Machining device for machining, method for recognizing machining error, and machining method

Abstract

The invention relates to a processing device (10) for processing an electrochemical cell substrate (12), to a method for detecting errors during the processing of an electrochemical cell substrate (12), and to a method for processing an electrochemical cell substrate (12). According to the invention, a deformation of the substrate (12) is detected by means of a monitoring unit (18) during the processing of the substrate (12).

Description

Technical Field

[0001] The present invention relates to a processing apparatus for processing electrochemical battery substrates, a method for identifying errors during the processing of electrochemical battery substrates, and a method for processing electrochemical battery substrates. Background Technology

[0002] Processing apparatuses for processing electrochemical battery substrates are known in the prior art. Summary of the Invention

[0003] In contrast, the processing apparatus of this invention, which features the features of the independent claims, has the advantage of including a monitoring unit configured to detect deformation of the substrate during substrate processing. This enables more efficient manufacturing of electrochemical cell substrates.

[0004] In this context, "processing apparatus" can be understood in particular as an apparatus for processing a substrate. This processing apparatus is especially used for processing electrochemical battery substrates. Preferably, the processing apparatus has a multi-component structure. Preferably, a non-cutting processing method is performed using this processing apparatus. Furthermore, the processing apparatus has the aforementioned holding member for the electrochemical battery substrate. Preferably, the substrate is directly processed in a single processing step. Alternatively, indirect processing of the substrate via the processing apparatus is also conceivable. Particularly preferably, the processing apparatus is used to perform all necessary processing steps. The processing apparatus particularly includes a processing unit for processing the electrochemical battery substrate.

[0005] In this context, "processing unit" can be understood in particular as a unit for processing a substrate. Preferably, the processing unit is used to form recesses in the substrate, especially through recesses. Preferably, the processing unit has at least one non-cutting tool for forming the recess. Preferably, the processing unit is a multi-part structure. Preferably, the processing unit is used to generate laser pulses. Preferably, the processing unit is used to generate a single laser pulse and / or multiple consecutive laser pulses. Particularly preferably, the processing unit is configured as a laser drilling machine. The processing unit is particularly used to process at least one surface of an electrochemical battery substrate. Preferably, energy is input locally by means of laser pulses generated by the processing unit. Particularly preferably, the local energy is so large that the substrate surface is at least substantially partially, preferably mostly, and particularly preferably completely melted and / or evaporated. Alternatively, it is also conceivable that it is particularly completely melted and particularly at least substantially partially evaporated. Preferably, at least one recess is formed in the electrochemical battery substrate by processing the surface of the electrochemical battery substrate. Particularly preferably, a through recess is formed in the electrochemical battery substrate by processing the surface of the electrochemical battery substrate. Preferably, the through recess is arranged perpendicular to the main extending plane of the electrochemical cell substrate. Preferably, the laser pulse is focused by a processing unit.

[0006] In this context, "electrochemical battery substrate" is preferably understood as a substrate used in a fuel cell. Preferably, the electrochemical battery substrate is constructed as a metal plate. Preferably, the substrate is used in an electrolytic cell. Particularly preferably, the electrochemical battery substrate is used in a solid oxide fuel cell. Alternatively, the substrate is used in a battery. Preferably, the electrochemical battery substrate is used to provide a substrate for an electrolyte. Furthermore, substrates made of pre-sintered ceramics are also conceivable. Additionally, other materials deemed reasonable by those skilled in the art are also conceivable. Within the scope of this invention, "non-shrinkage material" should be understood as a material that no longer shrinks during a shrinkage process (e.g., a sintering process) and / or has been pre-shrinked, for example, by a sintering process.

[0007] The “main extension plane” of an object or device should be understood in particular as a plane that is parallel to the largest side of the smallest virtual cuboid that just completely encloses the object or device, and in particular passes through the center point of the cuboid.

[0008] Within the scope of this invention, a "monitoring unit" can be understood in particular as a unit for monitoring processes, operations, and / or functions (e.g., processes, operations, and / or functions of an apparatus and / or system). This monitoring unit can particularly collect and / or analyze data (e.g., measurement data), preferably for identifying potential problems and / or errors and / or taking appropriate measures. In particular, the monitoring unit may also output information when values ​​exceed or fall below specific thresholds and / or limits.

[0009] Within the scope of this invention, "deformation" can be understood in particular as a change in the shape, size and / or structure of an object or material, such as a change caused by bending, twisting, compression and / or stretching.

[0010] Advantageous improvements to the processing unit described in the independent claim can be achieved through the features listed in the dependent claims. Therefore, it is advantageous for the monitoring unit to identify deformations of the substrate, particularly bulging, in a direction at least substantially perpendicular to the main extension plane of the substrate. This enables more efficient manufacturing of electrochemical cell substrates.

