Automatic detection method of operation loop module

Abstract

The invention discloses an automatic detection method for an operation loop module. According to the method, a relay matrix reconfigurable hardware system is constructed to issue a test instruction based on an upper computer control platform; according to a test instruction issued by the upper computer, automatic scheduling and execution of the relay matrix reconfigurable hardware system are carried out; and the upper computer receives an execution result of the relay matrix reconfigurable hardware system, and compares the execution result with a preset expectation to generate an evaluation report. Through accurate voltage grade automatic selection and matched simulation coil parameters, the risk of equipment damage caused by voltage mismatching is effectively prevented, meanwhile, the problems of voltage mismatching, test step omission or sequence error and the like caused by human factors are avoided, the voltage grade is combined with complex function verification, and the test efficiency is improved. The detection precision is improved to millisecond-level time sequence change, and the test precision of the detection system is improved.

Description

Technical Field

[0001] This invention relates to the field of automated testing technology, and more specifically to an automated testing method for an operating loop module. Background Technology

[0002] The operating circuit module, also known as the control circuit module, is a crucial component of the secondary circuit in a power system. Essentially, it is a dedicated interface and actuator responsible for safely and reliably receiving control commands (such as opening and closing) and driving primary equipment (such as circuit breakers) to perform corresponding operations. This prevents the circuit breaker from "jumping" (continuous opening and closing multiple times) when closing to a faulty line because the closing command has not been promptly released, thus protecting the circuit breaker from damage. It also monitors the status of the circuit breaker itself and its operating mechanism in real time.

[0003] In the current production and inspection of operating circuit modules, the conventional approach is to use testing fixtures to simulate the interface and state of a real circuit breaker to complete basic functional verification. However, this method has several inherent limitations in terms of process implementation and testing performance, specifically as follows: First, regarding test environment simulation, the load conditions simulated by existing fixtures differ significantly from those of circuit breaker mechanisms actually operating in the field. There are many types of circuit breakers in the field, with varying electrical and mechanical characteristics. Fixtures with fixed parameters struggle to reproduce the complex and ever-changing field conditions, resulting in some potential defects not being effectively exposed during the manufacturing phase.

[0004] Secondly, regarding load adaptability, operating mechanisms at different voltage levels (such as DC 24V, 48V, 110V, and 220V) correspond to different coil resistance and power consumption characteristics. Existing testing methods typically use a single or limited number of high-power resistors for simulation, which makes it difficult to accurately match the actual electrical behavior of the coil at each voltage level, thus affecting the accuracy and representativeness of the test results.

[0005] Furthermore, in terms of test process execution, existing methods still rely on manual operation for some tasks, such as gear shifting, button triggering, and status recording. This approach is not only inefficient but also prone to misjudgment and omissions due to differences in personnel operating habits or experience, affecting the consistency of product quality.

[0006] In summary, existing testing methods are insufficient in terms of environmental realism, load coverage, and process automation, which restricts the efficiency and reliability of factory inspection of operating loop modules. There is an urgent need for a testing device that can fully simulate on-site working conditions, automatically execute test processes, and has a standardized judgment mechanism. Summary of the Invention

[0007] The present invention proposes an automated detection method for an operating loop module, which can at least solve one of the technical problems in the background art.

[0008] To achieve the above objectives, the present invention adopts the following technical solution: An automated detection method for an operating loop module includes the following steps: S100: Construct a reconfigurable hardware system for a relay matrix and issue test commands based on a host computer control platform; S200: Automatically schedule and execute the reconfigurable hardware system of the relay matrix according to the test instructions issued by the host computer; The S300 and host computer receive the execution results of the reconfigurable hardware system of the relay matrix and compare them with the preset expectations to generate an evaluation report.

