Device and method for testing service life of lock-type light-operated switch

Abstract

The invention provides a lock-type light-operated switch life test device and method, and the device comprises an energy storage assembly which is used for storing electric energy and releasing the electric energy during the life test of a lock-type light-operated switch to form pulse current; the waveform generation module is used for generating a pulse current waveform according to the pulse current released by the energy storage assembly and the lock-type light-operated switch; the charging and discharging control module is used for charging and discharging the energy storage assembly; the pulse control module is used for controlling the time when the energy storage assembly releases the pulse current to the waveform generation module; and the test control module is used for receiving the test parameters, controlling the charge and discharge control module and the pulse control module to charge and discharge the energy storage assembly according to the test parameters, and collecting the pulse current waveform generated by the waveform generation module so as to complete the service life test of the lock-type light-operated switch. According to the invention, a circuit structure meeting a standard test requirement is designed to detect the service life of the lock-type light-operated switch, and the reliability of a service life test result of the light-operated switch is improved.

Description

Technical Field

[0001] This invention relates to the field of switch life testing, and more particularly to a device and method for testing the life of a lock-type optical switch. Background Technology

[0002] The standard ANSI C136.10-2023 has added test requirements for the life of electronic loads of lock-type light-controlled switches. It mainly targets the physical and electrical interchangeability of light-controlled devices and matching sockets, as well as the life test of light-controlled switches. Since the load of light-controlled devices will generate huge inrush current due to extremely low impedance when the light-controlled switch is closed, how to reliably evaluate the life of light-controlled switches has become a technical problem that needs to be studied.

[0003] Currently, existing technologies mainly use high-power wire-wound resistors or cement resistors as loads, which are directly connected in series at the output of the light-controlled switch to simulate a constant purely resistive current load for testing the lifespan of the lock-type light-controlled switch. However, the starting current of the resistive load in this scheme rises steadily, making it difficult to simulate the working condition when a very large inrush current is generated due to extremely low impedance, resulting in poor reliability of the lifespan test results of the light-controlled switch. Summary of the Invention

[0004] To address the aforementioned issues, this invention proposes a device and method for testing the lifespan of a lock-type light-controlled switch. This method utilizes a circuit structure designed to meet standard testing requirements to detect the lifespan of the lock-type light-controlled switch, thereby improving the reliability of the lifespan test results.

[0005] To achieve the above objectives, embodiments of the present invention provide a life testing device for a latching light-controlled switch, applied to the life testing of a latching light-controlled switch. The device includes: an isolated power supply module, a test control module, an energy storage component, a waveform generation module, a charge / discharge control module, a pulse control module, and a sample power supply module. The isolated power supply module is electrically connected to the test control module; the test control module is electrically connected to the waveform generation module; the test control module is also electrically connected to the charge / discharge control module; the test control module is also electrically connected to the pulse control module; the energy storage component is electrically connected to the charge / discharge control module; the energy storage component is also electrically connected to the pulse control module; the energy storage component is also electrically connected to the waveform generation module; the pulse control module is electrically connected to the waveform generation module; the pulse control module is also electrically connected to the charge / discharge control module; the waveform generation module is electrically connected to the latching light-controlled switch; the waveform generation module is also electrically connected to the charge / discharge control module. The system is as follows: The sample power supply module is electrically connected to the charge / discharge control module; the charge / discharge control module is also electrically connected to the latching light-controlled switch; the isolation power supply module provides an electrically isolated operating voltage to the test control module; the energy storage component stores electrical energy and releases it to form a pulse current during the latching light-controlled switch life test; the waveform generation module generates a pulse current waveform based on the pulse current released by the energy storage component and the latching light-controlled switch; the charge / discharge control module charges and discharges the energy storage component; the pulse control module controls the timing of the energy storage component releasing pulse current to the waveform generation module; the sample power supply module provides the operating voltage to the charge / discharge control module; and the test control module receives test parameters and controls the charge / discharge control module and the pulse control module to charge and discharge the energy storage component according to the test parameters, and acquires the pulse current waveform generated by the waveform generation module to complete the latching light-controlled switch life test.

[0006] This invention proposes a life testing device for a latching light-controlled switch. The device comprises seven modules: an isolated power supply module, a test control module, an energy storage component, a waveform generation module, a charge / discharge control module, a pulse control module, and a sample power supply module. The test control module receives test parameters and controls the charge / discharge control module and the pulse control module to charge and discharge the energy storage component based on these parameters. The waveform generation module generates a pulse current waveform, which provides a basis for meeting standard test requirements, thus improving the reliability of the latching light-controlled switch life test results.

[0007] Furthermore, the test control module includes: an operation unit, a main control unit, and a data acquisition unit; the operation unit is electrically connected to the isolated power supply module; the main control unit is electrically connected to the isolated power supply module; the main control unit is also electrically connected to the charge / discharge control module; the data acquisition unit is electrically connected to the isolated power supply module; the data acquisition unit is also electrically connected to the waveform generation module; the data acquisition unit is also electrically connected to the pulse control module; the operation unit is used to receive test parameters and send the test parameters to the main control unit; the data acquisition unit is used to collect the stored energy of the energy storage component, the pulse current released by the energy storage component, and the time of the pulse current released by the energy storage component to the waveform generation module in real time, obtain monitoring data, and send the monitoring data to the main control unit; the main control unit is used to output control commands according to the test parameters and monitoring data, and complete the life test of the lock-type light-controlled switch according to the control commands.

[0008] In the above scheme, the test control module is specifically divided into an operation unit, a main control unit, and an acquisition unit. The three unit components with clearly defined functions ensure the accurate execution of test commands, the reliable acquisition of real-time data, and the accurate feedback of control commands, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0009] Furthermore, the isolated power supply module includes: a first isolated power supply, a second isolated power supply, and a third isolated power supply; the first isolated power supply is electrically connected to the operating unit; the second isolated power supply is electrically connected to the main control unit; and the third isolated power supply is electrically connected to the acquisition unit; the first isolated power supply is used to provide an electrically isolated operating voltage for the operating unit; the second isolated power supply is used to provide an electrically isolated operating voltage for the main control unit; and the third isolated power supply is used to provide an electrically isolated operating voltage for the acquisition unit.

