structure includes an ultraviolet frame, an ultraviolet adjustment ring rotatably connected to the outer side of the ultraviolet frame, two arc-shaped grooves on the outer side of the ultraviolet frame, an arc groove slider slidably connected to the inner side of each arc groove, an inner frame ring fixedly connected to the side of the arc groove slider away from the ultraviolet adjustment ring, and a docking ring fixedly connected to the top surface of the ultraviolet frame.

[0008] According to the above technical solution, the infrared light-shielding structure includes an infrared frame, an infrared adjustment ring rotatably connected to the outer side of the infrared frame, a top frame ring fixedly connected to the top of the infrared frame, a connecting seat fixedly connected to the inner wall of the top frame ring, the internal structure of the infrared frame being the same as the internal structure of the ultraviolet frame, an inner frame ring also being provided on the inner side of the infrared frame, two top groove blocks and one spring block groove end being fixedly connected to the upper surface of the inner frame ring respectively, a rubber block being fixedly connected to the outer surface of the top groove block, slide bars being fixedly connected to the inner walls on both sides of the spring block groove end, a sliding block being slidably connected between the slide bars, a filter frame being provided on the side of the inner frame ring, a filter being fixedly connected to the inner wall of the filter frame, an empty window being opened on the side of the filter, and a positioning groove being opened on the edge of the filter frame.

[0009] According to the above technical solution, a spring is fixedly connected inside the sliding block, and the two ends of the spring are fixedly connected to the inner wall of the sliding block and the spring block groove, respectively. The positioning groove and the top groove block fit together. The spring block groove and the filter frame form a locking structure. The filter inside the infrared frame is made of silicon or zinc selenide. The ultraviolet frame also has a connecting structure for installing the filter. The connecting structure for installing the filter inside the ultraviolet frame is the same as that inside the infrared frame. The filter inside the ultraviolet frame is made of magnesium fluoride or calcium fluoride.

[0010] According to the above technical solution, the visible light adjustment structure includes a visible light adjustment ring, and a visible light frame is rotatably connected to the inner wall of the visible light adjustment ring. The internal structure of the visible light frame is the same as the internal structure of the infrared frame.

[0011] The filter inside the visible light frame is made of optical glass, and the surface of the optical glass is coated with an interference film.

[0012] According to the above technical solution, the gas medium structure includes a medium frame, a gas window adjustment ring is rotatably connected to the outer wall of the medium frame, two inner frame rings are provided on the inner wall of the medium frame, an upper transparent plate and a lower transparent plate are fixedly connected to the sides of the two inner frame rings respectively, a hollow window cylinder and a medium window are fixedly connected between the upper transparent plate and the lower transparent plate, the medium window is connected to the upper transparent plate and the lower transparent plate, a gas supply pipe is fixedly connected to the bottom surface of the lower transparent plate, and a one-way valve core is fixedly connected inside the gas supply pipe;

[0013] The end of the gas supply tube furthest from the lower transducer is fixedly connected to the gas window adjustment ring, and two long levers are fixedly connected to the outer surface of the gas window adjustment ring.

[0014] According to the above technical solution, the refraction test structure includes a refraction frame, a refraction adjustment ring is rotatably connected to the outer wall of the refraction frame, a test piece is provided inside the refraction adjustment ring, a refraction window is opened on the surface of the test piece, and multiple refraction lenses of different thicknesses but the same density are fixedly connected to the side of the test piece.

[0015] The mounting structure of the test piece is the same as that of the filter mounting structure described above, and five short levers are fixedly connected to the outer surface of the refractive adjustment ring.

[0016] According to the above technical solution, the light-concentrating layer structure includes a light-concentrating frame, a light-concentrating adjustment ring is rotatably connected to the outer wall of the light-concentrating frame, a light-concentrating disc is provided inside the light-concentrating frame, a light-concentrating window is opened on the surface of the light-concentrating disc, and a light-concentrating lens is fixedly connected to the side of the light-concentrating disc.

[0017] The mounting structure of the optical disc is the same as that of the filter mounting structure described above.

[0018] According to the above technical solution, an infrared sensor and an ultraviolet sensor are installed inside the sensor layer.

