Three-dimensional measurement method, device and equipment based on polarization structured light and medium

Abstract

The embodiment of the invention discloses a three-dimensional measurement method and device based on polarization structured light, equipment and a medium. The method comprises: determining the total amount of reflected light according to a surface polarization fringe image; extracting components to obtain a first total illumination intensity of the reflected light, wherein the first total illumination intensity is represented based on imaging characteristics of the polarization imaging device; the second total illumination intensity is represented based on the projection characteristics of the polarization projection device; performing channel fusion on the second total illumination intensity based on different polarization angles to recover a polarization fringe image, and performing phase shift decoding processing to obtain phase distribution; and mapping to obtain a surface three-dimensional coordinate. According to the invention, the collected surface polarization fringe images with different polarization angles are collected at the same time, the introduction of mechanical errors and polarized light calibration is avoided, the influence of time-varying ambient light reflected by a mirror surface is suppressed, and the technical problem that the measurement precision is not high when three-dimensional measurement is carried out based on structured light under dynamic ambient light illumination is solved.

Description

Technical Field

[0001] This application relates to the field of structured light three-dimensional measurement, and in particular to three-dimensional measurement methods, devices, equipment and media based on polarized structured light. Background Technology

[0002] In structured light-based 3D measurement, the projected sinusoidal polarized fringe pattern is used to time-encode the object's surface and calculate its phase distribution, thereby achieving 3D topographic measurement of the object. This method has advantages such as non-contact, high precision, high density, and high-speed measurement, and has been widely applied in fields such as industrial parts inspection, precision manufacturing, medical imaging, cultural heritage protection, and robot vision. This method assumes constant ambient lighting, but in practical applications, dynamic ambient light sources such as sunlight, strobe lights, or moving light sources introduce unstable background components during fringe acquisition, causing phase errors and ultimately leading to measurement distortion. Existing methods for suppressing dynamic ambient light require manual rotation of polarizers and polarization calibration, which introduces mechanical errors, further contributing to measurement distortion. Therefore, existing technologies suffer from low measurement accuracy when performing 3D measurements based on structured light under dynamic ambient lighting. Summary of the Invention

[0003] This application provides a three-dimensional measurement method, apparatus, device, and medium based on polarized structured light, which can solve the technical problem of low measurement accuracy when performing three-dimensional measurements based on structured light.

[0004] In a first aspect, embodiments of this application provide a three-dimensional measurement method based on polarized structured light. This method is applied to a controller within a three-dimensional measurement system based on polarized structured light. The system includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with both the polarization projection device and the polarization imaging device. First, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the surface of the target object. Then, the polarization imaging device is controlled to acquire surface polarization fringe images of the target object surface, each with four different polarization angles. These four surface polarization fringe images are obtained in the same exposure. The three-dimensional measurement method based on polarized structured light includes:

[0005] In response to a three-dimensional measurement command for the target under test, the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device is determined based on the surface polarization fringe image obtained from the polarization imaging device.

[0006] A component is extracted from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0007] The first total illumination intensity is characterized and transformed to obtain the second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device;

[0008] Channel fusion processing is performed on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0009] The phase distribution of the target under test is obtained by performing phase-shift decoding processing on the polarization fringe image of the projected polarized light.

[0010] Based on a preset mapping model between phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the three-dimensional coordinates of the target surface, thus realizing the three-dimensional measurement of the target.

[0011] In some embodiments, before mapping the phase distribution of the target under test using the preset mapping model between phase distribution and three-dimensional coordinates to obtain the surface three-dimensional coordinates of the target under test and realizing the three-dimensional measurement of the target under test, the following steps are included:

[0012] The polarization projection device is controlled to project a unidirectional polarization fringe pattern onto a preset planar target surface;

[0013] The polarization imaging device is controlled to acquire multiple preset images of polarization stripes on the surface of a planar target;

[0014] Phase calculations are performed on the surface polarization fringe image to obtain phase information;

[0015] The phase information is mapped using a fringe projection algorithm to obtain a mapping model between the preset phase distribution and three-dimensional coordinates.

[0016] In some embodiments, the polarization fringe image recovered by channel fusion processing of the second total illumination intensity is an effective fringe image related to the polarization light component.

[0017] In some embodiments, the total amount of reflected light is , It is the light intensity of the polarization projection device. The ambient light intensity is the ambient light intensity. It is the surface reflectance of the target surface being measured. It is the debiasing coefficient related to the roughness of the target object. It is the diffuse reflectance coefficient, a variable. Indicates the polarizer angle, variable Representing the sub-angle of the polarization camera; the step of extracting components from the total amount of reflected light to obtain the first total illumination intensity of the reflected light includes:

[0018] Based on the total amount of reflected light The reflected light component is extracted to obtain the first total illumination intensity of the reflected light. ,in, The first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device.

[0019] In some embodiments, the characterization transformation of the first total illuminance to obtain the second total illuminance is performed. Includes: the first total illuminance Introduced into the projection characteristic expression of a polarization projection device In, among them, This represents the ambient light intensity component that varies with time t. This represents the illumination intensity component of projected polarized light that is independent of time t.