[0010] In the above scheme, three independent power supplies—the first isolation power supply, the second isolation power supply, and the third isolation power supply—are used to power the operation unit, the main control unit, and the acquisition unit, respectively. Through power supply isolation, the common ground interference and conducted noise of the power circuit to the sensitive control and acquisition circuit are effectively blocked, ensuring the purity of the control signal and the accuracy of the acquired data, which helps to improve the reliability of the life test results of the lock-type optical control switch.

[0011] Furthermore, the waveform generation module includes: a rectifier and filter unit and a current waveform generation unit; the rectifier and filter unit is electrically connected to the charge and discharge control module, and also electrically connected to the energy storage component; the rectifier and filter unit is also electrically connected to the pulse control module; the current waveform generation unit is electrically connected to the pulse control module; the rectifier and filter unit is also electrically connected to the acquisition unit; the current waveform generation unit is also electrically connected to the acquisition unit, and also electrically connected to the charge and discharge control module; the current waveform generation unit is also electrically connected to the lock-type light-controlled switch; the rectifier and filter unit is used to provide a stable charging voltage for the energy storage component to generate a pulse current; the current waveform generation unit is used to generate a pulse current waveform based on the pulse current in the connection circuit with the lock-type light-controlled switch.

[0012] In the above scheme, the waveform generation module consists of a rectifier and filter unit and a current waveform generation unit. The rectifier and filter unit is responsible for converting AC power into stable and clean DC power to provide consistent and controllable charging energy for the energy storage component. The current waveform generation unit, together with the energy storage component and the lock-type light control switch, forms a discharge circuit and shapes the energy released from the energy storage into a pulse current waveform to provide a basis for meeting standard test requirements, thereby improving the reliability of the life test results of the lock-type light control switch.

[0013] Furthermore, the charge / discharge control module includes: a first relay, a second relay, and a third relay; the first relay is electrically connected to the sample power supply module; the first relay is also electrically connected to the rectifier and filter unit; the second relay is electrically connected to the sample power supply module; the second relay is also electrically connected to the current waveform generation unit; the second relay is also electrically connected to the lock-type light control switch; the third relay is electrically connected to the sample power supply module; the third relay is also electrically connected to the rectifier and filter unit; the third relay is also electrically connected to the energy storage unit; the third relay is also electrically connected to the pulse control module; and the third relay is also electrically connected to the acquisition unit; the first relay is used to control the charging of the energy storage component; the second relay is used to control the on and off of the lock-type light control switch; and the third relay is used to control the discharging of the energy storage component.

[0014] In the above scheme, the charging and discharging control module adopts a design that uses discrete relays to perform key switching functions, so that the first relay, the second relay and the third relay are logically mutually exclusive. This ensures that the three core stages of charging, testing and discharging are completely electrically separated. Through physical isolation of hardware, errors that occur during the testing process are reduced, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0015] Furthermore, the charge / discharge control module is used to charge and discharge the energy storage component, including: when the second relay is open, the third relay is open, and the first relay is closed, the rectifier and filter unit provides a stable charging voltage to the energy storage component for charging, and the energy storage component stores electrical energy; when the first relay is open, the third relay is open, and the second relay is closed, the lock-type light control switch is turned on and the pulse control module is turned on to release electrical energy to form a pulse current during the life test of the lock-type light control switch, and a pulse current waveform is generated according to the pulse current in the connection circuit between the current waveform generation unit and the lock-type light control switch; when the second relay is open, the first relay is open, and the third relay is closed, the pulse control module is turned off and the energy storage component is discharged.

[0016] In the above scheme, various different operating condition combinations are designed for the first, second, and third relays, decomposing the complex life test process of the lock-type light-controlled switch into multiple safe steps that can be executed automatically. The scheme distinguishes the working modes of the relays during the energy storage module charging, energy storage module discharging, and lock-type light-controlled switch testing stages, preventing problems such as reverse power feeding, accidental short circuits, or residual energy, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0017] Furthermore, in the test control module, which receives test parameters and controls the charge / discharge control module and pulse control module to charge / discharge the energy storage component according to the test parameters, and acquires the pulse current waveform generated by the waveform generation module to complete the life test of the lock-type light-controlled switch, before performing the life test of the lock-type light-controlled switch, the process includes: controlling the lock-type light-controlled switch to open, receiving test parameters and performing a preset number of preset tests according to the test parameters to obtain a standard waveform; performing the life test of the lock-type light-controlled switch, including: controlling the lock-type light-controlled switch to close, performing a life test on the lock-type light-controlled switch based on the test parameters to obtain a pulse current waveform; and generating the life test result of the lock-type light-controlled switch based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

[0018] In the above scheme, a no-load test is designed to obtain a standard waveform to calibrate and verify the output performance of the life test device itself, ensuring that the generated pulse current waveform itself meets the standard requirements. Then, a latching light-controlled switch is connected for life testing to obtain the measured pulse current waveform. Finally, based on the pulse current waveform and the standard waveform, the life test results of the latching light-controlled switch are generated to complete the life test of the latching light-controlled switch. Therefore, performing a no-load test before starting the life test of the latching light-controlled switch can reduce the errors inherent in the life test device itself, making the life assessment results of the light-controlled switch more objective and accurate, and helping to improve the reliability of the life test results of the latching light-controlled switch.

[0019] This invention also provides a method for testing the lifespan of a latching light-controlled switch, executed by a test control module, including: receiving test parameters and controlling a charge / discharge control module and a pulse control module to charge / discharge the energy storage component according to the test parameters; and acquiring a pulse current waveform generated by a waveform generation module to complete the lifespan test of the latching light-controlled switch.

[0020] This invention proposes a method for testing the lifespan of a latching light-controlled switch. The method involves a test control module receiving test parameters and controlling a charge / discharge control module and a pulse control module to charge and discharge the energy storage component based on these parameters. In conjunction with a waveform generation module, a pulse current waveform is generated. This pulse current waveform provides a basis for meeting standard test requirements, thereby improving the reliability of the latching light-controlled switch lifespan test results.

