Comprehensive detector for stepped holes and hole distance and hole diameter detection method

Abstract

The invention provides a comprehensive detector for stepped holes and a hole distance and hole diameter detection method, and relates to the technical field of hole distance and hole diameter detection. Comprising a detection platform, a main Z-direction adjusting mechanism, a main Y-direction adjusting mechanism, a main X-direction adjusting mechanism, a secondary X-direction adjusting mechanism, a secondary Y-direction adjusting mechanism and a secondary Z-direction adjusting mechanism, and the main Z-direction adjusting mechanism, the main Y-direction adjusting mechanism, the main X-direction adjusting mechanism, the secondary Y-direction adjusting mechanism and the secondary Z-direction adjusting mechanism are arranged in a layered mode along a three-dimensional space axis. The main X-direction adjusting mechanism and the secondary Z-direction adjusting mechanism are each provided with an inner measuring head through an inner measuring head fixing clamp. Through the movement of the main Z-direction adjusting mechanism, the main Y-direction adjusting mechanism and the main X-direction adjusting mechanism, a first inner measuring head installed on the main X-direction adjusting mechanism is driven to be aligned with a first to-be-measured hole of the stepped hole, and through the cooperative movement of the secondary X-direction adjusting mechanism, the secondary Y-direction adjusting mechanism and the secondary Z-direction adjusting mechanism, the first to-be-measured hole is aligned with a second to-be-measured hole of the stepped hole. A second inner measuring head installed on the secondary Z-direction adjusting mechanism is driven to be aligned with a second to-be-measured hole of the stepped hole, and hole diameter and hole distance data of the stepped hole are synchronously collected through one-time clamping.

Description

Technical Field

[0001] This invention relates to the technical field of hole spacing and diameter detection, specifically to a comprehensive testing instrument and method for step-type holes. Background Technology

[0002] Stepped holes are widely used in high-end equipment such as aerospace components and precision molds. Their hole diameter accuracy, coaxiality, and hole spacing accuracy directly affect the assembly accuracy, sealing performance, and load-bearing stability of components. Excessive deviation can easily lead to sealing leaks, component wear, or even safety accidents. Therefore, the testing must meet extremely high accuracy requirements.

[0003] Currently, the main methods for detecting stepped boreholes are manual inspection and traditional instrument inspection.

[0004] Manual inspection relies on tools such as plug gauges and dial indicators, which are labor-intensive and inefficient. Deep hole sections and variable diameter sections are prone to measurement blind spots, and the results are greatly affected by human factors, making them unsuitable for mass production. In traditional instrument inspection, coordinate measuring machines are expensive and complex to operate, and have strict environmental requirements. The inspection process is cumbersome and time-consuming, while customized inspection fixtures have poor versatility and limited adjustment accuracy.

[0005] Therefore, the present invention provides a comprehensive testing instrument and a method for detecting hole spacing and diameter for stepped holes. Summary of the Invention

[0006] The purpose of this invention is to overcome the shortcomings of the prior art and provide a comprehensive testing instrument and a method for detecting hole spacing and diameter for stepped holes.

[0007] To achieve the above objectives, the present invention adopts the following technical solution: a comprehensive testing instrument for stepped holes, including a testing platform, and further comprising;

[0008] The main Z-axis adjustment mechanism is installed on the top side of the detection platform along the Z-axis direction and can move linearly along the Z-axis direction of the detection platform.

[0009] The main Y-axis adjustment mechanism is mounted on top of the main Z-axis adjustment mechanism along the Y-axis direction of the detection platform and can move linearly along the Y-axis direction of the detection platform.

[0010] The main X-axis adjustment mechanism is installed on the side of the main Y-axis adjustment mechanism along the X-axis direction of the detection platform and can move linearly along the X-axis direction of the detection platform.

[0011] The secondary X-axis adjustment mechanism is installed on the side of the main X-axis adjustment mechanism along the X-axis direction of the detection platform and can move linearly along the X-axis direction of the detection platform.

[0012] The secondary Y-axis adjustment mechanism is installed on the side of the secondary X-axis adjustment mechanism along the Y-axis direction of the detection platform, and can move linearly along the Y-axis direction of the detection platform.

[0013] The secondary Z-axis adjustment mechanism is installed on the side of the secondary Y-axis adjustment mechanism along the Z-axis direction of the detection platform, and can move linearly along the Z-axis direction of the detection platform.

[0014] The detection device includes a first internal probe fixed in an internal probe fixing fixture on a main X-axis adjustment mechanism and a second internal probe fixed in an internal probe fixing fixture on a secondary Z-axis adjustment mechanism, used to synchronously collect the hole diameter and hole spacing data of stepped holes. The internal probe includes a probe, a bevel gear, a fixing sleeve, a micrometer screw, a micrometer cylinder, an adjusting nut, a connector, a washer, and a rotating head.

[0015] The micrometer screw is inserted into the fixed sleeve. One end of the micrometer screw is connected to the probe, and the other end of the micrometer screw passes through the differential cylinder, connector, and washer in sequence. A rotating head is installed at the end of the micrometer screw. An elastic sensor is provided between the micrometer screw and the rotating head. The elastic sensor is electrically connected to the detection platform. The bevel gear is connected to the micrometer screw to transmit motion. The adjusting nut is assembled at the corresponding position on the fixed sleeve. A small motor is connected to the tail end of the rotating head. The small motor is electrically connected to the detection platform. The motor drives the rotating head to rotate, and the bevel gear transmission drives the micrometer screw to move linearly. This allows the probe to measure and accurately position the diameter of the stepped hole based on the three-point contact principle.

