Channel fault detection and positioning processing method, system and platform based on decision feedback equalizer tap coefficient, and storage medium

Abstract

The invention discloses a channel fault detection and positioning processing method, system and platform based on a decision feedback equalizer tap coefficient and a storage medium, first data corresponding to a decision feedback equalizer is created and acquired, and based on the first data, an abnormal tap coefficient corresponding to channel reflection and an index thereof are identified; based on the index of the abnormal tap coefficient, calculating and generating second data corresponding to the reflection point; screening, eliminating and processing false reflection points caused by multiple reflections, and generating and outputting corresponding third data; according to the method, the system, the platform and the storage medium corresponding to the method, on the premise of not increasing any hardware cost and not depending on an external special test instrument, detection, positioning and property preliminary judgment of fault points such as impedance discontinuity in a high-speed signal transmission channel are achieved by reading and analyzing an existing DFE tap coefficient in a SerDes receiving end chip, and the fault points can be accurately and accurately detected. Therefore, the test cost is reduced, and the production test and field operation efficiency is improved.

Description

Technical Field

[0001] This invention belongs to the field of high-speed digital communication technology, specifically relating to a channel fault detection and location processing method, system, platform, and storage medium based on the tap coefficient of a decision feedback equalizer. Background Technology

[0002] In high-speed SerDes communication systems (such as PCIe, Ethernet, USB, etc.), when signals pass through printed circuit board (PCB) traces, connectors, cables, and other transmission media, inter-symbol interference (ISI) occurs due to factors such as impedance discontinuities, dielectric loss, and reflections. This leads to eye diagram closure, increased bit error rate, and severely impacts system performance and reliability. Therefore, integrity testing and fault location of signal transmission channels are crucial during product development, production, and maintenance phases.

[0003] Traditional methods for signal integrity fault detection and location mainly include vector network analyzers (VNAs) and time domain reflectometers (TDRs), as well as eye diagram and bit error rate (BER) testing. Instruments like VNAs and TDRs can accurately measure the frequency domain S-parameters or time domain reflection waveforms of a channel, thereby locating impedance discontinuities. However, they are extremely expensive, complex to operate, require professional calibration and de-embedding, and cannot be performed online while the system is powered on, limiting their application primarily to research and development laboratory environments. Eye diagram and BER testing can determine whether the overall channel performance meets standards by observing the eye diagram or statistically analyzing the BER, but this method only provides a "pass / fail" conclusion and cannot precisely locate the physical location of the fault, offering limited assistance in troubleshooting specific board-level or cable-level defects.

[0004] With the continuous increase in data rates (e.g., 56Gbps, 112Gbps and above), the impact of channel loss and reflection is becoming increasingly significant, making the demand for low-cost, high-efficiency, and online-operable fault location technologies increasingly urgent. Existing SerDes chips generally integrate powerful adaptive equalizers, such as continuous-time linear equalizers (CTLE) and decision feedback equalizers (DFE), to compensate for channel impairments. Among them, DFE eliminates ISI caused by past symbols through feedback loops, and its tap coefficients directly reflect the impulse response characteristics of the channel. However, currently, the industry only uses these coefficients for real-time signal recovery, and no technology has yet been found to systematically use them for reverse diagnosis of physical channel faults themselves.

[0005] Therefore, in view of the above-mentioned technical problems and defects, there is an urgent need to design and develop a channel fault detection and location processing method, system, platform and storage medium based on the tap coefficient of the decision feedback equalizer. Summary of the Invention

[0006] To overcome the shortcomings and difficulties of the existing technology, the present invention aims to provide a channel fault detection and location processing method, system, platform and storage medium based on the tap coefficient of the decision feedback equalizer, so as to utilize existing chip resources, without the need for additional expensive instruments, and to achieve accurate fault location under conditions of no service interruption or slight interruption.

[0007] The first objective of this invention is to provide a channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer; the second objective of this invention is to provide a channel fault detection and location processing system based on the tap coefficients of a decision feedback equalizer; the third objective of this invention is to provide a channel fault detection and location processing platform based on the tap coefficients of a decision feedback equalizer; and the fourth objective of this invention is to provide a computer-readable storage medium.

[0008] The first objective of this invention is achieved as follows: the method comprises:

[0009] Create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0010] Based on the index of the abnormal tap coefficient, second data corresponding to the reflection point is calculated and generated; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0011] False reflection points caused by multiple reflections are filtered and removed, and corresponding third data is generated and output; wherein, the third data is the actual location of the fault point.

[0012] Furthermore, the step of creating and acquiring first data corresponding to the decision feedback equalizer, and identifying anomalous tap coefficients and their indices corresponding to channel reflections based on the first data, further includes:

[0013] The decision feedback equalizer is enabled and converged at the high-speed serial deserializer SerDes receiver, and the gain of the linear equalizer is fixed. A first preset threshold corresponding to the gain of the linear equalizer is created; wherein, the first preset threshold is a preset golden value.

[0014] The first data corresponding to the decision feedback equalizer is obtained in batches through the debugging interface, and the first data is preprocessed; wherein, the preprocessing includes noise reduction processing and / or temperature compensation processing.

[0015] Furthermore, the step of acquiring the first data corresponding to the decision feedback equalizer in batches through the debugging interface and preprocessing the first data further includes:

[0016] The first data is normalized and compensated based on the difference between the current chip temperature and the reference temperature; wherein, the normalization and compensation process includes absolute reference compensation or relative reference compensation.

[0017] The formula for calculating the absolute reference compensation is as follows:

[0018] (1)

[0019] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature;

[0020] The formula for calculating the relative benchmark compensation is as follows:

[0021] (2)

[0022] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature; This is the reference temperature.

[0023] Furthermore, the step of creating and acquiring first data corresponding to the decision feedback equalizer, and identifying anomalous tap coefficients and their indices corresponding to channel reflections based on the first data, further includes:

[0024] Create fourth data corresponding to the first data; wherein, the fourth data is statistical feature data of the absolute values ​​of the tap coefficient sequence; the statistical feature data includes at least the mean and standard deviation;

[0025] Based on the fourth data, a second preset threshold is dynamically generated, and based on the second preset threshold, a fifth data corresponding to the decision feedback equalizer is identified and generated; wherein, the second preset threshold is a detection threshold, the detection threshold is the mean plus N times the standard deviation, and N is a positive integer greater than or equal to 3; the fifth data is abnormal tap coefficient data.

