Production test tool method and system of OS test circuit board, storage medium and electronic equipment
By implementing a test scheme that automates the control of FPGA modules and relay switch matrices, the problem of low efficiency in repeatable checks in integrated circuit test systems has been solved, enabling efficient fault location and channel detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-20
- Publication Date
- 2026-04-17
AI Technical Summary
In existing integrated circuit testing systems, each circuit on an Open/Short test board requires repetitive checks, leading to inefficiency during production and maintenance and making it impossible to effectively verify unused test channels.
An automated testing scheme is adopted, which uses host computer software to control the FPGA module and relay switch matrix to automatically switch the test channel status, and uses a multi-function multimeter and frequency meter to detect parameters such as resistance, voltage and current, so as to achieve fully automatic fault location.
It improved testing efficiency, reduced repetitive manual operations, accurately located fault channels, and improved production and maintenance efficiency.
Smart Images
Figure CN121878426A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of integrated circuit testing technology, and in particular to a method, system, storage medium, and electronic device for manufacturing and testing a chip OS (Open / Short) test circuit board. Background Technology
[0002] Currently, in the hardware production process of integrated circuit testing systems, the Open / Short test boards used employ identical, multi-channel repetitive test circuits to test open / short circuit parameters, leakage current parameters, and functional parameters. These circuits have identical structures and designs. By switching analog switches, the pins of the chip under test are connected to the test channels used by the test board. Each channel can test the chip's open / short circuit parameters, leakage current parameters, and functional parameters. During the production and repair of test boards, it is necessary to test whether each test circuit is working properly. Since there are hundreds of such repetitive circuits in the test board, a significant amount of time is spent on repetitive checks during production and repair to verify whether each circuit is working properly. This can be done by detecting all output test channels through output excitation signals, receiving input signals from each test channel, or verifying the required test channels by actually testing a good chip. However, this method cannot verify unused test channels. Summary of the Invention
[0003] The purpose of this invention is to provide a method, system, storage medium, and electronic device for manufacturing and testing chip OS test circuit boards, which can solve the problem of low efficiency caused by manually repeating tests on each test channel circuit.
[0004] The technical solution adopted in this invention is as follows: A method for manufacturing and testing a test fixture for an OS test circuit board includes the following steps: S1. Initialize the Open / Short test circuit board detection environment. The host computer test program checks whether the Open / Short test circuit board to be tested, the test fixture circuit board, the digital programmable power supply, the signal source / frequency meter and the multi-function multimeter exist and can work normally. If they exist and can work normally, proceed to the next step. Otherwise, this step needs to be repeated after installation and debugging. S2, Test whether the output channel of the digital I / O channel of the circuit channel is open-circuited or faulty; S2.1, the host computer test program sends control commands to the Open / Short test board through the USB communication interface of the Open / Short test board under test. S2.2, the FPGA control module in the Open / Short test circuit board parses the received control commands, sets the digital I / O channels of the Open / Short test circuit board to output mode, switches the analog switch, and closes the digital I / O input channels. S2.3 Set the signal level of the output channel of the Open / Short test circuit board to high, with a signal level of 1.7V; use an external multimeter to check whether the output signal of the Open / Short test circuit board under test is high. S2.4, Set the signal level of the output channel of the Open / Short test board. If the signal is low, the signal level is 1.7V. Use an external multimeter to check whether the output signal of the Open / Short test board under test is low. If the test result is inconsistent with the setting, it indicates that there is a fault in the output channel. If they are consistent, proceed to the next test. S2.5, Repeat test steps S2.1-S2.4 until all circuit channels are tested; S3: Input path test of the I / O channel of the Open / Short test board under test: Use an instantiated signal frequency acquisition module inside the FPGA of the test board to calculate the frequency corresponding to the input channel, and then determine whether the input channel under test is working properly; S4: Perform grounding detection on the grounding channel circuit of the Open / Short test board to be tested: S4.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands and sets its path to ground mode. At this time, the channel circuit of the Open / Short test board under test is connected to the ground plane, and the resistance to ground is less than 5Ω. S4.2, The host computer sets the multimeter to work in resistance test mode via USB HUB; S4.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays in turn, and connects the output channel of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S4.4, The host computer program reads back the test results. If the signal is higher than 5Ω, it is determined that there is a fault in the channel when it is in a grounding state. S4.5, Repeat test steps S4.1-S4.4 until all circuit channels of the Open / Short test boards to be tested are completed.