[0021] Furthermore, the step of acquiring the pulse current waveform generated by the waveform generation module to complete the life test of the lock-type light-controlled switch includes: controlling the lock-type light-controlled switch to open, receiving test parameters and performing a preset number of preset test tests according to the test parameters to obtain a standard waveform; controlling the lock-type light-controlled switch to close, performing a life test on the lock-type light-controlled switch based on the test parameters to obtain a pulse current waveform; and generating the life test result of the lock-type light-controlled switch based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

[0022] Furthermore, based on the pulse current waveform and the standard waveform, the life test results of the lock-type light-controlled switch are generated to complete the life test of the lock-type light-controlled switch. This includes: if an abnormal operation signal or a lock-type light-controlled switch life test completion signal is received from the test control module, a shutdown command is output, and the life test results of the lock-type light-controlled switch are generated based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch. Attached Figure Description

[0023] Figure 1 A schematic diagram of the module structure of a lock-type optical switch life testing device provided in a certain embodiment of the present invention; Figure 2 A schematic diagram of the external power supply circuit structure of a lock-type optical switch life testing device provided in a certain embodiment of the present invention; Figure 3 A schematic diagram of the test control module and charge / discharge control module of a lock-type optical switch life testing device provided in a certain embodiment of the present invention; Figure 4 This is a schematic diagram of the isolated power supply module structure of a lock-type optical switch life testing device according to a certain embodiment of the present invention; Figure 5 This is a schematic diagram of the waveform generation module structure of a lock-type optical control switch life testing device according to a certain embodiment of the present invention; Figure 6 This is a schematic diagram of the structure of a lock-type optical control switch in a life testing device for a lock-type optical control switch according to a certain embodiment of the present invention; Figure 7 A schematic diagram of a standard waveform generated by a life testing device for a lock-type optical switch according to a certain embodiment of the present invention; Figure 8 This is a flowchart illustrating the steps of a life test method for a lock-type light-controlled switch according to a certain embodiment of the present invention. Detailed Implementation

[0024] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0025] Example 1 See Figure 1 , Figure 1 This is a schematic diagram of the module structure of a lock-type optical switch life testing device provided in one embodiment of the present invention. Figure 1 As shown in the figure, this invention provides a life testing device for a lock-type light-controlled switch, applied to the life testing of a lock-type light-controlled switch 8. The device includes: an isolation power supply module 1, a test control module 2, an energy storage component 3, a waveform generation module 4, a charge / discharge control module 5, a pulse control module 6, and a sample power supply module 7. The isolation power supply module 1 is electrically connected to the test control module 2; the test control module 2 is electrically connected to the waveform generation module 4; the test control module 2 is also electrically connected to the charge / discharge control module 5; and the test control module 2 is also electrically connected to the pulse control module 6. Energy storage module 3 is electrically connected to charge / discharge control module 5; energy storage module 3 is also electrically connected to pulse control module 6; energy storage module 3 is also electrically connected to waveform generation module 4; pulse control module 6 is electrically connected to waveform generation module 4; pulse control module 6 is also electrically connected to charge / discharge control module 5; waveform generation module 4 is electrically connected to lock-type light control switch 8; waveform generation module 4 is also electrically connected to charge / discharge control module 5; sample power supply module 7 is electrically connected to charge / discharge control module 5; charge / discharge control module 5 is also electrically connected to lock-type light control switch 8.

[0026] In this embodiment, see Figure 2 , Figure 2 This is a schematic diagram of the external power supply circuit structure of a lock-type optical switch life testing device according to a certain embodiment of the present invention, as shown below. Figure 2As shown, the isolated power supply module 1 is electrically connected to the device power supply through the Equ_L interface and the Equ_N interface, and the charge / discharge control module 5 is electrically connected to the device power supply through the Equ_L interface and the Equ_N interface.

[0027] See Figure 3 , Figure 3 This is a schematic diagram of the test control module and charge / discharge control module of a lock-type optical switch life testing device according to a certain embodiment of the present invention; as shown. Figure 3 As shown, the test control module 2 includes: an operation unit, a main control unit, and an acquisition unit; the operation unit is electrically connected to the isolation power supply module 1; the main control unit is electrically connected to the isolation power supply module 1; the main control unit is also electrically connected to the charge / discharge control module 5; the acquisition unit is electrically connected to the isolation power supply module 1; the acquisition unit is also electrically connected to the waveform generation module 4; and the acquisition unit is also electrically connected to the pulse control module 6.

[0028] In this embodiment, the operation unit is electrically connected to the isolated power supply module 1 via the VDD1 interface; the main control unit is electrically connected to the isolated power supply module 1 via the VDD2 interface; the acquisition unit is electrically connected to the isolated power supply module 1 via the VDD3 interface; the acquisition unit is also electrically connected to the waveform generation module 4 via the V_sensor interface, the I_sensor interface, and the T_sensor interface; the acquisition unit is also electrically connected to the pulse control module 6. It is worth mentioning that the pulse control module 6 is represented as a fixed relay SSR1, and the main control unit is also electrically connected to the fixed relay SSR1 via the DC24V interface and the DC0V interface.

[0029] For example, see Figure 4 , Figure 4 This is a schematic diagram of the isolated power supply module structure of a lock-type optical switch life testing device according to a certain embodiment of the present invention; as shown. Figure 4 As shown, the isolated power supply module 1 includes: a first isolated power supply, a second isolated power supply, and a third isolated power supply; the first isolated power supply is electrically connected to the operation unit; the second isolated power supply is electrically connected to the main control unit; and the third isolated power supply is electrically connected to the acquisition unit.

[0030] In this embodiment, the operation unit is electrically connected to the first isolated power supply via the VDD1 interface; the main control unit is electrically connected to the second isolated power supply via the VDD2 interface; and the acquisition unit is electrically connected to the third isolated power supply via the VDD3 interface.