[0026] Furthermore, the step of calculating and generating second data corresponding to the reflection point based on the index of the abnormal tap coefficient further includes:

[0027] Calculate the electrical distance between the generated reflection point and the receiver in the transmission channel, using the following formula:

[0028] (3)

[0029] in, This is an abnormal Tap index. In units of bit time, The speed at which the signal propagates in the medium.

[0030] Furthermore, the process of filtering and eliminating false reflection points caused by multiple reflections, and generating and outputting corresponding third data, also includes:

[0031] Based on the electrical distance and reflection energy corresponding to each candidate reflection point, false reflection points that satisfy the multiple reflection characteristics are identified and eliminated; wherein, the multiple reflection characteristics include that the electrical distance between at least two candidate reflection points is approximately an integer multiple relationship, and the reflection energy approximately conforms to an exponential decay relationship of the corresponding number of times;

[0032] The electrical distance corresponding to the third data is mapped to the physical design layout, and the corresponding and specific fault physical structure is identified.

[0033] The second objective of this invention is achieved as follows: the system is used to implement the channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer, the system comprising:

[0034] A data creation and processing unit is used to create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0035] The data calculation and generation unit is used to calculate and generate second data corresponding to the reflection point based on the index of the abnormal tap coefficient; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0036] The data output generation unit is used to filter and eliminate false reflection points caused by multiple reflections, and generate and output corresponding third data; wherein, the third data is the actual fault location.

[0037] Furthermore, the data creation processing unit further includes:

[0038] The first generation module is used to enable and converge the decision feedback equalizer at the high-speed serial deserializer SerDes receiver, fix the gain of the linear equalizer, and create a first preset threshold corresponding to the gain of the linear equalizer; wherein, the first preset threshold is a preset golden value.

[0039] The first processing module is used to acquire first data corresponding to the decision feedback equalizer in batches through the debugging interface, and preprocess the first data; wherein, the preprocessing includes noise reduction processing and / or temperature compensation processing;

[0040] The second generation module is used to create fourth data corresponding to the first data; wherein the fourth data is statistical feature data of the absolute value of the tap coefficient sequence; the statistical feature data includes at least the mean and standard deviation;

[0041] The third generation module is used to dynamically generate a second preset threshold based on the fourth data, and to identify and generate fifth data corresponding to the decision feedback equalizer according to the second preset threshold; wherein, the second preset threshold is a detection threshold, the detection threshold is the mean plus N times the standard deviation, and N is a positive integer greater than or equal to 3; the fifth data is abnormal tap coefficient data;

[0042] And / or, the first processing module further includes:

[0043] The second processing module is used to normalize and compensate the first data based on the difference between the current chip temperature and the reference temperature; wherein, the normalization and compensation processing includes absolute reference compensation or relative reference compensation.

[0044] The formula for calculating the absolute reference compensation is as follows:

[0045] (1)

[0046] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature;

[0047] The formula for calculating the relative benchmark compensation is as follows:

[0048] (2)

[0049] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature; Reference temperature;

[0050] And / or, the data calculation and generation unit further includes:

[0051] The first calculation module is used to calculate the electrical distance between the generated reflection point and the receiving end in the transmission channel, wherein the calculation formula is:

[0052] (3)

[0053] in, This is an abnormal Tap index. In units of bit time, The speed at which a signal propagates in a medium;

[0054] And / or, the data output generation unit further includes:

[0055] The third processing module is used to identify and eliminate false reflection points that satisfy the multiple reflection characteristics based on the electrical distance and reflection energy corresponding to each candidate reflection point; wherein, the multiple reflection characteristics include that the electrical distance between at least two candidate reflection points is approximately an integer multiple relationship, and the reflection energy approximately conforms to an exponential decay relationship of the corresponding number of times;

[0056] The identifier generation module is used to map the electrical distance corresponding to the third data to the physical design layout and to generate corresponding and specific fault physical structures.

[0057] The third objective of this invention is achieved as follows: it includes a processor, a memory, and a channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer; wherein the channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer is executed on the processor, the channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer is stored in the memory, and the channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer implements the channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer.

[0058] The fourth objective of this invention is achieved as follows: the computer-readable storage medium stores a channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer, and the channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer implements the channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer.

[0059] This invention creates and acquires first data corresponding to a decision feedback equalizer (DFFE) through a method, and identifies abnormal tap coefficients and their indices corresponding to channel reflections based on the first data. The first data is a sequence of tap coefficients. Based on the indices of the abnormal tap coefficients, second data corresponding to the reflection point is calculated and generated. The second data is the electrical distance between the reflection point and the receiver in the transmission channel. False reflection points caused by multiple reflections are filtered and eliminated, and corresponding third data is generated and output. The third data represents the actual fault location, along with the corresponding system, platform, and storage medium. Without increasing any hardware costs or relying on external dedicated test instruments, this invention achieves the detection, location, and preliminary judgment of fault points such as impedance discontinuities in high-speed signal transmission channels by reading and analyzing the existing DFE tap coefficients within the SerDes receiver chip. This reduces testing costs and improves production testing and field maintenance efficiency.

[0060] In other words, this invention constructs a complete "software-defined" channel diagnostic system by reusing the tap coefficients of the decision feedback equalizer (DFE) already built inside the high-speed SerDes chip. This achieves online high-precision fault location with zero hardware addition cost and no or minimal service interruption. The method effectively replaces traditional, expensive, and complex vector network analyzers (VNAs) and time domain reflectometers (TDRs). It can not only determine link continuity but also locate impedance discontinuities in PCB traces, connectors, or cables with centimeter-level accuracy. It also effectively suppresses false signals such as secondary reflections. Combined with design documents, it can automatically map to specific physical structures, thereby extending high-precision signal integrity testing capabilities from the laboratory to production testing and field maintenance, reducing the testing threshold and the overall lifecycle maintenance cost. Attached Figure Description

[0061] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0062] Figure 1 This is a schematic diagram of the process steps of a channel fault detection and location processing method based on the tap coefficient of a decision feedback equalizer according to the present invention.