[0005] It also includes step S5, which performs open-circuit detection on the open-circuit channel circuit of the Open / Short test board to be tested: S5.1, through the USB communication interface of the Open / Short test board, a control command is sent. The FPGA in the test board parses the received control command and sets the channel circuit of the Open / Short test board to open circuit mode. At this time, the channel circuit of the Open / Short test board is in open circuit state and the resistance to ground is greater than 100k. S5.2, the host computer sets the multimeter to work in resistance test mode via USB HUB; S5.3, the host computer sends control commands to the test fixture circuit board via USB HUB. The control module on the test fixture circuit board parses the received control commands, switches relays in turn, and connects the output channel of the channel circuit of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S5.4, the host computer program reads back the test results. If the resistance to ground is less than 100k, it is determined that there is a fault in the channel when it is in an open circuit state. S5.5, Repeat test steps S5.1-S5.4 until all circuit channels of the Open / Short test boards to be tested are completed.
[0006] It also includes step S6, which involves detecting the DC parameter test channels of the Open / Short test board to be tested: S6.1, through the USB communication interface of the Open / Short test board, send control commands. The FPGA in the test board parses the received control commands and sets the test path to DC test channel mode. At this time, the DC test channel is connected to the test fixture board. S6.2, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, outputs control signals, switches relays in turn, and connects the excitation acquisition terminal of the DC test chip AD5522 with the 10k, 5R load resistor to form the channel through the relay switch matrix. S6.3, The host computer program reads back the test results from AD5522. If the voltage or current of the result exceeds the judgment value, it is determined that there is a fault in the DC test channel. S6.4, Repeat test steps S6.1-S6.3 until all circuit channels are tested.
[0007] Step S3 specifically includes the following steps: S3.1, Send control commands through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands, sets the input path of the Open / Short test board to input mode, and collects the signal frequency of the received channel. S3.2, The host computer sets the frequency meter / signal source to work in square wave signal generation mode via USB HUB. The input path of each Open / Short test board under test corresponds to its own inherent frequency. The frequency step of each channel is 10Hz, and the starting frequency is 100Hz. S3.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the input path and signal source of the Open / Short test circuit board under test. The input path of the Open / Short test circuit board under test receives the input square wave signal. The S3.4 host computer program reads back the frequency test results in the FPGA test program of the circuit board under test, compares them with the output frequency set by the signal source board, and if the error between the two exceeds the range, it is determined that there is a fault in the input path of the Open / Short test circuit board under test in that channel. S3.5, Repeat test steps S3.1-S3.4 until all input paths of the Open / Short test boards to be tested are completed.
[0008] In step S2, when there is a short circuit between the output channels of the Open / Short test circuit board under test, the circuit abnormality cannot be detected by signal level detection alone. In this case, the frequency associated with each output channel can be used to detect whether the output channel is working properly and whether it is short-circuited with other paths. Specifically, the steps are as follows: S2.1.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA control module in the test board parses the received control commands, sets the output of the Open / Short test board to output mode, sets the starting frequency to 100Hz, generates a square wave signal in 10Hz steps, and the signal level is 1.8V. S2.1.2, The host computer sets the frequency meter / signal source to work in frequency test mode via USB HUB; S2.1.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the output circuit and frequency meter of the Open / Short test circuit board under test. The output circuit of the Open / Short test circuit board under test outputs a square wave signal. S2.1.4, In the FPGA of the circuit board under test, different frequency square wave signals are output through the output gate of different Open / Short test circuit boards. S2.1.5, The host computer program reads back the frequency weighing test results and compares them with the output frequency set by the board under test. If the error between the two exceeds the range, it is determined that there is a fault in the output circuit of the Open / Short test board under test. S2.1.6, Repeat test steps S2.1.1-S2.1.5 until all output channels of the Open / Short test boards to be tested are completed.