[0020] Based on projection characteristic expression For the first total illuminance A characterization transformation is performed to obtain the second total illumination intensity characterized by the projection characteristics of the polarization projection device.

[0021] , It is the polarization modulation coefficient. It is the portion contributed by ambient light.

[0022] In some embodiments, the four polarization angles are 0 degrees, 45 degrees, 90 degrees, and 135 degrees, respectively. The channel fusion processing of the second total illumination intensity based on the four polarization angles to recover a time-independent polarization fringe image of the projected polarized light includes:

[0023] Substituting the four polarization angles into the second total illumination intensity characterized by the projection characteristics of the polarization projection device, we obtain the second total illumination intensity corresponding to the four polarization angles.

[0024] By performing channel fusion processing on the corresponding second total illumination intensities at four polarization angles, the portion contributed by ambient light in the second total illumination intensity is removed, resulting in a time-independent polarization fringe image of the projected polarized light.

[0025] In some embodiments, performing phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test includes:

[0026] The light intensity values ​​of the polarization fringe image pixels of the projected polarized light are used to form a sinusoidal sequence;

[0027] The wrap-around phase value of the point is calculated based on the sinusoidal sequence;

[0028] The phase value of the package is expanded to obtain a continuously changing phase field distribution.

[0029] Secondly, embodiments of this application also provide a three-dimensional measurement device based on polarized structured light. The three-dimensional measurement device based on polarized structured light is configured in a controller of a three-dimensional measurement system based on polarized structured light. The three-dimensional measurement system based on polarized structured light includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with the polarization projection device and the polarization imaging device. First, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the surface of the target to be measured. Then, the polarization imaging device is controlled to acquire surface polarization fringe images of the target surface, each with four different polarization angles. The four surface polarization fringe images with their respective polarization angles are obtained in the same exposure. The three-dimensional measurement device based on polarized structured light includes:

[0030] The first determining unit is configured to, in response to a three-dimensional measurement command for the target under test, determine the total amount of reflected light, including projected polarized light and ambient light, collected by the polarization imaging device based on the surface polarization fringe image obtained from the polarization imaging device.

[0031] An illumination intensity determination unit is used to extract components from the total amount of reflected light to obtain a first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0032] A conversion unit is used to characterize and convert the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device; an ambient light suppression unit is used to perform channel fusion processing on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0033] A phase-shift decoding unit is used to perform phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test;

[0034] The mapping determination unit is used to map the phase distribution of the target under test based on a preset mapping model between the phase distribution and the three-dimensional coordinates, so as to obtain the surface three-dimensional coordinates of the target under test and realize the three-dimensional measurement of the target under test.

[0035] Thirdly, embodiments of this application also provide a three-dimensional measurement device based on polarized structured light, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the above-described method.

[0036] Fourthly, embodiments of this application also provide a computer-readable medium storing a computer program, the computer program including program instructions that, when executed by a processor, can implement the above-described method.

[0037] This application provides a three-dimensional measurement method, apparatus, device, and medium based on polarized structured light. The method includes: responding to a three-dimensional measurement command for the target under test, determining the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device based on a surface polarization fringe image obtained from the polarization imaging device; extracting components from the total amount of reflected light to obtain a first total illumination intensity, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device; performing a characterization transformation on the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device; performing channel fusion processing on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light; performing phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test; and performing mapping processing on the phase distribution of the target under test based on a preset mapping model between the phase distribution and three-dimensional coordinates to obtain the surface three-dimensional coordinates of the target under test, thereby achieving three-dimensional measurement of the target under test. In this application, unlike previous solutions that require rotating the polarizer or calibrating the angle of the transmission axis, the surface polarization fringe images with four different polarization angles are acquired simultaneously, avoiding the problem of mechanical errors introduced by operation. The first total illumination intensity obtained from the total amount of reflected light is characterized based on the imaging characteristics of the polarization imaging device, suppressing the influence of time-varying ambient light on specular reflection, and solving the technical problem of low measurement accuracy when performing three-dimensional measurements based on structured light under dynamic ambient lighting. Attached Figure Description

[0038] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1A schematic flowchart illustrating the three-dimensional measurement method based on polarized structured light provided in this application embodiment;

[0040] Figure 2 A schematic block diagram of a three-dimensional measurement device based on polarized structured light provided in an embodiment of this application;

[0041] Figure 3 A schematic block diagram of the device provided in the embodiments of this application. Detailed Implementation

[0042] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0043] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0044] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0045] It should also be further understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0046] Structured light 3D measurement (Fringe Projection Profilometry, FPP) is a typical active optical measurement method. It uses projected sinusoidal fringe patterns to temporally encode the surface of an object and calculates the phase distribution through a phase-shifting algorithm, thereby achieving 3D shape measurement of the object. This method has advantages such as non-contact, high precision, high density, and high-speed measurement, and has been widely used in fields such as industrial parts inspection, precision manufacturing, medical imaging, cultural heritage protection, and robot vision.

[0047] Traditional phase-shifting methods assume constant ambient light. However, in practical applications, ambient light intensity often varies over time, such as from sunlight, strobe lights, or moving light sources. This dynamic ambient light (DAL) introduces unstable background components during fringe acquisition, causing phase errors and measurement distortion. Furthermore, for highly reflective surfaces such as metals and ceramics, the influence of ambient light is even more pronounced due to the significant specular reflection component. Traditional algorithms cannot accurately separate the projected light from the background light, resulting in severe phase distortion.