[0016] Preferably, the main Z-axis adjustment mechanism, main Y-axis adjustment mechanism, main X-axis adjustment mechanism, secondary X-axis adjustment mechanism, secondary Y-axis adjustment mechanism, and secondary Z-axis adjustment mechanism all include a base plate and a motor fixed to the side of the base plate. Two bearing supports are symmetrically installed on the top of the base plate. A lead screw is installed between the two bearing supports through a bearing end cover and a rolling bearing. A slider is threaded onto the lead screw. A slide table is fixed on the top of the slider. The output shaft of the motor is connected to the lead screw on the bearing support via a coupling. Guide rails are fixed on both sides of the top of the base plate, and the slide table can slide along the guide rails. Limiting blocks for limiting the sliding stroke of the slide table are fixed at both ends of the guide rails. A displacement sensor is also provided on the guide rails, and the displacement sensor is electrically connected to the detection platform.

[0017] Preferably, the base plate of the main Y-axis adjustment mechanism is a thickened structure, and the base plate of the main Y-axis adjustment mechanism is fixed to the slide of the main Z-axis adjustment mechanism by bolts. The base plate of the main X-axis adjustment mechanism is fixed to the slide of the main Y-axis adjustment mechanism by bolts. The base plate of the secondary X-axis adjustment mechanism is fixed to the slide of the main X-axis adjustment mechanism by bolts. The base plate of the secondary Y-axis adjustment mechanism is fixed to the slide of the secondary X-axis adjustment mechanism by bolts. The base plate of the secondary Z-axis adjustment mechanism is fixed to the slide of the secondary Y-axis adjustment mechanism by bolts.

[0018] Preferably, the bottom plate of the main X-axis adjustment mechanism has an integrally formed reinforcing lug on its side, and the reinforcing lug is connected to the slide table of the main Y-axis adjustment mechanism by bolts. The slide tables of the detection platform, the main Z-axis adjustment mechanism, the main Y-axis adjustment mechanism, the main X-axis adjustment mechanism and the secondary Y-axis adjustment mechanism are all straight plate structures, and the slide tables of the secondary X-axis adjustment mechanism and the secondary Z-axis adjustment mechanism are L-shaped structures.

[0019] Preferably, the inner probe fixing clamp on the main X-axis adjustment mechanism is mounted on the surface of the upper slide of the main X-axis adjustment mechanism via a T-block, and the inner probe fixing clamp on the secondary Z-axis adjustment mechanism is fixed to the side of the upper slide of the secondary Z-axis adjustment mechanism.

[0020] Preferably, the internal probe fixing clamp has a T-shaped structure, and the internal probe fixing clamp has a through hole with an opening, a fixing bolt threaded through the opening, and the internal probe is sleeved inside the through hole.

[0021] A method for detecting hole spacing and diameter using a comprehensive testing instrument for stepped holes, comprising the following steps:

[0022] S1. Import the three-dimensional digital model of the workpiece to be tested into the computer system of the testing instrument through digital communication means such as USB flash drive or network, and the control system automatically analyzes the three-dimensional model data of the workpiece to be tested.

[0023] S2. By activating the motion switch in the detection platform control system, manipulate the main Z-axis adjustment mechanism, the main Y-axis adjustment mechanism, and the main X-axis adjustment mechanism to move or move in tandem, so that they return to the machine zero position respectively; manipulate the secondary X-axis adjustment mechanism, the secondary Y-axis adjustment mechanism, and the secondary Z-axis adjustment mechanism to move or move in tandem, so that they return to the machine zero position respectively.

[0024] S3. Fix the workpiece with the stepped hole to be tested in the preset position of the testing platform;

[0025] S4. By activating the alignment switch in the detection platform control system, the control system automatically completes the alignment and positioning of the typical features of the workpiece based on the three-dimensional model data of the workpiece to be tested and the clamping position of the workpiece, and records the current coordinate position of the two inner probes.

[0026] S5. The control system of the detection platform controls the main Z-axis adjustment mechanism, the main Y-axis adjustment mechanism, and the main X-axis adjustment mechanism to move respectively, so that the inner probe on the main X-axis adjustment mechanism extends into the first test hole of the stepped hole. By rotating the inner probe, the probe is driven to fit against the inner wall of the first test hole based on the three-point contact principle, thus completing the positioning and collecting the hole diameter data of the first test hole. When the inner probe fits against the inner wall of the first test hole, the actual hole diameter value of the first test hole is read through the scale of the micrometer drum, and compared with the preset standard value to obtain the hole diameter error of the first test hole.

[0027] S6. Control the secondary X-axis adjustment mechanism, secondary Y-axis adjustment mechanism, and secondary Z-axis adjustment mechanism to move respectively, so that the inner probe on the secondary Z-axis adjustment mechanism extends into the second test hole of the stepped hole. By rotating the inner probe, the probe is driven to fit against the inner wall of the second test hole based on the three-point contact principle, thus completing the positioning of the second test hole and collecting its hole diameter data. When the inner probe fits against the inner wall of the second test hole, the actual hole diameter value of the second test hole is read through the scale of the micrometer drum, and compared with the preset standard value to obtain the hole diameter error of the second test hole.

[0028] S7. Using displacement feedback data, calculate the relative distance between the first and second test holes in the X, Y, and Z directions, and combine the hole diameter data to complete the comprehensive detection of the hole spacing and hole diameter of the stepped hole.

[0029] The hole distance is calculated as follows: with the machine zero position as the reference origin of the XYZ coordinate axis, record the coordinate values ​​of the main Z-axis adjustment mechanism, the main Y-axis adjustment mechanism, and the main X-axis adjustment mechanism in the X, Y, and Z directions when the inner probe is in contact with the inner wall of the first hole to be tested. Then, record the coordinate values ​​of the secondary X-axis adjustment mechanism, the secondary Y-axis adjustment mechanism, and the secondary Z-axis adjustment mechanism in the X, Y, and Z directions when the inner probe is in contact with the inner wall of the second hole to be tested. Calculate the three-dimensional hole distance between the two holes to be tested using the spatial distance formula.

[0030] S8. Record the measured data of the hole spacing and hole diameter of the stepped holes.

[0031] S9. Repeat S3-S8 to perform a comprehensive inspection of the hole spacing and diameter of the next workpiece. By repeating this process, the comprehensive inspection of the hole spacing and diameter of stepped holes in a batch of workpieces can be completed quickly.