[0009] A production test fixture system for Open / Short test circuit boards includes: a test fixture circuit board, an interface conversion adapter daughterboard, a USB hub, a digital programmable power supply, a multi-function multimeter, a frequency counter / signal source, and host computer control software. The test fixture circuit board is connected to the Open / Short test circuit board under test via an interface conversion adapter board, i.e., a high-density CPCI interface. Control commands are transmitted from the host computer to the FPGA control module within the test fixture circuit board. The module outputs relay control signals to the test fixture circuit board as needed. Each circuit of the Open / Short test circuit board to be tested is connected to a multi-function multimeter. When the multimeter is connected in series with a channel, it can test the grounding and open-circuit resistance of each channel. When the multimeter is connected in parallel across a 10k load, a 1.8V high-level output from the channel indicates a fault in the output channel. This allows for the determination of whether each channel of the circuit board under test is functioning correctly. The USB hub is used to connect the host computer, the Open / Short test circuit board to be tested, the digital programmable power supply, and the test fixture board. The host computer controls the functions of the multi-function multimeter through the test software, and can switch the multimeter test items to voltage or resistance test modes; it can also control the programmable power supply, control the output voltage and current of the power supply, and can read back the actual output power of the digital programmable power supply. The multi-function multimeter controls the output signal voltage and grounding resistance of the test circuit via a remote control interface; the digital programmable power supply powers the circuit board under test and the test fixture board. Since the test fixture circuit board needs to be compatible with open / short test circuit boards with various interfaces, the switch matrix circuit board is designed with a fixed interface form, and the interface conversion sub-board is used to adapt to open / short test circuit boards with different functional forms. The interface conversion board connects multiple output signals of the Open / Short test circuit board under test to the input interface of the test fixture circuit board in parallel. At this time, each relay input signal in the switch matrix circuit board corresponds to the channel of the corresponding Open / Short test circuit board under test. The Open / Short test board under test has multiple identical circuit structures. The normal operation of the circuit channel is determined by judging the voltage, signal frequency, and open / ground resistance when the channel circuit is working normally.
[0010] The host computer control software controls the test fixture circuit board, USB hub, digital programmable power supply, and Open / Short test circuit board under test through the host's USB interface. It also controls the multi-function multimeter through the GPIB interface, loads the test program for the Open / Short test circuit board under test, loads the test program for the test fixture circuit board, and records the test results.
[0011] The DC parameter test channel uses the AD5522 test chip.
[0012] A computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, the device on which the computer-readable storage medium is located executes the production and testing tooling method for the OS test circuit board.
[0013] An electronic device includes a memory and a processor, wherein the memory stores a program executable on the processor, and the processor executes the program to implement the production and testing tooling method for the OS test circuit board. This invention addresses the issue of identical circuit structures in existing circuits. It employs a hardware foundation consisting of a test circuit board for the chip under test (OS), test firmware, test instruments, and test fixtures. A host computer software handles test scheduling and result evaluation, enabling a fully automated and accurate test scheme for locating faulty test channels. The host computer software programs and polls the circuit channels on the OS test circuit board to set them to different operating states. It also programs and switches relay switches on the test fixtures, adjusting the load and test instruments according to the different circuit channel states and test requirements. This creates a test environment for the circuit channels under test. By reading back the instrument test data, the host computer software accurately locates the faulty channel, avoiding the need for manual connection of instruments and load matching, and performing tests on each of the repetitive circuit channels on the test board. Attached Figure Description
[0014] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0015] Figure 1 This is a schematic diagram of the system described in this invention; Figure 2 This is a schematic block diagram of the Open / Short test circuit board to be tested according to the present invention; Figure 3 This is a schematic block diagram of the test fixture circuit board described in this invention; Figure 4 This is a schematic diagram of the grounding channel test described in this invention; Figure 5 This is a schematic diagram of the open-circuit channel test described in this invention; Figure 6 This is a schematic diagram of the digital I / O output channel test described in this invention; Figure 7 This is a schematic diagram of the digital I / O input channel test according to the present invention; Figure 8 This is a schematic diagram of the DC parameter channel test described in this invention. Detailed Implementation
[0016] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0017] like Figure 1 , 2 As shown in Figures 3 and 6, the present invention includes the following steps: S1. Initialize the Open / Short test circuit board detection environment. The host computer test program checks whether the Open / Short test circuit board to be tested, the test fixture circuit board, the digital programmable power supply, the signal source / frequency meter and the multi-function multimeter exist and can work normally. If they exist and can work normally, proceed to the next step. Otherwise, this step needs to be repeated after installation and debugging. S2, Test whether the output channel of the digital I / O channel of the circuit channel is open-circuited or faulty; S2.1, the host computer test program sends control commands to the Open / Short test board through the USB communication interface of the Open / Short test board under test. S2.2, the FPGA control module in the Open / Short test circuit board parses the received control commands, sets the digital I / O channels of the Open / Short test circuit board to output mode, switches the analog switch, and closes the digital I / O input channels. S2.3 Set the signal level of the output channel of the Open / Short test circuit board to high, with a signal level of 1.7V; use an external multimeter to check whether the output signal of the Open / Short test circuit board under test is high. S2.4, Set the signal level of the output channel of the Open / Short test board. If the signal is low, the signal level is 1.7V. Use an external multimeter to check whether the output signal of the Open / Short test board under test is low. If the test result is inconsistent with the setting, it indicates that there is a fault in the output channel. If they are consistent, proceed to the next test. S2.5, Repeat test steps S2.1-S2.4 until all circuit channels are tested; S3: Input path test of the I / O channel of the Open / Short test board under test: Use an instantiated signal frequency acquisition module inside the FPGA of the test board to calculate the frequency corresponding to the input channel, and then determine whether the input channel under test is working properly; S4: Perform grounding detection on the grounding channel circuit of the Open / Short test board to be tested: S4.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands and sets its path to ground mode. At this time, the channel circuit of the Open / Short test board under test is connected to the ground plane, and the resistance to ground is less than 5Ω. S4.2, The host computer sets the multimeter to work in resistance test mode via USB HUB; S4.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays in turn, and connects the output channel of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S4.4, The host computer program reads back the test results. If the signal is higher than 5Ω, it is determined that there is a fault in the channel when it is in a grounding state. S4.5, Repeat test steps S4.1-S4.4 until all circuit channels of the Open / Short test boards to be tested are completed.