[0048] Polarization imaging technology can distinguish reflected components from unpolarized background light by analyzing the polarization characteristics of light. However, previous polarization-based suppression schemes require rotating polarizers or calibrating the angle of the transmission axis, which is cumbersome and prone to introducing mechanical errors. Therefore, how to achieve physical separation and suppression of dynamic ambient light under simple operating conditions has become an important research direction in the field of structured light measurement.

[0049] The purpose of this invention is to overcome the shortcomings of existing structured light measurement techniques, such as susceptibility to interference under dynamic ambient lighting conditions, large phase calculation errors, and poor real-time performance. This invention provides a polarization-based dynamic ambient lighting suppression method. This method utilizes the difference in physical properties between projected polarized light and unpolarized ambient light to achieve real-time physical separation of dynamic ambient light components without the need for rotating or calibrating polarizers. This ensures high-precision phase recovery and 3D measurement even under complex lighting conditions. It has significant research value and practical implications, especially for solving the 3D measurement problem of tall metallic objects in complex scenarios.

[0050] The three-dimensional measurement method based on polarization structured light is applied to the controller of a three-dimensional measurement system based on polarization structured light. The three-dimensional measurement system based on polarization structured light includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with the polarization projection device and the polarization imaging device. First, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the surface of the target to be measured. Then, the polarization imaging device is controlled to acquire surface polarization fringe images of the target surface with four different polarization angles. The four surface polarization fringe images with their respective polarization angles are obtained in the same exposure.

[0051] Figure 1 This is a schematic flowchart of a three-dimensional measurement method based on polarized structured light provided in an embodiment of this application. The three-dimensional measurement method based on polarized structured light includes the following steps S110-S160:

[0052] S110, in response to a three-dimensional measurement command for the target under test, the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device is determined based on the surface polarization fringe image obtained from the polarization imaging device.

[0053] When the controller in the polarization-structured light-based 3D measurement system receives a 3D measurement command to perform 3D measurement on the target, the controller first controls the polarization projection device to project a unidirectional polarization fringe pattern onto the target surface. Then, it controls the polarization imaging device to acquire surface polarization fringe images of the target surface, each with four different polarization angles. These four surface polarization fringe images are obtained in the same exposure. In this embodiment, the four surface polarization fringe images with different polarization angles are acquired simultaneously. Unlike previous methods that required rotating the polarizer or calibrating the transmission axis, this embodiment avoids the problems of cumbersome operation and easy introduction of mechanical errors, and belongs to simultaneous imaging.

[0054] When acquiring surface fringe images using polarization imaging devices, two types are distinguished: time-division imaging and simultaneous imaging. Time-division imaging achieves this by sequentially acquiring images of different polarization directions at different times. A rotatable linear polarizer is mounted in front of a single camera. The polarizer is rotated to 0° to capture an image, then to 45°, then to 90°, and finally to 135°. Time-division imaging is less expensive but unsuitable for dynamic scenes. Because the four images are captured at different times, if the target or camera is moving, it can lead to image registration errors. The acquisition speed is also slow and limited by mechanical rotation. Simultaneous imaging, on the other hand, uses optical beam splitting or special sensors to acquire images of four polarization directions simultaneously.

[0055] As an example, this embodiment employs a specially processed image sensor. Above each pixel of a conventional Complementary Metal-Oxide-Semiconductor (CMOS) or Charge-Coupled Device (CCD) sensor, a tiny linear polarizer is integrated using micro-nano fabrication techniques. These micro-polarizers are arranged in a "superpixel" pattern, such as the most common 2×2 mosaic pattern. Within a superpixel, the polarizer orientations at the top of four adjacent pixels are 0°, 45°, 90°, and 135°, respectively. With a single exposure, the specially processed image sensor directly obtains a polarized image, where each pixel records the light intensity in a specific polarization direction. From the original polarized image, the pixels at 0°, 45°, 90°, and 135° are extracted, and through interpolation algorithms, these four images are reconstructed into four full-resolution polarized images with the same resolution as the sensor.

[0056] In this embodiment, true single-shot instantaneous imaging is achieved, making it suitable for dynamic ambient lighting scenarios. The system size is similar to that of a typical camera module and can be integrated into mobile phones, drones, and endoscopes.

[0057] S120, extract components from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0058] By utilizing the total reflection intensity information in four polarization directions, the polarized and unpolarized light components are calculated to separate and suppress dynamic ambient light, resulting in an effective fringe image formed solely by projected light. The polarized fringe image recovered by channel fusion processing of the second total illumination intensity is an effective fringe image related to the polarized light components. This embodiment eliminates the need to rotate polarizers or detect or match the polarization direction of ambient light, unlike existing technologies that rely on rotating gratings or changing the emission polarization direction. This embodiment is based on an optical polarization physics model and uses algorithms to separate dynamic ambient light.

[0059] This embodiment uses Stokes vectors. Characterize the projected polarized light, and then pass it through the Mueller matrix. It describes the interaction between polarized light and an object, and quantifies the polarization state changes between incident and reflected light.

