Lens diopter and microstructure detection device and method based on mechanical switching structure

The lens refractive power and microstructure detection device with mechanical switching structure realizes the synchronous positioning and measurement of the optical center and the geometric center of the microstructure region, which solves the problems of low detection efficiency and large error in the existing technology and improves detection efficiency and accuracy.

CN121877346APending Publication Date: 2026-04-17DONGHUA UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
DONGHUA UNIV
Filing Date
2025-12-30
Publication Date
2026-04-17

AI Technical Summary

Technical Problem

Existing testing instruments struggle to simultaneously and accurately locate both the optical center and the geometric center of the microstructure region of a microstructure lens, resulting in low testing efficiency, large human error, and fragmented data storage.

Method used

A lens diopter and microstructure detection device based on a mechanical switching structure is adopted. The Hartmann aperture assembly and the microscopic measurement assembly are integrated through the mechanical switching component, and the optical center and the geometric center of the microstructure region can be synchronously positioned and measured in a single clamping.

Benefits of technology

It improves detection efficiency, reduces human error, ensures the accuracy and consistency of detection results, and enables real-time comparison and offset calculation of the optical center and the geometric center of the microstructure region.

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Abstract

The invention discloses a lens diopter and microstructure detection device and method based on a mechanical switching structure, the lens diopter and microstructure detection device comprises a support table, a focusing assembly and an imaging assembly, the focusing assembly and the imaging assembly are both mounted on the support table, the imaging assembly comprises a Hartmann diaphragm assembly and a microscopic measurement assembly, and the Hartmann diaphragm assembly and the microscopic measurement assembly are mounted on the support table. The Hartmann diaphragm assembly and the microscopic measurement assembly are connected with the support table through the mechanical switching assembly, and a lens to be measured is arranged between the Hartmann diaphragm assembly and the focusing assembly or between the microscopic measurement assembly and the focusing assembly. Aiming at the problem that the precision is uncontrollable due to the fact that the optical center and the geometric center of the microstructure area of the current microstructure lens cannot be positioned at the same time, the quality of the microstructure lens and the accuracy of an inspection mechanism are expected to be improved.
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Description

Technical Field

[0001] This invention relates to the field of optical precision measurement technology, specifically to a device and method for detecting lens diopter and microstructure based on a mechanical switching structure. Background Technology

[0002] Currently, microstructured lenses are commonly used by teenagers to intervene in myopia control, becoming an important part of the prevention and control system. The optical performance of these lenses depends on two core parameters: first, the refractive power required for basic refractive correction and the position of the optical center; second, the geometric center position of the microstructured region that directly affects the defocus control effect. If either of these positions is misaligned, the myopia control function of the lens will be severely weakened.

[0003] However, the mainstream testing instrument in the optometry industry is the focimeter, whose optical principle is mainly designed for traditional single-vision lenses. It calculates refractive power by utilizing the displacement change of collimated light after passing through the Hartmann stop, but it is difficult to effectively capture the spatial distribution characteristics of microstructural regions. Actual measurements require a step-by-step process: first, the optical center is determined using the focimeter, then the center of the microstructure is manually located using a microscopic imaging device. This multi-step, multi-device operation mode leads to low testing efficiency, significant human error interference, and fragmented data storage. Therefore, with the increasingly clear requirements for technological integration in myopia prevention and control policies, breaking through the technological bottlenecks of single-function devices and achieving efficient, accurate, and integrated detection of key parameters has become an urgent problem to be solved. Summary of the Invention

[0004] This invention provides a lens refractive power and microstructure detection device and method based on a mechanical switching structure. It addresses the problem of uncontrollable accuracy caused by the inability to simultaneously locate the optical center and the geometric center of the microstructure region in current microstructure lenses, and is expected to improve the quality of microstructure lenses and the accuracy of inspection institutions.