[0009] Furthermore, the reconfigurable relay matrix hardware system in step S100 of the present invention includes: Voltage level testing device, closing testing device, operating circuit module, and anti-pumping function testing module; the voltage level testing device is connected to the closing testing device, the output of the closing testing device is connected to the operating circuit module, and the output of the operating circuit module is connected to the anti-pumping function testing device. The voltage level testing device includes: a communication control device, a control device power supply, an optocoupler control circuit, an optocoupler feedback circuit, and a multi-channel relay coil and relay switch section. The power supply of the communication control device is connected to the power supply of the control device. The power supply of the control device is connected to the multi-channel optocoupler control circuit and the optocoupler feedback circuit, which are responsible for powering the circuit. The optocoupler control circuit is connected to the corresponding relay coil. The optocoupler feedback circuit is connected to the test result output relay switch. The test result output relay switch and the multi-channel relay coil are connected to the closing test device.

[0010] Furthermore, the anti-jump function testing device of the present invention includes: an analog coil testing circuit, a test result feedback circuit, a relay switch part, a test relay switch, a test result output relay coil, and an output knob unit; The test relay switches include conventional test relay switches, holding test relay switches, and open circuit test relay switches. One end of the open circuit test relay switch is connected to the conventional test relay switch and the holding test relay switch, and the other end is connected to the test result output relay coil. The conventional test relay switch and the holding test relay switch are connected in series in the analog coil test circuit, and the other end of the analog coil test circuit is connected to the relay switch section. The analog coil test circuit includes: a 24V analog coil test line, a 48V analog coil test line, a 110V analog coil test line, and a 220V analog coil test line; the relay switch section includes: a 24V relay switch, a 48V relay switch, a 110V relay switch, and a 220V relay switch; the multi-channel analog coil test line is connected to the relay switch corresponding to the voltage. The relay switch section is connected to the outlet knob unit, and the outlet knob unit is connected to the operation circuit module.

[0011] Furthermore, the communication control device of the present invention includes: The communication control device communicates with the host computer and controls the optocoupler control circuit according to the host computer's instructions; the I / O port of the MCU chip in the communication control device is connected to the YK terminal of each relay in the optocoupler control circuit unit, and the MCU chip and the optocoupler control circuit share a common ground; The secondary YKST port of the optocoupler control circuit is connected to the relay coil section and is used to control the closing and opening of the corresponding relay switching unit to achieve the function of switching different test circuits.

[0012] Furthermore, the automatic scheduling and execution method of the relay matrix reconfigurable hardware system in step S200 of the present invention includes: The host computer automatically calls the corresponding test logic according to different test items through the built-in programming test sequence, and sends instructions to the lower device for adjustment through IC serial communication. The sent instructions include: voltage level test instructions, manual closing automatic test instructions, and anti-pumping function automatic test instructions. The adjustment method for the voltage level test command is as follows: The host computer selects the 24V test voltage level and sends a shift command to the voltage level test device, which causes the MCU in the test device to generate and output an activation signal corresponding to the 24V level. The voltage level testing device receives the 24V range activation signal, controls the corresponding relay to activate the 24V test-dedicated analog coil and resistor circuit, and simultaneously adjusts the power supply voltage to 24V. After confirming that the relay has activated and the corresponding circuit branch is conducting, the testing device sends a signal to the MCU to complete the shift by changing the position of the optocoupler signal; the MCU then sends a shift success message to the host computer. After receiving the successful gear shift information, the host computer sends a power supply command to the power supply to control the power supply to output the 24V gear voltage. The power supply begins supplying power according to the power supply command, completing the test preparation for the 24V voltage level.