[0031] For example, see Figure 5 , Figure 5 This is a schematic diagram of the waveform generation module structure of a lock-type optical control switch life testing device according to a certain embodiment of the present invention; as shown below. Figure 5As shown, the waveform generation module 4 includes: a rectifier and filter unit and a current waveform generation unit; the rectifier and filter unit is electrically connected to the charge and discharge control module 5, and is also electrically connected to the energy storage component 3; the rectifier and filter unit is also electrically connected to the pulse control module 6; the current waveform generation unit is electrically connected to the pulse control module 6; the rectifier and filter unit is also electrically connected to the acquisition unit; the current waveform generation unit is also electrically connected to the acquisition unit, and is also electrically connected to the charge and discharge control module 5; the current waveform generation unit is also electrically connected to the lock-type light control switch 8.

[0032] In this embodiment, see Figure 5 The rectifier and filter unit consists of a mature transformer, a rectifier bridge, a voltage regulator Z, a first resistor R1, a second resistor R2, and a third resistor R3. The energy storage component 3 is represented by a capacitor C1. The transformer of the rectifier and filter unit is electrically connected to the charge and discharge control module 5. The voltage regulator Z and the second resistor R2 of the rectifier and filter unit are also electrically connected to the capacitor C1. The rectifier and filter unit is also electrically connected to the fixed relay SSR1. The current waveform generation unit is also electrically connected to the lock-type light control switch 8 through the DUT_L interface, the DUT_N interface, and the DUT_Load interface. Among them, the transformer is electrically connected to the rectifier bridge, the rectifier bridge is electrically connected to the voltage regulator Z, the voltage regulator Z is electrically connected to the first resistor R1, the second resistor R2, and the third resistor R3 are electrically connected. The second resistor R2 and the third resistor R3 are also electrically connected to the acquisition unit through the V_sensor interface.

[0033] For example, see Figure 3 and Figure 5 The charging and discharging control module 5 includes: a first relay KM1, a second relay KM2, and a third relay KM3; the first relay KM1 is electrically connected to the sample power supply module 7; the first relay KM1 is also electrically connected to the rectifier and filter unit; the second relay KM2 is electrically connected to the sample power supply module 7; the second relay KM2 is also electrically connected to the current waveform generation unit; the second relay KM2 is also electrically connected to the lock-type light control switch 8; the third relay KM3 is electrically connected to the sample power supply module 7; the third relay KM3 is also electrically connected to the rectifier and filter unit; the third relay KM3 is also electrically connected to the energy storage unit; the third relay KM3 is also electrically connected to the pulse control module 6; and the third relay KM3 is also electrically connected to the acquisition unit. The circuit structure of the lock-type light control switch 8 is described below. Figure 6 , Figure 6 This is a schematic diagram of the structure of a lock-type light-controlled switch for a life testing device of a lock-type light-controlled switch according to a certain embodiment of the present invention.

[0034] In this embodiment, the first relay KM1 is electrically connected to the sample power supply module 7 via the DUT_L and DUT_N interfaces; the first relay KM1 is also electrically connected to the transformer of the rectifier filter unit; the second relay KM2 is electrically connected to the sample power supply module 7 via the DUT_L and DUT_N interfaces; the second relay KM2 is also electrically connected to the lock-type light control switch 8 via the DUT_N interface; the third relay KM3 is electrically connected to the sample power supply module 7 via the DUT_L and DUT_N interfaces; the third relay KM3 is also electrically connected to the first resistor R1 of the rectifier filter unit; the third relay KM3 is also electrically connected to the capacitor C1; the third relay KM3 is also electrically connected to the fixed relay SSR1; it is worth mentioning that the third relay KM3 is also connected to the second resistor R2 and the voltage regulator Z.

[0035] Based on the above circuit connections, the working principles of each structure are as follows: the isolation power supply module 1 provides an electrically isolated working voltage to the test control module 2; the energy storage component 3 stores electrical energy and releases it during the life test of the lock-type light-controlled switch to form a pulse current; the waveform generation module 4 generates a pulse current waveform based on the pulse current released by the energy storage component 3 and the lock-type light-controlled switch 8; the charge and discharge control module 5 charges and discharges the energy storage component 3; the pulse control module 6 controls the timing of the pulse current released by the energy storage component 3 to the waveform generation module 4; the sample power supply module 7 provides a working voltage to the charge and discharge control module 5; and the test control module 2 receives test parameters and controls the charge and discharge control module 5 and the pulse control module 6 to charge and discharge the energy storage component 3 according to the test parameters, and collects the pulse current waveform generated by the waveform generation module 4 to complete the life test of the lock-type light-controlled switch.

[0036] In one specific implementation, the function of the isolation power supply module 1 is to electrically isolate the input voltage of the device power supply from the output voltage of the output port, thereby improving the safety and anti-interference capability of the circuit and preventing electrical interference between different power supplies. In this embodiment, the isolation power supply module 1 can be implemented using at least three independent isolation power supplies.

[0037] Test control module 2 includes an operation unit, a main control unit, and an acquisition unit. The operation unit is powered by the first isolation power supply via VDD1. The operation unit serves as a human-machine interface, receiving user operation commands such as start, stop, number of times, and duration parameter settings, and transmitting the commands to the main control unit. At the same time, it displays the relevant running test parameter information returned by the acquisition unit.

[0038] The main control unit is powered by the second isolated power supply via VDD2. The main control unit is the core control unit, responsible for logic operation, instruction distribution, and status feedback. The main control unit receives instructions transmitted by the operation unit and the acquisition unit, performs logic operation, and then distributes instructions and provides status feedback. According to the signal instructions, it outputs corresponding electrical signals to provide starting power for the first relay KM1, the second relay KM2, the third relay KM3, and the fixed relay SSR1. It controls the charging, voltage output, discharging, and starting of the test sample of the energy storage component 3. Finally, it feeds back the operating status data to the operation unit for real-time operation status display. The operating status data includes relevant operating test parameter information.

[0039] The acquisition unit is powered by the third isolated power supply via VDD3. The acquisition unit monitors in real time through sensors, including a voltage sensor, a current sensor, and a time sensor. The output port of the voltage sensor is V_sensor, the output port of the current sensor is I_sensor, and the output port of the time sensor is T_sensor. Then, it collects data such as the charge of capacitor C1, pulse current, and pulse current duration, and feeds the monitoring data back to the main control unit to provide a basis for control decisions.