[0032] This invention provides a comprehensive testing instrument and method for detecting hole spacing and diameter in stepped holes. It offers the following advantages:

[0033] 1. This invention drives a first internal probe mounted on the main X-axis adjustment mechanism to align with the first test hole of the stepped hole through the movement of the main Z-axis adjustment mechanism, the main Y-axis adjustment mechanism, and the main X-axis adjustment mechanism; and drives a second internal probe mounted on the secondary Z-axis adjustment mechanism to align with the second test hole of the stepped hole through the coordinated movement of the secondary X-axis adjustment mechanism, the secondary Y-axis adjustment mechanism, and the secondary Z-axis adjustment mechanism. This allows each adjustment mechanism to move along its corresponding coordinate axis, achieving precise displacement of the internal probes in three-dimensional space. The two internal probes simultaneously complete the positioning and data acquisition of the two holes, avoiding the cumbersome process of step-by-step measurement of a single hole in traditional testing, achieving high efficiency, completing comprehensive testing in a single setup, and greatly improving testing efficiency.

[0034] 2. Compared with manual inspection of one hole at a time, this invention enables simultaneous inspection of two stepped holes, completely eliminating measurement blind spots in deep hole sections and variable diameter sections, thus improving inspection efficiency. Compared with the complex operation and environmental dependence of traditional coordinate measuring machines, the structure is simplified and does not require strict environmental control. It can be directly applied to mass production scenarios in workshops and can also cover stepped holes of different specifications, solving the problem of poor versatility of customized chemical equipment.

[0035] 3. This invention fully utilizes the data from the three-dimensional digital model of the workpiece to be tested, facilitating the comparison and judgment between design values ​​and measured values. It is particularly suitable for batch production, with small clamping errors and high testing efficiency. By importing the three-dimensional digital model, the system can automatically analyze the features to be measured and drive the equipment for initial alignment, reducing the difficulty of pre-operation preparation and reliance on operator experience. All measurements in this invention are based on a unified detection platform coordinate system and single clamping positioning. The spatial positions of the two probes are accurately fed back by the same high-precision motion control system (lead screw guide mechanism), ensuring a high degree of homogeneity between the aperture data and the spatial position data, fundamentally avoiding errors caused by inconsistent references and eliminating reference conversion errors.

[0036] 4. This invention effectively improves the automation and intelligence level of the inspection process. Through automated or semi-automated motion control and data reading (e.g., via a differential cylinder), it reduces operator intervention in manual positioning and visual reading, improving the objectivity and repeatability of measurements and further reducing human error. As a flexible inspection platform, this invention can adapt to the inspection of stepped holes of different sizes and positional relationships through program adjustments, achieving "one machine for multiple uses" and saving on the design, manufacturing, and inventory management costs of specialized inspection tools. The automated and standardized operating procedures reduce the stringent requirements for the proficiency of inspection personnel, reducing training costs and quality fluctuations caused by subjective human judgment. Attached Figure Description

[0037] Figure 1This is a schematic diagram of the structure of a comprehensive testing instrument and hole spacing / diameter testing method for stepped holes provided by the present invention.

[0038] Figure 2 A schematic diagram of the main Z-axis adjustment mechanism, main Y-axis adjustment mechanism, main X-axis adjustment mechanism, secondary X-axis adjustment mechanism, secondary Y-axis adjustment mechanism, and secondary Z-axis adjustment mechanism of the comprehensive testing instrument and hole spacing and diameter detection method for stepped holes provided by the present invention.

[0039] Figure 3 The diagram shows the main Y-axis adjustment mechanism, the main X-axis adjustment mechanism, and the secondary X-axis adjustment mechanism of the comprehensive testing instrument and hole spacing and diameter testing method for stepped holes provided by the present invention.

[0040] Figure 4 A schematic diagram of the secondary X-axis adjustment mechanism of a comprehensive testing instrument and hole spacing / diameter testing method for stepped holes provided by the present invention;

[0041] Figure 5 A schematic diagram of the main X-axis adjustment mechanism of a comprehensive testing instrument and hole spacing / diameter testing method for stepped holes provided by the present invention;

[0042] Figure 6 A schematic diagram of an internal probe fixing fixture for a comprehensive testing instrument and hole spacing / diameter testing method for stepped holes provided by the present invention;

[0043] Figure 7 This invention provides a schematic diagram of the internal probe of a comprehensive testing instrument for stepped holes and a method for detecting hole spacing and diameter.

[0044] Legend:

[0045] 1-Detection platform; 2-Main Z-axis adjustment mechanism; 3-Main Y-axis adjustment mechanism; 4-Main X-axis adjustment mechanism; 5-Secondary X-axis adjustment mechanism; 6-Secondary Y-axis adjustment mechanism; 7-Secondary Z-axis adjustment mechanism; 8-Internal probe fixing fixture; 81-Through hole;

[0046] 9-Internal probe; 901-Probe; 902-Bevel gear; 903-Fixed sleeve; 904-Micrometer screw; 905-Micrometer cylinder; 906-Adjusting nut; 907-Connector; 908-Washer; 909-Rotating head;

[0047] 10-T-block; 11-base plate; 12-motor; 13-bearing support; 14-lead screw; 15-slider; 16-slide table; 17-guide rail; 18-coupling; 19-limit block. Detailed Implementation

