Multi-channel signal delay calibration method and system and ATE test equipment

Abstract

The invention is suitable for the technical field of semiconductor testing, and provides a delay calibration method and system for multichannel signals and ATE testing equipment. The method comprises the following steps: acquiring calibration sequence signals sent by at least two channels respectively, wherein the calibration sequence signals sent by each channel are the same; dividing all the calibration sequence signals into a plurality of signal combinations, wherein each signal combination comprises a first calibration sequence signal and a second calibration sequence signal; for each signal combination, taking the first calibration sequence signal in the signal combination as a P-end differential signal, and taking the second calibration sequence signal in the signal combination as an N-end differential signal to carry out phase adjustment so as to determine a phase difference corresponding to the signal combination; and performing delay calibration on the to-be-transmitted signals of the at least two channels according to the phase difference corresponding to each signal combination. According to the method, the phase delay among the to-be-transmitted signals of the multiple channels can be reduced, and the delay calibration effect on the multi-channel signals is improved.

Description

Technical Field

[0001] This application belongs to the field of semiconductor testing technology, and in particular relates to a delay calibration method, system and ATE test equipment for multi-channel signals. Background Technology

[0002] With the development of information technology and the large-scale application of complex chips, each chip needs to undergo high-speed, automated testing using ATE (Automatic Test Equipment) before leaving the factory to screen out products that meet functional and performance standards, ensuring a high yield rate. However, during the mass production testing of complex chips, as the requirements for test items and efficiency continue to increase, users also have higher and higher demands for signal transmission rates. One way to improve signal transmission rates is to transmit signals through multiple channels. When transmitting signals through multiple channels, delay calibration is required for the signals transmitted through multiple channels to ensure that the signals transmitted from multiple channels are sent synchronously to the signal receiving end.

[0003] Currently, existing methods for delay calibration typically fall into two categories: The first is to set the trace length between each channel and the signal receiver to the same length. The drawback of this method is that the signals transmitted through each channel will still exhibit delay differences when passing through certain devices (such as high-speed switches and high-speed comparators), resulting in poor delay calibration performance. The second method involves performing delay calibration on signals transmitted through multiple channels at the signal receiver. The drawback of this method is its limitations in certain scenarios. For example, in C-PHY protocol communication scenarios, due to the small preamble byte length, the signal receiver needs significant resources for parallel processing to quickly recover the clock, and the bit error rate will be high, thus resulting in poor delay calibration performance.

[0004] It can be seen that the existing delay calibration methods for multi-channel signals have the disadvantage of difficulty in ensuring the consistency of delay differences between devices in terms of hardware, or the disadvantage of high bit error rate in certain application scenarios, thus resulting in poor delay calibration effect. Summary of the Invention

[0005] In view of this, embodiments of this application provide a delay calibration method, system, and ATE test equipment for multi-channel signals to solve the technical problem that the delay calibration method for multi-channel signals in the prior art is of poor performance.

[0006] In a first aspect, embodiments of this application provide a delay calibration method for multi-channel signals, comprising: Acquire calibration sequence signals sent by at least two channels, wherein the calibration sequence signals sent by each channel are identical; All the calibration sequence signals are divided into multiple signal combinations, and each signal combination includes a first calibration sequence signal and a second calibration sequence signal; For each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment, so as to determine the phase difference corresponding to the signal combination. Based on the phase difference corresponding to each of the signal combinations, delay calibration is performed on the signals to be transmitted in at least two channels.

[0007] Optionally, the step of using the first calibration sequence signal in the signal combination as the P-terminal differential signal and the second calibration sequence signal in the signal combination as the N-terminal differential signal for phase adjustment to determine the phase difference corresponding to the signal combination includes: Based on the first phase adjustment value, the P-terminal differential signal and the N-terminal differential signal in the signal combination are subjected to preliminary phase adjustment processing until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, thereby obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal. Based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, a second phase adjustment process is performed on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment process until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, thereby obtaining the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal; the first phase adjustment value is greater than the second phase adjustment value; The phase difference corresponding to the signal combination is determined based on the third current phase value and the fourth current phase value.

[0008] Optionally, the step of performing preliminary phase adjustment processing on the P-terminal differential signal and the N-terminal differential signal in the signal combination according to the first phase adjustment value, until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, and obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal, includes: The phase of the P-terminal differential signal in the signal combination is fixed, and the N-terminal differential signal in the signal combination is subjected to phase delay processing up to M times with the first phase adjustment value. If the calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing; wherein, K is less than or equal to M; If the calibration sequence cannot be determined after the Mth phase delay process, the phase of the N-terminal differential signal in the signal combination is fixed, and the P-terminal differential signal in the signal combination is subjected to a maximum of M phase delay processes with the first phase adjustment value. If the calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing.

[0009] Optionally, the step of performing a second phase adjustment process on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment processing based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, to obtain the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal, includes: The phase of the P-terminal differential signal in the signal combination is fixed to the first current phase value, and the N-terminal differential signal in the signal combination is phase delayed according to the second current phase value as the initial value and the second phase adjustment value. If the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is larger than the first effective window, then the N-terminal differential signal continues to be phase delayed until the third effective window is the largest, and the first current phase value is determined as the third current phase value, and the phase value of the N-terminal differential signal at the current moment is determined as the fourth current phase value. If the third effective window is smaller than the first effective window, the phase of the N-terminal differential signal in the signal combination is fixed to the second current phase value. The first current phase value is used as the initial value, and the phase delay processing of the P-terminal differential signal in the signal combination is performed according to the second phase adjustment value until the third effective window is maximized. The second current phase value is then determined as the fourth current phase value, and the phase value of the P-terminal differential signal at the current moment is determined as the third current phase value.

[0010] Optionally, the step of performing delay calibration on the at least two channels of signals to be transmitted based on the phase difference corresponding to each of the signal combinations includes: Choose any one of the at least two channels as the reference channel; For each of the at least two channels other than the reference channel, the phase difference between the other channel and the reference channel is determined based on the phase difference corresponding to each signal combination, and the signal to be transmitted in the other channel is delayed and calibrated based on the phase difference between the other channel and the reference channel.