[0013] Furthermore, the method for adjusting the automated test command for the anti-jump function of the present invention includes: The host computer sends the first shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an activation signal for the anti-jump output gear; The anti-jump function testing device controls the corresponding relay to switch to the anti-jump output state according to the opening signal of the anti-jump output position; After the circuit corresponding to the anti-jump output state is turned on, the anti-jump function test device detects the completion of the state change through the optical coupler signal change and feeds back the first gear shift success information to the host computer. After receiving the first successful gear shift information, the host computer sends a single closing button trigger signal to the closing test device; the MCU in the closing test device generates and outputs a closing button opening signal with a duration of 1 second accordingly. The closing test device controls the closing relay switch to switch to the closed state according to the closing button opening signal and maintains it for 1 second before resuming, simulating an instantaneous pressing operation of the closing button; The host computer sends a second shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an open signal for the normal output gear. The anti-jump function testing device controls the corresponding relay to switch to the normal output state based on the opening signal of the normal output position; After the circuit corresponding to the normal output state is turned on, the operation loop module detects the completion of the state change through the optocoupler signal change and feeds back the second gear shift success information to the host computer. The closing test device controls the closing relay switch and the opening relay switch to the continuously closed state. The closing test device collects and reports the remote signaling status of the interlocking, closing, opening, closing action and opening action to the host computer in real time. The host computer compares the received remote signaling status with the first preset expected result. If the status meets the expectation, the test continues. If it does not meet the expectation, the anti-pumping test is deemed unqualified.

[0014] Furthermore, the method for adjusting the manual closing automatic test command of the present invention includes: The host computer sends a shift command to the testing device, instructing the MCU in the testing device to generate a manual signal to activate the gear. The testing device controls the corresponding relay to switch to manual signal state based on the activation signal of the manual signal position; After the circuit corresponding to the manual signal state is turned on, the test device detects the completion of the state change through the optical coupler signal change and sends a successful gear shift message back to the host computer. After receiving the successful gear shift information, the host computer sends a single closing button trigger signal to the test device; the MCU in the test device generates and outputs a closing button opening signal with a duration of 1 second based on this signal. The closing test device controls the closing button relay to switch to the closed state and maintain it for 1 second after the closing button is activated, based on the closing button activation signal, to simulate a momentary pressing operation of the closing button by a human. After the test is completed, the voltage level test device detects the change of the optocoupler signal in the closed and closed state circuits, collects the status information of the closed remote signaling and the closed remote signaling, and reports the remote signaling status to the host computer. The host computer compares the received remote signaling status with the preset expected result; if the remote signaling status meets the expected result, the manual closing test is deemed qualified and the next test is automatically started; if it does not meet the expected result, the test is deemed unqualified and the result is recorded.

[0015] In summary, this invention, through its automated and intelligent testing scheme, has achieved significant improvements in testing efficiency, accuracy, consistency, and economy, providing reliable technical support for quality assurance of operating loop modules. Actual production verification has shown that this invention can meet the testing needs of large-scale industrial production and has significant value for widespread application. Attached Figure Description

[0016] Figure 1 This is a structural diagram of the reconfigurable relay matrix hardware system of the present invention; Figure 2 This is a schematic diagram of the optocoupler control voltage level test circuit of the present invention; Figure 3 This is the circuit schematic diagram for the optocoupler control test item of the present invention; Figure 4 This is a schematic diagram of the voltage level relay switching circuit of the present invention; Figure 5 This is a schematic diagram of the optocoupler feedback circuit of the present invention; Figure 6 This is the schematic diagram of the relay switch circuit for the test item of this invention; Figure 7 This is a flowchart of the operation and testing process of the present invention. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of the present invention, but not all embodiments.

[0018] The automated detection method for the operating loop module described in this embodiment includes the following steps: S100: Construct a reconfigurable hardware system for a relay matrix and issue test commands based on a host computer control platform; S200: Automatically schedule and execute the reconfigurable hardware system of the relay matrix according to the test instructions issued by the host computer; The S300 and host computer receive the execution results of the reconfigurable hardware system of the relay matrix and compare them with the preset expectations to generate an evaluation report.