[0063] Figure 2 This is a schematic diagram of the channel fault detection and location processing system architecture based on the tap coefficients of a decision feedback equalizer according to the present invention.

[0064] Figure 3This is a schematic diagram of a channel fault detection and localization processing platform based on the tap coefficients of a decision feedback equalizer according to the present invention.

[0065] Figure 4 This is a schematic diagram of a computer-readable storage medium architecture in one embodiment of the present invention. Detailed Implementation

[0066] To facilitate a clearer understanding of the objectives, technical solutions, and advantages of this invention, the invention will be further described below in conjunction with the accompanying drawings and specific embodiments. Those skilled in the art can easily understand other advantages and effects of this invention from the content disclosed in this specification.

[0067] This invention can also be implemented or applied through other different specific examples, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of this invention.

[0068] It should be noted that if the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0069] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Secondly, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0070] Preferably, the channel fault detection and location processing method based on the tap coefficient of a decision feedback equalizer of the present invention is applied in one or more terminals or servers. The terminal is a device capable of automatically performing numerical calculations and / or information processing according to pre-set or stored instructions, and its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), digital signal processors (DSPs), embedded devices, etc.

[0071] The terminal can be a desktop computer, laptop, handheld computer, or cloud server, etc. The terminal can interact with the customer via a keyboard, mouse, remote control, touchpad, or voice control device.

[0072] This invention provides a method, system, platform, and storage medium for channel fault detection and location processing based on the tap coefficients of a decision feedback equalizer.

[0073] like Figure 1 The diagram shown is a flowchart of a channel fault detection and localization method based on the tap coefficients of a decision feedback equalizer provided in an embodiment of the present invention.

[0074] In this embodiment, the channel fault detection and location processing method based on the tap coefficient of the decision feedback equalizer can be applied to a terminal with display function or a fixed terminal. The terminal is not limited to personal computers, smartphones, tablets, desktop computers or all-in-one computers with cameras, etc.

[0075] The channel fault detection and location processing method based on the tap coefficients of the decision feedback equalizer can also be applied to a hardware environment consisting of a terminal and a server connected to the terminal via a network. The network includes, but is not limited to, a wide area network (WAN), a metropolitan area network (MAN), or a local area network (LAN). The channel fault detection and location processing method based on the tap coefficients of the decision feedback equalizer in this embodiment of the invention can be executed by the server, by the terminal, or by both the server and the terminal.

[0076] For example, for terminals requiring channel fault detection and location processing based on decision feedback equalizer tap coefficients, the channel fault detection and location processing function based on decision feedback equalizer tap coefficients provided by the method of this invention can be directly integrated into the terminal, or a client for implementing the method of this invention can be installed. Alternatively, the method provided by this invention can also run on servers or other devices in the form of a Software Development Kit (SDK), providing an interface for the channel fault detection and location processing function based on decision feedback equalizer tap coefficients. Terminals or other devices can then implement the channel fault detection and location processing function based on decision feedback equalizer tap coefficients through the provided interface. The invention will be further described below with reference to the accompanying drawings.

[0077] like Figure 1 As shown, this invention provides a channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer. The method includes the following steps:

[0078] S01. Create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0079] S02. Based on the index of the abnormal tap coefficient, calculate and generate second data corresponding to the reflection point; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0080] S03. Filter and remove false reflection points caused by multiple reflections, and generate and output the corresponding third data; wherein, the third data is the actual location of the fault point.

[0081] The step of creating and acquiring first data corresponding to the decision feedback equalizer, and identifying anomalous tap coefficients and their indices corresponding to channel reflections based on the first data, further includes:

[0082] S011. Enable and converge the decision feedback equalizer at the high-speed serial deserializer SerDes receiver, fix the gain of the linear equalizer, and create a first preset threshold corresponding to the gain of the linear equalizer; wherein, the first preset threshold is a preset golden value.

[0083] S012. Obtain the first data corresponding to the decision feedback equalizer in batches through the debugging interface, and preprocess the first data; wherein, the preprocessing includes noise reduction processing and / or temperature compensation processing.

[0084] The step of batch acquiring the first data corresponding to the decision feedback equalizer through the debugging interface and preprocessing the first data further includes:

[0085] S0121. Based on the difference between the current chip temperature and the reference temperature, the first data is normalized and compensated; wherein, the normalization and compensation process includes absolute reference compensation or relative reference compensation.

[0086] The formula for calculating the absolute reference compensation is as follows:

[0087] (1)

[0088] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature;

[0089] The formula for calculating the relative benchmark compensation is as follows:

[0090] (2)

[0091] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature; This is the reference temperature.

[0092] The step of creating and acquiring first data corresponding to the decision feedback equalizer, and identifying anomalous tap coefficients and their indices corresponding to channel reflections based on the first data, further includes:

[0093] S013. Create and generate fourth data corresponding to the first data; wherein, the fourth data is statistical feature data of the absolute value of the tap coefficient sequence; the statistical feature data includes at least the mean and standard deviation;

[0094] S014. Based on the fourth data, dynamically generate a second preset threshold, and according to the second preset threshold, identify and generate fifth data corresponding to the decision feedback equalizer; wherein, the second preset threshold is a detection threshold, the detection threshold is the mean plus N times the standard deviation, and N is a positive integer greater than or equal to 3; the fifth data is abnormal tap coefficient data.

[0095] The step of calculating and generating second data corresponding to the reflection point based on the index of the abnormal tap coefficient further includes:

[0096] S021. Calculate the electrical distance between the generated reflection point and the receiving end in the transmission channel; where the calculation formula is:

[0097] (3)

[0098] in, This is an abnormal Tap index. In units of bit time, The speed at which the signal propagates in the medium.