[0060] The total amount of reflected light is represented by the Stokes vector.

[0061]

[0062] in, It is the light intensity of the polarization projection device. The ambient light intensity is the ambient light intensity. It is the surface reflectance of the target surface being measured. It is the debiasing coefficient related to the roughness of the target object. It is the diffuse reflectance coefficient, a variable. Indicates the polarizer angle, variable Indicates the sub-angle of the polarization camera;

[0063] Step S120 includes: based on the total amount of reflected light The reflected light component is extracted to obtain the first total illumination intensity of the reflected light. ,in, The first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device.

[0064] Based on the actual projected reflected polarized light collected by the polarization imaging device :

[0065]

[0066] Ambient light is typically unpolarized light, and its intensity is defined as... Then, the ambient light and the light reflected from the target are... Ambient light actually acquired by a polarization imaging device :

[0067]

[0068] The total amount of mixed reflected light collected by the polarization imaging device .

[0069] Based on the total amount of mixed reflected light collected by the polarization imaging device Extracting the first component of the Stokes vector from the total amount of reflected light yields the first total illumination intensity of the reflected light. .

[0070]

[0071] The first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device.

[0072] S130, the first total illumination intensity is characterized and transformed to obtain the second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device;

[0073] In this invention, the phase shift under dynamic illumination is expressed as: Ambient light background intensity During the phase shift process, the effect of dynamic illumination changes to a time-dependent state. Change in quantity For the first total illuminance A characterization transformation is performed to obtain the second total illumination intensity. The second total illumination intensity is characterized based on the projection characteristics of the polarization projection device.

[0074] Step S130 includes steps S1301-S1302:

[0075] Step S1301, the first total illuminance Introduced into the projection characteristic expression of a polarization projection device In, among them, This represents the ambient light intensity component that varies with time t. This represents the illumination intensity component of projected polarized light that is independent of time t.

[0076] The first total light intensity Introduced into the projection characteristic expression of a polarization projection device In, among them, This represents the ambient light intensity component that varies with time t. This represents the illumination intensity component of projected polarized light that is independent of time t.

[0077] Step S1302, based on the projection characteristic expression For the first total illuminance A characterization transformation is performed to obtain the projection characteristics of the polarization projection device. , It is the polarization modulation coefficient. It is the portion contributed by ambient light.

[0078] This is the portion contributed by the projected polarized light, and it also represents the target light information required. This is the portion contributed by ambient light, and it is the component that needs to be filtered out.

[0079] The lighting of the projected portion is only related to Related to time It is irrelevant. The direct light component that does not change over time can be recovered using four-polarization channel fusion calculation.

[0080] S140, based on four polarization angles, channel fusion processing is performed on the second total illumination intensity to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0081] The four polarization angles are obtained as follows:

[0082] The second total illumination intensity is processed by channel fusion based on four polarization angles. as well as The polarization fringe image of the projected polarized light is eliminated and recovered, which is independent of time, and suppresses the dynamic effects of ambient light.

[0083] Time-independent intensity of the direct component of projected polarized light Indicates the first The intensity of the direct component of the phase-shifted fringe pattern captured by the imaging device.

[0084]

[0085] The four polarization angles are 0 degrees, 45 degrees, 90 degrees and 135 degrees. Step S140 includes steps S1401-S1402:

[0086] Step S1401: Substitute the four polarization angles into the second total illumination intensity characterized by the projection characteristics of the polarization projection device to obtain the second total illumination intensity corresponding to the four polarization angles.

[0087] Substituting the four polarization angles into the second total illumination intensity characterized by the projection characteristics of the polarization projection device, we obtain the second total illumination intensity corresponding to the four polarization angles.

[0088] Step S1402: By performing channel fusion processing on the corresponding second total illumination intensities of the four polarization angles, the portion contributed by ambient light in the second total illumination intensity is removed, resulting in a time-independent polarization fringe image of the projected polarized light.

[0089] By performing channel fusion processing on the corresponding second total illumination intensities at four polarization angles, the portion contributed by ambient light in the second total illumination intensity is removed, resulting in a time-independent polarization fringe image of the projected polarized light.

[0090] S150, perform phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test;

[0091] The purpose of phase-shift decoding is to convert grayscale information in an image into phase values ​​that include height information.

[0092] The phase distribution of the target under test is obtained by performing phase-shift decoding on the polarization fringe image of the projected polarized light.

[0093] Step S150 includes S1501-S1503:

[0094] S1501, construct a sinusoidal sequence of light intensity values ​​of the polarization fringe image pixels of the projected polarized light;

[0095] For each pixel on the surface, a sinusoidal sequence is constructed based on the light intensity values ​​of the pixel in multiple phase-shifted images.

[0096] S1502, Calculate the wrapping phase value of the point based on the sinusoidal sequence;

[0097] The wrap-around phase value of a point is directly calculated using a phase-shifting algorithm. The most commonly used method is the four-step phase-shifting method with a step size of 90°. The wrap-around phase value is truncated and discontinuous, with a jump at 2π.