[0011] Secondly, embodiments of this application provide a delay calibration system for multi-channel signals, the system including ATE testing equipment; The ATE test equipment is configured as follows: Acquire calibration sequence signals sent by at least two channels, wherein the calibration sequence signals sent by each channel are identical; All the calibration sequence signals are divided into multiple signal combinations, each signal combination including a first calibration sequence signal and a second calibration sequence signal. For each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment, so as to determine the phase difference corresponding to the signal combination. Based on the phase difference corresponding to each of the signal combinations, delay calibration is performed on the signals to be transmitted in at least two channels.

[0012] Optionally, the system further includes a calibration sequence signal transmission unit; each of the at least two channels includes a transmission unit, a first receiving unit, and a second receiving unit; The calibration sequence signal transmitting unit is configured to transmit the calibration sequence signal to the first receiving unit of each of the channels respectively; The first receiving unit of any channel is configured to receive the calibration sequence signal and send the calibration sequence signal to the sending unit of the arbitrary channel; The transmitting unit of the arbitrary channel is configured to transmit the calibration sequence signal to the second receiving unit of the arbitrary channel and the second receiving unit of another channel; The second receiving unit of the arbitrary channel is configured to receive the calibration sequence signal transmitted by the transmitting unit of the arbitrary channel and the calibration sequence signal transmitted by another channel.

[0013] Optionally, the ATE test equipment is specifically configured as follows: The two calibration sequence signals received by the second receiving unit of each channel are divided into a signal combination.

[0014] Optionally, each of the channels further includes an output signal phase adjustment unit and an input signal phase adjustment unit; The ATE test equipment is configured to send a phase adjustment signal to the output signal phase adjustment unit and / or the input signal phase adjustment unit in any channel, to instruct the output signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the first receiving unit of the arbitrary channel, and / or to instruct the input signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the second receiving unit of the arbitrary channel.

[0015] Thirdly, embodiments of this application provide an ATE testing device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the delay calibration method for multi-channel signals as described in any of the first aspects above.

[0016] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the delay calibration method for multi-channel signals as described in any of the first aspects above.

[0017] Fifthly, embodiments of this application provide a computer program product that, when run on an electronic device, causes the electronic device to perform each step of the delay calibration method for multi-channel signals as described in any of the first aspects above.

[0018] The delay calibration method, system, and ATE test equipment for multi-channel signals provided in this application have the following beneficial effects: In the delay calibration method for multi-channel signals provided in this application embodiment, firstly, calibration sequence signals transmitted by at least two channels are acquired, with each channel transmitting the same calibration sequence signal. Then, all calibration sequence signals are divided into multiple signal combinations, each including a first calibration sequence signal and a second calibration sequence signal. Next, for each signal combination, the first calibration sequence signal in the combination is used as the P-terminal differential signal, and the second calibration sequence signal in the combination is used as the N-terminal differential signal for phase adjustment, to determine the phase difference corresponding to the signal combination. Finally, based on the phase difference corresponding to each signal combination, delay calibration is performed on the signals to be transmitted from at least two channels. This method utilizes the low delay between the phase-adjusted P-terminal differential signal and the phase-adjusted N-terminal differential signal, which can reduce the phase delay between the signals to be transmitted from multiple channels and improve the effect of delay calibration for multi-channel signals. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 A schematic diagram of the structure of a delay calibration system for a multi-channel signal provided in an embodiment of this application; Figure 2 A flowchart illustrating the implementation of the delay calibration method for multi-channel signals provided in this application embodiment; Figure 3 This application provides a schematic diagram of the P-terminal differential signal before phase adjustment and the N-terminal differential signal before phase adjustment, as part of an embodiment of the present application. Figure 4 A flowchart illustrating the implementation of a method for phase adjustment of signal combinations, provided in an embodiment of this application; Figure 5 This application provides a schematic diagram of a phase-adjusted P-terminal differential signal and a phase-adjusted N-terminal differential signal as an embodiment of the present application. Figure 6 A schematic diagram of the structure of a delay calibration system for a multi-channel signal provided in another embodiment of this application; Figure 7 This is a schematic diagram of the structure of an ATE testing device provided in an embodiment of this application; Figure 8 This is a schematic diagram of the structure of an ATE testing device provided in another embodiment of this application. Detailed Implementation

[0021] It should be noted that the terminology used in the embodiments of this application is only for explaining specific embodiments of this application and is not intended to limit this application. In the description of the embodiments of this application, unless otherwise stated, "multiple" means two or more, "at least one" or "one or more" means one, two or more. The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.

[0022] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.

[0023] The execution subject of the delay calibration method for multi-channel signals provided in this application embodiment can be an ATE test device.

[0024] The delay calibration method for multi-channel signals provided in this application can be applied to any scenario requiring delay calibration of multi-channel signals. For example, when delay calibration is required for multiple channels (two or more channels) of signals to be transmitted, the various steps of the delay calibration method for multi-channel signals provided in this application can be executed using an ATE test device. This reduces the phase delay between the multiple channels of signals to be transmitted, thereby improving the effectiveness of delay calibration for multi-channel signals.

[0025] This application first provides a delay calibration system for multi-channel signals. Please refer to... Figure 1 , Figure 1 This is a schematic diagram of the structure of a delay calibration system for a multi-channel signal provided in an embodiment of this application.

[0026] like Figure 1As shown, the multi-channel signal delay calibration system may include at least two channels and an ATE test device. Each of the at least two channels includes a transmitting unit, a first receiving unit, and a second receiving unit. The first receiving unit of the channel is connected to the ATE test device and the transmitting unit of the channel. The transmitting unit of the channel is connected to the second receiving unit of the channel and the second receiving unit of another channel. The second receiving unit of the channel is also connected to the ATE test device.

[0027] It should be noted that in each embodiment of this application, four channels are used as an example for illustration.

[0028] The first receiving unit of any channel is configured to receive the calibration sequence signal and send the calibration sequence signal to the sending unit of any channel.