[0019] According to the above technical solution, the infrared light-shielding structure also includes a docking structure, which includes a spring and a locking block. The spring and the locking block are located at the upper and lower ends of the infrared frame, respectively. A limit bead is fixedly connected to the top of the spring, and a locking groove and a guide groove are respectively opened on the surface of the locking block.

[0020] The ultraviolet frame, visible light frame, dielectric frame, refractive frame, and focusing frame are all equipped with docking structures.

[0021] This invention provides an optical measurement device. It has the following beneficial effects:

[0022] This invention forms a complete and controllable optical path through the entire system, from filtering and environmental simulation to detection. For ultraviolet intensity measurement, the process is symmetrical. By operating the infrared and visible light adjustment rings, the corresponding wavelengths are first filtered out. Then, the gas window module is activated or deactivated as needed. Finally, the sensor detects the light. This allows the same hardware platform to be compatible with the measurement of two very different wavelengths, infrared and ultraviolet, improving the versatility and cost-effectiveness of the equipment. Through precise mechanical linkage, switchable gas environment, and symmetrical modular optical path, this design achieves high-purity extraction of specific wavelengths from the full spectrum of light sources, flexible environmental simulation, and high-precision intensity detection. It has high practical value in scientific research, industrial testing, and other fields.

[0023] This invention, by using lens groups of the same material but different thicknesses for measurement, can effectively eliminate systematic errors caused by uneven sample material or differences in surface treatment, making the data more comparable and reliable. The obtained group refractive index and absorption coefficient data can not only be directly used to evaluate the performance of the material as an optical window or filter element, but also provide accurate input for further analysis of the material's dielectric constant, band structure and other deep physical properties. Through the integrated refractive adjustment ring and test piece design, this setup transforms the complex optical parameter measurement process into a simple and reliable mechanical rotation operation, realizing efficient, accurate and systematic measurement of the core physical properties of materials such as group refractive index and absorption coefficient, greatly improving the work efficiency and data quality of optical experiments and analysis;

[0024] This invention, through a modular snap-fit ​​structure of spring contacts, limiting beads, and locking blocks, enables tool-free and rapid separation of core functional modules such as the ultraviolet frame. This significantly reduces maintenance threshold and time, and avoids loosening or displacement errors in the overall structure due to frequent disassembly and assembly. Secondly, inside the module, the collaborative mechanism of sliding blocks and rubber blocks allows the filter frame to be gently tilted, effectively preventing scratches, stress damage, or damage to the positioning structure when replacing precision filters. This ensures the surface quality and reference accuracy of optical components, while guaranteeing that their angle and center position in the optical path can be accurately restored and remain stable over a long period, eliminating displacement caused by vibration. Attached Figure Description

[0025] Figure 1 This is a three-dimensional structural diagram of the entire front of the present invention;

[0026] Figure 2 This is a rear-view three-dimensional structural schematic diagram of the present invention;

[0027] Figure 3 This is a schematic diagram showing the overall structural distribution of the present invention.

[0028] Figure 4 This is a schematic diagram of the overall filter frame installation structure of the present invention;

[0029] Figure 5 This invention as a whole Figure 4 A magnified structural diagram of A in the middle;

[0030] Figure 6 This is a schematic diagram of the overall gas medium structure of the present invention;

[0031] Figure 7 This is a schematic diagram of the overall refraction testing structure of the present invention;

[0032] Figure 8 This is a schematic diagram of the overall light-concentrating layer structure of the present invention;

[0033] Figure 9 This is a schematic diagram of the overall sensor layer structure of the present invention.

