Network tester with line storage mechanism

Abstract

The utility model relates to the technical field of network testing, in particular to a network tester with a circuit accommodating mechanism, which comprises an upper tester shell and a lower tester shell, and the upper end face of the upper tester shell and the lower tester shell are both provided with threaded holes. The tester upper shell and the tester lower shell are fixed through bolts, a main circuit board and an auxiliary circuit board are welded to the upper end face of the tester lower shell, and the main circuit board is located on the right side of the auxiliary circuit board. A wire harness is inserted between the main circuit board and the auxiliary circuit board, and a storage device is arranged on the wire harness; the storage device is composed of a top plate, a first semiconductor heat conduction plate, an insertion column, a threaded column and a twisting plate. According to the utility model, through the arrangement of the circuit accommodation mechanism, the wire harness can be effectively fixed and accommodated, the neatness and beauty of the tester are improved, the maintenance and repair of the tester by workers are facilitated, and the service life of the tester is prolonged.

Description

Technical Field

[0001] This utility model relates to the field of network testing technology, specifically a network tester with a line storage mechanism. Background Technology

[0002] A network tester, also known as a professional network tester or network detector, is a portable, visual, intelligent testing device that can detect the operational status of the physical layer, data link layer, and network layer as defined by the OSI model. It is primarily used for local area network (LAN) fault detection, maintenance, and structured cabling installation. However, existing network testers often have certain problems, such as:

[0003] Application CN201821371059.1, entitled "A Network Tester with a Cable Management Mechanism," includes a network tester body, a handle, a housing, a shaft, and a transparent soft rubber pad. The housing is welded to the front end of the network tester body, and a shaft is located inside the housing. A handle is installed at the left end of the housing, passing through the housing and connecting to the shaft. A transparent soft rubber pad is installed at the front end of the network tester body, located at the lower end of the housing and extending into the housing, and is wrapped around the shaft. This device lacks a cable management mechanism inside the tester, which may lead to messy and easily tangled cables, affecting aesthetics and increasing operational difficulty and reducing work efficiency during cable connection or repair, failing to meet daily needs. Therefore, this paper proposes a network tester with a cable management mechanism to solve the above problems. Utility Model Content

[0004] The purpose of this invention is to provide a network tester with a cable management mechanism to solve the problem mentioned in the background art that existing network testers do not have a cable management device inside the tester, which may lead to messy and disorganized cables.

[0005] To achieve the above objectives, this utility model provides the following technical solution: It includes an upper housing and a lower housing of a tester. Both the upper housing and the lower housing are provided with threaded holes, and are fixed together by bolts. A main circuit board and a secondary circuit board are welded to the upper housing, with the main circuit board located to the right of the secondary circuit board. A wiring harness is inserted between the main circuit board and the secondary circuit board, and a storage device is provided on the wiring harness.

[0006] The above technical solution facilitates the organization and tidying of the internal wiring of the tester, preventing messy wiring that could affect the normal use and aesthetics of the tester. Furthermore, the storage device is detachably mounted on the wiring harness, allowing staff to install or remove it according to actual needs, thus improving the flexibility and practicality of the tester.

[0007] As a preferred embodiment of this utility model, the storage device consists of a top plate, a first semiconductor heat-conducting plate, a plug-in post, a threaded post, and a twist plate.

[0008] The above technical solution facilitates quick and effective storage of the internal circuitry of the tester by staff; the top plate is designed to cover and protect the circuitry, preventing damage from the external environment; and the No. 1 semiconductor heat dissipation plate helps dissipate heat, ensuring that the tester remains stable under high-intensity operation.

[0009] As a preferred embodiment of this utility model, the upper end face of the plug-in post is fixedly connected to the lower end face of the top plate, and the plug-in post is symmetrically arranged about the center of the top plate; the upper end face of the lower housing of the tester is provided with a groove corresponding to the plug-in post.

[0010] The above technical solution facilitates the stable installation of the storage device on the lower housing of the tester, ensuring that the top plate fits tightly against the upper surface of the lower housing, thereby effectively covering and protecting the circuitry. At the same time, the matching design of the plug and groove not only improves the installation stability of the storage device, but also facilitates quick installation and disassembly by the staff, further enhancing the practicality and flexibility of the tester.

[0011] As a preferred embodiment of this utility model, the inner wall surface of the top plate is fixedly connected to the outer end surface of the first semiconductor heat-conducting plate, and the first semiconductor heat-conducting plate is symmetrically arranged about the center of the top plate.

[0012] The above technical solution, with the symmetrical arrangement of the No. 1 semiconductor heat-conducting plate about the center of the top plate, ensures the uniform distribution and rapid dissipation of heat inside the tester, avoids local overheating, and further improves the stability and reliability of the tester under high-intensity working environment.

[0013] As a preferred embodiment of this utility model, the top plate is threadedly connected to the threaded column, and a baffle is fixedly connected to the lower end face of the threaded column; the upper end face of the threaded column is fixedly connected to the lower end face of the torsion plate.

