Instrument calibration device, calibration method, electronic equipment and storage medium

Abstract

The invention provides an instrument calibration device, a verification method, electronic equipment and a storage medium, the device comprises a to-be-calibrated instrument and a verification board, and the verification board is used for testing the calibration instrument, obtaining test data and verifying the to-be-calibrated instrument based on the test data. Wherein the instrument to be calibrated comprises a plurality of connecting ends; an analyzer and a switch assembly are arranged on the verification plate, and the analyzer is communicated with at least one connecting end of the instrument to be calibrated through the switch assembly, so that the analyzer sends test data to the calibration instrument to obtain the test data of the calibration instrument, and calibrates the test data based on the test data to determine errors existing in the test data; the calibrated power is more accurate, and the accuracy of the aging test is improved.

Description

Technical Field

[0001] This application relates to the field of equipment calibration technology, and in particular to an instrument calibration device, calibration method, electronic device and storage medium. Background Technology

[0002] During the development, application verification, and reliability evaluation phases of radio frequency (RF) devices, RF aging tests are required. RF aging refers to providing the RF device under aging conditions with specified microwave excitation to enable it to operate normally, while simultaneously testing its RF output characteristics. In engineering practice, a microwave frequency source is typically used to provide microwave excitation to the device under test, and a detector is used to measure its RF output power. However, during the testing process, the signals output by the frequency source and detector will experience losses during transmission, leading to errors in the aging test results. Summary of the Invention

[0003] In view of this, the purpose of this application is to provide an instrument calibration device, calibration method, electronic device and storage medium to solve some or all of the technical problems mentioned in the background art.

[0004] To achieve the above objectives, this application provides an instrument calibration apparatus, comprising: The instrument to be calibrated includes multiple connection terminals; A calibration board is provided with an analyzer, the analyzer including a first connection terminal, the first connection terminal of the analyzer being connected to multiple connection terminals of the instrument to be calibrated via a switch assembly; so that the switch assembly controls the analyzer to connect to at least one of the connection terminals of the instrument to be calibrated.

[0005] Optionally, the switching assembly includes a first switch and a plurality of second switches. The first switch includes a first A connection terminal and a plurality of second A connection terminals. Each of the second switches includes a first B connection terminal and a plurality of second B connection terminals. The first A connection terminal of the first switch is connected to the first connection terminal of the analyzer. The first B connection terminals of the plurality of second switches are connected one-to-one with the plurality of second A connection terminals of the first switch. The plurality of second B connection terminals of the second switches are connected one-to-one with the plurality of connection terminals of the instrument to be calibrated.

[0006] Optionally, the first switch is a single-pole double-throw switch; the second switch is a matrix switch, wherein the matrix switch is a single-pole 16-throw matrix switch.

[0007] Optionally, the instrument to be calibrated is a detector or a frequency source.

[0008] Optionally, the analyzer is a signal generator, a power meter, or a vector network analyzer.

[0009] Optionally, the device further includes a processor, the output of which is connected to a second connection terminal of the analyzer for receiving or sending signals to the analyzer.

[0010] Based on the same inventive concept, this application also provides an instrument calibration method applicable to the instrument calibration apparatus described in any of the above claims, comprising: Obtain the type of the instrument to be calibrated and the predefined frequency point matrix; The data transmission direction of the instrument calibration device is determined according to the type of the instrument to be calibrated; According to the data transmission direction, the instrument calibration device is controlled to transmit data to the frequency points in the predefined frequency point matrix in sequence to obtain test data; The deviation data is obtained by comparing the test data and the frequency points. The test data of the instrument to be calibrated are calibrated based on the deviation data.

[0011] Optionally, the type of the instrument to be calibrated includes: Obtain the attribute information of the instrument to be calibrated; In response to the attribute information being an attribute of a transmitted signal, the type of the instrument to be calibrated is determined to be a transmitted signal type; In response to the attribute information being an attribute of a received signal, the type of the instrument to be calibrated is determined to be a received signal type.

[0012] Optionally, the type of the instrument to be calibrated includes: a transmitting signal type and a receiving signal type; the data transmission direction includes a transmitting direction and a receiving direction; Determining the data transmission direction of an instrument calibration device based on the type of the instrument to be calibrated includes: In response to the fact that the type of the instrument to be calibrated is a transmitting signal type, the data transmission direction of the instrument calibration device is determined to be the receiving direction; In response to the type of the instrument to be calibrated being a received signal type, the data transmission direction of the instrument calibration device is determined to be a transmitted direction.

