Test control method and test control system for power failure abnormity on device and medium
By controlling the relay to remain closed, the problem of the device's abnormal power-on phenomenon disappearing is solved. Users can analyze the cause of the abnormal power-on phenomenon, which improves the user experience and safety of test control.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-28
- Publication Date
- 2026-03-24
AI Technical Summary
During the power-on process of the device, abnormal operation may occur due to hardware and software power-on and loading timing issues. Existing technology can make the abnormal phenomenon disappear by repeating the power-on operation, and users cannot analyze the cause of the power-on abnormality.
The controller responds to the power failure signal of the device under test by sending a closing command to the relay, enabling the device under test to operate under power supply and sending an operating status signal. When an abnormal operating status signal is received, the relay is kept closed to prevent the abnormal phenomenon from disappearing upon power-up.
It enables the device under test to maintain power-on even when there is a power-on anomaly, allowing users to analyze the cause of the anomaly and improving the user experience and safety of test control.
Smart Images
Figure CN121722008A_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the field of test control technology, and in particular relates to a test control method, test control system and medium for power failure abnormalities on a device. Background Technology
[0002] During power-up, issues with the timing of software and hardware power-up and loading can cause malfunctions in the device. Troubleshooting these problems often requires tracking hardware or software information at the moment of the anomaly and necessitates repeated testing.
[0003] Currently, when a device experiences a power-on anomaly, it is typically powered on repeatedly using a programmable power supply to restore normal operation. However, the anomaly disappears after repeated power-on operations, preventing users from analyzing the anomaly process and thus hindering their ability to determine the cause of the power-on anomaly. Summary of the Invention
[0004] In view of the above, embodiments of this application provide a test control method, test control system and medium for power failure anomalies on a device, in order to overcome the problems of the prior art.
[0005] In a first aspect, embodiments of this application provide a test control method for power failure anomalies on a device, applied to a controller in a test control system. The test control system further includes a relay, a power supply, and a device under test (DUT) connected in series. The controller is communicatively connected to the relay and the DUT. The test control method includes: In response to the power failure signal sent by the device under test, a closing command is sent to the relay to switch the relay to the closed state and enable the device under test to operate under the power supply. The device under test is also sent to the controller as an operating status signal, which is either a normal operating status signal or an abnormal operating status signal. When the abnormal operating status signal is received, the relay is controlled to remain in the closed state.
[0006] In some optional embodiments, the test control method further includes: When the normal operating status signal is received, a disconnect command is sent to the relay to switch the relay from the closed state to the open state, and the power supply to the device under test is disconnected. The power-off signal is also sent to the controller. The steps of sending a closing command to the relay in response to the power-down signal sent by the device under test, and subsequent steps, are performed.
[0007] In some optional embodiments, the test control method further includes: Record the number of times the normal operating status signal is received; The number of receptions is determined as the number of times the device under test is restarted.
[0008] In some optional embodiments, sending a disconnect command to the relay upon receiving the normal operating status signal includes: When the normal operation status signal is received, the disconnect command is sent to the relay after a first time interval.
[0009] Secondly, embodiments of this application provide a test control method for power failure anomalies on a device, applied to the device under test in a test control system. The test control system further includes a relay, a power supply, and a controller. The relay, the power supply, and the device under test are connected in series electrically. The controller is communicatively connected to the relay and the device under test. The test control method includes: When the device under test is in a power-off state, a power-off signal is sent to the controller, so that the controller responds to the power-off signal, sends a closing command to the relay, switches the relay to the closed state, and enables the device under test to operate under the power supply. When the device under test is in an abnormal operating state, it sends an abnormal operating state signal to the controller so that the controller controls the relay to maintain the closed state.
[0010] In some optional embodiments, the test control method further includes: When the device under test is in normal operating condition, it sends a normal operating condition signal to the controller, so that the controller sends a disconnect command to the relay, and switches the relay from the closed state to the open state, and disconnects the power supply to the device under test; Perform the step of sending a power-down signal to the controller and subsequent steps.
[0011] In some optional embodiments, before sending an abnormal operating state signal to the controller when the device under test is in an abnormal operating state, the test control method further includes: Obtain the no-load operating parameters of the device under test, which are obtained based on testing the device under test without analog input; When the no-load operating parameter is greater than the no-load operating parameter threshold, the device under test is determined to be in the abnormal operating state. When the no-load operating parameter is less than or equal to the no-load operating parameter threshold, the device under test is determined to be in normal operating condition.