[0018] It also includes step S5, which performs open-circuit detection on the open-circuit channel circuit of the Open / Short test board to be tested: S5.1, through the USB communication interface of the Open / Short test board, a control command is sent. The FPGA in the test board parses the received control command and sets the channel circuit of the Open / Short test board to open circuit mode. At this time, the channel circuit of the Open / Short test board is in open circuit state and the resistance to ground is greater than 100k. S5.2, the host computer sets the multimeter to work in resistance test mode via USB HUB; S5.3, the host computer sends control commands to the test fixture circuit board via USB HUB. The control module on the test fixture circuit board parses the received control commands, switches relays in turn, and connects the output channel of the channel circuit of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S5.4, the host computer program reads back the test results. If the resistance to ground is less than 100k, it is determined that there is a fault in the channel when it is in an open circuit state. S5.5, Repeat test steps S5.1-S5.4 until all circuit channels of the Open / Short test boards to be tested are completed.
[0019] It also includes step S6, which involves detecting the DC parameter test channels of the Open / Short test board to be tested: S6.1, through the USB communication interface of the Open / Short test board, send control commands. The FPGA in the test board parses the received control commands and sets the test path to DC test channel mode. At this time, the DC test channel is connected to the test fixture board. S6.2, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, outputs control signals, switches relays in turn, and connects the excitation acquisition terminal of the DC test chip AD5522 with the 10k, 5R load resistor to form the channel through the relay switch matrix. S6.3, The host computer program reads back the test results from AD5522. If the voltage or current of the result exceeds the judgment value, it is determined that there is a fault in the DC test channel. S6.4, Repeat test steps S6.1-S6.3 until all circuit channels are tested.
[0020] Step S3 specifically includes the following steps: S3.1, Send control commands through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands, sets the input path of the Open / Short test board to input mode, and collects the signal frequency of the received channel. S3.2, The host computer sets the frequency meter / signal source to work in square wave signal generation mode via USB HUB. The input path of each Open / Short test board under test corresponds to its own inherent frequency. The frequency step of each channel is 10Hz, and the starting frequency is 100Hz. S3.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the input path and signal source of the Open / Short test circuit board under test. The input path of the Open / Short test circuit board under test receives the input square wave signal. The S3.4 host computer program reads back the frequency test results in the FPGA test program of the circuit board under test, compares them with the output frequency set by the signal source board, and if the error between the two exceeds the range, it is determined that there is a fault in the input path of the Open / Short test circuit board under test in that channel. S3.5, Repeat test steps S3.1-S3.4 until all input paths of the Open / Short test boards to be tested are completed.
[0021] In step S2, when there is a short circuit between the output channels of the Open / Short test circuit board under test, the circuit abnormality cannot be detected by signal level detection alone. In this case, the frequency associated with each output channel can be used to detect whether the output channel is working properly and whether it is short-circuited with other paths. Specifically, the steps are as follows: S2.1.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA control module in the test board parses the received control commands, sets the output of the Open / Short test board to output mode, sets the starting frequency to 100Hz, generates a square wave signal in 10Hz steps, and the signal level is 1.8V. S2.1.2, The host computer sets the frequency meter / signal source to work in frequency test mode via USB HUB; S2.1.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the output circuit and frequency meter of the Open / Short test circuit board under test. The output circuit of the Open / Short test circuit board under test outputs a square wave signal. S2.1.4, In the FPGA of the circuit board under test, different frequency square wave signals are output through the output gate of different Open / Short test circuit boards. S2.1.5, The host computer program reads back the frequency weighing test results and compares them with the output frequency set by the board under test. If the error between the two exceeds the range, it is determined that there is a fault in the output circuit of the Open / Short test board under test. S2.1.6, Repeat test steps S2.1.1-S2.1.5 until all output channels of the Open / Short test boards to be tested are completed.