[0034] In the diagram: 1. Shielding layer structure; 101. Metal cover; 102. Quartz window; 2. Infrared light shielding structure; 201. Infrared adjustment ring; 202. Infrared frame; 203. Connecting seat; 204. Top frame ring; 211. Spring; 212. Limiting bead; 213. Locking block; 214. Locking slot; 215. Guide groove; 216. Filter frame; 217. Filter; 218. Empty window; 219. Positioning groove; 220. Top groove block; 221. Rubber block; 222. Spring block groove end; 223. Sliding block; 224. Sliding bar; 3. Ultraviolet light shielding structure; 301. Ultraviolet adjustment ring; 302. Ultraviolet frame; 303. Docking ring; 304. Arc groove slider; 305. Arc-shaped sliding groove; 306. Inner frame ring; 4. Visible light adjustment structure Structure; 401, Visible light adjustment ring; 402, Visible light frame; 5, Gas medium structure; 501, Gas window adjustment ring; 502, Long lever; 503, Medium frame; 504, Upper lens; 505, Hollow window tube; 506, Medium window; 507, Gas supply tube; 508, One-way valve core; 509, Lower lens; 6, Refraction test structure; 601, Refraction adjustment ring; 602, Refraction frame; 603, Test piece; 604, Refraction window; 605, Refraction lens; 7, Concentrating layer structure; 701, Concentrating adjustment ring; 702, Concentrating frame; 703, Concentrating disc; 704, Concentrating window; 705, Concentrating lens; 8, Sensor layer; 801, Infrared sensor; 802, Ultraviolet sensor; 9, Short lever. Detailed Implementation

[0035] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0036] Please see Figure 1-9 An embodiment of the present invention is as follows: an optical measurement device includes a shielding layer structure 1, an infrared light-shielding structure 2 disposed below the shielding layer structure 1, an ultraviolet light-shielding structure 3 disposed below the infrared light-shielding structure 2, a visible light adjustment structure 4 disposed below the ultraviolet light-shielding structure 3, a gas medium structure 5 disposed below the visible light adjustment structure 4, a refraction testing structure 6 disposed below the gas medium structure 5, a light-concentrating layer structure 7 disposed below the refraction testing structure 6, and a sensor layer 8 disposed below the light-concentrating layer structure 7.

[0037] The shielding structure 1 includes a metal cover 101 that shields electromagnetic waves and a quartz window 102 that allows full-spectrum light sources to pass through.

[0038] The ultraviolet shading structure 3 includes an ultraviolet frame 302. An ultraviolet adjustment ring 301 is rotatably connected to the outer side of the ultraviolet frame 302. Two arc-shaped grooves 305 are provided on the outer side of the ultraviolet frame 302. An arc groove slider 304 is slidably connected to the inner side of each arc groove 305. An inner frame ring 306 is fixedly connected to the side of the arc groove slider 304 away from the ultraviolet adjustment ring 301. A docking ring 303 is fixedly connected to the top surface of the ultraviolet frame 302.

[0039] The infrared shielding structure 2 includes an infrared frame 202. An infrared adjustment ring 201 is rotatably connected to the outer side of the infrared frame 202. A top frame ring 204 is fixedly connected to the top of the infrared frame 202. A connecting seat 203 is fixedly connected to the inner wall of the top frame ring 204. The internal structure of the infrared frame 202 is the same as that of the ultraviolet frame 302. An inner frame ring 306 is also provided on the inner side of the infrared frame 202. Two top groove blocks 220 are fixedly connected to the upper surface of the inner frame ring 306. A rubber block 221 is fixedly connected to the outer surface of the top groove block 220 and a spring block groove end 222. Sliding strips 224 are fixedly connected to both inner walls of the spring block groove end 222. Sliding blocks 223 are slidably connected between the sliding strips 224. A filter frame 216 is provided on the side of the inner frame ring 306. A filter 217 is fixedly connected to the inner wall of the filter frame 216. An empty window 218 is opened on the side of the filter 217. A positioning groove 219 is opened on the edge of the filter frame 216.