[0013] Optionally, the data transmission direction includes a sending direction and a receiving direction; The step of controlling the instrument calibration device to sequentially transmit data to frequency points within the predefined frequency point matrix according to the data transmission direction to obtain test data includes: In response to the data transmission direction being the sending direction, the control analyzer sequentially transmits data from the frequency points in the predefined frequency point matrix to the instrument to be calibrated, and the instrument to be calibrated outputs the test data. In response to the data transmission direction being the receiving direction, the control test and measurement instrument transmits data sequentially to the analyzer from the frequency points within the predefined frequency point matrix, and the analyzer outputs the test data.

[0014] Based on the same inventive concept, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements an instrument calibration device as described above when executing the computer program.

[0015] Based on the same inventive concept, this application also provides a non-transitory computer-readable storage medium that stores computer instructions for causing a computer to execute an instrument calibration device as described above.

[0016] As described above, this application provides an instrument calibration device, verification method, electronic device, and storage medium. The device includes an instrument to be calibrated and a calibration board. The calibration board is used to test the calibration instrument, acquire test data, and verify the instrument to be calibrated based on the test data. The instrument to be calibrated includes multiple connection terminals. The calibration board is equipped with an analyzer and a switching assembly. The analyzer is connected to at least one connection terminal of the instrument to be calibrated through the switching assembly. Thus, the analyzer sends test data to the calibration instrument, obtains the test data of the calibration instrument, and calibrates the test data based on the test data to determine the errors present in the test data, making the calibrated power more accurate and improving the accuracy of the aging test. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the frequency source and detector installation structure according to an embodiment of this application; Figure 2 This is a schematic diagram of an exemplary radio frequency signal transmission path according to an embodiment of this application; Figure 3 This is a schematic diagram of an instrument calibration device according to an embodiment of this application; Figure 4 This is a schematic diagram of an instrument calibration device structure, representing another example of an embodiment of this application. Figure 5 This is a schematic diagram of the instrument calibration apparatus in this application, where the instrument to be calibrated is a detector; Figure 6 This is a schematic diagram of the instrument calibration device in this application embodiment, where the instrument to be calibrated is a frequency source. Figure 7 This is a schematic diagram of an instrument calibration method according to an embodiment of this application; Figure 8 This is a schematic diagram of the end face analysis of the calibration error of the old refining plate and the calibration plate in an embodiment of this application; Figure 9 This is a schematic diagram of the end face analysis of the calibration error of the old refining plate and the calibration plate, which is another example of an embodiment of this application. Figure 10 This is a schematic diagram of an electronic hardware device structure according to an embodiment of this application; Detailed Implementation To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.

[0019] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0020] Based on the background technology described above Figure 1 An exemplary schematic diagram of the frequency source and detector installation is shown. Figure 2 A schematic diagram of the actual transmission path of the radio frequency signal is shown. For example... Figure 1 As shown, the frequency source and detector are mounted on the driver board of the aging equipment and connected to the device under test (DUT) via RF cables. A single driver board has 32 frequency outputs and 32 detector power inputs, meaning a single driver board can support 32 RF devices for aging tests. Figure 2As shown, taking the frequency source 0 on the driver board as an example, the RF signal is transmitted to DUT0 through a section of RF cable IN0 to the female RF connector. The path between the female and male connectors is IN0'. Then, from the male connector, the RF cable IN0'' passes through a section of RF cable to the input terminal of the DUT on the old board. Thus, the RF signal transmission path between the frequency source output port and the DUT input port is IN0→IN0'→IN0''. It can be seen that the transmission path causes losses, which leads to errors in the power output from the frequency source to the DUT input terminal. Therefore, power calibration needs to be performed at the input terminal of the device before the experiment.

[0021] To address the aforementioned technical problems, this application proposes an instrument calibration device. The device includes an instrument to be calibrated and a calibration board. The calibration board is used to test the instrument, acquire test data, and calibrate the instrument based on the test data. The instrument to be calibrated includes multiple connection terminals. The calibration board is equipped with an analyzer and a switching assembly. The analyzer is connected to at least one connection terminal of the instrument to be calibrated via the switching assembly. Thus, the analyzer sends or receives test data from the instrument to obtain the test data of the instrument, and calibrates the test data based on the test data to determine the errors present in the test data, making the calibrated power more accurate and improving the accuracy of the aging test.