[0012] In some optional embodiments, determining that the device under test is in normal operating condition when the no-load operating parameter is less than or equal to the no-load operating parameter threshold includes: When the duration of the no-load operation parameter being less than or equal to the no-load operation parameter threshold is greater than or equal to the duration threshold, the device under test is determined to be in the normal operation state.
[0013] Thirdly, embodiments of this application provide a test control device for power failure anomalies, applied to a controller in a test control system. The test control system further includes a relay, a power supply, and a device under test connected in series. The controller is communicatively connected to the relay and the device under test. The test control device includes: The closing command sending module is used to respond to the power failure signal sent by the device under test, send a closing command to the relay to switch the relay to the closed state, enable the device under test to operate under the power supply, and send an operating status signal to the controller, wherein the operating status signal is a normal operating status signal or an abnormal operating status signal. The control and holding module is used to control the relay to maintain the closed state when the abnormal operating state signal is received.
[0014] Fourthly, embodiments of this application provide a test control device for power failure anomalies, applied to the device under test in a test control system. The test control system further includes a relay, a power supply, and a controller. The relay, the power supply, and the device under test are connected in series electrically. The controller is communicatively connected to the relay and the device under test. The test control device includes: The power-down signal transmission module is used to send a power-down signal to the controller when the device under test is in a power-down state, so that the controller responds to the power-down signal, sends a closing command to the relay, switches the relay to the closed state, and enables the device under test to operate under the power supply. An abnormal signal sending module is used to send an abnormal operating state signal to the controller when the device under test is in an abnormal operating state, so that the controller controls the relay to maintain the closed state.
[0015] Fifthly, embodiments of this application provide a test control system, including a controller, a relay, a power supply, and a device under test. The controller is communicatively connected to the relay and the device under test, and the relay, the power supply, and the device under test are connected in series. The controller is used to execute the test control method provided in the first aspect above; The device under test is used to perform the test control method provided in the second aspect above.
[0016] Sixthly, embodiments of this application provide a computer-readable storage medium storing program code, which can be invoked by a processor to execute the test control method provided in the first aspect or the second aspect above.
[0017] In a seventh aspect, embodiments of this application provide a computer program product that, when run on a computer device, causes the computer device to perform the test control method provided in the first or second aspect described above.
[0018] The solution provided in this application involves a controller responding to a power-down signal sent by the device under test (DUT). The controller sends a closing command to a relay, causing the relay to switch to a closed state and enabling the DUT to operate under power. The controller also sends an operating status signal, which can be a normal operating status signal or an abnormal operating status signal. Upon receiving an abnormal operating status signal, the controller keeps the relay closed. This ensures that even when the DUT is powered on and malfunctioning, the relay remains closed, preventing the abnormal power-on phenomenon from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon, which helps them understand the cause of the abnormal power-on. Attached Figure Description
[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0020] Figure 1 A schematic diagram of a test control system provided in an embodiment of this application is shown.
[0021] Figure 2 This paper illustrates a flowchart of a test control method for power failure on a device provided in an embodiment of this application.
[0022] Figure 3 This paper illustrates another flowchart of the test control method for power failure on the device provided in the embodiments of this application.
[0023] Figure 4 This paper illustrates a structural block diagram of a test control device for power failure provided in an embodiment of this application.
[0024] Figure 5 This paper illustrates another structural block diagram of the test control device for power failure provided in the embodiments of this application.
[0025] Figure 6 This application illustrates a computer-readable storage medium for storing or carrying program code that implements a test control method for power failure anomalies on a device according to an embodiment of this application.
[0026] Figure 7 This application illustrates a computer program product for storing or carrying program code that implements a test control method for power failure anomalies on a device according to an embodiment of this application. Detailed Implementation
[0027] To make the inventive objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0028] It should be understood that, when used in this specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.
[0029] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.
[0030] It should also be further understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.
[0031] Furthermore, in the description of this application, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0032] During power-up, issues with the timing of software and hardware power-up and loading can cause malfunctions in the device. Troubleshooting these problems often requires tracking hardware or software information at the moment of the anomaly and necessitates repeated testing.