[0040] A spring is fixedly connected inside the sliding block 223, and both ends of the spring are fixedly connected to the inner walls of the sliding block 223 and the spring block groove end 222, respectively. The positioning groove 219 and the top groove block 220 fit together. The spring block groove end 222 and the filter frame 216 form a locking structure. The filter 217 set inside the infrared frame 202 is made of silicon or zinc selenide. The ultraviolet frame 302 also has a connection structure for installing the filter 217. The connection structure for installing the filter 217 inside the ultraviolet frame 302 is the same as that inside the infrared frame 202. The filter 217 inside the ultraviolet frame 302 is made of magnesium fluoride or calcium fluoride. When it is necessary to measure the infrared intensity in the full spectrum light source, the infrared adjustment rings 201 and ultraviolet adjustment rings 301 must be adjusted first. 1. After aligning the short lever 9 connected to the outside with the arrow on the top frame ring 204, reset the device and align the light source to be tested at the center of the quartz window 102. After placing the light source, rotate the ultraviolet adjustment ring 301 and the visible light adjustment ring 401 to allow the full-spectrum light source to pass through the empty window 218 of the filter 217 in the infrared frame 202. Then, the light source passes through the filter 217 in the ultraviolet adjustment ring 301. As the ultraviolet adjustment ring 301 rotates, it drives the connected arc groove slider 304 to slide along the arc groove 305, causing the arc groove slider 304 to move and drive the filter 217 installed on the inner frame ring 306 to rotate together with the filter frame 216. Adjust the position of the empty window 218 on the filter 217 so that the light passes through the ultraviolet frame 302. The inner filter 217 filters out ultraviolet light from the full-spectrum light source. When the filtered light continues to pass through the inner filter 217 of the visible light frame 402, since the infrared frame 202, ultraviolet frame 302, and visible light frame 402 have the same internal structure, the visible light frame 402 adjusts the position of the inner filter 217 by rotating the outer visible light adjustment ring 401. This allows the light source to filter out interference from visible light and other rays in the same way. The light source filtered by the inner filter 217 of the visible light frame 402 retains only infrared light. To obtain a pure infrared light source, the gas window adjustment ring 501 can be rotated. This rotation of the gas window adjustment ring 501 causes the upper filter 504 and lower filter 509 to rotate simultaneously, allowing the infrared light to pass through. Light passes through the inert gas between the upper and lower lenses 509 via the medium window 506, thereby reducing the absorption of infrared light by gases such as water and carbon dioxide in the air. When ultraviolet light passes through the medium window 506, it avoids absorption by oxygen and ozone in the air. When a control experiment is needed to simulate the intensity comparison of infrared or ultraviolet light after propagation in the air, infrared light can pass through the hollow window tube 505 to increase contact with the air. The passed infrared light is transmitted to the infrared sensor 801 to detect the infrared light intensity through the refractive window 604 of the test piece 603 within the refractive frame 602 and the condensing lens 705 of the focusing disc 703 within the focusing frame 702. The process for measuring ultraviolet light intensity is similar.After setting up the light source, the infrared adjustment ring 201 and the visible light adjustment ring 401 need to be rotated to allow the full-spectrum light source to pass through the filter 217 inside the infrared frame 202, filtering out both infrared and visible light. Then, depending on the experimental requirements, the gas window adjustment ring 501 needs to be adjusted. The subsequent detection process is the same as for infrared intensity detection. The entire system, from filtering and environmental simulation to detection, forms a complete and controllable optical path. For ultraviolet intensity measurement, the process is symmetrical. By operating the infrared adjustment ring 201 and the visible light adjustment ring 401, the corresponding wavelength band is first filtered out. Then, depending on the requirements, the gas window module is activated. Finally, the sensor detects the intensity. This allows the same hardware platform to be compatible with both infrared and ultraviolet wavelength measurements, improving the equipment's versatility and cost-effectiveness. This setup, through precise mechanical linkage, switchable gas environments, and a symmetrical modular optical path, achieves high-purity extraction of specific wavelength bands from the full-spectrum light source, flexible environmental simulation, and high-precision intensity detection, making it highly practical in scientific research, industrial testing, and other fields.

[0041] The visible light adjustment structure 4 includes a visible light adjustment ring 401, and a visible light frame 402 is rotatably connected to the inner wall of the visible light adjustment ring 401. The internal structure of the visible light frame 402 is the same as the internal structure of the infrared frame 202.

[0042] The filter 217 inside the visible light frame 402 is made of optical glass, and the surface of the optical glass is coated with an interference film.

[0043] The gas medium structure 5 includes a medium frame 503. A gas window adjustment ring 501 is rotatably connected to the outer wall of the medium frame 503. Two inner frame rings 306 are provided on the inner wall of the medium frame 503. An upper transparent plate 504 and a lower transparent plate 509 are fixedly connected to the sides of the two inner frame rings 306 respectively. A hollow window cylinder 505 and a medium window 506 are fixedly connected between the upper transparent plate 504 and the lower transparent plate 509. The medium window 506 is connected to the upper transparent plate 504 and the lower transparent plate 509. A gas supply pipe 507 is fixedly connected to the bottom surface of the lower transparent plate 509. A one-way valve core 508 is fixedly connected inside the gas supply pipe 507.