[0022] This application uses a power meter as the measurement reference. Due to transmission errors introduced through RF cables, RF connectors, etc., the power meter is used to measure and calibrate the power reaching its input port. The difference between the target set value and the measured value of the frequency source is the error value of the frequency source's output power. After discarding the error, the output power of the frequency source can be regarded as the ideal value. A single driver board has 32 RF excitations, so the calibration process requires the use of an RF matrix switch for automated calibration. During the calibration process, the error introduced by the RF matrix switch must also be considered. After calibration, the above error data is recorded in the host computer. During the test, the above error value is discarded, which can improve the power accuracy of the RF excitation at the device's input port.

[0023] The embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0024] like Figure 3 and Figure 4 As shown, an instrument calibration device includes: The instrument to be calibrated includes multiple connection terminals; A calibration board is provided with an analyzer, the analyzer including a first connection terminal, the first connection terminal of the analyzer being connected to multiple connection terminals of the instrument to be calibrated via a switch assembly; so that the switch assembly controls the analyzer to connect to at least one of the connection terminals of the instrument to be calibrated.

[0025] Specifically, in this embodiment, the instrument to be calibrated can be a detector or a frequency source. For example... Figure 2 As shown, the driver board in the aging test system has 32 frequency outputs and 32 detector power inputs, meaning a single driver board can support 32 RF devices for aging tests. Therefore, the instrument to be calibrated in this application uses a 32-channel connection. For example... Figure 3 and Figure 5 As shown, when the instrument to be calibrated is a detector, there are two detectors, each with 16 connection terminals, for a total of 32 connection terminals. For example, multiple connection terminals of detector one include D0, D1, D2...D15, and multiple connection terminals of detector two include D16, D17, D18...D31. Figure 3 and Figure 5 As shown, when the instrument to be calibrated is a frequency source, there are two frequency sources, each with 16 connection terminals, for a total of 32 connection terminals. For example, the multiple connection terminals of frequency source one include G0, G1, G2...G15, and the multiple connection terminals of frequency source two include G16, G17, G18...G31.

[0026] like Figure 3 and Figure 4 As shown, the first connection terminal of the analyzer is S0, which is connected to the switching assembly. Multiple connection terminals of the switching assembly are connected to multiple connection terminals of the instrument to be calibrated. It can be understood that the multiple connection terminals of the switching assembly are connected one-to-one with the multiple connection terminals of the instrument to be calibrated, forming multiple transmission channels. During the test, one of the transmission channels can be controlled by the switching assembly to transmit data. After transmission through multiple channels, all acquired test signals are verified to make the verification results more accurate.

[0027] The analyzer can be a power meter or a signal generator. When the instrument to be calibrated is a detector, the analyzer acts as a signal generator, sending signals to the detector to obtain the test signal generated by the detector. It then calculates the error value based on the test signal and a standard signal, and calibrates the test signal based on the error value. When the instrument to be calibrated is a frequency source, the analyzer acts as a power meter. The frequency source sends a standard signal to the power meter, which receives the standard signal and outputs a test signal. It then calculates the error value based on the test signal and the standard signal, and calibrates the test signal based on the error value. In addition to the above examples, the analyzer can also be a vector network analyzer. A vector network analyzer can both send and receive signals. Its transmission direction and output / input states depend on the type of instrument to be calibrated. When the instrument to be calibrated is a detector, the vector network analyzer acts as a standard signal output source. Its specific output and processing are consistent with the signal generator process described above, and will not be described in detail here. When the instrument to be calibrated is a frequency source, the vector network analyzer acts as a signal receiving device, and its function is the same as that of the power meter. The processing procedure of the vector network analyzer is the same as that of the power meter, and will not be described in detail here.

[0028] In summary, the device includes an instrument to be calibrated and a calibration board. The calibration board is used to test the instrument to be calibrated, acquire test data, and calibrate the instrument to be calibrated based on the test data. The instrument to be calibrated includes multiple connection terminals. The calibration board is equipped with an analyzer and a switching assembly. The analyzer is connected to at least one connection terminal of the instrument to be calibrated through the switching assembly. Thus, the analyzer sends or receives test data from the instrument to obtain the test data of the instrument, and calibrates the test data based on the test data to determine the errors present in the test data, making the calibrated power more accurate and improving the accuracy of the aging test.

[0029] In some embodiments, such as Figure 3 and Figure 4 As shown, the switch assembly includes a first switch and a plurality of second switches. The first switch includes a first A connection terminal and a plurality of second A connection terminals. Each of the second switches includes a first B connection terminal and a plurality of second B connection terminals. The first A connection terminal of the first switch is connected to the first connection terminal of the analyzer. The first B connection terminals of the plurality of second switches are connected one-to-one with the plurality of second A connection terminals of the first switch. The plurality of second B connection terminals of the second switches are connected one-to-one with the plurality of connection terminals of the instrument to be calibrated.