[0005] To achieve the above objectives, in a first aspect, the present invention provides the following technical solution: a lens refractive power and microstructure detection device based on a mechanical switching structure, comprising a support stage, a focusing component, and an imaging component. Both the focusing component and the imaging component are mounted on the support stage. The imaging component includes a Hartmann aperture assembly and a microscopic measurement component. Both the Hartmann aperture assembly and the microscopic measurement component are connected to the support stage via a mechanical switching component. The lens to be tested is positioned between the Hartmann aperture assembly and the focusing component, or between the microscopic measurement component and the focusing component. The mechanical switching component moves the Hartmann aperture assembly or the microscopic measurement component to the same plane containing the optical axes of the lens to be tested, the focusing component, and the imaging component. This mechanical switching component achieves integrated operation of the Hartmann aperture assembly and the microscopic measurement component, solving the pain point of traditional equipment requiring step-by-step testing across instruments and repeated clamping. A single clamping operation can complete the measurement of dual core parameters, improving detection efficiency.

[0006] Preferably, the mechanical switching assembly includes a rotating shaft and a first connecting plate and a second connecting plate sleeved on the rotating shaft for rotation. The first connecting plate and the second connecting plate are respectively connected to the Hartmann aperture assembly and the microscopic measurement assembly. The structural design of the rotating shaft and the double connecting plates is simple, realizes rapid switching between the two measurement assemblies, and is easy to operate without the need for manual disassembly or movement of the assemblies.

[0007] Preferably, the microscopic measurement assembly includes a sample holder and an eyepiece and an objective lens arranged coaxially in the middle of the sample holder. The sample holder has a circular light-transmitting hole at its center. The lens to be measured is positioned and installed on the sample holder and is coaxial with the eyepiece, objective lens, and circular light-transmitting hole. The coaxial arrangement of the eyepiece and objective lens can ensure the consistency of the optical path for microscopic imaging, avoid imaging blurring caused by axial offset, and improve the accuracy of microstructure detail recognition. The lens to be measured is positioned and installed on the sample holder to avoid lens displacement during measurement and ensure the repeatability of microstructure center positioning.

[0008] Preferably, the eyepiece and objective lens are adjusted by means of an adjustment mechanism to adjust the axial distance between them in order to adjust the focal length. The adjustable axial distance design can be adapted to the test lenses of different thicknesses and curvatures to ensure that the microstructure imaging is always clear. The adjustment mechanism has multiple options.

[0009] Preferably, the Hartmann aperture assembly includes a sample holder and a Hartmann aperture installed in the middle of the sample holder. The Hartmann aperture is provided with a micropore array, and the sample holder has a circular light-transmitting hole at its center. The lens under test is positioned and installed on the sample holder and is coaxial with the Hartmann aperture and the circular light-transmitting hole. The coaxial design of the Hartmann aperture with the sample holder and the lens under test ensures that green light passes perpendicularly through the micropore array, forming a regular light spot signal and improving the accuracy of diopter calculation. The micropore array provides a stable light transmission path, combined with a light spot offset algorithm.

[0010] Preferably, the focusing assembly includes at least a collimating lens and an illumination source. The illumination source is located on the focal plane of the collimating lens, and the distance between the two is matched with the focal length of the collimating lens. The illumination source and the optical axis of the collimating lens are coplanar. The fact that the illumination source is located on the focal plane of the collimating lens and the distance is matched can ensure that the parallelism of the emitted light is sufficiently high after collimation, providing stable incident light conditions for diopter measurement.

[0011] Preferably, the collimating lens is a single-lens structure or a cemented lens group structure; it is composed of at least one of plano-convex lens, biconvex lens, aspherical lens, Fresnel lens and gradient refractive index lens. The single-lens structure is easy to process and has a low cost, making it suitable for conventional precision measurement; the cemented lens group structure can correct various aberrations, making it suitable for high-precision measurement and improving the adaptability of the device.

[0012] Preferably, the imaging component further includes an image sensor, which is located on the light signal transmission path emitted by the Hartmann aperture component or the microscopic measurement component. The image sensor is located directly behind the light signal transmission path, which can efficiently receive the light signals of the two components. Moreover, the position of the image sensor is fixed and does not need to be adjusted when the components are switched, thus avoiding signal deviations introduced by position changes and ensuring the consistency of measurement results.