[0044] The end of the gas supply tube 507 away from the lower transducer 509 is fixedly connected to the gas window adjustment ring 501, and two long levers 502 are fixedly connected to the outer surface of the gas window adjustment ring 501.

[0045] The refraction test structure 6 includes a refraction frame 602, a refraction adjustment ring 601 rotatably connected to the outer wall of the refraction frame 602, a test piece 603 is provided inside the refraction adjustment ring 601, a refraction window 604 is opened on the surface of the test piece 603, and multiple refraction lenses 605 of different thicknesses but the same density are fixedly connected to the side of the test piece 603.

[0046] The mounting structure of the test piece 603 is the same as that of the filter 217 described above. Five short levers 9 are fixedly connected to the outer surface of the refractive adjustment ring 601. To test the physical properties of light, the refractive adjustment ring 601 can be rotated to rotate the test piece 603, ensuring that refractive lenses 605 of the same density but different thicknesses are positioned along the light propagation path. Measurements are then performed separately based on the thickness. By measuring the time difference of the light pulse passing through samples of different thicknesses and the known thickness difference, combined with precise light intensity measurements, parameters such as group refractive index and optical absorption coefficient can be directly obtained. Using lens groups of the same material but different thicknesses for measurement can effectively eliminate the influence of sample thickness. Systematic errors caused by material inhomogeneity or differences in surface treatment make the data more comparable and reliable. The obtained group refractive index and absorption coefficient data can not only be directly used to evaluate the performance of the material as an optical window or filter element, but also provide accurate input for further analysis of the material's dielectric constant, band structure and other deep physical properties. Through the integrated refractive adjustment ring 601 and test piece 603 design, this setup transforms the complex optical parameter measurement process into a simple and reliable mechanical rotation operation, realizing efficient, accurate and systematic measurement of the core physical properties of the material such as group refractive index and absorption coefficient, which greatly improves the work efficiency and data quality of optical experiments and analysis.

[0047] The light-concentrating layer structure 7 includes a light-concentrating frame 702, a light-concentrating adjustment ring 701 rotatably connected to the outer wall of the light-concentrating frame 702, a light-concentrating disc 703 disposed inside the light-concentrating frame 702, a light-concentrating window 704 opened on the surface of the light-concentrating disc 703, and a light-concentrating lens 705 fixedly connected to the side of the light-concentrating disc 703.

[0048] The mounting structure of the optical disc 703 is the same as that of the filter 217 described above.

[0049] An infrared sensor 801 and an ultraviolet sensor 802 are installed inside the sensor layer 8.

[0050] The infrared shielding structure 2 also includes a docking structure, which includes a spring piece 211 and a locking block 213. The spring piece 211 and the locking block 213 are located at the upper and lower ends of the infrared frame 202, respectively. The top end of the spring piece 211 is fixedly connected to a limit bead 212, and the surface of the locking block 213 is provided with a locking groove 214 and a guide groove 215, respectively.

