Impedance detection method and related equipment thereof

Abstract

The invention provides an impedance detection method and related equipment thereof, and the method comprises the steps: determining the test data of a target test point, the test data comprising test point data and a signal transmission direction; performing a forward test based on the test point data and the signal transmission direction to obtain a forward TDR test curve; performing a reverse test based on the test point data and the signal transmission direction to obtain a reverse TDR test curve; and based on the forward TDR test curve and the reverse TDR test curve, performing impedance complementary speculation on the target test point, and determining impedance data of the target test point. By distinguishing and complementarily extracting abnormal impedance sections generated in the forward test process and the reverse test process, the accuracy of impedance judgment is improved, and the impedance distortion misjudgment condition caused by the one-way TDR test can be avoided.

Description

Technical Field

[0001] This invention relates to the field of link impedance testing, and more particularly to an impedance detection method, apparatus, system, electronic device and its storage medium. Background Technology

[0002] In multi-segment electrical connection structures such as rigid-flex PCBs, flexible circuit boards, and high-speed differential signal transmission lines, link impedance is typically used as a crucial parameter for evaluating signal integrity. A common impedance testing method involves injecting a test signal at a designated test point using Time Domain Reflectometry (TDR) and determining whether the target link meets the design impedance requirements based on the echo reflection curve. Because rigid-flex PCBs contain various structural features such as connector ends, flexible segments, via solder joints, and chip pads, the local impedance state near different test points can be affected by solder interfaces, structural changes, and probe access. Therefore, accurately identifying link impedance using TDR curves is a critical step in verifying this type of PCB.

[0003] Existing impedance detection methods typically rely solely on unidirectional TDR testing to determine the impedance value of the target test point. However, during testing, the contact between the test probe and the test point can create localized distortion regions, leading to abnormal waveforms or abrupt changes on the TDR curve, further distorting the impedance data for the corresponding segment. Furthermore, when the circuit board's endpoint structure is asymmetrical, the curve obtained from a single test direction cannot cover the true impedance changes of the entire link, thus affecting the accuracy of the impedance determination. Current technologies lack mechanisms for identifying abnormal segments and performing complementary data inference from both forward and reverse test results, failing to effectively eliminate errors caused by probe contact positions and making it difficult to avoid impedance misjudgments due to unidirectional inaccuracies.

[0004] Therefore, existing impedance detection methods suffer from the problem of data error, which is unable to eliminate abnormal impedance segments caused by probe contact or link structure asymmetry in unidirectional TDR testing, making it difficult to accurately determine the true impedance of the target test point. Summary of the Invention

[0005] This invention provides an impedance detection method to solve the data error problem of existing impedance detection methods, which cannot eliminate abnormal impedance segments caused by probe contact or link structure asymmetry in unidirectional TDR testing, thus making it difficult to accurately determine the true impedance of the target test point.

[0006] In a first aspect, the present invention provides an impedance detection method, the method comprising the following steps: Determine the test data for the target test point, the test data including test point location data and signal transmission direction; Based on the test point data and signal transmission direction, a forward test is performed to obtain the forward TDR test curve; Based on the test point data and signal transmission direction, a reverse test is performed to obtain the reverse TDR test curve. Based on the forward TDR test curve and the reverse TDR test curve, impedance complementarity estimation is performed on the target test point to determine the impedance data of the target test point.

[0007] Optionally, the test data for determining the target test point includes: Obtain the design parameters of the target circuit board, including link structure information, signal routing locations, and impedance design requirements; Based on the link structure information, signal routing location, and impedance design requirements, determine the test point data of the target test point and the endpoint position relationship of the target test point in the link structure information; The signal transmission direction is determined based on the positional relationship of the endpoints.

[0008] Optionally, the step of performing a forward test based on the test point data and the signal transmission direction to obtain a forward TDR test curve includes: Based on the signal transmission direction, determine the test start point and test end point of the target test point; The TDR test probe is brought into contact with the test start point and the test end point, and the test start point is used as the TDR signal injection end. The test signal is transmitted to the target test link along the signal transmission direction, the reflected signal returned along the link is collected, and the positive TDR test curve is obtained. Based on the positive TDR test curve, the positive unknown abnormal data is determined. The positive unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during the positive test.

[0009] Optionally, the step of performing a reverse test based on the test point data and the signal transmission direction to obtain a reverse TDR test curve includes: Based on the reverse direction of the signal transmission, the test start point and test end point of the target test point are determined in the reverse test; The TDR test probe is brought into contact with the test starting point, and the test starting point is used as the TDR signal injection end. The test signal is transmitted to the target test link in the reverse direction of the signal transmission direction, and the reflected signal returned along the link is collected to obtain the reverse TDR test curve. Based on the reverse TDR test curve, the reverse unknown abnormal data is determined. The reverse unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during the reverse test.

[0010] Optionally, the step of performing impedance complementarity estimation on the target test point based on the forward TDR test curve and the reverse TDR test curve to determine the impedance data of the target test point includes: Obtain unknown abnormal data from the forward TDR test curve and the reverse TDR test curve; Identify the link segments in the forward unknown anomaly data, and determine the forward impedance data based on the corresponding link segments; Identify the link segments in the reverse unknown anomaly data, and determine the reverse impedance data based on the corresponding link segments; Based on the forward and reverse impedance data, complementary extraction processing is performed to determine the impedance data at the target test point.

[0011] Optionally, the step of performing complementary extraction processing based on the forward impedance data and reverse impedance data to determine the impedance data at the target test point includes: For the link segment corresponding to the forward unknown abnormal data, the impedance data at the corresponding position is extracted from the reverse impedance data as the first impedance determination data for that segment. For the link segment corresponding to the reverse unknown abnormal data, the impedance data at the corresponding position is extracted from the forward impedance data as the second impedance determination data for that segment. Based on the first impedance determination data and the second impedance determination data, complementary extraction processing is performed to determine the impedance data at the target test point.

[0012] Secondly, the present invention also provides an impedance detection device, the impedance detection device comprising: The first determining module is used to determine the test data of the target test point, the test data including test point location data and signal transmission direction; The forward test module is used to perform forward testing based on the test point data and the signal transmission direction to obtain the forward TDR test curve; The reverse testing module is used to perform reverse testing based on the test point data and the signal transmission direction to obtain the reverse TDR test curve. The complementary module is used to perform impedance complementarity estimation on the target test point based on the forward TDR test curve and the reverse TDR test curve, and to determine the impedance data of the target test point.

[0013] Thirdly, embodiments of the present invention provide an impedance detection system, the impedance detection system comprising: an impedance detection device, a server, and physical equipment.