[0022] Existing open / short tests, leakage current parameter tests, and functional parameter tests for chips involve connecting the pins of the chip under test to the ground, open circuit, and digital I / O interfaces of the test circuit board. The open / short test circuit board has four types of test resources: ground, open circuit, DC parameter tests (voltage applied current measurement, current applied voltage measurement), and digital I / O. The digital I / O is divided into input and output channels. Therefore, it is necessary to verify whether the ground, open circuit, DC parameter test, and digital I / O port channel connections on the test circuit board are normal. This invention uses a multi-channel analog switch on the FPGA control board of the Open / Short test circuit board to set the test channel to ground, open circuit, DC, and digital I / O states. The FPGA in the test fixture circuit board controls the relay switch on the fixture circuit board to connect the test channel to the test instrument. The host computer software controls the test instrument to test the resistance, voltage, current, and characteristic frequency of the channel of the Open / Short test circuit board, and reads back the test results to determine whether the channel is working properly. It also accurately locates the specific circuit of the channel as ground, open circuit, voltage-current measurement, current-voltage measurement, and digital I / O path, which facilitates maintenance and debugging. A production test fixture system for Open / Short test circuit boards includes: a test fixture circuit board, an interface conversion adapter daughterboard, a USB hub, a digital programmable power supply, a multi-function multimeter, a frequency counter / signal source, and host computer control software. The test fixture circuit board is connected to the Open / Short test circuit board under test via an interface conversion adapter board, i.e., a high-density CPCI interface. Control commands are transmitted from the host computer to the FPGA control module within the test fixture circuit board. The module outputs relay control signals to the test fixture circuit board as needed. Each circuit of the Open / Short test circuit board to be tested is connected to a multi-function multimeter. When the multimeter is connected in series with a channel, it can test the grounding and open-circuit resistance of each channel. When the multimeter is connected in parallel across a 10k load, a 1.8V high-level output from the channel indicates a fault in the output channel. This allows for the determination of whether each channel of the circuit board under test is functioning correctly. The USB hub is used to connect the host computer, the Open / Short test circuit board to be tested, the digital programmable power supply, and the test fixture board. The host computer controls the functions of the multi-function multimeter through the test software, and can switch the multimeter test items to voltage or resistance test modes; it can also control the programmable power supply, control the output voltage and current of the power supply, and can read back the actual output power of the digital programmable power supply. The multi-function multimeter controls the output signal voltage and grounding resistance of the test circuit via a remote control interface; the digital programmable power supply powers the circuit board under test and the test fixture board. Since the test fixture circuit board needs to be compatible with various interface types of Open / Short test circuit boards, the switch matrix circuit board is designed with a fixed interface type, and the interface conversion sub-board is used to adapt to Open / Short test circuit boards with different functional types. The interface conversion board connects multiple output signals of the Open / Short test circuit board under test to the input interface of the test fixture circuit board in parallel. At this time, each relay input signal in the switch matrix circuit board corresponds to the channel of the corresponding Open / Short test circuit board under test. The Open / Short test board under test has multiple identical circuit structures. The normal operation of the circuit channel is determined by judging the voltage, signal frequency, and open / ground resistance when the channel circuit is working normally.
[0023] The host computer control software controls the test fixture circuit board, USB hub, digital programmable power supply, and Open / Short test circuit board under test through the host's USB interface. It also controls the multi-function multimeter through the GPIB interface, loads the test program for the Open / Short test circuit board under test, loads the test program for the test fixture circuit board, and records the test results.
[0024] The DC parameter test channel uses the AD5522 test chip.
[0025] The test fixture circuit board of this application connects the DC test circuit on the Open / Short test circuit board to the load resistor through on-board relay switching. The test program reads back the core AD5522 chip of the DC test module to determine whether the DC parameter test circuit is working properly.
[0026] The test fixture circuit board connects the digital I / O channels on the Open / Short test circuit board to be tested to the signal source and frequency meter via relay switching. The digital output circuit is judged to be working normally by outputting a characteristic frequency signal to the frequency meter. The digital input circuit of the Open / Short test circuit board is judged to be working normally by measuring the input characteristic frequency of the signal source through the test program.