[0051] The ultraviolet frame 302, visible light frame 402, dielectric frame 503, refractive frame 602, and focusing frame 702 are all equipped with docking structures. If the filter 217 inside the inner frame 306 is defective and needs to be replaced, such as replacing the filter 217 inside the ultraviolet frame 302, the connection between the infrared frame 202 and the ultraviolet frame 302 must first be separated. By holding the infrared adjustment ring 201 and the ultraviolet adjustment ring 301, force is applied to make the spring piece 211 on the ultraviolet frame 302 pass through the limiting bead 212 from the infrared frame 202. The connected locking block 213 disengages, at which point the limiting bead 212 slides out of the locking groove 214 on the locking block 213 and slides away along the guide groove 215. Next, a tool is used to push the sliding block 223 inside the UV frame 302, causing the sliding block 223 to slide away from the edge of the contacting filter frame 216 along the inner wall of the spring block groove end 222. This allows the filter frame 216 to lift the filter 217 under the elastic force of the rubber block 221 on the top groove block 220, allowing the defective filter 217 to be removed and replaced. The intact filter 217 is then passed through the filter... The positioning groove 219 on the optical frame 216 is aligned with the top groove block 220 fixed on the inner frame 306 and inserted. Then, the filter frame 216 near the sliding block 223 is pressed, causing the filter frame 216 to push the sliding block 223 along the inclined surface of the sliding block 223 to compress the elastic spring. Subsequently, the elastic spring pushes the sliding block 223 to reset and lock the filter frame 216 in place. Through the modular snap-fit ​​structure of the spring piece 211, the limiting bead 212, and the locking block 213, tool-free and rapid separation of core functional modules such as the ultraviolet frame 302 is achieved. This significantly reduces the maintenance threshold and time, and avoids loosening or displacement errors in the overall structure due to frequent disassembly and assembly. Secondly, inside the module, the coordinated mechanism of sliding block 223 and rubber block 221 allows the filter frame 216 to be gently tilted up, thereby effectively avoiding scratches, stress damage or damage to the positioning structure when replacing the precision filter 217. This ensures the surface quality and reference accuracy of the optical components, while also ensuring that their angle and center position in the optical path can be accurately restored and remain stable for a long time, eliminating displacement caused by vibration.

[0052] Working principle: When measuring the infrared intensity of a full-spectrum light source, first align the infrared adjustment rings 201 and ultraviolet adjustment rings 301 with the arrows on the top frame ring 204 according to the short dials 9 connected to the outside, and then reset them. Place the light source to be tested at the center of the quartz window 102. After positioning the light source, rotate the ultraviolet adjustment ring 301 and the visible light adjustment ring 401 to allow the full-spectrum light source to pass through the window 218 of the filter 217 within the infrared frame 202. Then, the light source passes through the filter 217 within the ultraviolet adjustment ring 301. The rotation of the ultraviolet adjustment ring 301 causes the connected arc-groove slider 304 to slide along the arc-shaped groove 305, thus moving the arc-groove slider 304. The filter 217 mounted on the inner frame 306 rotates along the same axis as the filter frame 216, adjusting the position of the open window 218 on the filter 217. This allows light to pass through the filter 217 inside the ultraviolet frame 302, filtering out ultraviolet rays from the full-spectrum light source. The filtered light then continues to pass through the filter 217 inside the visible light frame 402. Because the infrared frame 202, ultraviolet frame 302, and visible light frame 402 have identical internal structures, the visible light frame 402 adjusts the position of the internal filter 217 by rotating the outer visible light adjustment ring 401. This ensures that the light source is filtered out from interference from visible light and other rays in the same way. The light then passes through the filter inside the visible light frame 402. The 217 filter retains only infrared light. To obtain a pure infrared light source, the gas window adjustment ring 501 can be rotated. This rotation causes the upper and lower transparent plates 504 and 509 to rotate simultaneously, allowing infrared light to pass through the inert gas between the upper and lower transparent plates 504 and 509 via the medium window 506. This reduces the absorption of infrared light by gases such as water and carbon dioxide in the air. When ultraviolet light passes through the medium window 506, it avoids absorption by oxygen and ozone in the air. When a control experiment is needed to simulate the intensity comparison of infrared or ultraviolet light after propagation in the air, the infrared light can be allowed to pass through the hollow window tube 505. Infrared light, having increased contact with air, is transmitted to infrared sensor 801 to detect the intensity of infrared light through the refractive window 604 of test piece 603 within refractive frame 602 and the condensing lens 705 of condensing disc 703 within condensing frame 702. The process for measuring ultraviolet intensity is similar. When measuring ultraviolet intensity, after setting up the light source, the infrared adjustment ring 201 and visible light adjustment ring 401 need to be rotated to allow the full-spectrum light source to pass through the filter 217 inside the infrared frame 202, filtering out infrared and visible light. Then, depending on whether pure ultraviolet light is required for the experiment, the gas window adjustment ring 501 needs to be adjusted. The subsequent detection process is the same as that for infrared intensity detection.