[0014] Fourthly, the present invention provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps in the impedance detection method provided by the present invention.

[0015] Fifthly, the present invention provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps in the impedance detection method provided by the invention.

[0016] This invention determines the test data of a target test point, including test point location data and signal transmission direction. Based on the test point location data and signal transmission direction, a forward test is performed to obtain a forward TDR test curve. Based on the test point location data and signal transmission direction, a reverse test is performed to obtain a reverse TDR test curve. Based on the forward and reverse TDR test curves, impedance complementarity estimation is performed on the target test point to determine its impedance data. By distinguishing and complementaryly extracting abnormal impedance segments generated during the forward and reverse tests, the accuracy of impedance determination is improved, avoiding misjudgments due to impedance distortion caused by unidirectional TDR testing. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is an architecture diagram of an impedance detection system provided in an embodiment of the present invention; Figure 2 This is a flowchart of an impedance detection method provided in an embodiment of the present invention; Figure 3 This is a comparison chart of forward and reverse test results provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of another impedance detection device provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] like Figure 1 As shown, Figure 1 This is an architectural diagram of an impedance detection system 100 provided in an embodiment of the present invention. The impedance detection system includes an impedance detection device 300, a server 101, and a physical device 102. The impedance detection device 300 further includes a first determining module, which can be used to determine the test data of a target test point, the test data including test point location data and signal transmission direction; a forward testing module, which can be used to perform forward testing based on the test point location data and signal transmission direction to obtain a forward TDR test curve; a reverse testing module, which can be used to perform reverse testing based on the test point location data and signal transmission direction to obtain a reverse TDR test curve; and a complementary module, which can be used to perform impedance complementarity estimation of the target test point based on the forward and reverse TDR test curves to determine the impedance data of the target test point.

[0021] Specifically, before performing impedance testing, the aforementioned impedance testing system can first perform structural analysis on the target signal link in the rigid-flex circuit board, including the link start end, end end, trace area, flexible connection section, connector soldering position, chip pad position, and via position, etc.

[0022] More specifically, the impedance detection system described above can identify key points that directly characterize the true impedance state of the signal link based on link structure information and set them as target test points. For example, in the signal link between the connector and the chip, the connector end and the chip pad (or the via location after ink removal) are selected as target test points for subsequent forward and reverse testing.

[0023] The aforementioned target test points can be data acquisition locations within the signal link used for TDR testing. It's understood that the TDR characteristic waveforms generated by these target test points can be directly used to determine whether the impedance at the corresponding point meets design requirements. Generally, these target test points can be set at both ends of the link, such as the connector end and the chip end. This is because these two points correspond to the input and termination ends of the signal link, respectively, and can more completely reflect the impedance change pattern of the signal throughout the entire link transmission process.

[0024] In rigid-flex PCB structures, the connector end is typically composed of a rigid board, while the chip end may be located at the site of a rigid-flex via. Removing the solder mask layer improves the contact reliability of the test probes. In this embodiment, the impedance detection system described above can set the connector end and the via pad end as target test points.

[0025] The aforementioned test data may refer to key parameters predetermined for performing forward and reverse testing, including but not limited to test point location data of the target test point and signal transmission direction. It is understood that this test data can serve as positioning information and navigation for subsequent testing procedures.

[0026] In this embodiment, the test data can also be data content composed of the physical location of the target test point (such as the point number, test terminal coordinates, etc.) and the forward or reverse signal transmission direction.

[0027] The aforementioned test point data can refer to the pin number, chip pad number, via coordinate number, and other location information used to identify the specific test probe contact position. This information can generally be obtained during the circuit board design stage through structural diagrams, net lists, PCB wiring diagrams, etc.

[0028] The aforementioned signal transmission direction can be determined based on the positional relationship between the endpoints of the target test points. Specifically, it can be determined based on the positional relationship of the endpoints of the target test points in the signal link structure. That is, the target test point used for the first TDR test is taken as the signal injection starting point, and another target test point is taken as the signal propagation ending point, thus forming a signal transmission direction from the starting point to the ending point; the reverse test establishes a transmission path in the opposite direction. This direction is not based on the actual logical data flow during circuit operation, but is dynamically selected according to test requirements, link endpoint structural characteristics, and probe accessibility. It serves as a directional reference to distinguish between forward and reverse tests, thereby ensuring that the same link can be compared and analyzed and supplemented under different test directions to obtain true impedance data without the influence of probe contact.

[0029] In one possible embodiment, the impedance detection system described above transmits a TDR test signal from the starting test position to the ending position based on the signal transmission direction, thereby realizing the forward testing process. Specifically, the TDR probe can be brought into contact with the connector end, and test pulses can be sent along the signal link towards the chip end to collect changes in the reflected signal and generate a forward TDR test curve.

[0030] It is understandable that near the connector end, the probe contact will create a sharp impedance disturbance, so the forward test curve may show abnormal abrupt waveforms near the starting point, i.e., unknown abnormal data in the forward direction.

[0031] The aforementioned forward TDR test curve can be a waveform diagram formed by acquiring reflected signals during forward testing. It is used to record the impedance distribution changes along the link direction and is usually a combination of waveform rising, falling and abrupt change regions.

[0032] In another possible embodiment, the impedance detection system described above performs TDR detection from the opposite direction to the forward test, thereby realizing the reverse test process. Specifically, the probe can be placed in contact with the ink removal area of ​​the via and a test pulse can be emitted along the link towards the connector end to collect the reflected signal and form a reverse TDR test curve.

[0033] The aforementioned reverse TDR test curve can be a waveform diagram constructed by the reflected signal propagating in the reverse direction of the link to record the data results of the reverse test. Generally, this curve corresponds to the forward curve. By distinguishing its abnormal abrupt change points, it can be determined whether there are data regions near the starting point of the reverse test that cannot be directly used for impedance determination, and provide a basis for subsequent complementary processing.

[0034] In another possible embodiment, after identifying abnormal segments in the forward and reverse test curves, the impedance detection system compensates for the abnormal segments by exchanging data between the corresponding link segments of the two curves: when an abnormality occurs in a segment of the forward curve near the target point, the normal impedance value at the corresponding position of the reverse curve can be used to replace the forward impedance judgment basis for that area; and when an abnormality occurs in a reverse curve near the target point, the impedance value at the corresponding position of the forward curve can be used to replace the reverse impedance judgment basis for that area.

[0035] By using segment mapping and data complementarity, complete impedance identification and judgment without dead zones can be achieved.