[0011] Also advantageously, the monitoring unit includes a sensor unit, particularly an optical sensor unit, preferably a triangulation sensor, which is used to detect substrate deformation during substrate processing, especially by distance measurement. This enables particularly efficient monitoring of the electrochemical cell substrate processing.

[0012] Also advantageous is that the monitoring unit includes a control unit for electronically detecting substrate deformation, particularly the output signal of the sensor unit corresponding to substrate deformation. This enables more efficient manufacturing of electrochemical cell substrates.

[0013] Equally advantageous is that when deformation (especially the sensor unit output signal corresponding to substrate deformation) and / or deformation exceeding the limit value (especially the sensor unit output signal corresponding to substrate deformation and exceeding the limit value) is detected, the monitoring unit, especially the control unit, is used to terminate the substrate processing. This also enables more efficient manufacturing of electrochemical cell substrates, especially in mass production.

[0014] A method for identifying errors during the processing of electrochemical battery substrates, particularly by means of processing according to the processing apparatus described above, has the advantage of detecting substrate deformation during substrate processing by a monitoring unit. This also enables more efficient manufacturing of electrochemical battery substrates.

[0015] Advantageous improvements to the method can be achieved through the features listed in the dependent claims. Therefore, it is advantageous to identify deformations, particularly bulging, of the substrate in a direction at least substantially perpendicular to the main extension plane of the substrate by means of a monitoring unit. This enables more efficient manufacturing of electrochemical cell substrates.

[0016] Also advantageously, the monitoring unit includes a sensor unit (especially an optical sensor unit, preferably a triangulation sensor) that detects substrate deformation during substrate processing, particularly through distance measurement. This enables the particularly efficient manufacturing of electrochemical cell substrates.

[0017] Another advantage is that the monitoring unit includes a control unit, which electronically detects substrate deformation, particularly the output signal of a sensor unit corresponding to substrate deformation. This enables more efficient manufacturing of electrochemical battery substrates.

[0018] Equally advantageous is that when deformation (especially the sensor unit output signal corresponding to substrate deformation) and / or deformation exceeding the limit value (especially the sensor unit output signal corresponding to substrate deformation and exceeding the limit value) is detected, the substrate processing can be terminated by a monitoring unit, especially a control unit. This enables more efficient manufacturing of electrochemical cell substrates, especially in mass production.

[0019] The method for processing electrochemical battery substrates (especially processing performed using the processing apparatus described above) has the advantage of implementing the method described above for identifying errors during the processing of electrochemical battery substrates. This also enables more efficient manufacturing of electrochemical battery substrates. Attached Figure Description

[0020] Figure 1The accompanying drawing schematically illustrates one embodiment of the invention, which is described in detail below. The drawing shows a cross-sectional view of an embodiment of a processing apparatus for processing electrochemical battery substrates. Detailed Implementation

[0021] Figure 1 A cross-sectional view of one embodiment of a processing apparatus 10 for processing a substrate 12 of an electrochemical cell is shown. In the illustrated embodiment, the processing apparatus 10 includes a processing unit 14 for processing the substrate 12. Furthermore, in the illustrated embodiment, the processing apparatus 10 also includes a holder 16 for the substrate 12. In the illustrated embodiment, the substrate 12 is placed in the holder 16, or held by the holder 16.

[0022] The processing apparatus 10 is characterized by a monitoring unit 18, which detects deformation of the substrate 12 during processing. Accordingly, the monitoring unit 18 detects deformation of the substrate during processing. This allows identification of whether undesirable deformation of the substrate 12 has occurred during processing, which could lead to errors in the processing of the substrate 12. Consequently, errors in the processing of the substrate 12 and / or potentially erroneous substrates can be identified early in the processing. This, in turn, enables more efficient manufacturing of the electrochemical battery substrate 12, especially in mass production.

[0023] In the illustrated embodiment, the monitoring unit 18 is used to identify deformation of the substrate 12 in a direction at least substantially perpendicular to the main extension plane of the substrate 12, which in the illustrated case is an arch 20. This allows for the identification of substrate 12 deformations (vertical deformations in this embodiment) that are particularly critical to processing. In the illustrated case, such deformations may cause the substrate 12 to move away from the focal point of the laser pulse 22 generated by the processing unit 14, resulting in insufficient energy input of the laser pulse 20 to form a recess in the substrate 12, especially a through recess. Accordingly, substrates 12 exhibiting vertical deformation in the illustrated case, and thus more likely to have errors, can be identified during manufacturing. Other substrates (e.g., those with horizontal deformation) can be inspected in subsequent processes to determine if errors are indeed present. This, in turn, enables more efficient manufacturing of the electrochemical cell substrate 12, especially in mass production.