[0030] Specifically, the first switch is a single-pole double-throw switch; the second switch is a matrix switch, specifically a single-pole 16-throw matrix switch.

[0031] like Figure 3 and Figure 4 As shown, the first switch is a single-pole double-throw switch, including a first A connection terminal and two second A connection terminals. The first A connection terminal is S1, and the two second A connection terminals are S2 and S3, respectively. The analyzer's first connection terminal is S0, and S1 and S0 are connected. Multiple second switches include two second switches, where the first B connection terminal of one second switch is L0, and the first B connection terminal of the other second switch is L1. The multiple second B connection terminals of one second switch are P0', P1', P2', ..., P15', and the multiple second B connection terminals of the other second switch are P16', P17', P18', ..., P31' (another embodiment uses P0...P31 as an example). When the instrument to be calibrated is a detector, the instrument to be calibrated includes detector one and detector two. The multiple connection terminals of detector one include D0, D1, D2...D15, and the multiple connection terminals of detector two include D16, D17, D18...D31. Figure 5 As shown, D0, D1, D2...D15 are connected one-to-one with P0', P1', P2',...P15', and D16, D17, D18...D31 are connected one-to-one with P16', P17', P18',...P31'. When the instrument to be calibrated is a frequency source, the instrument includes frequency source one and frequency source two. Frequency source one has multiple connection terminals including G0, G1, G2...G15, and frequency source two has multiple connection terminals including G16, G17, G18...G31. For example... Figure 6 As shown, G0, G1, G2...G15 are connected one-to-one with P0, P1, P2,...P15, and G16, G17, G18...G31 are connected one-to-one with P16, P17, P18,...P31. After the devices are connected, data transmission can be achieved through 32 channels under the control of single-pole double-throw switches and single-pole 16-throw switches. The specific 32 channels are as follows... Figure 3 and Figure 4 For example, the combination of lines in the diagram, such as S0-S1-S2-L0-P0-D0, forms a path (e.g., ...). Figure 4 The direction of transmission indicated by the middle arrow corresponds to the transmission path. S0-S1-S2-L0-P1-D1 is one path, and they are combined sequentially to form 32 paths.

[0032] In some embodiments, the apparatus further includes a processor, the output of which is connected to a second connection terminal of the analyzer for receiving or sending signals to the analyzer.

[0033] Specifically, the analyzer sends or receives test data from the calibration instrument to obtain the test data of the calibration instrument. The processor calibrates the test data based on the test data to determine the errors present in the test data, making the calibrated power more accurate and improving the accuracy of the aging test.

[0034] Based on the same inventive concept, such as Figure 7 As shown, this application also provides an instrument calibration method applicable to the instrument calibration apparatus described in any of the above claims, comprising the following steps: Step 102: Obtain the type of the instrument to be calibrated and the predefined frequency point matrix.

[0035] In this step, determining the type of the instrument to be calibrated includes: acquiring attribute information of the instrument to be calibrated; determining the type of the instrument to be calibrated as a signal transmission type in response to the attribute information being a signal transmission attribute; and determining the type of the instrument to be calibrated as a signal reception type in response to the attribute information being a signal reception attribute. Specifically, the attribute information records the function of the instrument to be calibrated. Based on the function of the instrument to be calibrated, it can be determined that the attribute is a signal transmission attribute, thus determining the type of the instrument to be calibrated as a signal transmission type. For example, a signal transmission type instrument to be calibrated is a signal generator, whose function is to transmit signals, so this instrument to be calibrated is a signal transmission type. A signal reception type instrument to be calibrated is a power meter, whose function is to display received signals, so this instrument to be calibrated is a signal reception type.

[0036] The predefined frequency point matrix can be input by the user. The frequency point matrix is ​​represented as: F=[F0, ..., FN-1], where the number of frequencies is denoted as N.

[0037] Step 104: Determine the data transmission direction of the instrument calibration device according to the type of the instrument to be calibrated.

[0038] In this step, the instrument to be calibrated includes both transmit signal type and receive signal type. When the instrument is of transmit signal type, its function is to send a standard signal to the analyzer. When the instrument is of receive signal type, its function is to receive the standard signal sent by the analyzer and output a test signal. It is understood that the instrument calibration device for transmit signal type has the opposite transmission direction to the instrument calibration device for receive signal type. The data transmission direction includes both the transmit and receive directions. The instrument calibration device is controlled to transmit and test signals according to the transmit or receive direction to obtain test data.