[0029] The transmitting unit of any channel is configured to transmit a calibration sequence signal to the second receiving unit of that arbitrary channel and the second receiving unit of another channel; for example, the transmitting unit of channel 1 is configured to transmit a calibration sequence signal to the second receiving unit of channel 1 and the second receiving unit of channel 2; the transmitting unit of channel 2 is configured to transmit a calibration sequence signal to the second receiving unit of channel 2 and the second receiving unit of channel 3; the transmitting unit of channel 3 is configured to transmit a calibration sequence signal to the second receiving unit of channel 3 and the second receiving unit of channel 4; the transmitting unit of channel 4 is configured to transmit a calibration sequence signal to the second receiving unit of channel 4 and the second receiving unit of channel 1; in addition, it is also configured to transmit the signal to be transmitted to the signal receiving end.

[0030] The second receiving unit of any channel is configured to receive a calibration sequence signal sent by the transmitting unit of that arbitrary channel and a calibration sequence signal sent by another channel. For example, the second receiving unit of channel 1 is configured to receive a calibration sequence signal sent by the transmitting unit of channel 1 and a calibration sequence signal sent by the transmitting unit of channel 4; the second receiving unit of channel 2 is configured to receive a calibration sequence signal sent by the transmitting unit of channel 1 and a calibration sequence signal sent by the transmitting unit of channel 2; the second receiving unit of channel 3 is configured to receive a calibration sequence signal sent by the transmitting unit of channel 2 and a calibration sequence signal sent by the transmitting unit of channel 3; and the second receiving unit of channel 4 is configured to receive a calibration sequence signal sent by the transmitting unit of channel 3 and a calibration sequence signal sent by the transmitting unit of channel 4.

[0031] The ATE test equipment is configured to perform each step of the delay calibration method for multi-channel signals provided in the embodiments of this application.

[0032] Please see Figure 2 , Figure 2This is a flowchart illustrating the implementation of a multi-channel signal delay calibration method provided in this application embodiment. This multi-channel signal delay calibration method can be applied to ATE test equipment and may include steps S101 to S104, detailed below: In S101, the calibration sequence signals sent by at least two channels are acquired, and the calibration sequence signals sent by each channel are the same.

[0033] In this embodiment of the application, the calibration sequence signal sent by each channel can be set according to actual needs. For example, the calibration sequence signal sent by each channel can all be "1011".

[0034] Furthermore, there may be a delay in the calibration sequence signals sent by each channel; that is, the timing of the calibration sequence signals sent by each channel acquired by the ATE test equipment may differ. For example, the ATE test equipment acquires the calibration sequence signal sent by channel 1 at time t1, the calibration sequence signal sent by channel 2 at time t2, and the calibration sequence signal sent by channel 3 at time t3.

[0035] exist Figure 1 In the multi-channel signal delay calibration system shown, the ATE test equipment can obtain the corresponding calibration sequence signal through the second receiving unit of each channel, thereby obtaining the calibration sequence signal sent by each channel.

[0036] For example, the ATE test equipment can obtain the calibration sequence signal sent by the transmitting unit of channel 1 and the calibration sequence signal sent by the transmitting unit of channel 4 from the second receiving unit of channel 1, the calibration sequence signal sent by the transmitting unit of channel 1 and the calibration sequence signal sent by the transmitting unit of channel 2 from the second receiving unit of channel 2, the calibration sequence signal sent by the transmitting unit of channel 2 and the calibration sequence signal sent by the transmitting unit of channel 3 from the second receiving unit of channel 3, and the calibration sequence signal sent by the transmitting unit of channel 3 and the calibration sequence signal sent by the transmitting unit of channel 4 from the second receiving unit of channel 4, thereby obtaining the calibration sequence signals sent by channels 1 to 4 respectively.

[0037] In S102, all calibration sequence signals are divided into multiple signal combinations, each signal combination including a first calibration sequence signal and a second calibration sequence signal.

[0038] In this embodiment of the application, the ATE test equipment can divide the two calibration sequence signals received by the second receiving unit of each channel into a signal combination.

[0039] For example, the ATE test equipment can determine the calibration sequence signal sent by the transmitting unit of channel 1 and the calibration sequence signal sent by the transmitting unit of channel 4, which are obtained from the second receiving unit of channel 1, as the first signal combination; similarly, it can determine the calibration sequence signal sent by the transmitting unit of channel 1 and the calibration sequence signal sent by the transmitting unit of channel 2, which are obtained from the second receiving unit of channel 2, as the second signal combination; similarly, it can determine the calibration sequence signal sent by the transmitting unit of channel 2 and the calibration sequence signal sent by the transmitting unit of channel 3, which are obtained from the second receiving unit of channel 3, as the third signal combination; similarly, it can determine the calibration sequence signal sent by the transmitting unit of channel 3 and the calibration sequence signal sent by the transmitting unit of channel 4, which are obtained from the second receiving unit of channel 4, as the fourth signal combination.

[0040] Based on this, the ATE test equipment can be divided into the following four signal combinations: (calibration sequence signal sent by channel 1 and calibration sequence signal sent by channel 4), (calibration sequence signal sent by channel 1 and calibration sequence signal sent by channel 2), (calibration sequence signal sent by channel 2 and calibration sequence signal sent by channel 3), and (calibration sequence signal sent by channel 3 and calibration sequence signal sent by channel 4).

[0041] It should be noted that since the calibration sequence signals transmitted by each channel are the same, the specific method for determining one calibration sequence signal in the signal combination as the first calibration sequence signal and the other calibration sequence signal in the signal combination as the second calibration sequence signal can be set according to actual needs. For example, in the first signal combination, the calibration sequence signal transmitted by channel 4 can be determined as the first calibration sequence signal, and the calibration sequence signal transmitted by channel 1 can be determined as the second calibration signal.

[0042] In S103, for each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment, so as to determine the phase difference corresponding to the signal combination.

[0043] In this embodiment of the application, after determining multiple signal combinations, the ATE test equipment can perform the following steps for each signal combination: take the first calibration sequence signal in the signal combination as the P-terminal differential signal, and take the second calibration sequence signal in the signal combination as the N-terminal differential signal, thereby performing phase adjustment on the signal combination to determine the phase difference corresponding to the signal combination.