[0040] This invention proposes a life testing device for a latching light-controlled switch. The device comprises seven modules: an isolated power supply module, a test control module, an energy storage component, a waveform generation module, a charge / discharge control module, a pulse control module, and a sample power supply module. The test control module receives test parameters and controls the charge / discharge control module and the pulse control module to charge and discharge the energy storage component based on these parameters. The waveform generation module generates a pulse current waveform, which provides a basis for meeting standard test requirements, thus improving the reliability of the latching light-controlled switch life test results.

[0041] A more specific explanation is that the operation unit is used to receive test parameters and send them to the main control unit; the acquisition unit is used to collect the stored power of the energy storage component 3, the pulse current released by the energy storage component 3, and the time when the energy storage component 3 releases the pulse current to the waveform generation module 4 in real time, obtain monitoring data, and send the monitoring data to the main control unit; the main control unit is used to output control commands according to the test parameters and monitoring data, and complete the life test of the lock-type light-controlled switch according to the control commands.

[0042] Specifically, the test control module 2 includes an operation unit, a main control unit, and an acquisition unit. The operation unit is powered by the first isolation power supply via VDD1. The operation unit serves as a human-machine interface, receiving user operation commands such as start, stop, number of times, and duration parameter settings, and transmitting the commands to the main control unit. At the same time, it displays the relevant running test parameter information returned by the acquisition unit.

[0043] The main control unit is powered by the second isolated power supply via VDD2. The main control unit is the core control unit, responsible for logic operation, instruction distribution, and status feedback. The main control unit receives instructions transmitted by the operation unit and the acquisition unit, performs logic operation, and then distributes instructions and provides status feedback. According to the signal instructions, it outputs corresponding electrical signals to provide starting power for the first relay KM1, the second relay KM2, the third relay KM3, and the fixed relay SSR1. It controls the charging, voltage output, discharging, and starting of the test sample of the energy storage component 3. Finally, it feeds back the operating status data to the operation unit for real-time operation status display. The operating status data includes relevant operating test parameter information.

[0044] The acquisition unit is powered by the third isolated power supply via VDD3. The acquisition unit monitors in real time through sensors, including a voltage sensor, a current sensor, and a time sensor. The output port of the voltage sensor is V_sensor, the output port of the current sensor is I_sensor, and the output port of the time sensor is T_sensor. Then, it collects data such as the charge of capacitor C1, pulse current, and pulse current duration, and feeds the monitoring data back to the main control unit to provide a basis for control decisions.

[0045] In the above scheme, the test control module is specifically divided into an operation unit, a main control unit, and an acquisition unit. The three unit components with clearly defined functions ensure the accurate execution of test commands, the reliable acquisition of real-time data, and the accurate feedback of control commands, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0046] For example, the first isolation power supply is used to provide an electrically isolated operating voltage for the operation unit; the second isolation power supply is used to provide an electrically isolated operating voltage for the main control unit; and the third isolation power supply is used to provide an electrically isolated operating voltage for the acquisition unit.

[0047] Specifically, the function of the isolation power supply module 1 is to electrically isolate the input voltage of the device power supply from the output voltage of the output port, thereby improving the safety and anti-interference capability of the circuit and preventing electrical interference between different power supplies. The isolation power supply module 1 can be implemented using at least three independent isolation power supplies. In this embodiment, it is preferred to use three independent isolation power supplies.

[0048] In the above scheme, three independent power supplies—the first isolation power supply, the second isolation power supply, and the third isolation power supply—are used to power the operation unit, the main control unit, and the acquisition unit, respectively. Through power supply isolation, the common ground interference and conducted noise of the power circuit to the sensitive control and acquisition circuit are effectively blocked, ensuring the purity of the control signal and the accuracy of the acquired data, which helps to improve the reliability of the life test results of the lock-type optical control switch.

[0049] For example, the rectifier and filter unit is used to provide a stable charging voltage for the energy storage component 3 to generate a pulse current; the current waveform generation unit is used to generate a pulse current waveform based on the pulse current in the connection circuit with the lock-type light control switch 8.

[0050] One specific explanation is that when the operation unit, main control unit, and acquisition unit are powered on and begin operation, the operation unit initiates the process. Upon receiving the start signal, the main control unit outputs a voltage source to the first relay KM1. The first relay KM1 closes, outputting a voltage source to the transformer. The transformer, powered on, outputs a stable DC voltage source after rectification by the rectifier bridge, Z-stabilizing resistor, second resistor R2, and third resistor R3, charging the energy storage component 3, i.e., charging capacitor C1. Then, when the acquisition unit detects a fully charged signal from capacitor C1 via a voltage sensor, it feeds the signal back to the main control unit. The main control unit then disconnects the power supply to the first relay KM1, causing it to open and stop charging. With the first relay KM1 open and the second relay KM2 closed, the lock-type light control switch 8 is powered on. Upon startup, the main control unit outputs a DC 24V voltage source, energizing and closing the fixed relay SSR1. Capacitor C1 outputs electrical energy to the current waveform generation unit, which awaits a pulse. When the internal RELAY switch of the lock-type light-controlled switch 8 closes, it forms a circuit with the current waveform generation unit, generating a set pulse current. In this embodiment, the current waveform generation unit is represented as a waveform generator. The acquisition unit collects current signals and pulse duration signals through current sensors and time sensors, transmitting them to the main control unit. The main control unit controls the fixed relay SSR1 to open and complete the pulse according to the set parameters. When the fixed relay SSR1 opens and the pulse ends, the main control unit outputs a voltage source to control the third relay KM3 to close and form a circuit with the first resistor R1, discharging capacitor C1 and preparing for the next charging cycle.

[0051] In the above scheme, the waveform generation module consists of a rectifier and filter unit and a current waveform generation unit. The rectifier and filter unit is responsible for converting AC power into stable and clean DC power to provide consistent and controllable charging energy for the energy storage component. The current waveform generation unit, together with the energy storage component and the lock-type light control switch, forms a discharge circuit and shapes the energy released from the energy storage into a pulse current waveform to provide a basis for meeting standard test requirements, thereby improving the reliability of the life test results of the lock-type light control switch.