[0024] In the illustrated embodiment, the monitoring unit 18 includes a sensor unit 24, which in this case is an optical sensor unit, preferably a triangulation sensor 26, used to detect deformation of the substrate 12 during substrate processing. In the illustrated embodiment, deformation of the substrate 12 is detected by distance measurement. In this case, the distance from the sensor unit 24 (or the triangulation sensor 26) to the substrate 12 is measured, specifically the distance to the position on the substrate 12 illuminated by the laser pulse 22 generated by the processing unit 14. This allows for non-contact and highly accurate detection of substrate deformation, thereby enabling highly efficient error identification. Consequently, highly efficient monitoring of the electrochemical cell substrate 12 processing can be achieved.

[0025] Furthermore, in the illustrated embodiment, the monitoring unit 18 includes a control unit 28 for electronically detecting deformation of the substrate 12, particularly the output signal of the sensor unit 24 (or triangulation sensor 26) corresponding to the deformation of the substrate 12. Thus, the control unit 28 can also analyze the intensity of the deformation, thereby identifying substrates 12 with particularly severe vertical deformation and a higher likelihood of error during manufacturing, especially in mass production. Other substrates 12 (e.g., those with less severe horizontal deformation) can be inspected in subsequent processes to determine if they indeed have errors. This, in turn, enables more efficient manufacturing of the electrochemical cell substrate 12, especially in mass production.

[0026] In the illustrated embodiment, when deformation (especially the output signal of sensor unit 24 corresponding to deformation of substrate 12) and / or deformation exceeding the limit value (especially the output signal of sensor unit 24 corresponding to deformation of substrate 12 and exceeding the limit value), monitoring unit 18, especially control unit 28, terminates the processing of substrate 12. Thus, during manufacturing, especially in mass production, processing of substrate 12 that is detected to have deformation exceeding the limit value during processing can be terminated early, thereby saving time and avoiding costly further processing of substrate 12. This also enables more efficient manufacturing of electrochemical cell substrate 12, especially in mass production.

Claims

1. A processing apparatus (10) for processing a substrate (12) of an electrochemical cell, characterized in that, The processing apparatus includes a monitoring unit (18) for detecting deformation of the substrate (12) during the processing of the substrate (12).

2. The processing apparatus (10) according to any one of the preceding claims, characterized in that, The monitoring unit (18) is used to identify deformation of the substrate (12) in a direction at least substantially perpendicular to the main extension plane of the substrate (12), especially bulging (20).

3. The processing apparatus (10) according to any one of the preceding claims, characterized in that, The monitoring unit (18) includes a sensor unit (24), particularly an optical sensor unit, preferably a triangulation sensor (26), which is used to detect deformation of the substrate (12) during the processing of the substrate (12), particularly by means of distance measurement.

4. The processing apparatus (10) according to any one of the preceding claims, characterized in that, The monitoring unit (18) includes a control unit (28) for electronically detecting deformation of the substrate (12), particularly the output signal of the sensor unit (24) corresponding to the deformation of the substrate (12).

5. The processing apparatus (10) according to any one of the preceding claims, characterized in that, When deformation is detected, especially the output signal of the sensor unit (24) corresponding to the deformation of the substrate (12) and / or deformation exceeding the limit value, especially the output signal of the sensor unit (24) corresponding to the deformation of the substrate and exceeding the limit value, the monitoring unit (18), especially the control unit (28), is used to terminate the processing of the substrate (12).

6. A method for identifying errors during the processing of a substrate (12) of an electrochemical cell, particularly by means of a processing apparatus (10) according to any one of the preceding claims, characterized in that, The deformation of the substrate (12) is detected by the monitoring unit (18) during the processing of the substrate (12).

7. The method according to claim 6, characterized in that, The monitoring unit (18) identifies deformation of the substrate in a direction that is at least substantially perpendicular to the main extension plane of the substrate (12), especially bulging (20).

8. The method according to claim 6 or 7, characterized in that, The monitoring unit (18) includes a sensor unit (24), particularly an optical sensor unit, preferably a triangulation sensor (26), which detects the deformation of the substrate (12) during the processing of the substrate (12), particularly by means of distance measurement.

9. The method according to any one of claims 6 to 8, characterized in that, The monitoring unit (18) includes a control unit (28) which electronically detects the deformation of the substrate (12), particularly the output signal of the sensor unit (24) corresponding to the deformation of the substrate (12).

10. The method according to any one of claims 6 to 9, characterized in that, When deformation is detected, especially the output signal of the sensor unit (24) corresponding to the deformation of the substrate (12) and / or deformation exceeding the limit value, especially the output signal of the sensor unit (24) corresponding to the deformation of the substrate (12) and exceeding the limit value, the processing of the substrate (12) is terminated by the monitoring unit (18), especially the control unit (28).

11. A method for processing a substrate (12) of an electrochemical cell, particularly by means of a processing apparatus (10) according to any one of claims 1 to 5, characterized in that, Perform the method for identifying errors in the processing of the substrate (12) of the electrochemical cell according to any one of claims 6 to 10.

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