[0019] The following provides a detailed explanation of each step: S100: Construct a reconfigurable hardware system for a relay matrix and issue test commands based on a host computer control platform; like Figure 1 As shown, the method for constructing a reconfigurable hardware system with a relay matrix is ​​as follows: A circuit switching architecture based on a relay network was designed to realistically replicate the working environment of a field circuit breaker operating circuit. A voltage level testing device is connected to a closing testing device; the output of the closing testing device is connected to the operating circuit module; and the output of the operating circuit module is connected to an anti-pumping function testing device. Specifically, this includes: The voltage level testing device is the control section, responsible for controlling the on / off state of each virtual switch, selecting test circuits for different voltage levels, and processing the feedback of each test result; The structure consists of a communication control device, a control device power supply, an optocoupler control circuit, an optocoupler feedback circuit, and a multi-channel relay coil and relay switch.

[0020] The power supply of the communication device is connected to the power supply of the control device. The power supply of the control device is connected to the multi-channel optocoupler control circuit and the optocoupler feedback circuit, which are responsible for powering the circuit. The optocoupler control circuit is connected to the corresponding relay coil. The optocoupler feedback circuit is connected to the test result output relay switch. The test result output relay switch and the multi-channel relay coil are connected to the closing test device.

[0021] The communication control device communicates with the host computer and controls the optical coupling control circuit according to the host computer's instructions. For example... Figure 2 As shown, the I / O port of the MCU chip in the communication control device is connected to the YK terminal of each relay in the optocoupler control circuit unit, and the MCU chip and the optocoupler control circuit share a common ground.

[0022] like Figure 3 As shown, the secondary YKST port of the optocoupler control circuit is connected to the relay coil section, which is used to control the closing and opening of the corresponding relay switching unit to achieve the function of switching different test circuits.

[0023] The anti-pumping function test device is the test circuit part, used to select test circuits of different voltage levels and some controlled virtual switches; The structure consists of: an analog coil test circuit, a test result feedback circuit, a relay switch section, a test relay switch, a test result output relay coil, and an output knob unit; The test relay switches include a conventional test relay switch, a holding test relay switch, and a disconnection test relay switch. One end of the disconnection test relay switch is connected to the conventional and holding test relay switches, and the other end is connected to the test result output relay coil. The conventional and holding test relay switches are connected in series in the analog coil test circuit. The other end of the analog coil test circuit is connected to the relay switch section. The analog coil test circuit includes: 24V, 48V, 110V, and 220V analog coil test lines. The relay switch section includes: 24V, 48V, 110V, and 220V relay switches. Multiple analog coil test lines are connected to the corresponding voltage relay switches. The circuit structure of the relay switches and analog coil test lines is as follows: Figure 4 As shown.

[0024] The relay switch section is connected to the outlet knob unit, and the outlet knob unit is connected to the operation circuit module.

[0025] like Figure 5 As shown, the primary side of the optocoupler feedback circuit is connected to the relay switch unit, and the corresponding relay coil unit is connected in series in the test circuit module, responsible for transmitting test results to the communication control device. The VO1+ port and VO1- port of the optocoupler feedback circuit are connected in parallel to the power supply circuit of the control module, and the D5 port is connected to the I / O port of the MCU chip of the communication control device.

[0026] The closing test device is a test item selection module, which is mainly controlled by the control module to select different test items. like Figure 6 As shown, the structure consists of a closing relay switch, a tripping relay switch, a manual signal relay switch, and a protection signal relay switch connected in parallel.

[0027] The circuits of the test loop module and the control module are connected by relays; the circuits of the test item selection module and the control module are connected by relays; the test loop module and the test item selection module are connected by installing the operating loop module under test into the test device.