[0044] It should be noted that the differential signals at the P-end and N-end are complementary, symmetrical, and inverse signals. That is, if the differential signal at the P-end is "1011", then the differential signal at the N-end is "0100".

[0045] Please see Figure 3 , Figure 3 This document provides a schematic diagram of the P-terminal differential signal before phase adjustment and the N-terminal differential signal before phase adjustment, as provided in an embodiment of this application. From... Figure 3 It can be seen that there is a phase difference between the P-terminal differential signal before phase adjustment and the N-terminal differential signal before phase adjustment, which needs to be phase adjusted by S201.

[0046] For example, for the signal combination consisting of the calibration sequence signal sent by channel 1 and the calibration sequence signal sent by channel 4, the signal combination consisting of the calibration sequence signal sent by channel 4 can be used as the P-terminal differential signal, and the calibration sequence signal sent by channel 1 can be used as the N-terminal differential signal.

[0047] In one possible implementation, the ATE test equipment can be used via, for example... Figure 4 The method shown is used to adjust the phase of the signal combination. For example... Figure 4 As shown, Figure 4 This application provides a flowchart of a method for phase adjustment of a signal combination. The method for phase adjustment of a signal combination may include steps S201-S203, as detailed below: In S201, based on the first phase adjustment value, the P-terminal differential signal and the N-terminal differential signal in the signal combination are subjected to preliminary phase adjustment processing until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, thereby obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal.

[0048] In this implementation, the purpose of S201 is to perform phase coarse adjustment on the P-terminal differential signal and the N-terminal differential signal in the signal combination, so as to rapidly reduce the phase difference between the P-terminal differential signal and the N-terminal differential signal in the signal combination, thereby improving the efficiency of phase adjustment and thus improving the efficiency of delay calibration of multi-channel signals.

[0049] In one possible implementation, the ATE test equipment can achieve S201 through steps a to d, as detailed below: In step a, the phase of the P-terminal differential signal in the signal combination is first fixed, and the N-terminal differential signal in the signal combination is subjected to phase delay processing up to M times with the first phase adjustment value.

[0050] In this implementation, for example, the first phase adjustment value can be T / 2, where T can be determined based on the minimum time required for each channel to send one bit of data. For example, T can be 100 picoseconds, and based on this, the first phase adjustment value can be 50 picoseconds.

[0051] After each phase delay processing of the N-terminal differential signal in the signal combination with the first phase adjustment value, the ATE test equipment can determine whether the calibration sequence corresponding to the phase-delayed N-terminal differential signal and the fixed P-terminal differential signal can be determined. If not, the phase delay processing of the phase-delayed N-terminal differential signal with the first phase adjustment value continues.

[0052] In step b, if a calibration sequence is determined after the Kth phase delay processing, the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing; wherein, K is less than or equal to M.

[0053] In this implementation, if the ATE test equipment can determine the calibration sequence corresponding to the N-terminal differential signal and the fixed P-terminal differential signal after the Kth phase delay processing, the phase value of the P-terminal differential signal at the current time (i.e., the initial phase value of the P-terminal differential signal) can be determined as the first current phase value, and the phase value of the N-terminal differential signal at the current time (i.e., the phase value of the N-terminal differential signal after the Kth phase delay processing) can be determined as the second current phase value. Furthermore, the first effective window can be determined based on the P-terminal differential signal and the N-terminal differential signal at the current time.

[0054] The meaning of a valid window can be found in the following reference: Figure 3 ,like Figure 3 As shown, at any phase, if the differential signal at terminal P and the differential signal at terminal N are opposite, then there is an effective window for that phase; if the differential signal at terminal P and the differential signal at terminal N are the same, then there is no effective window. Based on this, the smaller the phase difference between the differential signal at terminal P and the differential signal at terminal N, the larger the effective window is usually. The effective window is largest when the phase difference between the differential signal at terminal P and the differential signal at terminal N is 0.

[0055] In step c, if the calibration sequence cannot be determined after the Mth phase delay process, the phase of the N-terminal differential signal in the signal combination is fixed, and the P-terminal differential signal in the signal combination is subjected to a maximum of M phase delay processes with the first phase adjustment value.

[0056] In this implementation, if after performing M phase delay processing on the N-terminal differential signal in the signal combination with the first phase adjustment value, the ATE test equipment still cannot determine the calibration sequence corresponding to the N-terminal differential signal after the Mth phase delay processing and the fixed P-terminal differential signal, then the phase of the N-terminal differential signal in the signal combination can be fixed, and the P-terminal differential signal in the signal combination can be subjected to up to M phase delay processing with the first phase adjustment value.

[0057] After each phase delay processing of the P-terminal differential signal in the signal combination with the first phase adjustment value, the ATE test equipment can determine whether the calibration sequence corresponding to the phase-delayed P-terminal differential signal and the fixed N-terminal differential signal can be determined. If not, the phase delay processing of the phase-delayed P-terminal differential signal with the first phase adjustment value continues.

[0058] In step d, if a calibration sequence is determined after the Kth phase delay processing, the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing.

[0059] In this implementation, if the ATE test equipment can determine the calibration sequence corresponding to the P-end differential signal after the Kth phase delay processing and the fixed N-end differential signal after the Kth phase delay processing, then the phase value of the P-end differential signal at the current time (that is, the phase value of the P-end differential signal after the Kth phase delay processing) can be determined as the first current phase value, and the phase value of the N-end differential signal at the current time (that is, the initial phase value of the N-end differential signal) can be determined as the second current phase value. Furthermore, the first effective window can be determined based on the P-end differential signal and the N-end differential signal at the current time.

[0060] Furthermore, if, after performing M phase delay processing on the P-terminal differential signal in the signal combination with the first phase adjustment value, the ATE test equipment still cannot determine the calibration sequence corresponding to the P-terminal differential signal after the Mth phase delay processing and the fixed N-terminal differential signal, it can output an error signal.