[0014] By adopting the above technical solution, it is convenient for staff to adjust the height of the baffle by rotating the torsion plate to drive the threaded column, which facilitates the effective fixing and storage of the wire harness, avoids the messy situation of the wire harness, and improves the neatness and aesthetics of the tester.

[0015] As a preferred embodiment of this utility model, a second semiconductor heat-conducting plate is snapped onto the lower end face of the lower housing of the tester, and the second semiconductor heat-conducting plate penetrates through the lower end face of the lower housing of the tester.

[0016] By adopting the above technical solution, the heat generated by the tester during operation can be quickly discharged through the No. 2 semiconductor heat-conducting plate and exchanged with the external environment, thereby effectively reducing the operating temperature of the tester and ensuring its stable operation for a long time under high-intensity working environment.

[0017] Compared with the prior art, the beneficial effects of this utility model are as follows: The wiring harness storage mechanism facilitates effective fixing and storage, improving the neatness and aesthetics of the tester, and also facilitating maintenance and repair by staff. The No. 1 and No. 2 semiconductor heat-conducting plates quickly dissipate the heat generated during operation and exchange it with the external environment, effectively reducing the tester's operating temperature and ensuring stable operation for extended periods under high-intensity working conditions, thus extending the tester's lifespan.

[0018] 1. When the tester is working, current flows through the circuit board inside the tester, generating a certain amount of heat. The No. 1 and No. 2 semiconductor heat-conducting plates serve as the main heat conduction paths, effectively absorbing and dispersing this heat. The symmetrical design of the No. 1 semiconductor heat-conducting plate about the center of the top plate ensures uniform heat distribution inside the tester, avoiding performance degradation or damage caused by local overheating. At the same time, the No. 2 semiconductor heat-conducting plate runs through the lower end face of the lower housing of the tester, quickly conducting heat to the external environment. Through heat exchange with the air, it effectively reduces the operating temperature of the tester.

[0019] 2. By twisting the torsion plate, the operator moves the threaded column, which in turn moves the baffle, thus limiting the wire harness. The wire harness is securely confined inside the tester, preventing it from becoming tangled and reducing the risk of performance degradation due to loose or tangled wires. This design avoids tangled wires, reduces the risk of malfunctions caused by wire entanglement, and further improves the stability and reliability of the tester. Attached Figure Description

[0020] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0021] Figure 2 This is a schematic diagram of the exploded structure of this utility model;

[0022] Figure 3 This is a schematic diagram of the structure of this utility model from below;

[0023] Figure 4 This is a schematic diagram of the storage device structure of this utility model;

[0024] Figure 5This is a schematic diagram of the connection structure between the main circuit board and the sub-circuit board of this utility model;

[0025] Figure 6 This is a schematic diagram of the connection structure between the sub-circuit board and the storage device of this utility model.

[0026] In the diagram: 1. Upper housing of the tester; 2. Lower housing of the tester; 3. Main circuit board; 4. Sub-circuit board; 5. Storage device; 501. Top plate; 502. No. 1 semiconductor heat-conducting plate; 503. Insertion post; 504. Threaded post; 505. Twist plate; 6. No. 2 semiconductor heat-conducting plate. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0028] Please see Figures 1-6 The present invention provides a network tester with a cable management mechanism, comprising an upper housing 1 and a lower housing 2. Both the upper housing 1 and the lower housing 2 have threaded holes and are fixed together by bolts. A main circuit board 3 and a secondary circuit board 4 are welded to the upper housing 2, with the main circuit board 3 located to the right of the secondary circuit board 4. A wiring harness is inserted between the main circuit board 3 and the secondary circuit board 4, and a cable management device 5 is provided on the cable harness. This facilitates the organization and management of the internal wiring of the tester, preventing messy wiring that could affect the normal use and aesthetics of the tester. Furthermore, the cable management device 5 is detachably mounted on the cable harness, allowing for easy installation or removal by the operator according to actual needs, thus improving the flexibility and practicality of the tester.

[0029] The storage device 5 consists of a top plate 501, a first semiconductor heat-conducting plate 502, a plug-in post 503, a threaded post 504, and a twist plate 505, which facilitates the quick and efficient storage of the internal circuitry of the tester by the staff. The top plate 501 is designed to cover and protect the circuitry, preventing it from being damaged by the external environment. The first semiconductor heat-conducting plate 502 helps dissipate heat, ensuring that the tester remains stable under high-intensity operation.

[0030] The upper end face of the plug 503 is fixedly connected to the lower end face of the top plate 501, and the plug 503 is symmetrically arranged about the center of the top plate 501. The upper end face of the lower housing 2 of the tester is provided with a groove corresponding to the plug 503, which makes it easy for the staff to stably install the storage device 5 on the lower housing 2 of the tester, ensuring that the top plate 501 can fit tightly against the upper end face of the lower housing 2 of the tester, thereby effectively covering and protecting the circuit. At the same time, the matching design of the plug 503 and the groove not only improves the installation stability of the storage device 5, but also makes it easy for the staff to quickly install and disassemble, further improving the practicality and flexibility of the tester.