[0028] Multi-channel relay switching system: By controlling multiple relays with an MCU, the test simulation coil, resistive load and signal path can be quickly switched between different test items; For example, it can switch to a dedicated 24V analog coil during 24V testing and switch to an anti-pumping output circuit during anti-pumping testing, thus achieving "one machine for multiple uses". Realistic working condition simulation capability: The precise matching of the simulation coil and resistor parameters reproduces the electrical characteristics of the actual circuit breaker mechanism; Supports real-world reconfiguration of multiple operating modes, including manual / automatic, closing / opening, anti-pumping / normal, ensuring that the test environment is consistent with the field. Opto-isolation and signal acquisition mechanism: Optical isolation devices are used to achieve electrical isolation and acquisition of status signals (such as remote signaling information), thereby improving the system's anti-interference capability; By triggering MCU interrupts through optocoupler position changes, real-time capture and reporting of state changes are achieved, ensuring the timeliness and accuracy of test responses.

[0029] S200: Automatically schedule and execute the reconfigurable hardware system of the relay matrix according to the test instructions issued by the host computer; like Figure 7 As shown, the test plan is automatically scheduled and executed: The host computer has a built-in programmable test sequence, which automatically calls the corresponding test logic according to different test items (such as 24V voltage level test, manual closing test, and anti-pumping function test); Sending instructions to the lower-level device via IIC / serial port [1] communication enables unmanned operation of the test process, replacing the traditional manual operation of buttons, switching gears and recording results. The instructions sent include: voltage level test instructions, manual closing automatic test instructions, and anti-pumping function automatic test instructions. The adjustment method for the 24V voltage level test is as follows: The host computer selects the 24V test voltage level and sends a shift command to the voltage level testing device. The shift command is used to instruct the MCU in the testing device to generate and output an activation signal corresponding to the 24V level. The voltage level testing device receives the 24V range activation signal, controls the corresponding relay to activate the 24V test-dedicated analog coil and resistor circuit, and simultaneously adjusts the power supply voltage to 24V. After confirming that the relay has activated and the corresponding circuit branch is conducting, the testing device sends a signal to the MCU to complete the shift by changing the position of the optocoupler signal; the MCU then sends a shift success message to the host computer.

[0030] After receiving the successful gear shift information, the host computer sends a power supply command to the power supply to control the power supply to output the 24V gear voltage.

[0031] The power supply begins supplying power according to the power supply command, thereby completing the test preparation for the 24V voltage level.

[0032] The method for automating the manual closing of the operating circuit module includes the following steps: The host computer sends a shift command to the testing device, instructing the MCU in the testing device to generate a manual signal to activate the gear. The testing device controls the corresponding relay to switch to manual signal state based on the activation signal of the manual signal position.

[0033] After the circuit corresponding to the manual signal state is turned on, the test device detects the completion of the state change through the optical coupler signal change and sends a successful gear shift message back to the host computer.

[0034] After receiving the successful shift information, the host computer sends a single closing button trigger signal to the test device; the MCU in the test device generates and outputs a closing button opening signal with a duration of 1 second based on this signal.

[0035] The closing test device controls the closing button relay to switch to the closed state and maintain it for 1 second after the closing button is activated, based on the closing button's activation signal, thus simulating a momentary pressing operation of the closing button by a human.

[0036] After the test is completed, the voltage level test device collects the status information of the remote signaling during and after the test by detecting the change of the optocoupler signal in the closed and closed state circuits, and reports the remote signaling status to the host computer.

[0037] The host computer compares the received remote signaling status with the preset expected result; if the remote signaling status meets the expected result, the manual closing test is deemed qualified and the next test is automatically started; if it does not meet the expected result, the test is deemed unqualified, the result is recorded and the subsequent test process continues.

[0038] An automated testing method for the anti-pumping function of the operating loop module includes the following steps: The host computer sends the first shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an activation signal for the anti-jump output gear.

[0039] The anti-jump function testing device controls the corresponding relay to switch to the anti-jump output state according to the opening signal of the anti-jump output position; After the circuit corresponding to the anti-jump output state is turned on, the anti-jump function test device detects the completion of the state change through the optical coupler signal change and feeds back the first gear shift success information to the host computer.