[0061] In S202, based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, a second phase adjustment process is performed on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment process until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, thereby obtaining the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal; the first phase adjustment value is greater than the second phase adjustment value.

[0062] In this implementation, the purpose of S202 is to fine-tune the phase of the P-terminal differential signal and the N-terminal differential signal in the signal combination, so as to minimize the phase difference between the P-terminal differential signal and the N-terminal differential signal in the signal combination, thereby improving the phase adjustment effect and thus improving the delay calibration effect of the multi-channel signal.

[0063] In one possible implementation, the ATE test equipment can achieve S202 through steps e to g, as detailed below: In step e, the phase of the P-terminal differential signal in the signal combination is fixed to the first current phase value, and the N-terminal differential signal in the signal combination is phase delayed according to the second phase adjustment value, using the second current phase value as the initial value.

[0064] In this implementation, after completing the initial phase adjustment processing of the P-terminal differential signal and the N-terminal differential signal in the signal combination, the ATE test equipment can fix the phase of the P-terminal differential signal in the signal combination to the first current phase value, and use the second current phase value as the initial value to perform phase delay processing on the N-terminal differential signal in the signal combination according to the second phase adjustment value. After each phase delay processing, the third effective window corresponding to the P-terminal differential signal and the phase-delayed N-terminal differential signal in the signal combination is determined, and the third effective window is compared with the first effective window.

[0065] In step f, if the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is greater than the first effective window, then the N-terminal differential signal continues to be phase delayed until the third effective window is the largest, and the first current phase value is determined as the third current phase value, and the phase value of the N-terminal differential signal at the current time is determined as the fourth current phase value.

[0066] In this implementation, if the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is greater than the first effective window, then step e is continued to be executed to continue to perform phase delay processing on the N-terminal differential signal until the third effective window is the largest. After that, the ATE test equipment can determine the first current phase value as the third current phase value and determine the phase value of the N-terminal differential signal at the current moment as the fourth current phase value.

[0067] In step g, if the third effective window is smaller than the first effective window, the phase of the N-terminal differential signal in the signal combination is fixed to the second current phase value, and the first current phase value is used as the initial value. The phase delay processing of the P-terminal differential signal in the signal combination is performed according to the second phase adjustment value until the third effective window is maximized. The second current phase value is determined as the fourth current phase value, and the phase value of the P-terminal differential signal at the current time is determined as the third current phase value.

[0068] In this implementation, if the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is smaller than the first effective window, the ATE test equipment can fix the phase of the N-terminal differential signal in the signal combination to the second current phase value, and use the first current phase value as the initial value, perform phase delay processing on the P-terminal differential signal in the signal combination according to the second phase adjustment value, until the third effective window is maximized. After that, the ATE test equipment can determine the second current phase value as the fourth current phase value, and determine the phase value of the P-terminal differential signal at the current moment as the third current phase value.

[0069] After completing steps a to g, the ATE test equipment can perform phase adjustment on the first calibration sequence signal and the second calibration sequence signal in the signal combination.

[0070] Please see Figure 5 , Figure 5 This illustration provides a schematic diagram of a phase-adjusted P-terminal differential signal and a phase-adjusted N-terminal differential signal according to an embodiment of this application. From... Figure 5 It can be seen that the phase difference between the phase-adjusted P-terminal differential signal and the phase-adjusted N-terminal differential signal is small, and the effective windows corresponding to the phase-adjusted P-terminal differential signal and the phase-adjusted N-terminal differential signal are the largest.

[0071] In S203, the phase difference corresponding to the signal combination is determined based on the third current phase value and the fourth current phase value.

[0072] In this implementation, the third current phase value is the current phase value of the P-terminal differential signal after phase adjustment, and the fourth current phase value is the current phase value of the N-terminal differential signal after phase adjustment. Based on this, the ATE test equipment can first determine the phase difference generated by the P-terminal differential signal during phase adjustment and determine the phase difference generated by the N-terminal differential signal during phase adjustment. Then, based on the third current phase value and the phase difference generated by the P-terminal differential signal during phase adjustment, the initial phase value of the P-terminal differential signal is determined. Based on the fourth current phase value and the phase difference generated by the N-terminal differential signal during phase adjustment, the initial phase value of the N-terminal differential signal is determined. Finally, based on the initial phase values ​​of the P-terminal differential signal and the N-terminal differential signal, the phase difference corresponding to the signal combination is determined.

[0073] It should be noted that the ATE test equipment needs to execute S201~S203 for each signal combination in order to obtain the phase difference corresponding to each signal combination.

[0074] In S104, delay calibration is performed on at least two channels of signals to be transmitted based on the phase difference corresponding to each signal combination.

[0075] In this embodiment of the application, after determining the phase difference corresponding to each signal combination, the ATE test equipment can determine the delay information between the signals sent by each channel.

[0076] For example, the phase difference corresponding to each signal combination can be as follows: The phase difference of the first signal combination (the calibration sequence signal sent by channel 1 and the calibration sequence signal sent by channel 4) can be 0.2T. That is, the phase of the calibration sequence signal sent by channel 1 minus the phase of the calibration sequence signal sent by channel 4 is 0.2T. In other words, the calibration sequence signal sent by channel 1 is delayed by 0.2T compared to the calibration sequence signal sent by channel 4.

[0077] The phase difference between the second signal combination (the calibration sequence signal sent by channel 1 and the calibration sequence signal sent by channel 2) can be -0.3T, that is, the calibration sequence signal sent by channel 2 is delayed by 0.3T compared with the calibration sequence signal sent by channel 1.

[0078] The phase difference of the third signal combination (the calibration sequence signal sent by channel 2 and the calibration sequence signal sent by channel 3) can be -0.2T, that is, the calibration sequence signal sent by channel 3 is delayed by 0.2T compared with the calibration sequence signal sent by channel 2.

[0079] The phase difference of the fourth signal combination (the calibration sequence signal sent by channel 3 and the calibration sequence signal sent by channel 4) can be 0.5T, that is, the calibration sequence signal sent by channel 3 is delayed by 0.5T compared with the calibration sequence signal sent by channel 4.