[0031] The inner wall of the top plate 501 is fixedly connected to the outer end face of the first semiconductor heat-conducting plate 502. The first semiconductor heat-conducting plate 502 is symmetrically arranged about the center of the top plate 501. This symmetrical arrangement of the first semiconductor heat-conducting plate 502 about the center of the top plate 501 ensures the uniform distribution and rapid dissipation of heat inside the tester, avoids the occurrence of local overheating, and further improves the stability and reliability of the tester under high-intensity working environment.

[0032] The top plate 501 is threadedly connected to the threaded post 504, and the lower end face of the threaded post 504 is fixedly connected to the baffle; the upper end face of the threaded post 504 is fixedly connected to the lower end face of the torsion plate 505, which makes it easy for the staff to adjust the height of the baffle by rotating the torsion plate 505 to drive the threaded post 504, which facilitates the effective fixing and storage of the wire harness, avoids the messy situation of the wire harness, and improves the neatness and aesthetics of the tester.

[0033] The lower end face of the lower housing 2 of the tester is fitted with a second semiconductor heat-conducting plate 6, and the second semiconductor heat-conducting plate 6 penetrates through the lower end face of the lower housing 2 of the tester. This facilitates the rapid dissipation of heat generated during the operation of the tester through the second semiconductor heat-conducting plate 6 and heat exchange with the external environment, thereby effectively reducing the operating temperature of the tester and ensuring the stable operation of the tester for a long time in high-intensity working environments.

[0034] Working principle: When the tester is working, current flows through the circuit board inside the tester, generating a certain amount of heat. The No. 1 semiconductor heat conduction plate 502 and the No. 2 semiconductor heat conduction plate 6 serve as the main heat conduction paths, effectively absorbing and dispersing this heat. The symmetrical design of the No. 1 semiconductor heat conduction plate 502 about the center of the top plate 501 ensures the uniform distribution of heat inside the tester, avoiding performance degradation or damage caused by local overheating. At the same time, the No. 2 semiconductor heat conduction plate 6 penetrates the lower end face of the lower housing 2 of the tester, quickly conducting heat to the external environment. Through heat exchange with the air, it effectively reduces the operating temperature of the tester.

[0035] The operator moves the threaded post 504 by twisting the torsion plate 505, which in turn moves the baffle, thereby limiting the wire harness. The wire harness is securely confined inside the tester, preventing it from becoming tangled and reducing the risk of performance degradation due to loose or tangled wire harnesses. This design avoids tangled wire harnesses, reduces the risk of malfunctions caused by wire harness entanglement, and further improves the stability and reliability of the tester.

[0036] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A network tester with a line storage mechanism, comprising an upper housing (1) and a lower housing (2), wherein threaded holes are provided on the upper end face of the upper housing (1) and the lower housing (2), and the upper housing (1) and the lower housing (2) are fixed together by bolts, characterized in that: The upper end face of the lower housing (2) of the tester is welded with a main circuit board (3) and a secondary circuit board (4), and the main circuit board (3) is located to the right of the secondary circuit board (4); a wire harness is inserted between the main circuit board (3) and the secondary circuit board (4), and a storage device (5) is provided on the wire harness.

2. A network tester with a line storage mechanism according to claim 1, characterized in that: The storage device (5) consists of a top plate (501), a first semiconductor heat-conducting plate (502), a plug-in post (503), a threaded post (504), and a twist plate (505).

3. A network tester with a line storage mechanism according to claim 2, characterized in that: The upper end face of the plug (503) is fixedly connected to the lower end face of the top plate (501), and the plug (503) is symmetrically arranged about the center of the top plate (501); the upper end face of the lower housing (2) of the tester is provided with a groove corresponding to the plug (503).

4. A network tester with a line storage mechanism according to claim 3, characterized in that: The inner wall of the top plate (501) is fixedly connected to the outer end face of the first semiconductor heat-conducting plate (502), and the first semiconductor heat-conducting plate (502) is symmetrically arranged about the center of the top plate (501).

5. A network tester with a line storage mechanism according to claim 4, characterized in that: The top plate (501) is threadedly connected to the threaded post (504), and a baffle is fixedly connected to the lower end face of the threaded post (504); the upper end face of the threaded post (504) is fixedly connected to the lower end face of the torsion plate (505).

6. A network tester with a line storage mechanism according to claim 5, characterized in that: The lower end face of the lower housing (2) of the tester is fitted with a second semiconductor heat-conducting plate (6), and the second semiconductor heat-conducting plate (6) penetrates the lower end face of the lower housing (2) of the tester.

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