Centralized control test system and method for inertial device of temperature control rotary table

Abstract

The invention provides a temperature control rotary table inertial device centralized control test system and method. According to the test system, a motion control module is used for enabling a test rotary table to be in a corresponding position posture and / or angular rate under the control of a main control module; the temperature and humidity control module is used for enabling the internal environment of the high and low temperature test box to be at corresponding temperature and humidity under the control of the main control module; the inertial device power supply management module is used for supplying power to a to-be-tested inertial device under the control of the main control module; the test turntable is used for providing a motion condition required by a test for the inertial device to be tested; the high and low temperature test box is used for providing a temperature and humidity environment required by a test for the inertial device to be tested; the inertial device data acquisition module is used for acquiring test feedback data of the inertial device to be tested under the control of the main control module; the master control module is used for unifying clock signals of the motion control module, the temperature and humidity control module, the inertial device data acquisition module and the inertial device power management module. According to the invention, the problems of low test result accuracy and low credibility caused by asynchronous clocks of all functional units in the existing inertial device test system can be solved.

Description

Technical Field

[0001] This invention belongs to the field of inertial device testing, and more specifically, relates to a temperature-controlled turntable inertial device centralized control testing system and method. Background Technology

[0002] Currently, performance testing of inertial devices (such as fiber optic gyroscopes and assemblies, accelerometers, MEMS-IMUs, etc.) under temperature conditions typically employs a discrete control mode. This means that the high and low temperature test chamber, test turntable, data acquisition system, and power management system are all independent devices with their own control units. Testing is then conducted manually, using simple test scripts, or through specially developed test systems. The aforementioned testing methods for inertial devices have the following main drawbacks:

[0003] The test turntable and the high and low temperature test chamber are driven by different controllers, which leads to clock asynchrony and time deviation in the test data. This affects the accuracy of the input angular rate, and thus the accuracy of the inertial device calibration fitting results.

[0004] The motion control reference of the test turntable is independent of the reference of the inertial device data acquisition (for example, the test turntable uses its own encoder signal as the reference, while the data acquisition system uses its own clock signal as the data acquisition reference). This leads to time asynchrony and reference source deviation between the motion input excitation and the output response of the inertial device. For high-precision inertial devices, this will seriously result in a loss of test input accuracy and reduce the reliability of test results. Summary of the Invention

[0005] In view of this, the present invention provides a temperature-controlled turntable inertial device centralized control test system and method.

[0006] According to a first aspect of the present invention, a temperature-controlled turntable inertial device integrated control test system is provided, the system comprising a main control module, a motion control module, a temperature and humidity control module, an inertial device data acquisition module, an inertial device power management module, a test turntable, and a high and low temperature test chamber;

[0007] The motion control module is used to position the test turntable in a corresponding position and / or angular rate under the control of the main control module.

[0008] The temperature and humidity control module is used to maintain the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity under the control of the main control module.

[0009] The inertial device power management module is used to supply power to the inertial device under test under the control of the main control module;

[0010] The test turntable is used to provide the motion conditions required for testing the inertial device under test;

[0011] The high and low temperature test chamber is used to provide the temperature and humidity environment required for testing the inertial device under test;

[0012] The inertial device data acquisition module is used to acquire test feedback data of the inertial device under test under the control of the main control module, and upload the acquired test feedback data to the main control module.

[0013] The main control module is used to unify the clock signals of the motion control module, the temperature and humidity control module, the inertial device data acquisition module, and the inertial device power management module.

[0014] According to a second aspect of the present invention, a method for centralized control testing of inertial devices on a temperature-controlled turntable is provided. This method is implemented based on the aforementioned centralized control testing system for inertial devices on a temperature-controlled turntable, and includes the following steps:

[0015] The main control module controls the test turntable through the motion control module to make the test turntable position and / or angular rate in the corresponding position and / or attitude.

[0016] The main control module controls the high and low temperature test chamber through the temperature and humidity control module to keep the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity.