[0048] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0049] Example 1

[0050] like Figures 1-3 As shown, this embodiment provides a technical solution: a comprehensive testing instrument for stepped holes, including a testing platform 1 and a primary Z-axis adjustment mechanism 2, a primary Y-axis adjustment mechanism 3, a primary X-axis adjustment mechanism 4, a secondary X-axis adjustment mechanism 5, a secondary Y-axis adjustment mechanism 6 and a secondary Z-axis adjustment mechanism 7 arranged in layers along the three-dimensional spatial axis, and a testing device. The main Z-axis adjustment mechanism 2 is mounted on the top side of the detection platform 1 along the Z-axis direction and can move linearly along the Z-axis; the main Y-axis adjustment mechanism 3 is mounted on top of the main Z-axis adjustment mechanism 2 along the Y-axis direction of the detection platform 1 and can move linearly along the Y-axis; the main X-axis adjustment mechanism 4 is mounted on the side of the main Y-axis adjustment mechanism 3 along the X-axis direction of the detection platform 1 and can move linearly along the X-axis; the secondary X-axis adjustment mechanism 5 is mounted on the side of the main X-axis adjustment mechanism 4 along the X-axis direction of the detection platform 1 and can move linearly along the X-axis; the secondary Y-axis adjustment mechanism 6 is mounted on the side of the secondary X-axis adjustment mechanism 5 along the Y-axis direction of the detection platform 1 and can move linearly along the Y-axis; the secondary Z-axis adjustment mechanism 7 is mounted on the side of the secondary Y-axis adjustment mechanism 6 along the Z-axis direction of the detection platform 1 and can move linearly along the Z-axis; the detection device includes an internal probe 9 mounted on both the main X-axis adjustment mechanism 4 and the secondary Z-axis adjustment mechanism 7 via an internal probe fixing clamp 8, used to synchronously collect the diameter and spacing data of the stepped holes.

[0051] As described above, the movement of the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, and the main X-axis adjustment mechanism 4 drives the first internal probe 9 mounted on the main X-axis adjustment mechanism 4 to align with the first test hole of the stepped hole; and through the coordinated movement of the secondary X-axis adjustment mechanism 5, the secondary Y-axis adjustment mechanism 6, and the secondary Z-axis adjustment mechanism 7, the second internal probe 9 mounted on the secondary Z-axis adjustment mechanism 7 is driven to align with the second test hole of the stepped hole. This allows each adjustment mechanism to move along its corresponding coordinate axis, achieving precise displacement of the internal probe 9 in three-dimensional space. The two internal probes 9 simultaneously complete the positioning and data acquisition of the two holes, avoiding the cumbersome process of step-by-step measurement of a single hole in traditional testing.

[0052] like Figures 1-5As shown: The main Z-axis adjustment mechanism 2, main Y-axis adjustment mechanism 3, main X-axis adjustment mechanism 4, secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6, and secondary Z-axis adjustment mechanism 7 adopt a unified modular structure. They all include a base plate 11 and a motor 12 fixed to the side of the base plate 11. Two bearing supports 13 are symmetrically installed on the top of the base plate 11. A lead screw 14 is installed between the two bearing supports 13 through a bearing end cover and a rolling bearing. A slider 15 is threaded onto the lead screw 14. A slide table 16 is fixed on the top of the slider 15. The output shaft of the motor 12 is connected to the lead screw 14 on the bearing support 13 through a coupling 18.

[0053] As described above, the motor 12 outputs rotational motion, which is transmitted to the lead screw 14 via the coupling 18. The rotational motion of the lead screw 14 drives the slider 15 to move linearly through a threaded connection, thereby causing the slide table 16 and the adjustment mechanism mounted on the slide table 16 to move synchronously along the axial direction, thus achieving linear displacement. Compared with manual adjustment or gear transmission, the lead screw 14 transmission has higher lead accuracy and a self-locking function. Through the displacement of the main Z-axis adjustment mechanism 2, main Y-axis adjustment mechanism 3, main X-axis adjustment mechanism 4, secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6, and secondary Z-axis adjustment mechanism 7, the pain points of large manual adjustment errors and limited adjustment accuracy of traditional tooling in manual inspection are solved. The motor 12 drive replaces manual operation, greatly reducing labor intensity. At the same time, the self-locking property of the lead screw 14 transmission ensures the stability of the position of each slide table 16 during the inspection process, avoiding measurement deviations caused by external interference.

[0054] like Figures 4-5 As shown: The main Z-axis adjustment mechanism 2, main Y-axis adjustment mechanism 3, main X-axis adjustment mechanism 4, secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6 and secondary Z-axis adjustment mechanism 7 are all fixed with parallel guide rails 17 on both sides of the top of the base plate 11. The bottom of the slide table 16 of each adjustment mechanism is provided with a guide groove that matches the guide rail 17, and the slide table 16 can slide smoothly in a straight line along the guide rail 17.

[0055] As described above, the guide rail 17 provides guiding constraints for the slide table 16, limiting its offset in the direction perpendicular to the axis. Simultaneously, the sliding engagement between the guide rail 17 and the slide table 16 reduces friction when the adjusting mechanism moves along the axis, ensuring the straightness and smoothness of the slide table 16 and the adjusting mechanism mounted on it. This further guarantees the motion accuracy of each adjusting mechanism and prevents problems such as jamming or offset during the movement of the slide table 16.

[0056] like Figures 3-5As shown: The main Z-axis adjustment mechanism 2, main Y-axis adjustment mechanism 3, main X-axis adjustment mechanism 4, secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6 and secondary Z-axis adjustment mechanism 7 all have limit blocks 19 fixed at both ends of the guide rail 17 to limit the sliding stroke of the slide table 16. The limit blocks 19 are fixed to the base plate 11 by bolts. The guide rail 17 is also equipped with a displacement sensor, which is electrically connected to the detection platform 1. The displacement sensor obtains the relative motion between the guide rail 17 and the slider 15, i.e., the displacement data, and transmits it to the control system of the detection platform 1.

[0057] As can be seen from the above, when the slide table 16 of the adjustment mechanism moves along the axis to the end of the guide rail 17 under the drive of the motor 12, the limiting block 19 contacts the end face of the slide table 16 to form a limit, preventing the slide table 16 from continuing to move along the axis and avoiding exceeding the design stroke; effectively preventing the slide table 16 of each adjustment mechanism from disengaging from the guide rail 17 or colliding with other components, protecting the motor 12 and lead screw 14 of each adjustment mechanism from overload damage; at the same time, preventing the inner probe 9 on the main X-axis adjustment mechanism 4 and the secondary Z-axis adjustment mechanism 7 from making hard contact with the workpiece to be tested, preventing scratches on the workpiece surface or damage to the inner probe 9, and improving the safety and reliability of operation.