[0027] The USB hub connects the host computer, the Open / Short test circuit board under test, the digital programmable power supply, and the test fixture circuit board. The host computer uses test software to control the multimeter's functions, switching it to voltage or resistance testing modes. It also controls the programmable power supply, regulating its output voltage and current, and can read back the actual output power. The multimeter uses a remote control interface to control the output signal voltage and grounding resistance of the test circuits. The digital programmable power supply powers the circuit board under test and the test fixture circuit board.
[0028] Since the test fixture circuit board needs to be compatible with Open / Short test circuit boards with various interfaces, the switch matrix circuit board is designed with a fixed interface form, and the interface conversion daughterboard is used to adapt to Open / Short test circuit boards with different functional forms.
[0029] The conversion daughterboard connects the multiple channels of the Open / Short test board to the interface of the test fixture circuit board in parallel. At this time, each relay input signal in the switch matrix circuit board corresponds to the channel of the Open / Short test board to be tested.
[0030] The host computer control software controls the test fixture circuit board, USB hub, digital programmable power supply, and Open / Short test circuit board under test through the host's USB interface. It also controls the multi-function multimeter through the GPIB interface, loads the test program for the Open / Short test circuit board under test, loads the test program for the test fixture circuit board, and records the test results.
[0031] Specifically, such as Figure 3As shown, when test channel 1 is in the grounded working state, firstly, the multiplexer on the FPGA control board of the Open / Short board sets channel 1 to ground. Then, the control 1 signal on the test fixture board controls the relay 1 to connect the signal input 1 (channel 1) to the positive terminal of the multimeter, and the negative terminal is grounded. At this time, the multimeter can test the resistance of channel 1 to ground.
[0032] like Figure 3 As shown, when test channel 1 is in DC parameter testing mode, the multiplexer on the FPGA control board of the Open / Short board first connects channel 1 to the excitation acquisition terminal of the DC test chip AD5522. Then, the control signal 1 on the test fixture board controls relay 1 to turn on signal input 1 (channel 1). Test control signal 1 controls test relay 1 to turn on the load resistor 5R. Test control signal 2 controls test relay 2 to turn on the load resistor 10k. AD5522 reads the current and voltage on the load resistor through the voltage-current measurement and current-voltage measurement modes to determine whether there is a fault in the DC test channel.
[0033] The Open / Short test board under test has multiple identical circuit structures. The normal operation of the circuit channel can be determined by judging the voltage, signal frequency, and open / ground resistance when the channel circuit is working normally.
[0034] A computer-readable storage medium stores a computer program thereon. When executed by a processor, the computer program causes the device containing the computer-readable storage medium to perform the production and testing tooling method for an OS test circuit board as described above. The computer program includes computer program code, which may be in the form of source code, object code, executable file, or some intermediate form. The computer-readable medium may include any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), random access memory, and other memories.
[0035] An electronic device includes a memory and a processor, wherein the memory stores a program executable on the processor, and the processor executes the program to implement the production test fixture method for an OS test circuit board as described above.
[0036] If the modules / units integrated in the electronic device described in this application are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can also be implemented by a computer program instructing related hardware devices. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above.
[0037] Furthermore, the computer-readable storage medium may primarily include a stored program area and a stored data area, wherein the stored program area may store the operating system, an application program required for at least one function, etc.; and the stored data area may store data created based on the use of blockchain nodes, etc.
[0038] The computer-readable storage medium stores computer-readable instructions, which are executed by a processor in an electronic device to implement the production and testing tooling method for the OS test circuit board described in any of the above embodiments.
[0039] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules is only a logical functional division, and other division methods may be used in actual implementation.
[0040] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0041] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
[0042] It should be noted that the terms "comprising" and "having" and any variations thereof in the specification and claims of this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such process, method, product, or device.
[0043] Note that the above description is merely a preferred embodiment and application of the technical principles of the present invention. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the specific embodiments described herein, and may include many other effective embodiments without departing from the concept of the present invention. The scope of the present invention is determined by the scope of the appended claims.