[0040] After receiving the first successful gear shift information, the host computer sends a single closing button trigger signal to the closing test device; the MCU in the closing test device generates and outputs a closing button opening signal with a duration of 1 second.

[0041] The closing test device controls the closing relay switch to switch to the closed state according to the closing button opening signal and maintains it for 1 second before resuming, simulating an instantaneous pressing operation of the closing button.

[0042] The host computer sends a second shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an open signal for the normal output gear.

[0043] The anti-jump function testing device controls the corresponding relay to switch to the normal output state based on the opening signal of the normal output position.

[0044] After the circuit corresponding to the normal output state is turned on, the operation loop module detects the completion of the state change through the optocoupler signal change and feeds back the second gear shift success information to the host computer.

[0045] The closing test device controls the closing relay switch and the opening relay switch to the continuously closed state. The closing test device collects and reports the remote signaling status of the interlocking, closing, opening, closing action and opening action to the host computer in real time. The host computer compares the received remote signaling status with the first preset expected result. If the status meets the expectation, the test continues. If it does not meet the expectation, the anti-pumping test is deemed unqualified, the result is recorded and the test proceeds to the next test item.

[0046] The closing test device controls the closing button relay and the opening button relay to switch to the off state. The closing test device collects and reports the remote signaling status of the interlocking, closing, opening, closing action and opening action to the host computer again. The host computer compares the remote signaling status received again with the second preset expected result. If the status meets the expectation, the anti-pumping test is deemed qualified and the next test is automatically started. If it does not meet the expectation, the anti-pumping test is deemed unqualified, the result is recorded and the subsequent test process continues.

[0047] S300: The host computer receives the execution results of the reconfigurable hardware system of the relay matrix and compares them with the preset expectations to generate an evaluation report. The system receives real-time status information from the testing device (such as relay action completion signals and remote signaling change signals). The host computer automatically compares the feedback data with the preset expected state and generates a "pass / fail" judgment, completely avoiding the subjective error introduced by manual visual identification; All test commands, response data, and judgment results are automatically recorded to form a structured test log; It supports one-click generation of test reports, meeting the needs of quality traceability and standardized management.

[0048] In summary, compared with traditional manual testing methods; This invention achieves full automation of the testing process, significantly improving testing efficiency. Based on comparative test data from actual production environments, the complete testing time for a single operating loop module is reduced from 15-20 minutes to 3-5 minutes, an efficiency improvement of approximately 75-85%. This is mainly due to the automatic matching of test plans, the automatic progression of test items, and the automatic generation of test results, eliminating the intervals and operational delays inherent in manual operations.

[0049] Significant improvement in test accuracy: Through a precise automatic voltage matching mechanism and standardized testing procedures, this invention effectively avoids problems such as voltage mismatch, omissions in testing steps, or incorrect sequences caused by human factors. Statistical analysis of 300 samples showed that the accuracy of the test results increased from approximately 95% using traditional methods to over 99.5%, while the false positive rate decreased to below 0.5%. Particularly in complex functional verifications such as anti-bounce testing, the system can accurately capture millisecond-level timing changes, a level of precision difficult to achieve through manual observation.

[0050] Completeness and consistency of test coverage: This invention can automatically execute a complete test sequence, including closing hold, opening hold, anti-pumping test, and disconnection test, ensuring that each module undergoes identical test conditions and standards. Practical application shows that the test scheme covers all key functional verifications across four voltage levels: DC24V, 48V, 110V, and 220V. The test results show good consistency, with test deviations between different batches of products less than 1%.

[0051] Significant reduction in labor costs and improvement in labor intensity: Traditional testing methods require specialized technicians to operate, observe, and record data, while this invention allows ordinary operators to complete all testing tasks. On the actual production line, the number of personnel needed for testing positions is reduced from 2 per shift to 0.5 (while also handling other tasks), while completely eliminating errors and omissions that may occur with manual recording, significantly reducing labor intensity and skill requirements.