[0080] The ATE test equipment can designate any one of at least two channels as the reference channel. For example, the ATE test equipment can designate the channel with the largest delay as the reference channel, that is, channel 3 can be designated as the reference channel.

[0081] Subsequently, the ATE test equipment can determine the phase difference between the other channel and the reference channel based on the phase difference corresponding to each signal combination for each of at least two channels other than the reference channel, and perform delay calibration on the signal to be transmitted in the other channel based on the phase difference between the other channel and the reference channel.

[0082] For example, for channel 2, based on the phase difference of the third signal combination, the phase difference between channel 2 and channel 3 can be determined to be -0.2T. Based on the phase difference between channel 2 and channel 3, the signal to be transmitted in channel 2 can be controlled to be sent with a delay of 0.2T relative to the signal to be transmitted in channel 3, so as to perform delay calibration on the signal to be transmitted in channel 2.

[0083] For example, for channel 4, based on the phase difference of the fourth signal combination, the phase difference between channel 3 and channel 4 can be determined to be 0.5T. Based on the phase difference between channel 3 and channel 4, the signal to be transmitted in channel 4 can be controlled to be sent with a delay of 0.5T relative to the signal to be transmitted in channel 3, so as to perform delay calibration on the signal to be transmitted in channel 4.

[0084] For example, for channel 1, based on the phase difference of the first signal combination and the phase difference of the fourth signal combination, the phase difference between channel 3 and channel 1 can be determined to be 0.3T. Based on the phase difference between channel 3 and channel 1, the signal to be transmitted in channel 1 can be controlled to be sent with a delay of 0.3T relative to the signal to be transmitted in channel 3, so as to perform delay calibration on the signal to be transmitted in channel 1.

[0085] The delay calibration method for multi-channel signals provided in this application embodiment can synchronize the transmission time of signals sent from each channel to the signal receiving end.

[0086] Compared to existing technologies that set the trace length between each channel and the signal receiver to be the same, the multi-channel signal delay calibration method provided in this application provides a unique calibration and compensation mechanism that can compensate for the delay differences of hardware devices to a certain extent, reduce the over-reliance on hardware consistency, and even if there are certain delay differences in hardware devices, this method can be used for calibration and compensation to ensure the delay consistency between channels and improve the reliability of the signal transmission system.

[0087] Compared with the existing technology of performing delay calibration on signals transmitted through multiple channels at the signal receiving end, the delay calibration method for multi-channel signals provided in this application embodiment can better adapt to different application scenarios and data transmission requirements, has a wider range of applications, and has a lower error rate in various scenarios.

[0088] As can be seen from the above, in the multi-channel signal delay calibration method provided in this application embodiment, firstly, calibration sequence signals transmitted by at least two channels are acquired, and the calibration sequence signals transmitted by each channel are identical; then, all calibration sequence signals are divided into multiple signal combinations, each signal combination including a first calibration sequence signal and a second calibration sequence signal; then, for each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment to determine the phase difference corresponding to the signal combination; finally, based on the phase difference corresponding to each signal combination, delay calibration is performed on the signals to be transmitted in at least two channels. This method utilizes the low delay between the phase-adjusted P-terminal differential signal and the phase-adjusted N-terminal differential signal, which can reduce the phase delay between the signals to be transmitted in multiple channels and improve the effect of delay calibration for multi-channel signals.

[0089] Another embodiment of this application provides a delay calibration system for multi-channel signals. See also... Figure 6 , Figure 6 This is a schematic diagram of the structure of a delay calibration system for a multi-channel signal, provided in another embodiment of this application.

[0090] Figure 6 The delay calibration system for the multi-channel signal shown is... Figure 1 Compared to the multi-channel signal delay calibration system shown, Figure 6 The delay calibration system for the multi-channel signal shown may also include a signal transmission module.

[0091] The control signal transmission module may include a signal receiving sequence, a signal interaction interface, a calibration sequence signal sending unit, a phase adjustment control unit, and several sending signal delay units and receiving signal delay units corresponding to the channel.

[0092] The signal receiving sequence is configured to receive calibration sequence signals sent by the second receiving unit of each channel, and send each calibration sequence signal to the ATE test equipment through the signal interaction interface.

[0093] The calibration sequence signal transmitting unit is configured to receive the calibration sequence signal sent by the ATE test equipment through the signal interaction interface, and send the calibration sequence signal to the first receiving unit of each channel.

[0094] A signal delay unit is connected to a transmission unit of a channel and is configured to delay the phase of the signal transmitted by the transmission unit of that channel according to a phase adjustment signal.

[0095] A received signal delay unit is connected to a second receiving unit of a channel and is configured to delay the calibration sequence signal sent by the second receiving unit of the channel to the signal receiving sequence according to the phase adjustment signal.

[0096] Based on this, the ATE test equipment is also configured to send a phase adjustment signal to the output signal phase adjustment unit and / or the input signal phase adjustment unit in any channel, so as to instruct the output signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the first receiving unit of any channel, and / or to instruct the input signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the second receiving unit of any channel.

[0097] In other words, the ATE test equipment can perform phase adjustment by sending phase adjustment signals to the output signal phase adjustment units and input signal phase adjustment units of each channel. Figure 4 The steps of the method for phase adjustment of signal combinations are shown, as well as the execution of S104.

[0098] The phase adjustment control unit is configured to forward the phase adjustment signal sent by the ATE test equipment to the output signal phase adjustment unit and / or the input signal phase adjustment unit.

[0099] Based on the multi-channel signal delay calibration method provided in the above embodiments, this application further provides an ATE test device for implementing the above method embodiments. Please refer to [link to relevant documentation]. Figure 7 , Figure 7 This is a schematic diagram of the structure of an ATE testing device provided in an embodiment of this application. Figure 7 As shown, the ATE test equipment 70 may include: an acquisition unit 71, a partitioning unit 72, a phase adjustment unit 73, and a delay calibration unit 74. Wherein: The acquisition unit 71 is used to acquire the calibration sequence signals sent by at least two channels, and the calibration sequence signals sent by each channel are the same.