[0017] The main control module controls the inertial device power management module to supply power to the inertial device under test;

[0018] The main control module controls the inertial device data acquisition module to acquire test feedback data of the inertial device under test, and receives test feedback data uploaded by the inertial device data acquisition module.

[0019] The beneficial effects of this invention are as follows:

[0020] Based on the temperature-controlled turntable inertial device centralized control test system of the present invention, and combined with the temperature-controlled turntable inertial device centralized control test method of the present invention, when performing performance tests on inertial devices under temperature conditions, the motion control module for controlling the test turntable, the temperature and humidity control module for controlling the high and low temperature test chamber, the inertial device data acquisition module, and the inertial device power management module can have a unified time reference, thereby effectively solving the problem of low accuracy and low reliability of test results caused by the asynchronous clocks of various functional units in existing inertial device test systems.

[0021] Other features and advantages of the present invention will be described in detail in the following detailed description section. Attached Figure Description

[0022] The present invention can be better understood by referring to the following description taken in conjunction with the accompanying drawings, in which the same or similar reference numerals are used throughout the drawings to denote the same or similar parts.

[0023] Figure 1 A schematic block diagram of a temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is shown.

[0024] Figure 2 A general control flowchart of a temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is shown.

[0025] Figure 3 A detailed control flowchart of a temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is shown. Detailed Implementation

[0026] To enable those skilled in the art to more fully understand the technical solutions of the present invention, exemplary embodiments of the present invention will be described more comprehensively and in detail below with reference to the accompanying drawings. Obviously, the one or more embodiments of the present invention described below are merely one or more specific ways to implement the technical solutions of the present invention, and are not exhaustive. It should be understood that other ways belonging to a general inventive concept can be used to implement the technical solutions of the present invention, and should not be limited to the embodiments described exemplary. Based on one or more embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0027] Example: Figure 1 A schematic block diagram of the temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is shown. (Refer to...) Figure 1 The temperature-controlled turntable inertial device integrated control test system of this invention includes a main control module, a motion control module, a temperature and humidity control module, an inertial device data acquisition module, an inertial device power management module, a test turntable, and a high and low temperature test chamber.

[0028] The motion control module is used to keep the test turntable in the corresponding position, attitude and / or angular rate under the control of the main control module;

[0029] The temperature and humidity control module is used to maintain the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity under the control of the main control module.

[0030] The inertial device power management module is used to supply power to the inertial device under test under the control of the main control module;

[0031] The test turntable is used to provide the motion conditions required for testing the inertial device under test;

[0032] High and low temperature test chambers are used to provide the temperature and humidity environment required for testing inertial devices under test;

[0033] The inertial device data acquisition module is used to acquire test feedback data of the inertial device under test under the control of the main control module, and upload the acquired test feedback data to the main control module.

[0034] The main control module is used to unify the clock signals of the motion control module, temperature and humidity control module, inertial device data acquisition module, and inertial device power management module.

[0035] Specifically, Figure 2 The overall control flowchart of the temperature-controlled turntable inertial device integrated control test system according to an embodiment of the present invention is shown. The main control module, motion control module, temperature and humidity control module, inertial device data acquisition module, and inertial device power management module are integrated into a single control system. The inertial device under test is equipped with a first inertial device switching power supply and a second inertial device switching power supply.

[0036] In this embodiment of the invention, the control system completes the synchronous control of the test turntable, the high and low temperature test chamber, and the switching power supply of the inertial device, and integrates the data acquisition function of the inertial device, achieving "one-card" integration and universality. (Refer to...) Figure 2 The synchronization control process of the control system is as follows:

[0037] In step “1”, the production or research and development testing tasks and task summary list in the production system (MES) can be read through the user control terminal, and the testing task can be selected to be carried out according to the calibration test requirements. Secondly, the test plan instruction is sent to the control system through the user control terminal. The control system sends communication handshake signals to the test turntable, high and low temperature test chamber, inertial device switching power supply and the inertial device under test based on the received test plan instruction, and receives the inertial device test data in real time and interacts and records it with the user control terminal.