[0052] For example, the first relay KM1 is used to control the charging of the energy storage component 3; the second relay KM2 is used to control the opening and closing of the lock-type light control switch 8; and the third relay KM3 is used to control the discharging of the energy storage component 3.

[0053] One possible implementation is that when the first relay KM1 is closed, the output voltage source is supplied to the transformer. When the transformer is energized, the output voltage is rectified by the rectifier bridge, the Z-stabilizing resistor, the second resistor R2 and the third resistor R3, and then outputs a stable DC voltage source to charge the energy storage component 3, that is, to charge the capacitor C1.

[0054] When the first relay KM1 is open and the second relay KM2 is closed, the lock-type light control switch 8 is energized and starts working. At the same time, the main control unit outputs a DC24V voltage source, the fixed relay SSR1 is energized and closes, and the capacitor C1 outputs electrical energy to the current waveform generation unit to wait for pulses. When the internal RELAY switch of the lock-type light control switch 8 closes, it forms a circuit with the current waveform generation unit to generate the set pulse current.

[0055] When the fixed relay SSR1 disconnects, the pulse ends, and the main control unit outputs a voltage source to control the third relay KM3 to close, forming a circuit with the first resistor R1 to discharge capacitor C1 and prepare for the next charging cycle.

[0056] In the above scheme, the charging and discharging control module adopts a design that uses discrete relays to perform key switching functions, so that the first relay, the second relay and the third relay are logically mutually exclusive. This ensures that the three core stages of charging, testing and discharging are completely electrically separated. Through physical isolation of hardware, errors that occur during the testing process are reduced, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0057] For example, the charge / discharge control module 5 is used to charge and discharge the energy storage component 3, including: when the second relay KM2 is open, the third relay KM3 is open and the first relay KM1 is closed, the rectifier and filter unit provides a stable charging voltage to the energy storage component 3 for charging, and the energy storage component 3 stores electrical energy; when the first relay KM1 is open, the third relay KM3 is open and the second relay KM2 is closed, the lock-type light control switch 8 is turned on and the pulse control module 6 is turned on to release electrical energy to form a pulse current during the life test of the lock-type light control switch, and a pulse current waveform is generated according to the pulse current in the connection circuit between the current waveform generation unit and the lock-type light control switch 8; when the second relay KM2 is open, the first relay KM1 is open and the third relay KM3 is closed, the pulse control module 6 is turned off and the energy storage component 3 is discharged.

[0058] One specific explanation is that when the device power switch S1 is turned on to start the device, the first, second, and third isolated power supplies are energized and operate, outputting three different DC power voltages, VDD1, VDD2, and VDD3, to provide operating power to the operation unit, main control unit, and acquisition unit. When the operation unit, main control unit, and acquisition unit are energized and begin operation, the operation unit initiates operation. Upon receiving the start signal, the main control unit outputs a voltage source to the first relay KM1. The first relay KM1 closes, outputting a voltage source to the transformer. The transformer is energized, and its output voltage is rectified by the rectifier bridge, Z-stabilizing resistor, second resistor R2, and third resistor R3 to output a stable DC voltage source to charge the energy storage component 3, i.e., to charge capacitor C1. Then, when the acquisition unit detects that capacitor C1 is fully charged via a voltage sensor, the acquisition unit feeds the signal back to the main control unit, which then disconnects the operating power supply to the first relay KM1. The first relay KM1 disconnects to stop charging; when the first relay KM1 disconnects, the second relay KM2 closes, the lock-type light control switch 8 is energized and starts working, and at the same time the main control unit outputs a DC24V voltage source, the fixed relay SSR1 is energized and closes, and the capacitor C1 outputs electrical energy to the current waveform generation unit to wait for the pulse. When the internal RELAY switch of the lock-type light control switch 8 closes, it forms a circuit with the current waveform generation unit to generate a set pulse current. In this embodiment, the current waveform generation unit is represented as a waveform generator; the acquisition unit acquires the current signal and pulse duration signal through the current sensor and time sensor and transmits them to the main control unit. The main control unit controls the fixed relay SSR1 to disconnect to complete the pulse according to the set parameters; when the fixed relay SSR1 disconnects and the pulse ends, the main control unit outputs a voltage source to control the third relay KM3 to close and form a circuit with the first resistor R1 to discharge the capacitor C1 and prepare for the next charging cycle.

[0059] In the above scheme, various different operating condition combinations are designed for the first, second, and third relays, decomposing the complex life test process of the lock-type light-controlled switch into multiple safe steps that can be executed automatically. The scheme distinguishes the working modes of the relays during the energy storage module charging, energy storage module discharging, and lock-type light-controlled switch testing stages, preventing problems such as reverse power feeding, accidental short circuits, or residual energy, which helps to improve the reliability of the life test results of the lock-type light-controlled switch.

[0060] For example, in the test control module 2, which receives test parameters and controls the charge / discharge control module 5 and pulse control module 6 to charge / discharge the energy storage component 3 according to the test parameters, and acquires the pulse current waveform generated by the waveform generation module 4 to complete the life test of the lock-type light-controlled switch, before performing the life test of the lock-type light-controlled switch, the process includes: controlling the lock-type light-controlled switch 8 to open, receiving test parameters and performing a preset number of preset test tests according to the test parameters to obtain a standard waveform; performing the life test of the lock-type light-controlled switch, including: controlling the lock-type light-controlled switch 8 to close, performing a life test on the lock-type light-controlled switch 8 based on the test parameters to obtain a pulse current waveform; and generating the life test result of the lock-type light-controlled switch based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