[0033] Currently, when a device experiences a power-on anomaly, it is typically powered on repeatedly using a programmable power supply to restore normal operation. However, the anomaly disappears after repeated power-on operations, preventing users from analyzing the anomaly process and thus hindering their ability to determine the cause of the power-on anomaly.
[0034] To address the aforementioned issues, the present application provides a test control method, test control system, and medium for detecting power failures on a device. The controller responds to a power failure signal sent by the device under test (DUT) by sending a closing command to a relay, causing the relay to switch to a closed state and enabling the DUT to operate under power supply. The controller also sends an operating status signal, which can be a normal operating status signal or an abnormal operating status signal. Upon receiving an abnormal operating status signal, the controller keeps the relay closed. This ensures that when the DUT is powered on and malfunctioning, the relay remains closed, maintaining the abnormal power-on state and preventing the abnormal power-on state from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon, which helps them understand the cause of the abnormal power-on state.
[0035] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings.
[0036] Please see Figure 1 The illustration shows an application scenario diagram of the test control system provided in the embodiment of this application. The test control system may include a device under test 100, a power supply 200, a relay 300 and a controller 400. The device under test 100, the power supply 200 and the relay 300 may be connected in series and electrically connected to each other. The controller 400 may be communicatively connected to the device under test 100 and the relay 300.
[0037] The device under test 100 can be any of various power distribution automation terminals and self-healing protection devices, such as feeder terminal units (FTU), data transfer units (DTU), and distribution transformer supervisory terminal units (TTU), etc., without any limitation here.
[0038] The power supply 200 can be any type of power supply, such as DC or AC. The type of power supply 200 is not limited here and can be set according to actual needs.
[0039] The relay 300 can be any of the following: electromagnetic relay, induction relay, electric relay, or electronic relay, etc., without any limitation here.
[0040] The controller 400 can be a terminal device or a server, etc. The type of controller 400 is not limited here, and can be set according to actual needs.
[0041] The terminal device can be a mobile terminal device (such as a mobile phone, PDA, tablet PC, laptop, smartwatch, smart bracelet or wearable device, etc.) or a fixed terminal device (desktop computer, smart panel, etc.).
[0042] A server can be a standalone physical server, a server cluster or distributed system consisting of multiple physical servers, or any of the following: cloud servers that provide basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, content delivery networks (CDN), big data or artificial intelligence platforms.
[0043] Please see Figure 2 This document illustrates a flowchart of a test control method for power-down anomalies on a device according to an embodiment of this application. In a specific embodiment, the test control method for power-down anomalies on a device can be applied to, for example... Figure 1 The test control system shown includes controller 400. The following will use controller 400 as an example to discuss... Figure 2 The process shown is described in detail. The test control method for power failure on the device may include the following steps 501 to 502.
[0044] Step 501: In response to the power failure signal sent by the device under test, send a closing command to the relay.
[0045] In this embodiment, the relay is initially in an open state, and the device under test is initially in a power-down state. The device under test can send a power-down signal to the controller, and the controller, in response to the received power-down signal, sends a closing command to the relay.
[0046] After receiving a closing command, the relay can switch to the closed state, connecting the device under test (DUT) to the power supply. The DUT then switches from a power-down state to a power-on state. The DUT can then operate under power supply and send operating status signals to the controller.
[0047] The operating status signal can be any of the following: normal operating status signal or abnormal operating status signal, etc., without limitation.
[0048] When the device under test (DUT) is in normal operating condition, it can send a normal operating status signal to the controller. When the DUT is in an abnormal operating condition, it can send an abnormal operating status signal to the controller.
[0049] Step 502: When an abnormal operating status signal is received, control the relay to remain closed.
[0050] In this embodiment, when the controller receives an abnormal operating status signal, it can control the relay to remain closed. This enables the relay to remain closed when the device under test is powered on and operating abnormally, thus maintaining the abnormal power-on phenomenon and preventing the abnormal power-on phenomenon from disappearing due to repeated power-on. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon of the device under test, which helps users understand the cause of the abnormal power-on phenomenon.