[0036] The impedance data of the target test points mentioned above can refer to the data obtained after complementary forward and reverse inference, and does not include abnormal segment data caused by probe contact or structural interference.

[0037] For example, when the impedance detection system described above judges the impedance of point 2, it will use the normal waveform segment data corresponding to the reverse TDR curve, instead of directly using the distorted segment at the beginning of the forward test curve.

[0038] By using the impedance data after complementary substitution, the impedance detection system can determine whether the target test point meets the 50Ω or other design impedance tolerance requirements, thereby accurately assessing the link quality.

[0039] By performing forward and reverse TDR tests at the target test point and then performing segment complementation and data substitution based on the identification results of abnormal segments in the two test curves, the system effectively eliminates test distortion data caused by probe contact, asymmetrical endpoint structure, or local impedance distortion. It obtains reliable impedance data at the target test point through mutual compensation between forward and reverse tests, significantly improving the accuracy and stability of impedance determination. This avoids impedance misjudgment caused by unidirectional TDR test errors, ensuring that the link quality test results of the hardware-software integrated circuit board have greater engineering credibility and design consistency.

[0040] like Figure 2 As shown, Figure 2 This is a flowchart of an impedance detection method provided by an embodiment of the present invention. The impedance detection method includes the following steps: 201. Determine the test data for the target test points.

[0041] In this embodiment of the invention, the impedance detection method described above can be applied to an impedance detection system. The impedance detection system has functions such as impedance detection data processing, impedance detection data transmission and reception, and impedance detection data memory storage. It can be built based on a server or server cluster. The server or server cluster can be an electronic device with impedance detection data processing capabilities.

[0042] The aforementioned target test points can be data acquisition locations within the signal link used for TDR testing. It's understood that the TDR characteristic waveforms generated by these target test points can be directly used to determine whether the impedance at the corresponding point meets design requirements. Generally, these target test points can be set at both ends of the link, such as the connector end and the chip end. This is because these two points correspond to the input and termination ends of the signal link, respectively, and can more completely reflect the impedance change pattern of the signal throughout the entire link transmission process.

[0043] In rigid-flex PCB structures, the connector end is typically composed of a rigid board, while the chip end may be located at the site of a rigid-flex via. Removing the solder mask layer improves the contact reliability of the test probes. In this embodiment, the impedance detection system described above can set the connector end and the via pad end as target test points.

[0044] The aforementioned test data may refer to key parameters predetermined for performing forward and reverse testing, including but not limited to test point location data of the target test point and signal transmission direction. It is understood that this test data can serve as positioning information and navigation for subsequent testing procedures.

[0045] In this embodiment, the test data can also be data content composed of the physical location of the target test point (such as the point number, test terminal coordinates, etc.) and the forward or reverse signal transmission direction.

[0046] The aforementioned test point data can refer to the pin number, chip pad number, via coordinate number, and other location information used to identify the specific test probe contact position. This information can generally be obtained during the circuit board design stage through structural diagrams, net lists, PCB wiring diagrams, etc.

[0047] The aforementioned signal transmission direction can be determined based on the positional relationship between the endpoints of the target test points. Specifically, it can be determined based on the positional relationship of the endpoints of the target test points in the signal link structure. That is, the target test point used for the first TDR test is taken as the signal injection starting point, and another target test point is taken as the signal propagation ending point, thus forming a signal transmission direction from the starting point to the ending point; the reverse test establishes a transmission path in the opposite direction. This direction is not based on the actual logical data flow during circuit operation, but is dynamically selected according to test requirements, link endpoint structural characteristics, and probe accessibility. It serves as a directional reference to distinguish between forward and reverse tests, thereby ensuring that the same link can be compared and analyzed and supplemented under different test directions to obtain true impedance data without the influence of probe contact.

[0048] 202. Based on the test point data and signal transmission direction, a forward test is performed to obtain the forward TDR test curve.

[0049] In this embodiment of the invention, the impedance detection system transmits a TDR test signal from the starting test position to the ending position based on the signal transmission direction, thereby realizing the forward testing process. Specifically, the TDR probe can be brought into contact with the connector end, and test pulses can be sent along the signal link towards the chip end to collect changes in the reflected signal and generate a forward TDR test curve.

[0050] It is understandable that near the connector end, the probe contact will create a sharp impedance disturbance, so the forward test curve may show abnormal abrupt waveforms near the starting point, i.e., unknown abnormal data in the forward direction.

[0051] The aforementioned forward TDR test curve can be a waveform diagram formed by acquiring reflected signals during forward testing. It is used to record the impedance distribution changes along the link direction and is usually a combination of waveform rising, falling and abrupt change regions.

[0052] 203. Based on the test point data and signal transmission direction, perform reverse testing to obtain the reverse TDR test curve.

[0053] In this embodiment of the invention, the impedance detection system performs TDR detection from the opposite direction to the forward test, thereby realizing the reverse test process. Specifically, the probe can be placed in contact with the ink removal area of ​​the via, and a test pulse can be emitted along the link towards the connector end to collect the reflected signal and form a reverse TDR test curve.

[0054] The aforementioned reverse TDR test curve can be a waveform diagram constructed by the reflected signal propagating in the reverse direction of the link to record the data results of the reverse test. Generally, this curve corresponds to the forward curve. By distinguishing its abnormal abrupt change points, it can be determined whether there are data regions near the starting point of the reverse test that cannot be directly used for impedance determination, and provide a basis for subsequent complementary processing.

[0055] 204. Based on the forward TDR test curve and the reverse TDR test curve, impedance complementarity is estimated for the target test point to determine the impedance data of the target test point.

[0056] In another possible embodiment of the present invention, after identifying abnormal segments in the forward and reverse test curves, the impedance detection system compensates for the abnormal segments by exchanging data of the corresponding link segments of the two curves: when an abnormality occurs in a segment of the forward curve near the target point, the normal impedance value of the corresponding position of the reverse curve can be used to replace the forward impedance judgment basis for that area; and when an abnormality occurs in a reverse curve near the target point, the impedance value of the corresponding position of the forward curve can be used to replace the reverse impedance judgment basis for that area.

[0057] By using segment mapping and data complementarity, complete impedance identification and judgment without dead zones can be achieved.

[0058] The impedance data of the target test points mentioned above can refer to the data obtained after complementary forward and reverse inference, and does not include abnormal segment data caused by probe contact or structural interference.

[0059] For example, when the impedance detection system described above judges the impedance of point 2, it will use the normal waveform segment data corresponding to the reverse TDR curve, instead of directly using the distorted segment at the beginning of the forward test curve.