[0061] For an explanation of one possible implementation method, see [link to implementation details]. Figure 7 , Figure 7 A schematic diagram of a standard waveform generated by a life testing device for a lock-type optical switch according to a certain embodiment of the present invention, as shown below. Figure 7 As shown, where Amplitude is the amplitude, PulseWidth is the pulse width, Time is the time, and Peak Current is the peak current I. pk First, connect the latching light-controlled switch life test device to a 220VAC 50Hz regulated power supply, without connecting the latching light-controlled switch initially, until the device reaches a stable operating state. During this step, ensure reliable grounding to prevent electric shock. Next, set the output test current of the latching light-controlled switch life test device, and set the power-off time to 150 seconds and the power-on time to 90 seconds, with a time interval of 0.5 seconds between the power-on and power-off times. Then, set the test parameters for the latching light-controlled switch life test device, which can be set to 3650, 7300, or 10000 cycles, etc. Finally, when the latching light-controlled switch life test device reaches a stable operating state, use a waveform generator to monitor the pulse current waveform output by the device in real time. The standard waveform is shown below. Figure 7 As shown. Finally, the latching light-controlled switch is connected via the DUT_L, DUT_N, and DUT_Load interfaces. After setting it up according to the above steps, the life test begins and continues until the latching light-controlled switch life test is completed. Generally, if an abnormality is found during the test or a test completion signal is received, a stop command is output to control the latching light-controlled switch life test device to stop immediately, and the abnormal status or test completion status is displayed in the display window of the operation unit. It is worth mentioning that a buzzer can also be set in the main control unit, which is driven to start when an abnormality is found during the test.

[0062] In the above scheme, a no-load test is designed to obtain a standard waveform to calibrate and verify the output performance of the life test device itself, ensuring that the generated pulse current waveform itself meets the standard requirements. Then, a latching light-controlled switch is connected for life testing to obtain the measured pulse current waveform. Finally, based on the pulse current waveform and the standard waveform, the life test results of the latching light-controlled switch are generated to complete the life test of the latching light-controlled switch. Therefore, performing a no-load test before starting the life test of the latching light-controlled switch can reduce the errors inherent in the life test device itself, making the life assessment results of the light-controlled switch more objective and accurate, and helping to improve the reliability of the life test results of the latching light-controlled switch.

[0063] Example 2 See Figure 8 , Figure 8 This is a flowchart illustrating the steps of a lifespan testing method for a lock-type optical switch according to a certain embodiment of the present invention. Figure 8 As shown in the figure, this embodiment of the invention proposes a method for testing the lifespan of a lock-type light-controlled switch, including steps 101 to 102, the specific steps of which are as follows: Step 101: Receive test parameters and control the charge / discharge control module 5 and pulse control module 6 to charge / discharge the energy storage component 3 according to the test parameters; Step 102: Acquire the pulse current waveform generated by waveform generation module 4 to complete the life test of the lock-type light-controlled switch.

[0064] This invention proposes a method for testing the lifespan of a lock-type light-controlled switch. The test control module 2 receives test parameters and controls the charge / discharge control module 5 and the pulse control module 6 to charge and discharge the energy storage component 3 according to the test parameters. In conjunction with the pulse current waveform generated by the waveform generation module 4, the generated pulse current waveform provides a basis for meeting standard test requirements, thereby improving the reliability of the lifespan test results of the lock-type light-controlled switch.

[0065] Furthermore, the step of acquiring the pulse current waveform generated by the waveform generation module 4 to complete the life test of the lock-type light-controlled switch includes: controlling the lock-type light-controlled switch 8 to open, receiving test parameters and performing a preset number of preset test tests according to the test parameters to obtain a standard waveform; controlling the lock-type light-controlled switch 8 to close, performing a life test on the lock-type light-controlled switch 8 based on the test parameters to obtain a pulse current waveform; and generating the life test result of the lock-type light-controlled switch based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

[0066] Furthermore, based on the pulse current waveform and the standard waveform, the life test result of the lock-type light-controlled switch is generated to complete the life test of the lock-type light-controlled switch. This includes: if an abnormal operation signal or a lock-type light-controlled switch life test completion signal is received from the test control module 2, a shutdown command is output, and the life test result of the lock-type light-controlled switch is generated based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

[0067] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

[0068] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. Furthermore, the described specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of those different embodiments or examples.

[0069] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

Claims

1. A lifespan testing device for a lock-type light-controlled switch, characterized in that, The device for life testing of lock-type light-controlled switches includes: an isolation power supply module, a test control module, an energy storage component, a waveform generation module, a charge / discharge control module, a pulse control module, and a sample power supply module; The isolated power supply module is electrically connected to the test control module; the test control module is electrically connected to the waveform generation module; the test control module is also electrically connected to the charge / discharge control module; the test control module is also electrically connected to the pulse control module; the energy storage component is electrically connected to the charge / discharge control module; the energy storage component is also electrically connected to the pulse control module; the energy storage component is also electrically connected to the waveform generation module; the pulse control module is electrically connected to the waveform generation module; the pulse control module is also electrically connected to the charge / discharge control module; the waveform generation module is electrically connected to the lock-type optical control switch; the waveform generation module is also electrically connected to the charge / discharge control module; the sample power supply module is electrically connected to the charge / discharge control module; the charge / discharge control module is also electrically connected to the lock-type optical control switch. The isolated power supply module is used to provide an electrically isolated operating voltage to the test control module; The energy storage component is used to store electrical energy and release it to form a pulse current during the life test of the lock-type optical control switch. The waveform generation module is used to generate a pulse current waveform based on the pulse current released by the energy storage component and the lock-type light control switch; The charge and discharge control module is used to charge and discharge the energy storage component; The pulse control module is used to control the time when the energy storage component releases pulse current to the waveform generation module. The sample power supply module is used to provide operating voltage to the charge and discharge control module; The test control module is used to receive test parameters and control the charge-discharge control module and the pulse control module to charge and discharge the energy storage component according to the test parameters, and to collect the pulse current waveform generated by the waveform generation module to complete the life test of the lock-type light-controlled switch.