[0013] Preferably, the sample holder is provided with sliding guide rails connected to the mechanical switching component in the X, Y, and Z axes. The three-axis sliding guide rails enable precise adjustment of the sample holder, facilitating quick and accurate adjustment of the position of the Hartmann aperture component or the microscopic measurement component. And / or, the sample holder has an integrated auxiliary positioning device at the top for positioning the lens to be tested. The auxiliary positioning device is a spring clamping unit or a vacuum adsorption unit. The auxiliary positioning device ensures that the lens is firmly fixed and avoids the lens from loosening or shifting during the measurement process.

[0014] In a second aspect, a method for detecting lens refractive power and microstructure based on a mechanical switching structure according to the first aspect includes the following steps: When measuring the refractive power of a lens, the Hartmann aperture assembly is moved to the same optical axis as the focusing assembly by a mechanical switching component. The lens to be tested is placed on the sample holder of the Hartmann aperture assembly. The collimated parallel light emitted by the focusing assembly passes vertically through the lens to be tested. Some of the green light passes through the micro-aperture array on the Hartmann aperture and reaches the image sensor. By comparing the geometric offset of the array light spot passing through the circular aperture before and after the lens is placed, the lens refractive power parameters are accurately calculated, thus realizing the lens refractive power measurement function. When performing lens microstructure analysis, the Hartmann aperture assembly is moved out by the mechanical switching component, and the micro measurement component is moved to the same optical axis as the focusing component. The light source of the focusing component is switched to infrared light. After the infrared light passes through the lens under test, it passes through the eyepiece and objective lens and is finally received by the image sensor, clearly presenting the microstructural details of the lens, thereby realizing the high-precision analysis function of lens microstructure. When simultaneously measuring the distance between the optical center of the lens and the geometric center of the microstructure region, the distance measurement tool built into the detection device is selected. Based on the calibrated markers of the optical center and the geometric center of the microstructure region, the spatial distance between the two feature points is accurately determined.

[0015] The overall method is simple to operate; switching components and light sources can complete dual-function measurements, significantly reducing labor costs.

[0016] Compared with the prior art, the beneficial effects of the present invention are: By integrating the Hartmann aperture assembly and the microscopic measurement assembly through a mechanical switching component, this invention addresses the pain points of traditional equipment that requires step-by-step testing across instruments and repeated clamping. A single clamping operation can complete the measurement of both core parameters, significantly improving testing efficiency. Therefore, the technical solution of this invention integrates a lens diopter measurement module and a high-precision microstructure analysis module, merging the diopter measurement and optical center positioning functions of a traditional focimeter with the microscopic morphology analysis function of a microscopic observation system into a single instrument. During the inspection process, the optical center coordinates of the microstructure lens and the geometric center coordinates of the microstructure region can be acquired simultaneously, and the two can be compared and the offset calculated in real time. This completely eliminates the systematic and random errors introduced by lens movement, repeated positioning fixtures, and inconsistent human operation in the traditional step-by-step inspection process, which first uses a focimeter to measure the optical center and then uses a microscope to observe the microstructure. This achieves real-time synchronous acquisition of optical center positioning data and microstructure region geometric center data. The optical center coordinates and microstructure geometric center coordinates are acquired at the same time, at the same position, and in the same reference coordinate system. The two sets of coordinates are directly comparable, which fundamentally guarantees the absolute accuracy and reliability of the position offset calculation. Users can obtain all core inspection results at the same time after completing one clamping and startup, greatly improving inspection efficiency. Attached Figure Description

[0017] Figure 1 This is a schematic diagram illustrating the principle of the present invention; Figure 2 This is a structural diagram of the mechanical switching assembly, Hartmann aperture assembly, and microscopic measurement assembly of the present invention; Figure 3 This is a cross-sectional view of the detection device of the present invention; Figure 4 This is a three-dimensional structural diagram of the detection device of the present invention.