[0098] S1503, the phase value of the package is expanded to obtain a continuously changing phase field distribution;

[0099] To obtain a continuous true absolute phase distribution, the wrapped phase is phase-unfolded, and the 2π jump point in the wrapped phase diagram is detected. The jump effect is eliminated by adding or subtracting integer multiples of 2π, and the continuously changing phase field is reconstructed.

[0100] S160: Based on a preset mapping model between phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the surface three-dimensional coordinates of the target under test, thereby realizing the three-dimensional measurement of the target under test.

[0101] After obtaining the continuously changing phase field distribution of the target under test, the continuously changing phase field distribution of the target under test is mapped through a pre-calibrated structured optics system to obtain the three-dimensional coordinates of the target under test for three-dimensional measurement.

[0102] The polarized light used in this embodiment can separate the projected light and the ambient light, improving the measurement capability of highly reflective surfaces under complex lighting conditions.

[0103] As an example, the phase-height calibration method is used, where there is a one-to-one geometric relationship between the continuously changing phase field distribution of the target and the height of the target surface.

[0104] This one-to-one geometric relationship requires precise calibration of the entire optical system. Calibration establishes a mapping model between phase values ​​and actual three-dimensional coordinates. Using the calibrated mapping model, the absolute phase value of each pixel is converted into the height value or three-dimensional coordinates of that point relative to the reference plane.

[0105] Before S160, steps A1-A4 are included:

[0106] A1, control the polarization projection device to project a unidirectional polarization stripe pattern onto a preset planar target surface;

[0107] A mapping model between phase values ​​and actual three-dimensional coordinates is established based on a structured cursor positioning system. The implementation steps are the same as those described for the target under test: first, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the preset planar target surface.

[0108] A2, control the polarization imaging device to acquire multiple preset images of polarization stripes on the surface of a planar target;

[0109] Then, the polarization imaging device is controlled to acquire multiple preset images of surface polarization stripes on the surface of a planar target, each with four different polarization angles.

[0110] A3. Perform phase calculation on the surface polarization stripe image to obtain phase information;

[0111]

[0112] A4. The phase information is mapped using a fringe projection algorithm to obtain a preset mapping model between the phase distribution and the three-dimensional coordinates.

[0113] Based on preset three-dimensional coordinates, the phase information is mapped using a fringe projection algorithm to obtain a preset phase distribution and a mapping model between three-dimensional coordinates for the phase-space mapping relationship.

[0114] Using the established phase-space mapping relationship and the fitted... Mapping coefficients. The obtained phase information is then converted into three-dimensional coordinates of the object surface to obtain high-precision three-dimensional measurement results that are resistant to ambient light interference.

[0115]

[0116] in, Mapping coefficients

[0117] This application provides a three-dimensional measurement method, apparatus, device, and medium based on polarized structured light. The method includes: responding to a three-dimensional measurement command for the target under test, determining the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device based on a surface polarization fringe image obtained from the polarization imaging device; extracting components from the total amount of reflected light to obtain a first total illumination intensity, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device; and performing a characterization transformation on the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device.

[0118] Channel fusion processing is performed on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light; phase-shift decoding processing is performed on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test; based on a preset mapping model between the phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the surface three-dimensional coordinates of the target under test, thereby realizing the three-dimensional measurement of the target under test.

[0119] This application provides a three-dimensional measurement method, apparatus, device, and medium based on polarized structured light. The method includes: responding to a three-dimensional measurement command for the target under test, determining the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device based on a surface polarization fringe image obtained from the polarization imaging device; extracting components from the total amount of reflected light to obtain a first total illumination intensity, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device; performing a characterization transformation on the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device; performing channel fusion processing on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light; performing phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test; and performing mapping processing on the phase distribution of the target under test based on a preset mapping model between the phase distribution and three-dimensional coordinates to obtain the surface three-dimensional coordinates of the target under test, thereby achieving three-dimensional measurement of the target under test. In this application, unlike previous solutions that require rotating the polarizer or calibrating the angle of the transmission axis, the surface polarization fringe images with four different polarization angles are acquired simultaneously, avoiding the problem of mechanical errors introduced by operation. The first total illumination intensity obtained from the total amount of reflected light is characterized based on the imaging characteristics of the polarization imaging device, suppressing the influence of time-varying ambient light on specular reflection, and solving the technical problem of low measurement accuracy when performing three-dimensional measurements based on structured light under dynamic ambient lighting.

[0120] Figure 2 This is a schematic block diagram of a three-dimensional measurement device based on polarized structured light, provided in an embodiment of this application. Figure 2As shown, corresponding to the above-mentioned three-dimensional measurement method based on polarization structured light, the three-dimensional measurement device based on polarization structured light is configured in the controller of the three-dimensional measurement system based on polarization structured light. The three-dimensional measurement system based on polarization structured light includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with the polarization projection device and the polarization imaging device. First, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the surface of the target to be measured. Then, the polarization imaging device is controlled to acquire multiple surface polarization fringe images of the target surface, each with four different polarization angles. The four surface polarization fringe images with their respective polarization angles are obtained in the same exposure.