2. The lifespan testing device for a lock-type optical switch as described in claim 1, characterized in that, The test control module includes: an operation unit, a main control unit, and a data acquisition unit; The operating unit is electrically connected to the isolated power supply module; the main control unit is electrically connected to the isolated power supply module; the main control unit is also electrically connected to the charge / discharge control module; the acquisition unit is electrically connected to the isolated power supply module; the acquisition unit is also electrically connected to the waveform generation module; the acquisition unit is also electrically connected to the pulse control module. The operation unit is used to receive test parameters and send the test parameters to the main control unit; The acquisition unit is used to acquire the stored power of the energy storage component, the pulse current released by the energy storage component, and the time when the energy storage component releases the pulse current to the waveform generation module in real time, to obtain monitoring data, and to send the monitoring data to the main control unit. The main control unit is used to output control commands based on the test parameters and the monitoring data, and to complete the life test of the lock-type light control switch based on the control commands.

3. The lifespan testing device for a lock-type optical switch as described in claim 2, characterized in that, The isolated power supply module includes: a first isolated power supply, a second isolated power supply, and a third isolated power supply; The first isolation power supply is electrically connected to the operation unit; the second isolation power supply is electrically connected to the main control unit; and the third isolation power supply is electrically connected to the acquisition unit. The first isolation power supply is used to provide an electrically isolated operating voltage for the operating unit; The second isolation power supply is used to provide an electrically isolated operating voltage for the main control unit; The third isolation power supply is used to provide an electrically isolated operating voltage for the acquisition unit.

4. The lifespan testing device for a lock-type optical switch as described in claim 2, characterized in that, The waveform generation module includes: a rectification and filtering unit and a current waveform generation unit; The rectifier and filter unit is electrically connected to the charge and discharge control module, and is also electrically connected to the energy storage component; the rectifier and filter unit is also electrically connected to the pulse control module; the current waveform generation unit is electrically connected to the pulse control module; the rectifier and filter unit is also electrically connected to the acquisition unit; the current waveform generation unit is also electrically connected to the acquisition unit, and is also electrically connected to the charge and discharge control module; the current waveform generation unit is also electrically connected to the lock-type optical control switch. The rectifier and filter unit is used to provide a stable charging voltage for the energy storage component in order to generate pulse current; The current waveform generation unit is used to generate a pulse current waveform based on the pulse current in the connection circuit with the lock-type light-controlled switch.

5. The lifespan testing device for a lock-type optical switch as described in claim 4, characterized in that, The charging and discharging control module includes: a first relay, a second relay, and a third relay; The first relay is electrically connected to the sample power supply module; the first relay is also electrically connected to the rectifier and filter unit; the second relay is electrically connected to the sample power supply module; the second relay is also electrically connected to the current waveform generation unit; the second relay is also electrically connected to the lock-type light control switch; the third relay is electrically connected to the sample power supply module; the third relay is also electrically connected to the rectifier and filter unit; the third relay is also electrically connected to the energy storage unit; the third relay is also electrically connected to the pulse control module; the third relay is also electrically connected to the acquisition unit. The first relay is used to control the charging of the energy storage component; The second relay is used to control the on and off of the lock-type light-controlled switch; The third relay is used to control the discharge of the energy storage component.

6. The lifespan testing device for a lock-type optical switch as described in claim 5, characterized in that, The charge / discharge control module is used to charge and discharge the energy storage component, including: When the second relay is disconnected, the third relay is disconnected, and the first relay is closed, the rectifier and filter unit provides a stable charging voltage to the energy storage component for charging, and the energy storage component stores electrical energy. When the first relay is disconnected, the third relay is disconnected, and the second relay is closed, the lock-type light control switch is controlled to be turned on and the pulse control module is controlled to be turned on to release electrical energy to form a pulse current during the life test of the lock-type light control switch. In the connection circuit between the current waveform generation unit and the lock-type light control switch, a pulse current waveform is generated according to the pulse current. When the second relay is disconnected, the first relay is disconnected, and the third relay is closed, the pulse control module is disconnected and the energy storage component is discharged.

7. The lifespan testing device for a lock-type optical switch as described in claim 6, characterized in that, In the test control module, which receives test parameters and controls the charge / discharge control module and the pulse control module to charge / discharge the energy storage component according to the test parameters, and acquires the pulse current waveform generated by the waveform generation module to complete the life test of the lock-type light-controlled switch, before performing the life test of the lock-type light-controlled switch, the test includes: controlling the lock-type light-controlled switch to open, receiving test parameters and performing a preset number of preset test tests according to the test parameters to obtain a standard waveform; Performing a life test on a latching light-controlled switch includes: controlling the latching light-controlled switch to close; performing a life test on the latching light-controlled switch based on the test parameters to obtain a pulse current waveform; and generating a life test result for the latching light-controlled switch based on the pulse current waveform and the standard waveform to complete the life test of the latching light-controlled switch.

8. A method for testing the lifespan of a lock-type light-controlled switch, characterized in that, An apparatus for testing the lifespan of a latching light-controlled switch as described in any one of claims 1 to 7, wherein the apparatus is used for lifespan testing of a latching light-controlled switch, and the method is executed by a test control module, comprising: Receive test parameters and control the charge / discharge control module and the pulse control module to charge / discharge the energy storage component according to the test parameters; The pulse current waveform generated by the waveform generation module is acquired to complete the life test of the lock-type light-controlled switch.

9. The lifespan testing method for a lock-type light-controlled switch as described in claim 8, characterized in that, The step of acquiring the pulse current waveform generated by the waveform generation module to complete the life test of the lock-type light-controlled switch includes: The lock-type light control switch is controlled to open, test parameters are received, and a preset number of preset test tests are performed according to the test parameters to obtain a standard waveform; The lock-type light-controlled switch is controlled to close, and a life test is performed on the lock-type light-controlled switch based on the test parameters to obtain a pulse current waveform; Based on the pulse current waveform and the standard waveform, the life test results of the latching light-controlled switch are generated to complete the life test of the latching light-controlled switch.

10. The lifespan testing method for a lock-type light-controlled switch as described in claim 9, characterized in that, Based on the pulse current waveform and the standard waveform, the life test results of the latching light-controlled switch are generated to complete the life test of the latching light-controlled switch, including: If an abnormal operation signal or a signal indicating completion of the life test of the lock-type light-controlled switch is received from the test control module, a shutdown command is output, and the life test result of the lock-type light-controlled switch is generated based on the pulse current waveform and the standard waveform to complete the life test of the lock-type light-controlled switch.

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