[0018] Figure label: 1. Illumination source; 2. Collimating lens; 3. Mechanical switching assembly; 31. Second connecting plate; 32. Rotating shaft; 33. First connecting plate; 4. Microscopic measurement assembly; 5. Hartmann aperture assembly; 51. Hartmann aperture; 52. Micropore array; 6. Sample holder; 7. Image sensor; 8. Lens to be tested; 9. Stage. Detailed Implementation

[0019] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

[0020] like Figure 1-4As shown, this invention provides a solution to address the problems of low efficiency and large human error in current focal length and microstructure analysis methods that rely on multiple devices. The invention offers the following technical solution: a lens refractive power and microstructure detection device based on a mechanical switching structure, comprising a support stage 9, a focusing assembly, and an imaging assembly. Both the focusing assembly and the imaging assembly are mounted on the support stage 9. The imaging assembly includes a Hartmann aperture assembly 5 and a microscopic measurement assembly 4. Both the Hartmann aperture assembly 5 and the microscopic measurement assembly 4 are connected to the support stage 9 via a mechanical switching assembly 3. The lens 8 to be tested is positioned between the Hartmann aperture assembly 5 and the focusing assembly, or between the microscopic measurement assembly 4 and the focusing assembly. The mechanical switching assembly 3 moves the Hartmann aperture assembly 5 or the microscopic measurement assembly 4 to the same plane containing the optical axes of the lens 8, the focusing assembly, and the imaging assembly. This integrated approach of the mechanical switching assembly 3 solves the pain points of traditional equipment requiring multi-instrument step-by-step testing and repeated clamping, allowing for the measurement of dual core parameters in a single clamping operation, thus improving detection efficiency.

[0021] Specifically, the mechanical switching assembly 3 is fixed to the center of the front side of the support platform 9, and the Hartmann aperture assembly 5 and the microscopic measurement assembly 4 are symmetrically connected to both sides of the switching assembly. The lens to be tested 8 is a microstructured glass lens for myopia control in adolescents. When switching the Hartmann aperture assembly 5 to the optical path, its coplanar error with the focusing assembly and the imaging assembly is ≤±0.08mm; when switching the microscopic measurement assembly 4, the coplanar error of the optical axis is ≤±0.09mm.

[0022] In this embodiment, the mechanical switching assembly 3 includes a rotating shaft 32 and a first connecting plate 33 and a second connecting plate 31 that are sleeved on the rotating shaft 32 and rotate. The first connecting plate 33 and the second connecting plate 31 are respectively connected to the Hartmann aperture assembly 5 and the microscopic measurement assembly 4. The structural design of the rotating shaft 32 and the double connecting plates is simple, enabling rapid switching between the two measurement assemblies. The operation is convenient and does not require manual disassembly or movement of the assemblies. Specifically, the rotating shaft 32, the first connecting plate 33, and the second connecting plate 31 of the mechanical switching assembly 3 are all made of aluminum alloy. The first connecting plate 33 and the second connecting plate 31 are rigidly connected to the Hartmann aperture assembly 5 and the microscopic measurement assembly 4 respectively by bolts. The rotating shaft 32 is fixed by a deep groove ball bearing. During switching, the connecting plate drives the assembly to rotate 90°. After reaching the position, the positioning pin automatically locks. After locking, the coaxiality error between the optical axis and the optical path of the assembly is ≤±0.05mm.

[0023] In this embodiment, the microscopic measurement assembly 4 includes a sample holder 6 and an eyepiece and objective lens arranged coaxially in the middle of the sample holder 6. The sample holder 6 has a circular light-transmitting hole at its center. The lens to be measured 8 is positioned and mounted on the sample holder 6, coaxial with the eyepiece, objective lens, and circular light-transmitting hole. The coaxial arrangement of the eyepiece and objective lens ensures the consistency of the optical path for microscopic imaging, avoids imaging blurring caused by axial misalignment, and improves the accuracy of microstructure detail recognition. Positioning the lens to be measured 8 on the sample holder 6 prevents lens displacement during measurement and ensures the repeatability of microstructure center positioning. Specifically, the sample holder 6 is made of aluminum alloy, the eyepiece is a 10× achromatic eyepiece with a focal length of 25mm, and the objective lens is a 20× plan objective lens with a focal length of 12.5mm. Both are coaxially arranged from top to bottom along the vertical optical axis, with a geometric center coaxiality tolerance ≤ ±8μm. The lens to be measured 8 is fixed by the positioning steps of the sample holder 6.