[0099] The process of filtering and eliminating false reflection points caused by multiple reflections, and generating and outputting corresponding third data, also includes:

[0100] S031. Based on the electrical distance and reflection energy corresponding to each candidate reflection point, identify and eliminate false reflection points that satisfy the multiple reflection characteristics; wherein, the multiple reflection characteristics include that the electrical distance between at least two candidate reflection points is approximately an integer multiple relationship, and the reflection energy approximately conforms to an exponential decay relationship of the corresponding number of times;

[0101] S032. Map the electrical distance corresponding to the third data to the physical design layout, and identify and generate the corresponding and specific fault physical structure.

[0102] Specifically, this invention provides a method for testing high-speed signal transmission media, where the high-speed signal transmission media is a medium capable of transmitting high-speed signals, such as PCBs and cables. The technical principle is as follows: In a high-speed SerDes link, when a signal passes through PCB traces, connectors, cables, etc., if it encounters impedance discontinuities (e.g., vias, pad oxidation, poor connector crimping), reflected waves will be generated. These reflected waves return to the receiving end after a delay, forming inter-symbol interference (ISI). The core function of a decision feedback equalizer is to eliminate ISI; its internal Tap value is proportional to the "residual voltage at a certain point in the past." Therefore, an abnormally large Tap value indicates a strong reflection at the corresponding time point; and time can be converted into distance, thus forming a complete positioning chain of "Tap index ←→ time delay ←→ physical location," requiring no TDR, no power interruption, and zero hardware cost.

[0103] The method includes the following steps: enabling the decision feedback equalizer at the SerDes receiver and bringing it to converge, then fixing the linear equalization; reading the decision feedback equalizer Tap value sequence ( , ,..., ); Identify abnormal Tap values ​​(such as | (|>threshold)

[0104] Based on the Tap index k, calculate the distance from the fault point to the receiver:

[0105] (3)

[0106] In the formula: This is an abnormal Tap index. In units of bit time, The speed at which the signal propagates in the medium.

[0107] Using specific criteria, ghost images and secondary reflections are filtered out, retaining only the true fault point. The fault location L is output, along with the corresponding physical structure (such as vias, connectors, capacitors, etc.).

[0108] Preferably, the method for testing a high-speed signal transmission medium is provided, and the detailed steps are as follows:

[0109] Enable and converge the decision feedback equalizer. After power-on, first configure the SerDes receiver to decision feedback equalizer mode (different from pure linear equalizer mode) and enable the decision feedback equalizer adaptive function.

[0110] The transmitter sends a long pseudo-random code stream, such as a PRBS31 code stream, to ensure that the spectrum is rich enough to excite all reflection frequencies.

[0111] Poll the convergence completion flags inside the chip (such as RX_ADAPT_DONE, ADAPT_DONE, etc.) until the decision feedback equalizer coefficients converge (usually <5ms).

[0112] Depending on the chip type, some chips allow switching the decision feedback equalizer from "adaptive mode" to "fixed mode" via register settings. After the tap coefficients converge, they are locked and then read. This prevents the coefficients from changing during the reading process.

[0113] Fixed linear equalization is not supported by most high-end SerDes systems, which do not allow completely disabling adaptive linear equalization in decision feedback equalizer mode. Without fixed linear equalization, it may compete with the decision feedback equalizer for energy, leading to batch-to-batch discrepancies in the Tap value and an inability to unify the threshold. A fixed method involves writing the Golden value (derived from statistics of good products in the same batch) into the linear equalization gain register and then setting the freeze gain register (e.g., CTLE_FREEZE) to 1.

[0114] Read the Tap value and read the decision feedback equalizer Tap register in batches through debugging interfaces such as I2C, MDIO, SPI, and JTAG.

[0115] Each Lane is stored as an array H[k], where k=1,2,...,N (N≤256). k is the "time scale". k=1 corresponds to 1 UI, k=2 corresponds to 2 UI, and so on.

[0116] For noise reduction, to eliminate the influence of random noise, the Tap value can be read multiple times and averaged to obtain a more stable and reliable result. For example, after reading the Tap value 10 times consecutively, the maximum and minimum values ​​are removed once each, and the average of the remaining 8 values ​​is taken to obtain the result. .

[0117] Temperature compensation is necessary because copper loss increases systematically with temperature, causing the Tap value to systematically increase. Normalization is essential to prevent defective products from being mistakenly rejected. Two temperature compensation schemes exist: absolute reference and relative reference.

[0118] The absolute reference compensation scheme reads the current chip temperature. If the current chip temperature differs from 25℃ by more than 10℃, then temperature compensation is performed.

[0119] (1)

[0120] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The measured temperature of the chip is in °C.

[0121] Relative reference compensation scheme: Read the current chip temperature. If the current chip temperature differs from the previous test temperature or the reference test temperature of this batch by more than 10°C, then perform temperature compensation.

[0122] (2)

[0123] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The measured temperature of the chip is currently in °C. The reference temperature is the temperature of the previous test or the reference test temperature for this batch.

[0124] Different solutions should be selected depending on the testing scenario: an absolute benchmark solution can be used for mass production or R&D testing; a relative benchmark solution can be used for field or operation and maintenance testing. However, the benchmark must be kept consistent throughout the same testing process.

[0125] Identify abnormal Tap values ​​and perform an overall statistical analysis of the absolute values ​​of all decision feedback equalizer Taps under the same batch, the same lane, and the same test conditions (fixed rate, fixed temperature, fixed pattern).

[0126] Calculate the average value ;Specifically:

[0127] (4)

[0128] (5)

[0129] In the formula, M is the number of test objects; j is the j-th test object; N is the total number of taps; k is the k-th tap; and the average value is... This indicates the average residual ISI voltage per UI for this batch of links at 25°C (or the reference temperature). A small value indicates low channel loss, low reflection, and a "healthy" link; A large value indicates high overall insertion loss or batch process drift (thin copper foil, high dielectric roughness, etc.).

[0130] Calculate the standard deviation , specifically:

[0131] (6)

[0132] In the formula: M is the number of the test objects; j is the j-th test object; The value is the average; the standard deviation σ represents the degree of dispersion of the Tap value from the average; a small σ indicates a smooth Tap curve with no abrupt reflections; a large σ indicates the presence of local abrupt changes (vias, connectors, poor soldering).

[0133] The threshold Threshold = μ + 4σ is calculated. If the probability of values ​​outside 4σ is less than 0.3%, they can be considered not as random noise, but as physical structure.