[0060] By using the impedance data after complementary substitution, the impedance detection system can determine whether the target test point meets the 50Ω or other design impedance tolerance requirements, thereby accurately assessing the link quality.

[0061] In this embodiment of the invention, test data for the target test point is determined, including test point location data and signal transmission direction. A forward test is performed based on the test point location data and signal transmission direction to obtain a forward TDR test curve. A reverse test is performed based on the test point location data and signal transmission direction to obtain a reverse TDR test curve. Based on the forward and reverse TDR test curves, impedance complementarity estimation is performed on the target test point to determine its impedance data. By distinguishing and complementaryly extracting abnormal impedance segments generated during the forward and reverse tests, the accuracy of impedance determination is improved, avoiding misjudgments due to impedance distortion caused by unidirectional TDR testing.

[0062] Optionally, in the step of determining the test data of the target test point, the design parameters of the target circuit board can also be obtained, including link structure information, signal routing location, and impedance design requirements; based on the link structure information, signal routing location, and impedance design requirements, the test point location data of the target test point and the endpoint position relationship of the target test point in the link structure information are determined; based on the endpoint position relationship, the signal transmission direction is determined.

[0063] In this embodiment of the invention, the aforementioned design parameters refer to engineering information used to assist in determining the specific location of the target test point and the subsequent test direction, including wiring structure, endpoint connectivity, and design impedance specifications. These parameters can generally be obtained from circuit diagrams or engineering requirements. For example, the aforementioned design parameters may include network topology diagrams, PCB routing files (such as Gerber or ODB++ data), schematic connection relationships, and impedance design specifications (such as a target impedance of 50Ω ± 5Ω). By reading the design parameters, the impedance detection system can clearly identify the starting and ending points of the signal link, as well as key structures such as via shapes and hard / soft layer transition areas along the link, providing a valid basis for determining the target test point and setting the impedance detection direction.

[0064] The aforementioned link structure information can be the physical connection path of a signal from the start point to the end point on the circuit board, including connector pins, cross-sections from rigid board to flexible board, via pads, transition traces, and structural nodes such as terminal chip pads. For example, in a differential link between connector Pin2 and the via location on the chip side, the impedance detection system can identify the specific trace segments, via channels, and locations of rigid and flexible connection solder layers it traverses.

[0065] The aforementioned signal routing location can be information such as the trace coordinates, layer number, trace shape, trace length, and spacing between adjacent traces in the actual PCB layout. For example, the impedance detection system described above can analyze the trace transition structure between Layer 2 and Layer 4 through which the target signal passes and identify the return path characteristics of the trace near the connector.

[0066] The aforementioned impedance design requirements can be the impedance specifications for the corresponding signal link, such as controlling the impedance to be 50Ω or 90Ω, and its allowable error range. The impedance testing system uses this parameter to define the impedance judgment criteria, which is used to subsequently determine whether the test results meet the design values.

[0067] In one possible embodiment, the impedance detection system can identify the physical location of the target test point in the link structure, and is used to identify the signal injection end and signal receiving end of the link.

[0068] For example, the impedance detection system identifies the connector end as the starting position of the link based on the link structure information, takes the corresponding test pad or connector pin as the "first endpoint", and identifies the chip pad or via pad as the ending position of the link, defining it as the "second endpoint".

[0069] This endpoint location information is not only used for test point identification, but also determines the basis for switching between forward and reverse testing directions.

[0070] More specifically, the impedance detection system described above analyzes the structural hierarchy of the target test point based on the link structure information, and determines the spatial position relationship, wiring connectivity, and signal propagation path between the two test points as the endpoint position relationship.

[0071] For example, when the system determines that there is a direct signal connection between connector point 2 and chip-side via point 6, point 2 is regarded as the starting point of the signal link and point 6 is regarded as the ending point of the link, thereby constructing the first endpoint position relationship.

[0072] The positional relationship of these endpoints can indicate the link structure that the signal propagation path actually crosses, including characteristic paths such as welded vias and soft / hard transition sections, providing a technical basis for establishing the subsequent signal transmission direction.

[0073] Understandably, after obtaining the positional relationship between the endpoints at both ends of the link, the above system determines the signal transmission direction based on test requirements, the order of test points selected manually, and the feasibility of probe contact.

[0074] For example, when the system uses the connector end as the probe contact point for the first TDR test, the system sets that point as the signal injection start point and sets the via position on the chip side as the signal propagation end point, thus forming a positive signal transmission direction extending from the connector end to the chip end. When the via end is used as the probe contact point for testing, it constitutes a reverse signal transmission direction, that is, from the via end to the connector end.

[0075] The signal transmission direction serves as a benchmark for distinguishing between forward and reverse testing, providing a directional basis for mapping corresponding segments of the two TDR test curves, identifying abnormal segments, and extracting complementary impedance data. In other words, the signal transmission direction is not the actual flow of circuit logic data, but rather a manually set test path used to eliminate probe contact errors and form bidirectional complementary test logic.

[0076] Optionally, the step of obtaining a forward TDR test curve by performing forward testing based on test point data and signal transmission direction further includes determining the test start point and test end point of the target test point based on the signal transmission direction; contacting the TDR test probe with the test start point and test end point, and using the test start point as the TDR signal injection end, transmitting a test signal along the signal transmission direction to the target test link, collecting the reflected signal returned along the link and obtaining the forward TDR test curve; and determining forward unknown abnormal data based on the forward TDR test curve, including abnormal waveform data and abnormal sudden TDR data during forward testing.

[0077] In this embodiment of the invention, the aforementioned test starting point can refer to the target test point selected by the impedance detection system as the TDR signal injection reference point during the execution of a forward TDR test. This point is used to place the test probe and transmit an excitation signal to the signal link. In this embodiment, the impedance detection system determines the test point corresponding to the connector end as the test starting point based on the signal transmission direction. That is, the impedance detection system contacts the test probe at this point as the initial trigger position for the test signal, used to generate and inject a TDR pulse signal.

[0078] The aforementioned test endpoint can refer to the other endpoint reached by the test signal propagation in the signal transmission direction, serving as the signal termination reference point for the forward test link. After establishing the test direction based on the endpoint relationship, the impedance detection system sets another target test point corresponding to the test start point as the test endpoint. For example, the connector can be used as the start point, and the chip pad or the via point exposed after ink removal can be used as the endpoint. In the forward test, the test signal propagates from the test start point to the test endpoint, and the link impedance state is determined by the change in the reflected signal.

[0079] The aforementioned TDR test probe can be a specialized test tool used to make electrical contact with the target test point, input test signals, and acquire changes in the reflected waveform.