[0121] This application also provides a three-dimensional measurement device 600 based on polarized structured light. The three-dimensional measurement device 600 includes a unit for performing the aforementioned three-dimensional measurement method based on polarized structured light, and can be configured in terminals such as desktop computers, tablet computers, and laptops. For details, please refer to... Figure 2 The three-dimensional measurement device 600 based on polarization structured light includes a first determining unit 601, an illumination intensity determining unit 602, a conversion unit 603, an ambient light suppression unit 604, a phase-shift decoding unit 605, and a mapping determining unit 606, wherein:

[0122] The first determining unit 601 is configured to, in response to a three-dimensional measurement command for the target under test, determine the total amount of reflected light, including projected polarized light and ambient light, collected by the polarization imaging device based on the surface polarization stripe image obtained from the polarization imaging device.

[0123] The illumination intensity determination unit 602 is used to extract components from the total amount of reflected light to obtain a first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0124] The conversion unit 603 is used to characterize and convert the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device;

[0125] An ambient light suppression unit 604 is used to perform channel fusion processing on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0126] The phase-shift decoding unit 605 is used to perform phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test.

[0127] The mapping determination unit 606 is used to map the phase distribution of the target under test based on a preset mapping model between the phase distribution and the three-dimensional coordinates, so as to obtain the surface three-dimensional coordinates of the target under test and realize the three-dimensional measurement of the target under test.

[0128] In some embodiments, before the mapping process of the phase distribution of the target under test based on the preset mapping model between phase distribution and three-dimensional coordinates is performed to obtain the surface three-dimensional coordinates of the target under test and realize the three-dimensional measurement of the target under test, the mapping determination unit 606 is specifically used for:

[0129] The polarization projection device is controlled to project a unidirectional polarization fringe pattern onto a preset planar target surface;

[0130] The polarization imaging device is controlled to acquire multiple preset images of polarization stripes on the surface of a planar target;

[0131] Phase calculations are performed on the surface polarization fringe image to obtain phase information;

[0132] The phase information is mapped using a fringe projection algorithm to obtain a mapping model between the preset phase distribution and three-dimensional coordinates.

[0133] In some embodiments, the polarization fringe image recovered by channel fusion processing of the second total illumination intensity is an effective fringe image related to the polarization light component.

[0134] In some embodiments, the total amount of reflected light is , It is the light intensity of the polarization projection device. The ambient light intensity is the ambient light intensity. It is the surface reflectance of the target surface being measured. It is the debiasing coefficient related to the roughness of the target object. It is the diffuse reflectance coefficient, a variable. Indicates the polarizer angle, variable The polarization camera sub-angle is represented; the illumination intensity determination unit 602, in performing the extraction of components from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, is specifically used for:

[0135] Based on the total amount of reflected light The reflected light component is extracted to obtain the first total illumination intensity of the reflected light. ,in, The first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device.

[0136] In some embodiments, the conversion unit 603 performs the characterization conversion of the first total illuminance to obtain a second total illuminance. Specifically used for:

[0137] The first total light intensity Introduced into the projection characteristic expression of a polarization projection device In, among them, This represents the ambient light intensity component that varies with time t. This represents the illumination intensity component of projected polarized light that is independent of time t.

[0138] Based on projection characteristic expression For the first total illuminance A characterization transformation is performed to obtain the projection characteristics of the polarization projection device. , It is the polarization modulation coefficient. It is the portion contributed by ambient light.

[0139] In some embodiments, the four polarization angles are 0 degrees, 45 degrees, 90 degrees, and 135 degrees, respectively. The ambient light suppression unit 604, when performing channel fusion processing on the second total illumination intensity based on the four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, is specifically used for:

[0140] Substituting the four polarization angles into the second total illumination intensity characterized by the projection characteristics of the polarization projection device, we obtain the second total illumination intensity corresponding to the four polarization angles.

[0141] By performing channel fusion processing on the corresponding second total illumination intensities at four polarization angles, the portion contributed by ambient light in the second total illumination intensity is removed, resulting in a time-independent polarization fringe image of the projected polarized light.

[0142] In some embodiments, the phase-shift decoding unit 605, when performing phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test, is specifically used for:

[0143] The light intensity values ​​of the polarization fringe image pixels of the projected polarized light are used to form a sinusoidal sequence;

[0144] The wrap-around phase value of the point is calculated based on the sinusoidal sequence;

[0145] The phase value of the package is expanded to obtain a continuously changing phase field distribution.

[0146] In summary, the three-dimensional measurement device 600 based on polarized structured light in this embodiment differs from previous solutions that required rotating the polarizer or calibrating the angle of the transmission axis. The four surface polarization stripe images with different polarization angles are acquired simultaneously, avoiding the problem of mechanical errors introduced by operation. The first total illumination intensity obtained from the total amount of reflected light is characterized based on the imaging characteristics of the polarization imaging device, suppressing the influence of time-varying ambient light on specular reflection, and solving the technical problem of low measurement accuracy when performing three-dimensional measurements based on structured light under dynamic ambient lighting.

[0147] It should be noted that those skilled in the art can clearly understand that the specific implementation process of the above-mentioned three-dimensional measurement device based on polarized structured light and each unit can be referred to the corresponding description in the foregoing method embodiments. For the sake of convenience and brevity, it will not be repeated here.

[0148] The aforementioned three-dimensional measurement device based on polarized structured light can be implemented as a computer program, which can be used in, for example... Figure 3 It runs on the device shown.