Claims
1. A method for manufacturing and testing a test circuit board for OS, characterized in that: Includes the following steps: S1. Initialize the Open / Short test circuit board detection environment. The host computer test program checks whether the Open / Short test circuit board to be tested, the test fixture circuit board, the digital programmable power supply, the signal source / frequency meter and the multi-function multimeter exist and can work normally. If they exist and can work normally, proceed to the next step. Otherwise, this step needs to be repeated after installation and debugging. S2, Test whether the output channel of the digital IO channel of the circuit channel is open-circuited or faulty; S2.1, the host computer test program sends control commands to the Open / Short test circuit board through the USB communication interface of the Open / Short test circuit board under test. S2.2, the FPGA control module in the Open / Short test circuit board parses the received control commands, sets the digital I / O channels of the Open / Short test circuit board to output mode, switches the analog switch, and closes the digital I / O input channels. S2.3 Set the signal level of the output channel of the Open / Short test circuit board to high, with a signal level of 1.7V; use an external multimeter to check whether the output signal of the Open / Short test circuit board under test is high. S2.4, Set the signal level of the output channel of the Open / Short test board. If the signal is low, the signal level is 1.7V. Use an external multimeter to check whether the output signal of the Open / Short test board under test is low. If the test result is inconsistent with the setting, it indicates that there is a fault in the output channel. If they are consistent, proceed to the next test. S2.5, Repeat test steps S2.1-S2.4 until all circuit channels are tested; S3: Input path test of the IO channel of the Open / Short test board under test: Use an instantiated signal frequency acquisition module inside the FPGA of the test board to calculate the frequency corresponding to the input channel, and then determine whether the input channel under test is working properly. S4: Perform grounding detection on the grounding channel circuit of the Open / Short test board to be tested: S4.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands and sets its path to ground mode. At this time, the channel circuit of the Open / Short test board under test is connected to the ground plane, and the resistance to ground is less than 5Ω. S4.2, The host computer sets the multimeter to work in resistance test mode via USB HUB; S4.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays in turn, and connects the output channel of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S4.4, The host computer program reads back the test results. If the signal is higher than 5Ω, it is determined that there is a fault in the channel when it is in a grounding state. S4.5, Repeat test steps S4.1-S4.4 until all circuit channels of the Open / Short test boards to be tested are completed.
2. The method for manufacturing and testing OS test circuit boards according to claim 1, characterized in that: It also includes step S5, which performs open-circuit detection on the open-circuit channel circuit of the Open / Short test board to be tested: S5.1, through the USB communication interface of the Open / Short test board, a control command is sent. The FPGA in the test board parses the received control command and sets the channel circuit of the Open / Short test board to open circuit mode. At this time, the channel circuit of the Open / Short test board is in open circuit state and the resistance to ground is greater than 100k. S5.2, the host computer sets the multimeter to work in resistance test mode via USB HUB; S5.3, the host computer sends control commands to the test fixture circuit board via USB HUB. The control module on the test fixture circuit board parses the received control commands, switches relays in turn, and connects the output channel of the channel circuit of the Open / Short test circuit board under test and the multimeter, forming the channel through the relay switch matrix. S5.4, the host computer program reads back the test results. If the resistance to ground is less than 100k, it is determined that there is a fault in the channel when it is in an open circuit state. S5.5, Repeat test steps S5.1-S5.4 until all circuit channels of the Open / Short test boards to be tested are completed.
3. The method for manufacturing and testing OS test circuit boards according to claim 1, characterized in that: It also includes step S6, which involves detecting the DC parameter test channels of the Open / Short test board to be tested: S6.1, through the USB communication interface of the Open / Short test board, send control commands. The FPGA in the test board parses the received control commands and sets the test path to DC test channel mode. At this time, the DC test channel is connected to the test fixture board. S6.2, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, outputs control signals, switches relays in turn, and connects the excitation acquisition terminal of the DC test chip AD5522 with the 10k, 5R load resistor to form the channel through the relay switch matrix. S6.3, The host computer program reads back the test results from AD5522. If the voltage or current of the result exceeds the judgment value, it is determined that there is a fault in the DC test channel. S6.4, Repeat test steps S6.1-S6.3 until all circuit channels are tested.
4. The method for manufacturing and testing OS test circuit boards according to claim 1, characterized in that: Step S3 specifically includes the following steps: S3.1, Send control commands through the USB communication interface of the Open / Short test board. The FPGA in the test board parses the received control commands, sets the input path of the Open / Short test board to input mode, and collects the signal frequency of the received channel. S3.2, The host computer sets the frequency meter / signal source to work in square wave signal generation mode via USB HUB. The input path of each Open / Short test board under test corresponds to its own inherent frequency. The frequency step of each channel is 10Hz, and the starting frequency is 100Hz. S3.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the input path and signal source of the Open / Short test circuit board under test. The input path of the Open / Short test circuit board under test receives the input square wave signal. The S3.4 host computer program reads back the frequency test results in the FPGA test program of the circuit board under test, compares them with the output frequency set by the signal source board, and if the error between the two exceeds the range, it is determined that there is a fault in the input path of the Open / Short test circuit board under test in that channel. S3.5, Repeat test steps S3.1-S3.4 until all input paths of the Open / Short test boards to be tested are completed.