[0053] To test the physical properties of light, the refraction adjustment ring 601 can be rotated and adjusted, causing the test piece 603 to rotate, so that the refraction mirrors 605 of the same density but different thicknesses are placed on the light propagation path, and the parameters such as group refractive index and optical absorption coefficient can be directly obtained by measuring the time difference of the light pulse passing through the sample of different thicknesses and the known thickness difference, combined with the precise light intensity measurement.

[0054] If the filter 217 inside the inner frame 306 is defective and needs to be replaced, such as replacing the filter 217 inside the ultraviolet frame 302, the connection between the infrared frame 202 and the ultraviolet frame 302 must first be separated. Hold the infrared adjustment ring 201 and the ultraviolet adjustment ring 301 by hand and apply force to make the spring piece 211 on the ultraviolet frame 302 disengage from the locking block 213 connected to the infrared frame 202 through the limiting bead 212. At this time, the limiting bead 212 slides out of the locking groove 214 on the locking block 213 and slides away along the guide groove 215. Then, use a tool to push the sliding block 223 inside the ultraviolet frame 302 so that the sliding block 223 slides along the end of the spring block groove. The inner wall of the filter frame 216 slides out of contact with the edge of the filter frame 216, allowing the filter frame 216 to lift the filter 217 under the elastic force of the rubber block 221 on the top groove block 220. The defective filter 217 can then be removed and replaced. The intact filter 217 is aligned with the top groove block 220 fixed on the inner frame ring 306 through the positioning groove 219 on the filter frame 216. Then, the filter frame 216 near the sliding block 223 is pressed, causing the filter frame 216 to push the sliding block 223 along the inclined surface of the sliding block 223 to squeeze the elastic spring. Subsequently, the elastic spring pushes the sliding block 223 to reset and lock the filter frame 216 in place.

[0055] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. An optical measurement device, comprising a shielding layer structure (1), characterized in that: An infrared shielding structure (2) is provided below the shielding layer structure (1), an ultraviolet shielding structure (3) is provided below the infrared shielding structure (2), a visible light adjustment structure (4) is provided below the ultraviolet shielding structure (3), a gas medium structure (5) is provided below the visible light adjustment structure (4), a refraction test structure (6) is provided below the gas medium structure (5), a light focusing layer structure (7) is provided below the refraction test structure (6), and a sensor layer (8) is provided below the light focusing layer structure (7). The shielding structure (1) includes a metal cover (101) that shields electromagnetic waves and a quartz window (102) that allows full-spectrum light sources to pass through. The ultraviolet shading structure (3) includes an ultraviolet frame (302), an ultraviolet adjustment ring (301) is rotatably connected to the outer side of the ultraviolet frame (302), two arc-shaped grooves (305) are provided on the outer side of the ultraviolet frame (302), an arc groove slider (304) is slidably connected to the inner side of each arc-shaped groove (305), an inner frame ring (306) is fixedly connected to the side of the arc groove slider (304) away from the ultraviolet adjustment ring (301), a docking ring (303) is fixedly connected to the top surface of the ultraviolet frame (302), and a short lever (9) is fixedly connected to the outer surface of the ultraviolet adjustment ring (301). The gas medium structure (5) includes a medium frame (503), a gas window adjustment ring (501) is rotatably connected to the outer wall of the medium frame (503), two inner frame rings (306) are provided on the inner wall of the medium frame (503), an upper transparent plate (504) and a lower transparent plate (509) are fixedly connected to the sides of the two inner frame rings (306) respectively, a hollow window cylinder (505) and a medium window (506) are fixedly connected between the upper transparent plate (504) and the lower transparent plate (509), the medium window (506) is connected to the upper transparent plate (504) and the lower transparent plate (509), a gas supply pipe (507) is fixedly connected to the bottom surface of the lower transparent plate (509), and a one-way valve core (508) is fixedly connected inside the gas supply pipe (507). The end of the gas supply pipe (507) away from the lower transducer (509) is fixedly connected to the gas window adjustment ring (501), and two long levers (502) are fixedly connected to the outer surface of the gas window adjustment ring (501). The refraction test structure (6) includes a refraction frame (602), a refraction adjustment ring (601) is rotatably connected to the outer wall of the refraction frame (602), a test piece (603) is provided inside the refraction adjustment ring (601), a refraction window (604) is opened on the surface of the test piece (603), and multiple refraction lenses (605) of different thicknesses but the same density are fixedly connected to the side of the test piece (603). Five short levers (9) are fixedly connected to the outer surface of the refractive adjustment ring (601).