[0052] Enhanced equipment safety and testing realism: By automatically selecting and matching the analog coil parameters with precise voltage levels, this invention effectively prevents the risk of equipment damage due to voltage mismatch. Test data shows that the electrical characteristics of the analog coil match the actual equipment in the field with a degree of over 98%, accurately replicating the field operating conditions and identifying potential defects in advance.

[0053] Optimization of energy and resource utilization: Compared to traditional testing methods that require preparing multiple sets of test fixtures, this invention achieves the shared use of test resources through a relay switching system, reducing equipment investment costs by approximately 60% and also reducing standby time and energy consumption caused by replacing test devices.

[0054] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0055] The various embodiments in this specification are described in a related manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0056] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. An automated detection method for an operating loop module, characterized in that, Includes the following steps: S100: Construct a reconfigurable hardware system for a relay matrix and issue test commands based on a host computer control platform; S200: Automatically schedule and execute the reconfigurable hardware system of the relay matrix according to the test instructions issued by the host computer; The S300 and host computer receive the execution results of the reconfigurable hardware system of the relay matrix and compare them with the preset expectations to generate an evaluation report.

2. The automated detection method for the operating loop module according to claim 1, characterized in that, The reconfigurable hardware system for the relay matrix in step S100 includes: Voltage level testing device, closing testing device, operating circuit module, and anti-pumping function testing module; the voltage level testing device is connected to the closing testing device, the output of the closing testing device is connected to the operating circuit module, and the output of the operating circuit module is connected to the anti-pumping function testing device. The voltage level testing device includes: a communication control device, a control device power supply, an optocoupler control circuit, an optocoupler feedback circuit, and a multi-channel relay coil and relay switch section. The power supply of the communication control device is connected to the power supply of the control device. The power supply of the control device is connected to the multi-channel optocoupler control circuit and the optocoupler feedback circuit, which are responsible for powering the circuit. The optocoupler control circuit is connected to the corresponding relay coil. The optocoupler feedback circuit is connected to the test result output relay switch. The test result output relay switch and the multi-channel relay coil are connected to the closing test device.

3. The automated detection method for the operating loop module according to claim 2, characterized in that, The anti-jump function testing device includes: a simulated coil testing circuit, a test result feedback circuit, a relay switch section, a test relay switch, a test result output relay coil, and an output knob unit. The test relay switches include conventional test relay switches, holding test relay switches, and open circuit test relay switches. One end of the open circuit test relay switch is connected to the conventional test relay switch and the holding test relay switch, and the other end is connected to the test result output relay coil. The conventional test relay switch and the holding test relay switch are connected in series in the analog coil test circuit, and the other end of the analog coil test circuit is connected to the relay switch section. The analog coil test circuit includes: a 24V analog coil test line, a 48V analog coil test line, a 110V analog coil test line, and a 220V analog coil test line; the relay switch section includes: a 24V relay switch, a 48V relay switch, a 110V relay switch, and a 220V relay switch; the multi-channel analog coil test line is connected to the relay switch corresponding to the voltage. The relay switch section is connected to the outlet knob unit, and the outlet knob unit is connected to the operation circuit module.

4. The automated detection method for the operating loop module according to claim 2, characterized in that, The communication control device includes: The communication control device communicates with the host computer and controls the optocoupler control circuit according to the host computer's instructions; the I / O port of the MCU chip in the communication control device is connected to the YK terminal of each relay in the optocoupler control circuit unit, and the MCU chip and the optocoupler control circuit share a common ground; The secondary YKST port of the optocoupler control circuit is connected to the relay coil section and is used to control the closing and opening of the corresponding relay switching unit to achieve the function of switching different test circuits.