[0149] Please see Figure 3 , Figure 3 This is a schematic block diagram of a device provided in an embodiment of this application. The device 700 can be a terminal or a server. The terminal can be an electronic device with communication functions, such as a smartphone, tablet, laptop, desktop computer, personal digital assistant, or wearable device. The server can be a standalone server or a server cluster composed of multiple servers.

[0150] See Figure 3 The device 700 includes a processor 702, a memory, and a network interface 705 connected via a system bus 701, wherein the memory may include a non-volatile medium 703 and internal memory 704.

[0151] The non-volatile medium 703 may store an operating system 7031 and a computer program 7032. The computer program 7032 includes program instructions that, when executed, cause the processor 702 to perform a three-dimensional measurement method based on polarized structured light.

[0152] The processor 702 provides computing and control capabilities to support the operation of the entire device 700.

[0153] The internal memory 704 provides an environment for the operation of the computer program 7032 in the non-volatile medium 703. When the computer program 7032 is executed by the processor 702, the processor 702 can execute a three-dimensional measurement method based on polarized structured light.

[0154] This network interface 705 is used for network communication with other devices. Those skilled in the art will understand that... Figure 3 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the device 700 to which the present application is applied. The specific device 700 may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0155] The processor 702 is used to run the computer program 7032 stored in the memory to perform the following steps:

[0156] In response to a three-dimensional measurement command for the target under test, the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device is determined based on the surface polarization fringe image obtained from the polarization imaging device.

[0157] A component is extracted from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0158] The first total illumination intensity is characterized and transformed to obtain the second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device;

[0159] Channel fusion processing is performed on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0160] The phase distribution of the target under test is obtained by performing phase-shift decoding processing on the polarization fringe image of the projected polarized light.

[0161] Based on a preset mapping model between phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the three-dimensional coordinates of the target surface, thus realizing the three-dimensional measurement of the target.

[0162] It should be understood that in the embodiments of this application, the processor 702 may be a central processing unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor.

[0163] It will be understood by those skilled in the art that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program includes program instructions and can be stored in a medium, which is a computer-readable medium. The program instructions are executed by at least one processor in the computer system to implement the process steps of the embodiments of the above methods.

[0164] Therefore, this application also provides a medium. This medium can be a computer-readable medium. The medium stores a computer program, wherein the computer program includes program instructions. When executed by a processor, the program instructions cause the processor to perform the following steps:

[0165] In response to a three-dimensional measurement command for the target under test, the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device is determined based on the surface polarization fringe image obtained from the polarization imaging device.

[0166] A component is extracted from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device;

[0167] The first total illumination intensity is characterized and transformed to obtain the second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device;

[0168] Channel fusion processing is performed on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light.

[0169] The phase distribution of the target under test is obtained by performing phase-shift decoding processing on the polarization fringe image of the projected polarized light.

[0170] Based on a preset mapping model between phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the three-dimensional coordinates of the target surface, thus realizing the three-dimensional measurement of the target.

[0171] The medium can be any computer-readable medium that can store program code, such as a USB flash drive, external hard drive, read-only memory (ROM), magnetic disk, or optical disk.

[0172] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this application.

[0173] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For example, the division of each unit is merely a logical functional division, and there may be other division methods in actual implementation. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed.

[0174] The steps in the methods of this application embodiment can be adjusted, merged, or deleted according to actual needs. The units in the apparatus of this application embodiment can be merged, divided, or deleted according to actual needs. Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0175] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a medium and includes several instructions to cause a device (which may be a personal computer, a terminal, or a network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application.

[0176] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A three-dimensional measurement method based on polarized structured light, characterized in that, The three-dimensional measurement method based on polarization structured light is applied to the controller of a three-dimensional measurement system based on polarization structured light. The system includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with both the polarization projection device and the polarization imaging device. First, the polarization projection device projects a unidirectional polarization fringe pattern onto the surface of the target object. Then, the polarization imaging device acquires surface polarization fringe images of the target object surface, each with four different polarization angles. These four surface polarization fringe images are obtained in the same exposure. The three-dimensional measurement method based on polarization structured light includes: In response to a three-dimensional measurement command for the target under test, the total amount of reflected light, including projected polarized light and ambient light, acquired by the polarization imaging device is determined based on the surface polarization fringe image obtained from the polarization imaging device. A component is extracted from the total amount of reflected light to obtain the first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device; The first total illumination intensity is characterized and transformed to obtain the second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device; Channel fusion processing is performed on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light. The phase distribution of the target under test is obtained by performing phase-shift decoding processing on the polarization fringe image of the projected polarized light. Based on a preset mapping model between phase distribution and three-dimensional coordinates, the phase distribution of the target under test is mapped to obtain the three-dimensional coordinates of the target surface, thus realizing the three-dimensional measurement of the target.

2. The method according to claim 1, characterized in that, Before performing the mapping process on the phase distribution of the target under test using the preset mapping model between phase distribution and three-dimensional coordinates to obtain the surface three-dimensional coordinates of the target under test and realizing the three-dimensional measurement of the target under test, the following steps are included: The polarization projection device is controlled to project a unidirectional polarization fringe pattern onto a preset planar target surface; The polarization imaging device is controlled to acquire multiple preset images of polarization stripes on the surface of a planar target; Phase calculations are performed on the surface polarization fringe image to obtain phase information; The phase information is mapped using a fringe projection algorithm to obtain a mapping model between the preset phase distribution and three-dimensional coordinates.