[0051] In some implementations, when the controller receives a normal operating status signal, it can send a disconnect command to the relay. Upon receiving the disconnect command, the relay can switch from a closed state to an open state, disconnecting the electrical connection between the device under test (DUT) and the power supply. The DUT then switches from a power-on state to a power-off state. The DUT can send a power-off signal to the controller. The controller receives the power-off signal from the DUT and returns to execute step 501 and subsequent steps. When the DUT is powered on and operating normally, the control relay switches from a closed state to an open state to repeatedly power on the DUT until the DUT repeatedly powers on and malfunctions. At this point, the control relay remains closed, improving the user experience during the test control process for power-off anomalies on the DUT.
[0052] In some implementations, when the controller receives a normal operating status signal, it can send a disconnect command to the relay after a first time interval. Upon receiving the disconnect command, the relay can switch from a closed state to an open state, disconnecting the electrical connection between the device under test (DUT) and the power supply. The DUT then switches from a power-on state to a power-off state. The DUT can send a power-off signal to the controller, which receives the signal and returns to step 501 and subsequent steps. Delaying the relay disconnection provides a buffer time for disconnecting the power supply to the DUT, preventing damage from sudden power outages and improving the safety of the DUT.
[0053] The first duration can be set according to the duration required for the device under test to be safely shut down. For example, the first duration can be 5 seconds, or it can be 10 seconds, etc. There is no limitation here.
[0054] In some implementations, when the controller receives a normal operating status signal, it can send a disconnect command to the relay, record the number of times the normal operating status signal is received, determine the number of times the device under test is restarted, and store the number of restarts for the user to view. This helps to improve the user experience during the test and control of power failure anomalies on the device under test.
[0055] In some implementations, when the controller receives a normal operating status signal, it can send a disconnect command to the relay, record the number of times the normal operating status signal is received, and determine the number of times the device under test is restarted. A test record containing the number of restarts is generated and stored so that users can trace back based on the test record, which helps to improve the user experience during the test and control of power failure anomalies on the device under test.
[0056] The test records may also include the power-off and power-on states of the device under test, the closed and open states of the relays, etc., which are not limited here.
[0057] In some implementations, when the controller receives an abnormal operating status signal, after the control relay remains closed, a reminder message can be generated to remind the user to analyze the abnormal power-on process in a timely manner based on the abnormal power-on phenomenon. This helps to improve the user experience during the test and control process of power-off anomalies on the device under test.
[0058] The reminder message can be any of the following: text reminder message, sound reminder message, or light reminder message, etc., without any limitation.
[0059] The solution provided in this application involves a controller responding to a power-down signal sent by the device under test (DUT). The controller sends a closing command to a relay, causing the relay to switch to a closed state and enabling the DUT to operate under power. The controller also sends an operating status signal, which can be a normal operating status signal or an abnormal operating status signal. Upon receiving an abnormal operating status signal, the controller keeps the relay closed. This ensures that even when the DUT is powered on and malfunctioning, the relay remains closed, preventing the abnormal power-on phenomenon from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon, which helps them understand the cause of the abnormal power-on.
[0060] Please see Figure 3 This illustrates a flowchart of a test control method for power-down anomalies on a device according to another embodiment of this application. In a specific embodiment, the test control method for power-down anomalies on a device can be applied to, for example... Figure 1 The test control system shown includes the device under test (DUT) 100. The following will use DUT 100 as an example to illustrate this. Figure 3 The process shown is described in detail. The test control method for power failure on the device may include the following steps 601 to 602.
[0061] Step 601: When the device under test is in a power-off state, send a power-off signal to the controller.
[0062] In this embodiment, when the device under test is in a power-down state, it can send a power-down signal to the controller. In response to the received power-down signal, the controller can send a closing command to the relay.
[0063] After receiving a closing command, the relay can switch to the closed state, connecting the device under test (DUT) to the power supply. The DUT then switches from a power-off state to a power-on state and operates under power supply.
[0064] In some implementations, when the device under test (DUT) is in a power-off state, after the DUT sends a power-off signal to the controller, the no-load operating parameters of the DUT can be obtained, and the abnormal operating state of the DUT can be determined based on the no-load operating parameters. Judging the operating state of the DUT based on the no-load operating parameters improves the accuracy of judging the operating state of the DUT.
[0065] Among them, the no-load operating parameters can be obtained by testing the device under test without analog input.
[0066] When the no-load operating parameters are greater than the no-load operating parameter threshold, the device under test is determined to be in an abnormal operating state; when the no-load operating parameters are less than or equal to the no-load operating parameter threshold, the device under test is determined to be in a normal operating state.