[0039] Step 106: According to the data transmission direction, control the instrument calibration device to transmit data to the frequency points in the predefined frequency point matrix in sequence to obtain test data.

[0040] In this step, based on the above embodiments, for example, when the instrument to be calibrated in the instrument calibration device is a frequency source, and the frequency source sends data signals to the analyzer to obtain test data, then the data transmission direction can be determined as the receiving direction. When the instrument to be calibrated in the instrument calibration device is a detector, and the detector receives data signals sent by the analyzer to obtain test data, then the data transmission direction can be determined as the sending direction. It can be understood that, according to different instruments to be calibrated, data is transmitted sequentially to the frequency points within a predefined frequency point matrix according to their corresponding data transmission directions to obtain test data.

[0041] Step 108: Compare the test data and the frequency points to obtain the deviation data.

[0042] In this step, because the test data may deviate due to path loss during data transmission, the test data is compared with the frequency point to find the deviation between the test data and the frequency point (i.e., the real data).

[0043] Step 110: Calibrate the test data of the instrument to be calibrated based on the deviation data.

[0044] In this step, due to path loss during data transmission, the test data may deviate. Therefore, it is necessary to determine the test data and the real data (i.e., the transmission frequency point) to calculate the deviation data. Then, the test data can be calibrated based on the deviation data to make the calibrated test data more accurate and improve the testing efficiency of the aging experiment.

[0045] In some embodiments, the type of the instrument to be calibrated includes: a transmit signal type and a receive signal type; the data transmission direction includes a transmit direction and a receive direction; Determining the data transmission direction of an instrument calibration device based on the type of the instrument to be calibrated includes: In response to the type of the instrument to be calibrated being a transmitting signal type, the data transmission direction of an instrument calibration device is determined as a receiving direction; In response to the type of the instrument to be calibrated being a received signal type, the data transmission direction of an instrument calibration device is determined as the transmission direction.

[0046] Specifically, the data transmission direction is as follows: Figure 5 and Figure 6 The direction the middle arrow points indicates the data transmission direction, including the sending direction and the receiving direction, such as... Figure 5 As shown, the direction in which the signal generator sends the signal to the detector (i.e., Figure 5 The direction of the arrow in the image indicates the sending direction; for example... Figure 6 As shown, the direction in which the frequency source sends a signal to the power meter (i.e.) Figure 6 The arrows in the diagram indicate the receiving direction. For example, when the instrument to be calibrated is a transmit signal type, it means the instrument is a frequency source. The frequency source will sequentially send the frequency points within the predefined frequency point matrix to the analyzer (or, when the instrument is a frequency source, the analyzer is a power source) via the second and first switches. The analyzer receives the frequency points and outputs test data, i.e., transmission occurs according to the receiving direction. When the instrument to be calibrated is a receive signal type, it means the instrument is a detector. The analyzer (or, when the instrument is a detector, the analyzer is a signal generator) will send the frequency points within the predefined frequency point matrix to the detector via the first and second switches. The detector receives the frequency points and outputs test data, i.e., transmission occurs according to the transmitting direction.

[0047] In some embodiments, the data transmission direction includes a sending direction and a receiving direction; The process involves controlling the instrument calibration device to sequentially transmit data to the frequency points within the predefined frequency point matrix according to the data transmission direction to obtain test data, including: In response to the data transmission direction being the sending direction, the control analyzer sequentially transmits data from the frequency points in the predefined frequency point matrix to the instrument to be calibrated, and the instrument to be calibrated outputs the test data. In response to the data transmission direction being the receiving direction, the control test and measurement instrument transmits data sequentially to the analyzer from the frequency points within the predefined frequency point matrix, and the analyzer outputs the test data.

[0048] Specifically, when the data transmission direction is transmitting, meaning the instrument to be calibrated is a receiving signal type, it indicates that the instrument is a detector. In this case, the analyzer (which acts as a signal generator when the instrument is a detector) sends the frequency points from a predefined frequency point matrix to the detector via the first and second switches. The detector receives the frequency points and outputs test data. Conversely, when the data transmission direction is receiving, meaning the instrument to be calibrated is a transmitting signal type, it indicates that the instrument is a frequency source. The frequency source then sends the frequency points from a predefined frequency point matrix sequentially to the analyzer (which acts as a power source when the instrument is a frequency source) via the first and second switches. The analyzer receives the frequency points and outputs test data.