[0038] In step "2", after receiving the test plan instruction from the remote control computer, the control system directly acquires the position or rate signal from the test turntable angle sensor according to the requirements of the inertial device for testing specific position attitude or angular rate changes, and inputs the required position attitude or rate information to the test turntable. This step improves the accuracy by at least three orders of magnitude compared to inputting position attitude or rate information through turntable self-control, where the accuracy of traditional test turntable self-control position and rate is only (1×10⁻⁶). -4 The accuracy level is (1×10⁻⁶)°, while the control system of this embodiment can directly read the position or rate signal of the turntable angle sensor to obtain the accuracy level (1×10⁻⁶). -27 )° (turntable angle sensor - minimum resolution of grating).

[0039] In step "3", the control system can send temperature / humidity monitoring data commands for the "high and low temperature test chamber" according to the environmental conditions required for the calibration test of the inertial device or the temperature control requirements of the inertial device test process. This is to determine whether the calibration test temperature environment of the inertial device meets the process requirements. If the temperature control requirements are met, the self-test ready command for the calibration position or rate status of the inertial device is executed. Otherwise, the control system replaces the local control terminal of the high and low temperature test chamber to control the high and low temperature test chamber, so that the inertial device is within the required test temperature range, and maintains the same clock base point with the inertial device data acquisition module in real time. The test clock base point alignment accuracy can reach 0.625ms. Compared with the traditional independent local control test time error of the temperature chamber (not less than 5 minutes), the embodiment of the present invention effectively improves the test timeliness and test reproducibility accuracy.

[0040] In step “4-1”, the control system sends a power output / shutdown command to the first inertial device switching power supply according to the batch calibration product quantity of the inertial device and the power supply requirements of the inertial device. The power supply can output 12 channels of ±5V, with ripple not exceeding 30mV, and the accuracy of line loss compensation can reach ±0.1V. The output operating current is (0~5)A. The control system can automatically control (correct parameters) the maximum output current protection of the inertial device power switch according to the specifications and model of the inertial device being tested pushed from the remote end.

[0041] In step “4-2”, the control system sends a power output / shutdown command to the second inertial device switching power supply according to the batch calibration product quantity of the inertial device and the power supply requirements of the inertial device. The power supply can output 12 channels of ±15V with a ripple of no more than 50mV and an output operating current of (0~3)A. The power supply can also automatically control (correct parameters) the maximum output current protection of the inertial device power switch according to the specifications and model of the inertial device being tested pushed from the remote end.

[0042] In step “5-1”, the control system determines the current test process progress through the inertial device data acquisition module, and determines whether to continue supplying power to the inertial device under test based on the current test process progress, thereby realizing multi-channel ±5V power on / off control.

[0043] In step “5-2”, the control system determines the current test process progress through the inertial device data acquisition module, and determines whether to continue supplying power to the inertial device under test based on the current test process progress, thereby realizing multi-channel ±15V power on / off control.

[0044] In step "6", the control system executes the temperature conditions and attitude or rate requirements required for the process according to the inertial device test plan. It interacts in real time with the high and low temperature test chamber, test turntable, inertial device switching power supply and integrated inertial device data acquisition function. This enables all test systems (subsystems of inertial test equipment) required in the entire test process to be tested with the same clock base point, and to perform cyclic testing of inertial devices under various position attitudes and different angular rate requirements under the entire product test temperature conditions. This constitutes a highly integrated, highly automated inertial device test system that provides high-precision position and rate test conditions.

[0045] Specifically, Figure 3 A detailed control flowchart of the temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is shown. (Refer to...) Figure 3 The specific control flow of the temperature-controlled turntable inertial device centralized control test system according to an embodiment of the present invention is as follows:

[0046] In step "1-1", the remote control computer interacts with the production management system (MES server). The remote control computer acts as an intermediate bridge to realize data interaction between the production management system and the main control module (FGPA logic circuit), thereby achieving test automation and digitization.