[0100] The division unit 72 is used to divide all calibration sequence signals into multiple signal combinations, each signal combination including a first calibration sequence signal and a second calibration sequence signal.

[0101] The phase adjustment unit 73 is used to perform phase adjustment for each signal combination by taking the first calibration sequence signal in the signal combination as the P-terminal differential signal and the second calibration sequence signal in the signal combination as the N-terminal differential signal, so as to determine the phase difference corresponding to the signal combination.

[0102] The delay calibration unit 74 is used to perform delay calibration on at least two channels of signals to be transmitted based on the phase difference corresponding to each signal combination.

[0103] Optionally, the phase adjustment unit 73 is specifically used for: Based on the first phase adjustment value, the P-terminal differential signal and the N-terminal differential signal in the signal combination are subjected to preliminary phase adjustment processing until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, thereby obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal. Based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, a second phase adjustment process is performed on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment process until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, thereby obtaining the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal; the first phase adjustment value is greater than the second phase adjustment value; The phase difference corresponding to the signal combination is determined based on the third and fourth current phase values.

[0104] Optionally, the phase adjustment unit 73 is specifically used for: Fix the phase of the P-terminal differential signal in the signal combination, and perform phase delay processing on the N-terminal differential signal in the signal combination up to M times with the first phase adjustment value; If a calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing; wherein, K is less than or equal to M; If the calibration sequence cannot be determined after the Mth phase delay process, the phase of the N-terminal differential signal in the signal combination is fixed, and the P-terminal differential signal in the signal combination is subjected to a maximum of M phase delay processes with the first phase adjustment value. If a calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing.

[0105] Optionally, the phase adjustment unit 73 is specifically used for: The phase of the P-terminal differential signal in the signal combination is fixed to the first current phase value, and the N-terminal differential signal in the signal combination is phase delayed according to the second current phase value as the initial value and the second phase adjustment value. If the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is larger than the first effective window, then the N-terminal differential signal continues to be phase delayed until the third effective window is the largest, and the first current phase value is determined as the third current phase value, and the phase value of the N-terminal differential signal at the current time is determined as the fourth current phase value. If the third effective window is smaller than the first effective window, the phase of the N-terminal differential signal in the signal combination is fixed to the second current phase value. The first current phase value is used as the initial value, and the phase delay processing of the P-terminal differential signal in the signal combination is performed according to the second phase adjustment value until the third effective window is maximized. The second current phase value is then determined as the fourth current phase value, and the phase value of the P-terminal differential signal at the current moment is determined as the third current phase value.

[0106] Optionally, the delay calibration unit 74 is specifically used for: Choose any one of at least two channels as the reference channel; For each of the at least two channels other than the reference channel, the phase difference between the other channel and the reference channel is determined based on the phase difference corresponding to each signal combination, and the signal to be transmitted in the other channel is delayed and calibrated based on the phase difference between the other channel and the reference channel.

[0107] It should be noted that the information interaction and execution process between the above-mentioned units are based on the same concept as the method embodiments of this application. Their specific functions and technical effects can be referred to the method embodiments section, and will not be repeated here.

[0108] Please see Figure 8 , Figure 8 This is a schematic diagram of the structure of an ATE testing device provided in another embodiment of this application. Figure 8As shown, the ATE test device 8 provided in this embodiment may include: a processor 80, a memory 81, and a computer program 82 stored in the memory 81 and executable on the processor 80, such as a program corresponding to a delay calibration method for multi-channel signals. When the processor 80 executes the computer program 82, it implements the steps described above in the embodiment of the delay calibration method for multi-channel signals, for example... Figure 2 S101~S104 and shown Figure 4 S201~S203 are shown. Alternatively, when processor 80 executes computer program 82, it implements the functions of each module / unit in the above-described ATE test equipment embodiment, for example... Figure 7 The functions of units 71-74 shown.

[0109] For example, the computer program 82 can be divided into one or more modules / units, one or more of which are stored in the memory 81 and executed by the processor 80 to complete this application. The one or more modules / units can be a series of computer program instruction segments capable of performing specific functions, which describe the execution process of the computer program 82 in the ATE test equipment 8. For example, the computer program 82 can be divided into an acquisition unit 71, a partitioning unit 72, a phase adjustment unit 73, and a delay calibration unit 74. For the specific functions of each unit, please refer to [link to relevant documentation]. Figure 7 The relevant descriptions in the corresponding embodiments are not repeated here.

[0110] Those skilled in the art will understand that Figure 8 This is merely an example of ATE test equipment 8 and does not constitute a limitation on ATE test equipment 8. It may include more or fewer components than shown, or combine certain components, or use different components.

[0111] The processor 80 can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor.

[0112] The memory 81 can be an internal storage unit of the ATE test equipment 8, such as a hard disk or RAM of the ATE test equipment 8. The memory 81 can also be an external storage device of the ATE test equipment 8, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, or flash card equipped on the ATE test equipment 8. Furthermore, the memory 81 can include both internal storage units and external storage devices of the ATE test equipment 8. The memory 81 is used to store computer programs and other programs and data required by the ATE test equipment. The memory 81 can also be used to temporarily store data that has been output or will be output.

[0113] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units is merely an example. In practical applications, the above functions can be assigned to different functional units as needed, that is, the internal structure of the ATE testing equipment can be divided into different functional units to complete all or part of the functions described above. The functional units in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0114] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps in the various method embodiments described above.

[0115] This application provides a computer program product that, when run on a terminal device, enables the terminal device to implement the steps described in the various method embodiments above.

[0116] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, refer to the relevant descriptions of other embodiments.

[0117] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0118] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A delay calibration method for multi-channel signals, characterized in that, include: Acquire calibration sequence signals sent by at least two channels, wherein the calibration sequence signals sent by each channel are identical; All the calibration sequence signals are divided into multiple signal combinations, and each signal combination includes a first calibration sequence signal and a second calibration sequence signal; For each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment, so as to determine the phase difference corresponding to the signal combination. Based on the phase difference corresponding to each of the signal combinations, delay calibration is performed on the signals to be transmitted in at least two channels.