[0058] like Figures 3-5 As shown: Each adjustment mechanism is assembled in layers through bolt connection between the base plate 11 and the slide table 16;

[0059] The base plate 11 of the main Y-axis adjustment mechanism 3 adopts a thickened structure (twice the thickness of a normal base plate), and the base plate 11 of the main Y-axis adjustment mechanism 3 is fixed to the slide table 16 of the main Z-axis adjustment mechanism 2 by bolts;

[0060] The base plate 11 of the main X-axis adjustment mechanism 4 is fixed to the slide table 16 of the main Y-axis adjustment mechanism 3 by bolts;

[0061] The base plate 11 of the secondary X-axis adjustment mechanism 5 is fixed to the slide table 16 of the main X-axis adjustment mechanism 4 by bolts;

[0062] The base plate 11 of the secondary Y-axis adjustment mechanism 6 is fixed to the slide table 16 of the secondary X-axis adjustment mechanism 5 by bolts;

[0063] The base plate 11 of the secondary Z-axis adjustment mechanism 7 is fixed to the slide table 16 of the secondary Y-axis adjustment mechanism 6 by bolts.

[0064] As can be seen from the above, the slide table 16 of the adjustment mechanism serves as the mounting base for another adjustment mechanism, forming a hierarchical linkage structure along the Z, Y, and X axes; the thickened base plate 11 on the main Y-axis adjustment mechanism 3 can enhance the load-bearing capacity, disperse the gravity load of the upper-level mechanisms such as the main X-axis adjustment mechanism 4 and the secondary X-axis adjustment mechanism 5, and prevent the base plate 11 from deforming; it realizes the assembly, maintenance, and replacement of each adjustment mechanism, reducing equipment maintenance costs; the thickened base plate 11 effectively reduces the risk of deformation under high loads and ensures the consistency of each adjustment mechanism when multiple axes are linked.

[0065] like Figures 3-5 As shown: The base plate 11 of the main X-axis adjustment mechanism 4 has an integrally formed reinforcing lug on its side, and bolt holes are provided on the reinforcing lug. It is connected to the slide table 16 of the main Y-axis adjustment mechanism 3 by bolts. The slide tables 16 on the detection platform 1, the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, the main X-axis adjustment mechanism 4 and the secondary Y-axis adjustment mechanism 6 are all straight plate structures. The slide tables 16 on the secondary X-axis adjustment mechanism 5 and the secondary Z-axis adjustment mechanism 7 are L-shaped structures to fit the installation space of the secondary adjustment mechanisms.

[0066] As can be seen from the above, the reinforcing lug of the main X-axis adjustment mechanism 4 increases the contact area between the base plate 11 and the slide table 16 of the main Y-axis adjustment mechanism 3, thereby improving the rigidity of the connection between the two and reducing displacement deviation caused by vibration during the detection process. The L-shaped slide table 16 of the secondary X-axis adjustment mechanism 5 provides a reasonable installation position for the secondary Y-axis adjustment mechanism 6 through its L-shaped structure, and the L-shaped slide table 16 of the secondary Z-axis adjustment mechanism 7 provides a reasonable installation position for the inner probe fixing clamp 8 and the inner probe 9, so that the movement range of the secondary Y-axis adjustment mechanism 6 and the secondary Z-axis adjustment mechanism 7 covers more specifications of stepped holes, further improving the overall versatility.

[0067] like Figure 3 As shown: the inner probe fixing clamp 8 on the main X-axis adjustment mechanism 4 is installed on the surface of the slide table 16 of the main X-axis adjustment mechanism 4 through the T-block 10, and the T-block 10 is locked in the slide table 16 of the main X-axis adjustment mechanism 4 by bolts; the inner probe fixing clamp 8 on the secondary Z-axis adjustment mechanism 7 is directly fixed to the side of the L-shaped slide table 16 of the secondary Z-axis adjustment mechanism 7 by bolts.

[0068] As can be seen from the above, the T-block 10 is fixed to the slide 16 on the main X-axis adjustment mechanism 4 by bolts, so as to realize the position adjustment of the inner probe fixing clamp 8 along the X-axis direction, and then adjust the position of the inner probe 9 to adapt to the step hole detection of different hole positions; the side of the L-shaped slide 16 on the secondary Z-axis adjustment mechanism 7 is fixed with the inner probe fixing clamp 8 and the inner probe 9 by bolts, so as to ensure the installation accuracy of the inner probe 9.

[0069] like Figures 1-3 and Figure 6As shown: The inner probe fixing clamp 8 has a T-shaped structure. The main body of the inner probe fixing clamp 8 has an open through hole 81. The inner diameter of the through hole 81 is adapted to the outer diameter of the fixing sleeve 903 of the inner probe 9. A fixing bolt is threaded through the opening. After the inner probe 9 is sleeved inside the through hole 81, it is clamped and fixed by tightening the fixing bolt.

[0070] As can be seen from the above, the open-type through hole 81, through the principle of elastic deformation, shrinks when the fixing bolt is tightened, forming a clamp on the fixing sleeve 903 of the inner probe 9, thus realizing the clamping and disassembly of the inner probe 9; the T-shaped structure reinforces the inner probe fixing clamp 8 to provide the bolt installation position, ensuring the installation of the inner probe fixing clamp 8.

[0071] like Figures 1-3 and Figure 7 As shown: The inner probe 9 includes a probe 901, a bevel gear 902, a fixed sleeve 903, a micrometer screw 904, a micrometer cylinder 905, an adjusting nut 906, a connector 907, a washer 908, and a rotating head 909. The micrometer screw 904 is inserted into the fixed sleeve 903. One end of the micrometer screw 904 is connected to the probe 901, and the other end of the micrometer screw 904 passes through the micrometer cylinder 905, the connector 907, and the washer 908 in sequence. The rotating head 909 is installed at the end of the micrometer screw 904, and an elastic sensor is provided between the micrometer screw 904 and the rotating head 909. The bevel gear 902 is connected to the micrometer screw 904 to transmit motion. The adjusting nut 906 is assembled at the corresponding position of the fixed sleeve 903. A small motor is connected to the tail of the rotating head 909, and the small motor is electrically connected to the detection platform 1.