[0024] Preferably, the eyepiece and objective lens are adjusted by means of an adjustment mechanism to change the focal length by adjusting the axial distance between them. The adjustable axial distance design can accommodate lenses of different thicknesses and curvatures, ensuring consistently clear imaging of microstructures. Multiple adjustment mechanisms are available. Specifically, the adjustment mechanism can employ a piezoelectric ceramic actuator (model PZT-5H) with a driving stroke of 5mm, an adjustment step of 0.005μm, and a maximum driving force of 10N. The eyepiece and objective lens are respectively mounted within a sliding metal sleeve, which engages with the guide rail of the sample holder 6. The axial movement of the sleeve, driven by the piezoelectric ceramic actuator, achieves the adjustment of the distance between them.

[0025] In this embodiment, the Hartmann aperture assembly 5 includes a sample holder 6 and a Hartmann aperture 51 installed in the middle of the sample holder 6. The Hartmann aperture 51 has a micro-aperture array 52. ​​The sample holder 6 has a circular light-transmitting hole at its center. The lens under test 8 is positioned and installed on the sample holder 6 and is coaxial with the Hartmann aperture 51 and the circular light-transmitting hole. The coaxial design of the Hartmann aperture 5 with the sample holder 6 and the lens under test 8 ensures that green light passes perpendicularly through the micro-aperture array, forming a regular light spot signal and improving the accuracy of refractive power calculation. The micro-aperture array 52 provides a stable light transmission path, combined with a light spot offset algorithm. Specifically, the sample holder 6 of the Hartmann aperture assembly 5 shares the same structure with the microscopic measurement assembly 4, and the two are interchangeable. The Hartmann aperture 51 is made of quartz material, with a circular micro-aperture array 52 etched on its surface, arranged in an equally spaced orthogonal grid, totaling 16 micro-apertures (4×4 array). The Hartmann aperture 51 is fixed to the middle of the sample holder 6 by an annular pressure ring.

[0026] In this embodiment, the focusing assembly includes at least a collimating lens 2 and an illumination source 1. The illumination source 1 is located on the focal plane of the collimating lens 2, and the distance between them matches the focal length of the collimating lens 2. The optical axes of the illumination source 1 and the collimating lens 2 are coplanar. The location of the illumination source 1 on the focal plane of the collimating lens and the matching distance ensure that the parallelism of the emitted light is sufficiently high after collimation, providing stable incident light conditions for refractive power measurement. Specifically, the illumination source 1 of the focusing assembly uses a green LED with a wavelength of 532nm and an infrared LED with a wavelength of 880nm. The collimating lens 2 is a biconvex lens made of K9 optical glass with a focal length of 120mm, an effective aperture of 30mm, and an aberration ≤0.007mm. The illumination source 1 is fixed on the focal plane of the collimating lens 2 by an adjustable bracket.

[0027] In this embodiment, the collimating lens is either a single-lens structure or a cemented lens group structure. It comprises at least one of a plano-convex lens, a biconvex lens, an aspherical lens, a Fresnel lens, and a gradient refractive index lens. The single-lens structure is simple to manufacture and has a low cost, making it suitable for routine precision measurements. The cemented lens group structure can correct various aberrations, making it suitable for high-precision measurements and improving device adaptability. Specifically, as a first option, the collimating lens 2 uses a single-lens aspherical lens made of PMMA resin, with an effective aperture of 28mm, a focal length of 120mm, an aberration ≤0.009mm, and a weight of 20g, making it suitable for portable measuring devices. As a second option, the collimating lens 2 uses a cemented lens group structure, consisting of a plano-convex lens and a biconcave lens cemented together, with an effective aperture of 32mm, a focal length of 120mm, and an aberration ≤0.004mm, making it suitable for high-precision laboratory measurement scenarios.