[0134] Identify abnormal Tap values, if Threshold is considered an abnormal reflection peak, and the abnormal index k value is recorded.

[0135] Distance conversion: For each k value marked as an anomaly, calculate its distance from the receiver.

[0136] (7)

[0137] In the formula: k is the k value of the marked anomaly; UI is the unit interval, unit bit time, 8.9ps for 112Gbps, 17.8ps for 56Gbps, and 40ps for 25Gbps; The speed of light propagation in a medium can be calculated using the relationship between the speed of light and the effective dielectric constant of the medium. The effective dielectric constant can be obtained from the medium's specifications. FR4 is approximately 15.24 cm / ns (6 inches / ns); DAC copper cable is approximately 20.3 cm / ns (8 inches / ns). Dividing by 2 is because the actual propagation distance from the transmitter to the fault point and back to the receiver is twice the distance.

[0138] Ghost peak suppression causes reflected waves to bounce back and forth between two impedance abrupt change points, resulting in secondary and tertiary reflections. These echoes arrive at the RX level two or three times later than the main peak, and their energy is much lower. Therefore, it is necessary to distinguish ghosts from real faults to reduce false alarms.

[0139] When multiple flagged anomalies with different k values ​​are detected, the length of each k value is first calculated. Then calculate the energy of each abnormal tap. .

[0140] Sort them by energy and designate the peak with the highest energy as (Main Peak), the other peaks are named in order. , …and then one by one with Compare. (Main peak) is the identified fault point.

[0141] right Perform a judgment, if (Approximately equal to 1 spatial resolution) and (Indicating that the energy is less than 40% of the main peak), then mark it. The image is a ghost and should be removed; it is not considered a fault. This is because, under the limits of spatial resolution, two real faults cannot fall within 1.2 cm. If they do appear and their energy is much lower than the main peak, they can only be sidelobes or quantization noise from the same discontinuity.

[0142] like (Distance ≈ 2 times the main peak, tolerance ±1cm) and If Γ≈0.3 (energy within ±20% of theoretical value), it is considered a secondary reflection, of secondary priority, and can be observed but not considered a fault. This is because the reflected wave will travel back and forth between the fault point and the chip end face once, and then be sampled by RX, corresponding to a time = Therefore, the distance ≈ The energy is reflected twice, with an amplitude of approximately .

[0143] If it does not fall into either of the above two categories, it is considered an independent, genuine fault. Continue the assessment using the same method. …until all abnormal taps have been identified.

[0144] Output fault information, and based on the CAD mapping, identify the taps that are confirmed as actual faults. Convert to the specific fault location L and indicate the corresponding physical structure (such as via, connector, capacitor, etc.).

[0145] You can call PCB CAD APIs (such as Valor, Allegro SKILL, Zuken scripts, etc.) and input the pin coordinates of the receiver. and Measure along the center line of the route Length, returns the nearest device reference number (e.g., "J30", "C102") and its corresponding physical structure.

[0146] Furthermore, a method for testing high-speed signal transmission media is provided, which involves reading the Tap value and calculating the distance, and the UI in the distance calculation formula is closely related to the rate.

[0147] When the medium under test supports multi-rate transmission, the Tap value can be obtained by scanning at different rates through rate switching, thereby realizing scanning at multiple scales on the same hardware, covering a wider range of faults, and improving spatial resolution.

[0148] Specifically,

[0149] (3)

[0150] The spatial resolution at different rates can be obtained from the above formula (k takes the minimum value of 1). Using the commonly used FR4 (approximately 15.24 cm / ns), it can meet different applications:

[0151] rate 1 UI length Spatial resolution use 10G 100ps 0.762cm Low-speed backplane / long-distance link fault location 25G 40ps 0.3048cm Mid-speed board / high-speed connector testing 56G ≈17.86ps ≈0.136cm High-speed SerDes link 112G ≈8.9ps ≈0.068cm Ultra-high-speed link 200G 5ps 0.0381cm High-speed inter-chip interconnect fault location

[0152] For two-dimensional compensation, in common scenarios where temperature is the primary source of tap drift and voltage is maintained by a regulator to prevent voltage jitter, only temperature compensation is performed, with the threshold for abnormal taps being μ+4σ. However, if voltage jitter occurs, simultaneous two-dimensional compensation for both voltage and temperature can be performed. Temperature compensation normalizes the tap value to 25°C, while two-dimensional compensation normalizes the tap value to a reference of 25°C + 1.0V.

[0153] The specific process of two-dimensional compensation is as follows: Synchronous acquisition, within the same clock cycle, simultaneously reading the voltage VDD, temperature, and Tap value. Specifically, the power module outputs the target VDD (±50mV step), the ADC samples the current VDD value (0.1mV resolution), the temperature sensor samples the current chip temperature (0.1°C resolution), and under the same clock cycle, reads the current Tap value through interfaces such as I2C / MDIO; under the same clock cycle, VDD, temperature, and Tap are written into the same data frame. The current VDD and the Tap value under the current temperature are H(V,T).

[0154] Calculate the two-dimensional compensation value:

[0155] (8)

[0156] (9)

[0157] In the formula: The Tap value is after two-dimensional compensation (normalized to a 1.0V+25°C reference). This is the Tap value (uncompensated original value) at the current VDD and current temperature. This refers to the two-dimensional drift amount; The Tap value is the reference value under the conditions of 1.0V and 25°C.

[0158] Calculate the two-dimensional threshold:

[0159] (10)

[0160] In the formula: Two-dimensional threshold; The average value of the tap under reference conditions of 1.0V and 25°C; The standard deviation of Tap is given under reference conditions of 1.0V and 25°C.

[0161] Determine abnormal Tap values:

[0162] (11)

[0163] That is, if the Tap value after two-dimensional compensation is greater than the threshold If a peak is found, it is considered an abnormal reflection peak, and the index value of the abnormal tap is recorded.

[0164] Example:

[0165] Testing a 25Gbps PCB link;

[0166] Initialization parameters are: UI = 1 / 25 = 40ps. =6 inches / ns; Read the Tap value, identify the abnormal Tap index, and confirm that the real faulty Tap index is 12;

[0167] The location of the fault is:

[0168] L=(12×40ps×6 inch / ns) / 2=1.44 inch=1.44×2.54 ≈ 3.66cm

[0169] Upon examining the PCB layout, it was discovered that this location is an AC coupling capacitor pad, confirming it as a point of impedance abrupt change.