[0072] As described above, based on the combined principles of three-point contact, helical transmission, and scale magnification, when the small motor drives the rotating head 909, the rotational motion is transmitted to the micrometer cylinder 905 through the connector 907. Simultaneously, the linear motion of the micrometer screw 904 drives the bevel gear 902, causing the probe 901 to extend and retract along the axis of the fixed sleeve 903. The probe 901, with its three-point structure, forms a stable three-point positioning when in contact with the inner wall of the stepped hole, ensuring the accuracy of the measurement reference. The micrometer cylinder 905 employs a scale magnification design, converting the minute linear displacement of the micrometer screw 904 into a clear scale reading. The adjusting nut 906 can adjust the transmission clearance of the micrometer screw 904, ensuring transmission accuracy. When the elastic sensor between the micrometer screw 904 and the rotating head 909 has not reached the set value, the probe 901 continues to move. When the set value of the elastic sensor is reached, the small motor stops rotating, and the rotating head 909 also stops rotating, recording the measurement value and transmitting it to the control system of the detection platform 1, completing the diameter measurement of a stepped hole.

[0073] The detection platform 1 is equipped with a motion switch and a alignment switch, and both the motion switch and the alignment switch are electrically connected to the control system inside the detection platform 1.

[0074] Example 2

[0075] This embodiment provides a stepped hole spacing and diameter detection method, which, as shown in Embodiment 1, includes the following steps:

[0076] Step 1: Import the 3D model of the workpiece to be tested into the computer system of the testing instrument via digital communication means such as USB flash drive or network, and the control system automatically analyzes the 3D model data of the workpiece to be tested.

[0077] Step 2: By activating the motion switch in the control system of the detection platform 1, manipulate the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, and the main X-axis adjustment mechanism 4 to move or link together, so that they return to the machine zero position respectively; manipulate the secondary X-axis adjustment mechanism 5, the secondary Y-axis adjustment mechanism 6, and the secondary Z-axis adjustment mechanism 7 to move or link together, so that they return to the machine zero position respectively.

[0078] Step 3: Fix the workpiece with the stepped hole to be tested in the preset position of the testing platform 1;

[0079] Step 4: By activating the alignment switch in the control system of the detection platform 1, the control system automatically completes the alignment and positioning of the typical features of the workpiece based on the three-dimensional model data of the workpiece to be tested and the clamping position of the workpiece, and records the current coordinate position of the two internal test heads 9.

[0080] Step 5: The control system of the detection platform 1 controls the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, and the main X-axis adjustment mechanism 4 to move respectively, so that the inner probe 9 on the main X-axis adjustment mechanism 4 extends into the first test hole of the stepped hole. By rotating the rotating head 909 of the inner probe 9, the probe 901 is driven to fit against the inner wall of the first test hole based on the three-point contact principle, thus completing the positioning and collecting the hole diameter data of the first test hole. When the probe 901 of the inner probe 9 fits against the inner wall of the first test hole, the actual hole diameter value of the first test hole is read through the scale of the micrometer 905 and compared with the preset standard value to obtain the hole diameter error of the first test hole.

[0081] Step 6: Control the secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6, and secondary Z-axis adjustment mechanism 7 to move respectively, so that the inner probe 9 on the secondary Z-axis adjustment mechanism 7 extends into the second test hole of the stepped hole. By rotating the rotating head 909 of the inner probe 9, the probe 901 is driven to fit against the inner wall of the second test hole based on the three-point contact principle, thus completing the positioning of the second test hole and collecting its hole diameter data. When the probe 901 of the inner probe 9 fits against the inner wall of the second test hole, the actual hole diameter value of the second test hole is read through the scale of the micrometer 905 and compared with the preset standard value to obtain the hole diameter error of the second test hole.

[0082] Step 7: Calculate the relative distance between the first and second test holes in the X, Y, and Z directions using displacement feedback data, and combine this with the hole diameter data to complete the comprehensive detection of the hole spacing and hole diameter of the stepped holes;

[0083] The hole distance is calculated as follows: with the machine zero position as the reference origin of the XYZ coordinate axis, record the coordinate values ​​of the main Z-axis adjustment mechanism 2, main Y-axis adjustment mechanism 3, and main X-axis adjustment mechanism 4 when the probe 901 of the inner probe 9 is in contact with the inner wall of the first hole to be tested. Then, record the coordinate values ​​of the secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6, and secondary Z-axis adjustment mechanism 7 when the probe 901 of the inner probe 9 is in contact with the inner wall of the second hole to be tested. Calculate the three-dimensional hole distance between the two holes to be tested using the spatial distance formula.

[0084] With the geometric center of the detection platform 1 as the reference origin, the coordinate values ​​X1, Y1, Z1 of the main X-axis adjustment mechanism 4 slide 16 in the X, Y, and Z directions and the coordinate values ​​X2, Y2, Z2 of the secondary Z-axis adjustment mechanism 7 slide 16 in the X, Y, and Z directions are recorded respectively. The three-dimensional hole distance between the two holes to be measured is calculated by using the spatial distance formula L=√[(X2-X1)²+(Y2-Y1)²+(Z2-Z1)²].

[0085] Step 8: Record the measured data of the hole spacing and hole diameter of the stepped holes;

[0086] Step 9: Repeat steps 3-8 to perform a comprehensive inspection of the hole spacing and diameter of the next workpiece. By repeating this process, the comprehensive inspection of the hole spacing and diameter of stepped holes in a batch of workpieces can be completed quickly.

[0087] As can be seen from the above, the positioning and aperture acquisition of the first test hole are achieved through the coordinated movement of the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, and the main X-axis adjustment mechanism 4, with the detection platform 1 as the reference. The positioning and aperture acquisition of the second test hole are achieved through the coordinated movement of the secondary X-axis adjustment mechanism 5, the secondary Y-axis adjustment mechanism 6, and the secondary Z-axis adjustment mechanism 7. The three-dimensional hole distance between the two holes is calculated using the coordinate measurement principle, thus realizing the detection of positioning, acquisition, and calculation.