[0067] The no-load operating parameter threshold can be set according to the full scale of the operating parameters of the device under test. For example, the no-load operating parameter threshold can be a preset percentage of the full scale.
[0068] As an example, the threshold for no-load operation parameters can be 1% of the full scale, or it can be 3% of the full scale, etc., without limitation here.
[0069] As one implementation method, when the duration for which the no-load operating parameter is less than or equal to the no-load operating parameter threshold is greater than or equal to the duration threshold, the device under test is determined to be in normal operating condition. Determining that the device under test is in normal operating condition based on acquiring a smaller no-load operating parameter over a longer period can further improve the accuracy of judging the operating status of the device under test.
[0070] Step 602: When the device under test is in an abnormal operating state, send an abnormal operating state signal to the controller.
[0071] In this embodiment, when the device under test (DUT) is in an abnormal operating state, it can send an abnormal operating state signal to the controller. After receiving the abnormal operating state signal, the controller controls the relay to remain closed. This allows the controller to keep the relay closed when the DUT is powered on and operating abnormally, thus preventing the abnormal power-on phenomenon from disappearing due to repeated power-on. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon of the DUT, which helps them understand the cause of the abnormal power-on phenomenon.
[0072] In some implementations, when the device under test (DUT) is in normal operating condition, it can send a normal operating condition signal to the controller. Upon receiving the signal, the controller sends a disconnect command to the relay. The relay, upon receiving the disconnect command, switches from a closed state to an open state, disconnecting the electrical connection between the DUT and the power supply. The DUT then switches from a power-on state to a power-off state and returns to step 601 and subsequent steps. When the DUT is powered on and operating normally, the control relay switches from a closed state to an open state to repeatedly power on the DUT until it repeatedly powers on and malfunctions. At this point, the control relay remains closed, improving the user experience during the test control process for power-off anomalies on the DUT.
[0073] The solution provided in this embodiment allows the device under test (DUT) to send a power-down signal to the controller when the DUT is in a power-down state. The controller then responds to the power-down signal by sending a closing command to the relay, switching the relay to a closed state, and allowing the DUT to operate under power supply. When the DUT is in an abnormal operating state, it sends an abnormal operating state signal to the controller, causing the controller to keep the relay in a closed state. This achieves the goal of maintaining the abnormal power-on state by controlling the relay to remain closed when the DUT is powered on and operating abnormally, thus preventing the abnormal power-on state from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomena, which helps them understand the cause of the abnormal power-on state.
[0074] Please see Figure 4 This application illustrates a test control device 700 for power failure on a device according to an embodiment of the present application. The test control device 700 for power failure on a device can be applied to, for example... Figure 1 The test control system shown includes controller 400. The following discussion uses controller 400 as an example. Figure 4 The test control device 700 for power failure on the device shown is described in detail. The test control device 700 for power failure on the device may include a closing command sending module 701 and a control holding module 702.
[0075] The closing command sending module 701 can be used to send a closing command to the relay in response to a power failure signal sent by the device under test, so as to switch the relay to the closed state and enable the device under test to operate under power supply, and send an operating status signal to the controller. The operating status signal can be a normal operating status signal or an abnormal operating status signal. The control holding module 702 can be used to control the relay to remain in the closed state when an abnormal operating status signal is received.
[0076] In some embodiments, the test control device 700 for power failure may further include a disconnection command sending module and a first execution module.
[0077] The disconnect command sending module can be used to send a disconnect command to the relay when a normal operation status signal is received, so that the relay switches from the closed state to the open state, disconnects the power supply to the device under test, and sends a power-down signal to the controller; the first execution module can be used to execute the step of sending a closing command to the relay in response to the power-down signal sent by the device under test and subsequent steps.
[0078] In some embodiments, the test control device 700 for power failure may further include a recording module and a determination module.
[0079] The recording module can be used to record the number of times the normal operating status signal is received; the determination module can be used to determine the number of times the received signal is received as the number of times the device under test will restart.
[0080] In some implementations, the disconnect command sending module may include a sending unit.
[0081] The transmitting unit can be used to send a disconnect command to the relay after a first time interval when a normal operating status signal is received.