[0170] project Old Method (TDR) Method of the present invention Hardware costs >20,000 USD TDR Zero hardware running online Power outage, offline Online without downtime resolution 0.5 cm 0.038 cm (submillimeter level) Coverage 5 cm 0.15 cm ~ 15.24 cm False positive rate >5 % <0.5 % Production line rhythm 30 s <2 s

[0171] Resolution: Resolution is 1 UI length, and 0.038cm is the spatial resolution at a 200Gbps speed.

[0172] The coverage range has a lower limit of 0.15cm, which is the distance at the minimum effective Tap value of 4 for 200G speed (usually starting from the 4th Tap, the first few Taps are initial values ​​and do not participate in fault location), 4*0.038≈0.15; and an upper limit of 15.24cm, which is the distance at the maximum effective Tap value of 20 for 10G speed (10G speed DFE fault location usually only focuses on the first 20 Taps), 20*0.762=15.24.

[0173] The false positive rate, statistically speaking, has a probability of only about 0.3% outside of 4σ (normal distribution), which almost eliminates the interference of random noise. Normalized to a 25°C baseline, the false positive rate is <0.5%.

[0174] Production line cycle time, DFE convergence: <5ms; Tap register reading: <100ms; Denoising / normalization / anomaly detection: software calculation <500ms; Time-distance conversion: <100ms; Total process time <2s.

[0175] To achieve the above objectives, the present invention also provides a channel fault detection and location processing system based on the tap coefficients of a decision feedback equalizer, such as... Figure 2As shown, the system is applied to the channel fault detection and location processing method based on the tap coefficients of the decision feedback equalizer. The system includes:

[0176] A data creation and processing unit is used to create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0177] The data calculation and generation unit is used to calculate and generate second data corresponding to the reflection point based on the index of the abnormal tap coefficient; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0178] The data output generation unit is used to filter and eliminate false reflection points caused by multiple reflections, and generate and output corresponding third data; wherein, the third data is the actual fault location.

[0179] Furthermore, the data creation processing unit further includes:

[0180] The first generation module is used to enable and converge the decision feedback equalizer at the high-speed serial deserializer SerDes receiver, fix the gain of the linear equalizer, and create a first preset threshold corresponding to the gain of the linear equalizer; wherein, the first preset threshold is a preset golden value.

[0181] The first processing module is used to acquire first data corresponding to the decision feedback equalizer in batches through the debugging interface, and preprocess the first data; wherein, the preprocessing includes noise reduction processing and / or temperature compensation processing;

[0182] The second generation module is used to create fourth data corresponding to the first data; wherein the fourth data is statistical feature data of the absolute value of the tap coefficient sequence; the statistical feature data includes at least the mean and standard deviation;

[0183] The third generation module is used to dynamically generate a second preset threshold based on the fourth data, and to identify and generate fifth data corresponding to the decision feedback equalizer according to the second preset threshold; wherein, the second preset threshold is a detection threshold, the detection threshold is the mean plus N times the standard deviation, and N is a positive integer greater than or equal to 3; the fifth data is abnormal tap coefficient data;

[0184] And / or, the first processing module further includes:

[0185] The second processing module is used to normalize and compensate the first data based on the difference between the current chip temperature and the reference temperature; wherein, the normalization and compensation processing includes absolute reference compensation or relative reference compensation.

[0186] The formula for calculating the absolute reference compensation is as follows:

[0187] (1)

[0188] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature;

[0189] The formula for calculating the relative benchmark compensation is as follows:

[0190] (2)

[0191] In the formula, The compensated Tap value; This is the Tap value after noise reduction; The current temperature; Reference temperature;

[0192] And / or, the data calculation and generation unit further includes:

[0193] The first calculation module is used to calculate the electrical distance between the generated reflection point and the receiving end in the transmission channel, wherein the calculation formula is:

[0194] (3)

[0195] in, This is an abnormal Tap index. In units of bit time, The speed at which a signal propagates in a medium;

[0196] And / or, the data output generation unit further includes:

[0197] The third processing module is used to identify and eliminate false reflection points that satisfy the multiple reflection characteristics based on the electrical distance and reflection energy corresponding to each candidate reflection point; wherein, the multiple reflection characteristics include that the electrical distance between at least two candidate reflection points is approximately an integer multiple relationship, and the reflection energy approximately conforms to an exponential decay relationship of the corresponding number of times;

[0198] The identifier generation module is used to map the electrical distance corresponding to the third data to the physical design layout and to generate corresponding and specific fault physical structures.

[0199] The system also includes a decision feedback equalizer convergence module for starting and converging the decision feedback equalizer, a fixed linear equalizer decision feedback equalizer convergence module; a Tap reading module for reading Tap values ​​from the SerDes register, including functions such as noise reduction and temperature compensation; an anomaly detection module for identifying abnormal Tap indices k; and a distance calculation module for calculating distances according to the formula... (3)

[0200] Calculate the distance to the fault.

[0201] There is also a fault filtering module, used to filter out ghost images and secondary reflections based on specific criteria, retaining only the true fault points. A mapping module maps the distance L to the specific location and structure within the PCB layout. An output module outputs information such as fault location and physical structure.

[0202] In the system solution embodiment of the present invention, the specific details of the method steps involved in the channel fault detection and location processing based on the tap coefficient of the decision feedback equalizer have been described above. That is to say, the functional modules in the system are used to implement the steps or sub-steps in the above method embodiment, which will not be repeated here.

[0203] To achieve the above objectives, the present invention also provides a channel fault detection and location processing platform based on the tap coefficients of a decision feedback equalizer, such as... Figure 3 As shown, the system includes a processor, a memory, and a channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer. The processor executes the control program, which is stored in the memory. This control program implements the steps of the channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer, for example:

[0204] S01. Create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0205] S02. Based on the index of the abnormal tap coefficient, calculate and generate second data corresponding to the reflection point; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0206] S03. Filter and remove false reflection points caused by multiple reflections, and generate and output the corresponding third data; wherein, the third data is the actual location of the fault point.