[0047] In steps “1-2”, the remote control computer pushes down calibration test instructions, and the main control module executes each calibration test instruction to achieve real-time data interaction, recording and uploading.

[0048] In step "2-1", the turntable position and rate control functions are integrated for this embodiment of the invention, providing the required higher position and rate accuracy test environment conditions for inertial device calibration testing. This centralized control function achieves the same accuracy between the turntable and the grating (angle sensor), while simultaneously improving the fitting accuracy of the input and output data during the inertial device calibration testing process from the traditional (1×10⁻⁶)... -4 )° increased to (1×10 -27 Therefore, the Type B uncertainty factor introduced by the turntable can be completely ignored during the inertial device calibration test. Only the Type B uncertainty factor introduced by the temperature-controlled turntable inertial device centralized control test system needs to be considered. This provides higher precision environmental calibration test conditions for high-precision inertial devices.

[0049] In steps “2-2” and “2-3”, the independent control mode of the temperature-controlled turntable inertial device centralized control test system is implemented. This step ensures that the test clocks required for the inertial device data acquisition function are from the same source and have the same base point. Furthermore, during the calibration of the rate accuracy, the “reference value” displayed in the measurement aspect transitions to the “standard value”, thereby significantly improving the overall calibration accuracy of the inertial device.

[0050] In steps “2-4”, the interaction between the test turntable angle sensor signal and the required drive current of the test turntable drive motor is realized, and the real-time working parameters of the motor driver are obtained, so as to realize the control closed loop between the test turntable torque motor and the motion control module (servo motor DSP logic circuit).

[0051] In steps “2-5”, the interaction between motor control parameters and angle sensor signals and the relative or absolute position signals of the drive motor is realized.

[0052] In step “2-6”, the module in step “2-4” is used to realize the data interaction between the angle encoder digital signal and the main control module, so as to realize the test turntable function and accuracy control.

[0053] In step “3-1”, the inertial device data acquisition module of the present invention monitors the temperature / humidity environment data of the device under test through the temperature / humidity sensor of the high and low temperature test chamber and interacts with the centralized control system in real time. The unified clock reference of the centralized control system is used as the standard reference point to control the start and stop of the “high and low temperature test chamber”.

[0054] In step "3-2", the temperature environment test plan executed by this invention is replaced by the traditional independent operation procedures of the high and low temperature test chamber through the centralized control system of this invention. This improves the overall automation level of the inertial device testing equipment and enhances the efficiency of planned test execution.

[0055] In step “3-3”, the traditional functional modules of the high and low temperature test chamber are used to realize the heat exchange of the compressor refrigeration system. The refrigerant flow rate of the high and low temperature chamber and the working time and power of the heating wire are realized through the thermal expansion valve and the servo motor control valve.

[0056] In steps “3-4” and “3-5”, the signal source monitoring and control feedback of the high and low temperature test chamber is carried out. The environmental data of the test chamber is obtained through this step and the signal monitoring data is sent to step “3-3”. Temperature data is exchanged through step “3-5” and the temperature control function is realized by the temperature control turntable inertial device centralized control system to the PLC logic control module.

[0057] In steps “3-5”, the temperature monitoring function integrated by the present invention is used to monitor whether the dwell time of the inertial device under test in the test temperature environment reaches the process specification requirements, and the dwell time is kept at the same clock base point as the turntable control time reference. If the dwell time is reached, the “temperature control turntable inertial device centralized control system” sends a power-on command to the “inertial device switching power supply” to the device under test. The device under test is powered through the external channel in step “4-3”. At the same time, the centralized control system sends transmit and receive signals to the test channel of the test turntable to achieve synchronous and automatic testing.