[0088] Based on Embodiments 1 and 2, the overall working principle of this application is as follows: Figure 1-7 As shown:

[0089] During testing, the workpiece to be tested is first fixed at a preset position on the testing platform 1. The control system drives the main Z-axis adjustment mechanism 2, the main Y-axis adjustment mechanism 3, and the main X-axis adjustment mechanism 4 to move in tandem, so that the inner probe 9 on the main X-axis adjustment mechanism 4 extends into the first hole to be tested. The rotating head 909 of the inner probe 9 is rotated and transmitted to the bevel gear 902 through the connector 907 and the micrometer cylinder 905. The bevel gear 902 drives the micrometer screw 904 to move linearly, so that the probe 901 fits against the hole wall based on the three-point contact principle, completes the positioning, and obtains relevant hole diameter information through the micrometer cylinder 905. The adjusting nut 906 can compensate for the transmission gap to ensure accuracy.

[0090] The secondary X-axis adjustment mechanism 5, secondary Y-axis adjustment mechanism 6, and secondary Z-axis adjustment mechanism 7 are synchronously driven to move in coordination, causing the inner probe 9 on the secondary Z-axis adjustment mechanism 7 to extend into the second hole to be tested, repeating the above positioning and hole diameter information acquisition operations. Finally, displacement data is fed back through the displacement sensors of each adjustment mechanism. With the geometric center of the detection platform 1 as the reference origin, the three-dimensional coordinates of the slide 16 of the main X-axis adjustment mechanism 4 and the slide 16 of the secondary Z-axis adjustment mechanism 7 are recorded. The distance between the two holes is calculated using the spatial distance formula, and the comprehensive detection is completed by combining the hole diameter information of the two holes.

[0091] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0092] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A comprehensive testing instrument for stepped holes, comprising a testing platform (1), characterized in that, Also includes; The main Z-axis adjustment mechanism (2) is installed on the top side of the detection platform (1) along the Z-axis direction and can move linearly along the Z-axis direction of the detection platform (1). The main Y-axis adjustment mechanism (3) is installed on top of the main Z-axis adjustment mechanism (2) along the Y-axis direction of the detection platform (1) and can move linearly along the Y-axis direction of the detection platform (1). The main X-axis adjustment mechanism (4) is installed on the side of the main Y-axis adjustment mechanism (3) along the X-axis direction of the detection platform (1) and can move linearly along the X-axis direction of the detection platform (1). The secondary X-axis adjustment mechanism (5) is installed on the side of the main X-axis adjustment mechanism (4) along the X-axis direction of the detection platform (1) and can move linearly along the X-axis direction of the detection platform (1). The secondary Y-axis adjustment mechanism (6) is installed on the side of the secondary X-axis adjustment mechanism (5) along the Y-axis direction of the detection platform (1), and can move linearly along the Y-axis direction of the detection platform (1). The secondary Z-axis adjustment mechanism (7) is installed on the side of the secondary Y-axis adjustment mechanism (6) along the Z-axis direction of the detection platform (1), and can move linearly along the Z-axis direction of the detection platform (1). The detection device includes a first internal probe (9) fixed in the internal probe fixing fixture (8) on the main X-axis adjustment mechanism (4) and a second internal probe (9) fixed in the internal probe fixing fixture (8) on the secondary Z-axis adjustment mechanism (7), used to synchronously collect the hole diameter and hole spacing data of the stepped hole. The internal probe (9) includes a probe (901), a bevel gear (902), a fixing sleeve (903), a micrometer screw (904), a micrometer cylinder (905), an adjusting nut (906), a connector (907), a washer (908), and a rotating head (909). The micrometer screw (904) is inserted into the fixed sleeve (903). One end of the micrometer screw (904) is connected to the probe (901), and the other end of the micrometer screw (904) passes through the differential cylinder (905), the connector (907), and the washer (908) in sequence. A rotating head (909) is installed at the end of the micrometer screw (904). An elastic sensor is provided between the micrometer screw (904) and the rotating head (909). The elastic sensor is electrically connected to the detection platform (1). The bevel gear The wheel (902) is connected to the micrometer screw (904) to transmit motion. The adjusting nut (906) is assembled at the corresponding position of the fixed sleeve (903). The tail end of the rotating head (909) is connected to a small motor. The small motor is electrically connected to the detection platform (1). The rotating head (909) is driven to rotate by the motor, and the bevel gear (902) drives the micrometer screw (904) to move linearly. This allows the probe (901) to measure and accurately position the diameter of the stepped hole based on the three-point contact principle.

2. The comprehensive testing instrument for stepped holes according to claim 1, characterized in that: The main Z-axis adjustment mechanism (2), main Y-axis adjustment mechanism (3), main X-axis adjustment mechanism (4), secondary X-axis adjustment mechanism (5), secondary Y-axis adjustment mechanism (6) and secondary Z-axis adjustment mechanism (7) each include a base plate (11) and a motor (12) fixed to the side of the base plate (11). Two bearing supports (13) are symmetrically installed on the top of the base plate (11). A lead screw (14) is installed between the two bearing supports (13) through a bearing end cover and a rolling bearing. A slider (15) is threaded onto the lead screw (14). The top of the slider (15) is fixed with a slide table (16). The output shaft of the motor (12) is connected to the lead screw (14) on the bearing support (13) via a coupling (18). The top two sides of the base plate (11) are fixed with guide rails (17), and the slide table (16) can slide along the guide rails (17). The two ends of the guide rails (17) are fixed with limit blocks (19) for limiting the sliding stroke of the slide table (16). The guide rails (17) are also equipped with displacement sensors, and the displacement sensor detection platform (1) is electrically connected.