[0207] The specific details of the steps have been explained above and will not be repeated here.

[0208] In this embodiment of the invention, the built-in processor of the channel fault detection and location processing platform based on the tap coefficients of the decision feedback equalizer can be composed of integrated circuits. For example, it can be composed of a single packaged integrated circuit, or multiple integrated circuits with the same or different functions, including combinations of one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and various control chips. The processor connects to various components using various interfaces and lines, and executes programs or units stored in memory, as well as calling data stored in memory, to perform various functions of channel fault detection and location processing based on the tap coefficients of the decision feedback equalizer and to process data.

[0209] The memory is used to store program code and various data. It is installed in the channel fault detection and location processing platform based on the tap coefficients of the decision feedback equalizer and enables high-speed and automatic access to programs or data during operation. The memory includes read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically erasable programmable read-only memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium that can be used to carry or store data.

[0210] To achieve the above objectives, the present invention also provides a computer-readable storage medium, such as... Figure 4As shown, the computer-readable storage medium stores a channel fault detection and location processing platform control program based on the tap coefficients of a decision feedback equalizer. This control program implements the steps of the channel fault detection and location processing method based on the tap coefficients of a decision feedback equalizer; for example:

[0211] S01. Create and acquire first data corresponding to the decision feedback equalizer, and based on the first data, identify the abnormal tap coefficients and their indices corresponding to channel reflections; wherein, the first data is tap coefficient sequence data;

[0212] S02. Based on the index of the abnormal tap coefficient, calculate and generate second data corresponding to the reflection point; wherein, the second data is the electrical distance of the reflection point from the receiving end in the transmission channel;

[0213] S03. Filter and remove false reflection points caused by multiple reflections, and generate and output the corresponding third data; wherein, the third data is the actual location of the fault point.

[0214] The specific details of the steps have been explained above and will not be repeated here.

[0215] In the description of embodiments of the present invention, it should be noted that any process or method description in the flowcharts or otherwise described herein can be understood as representing a module, segment, or portion of code comprising one or more executable instructions for implementing a particular logical function or process, and the scope of the preferred embodiments of the present invention includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order according to the functions involved, as should be understood by those skilled in the art to which the embodiments of the present invention pertain.

[0216] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processing module, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, a “computer-readable medium” can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Furthermore, the computer-readable medium can even be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0217] This invention creates and acquires first data corresponding to a decision feedback equalizer (DFFE) through a method, and identifies abnormal tap coefficients and their indices corresponding to channel reflections based on the first data. The first data is a sequence of tap coefficients. Based on the indices of the abnormal tap coefficients, second data corresponding to the reflection point is calculated and generated. The second data is the electrical distance between the reflection point and the receiver in the transmission channel. False reflection points caused by multiple reflections are filtered and eliminated, and corresponding third data is generated and output. The third data represents the actual fault location, along with the corresponding system, platform, and storage medium. Without increasing any hardware costs or relying on external dedicated test instruments, this invention achieves the detection, location, and preliminary judgment of fault points such as impedance discontinuities in high-speed signal transmission channels by reading and analyzing the existing DFE tap coefficients within the SerDes receiver chip. This reduces testing costs and improves production testing and field maintenance efficiency.

[0218] In other words, this invention constructs a complete "software-defined" channel diagnostic system by reusing the tap coefficients of the decision feedback equalizer (DFE) already built inside the high-speed SerDes chip. This achieves online high-precision fault location with zero hardware addition cost and no or minimal service interruption. The method effectively replaces traditional, expensive, and complex vector network analyzers (VNAs) and time domain reflectometers (TDRs). It can not only determine link continuity but also locate impedance discontinuities in PCB traces, connectors, or cables with centimeter-level accuracy. It also effectively suppresses false signals such as secondary reflections. Combined with design documents, it can automatically map to specific physical structures, thereby extending high-precision signal integrity testing capabilities from the laboratory to production testing and field maintenance, reducing the testing threshold and the overall lifecycle maintenance cost.

[0219] In other words, this invention uses only the chip's existing registers to replace instruments such as TDRs; it has zero hardware cost, yet still meets testing requirements, detecting DUT faults and locating fault positions. Moreover, service traffic is uninterrupted, making it suitable for data center on-site maintenance. Furthermore, it is compatible with high-speed signals, and the Tap value has a very strong correlation with inter-symbol interference (ISI), allowing for reverse calculation of centimeter-level fault locations with a positioning error controlled within 5% (e.g., ≤5cm error for a 1-meter transmission line), meeting board-level / cable-level fault diagnosis needs.

[0220] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements all fall within the scope of protection of the present invention. Therefore, the scope of protection of this patent should be determined by the appended claims.

Claims

1. A method for channel fault detection and localization based on tap coefficients of a decision feedback equalizer, characterized in that, The method comprises: creating and obtaining first data corresponding to the decision feedback equalizer, and identifying abnormal tap coefficients and their indexes corresponding to channel reflections based on the first data; wherein the first data is tap coefficient sequence data; based on the indexes of the abnormal tap coefficients, second data corresponding to the reflection points is calculated and generated; wherein the second data is the electrical distance of the reflection points from the receiving end in the transmission channel; screening and eliminating false reflection points caused by multiple reflections, generating and outputting corresponding third data; wherein the third data is the real fault point position.

2. The method of claim 1, wherein the method further comprises: The creation and acquisition of the first data corresponding to the decision feedback equalizer, and the identification of the abnormal tap coefficients and their indexes corresponding to the channel reflections based on the first data, further comprises: enabling and converging the decision feedback equalizer at the high-speed serial deserializer SerDes receiving end, and fixing the gain of the linear equalizer, and creating and generating a first preset threshold value corresponding to the gain of the linear equalizer; wherein the first preset threshold value is a preset golden value; batch acquisition of first data corresponding to the decision feedback equalizer through the debugging interface, and preprocessing of the first data; wherein the preprocessing includes denoising processing and / or temperature compensation processing.