[0028] In this embodiment, the imaging component further includes an image sensor 7. The image sensor 7 is located on the light signal transmission path emitted from the Hartmann aperture assembly 5 or the microscopic measurement assembly 4. Positioned directly behind the light signal transmission path, the image sensor 7 can efficiently receive light signals from both assemblies. Furthermore, the image sensor 7 has a fixed position, eliminating the need for adjustment during component switching and avoiding signal deviations introduced by positional changes, thus ensuring the consistency of measurement results. Specifically, the image sensor 7 can be a CMOS sensor with 64 million pixels, a sampling frequency of 30fps, a photosensitive surface size of 1 / 1.7 inch, and a dynamic range of 130dB.

[0029] In this embodiment, the sample holder 6 is provided with sliding guide rails connected to the mechanical switching component 3 in the X, Y, and Z axes. The three-axis sliding guide rails enable precise adjustment of the sample holder, facilitating quick and accurate adjustment of the position of the Hartmann aperture component 5 or the microscopic measurement component 4. Specifically, the X, Y, and Z axis sliding guide rails of the sample holder 6 adopt a ball screw structure, which has high axial positioning accuracy, a guide rail stroke of 50 mm, and is adjusted by a manual knob with a knob graduation value of 0.001 mm.

[0030] In addition, the sample holder 6 integrates an auxiliary positioning device at its top for positioning the lens 8 to be tested. This auxiliary positioning device can be a spring clamping unit or a vacuum adsorption unit. The auxiliary positioning device ensures the lens is firmly fixed, preventing loosening or displacement during measurement. Specifically, as the first option, the auxiliary positioning device is a spring clamping unit, using three sets of stainless steel arc-shaped spring plates evenly distributed at the top of the sample holder 5. The clamping force of the spring plates is 5-10N, and the clamping range is suitable for lenses with a diameter of 40-80mm. After clamping, the radial displacement of the lens is ≤±0.02mm. As the second option, the auxiliary positioning device is a vacuum adsorption unit with a ring-shaped adsorption surface of 10mm in diameter. A vacuum generator provides a vacuum of -0.08MPa, and after adsorption, the axial displacement of the lens is ≤±0.01mm, suitable for thin lenses with a thickness ≤5mm.

[0031] In this embodiment, the detection device is also equipped with a computing system, such as an ARM Cortex-A9 processor with a main frequency of 1.5 GHz, and a display screen. The computing system is equipped with the Zernike polynomial wavefront reconstruction algorithm and pixel coordinate conversion algorithm, which can realize functions such as diopter calculation, microstructure imaging, and dual-center distance measurement. The display screen is used to display measurement parameters, images and results.

[0032] The complete implementation process of the measurement method in this embodiment includes the following steps: (1) Equipment preparation: Press the power switch to start the device and enter the self-test mode. The self-test includes light source brightness, lens position, sensor status, and positioning accuracy of switching components. After the self-test is passed, the display screen lights up and displays the mode selection interface by default (Mode 1: diopter measurement, Mode 2: microstructure measurement, Mode 3: dual-center distance measurement).

[0033] (2) Calibration operation: Empty sample holder 6, select mode 1, and observe whether the display shows 0.00D, such as spherical lens 0.00D, cylindrical lens 0.00D, and axis not displayed; if the display deviation exceeds ±0.01D, insert a standard lens (diopter -3.00D, cylindrical lens -1.00D, axis 90°), click the "calibrate" button on the display, and the system will automatically complete the parameter calibration. After calibration, the deviation is ≤±0.005D.