[0058] In steps “4-1” to “4-3”, after monitoring the temperature data of the high and low temperature test chamber through the integrated system of this invention, the system compares in real time whether the temperature dwell time of the inertial device meets the requirements specified in the test plan (process). If the temperature and time requirements are met, the centralized control system executes the position, attitude, or rate control function of the test turntable. At the same time, the centralized control system of the inertial device on the temperature-controlled turntable sends a device power-on command to the “power switch” and a communication handshake command to the inertial device, respectively, realizing the automatic power-on and automatic testing function required by the inertial device calibration test plan (process). This function can control the time synchronization accuracy to be better than 0.625ms.

[0059] In step "5-1", the electrical power supply of the inertial device and the acquisition of test status data are realized.

[0060] In step “5-2”, the calibration test status data of the inertial device is synchronized with the clock of the centralized control system of the present invention, so as to realize the synchronous output of the test device under various position, attitude or rate conditions of the inertial device, as well as the synchronous output of the test device under various temperature conditions under various position, attitude or rate conditions of the inertial device.

[0061] The core innovation of this invention lies in achieving high-precision collaborative control of multiple subsystems. Through the application of the "Temperature-Controlled Turntable Inertial Device Integrated Control Testing System Technology," the system achieves real-time clock synchronization between the temperature chamber dwell time and the inertial device data acquisition, while ensuring strict synchronization between the turntable position and status signals and the inertial device testing process, greatly improving the accuracy and reliability of the test data. Furthermore, the system directly uses the signals from the precision sensors of the test turntable as the standard values ​​for rate and position, abandoning the traditional external reference value input method and fundamentally avoiding the indirect measurement errors introduced by this. The system also integrates multi-channel control modes, effectively overcoming the cumulative error problems caused by independent turntable control errors, temperature chamber feedback delays, and independent data acquisition systems in traditional distributed control. This not only significantly improves testing accuracy and timeliness technically, but also greatly reduces the manufacturing cost of dedicated calibration equipment at the engineering application level, enhancing overall testing efficiency and system integration, making it suitable for the batch and automated calibration testing of high-precision inertial devices.

[0062] The temperature-controlled turntable inertial device centralized control test system according to the embodiments of the present invention integrates turntable control, temperature control module, data acquisition module, and power supply module for the device under test into the same control system to achieve integrated management. A high-precision synchronous clock source is adopted to ensure the time consistency of the turntable control signal, temperature control signal, and inertial device acquisition signal. The high-precision synchronizer signal generated by the test turntable controller (used to characterize the accurate position or rate information of the turntable) is not only sent to the servo drive unit of the turntable itself for closed-loop control, but also serves as the same reference source for the entire test system and is directly provided to the gyro test system (data acquisition system) as the synchronous clock and reference for signal acquisition. Based on the synchronizer signal of the turntable angle sensor, the output signals of the inertial devices are synchronously sampled to ensure that each attitude or rate input point corresponds to an accurate device output value, fundamentally eliminating the time-base error. The clock synchronization of multiple modules is achieved through an FPGA dedicated synchronization chip, reducing the time deviation and improving the accuracy of the test data. Each subsystem is self-contained, and the state of the entire test system is monitored in real time and protected in a linked manner from a unified platform. For example, the environmental temperature, turntable attitude, motion rate, device output data, etc. are all centrally controlled by the temperature-controlled turntable inertial device centralized control system. The unified clock base point is used to record the detection conditions of the supporting equipment simultaneously, reducing the process of manual integration and comparison required in the later stage due to different system records, realizing digitalization of problems, easy traceability of the calibration test process, and automation improvement of data processing and analysis. The user sets the temperature profile (such as temperature change rate, heat preservation point, duration), turntable motion trajectory (such as multiple position points, rate, sweep frequency mode), power supply parameters, and data acquisition rules in the integrated interface of the main control software. The control instructions can be synchronously sent to a temperature-controlled turntable inertial device centralized control test system technology through the instructions of the main control software (remote computer). This centralized control system synchronously sends the control instructions to the high and low temperature test chamber, test turntable, power switch, and inertial device data acquisition, etc. The test process is automatically executed, and the entire test process, from start to end, including exception handling, can be automatically completed by the centralized control system of the present invention without manual intervention.