5. The method for manufacturing and testing OS test circuit boards according to claim 1, characterized in that: In step S2, when there is a short circuit between the output channels of the Open / Short test circuit board under test, the circuit abnormality cannot be detected by signal level detection alone. In this case, the frequency associated with each output channel can be used to detect whether the output channel is working properly and whether it is short-circuited with other paths. Specifically, the steps are as follows: S2.1.1, control commands are sent through the USB communication interface of the Open / Short test board. The FPGA control module in the test board parses the received control commands, sets the output of the Open / Short test board to output mode, sets the starting frequency to 100Hz, generates a square wave signal in 10Hz steps, and the signal level is 1.8V. S2.1.2, The host computer sets the frequency meter / signal source to work in frequency test mode via USB HUB; S2.1.3, the host computer sends control commands to the test fixture circuit board via the USB HUB. The control module on the test fixture circuit board parses the received control commands, switches the relays, and connects the output circuit and frequency meter of the Open / Short test circuit board under test. The output circuit of the Open / Short test circuit board under test outputs a square wave signal. S2.1.4, In the FPGA of the circuit board under test, different frequency square wave signals are output through the output gate of different Open / Short test circuit boards. S2.1.5, The host computer program reads back the frequency weighing test results and compares them with the output frequency set by the board under test. If the error between the two exceeds the range, it is determined that there is a fault in the output circuit of the Open / Short test board under test. S2.1.6, Repeat test steps S2.1.1-S2.1.5 until all output channels of the Open / Short test boards to be tested are completed.
6. A production testing fixture system for Open / Short test circuit boards, characterized in that: include: Test fixtures include circuit boards, interface conversion adapter boards, USB hubs, digital programmable power supplies, multi-function multimeters, frequency counters / signal generators, and host computer control software. The test fixture circuit board is connected to the Open / Short test circuit board under test via an interface conversion adapter board, i.e., a high-density CPCI interface. Control commands are transmitted from the host computer to the FPGA control module within the test fixture circuit board. The module outputs relay control signals to the test fixture circuit board as needed. Each circuit of the Open / Short test circuit board to be tested is connected to a multi-function multimeter. When the multimeter is connected in series with a channel, it can test the grounding and open-circuit resistance of each channel. When the multimeter is connected in parallel across a 10k load, a 1.8V high-level output from the channel indicates a fault in the output channel. This allows for the determination of whether each channel of the circuit board under test is functioning correctly. The USB hub is used to connect the host computer, the Open / Short test circuit board to be tested, the digital programmable power supply, and the test fixture board. The host computer controls the functions of the multi-function multimeter through the test software, and can switch the multimeter test items to voltage or resistance test modes; it can also control the programmable power supply, control the output voltage and current of the power supply, and can read back the actual output power of the digital programmable power supply. The multi-function multimeter controls the output signal voltage and grounding resistance of the test circuit via a remote control interface; the digital programmable power supply powers the circuit board under test and the test fixture board. Since the test fixture circuit board needs to be compatible with open / short test circuit boards with various interfaces, the switch matrix circuit board is designed with a fixed interface form, and the interface conversion sub-board is used to adapt to open / short test circuit boards with different functional forms. The interface conversion board connects multiple output signals of the Open / Short test circuit board under test to the input interface of the test fixture circuit board in parallel. At this time, each relay input signal in the switch matrix circuit board corresponds to the channel of the corresponding Open / Short test circuit board under test. The Open / Short test board under test has multiple identical circuit structures. The normal operation of the circuit channel is determined by judging the voltage, signal frequency, and open / ground resistance when the channel circuit is working normally.
7. The production and testing fixture system for Open / Short test circuit boards according to claim 6, characterized in that: The host computer control software controls the test fixture circuit board, USB hub, digital programmable power supply, and Open / Short test circuit board under test through the host's USB interface. It also controls the multi-function multimeter through the GPIB interface, loads the test program for the Open / Short test circuit board under test, loads the test program for the test fixture circuit board, and records the test results.
8. The production and testing fixture system for Open / Short test circuit boards according to claim 7, characterized in that: The DC parameter test channel uses the AD5522 test chip.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it causes the device containing the computer-readable storage medium to perform the production and testing fixture method for the OS test circuit board according to any one of claims 1-5.
10. An electronic device, characterized in that, include: A memory and a processor, wherein the memory stores a program that can run on the processor, and the processor executes the program to implement the production test fixture method for an OS test circuit board as described in any one of claims 1-5.