[0034] (3) Sample clamping: The back surface of the microstructured lens for myopia control in the adolescent to be tested (diameter 65mm, thickness 3.2mm, designed diopter -4.00D) is placed face down above the light-transmitting hole in the center of the sample holder 6. The lens edge is fixed by 3 sets of spring clamping units to ensure that the lens is stable and centered without loosening or tilting, and the positioning error is ≤±0.8mm.

[0035] (4) Refractive power measurement (mode 1) Select mode 1, rotate the handle through mechanical switching component 3 to move the Hartmann aperture component 5 into the optical path, lock the positioning pin, and confirm that the optical axis of the component is coaxial with the optical axes of the focusing component and the imaging component; The testing device automatically switches to a 532nm green light source. The scattered light emitted by the light source is converted into collimated light with a parallelism of ≥99.7% by the collimating lens 2 and passes perpendicularly through the lens under test 8. Green light passing through the lens is incident on the micro-aperture array 52 of the Hartmann aperture 51, forming a regular array of light spots, and the light spot signal is transmitted to the image sensor 7. The calculation system compares the geometric offset of the array light spot before and after lens placement. Specifically, the light spot shifts by an average of 22 pixels after placement. One pixel corresponds to 0.01mm, and the actual offset is 0.22mm. Combined with the Zernike polynomial wavefront reconstruction algorithm, the refractive power parameters are accurately calculated. Meanwhile, the system uses an image sharpness recognition algorithm (sharpness threshold ≥85%) to locate the optical center of the lens, marks the center coordinates as X: 12.3mm, Y: 10.8mm on the display screen, and displays the measurement results: spherical lens -4.02D, cylindrical lens -0.98D, axis 89°, measurement time 12s.

[0036] (5) Microstructure measurement (mode 2) To exit mode 1, rotate the handle of the mechanical switching component 3 to move the Hartmann aperture component 5 out of the optical path and simultaneously move the microscopic measurement component 4 into the optical path. After locking the positioning pin, confirm that the optical axis is aligned. When mode 2 is selected, the device automatically switches to an 880nm infrared light source. The infrared light passes through the lens under test 8 and then enters the eyepiece and objective lens of the micro-measuring assembly 4. Adjust the piezoelectric ceramic actuator to set the distance between the eyepiece and the objective lens to 25mm, and the display screen will show a microstructure image magnified 300 times; Manually adjust the X and Y axis guide rails of the sample holder 6 so that the center of the crosshair is aligned with the geometric center of the microstructure area. The system automatically marks the coordinates of this center as X: 12.7mm, Y: 11.5mm. The measurement takes 10 seconds.

[0037] (6) Dual-center distance measurement (mode 3) Exit mode 2 and select mode 3. The system will automatically retrieve the calibrated optical center coordinates and the geometric center coordinates of the microstructure region. Based on the pixel coordinate conversion algorithm, the distance was calculated to be 0.68mm. The display screen shows the distance measurement results and error range. Users can choose to save the measurement data, including diopter parameters, center coordinates, and distance values, or print a report. The total detection time is 30 seconds.

[0038] (7) Equipment shutdown After the measurement is completed, remove the lens to be tested, turn off the light source, press the power switch to turn off the device, and clean the dust and impurities on the sample holder and aperture surface to ensure the equipment is clean.

[0039] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0040] Furthermore, in this invention, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly and specifically defined.

[0041] In this invention, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0042] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

Claims

1. A lens refractive power and microstructure detection device based on a mechanical switching structure, comprising a support platform (9), a focusing assembly, and an imaging assembly, wherein the focusing assembly and the imaging assembly are both mounted on the support platform (9), characterized in that, The imaging component includes a Hartmann aperture assembly (5) and a microscopic measurement assembly (4). Both the Hartmann aperture assembly (5) and the microscopic measurement assembly (4) are connected to the support stage (9) via a mechanical switching assembly (3). The lens to be tested (8) is positioned between the Hartmann aperture assembly (5) and the focusing assembly or between the microscopic measurement assembly (4) and the focusing assembly. The Hartmann aperture assembly (5) or the microscopic measurement assembly (4) is moved to the same plane containing the optical axes of the lens to be tested (8), the focusing assembly, and the imaging component via the mechanical switching assembly (3).

2. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 1, characterized in that: The mechanical switching assembly (3) includes a rotating shaft (32) and a first connecting plate (33) and a second connecting plate (31) mounted on the rotating shaft (32) for rotation. The first connecting plate (33) and the second connecting plate (31) are respectively connected to the Hartmann aperture assembly (5) and the microscopic measurement assembly (4).

3. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 2, characterized in that: The microscopic measurement component (4) includes a sample holder (6) and an eyepiece and an objective lens arranged coaxially in the middle of the sample holder (6). The sample holder (6) has a circular light-transmitting hole at its center. The lens to be tested (8) is positioned and installed on the sample holder (6) and is coaxial with the eyepiece, objective lens and circular light-transmitting hole.

4. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 3, characterized in that: The eyepiece and objective lens are adjusted by means of an adjustment mechanism to adjust the axial distance between them in order to adjust the focal length.

5. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 3, characterized in that: The Hartmann aperture assembly (5) includes a sample holder (6) and a Hartmann aperture (51) installed in the middle of the sample holder (6). The Hartmann aperture (5) is provided with a micro-pore array (52). The sample holder (6) has a circular light-transmitting hole at its center. The lens to be tested (8) is positioned and installed on the sample holder (6) and is coaxial with the Hartmann aperture (51) and the circular light-transmitting hole.

6. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 1, characterized in that: The focusing assembly includes at least a collimating lens (2) and an illumination source (1). The illumination source (1) is located on the focal plane of the collimating lens (2), and the distance between the two is matched with the focal length of the collimating lens (2). The optical axis of the illumination source (1) is coplanar with that of the collimating lens (2).

7. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 6, characterized in that: The collimating lens type is a single lens structure or a cemented lens group structure; it is composed of at least one of plano-convex lens, biconvex lens, aspherical lens, Fresnel lens and gradient refractive index lens.

8. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 2, characterized in that: The imaging component also includes an image sensor (7), which is located on the light signal transmission path emitted through the Hartmann aperture assembly (5) or the microscopic measurement assembly (4).

9. The lens refractive power and microstructure detection device based on a mechanical switching structure according to claim 5, characterized in that: The sample holder (6) is provided with sliding guide rails connected to the mechanical switching assembly (3) in the X, Y and Z axes; And / or, the sample holder (6) is integrated with an auxiliary positioning device for positioning the lens to be tested (8) on the top, the auxiliary positioning device being a spring clamping unit or a vacuum adsorption unit.

10. A method for detecting lens refractive power and microstructure based on a mechanical switching structure according to any one of claims 5-9, characterized in that, Includes the following steps: When measuring the refractive power of a lens, the Hartmann aperture assembly (5) is moved to the same optical axis as the focusing assembly by the mechanical switching assembly (3). The lens to be tested (8) is placed on the sample holder (6) of the Hartmann aperture assembly (5). The collimated parallel light emitted by the focusing assembly passes through the lens to be tested (8) vertically. Part of the green light passes through the micro-aperture array (52) on the Hartmann aperture (51) and reaches the image sensor (7). By comparing the geometric offset of the array light spot passing through the circular aperture before and after the lens is placed, the lens refractive power parameters are accurately calculated, and the lens refractive power measurement function is realized. When performing lens microstructure analysis, the Hartmann aperture assembly (5) is moved out by the mechanical switching assembly (3), and the micro measurement assembly (4) is moved to the same optical axis as the focusing assembly. The light source of the focusing assembly is switched to infrared light. After the infrared light passes through the lens under test (8), it passes through the eyepiece and objective lens and is finally received by the image sensor (7), clearly presenting the microstructure details of the lens, thereby realizing the high-precision analysis function of the lens microstructure. When simultaneously measuring the distance between the optical center of the lens and the geometric center of the microstructure region, the distance measurement tool built into the detection device is selected. Based on the calibrated markers of the optical center and the geometric center of the microstructure region, the spatial distance between the two feature points is accurately determined.