[0082] The solution provided in this embodiment involves the controller responding to a power-down signal sent by the device under test (DUT) by sending a closing command to the relay. This causes the relay to switch to a closed state, enabling the DUT to operate under power supply. The controller also sends an operating status signal, which can be either a normal operating status signal or an abnormal operating status signal. When an abnormal operating status signal is received, the controller keeps the relay in a closed state. This ensures that when the DUT is powered on and operating abnormally, the controller keeps the relay in a closed state, thus preventing the abnormal power-on phenomenon from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomenon of the DUT, which helps them understand the cause of the abnormal power-on phenomenon.
[0083] Please see Figure 5 This illustrates a test control device 800 for power failure on a device according to another embodiment of this application. The test control device 800 for power failure on a device can be applied to, for example... Figure 1 The test control system shown includes the device under test (DUT) 100. The following discussion uses DUT 100 as an example to illustrate this. Figure 5 The test control device 800 for power failure on the device shown is described in detail. The test control device 800 for power failure on the device may include a power failure signal transmission module 801 and an abnormal signal transmission module 802.
[0084] The power-down signal sending module 801 can be used to send a power-down signal to the controller when the device under test is in a power-down state, so that the controller responds to the power-down signal, sends a closing command to the relay, and switches the relay to the closed state, so that the device under test can operate under power supply. The abnormal signal sending module 802 can be used to send an abnormal operating state signal to the controller when the device under test is in an abnormal operating state, so that the controller controls the relay to remain in the closed state.
[0085] In some embodiments, the test control device 800 for power failure may further include a normal state signal transmission module and a second execution module.
[0086] The normal state signal sending module can be used to send a normal state signal to the controller when the device under test is in normal operating state, so that the controller sends a disconnect command to the relay, and switches the relay from the closed state to the open state, and disconnects the power supply to the device under test; the second execution module can be used to execute the step of sending a power-off signal to the controller and subsequent steps.
[0087] In some embodiments, the test control device 800 for power failure may further include an acquisition module, a first determination module, and a second determination module.
[0088] The acquisition module can be used to acquire the no-load operating parameters of the device under test before the abnormal signal sending module 802 sends the abnormal operating status signal to the controller when the device under test is in an abnormal operating state. The no-load operating parameters are used to characterize the device under test in an operating state without analog input. The first determination module can be used to determine that the device under test is in an abnormal operating state when the no-load operating parameters are greater than the no-load operating parameter threshold. The second determination module can be used to determine that the device under test is in a normal operating state when the no-load operating parameters are less than or equal to the no-load operating parameter threshold.
[0089] In some implementations, the second determination module may include a determination submodule.
[0090] The determination submodule can be used to determine that the device under test is in normal operating condition when the duration of the no-load operating parameter being less than or equal to the no-load operating parameter threshold is greater than or equal to the duration threshold.
[0091] The solution provided in this embodiment allows the device under test (DUT) to send a power-down signal to the controller when the DUT is in a power-down state. The controller then responds to the power-down signal by sending a closing command to the relay, switching the relay to a closed state, and allowing the DUT to operate under power supply. When the DUT is in an abnormal operating state, it sends an abnormal operating state signal to the controller, causing the controller to keep the relay in a closed state. This achieves the goal of maintaining the abnormal power-on state by controlling the relay to remain closed when the DUT is powered on and operating abnormally, thus preventing the abnormal power-on state from disappearing due to repeated power-on cycles. Users can analyze the abnormal power-on process based on the abnormal power-on phenomena, which helps them understand the cause of the abnormal power-on state.
[0092] It should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For device embodiments, since they are basically similar to method embodiments, the description is relatively simple; relevant parts can be referred to in the descriptions of the method embodiments. Any processing method described in the method embodiments can be implemented in the device embodiments through corresponding processing modules, and will not be elaborated upon further in the device embodiments.
[0093] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.
[0094] Please refer to Figure 6 This diagram illustrates a structural block diagram of a computer-readable storage medium provided in an embodiment of this application. The computer-readable storage medium 900 stores program code 901, which can be called by a processor to execute the methods described in the above method embodiments.
[0095] The computer-readable storage medium 900 may be an electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read-Only Memory), EPROM, hard disk, or ROM. Optionally, the computer-readable storage medium 900 includes a non-transitory computer-readable storage medium. The computer-readable storage medium 900 has storage space for program code 901 that performs any of the method steps described above. This program code can be read from or written to one or more computer program products. The program code 901 may, for example, be compressed in a suitable form.