[0080] The aforementioned TDR signal injection point can be the location of the test start point, and is set by the impedance detection system as the source point for transmitting pulse test signals to the signal link. In this embodiment, during forward testing, the target test point on the connector side is set as the signal injection point. The impedance detection system injects a rapidly rising TDR test pulse signal at this point, causing the signal to propagate along the link direction and form a reflection curve corresponding to the change in link impedance.

[0081] The aforementioned target test link can refer to the signal propagation path defined in the test direction, connecting the test start and end points, and encompassing the structural areas traversed by the signal propagation on the actual circuit board. For example, this link includes physical structures such as rigid connector pads, hard and soft connection sections, via channels, and chip pad soldering areas. The impedance detection system determines the routing range of this link based on the circuit board design data and uses this link as the source for calculating the test curve, enabling the TDR curve waveform to reflect the impedance change state of the link segment by segment.

[0082] The aforementioned test signal can refer to a pulsed electrical signal generated by a TDR test device, which has a fast rising edge and is used to excite the target link. During signal propagation, a reflected waveform is generated due to impedance changes. In the forward test, the system injects the test signal into the target link at the test starting point through the test probe, and constructs a forward test curve based on the propagation and reflection patterns of the signal.

[0083] In this embodiment, the impedance detection system can acquire the reflection data of the pulse test signal after propagation along the link through the test probe and instrument interface during the TDR test, and convert the data into a TDR waveform curve that can be used to analyze impedance characteristics. It is understood that the impedance detection system can record the curve data of the signal reflection waveform changing with time or distance in real time, which can be used to determine whether the local impedance in the link is distorted.

[0084] The impedance detection system described above can also analyze, identify, and judge the waveform to determine whether there are abnormal signal segments, abrupt jumps, or discrete peaks, and mark the data corresponding to such segments as positive unknown abnormal data, which will not be used directly as the basis for impedance judgment.

[0085] The aforementioned forward unknown abnormal data refers to abnormal waveform information identified by the impedance detection system during the analysis of the forward test curve. This abnormality is caused by changes in the test probe contact, solder joint structure, or local parasitic effects. It typically appears near the test start point, such as abrupt trough changes, peak jumps, or rapid impedance disturbances at the connector solder joint. It should be noted that in this embodiment, this abnormal segment will be marked by the impedance detection system and will not be directly used for impedance calculation at the target test point. Instead, it will be compensated for using normal data from the reverse test.

[0086] The abnormal waveform data during the aforementioned forward test can refer to the portion of the forward TDR test curve exhibiting abnormal fluctuations, irregular shapes, or nonlinear signal jumps. These can be caused by factors such as probe interference, uneven end-point welding structures, or amplified local impedance reflections. Correspondingly, abnormal abrupt TDR data refers to sudden sharp jumps, local troughs, or peaks on the curve. These data often appear near the contact point and cannot accurately reflect the link impedance. In this embodiment, the impedance detection system identifies these distorted data segments as forward unknown abnormal data and replaces them with corresponding data from the reverse test curve in the subsequent complementary inference step to ensure the accuracy of the final impedance determination result.

[0087] Optionally, the step of obtaining the reverse TDR test curve by performing reverse testing based on test point data and signal transmission direction further includes determining the test start and end points of the target test point in the reverse test based on the reverse direction of signal transmission; contacting the TDR test probe with the test start point and using the test start point as the TDR signal injection end, transmitting a test signal to the target test link in the reverse direction of signal transmission, collecting the reflected signal returned along the link and obtaining the reverse TDR test curve; and determining the reverse unknown abnormal data based on the reverse TDR test curve, which includes abnormal waveform data and abnormal sudden TDR data during the reverse test.

[0088] In this embodiment of the invention, the impedance detection system first reverses the existing signal transmission direction to obtain the target link propagation path used for reverse testing, and determines the test start and end points of the target test point in the reverse test accordingly. For example, when the forward test uses the connector as the injection start point of the test signal and the chip-side via as the link end point, in the reverse test, the system uses the chip-side via as the test start point of the reverse test signal and the connector as the reverse test end point, thereby forming a test path that propagates in reverse along the link direction.

[0089] After determining the test starting point, the impedance detection system can bring the TDR test probe to the test starting point position for reverse testing. Using this starting point as the TDR signal injection end, the system transmits the pulse test signal in the reverse direction of signal transmission towards the target test link. The test signal sequentially passes through the rigid-flex PCB structure, including the via layer transition area, the flexible area, and the connector soldering end area. As the test signal propagates within the link and local impedance mismatches occur, the impedance detection system collects and records the reflected signal returning along the link in real time. Based on the collected changes in the reflected waveform, it generates a corresponding reverse TDR test curve to characterize the impedance change characteristics of the link under reverse propagation conditions.

[0090] After the reverse TDR test curve is generated, the impedance detection system performs waveform analysis to identify whether there are waveform distortion phenomena caused by probe contact ends, via structures, or local parasitic effects, such as irregular peaks, abrupt jumps, and nonlinear signal disturbances near the test start point. The data corresponding to such distorted curve segments are marked as reverse unknown abnormal data. Reverse unknown abnormal data includes abnormal waveform data generated during reverse testing and abnormal abrupt TDR data formed by local impedance abrupt changes. This type of data is not directly used as the basis for subsequent impedance determination, but will be replaced by normal data at the corresponding position of the forward test curve in the complementary inference step, thereby ensuring that the impedance result of the target test point is not affected by contact distortion at the reverse test start point.

[0091] Optionally, the step of performing impedance complementary estimation on the target test point based on the forward and reverse TDR test curves to determine the impedance data of the target test point further includes: acquiring unknown abnormal data in the forward and reverse TDR test curves; identifying link segments in the forward unknown abnormal data and determining forward impedance data based on the corresponding link segments; identifying link segments in the reverse unknown abnormal data and determining reverse impedance data based on the corresponding link segments; and performing complementary extraction processing based on the forward and reverse impedance data to determine the impedance data at the target test point.

[0092] In this embodiment of the invention, after completing the forward TDR test, the impedance detection system performs data analysis on the generated forward TDR test curve. By analyzing the waveform morphology of the curve at different propagation positions, it identifies and locates abnormal segments in the forward test caused by changes in probe contact or link structure characteristics. For example, when the forward test probe contacts the connector end, nonlinear signal distortions such as peak spikes, bottom dips, or abrupt changes will occur near this area. The impedance detection system defines this waveform distortion segment as the link segment corresponding to the unknown abnormal forward data. This link segment typically includes a short distance extending from the test start point along the test direction, such as a link segment from the connector solder joint to several millimeters thereafter, which serves as the range of abnormal segment locations discarded in subsequent complementary speculation.