[0049] Specific examples, such as Figure 5As shown, this example uses the instrument to be calibrated as a detector. The calibration board mainly consists of two single-pole 16-channel RF matrix switches, one SPDT switch, one signal generator (for emitting a standard source), and an ARM processor. The RF signal transmission path from the detector to the two single-pole 16-channel RF matrices is consistent with the hardware on the old calibration board (wire length, connectors, cable specifications). That is, the D0-P0' ports on the calibration board are equivalent to the aforementioned OUT''→OUT'→OUT0, and other ports follow the same pattern. The following describes the detector power calibration process for the DUT output port interface: The first step is to calibrate sequentially according to the DUT's labels. Taking the DUT0 input port as an example, its corresponding detector port on the calibration board is D0. The calibration process is briefly described as follows: The left-side RF matrix switches are switched to P0'-L0 via software control, and the SPDT switches are switched to S2-S1. The signal flow diagram is already shown in [the diagram]. Figure 5 The middle part is marked with an arrow.

[0050] The second step, after opening the aforementioned channels, is to set the calibration frequency points and store them in the matrix F=[F0, ..., F...]. N-1 The number of frequencies requiring calibration is denoted as N. The value of matrix F needs to be set by the user. The values ​​in matrix F are read sequentially. First, channel D0 is calibrated at frequency F0. Figure 4 As shown, the DUT output port interface on the old refining board is the matrix switch P0' terminal on the calibration board. The output power of the standard source can be considered as an ideal value, and the output power of the standard source can be denoted as X. a，b The measured value of the detector is recorded as Z. a，b The two subscripts X and Z have different meanings: a is used to identify the frequency point (corresponding to the number of frequencies above), and b is used to identify the channel. In this case, the power value of the standard source is marked as X. 0，0 The power value read by the detector is marked as Z. 0，0 .

[0051] The third step is to analyze... Figure 8 It can be seen that Z 0，0 The measured value includes the transmission loss of the P0-S0 port at frequency F0, denoted as L. F0，P0 '- S0 , and L F0,P0’-S0 It can be considered a constant, obtained through measurement and stored in a two-dimensional M*32 matrix L2. The loss data at different frequency points are stored row by row in matrix L2, and the frequency point information of the measurement data is stored in a one-dimensional matrix F'=[F'0,.....,F' M Let M be the number of frequency points in F'. Since there is no one-to-one correspondence between the values ​​in matrices F and F', it is necessary to iterate through the values ​​in F' and compare them with the frequency point F0. When F' satisfies... m≤F0≤F' m+1 When, if F0-F' m ≤F' m+1 -F0, then L F0,P0’-S0 =L2(m, 0), otherwise L F0,P0’-S0 =L2 (m+1，0） The method for querying loss values ​​at other frequency points is the same.

[0052] The fourth step involves storing the calibration error from the DUT to the detector on the aging board in a two-dimensional N*32 matrix A2. When the calibration frequency is F0 and the detector channel is D0, the error data is stored in A2. (0,0) In the middle, at this time A2 （0，0） =Z 0，0 -X 0，0 -L F0,P0’-S0 This process is repeated to complete the power calibration at different frequency points set for channel D0.

[0053] Step 5: Switch the RF matrix switch and sequentially complete the output power calibration of all 32 DUT output interfaces. After calibration, the matrix will be complete. After obtaining A2, the power calibration of the 32 DUT output port interfaces is completed.

[0054] Currently, the aging system only supports dynamic RF aging at a single frequency point and 32 ports with different power levels. If the test conditions are set to frequency f0, the output power of the 32 DUTs is stored in a one-dimensional matrix D0 after detection by the detector components. However, due to errors in each channel, the system needs to perform error subtraction based on the error matrix A2 to obtain the actual detected power of each channel and store it in a one-dimensional matrix DA. After the test begins, since f0 is an arbitrary value set by the user, the value of f0 may not match the element in F. Therefore, it is necessary to traverse matrix F until F' is satisfied. m ≤f0≤F' m+1 When the number m is obtained, F' is then... m+1 -F' m The value is very small, and the error value between adjacent frequency points of a single channel can be regarded as linear. Therefore, the error data of 32 channels when the frequency point is f0 is: .

[0055] The calibrated detector power value is: .

[0056] The above specific examples can effectively eliminate the error introduced by transmission loss, ensure the accuracy of the output power at the DUT output terminal, and realize high-precision monitoring of the output power during the aging test of RF devices. It also realizes the automation of the calibration process by adding an RF matrix switch to the calibration device, and automatically eliminates the error introduced by the switch during calibration, which improves efficiency and ensures accuracy.