[0096] Please refer to Figure 7 This diagram illustrates a structural block diagram of a computer program product 1000 provided in an embodiment of this application. The computer program product 1000 includes a computer program / instructions 1001, which is stored in a computer-readable storage medium of a computer device. When the computer program product 1000 runs on the computer device, the processor of the computer device reads the computer program / instructions 1001 from the computer-readable storage medium, and executes the computer program / instructions 1001, causing the computer device to perform the methods described in the above method embodiments.
[0097] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.
Claims
1. A method of testing control of a power down anomaly on a device, the method comprising: The application relates to a controller applied to a test control system, wherein the test control system further comprises a relay, a power supply and a device under test which are electrically connected in series, the controller is in communication connection with the relay and the device under test, and the test control method comprises the following steps: sending a closing instruction to the relay in response to a power-off signal sent by the device under test, so that the relay is switched to a closing state, the device under test is operated under the power supply, and an operation state signal is sent to the controller, wherein the operation state signal is a normal operation state signal or an abnormal operation state signal; when the abnormal operation state signal is received, the relay is controlled to keep the closing state.
2. The test control method of claim 1, wherein, Further comprising the following steps: when the normal operation state signal is received, a disconnecting instruction is sent to the relay, so that the relay is switched from the closing state to a disconnecting state, the device under test is disconnected from the power supply, and the power-off signal is sent to the controller; the steps of sending the closing instruction to the relay in response to the power-off signal sent by the device under test and the subsequent steps are executed.
3. The test control method according to claim 2, wherein Further comprising the following steps: the number of times of receiving the normal operation state signal is recorded; the number of times of receiving the normal operation state signal is determined as the number of times of restarting the device under test.
4. The test control method of claim 2, wherein, The step of sending the disconnecting instruction to the relay when the normal operation state signal is received comprises the following step: when the normal operation state signal is received, the disconnecting instruction is sent to the relay after a first time interval.
5. A method of testing control of a power down anomaly on a device, the method comprising: The application relates to a device under test applied to a test control system, wherein the test control system further comprises a relay, a power supply and a controller, the relay, the power supply and the device under test are electrically connected in series, the controller is in communication connection with the relay and the device under test, and the test control method comprises the following steps: when the device under test is in a power-off state, a power-off signal is sent to the controller, so that the controller sends a closing instruction to the relay in response to the power-off signal, the relay is switched to a closing state, and the device under test is operated under the power supply; when the device under test is in an abnormal operation state, an abnormal operation state signal is sent to the controller, so that the controller controls the relay to keep the closing state.
6. The test control method according to claim 5, wherein Further comprising the following steps: when the device under test is in a normal operation state, a normal operation state signal is sent to the controller, so that the controller sends a disconnecting instruction to the relay, the relay is switched from the closing state to a disconnecting state, and the device under test is disconnected from the power supply; the step of sending the power-off signal to the controller and the subsequent steps are executed.
7. The test control method of claim 5, wherein, Before the step of sending the abnormal operation state signal to the controller when the device under test is in the abnormal operation state, the test control method further comprises the following steps: an idle load operation parameter of the device under test is acquired, the idle load operation parameter is obtained by testing the device under test without an analog quantity input; when the idle load operation parameter is greater than an idle load operation parameter threshold value, it is determined that the device under test is in the abnormal operation state. When the no-load operation parameter is less than or equal to the no-load operation parameter threshold value, it is determined that the measured device is in a normal operation state.
8. The test control method according to claim 7, wherein The determination that the measured device is in the normal operation state when the no-load operation parameter is less than or equal to the no-load operation parameter threshold value includes: When the duration that the no-load operation parameter is less than or equal to the no-load operation parameter threshold value is greater than or equal to a duration threshold value, it is determined that the measured device is in the normal operation state.
9. A test control system, characterized by The system includes a controller, a relay, a power supply, and a measured device, the controller is communicatively connected to the relay and the measured device, the relay, the power supply, and the measured device are electrically connected in series; The controller is configured to execute the test control method according to any one of claims 1 to 4. The measured device is configured to execute the test control method according to any one of claims 5 to 8.
10. A computer readable storage medium, characterized in that, The computer readable storage medium stores program code, and the program code can be called and executed by the processor to execute the test control method according to any one of claims 1 to 4, or according to any one of claims 5 to 8.