[0093] The aforementioned forward impedance data can refer to the impedance judgment data calculated based on the effective segment of the forward TDR test curve after removing the link segments corresponding to unknown forward abnormal data.

[0094] Specifically, the impedance detection system described above maps and converts the normal waveform portion outside the abnormal section. For example, it calculates the line impedance value of the section based on the step change of the TDR curve. It can be understood that the forward impedance data comes only from the effective range where the waveform is continuous, undistorted, and can fully reflect the true electrical characteristics of the link. It does not include distorted data caused by probe contact interference or local abrupt changes. It is used to provide a basis for compensation when there are abnormalities in the reverse data.

[0095] In another possible embodiment, after performing a reverse TDR test, the impedance detection system also analyzes the reverse test curve segment by segment to identify abnormal waveform ranges near the starting point of the reverse test. For example, when the reverse test uses the ink removal point of a via as the test starting point, due to probe contact, via excitation response, and local parasitic effects, a curve jump may also occur at this starting point. By analyzing waveform continuity, abrupt change amplitude, inflection point position, and reflection characteristic changes, the impedance detection system locates the abnormal segment as the link segment corresponding to the unknown abnormal reverse data, and marks and eliminates segments based on their location range to avoid using distorted waveforms for impedance judgment.

[0096] The aforementioned reverse impedance data refers to the impedance judgment data extracted from the normal region of the reverse TDR curve after removing abnormal link segments from the reverse test curve. It can be understood that this reverse impedance data originates from a continuous, smooth segment of the reverse test waveform, unaffected by contact point interference, and its impedance value reflects the true impedance characteristics of the link at the corresponding length. For example, when the reverse curve exhibits a stable step or gradual trend in the normal region, the aforementioned impedance detection system uses the impedance value corresponding to that band as reverse impedance data to compensate for the missing true impedance information in abnormal segments of the forward test curve.

[0097] In another possible embodiment, the impedance detection system matches, substitutes, and fuses forward and reverse test data to achieve complementary extraction processing. Specifically, firstly, based on the link segment location corresponding to the unknown abnormal data in the forward test, the system extracts the true impedance value of the same physical link location from the reverse impedance data and uses this data as the first impedance determination basis for the abnormal segment in the forward test. Subsequently, for the link segment corresponding to the abnormal waveform segment in the reverse test, the impedance detection system extracts the impedance value at the corresponding location from the forward impedance data and uses this data as the second impedance determination basis for the abnormal segment in the reverse test. By substituting the impedance information of the distorted segments in the two test curves, the impedance detection system achieves a complementary inference mechanism that corrects each other in forward and reverse tests, ensuring that the impedance data obtained at the target test point ultimately originates from the true curve segment without distortion, thereby deriving a reliable impedance determination result at the target test point.

[0098] Through the aforementioned segment identification, anomaly removal, and complementary extraction processes, this embodiment does not directly use distorted data with abrupt changes in the TDR curve for impedance determination. Instead, it uses a cross-complementary method of forward and reverse curves to ensure that the data used for impedance determination originates from normal response segments. This achieves the technical effect of using available segment data to cover distorted segment data. Even when probe interference is unavoidable and the link structure is complex, it can still accurately deduce the true impedance value of the target test point, avoiding misjudgments caused by unidirectional test data deviation.

[0099] Optionally, the step of performing complementary extraction processing based on forward impedance data and reverse impedance data to determine the impedance data at the target test point further includes, for the link segment corresponding to the forward unknown abnormal data, extracting the impedance data at the corresponding position from the reverse impedance data as the first impedance determination data for that segment; for the link segment corresponding to the reverse unknown abnormal data, extracting the impedance data at the corresponding position from the forward impedance data as the second impedance determination data for that segment; and performing complementary extraction processing based on the first impedance determination data and the second impedance determination data to determine the impedance data at the target test point.

[0100] In this embodiment of the invention, the aforementioned first impedance determination data can be the data that identifies abnormal abrupt changes caused by the contact of the test probe or the structure of the hardware endpoints after the impedance detection system completes the forward TDR test and obtains the forward test curve. Specifically, it can be combined with, for example, Figure 3 The diagram illustrates a comparison of forward and reverse test results. In the forward test curve (left image), a significant impedance abrupt change is visible near the connector end. The waveform exhibits a sharp drop, a dip in the low-lying area, and a signal pattern discontinuous from the surrounding stable sections (the area within the rectangle in the image). This region represents the link segment corresponding to the unknown abnormal data in the forward test. Because its waveform is distorted by the probe's electrical coupling and the connector solder joint structure, it cannot be used as a basis for accurate impedance calculation.

[0101] In this case, the impedance detection system extracts the normal impedance value of the link segment under reverse testing from the reverse TDR test curve (right figure) based on the mapping relationship of the link segment in both forward and reverse testing directions, using it as a compensation basis. As shown in the right figure, the reverse test presents a smooth step-like curve at the corresponding physical link location, without obvious abrupt troughs. Therefore, this segment of the reverse curve truly reflects the normal impedance state of the link at that location. The system extracts this normal impedance value and defines it as the first impedance judgment data for this segment.

[0102] In other words, the "first impedance judgment data" is based on the location of the abnormal section in the forward test, and the impedance value of the normal waveform segment at the corresponding position in the reverse test curve is taken to replace the critical impedance reference data after the abnormal section in the forward test is removed.

[0103] Similarly, the impedance detection system described above will also identify unknown abnormal data segments in the reverse test curve. For example, in reverse testing, since the probe contact point is located on the ink removal side of the via, local waveform distortion will also occur at this location, as shown in the rectangular area on the right of the figure. This segment of the curve exhibits an abnormal deformation shape, manifested as instantaneous jumps, nonlinear inflection points, or low-point peaks, which does not conform to the continuous impedance change law of the link. Therefore, the link segment corresponding to this area is defined as an unknown abnormal data segment in the reverse direction and is not used directly as a basis for reverse determination.

[0104] For this unknown anomaly in the reverse direction, the system locates the corresponding physical segment in the forward test curve and uses the impedance value of the normal continuous waveform segment in the forward curve as a substitute. For example, in the forward test curve shown on the left, this corresponding link location exhibits a relatively stable impedance change segment, with no abrupt changes and a continuous trend. Therefore, the impedance data for this segment can accurately represent the impedance situation of the link in this segment. The system extracts this normal impedance value and defines it as the second impedance judgment data.