[0063] The temperature-controlled turntable inertial device centralized control test system according to the embodiments of the present invention has the following beneficial effects:

[0064] Improve test accuracy: Clock synchronization reduces time error, making the dynamic performance test more accurate. <l

[0065] Enhance test efficiency: The integrated test system reduces the step-by-step test time and shortens the test cycle.

[0066] Enhance data consistency: The unified clock and integrated control ensure the reliability and repeatability of the test data.

[0067] Reduce system complexity: It features convenience, efficiency, practicality, low operational threshold, and rapid improvement, significantly reducing manual intervention and improving the automation level and productivity of data processing. For example, it reduces additional time alignment processing and simplifies the data analysis process.

[0068] Excellent repeatability and consistency: The software-based testing process ensures that the conditions and steps of each test are completely consistent, resulting in excellent repeatability and comparability of test results.

[0069] Powerful data management capabilities: All data is automatically linked and stored to form a complete data chain, supporting fast querying, tracing, and one-click generation of test reports.

[0070] Accordingly, based on the temperature-controlled turntable inertial device centralized control test system of this embodiment, this embodiment also proposes a temperature-controlled turntable inertial device centralized control test method based on the temperature-controlled turntable inertial device centralized control test system, the method comprising the following steps:

[0071] Step S100: The main control module controls the test turntable through the motion control module to make the test turntable be in the corresponding position, attitude and / or angular rate.

[0072] Step S200: The main control module controls the high and low temperature test chamber through the temperature and humidity control module to keep the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity.

[0073] Step S300: The main control module controls the inertial device power management module to supply power to the inertial device under test;

[0074] Step S400: The main control module controls the inertial device data acquisition module to acquire the test feedback data of the inertial device under test, and receives the test feedback data uploaded by the inertial device data acquisition module.

[0075] While one or more embodiments of the present invention have been described above, those skilled in the art will recognize that the present invention can be implemented in any other form without departing from its spirit and scope. Therefore, the embodiments described above are illustrative and not restrictive, and many modifications and substitutions will be apparent to those skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.

Claims

1. A temperature-controlled turntable inertial device centralized control and testing system, characterized in that, It includes a main control module, motion control module, temperature and humidity control module, inertial device data acquisition module, inertial device power management module, test turntable, and high and low temperature test chamber; The motion control module is used to position the test turntable in a corresponding position and / or angular rate under the control of the main control module. The temperature and humidity control module is used to maintain the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity under the control of the main control module. The inertial device power management module is used to supply power to the inertial device under test under the control of the main control module; The test turntable is used to provide the motion conditions required for testing the inertial device under test; The high and low temperature test chamber is used to provide the temperature and humidity environment required for testing the inertial device under test; The inertial device data acquisition module is used to acquire test feedback data of the inertial device under test under the control of the main control module, and upload the acquired test feedback data to the main control module. The main control module is used to unify the clock signals of the motion control module, the temperature and humidity control module, the inertial device data acquisition module, and the inertial device power management module.

2. A method for centralized control and testing of inertial devices on a temperature-controlled turntable, characterized in that, This is achieved based on the temperature-controlled turntable inertial device centralized control and testing system described in claim 1; The temperature-controlled turntable inertial device centralized control test method includes the following steps: The main control module controls the test turntable through the motion control module to make the test turntable position and / or angular rate in the corresponding position and / or attitude. The main control module controls the high and low temperature test chamber through the temperature and humidity control module to keep the internal environment of the high and low temperature test chamber at the corresponding temperature and humidity. The main control module controls the inertial device power management module to supply power to the inertial device under test; The main control module controls the inertial device data acquisition module to acquire test feedback data of the inertial device under test, and receives test feedback data uploaded by the inertial device data acquisition module.

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