3. The method of claim 2, wherein the method further comprises: The batch acquisition of first data corresponding to the decision feedback equalizer through the debugging interface, and the preprocessing of the first data, further comprises: According to the difference between the current chip temperature and the reference temperature, the first data is normalized and compensated; wherein the normalized compensation processing includes absolute reference compensation or relative reference compensation; The calculation formula of the absolute reference compensation is: （1） In the formula, Tap value after compensation; Tap value after de-noising; Current temperature; The calculation formula of the relative reference compensation is: （2） In the formula, Tap value after compensation Tap value after de-noising Current temperature Reference temperature 4. The method of claim 1 or 2, wherein, The creation and acquisition of the first data corresponding to the decision feedback equalizer, and the identification of the abnormal tap coefficients and their indexes corresponding to the channel reflections based on the first data, further comprises: creating and generating fourth data corresponding to the first data; wherein the fourth data is the statistical feature data of the absolute value of the tap coefficient sequence; the statistical feature data at least includes mean and standard deviation; based on the fourth data, a second preset threshold value is dynamically generated, and based on the second preset threshold value, fifth data corresponding to the decision feedback equalizer is identified and generated; wherein the second preset threshold value is a detection threshold, the detection threshold is the mean plus N times the standard deviation, N is a positive integer greater than or equal to 3; the fifth data is abnormal tap coefficient data.

5. The method of claim 1, wherein the method further comprises: The calculation and generation of the second data corresponding to the reflection points based on the indexes of the abnormal tap coefficients further comprises: The calculation and generation of the electrical distance of the reflection points from the receiving end in the transmission channel, wherein the calculation formula is: （3） wherein is the abnormal Tap index, is the unit bit time, is the signal propagation speed in the medium.

6. The method of claim 1, wherein the method further comprises: The screening and elimination of false reflection points caused by multiple reflections, generating and outputting corresponding third data, further comprises: based on the electrical distance and reflection energy corresponding to each candidate reflection point, identifying and eliminating false reflection points that meet the multiple reflection characteristics; wherein the multiple reflection characteristics include that the electrical distances between at least two candidate reflection points approximately exist an integer multiple relationship, and their reflection energies approximately conform to the exponential decay relationship of the corresponding number of times; mapping the electrical distance corresponding to the third data to a physical design layout, and identifying a corresponding and specific fault physical structure.

7. A channel fault detection and localization processing system based on decision feedback equalizer tap coefficients, characterized by, The system is applied to the channel fault detection and positioning processing method based on the tap coefficient of the decision feedback equalizer according to any one of claims 1 to 6, and the system comprises: A data creation processing unit is configured to create and obtain first data corresponding to the decision feedback equalizer, and identify abnormal tap coefficients and their indexes corresponding to channel reflections based on the first data; wherein the first data is tap coefficient sequence data; A data calculation generation unit is configured to calculate and generate second data corresponding to reflection points based on the indexes of the abnormal tap coefficients; wherein the second data is the electrical distance of the reflection points from the receiving end in the transmission channel; A data output generation unit is configured to filter and eliminate false reflection points caused by multiple reflections, and generate and output corresponding third data; wherein the third data is the position of the real fault point.

8. The channel fault detection and location processing system based on tap coefficients of a decision feedback equalizer of claim 7, wherein, The data creation processing unit further comprises: A first generation module is configured to enable and converge the decision feedback equalizer at the receiving end of the high-speed serial deserializer SerDes, fix the gain of the linear equalizer, and create and generate a first preset threshold value corresponding to the gain of the linear equalizer; wherein the first preset threshold value is a preset golden value; A first processing module is configured to obtain first data corresponding to the decision feedback equalizer in batches through a debugging interface, and pre-process the first data; wherein the pre-processing includes denoising processing and / or temperature compensation processing; A second generation module is configured to create and generate fourth data corresponding to the first data; wherein the fourth data is statistical feature data of tap coefficient sequence absolute values; and the statistical feature data at least includes mean and standard deviation; A third generation module is configured to dynamically generate a second preset threshold value based on the fourth data, and identify and generate fifth data corresponding to the decision feedback equalizer according to the second preset threshold value; wherein the second preset threshold value is a detection threshold value, the detection threshold value is the mean plus N times the standard deviation, N is a positive integer greater than or equal to 3; and the fifth data is abnormal tap coefficient data; And / or, the first processing module further comprises: A second processing module is configured to normalize and compensate the first data according to the difference between the current chip temperature and the reference temperature; wherein the normalization compensation processing includes absolute reference compensation or relative reference compensation; The calculation formula of the absolute reference compensation is: （1） In the formula, Tap value after compensation; Tap value after de-noising; Current temperature; The calculation formula of the relative reference compensation is: （2） In the formula, Tap value after compensation Tap value after de-noising Current temperature Reference temperature And / or, the data calculation generation unit further comprises: A first calculation module is configured to calculate and generate the electrical distance of the reflection points from the receiving end in the transmission channel, wherein the calculation formula is: （3） wherein, is an abnormal Tap index, is a unit bit time, is the speed of signal propagation in the medium; And / or, the data output generation unit further comprises: The third processing module is configured to identify and eliminate false reflection points that satisfy multiple reflection characteristics based on the electrical distance and the reflection energy corresponding to each candidate reflection point; wherein the multiple reflection characteristics include that the electrical distances of at least two candidate reflection points approximately satisfy an integer multiple relationship, and the reflection energies thereof approximately satisfy an exponential decay relationship of corresponding times. The identification generation module is configured to map the electrical distance corresponding to the third data to a physical design layout, and generate a corresponding and specific fault physical structure.

9. A channel fault detection and localization processing platform based on decision feedback equalizer tap coefficients, characterized by, The processor, the memory and the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient are included; wherein the processor executes the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient, the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient is stored in the memory, and the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient realizes the channel fault detection and positioning processing method based on the decision feedback equalizer tap coefficient as claimed in any one of claims 1 to 6.

10. A computer readable storage medium, characterized in that, The computer readable storage medium stores the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient, and the channel fault detection and positioning processing platform control program based on the decision feedback equalizer tap coefficient realizes the channel fault detection and positioning processing method based on the decision feedback equalizer tap coefficient as claimed in any one of claims 1 to 6.

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