[0105] In other words, the "second impedance judgment data" is the normal impedance data of the corresponding link position extracted from the forward test curve for the abnormal distortion section in the reverse test, which is used to replace the judgment basis of the distorted section of the reverse test data.

[0106] In this embodiment, as Figure 3 As shown, the left side is the forward TDR test curve, where the test probe contacts the connector end and the signal propagates along the link direction to the chip end; the right side is the reverse test curve, where the test probe contacts the chip / via end and the signal propagates in the opposite direction to the connector end.

[0107] By comparing the two test curves, it can be seen that: The positive curve shows a significant waveform abrupt change in the rectangular area near the connector end (left side of the figure). This segment corresponds to the link segment with the unknown abnormal positive data. In the reverse curve, the waveform segment corresponding to the same physical link location (right side of the figure) presents a smooth shape without distortion. Therefore, its impedance value can be used as the true basis for judgment and constitute the first impedance judgment data. Similarly: The reverse curve exhibits abnormal troughs or jumps near the via pads (right rectangle in the figure); The positive curve presents a continuous, distortion-free curve segment at the corresponding physical location, and the impedance detection system uses the normal impedance value at that location as the second impedance judgment data.

[0108] Finally, the impedance detection system performs complementary extraction processing based on the forward and reverse judgment data at the corresponding positions of the abnormal sections: forward abnormal sections → compensated with reverse normal data; reverse abnormal sections → compensated with forward normal data. Through the aforementioned complementary extraction action, the impedance detection system replaces all distorted segments in the two test curves with the true impedance data of the normal segments of the opposing curves, achieving full coverage complementarity of the interference-free section.

[0109] Finally, a complete set of impedance data is obtained to determine the true impedance value of the target test point, thereby accurately determining whether the point meets the impedance design requirements (e.g., 50Ω±5Ω).

[0110] like Figure 4 As shown, this embodiment of the invention also provides an impedance detection device 400, which includes: The first determining module 401 is used to determine the test data of the target test point, the test data including test point location data and signal transmission direction; The forward test module 402 is used to perform forward testing based on the test point data and the signal transmission direction to obtain a forward TDR test curve; The reverse testing module 403 is used to perform reverse testing based on the test point data and the signal transmission direction to obtain a reverse TDR test curve. The complementary module 404 is used to perform impedance complementarity estimation on the target test point based on the forward TDR test curve and the reverse TDR test curve, and determine the impedance data of the target test point.

[0111] Optionally, the first determining module 401 mentioned above includes: The first determination submodule is used to obtain the design parameters of the target circuit board, including link structure information, signal routing location and impedance design requirements. The second determining submodule is used to determine the test point data of the target test point and the endpoint position relationship of the target test point in the link structure information based on the link structure information, signal wiring location and impedance design requirements. The third determining submodule is used to determine the signal transmission direction based on the endpoint position relationship.

[0112] Optionally, the aforementioned forward test module 402 includes: The first forward test submodule is used to determine the test start point and test end point of the target test point based on the signal transmission direction; The second forward test submodule is used to contact the TDR test probe with the test start point and the test end point, and use the test start point as the TDR signal injection end to transmit the test signal to the target test link along the signal transmission direction, collect the reflected signal returned along the link and obtain the forward TDR test curve. The third forward testing submodule is used to determine the forward unknown abnormal data based on the forward TDR test curve. The forward unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during forward testing.

[0113] Optionally, the reverse testing module 403 mentioned above includes: The first reverse testing submodule is used to determine the test start point and test end point of the target test point in the reverse test based on the reverse direction of the signal transmission direction. The second reverse test submodule is used to bring the TDR test probe to the test starting point, and use the test starting point as the TDR signal injection end to transmit a test signal to the target test link in the reverse direction of the signal transmission direction, collect the reflected signal returned along the link and obtain the reverse TDR test curve. The third reverse testing submodule is used to determine the reverse unknown abnormal data based on the reverse TDR test curve. The reverse unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during reverse testing.

[0114] Optionally, the complementary module 404 mentioned above includes: The first complementary submodule is used to acquire unknown abnormal data in the forward TDR test curve and the reverse TDR test curve; The second complementary submodule is used to determine the link segment in the forward unknown abnormal data and determine the forward impedance data based on the corresponding link segment. The third complementary submodule is used to determine the link segment in the reverse unknown abnormal data and determine the reverse impedance data according to the corresponding link segment. The fourth complementary submodule is used to perform complementary extraction processing based on the forward impedance data and reverse impedance data to determine the impedance data at the target test point.

[0115] Optionally, the fourth complementary submodule mentioned above includes: The first complementary unit is used to extract the impedance data at the corresponding position from the reverse impedance data for the link segment corresponding to the forward unknown abnormal data as the first impedance determination data for that segment. The second complementary unit is used to extract the impedance data at the corresponding position from the forward impedance data for the link segment corresponding to the reverse unknown abnormal data as the second impedance determination data for that segment. The third complementary unit is used to perform complementary extraction processing based on the first impedance determination data and the second impedance determination data to determine the impedance data at the target test point.

[0116] like Figure 5 As shown, this embodiment of the invention also provides an electronic device 500, including a processor, which can execute any of the impedance detection methods described above.

[0117] Specifically, it includes a processor 501 and a memory 502, as well as a computer program stored in the memory 502 and capable of running on the processor 501 to perform the impedance detection method, wherein: The processor 501 runs the calculator program for the impedance detection method stored in the memory 502, and performs the following steps: Determine the test data for the target test point, the test data including test point location data and signal transmission direction; Based on the test point data and signal transmission direction, a forward test is performed to obtain the forward TDR test curve; Based on the test point data and signal transmission direction, a reverse test is performed to obtain the reverse TDR test curve. Based on the forward TDR test curve and the reverse TDR test curve, impedance complementarity estimation is performed on the target test point to determine the impedance data of the target test point.

[0118] Optionally, the processor 501 executes the test data for determining the target test point, including: Obtain the design parameters of the target circuit board, including link structure information, signal routing locations, and impedance design requirements; Based on the link structure information, signal routing location, and impedance design requirements, determine the test point data of the target test point and the endpoint position relationship of the target test point in the link structure information; The signal transmission direction is determined based on the positional relationship of the endpoints.

[0119] Optionally, the processor 501 performs a forward test based on the test point data and the signal transmission direction to obtain a forward TDR test curve, including: Based on the signal transmission direction, determine the test start point and test end point of the target test point; The TDR test probe is brought into contact with the test start point and the test end point, and the test start point is used as the TDR signal injection end. The test signal is transmitted to the target test link along the signal transmission direction, the reflected signal returned along the link is collected, and the positive TDR test curve is obtained. Based on the positive TDR test curve, the positive unknown abnormal data is determined. The positive unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during the positive test.