[0057] like Figure 6 As shown, this example uses the instrument to be calibrated as the frequency source. The calibration board mainly installs two single-pole 16-throw RF matrix switches, one SPDT switch, one power meter, and an ARM processor. The RF signal transmission path from the frequency source to the two single-pole 16-throw RF matrix switches is consistent with the hardware (wire length, connectors, cable specifications) on the old calibration board. That is, the G0-P0 port on the calibration board is equivalent to the above IN0→IN0'→IN0'', and other ports follow the same pattern. The power calibration process of the DUT input port interface is described below: The first step is to calibrate sequentially according to the DUT's labels. Taking the DUT0 input port as an example, its corresponding frequency source port on the calibration board is G0. The calibration process is briefly described: the left-side RF matrix switch switches the RF link to P0-L0, and the SPDT switch switches to S2-S1 via software control. The signal flow diagram is already shown in [the diagram]. Figure 6 The middle arrow is the symbol.

[0058] The second step, after opening the aforementioned channels, is to set the calibration frequency points and store them in the matrix F=[F0, ..., F...]. N-1 The number of frequencies requiring calibration is denoted as N. The value of matrix F needs to be set by the user, and the values ​​in matrix F are read sequentially. First, channel G0 is calibrated at frequency F0. During calibration, the channel power value needs to be set, denoted as X. a，b The measured value of the power meter is recorded as Y. a，b The two subscripts X and Y have different meanings: a is used to identify the frequency point, and b is used to identify the channel. Therefore, if the frequency of channel G0 is set to F0, the power setting value is marked as X. 0，0 The power value read by the power meter is marked as Y. 0，0 .

[0059] The third step is to analyze... Figure 9 It can be known that Y 0，0 The measured value includes the transmission loss of the P0-S0 port at frequency F0, denoted as L. F0，P0-S0 , and L F0，P0-S0 It can be considered a constant, obtained through measurement and stored in a two-dimensional M*32 matrix L1. The loss data at different frequency points are stored row by row in matrix L1, and the frequency point information of the measurement data is stored in a one-dimensional matrix F'=[F'0,.....,F'M Let M be the number of frequency points in F'. Since there is no one-to-one correspondence between the values ​​in matrices F and F', it is necessary to iterate through the values ​​in F' and compare them with the frequency point F0. When F' satisfies... m ≤F0≤F' m+1 When, if F0-F' m ≤F' m+1 -F0, then L F0,P0’-S0 =L1(m, 0), otherwise L F0,P0’-S0 =L1 (m+1，0） The method for querying loss values ​​at other frequency points is the same.

[0060] The fourth step involves storing the calibration error data from the frequency source on the old refining board to the DUT in a two-dimensional N*32 matrix A1. When the calibration frequency is F0 and the detector channel is G0, the error data is stored in A1. (0,0) In the middle, at this time A1 （0，0） =Y 0，0 -X 0，0 -L F0,P0’-S0 This process is repeated to complete the power calibration at different frequency points set for the G0 channel.

[0061] Step 5: Switch the RF matrix switch to sequentially complete the input power calibration of all 32 DUT input interfaces. After calibration, the matrix will be complete. Once A1 is obtained, the power calibration of the 32 DUT input port interfaces is completed.

[0062] Currently, the aging system only supports dynamic RF aging at a single frequency point and 32 ports with different power levels. If the test conditions are set to frequency f0, and the RF power of the 32 channels is set to different values ​​and stored in a one-dimensional matrix P0, but because each channel has errors, the system needs to perform error elimination based on the error matrix A1 to obtain the final actual power of each channel and store it in a one-dimensional matrix PA. After the test begins, since f0 is an arbitrary value set by the user, the value of f0 may not exactly match the elements in F. Therefore, it is necessary to traverse matrix F until F' is satisfied. m ≤f0≤F' m+1 When the number m is obtained, F' is then... m+1 -F' m When the value is very small, the error between adjacent frequency points of a single channel can be considered linear. Therefore, the error data for 32 channels at frequency point f0 are as follows: .

[0063] After adjusting for errors, the actual power values ​​PA of the 32 RF channels are: .

[0064] The above specific examples can effectively eliminate the error introduced by transmission loss, ensure the accuracy of the output power at the DUT output terminal, and realize high-precision monitoring of the output power during the aging test of RF devices. It also realizes the automation of the calibration process by adding an RF matrix switch to the calibration device, and automatically eliminates the error introduced by the switch during calibration, which improves efficiency and ensures accuracy.

[0065] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the process. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the instrument calibration device described above.

[0066] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0067] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement an instrument calibration method as described in any of the above embodiments.