2. The method according to claim 1, characterized in that, The step of using the first calibration sequence signal in the signal combination as the P-terminal differential signal and the second calibration sequence signal in the signal combination as the N-terminal differential signal for phase adjustment to determine the phase difference corresponding to the signal combination includes: Based on the first phase adjustment value, the P-terminal differential signal and the N-terminal differential signal in the signal combination are subjected to preliminary phase adjustment processing until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, thereby obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal. Based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, a second phase adjustment process is performed on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment process until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, thereby obtaining the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal; the first phase adjustment value is greater than the second phase adjustment value; The phase difference corresponding to the signal combination is determined based on the third current phase value and the fourth current phase value.

3. The method according to claim 2, characterized in that, The step of performing preliminary phase adjustment processing on the P-terminal differential signal and the N-terminal differential signal in the signal combination according to the first phase adjustment value, until the calibration sequence corresponding to the P-terminal differential signal and the N-terminal differential signal is determined, and obtaining the first current phase value of the P-terminal differential signal, the second current phase value of the N-terminal differential signal, and the first effective window corresponding to the P-terminal differential signal and the N-terminal differential signal, includes: The phase of the P-terminal differential signal in the signal combination is fixed, and the N-terminal differential signal in the signal combination is subjected to phase delay processing up to M times with the first phase adjustment value. If the calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing; wherein, K is less than or equal to M; If the calibration sequence cannot be determined after the Mth phase delay process, the phase of the N-terminal differential signal in the signal combination is fixed, and the P-terminal differential signal in the signal combination is subjected to a maximum of M phase delay processes with the first phase adjustment value. If the calibration sequence is determined after the Kth phase delay processing, then the first current phase value, the second current phase value, and the first effective window are determined based on the P-terminal differential signal and the N-terminal differential signal after the Kth phase delay processing.

4. The method according to claim 2, characterized in that, The step of performing a second phase adjustment process on the P-terminal differential signal and the N-terminal differential signal after the initial phase adjustment processing based on the second phase adjustment value, the first current phase value, the second current phase value, and the first effective window, until the second effective window corresponding to the P-terminal differential signal and the N-terminal differential signal is maximized, to obtain the third current phase value of the P-terminal differential signal and the fourth current phase value of the N-terminal differential signal, includes: The phase of the P-terminal differential signal in the signal combination is fixed to the first current phase value, and the N-terminal differential signal in the signal combination is phase delayed according to the second current phase value as the initial value and the second phase adjustment value. If the third effective window corresponding to the P-terminal differential signal and the N-terminal differential signal after phase delay processing in the signal combination is larger than the first effective window, then the N-terminal differential signal continues to be phase delayed until the third effective window is the largest, and the first current phase value is determined as the third current phase value, and the phase value of the N-terminal differential signal at the current moment is determined as the fourth current phase value. If the third effective window is smaller than the first effective window, the phase of the N-terminal differential signal in the signal combination is fixed to the second current phase value. The first current phase value is used as the initial value, and the phase delay processing of the P-terminal differential signal in the signal combination is performed according to the second phase adjustment value until the third effective window is maximized. The second current phase value is then determined as the fourth current phase value, and the phase value of the P-terminal differential signal at the current moment is determined as the third current phase value.

5. The method according to any one of claims 1 to 4, characterized in that, The step of performing delay calibration on the at least two channels of signals to be transmitted based on the phase difference corresponding to each of the signal combinations includes: Choose any one of the at least two channels as the reference channel; For each of the at least two channels other than the reference channel, the phase difference between the other channel and the reference channel is determined based on the phase difference corresponding to each signal combination, and the signal to be transmitted in the other channel is delayed and calibrated based on the phase difference between the other channel and the reference channel.

6. A delay calibration system for multi-channel signals, characterized in that, The system includes ATE testing equipment; The ATE test equipment is configured as follows: Acquire calibration sequence signals sent by at least two channels, wherein the calibration sequence signals sent by each channel are identical; All the calibration sequence signals are divided into multiple signal combinations, and each signal combination includes a first calibration sequence signal and a second calibration sequence signal; For each signal combination, the first calibration sequence signal in the signal combination is used as the P-terminal differential signal, and the second calibration sequence signal in the signal combination is used as the N-terminal differential signal for phase adjustment, so as to determine the phase difference corresponding to the signal combination. Based on the phase difference corresponding to each of the signal combinations, delay calibration is performed on the signals to be transmitted in at least two channels.

7. The system according to claim 6, characterized in that, The system further includes a calibration sequence signal transmission unit; each of the at least two channels includes a transmission unit, a first receiving unit, and a second receiving unit. The calibration sequence signal transmitting unit is configured to transmit the calibration sequence signal to the first receiving unit of each of the channels respectively; The first receiving unit of any channel is configured to receive the calibration sequence signal and send the calibration sequence signal to the sending unit of the arbitrary channel; The transmitting unit of the arbitrary channel is configured to transmit the calibration sequence signal to the second receiving unit of the arbitrary channel and the second receiving unit of another channel; The second receiving unit of the arbitrary channel is configured to receive the calibration sequence signal transmitted by the transmitting unit of the arbitrary channel and the calibration sequence signal transmitted by another channel.

8. The system according to claim 7, characterized in that, The ATE test equipment is specifically configured as follows: The two calibration sequence signals received by the second receiving unit of each channel are divided into a signal combination.

9. The system according to claim 7 or 8, characterized in that, Each of the channels further includes an output signal phase adjustment unit and an input signal phase adjustment unit; The ATE test equipment is configured to send a phase adjustment signal to the output signal phase adjustment unit and / or the input signal phase adjustment unit in any channel, to instruct the output signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the first receiving unit of the arbitrary channel, and / or to instruct the input signal phase adjustment unit to perform phase adjustment on the calibration sequence signal received by the second receiving unit of the arbitrary channel.

10. An ATE testing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements each step of the delay calibration method for multi-channel signals as described in any one of claims 1 to 5.

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