5. The automated detection method for the operating loop module according to claim 1, characterized in that, The automatic scheduling and execution method of the relay matrix reconfigurable hardware system in step S200 includes: The host computer automatically calls the corresponding test logic according to different test items through the built-in programming test sequence, and sends instructions to the lower device for adjustment through IC serial communication. The sent instructions include: voltage level test instructions, manual closing automatic test instructions, and anti-pumping function automatic test instructions. The adjustment method for the voltage level test command is as follows: The host computer selects the 24V test voltage level and sends a shift command to the voltage level test device, which causes the MCU in the test device to generate and output an activation signal corresponding to the 24V level. The voltage level testing device receives the 24V range activation signal, controls the corresponding relay to activate the 24V test-dedicated analog coil and resistor circuit, and simultaneously adjusts the power supply voltage to 24V. After confirming that the relay has activated and the corresponding circuit branch is conducting, the testing device sends a signal to the MCU to complete the shift by changing the position of the optocoupler signal; the MCU then sends a shift success message to the host computer. After receiving the successful gear shift information, the host computer sends a power supply command to the power supply to control the power supply to output the 24V gear voltage. The power supply begins supplying power according to the power supply command, completing the test preparation for the 24V voltage level.

6. The automated detection method for the operating loop module according to claim 5, characterized in that, The adjustment methods for the automated test commands for the anti-jump function include: The host computer sends the first shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an activation signal for the anti-jump output gear; The anti-jump function testing device controls the corresponding relay to switch to the anti-jump output state according to the opening signal of the anti-jump output position; After the circuit corresponding to the anti-jump output state is turned on, the anti-jump function test device detects the completion of the state change through the optical coupler signal change and feeds back the first gear shift success information to the host computer. After receiving the first successful gear shift information, the host computer sends a single closing button trigger signal to the closing test device; the MCU in the closing test device generates and outputs a closing button opening signal with a duration of 1 second accordingly. The closing test device controls the closing relay switch to switch to the closed state according to the closing button opening signal and maintains it for 1 second before resuming, simulating an instantaneous pressing operation of the closing button; The host computer sends a second shift command to the anti-jump function test device, instructing the MCU in the anti-jump function test device to generate an open signal for the normal output gear. The anti-jump function testing device controls the corresponding relay to switch to the normal output state based on the opening signal of the normal output position; After the circuit corresponding to the normal output state is turned on, the operation loop module detects the completion of the state change through the optocoupler signal change and feeds back the second gear shift success information to the host computer. The closing test device controls the closing relay switch and the opening relay switch to the continuously closed state. The closing test device collects and reports the remote signaling status of the interlocking, closing, opening, closing action and opening action to the host computer in real time. The host computer compares the received remote signaling status with the first preset expected result. If the status meets the expectation, the test continues. If it does not meet the expectation, the anti-pumping test is deemed unqualified.

7. The automated detection method for the operating loop module according to claim 5, characterized in that, The adjustment methods for manual closing automatic test commands include: The host computer sends a shift command to the testing device, instructing the MCU in the testing device to generate a manual signal to activate the gear. The testing device controls the corresponding relay to switch to manual signal state based on the activation signal of the manual signal position; After the circuit corresponding to the manual signal state is turned on, the test device detects the completion of the state change through the optical coupler signal change and sends a successful gear shift message back to the host computer. After receiving the successful gear shift information, the host computer sends a single closing button trigger signal to the test device; the MCU in the test device generates and outputs a closing button opening signal with a duration of 1 second based on this signal. The closing test device controls the closing button relay to switch to the closed state and maintain it for 1 second after the closing button is activated, based on the closing button activation signal, to simulate a momentary pressing operation of the closing button by a human. After the test is completed, the voltage level test device detects the change of the optocoupler signal in the closed and closed state circuits, collects the status information of the closed remote signaling and the closed remote signaling, and reports the remote signaling status to the host computer. The host computer compares the received remote signaling status with the preset expected result; if the remote signaling status meets the expected result, the manual closing test is deemed qualified and the next test is automatically started; if it does not meet the expected result, the test is deemed unqualified and the result is recorded.

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