[0068] Figure 10 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.

[0069] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0070] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is called and executed by the processor 1010.

[0071] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.

[0072] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).

[0073] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.

[0074] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.

[0075] The electronic devices described above are used to implement a corresponding instrument calibration method in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0076] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium that stores computer instructions for causing the computer to execute an instrument calibration method as described in any of the above embodiments.

[0077] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.

[0078] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute an instrument calibration method as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0079] It is understood that before using the technical solutions of the various embodiments in this application, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.

[0080] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations described in this application.

[0081] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0082] It is understood that the above notification and user authorization process is merely illustrative and does not limit the implementation of this application. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this application.

[0083] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application (including the claims) is limited to these examples; within the framework of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in the details for the sake of brevity.

[0084] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.

[0085] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.

[0086] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.

Claims

1. An instrument calibration device, characterized in that, include: The instrument to be calibrated includes multiple connection terminals; A calibration board is provided with an analyzer, the analyzer including a first connection terminal, the first connection terminal of the analyzer being connected to multiple connection terminals of the instrument to be calibrated via a switch assembly; so that the switch assembly controls the analyzer to connect to at least one of the connection terminals of the instrument to be calibrated.

2. The instrument calibration device according to claim 1, characterized in that, The switching assembly includes a first switch and a plurality of second switches. The first switch includes a first A connection terminal and a plurality of second A connection terminals. Each of the second switches includes a first B connection terminal and a plurality of second B connection terminals. The first A connection terminal of the first switch is connected to the first connection terminal of the analyzer. The first B connection terminals of the plurality of second switches are connected one-to-one with the plurality of second A connection terminals of the first switch. The plurality of second B connection terminals of the second switches are connected one-to-one with the plurality of connection terminals of the instrument to be calibrated.

3. The instrument calibration device according to claim 2, characterized in that, The first switch is a single-pole double-throw switch; the second switch is a matrix switch, specifically a single-pole 16-throw matrix switch.

4. The instrument calibration device according to claim 1, characterized in that, The instrument to be calibrated is a detector or a frequency source.

5. The instrument calibration device according to claim 1, characterized in that, The analyzer is a signal generator, power meter, or vector network analyzer.

6. The instrument calibration device according to claim 5, characterized in that, The device further includes a processor, the output of which is connected to a second connection terminal of the analyzer for receiving or sending signals to the analyzer.

7. An instrument calibration method, applicable to the instrument calibration apparatus according to any one of claims 1-6, characterized in that, include: Obtain the type of the instrument to be calibrated and the predefined frequency point matrix; The data transmission direction of the instrument calibration device is determined according to the type of the instrument to be calibrated; According to the data transmission direction, the instrument calibration device is controlled to transmit data to the frequency points in the predefined frequency point matrix in sequence to obtain test data; The deviation data is obtained by comparing the test data and the frequency points. The test data of the instrument to be calibrated are calibrated based on the deviation data.

8. The method according to claim 7, characterized in that, The types of instruments to be calibrated include: Obtain the attribute information of the instrument to be calibrated; In response to the attribute information being an attribute of a transmitted signal, the type of the instrument to be calibrated is determined to be a transmitted signal type; In response to the attribute information being an attribute of a received signal, the type of the instrument to be calibrated is determined to be a received signal type.

9. The method according to claim 7, characterized in that, The type of the instrument to be calibrated includes: a transmitting signal type and a receiving signal type; the data transmission direction includes a transmitting direction and a receiving direction. Determining the data transmission direction of an instrument calibration device based on the type of the instrument to be calibrated includes: In response to the type of the instrument to be calibrated being a transmitting signal type, the data transmission direction of an instrument calibration device is determined as a receiving direction; In response to the type of the instrument to be calibrated being a received signal type, the data transmission direction of an instrument calibration device is determined as the transmission direction.

10. The method according to claim 7, characterized in that, The data transmission direction includes a sending direction and a receiving direction; The process involves controlling the instrument calibration device to sequentially transmit data to the frequency points within the predefined frequency point matrix according to the data transmission direction to obtain test data, including: In response to the data transmission direction being the sending direction, the control analyzer sequentially transmits data from the frequency points in the predefined frequency point matrix to the instrument to be calibrated, and the instrument to be calibrated outputs the test data. In response to the data transmission direction being the receiving direction, the control test and measurement instrument transmits data sequentially to the analyzer from the frequency points within the predefined frequency point matrix, and the analyzer outputs the test data.

11. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method as described in any one of claims 7 to 10.

12. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method described in any one of claims 7 to 10.

Images