2. The optical measuring device according to claim 1, characterized in that: The infrared shielding structure (2) includes an infrared frame (202), an infrared adjustment ring (201) is rotatably connected to the outer side of the infrared frame (202), a top frame ring (204) is fixedly connected to the top of the infrared frame (202), and a connecting seat (203) is fixedly connected to the inner wall of the top frame ring (204). The internal structure of the infrared frame (202) is the same as that of the ultraviolet frame (302). An inner frame ring (306) is also provided on the inner side of the infrared frame (202). Two top groove blocks (220) and two top groove blocks (220) are fixedly connected to the upper surface of the inner frame ring (306). A rubber block (221) is fixedly connected to the outer surface of the top groove block (220) at one end of the spring block groove (222). Sliding strips (224) are fixedly connected to both inner walls of the spring block groove (222). Sliding blocks (223) are slidably connected between the sliding strips (224). A filter frame (216) is provided on the side of the inner frame (306). A filter (217) is fixedly connected to the inner wall of the filter frame (216). An empty window (218) is opened on the side of the filter (217). A positioning groove (219) is opened on the edge of the filter frame (216).

3. The optical measuring device according to claim 2, characterized in that: The sliding block (223) is internally fixedly connected with a spring, and the two ends of the spring are fixedly connected to the inner wall of the sliding block (223) and the spring block groove end (222) respectively. The positioning groove (219) and the top groove block (220) fit together. The spring block groove end (222) and the filter frame (216) form a locking structure. The filter (217) provided inside the infrared frame (202) is made of silicon or zinc selenide. The ultraviolet frame (302) is also provided with a connection structure for installing the filter (217). The connection structure for installing the filter (217) inside the ultraviolet frame (302) is the same as that inside the infrared frame (202). The filter (217) inside the ultraviolet frame (302) is made of magnesium fluoride or calcium fluoride. A short lever (9) is fixedly connected to the outer surface of the infrared frame (202).

4. An optical measuring device according to claim 3, characterized in that: The visible light adjustment structure (4) includes a visible light adjustment ring (401), and a visible light frame (402) is rotatably connected to the inner wall of the visible light adjustment ring (401). The internal structure of the visible light frame (402) is the same as the internal structure of the infrared frame (202). The filter (217) inside the visible light frame (402) is made of optical glass and has an interference coating on its surface. A short lever (9) is fixedly connected to the outer surface of the visible light adjustment ring (401).

5. An optical measuring device according to claim 4, characterized in that: The mounting structure of the test piece (603) is the same as that of the filter (217) described above.

6. An optical measuring device according to claim 5, characterized in that: The light-concentrating layer structure (7) includes a light-concentrating frame (702), a light-concentrating adjustment ring (701) is rotatably connected to the outer wall of the light-concentrating frame (702), a light-concentrating disc (703) is provided inside the light-concentrating frame (702), a light-concentrating window (704) is opened on the surface of the light-concentrating disc (703), and a light-concentrating lens (705) is fixedly connected to the side of the light-concentrating disc (703).

7. An optical measuring device according to claim 6, characterized in that: The mounting structure of the focusing disc (703) is the same as that of the filter (217). Two short levers (9) are fixedly connected to the outer surface of the focusing ring (701). An infrared sensor (801) and an ultraviolet sensor (802) are installed inside the sensor layer (8).

8. An optical measuring device according to claim 7, characterized in that: The infrared light-shielding structure (2) also includes a docking structure, which includes a spring (211) and a locking block (213). The spring (211) and the locking block (213) are located at the upper and lower ends of the infrared frame (202), respectively. The top end of the spring (211) is fixedly connected to a limit bead (212), and the surface of the locking block (213) is provided with a locking groove (214) and a guide groove (215). The ultraviolet frame (302), visible light frame (402), dielectric frame (503), refractive frame (602) and focusing frame (702) are all provided with docking structures.

Citation Information

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