3. The method according to claim 1, characterized in that, The polarization fringe image recovered by channel fusion processing of the second total illumination intensity is an effective fringe image related to the polarization light component.

4. The method according to claim 1, characterized in that, The total amount of reflected light is , It is the light intensity of the polarization projection device. The ambient light intensity is the ambient light intensity. It is the surface reflectance of the target surface being measured. It is the debiasing coefficient related to the roughness of the target object. It is the diffuse reflectance coefficient, a variable. Indicates the polarizer angle, variable Indicates the angle of the polarization camera; The step of extracting a component from the total amount of reflected light to obtain the first total illumination intensity of the reflected light includes: Based on the total amount of reflected light The reflected light component is extracted to obtain the first total illumination intensity of the reflected light. ,in, The first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device.

5. The method according to claim 4, characterized in that, The process of characterizing and transforming the first total illuminance to obtain the second total illuminance includes: The first total light intensity Introduced into the projection characteristic expression of a polarization projection device In, among them, This represents the ambient light intensity component that varies with time t. This represents the illumination intensity component of projected polarized light that is independent of time t. Based on projection characteristic expression For the first total illuminance A characterization transformation is performed to obtain the second total illumination intensity characterized by the projection characteristics of the polarization projection device. , It is the polarization modulation coefficient. It is the portion contributed by ambient light.

6. The method according to claim 5, characterized in that, The four polarization angles are 0 degrees, 45 degrees, 90 degrees, and 135 degrees. The process of channel fusion processing of the second total illumination intensity based on these four polarization angles to recover a time-independent polarization fringe image of the projected polarized light includes: Substituting the four polarization angles into the second total illumination intensity characterized by the projection characteristics of the polarization projection device, we obtain the second total illumination intensity corresponding to the four polarization angles. By performing channel fusion processing on the corresponding second total illumination intensities at four polarization angles, the portion contributed by ambient light in the second total illumination intensity is removed, resulting in a time-independent polarization fringe image of the projected polarized light.

7. The method according to claim 1, characterized in that, The step of performing phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test includes: The light intensity values ​​of the polarization fringe image pixels of the projected polarized light are used to form a sinusoidal sequence; The wrap-around phase value of the point is calculated based on the sinusoidal sequence; The phase value of the package is expanded to obtain a continuously changing phase field distribution.

8. A three-dimensional measurement device based on polarized structured light, characterized in that, The three-dimensional measurement device based on polarization structured light is configured in the controller of the three-dimensional measurement system based on polarization structured light. The three-dimensional measurement system based on polarization structured light includes a polarization projection device with a linear polarizer and a polarization imaging device with four polarization directions. The controller establishes a communication connection with the polarization projection device and the polarization imaging device. First, the polarization projection device is controlled to project a unidirectional polarization fringe pattern onto the surface of the target to be measured. Then, the polarization imaging device is controlled to acquire surface polarization fringe images of the target surface, each with four different polarization angles. The four surface polarization fringe images with their respective polarization angles are obtained in the same exposure. The three-dimensional measurement device based on polarization structured light includes: The first determining unit is configured to, in response to a three-dimensional measurement command for the target under test, determine the total amount of reflected light, including projected polarized light and ambient light, collected by the polarization imaging device based on the surface polarization fringe image obtained from the polarization imaging device. An illumination intensity determination unit is used to extract components from the total amount of reflected light to obtain a first total illumination intensity of the reflected light, wherein the first total illumination intensity is characterized based on the imaging characteristics of the polarization imaging device; A conversion unit is used to characterize and convert the first total illumination intensity to obtain a second total illumination intensity, wherein the second total illumination intensity is characterized based on the projection characteristics of the polarization projection device; an ambient light suppression unit is used to perform channel fusion processing on the second total illumination intensity based on four polarization angles to recover a time-independent polarization fringe image of the projected polarized light, wherein the polarization fringe image of the projected polarized light suppresses the dynamic influence of ambient light. A phase-shift decoding unit is used to perform phase-shift decoding processing on the polarization fringe image of the projected polarized light to obtain the phase distribution of the target under test; The mapping determination unit is used to map the phase distribution of the target under test based on a preset mapping model between the phase distribution and the three-dimensional coordinates, so as to obtain the surface three-dimensional coordinates of the target under test and realize the three-dimensional measurement of the target under test.

9. A three-dimensional measurement device based on polarized structured light, characterized in that, The method includes a memory, a processor, and a three-dimensional measurement program stored in the memory and executable on the processor, wherein the processor executes the three-dimensional measurement program to implement the steps of the three-dimensional measurement method based on polarized structured light as described in any one of claims 1 to 7.

10. A medium, characterized in that, The medium stores a program for implementing a three-dimensional measurement method based on polarized structured light, the program for implementing the three-dimensional measurement method based on polarized structured light being executed by a processor to implement the steps of the three-dimensional measurement method based on polarized structured light as described in any one of claims 1 to 7.

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