[0120] Optionally, the processor 501 performs the reverse test based on the test point data and signal transmission direction to obtain a reverse TDR test curve, including: Based on the reverse direction of the signal transmission, the test start point and test end point of the target test point are determined in the reverse test; The TDR test probe is brought into contact with the test starting point, and the test starting point is used as the TDR signal injection end. The test signal is transmitted to the target test link in the reverse direction of the signal transmission direction, and the reflected signal returned along the link is collected to obtain the reverse TDR test curve. Based on the reverse TDR test curve, the reverse unknown abnormal data is determined. The reverse unknown abnormal data includes abnormal waveform data and abnormal mutation TDR data during the reverse test.

[0121] Optionally, the processor 501 executes the impedance complementarity estimation of the target test point based on the forward TDR test curve and the reverse TDR test curve to determine the impedance data of the target test point, including: Obtain unknown abnormal data from the forward TDR test curve and the reverse TDR test curve; Identify the link segments in the forward unknown anomaly data, and determine the forward impedance data based on the corresponding link segments; Identify the link segments in the reverse unknown anomaly data, and determine the reverse impedance data based on the corresponding link segments; Based on the forward and reverse impedance data, complementary extraction processing is performed to determine the impedance data at the target test point.

[0122] Optionally, the processor 501 performs complementary extraction processing based on the forward impedance data and reverse impedance data to determine the impedance data at the target test point, including: For the link segment corresponding to the forward unknown abnormal data, the impedance data at the corresponding position is extracted from the reverse impedance data as the first impedance determination data for that segment. For the link segment corresponding to the reverse unknown abnormal data, the impedance data at the corresponding position is extracted from the forward impedance data as the second impedance determination data for that segment. Based on the first impedance determination data and the second impedance determination data, complementary extraction processing is performed to determine the impedance data at the target test point.

[0123] This invention also provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it implements the various processes of the impedance detection method or the application-side impedance detection method provided in this invention, and achieves the same technical effect. To avoid repetition, it will not be described again here.

[0124] Those skilled in the art will understand that implementing all or part of the processes in the above embodiments can be done by a computer program instructing related hardware, and can be stored in a computer-readable storage medium. When executed, the program can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0125] The above description discloses only preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, equivalent variations made in accordance with the claims of the present invention are still within the scope of the present invention.

Claims

1. An impedance detection method, characterized by, The method comprises the following steps: determining test data of a target test point, the test data comprising test point data and signal transmission direction; performing forward test based on the test point data and signal transmission direction to obtain a forward TDR test curve; performing reverse test based on the test point data and signal transmission direction to obtain a reverse TDR test curve; based on the forward TDR test curve and the reverse TDR test curve, performing impedance complementary inference on the target test point to determine impedance data of the target test point.

2. The impedance detection method of claim 1, wherein, The determination of the test data of the target test point comprises: obtaining design parameters of a target circuit board, the design parameters comprising link structure information, signal wiring position and impedance design requirement; based on the link structure information, signal wiring position and impedance design requirement, determining test point data of the target test point and end point position relationship of the target test point in the link structure information; based on the end point position relationship, determining the signal transmission direction.

3. The impedance detection method of claim 1, wherein, The forward test based on the test point data and signal transmission direction to obtain a forward TDR test curve comprises: based on the signal transmission direction, determining a test start point and a test end point of the target test point; contacting a TDR test probe to the test start point and the test end point, taking the test start point as a TDR signal injection end, emitting a test signal to the target test link along the signal transmission direction, collecting a reflected signal returned along the link and obtaining the forward TDR test curve; based on the forward TDR test curve, determining forward unknown abnormal data, the forward unknown abnormal data comprising abnormal waveform data and abnormal mutation TDR data in the forward test.

4. The impedance detection method of claim 1, wherein, The reverse test based on the test point data and signal transmission direction to obtain a reverse TDR test curve comprises: based on the inverse of the signal transmission direction, determining a test start point and a test end point of the target test point in the reverse test; contacting a TDR test probe to the test start point, taking the test start point as a TDR signal injection end, emitting a test signal to the target test link along the inverse of the signal transmission direction, collecting a reflected signal returned along the link and obtaining the reverse TDR test curve; based on the reverse TDR test curve, determining reverse unknown abnormal data, the reverse unknown abnormal data comprising abnormal waveform data and abnormal mutation TDR data in the reverse test.

5. The impedance detection method according to any one of claims 3 or 4, wherein, The impedance complementary inference on the target test point based on the forward TDR test curve and the reverse TDR test curve to determine impedance data of the target test point comprises: obtaining unknown abnormal data in the forward TDR test curve and the reverse TDR test curve; determining a link section in the forward unknown abnormal data and determining forward impedance data according to the corresponding link section; determining a link section in the reverse unknown abnormal data and determining reverse impedance data according to the corresponding link section; Based on the forward impedance data and the reverse impedance data, complementary extraction processing is performed to determine the impedance data at the target test point.

6. The impedance detection method of claim 5, wherein, The complementary extraction processing based on the forward impedance data and the reverse impedance data to determine the impedance data at the target test point comprises: For the link section corresponding to the forward unknown abnormal data, impedance data at the corresponding position in the reverse impedance data is extracted as the first impedance determination data of the section; For the link section corresponding to the reverse unknown abnormal data, impedance data at the corresponding position in the forward impedance data is extracted as the second impedance determination data of the section; Based on the first impedance determination data and the second impedance determination data, complementary extraction processing is performed to determine the impedance data at the target test point.

7. An impedance detecting device, characterized by comprising: Comprise: A first determination module is configured to determine test data of a target test point, wherein the test data comprises test point data and a signal transmission direction; A forward test module is configured to perform forward test based on the test point data and the signal transmission direction to obtain a forward TDR test curve; A reverse test module is configured to perform reverse test based on the test point data and the signal transmission direction to obtain a reverse TDR test curve; A complementary module is configured to perform impedance complementary inference on the target test point based on the forward TDR test curve and the reverse TDR test curve to determine impedance data of the target test point.

8. An impedance detection system characterized by, Comprise: An impedance detection device; The impedance detection device implements the impedance detection method of claim 1.

9. An electronic device, comprising: Comprise: A memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor implements the steps of the impedance detection method of any one of claims 1 to 6 when executing the computer program.

10. A computer-readable storage medium, characterized in that, The computer program is stored on the computer readable storage medium, and the computer program is executable on the processor to implement the steps of the impedance detection method of any one of claims 1 to 6.

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