3. The comprehensive testing instrument for stepped holes according to claim 2, characterized in that: The base plate (11) on the main Y-axis adjustment mechanism (3) is a thickened structure, and the base plate (11) on the main Y-axis adjustment mechanism (3) is fixed to the slide table (16) on the main Z-axis adjustment mechanism (2) by bolts. The base plate (11) on the main X-axis adjustment mechanism (4) is fixed to the slide table (16) on the main Y-axis adjustment mechanism (3) by bolts. The base plate (11) on the secondary X-axis adjustment mechanism (5) is fixed to the slide table (16) on the main X-axis adjustment mechanism (4) by bolts. The base plate (11) on the secondary Y-axis adjustment mechanism (6) is fixed to the slide table (16) on the secondary X-axis adjustment mechanism (5) by bolts. The base plate (11) on the secondary Z-axis adjustment mechanism (7) is fixed to the slide table (16) on the secondary Y-axis adjustment mechanism (6) by bolts.

4. The comprehensive testing instrument for stepped holes according to claim 3, characterized in that: The side of the base plate (11) on the main X-axis adjustment mechanism (4) is integrally formed with a reinforcing ear, and the reinforcing ear is connected to the slide (16) on the main Y-axis adjustment mechanism (3) by bolts. The slide (16) on the detection platform (1), the main Z-axis adjustment mechanism (2), the main Y-axis adjustment mechanism (3), the main X-axis adjustment mechanism (4) and the secondary Y-axis adjustment mechanism (6) are all straight plate structures, and the slide (16) on the secondary X-axis adjustment mechanism (5) and the secondary Z-axis adjustment mechanism (7) are L-shaped structures.

5. The comprehensive testing instrument for stepped holes according to claim 1, characterized in that: The inner probe fixing clamp (8) on the main X-axis adjustment mechanism (4) is installed on the surface of the upper slide (16) of the main X-axis adjustment mechanism (4) via a T-block (10), and the inner probe fixing clamp (8) on the secondary Z-axis adjustment mechanism (7) is fixed to the side of the upper slide (16) of the secondary Z-axis adjustment mechanism (7).

6. The comprehensive testing instrument for stepped holes according to claim 5, characterized in that: The inner probe fixing clamp (8) has a T-shaped structure, and the inner probe fixing clamp (8) has a through hole (81) with an opening. A fixing bolt is threaded through the opening, and the inner probe (9) is sleeved inside the through hole (81).

7. A method for detecting stepped hole spacing and diameter based on the integrated testing instrument described in any one of claims 1-6, characterized in that, Includes the following steps: S1. Import the three-dimensional digital model of the workpiece to be tested into the computer system of the testing instrument through digital communication means such as USB flash drive or network, and the control system automatically analyzes the three-dimensional model data of the workpiece to be tested. S2. By starting the motion switch in the control system of the detection platform 1, manipulate the main Z-axis adjustment mechanism (2), the main Y-axis adjustment mechanism (3), and the main X-axis adjustment mechanism (4) to move or link together, so that they return to the machine zero position respectively; manipulate the secondary X-axis adjustment mechanism (5), the secondary Y-axis adjustment mechanism (6), and the secondary Z-axis adjustment mechanism (7) to move or link together, so that they return to the machine zero position respectively. S3. Fix the stepped hole workpiece to be tested at the preset position of the testing platform (1); S4. By activating the alignment switch in the control system of the detection platform 1, the control system automatically completes the alignment and positioning of the typical features of the workpiece to be tested based on the three-dimensional model data of the workpiece to be tested and the clamping position of the workpiece, and records the current coordinate position of the two inner test heads (9). S5. The control system of the detection platform (1) controls the main Z-axis adjustment mechanism (2), the main Y-axis adjustment mechanism (3), and the main X-axis adjustment mechanism (4) to move respectively, so that the inner probe (9) on the main X-axis adjustment mechanism (4) extends into the first test hole of the stepped hole. By rotating the rotating head (909) of the inner probe (9), the probe (901) is driven to fit against the inner wall of the first test hole based on the three-point contact principle, thus completing the positioning and collecting the hole diameter data of the first test hole. When the probe (901) of the inner probe (9) fits against the inner wall of the first test hole, the actual hole diameter value of the first test hole is read through the scale of the micrometer cylinder (905), and compared with the preset standard value to obtain the hole diameter error of the first test hole. S6. Control the secondary X-axis adjustment mechanism (5), secondary Y-axis adjustment mechanism (6), and secondary Z-axis adjustment mechanism (7) to move respectively, so that the inner probe (9) on the secondary Z-axis adjustment mechanism (7) extends into the second test hole of the stepped hole. By rotating the rotating head (909) of the inner probe (9), the probe (901) is driven to fit against the inner wall of the second test hole based on the three-point contact principle, thereby completing the positioning of the second test hole and collecting its hole diameter data. When the probe (901) of the inner probe (9) fits against the inner wall of the second test hole, the actual hole diameter value of the second test hole is read through the scale of the micrometer cylinder (905) and compared with the preset standard value to obtain the hole diameter error of the second test hole. S7. Using displacement feedback data, calculate the relative distance between the first and second test holes in the X, Y, and Z directions, and combine the hole diameter data to complete the comprehensive detection of the hole spacing and hole diameter of the stepped hole. The hole distance is calculated as follows: with the zero position of the machine as the reference origin of the XYZ coordinate axis, record the coordinate values ​​of the main Z-direction adjustment mechanism (2), main Y-direction adjustment mechanism (3), and main X-direction adjustment mechanism (4) when the probe (901) of the inner probe (9) is in contact with the inner wall of the first hole to be tested. Then, record the coordinate values ​​of the secondary X-direction adjustment mechanism (5), secondary Y-direction adjustment mechanism (6), and secondary Z-direction adjustment mechanism (7) when the probe (901) of the inner probe (9) is in contact with the inner wall of the second hole to be tested. Calculate the three-dimensional hole distance between the two holes to be tested using the spatial distance formula. S8. Record the measured data of the hole spacing and hole diameter of the stepped holes. S9. Repeat S3-S8 to perform a comprehensive inspection of the hole spacing and diameter of the next workpiece. By repeating this process, the comprehensive inspection of the hole spacing and diameter of stepped holes in a batch of workpieces can be completed quickly.

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